CEL GET-BC-0006 Qualification test results on si mmic Datasheet

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GET-BE-OOO61/4
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Qualification Test Report
Si MMIC
(useon
UHSO
Process)
Prepared
on :June26,2003
i£.( fJi$;
by:
YASUSHISATOH
Assistant Manager
Approved by :
J. f~~.().Io-'J"~TOSHIAKI
YOKOKA W A
Manager
Reliability and QC Department
NEC CompoundSemiconductor
Devices,LTD.
,
I.'
,
GET-BE-0006 2/4
1. Introduction
This report presents UHSO (fT =25GHz) Process Qualification Test result.
The Process Qualification Test was performed by UPC8182B(B).
2. Qualification Test items and failure criteria
2. 1
Thermal Environmental Test
(Table. 1.2)
2.2
Mechanical Environmental Test
(Table. 1.2)
2. 3
High Temperature DC Bias Test
(Table. 1.2)
3. Result
3.1 Thermal and Mechanical Environmental Test
As shown Table 3.no failure was observed with respect to thermal environmental test and
mechanical environmental test.
3.2 High Temperature DC Bias Test
High temperature
DC bias test at Ta=200t
was performed for UPC8182B(B) using 100
samples. The test was performed for 3000 hours. The test results are shown Table 3.No
failure has been observed for 3000 hours. LlIcc change is shown in Fig.1.
GET-BE-0006 3/4
Table I
Test Item and Test Condition
Test Items
Test Condition
Sample
MIL-STD 883 Method
Size
Thermal Environmental Test
,
a)Solderability
2003
b)Temperature Cycling
c)Thermal Shock
1010:Cond.D -65'C
1011:Cond.A O'C
d)Moisture Resistance
1004:0mit initial conditioning
e)Hermetic Seal
1071
+200'C.IOOcycles
+100'C.15cycles
8
Fine Leak (Cond.Al)
1 X 10-9 Pa m3/s (-1 X 10-8 atmcdsec)
Gross Leak (Cond.C)
no stream bubble
Mechanical Environmental Test
a)Mechanical Shock
2002: 1.47 x 104rn/s2(1500G).0.5ms.3axis.5times
b)Vibration. Variable
2007:100
2000Hz. 196rn/S2(20G).3axis.
Frequency
c)Constant Acceleration
4min.4times
2001: 1.96 x 105rn/s2(20000G).3axis.1min..1time
d)Hermetic Seal
1071
8
Fine Leak (Cond.A1)
1 X 10- 9 Pa m3/s (-1 X 10-8 atmcdsec)
Gross Leak (Cond.C)
no stream bubble
Hi
erature DC Bias Test
1005:Ta=200'C.Vcc=3V.t=3000Hrs
100
Table 2 Parameters and Criteria
Limits
Parameters
Symbols
Circuit Current
Power Gain
Output
Power
Test Condition
Delta Criteria
Vcc=3V
Min
-
Max
38mA
G 1
Vcc=3V.f=0.9GHz
19dB
25dB
-
G 2
Vcc=3V,f=1.9GHz
18dB
24dB
-
G 3
Vcc=3V,f=2.4GHz
18dB
24dB
-
Pout
Vcc=3V,f=2.4GHz
7 dBm
-
-
-
6.5dB
-
Icc
:t 15%
Pin=-5dBm
Noise Fi ure
~~_._"_.
NF
Vcc=3V.f=2.4GHZ
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GET-BE-OOO6 4/4
Table 3
Qualification Test Results
Results
Test
Items
"
lfailure/sample!
\
Reference
Thermal Environmental Test
0/8
-
Mechanical Environmental Test
0/8
-
High Temp. DC Bias Test
0/100
-
(at 3000Hrs)
1
*
g
;
~
~
LlIcc
15.00%
10.00%
5.00%
~MAX
-e:- AVE
0.00%
-.- MIN
-5.00%
-10.00%
-15.00%
0
168
336
1000
hours
2000
3000
Fig.1 Icc changeson high temperature DC Bias Test.
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