Samsung K6T2008V2A-YB85 256kx8 bit low power and low voltage cmos static ram Datasheet

K6T2008V2A, K6T2008U2A Family
CMOS SRAM
Document Title
256Kx8 bit Low Power and Low Voltage CMOS Static RAM
Revision History
Revision No.
History
Draft Data
Remark
0.0
Design target
May 26, 1998
Advance
1.0
Finalize
October 8, 1998
Final
2.0
Revised
- Add FBGA type package
July 21, 1999
Final
2.01
Errata correction
- Removed T
’ TL Compatible’from Features
October 24, 2001
Final
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions. If you have any questions, please contact the SAMSUNG branch offices.
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
256Kx8 bit Low Power and Low Voltage CMOS Static RAM
FEATURES
GENERAL DESCRIPTION
• Process Technology: TFT
• Organization: 256Kx8
• Power Supply Voltage
K6T2008V2A Family: 3.0V~3.6V
K6T2008U2A Family: 2.7V~3.3V
• Low Data Retention Voltage: 2V(Min)
• Three State Outputs
• Package Type: 32-TSOP1-0820F, 32-TSOP1-0813.4F
48-FBGA-6.00x7.00
The K6T2008V2A and K6T2008U2A families are fabricated by
SAMSUNG′s advanced CMOS process technology. The family support various operating temperature ranges and have
various package types for user flexibility of system design. The
family also support low data retention voltage for battery backup operation with low data retention current.
PRODUCT FAMILY
Power Dissipation
Product Family
K6T2008V2A-B
Operating Temperature Vcc Range
Commercial(0~70°C)
K6T2008U2A-B
K6T2008V2A-F
Speed
3.0~3.6V
70/85ns
2.7~3.3V
1)
K6T2008U2A-F
Operating
(ICC2,Max)
10µA
70 /85/100ns
3.0~3.6V
Industrial(-40~85°C)
Standby
(ISB1, Max)
30mA2)
15µA
701)/85/100ns
PKG Type
32-TSOP1-0820F
32-TSOP1-0813.4F
48-FBGA-6.00x7.00
2.7~3.3V
1. The parameters are tested with 30pF test load
2. K6T2008V2A Family = 35mA
PIN DESCRIPTION
A11
A9
A8
A13
WE
CS2
A15
VCC
A17
A16
A14
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32-TSOP1
32-sTSOP1
Type - Forward
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
FUNCTIONAL BLOCK DIAGRAM
OE
A10
CS1
I/O8
I/O7
I/O6
I/O5
I/O4
VSS
I/O3
I/O2
I/O1
A0
A1
A2
A3
1
2
3
4
5
6
A
A0
A1
CS2
A3
A6
A8
B
I/O5
A2
WE
A4
A7
I/O1
C
I/O6
NC
A5
D
Vss
Vcc
E
Vcc
Vss
F
I/O7
G
I/O8
H
A9
Clk gen.
Precharge circuit.
A16
A15
I/O2
A14
A13
A12
A11
Memory array
1024 rows
256×8 columns
Row
select
A10
NC
A17
OE
CS1
A16
A15
I/O4
A10
A11
A12
A13
A14
A9
I/O3
A8
A7
I/O1
I/O8
48-FBGA: Top View (Ball Down)
Name
Function
CS1,CS2 Chip Select Inputs
Name
Function
I/O Circuit
Column select
Data
cont
I/O1~I/O8 Data Inputs/Outputs
OE
Output Enable Input
Vcc
Power
WE
Write Enable Input
Vss
Ground
Address Inputs
NC
No Connection
A0~A17
Data
cont
A0
A1 A17 A6 A5 A4 A3
A2
CS 1
CS 2
WE
Control
logic
OE
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
PRODUCT LIST
Commercial Temperature Products(0~70°C)
Part Name
Industrial Temperature Products(-40~85°C)
Function
Part Name
K6T2008V2A-TB70
K6T2008V2A-TB85
32-TSOP1-F, 70ns, 3.3V,LL
32-TSOP1-F, 85ns, 3.3V,LL
K6T2008U2A-TB70
K6T2008U2A-TB85
K6T2008U2A-TB10
32-TSOP1-F, 70ns, 3.0V, LL
32-TSOP1-F, 85ns, 3.0V, LL
32-TSOP1-F, 100ns, 3.0V, LL
K6T2008V2A-YB70
K6T2008V2A-YB85
32-sTSOP1-F, 70ns, 3.3V,LL
32-sTSOP1-F, 85ns, 3.3V,LL
K6T2008U2A-YB70
K6T2008U2A-YB85
K6T2008U2A-YB10
32-sTSOP1-F, 70ns, 3.0V, LL
32-sTSOP1-F, 85ns, 3.0V, LL
32-sTSOP1-F, 100ns, 3.0V, LL
Function
K6T2008V2A-TF70
K6T2008V2A-TF85
K6T2008V2A-TF10
32-TSOP1-F, 70ns, 3.3V, LL
32-TSOP1-F, 85ns, 3.3V, LL
32-TSOP1-F, 100ns, 3.3V, LL
K6T2008U2A-TF70
K6T2008U2A-TF85
K6T2008U2A-TF10
32-TSOP1-F, 70ns, 3.0V, LL
32-TSOP1-F, 85ns, 3.0V, LL
32-TSOP1-F, 100ns, 3.0V, LL
K6T2008V2A-YF70
K6T2008V2A-YF85
K6T2008V2A-YF10
32-sTSOP1-F, 70ns, 3.3V, LL
32-sTSOP1-F, 85ns, 3.3V, LL
32-sTSOP1-F, 100ns, 3.3V, LL
K6T2008U2A-YF70
K6T2008U2A-YF85
K6T2008U2A-YF10
32-sTSOP1-F, 70ns, 3.0V, LL
32-sTSOP1-F, 85ns, 3.0V, LL
32-sTSOP1-F, 100ns, 3.0V, LL
K6T2008V2A-FF70
K6T2008V2A-FF85
48-FBGA, 70ns, 3.3V, LL
48-FBGA, 85ns, 3.3V, LL
K6T2008U2A-FF70
K6T2008U2A-FF85
48-FBGA, 70ns, 3.0V, LL
48-FBGA, 85ns, 3.0V, LL
FUNCTIONAL DESCRIPTION
CS1
CS2
OE
WE
I/O
Mode
Power
1)
X
1)
X
High-Z
Deselected
Standby
X1)
X1)
High-Z
Deselected
Standby
H
H
H
High-Z
Output Disabled
Active
H
L
H
Dout
Read
Active
H
X1)
L
Din
Write
Active
H
X
X1)
L
L
L
L
1)
1. X means don′t care (Must be in high or low states)
ABSOLUTE MAXIMUM RATINGS1)
Item
Voltage on any pin relative to Vss
Voltage on Vcc supply relative to Vss
Power Dissipation
Storage temperature
Operating Temperature
Symbol
Ratings
Unit
Remark
VIN,VOUT
-0.5 to VCC+0.5
V
-
VCC
-0.3 to 4.6
V
-
PD
1.0
W
-
TSTG
-65 to 150
°C
-
0 to 70
°C
K6T2008V2A-B, K6T2008U2A-B
-40 to 85
°C
K6T2008V2A-F, K6T2008U2A-F
TA
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
RECOMMENDED DC OPERATING CONDITIONS1)
Item
Symbol
Product
Min
Typ
Max
Unit
Supply voltage
Vcc
K6T2008V2A Family
K6T2008U2A Family
3.0
2.7
3.3
3.0
3.6
3.3
V
Ground
Vss
All Family
0
0
0
V
Input high voltage
VIH
K6T2008V2A, K6T2008U2A Family
2.2
-
Vcc+0.3
V
Input low voltage
VIL
K6T2008V2A, K6T2008U2A Family
-0.33)
-
0.6
V
Note:
1. Commercial Product: TA=0 to 70°C, otherwise specified
Industrial Produc t: TA=-40 to 85°C, otherwise specified
2. Overshoot: Vcc+2.0V in case of pulse width≤30ns
3. Undershoot: -2.0V in case of pulse width≤30ns
4. Overshoot and undershoot are sampled, not 100% tested.
CAPACITANCE1) (f=1MHz, TA=25°C)
Symbol
Test Condition
Min
Max
Unit
Input capacitance
Item
CIN
VIN=0V
-
8
pF
Input/Output capacitance
CIO
VIO=0V
-
10
pF
1. Capacitance is sampled, not 100% tested
DC AND OPERATING CHARACTERISTICS
Item
Input leakage current
Symbol
Test Conditions
Min Typ Max Unit
µA
ILI
VIN=Vss to Vcc
-1
-
1
Output leakage current
ILO
CS1=VIH or CS2=VIL or OE=VIH or WE=VIL, VIO=Vss to Vcc
-1
-
1
µA
Operating power supply current
ICC
IIO=0mA, CS1=VIL, CS 2=VIH, VIN=VIH or VIL
-
-
5
mA
ICC1
Cycle time=1µs, 100%duty, IIO=0mA, CS1≤0.2V, CS2 ≥Vcc-0.2V, VIN≤0.2V
or VIN≥VCC-0.2V
-
-
4
mA
ICC2
Cycle time=Min, 100% duty, IIO=0mA, CS1=VIL, CS2=VIH, VIN =VIH or VIL
-
25
301)
mA
Output low voltage
VOL
IOL=2.1mA
-
-
0.4
V
Output high voltage
VOH
IOH=-1.0mA
2.4
-
-
V
Standby Current(TTL)
ISB
CS1=VIH, CS 2=VIL, Other inputs = VIH or VIL
-
-
0.3
mA
Standby Current(CMOS)
ISB1
CS1≥Vcc-0.2V, CS2≥Vcc-0.2V or CS2≤0.2V, Other inputs=0~Vcc
-
0.2
102)
µA
Average operating current
1. K6T2008V2A Family = 35mA
2. Industrial product = 15µA
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
AC OPERATING CONDITIONS
TEST CONDITIONS( Test Load and Input/Output Reference)
Input pulse level: 0.4 to 2.2V
Input rising and falling time: 5ns
Input and output reference voltage: 1.5V
Output load(see right): CL=100pF+1TTL
CL=30pF+1TTL
CL1)
1. Including scope and jig capacitance
AC CHARACTERISTICS (K6T2008V2A Family: VCC=3.0~3.6V, K6T2008U2A Family: VCC=2.7~3.3V
Commercial Product: TA=0 to 70°C, Industrial Product: TA=-40 to 85°C)
Speed Bins
Parameter List
Symbol
Units
100ns
Min
Max
Min
Max
Min
Max
70
-
85
-
100
-
ns
Address access time
tAA
-
70
-
85
-
100
ns
Chip select to output
tCO1, tCO2
-
70
-
85
-
100
ns
Output enable to valid output
tOE
-
35
-
40
-
50
ns
Chip select to low-Z output
tLZ
10
-
10
-
10
-
ns
tOLZ
5
-
5
-
5
-
ns
Output enable to low-Z output
Chip disable to high-Z output
tHZ
0
25
0
25
0
30
ns
tOHZ
0
25
0
25
0
30
ns
Output hold from address change
tOH
10
-
15
-
15
-
ns
Write cycle time
tWC
70
-
85
-
100
-
ns
Chip select to end of write
tCW
60
-
70
-
80
-
ns
Address set-up time
tAS
0
-
0
-
0
-
ns
Address valid to end of write
tAW
60
-
70
-
80
-
ns
Write pulse width
tWP
55
-
60
-
70
-
ns
Write recovery time
tWR
0
-
0
-
0
-
ns
Write to output high-Z
tWHZ
0
25
0
30
0
30
ns
Data to write time overlap
tDW
30
-
35
-
40
-
ns
Output disable to high-Z output
Write
85ns
tRC
Read cycle time
Read
70ns
Data hold from write time
tDH
0
-
0
-
0
-
ns
End write to output low-Z
tOW
5
-
5
-
5
-
ns
DATA RETENTION CHARACTERISTICS
Item
Symbol
Test Condition
Vcc for data retention
VDR
CS1≥Vcc-0.2V1)
Data retention current
IDR
Vcc=3.0V, CS1≥Vcc-0.2V
Data retention set-up time
tSDR
Recovery time
tRDR
1)
See data retention waveform
Min
Typ
Max
Unit
2.0
-
3.6
V
-
0.2
10
0
-
-
5
-
-
2)
µA
ms
1. CS1 ≥Vcc-0.2V, CS2 ≥Vcc-0.2V(CS1 controlled) or CS2 ≤0.2V(CS2 controlled)
2. Industrial Products = 15µA
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
TIMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS1=OE=VIL, CS2=WE=VIH)
tRC
Address
tAA
tOH
Data Out
Data Valid
Previous Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
tRC
Address
tOH
tAA
tCO1
CS1
tHZ(1,2)
CS2
tCO2
tOE
OE
Data out
High-Z
tOHZ
tOLZ
tLZ
Data Valid
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ (Min.) both for a given device and from device to device
interconnection.
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
TIMING WAVEFORM OF WRITE CYCLE(1)
CMOS SRAM
(WE Controlled)
tWC
Address
tWR(4)
tCW(2)
CS 1
tAW
CS 2
tCW(2)
tWP(1)
WE
tAS(3)
tDW
tDH
Data Valid
Data in
tWHZ
Data out
tOW
Data Undefined
TIMING WAVEFORM OF WRITE CYCLE(2) (CS1
Controlled)
tWC
Address
tAS(3)
tCW(2)
tWR(4)
CS 1
tAW
CS 2
tWP(1)
WE
tDW
Data in
Data out
tDH
Data Valid
High-Z
High-Z
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(3) (CS2 Controlled)
tWC
Address
tAS(3)
tCW(2)
tWR(4)
CS1
tAW
CS2
tCW(2)
tWP(1)
WE
tDW
Data in
Data out
tDH
Data Valid
High-Z
High-Z
NOTES (WRITE CYCLE)
1. A write occurs during the overlap of a low CS1, a high CS2 and a low WE. A write begins at the latest transition among CS1 goes low,
CS2 going high and WE going low : A write end at the earliest transition among CS1 going high, CS 2 going low and WE going high,
tWP is measured from the begining of write to the end of write.
2. tCW is measured from the CS1 going low or CS2 going high to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS1 or WE going high.
t WR2 is applied in case a write ends with CS2 going low.
DATA RETENTION WAVE FORM
CS1 controlled
VCC
tSDR
Data Retention Mode
tRDR
3.0/2.7V 1)
2.2V
VDR
CS1≥VCC - 0.2V
CS1
GND
CS2 controlled
Data Retention Mode
VCC
3.0/2.7V1)
CS 2
tSDR
tRDR
VDR
0.4V
CS2≤0.2V
GND
1. 3.0V for K6T2008V2A Family, 2.7V for K6T2008U2A Family
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
PACKAGE DIMENSIONS
Units: millimeter(inch)
32 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0820F)
+0.10
-0.05
+0.004
0.008-0.002
0.20
20.00±0.20
0.787±0.008
#1
#32
8.40
0.331MAX
0.50
0.0197
#17
#16
1.00±0.10
0.039±0.004
1.20
0.047MAX
18.40±0.10
0.724±0.004
0.25
0.010 TYP
0.25
)
0.010
8.00
0.315
(
+0.10
-0.05
0.006+0.004
-0.002
0.05
0.002 MIN
0.10 MAX
0.004MAX
0.15
0~8°
0.45 ~0.75
0.018 ~0.030
(
0.50
)
0.020
32 PIN SMALLER THIN SMALL OUTLINE PACKAGE TYPE I (0813.4F)
+0.10
-0.05
0.008+0.004
-0.002
0.20
13.40±0.20
0.528±0.008
#1
#32
8.40
0.331 MAX
#17
#16
0.25
0.010 TYP
1.00±0.10
0.039±0.004
1.20
0.047 MAX
11.80±0.10
0.465±0.004
+0.10
-0.05
0.006+0.004
-0.002
0.15
0~8°
0.45 ~0.75
0.018 ~0.030
0.05
0.002 MIN
(
1.10 MAX
0.004 MAX
0.50
0.0197
0.25
)
0.010
8.00
0.315
(
0.50
)
0.020
Revision 2.01
October 2001
K6T2008V2A, K6T2008U2A Family
CMOS SRAM
PACKAGE DIMENSIONS
Units: millimeters
48 BALL FINE PITCH BALL GRID ARRAY(6.00X7.00)
Top View
Bottom View
B
A1 INDEX MARK
0.50
B1
B
6
5
4
3
2
0.50
1
A
B
#A1
C
C
C
C1
D
C1/2
E
F
G
H
B/2
Detail A
Side View
Y
0.85/Typ.
E1
E
0.25/Typ.
E2
0.30
A
D
C
Min
Typ
Max
A
-
0.75
-
B
5.90
6.00
6.10
1. Bump counts: 48(8 row x 6 column)
B1
-
3.75
-
2. Bump pitch: (x,y)=(0.75 x 0.75)(typ.)
C
6.90
7.00
7.10
C1
-
5.25
-
D
0.30
0.35
0.40
E
-
1.10
1.20
E1
-
0.85
-
E2
0.20
0.25
0.30
Y
-
-
0.08
Notes.
3. All tolerence are +/-0.050 unless
otherwise specified.
4. Typ: Typical
5. Y is coplanarity: 0.08(Max)
Revision 2.01
October 2001
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