Fairchild MM74C04N Quad 2-input nand gate. quad 2-input nor gate. hex inverter Datasheet

Revised May 2002
MM74C00 • MM74C02 • MM74C04
Quad 2-Input NAND Gate •
Quad 2-Input NOR Gate •
Hex Inverter
General Description
Features
The MM74C00, MM74C02, and MM74C04 logic gates
employ complementary MOS (CMOS) to achieve wide
power supply operating range, low power consumption,
high noise immunity and symmetric controlled rise and fall
times. With features such as this the 74C logic family is
close to ideal for use in digital systems. Function and pin
out compatibility with series 74 devices minimizes design
time for those designers already familiar with the standard
74 logic family.
■ Wide supply voltage range:
3V to 15V
■ Guaranteed noise margin: 1V
■ High noise immunity: 0.45 VCC (typ.)
■ Low power consumption: 10 nW/package (typ.)
■ Low power:
TTL compatibility:
Fan out of 2 driving 74L
All inputs are protected from damage due to static discharge by diode clamps to VCC and GND.
Ordering Code:
Order Number
Package Number
Package Description
MM74C00M
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
MM74C00N
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
MM74C02N
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
MM74C04M
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
MM74C04N
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Connection Diagrams
MM74C00
MM74C02
Top View
Top View
MM74C04
Top View
© 2002 Fairchild Semiconductor Corporation
DS005877
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MM74C00 • MM74C02 • MM74C04 Quad 2-Input NAND Gate • Quad 2-Input NOR Gate • Hex Inverter
October 1987
MM74C00 • MM74C02 • MM74C04
Absolute Maximum Ratings(Note 1)
−0.3V to VCC + 0.3V
Voltage at Any Pin
Operating Temperature Range
−55°C to +125°C
Storage Temperature Range
−65°C to +150°C
Operating VCC Range
3.0V to 15V
Maximum VCC Voltage
18V
Power Dissipation (PD)
Dual-In-Line
700 mW
Small Outline
500 mW
Note 1: “Absolute Maximum Ratings” are those values beyond which the
safety of the device cannot be guaranteed. Except for “Operating Temperature Range” they are not meant to imply that the devices should be operated at these limits. The table of “Electrical Characteristics” provides
conditions for actual device operation.
Lead Temperature
300°C
(Soldering, 10 seconds)
DC Electrical Characteristics
Min/Max limits apply across the guaranteed temperature range unless otherwise noted
Symbol
Parameter
Conditions
Min
Typ
Max
Units
CMOS TO CMOS
VIN(1)
VIN(0)
VOUT(1)
VOUT(0)
Logical “1” Input Voltage
Logical “0” Input Voltage
Logical “1” Output Voltage
Logical “0” Output Voltage
VCC = 5.0V
3.5
VCC = 10V
8.0
V
VCC = 5.0V
1.5
VCC = 10V
2.0
VCC = 5.0V, IO = −10 µA
4.5
VCC = 10V, IO = −10 µA
9.0
V
VCC = 5.0V, IO = 10 µA
0.5
VCC = 10V, IO = 10 µA
1.0
IIN(1)
Logical “1” Input Current
VCC = 15V, VIN = 15V
IIN(0)
Logical “0” Input Current
VCC = 15V, VIN = 0V
ICC
Supply Current
VCC = 15V
0.005
−1.0
V
1.0
−0.005
0.01
V
µA
µA
15
µA
0.8
V
LOW POWER TO CMOS
VIN(1)
Logical “1” Input Voltage
74C, VCC = 4.75V
VIN(0)
Logical “0” Input Voltage
74C, VCC = 4.75V
VOUT(1)
Logical “1” Output Voltage
74C, VCC = 4.75V, IO = −10 µA
VOUT(0)
Logical “0” Output Voltage
74C, VCC = 4.75V, IO = 10 µA
VCC − 1.5
V
4.4
V
0.4
V
CMOS TO LOW POWER
VIN(1)
Logical “1” Input Voltage
74C, VCC = 4.75V
VIN(0)
Logical “0” Input Voltage
74C, VCC = 4.75V
VOUT(1)
Logical “1” Output Voltage
74C, VCC = 4.75V, IO = −360 µA
VOUT(0)
Logical “0” Output Voltage
74C, VCC = 4.75V, IO = 360 µA
4.0
V
1.0
2.4
V
V
0.4
V
OUTPUT DRIVE (see Family Characteristics Data Sheet) TA = 25°C (short circuit current)
ISOURCE
Output Source Current
VCC = 5.0V, VIN(0) = 0V, VOUT = 0V
−1.75
mA
ISOURCE
Output Source Current
VCC = 10V, VIN(0) = 0V, VOUT = 0V
−8.0
mA
ISINK
Output Sink Current
VCC = 5.0V, VIN(1) = 5.0V, VOUT = VCC
1.75
mA
ISINK
Output Sink Current
VCC = 10V, VIN(1) = 10V, VOUT = VCC
8.0
mA
AC Electrical Characteristics
(Note 2)
TA = 25°C, CL = 50 pF, unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
MM74C00, MM74C02, MM74C04
Propagation Delay Time to
VCC = 5.0V
50
90
Logical “1” or “0”
VCC = 10V
30
60
CIN
Input Capacitance
(Note 3)
6.0
pF
CPD
Power Dissipation Capacitance
Per Gate or Inverter (Note 4)
12
pF
tpd0, tpd1
Note 2: AC Parameters are guaranteed by DC correlated testing.
Note 3: Capacitance is guaranteed by periodic testing.
Note 4: CPD determines the no load AC power consumption of any CMOS device.
For complete explanation see Family Characteristics Application Note—AN-90.
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2
ns
Gate Transfer
Characteristics
Propagation Delay vs.
Ambient Temperature
MM74C00, MM74C02, MM74C04
Guaranteed Noise Margin
Over Temperature vs.
VCC
Propagation Delay vs.
Ambient Temperature
MM74C00, MM74C02, MM74C04
Propagation Delay Time vs.
Load Capacitance
MM74C00, MM74C02, MM74C04
Power Dissipation vs.
Frequency
MM74C00, MM74C02, MM74C04
3
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MM74C00 • MM74C02 • MM74C04
Typical Performance Characteristics
MM74C00 • MM74C02 • MM74C04
Switching Time Waveforms and AC Test Circuit
CMOS to CMOS
Delays measured with input tr, tf ≤ 20 ns.
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4
MM74C00 • MM74C02 • MM74C04
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
5
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MM74C00 • MM74C02 • MM74C04 Quad 2-Input NAND Gate • Quad 2-Input NOR Gate • Hex Inverter
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
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to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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