Microcomputer Components 8-Bit CMOS Microcontroller C501 Data Sheet 04.97 C501 Data Sheet Revision History : 1997-04-01 Previous Releases : 11.92, 11.93, 08.94, 08.95, 10.96 Page (previous version) Page (new version) general Subjects (changes since last revision) C501G-1E OTP version included 4 5 5-7 11 8, 9, 10 4 5 5-7 11 8, 9, 10 13 14 15-18 17 41 - 13 14 15 16-18 17 25-28 31 41 43, 44 Ordering information resorted and C501G-1E types added Table with literature hints added Pin configuration logic symbol for pins EA/Vpp and ALE/PROG updated Pin description for ALE/PROG and EA/Vpp completed Port 1, 3, 2 pin description: “bidirectional” replaced by “quasibidirectional” Block diagram updated for C501G-1E New design of register (PSW) description “Memory organization” added Actualized design of the SFR tables Reset value of T2CON corrected Description for the C501-1E OTP version added DC characteristics for C501-1E added Timing “External Clock Drive” now behind “Data Memory Cycle” AC characteristics for C501-1E added Edition 1997-04-01 Published by Siemens AG, Bereich Halbleiter, MarketingKommunikation, Balanstraße 73, 81541 München © Siemens AG 1997. 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C501 8-Bit CMOS Microcontroller Preliminary • • • • • • • • • • • • • Fully compatible to standard 8051 microcontroller Versions for 12/24/40 MHz operating frequency Program memory : completely external (C501-L) 8K × 8 ROM (C501-1R) 8K × 8 OTP memory (C501-1E) 256 × 8 RAM Four 8-bit ports Three 16-bit timers / counters (timer 2 with up/down counter feature) USART Six interrupt sources, two priority levels Power saving modes Quick Pulse programming algorithm (C501-1E only) 2-Level program memory lock (C501-1E only) P-DIP-40, P-LCC-44, and P-MQFP-44 package Temperature ranges : SAB-C501 TA : 0 ˚C to 70 ˚C SAF-C501 TA : – 40 ˚C to 85 ˚C Power Saving Modes RAM 256 x 8 T0 T2 Port 0 Ι /O Port 1 Ι /O Port 2 Ι/O Port 3 Ι/O USART CPU T1 8K x 8 ROM (C501-1R) 8K x 8 OTP (C501-1E) MCA03238 Figure 1 C501G Functional Units Semiconductor Group 3 1997-04-01 C501 The C501-1R contains a non-volatile 8K × 8 read-only program memory, a volatile 256 × 8 read/ write data memory, four ports, three 16-bit timers counters, a seven source, two priority level interrupt structure and a serial port. The C501-L is identical, except that it lacks the program memory on chip. The C501-1E contains a one-time programmable (OTP) program memory on chip. The term C501 refers to all versions within this specification unless otherwise noted. Further, the term C501 refers to all versions which are available in the different temperature ranges, marked with SAB-C501... or SAF-C501.... . Ordering Information Type Ordering Code Package SAB-C501G-LN SAB-C501G-LP SAB-C501G-LM Q67120-C969 Q67120-C968 Q67127-C970 P-LCC-44 for external memory (12 MHz) P-DIP-40 P-MQFP-44 SAB-C501G-L24N SAB-C501G-L24P SAB-C501G-L24M Q67120-C1001 Q67120-C999 Q67127-C1014 P-LCC-44 for external memory (24 MHz) P-DIP-40 P-MQFP-44 SAB-C501G-L40N SAB-C501G-L40P SAB-C501G-L40M Q67120-C1002 Q67120-C1000 Q67127-C1009 P-LCC-44 for external memory (40 MHz) P-DIP-40 P-MQFP-44 SAF-C501G-L24N SAF-C501G-L24P Q67120-C1011 Q67120-C1010 P-LCC-44 for external memory (24 MHz) P-MQFP-44 ext. temp. – 40 ˚C to 85 ˚C SAB-C501G-1RN SAB-C501G-1RP SAB-C501G-1RM Q67120-DXXX Q67120-DXXX Q67127-DXXX P-LCC-44 with mask-programmable ROM (12 MHz) P-DIP-40 P-MQFP-44 SAB-C501G-1R24N Q67120-DXXX SAB-C501G-1R24P Q67120-DXXX SAB-C501G-1R24M Q67127-DXXX P-LCC-44 with mask-programmable ROM (24 MHz) P-DIP-40 P-MQFP-44 SAB-C501G-1R40N Q67120-DXXX SAB-C501G-1R40P Q67120-DXXX SAB-C501G-1R40M Q67127-DXXX P-LCC-44 with mask-programmable ROM (40 MHz) P-DIP-40 P-MQFP-44 SAF-C501G-1R24N SAF-C501G-1R24P Q67120-DXXX Q67120-DXXX P-LCC-44 P-DIP-40 with mask-programmable ROM (24 MHz) ext. temp. – 40 ˚C to 85 ˚C SAB-C501G-1EN SAB-C501G-1EP Q67120-C1054 Q67120-C1056 P-LCC-44 P-DIP-40 with OTP memory (12 MHz) SAF-C501G-1EN SAF-C501G-1EP Q67120-C2002 Q67120-C2003 P-LCC-44 P-DIP-40 with OTP memory (12 MHz)) ext. temp. – 40 ˚C to 85 ˚C SAB-C501G-1E24N SAB-C501G-1E24P Q67120-C2005 Q67120-C2006 P-LCC-44 P-DIP-40 with OTP memory (24 MHz) SAF-C501G-1E24N SAF-C501G-1E24P Q67120-C2008 Q67120-C2009 P-LCC-44 P-DIP-40 with OTP memory (24 MHz)) ext. temp. – 40 ˚C to 85 ˚C Semiconductor Group 4 Description (8-Bit CMOS microcontroller) 1997-04-01 C501 Note: Versions for extended temperature range – 40 ˚C to 110 ˚C (SAH-C501G) on request. The ordering number of ROM types (DXXX extensions) is defined after program release (verification) of the customer. Additional Literature For further information about the C501 the following literature is available : C501 8-Bit CMOS Microcontroller User’s Manual B158-H6723-X-X-7600 C500 Microcontroller Family Architecture and Instruction Set User’s Manual B158-H6987-X-X-7600 C500 Microcontroller Family - Pocket Guide B158-H6986-X-X-7600 6 P1.5 P1.6 P1.7 RESET RxD/P3.0 N.C. TxD/P3.1 INT0/P3.2 INT1/P3.3 T0/P3.4 T1/P3.5 7 8 9 10 11 12 13 14 15 16 17 5 4 3 2 P0.0/AD0 P0.1/AD1 P0.2/AD2 P0.3/AD3 Ordering Number P1.4 P1.3 P1.2 P1.1/T2EX P1.0/T2 N.C VCC Title 1 44 43 42 41 40 C501 39 38 37 36 35 34 33 32 31 30 29 P0.4/AD4 P0.5/AD5 P0.6/AD6 P0.7/AD7 EA/VPP N.C. ALE/PROG PSEN P2.7/A15 P2.6/A14 P2.5/A13 N.C. P2.0/A8 P2.1/A9 P2.2/A10 P2.3/A11 P2.4/A12 WR/P3.6 RD/P3.7 XTAL2 XTAL1 VSS 18 19 20 21 22 23 24 25 26 27 28 MCP03214 Figure 2 Pin Configuration P-LCC-44 Package (Top view) Semiconductor Group 5 1997-04-01 C501 T2/P1.0 1 40 VCC T2EX/P1.1 2 39 P0.0/AD0 P1.2 3 38 P0.1/AD1 P1.3 4 37 P0.2/AD2 P1.4 5 36 P0.3/AD3 P1.5 6 35 P0.4/AD4 P1.6 7 34 P0.5/AD5 P1.7 8 33 P0.6/AD6 RESET 9 32 P0.7/AD7 31 EA/VPP RxD/P3.0 10 C501 TxD/P3.1 11 30 ALE/PROG INT0/P3.2 12 29 PSEN INT1/P3.3 13 28 P2.7/A15 T0/P3.4 14 27 P2.6/A14 T1/P3.5 15 26 P2.5/A13 WR/P3.6 16 25 P2.4/A12 RD/P3.7 17 24 P2.3/A11 XTAL2 18 23 P2.2/A10 XTAL1 19 22 P2.1/A9 VSS 20 21 P2.0/A8 MCP03215 Figure 3 Pin Configuration P-DIP-40 Package (top view) Semiconductor Group 6 1997-04-01 P0.4/AD4 P0.5/AD5 P0.6/AD6 P0.7/AD7 EA/VPP N.C. ALE/PROG PSEN P2.7/A15 P2.6/A14 P2.5/A13 C501 34 35 36 37 38 39 40 41 42 43 44 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 C501 16 15 14 13 12 1 2 3 4 5 6 7 8 9 10 11 P1.5 P1.6 P1.7 RESET RxD/P3.0 N.C. TxD/P3.1 INT0/P3.2 INT1/P3.3 T0/P3.4 T1/P3.5 P0.3/AD3 P0.2/AD2 P0.1/AD1 P0.0/AD0 VCC N.C. P1.0/T2 P1.1/T2EX P1.2 P1.3 P1.4 P2.4/A12 P2.3/A11 P2.2/A10 P2.1/A9 P2.0/A8 N.C. VSS XTAL1 XTAL2 RD/P3.7 WR/P3.6 MCP03216 Figure 4 Pin Configuration P-MQFP-44 Package (top view) VCC VSS Port 0 8-Bit Digital Ι /O XTAL1 XTAL2 Port 1 8-Bit Digital Ι /O RESET C501 Port 2 8-Bit Digital Ι /O EA /VPP ALE/PROG Port 3 8-Bit Digital Ι /O PSEN MCL03217 Figure 5 Logic Symbol Semiconductor Group 7 1997-04-01 C501 Table 1 Pin Definitions and Functions Symbol Pin Number I/O*) Function P-LCC-44 P-DIP-40 P-MQFP-44 P1.0 – P1.7 2–9 2 3 1–8 40–44, 1–3, 1 2 40 41 I/O Port 1 is a quasi-bidirectional I/O port with internal pull-up resistors. Port 1 pins that have 1s written to them are pulled high by the internal pullup resistors, and in that state can be used as inputs. As inputs, port 1 pins being externally pulled low will source current (IIL, in the DC characteristics) because of the internal pull-up resistors. Port 1 also contains the timer 2 pins as secondary function. The output latch corresponding to a secondary function must be pro-grammed to a one (1) for that function to operate. The secondary functions are assigned to the pins of port 1, as follows: P1.0 T2 Input to counter 2 P1.1 T2EX Capture - Reload trigger of timer 2 / Up-Down count *) I = Input O = Output Semiconductor Group 8 1997-04-01 C501 Table 1 Pin Definitions and Functions (cont’d) Symbol Pin Number I/O*) Function P-LCC-44 P-DIP-40 P-MQFP-44 P3.0 – P3.7 11, 13–19 10–17 5, 7–13 11 10 5 13 11 7 14 12 8 15 13 9 16 17 18 14 15 16 10 11 12 19 17 13 I/O Port 3 is a quasi-bidirectional I/O port with internal pull-up resistors. Port 3 pins that have 1s written to them are pulled high by the internal pull-up resistors, and in that state they can be used as inputs. As inputs, port 3 pins being externally pulled low will source current (IIL, in the DC characteristics) because of the internal pull-up resistors. Port 3 also contains the interrupt, timer, serial port 0 and external memory strobe pins which are used by various options. The output latch corresponding to a secondary function must be programmed to a one (1) for that function to operate. The secondary functions are assigned to the pins of port 3, as follows: P3.0 R×D receiver data input (asynchronous) or data input output (synchronous) of serial interface 0 P3.1 T×D transmitter data output (asynchronous) or clock output (synchronous) of the serial interface 0 P3.2 INT0 interrupt 0 input/timer 0 gate control P3.3 INT1 interrupt 1 input/timer 1 gate control P3.4 T0 counter 0 input P3.5 T1 counter 1 input P3.6 WR the write control signal latches the data byte from port 0 into the external data memory P3.7 RD the read control signal enables the external data memory to port 0 *) I = Input O = Output Semiconductor Group 9 1997-04-01 C501 Table 1 Pin Definitions and Functions (cont’d) Symbol Pin Number I/O*) Function P-LCC-44 P-DIP-40 P-MQFP-44 XTAL2 20 18 14 – XTAL2 Output of the inverting oscillator amplifier. XTAL1 21 19 15 – XTAL1 Input to the inverting oscillator amplifier and input to the internal clock generator circuits. To drive the device from an external clock source, XTAL1 should be driven, while XTAL2 is left unconnected. There are no requirements on the duty cycle of the external clock signal, since the input to the internal clocking circuitry is divided down by a divide-by-two flip-flop. Minimum and maximum high and low times as well as rise fall times specified in the AC characteristics must be observed. 21–28 18–25 I/O Port 2 is a quasi-bidirectional I/O port with internal pull-up resistors. Port 2 pins that have 1s written to them are pulled high by the internal pull-up resistors, and in that state they can be used as inputs. As inputs, port 2 pins being externally pulled low will source current (IIL, in the DC characteristics) because of the internal pull-up resistors. Port 2 emits the highorder address byte during fetches from external program memory and during accesses to external data memory that use 16-bit addresses (MOVX @DPTR). In this application it uses strong internal pull-up resistors when issuing 1s. During accesses to external data memory that use 8-bit addresses (MOVX @Ri), port 2 issues the contents of the P2 special function register. P2.0 – P2.7 24–31 *) I = Input O = Output Semiconductor Group 10 1997-04-01 C501 Table 1 Pin Definitions and Functions (cont’d) Symbol Pin Number I/O*) Function P-LCC-44 P-DIP-40 P-MQFP-44 PSEN 32 29 26 O The Program Store Enable output is a control signal that enables the external program memory to the bus during external fetch operations. It is activated every six oscillator periods except during external data memory accesses. Remains high during internal program execution. RESET 10 9 4 I RESET A high level on this pin for two machine cycles while the oscillator is running resets the device. An internal diffused resistor to VSS permits power-on reset using only an external capacitor to VCC. ALE/PROG 33 30 27 I/O The Address Latch Enable output is used for latching the low-byte of the address into external memory during normal operation. It is activated every six oscillator periods except during an external data memory access. For the C501-1E this pin is also the program pulse input (PROG) during OTP memory programming. EA/VPP 31 29 I External Access Enable When held at high level, instructions are fetched from the internal ROM (C501-1R and C501-1E) when the PC is less than 2000H. When held at low level, the C501 fetches all instructions from external program memory. For the C501-L this pin must be tied low. This pin also receives the programming supply voltage VPP during OTP memory programming (C501-1E) only). 35 *) I = Input O = Output Semiconductor Group 11 1997-04-01 C501 Table 1 Pin Definitions and Functions (cont’d) Symbol Pin Number I/O*) Function P-LCC-44 P-DIP-40 P-MQFP-44 P0.0 – P0.7 43–36 39–32 37–30 I/O Port 0 is an 8-bit open-drain bidirectional I/O port. Port 0 pins that have 1s written to them float, and in that state can be used as high-impedance inputs. Port 0 is also the multiplexed low-order address and data bus during accesses to external program or data memory. In this application it uses strong internal pull-up resistors when issuing 1s. Port 0 also outputs the code bytes during program verification in the C501-1R and C501-1E. External pull-up resistors are required during program verification. VSS 22 20 16 – Circuit ground potential VCC 44 40 38 – Supply terminal for all operating modes N.C. 1, 12, 23, 34 – 6, 17, 28, 39 – No connection *) I = Input O = Output Semiconductor Group 12 1997-04-01 C501 Functional Description The C501 is fully compatible to the standard 8051 microcontroller family. It is compatible with the 80C32/52/82C52. While maintaining all architectural and operational characteristics of the 8051microcontroller family, the C501 incorporates some enhancements in the timer 2 unit. Figure 6 shows a block diagram of the C501. V CC V SS C501 XTAL1 XTAL2 OSC & Timing RESET CPU RAM C501-1R : ROM C501-1E : OTP 256 x 8 8K x 8 ALE/PROG Timer 0 PSEN EA/VPP Port 0 Port 0 8-Bit Digit. Ι /O Port 1 Port 1 8-Bit Digit. Ι /O Port 2 Port 2 8-Bit Digit. Ι /O Port 3 Port 3 8-Bit Digit. Ι /O Timer 1 Timer 2 Interrupt Unit Serial Channel (USART) MCB03219 Figure 6 Block Diagram of the C501 Semiconductor Group 13 1997-04-01 C501 CPU The C501 is efficient both as a controller and as an arithmetic processor. It has extensive facilities for binary and BCD arithmetic and excels in its bit-handling capabilities. Efficient use of program memory results from an instruction set consisting of 44 % one-byte, 41 % two-byte, and 15% three-byte instructions. With a 12 MHz crystal, 58% of the instructions are executed in 1.0 µs 24 MHz: 500 ns, 40 MHz : 300 ns). Special Function Register PSW (Address D0H) Reset Value : 00H Bit No. MSB D0H LSB D7H D6H D5H D4H D3H D2H D1H D0H CY AC F0 RS1 RS0 OV F1 P Bit Function CY Carry Flag Used by arithmetic instruction. AC Auxiliary Carry Flag Used by instructions which execute BCD operations. F0 General Purpose Flag RS1 RS0 Register Bank select control bits These bits are used to select one of the four register banks. PSW RS1 RS0 Function 0 0 Bank 0 selected, data address 00H-07H 0 1 Bank 1 selected, data address 08H-0FH 1 0 Bank 2 selected, data address 10H-17H 1 1 Bank 3 selected, data address 18H-1FH OV Overflow Flag Used by arithmetic instruction. F1 General Purpose Flag P Parity Flag Set/cleared by hardware after each instruction to indicate an odd/even number of "one" bits in the accumulator, i.e. even parity. Semiconductor Group 14 1997-04-01 C501 Memory Organization The C501 CPU manipulates data and operands in the following four address spaces: – – – – up to 64 Kbyte of internal/external program memory up to 64 Kbyte of external data memory 256 bytes of internal data memory a 128 byte special function register area Figure 7 illustrates the memory address spaces of the C501. FFFF H FFFF H External External Indirect Address Direct Address FF H Internal RAM 2000 H 80 H 80 H Internal RAM External (EA = 0) 0000 H "Code Space" FF H 7F H 1FFF H Internal (EA = 1) Special Function Register 0000 H "Data Space" 00 H "Internal Data Space" MCD03224 Figure 7 C501 Memory Map Semiconductor Group 15 1997-04-01 C501 Special Function Registers The registers, except the program counter and the four general purpose register banks, reside in the special function register area. The 27 special function registers (SFRs) include pointers and registers that provide an interface between the CPU and the other on-chip peripherals. All SFRs with addresses where address bits 0-2 are 0 (e.g. 80H, 88H, 90H, 98H, ..., F8H, FFH) are bitaddressable. The SFRs of the C501 are listed in table 2 and table 3. In table 2 they are organized in groups which refer to the functional blocks of the C501. Table 3 illustrates the contents of the SFRs in numeric order of their addresses. Semiconductor Group 16 1997-04-01 C501 Table 2 Special Function Registers - Functional Blocks Block Symbol Name Address Contents after Reset CPU ACC B DPH DPL PSW SP Accumulator B-Register Data Pointer, High Byte Data Pointer, Low Byte Program Status Word Register Stack Pointer E0H 1) F0H 1) 83H 82H D0H 1) 81H 00H 00H 00H 00H 00H 07H Interrupt System IE IP Interrupt Enable Register Interrupt Priority Register A8H1) B8H 1) 0X000000B 3) XX000000B 3) Ports P0 P1 P2 P3 Port 0 Port 1 Port 2 Port 3 80H 1) 90H 1) A0H 1) B0H 1) FFH FFH FFH FFH Serial Channel PCON 2) SBUF SCON Power Control Register Serial Channel Buffer Register Serial Channel Control Register 87H 99H 98H 1) 0XXX0000B 3) XXH 3) 00H Timer 0 / Timer 1 TCON TH0 TH1 TL0 TL1 TMOD Timer 0/1 Control Register Timer 0, High Byte Timer 1, High Byte Timer 0, Low Byte Timer 1, Low Byte Timer Mode Register 88H 1) 8CH 8DH 8AH 8BH 89H 00H 00H 00H 00H 00H 00H Timer 2 T2CON T2MOD RC2H RC2L TH2 TL2 Timer 2 Control Register Timer 2 Mode Register Timer 2 Reload/Capture Register, High Byte Timer 2 Reload/Capture Register, Low Byt Timer 2 High Byte Timer 2 Low Byte C8H 1) C9H CBH CAH CDH CCH 00H XXXXXXX0B 3) 00H 00H 00H 00H Power Control Register 87H 0XXX0000B 3) Pow. Sav. PCON 2) Modes 1) Bit-addressable special function registers 2) This special function register is listed repeatedly since some bits of it also belong to other functional blocks. 3) “X“ means that the value is undefined and the location is reserved Semiconductor Group 17 1997-04-01 C501 Table 3 Contents of the SFRs, SFRs in numeric order of their addresses Addr Register Content Bit 7 after Reset1) Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 80H2) P0 FFH .7 .6 .5 .4 .3 .2 .1 .0 81H SP .7 .6 .5 .4 .3 .2 .1 .0 82H DPL 07H 00H .7 .6 .5 .4 .3 .2 .1 .0 83H DPH .7 .6 .5 .4 .3 .2 .1 .0 87H PCON 00H 0XXX0000B SMOD – – – GF1 GF0 PDE IDLE 00H 00H TF1 TR1 TF0 TR0 IE1 IT1 IE0 IT0 GATE C/T M1 M0 GATE C/T M1 M0 00H 00H .7 .6 .5 .4 .3 .2 .1 .0 .7 .6 .5 .4 .3 .2 .1 .0 00H 00H .7 .6 .5 .4 .3 .2 .1 .0 .7 .6 .5 .4 .3 .2 .1 .0 90H2) P1 FFH .7 .6 .5 .4 .3 .2 .1 .0 98H2) SCON 00H XXH SM0 SM1 SM2 REN TB8 RB8 TI RI .7 .6 .5 .4 .3 .2 .1 .0 FFH .7 .6 .5 .4 .3 .2 .1 .0 0X000000B EA – ET2 ES ET1 EX1 ET0 EX0 B0H2) P3 FFH RD WR T1 T0 INT1 INT0 TxD RxD B8H2) IP XX00. 0000B – – PT2 PS PT1 PX1 PT0 PX0 C8H2) T2CON TF2 EXF2 RCLK TCLK EXEN2 TR2 C/T2 CP/RL2 C9H T2MOD 00H XXXXXXX0B – – – – – – – DCEN CAH RC2L 00H .7 .6 .5 .4 .3 .2 .1 .0 CBH RC2H 00H .7 .6 .5 .4 .3 .2 .1 .0 CCH TL2 00H 00H .7 .6 .5 .4 .3 .2 .1 .0 .7 .6 .5 .4 .3 .2 .1 .0 CY AC F0 RS1 RS0 OV F1 P E0H2) ACC 00H 00H .7 .6 .5 .4 .3 .2 .1 .0 F0H2) B 00H .7 .6 .5 .4 .3 .2 .1 .0 88H 2) TCON 89H TMOD 8AH TL0 8BH TL1 8CH TH0 8DH TH1 99H SBUF A0H2) P2 A8H 2) IE CDH TH2 D0H2) PSW 1) X means that the value is undefined and the location is reserved 2) Bit-addressable special function registers Semiconductor Group 18 1997-04-01 C501 Timer / Counter 0 and 1 Timer/counter 0 and 1 can be used in four operating modes as listed in table 4. Table 4 Timer/Counter 0 and 1 Operating Modes Mode Description TMOD Input Clock Gate C/T M1 M0 internal external (max) 0 8-bit timer/counter with a divide-by-32 prescaler X X 0 0 fOSC/12 × 32 fOSC/24 × 32 1 16-bit timer/counter X X 1 1 fOSC/12 fOSC/24 2 8-bit timer/counter with 8-bit autoreload X X 0 0 fOSC/12 fOSC/24 3 Timer/counter 0 used as one 8-bit timer/counter and one 8-bit timer Timer 1 stops X X 1 1 fOSC/12 fOSC/24 In the “timer” function (C/T = ‘0’) the register is incremented every machine cycle. Therefore the count rate is fOSC/12. In the “counter” function the register is incremented in response to a 1-to-0 transition at its corresponding external input pin (P3.4/T0, P3.5/T1). Since it takes two machine cycles to detect a falling edge the max. count rate is fOSC/24. External inputs INTO and INT1 (P3.2, P3.3) can be programmed to function as a gate to facilitate pulse width measurements. Figure 8 illustrates the input clock logic. f OSC f OSC/12 ÷ 12 C/T TMOD 0 Timer 0/1 Input Clock P3.4/T0 P3.5/T1 max f OSC/24 1 TR 0/1 Control TCON Gate & =1 TMOD <_ 1 P3.2/INT0 P3.3/INT1 MCS01768 Figure 8 Timer/Counter 0 and 1 Input Clock Logic Semiconductor Group 19 1997-04-01 C501 Timer 2 Timer 2 is a 16-bit timer/counter with an up/down count feature. It can operate either as timer or as an event counter which is selected by bit C/T2 (T2CON.1). It has three operating modes as shown in table 5. Table 5 Timer/Counter 2 Operating Modes T2CON Mode T2MOD T2CON R×CLK or T×CLK CP/ RL2 TR2 0 0 0 0 16-bit Autoreload 16-bit Capture Input Clock P1.1/ Remarks T2EX DCEN EXEN 1 0 0 X 1 0 1 ↓ 0 0 0 0 1 1 1 1 X X 0 1 0 1 1 X 0 X 0 1 1 X 1 ↓ Baud Rate Generator 1 X 1 X 0 X 1 X 1 X 1 ↓ off X X 0 X X X Note: ↓ = internal external (P1.0/T2) reload upon overflow reload trigger (falling edge) Down counting Up counting fOSC/12 16 bit Timer/ Counter (only up-counting) capture TH2, TL2 → RC2H, RC2L fOSC/12 max fOSC/24 no overflow interrupt request (TF2) extra external interrupt (“Timer 2”) fOSC/2 max fOSC/24 Timer 2 stops – – max fOSC/24 falling edge Semiconductor Group 20 1997-04-01 C501 Serial Interface (USART) The serial port is full duplex and can operate in four modes (one synchronous mode, three asynchronous modes) as illustrated in table 6. The possible baudrates can be calculated using the formulas given in table 7. Table 6 USART Operating Modes Mode SCON Baudrate Description SM0 SM1 0 0 0 fOSC/12 1 0 1 Timer 1/2 overflow rate 2 1 0 fOSC/32 or fOSC/64 3 1 1 Timer 1/2 overflow rate Serial data enters and exits through R×D. T×D outputs the shift clock. 8-bit are transmitted/received (LSB first) 8-bit UART 10 bits are transmitted (through T×D) or received (R×D) 9-bit UART 11 bits are transmitted (T×D) or received (R×D) 9-bit UART Like mode 2 except the variable baud rate Table 7 Formulas for Calculating Baudrates Baud Rate derived from Interface Mode Baudrate Oscillator 0 2 fOSC/12 (2SMOD × fOSC) / 64 Timer 1 (16-bit timer) (8-bit timer with 8-bit autoreload) 1,3 1,3 (2SMOD × timer 1 overflow rate) /32 (2SMOD × fOSC) / (32 × 12 × (256-TH1)) Timer 2 1,3 fOSC / (32 × (65536-(RC2H, RC2L)) Semiconductor Group 21 1997-04-01 C501 Interrupt System The C501 provides 6 interrupt sources with two priority levels. Figure 9 gives a general overview of the interrupt sources and illustrates the request and control flags. High Priority Timer 0 Overflow Timer 1 Overflow TCON.0 Timer 2 Overflow P1.1/ T2EX TF2 T2CON.7 USART RI SCON.0 IT0 TCON.0 P3.3/ INT1 IT1 TCON.2 PT0 IP.1 ET1 IE.3 PT1 IP.3 ET2 IE.5 PT2 IP.5 ES IE.4 PS IP.4 EX0 IE.0 PX0 IP.0 <_ 1 <_ 1 TI SCON.1 P3.2/ INT0 ET0 IE.1 TF1 TCON.7 EXF2 T2CON.6 EXEN2 T2CON.3 Low Priority TF0 TCON.5 IE0 TCON.1 IE1 TCON.3 EX1 IE.2 EA IE.7 PX1 IP.2 MCS01783 Figure 9 Interrupt Request Sources Semiconductor Group 22 1997-04-01 C501 Table 8 Interrupt Sources and their Corresponding Interrupt Vectors Source (Request Flags) Vector Vector Address IE0 TF0 IE1 TF1 RI + TI TF2 + EXF2 External interrupt 0 Timer 0 interrupt External interrupt 1 Timer 1 interrupt Serial port interrupt Timer 2 interrupt 0003H 000BH 0013H 001BH 0023H 002BH A low-priority interrupt can itself be interrupted by a high-priority interrupt, but not by another lowpriority interrupt. A high-priority interrupt cannot be interrupted by any other interrupt source. If two requests of different priority level are received simultaneously, the request of higher priority is serviced. If requests of the same priority are received simultaneously, an internal polling sequence determines which request is serviced. Thus within each priority level there is a second priority structure determined by the polling sequence as shown in table 9. Table 9 Interrupt Priority-Within-Level Interrupt Source External Interrupt 0, Timer 0 Interrupt, External Interrupt 1, Timer 1 Interrupt, Serial Channel, Timer 2 Interrupt, Semiconductor Group Priority IE0 TF0 IE1 TF1 RI + TI TF2 + EXF2 High ↓ Low 23 1997-04-01 C501 Power Saving Modes Two power down modes are available, the Idle Mode and Power Down Mode. The bits PDE and IDLE of the register PCON select the Power Down mode or the Idle mode, respectively. If the Power Down mode and the Idle mode are set at the same time, the Power Down mode takes precedence. Table 10 gives a general overview of the power saving modes. Table 10 Power Saving Modes Overview Mode Entering Instruction Example Leaving by Remarks Idle mode ORL PCON, #01H – enabled interrupt – Hardware Reset CPU is gated off CPU status registers maintain their data. Peripherals are active Power-Down Mode ORL PCON, #02H Hardware Reset Oscillator is stopped, contents of on-chip RAM and SFR’s are maintained (leaving Power Down Mode means redefinition of SFR contents). In the Power Down mode of operation, VCC can be reduced to minimize power consumption. It must be ensured, however, that VCC is not reduced before the Power Down mode is invoked, and that VCC is restored to its normal operating level, before the Power Down mode is terminated. The reset signal that terminates the Power Down mode also restarts the oscillator. The reset should not be activated before VCC is restored to its normal operating level and must be held active long enough to allow the oscillator to restart and stabilize (similar to power-on reset). Semiconductor Group 24 1997-04-01 C501 OTP Operation The C501-1E is programmed by usng a modified Quick-Pulse ProgrammingTM 1) algorithm. It differs from older methods in the value used for VPP (programming supply voltage) and in the width and number of the ALE/PROG pulses. The C501-1E contains two signature bytes that can be read and used by a programming system to identify the device. The signature bytes identify the manufacturer of the device. Table 11 shows the logic levels for reading the signature byte, and for programming the program memory, the encryption table, and the security bits. The circuit configuration and waveforms for quick-pulse programming are shown in figures 10 to 12. Table 11 OTP Programming Modes Mode RESET PSEN ALE/ PROG EA/VPP P2.7 P2.6 P3.7 P3.6 Read signature 1 0 1 1 0 0 0 0 Program code data 1 0 0 VPP 1 0 1 1 Verify code data 1 0 1 1 0 0 1 1 Progam encryption table 1 0 0 VPP 1 0 1 0 Program security bit 1 1 0 0 VPP 1 1 1 1 Program security bit 2 1 0 0 VPP 1 1 0 0 Notes : 1. 2. 3. 4. “0” = valid low for that pin, “1” = valid high for that pin. VPP = 12.75 V ± 0.25V VCC = 5 V ± 10% during programming and verification. ALE/PROG receives 25 programming pulses while VPP is held at 12.75 V. Each programming pulse is low for 100 µs (± 10 µs) and high for a minimum of 10 µs. 1) Quick-Pulse ProgrammingTM is a trademark phrase of Intel Corporation Semiconductor Group 25 1997-04-01 C501 Quick-Pulse Programming The setup for microcontroller quick-pulse programming is shown in figure 10. Note that the C5011E is running with a 4 to 6 MHz oscillator The reason the oscillator needs to be running is that the device is executing internal address and program data transfers. The address of the OTP memory location to be programmed is applied to port 1 and 2 as shown in figure 10. The code byte to be programmed into that location is applied to port 0. RESET, PSEN and pins of port 2 and 3 specified in table 11 are held at the “Program code data“ levels. The ALE/ PROG signal is pulsed low 25 times as shown in figure 11. For programming of the encryption table, the 25 pulse programming sequence must be repeated for addresses 0 through 1FH, using the “Program encrytion table“ levels. After the encryption table is programmed, verification cycles will produce only encrypted data. For programming of the security bits, the 25 pulse programming sequence must be repeat using the “Program security bit“ levels. After one security bit is programmed, further programming of the code memory and encryption table is disabled. However, the other security bit can still be programmed. Note that the EA/VPP pin must not be allowed to go above the maximum specified VPP level. for any amount of time. Even a narrow glitch above that voltage can cause permanent damage to the device. The VPP source should be well regulated and free of glitches and overshoots. Program Verification If security bit 2 has not been programmed, the on-chip OTP program memory can be read out for program verification. The address of the OTP program memory locations to be read is applied to ports 1 and 2 as shown in figure 12. The other pins are held at the “Verify code data“ levels indicated in table 11. The contents of the address location will be emitted on port 0. External pullups are required on port 0 for this operation. If the encryption table has been programmed, the data presented at port 0 will be the exclusive NOR of the program byte with one of the encryption bytes. The user will have to know the encryption table contents in order to correctly decode the verification data. The encryption table itself cannot be read out. Reading the SIgnature Bytes The signature bytes are read by the same procedure as a normal verification of loctions 30H and 31H, except that P3.6 and P3.7 need to be pulled to a logic low. The values are : 30H = E0H indicates manufacturer 31H = 71H indicates C501-1E Semiconductor Group 26 1997-04-01 C501 +5 V A0 - A7 Port 1 C501-1E 1 RESET 1 1 P3.6 P3.7 VCC Programming Data Port 0 EA/VPP +12.75 V 25 x 100 µs Low Pulses 0 ALE/PROG XTAL2 PSEN 4 - 6 MHz P2.7 1 P2.6 0 XTAL1 A8 - A12 P2.0 - P2.4 VSS MCS03232 Figure 10 C501-1E OTP Memory Programming Configuration 25 Pulses ALE/PROG 10 µs min. ALE/PROG µ µ 1 0 MCT03234 Figure 11 C501-1E ALE/PROG Waveform Semiconductor Group 27 1997-04-01 C501 +5 V A0 - A7 VCC Port 1 C501-1E 1 RESET 1 1 P3.6 P3.7 10 k Ω Port 0 XTAL2 4 - 6 MHz Programming Data EA/VPP 1 ALE/PROG 1 PSEN 0 P2.7 0 Enable P2.6 0 XTAL1 P2.0 - P2.4 VSS A8 - A12 MCS03235 Figure 12 C501-1E OTP Memory Verification Semiconductor Group 28 1997-04-01 C501 Absolute Maximum Ratings Ambient temperature under bias (TA) ......................................................... Storage temperature (Tstg) .......................................................................... Voltage on VCC pins with respect to ground (VSS) ....................................... Voltage on any pin with respect to ground (VSS) ......................................... Input current on any pin during overload condition..................................... Absolute sum of all input currents during overload condition ..................... Power dissipation........................................................................................ – 40 to 85 °C – 65 °C to 150 °C – 0.5 V to 6.5 V – 0.5 V to VCC +0.5 V – 10 mA to 10 mA I 100 mA I TBD Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage of the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for longer periods may affect device reliability. During overload conditions (VIN > VCC or VIN < VSS) the Voltage on VCC pins with respect to ground (VSS) must not exceed the values defined by the absolute maximum ratings. Semiconductor Group 29 1997-04-01 C501 DC Characteristics for C501-L / C501-1R VCC = 5 V + 10 %, – 15 %; VSS = 0 V; TA = 0 ˚C to 70 ˚C TA = – 40 ˚C to 85 ˚C Parameter Symbol Input low voltage (except EA, VIL RESET) Limit Values for the SAB-C501 for the SAF-C501 Unit Test Condition min. max. – 0.5 0.2 VCC – 0.1 V – Input low voltage (EA) VIL 1 – 0.5 0.2 VCC – 0.3 V – Input low voltage (RESET) VIL 2 – 0.5 0.2 VCC + 0.1 V – Input high voltage (except XTAL1, EA, RESET) VIH 0.2 VCC + 0.9 VCC + 0.5 V Input high voltage to XTAL1 VIH 1 0.7 VCC VCC + 0.5 V Input high voltage to EA, RESET VIH 2 0.6 VCC VCC + 0.5 V – Output low voltage (ports 1, 2, 3) VOL – 0.45 V IOL = 1.6 mA 1) Output low voltage (port 0, ALE, PSEN) VOL 1 – 0.45 V IOL = 3.2 mA 1) Output high voltage (ports 1, 2, 3) VOH 2.4 0.9 VCC – – V IOH = – 80 µA, IOH = – 10 µA Output high voltage (port 0 in external bus mode, ALE, PSEN) VOH 1 2.4 0.9 VCC – – V IOH = – 800 µA 2), IOH = – 80 µA 2) Logic 0 input current (ports 1, 2, 3) IIL – 10 – 50 µA VIN = 0.45 V Logical 1-to-0 transition current (ports 1, 2, 3) ITL – 65 – 650 µA VIN = 2 V Input leakage current (port 0, EA) ILI – ±1 µA 0.45 < VIN < VCC Pin capacitance CIO – 10 pF fC = 1 MHz, TA = 25 ˚C Power supply current: Active mode, 12 MHz 7) Idle mode, 12 MHz 7) Active mode, 24 MHz 7) Idle mode, 24 MHz 7) Active mode, 40 MHz 7) Idle mode, 40 MHz 7) Power Down Mode ICC ICC ICC ICC ICC ICC IPD – – – – – – – 21 4.8 36.2 8.2 56.5 12.7 50 mA mA mA mA mA mA µA VCC = 5 V, 4) VCC = 5 V, 5) VCC = 5 V, 4) VCC = 5 V, 5) VCC = 5 V, 4) VCC = 5 V, 5) VCC = 2 … 5.5 V 3) – Notes see page 32. Semiconductor Group 30 1997-04-01 C501 DC Characteristics for C501-1E VCC = 5 V + 10 %, – 15 %; VSS = 0 V; Parameter TA = 0 ˚C to 70 ˚C TA = – 40 ˚C to 85 ˚C Symbol Limit Values min. max. for the SAB-C501 for the SAF-C501 Unit Test Condition Input low voltage (except EA/VPP, RESET) VIL – 0.5 0.2 VCC – 0.1 V – Input low voltage (EA/VPP) VIL 1 – 0.5 0.1 VCC – 0.1 V – Input low voltage (RESET) VIL 2 – 0.5 0.2 VCC + 0.1 V – Input high voltage (except XTAL1, EA/VPP, RESET) VIH 0.2 VCC + 0.9 VCC + 0.5 V Input high voltage to XTAL1 VIH 1 0.7 VCC VCC + 0.5 V Input high voltage to EA/VPP, VIH 2 RESET 0.6 VCC VCC + 0.5 V – – Output low voltage (ports 1, 2, 3) VOL – 0.45 V IOL = 1.6 mA 1) Output low voltage (port 0, ALE/PROG, PSEN) VOL 1 – 0.45 V IOL = 3.2 mA 1) Output high voltage (ports 1, 2, 3) VOH 2.4 0.9 VCC – – V IOH = – 80 µA, IOH = – 10 µA Output high voltage (port 0 in external bus mode, ALE/PROG, PSEN) VOH 1 2.4 0.9 VCC – – V IOH = – 800 µA 2), IOH = – 80 µA 2) Logic 0 input current (ports 1, 2, 3) IIL – 10 – 50 µA VIN = 0.45 V Logical 1-to-0 transition current (ports 1, 2, 3) ITL – 65 – 650 µA VIN = 2 V Input leakage current (port 0, EA/VPP) ILI – ±1 µA 0.45 < VIN < VCC Pin capacitance CIO – 10 pF fC = 1 MHz, TA = 25 ˚C Power supply current: Active mode, 12 MHz 7) Idle mode, 12 MHz 7) Active mode, 24 MHz 7) Idle mode, 24 MHz 7) Power Down Mode ICC ICC ICC ICC IPD – – – – – 21 18 36.2 20 50 mA mA mA mA µA VCC = 5 V, 4) VCC = 5 V, 5) VCC = 5 V, 4) VCC = 5 V, 5) VCC = 2 … 5.5 V 3) Notes see next page. Semiconductor Group 31 1997-04-01 C501 Notes: 1) Capacitive loading on ports 0 and 2 may cause spurious noise pulses to be superimposed on the VOL of ALE and port 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operation. In the worst case (capacitive loading > 100 pF), the noise pulse on ALE line may exceed 0.8 V. In such cases it may be desirable to qualify ALE with a schmitt-trigger, or use an address latch with a schmitt-trigger strobe input. 2) Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to momentarily fall bellow the 0.9 VCC specification when the address lines are stabilizing. 3) IPD (Power Down Mode) is measured under following conditions: EA = Port0 = VCC; RESET = VSS; XTAL2 = N.C.; XTAL1 = VSS; all other pins are disconnected. 4) ICC (active mode) is measured with: XTAL1 driven with tCLCH, tCHCL = 5 ns, VIL = VSS + 0.5 V, VIH = VCC – 0.5 V; XTAL2 = N.C.; EA = Port0 = RESET= VCC; all other pins are disconnected. ICC would be slightly higher if a crystal oscillator is used (appr. 1 mA). 5) ICC (Idle mode) is measured with all output pins disconnected and with all peripherals disabled; XTAL1 driven with tCLCH, tCHCL = 5 ns, VIL = VSS + 0.5 V, VIH = VCC – 0.5 V; XTAL2 = N.C.; RESET = EA = VSS; Port0 = VCC; all other pins are disconnected; 7) ICC max at other frequencies is given by: active mode: ICC = 1.27 x fOSC + 5.73 ICC = 0.28 x fOSC + 1.45 (C501-L and C501-1R only) idle mode: where fOSC is the oscillator frequency in MHz. ICC values are given in mA and measured at VCC = 5 V. Semiconductor Group 32 1997-04-01 C501 AC Characteristics for C501-L / C501-1R / C501-1E VCC = 5 V + 10 %, – 15 %; VSS = 0 V TA = 0 ˚C to 70 ˚C for the SAB-C501 TA = – 40 ˚C to 85 ˚C for the SAF-C501 (CL for port 0, ALE and PSEN outputs = 100 pF; CL for all other outputs = 80 pF) Program Memory Characteristics Parameter Symbol Limit Values 12 MHz Clock Unit Variable Clock 1/tCLCL = 3.5 MHz to 12 MHz min. max. min. max. ALE pulse width tLHLL 127 – 2tCLCL – 40 – ns Address setup to ALE tAVLL 43 – tCLCL – 40 – ns Address hold after ALE tLLAX 30 – tCLCL – 53 – ns ALE low to valid instr in tLLIV – 233 – 4tCLCL – 100 ns ALE to PSEN tLLPL 58 – tCLCL – 25 – ns PSEN pulse width tPLPH 215 – 3tCLCL – 35 – ns PSEN to valid instr in tPLIV – 150 – 3tCLCL – 100 ns Input instruction hold after PSEN tPXIX 0 – 0 – ns Input instruction float after PSEN tPXIZ*) – 63 – tCLCL – 20 ns Address valid after PSEN tPXAV*) 75 – tCLCL – 8 – ns Address to valid instr in tAVIV – 302 – 5tCLCL – 115 ns Address float to PSEN tAZPL 0 – 0 – ns *) Interfacing the C501 to devices with float times up to 75 ns is permissible. This limited bus contention will not cause any damage to port 0 Drivers. Semiconductor Group 33 1997-04-01 C501 AC Characteristics for C501-L / C501-1R / C501-1E (cont’d) External Data Memory Characteristics Parameter Symbol Limit Values 12 MHz Clock Unit Variable Clock 1/tCLCL = 3.5 MHz to 12 MHz min. max. min. max. RD pulse width tRLRH 400 – 6tCLCL – 100 – ns WR pulse width tWLWH 400 – 6tCLCL – 100 – ns Address hold after ALE tLLAX2 30 – tCLCL – 53 – ns RD to valid data in tRLDV – 252 – 5tCLCL – 165 ns Data hold after RD tRHDX 0 – 0 – ns Data float after RD tRHDZ – 97 – 2tCLCL – 70 ns ALE to valid data in tLLDV – 517 – 8tCLCL – 150 ns Address to valid data in tAVDV – 585 – 9tCLCL – 165 ns ALE to WR or RD tLLWL 200 300 3tCLCL – 50 3tCLCL + 50 ns Address valid to WR or RD tAVWL 203 – 4tCLCL – 130 – ns WR or RD high to ALE high tWHLH 43 123 tCLCL – 40 tCLCL + 40 ns Data valid to WR transition tQVWX 33 – tCLCL – 50 – ns Data setup before WR tQVWH 433 – 7tCLCL – 150 – ns Data hold after WR tWHQX 33 – tCLCL – 50 – ns Address float after RD tRLAZ – 0 – 0 ns External Clock Drive Characteristics Parameter Symbol Limit Values Unit Variable Clock Freq. = 3.5 MHz to 12 MHz min. max. Oscillator period tCLCL 83.3 285.7 ns High time tCHCX 20 tCLCL – tCLCX ns Low time tCLCX 20 tCLCL – tCHCX ns Rise time tCLCH – 20 ns Fall time tCHCL – 20 ns Semiconductor Group 34 1997-04-01 C501 AC Characteristics for C501-L24 / C501-1R24 / C501-1E24 VCC = 5 V + 10 %, – 15 %; VSS = 0 V TA = 0 ˚C to 70 ˚C for the SAB-C501 TA = – 40 ˚C to 85 ˚C for the SAF-C501 (CL for port 0, ALE and PSEN outputs = 100 pF; CL for all other outputs = 80 pF) Program Memory Characteristics Parameter Symbol Limit Values 24 MHz Clock Unit Variable Clock 1/tCLCL = 3.5 MHz to 24 MHz min. max. min. max. ALE pulse width tLHLL 43 – 2tCLCL – 40 – ns Address setup to ALE tAVLL 17 – tCLCL – 25 – ns Address hold after ALE tLLAX 17 – tCLCL – 25 – ns ALE low to valid instr in tLLIV – 80 – 4tCLCL – 87 ns ALE to PSEN tLLPL 22 – tCLCL – 20 – ns PSEN pulse width tPLPH 95 – 3tCLCL – 30 – ns PSEN to valid instr in tPLIV – 60 – 3tCLCL – 65 ns Input instruction hold after PSEN tPXIX 0 – 0 – ns Input instruction float after PSEN tPXIZ*) – 32 – tCLCL – 10 ns Address valid after PSEN tPXAV*) 37 – tCLCL – 5 – ns Address to valid instr in tAVIV – 148 – 5tCLCL – 60 ns Address float to PSEN tAZPL 0 – 0 – ns *) Interfacing the C501 to devices with float times up to 37 ns is permissible. This limited bus contention will not cause any damage to port 0 Drivers. Semiconductor Group 35 1997-04-01 C501 AC Characteristics for C501-L24 / C501-1R24 / C501-1E24 (cont’d) External Data Memory Characteristics Parameter Symbol Limit Values 24 MHz Clock Unit Variable Clock 1/tCLCL = 3.5 MHz to 24 MHz min. max. min. max. RD pulse width tRLRH 180 – 6tCLCL – 70 – ns WR pulse width tWLWH 180 – 6tCLCL – 70 – ns Address hold after ALE tLLAX2 15 – tCLCL – 27 – ns RD to valid data in tRLDV – 118 – 5tCLCL – 90 ns Data hold after RD tRHDX 0 – 0 – ns Data float after RD tRHDZ – 63 – 2tCLCL – 20 ns ALE to valid data in tLLDV – 200 – 8tCLCL – 133 ns Address to valid data in tAVDV – 220 – 9tCLCL – 155 ns ALE to WR or RD tLLWL 75 175 3tCLCL – 50 3tCLCL + 50 ns Address valid to WR or RD tAVWL 67 – 4tCLCL – 97 – ns WR or RD high to ALE high tWHLH 17 67 tCLCL – 25 tCLCL + 25 ns Data valid to WR transition tQVWX 5 – tCLCL – 37 – ns Data setup before WR tQVWH 170 – 7tCLCL – 122 – ns Data hold after WR tWHQX 15 – tCLCL – 27 – ns Address float after RD tRLAZ – 0 – 0 ns External Clock Drive Characteristics Parameter Symbol Limit Values Unit Variable Clock Freq. = 3.5 MHz to 24 MHz min. max. Oscillator period tCLCL 41.7 285.7 ns High time tCHCX 12 tCLCL – tCLCX ns Low time tCLCX 12 tCLCL – tCHCX ns Rise time tCLCH – 12 ns Fall time tCHCL – 12 ns Semiconductor Group 36 1997-04-01 C501 AC Characteristics for C501-L40 / C501-1R40 VCC = 5 V + 10 %, – 15 %; VSS = 0 V TA = 0 ˚C to 70 ˚C for the SAB-C501 TA = – 40 ˚C to 85 ˚C for the SAF-C501 (CL for port 0, ALE and PSEN outputs = 100 pF; CL for all other outputs = 80 pF) Program Memory Characteristics Parameter Symbol Limit Values 40 MHz Clock Unit Variable Clock 1/tCLCL = 3.5 MHz to 40 MHz min. max. min. max. ALE pulse width tLHLL 35 – 2 tCLCL– 15 – ns Address setup to ALE tAVLL 10 – tCLCL– 15 – ns Address hold after ALE tLLAX 10 – tCLCL– 15 – ns ALE low to valid instr in tLLIV – 55 – 4 tCLCL– 45 ns ALE to PSEN tLLPL 10 – tCLCL– 15 – ns PSEN pulse width tPLPH 60 – 3 tCLCL– 15 – ns PSEN to valid instr in tPLIV – 25 – 3 tCLCL– 50 ns Input instruction hold after PSEN tPXIX 0 – 0 – ns Input instruction float after PSEN tPXIZ*) – 20 – tCLCL– 5 ns Address valid after PSEN tPXAV*) 20 – tCLCL– 5 – ns Address to valid instr in tAVIV – 65 – 5 tCLCL– 60 ns Address float to PSEN tAZPL –5 – –5 – ns *) Interfacing the C501 to devices with float times up to 25ns is permissible. This limited bus contention will not cause any damage to port 0 Drivers. Semiconductor Group 37 1997-04-01 C501 AC Characteristics for C501-L40 / C501-1R40 (cont’d) External Data Memory Characteristics Parameter Symbol Limit Values 40 MHz Clock Unit Variable Clock 1/tCLCL = 3.5 MHz to 40 MHz min. max. min. max. RD pulse width tRLRH 120 – 6 tCLCL– 30 – ns WR pulse width tWLWH 120 – 6 tCLCL– 30 – ns Address hold after ALE tLLAX2 10 – tCLCL– 15 – ns RD to valid data in tRLDV – 75 – 5 tCLCL– 50 ns Data hold after RD tRHDX 0 – 0 – ns Data float after RD tRHDZ – 38 – 2 tCLCL– 12 ns ALE to valid data in tLLDV – 150 – 8 tCLCL– 50 ns Address to valid data in tAVDV – 150 – 9 tCLCL– 75 ns ALE to WR or RD tLLWL 60 90 3 tCLCL– 15 3 tCLCL+ 15 ns Address valid to WR or RD tAVWL 70 – 4 tCLCL– 30 – ns WR or RD high to ALE high tWHLH 10 40 tCLCL– 15 tCLCL+ 15 ns Data valid to WR transition tQVWX 5 – tCLCL– 20 – ns Data setup before WR tQVWH 125 – 7 tCLCL– 50 – ns Data hold after WR tWHQX 5 – tCLCL– 20 – ns Address float after RD tRLAZ – 0 – 0 ns External Clock Drive Characteristics Parameter Symbol Limit Values Unit Variable Clock Freq. = 3.5 MHz to 40 MHz min. max. Oscillator period tCLCL 25 285.7 ns High time tCHCX 10 tCLCL – tCLCX ns Low time tCLCX 10 tCLCL – tCHCX ns Rise time tCLCH – 10 ns Fall time tCHCL – 10 ns Semiconductor Group 38 1997-04-01 C501 t LHLL ALE t AVLL t PLPH t LLPL t LLIV t PLIV PSEN t AZPL t PXAV t LLAX t PXIZ t PXIX Port 0 A0 - A7 Instr.IN A0 - A7 t AVIV Port 2 A8 - A15 A8 - A15 MCT00096 Figure 13 Program Memory Read Cycle Semiconductor Group 39 1997-04-01 C501 t WHLH ALE PSEN t LLDV t LLWL t RLRH RD t RLDV t AVLL t RHDZ t LLAX2 t RLAZ Port 0 t RHDX A0 - A7 from Ri or DPL Data IN A0 - A7 from PCL Instr. IN t AVWL t AVDV Port 2 P2.0 - P2.7 or A8 - A15 from DPH A8 - A15 from PCH MCT00097 Figure 14 Data Memory Read Cycle Semiconductor Group 40 1997-04-01 C501 t WHLH ALE PSEN t LLWL t WLWH WR t QVWX t AVLL t WHQX t LLAX2 A0 - A7 from Ri or DPL Port 0 t QVWH A0 - A7 from PCL Data OUT Instr.IN t AVWL Port 2 P2.0 - P2.7 or A8 - A15 from DPH A8 - A15 from PCH MCT00098 Figure 15 Data Memory Write Cycle t CLCL VCC- 0.5V 0.45V 0.7 VCC 0.2 VCC- 0.1 t CHCL t CLCX t CHCX MCT00033 t CLCH Figure 16 External Clock Drive at XTAL2 Semiconductor Group 41 1997-04-01 C501 ROM Verification Characteristics for C501-1R ROM Verification Mode 1 Parameter Symbol Limit Values min. max. Unit Address to valid data tAVQV – 48tCLCL ns ENABLE to valid data tELQV – 48tCLCL ns Data float after ENABLE tEHQZ 0 48tCLCL ns Oscillator frequency 1/tCLCL 4 6 MHz P1.0 - P1.7 P2.0 - P2.4 Address t AVQV Port 0 Data OUT t ELQV t EHQZ P2.7 ENABLE MCT00049 Inputs: P2.5 - P2.6, PSEN = VSS ALE, EA = V IH RESET = V SS Address: P1.0 - P1.7 = A0 - A7 P2.0 - P2.4 = A8 - A12 Data: P0.0 - P0.7 = D0 - D7 Figure 17 ROM Verification Mode 1 Semiconductor Group 42 1997-04-01 C501 OTP Programming and Verification Characteristics VCC = 5 V ± 10%, VSS = 0 V, TA = 21 ˚C to + 27 ˚C Parameter Symbol Limit Values min. max. Unit Programming supply voltage VPP 12.5 13.0 V Programming supply current IPP – 50 mA Oscillator frequency 1 / tCLCL 4 6 MHz Address setup to ALE/PROG low tAVGL 48 tCLCL – ns Address hold after ALE/PROG tGHAX 48 tCLCL – ns Data setup to ALE/PROG low tDVGL 48 tCLCL – ns Data hold after ALE/PROG tGHDX 48 tCLCL – ns P2.7 (ENABLE) high to VPP tEHSH 48 tCLCL – ns VPP setup to ALE/PROG low tSHGL 10 – µs VPP hold after ALE/PROG low tGHSL 10 – µs ALE/PROG width tGLGH 90 110 µs Address to data valid tAVQV – 48 tCLCL ns ENABLE low to data valid tELQV – 48 tCLCL ns Data float after ENABLE tEHQZ 0 48 tCLCL ns ALE/PROG high to ALE/PROG low tGHGL 10 – µs Semiconductor Group 43 1997-04-01 C501 P1.0 - P1.7 P2.0 - P2.4 Programming Verification Address Address t AVQV Port 0 Data Data t DVGL t GHDX t GHAX t AVGL ALE/PROG t GLGH t GHGL t SHGL t GHSL Logic 1 EA/ V PP Logic 0 t EHSH t ELQV P2.7 ENABLE t EHQZ MCT03237 Figure 18 C501-1E OTP Memory Program/Read Cycle Semiconductor Group 44 1997-04-01 C501 VCC -0.5 V 0.2 VCC+0.9 Test Points 0.2 VCC -0.1 0.45 V MCT00039 AC Inputs during testing are driven at VCC – 0.5 V for a logic ‘1’ and 0.45 V for a logic ‘0’. Timing measurements are made at VIHmin for a logic ‘1’ and VILmax for a logic ‘0’. Figure 19 AC Testing: Input, Output Waveforms VOH -0.1 V VLoad +0.1 V Timing Reference Points VLoad VLoad -0.1 V VOL +0.1 V MCT00038 For timing purposes a port pin is no longer floating when a 100 mV change from load voltage occurs and begins to float when a 100 mV change from the loaded VOH / VOL level occurs. IOL / IOH ≥ ± 20 mA. Figure 20 AC Testing: Float Waveforms Crystal Oscillator Mode Driving from External Source C 3.5 - 40 MHz XTAL2 P-LCC-44/Pin 20 P-DIP-40/Pin 18 M-QFP-44/Pin 14 C XTAL1 P-LCC-44/Pin 21 P-DIP-40/Pin 19 M-QFP-44/Pin 15 N.C. External Oscillator Signal XTAL2 P-LCC-44/Pin 20 P-DIP-40/Pin 18 M-QFP-44/Pin 14 XTAL1 P-LCC-44/Pin 21 P-DIP-40/Pin 19 M-QFP-44/Pin 15 C = 20 pF 10 pF (incl. stray capacitance) MCS02452 Note: During programming and verification of the C501-1E OTP memory a clock signal of 4-6 MHz must be applied to the device. Figure 21 Recommended Oscillator Circuits Semiconductor Group 45 1997-04-01 C501 Package Outlines GPD05883 Plastic Package, P-DIP-40 for C501G-L / C501G-1R (Plastic Dual in-Line Package) Figure 22 P-DIP-40 Package Outlines Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” Dimensions in mm Semiconductor Group 46 1997-04-01 C501 GPL05882 Plastic Package, P-LCC-44 – SMD for C501G-L / C501G-1R / C501G-1E (Plastic Leaded Chip-Carrier) Figure 23 P-LCC-44 Package Outlines Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” SMD = Surface Mounted Device Semiconductor Group 47 Dimensions in mm 1997-04-01 C501 GPM05957 Plastic Package, P-MQFP-44 – SMD for C501G-L / C501G-1R (Plastic Metric Quad Flat Package) Figure 24 P-MQFP-44 Package Outlines Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” SMD = Surface Mounted Device Semiconductor Group 48 Dimensions in mm 1997-04-01