HD74BC574A Octal D Type Flip Flops With 3 State Outputs REJ03D0288–0300Z (Previous ADE-205-042A (Z)) Rev.3.00 Jul.16.2004 Description The HD74BC574A provides high drivability and operation equal to or better than high speed bipolar standard logic IC by using Bi-CMOS process. The device features low power dissipation that is about 1/5 of high speed bipolar logic IC, when the frequency is 10 MHz. The device has eight edge triger D type flip flops with three state outputs in a 20 pin package. Data at the D inputs meeting set up requirements, are transferred to the Q outputs on positive going transitions of the clock input. When the latch enable goes low, data at the D inputs will be retained at the outputs until latch enable returns high again. When a high logic level is applied to the output control input, all outputs go to a high impedance state, regardless of what signals are present at the other inputs and the state of the strage elements. Features • Input/Output are at high impedance state when power supply is off. • Built in input pull up circuit can make input pins be open, when not used. • TTL level input • Wide operating temperature range Ta = –40 to + 85°C • Ordering Information Part Name HD74BC574AFPEL Package Type Package Code SOP-20 pin (JEITA) FP-20DAV Package Abbreviation FP Taping Abbreviation (Quantity) EL (2,000 pcs/reel) Function Table Inputs Output Control CK D Output Q L H H L L L L X L Q0 X X Z H H L X Z : : : : High level Low level Immaterial High impedance : Low to high transition Q0 : Level of Q before the indicated steady state input conditions were established. Rev.3.00, Jul.16.2004, page 1 of 7 HD74BC574A Pin Arrangement Output Control 1 20 VCC 1D 2 19 1Q 2D 3 18 2Q 3D 4 17 3Q 4D 5 16 4Q 5D 6 15 5Q 6D 7 14 6Q 7D 8 13 7Q 8D 9 12 8Q GND 10 11 CK (Top view) Absolute Maximum Ratings Item Supply voltage Input diode current Input voltage Output voltage Off state output voltage Symbol VCC Rating –0.5 to +7.0 Unit V IIK VIN ±30 –0.5 to +7.5 mA V VOUT VOUT(off) –0.5 to +7.5 –0.5 to +5.5 V V Storage temperature Tstg –65 to +150 °C Note: 1. The absolute maximum ratings are values which must not individually be exceeded, and furthermore, no two of which may be realized at the same time. Recommended Operating Conditions Item Supply voltage VCC 4.5 5.0 5.5 V Input voltage Output voltage VIN VOUT 0 0 — — VCC VCC V V Operating temperature Input rise/fall time*1 Topr tr, tf –40 0 — — 85 8 °C ns/V Note: Symbol Min Typ 1. This item guarantees maximum limit when one input switches. Waveform: Refer to test circuit of switching characteristics. Rev.3.00, Jul.16.2004, page 2 of 7 Max Unit HD74BC574A Logic Diagram Output Control 1D D Q CK 1Q 2D D Q CK 2Q 3D D Q CK 3Q 4D D Q CK 4Q 8D D Q CK 8Q CK Electrical Characteristics (Ta = –40°C to +85°C) Item Symbol Input voltage VIH VIL Output voltage VOH Input diode voltage Input current VCC (V) Min Max Unit Test Conditions 2.0 — — 0.8 V V 4.5 4.5 2.4 2.0 — — V V IOH = –3 mA IOH = –15 mA VOL 4.5 4.5 — — 0.4 0.5 V V IOL = 24 mA IOL = 48 mA VIK II 4.5 5.5 — — –1.2 –250 V µA IIN = –18 mA VIN = 0 V 5.5 5.5 — — 1.0 100 µA µA VIN = 5.5 V VIN = 7.0 V Short circuit output current*1 Off state output current IOS IOZH 5.5 5.5 –100 — –225 50 mA µA VIN = 0 or 5.5 V VO = 2.7 V Supply current IOZL ICCL 5.5 5.5 — — –50 29.5 µA mA VO = 0.5 V VIN = 0 or 5.5 V All outputs is “L” ICCH 5.5 — 2.5 mA ICCZ 5.5 — 2.5 mA VIN = 0 or 5.5 V All outputs is “H” VIN = 0 or 5.5 V All outputs is “Z” ICCT*2 5.5 — 1.5 mA VIN = 3.4 or 0.5 V Notes: 1. Not more than one output should be shorted at a time and duration of the short circuit should not exceed one second. 2. When input by the TTL level, it shows ICC increase at per one input pin. Rev.3.00, Jul.16.2004, page 3 of 7 HD74BC574A Switching Test Method (CL = 50 pF) Ta = 25°C VCC = 5.0 V Item Propagation Ta = –40 to 85°C VCC = 5.0 V ±10% Symbol Min tPLH 3.0 Max 8.0 Min 3.0 Max 10.0 Unit Test conditions ns See under figure delay time Output enable time tPHL tZH 3.0 3.0 8.0 9.0 3.0 3.0 10.0 11.0 ns Output disable time tZL tHZ 3.0 3.0 9.0 8.0 3.0 3.0 11.0 10.0 ns Setup time tLZ ts(H) 3.0 2.0 8.0 — 3.0 2.0 10.0 — ns Hold time ts(L) th(H) 2.0 2.0 — — 2.0 2.0 — — ns Pulse width th(L) tW(H) 2.0 6.0 — — 2.0 6.0 — — ns 6.0 — 3.0 (Typ) — 6.0 — — Input capacitance tW(L) CIN Output capacitance CO 15.0 (Typ) — CK → Q pF VIN = VCC or GND pF VO = VCC or GND Test Circuit VCC VCC Input Pulse Generator Zout = 50 Ω Input Pulse Generator Zout = 50 Ω Notes: See Function Table Output OC 500 Ω 1Q to 8Q 1D to 8D CK 1. CL includes probe and jig capacitance. 2. OPEN: tPLH, tPHL, tZH, tHZ,th, ts tw 7 V: tZL, tLZ Rev.3.00, Jul.16.2004, page 4 of 7 CL = 50 pF 450 Ω 50 Ω Scope *2 OPEN 7V HD74BC574A Waveforms-1 tr tf 90% 1.5 V Input CK 3V 90% 1.5 V 10% 1.5 V 10% 0V tr tf 90% Input D 3V 90% 10% 10% t PLH t PHL 0V VOH Output Q 1.5 V 1.5 V VOL Waveforms-2 tr tf 90% 1.5 V Input CK 10% ts 3V 90% 1.5 V 10% tw 0V th 3V Input D Rev.3.00, Jul.16.2004, page 5 of 7 1.5 V 1.5 V 0V HD74BC574A Waveforms-3 tf Output Control tr 90% 1.5 V 90% 1.5 V 10% 10% t ZL 3V 0V t LZ 3.5 V 1.5 V Waveform–A VOL + 0.3 V t ZH Waveform–B t HZ VOH – 0.3 V VOL VOH 1.5 V 0V Notes: 1. tr = 2.5 ns, tf = 2.5 ns 2. Input waveform: PRR = 1 MHz, duty cycle 50% 3. Waveform-A shows input conditions such that the output is “L” level when enable by the output control. 4. Waveform-B shows input conditions such that the output is “H” level when enable by the output control. Rev.3.00, Jul.16.2004, page 6 of 7 HD74BC574A Package Dimensions As of January, 2003 Unit: mm 12.6 13 Max 11 1 10 1.27 *0.40 ± 0.06 0.10 ± 0.10 0.80 Max *0.20 ± 0.05 2.20 Max 5.5 20 0.20 7.80 +– 0.30 1.15 0˚ – 8 ˚ 0.70 ± 0.20 0.15 0.12 M *Ni/Pd/Au plating Rev.3.00, Jul.16.2004, page 7 of 7 Package Code JEDEC JEITA Mass (reference value) FP-20DAV — Conforms 0.31 g Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. 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