Cypress CY7C1471BV25 72-mbit (2 m x 36/4 m x 18/1 m x 72) flow-through sram with nobl architecture Datasheet

CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
72-Mbit (2 M × 36/4 M × 18/1 M × 72)
Flow-Through SRAM with NoBL™ Architecture
72-Mbit (2 M × 36/4 M × 18/1 M × 72) Flow-Through SRAM with NoBL™ Architecture
Features
Functional Description
■
No Bus Latency™ (NoBL™) architecture eliminates dead
cycles between write and read cycles
■
Supports up to 133 MHz bus operations with zero wait states
■
Data transfers on every clock
■
Pin compatible and functionally equivalent to ZBT™ devices
■
Internally self timed output buffer control to eliminate the need
to use OE
■
Registered inputs for flow through operation
■
Byte Write capability
■
2.5 V IO supply (VDDQ)
■
Fast clock-to-output times
❐ 6.5 ns (for 133-MHz device)
■
Clock Enable (CEN) pin to enable clock and suspend operation
■
Synchronous self timed writes
■
Asynchronous Output Enable (OE)
■
CY7C1471BV25,
CY7C1473BV25
available
in
JEDEC-standard Pb-free 100-pin TQFP, Pb-free and
non-Pb-free 165-ball FBGA package. CY7C1475BV25
available in Pb-free and non-Pb-free 209-ball FBGA package.
■
Three Chip Enables (CE1, CE2, CE3) for simple depth
expansion.
■
Automatic power down feature available using ZZ mode or CE
deselect.
■
IEEE 1149.1 JTAG Boundary Scan compatible
■
Burst Capability - linear or interleaved burst order
■
Low standby power
The CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25
are 2.5 V, 2 M × 36/4 M × 18/1 M × 72 synchronous flow through
burst SRAMs designed specifically to support unlimited true
back-to-back read or write operations without the insertion of
wait states. The CY7C1471BV25, CY7C1473BV25, and
CY7C1475BV25 are equipped with the advanced No Bus
Latency (NoBL) logic required to enable consecutive read or
write operations with data transferred on every clock cycle. This
feature dramatically improves the throughput of data through the
SRAM, especially in systems that require frequent write-read
transitions.
All synchronous inputs pass through input registers controlled by
the rising edge of the clock. The clock input is qualified by the
Clock Enable (CEN) signal, which when deasserted suspends
operation and extends the previous clock cycle. Maximum
access delay from the clock rise is 6.5 ns (133-MHz device).
Write operations are controlled by two or four Byte Write Select
(BWX) and a Write Enable (WE) input. All writes are conducted
with on-chip synchronous self timed write circuitry.
Three synchronous Chip Enables (CE1, CE2, CE3) and an
asynchronous Output Enable (OE) provide easy bank selection
and output tri-state control. To avoid bus contention, the output
drivers are synchronously tri-stated during the data portion of a
write sequence.
For best practice recommendations, refer to the Cypress
application note AN1064, SRAM System Guidelines.
Selection Guide
Description
133 MHz
100 MHz
Unit
Maximum Access Time
6.5
8.5
ns
Maximum Operating Current
305
275
mA
Maximum CMOS Standby Current
120
120
mA
Cypress Semiconductor Corporation
Document Number: 001-15013 Rev. *H
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised May 13, 2011
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Logic Block Diagram – CY7C1471BV25 (2 M × 36)
ADDRESS
REGISTER
A0, A1, A
A1
D1
A0
D0
MODE
CLK
CEN
CE
C
ADV/LD
C
BURST
LOGIC
Q1 A1'
A0'
Q0
WRITE ADDRESS
REGISTER
ADV/LD
BW A
WRITE
DRIVERS
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
BW B
BW C
MEMORY
ARRAY
S
E
N
S
E
A
M
P
S
BW D
WE
INPUT
REGISTER
OE
CE1
CE2
CE3
D
A
T
A
S
T
E
E
R
I
N
G
O
U
T
P
U
T
B
U
F
F
E
R
S
DQs
DQP A
DQP B
DQP C
DQP D
E
E
READ LOGIC
SLEEP
CONTROL
ZZ
Logic Block Diagram – CY7C1473BV25 (4 M × 18)
ADDRESS
REGISTER
A0, A1, A
A1
D1
A0
D0
MODE
CLK
CEN
CE
C
ADV/LD
C
BURST
LOGIC
A1'
Q1
A0'
Q0
WRITE ADDRESS
REGISTER
ADV/LD
BW A
BW B
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
WRITE
DRIVERS
MEMORY
ARRAY
S
E
N
S
E
A
M
P
S
WE
OE
CE1
CE2
CE3
ZZ
Document Number: 001-15013 Rev. *H
D
A
T
A
S
T
E
E
R
I
N
G
O
U
T
P
U
T
B
U
F
F
E
R
S
DQs
DQP A
DQP B
E
INPUT
E
REGISTER
READ LOGIC
SLEEP
CONTROL
Page 2 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Logic Block Diagram – CY7C1475BV25 (1 M × 72)
A0, A1, A
ADDRESS
REGISTER 0
MODE
CLK
ADV/LD
C
C
CEN
A1
A1'
D1
Q1
A0
A0'
D0 BURST Q0
LOGIC
WRITE ADDRESS
REGISTER 2
WRITE ADDRESS
REGISTER 1
ADV/LD
BW a
BW b
BW c
BW d
BW e
BW f
BW g
BW h
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
WRITE
DRIVERS
MEMORY
ARRAY
S
E
N
S
E
A
M
P
S
O
U
T
P
U
T
R
E
G
I
S
T
E
R
S
D
A
T
A
S
T
E
E
R
I
N
G
E
O
U
T
P
U
T
B
U
F
F
E
R
S
E
DQ s
DQ Pa
DQ Pb
DQ Pc
DQ Pd
DQ Pe
DQ Pf
DQ Pg
DQ Ph
WE
INPUT
E
REGISTER 1
OE
CE1
CE2
CE3
ZZ
INPUT
E
REGISTER 0
READ LOGIC
Sleep Control
Document Number: 001-15013 Rev. *H
Page 3 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Contents
Pin Configurations ........................................................... 5
Pin Definitions .................................................................. 9
Functional Overview ...................................................... 10
Single Read Accesses .............................................. 10
Burst Read Accesses ................................................ 10
Single Write Accesses ............................................... 10
Burst Write Accesses ................................................ 11
Sleep Mode ............................................................... 11
Interleaved Burst Address Table
(MODE = Floating or VDD) ............................................. 11
Linear Burst Address Table
(MODE = GND) ................................................................ 11
ZZ Mode Electrical Characteristics ............................... 11
Truth Table ...................................................................... 12
Truth Table for Read/Write ............................................ 13
Truth Table for Read/Write ............................................ 13
Truth Table for Read/Write ............................................ 13
IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 14
Disabling the JTAG Feature ...................................... 14
TAP Controller State Diagram ....................................... 14
Test Access Port (TAP) ............................................. 14
TAP Controller Block Diagram ...................................... 14
PERFORMING A TAP RESET .................................. 14
TAP REGISTERS ...................................................... 15
TAP Instruction Set ................................................... 15
TAP AC Switching Characteristics ............................... 17
2.5 V TAP AC Test Conditions ....................................... 17
2.5 V TAP AC Output Load Equivalent ......................... 17
Document Number: 001-15013 Rev. *H
TAP DC Electrical Characteristics and
Operating Conditions ..................................................... 17
Identification Register Definitions ................................ 18
Scan Register Sizes ....................................................... 18
Identification Codes ....................................................... 18
Boundary Scan Exit Order (2 M × 36) ........................... 19
Boundary Scan Exit Order (4 M × 18) ........................... 19
Boundary Scan Exit Order (1 M × 72) ........................... 20
Maximum Ratings ........................................................... 21
Operating Range ............................................................. 21
Electrical Characteristics ............................................... 21
Capacitance .................................................................... 22
Thermal Resistance ........................................................ 22
Switching Characteristics .............................................. 23
Switching Waveforms .................................................... 24
Ordering Information ...................................................... 27
Ordering Code Definitions ......................................... 27
Package Diagrams .......................................................... 28
Acronyms ........................................................................ 31
Document Conventions ................................................. 31
Units of Measure ....................................................... 31
Document History Page ................................................. 32
Sales, Solutions, and Legal Information ...................... 33
Worldwide Sales and Design Support ....................... 33
Products .................................................................... 33
PSoC Solutions ......................................................... 33
Page 4 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Pin Configurations
A
40
41
42
43
44
45
46
47
48
49
50
VDD
A
A
A
A
A
A
A
A
A
37
A0
VSS
36
A1
39
35
A
NC/144M
34
A
38
33
A
NC/288M
32
A
Document Number: 001-15013 Rev. *H
81
A
82
83
A
A
84
ADV/LD
VSS
90
85
VDD
91
OE
CE3
92
86
BWA
93
CEN
BWB
94
WE
BWC
95
88
BWD
96
CLK
CE2
97
89
CE1
A
98
87
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
CY7C1471BV25
31
BYTE D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
MODE
BYTE C
DQPC
DQC
DQC
VDDQ
VSS
DQC
DQC
DQC
DQC
VSS
VDDQ
DQC
DQC
NC
VDD
NC
VSS
DQD
DQD
VDDQ
VSS
DQD
DQD
DQD
DQD
VSS
VDDQ
DQD
DQD
DQPD
99
100
A
Figure 1. 100-pin TQFP Pinout
DQPB
DQB
DQB
VDDQ
VSS
DQB
DQB
DQB
DQB
VSS
VDDQ
DQB
DQB
VSS
NC
VDD
ZZ
DQA
DQA
VDDQ
VSS
DQA
DQA
DQA
DQA
VSS
VDDQ
DQA
DQA
DQPA
BYTE B
BYTE A
Page 5 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Pin Configurations (continued)
A
40
41
42
43
44
45
46
47
48
49
50
VDD
A
A
A
A
A
A
A
A
A
37
A0
VSS
36
A1
39
35
A
NC/144M
34
A
38
33
A
NC/288M
32
A
Document Number: 001-15013 Rev. *H
81
A
82
A
83
A
84
ADV/LD
85
OE
86
VSS
90
CEN
VDD
91
WE
CE3
92
88
BWA
93
CLK
BWB
94
89
NC
95
NC
CE2
97
96
CE1
A
98
87
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
CY7C1473BV25
31
BYTE B
VDDQ
VSS
NC
NC
DQB
DQB
VSS
VDDQ
DQB
DQB
NC
VDD
NC
VSS
DQB
DQB
VDDQ
VSS
DQB
DQB
DQPB
NC
VSS
VDDQ
NC
NC
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
MODE
NC
NC
NC
99
100
A
Figure 2. 100-pin TQFP Pinout
A
NC
NC
VDDQ
VSS
NC
DQPA
DQA
DQA
VSS
VDDQ
DQA
DQA
VSS
NC
VDD
ZZ
BYTE A
DQA
DQA
VDDQ
VSS
DQA
DQA
NC
NC
VSS
VDDQ
NC
NC
NC
Page 6 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Pin Configurations (continued)
165-ball FBGA (15 × 17 × 1.4 mm) Pinout
CY7C1471BV25 (2 M × 36)
1
2
3
4
5
6
7
8
9
10
11
A
B
C
D
E
F
G
H
J
K
L
M
N
P
NC/576M
A
CE1
BWC
BWB
CE3
CEN
ADV/LD
A
A
NC
NC/1G
A
CE2
A
A
VDDQ
VSS
VSS
VSS
VDD
VDDQ
VDDQ
VSS
VSS
WE
VSS
OE
NC
DQC
BWA
VSS
CLK
DQPC
DQC
BWD
VSS
VDD
VDDQ
NC
DQB
DQPB
DQB
DQC
DQC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQB
DQB
DQC
DQC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQB
DQB
DQC
NC
DQD
DQC
NC
DQD
VDDQ
NC
VDDQ
VDD
VDD
VDD
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
VDD
VDD
VDDQ
NC
VDDQ
DQB
NC
DQA
DQB
ZZ
DQA
DQD
DQD
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
DQA
DQD
DQD
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
DQA
DQD
DQPD
DQD
NC
VDDQ
VDDQ
VDD
VSS
VSS
NC
VSS
VDD
VSS
VDDQ
VDDQ
DQA
NC
DQA
DQPA
NC/144M
A
A
A
TDI
NC
A1
VSS
NC
TDO
A
A
A
NC/288M
R
MODE
A
A
A
TMS
A0
TCK
A
A
A
A
8
9
10
11
ADV/LD
A
A
A
A
A
NC
NC
CY7C1473BV25 (4 M × 18)
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
2
3
4
5
6
NC/576M
A
CE1
BWB
NC
CE3
NC/1G
A
CE2
NC
NC
NC
NC
DQB
VDDQ
VDDQ
VSS
VDD
BWA
VSS
CLK
NC
DQB
VDDQ
NC
NC
NC
DQB
DQB
DQB
NC
NC
DQB
7
CEN
WE
VSS
VSS
OE
VSS
VDD
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
DQPA
DQA
VDD
VSS
VSS
VSS
VDD
VDDQ
NC
DQA
VDDQ
VDDQ
NC
VDDQ
VDD
VSS
VSS
VSS
VSS
VSS
VDD
VDD
VDD
VDDQ
VDDQ
NC
VDDQ
NC
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
VDD
VDD
VDD
NC
NC
DQA
DQA
DQA
ZZ
NC
NC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
NC
DQB
NC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
NC
DQB
DQPB
NC
NC
VDDQ
VDDQ
VDD
VSS
VSS
NC
VSS
NC/144M
A
A
A
MODE
A
A
A
Document Number: 001-15013 Rev. *H
VSS
NC
VDD
VSS
VDDQ
VDDQ
DQA
NC
NC
NC
TDI
NC
A1
TDO
A
A
A
NC/288M
TMS
A0
TCK
A
A
A
A
Page 7 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Pin Configurations (continued)
209-ball FBGA (14 × 22 × 1.76 mm) Pinout
CY7C1475BV25 (1 M × 72)
1
2
3
4
5
6
7
8
9
10
11
A
DQg
DQg
A
CE2
A
ADV/LD
A
CE3
A
DQb
DQb
B
DQg
DQg
BWSc
BWSg
NC
WE
A
BWSb
BWSf
DQb
DQb
C
DQg
DQg
BWSh
BWSd NC/576M
CE1
NC
BWSe
BWSa
DQb
DQb
D
DQg
DQg
VSS
NC
NC/1G
OE
NC
NC
VSS
DQb
DQb
E
DQPg
DQPc
VDDQ
VDDQ
VDD
VDD
VDD
VDDQ
VDDQ
DQPf
DQPb
F
DQc
DQc
VSS
VSS
VSS
NC
VSS
VSS
VSS
DQf
DQf
G
DQc
DQc
VDDQ
VDDQ
VDD
NC
VDD
VDDQ
VDDQ
DQf
DQf
H
DQc
DQc
VSS
VSS
VSS
NC
VSS
VSS
VSS
DQf
DQf
J
DQc
DQc
VDDQ
VDDQ
VDD
NC
VDD
VDDQ
VDDQ
DQf
DQf
K
NC
NC
CLK
NC
VSS
CEN
VSS
NC
NC
NC
NC
L
DQh
DQh
VDDQ
VDDQ
VDD
NC
VDD
VDDQ
VDDQ
DQa
DQa
M
DQh
DQh
VSS
VSS
VSS
NC
VSS
VSS
VSS
DQa
DQa
N
DQh
DQh
VDDQ
VDDQ
VDD
NC
VDD
VDDQ
VDDQ
DQa
DQa
P
DQh
DQh
VSS
VSS
VSS
ZZ
VSS
VSS
VSS
DQa
DQa
R
DQPd
DQPh
VDDQ
VDDQ
VDD
VDD
VDD
VDDQ
VDDQ
DQPa
DQPe
T
DQd
DQd
VSS
NC
NC
MODE
NC
NC
VSS
DQe
DQe
U
DQd
DQd
NC/144M
A
A
A
A
A
NC/288M
DQe
DQe
V
DQd
DQd
A
A
A
A1
A
A
A
DQe
DQe
W
DQd
DQd
TMS
TDI
A
A0
A
TDO
TCK
DQe
DQe
Document Number: 001-15013 Rev. *H
Page 8 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Pin Definitions
Name
IO
Description
A0, A1, A
InputSynchronous
Address Inputs Used to Select One of the Address Locations. Sampled at the rising edge
of the CLK. A[1:0] are fed to the two-bit burst counter.
BWA, BWB,
BWC, BWD,
BWE, BWF,
BWG, BWH
InputSynchronous
Byte Write Inputs, Active LOW. Qualified with WE to conduct writes to the SRAM. Sampled
on the rising edge of CLK.
WE
InputSynchronous
Write Enable Input, Active LOW. Sampled on the rising edge of CLK if CEN is active LOW.
This signal must be asserted LOW to initiate a write sequence.
ADV/LD
InputSynchronous
Advance/Load Input. Used to advance the on-chip address counter or load a new address.
When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a
new address can be loaded into the device for an access. After being deselected, ADV/LD must
be driven LOW to load a new address.
CLK
InputClock
Clock Input. Captures all synchronous inputs to the device. CLK is qualified with CEN. CLK is
only recognized if CEN is active LOW.
CE1
InputSynchronous
Chip Enable 1 Input, Active LOW. Sampled on the rising edge of CLK. Used in conjunction
with CE2 and CE3 to select or deselect the device.
CE2
InputSynchronous
Chip Enable 2 Input, Active HIGH. Sampled on the rising edge of CLK. Used in conjunction
with CE1 and CE3 to select or deselect the device.
CE3
InputSynchronous
Chip Enable 3 Input, Active LOW. Sampled on the rising edge of CLK. Used in conjunction
with CE1 and CE2 to select or deselect the device.
OE
InputAsynchronous
Output Enable, Asynchronous Input, Active LOW. Combined with the synchronous logic
block inside the device to control the direction of the IO pins. When LOW, the IO pins are enabled
to behave as outputs. When deasserted HIGH, IO pins are tri-stated, and act as input data pins.
OE is masked during the data portion of a write sequence, during the first clock when emerging
from a deselected state, when the device has been deselected.
CEN
InputSynchronous
Clock Enable Input, Active LOW. When asserted LOW the clock signal is recognized by the
SRAM. When deasserted HIGH the clock signal is masked. Because deasserting CEN does
not deselect the device, CEN can be used to extend the previous cycle when required.
ZZ
InputAsynchronous
ZZ “Sleep” Input. This active HIGH input places the device in a non-time-critical “sleep”
condition with data integrity preserved. For normal operation, this pin must be LOW or left
floating. ZZ pin has an internal pull down.
DQs
IOSynchronous
Bidirectional Data IO Lines. As inputs, they feed into an on-chip data register that is triggered
by the rising edge of CLK. As outputs, they deliver the data contained in the memory location
specified by the addresses presented during the previous clock rise of the read cycle. The
direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs.
When HIGH, DQs and DQPX are placed in a tri-state condition.The outputs are automatically
tri-stated during the data portion of a write sequence, during the first clock when emerging from
a deselected state, and when the device is deselected, regardless of the state of OE.
DQPX
IOSynchronous
Bidirectional Data Parity IO Lines. Functionally, these signals are identical to DQs. During
write sequences, DQPX is controlled by BWX correspondingly.
MODE
Input Strap Pin
Mode Input. Selects the Burst Order of the Device.
When tied to Gnd selects linear burst sequence. When tied to VDD or left floating selects interleaved burst sequence.
VDD
Power Supply
Power Supply Inputs to the Core of the Device.
VDDQ
VSS
TDO
IO Power Supply
Ground
Power Supply for the IO Circuitry.
Ground for the Device.
JTAG serial output Serial Data Out to the JTAG Circuit. Delivers data on the negative edge of TCK. If the JTAG
Synchronous
feature is not used, this pin must be left unconnected. This pin is not available on TQFP
packages.
Document Number: 001-15013 Rev. *H
Page 9 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Pin Definitions (continued)
Name
IO
Description
TDI
JTAG serial input
Synchronous
Serial Data In to the JTAG Circuit. Sampled on the rising edge of TCK. If the JTAG feature is
not used, leave this pin floating or connected to VDD through a pull up resistor. This pin is not
available on TQFP packages.
TMS
JTAG serial input
Synchronous
Serial Data In to the JTAG Circuit. Sampled on the rising edge of TCK. If the JTAG feature is
not used, this pin can be disconnected or connected to VDD. This pin is not available on TQFP
packages.
TCK
JTAG-Clock
Clock Input to the JTAG Circuitry. If the JTAG feature is not used, connect this pin to VSS.
This pin is not available on TQFP packages.
NC
-
No Connects. Not internally connected to the die. 144M, 288M, 576M, and 1G are address
expansion pins and are not internally connected to the die.
Functional Overview
The CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25
are synchronous flow through burst SRAMs designed
specifically to eliminate wait states during write read transitions.
All synchronous inputs pass through input registers controlled by
the rising edge of the clock. The clock signal is qualified with the
Clock Enable input signal (CEN). If CEN is HIGH, the clock signal
is not recognized and all internal states are maintained. All
synchronous operations are qualified with CEN. Maximum
access delay from the clock rise (tCDV) is 6.5 ns (133-MHz
device).
Accesses are initiated by asserting all three Chip Enables (CE1,
CE2, CE3) active at the rising edge of the clock. If CEN is active
LOW and ADV/LD is asserted LOW, the address presented to
the device is latched. The access is either a read or write
operation, depending on the status of the Write Enable (WE).
Use Byte Write Select (BWX) to conduct Byte Write operations.
Write operations are qualified by the WE. All writes are simplified
with on-chip synchronous self- timed write circuitry.
Three synchronous Chip Enables (CE1, CE2, CE3) and an
asynchronous Output Enable (OE) simplify depth expansion. All
operations (reads, writes, and deselects) are pipelined. ADV/LD
must be driven LOW after the device is deselected to load a new
address for the next operation.
Single Read Accesses
A read access is initiated when the following conditions are
satisfied at clock rise:
■
CEN is asserted LOW
■
CE1, CE2, and CE3 are ALL asserted active
■
WE is deasserted HIGH
■
ADV/LD is asserted LOW.
The address presented to the address inputs is latched into the
Address Register and presented to the memory array and control
logic. The control logic determines that a read access is in
progress and allows the requested data to propagate to the
output buffers. The data is available within 6.5 ns (133-MHz
device) provided OE is active LOW. After the first clock of the
read access, the output buffers are controlled by OE and the
internal control logic. OE must be driven LOW to drive out the
requested data. On the subsequent clock, another operation
Document Number: 001-15013 Rev. *H
(read/write/deselect) can be initiated. When the SRAM is
deselected at clock rise by one of the chip enable signals, the
output is tri-stated immediately.
Burst Read Accesses
The CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25
has an on-chip burst counter that enables the user the ability to
supply a single address and conduct up to four reads without
reasserting the address inputs. ADV/LD must be driven LOW to
load a new address into the SRAM, as described in the Single
Read Accesses section. The sequence of the burst counter is
determined by the MODE input signal. A LOW input on MODE
selects a linear burst mode, a HIGH selects an interleaved burst
sequence. Both burst counters use A0 and A1 in the burst
sequence, and wraps around when incremented sufficiently. A
HIGH input on ADV/LD increments the internal burst counter
regardless of the state of chip enable inputs or WE. WE is latched
at the beginning of a burst cycle. Therefore, the type of access
(read or write) is maintained throughout the burst sequence.
Single Write Accesses
Write accesses are initiated when these conditions are satisfied
at clock rise:
■
CEN is asserted LOW
■
CE1, CE2, and CE3 are ALL asserted active
■
WE is asserted LOW.
The address presented to the address bus is loaded into the
Address Register. The write signals are latched into the Control
Logic block. The data lines are automatically tri-stated
regardless of the state of the OE input signal. This allows the
external logic to present the data on DQs and DQPX.
On the next clock rise the data presented to DQs and DQPX (or
a subset for Byte Write operations, see Truth Table for
Read/Write on page 13 for details) inputs is latched into the
device and the write is complete. Additional accesses
(read/write/deselect) can be initiated on this cycle.
The data written during the write operation is controlled by BWX
signals.
The
CY7C1471BV25, CY7C1473BV25,
and
CY7C1475BV25 provide Byte Write capability that is described
in the Truth Table for Read/Write on page 13. The input WE with
the selected BWx input selectively writes to only the desired
bytes. Bytes not selected during a Byte Write operation remain
unaltered. A synchronous self timed write mechanism is
Page 10 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
provided to simplify the write operations. Byte Write capability is
included to greatly simplify read/modify/write sequences, which
can be reduced to simple byte write operations.
Because the CY7C1471BV25, CY7C1473BV25, and
CY7C1475BV25 are common IO devices, data must not be
driven into the device while the outputs are active. The OE can
be deasserted HIGH before presenting data to the DQs and
DQPX inputs. This tri-states the output drivers. As a safety
precaution, DQs and DQPX are automatically tri-stated during
the data portion of a write cycle, regardless of the state of OE.
Burst Write Accesses
The CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25
have an on-chip burst counter that makes it possible to supply a
single address and conduct up to four Write operations without
reasserting the address inputs. Drive ADV/LD LOW to load the
initial address, as described in the Single Write Accesses
section. When ADV/LD is driven HIGH on the subsequent clock
rise, the Chip Enables (CE1, CE2, and CE3) and WE inputs are
ignored and the burst counter is incremented. You must drive the
correct BWX inputs in each cycle of the Burst Write to write the
correct data bytes.
Interleaved Burst Address Table
(MODE = Floating or VDD)
First
Address
A1: A0
Second
Address
A1: A0
Third
Address
A1: A0
Fourth
Address
A1: A0
00
01
10
11
01
00
11
10
10
11
00
01
11
10
01
00
Linear Burst Address Table
(MODE = GND)
First
Address
A1: A0
Second
Address
A1: A0
Third
Address
A1: A0
Fourth
Address
A1: A0
00
01
10
11
01
10
11
00
Sleep Mode
10
11
00
01
The ZZ input pin is an asynchronous input. Asserting ZZ places
the SRAM in a power conservation “sleep” mode. Two clock
cycles are required to enter into or exit from this “sleep” mode.
While in this mode, data integrity is guaranteed. Accesses
pending when entering the “sleep” mode are not considered valid
nor is the completion of the operation guaranteed. You must
select the device before entering the “sleep” mode. CE1, CE2,
and CE3, must remain inactive for the duration of tZZREC after the
ZZ input returns LOW.
11
00
01
10
ZZ Mode Electrical Characteristics
Parameter
Description
Test Conditions
Min
Max
Unit
IDDZZ
Sleep mode standby current
ZZ > VDD– 0.2 V
–
120
mA
tZZS
Device operation to ZZ
ZZ > VDD – 0.2 V
–
2tCYC
ns
tZZREC
ZZ recovery time
ZZ < 0.2 V
2tCYC
–
ns
tZZI
ZZ active to sleep current
This parameter is sampled
–
2tCYC
ns
tRZZI
ZZ Inactive to exit sleep current
This parameter is sampled
0
–
ns
Document Number: 001-15013 Rev. *H
Page 11 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Truth Table
The truth table for CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25 follows.[1, 2, 3, 4, 5, 6, 7]
Operation
Address CE CE
1
2 CE3
Used
ZZ
ADV/LD
WE
BWX
OE
CEN
CLK
DQ
Deselect Cycle
None
H
X
X
L
L
X
X
X
L
L->H
Tri-State
Deselect Cycle
None
X
X
H
L
L
X
X
X
L
L->H
Tri-State
Deselect Cycle
None
X
L
X
L
L
X
X
X
L
L->H
Tri-State
Continue Deselect Cycle
None
X
X
X
L
H
X
X
X
L
L->H
Tri-State
Read Cycle (Begin Burst)
External
L
H
L
L
L
H
X
L
L
L->H Data Out (Q)
Read Cycle (Continue Burst)
Next
X
X
X
L
H
X
X
L
L
L->H Data Out (Q)
External
L
H
L
L
L
H
X
H
L
L->H
Tri-State
Next
X
X
X
L
H
X
X
H
L
L->H
Tri-State
External
L
H
L
L
L
L
L
X
L
L->H
Data In (D)
Write Cycle (Continue Burst)
Next
X
X
X
L
H
X
L
X
L
L->H
Data In (D)
NOP/Write Abort
(Begin Burst)
None
L
H
L
L
L
L
H
X
L
L->H
Tri-State
Write Abort (Continue Burst)
Next
X
X
X
L
H
X
H
X
L
L->H
Tri-State
NOP/Dummy Read
(Begin Burst)
Dummy Read
(Continue Burst)
Write Cycle (Begin Burst)
Ignore Clock Edge (Stall)
Sleep Mode
Current
X
X
X
L
X
X
X
X
H
L->H
-
None
X
X
X
H
X
X
X
X
X
X
Tri-State
Notes
1. X = “Don't Care.” H = Logic HIGH, L = Logic LOW. BWX = L signifies at least one Byte Write Select is active, BWX = Valid signifies that the desired Byte Write Selects
are asserted, see Truth Table for Read/Write on page 13 for details.
2. Write is defined by BWX, and WE. See Truth Table for Read/Write on page 13.
3. When a write cycle is detected, all IOs are tri-stated, even during byte writes.
4. The DQs and DQPX pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock.
5. CEN = H, inserts wait states.
6. Device powers up deselected with the IOs in a tri-state condition, regardless of OE.
7. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle DQs and DQPX = tri-state when OE is inactive
or when the device is deselected, and DQs and DQPX = data when OE is active.
Document Number: 001-15013 Rev. *H
Page 12 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Truth Table for Read/Write
The read-write truth table for CY7C1471BV25 follows.[8, 9, 10]
Function
WE
BWA
BWB
BWC
BWD
Read
H
X
X
X
X
Write No bytes written
L
H
H
H
H
Write Byte A – (DQA and DQPA)
Write Byte B – (DQB and DQPB)
L
L
H
H
H
L
H
L
H
H
Write Byte C – (DQC and DQPC)
L
H
H
L
H
Write Byte D – (DQD and DQPD)
L
H
H
H
L
Write All Bytes
L
L
L
L
L
Truth Table for Read/Write
The read-write truth table for CY7C1473BV25 follows.[8, 9, 10]
Function
WE
BWb
BWa
Read
H
X
X
Write – No Bytes Written
L
H
H
Write Byte a – (DQa and DQPa)
L
H
L
Write Byte b – (DQb and DQPb)
L
L
H
Write Both Bytes
L
L
L
Truth Table for Read/Write
The read-write truth table for CY7C1475BV25 follows.[8, 9, 10]
Function
WE
BWx
Read
H
X
Write – No Bytes Written
L
H
Write Byte X(DQx and DQPx)
L
L
Write All Bytes
L
All BW = L
Notes
8. X = “Don't Care.” H = Logic HIGH, L = Logic LOW. BWX = L signifies at least one Byte Write Select is active, BWX = Valid signifies that the desired Byte Write Selects
are asserted, see Truth Table for Read/Write on page 13 for details.
9. Write is defined by BWX, and WE. See Truth Table for Read/Write on page 13.
10. This table is only a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write is based on which byte write is active.
Document Number: 001-15013 Rev. *H
Page 13 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
IEEE 1149.1 Serial Boundary Scan (JTAG)
Test Access Port (TAP)
The CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25
incorporate a serial boundary scan Test Access Port (TAP). This
port operates in accordance with IEEE Standard 1149.1-1990
but does not have the set of functions required for full 1149.1
compliance. These functions from the IEEE specification are
excluded because their inclusion places an added delay in the
critical speed path of the SRAM. Note that the TAP controller
functions in a manner that does not conflict with the operation of
other devices using 1149.1 fully compliant TAPs. The TAP
operates using JEDEC-standard 2.5 V IO logic levels.
Test Clock (TCK)
The CY7C1471BV25, CY7C1473BV25, and CY7C1475BV25
contain a TAP controller, instruction register, boundary scan
register, bypass register, and ID register.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, tie TCK LOW (VSS) to
prevent clocking of the device. TDI and TMS are internally pulled
up and may be unconnected. They may alternately be connected
to VDD through a pull up resistor. TDO must be left unconnected.
During power up, the device comes up in a reset state, which
does not interfere with the operation of the device.
TEST-LOGIC
RESET
0
RUN-TEST/
IDLE
0
1
SELECT
DR-SCA N
1
SELECT
IR-SCAN
0
1
The TMS input gives commands to the TAP controller and is
sampled on the rising edge of TCK. You can leave this ball
unconnected if the TAP is not used. The ball is pulled up
internally, resulting in a logic HIGH level.
Test Data In (TDI)
The TDI ball serially inputs information into the registers and is
connected to the input of any of the registers. The register
between TDI and TDO is chosen by the instruction that is loaded
into the TAP instruction register. For information about loading
the instruction register, see the TAP Controller State Diagram.
TDI is internally pulled up and can be unconnected if the TAP is
unused in an application. TDI is connected to the most significant
bit (MSB) of any register. (See TAP Controller Block Diagram.)
Test Data Out (TDO)
1
TAP Controller Block Diagram
0
1
CAPTURE-DR
CAPTURE-IR
0
0
0
SHIFT-DR
0
Bypass Register
SHIFT-IR
1
0
2 1 0
1
EXIT1-DR
1
EXIT1-IR
0
1
TDI
0
0
0
TDO
Boundary Scan Register
EXIT2-IR
1
1
UPDATE-DR
UPDATE-IR
TCK
1
Selection
Circuitry
x . . . . . 2 1 0
1
EXIT2-DR
Instruction Register
Identification Register
PAUSE-IR
1
Selection
Circuitry
31 30 29 . . . 2 1 0
0
PAUSE-DR
0
Test Mode Select (TMS)
The TDO output ball serially clocks data out from the registers.
The output is active depending upon the current state of the TAP
state machine. The output changes on the falling edge of TCK.
TDO is connected to the least significant bit (LSB) of any register.
(See TAP Controller State Diagram.)
TAP Controller State Diagram
1
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
0
1
0
The 0/1 next to each state represents the value of TMS at the
rising edge of TCK.
TM S
TAP CONTROLLER
Performing a TAP Reset
A RESET is performed by forcing TMS HIGH (VDD) for five rising
edges of TCK. This RESET does not affect the operation of the
SRAM and may be performed while the SRAM is operating.
During power up, the TAP is reset internally to ensure that TDO
comes up in a High Z state.
Document Number: 001-15013 Rev. *H
Page 14 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
TAP Registers
Registers are connected between the TDI and TDO balls and
enable the scanning of data into and out of the SRAM test
circuitry. Only one register is selectable at a time through the
instruction register. Data is serially loaded into the TDI ball on the
rising edge of TCK. Data is output on the TDO ball on the falling
edge of TCK.
Instruction Register
Three-bit instructions can be serially loaded into the instruction
register. This register is loaded when it is placed between the TDI
and TDO balls as shown in the TAP Controller Block Diagram on
page 14. During power up, the instruction register is loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state as described
in the previous section.
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary ‘01’ pattern to enable fault
isolation of the board-level serial test data path.
Bypass Register
The TAP controller used in this SRAM is not fully compliant to the
1149.1 convention because some of the mandatory 1149.1
instructions are not fully implemented.
You cannot use the TAP controller to load address data or control
signals into the SRAM and you cannot preload the IO buffers.
The SRAM does not implement the 1149.1 commands EXTEST
or INTEST or the PRELOAD portion of SAMPLE/PRELOAD;
rather, it performs a capture of the IO ring when these instructions are executed.
Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO balls. To execute
the instruction after it is shifted in, the TAP controller must be
moved into the Update-IR state.
EXTEST
EXTEST is a mandatory 1149.1 instruction which is executed
whenever the instruction register is loaded with all 0s. EXTEST
is not implemented in this SRAM TAP controller making this
device not compliant with 1149.1. The TAP controller does
recognize an all-0 instruction.
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between the
TDI and TDO balls. This shifts the data through the SRAM with
minimal delay. The bypass register is set LOW (VSS) when the
BYPASS instruction is executed.
When an EXTEST instruction is loaded into the instruction
register, the SRAM responds as if a SAMPLE/PRELOAD
instruction is loaded. There is one difference between the two
instructions. Unlike the SAMPLE/PRELOAD instruction,
EXTEST places the SRAM outputs in a High Z state.
Boundary Scan Register
IDCODE
The boundary scan register is connected to all the input and
bidirectional balls on the SRAM.
The IDCODE instruction causes a vendor specific, 32-bit code to
load into the instruction register. It also places the instruction
register between the TDI and TDO balls and enables the
IDCODE for shifting out of the device when the TAP controller
enters the Shift-DR state.
The boundary scan register is loaded with the contents of the
RAM IO ring when the TAP controller is in the Capture-DR state
and is then placed between the TDI and TDO balls when the
controller is moved to the Shift-DR state. The EXTEST,
SAMPLE/PRELOAD and SAMPLE Z instructions can be used to
capture the contents of the IO ring.
The Boundary Scan Order tables show the order in which the bits
are connected. Each bit corresponds to one of the bumps on the
SRAM package. The MSB of the register is connected to TDI and
the LSB is connected to TDO.
Identification (ID) Register
The ID register is loaded with a vendor specific, 32-bit code
during the Capture DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift DR state. The ID register has a vendor code and other
information described in Identification Register Definitions on
page 18.
TAP Instruction Set
Overview
Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in Identification
Codes on page 18. Three of these instructions are listed as
RESERVED and are not for use. The other five instructions are
described in this section in detail.
Document Number: 001-15013 Rev. *H
The IDCODE instruction is loaded into the instruction register
during power up or whenever the TAP controller is in a test logic
reset state.
SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. It also places all SRAM outputs into a High Z
state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. The
PRELOAD portion of this instruction is not implemented, so the
device TAP controller is not fully 1149.1 compliant.
When the SAMPLE/PRELOAD instruction is loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the inputs and bidirectional balls is
captured in the boundary scan register.
Be aware that the TAP controller clock only operates at a
frequency up to 20 MHz, while the SRAM clock operates more
than an order of magnitude faster. Because there is a large
difference in the clock frequencies, it is possible that, during the
Capture-DR state, an input or output may undergo a transition.
The TAP may then try to capture a signal while in transition
(metastable state). This does not harm the device, but there is
Page 15 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Note that since the PRELOAD part of the command is not implemented, putting the TAP to the Update-DR state while performing
a SAMPLE/PRELOAD instruction has the same effect as the
Pause-DR command.
no guarantee as to the value that is captured. Repeatable results
may not be possible.
To guarantee that the boundary scan register captures the
correct signal value, make certain that the SRAM signal is
stabilized long enough to meet the TAP controller’s capture
setup plus hold time (tCS plus tCH).
BYPASS
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO balls. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
The SRAM clock input might not be captured correctly if there is
no way in a design to stop (or slow) the clock during a
SAMPLE/PRELOAD instruction. If this is an issue, it is still
possible to capture all other signals and simply ignore the value
of the CLK captured in the boundary scan register.
Reserved
After the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO balls.
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
Figure 3. TAP Timing
1
2
Test Clock
(TCK )
3
t TH
t TM SS
t TM SH
t TDIS
t TDIH
t
TL
4
5
6
t CY C
Test M ode Select
(TM S)
Test Data-In
(TDI)
t TDOV
t TDOX
Test Data-Out
(TDO)
DON’T CA RE
Document Number: 001-15013 Rev. *H
UNDEFINED
Page 16 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
TAP AC Switching Characteristics
Over the Operating Range[11, 12]
Parameter
Description
Min
Max
Unit
Clock
tTCYC
TCK Clock Cycle Time
50
–
ns
tTF
TCK Clock Frequency
–
20
MHz
tTH
TCK Clock HIGH Time
20
–
ns
tTL
TCK Clock LOW Time
20
–
ns
Output Times
tTDOV
TCK Clock LOW to TDO Valid
–
10
ns
tTDOX
TCK Clock LOW to TDO Invalid
0
–
ns
tTMSS
TMS Setup to TCK Clock Rise
5
–
ns
tTDIS
TDI Setup to TCK Clock Rise
5
–
ns
tCS
Capture Setup to TCK Rise
5
–
ns
Setup Times
Hold Times
tTMSH
TMS Hold after TCK Clock Rise
5
–
ns
tTDIH
TDI Hold after Clock Rise
5
–
ns
tCH
Capture Hold after Clock Rise
5
–
ns
2.5 V TAP AC Test Conditions
2.5 V TAP AC Output Load Equivalent
Input pulse levels................................................VSS to 2.5 V
1.25V
Input rise and fall time .....................................................1 ns
Input timing reference levels........................................ 1.25 V
50Ω
Output reference levels ............................................... 1.25 V
Test load termination supply voltage ........................... 1.25 V
TDO
Z O= 50Ω
20pF
TAP DC Electrical Characteristics and Operating Conditions
(0 °C < TA < +70 °C; VDD = 2.375 to 2.625 unless otherwise noted) [13]
Parameter
Description
Test Conditions
Min
Max
Unit
VOH1
Output HIGH Voltage
IOH = –1.0 mA, VDDQ = 2.5 V
2.0
–
V
VOH2
Output HIGH Voltage
IOH = –100 µA, VDDQ = 2.5 V
2.1
–
V
VOL1
Output LOW Voltage
IOL = 1.0 mA, VDDQ = 2.5 V
–
0.4
V
VOL2
Output LOW Voltage
IOL = 100 µA, VDDQ = 2.5 V
–
0.2
V
VIH
Input HIGH Voltage
VDDQ = 2.5 V
1.7
VDD + 0.3
V
VIL
Input LOW Voltage
VDDQ = 2.5 V
–0.3
0.7
V
IX
Input Load Current
GND < VIN < VDDQ
–5
5
µA
Notes
11. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
12. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
13. All voltages refer to VSS (GND).
Document Number: 001-15013 Rev. *H
Page 17 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Identification Register Definitions
Instruction Field
CY7C1471BV25 CY7C1473BV25 CY7C1475BV25
(2 M × 36)
(4 M × 18)
(1 M × 72)
Revision Number (31:29)
Description
000
000
000
01011
01011
01011
Architecture/Memory Type (23:18)
001001
001001
001001
Defines memory type and architecture
Bus Width/Density (17:12)
100100
010100
110100
Defines width and density
00000110100
00000110100
00000110100
1
1
1
Device Depth (28:24)
Cypress JEDEC ID Code (11:1)
ID Register Presence Indicator (0)
Describes the version number
Reserved for internal use
Allows unique identification of SRAM
vendor
Indicates the presence of an ID register
Scan Register Sizes
Register Name
Bit Size (× 36)
Bit Size (× 18)
Bit Size (× 72)
Instruction
3
3
3
Bypass
1
1
1
ID
32
32
32
Boundary Scan Order – 165-ball FBGA
71
52
–
Boundary Scan Order – 209-ball BGA
–
–
110
Identification Codes
Instruction
Code
Description
EXTEST
000
Captures IO ring contents. Places the boundary scan register between TDI and TDO.
Forces all SRAM outputs to High Z state. This instruction is not 1149.1 compliant.
IDCODE
001
Loads the ID register with the vendor ID code and places the register between TDI
and TDO. This operation does not affect SRAM operations.
SAMPLE Z
010
Captures IO ring contents. Places the boundary scan register between TDI and TDO.
Forces all SRAM output drivers to a High Z state.
RESERVED
011
Do Not Use: This instruction is reserved for future use.
SAMPLE/PRELOAD
100
Captures IO ring contents. Places the boundary scan register between TDI and TDO.
Does not affect SRAM operation. This instruction does not implement 1149.1 preload
function and is therefore not 1149.1 compliant.
RESERVED
101
Do Not Use: This instruction is reserved for future use.
RESERVED
110
Do Not Use: This instruction is reserved for future use.
BYPASS
111
Places the bypass register between TDI and TDO. This operation does not affect
SRAM operation.
Document Number: 001-15013 Rev. *H
Page 18 of 33
[+] Feedback
CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Boundary Scan Exit Order (2 M × 36)
Bit #
165-ball ID
Bit #
165-ball ID
Bit #
165-ball ID
Bit #
165-ball ID
1
C1
21
R3
41
J11
61
B7
2
D1
22
P2
42
K10
62
B6
3
E1
23
R4
43
J10
63
A6
4
D2
24
P6
44
H11
64
B5
5
E2
25
R6
45
G11
65
A5
6
F1
26
R8
46
F11
66
A4
7
G1
27
P3
47
E11
67
B4
8
F2
28
P4
48
D10
68
B3
9
G2
29
P8
49
D11
69
A3
10
J1
30
P9
50
C11
70
A2
11
K1
31
P10
51
G10
71
B2
12
L1
32
R9
52
F10
13
J2
33
R10
53
E10
14
M1
34
R11
54
A9
15
N1
35
N11
55
B9
16
K2
36
M11
56
A10
17
L2
37
L11
57
B10
18
M2
38
M10
58
A8
19
R1
39
L10
59
B8
20
R2
40
K11
60
A7
165-ball ID
Bit #
165-ball ID
Boundary Scan Exit Order (4 M × 18)
Bit #
165-ball ID
Bit #
165-ball ID
Bit #
1
D2
14
R4
27
L10
40
B10
2
E2
15
P6
28
K10
41
A8
3
F2
16
R6
29
J10
42
B8
4
G2
17
R8
30
H11
43
A7
5
J1
18
P3
31
G11
44
B7
6
K1
19
P4
32
F11
45
B6
7
L1
20
P8
33
E11
46
A6
8
M1
21
P9
34
D11
47
B5
9
N1
22
P10
35
C11
48
A4
10
R1
23
R9
36
A11
49
B3
11
R2
24
R10
37
A9
50
A3
12
R3
25
R11
38
B9
51
A2
13
P2
26
M10
39
A10
52
B2
Document Number: 001-15013 Rev. *H
Page 19 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Boundary Scan Exit Order (1 M × 72)
Bit #
209-ball ID
Bit #
209-ball ID
Bit #
209-ball ID
1
A1
29
2
A2
30
3
B1
4
B2
5
6
7
8
Bit #
209-ball ID
T1
57
U10
85
B11
T2
58
T11
86
B10
31
U1
59
T10
87
A11
32
U2
60
R11
88
A10
C1
33
V1
61
R10
89
A7
C2
34
V2
62
P11
90
A5
D1
35
W1
63
P10
91
A9
D2
36
W2
64
N11
92
U8
9
E1
37
T6
65
N10
93
A6
10
E2
38
V3
66
M11
94
D6
11
F1
39
V4
67
M10
95
K6
12
F2
40
U4
68
L11
96
B6
13
G1
41
W5
69
L10
97
K3
14
G2
42
V6
70
P6
98
A8
15
H1
43
W6
71
J11
99
B4
16
H2
44
V5
72
J10
100
B3
17
J1
45
U5
73
H11
101
C3
18
J2
46
U6
74
H10
102
C4
19
L1
47
W7
75
G11
103
C8
20
L2
48
V7
76
G10
104
C9
21
M1
49
U7
77
F11
105
B9
22
M2
50
V8
78
F10
106
B8
23
N1
51
V9
79
E10
107
A4
24
N2
52
W11
80
E11
108
C6
25
P1
53
W10
81
D11
109
B7
26
P2
54
V11
82
D10
110
A3
27
R2
55
V10
83
C11
28
R1
56
U11
84
C10
Document Number: 001-15013 Rev. *H
Page 20 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Maximum Ratings
DC Input Voltage ................................. –0.5 V to VDD + 0.5 V
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ............................... –65 C to +150 C
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage......................................... > 2001 V
(MIL-STD-883, Method 3015)
Latch Up Current ................................................... > 200 mA
Ambient Temperature with
Power Applied .......................................... –55C to +125 C
Operating Range
Supply Voltage on VDD Relative to GND ......–0.5 V to +3.6 V
Ambient
VDD
VDDQ
Temperature
Commercial 0 °C to +70 °C 2.5 V – 5% / + 5% 2.5 V – 5%
to VDD
Industrial
–40 °C to +85 °C
Range
Supply Voltage on VDDQ Relative to GND ..... –0.5 V to +VDD
DC Voltage Applied to Outputs
in Tri-State .........................................–0.5 V to VDDQ + 0.5 V
Electrical Characteristics
Over the Operating Range [14, 15]
Parameter
Description
Test Conditions
VDD
Power Supply Voltage
VDDQ
IO Supply Voltage
VOH
Output HIGH Voltage
For 2.5 V IO, IOH =–1.0 mA
VOL
Output LOW Voltage
For 2.5 V IO, IOL=1.0 mA
For 2.5 V IO
Min
Max
Unit
2.375
2.625
V
2.375
VDD
V
2.0
–
V
–
0.4
V
V
Input HIGH
Voltage[14]
For 2.5 V IO
1.7
VDD + 0.3 V
VIL
Input LOW
Voltage[14]
For 2.5 V IO
–0.3
0.7
V
IX
Input Leakage Current
except ZZ and MODE
GND  VI  VDDQ
–5
5
A
Input Current of MODE
Input = VSS
–30
–
A
Input = VDD
–
5
A
Input = VSS
–5
–
A
Input = VDD
–
30
A
–5
5
A
VIH
Input Current of ZZ
Output Leakage Current GND  VI  VDDQ, Output Disabled
IOZ
[16]
VDD Operating Supply
Current
VDD = Max, IOUT = 0 mA,
f = fMAX = 1/tCYC
Automatic CE
Power Down
Current—TTL Inputs
VDD = Max, Device Deselected,
VIN  VIH or VIN  VIL,
f = fMAX, inputs switching
ISB2
Automatic CE
Power Down
Current—CMOS Inputs
VDD = Max, Device Deselected,
VIN  0.3 V or VIN > VDD – 0.3 V,
f = 0, inputs static
ISB3
Automatic CE
Power Down
Current—CMOS Inputs
VDD = Max, Device Deselected, or 6.5 ns cycle, 133 MHz
VIN  0.3 V or VIN > VDDQ – 0.3 V 8.5 ns cycle, 100 MHz
f = fMAX, inputs switching
Automatic CE
Power Down
Current—TTL Inputs
VDD = Max, Device Deselected,
VIN  VDD – 0.3 V or VIN  0.3 V,
f = 0, inputs static
IDD
ISB1
ISB4
6.5 ns cycle, 133 MHz
–
305
mA
8.5 ns cycle, 100 MHz
–
275
mA
6.5 ns cycle, 133 MHz
–
170
mA
8.5 ns cycle, 100 MHz
–
170
mA
All speeds
–
120
mA
–
170
mA
–
170
mA
–
135
mA
All Speeds
Notes
14. Overshoot: VIH(AC) < VDD + 1.5 V (pulse width less than tCYC/2). Undershoot: VIL(AC) > –2 V (pulse width less than tCYC/2).
15. TPower-up: assumes a linear ramp from 0 V to VDD(min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD.
16. The operation current is calculated with 50% read cycle and 50% write cycle.
Document Number: 001-15013 Rev. *H
Page 21 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Capacitance
Tested initially and after any design or process change that may affect these parameters.
Parameter
Description
CADDRESS
Address Input Capacitance
CDATA
Data Input Capacitance
CCTRL
100-pin TQFP 165-ball FBGA 209-ball FBGA
Max
Max
Max
Test Conditions
TA = 25°C, f = 1 MHz,
VDD = 2.5 V, VDDQ = 2.5 V
Unit
6
6
6
pF
5
5
5
pF
Control Input Capacitance
8
8
8
pF
CCLK
Clock Input Capacitance
6
6
6
pF
CIO
Input-Output Capacitance
5
5
5
pF
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
Parameter
Description
JA
Thermal Resistance
(Junction to Ambient)
JC
Thermal Resistance
(Junction to Case)
100-pin TQFP 165-ball FBGA 209-ball FBGA
Package
Package
Package
Test Conditions
Test conditions follow
standard test methods and
procedures for measuring
thermal impedance,
according to EIA/JESD51.
Unit
24.63
16.3
15.2
C/W
2.28
2.1
1.7
C/W
Figure 4. AC Test Loads and Waveforms
2.5 V IO Test Load
R = 1667 
2.5 V
OUTPUT
OUTPUT
RL = 50 
Z0 = 50 
GND
5 pF
R = 1538 
VL = 1.25 V
(a)
Document Number: 001-15013 Rev. *H
ALL INPUT PULSES
VDDQ
INCLUDING
JIG AND
SCOPE
(b)
10%
90%
10%
90%
 1 ns
 1 ns
(c)
Page 22 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Switching Characteristics
Over the Operating Range[17, 18]
Parameter
Description
tPOWER[19]
133 MHz
100 MHz
Unit
Min
Max
Min
Max
1
–
1
–
ms
7.5
–
10
–
ns
Clock
tCYC
Clock Cycle Time
tCH
Clock HIGH
2.5
–
3.0
–
ns
tC]L
Clock LOW
2.5
–
3.0
–
ns
Output Times
tCDV
Data Output Valid After CLK Rise
–
6.5
–
8.5
ns
tDOH
Data Output Hold After CLK Rise
2.5
–
2.5
–
ns
tCLZ
Clock to Low Z [20, 21, 22]
3.0
–
3.0
–
ns
tCHZ
Clock to High Z
[20, 21, 22]
–
3.8
–
4.5
ns
tOEV
OE LOW to Output Valid
–
3.0
–
3.8
ns
0
–
0
–
ns
–
3.0
–
4.0
ns
[20, 21, 22]
tOELZ
OE LOW to Output Low Z
tOEHZ
OE HIGH to Output High Z [20, 21, 22]
Setup Times
tAS
Address Setup Before CLK Rise
1.5
–
1.5
–
ns
tALS
ADV/LD Setup Before CLK Rise
1.5
–
1.5
–
ns
tWES
WE, BWX Setup Before CLK Rise
1.5
–
1.5
–
ns
tCENS
CEN Setup Before CLK Rise
1.5
–
1.5
–
ns
tDS
Data Input Setup Before CLK Rise
1.5
–
1.5
–
ns
tCES
Chip Enable Setup Before CLK Rise
1.5
–
1.5
–
ns
tAH
Address Hold After CLK Rise
0.5
–
0.5
–
ns
tALH
ADV/LD Hold After CLK Rise
0.5
–
0.5
–
ns
Hold Times
tWEH
WE, BWX Hold After CLK Rise
0.5
–
0.5
–
ns
tCENH
CEN Hold After CLK Rise
0.5
–
0.5
–
ns
tDH
Data Input Hold After CLK Rise
0.5
–
0.5
–
ns
tCEH
Chip Enable Hold After CLK Rise
0.5
–
0.5
–
ns
Notes
17. Timing reference level is 1.25 V when VDDQ = 2.5 V.
18. Test conditions shown in (a) of Figure 4 on page 22 unless otherwise noted.
19. This part has a voltage regulator internally; tPOWER is the time that the power is supplied above VDD(minimum) initially, before a read or write operation can be initiated.
20. tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of Figure 4 on page 22. Transition is measured ±200 mV from steady-state voltage.
21. At any supplied voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data
bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve
High Z before Low Z under the same system conditions.
22. This parameter is sampled and not 100% tested.
Document Number: 001-15013 Rev. *H
Page 23 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Switching Waveforms
Figure 5 shows read-write timing waveform.[23, 24, 25]
Figure 5. Read/Write Timing
1
2
3
t CYC
4
5
A3
A4
6
7
8
9
A5
A6
A7
10
CLK
t CENS
t CENH
t CES
t CEH
t CH
t CL
CEN
CE
ADV/LD
WE
BW X
A1
ADDRESS
t AS
A2
t CDV
t AH
t DOH
t CLZ
DQ
D(A1)
t DS
D(A2)
Q(A3)
D(A2+1)
t OEV
Q(A4+1)
Q(A4)
t OELZ
W RITE
D(A1)
W RITE
D(A2)
D(A5)
Q(A6)
D(A7)
W RITE
D(A7)
DESELECT
t OEHZ
t DH
OE
COM M AND
t CHZ
BURST
W RITE
D(A2+1)
READ
Q(A3)
READ
Q(A4)
DON’T CARE
BURST
READ
Q(A4+1)
t DOH
W RITE
D(A5)
READ
Q(A6)
UNDEFINED
Notes
23. For this waveform ZZ is tied LOW.
24. When CE is LOW, CE1 is LOW, CE2 is HIGH, and CE3 is LOW. When CE is HIGH, CE1 is HIGH, CE2 is LOW or CE3 is HIGH.
25. Order of the Burst sequence is determined by the status of the MODE (0 = Linear, 1 = Interleaved). Burst operations are optional.
Document Number: 001-15013 Rev. *H
Page 24 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Switching Waveforms (continued)
[26, 27, 28]
Figure 6 shows NOP, STALL and DESELECT Cycles waveform.
Figure 6. NOP, STALL and DESELECT Cycles
1
2
A1
A2
3
4
5
A3
A4
6
7
8
9
10
CLK
CEN
CE
ADV/LD
WE
BW [A:D]
ADDRESS
A5
t CHZ
D(A1)
DQ
Q(A2)
Q(A3)
D(A4)
Q(A5)
t DOH
COMMAND
WRITE
D(A1)
READ
Q(A2)
STALL
READ
Q(A3)
WRITE
D(A4)
DON’T CARE
STALL
NOP
READ
Q(A5)
DESELECT
CONTINUE
DESELECT
UNDEFINED
Notes
26. For this waveform ZZ is tied LOW.
27. When CE is LOW, CE1 is LOW, CE2 is HIGH, and CE3 is LOW. When CE is HIGH, CE1 is HIGH, CE2 is LOW or CE3 is HIGH.
28. The IGNORE CLOCK EDGE or STALL cycle (Clock 3) illustrates CEN being used to create a pause. A write is not performed during this cycle.
Document Number: 001-15013 Rev. *H
Page 25 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Switching Waveforms (continued)
Figure 7 shows ZZ Mode timing waveform.
[29, 30]
Figure 7. ZZ Mode Timing
CLK
t
ZZ
I
t ZZREC
ZZ
t ZZI
SUPPLY
I DDZZ
t RZZI
ALL INPUTS
(except ZZ)
Outputs (Q)
DESELECT or READ Only
High-Z
DON’T CARE
Notes
29. Device must be deselected when entering ZZ mode. See Truth Table on page 12 for all possible signal conditions to deselect the device.
30. DQs are in high Z when exiting ZZ sleep mode.
Document Number: 001-15013 Rev. *H
Page 26 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Ordering Information
Cypress offers other versions of this type of product in different configurations and features. The following table contains only the list
of parts that are currently available.
For a complete listing of all options, visit the Cypress website at www.cypress.com and refer to the product summary page at
http://www.cypress.com/products, or contact your local sales representative.
Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives and distributors. To find the
office closest to you, visit us at http://www.cypress.com/go/datasheet/offices.
Speed
(MHz)
133
Package
Diagram
Ordering Code
CY7C1471BV25-133AXI
Part and Package Type
51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free
Operating
Range
lndustrial
Ordering Code Definitions
CY 7C 1471 B V25 - 133 AX
I
Temperature Range:
I = Industrial
Package Type:
AX = 100-pin TQFP (Pb-free)
Frequency Range: 133 MHz
V25 = 2.5 V
Die Revision
1471 = FT, 2 Mb × 36 (72 Mb)
Marketing Code: 7C = SRAM
Company ID: CY = Cypress
Document Number: 001-15013 Rev. *H
Page 27 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Package Diagrams
Figure 8. 100-pin TQFP (14 × 20 × 1.4 mm), 51-85050
51-85050 *D
Document Number: 001-15013 Rev. *H
Page 28 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Package Diagrams (continued)
Figure 9. 165-ball FBGA (15 × 17 × 1.4 mm), 51-85165
51-85165 *B
Document Number: 001-15013 Rev. *H
Page 29 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Package Diagrams (continued)
Figure 10. 209-ball FBGA (14 × 22 × 1.76 mm), 51-85167
51-85167 *A
Document Number: 001-15013 Rev. *H
Page 30 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Acronyms
Document Conventions
Acronym
Description
Units of Measure
BWS
byte write select
BGA
ball grid array
°C
degree Celcius
CMOS
complementary metal oxide semiconductor
µA
micro Amperes
FBGA
fine-pitch ball grid array
mA
milli Amperes
I/O
input/output
mm
milli meter
JTAG
Joint Test Action Group
ms
milli seconds
LSB
least significant bit
MHz
Mega Hertz
MSB
most significant bit
ns
nano seconds
OE
output enable

Ohms
SRAM
static random access memory
%
percent
TAP
test access port
pF
pico Farad
TCK
test clock
V
Volts
TDI
test data-in
W
Watts
TDO
test data-out
TMS
test mode select
TQFP
thin quad flat pack
TTL
transistor transistor logic
WE
write enable
Document Number: 001-15013 Rev. *H
Symbol
Unit of Measure
Page 31 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
Document History Page
Document Title: CY7C1471BV25/CY7C1473BV25/CY7C1475BV25, 72-Mbit (2 M × 36/4 M × 18/1 M × 72) Flow-Through SRAM
with NoBL™ Architecture
Document Number: 001-15013
REV.
ECN NO.
Issue Date
**
1024500
See ECN
Orig. of
Change
Description of Change
VKN/KKVTMP New Data Sheet
*A
1274731
See ECN
VKN/AESA
Corrected typo in the “NOP, STALL and DESELECT Cycles” waveform
*B
1562503
See ECN
VKN/AESA
Removed 1.8V IO offering from the data sheet
*C
1897447
See ECN
VKN/AESA
*D
2082487
See ECN
VKN
*E
2159486
See ECN
VKN/PYRS
*F
2898501
03/24/2010
NJY
Removed inactive part numbers from Ordering Information table; Updated
package diagrams.
*G
3207526
03/28/2011
NJY
Updated Ordering Information and added Ordering Code Definitions.
Updated Package Diagrams.
Updated in new template.
*H
3256583
05/13/2011
NJY
Added Acronyms and Units of Measure.
Document Number: 001-15013 Rev. *H
Added footnote 14 related to IDD
Converted from preliminary to final
Minor Change-Moved to the external web
Page 32 of 33
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CY7C1471BV25
CY7C1473BV25, CY7C1475BV25
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© Cypress Semiconductor Corporation, 2007-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
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Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-15013 Rev. *H
Revised May 13, 2011
Page 33 of 33
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