Harris CD74HCT373E High speed cmos logic octal transparent latch, three-state output Datasheet

CD74HC373, CD74HCT373,
CD54HC573, CD74HC573,
CD74HCT573
S E M I C O N D U C T O R
November 1997
High Speed CMOS Logic
Octal Transparent Latch, Three-State Output
Features
Description
• Common Latch Enable Control
The Harris CD74HC373, CD74HCT373, CD54HC573,
CD74HC573, and CD74HCT573 are high speed Octal Transparent Latches manufactured with silicon gate CMOS technology. They possess the low power consumption of standard
CMOS integrated circuits, as well as the ability to drive 15
LSTTL devices. The CD74HCT373 and CD74HCT573 are
functionally as well as pin compatible with the standard
74LS373 and 74LS573.
• Common Three-State Output Enable Control
• Buffered Inputs
• Three-State Outputs
• Bus Line Driving Capacity
• Typical Propagation Delay = 12ns at VCC = 5V,
CL = 15pF, TA = 25oC (Data to Output for HC373)
The outputs are transparent to the inputs when the latch
enable (LE) is high. When the latch enable (LE) goes low the
data is latched. The output enable (OE) controls the threestate outputs. When the output enable (OE) is high the
outputs are in the high impedance state. The latch operation
is independent to the state of the output enable. The 373 and
573 are identical in function and differ only in their pinout
arrangements.
• Fanout (Over Temperature Range)
- Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55oC to 125oC
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL
Logic ICs
Ordering Information
• HC Types
- 2V to 6V Operation
- High Noise Immunity: NIL = 30%, NIH = 30% of VCC
at VCC = 5V
TEMP. RANGE
(oC)
PACKAGE
CD54HC573F
-55 to 125
20 Ld CERDIP
F20.3
CD74HC373E
-55 to 125
20 Ld PDIP
F20.3
CD74HCT373E
-55 to 125
20 Ld PDIP
E20.3
CD74HC573E
-55 to 125
20 Ld PDIP
E20.3
CD74HCT573E
-55 to 125
20 Ld PDIP
E20.3
CD74HC373M
-55 to 125
20 Ld SOIC
M20.3
CD74HCT373M
-55 to 125
20 Ld SOIC
M20.3
CD74HC573M
-55 to 125
20 Ld SOIC
M20.3
CD74HCT573M
-55 to 125
20 Ld SOIC
M20.3
PART NUMBER
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
VIL= 0.8V (Max), VIH = 2V (Min)
- CMOS Input Compatibility, Il ≤ 1µA at VOL, VOH
PKG.
NO.
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer or die for this part number are available which meets all
electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
© Harris Corporation 1997
1
File Number
1679.1
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
Pinout
CD74HC373, CD74HCT373
(PDIP, SOIC)
TOP VIEW
CD54HC573, CD74HC573, CD74HCT573
(PDIP, SOIC, CERDIP)
TOP VIEW
OE 1
20 VCC
OE 1
Q0 2
19 Q7
D0 2
19 Q0
D0 3
18 D7
D1 3
18 Q1
20 VCC
D1 4
17 D6
D2 4
17 Q2
Q1 5
16 Q6
D3 5
16 Q3
Q2 6
15 Q5
D4 6
15 Q4
D2 7
14 D5
D5 7
14 Q5
D3 8
13 D4
D6 8
13 Q6
Q3 9
12 Q4
D7 9
12 Q7
GND 10
11 LE
GND 10
11 LE
Functional Block Diagrams
CD74HC373, CD74HCT373, CD74HC573, CD74HCT573
D0
D1
D
G
D2
D
G
O
D3
D
G
O
D4
D
D
G
O
D5
G
O
D6
D
G
O
D7
D
G
O
D
G
O
O
LE
OE
O0
O1
O2
O3
O4
O5
O6
O7
CD74HCT573
D0
D1
D
O
D2
D
G
O
D3
D
G
O
D4
D
G
O
D5
D
G
O
D6
D
G
O
D7
D
G
O
D
G
O
G
LE
OE
O0
O1
O2
O3
O4
O5
O6
O7
TRUTH TABLE
OUTPUT ENABLE
LATCH ENABLE
DATA
OUTPUT
L
H
H
H
L
H
L
L
L
L
l
L
L
L
h
H
H
X
X
Z
NOTE: H = High Voltage Level, L = Low Voltage Level, X = Don’t Care, Z = High Impedance State, l = Low voltage level one set-up time prior
to the high to low latch enable transition, h = High voltage level one set-up time prior to the high to low latch enable transition.
2
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
Absolute Maximum Ratings
Thermal Information
DC Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, IIK
For VI < -0.5V or VI > VCC + 0.5V . . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, IOK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Drain Current, per Output, IO
For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA
DC Output Source or Sink Current per Output Pin, IO
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .±50mA
Thermal Resistance (Typical, Note 3). . . . θJA (oC/W)
θJA (oC/W)
PDIP Package . . . . . . . . . . . . . . . . . . .
125
N/A
CERDIP Package . . . . . . . . . . . . . . . .
85
24
SOIC Package . . . . . . . . . . . . . . . . . . .
120
N/A
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, VCC
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
DC Electrical Specifications
TEST
CONDITIONS
PARAMETER
SYMBOL
VI (V)
VIH
-
25oC
IO (mA) VCC (V)
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
2
1.5
-
-
1.5
-
1.5
-
V
4.5
3.15
-
-
3.15
-
3.15
-
V
6
4.2
-
-
4.2
-
4.2
-
V
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
VIL
VOH
-
VIH or
VIL
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
VOL
VIH or
VIL
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
-
-
2
-
-
0.5
-
0.5
-
0.5
V
4.5
-
-
1.35
-
1.35
-
1.35
V
6
-
-
1.8
-
1.8
-
1.8
V
-0.02
2
1.9
-
-
1.9
-
1.9
-
V
-0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
-0.02
6
5.9
-
-
5.9
-
5.9
-
V
-6
4.5
3.98
-
-
3.84
-
3.7
-
V
-7.8
6
5.48
-
-
5.34
-
5.2
-
V
0.02
2
-
-
0.1
-
0.1
-
0.1
V
0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
0.02
6
-
-
0.1
-
0.1
-
0.1
V
6
4.5
-
-
0.26
-
0.33
-
0.4
V
7.8
6
-
-
0.26
-
0.33
-
0.4
V
II
VCC or
GND
-
6
-
-
±0.1
-
±1
-
±1
µA
ICC
VCC or
GND
0
6
-
-
8
-
80
-
160
µA
3
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
DC Electrical Specifications
(Continued)
TEST
CONDITIONS
25oC
SYMBOL
VI (V)
IO (mA) VCC (V)
-
VIL or
VIH
VO =
VCC or
GND
High Level Input
Voltage
VIH
-
Low Level Input
Voltage
VIL
High Level Output
Voltage
CMOS Loads
VOH
PARAMETER
Three-State Leakage
Current
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
6
-
-
±0.5
-
±5
-
±10
µA
-
4.5 to
5.5
2
-
-
2
-
2
-
V
-
-
4.5 to
5.5
-
-
0.8
-
0.8
-
0.8
V
VIH or
VIL
-0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
-6
4.5
3.98
-
-
3.84
-
3.7
-
V
-7.8
6
5.48
-
-
5.34
-
5.2
-
V
0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
6
4.5
-
-
0.26
-
0.33
-
0.4
V
7.8
6
-
-
0.26
-
0.33
-
0.4
V
HCT TYPES
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
VIH or
VIL
VOL
Low Level Output
Voltage
TTL Loads
II
VCC to
GND
-
5.5
-
-
±0.1
-
±1
-
±1
µA
ICC
VCC or
GND
0
5.5
-
-
8
-
80
-
160
µA
Three-State Leakage
Current
-
VIL or
VIH
VO =
VCC or
GND
6
-
-
±0.5
-
±5
-
±10
µA
Additional Quiescent
Device Current Per
Input Pin: 1 Unit Load
(Note 4)
∆ICC
VCC
-2.1
-
4.5 to
5.5
-
100
360
-
450
-
490
µA
Input Leakage
Current
Quiescent Device
Current
NOTE:
4. For dual-supply systems theoretical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
HCT Input Loading Table
UNIT LOADS
INPUT
HCT373
HCT573
OE
1.5
1.25
Dn
0.4
0.3
LE
0.6
0.65
NOTE: Unit Load is ∆ICC limit specified in DC Electrical Specifications table, e.g., 360µA max at 25oC.
4
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
Prerequisite For Switching Specifications
PARAMETER
25oC
-40oC TO 85oC -55oC TO 125oC
SYMBOL
TEST
CONDITIONS
VCC
(V)
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
tW
-
2
80
-
-
100
-
120
-
ns
4.5
16
-
-
20
-
24
-
ns
6
14
-
-
17
-
20
-
ns
2
50
-
-
65
-
75
-
ns
4.5
10
-
-
13
-
15
-
ns
6
9
-
-
11
-
13
-
ns
HC TYPES
LE Pulse Width
Set-up Time Data to LE
tSU
Hold Time, Data to LE
(573)
-
tH
Hold Time, Data to LE
(373)
-
tH
-
2
40
-
-
50
-
60
-
ns
4.5
8
-
-
10
-
12
-
ns
6
7
-
-
9
-
10
-
ns
2
5
-
-
5
-
5
-
ns
4.5
5
-
-
5
-
5
-
ns
6
5
-
-
5
-
5
-
ns
HCT TYPES
LE Pulse Width
tw
-
4.5
16
-
-
20
-
24
-
ns
Set-up Time Data to LE
tw
-
4.5
13
-
-
16
-
20
-
ns
Hold Time, Data to LE
tH
-
4.5
10
-
-
13
-
15
-
ns
Switching Specifications
PARAMETER
Input tr, tf = 6ns
SYMBOL
TEST
CONDITIONS
tPLH, tPHL
CL = 50pF
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
2
-
150
190
225
ns
4.5
-
30
38
45
ns
6
-
26
33
38
ns
CL = 15pF
5
12
-
-
-
ns
CL = 50pF
2
-
175
220
265
ns
4.5
-
35
44
53
ns
6
-
30
37
45
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
2
-
175
220
265
ns
4.5
-
35
44
53
ns
6
-
30
37
45
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
2
-
150
190
225
ns
4.5
-
30
38
45
ns
6
-
26
33
38
ns
5
12
-
-
-
ns
HC TYPES
Propagation Delay,
Data to Qn
(HC/HCT373)
Propagation Delay,
Data to Qn
(HC/HCT573)
Propagation Delay,
LE to Qn
Output Enabling Time
tPLH, tPHL
tPLH, tPHL
tPZL, tPZH
CL = 15pF
5
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
Switching Specifications
PARAMETER
Output Disabling Time
Output Transition Time
Input tr, tf = 6ns (Continued)
SYMBOL
TEST
CONDITIONS
tPLZ, tPHZ
CL = 50pF
tTLH, tTHL
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
2
-
150
190
225
ns
4.5
-
30
38
45
ns
6
-
26
33
38
ns
CL = 15pF
5
12
-
-
-
ns
CL = 50pF
2
-
60
75
90
ns
4.5
-
12
15
18
ns
6
-
10
13
15
ns
Input Capacitance
CI
-
-
-
10
10
10
pF
Three-State Output
Capacitance
CO
-
-
-
20
20
20
pF
Power Dissipation
Capacitance
(Notes 5, 6)
CPD
-
5
51
-
-
-
pF
CL = 50pF
4.5
-
32
40
48
ns
CL = 15pF
5
13
-
-
-
ns
CL = 50pF
4.5
-
35
44
53
ns
CL = 15pF
5
17
-
-
-
ns
CL = 50pF
4.5
-
35
44
53
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
4.5
-
35
44
53
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
4.5
-
35
44
53
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
4.5
-
12
15
18
ns
HCT TYPES
Propagation Delay,
Data to Qn
(HC/HCT373)
tPLH, tPHL
Propagation Delay,
Data to Qn
(HC/HCT573)
tPLH, tPHL
Propagation Delay,
LE to Qn
tPLH, tPHL
Output Enabling Time
tPZL, tPZH
Output Disabling Time
Output Transition Time
tPLZ, tPZH
tTLH, tTHL
Input Capacitance
CI
-
-
-
10
10
10
pF
Three-State Output
Capacitance
CO
-
-
-
20
20
20
pF
Power Dissipation
Capacitance
(Notes 5, 6)
CPD
-
5
53
-
-
-
pF
NOTES:
5. CPD is used to determine the no-load dynamic power consumption, per latch.
6. PD (total power per latch) = VCC2 fi (CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
6
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
Test Circuits and Waveforms
tWL + tWH =
tfCL
trCL
50%
10%
10%
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tf = 6ns
tr = 6ns
GND
tTHL
tTLH
90%
INVERTING
OUTPUT
tPHL
FIGURE 3. HC TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
trCL
VCC
tfCL
GND
1.3V
0.3V
GND
tH(H)
tH(L)
VCC
DATA
INPUT
3V
2.7V
CLOCK
INPUT
50%
tH(H)
tPLH
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfCL
10%
tTLH
1.3V
10%
tPLH
90%
GND
tTHL
90%
50%
10%
trCL
3V
2.7V
1.3V
0.3V
INPUT
INVERTING
OUTPUT
GND
tWH
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For fMAX, input duty cycle = 50%.
VCC
90%
50%
10%
1.3V
1.3V
tWL
tf = 6ns
tPHL
1.3V
0.3V
tWH
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
INPUT
2.7V
0.3V
GND
tr = 6ns
DATA
INPUT
50%
tH(L)
3V
1.3V
1.3V
1.3V
GND
tSU(H)
tSU(H)
tSU(L)
tTLH
90%
OUTPUT
tTHL
90%
50%
10%
tTLH
90%
1.3V
OUTPUT
tREM
3V
SET, RESET
OR PRESET
GND
tTHL
1.3V
10%
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
tPHL
1.3V
GND
IC
CL
50pF
GND
90%
tPLH
50%
IC
tSU(L)
tPHL
tPLH
I
fCL
3V
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For fMAX, input duty cycle = 50%.
tREM
VCC
SET, RESET
OR PRESET
tfCL = 6ns
CLOCK
50%
50%
tWL
CLOCK
INPUT
tWL + tWH =
trCL = 6ns
VCC
90%
CLOCK
I
fCL
CL
50pF
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
Test Circuits and Waveforms
6ns
(Continued)
6ns
OUTPUT
DISABLE
90%
50%
10%
2.7
1.3
OUTPUT HIGH
TO OFF
50%
OUTPUTS
ENABLED
OUTPUTS
DISABLED
FIGURE 7. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
IC WITH
THREESTATE
OUTPUT
GND
1.3V
tPZH
90%
1.3V
OUTPUTS
ENABLED
OUTPUTS
ENABLED
0.3
10%
tPHZ
tPZH
90%
3V
tPZL
tPLZ
OUTPUT LOW
TO OFF
50%
OUTPUT HIGH
TO OFF
6ns
GND
10%
tPHZ
tf
OUTPUT
DISABLE
tPZL
tPLZ
OUTPUT LOW
TO OFF
6ns
tr
VCC
OUTPUTS
DISABLED
OUTPUTS
ENABLED
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
OUTPUT
RL = 1kΩ
CL
50pF
VCC FOR tPLZ AND tPZL
GND FOR tPHZ AND tPZH
NOTE: Open drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test circuit is Output RL = 1kΩ to
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
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