CAT25256 256-Kb SPI Serial CMOS EEPROM Description The CAT25256 is a 256−Kb Serial CMOS EEPROM device internally organized as 32Kx8 bits. This features a 64−byte page write buffer and supports the Serial Peripheral Interface (SPI) protocol. The device is enabled through a Chip Select (CS) input. In addition, the required bus signals are clock input (SCK), data input (SI) and data output (SO) lines. The HOLD input may be used to pause any serial communication with the CAT25256 device. The device features software and hardware write protection, including partial as well as full array protection. On−Chip ECC (Error Correction Code) makes the device suitable for high reliability applications.* http://onsemi.com SOIC−8 V SUFFIX CASE 751BD UDFN−8 HU4 SUFFIX CASE 517AZ PDIP−8 L SUFFIX CASE 646AA TSSOP−8 Y SUFFIX CASE 948AL SOIC−8 X SUFFIX CASE 751BE Features • • • • • • • • • • • • • • 20 MHz (5 V) SPI Compatible 1.8 V to 5.5 V Supply Voltage Range SPI Modes (0,0) & (1,1) 64−byte Page Write Buffer Additional Identification Page with Permanent Write Protection (New Product) Self−timed Write Cycle Hardware and Software Protection Block Write Protection − Protect 1/4, 1/2 or Entire EEPROM Array Low Power CMOS Technology 1,000,000 Program/Erase Cycles 100 Year Data Retention Industrial and Extended Temperature Range 8−lead PDIP, SOIC, TSSOP and 8−pad UDFN and TDFN Packages This Device is Pb−Free, Halogen Free/BFR Free, and RoHS Compliant VCC SI CAT25256 WP PIN CONFIGURATIONS CS SO WP VSS ** Not recommended for new designs. PIN FUNCTION Pin Name† CS Chip Select Serial Data Output WP Write Protect VSS Ground Serial Data Input VCC SCK Function SO HOLD HOLD VCC HOLD SCK SI (Top View) SCK SO 1 PDIP (L), SOIC (V, X), TSSOP (Y), UDFN (HU4), TDFN** (ZD2) SI CS TDFN−8** ZD2 SUFFIX CASE 511AM Serial Clock Hold Transmission Input Power Supply †The exposed pad for the TDFN/UDFN packages can be left floating or connected to Ground. VSS Figure 1. Functional Symbol ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 20 of this data sheet. * Available for New Product (Rev. E) © Semiconductor Components Industries, LLC, 2012 September, 2012 − Rev. 7 1 Publication Order Number: CAT25256/D CAT25256 Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Operating Temperature −45 to +130 °C Storage Temperature −65 to +150 °C Voltage on any Pin with Respect to Ground (Note 1) −0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. Table 2. RELIABILITY CHARACTERISTICS (Note 2) Parameter Symbol NEND (Note 3, 4) TDR Endurance Data Retention Min Units 1,000,000 Program / Erase Cycles 100 Years 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. 3. Page Mode, VCC = 5 V, 25°C. 4. The new product revision (E) uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when a single byte has to be written, 4 bytes (including the ECC bits) are re−programmed. It is recommended to write by multiple of 4 bytes in order to benefit from the maximum number of write cycles. Table 3. D.C. OPERATING CHARACTERISTICS − MATURE PRODUCT (VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.) Symbol Parameter Test Conditions Min Max Units ICCR Supply Current (Read Mode) Read, VCC = 5.5 V, SO open 10 MHz / −40°C to 85°C 2 mA 5 MHz / −40°C to 125°C 2 mA ICCW Supply Current (Write Mode) Write, VCC = 5.5 V, SO open 10 MHz / −40°C to 85°C 4 mA 5 MHz / −40°C to 125°C 4 mA Standby Current VIN = GND or VCC, CS = VCC, WP = VCC, HOLD = VCC, VCC = 5.5 V TA = −40°C to +85°C 1 mA TA = −40°C to +125°C 3 mA VIN = GND or VCC, CS = VCC, WP = GND, HOLD = GND, VCC = 5.5 V TA = −40°C to +85°C 4 mA TA = −40°C to +125°C 5 mA −2 2 mA TA = −40°C to +85°C −1 1 mA TA = −40°C to +125°C −1 2 mA ISB1 ISB2 IL ILO Standby Current Input Leakage Current VIN = GND or VCC Output Leakage Current CS = VCC, VOUT = GND or VCC VIL Input Low Voltage −0.5 0.3 VCC V VIH Input High Voltage 0.7 VCC VCC + 0.5 V VOL1 Output Low Voltage VCC > 2.5 V, IOL = 3.0 mA 0.4 V VOH1 Output High Voltage VCC > 2.5 V, IOH = −1.6 mA VOL2 Output Low Voltage VCC > 1.8 V, IOL = 150 mA VOH2 Output High Voltage VCC > 1.8 V, IOH = −100 mA VCC − 0.8 V V 0.2 VCC − 0.2 V http://onsemi.com 2 V V CAT25256 Table 4. D.C. OPERATING CHARACTERISTICS − NEW PRODUCT (Rev E) (VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.) Symbol ICCR ICCW ISB1 ISB2 IL Parameter Supply Current (Read Mode) Supply Current (Write Mode) Standby Current Standby Current Test Conditions Max Units VCC = 1.8 V, fSCK = 5 MHz 0.8 mA VCC = 2.5 V, fSCK =10 MHz 1.2 VCC = 5.5 V, fSCK = 20 MHz 3.0 Read, SO open / −40°C to +125°C 2.5 V< VCC < 5.5 V, fSCK = 10 MHz 2.0 Write, CS = VCC/ −40°C to +85°C VCC = 1.8 V 1.5 VCC = 2.5 V 2 VCC = 5.5 V 2 Write, CS = VCC/ −40°C to +125°C 2.5 V< VCC < 5.5 V 2 VIN = GND or VCC, CS = VCC, WP = VCC, VCC = 5.5 V TA = −40°C to +85°C 1 TA = −40°C to +125°C 3 VIN = GND or VCC, CS = VCC, WP = GND, VCC = 5.5 V TA = −40°C to +85°C 3 TA = −40°C to +125°C 5 Read, SO open / −40°C to +85°C Input Leakage Current VIN = GND or VCC Output Leakage Current CS = VCC VOUT = GND or VCC VIL1 Input Low Voltage VIH1 Min mA mA mA −2 2 mA TA = −40°C to +85°C −1 1 mA TA = −40°C to +125°C −1 2 VCC ≥ 2.5 V −0.5 0.3 VCC V Input High Voltage VCC ≥ 2.5 V 0.7 VCC VCC + 0.5 V VIL2 Input Low Voltage VCC < 2.5 V −0.5 0.25 VCC V 0.75 VCC VCC + 0.5 V 0.4 V ILO VIH2 Input High Voltage VCC < 2.5 V VOL1 Output Low Voltage VCC ≥ 2.5 V, IOL = 3.0 mA VOH1 Output High Voltage VCC ≥ 2.5 V, IOH = −1.6 mA VOL2 Output Low Voltage VCC < 2.5 V, IOL = 150 mA VOH2 Output High Voltage VCC < 2.5 V, IOH = −100 mA VCC − 0.8 V V 0.2 VCC − 0.2 V V V Table 5. PIN CAPACITANCE (Note 5) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V) Test Symbol COUT CIN Conditions Output Capacitance (SO) Input Capacitance (CS, SCK, SI, WP, HOLD) Min Typ Max Units VOUT = 0 V 8 pF VIN = 0 V 8 pF 5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. http://onsemi.com 3 CAT25256 Table 6. A.C. CHARACTERISTICS − MATURE PRODUCT (TA = −40°C to +85°C (Industrial) and TA = −40°C to +125°C (Extended).) (Notes 6, 9) Symbol VCC = 1.8 V − 5.5 V / −405C to +855C VCC = 2.5 V − 5.5 V VCC = 2.5 V − 5.5 V / −405C to +1255C −405C to +855C Parameter Min Max Min Max Units 5 DC 10 MHz fSCK Clock Frequency DC tSU Data Setup Time 40 20 ns tH Data Hold Time 40 20 ns tWH SCK High Time 75 40 ns tWL SCK Low Time 75 40 ns tLZ HOLD to Output Low Z 50 25 ns tRI (Note 7) Input Rise Time 2 2 ms tFI (Note 7) Input Fall Time 2 2 ms tHD HOLD Setup Time 0 0 ns tCD HOLD Hold Time 10 10 ns tV Output Valid from Clock Low tHO Output Hold Time tDIS Output Disable Time tHZ HOLD to Output High Z 75 0 40 0 ns ns 50 20 ns 100 25 ns tCS CS High Time 140 70 ns tCSS CS Setup Time 30 15 ns tCSH CS Hold Time 30 15 ns tCNS CS Inactive Setup Time 20 15 ns tCNH CS Inactive Hold Time 20 15 ns tWPS WP Setup Time 10 10 ns tWPH WP Hold Time 100 60 ns tWC (Note 8) Write Cycle Time 5 5 ms 6. AC Test Conditions: Input Pulse Voltages: 0.3 VCC to 0.7 VCC Input rise and fall times: ≤ 10 ns Input and output reference voltages: 0.5 VCC Output load: current source IOL max/IOH max; CL = 50 pF 7. This parameter is tested initially and after a design or process change that affects the parameter. 8. tWC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle. 9. All Chip Select (CS) timing parameters are defined relative to the positive clock edge (Figure 2). tCSH timing specification is valid for die revision C and higher. The die revision C is identified by letter “C” or a dedicated marking code on top of the package. For previous product revision (Rev. B) the tCSH is defined relative to the negative clock edge. Table 7. POWER−UP TIMING (Notes 7, 10) Symbol Parameter Max Units tPUR Power−up to Read Operation 1 ms tPUW Power−up to Write Operation 1 ms 10. tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. http://onsemi.com 4 CAT25256 Table 8. A.C. CHARACTERISTICS – NEW PRODUCT (Rev E) (VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C (Industrial) and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.) (Note 11) VCC = 1.8 V − 5.5 V −405C to +855C Symbol Parameter VCC = 2.5 V − 5.5 V −405C to +1255C VCC = 4.5 V − 5.5 V −405C to +855C Min Max Min Max Min Max Units 5 DC 10 DC 20 MHz fSCK Clock Frequency DC tSU Data Setup Time 20 10 5 ns tH Data Hold Time 20 10 5 ns tWH SCK High Time 75 40 20 ns tWL SCK Low Time 75 40 20 ns tLZ HOLD to Output Low Z 50 25 25 ns tRI (Note 12) Input Rise Time 2 2 2 ms tFI (Note 12) Input Fall Time 2 2 2 ms tHD HOLD Setup Time 0 tCD HOLD Hold Time 10 tV Output Hold Time tDIS Output Disable Time 0 10 Output Valid from Clock Low tHO tHZ 0 75 0 5 ns 40 0 HOLD to Output High Z ns 20 0 ns ns 50 20 20 ns 100 25 25 ns tCS CS High Time 80 40 20 ns tCSS CS Setup Time 30 30 15 ns tCSH CS Hold Time 30 30 20 ns tCNS CS Inactive Setup Time 20 20 15 ns tCNH CS Inactive Hold Time 20 20 15 ns tWPS WP Setup Time 10 10 10 ns tWPH WP Hold Time 10 10 10 ns tWC (Note 13) Write Cycle Time 5 5 5 ms 11. AC Test Conditions: Input Pulse Voltages: 0.3 VCC to 0.7 VCC Input rise and fall times: ≤ 10 ns Input and output reference voltages: 0.5 VCC Output load: current source IOL max/IOH max; CL = 30 pF 12. This parameter is tested initially and after a design or process change that affects the parameter. 13. tWC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle. Table 9. POWER−UP TIMING (Notes 12, 14) Symbol Parameter Min Max Units tPUR Power−up to Read Operation 0.1 1 ms tPUW Power−up to Write Operation 0.1 1 ms 14. tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. http://onsemi.com 5 CAT25256 Pin Description Functional Description SI: The serial data input pin accepts op−codes, addresses and data. In SPI modes (0,0) and (1,1) input data is latched on the rising edge of the SCK clock input. SO: The serial data output pin is used to transfer data out of the device. In SPI modes (0,0) and (1,1) data is shifted out on the falling edge of the SCK clock. SCK: The serial clock input pin accepts the clock provided by the host and used for synchronizing communication between host and CAT25256. CS: The chip select input pin is used to enable/disable the CAT25256. When CS is high, the SO output is tri−stated (high impedance) and the device is in Standby Mode (unless an internal write operation is in progress). Every communication session between host and CAT25256 must be preceded by a high to low transition and concluded with a low to high transition of the CS input. WP: The write protect input pin will allow all write operations to the device when held high. When WP pin is tied low and the WPEN bit in the Status Register (refer to Status Register description, later in this Data Sheet) is set to “1”, writing to the Status Register is disabled. HOLD: The HOLD input pin is used to pause transmission between host and CAT25256, without having to retransmit the entire sequence at a later time. To pause, HOLD must be taken low and to resume it must be taken back high, with the SCK input low during both transitions. When not used for pausing, it is recommended the HOLD input to be tied to VCC, either directly or through a resistor. The CAT25256 device supports the Serial Peripheral Interface (SPI) bus protocol, modes (0,0) and (1,1). The device contains an 8−bit instruction register. The instruction set and associated op−codes are listed in Table 10. Reading data stored in the CAT25256 is accomplished by simply providing the READ command and an address. Writing to the CAT25256, in addition to a WRITE command, address and data, also requires enabling the device for writing by first setting certain bits in a Status Register, as will be explained later. After a high to low transition on the CS input pin, the CAT25256 will accept any one of the six instruction op−codes listed in Table 10 and will ignore all other possible 8−bit combinations. The communication protocol follows the timing from Figure 2. The CAT25256, New Product Rev E features an additional Identification Page (64 bytes) which can be accessed for Read and Write operations when the IPL bit from the Status Register is set to “1”. The user can also choose to make the Identification Page permanent write protected. Table 10. INSTRUCTION SET Instruction Opcode WREN 0000 0110 Enable Write Operations Operation WRDI 0000 0100 Disable Write Operations RDSR 0000 0101 Read Status Register WRSR 0000 0001 Write Status Register READ 0000 0011 Read Data from Memory WRITE 0000 0010 Write Data to Memory tCS CS tCSS tCNH tWH tWL tCSH tCNS SCK tSU tH tRI tFI VALID IN SI tV tV tDIS tHO SO HI−Z VALID OUT Figure 2. Synchronous Data Timing http://onsemi.com 6 HI−Z CAT25256 Status Register protected sections of memory. While hardware write protection is active, only the non−block protected memory can be written. Hardware write protection is disabled when the WP pin is high or the WPEN bit is 0. The WPEN bit, WP pin and WEL bit combine to either permit or inhibit Write operations, as detailed in Table 13. The IPL (Identification Page Latch) bit determines whether the additional Identification Page (IPL = 1) or main memory array (IPL = 0) can be accessed both for Read and Write operations. The IPL bit is set by the user with the WRSR command and is volatile. The IPL bit is automatically reset after read/write operations. The LIP bit is set by the user with the WRSR command and is non−volatile. When set to 1, the Identification Page is permanently write protected (locked in Read−only mode). Note: The IPL and LIP bits cannot be set to 1 using the same WRSR instruction. If the user attempts to set (“1”) both the IPL and LIP bit in the same time, these bits cannot be written and therefore they will remain unchanged. The Status Register, as shown in Table 11, contains a number of status and control bits. The RDY (Ready) bit indicates whether the device is busy with a write operation. This bit is automatically set to 1 during an internal write cycle, and reset to 0 when the device is ready to accept commands. For the host, this bit is read only. The WEL (Write Enable Latch) bit is set/reset by the WREN/WRDI commands. When set to 1, the device is in a Write Enable state and when set to 0, the device is in a Write Disable state. The BP0 and BP1 (Block Protect) bits determine which blocks are currently write protected. They are set by the user with the WRSR command and are non−volatile. The user is allowed to protect a quarter, one half or the entire memory, by setting these bits according to Table 12. The protected blocks then become read−only. The WPEN (Write Protect Enable) bit acts as an enable for the WP pin. Hardware write protection is enabled when the WP pin is low and the WPEN bit is 1. This condition prevents writing to the status register and to the block Table 11. STATUS REGISTER 7 6 5 4 3 2 1 0 WPEN IPL* 0 LIP* BP1 BP0 WEL RDY *IPL and LIP bits are available for the New Product only. For older product revisions, the status register bit 6 and bit 4 are set to ‘0’. Table 12. BLOCK PROTECTION BITS Status Register Bits BP1 BP0 Array Address Protected Protection 0 0 None No Protection 0 1 6000−7FFF Quarter Array Protection 1 0 4000−7FFF Half Array Protection 1 1 0000−7FFF Full Array Protection Table 13. WRITE PROTECT CONDITIONS WPEN WP WEL Protected Blocks Unprotected Blocks Status Register 0 X 0 Protected Protected Protected 0 X 1 Protected Writable Writable 1 Low 0 Protected Protected Protected 1 Low 1 Protected Writable Protected X High 0 Protected Protected Protected X High 1 Protected Writable Writable http://onsemi.com 7 CAT25256 WRITE OPERATIONS The CAT25256 device powers up into a write disable state. The device contains a Write Enable Latch (WEL) which must be set before attempting to write to the memory array or to the status register. In addition, the address of the memory location(s) to be written must be outside the protected area, as defined by BP0 and BP1 bits from the status register. instruction to the CAT25256. Care must be taken to take the CS input high after the WREN instruction, as otherwise the Write Enable Latch will not be properly set. WREN timing is illustrated in Figure 3. The WREN instruction must be sent prior to any WRITE or WRSR instruction. The internal write enable latch is reset by sending the WRDI instruction as shown in Figure 4. Disabling write operations by resetting the WEL bit, will protect the device against inadvertent writes. Write Enable and Write Disable The internal Write Enable Latch and the corresponding Status Register WEL bit are set by sending the WREN CS SCK 0 SI SO 0 0 0 0 1 1 0 HIGH IMPEDANCE Dashed Line = mode (1, 1) Figure 3. WREN Timing CS SCK SI SO 0 0 0 0 0 1 0 HIGH IMPEDANCE Dashed Line = mode (1, 1) Figure 4. WRDI Timing http://onsemi.com 8 0 CAT25256 Byte Write automatically returned to the write disable state. While the internal write cycle is in progress, the RDSR command will output the RDY (Ready) bit status only (i.e., data out = FFh). Once the WEL bit is set, the user may execute a write sequence, by sending a WRITE instruction, a 16−bit address and data as shown in Figure 5. Only 15 significant address bits are used by the CAT25256. The 16th address bit is don’t care, as shown in Table 14. Internal programming will start after the low to high CS transition. During an internal write cycle, all commands, except for RDSR (Read Status Register) will be ignored. The RDY bit will indicate if the internal write cycle is in progress (RDY high), or the device is ready to accept commands (RDY low). Write Identification Page The additional 64−byte Identification Page (IP) can be written with user data using the same Write commands sequence as used for Page Write to the main memory array (Figure 6). The IPL bit from the Status Register must be set (IPL = 1) using the WRSR instruction, before attempting to write to the IP. The address bits [A15:A6] are Don’t Care and the [A5:A0] bits define the byte address within the Identification Page. In addition, the Byte Address must point to a location outside the protected area defined by the BP1, BP0 bits from the Status Register. When the full memory array is write protected (BP1, BP0 = 1,1), the write instruction to the IP is not accepted and not executed. Also, the write to the IP is not accepted if the LIP bit from the Status Register is set to 1 (the page is locked in Read−only mode). Page Write After sending the first data byte to the CAT25256, the host may continue sending data, up to a total of 64 bytes, according to timing shown in Figure 6. After each data byte, the lower order address bits are automatically incremented, while the higher order address bits (page address) remain unchanged. If during this process the end of page is exceeded, then loading will “roll over” to the first byte in the page, thus possibly overwriting previously loaded data. Following completion of the write cycle, the CAT25256 is Table 14. BYTE ADDRESS Address Significant Bits Address Don’t Care Bits # Address Clock Pulses Main Memory Array A14 − A0 A15 16 Identification Page* A5 − A0 A15 − A6 16 *New Product only. CS 0 1 2 3 4 5 6 7 21 8 22 23 24 25 26 27 28 29 30 31 SCK OPCODE SI 0 0 0 0 0 0 DATA IN BYTE ADDRESS* 1 0 A0 D7 D6 D5 D4 D3 D2 D1 D0 AN HIGH IMPEDANCE SO * Please check the Byte Address Table (Table 14) Dashed Line = mode (1, 1) Figure 5. Byte WRITE Timing CS 0 1 2 3 4 5 6 7 8 21 SCK 0 0 0 0 0 0 23 24−31 32−39 24+(N−1)x8−1 .. 24+(N−1)x8 24+Nx8−1 BYTE ADDRESS* OPCODE SI 22 1 0 AN DATA IN A0 Data Data Data Byte 1 Byte 2 Byte 3 HIGH IMPEDANCE SO Dashed Line = mode (1, 1) Data Byte N 7..1 0 * Please check the Byte Address Table (Table 14) Figure 6. Page WRITE Timing http://onsemi.com 9 CAT25256 Write Status Register Write Protection The Status Register is written by sending a WRSR instruction according to timing shown in Figure 7. Only bits 2, 3, 4, 6 and 7 can be written using the WRSR command. The Write Protect (WP) pin can be used to protect the Block Protect bits BP0 and BP1 against being inadvertently altered. When WP is low and the WPEN bit is set to “1”, write operations to the Status Register are inhibited. WP going low while CS is still low will interrupt a write to the status register. If the internal write cycle has already been initiated, WP going low will have no effect on any write operation to the Status Register. The WP pin function is blocked when the WPEN bit is set to “0”. The WP input timing is shown in Figure 8. CS 0 1 2 3 4 5 6 7 8 9 10 11 1 7 6 5 4 12 13 14 15 2 1 0 SCK OPCODE SI 0 0 0 0 0 DATA IN 0 0 MSB HIGH IMPEDANCE SO Dashed Line = mode (1, 1) Figure 7. WRSR Timing tWPS tWPH CS SCK WP WP Dashed Line = mode (1, 1) Figure 8. WP Timing http://onsemi.com 10 3 CAT25256 READ OPERATIONS Read from Memory Array address register defined by [A5:A0] bits is automatically incremented and the next data byte from the IP is shifted out. The byte address must not exceed the 64−byte page boundary. To read from memory, the host sends a READ instruction followed by a 16−bit address (see Table 14 for the number of significant address bits). After receiving the last address bit, the CAT25256 will respond by shifting out data on the SO pin (as shown in Figure 9). Sequentially stored data can be read out by simply continuing to run the clock. The internal address pointer is automatically incremented to the next higher address as data is shifted out. After reaching the highest memory address, the address counter “rolls over” to the lowest memory address, and the read cycle can be continued indefinitely. The read operation is terminated by taking CS high. Read Status Register To read the status register, the host simply sends a RDSR command. After receiving the last bit of the command, the CAT25256 will shift out the contents of the status register on the SO pin (Figure 10). The status register may be read at any time, including during an internal write cycle. While the internal write cycle is in progress, the RDSR command will output the full content of the status register (New product, Rev. E) or the RDY (Ready) bit only (i.e., data out = FFh) for previous product revisions C, D (Mature product). For easy detection of the internal write cycle completion, both during writing to the memory array and to the status register, we recommend sampling the RDY bit only through the polling routine. After detecting the RDY bit “0”, the next RDSR instruction will always output the expected content of the status register. Read Identification Page Reading the additional 64−byte Identification Page (IP) is achieved using the same Read command sequence as used for Read from main memory array (Figure 9). The IPL bit from the Status Register must be set (IPL = 1) before attempting to read from the IP. The [A5:A0] are the address significant bits that point to the data byte shifted out on the SO pin. If the CS continues to be held low, the internal CS 0 1 2 3 4 5 6 7 8 20 21 10 9 22 23 24 25 26 27 28 29 30 SCK OPCODE SI 0 0 0 0 0 0 BYTE ADDRESS* 1 1 A0 AN DATA OUT HIGH IMPEDANCE SO 7 Dashed Line = mode (1, 1) * Please check the Byte Address Table (Table 14) 6 5 4 3 2 1 0 MSB Figure 9. READ Timing CS 0 1 2 3 4 5 6 7 1 0 1 8 9 10 6 5 11 12 13 14 2 1 SCK OPCODE SI SO 0 0 0 0 0 DATA OUT HIGH IMPEDANCE 7 MSB Dashed Line = mode (1, 1) Figure 10. RDSR Timing http://onsemi.com 11 4 3 0 CAT25256 Hold Operation below the POR trigger level. This bi−directional POR behavior protects the device against ‘brown−out’ failure following a temporary loss of power. The CAT25256 device powers up in a write disable state and in a low power standby mode. A WREN instruction must be issued prior to any writes to the device. After power up, the CS pin must be brought low to enter a ready state and receive an instruction. After a successful byte/page write or status register write, the device goes into a write disable mode. The CS input must be set high after the proper number of clock cycles to start the internal write cycle. Access to the memory array during an internal write cycle is ignored and programming is continued. Any invalid op−code will be ignored and the serial output pin (SO) will remain in the high impedance state. The HOLD input can be used to pause communication between host and CAT25256. To pause, HOLD must be taken low while SCK is low (Figure 11). During the hold condition the device must remain selected (CS low). During the pause, the data output pin (SO) is tri−stated (high impedance) and SI transitions are ignored. To resume communication, HOLD must be taken high while SCK is low. Design Considerations The CAT25256 device incorporates Power−On Reset (POR) circuitry which protects the internal logic against powering up in the wrong state. The device will power up into Standby mode after VCC exceeds the POR trigger level and will power down into Reset mode when VCC drops CS tCD tCD SCK tHD tHD HOLD tHZ HIGH IMPEDANCE SO tLZ Dashed Line = mode (1, 1) Figure 11. HOLD Timing http://onsemi.com 12 CAT25256 PACKAGE DIMENSIONS PDIP−8, 300 mils CASE 646AA−01 ISSUE A SYMBOL MIN NOM A E1 5.33 A1 0.38 A2 2.92 3.30 4.95 b 0.36 0.46 0.56 b2 1.14 1.52 1.78 c 0.20 0.25 0.36 D 9.02 9.27 10.16 E 7.62 7.87 8.25 E1 6.10 6.35 7.11 e PIN # 1 IDENTIFICATION MAX 2.54 BSC eB 7.87 L 2.92 10.92 3.30 3.80 D TOP VIEW E A2 A A1 c b2 L e eB b SIDE VIEW END VIEW Notes: (1) All dimensions are in millimeters. (2) Complies with JEDEC MS-001. http://onsemi.com 13 CAT25256 PACKAGE DIMENSIONS SOIC−8, 208 mils CASE 751BE−01 ISSUE O SYMBOL MIN NOM 2.03 A E1 E MAX A1 0.05 0.25 b 0.36 0.48 c 0.19 0.25 D 5.13 5.33 E 7.75 8.26 E1 5.13 5.38 1.27 BSC e L 0.51 0.76 θ 0º 8º PIN#1 IDENTIFICATION TOP VIEW D A e b q L A1 SIDE VIEW c END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with EIAJ EDR-7320. http://onsemi.com 14 CAT25256 PACKAGE DIMENSIONS SOIC 8, 150 mils CASE 751BD−01 ISSUE O E1 E SYMBOL MIN A 1.35 1.75 A1 0.10 0.25 b 0.33 0.51 c 0.19 0.25 D 4.80 5.00 E 5.80 6.20 E1 3.80 MAX 4.00 1.27 BSC e PIN # 1 IDENTIFICATION NOM h 0.25 0.50 L 0.40 1.27 θ 0º 8º TOP VIEW D h A1 θ A c e b L SIDE VIEW END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with JEDEC MS-012. http://onsemi.com 15 CAT25256 PACKAGE DIMENSIONS SOIC−8, 208 mils CASE 751BE−01 ISSUE O SYMBOL MIN NOM 2.03 A E1 E MAX A1 0.05 0.25 b 0.36 0.48 c 0.19 0.25 D 5.13 5.33 E 7.75 8.26 E1 5.13 5.38 1.27 BSC e L 0.51 0.76 θ 0º 8º PIN#1 IDENTIFICATION TOP VIEW D A e b q L A1 SIDE VIEW c END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with EIAJ EDR-7320. http://onsemi.com 16 CAT25256 PACKAGE DIMENSIONS TSSOP8, 4.4x3 CASE 948AL−01 ISSUE O b SYMBOL MIN NOM A E1 E MAX 1.20 A1 0.05 A2 0.80 b 0.19 0.15 0.90 1.05 0.30 c 0.09 D 2.90 3.00 3.10 E 6.30 6.40 6.50 E1 4.30 4.40 4.50 e 0.20 0.65 BSC L 1.00 REF L1 0.50 θ 0º 0.60 0.75 8º e TOP VIEW D A2 c q1 A A1 L1 SIDE VIEW L END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with JEDEC MO-153. http://onsemi.com 17 CAT25256 PACKAGE DIMENSIONS TDFN8, 3x4.9 CASE 511AM−01 ISSUE A D A DETAIL A DAP SIZE 2.6 x 3.3mm E E2 PIN #1 IDENTIFICATION A1 PIN #1 IDENTIFICATION D2 TOP VIEW SIDE VIEW SYMBOL MIN NOM MAX A 0.70 0.75 0.80 A1 0.00 0.02 0.05 A2 0.45 0.55 0.65 A3 A2 A A1 b 0.25 0.30 0.35 2.90 3.00 3.10 D2 0.90 1.00 1.10 E 4.80 4.90 5.00 E2 0.90 1.00 1.10 e b L 0.65 TYP 0.50 0.60 A3 FRONT VIEW 0.20 REF D L BOTTOM VIEW e 0.70 DETAIL A Notes: (1) All dimensions are in millimeters. (2) Complies with JEDEC MO-229. http://onsemi.com 18 CAT25256 PACKAGE DIMENSIONS UDFN8, 2x3 EXTENDED PAD CASE 517AZ−01 ISSUE O D b A e L DAP SIZE 1.8 x 1.8 E2 E PIN #1 IDENTIFICATION A1 PIN #1 INDEX AREA D2 TOP VIEW SIDE VIEW SYMBOL MIN NOM MAX A 0.45 0.50 0.55 A1 0.00 0.02 0.05 A3 b 0.127 REF 0.20 0.25 0.30 D 1.95 2.00 2.05 D2 1.35 1.40 1.45 E 2.95 3.00 3.05 E2 1.25 1.30 1.35 e L BOTTOM VIEW DETAIL A 0.065 REF A3 A FRONT VIEW 0.50 REF 0.25 0.30 0.35 A3 Notes: (1) All dimensions are in millimeters. (2) Refer JEDEC MO-236/MO-252. 0.0 - 0.05 DETAIL A http://onsemi.com 19 0.065 REF Copper Exposed CAT25256 ORDERING INFORMATION (Notes 15 − 18) Specific Device Marking* Package Type CAT25256LI−G 25256E CAT25256VI−G Device Order Number Temperature Range Lead Finish Shipping (Note 19) PDIP−8 Industrial (−40°C to +85°C) NiPdAu Tube, 50 Units / Tube 25256E SOIC−8 Industrial (−40°C to +85°C) NiPdAu Tube, 100 Units / Tube CAT25256VI−GT3 25256E SOIC−8 Industrial (−40°C to +85°C) NiPdAu Tape & Reel, 3,000 Units / Reel CAT25256VE−GT3 25256E SOIC−8 Extended (−40°C to +125°C) NiPdAu Tape & Reel, 3,000 Units / Reel CAT25256XI−T2 25256E SOIC−8 Industrial (−40°C to +85°C) Matte−Tin Tape & Reel, 2,000 Units / Reel CAT25256XE−T2 25256E SOIC−8 Extended (−40°C to +125°C) Matte−Tin Tape & Reel, 2,000 Units / Reel CAT25256YI−G S56E TSSOP−8 Industrial (−40°C to +85°C) NiPdAu Tube, 100 Units / Tube CAT25256YI−GT3 S56E TSSOP−8 Industrial (−40°C to +85°C) NiPdAu Tape & Reel, 3,000 Units / Reel CAT25256YE−GT3 S56E TSSOP−8 Extended (−40°C to +125°C) NiPdAu Tape & Reel, 3,000 Units / Reel CAT25256ZD2I−GT2 (Note 19) CCHM TDFN−8 Industrial (−40°C to +85°C) NiPdAu Tape & Reel, 2,000 Units / Reel CAT25256HU4I−GT3 S8U UDFN8−EP Industrial (−40°C to +85°C) NiPdAu Tape & Reel, 3,000 Units / Reel CAT25256HU4E−GT3 S8U UDFN8−EP Extended (−40°C to +125°C) NiPdAu Tape & Reel, 3,000 Units / Reel *Marking for New Product (Rev E) 15. All packages are RoHS−compliant (Lead−free, Halogen−free). 16. The standard lead finish is NiPdAu. 17. For detailed information and a breakdown of device nomenclature and numbering systems, please see the ON Semiconductor Device Nomenclature document, TND310/D, available at www.onsemi.com 18. For additional package and temperature options, please contact your nearest ON Semiconductor Sales office. 19. The TDFN 3x4.9 (ZD2) package is not recommended for new design. Not available for New Product (Rev E). 20. For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: [email protected] N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 http://onsemi.com 20 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative CAT25256/D