ONSEMI MC14011UBCPG

MC14001UB, MC14011UB
UB−Suffix Series
CMOS Gates
The UB Series logic gates are constructed with P and N channel
enhancement mode devices in a single monolithic structure
(Complementary MOS). Their primary use is where low power
dissipation and/or high noise immunity is desired. The UB set of
CMOS gates are inverting non−buffered functions.
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MARKING
DIAGRAMS
Features
• Supply Voltage Range = 3.0 Vdc to 18 Vdc
• Linear and Oscillator Applications
• Capable of Driving Two Low−Power TTL Loads or One
•
•
•
14
Low−Power Schottky TTL Load Over the Rated Temperature Range
Double Diode Protection on All Inputs
Pin−for−Pin Replacements for Corresponding CD4000 Series UB
Suffix Devices
Pb−Free Packages are Available*
MAXIMUM RATINGS (Voltages Referenced to VSS)
Symbol
Value
Unit
−0.5 to +18.0
V
−0.5 to VDD + 0.5
V
Input or Output Current
(DC or Transient) per Pin
± 10
mA
PD
Power Dissipation, per Package
(Note 1)
500
mW
TA
Ambient Temperature Range
−55 to +125
°C
Tstg
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature
(8−Second Soldering)
260
°C
VDD
Vin, Vout
Iin, Iout
Parameter
DC Supply Voltage Range
Input or Output Voltage Range
(DC or Transient)
PDIP−14
P SUFFIX
CASE 646
MC140xxUBCP
AWLYYWW
1
14
SOIC−14
D SUFFIX
CASE 751A
140xxU
AWLYWW
1
xx
A
WL, L
YY, Y
WW, W
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 4 of this data sheet.
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. Temperature Derating:
Plastic “P and D/DW” Packages: – 7.0 mW/C From 65C To 125C
This device contains protection circuitry to guard against damage due to high
static voltages or electric fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated voltages to this
high−impedance circuit. For proper operation, Vin and Vout should be constrained
to the range VSS (Vin or Vout) VDD.
Unused inputs must always be tied to an appropriate logic voltage level
(e.g., either VSS or VDD). Unused outputs must be left open.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
 Semiconductor Components Industries, LLC, 2005
February, 2005 − Rev. 5
1
Publication Order Number:
MC14001UB/D
MC14001UB, MC14011UB
LOGIC DIAGRAMS
MC14001UB
Quad 2−Input
NOR Gate
1
2
5
6
8
9
12
13
MC14011UB
Quad 2−Input
NAND Gate
1
3
3
2
5
4
4
6
8
10
10
9
12
11
11
13
VDD = PIN 14
VSS = PIN 7
FOR ALL DEVICES
PIN ASSIGNMENTS
MC14001UB
Quad 2−Input NOR Gate
MC14011UB
Quad 2−Input NAND Gate
IN 1A
1
14
VDD
IN 1A
1
14
VDD
IN 2A
2
13
IN 2D
IN 2A
2
13
IN 2D
OUTA
3
12
IN 1D
OUTA
3
12
IN 1D
OUTB
4
11
OUTD
OUTB
4
11
OUTD
IN 1B
5
10
OUTC
IN 1B
5
10
OUTC
IN 2B
6
9
IN 2C
IN 2B
6
9
IN 2C
VSS
7
8
IN 1C
VSS
7
8
IN 1C
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2
MC14001UB, MC14011UB
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ELECTRICAL CHARACTERISTICS (Voltages Referenced to VSS)
− 55C
Characteristic
Symbol
25C
125C
VDD
Vdc
Min
Max
Min
Typ
(Note 2)
Max
Min
Max
Unit
Output Voltage
Vin = VDD or 0
“0” Level
VOL
5.0
10
15
−
−
−
0.05
0.05
0.05
−
−
−
0
0
0
0.05
0.05
0.05
−
−
−
0.05
0.05
0.05
Vdc
Vin = 0 or VDD
“1” Level
VOH
5.0
10
15
4.95
9.95
14.95
−
−
−
4.95
9.95
14.95
5.0
10
15
−
−
−
4.95
9.95
14.95
−
−
−
Vdc
“0” Level
VIL
5.0
10
15
−
−
−
1.0
2.0
2.5
−
−
−
2.25
4.50
6.75
1.0
2.0
2.5
−
−
−
1.0
2.0
2.5
5.0
10
15
4.0
8.0
12.5
−
−
−
4.0
8.0
12.5
2.75
5.50
8.25
−
−
−
4.0
8.0
12.5
−
−
−
5.0
5.0
10
15
– 1.2
– 0.25
– 0.62
– 1.8
−
−
−
−
– 1.0
– 0.2
– 0.5
– 1.5
– 1.7
– 0.36
– 0.9
– 3.5
−
−
−
−
– 0.7
– 0.14
– 0.35
– 1.1
−
−
−
−
IOL
5.0
10
15
0.64
1.6
4.2
−
−
−
0.51
1.3
3.4
0.88
2.25
8.8
−
−
−
0.36
0.9
2.4
−
−
−
mAdc
Input Current
Iin
15
−
± 0.1
−
± 0.00001
± 0.1
−
± 1.0
Adc
Input Capacitance
(Vin = 0)
Cin
−
−
−
−
5.0
7.5
−
−
pF
Quiescent Current
(Per Package)
IDD
5.0
10
15
−
−
−
0.25
0.5
1.0
−
−
−
0.0005
0.0010
0.0015
0.25
0.5
1.0
−
−
−
7.5
15
30
Adc
IT
5.0
10
15
Input Voltage
(VO = 4.5 Vdc)
(VO = 9.0 Vdc)
(VO = 13.5 Vdc)
(VO = 0.5 Vdc)
(VO = 1.0 Vdc)
(VO = 1.5 Vdc)
“1” Level
Output Drive Current
(VOH = 2.5 Vdc)
(VOH = 4.6 Vdc)
(VOH = 9.5 Vdc)
(VOH = 13.5 Vdc)
(VOL = 0.4 Vdc)
(VOL = 0.5 Vdc)
(VOL = 1.5 Vdc)
IIH
Vdc
IOH
Source
Sink
Total Supply Current (Notes 3, 4)
(Dynamic plus Quiescent,
Per Gate CL = 50 pF)
Vdc
mAdc
IT = (0.3 A/kHz) f + IDD/N
IT = (0.6 A/kHz) f + IDD/N
IT = (0.8 A/kHz) f + IDD/N
Adc
2. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
3. The formulas given are for the typical characteristics only at 25C.
4. To calculate total supply current at loads other than 50 pF:
IT(CL) = IT(50 pF) + (CL − 50) Vfk
where: IT is in H (per package), CL in pF, V = (VDD − VSS) in volts, f in kHz is input frequency, and k = 0.001 x the number of exercised gates
per package.
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SWITCHING CHARACTERISTICS (Note 5) (CL = 50 pF, TA = 25C)
Characteristic
Symbol
Output Rise Time
tTLH = (3.0 ns/pF) CL + 30 ns
tTLH = (1.5 ns/pF) CL + 15 ns
tTLH = (1.1 ns/pF) CL + 10 ns
tTLH
Output Fall Time
tTHL = (1.5 ns/pF) CL + 25 ns
tTHL = (0.75 ns/pF) CL + 12.5 ns
tTHL = (0.55 ns/pF) CL + 9.5 ns
tTHL
Propagation Delay Time
tPLH, tPHL = (1.7 ns/pF) CL + 30 ns
tPLH, tPHL = (0.66 ns/pF) CL + 22 ns
tPLH, tPHL = (0.50 ns/pF) CL + 15 ns
VDD
Vdc
Min
Typ
(Note 6)
Max
5.0
10
15
−
−
−
180
90
65
360
180
130
5.0
10
15
−
−
−
100
50
40
200
100
80
5.0
10
15
−
−
−
90
50
40
180
100
80
Unit
ns
ns
tPLH, tPHL
ns
5. The formulas given are for the typical characteristics only at 25C.
6. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
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3
MC14001UB, MC14011UB
ORDERING INFORMATION
Package
Shipping†
MC14001UBCP
PDIP−14
500 Units / Rail
MC14001UBCPG
PDIP−14
(Pb−Free)
500 Units / Rail
MC14001UBD
SOIC−14
55 Units / Rail
MC14001UBDG
SOIC−14
(Pb−Free)
55 Units / Rail
MC14001UBDR2
SOIC−14
2500 / Tape & Reel
MC14001UBDR2G
SOIC−14
(Pb−Free)
2500 / Tape & Reel
MC14011UBCP
PDIP−14
500 Units / Rail
MC14011UBCPG
PDIP−14
(Pb−Free)
500 Units / Rail
MC14011UBD
SOIC−14
55 Units / Rail
MC14011UBDG
SOIC−14
(Pb−Free)
55 Units / Rail
MC14011UBDR2
SOIC−14
2500 / Tape & Reel
MC14011UBDR2G
SOIC−14
(Pb−Free)
2500 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
20 ns
14
PULSE
GENERATOR
VDD
INPUT
INPUT
OUTPUT
20 ns
VDD
90%
50%
10%
0V
tPHL
*
CL
7
tPLH
90%
50%
10%
OUTPUT
INVERTING
VSS
*All unused inputs of AND, NAND gates must be
connected to VDD.
All unused inputs of OR, NOR gates must be
connected to VSS.
tTHL
Figure 1. Switching Time Test Circuit and Waveforms
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4
VOH
VOL
tTLH
MC14001UB, MC14011UB
MC14001UB CIRCUIT SCHEMATIC
VDD
14
3
MC14011UB CIRCUIT SCHEMATIC
(1/4 of Device Shown)
10
14 VDD
1
8
2
9
3, 4, 10, 11
1, 6, 8, 13
2, 5, 9, 12
6
13
5
12
11
14
12
10
8.0
8.0
a
b
6.0
6.0
5.0 Vdc
b
2.0
15 Vdc
b a
a
4.0
0
16
VDD = 15 Vdc TA = +25°C
Unused input
connected to
VSS.
a One input only
10 Vdc
b Both inputs
10 Vdc
4.0
Vout , OUTPUT VOLTAGE (Vdc)
Vout , OUTPUT VOLTAGE (Vdc)
16
7
VSS
I D, DRAIN CURRENT (mAdc)
4
7 VSS
2.0
VGS = −5.0 Vdc
c
−10 Vdc
−10
−10
10
c
b
a TA = −55°C
b TA = +25°C
c TA = +125°C
−8.0
b
c
−15 Vdc
b
a
−8.0
−6.0
−4.0
VDS, DRAIN VOLTAGE (Vdc)
a TA = +125°C
b TA = −55°C
8.0
b
a
6.0
5.0 Vdc
4.0
a b
0
2.0 4.0 6.0 8.0 10 12 14 16
Vin, INPUT VOLTAGE (Vdc)
Figure 3. Typical Voltage Transfer
Characteristics versus Temperature
a
−6.0
10 Vdc
10
0
I D, DRAIN CURRENT (mAdc)
I D, DRAIN CURRENT (mAdc)
0
−4.0
12
2.0
Figure 2. Typical Voltage and
Current Transfer Characteristics
−2.0
14
0
2.0 4.0 6.0 8.0 10 12 14 16
Vin, INPUT VOLTAGE (Vdc)
0
VDD = 15 Vdc Unused input
connected to
b
VSS.
a
a
8.0
15 Vdc
b
c
a
VGS = 10 Vdc
b
c
6.0
a TA = −55°C
b TA = +25°C
c TA = +125°C
4.0
a
2.0
b
5.0 Vdc
c
a
−2.0
0
0
0
Figure 4. Typical Output Source Characteristics
2.0
4.0
6.0
VDS, DRAIN VOLTAGE (Vdc)
8.0
Figure 5. Typical Output Sink Characteristics
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5
10
MC14001UB, MC14011UB
PACKAGE DIMENSIONS
P SUFFIX
PLASTIC DIP PACKAGE
CASE 646−06
ISSUE N
14
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEADS
WHEN FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE
MOLD FLASH.
5. ROUNDED CORNERS OPTIONAL.
8
B
1
7
A
F
L
N
C
−T−
SEATING
PLANE
J
K
H
G
D 14 PL
0.13 (0.005)
M
M
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6
DIM
A
B
C
D
F
G
H
J
K
L
M
N
INCHES
MIN
MAX
0.715
0.770
0.240
0.260
0.145
0.185
0.015
0.021
0.040
0.070
0.100 BSC
0.052
0.095
0.008
0.015
0.115
0.135
0.290
0.310
−−−
10 0.015
0.039
MILLIMETERS
MIN
MAX
18.16
18.80
6.10
6.60
3.69
4.69
0.38
0.53
1.02
1.78
2.54 BSC
1.32
2.41
0.20
0.38
2.92
3.43
7.37
7.87
−−−
10 0.38
1.01
MC14001UB, MC14011UB
PACKAGE DIMENSIONS
D SUFFIX
PLASTIC SOIC PACKAGE
CASE 751A−03
ISSUE G
−A−
14
8
−B−
P 7 PL
0.25 (0.010)
M
B
M
7
1
G
F
R X 45 C
−T−
SEATING
PLANE
0.25 (0.010)
M
T B
J
M
K
D 14 PL
S
A
S
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7
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.127
(0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
DIM
A
B
C
D
F
G
J
K
M
P
R
MILLIMETERS
MIN
MAX
8.55
8.75
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0
7
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.337 0.344
0.150 0.157
0.054 0.068
0.014 0.019
0.016 0.049
0.050 BSC
0.008 0.009
0.004 0.009
0
7
0.228 0.244
0.010 0.019
MC14001UB, MC14011UB
ON Semiconductor and
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8
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MC14001UB/D