HAT2165H Silicon N Channel Power MOS FET Power Switching REJ03G0004-0500Z (Previous ADE-208-1632C (Z)) Rev.5.00 Apr.09.2003 Features • • • • • High speed switching Capable of 4.5 V gate drive Low drive current High density mounting Low on-resistance RDS(on) = 2.5 mΩ typ. (at VGS = 10 V) Outline LFPAK 5 5 D 4 G 4 1, 2, 3 Source 4 Gate 5 Drain S S S 1 2 3 Rev.5.00, Apr.09.2003, page 1 of 10 3 1 2 HAT2165H Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 30 V Gate to source voltage VGSS ±20 V Drain current ID 55 A Drain peak current ID(pulse)Note1 220 A Body-drain diode reverse drain current IDR 55 A Note 2 Avalanche current IAP 30 A Avalanche energy EAR Note 2 90 mJ Note3 30 W Channel dissipation Pch Channel to Case Thermal Resistance θch-C 4.17 °C/W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tch = 25°C, Rg ≥ 50 Ω 3. Tc = 25°C Rev.5.00, Apr.09.2003, page 2 of 10 HAT2165H Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS — — V ID = 10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ± 20 — — V IG = ±100 µA, VDS = 0 Gate to source leak current IGSS — — ± 10 µA VGS = ±16 V, VDS = 0 Zero gate voltage drain current IDSS — — 1 µA VDS = 30 V, VGS = 0 Gate to source cutoff voltage VGS(off) 1.0 — 2.5 V VDS = 10 V, I D = 1 mA Static drain to source on state RDS(on) — 2.5 3.3 mΩ ID = 27.5 A, VGS = 10 V Note4 resistance RDS(on) — 3.4 5.3 mΩ ID = 27.5 A, VGS = 4.5 V Forward transfer admittance |yfs| 60 100 — S ID = 27.5 A, VDS = 10 V Note4 Input capacitance Ciss — 5180 — pF VDS = 10 V Output capacitance Coss — 1200 — pF VGS = 0 Reverse transfer capacitance Crss — 380 — pF f = 1 MHz Gate Resistance Rg — 0.5 — Ω Total gate charge Qg — 33 — nc 30 VDD = 10 V Gate to source charge Qgs — 15 — nc VGS = 4.5 V Gate to drain charge Qgd — 7.1 — nc ID = 55 A Turn-on delay time td(on) — 13 — ns VGS = 10 V, ID = 27.5 A Rise time tr — 65 — ns VDD ≅ 10 V Turn-off delay time td(off) — 60 — ns RL = 0.36 Ω Fall time tf — 9.5 — ns Rg = 4.7 Ω Body–drain diode forward voltage VDF — 0.81 1.06 V IF = 55 A, VGS = 0 Note4 Body–drain diode reverse recovery time trr — 40 — ns IF = 55 A, VGS = 0 diF/ dt = 100 A/ µs Notes: 4. Pulse test Rev.5.00, Apr.09.2003, page 3 of 10 Note4 HAT2165H Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area 500 I D (A) Pch (W) 40 20 10 0 10 Op s era 0m s n 1 Operation in this area is limited by R DS(on) 50 100 150 200 Tc (°C) Tc = 25°C 1 shot Pulse 0.01 0.1 0.3 1 3 10 30 100 Drain to Source Voltage V DS (V) 10 V 4.5 V Typical Transfer Characteristics 100 Pulse Test V DS = 10 V Pulse Test 3.0 V 2.8 V 60 2.6 V 40 2.4 V 20 ID (A) 80 Drain Current I D (A) 1m =1 tio Typical Output Characteristics Drain Current DC 0.1 Case Temperature 100 10 µ 0µ s s 10 PW Drain Current Channel Dissipation 30 100 80 60 40 20 25°C Tc = 75°C -25°C VGS = 2.2 V 0 2 4 6 Drain to Source Voltage Rev.5.00, Apr.09.2003, page 4 of 10 8 10 V DS (V) 0 1 2 3 Gate to Source Voltage 5 4 V GS (V) 250 200 150 I D = 50 A 100 20 A 50 10 A 0 Static Drain to Source on State Resistance R DS(on) (m Ω) Pulse Test 4 8 12 Gate to Source Voltage 16 20 V GS (V) Static Drain to Source on State Resistance vs. Temperature 8 Pulse Test 6 I D = 10 A, 20 A 50 A 4 V GS = 4.5 V 10 A, 20 A, 50 A 2 10 V 0 -25 0 25 50 75 100 125 150 Case Temperature Tc (°C) Rev.5.00, Apr.09.2003, page 5 of 10 Drain to Source On State Resistance R DS(on) (m Ω) Drain to Source Saturation Voltage vs. Gate to Source Voltage Static Drain to Source on State Resistance vs. Drain Current 10 Pulse Test 5 VGS = 4.5 V 10 V 2 1 1 3 10 100 300 30 Drain Current I D (A) 1000 Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) Drain to Source Voltage V DS(on) (mV) HAT2165H 1000 300 100 Tc = -25°C 30 75°C 10 25°C 3 1 V DS = 10 V Pulse Test 0.3 0.1 0.1 0.3 1 3 10 30 Drain Current I D (A) 100 HAT2165H Body-Drain Diode Reverse Recovery Time Typical Capacitance vs. Drain to Source Voltage 10000 Ciss Capacitance C (pF) Reverse Recovery Time trr (ns) 100 50 20 10 0.1 3000 1000 Coss 300 Crss 100 di / dt = 100 A / µs V GS = 0, Ta = 25°C 30 VGS = 0 f = 1 MHz 10 0.3 1 3 10 30 100 Reverse Drain Current I DR (A) 0 5 V DD = 25 V 12 8 20 V DS 10 10 V 4 5V 0 20 40 60 80 Gate Charge Qg (nc) Rev.5.00, Apr.09.2003, page 6 of 10 20 25 30 0 100 1000 Switching Time t (ns) 30 V GS VDD = 5 V 10 V 25 V V GS (V) I D = 55 A 15 Switching Characteristics 16 Gate to Source Voltage Drain to Source Voltage V DS (V) Dynamic Input Characteristics 40 10 Drain to Source Voltage V DS (V) 300 t d(off) 100 tf 30 t d(on) 10 tr 3 V GS = 10 V , VDS = 10 V Rg = 4.7 Ω, duty < 1 % 0.1 0.2 0.5 1 2 5 10 20 50 100 Drain Current I D (A) HAT2165H Maximum Avalanche Energy vs. Channel Temperature Derating (A) 100 Repetitive Avalanche Energy EAR (mJ) Reverse Drain Current vs. Source to Drain Voltage Reverse Drain Current IDR 80 10 V V GS = 0 5V 60 40 20 Pulse Test 0 0.4 0.8 1.2 Source to Drain Voltage 1.6 2.0 100 I AP = 30 A V DD = 15 V duty < 0.1 % Rg > 50 Ω 80 60 40 20 0 25 V SD (V) 50 75 100 125 150 Channel Temperature Tch (˚C) Avalanche Test Circuit Avalanche Waveform EAR = L V DS Monitor 1 2 I AP Monitor L • IAP2 • VDSS VDSS - V DD V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin 15 V 50Ω 0 Rev.5.00, Apr.09.2003, page 7 of 10 VDD HAT2165H Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance γ s (t) 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θ ch - c(t) = γs (t) · θ ch - c θ ch - c = 4.17°C/ W, Tc = 25°C 0.1 0.05 0.03 PDM 0.02 1 0.0 D= e uls PW p ot T h 0.01 10 µ 1s PW T 100 µ 1m 100 m 10 m 1 10 Pulse Width PW (s) Switching Time Test Circuit Switching Time Waveform Vout Monitor Vin Monitor Rg 90% D.U.T. RL Vin Vin 10 V V DS = 10 V Vout 10% 10% 90% td(on) Rev.5.00, Apr.09.2003, page 8 of 10 tr 10% 90% td(off) tf HAT2165H Package Dimensions As of January, 2003 Unit: mm 4.9 5.3 Max 4.0 ± 0.2 +0.05 4.2 6.1 –0.3 +0.1 3.95 5 4 0˚ – 8˚ +0.25 +0.05 *0.20 –0.03 0.6 –0.20 1.3 Max 1 1.1 Max +0.03 0.07 –0.04 3.3 1.0 0.25 –0.03 0.75 Max 0.10 1.27 *0.40 ± 0.06 *Ni/Pd/Au plating Rev.5.00, Apr.09.2003, page 9 of 10 0.25 M Package Code JEDEC JEITA Mass (reference value) LFPAK — — 0.080 g HAT2165H Sales Strategic Planning Div. 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Renesas Technology Corporation, All rights reserved. Printed in Japan. Colophon 0.0 Rev.5.00, Apr.09.2003, page 10 of 10