INCHANGE Semiconductor isc N-Channel MOSFET Transistor IRL2910，IIRL2910 ·FEATURES ·Static drain-source on-resistance: RDS(on) ≤0.026Ω ·Enhancement mode ·Fast Switching Speed ·100% avalanche tested ·Minimum Lot-to-Lot variations for robust device performance and reliable operation ·DESCRITION ·reliable device for use in a wide variety of applications ·ABSOLUTE MAXIMUM RATINGS(Ta=25℃) SYMBOL PARAMETER VALUE UNIT VDSS Drain-Source Voltage 100 V VGS Gate-Source Voltage ±16 V ID Drain Current-Continuous 55 A IDM Drain Current-Single Pulsed 190 A PD Total Dissipation @TC=25℃ 200 W Tj Max. Operating Junction Temperature 175 ℃ -55~175 ℃ Tstg Storage Temperature ·THERMAL CHARACTERISTICS SYMBOL Rth(ch-c) Rth(ch-a) PARAMETER Channel-to-case thermal resistance Channel-to-ambient thermal resistance isc website：www.iscsemi.cn 1 MAX UNIT 0.75 ℃/W 62 ℃/W isc & iscsemi is registered trademark INCHANGE Semiconductor isc N-Channel MOSFET Transistor IRL2910，IIRL2910 ELECTRICAL CHARACTERISTICS TC=25℃ unless otherwise specified SYMBOL PARAMETER CONDITIONS MIN BVDSS Drain-Source Breakdown Voltage VGS=0V; ID =250μA 100 VGS(th) Gate Threshold Voltage VDS=VGS; ID =250μA 1.0 RDS(on) Drain-Source On-Resistance IGSS TYP MAX UNIT V 2.0 V VGS=10V; ID=29A 0.026 Ω Gate-Source Leakage Current VGS=±16V ±0.1 μA IDSS Drain-Source Leakage Current VDS=100V; VGS= 0V 25 μA VSD Diode forward voltage IS=29A, VGS = 0V 1.3 V isc website：www.iscsemi.cn 2 isc & iscsemi is registered trademark