CY7C1355C, CY7C1357C 9-Mbit (256 K × 36 / 512 K × 18) Flow-Through SRAM with NoBL™ Architecture 9-Mbit (256 K × 36 / 512 K × 18) Flow-through SRAM with NoBL™ Architecture Features Functional Description ■ No Bus Latency™ (NoBL™) architecture eliminates dead cycles between write and read cycles ■ Can support up to 133-MHz bus operations with zero wait states ❐ Data is transferred on every clock ■ Pin compatible and functionally equivalent to ZBT™ devices ■ Internally self-timed output buffer control to eliminate the need to use OE ■ Registered inputs for flow-through operation ■ Byte write capability ■ 3.3 V / 2.5 V I/O power supply (VDDQ) ■ Fast clock-to-output times ❐ 6.5 ns (for 133-MHz device) ■ Clock enable (CEN) pin to enable clock and suspend operation ■ Synchronous self-timed writes ■ Asynchronous output enable ■ Available in JEDEC-standard and Pb-free 100-pin TQFP and 165-ball FBGA package ■ Three chip enables for simple depth expansion. ■ Automatic power-down feature available using ZZ mode or CE deselect ■ IEEE 1149.1 JTAG-compatible boundary scan ■ Burst capability – linear or interleaved burst order ■ Low standby power The CY7C1355C/CY7C1357C is a 3.3 V, 256 K × 36 / 512 K × 18 synchronous flow-through burst SRAM designed specifically to support unlimited true back-to-back read/write operations without the insertion of wait states. The CY7C1355C/CY7C1357C is equipped with the advanced No Bus Latency (NoBL) logic required to enable consecutive read/write operations with data being transferred on every clock cycle. This feature dramatically improves the throughput of data through the SRAM, especially in systems that require frequent write-read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock input is qualified by the clock enable (CEN) signal, which when deasserted suspends operation and extends the previous clock cycle. Maximum access delay from the clock rise is 6.5 ns (133-MHz device). Write operations are controlled by the two or four byte write select (BWX) and a write enable (WE) input. All writes are conducted with on-chip synchronous self-timed write circuitry. Three synchronous chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) provide for easy bank selection and output tri-state control. In order to avoid bus contention, the output drivers are synchronously tri-stated during the data portion of a write sequence. Selection Guide Description 133 MHz 100 MHz Unit Maximum access time 6.5 7.5 ns Maximum operating current 250 180 mA Maximum CMOS standby current 40 40 mA Cypress Semiconductor Corporation Document Number: 38-05539 Rev. *K • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised September 24, 2012 CY7C1355C, CY7C1357C Logic Block Diagram – CY7C1355C ADDRESS REGISTER A0, A1, A A1 D1 A0 D0 MODE CLK CEN C CE ADV/LD C BURST LOGIC Q1 A1' A0' Q0 WRITE ADDRESS REGISTER ADV/LD BWA BWB BWC WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC BWD WRITE DRIVERS MEMORY ARRAY S E N S E A M P S WE OE CE1 CE2 CE3 ZZ Document Number: 38-05539 Rev. *K D A T A S T E E R I N G O U T P U T B U F F E R S DQs DQPA DQPB DQPC DQPD E INPUT E REGISTER READ LOGIC SLEEP CONTROL Page 2 of 33 CY7C1355C, CY7C1357C Logic Block Diagram – CY7C1357C ADDRESS REGISTER A0, A1, A A1 D1 A0 D0 MODE CLK CEN C CE ADV/LD C BURST LOGIC Q1 A1' A0' Q0 WRITE ADDRESS REGISTER ADV/LD BWA BWB WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC WRITE DRIVERS MEMORY ARRAY S E N S E A M P S WE OE CE1 CE2 CE3 ZZ Document Number: 38-05539 Rev. *K D A T A S T E E R I N G O U T P U T B U F F E R S DQs DQPA DQPB E INPUT E REGISTER READ LOGIC SLEEP CONTROL Page 3 of 33 CY7C1355C, CY7C1357C Contents Pin Configurations ........................................................... 5 Pin Definitions .................................................................. 8 Functional Overview ........................................................ 9 Single Read Accesses ................................................ 9 Burst Read Accesses .................................................. 9 Single Write Accesses ................................................. 9 Burst Write Accesses ................................................ 10 Sleep Mode ............................................................... 10 Interleaved Burst Address Table ............................... 10 Linear Burst Address Table ....................................... 10 ZZ Mode Electrical Characteristics ............................ 10 Truth Table ...................................................................... 11 Partial Truth Table for Read/Write ................................ 11 Partial Truth Table for Read/Write ................................ 12 IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 13 Disabling the JTAG Feature ...................................... 13 Test Access Port (TAP) ............................................. 13 PERFORMING A TAP RESET .................................. 13 TAP REGISTERS ...................................................... 13 TAP Instruction Set ................................................... 13 TAP Controller State Diagram ....................................... 15 TAP Controller Block Diagram ...................................... 16 TAP Timing ...................................................................... 16 TAP AC Switching Characteristics ............................... 17 3.3 V TAP AC Test Conditions ....................................... 18 3.3 V TAP AC Output Load Equivalent ......................... 18 2.5 V TAP AC Test Conditions ....................................... 18 2.5 V TAP AC Output Load Equivalent ......................... 18 Document Number: 38-05539 Rev. *K TAP DC Electrical Characteristics and Operating Conditions ..................................................... 18 Identification Register Definitions ................................ 19 Scan Register Sizes ....................................................... 19 Identification Codes ....................................................... 19 Boundary Scan Order .................................................... 20 Maximum Ratings ........................................................... 21 Operating Range ............................................................. 21 Electrical Characteristics ............................................... 21 Capacitance .................................................................... 22 Thermal Resistance ........................................................ 22 AC Test Loads and Waveforms ..................................... 22 Switching Characteristics .............................................. 23 Switching Waveforms .................................................... 24 Ordering Information ...................................................... 27 Ordering Code Definitions ......................................... 27 Package Diagrams .......................................................... 28 Acronyms ........................................................................ 30 Document Conventions ................................................. 30 Units of Measure ....................................................... 30 Document History Page ................................................. 31 Sales, Solutions, and Legal Information ...................... 33 Worldwide Sales and Design Support ....................... 33 Products .................................................................... 33 PSoC Solutions ......................................................... 33 Page 4 of 33 CY7C1355C, CY7C1357C Pin Configurations A 81 A 82 A 83 84 NC/18M ADV/LD 85 OE 86 CEN 90 87 VSS 91 WE VDD 92 88 CE3 93 CLK BWA 94 89 BWC 96 BWB BWD 97 95 CE2 98 A CE1 42 43 44 45 46 47 48 49 50 NC/36M A A A A A A A 41 NC/72M 40 37 A0 VSS 36 A1 VDD 35 A 39 34 A NC/144M 33 A 38 32 Document Number: 38-05539 Rev. *K NC/288M 31 A BYTE D 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE BYTE C DQPC DQC DQC VDDQ VSS DQC DQC DQC DQC VSS VDDQ DQC DQC Vss/DNU VDD NC VSS DQD DQD VDDQ VSS DQD DQD DQD DQD VSS VDDQ DQD DQD DQPD 99 100 A Figure 1. 100-pin TQFP (14 × 20 × 1.4 mm) pinout (CY7C1355C) DQPB DQB DQB VDDQ VSS DQB DQB DQB DQB VSS VDDQ DQB DQB VSS NC VDD ZZ DQA DQA VDDQ VSS DQA DQA DQA DQA VSS VDDQ DQA DQA DQPA BYTE B BYTE A Page 5 of 33 CY7C1355C, CY7C1357C Pin Configurations (continued) A 81 A 82 A 83 84 NC/18M ADV/LD 85 OE 86 CEN 90 87 VSS 91 WE VDD 92 88 CE3 93 CLK BWA 94 89 NC BWB 95 NC 97 96 CE2 98 A CE1 42 43 44 45 46 47 48 49 50 NC/72M NC/36M A A A A A A A 41 VDD 37 A0 40 36 A1 VSS 35 A 39 34 A NC/144M 33 A 38 32 A Document Number: 38-05539 Rev. *K NC/288M 31 BYTE B VDDQ VSS NC NC DQB DQB VSS VDDQ DQB DQB Vss/DNU VDD NC VSS DQB DQB VDDQ VSS DQB DQB DQPB NC VSS VDDQ NC NC NC 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE NC NC NC 99 100 A Figure 2. 100-pin TQFP (14 × 20 × 1.4 mm) pinout (CY7C1357C) A NC NC VDDQ VSS NC DQPA DQA DQA VSS VDDQ DQA DQA VSS NC VDD ZZ BYTE A DQA DQA VDDQ VSS DQA DQA NC NC VSS VDDQ NC NC NC Page 6 of 33 CY7C1355C, CY7C1357C Pin Configurations (continued) Figure 3. 165-ball FBGA (13 × 15 × 1.4 mm) pinout (3 Chip Enables with JTAG) CY7C1357C (512 K × 18) 1 2 3 4 5 6 7 8 9 10 11 A B C D E F G H J K L M N P NC/576M A CE1 BWB NC CE3 CEN ADV/LD A A A NC/1G A CE2 NC BWA CLK WE OE NC/18M A NC NC NC NC DQB VDDQ VSS VSS VSS VSS VSS VSS VSS VDD VDDQ VDDQ VSS VDD VDDQ NC NC DQPA DQA NC DQB VDDQ VDD VSS VSS VSS VDD VDDQ NC DQA NC NC NC DQB DQB VDDQ VDDQ NC VDDQ VDD VSS VSS VSS VSS VSS VDD VDD VDD VDDQ VDDQ NC VDDQ NC VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDD NC NC DQA DQA DQA ZZ NC DQB NC VDDQ VDD VSS VSS VSS VDD VDDQ DQA NC DQB NC VDDQ VDD VSS VSS VSS VDD VDDQ DQA NC DQB DQPB NC NC VDDQ VDDQ VDD VSS VSS NC VSS NC/144M NC/72M A A R MODE NC/36M A A DQB NC NC Document Number: 38-05539 Rev. *K VSS NC VDD VSS VDDQ VDDQ DQA NC NC NC TDI NC A1 TDO A A A NC/288M TMS A0 TCK A A A A Page 7 of 33 CY7C1355C, CY7C1357C Pin Definitions Name A0, A1, A I/O Description InputAddress inputs used to select one of the address locations. Sampled at the rising edge of the CLK. synchronous A[1:0] are fed to the two-bit burst counter. InputByte write inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising BWA, BWB, BWC, BWD synchronous edge of CLK. WE InputWrite enable input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal synchronous must be asserted LOW to initiate a write sequence. ADV/LD InputAdvance/load input. Used to advance the on-chip address counter or load a new address. When HIGH synchronous (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW in order to load a new address. CLK Inputclock Clock input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. CE1 InputChip enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2, synchronous and CE3 to select/deselect the device. CE2 InputChip enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 synchronous and CE3 to select/deselect the device. CE3 InputChip enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 synchronous and CE2 to select/deselect the device. OE InputOutput enable, asynchronous input, active LOW. Combined with the synchronous logic block inside asynchronous the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE is masked during the data portion of a write sequence, during the first clock when emerging from a deselected state, when the device has been deselected. CEN InputClock enable input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. synchronous When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. ZZ InputZZ “sleep” input. This active HIGH input places the device in a non-time critical “sleep” condition with asynchronous data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin has an internal pull-down. DQs I/OBidirectional data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the synchronous rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by the addresses presented during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQs and DQPX are placed in a tri-state condition.The outputs are automatically tri-stated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. DQPX I/OBidirectional data parity I/O lines. Functionally, these signals are identical to DQs. During write synchronous sequences, DQPX is controlled by BWX correspondingly. MODE Input strap pin Mode input. Selects the burst order of the device. When tied to Gnd selects linear burst sequence. When tied to VDD or left floating selects interleaved burst sequence. VDD Power supply Power supply inputs to the core of the device. VDDQ VSS TDO I/O power supply Ground Power supply for the I/O circuitry. Ground for the device. JTAG serial Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. If the JTAG feature is not being utilized, this pin should be left unconnected. This pin is not available on TQFP packages. output synchronous Document Number: 38-05539 Rev. *K Page 8 of 33 CY7C1355C, CY7C1357C Pin Definitions (continued) Name I/O Description TDI JTAG serial Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is not being utilized, this pin can be left floating or connected to VDD through a pull-up resistor. This pin is not available input synchronous on TQFP packages. TMS JTAG serial Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is not being input utilized, this pin can be disconnected or connected to VDD. This pin is not available on TQFP packages. synchronous TCK JTAG clock Clock input to the JTAG circuitry. If the JTAG feature is not being utilized, this pin must be connected to VSS. This pin is not available on TQFP packages. NC – No connects. Not internally connected to the die. 18-Mbit, 36-Mbit, 72-Mbit, 144-Mbit, 288-Mbit, 576-Mbit and 1-Gbit are address expansion pins and are not internally connected to the die. VSS/DNU Ground/DNU This pin can be connected to Ground or should be left floating. Functional Overview The CY7C1355C/CY7C1357C is a synchronous flow-through burst SRAM designed specifically to eliminate wait states during write-read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the clock enable input signal (CEN). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. Maximum access delay from the clock rise (tCDV) is 6.5 ns (133-MHz device). Accesses can be initiated by asserting all three chip enables (CE1, CE2, CE3) active at the rising edge of the clock. If clock enable (CEN) is active LOW and ADV/LD is asserted LOW, the address presented to the device will be latched. The access can either be a read or write operation, depending on the status of the write enable (WE). BWX can be used to conduct byte write operations. Write operations are qualified by the write enable (WE). All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) simplify depth expansion. All operations (reads, writes, and deselects) are pipelined. ADV/LD should be driven LOW once the device has been deselected in order to load a new address for the next operation. Single Read Accesses A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, (3) the write enable input signal WE is deasserted HIGH, and 4) ADV/LD is asserted LOW. The address presented to the address inputs is latched into the address register and presented to the memory array and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the output buffers. The data is available within 7.5 ns (133-MHz device) provided OE is active LOW. After the first clock of the read access, the output buffers are controlled by OE and the internal control logic. OE must be driven LOW in order for the device to drive out the requested data. On the subsequent clock, another operation (read/write/deselect) can be initiated. When the SRAM is deselected at clock rise by one of the chip enable signals, its output will be tri-stated immediately. Document Number: 38-05539 Rev. *K Burst Read Accesses The CY7C1355C/CY7C1357C has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four reads without reasserting the address inputs. ADV/LD must be driven LOW in order to load a new address into the SRAM, as described in the Single Read Accesses section above. The sequence of the burst counter is determined by the MODE input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst sequence, and will wrap around when incremented sufficiently. A HIGH input on ADV/LD will increment the internal burst counter regardless of the state of chip enable inputs or WE. WE is latched at the beginning of a burst cycle. Therefore, the type of access (read or write) is maintained throughout the burst sequence. Single Write Accesses Write access are initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, and (3) the write signal WE is asserted LOW. The address presented to the address bus is loaded into the address register. The write signals are latched into the control logic block. The data lines are automatically tri-stated regardless of the state of the OE input signal. This allows the external logic to present the data on DQs and DQPX. On the next clock rise the data presented to DQs and DQPX (or a subset for byte write operations, see Truth Table for details) inputs is latched into the device and the write is complete. Additional accesses (read/write/deselect) can be initiated on this cycle. The data written during the write operation is controlled by BWX signals. The CY7C1355C/CY7C1357C provides byte write capability that is described in the Truth Table. Asserting the write enable input (WE) with the selected byte write select input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the Write operations. Byte write capability has been included in order to greatly simplify read/modify/write sequences, which can be reduced to simple byte write operations. Because the CY7C1355C/CY7C1357C is a common I/O device, data should not be driven into the device while the outputs are Page 9 of 33 CY7C1355C, CY7C1357C active. The output enable (OE) can be deasserted HIGH before presenting data to the DQs and DQPX inputs. Doing so will tri-state the output drivers. As a safety precaution, DQs and DQPX are automatically tri-stated during the data portion of a write cycle, regardless of the state of OE. Interleaved Burst Address Table (MODE = Floating or VDD) Burst Write Accesses The CY7C1355C/CY7C1357C has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four write operations without reasserting the address inputs. ADV/LD must be driven LOW in order to load the initial address, as described in the Single Write Accesses section above. When ADV/LD is driven HIGH on the subsequent clock rise, the chip enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BWX inputs must be driven in each cycle of the burst write, in order to write the correct bytes of data. First Address A1:A0 Second Address A1:A0 Third Address A1:A0 Fourth Address A1:A0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 Fourth Address A1:A0 Linear Burst Address Table (MODE = GND) Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the “sleep” mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW. First Address A1:A0 Second Address A1:A0 Third Address A1:A0 00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10 ZZ Mode Electrical Characteristics Parameter Description Test Conditions IDDZZ Sleep mode standby current ZZ > VDD– 0.2 V tZZS Device operation to ZZ ZZ > VDD – 0.2 V tZZREC ZZ recovery time ZZ < 0.2 V tZZI ZZ active to sleep current tRZZI ZZ inactive to exit sleep current Document Number: 38-05539 Rev. *K Min Max Unit – 50 mA – 2tCYC ns 2tCYC – ns This parameter is sampled – 2tCYC ns This parameter is sampled 0 – ns Page 10 of 33 CY7C1355C, CY7C1357C Truth Table The Truth Table for parts CY7C1355C/CY7C1357C is as follows. [1, 2, 3, 4, 5, 6, 7] Operation Address Used CE1 CE2 CE3 ZZ ADV/LD WE BWX OE CEN CLK DQ Deselect cycle None H X X L L X X X L L->H Tri-state Deselect cycle None X X H L L X X X L L->H Tri-state Deselect cycle None X L X L L X X X L L->H Tri-state Continue deselect cycle None X X X L H X X X L L->H Tri-state External L H L L L H X L L L->H Data out (Q) Next X X X L H X X L L L->H Data out (Q) External L H L L L H X H L L->H Tri-state Next X X X L H X X H L L->H Tri-state READ cycle (begin burst) READ cycle (continue burst) NOP/DUMMY READ (begin burst) DUMMY READ (continue burst) WRITE cycle (begin burst) External L H L L L L L X L L->H Data in (D) WRITE cycle (continue burst) Next X X X L H X L X L L->H Data in (D) NOP/WRITE ABORT (begin burst) None L H L L L L H X L L->H Tri-state WRITE ABORT (continue burst) Next X X X L H X H X L L->H Tri-state IGNORE CLOCK EDGE (stall) SLEEP MODE Current X X X L X X X X H L->H – None X X X H X X X X X X Tri-state Partial Truth Table for Read/Write The Partial Truth Table for read or write for parts CY7C1355C is as follows. [1, 2, 8] Function (CY7C1355C) WE H BWA X BWB X BWC X BWD X Write no bytes written L H H H H Write byte A – (DQA and DQPA) L L H H H Write byte B – (DQB and DQPB) L H L H H Write byte C – (DQC and DQPC) L H H L H Write byte D – (DQD and DQPD) L H H H L Write all bytes L L L L L Read Notes 1. X = “Don't Care.” H = Logic HIGH, L = Logic LOW. BWx = L signifies at least one byte write select is active, BWx = valid signifies that the desired byte write selects are asserted, see Truth Table for details. 2. Write is defined by BWX, and WE. See Truth Table for read/write. 3. When a write cycle is detected, all I/Os are tri-stated, even during byte writes. 4. The DQs and DQPX pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock. 5. CEN = H, inserts wait states. 6. Device will power-up deselected and the I/Os in a tri-state condition, regardless of OE. 7. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle DQs and DQPX = tri-state when OE is inactive or when the device is deselected, and DQs and DQPX = data when OE is active. 8. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write will be done based on which byte write is active. Document Number: 38-05539 Rev. *K Page 11 of 33 CY7C1355C, CY7C1357C Partial Truth Table for Read/Write The Partial Truth Table for read or write for parts CY7C1357C is as follows. [9, 10, 11] Function (CY7C1357C) WE H BWA X BWB X Write - no bytes written L H H Write byte A – (DQA and DQPA) L H H Write byte B – (DQB and DQPB) L H H Write all bytes L L L Read Notes 9. X = “Don't Care.” H = Logic HIGH, L = Logic LOW. BWx = L signifies at least one byte write select is active, BWx = valid signifies that the desired byte write selects are asserted, see Truth Table for details. 10. Write is defined by BWX, and WE. See Truth Table for read/write. 11. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write will be done based on which byte write is active. Document Number: 38-05539 Rev. *K Page 12 of 33 CY7C1355C, CY7C1357C IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1357C incorporates a serial boundary scan test access port (TAP) in the BGA package only. The TQFP package does not offer this functionality. This part operates in accordance with IEEE Standard 1149.1-1900, but doesn’t have the set of functions required for full 1149.1 compliance. These functions from the IEEE specification are excluded because their inclusion places an added delay in the critical speed path of the SRAM. Note the TAP controller functions in a manner that does not conflict with the operation of other devices using 1149.1 fully compliant TAPs. The TAP operates using JEDEC-standard 3.3 V or 2.5 V I/O logic levels. The CY7C1357C contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW(VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this ball unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information about loading the instruction register, see the TAP Controller State Diagram on page 15. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. Test Data-Out (TDO) The TDO output ball is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see Identification Codes on page 19). The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. Performing a TAP Reset A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. Document Number: 38-05539 Rev. *K At power-up, the TAP is reset internally to ensure that TDO comes up in a high Z state. TAP Registers Registers are connected between the TDI and TDO balls and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram on page 16. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary “01” pattern to allow for fault isolation of the board-level serial test data path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The boundary scan register is loaded with the contents of the RAM I/O ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the I/O ring. The Boundary Scan Order on page 20 show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions table. TAP Instruction Set Overview Eight different instructions are possible with the three bit instruction register. All combinations are listed in the Instruction Codes table. Three of these instructions are listed as Page 13 of 33 CY7C1355C, CY7C1357C RESERVED and should not be used. The other five instructions are described in detail below. there is no guarantee as to the value that will be captured. Repeatable results may not be possible. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO balls. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK# captured in the boundary scan register. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO balls and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state.The IDCODE instruction is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. The SAMPLE Z command puts the output bus into a high Z state until the next command is given during the “Update IR” state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but Document Number: 38-05539 Rev. *K Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required – that is, while data captured is shifted out, the preloaded data can be shifted in. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the shift-DR controller state. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions. Page 14 of 33 CY7C1355C, CY7C1357C TAP Controller State Diagram 1 TEST-LOGIC RESET 0 0 RUN-TEST/ IDLE 1 SELECT DR-SCAN 1 SELECT IR-SCAN 0 1 0 1 CAPTURE-DR CAPTURE-IR 0 0 SHIFT-DR 0 SHIFT-IR 1 1 EXIT1-IR 0 1 0 PAUSE-DR 0 PAUSE-IR 1 0 1 EXIT2-DR 0 EXIT2-IR 1 1 UPDATE-DR 1 0 1 EXIT1-DR 0 1 0 UPDATE-IR 1 0 The 0/1 next to each state represents the value of TMS at the rising edge of the TCK. Document Number: 38-05539 Rev. *K Page 15 of 33 CY7C1355C, CY7C1357C TAP Controller Block Diagram 0 Bypass Register 2 1 0 TDI Selection Circuitry Instruction Register 31 30 29 . . Selection Circuitry . 2 1 0 TDO Identification Register x . . . . . 2 1 0 Boundary Scan Register TCK TMS TAP CONTROLLER TAP Timing 1 2 Test Clock (TCK) 3 tTH tTMSS tTMSH tTDIS tTDIH t TL 4 5 6 tCYC Test Mode Select (TMS) Test Data-In (TDI) tTDOV tTDOX Test Data-Out (TDO) DON’T CARE Document Number: 38-05539 Rev. *K UNDEFINED Page 16 of 33 CY7C1355C, CY7C1357C TAP AC Switching Characteristics Over the Operating Range Parameter [12, 13] Description Min Max Unit 50 – ns Clock tTCYC TCK clock cycle time tTF TCK clock frequency – 20 MHz tTH TCK clock HIGH time 20 – ns tTL TCK clock LOW time 20 – ns tTDOV TCK clock LOW to TDO valid – 10 ns tTDOX TCK clock LOW to TDO invalid 0 – ns tTMSS TMS set-up to TCK clock rise 5 – ns tTDIS TDI set-up to TCK clock rise 5 – ns tCS Capture set-up to TCK rise 5 – ns tTMSH TMS hold after TCK clock rise 5 – ns tTDIH TDI hold after clock rise 5 – ns tCH Capture hold after clock rise 5 – ns Output Times Set-up Times Hold Times Notes 12. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register. 13. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns. Document Number: 38-05539 Rev. *K Page 17 of 33 CY7C1355C, CY7C1357C 3.3 V TAP AC Test Conditions 2.5 V TAP AC Test Conditions Input pulse levels................................................VSS to 3.3 V Input pulse levels................................................ VSS to 2.5 V Input rise and fall times....................................................1 ns Input rise and fall time .....................................................1 ns Input timing reference levels.......................................... 1.5 V Input timing reference levels........................................ 1.25 V Output reference levels ................................................. 1.5 V Output reference levels ............................................... 1.25 V Test load termination supply voltage ............................. 1.5 V Test load termination supply voltage ........................... 1.25 V 3.3 V TAP AC Output Load Equivalent 2.5 V TAP AC Output Load Equivalent 1.5V 1.25V 50 50 TDO TDO Z O= 50 Z O= 50 20pF 20pF TAP DC Electrical Characteristics and Operating Conditions (0 °C < TA < +70 °C; VDD = 3.3 V ± 0.165 V unless otherwise noted) Parameter [14] VOH1 VOH2 VOL1 VOL2 VIH VIL IX Description Output HIGH voltage Output HIGH voltage Output LOW voltage Output LOW voltage Conditions Min Max Unit IOH = –4.0 mA, VDDQ = 3.3 V IOH = –1.0 mA, VDDQ = 2.5 V 2.4 – V 2.0 – V IOH = –100 µA VDDQ = 3.3 V 2.9 – V VDDQ = 2.5 V 2.1 – V IOL = 8.0 mA VDDQ = 3.3 V – 0.4 V IOL = 8.0 mA VDDQ = 2.5 V – 0.4 V IOL = 100 µA VDDQ = 3.3 V – 0.2 V VDDQ = 2.5 V – 0.2 V Input HIGH voltage Input LOW voltage Input load current GND < VIN < VDDQ VDDQ = 3.3 V 2.0 VDD + 0.3 V VDDQ = 2.5 V 1.7 VDD + 0.3 V VDDQ = 3.3 V –0.5 0.7 V VDDQ = 2.5 V –0.3 0.7 V –5 5 µA Note 14. All voltages referenced to VSS (GND). Document Number: 38-05539 Rev. *K Page 18 of 33 CY7C1355C, CY7C1357C Identification Register Definitions CY7C1357C (512 K × 18) Instruction Field Revision number (31:29) 010 Description Describes the version number Device depth (28:24) 01010 Device width (23:18) 001001 Defines memory type and architecture Cypress device ID (17:12) 010110 Defines width and density Cypress JEDEC ID code (11:1) 00000110100 ID register presence indicator (0) 1 Reserved for Internal Use Allows unique identification of SRAM vendor Indicates the presence of an ID register Scan Register Sizes Register Name Bit Size (× 18) Instruction 3 Bypass 1 ID 32 Boundary scan order (165-ball FBGA package) 69 Identification Codes Instruction Code Description EXTEST 000 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM outputs to high Z state. This instruction is not 1149.1 compliant. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operations. SAMPLE Z 010 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a high Z state. RESERVED 011 Do Not Use: This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Does not affect SRAM operation. This instruction does not implement 1149.1 preload function and is therefore not 1149.1 compliant. RESERVED 101 Do Not Use: This instruction is reserved for future use. RESERVED 110 Do Not Use: This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. Document Number: 38-05539 Rev. *K Page 19 of 33 CY7C1355C, CY7C1357C Boundary Scan Order 165-ball FBGA CY7C1357C (512 K × 18) Bit# ball ID Signal Name Bit# ball ID Signal Name 1 B6 CLK 37 R4 A 2 B7 WE 38 P4 A 3 A7 CEN 39 R3 A 4 B8 OE 40 P3 A 5 A8 ADV/LD 41 R1 MODE 6 A9 A 42 Internal Internal 7 B10 A 43 Internal Internal 8 A10 A 44 Internal Internal 9 A11 A 45 Internal Internal 10 Internal Internal 46 N1 DQPB 11 Internal Internal 47 M1 DQB 12 Internal Internal 48 L1 DQB 13 C11 DQPA 49 K1 DQB 14 D11 DQA 50 J1 DQB 15 E11 DQA 51 Internal Internal 16 F11 DQA 52 G2 DQB 17 G11 DQA 53 F2 DQB 18 H11 ZZ 54 E2 DQB 19 J10 DQA 55 D2 DQB 20 K10 DQA 56 Internal Internal 21 L10 DQA 57 Internal Internal 22 M10 DQA 58 Internal Internal 23 Internal Internal 59 Internal Internal 24 Internal Internal 60 Internal Internal 25 Internal Internal 61 B2 A 26 Internal Internal 62 A2 A 27 Internal Internal 63 A3 CE1 28 R11 A 64 B3 CE2 29 R10 A 65 Internal Internal 30 P10 A 66 Internal Internal 31 R9 A 67 A4 BWB 32 P9 A 68 B5 BWA 33 R8 A 69 A6 CE3 34 P8 A 35 R6 A0 36 P6 A1 Document Number: 38-05539 Rev. *K Page 20 of 33 CY7C1355C, CY7C1357C Maximum Ratings DC input voltage ................................. –0.5 V to VDD + 0.5 V Exceeding maximum ratings may shorten the useful life of the device. User guidelines are not tested. Storage temperature ................................ –65 °C to +150 °C Ambient temperature with power applied .......................................... –55 °C to +125 °C Current into outputs (LOW) ........................................ 20 mA Static discharge voltage (per MIL-STD-883, method 3015) .......................... > 2001 V Latch up current ..................................................... > 200 mA Operating Range Supply voltage on VDD relative to GND .......–0.5 V to +4.6 V Supply voltage on VDDQ relative to GND ...... –0.5 V to +VDD Range Ambient Temperature DC voltage applied to outputs in tri-state ..........................................–0.5 V to VDDQ + 0.5 V Commercial 0 °C to +70 °C VDD VDDQ 3.3 V 2.5 V – 5% to – 5% / + 10% VDD Electrical Characteristics Over the Operating Range Parameter [15, 16] Description VDD Power supply voltage VDDQ I/O supply voltage VOH VOL VIH VIL IX Output HIGH voltage Output LOW voltage Input HIGH voltage[15] Test Conditions Min Max Unit 3.135 3.6 V For 3.3 V I/O 3.135 VDD V For 2.5 V I/O 2.375 2.625 V For 3.3 V I/O, IOH =4.0 mA 2.4 – V For 2.5 V I/O, IOH =1.0 mA 2.0 – V For 3.3 V I/O, IOL=8.0 mA – 0.4 V For 2.5 V I/O, IOL= 1.0 mA – 0.4 V For 3.3 V I/O 2.0 VDD + 0.3 V V For 2.5 V I/O 1.7 VDD + 0.3 V V For 3.3 V I/O –0.3 0.8 V For 2.5 V I/O –0.3 0.7 V Input leakage current except ZZ GND VI VDDQ and MODE –5 5 µA Input current of MODE Input = VSS –30 – µA Input = VDD – 5 µA Input = VSS –5 – µA Input = VDD – 30 µA Input LOW voltage[15] Input current of ZZ IOZ Output leakage current GND VI VDDQ, output disabled –5 5 µA IDD VDD operating supply current VDD = Max, IOUT = 0 mA, f = fMAX = 1/tCYC 7.5-ns cycle, 133 MHz – 250 mA 10-ns cycle, 100 MHz – 180 mA ISB1 Automatic CE power-down current – TTL inputs VDD = Max, device deselected, VIN VIH or VIN VIL, f = fMAX, inputs switching All speeds – 110 mA ISB2 Automatic CE power-down current – CMOS inputs VDD = Max, device deselected, All speeds VIN 0.3 V or VIN > VDD – 0.3 V, f = 0, inputs static – 40 mA ISB3 Automatic CE power-down current – CMOS inputs VDD = Max, device deselected, All speeds VIN 0.3 V or VIN > VDDQ – 0.3 V, f = fMAX, inputs switching – 100 mA Notes 15. Overshoot: VIH(AC) < VDD + 1.5 V (Pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (Pulse width less than tCYC/2). 16. TPower-up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD. Document Number: 38-05539 Rev. *K Page 21 of 33 CY7C1355C, CY7C1357C Electrical Characteristics (continued) Over the Operating Range Parameter [15, 16] ISB4 Description Test Conditions Automatic CE power-down current – TTL Inputs VDD = Max, device deselected, VIN VIH or VIN VIL, f = 0, inputs static All speeds Min Max Unit – 40 mA Capacitance Parameter [17] Description CIN Input capacitance CCLK Clock input capacitance CI/O Input/output capacitance 100-pin TQFP 165-ball FBGA Unit Max Max Test Conditions 5 TA = 25 °C, f = 1 MHz, VDD = 3.3 V, VDDQ = 2.5 V 5 pF 5 5 pF 5 7 pF Thermal Resistance Parameter [17] Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) 100-pin TQFP 165-ball FBGA Unit Package Package Test Conditions Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. 29.41 16.8 C/W 6.31 3.0 C/W AC Test Loads and Waveforms Figure 4. AC Test Loads and Waveforms 3.3 V I/O Test Load R = 317 3.3 V OUTPUT OUTPUT RL = 50 Z0 = 50 GND 5 pF R = 351 VT = 1.5 V INCLUDING JIG AND SCOPE (a) 2.5 V I/O Test Load OUTPUT RL = 50 Z0 = 50 VT = 1.25 V (a) 10% (c) ALL INPUT PULSES VDDQ INCLUDING JIG AND SCOPE 1 ns (b) GND 5 pF 90% 10% 90% 1 ns R = 1667 2.5 V OUTPUT ALL INPUT PULSES VDDQ R = 1538 (b) 10% 90% 10% 90% 1 ns 1 ns (c) Note 17. Tested initially and after any design or process change that may affect these parameters. Document Number: 38-05539 Rev. *K Page 22 of 33 CY7C1355C, CY7C1357C Switching Characteristics Over the Operating Range Parameter [18, 19] tPOWER Description VDD(typical) to the first access [20] -133 -100 Min Max Min Max 1 – 1 – Unit ms Clock tCYC Clock cycle time 7.5 – 10 – ns tCH Clock HIGH 3.0 – 4.0 – ns tCL Clock LOW 3.0 – 4.0 – ns Output Times tCDV Data output valid after CLK rise – 6.5 – 7.5 ns tDOH Data output hold after CLK rise 2.0 – 2.0 – ns tCLZ Clock to low Z [21, 22, 23] 0 – 0 – ns – 3.5 – 3.5 ns [21, 22, 23] tCHZ Clock to high Z tOEV OE LOW to output valid – 3.5 – 3.5 ns tOELZ OE LOW to output low Z [21, 22, 23] 0 – 0 – ns – 3.5 – 3.5 ns tOEHZ OE HIGH to output high Z [21, 22, 23] Set-up Times tAS Address set-up before CLK rise 1.5 – 1.5 – ns tALS ADV/LD set-up before CLK rise 1.5 – 1.5 – ns tWES WE, BWX set-up before CLK rise 1.5 – 1.5 – ns tCENS CEN set-up before CLK rise 1.5 – 1.5 – ns tDS Data input set-up before CLK rise 1.5 – 1.5 – ns tCES Chip enable set-up before CLK rise 1.5 – 1.5 – ns tAH Address hold after CLK rise 0.5 – 0.5 – ns Hold Times tALH ADV/LD hold after CLK rise 0.5 – 0.5 – ns tWEH WE, BWX hold after CLK rise 0.5 – 0.5 – ns tCENH CEN hold after CLK rise 0.5 – 0.5 – ns tDH Data input hold after CLK rise 0.5 – 0.5 – ns tCEH Chip enable hold after CLK rise 0.5 – 0.5 – ns Notes 18. Timing reference level is 1.5 V when VDDQ = 3.3 V and is 1.25 V when VDDQ = 2.5 V. 19. Test conditions shown in (a) of Figure 4 on page 22 unless otherwise noted. 20. This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially, before a read or write operation can be initiated. 21. tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of Figure 4 on page 22. Transition is measured ±200 mV from steady-state voltage. 22. At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve high Z prior to low Z under the same system conditions. 23. This parameter is sampled and not 100% tested. Document Number: 38-05539 Rev. *K Page 23 of 33 CY7C1355C, CY7C1357C Switching Waveforms Figure 5. Read/Write Waveforms [24, 25, 26] 1 2 3 tCYC 4 5 6 7 8 9 A5 A6 A7 10 CLK tCENS tCENH tCES tCEH tCH tCL CEN CE ADV/LD WE BWX A1 ADDRESS tAS A2 A4 A3 tCDV tAH tDOH tCLZ DQ D(A1) tDS D(A2) Q(A3) D(A2+1) tOEV Q(A4+1) Q(A4) tOELZ WRITE D(A1) WRITE D(A2) D(A5) Q(A6) D(A7) WRITE D(A7) DESELECT tOEHZ tDH OE COMMAND tCHZ BURST WRITE D(A2+1) READ Q(A3) READ Q(A4) DON’T CARE BURST READ Q(A4+1) tDOH WRITE D(A5) READ Q(A6) UNDEFINED Notes 24. For this waveform ZZ is tied LOW. 25. When CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 26. Order of the burst sequence is determined by the status of the MODE (0 = Linear, 1 = Interleaved). Burst operations are optional. Document Number: 38-05539 Rev. *K Page 24 of 33 CY7C1355C, CY7C1357C Switching Waveforms (continued) Figure 6. NOP, STALL and DESELECT Cycles [27, 28, 29] 1 2 3 tCYC 4 5 6 7 8 9 A5 A6 A7 10 CLK tCENS tCENH tCES tCEH tCH tCL CEN CE ADV/LD WE BWX A1 ADDRESS tAS A2 A4 A3 tCDV tAH tDOH tCLZ DQ D(A1) tDS D(A2) Q(A3) D(A2+1) tOEV Q(A4+1) Q(A4) tOELZ WRITE D(A1) WRITE D(A2) D(A5) Q(A6) D(A7) WRITE D(A7) DESELECT tOEHZ tDH OE COMMAND tCHZ BURST WRITE D(A2+1) READ Q(A3) READ Q(A4) DON’T CARE BURST READ Q(A4+1) tDOH WRITE D(A5) READ Q(A6) UNDEFINED Notes 27. For this waveform ZZ is tied LOW. 28. When CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 29. The IGNORE CLOCK EDGE or STALL cycle (Clock 3) illustrates CEN being used to create a pause. A write is not performed during this cycle. Document Number: 38-05539 Rev. *K Page 25 of 33 CY7C1355C, CY7C1357C Switching Waveforms (continued) Figure 7. ZZ Mode Timing [30, 31] CLK t ZZ ZZ I t ZZREC t ZZI SUPPLY I DDZZ t RZZI ALL INPUTS (except ZZ) Outputs (Q) DESELECT or READ Only High-Z DON’T CARE Notes 30. Device must be deselected when entering ZZ mode. See truth table for all possible signal conditions to deselect the device. 31. DQs are in high Z when exiting ZZ sleep mode. Document Number: 38-05539 Rev. *K Page 26 of 33 CY7C1355C, CY7C1357C Ordering Information The following table contains only the list of parts that are currently available. If you do not see what you are looking for, contact your local sales representative. For more information, visit the Cypress website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products. Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office closest to you, visit us at http://www.cypress.com/go/datasheet/offices. Speed (MHz) 133 Ordering Code CY7C1355C-133AXC Package Diagram Part and Package Type Operating Range 51-85050 100-pin TQFP (14 × 20 × 1.4 mm) Pb-free Commercial 51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Commercial CY7C1357C-133AXC 100 CY7C1357C-100BZC Ordering Code Definitions CY 7 C 135X C - XXX XX X C Temperature Range: C = Commercial Pb-free Package Type: XX = A or BZ A = 100-pin TQFP BZ = 165-ball FBGA Speed Grade: XXX = 133 MHz or 100 MHz Process Technology: C 90nm Part Identifier: 135X = 1355 or 1357 1355 = FT, 256 Kb × 36 (9 Mb) 1357 = FT, 512 Kb × 18 (9 Mb) Technology Code: C = CMOS Marketing Code: 7 = SRAM Company ID: CY = Cypress Document Number: 38-05539 Rev. *K Page 27 of 33 CY7C1355C, CY7C1357C Package Diagrams Figure 8. 100-pin TQFP (14 × 20 × 1.4 mm) A100RA Package Outline, 51-85050 51-85050 *D Document Number: 38-05539 Rev. *K Page 28 of 33 CY7C1355C, CY7C1357C Package Diagrams (continued) Figure 9. 165-ball FBGA (13 × 15 × 1.4 mm) BB165D/BW165D (0.5 Ball Diameter) Package Outline, 51-85180 51-85180 *F Document Number: 38-05539 Rev. *K Page 29 of 33 CY7C1355C, CY7C1357C Acronyms Acronym Document Conventions Description Units of Measure BGA ball grid array CE chip enable °C degree Celsius CEN clock enable MHz megahertz FPBGA fine-pitch ball grid array µA microampere JTAG joint test action group mA milliampere NoBL no bus latency ms millisecond OE output enable ns nanosecond SEL single event latchup pF picofarad TCK test clock V volt TDI test data input W watt TMS test mode select TDO test data output TQFP thin quad flat pack WE write enable Document Number: 38-05539 Rev. *K Symbol Unit of Measure Page 30 of 33 CY7C1355C, CY7C1357C Document History Page Document Title: CY7C1355C/CY7C1357C, 9-Mbit (256 K × 36 / 512 K × 18) Flow-Through SRAM with NoBL™ Architecture Document Number: 38-05539 Rev. ECN No. Issue Date Orig. of Change ** 242032 See ECN RKF New data sheet. *A 332059 See ECN PCI Changed status from Preliminary to Final. Updated Features (Removed 117 MHz frequency related information). Updated Selection Guide (Removed 117 MHz frequency related information). Updated Pin Configurations (Address expansion pins/balls in the pinouts for all packages are modified as per JEDEC standard). Updated Functional Overview (Updated ZZ Mode Electrical Characteristics (Changed maximum value of IDDZZ parameter from 35 mA to 50 mA). Updated IEEE 1149.1 Serial Boundary Scan (JTAG) (Updated TAP Instruction Set (Removed the sub-section Extest Output Bus Tri-state)). Updated Boundary Scan Order (Changed to match the B rev of these devices). Updated Boundary Scan Order (Changed to match the B rev of these devices). Updated Electrical Characteristics (Removed 117 MHz frequency related information, updated Test Conditions of VOL, VOH parameters, changed maximum value of ISB1 parameter from 40 mA to 110 mA, changed maximum value of ISB3 parameter from 40 mA to 100 mA, Changed Test Condition of ISB4 parameter from (VIN VDD – 0.3 V or VIN 0.3 V) to (VIN VIH or VIN VIL)). Updated Thermal Resistance (Changed JA and Jc for 100-pin TQFP Package from 25 °C/W and 9 °C/W to 29.41 °C/W and 6.13 °C/W respectively, changed JA and Jc for 119-ball BGA Package from 25 °C/W and 6 °C/W to 34.1 °C/W and 14.0 °C/W respectively, changed JA and Jc for 165-ball FBGA Package from 27 °C/W and 6 °C/W to 16.8 °C/W and 3.0 °C/W respectively). Updated Switching Characteristics (Removed 117 MHz frequency related information). Updated Ordering Information (Updated part numbers (Added lead-free information for 100-pin TQFP, 119-ball BGA and 165-ball FBGA Packages)). *B 351895 See ECN PCI Updated Electrical Characteristics (Changed maximum value of ISB2 parameter from 30 mA to 40 mA). Updated Ordering Information (Updated part numbers). *C 377095 See ECN PCI Updated Electrical Characteristics (Updated Note 16 (Modified test condition in from VIH < VDD to VIH VDD)). *D 408298 See ECN RXU Changed address of Cypress Semiconductor Corporation from “3901 North First Street” to “198 Champion Court”. Updated Electrical Characteristics (Changed “Input Load Current except ZZ and MODE” to “Input Leakage Current except ZZ and MODE” in the description of IX parameter). Updated Ordering Information (Updated part numbers, replaced Package Name column with Package Diagram in the Ordering Information table). Replaced three-state with tri-state in all instances across the document. *E 501793 See ECN VKN Updated Maximum Ratings (Added the Maximum Rating for Supply Voltage on VDDQ Relative to GND). Updated TAP AC Switching Characteristics (Changed minimum value of tTH, tTL parameters from 25 ns to 20 ns and maximum value of tTDOV parameter from 5 ns to 10 ns). Updated Ordering Information (Updated part numbers). *F 2896585 03/20/2010 NJY Updated Ordering Information (Removed obsolete parts from Ordering Information table). Updated Package Diagrams. Updated Sales, Solutions, and Legal Information. Updated in new template. Document Number: 38-05539 Rev. *K Description of Change Page 31 of 33 CY7C1355C, CY7C1357C Document History Page (continued) Document Title: CY7C1355C/CY7C1357C, 9-Mbit (256 K × 36 / 512 K × 18) Flow-Through SRAM with NoBL™ Architecture Document Number: 38-05539 Rev. ECN No. Issue Date Orig. of Change *G 3032633 09/17/2010 NJY Updated Ordering Information (Updated part numbers) and added Ordering Code Definitions. Added Acronyms and Units of Measure. Minor edits and updated in new template. *H 3210400 03/30/11 NJY Updated Ordering Information (Removed pruned parts namely CY7C1355C-133BGC, CY7C1357C-100AXC from ordering information table). Updated Package Diagrams (spec 51-85050 (changed revision from *C to *D)). *I 3353361 08/24/2011 PRIT Updated Functional Description (Updated Note as “For best practices recommendations, refer to SRAM System Design Guidelines.”). *J 3612268 05/09/2012 PRIT Updated Features (Removed 119-ball BGA Package related information). Updated Functional Description (Removed the Note “For best practices recommendations, refer to SRAM System Design Guidelines.” and its reference). Updated Pin Configurations (Removed 119-ball BGA Package related information, updated Figure 3 (removed CY7C1355C related information)). Updated IEEE 1149.1 Serial Boundary Scan (JTAG) (Removed CY7C1355C related information). Updated Identification Register Definitions (Removed CY7C1355C related information). Updated Scan Register Sizes (Removed “Bit Size (× 36)” column). Removed Boundary Scan Order (Corresponding to 119-ball BGA). Updated Boundary Scan Order (Removed CY7C1355C related information). Updated Operating Range (Removed Industrial Temperature Range). Updated Capacitance (Removed 119-ball BGA Package related information). Updated Thermal Resistance (Removed 119-ball BGA Package related information). Updated Ordering Information (Updated part numbers). Updated Package Diagrams (Removed 119-ball BGA Package related information (spec 51-85115), spec 51-85180 (changed revision from *C to *E)). Updated in new template. *K 3753175 09/24/2012 PRIT Updated Package Diagrams (spec 51-85180 (changed revision from *E to *F)). Document Number: 38-05539 Rev. *K Description of Change Page 32 of 33 CY7C1355C, CY7C1357C Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. Products Automotive Clocks & Buffers Interface Lighting & Power Control PSoC Solutions cypress.com/go/automotive psoc.cypress.com/solutions cypress.com/go/clocks PSoC 1 | PSoC 3 | PSoC 5 cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc Memory Optical & Image Sensing cypress.com/go/memory cypress.com/go/image PSoC cypress.com/go/psoc Touch Sensing cypress.com/go/touch USB Controllers Wireless/RF cypress.com/go/USB cypress.com/go/wireless © Cypress Semiconductor Corporation, 2006-2012. The information contained herein is subject to change without notice. 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Document Number: 38-05539 Rev. *K Revised September 24, 2012 Page 33 of 33 i486 is a trademark, and Intel and Pentium are registered trademarks, of Intel Corporation. PowerPC is a registered trademark of IBM Corporation. All products and company names mentioned in this document may be the trademarks of their respective holders.