DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 3-Phase Brushless Motor Driver FEATURES DESCRIPTION • The DRV3211-Q1 device is a field effect transistor (FET) pre-driver designed for 3-phase motor control and its application such as an oil pump or a water pump. It is equipped with three high-side pre-FET drivers and three low-side drivers which are controlled by an external microcontroller (MCU). The power for the high side is supplied by a charge pump and no bootstrap cap is needed. For commutation, this integrated circuit (IC) sends a conditional motor drive signal and output to the MCU. Diagnostics provide undervoltage, overvoltage, overcurrent, overtemperature and power bridge faults. The motor current can be measured using an integrated current sense amplifier and comparator in a battery commonmode range, which allows the motor current to be used in a high-side current sense application. Gain is attained by external resistors. If the MCU does not have enough bandwidth, the phase monitoring sample and hold amplifiers can hold phase information until the MCU is ready to process it. The pre-driver and other internal settings can be configured through the SPI interface. 1 • • • • • • • • • • 3-Phase Pre-drivers for N-channel MOS Field Effect Transistors (MOSFETs) Pulse Width Modulation (PWM) Frequency up to 20 kHz Fault Diagnostics Charge Pump Phase Comparators Phase Monitoring Sample and Hold Op-Amps Central Processing Unit (CPU) Reset Generator Serial Port I/F (SPI) Motor Current Sense 80-pin HTQFP 5-V Regulator APPLICATIONS • Automotive VCFB VBPD UL VL WL N/C TEST1 GFB TEST3 VCCB FAULT WDEN PRN RES CTLUH CTLUL CTLVH CTLVL CTLWH TEST2 WH VDD CTLWL PDCPV SCK UH CPDR4 DOUT CTLEN CPDR3 CS VH CPDR2 PSS3 DGND CPDR1 PSS2 DIN VBCP PSS1 PINOUT 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. Copyright © 2012, Texas Instruments Incorporated PRODUCT PREVIEW Check for Samples: DRV3211-Q1 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PIN FUNCTIONS PIN FUNCTION NAME TYPE 1 AOUT O –0.3–6 V Test mode output 2 PHTM I –1–40 V Phase comparator reference input 3 PH1M I –1–40 V Phase comparator input 4 PH2M I –1–40 V Phase comparator input 5 PH3M I –1–40 V Phase comparator input 6 PMV1 O –0.3–6 V Phase comparator output 7 PMV2 O –0.3–6 V Phase comparator output Phase comparator output PRODUCT PREVIEW 8 PMV3 O –0.3–6 V 9, 20, 42, 49, 50 GND I –0.3–0.3 V 10 PH1T I –2–40 V Phase amplifier input 11 PSC1 O –0.3–6 V Sample and hold filter output 12 AMPG I –0.3–0.3 V 13 PH2T I –2–40 V Phase amplifier input 14 PSC2 O –0.3–6 V Sample and hold filter output 15 PH3T I –2–40 V Phase amplifier input 16 PSC3 O –0.3–6 V Sample and hold filter output 17 PTV1 O –0.3–6 V Phase amplifier output 18 PTV2 O –0.3–6 V Phase amplifier output 19 PTV3 O –0.3–6 V Phase amplifier output 21 PSS1 I –0.3–6 V Sample and hold control signal input 22 PSS2 I –0.3–6 V Sample and hold control signal input 23 PSS3 I –0.3–6 V Sample and hold control signal input 24 CS I –0.3–6 V SPI chip select 25 DOUT O –0.3–6 V SPI data output 26 SCK I –0.3–6 V SPI clock 27 VDD O –0.3–3.6 V 28 DIN I –0.3–6 V 29 DGND I –0.3–0.3 V 30 CTLEN I –0.3–6 V Pre-driver parallel enable input 31 CTLWL I –0.3–6 V Pre-driver parallel input 32 CTLWH I –0.3–6 V Pre-driver parallel input 33 CTLVL I –0.3–6 V Pre-driver parallel input 34 CTLVH I –0.3–6 V Pre-driver parallel input 35 CTLUL I –0.3–6 V Pre-driver parallel input 36 CTLUH I –0.3–6 V Pre-driver parallel input 37 RES O –0.3–6 V Reset output 38 PRN I –0.3–6 V Pulse input 39 WDEN I –0.3–6 V Reset generator enable input 40 FAULT O –0.3–6 V Diagnosis output 41 OVCR I –0.3–6 V Over current reset input 43-48, 58, 67 51 2 MAX RATING NO. N/C ADTH — — I –0.3–6 V GND Quiet GND Digital supply output SPI data input Digital GND Not connected Motor overcurrent threshold input Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 PIN FUNCTIONS (continued) PIN FUNCTION NAME 52 AMPG I –0.3–0.3 V 53 ALV O –0.3–6 V Motor current sense amp output 54 AREF O –0.3–40 V Motor current sense reference output 55 ALFB O –0.3–40 V Motor current sense amp feedback 56 ALM I –0.3–40 V Motor current sense amp negative input 57 ALP I –0.3–40 V Motor current sense amp positive input 59 VLVD I –0.3–6 V VCC undervoltage threshold input 60 VCCT I –0.3–6 V VCC supply input 61 VCCB O –0.3–40 V VCC regulator base drive for PNP external transistor 62 VCFB I –0.3–40 V VCC regulator current sense input 63 VBPD I –0.3–40 V VB input 64 UL O -0.3–20 V Pre-driver output 65 VL O -0.3–20 V Pre-driver output 66 WL O -0.3–20 V Pre-driver output 68 TEST1 I –0.3–6 V Test input 69 GFB I –0.3–0.3 V Power GND 70 TEST3 I -0.3–20 V Test input 71 TEST2 I –0.3–6 V Test input 72 UH O –0.3–40 V Pre-driver output 73 VH O –0.3–40 V Pre-driver output 74 WH O –0.3–40 V Pre-driver output 75 PDCPV O –0.3–40 V Charge pump output 76 CPDR4 O –0.3–40 V Charge pump output 77 CPDR3 O –0.3–40 V Charge pump output 78 CPDR2 O –0.3–40 V Charge pump output 79 CPDR1 O –0.3–40 V Charge pump output 80 VBCP I –0.3–4 0V VB input Quiet GND PRODUCT PREVIEW TYPE MAX RATING NO. Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 3 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com VBPD VCFB VCCB PRN FAULT VL CTLUH WDEN WL CTLUL UL NC CTLVH GFB TEST1 TEST3 TEST2 UH VH PDCPV WH CPDR4 COMP CPDR3 COMP RES CTLVL CTLWH CTLWL DGND CTLEN DIN VDD SCK DOUT CS PSS3 PSS3 PSS1 PSS2 PSS2 PRODUCT PREVIEW PSS1 COMP ADTH COMP VBCP CPDR1 CPDR2 VB BLOCK DIAGRAM Figure 1. Top Block Diagram ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) MIN ESD MAX UNITS (1) ESD all pins ESD performance of all pins to any other pin HBM model –2 2 kV CDM model –500 500 V TEMPERATURE TA Operating temperature range -40 125 degree TJ Junction temperature -40 150 degree Ts Storage temperature –55 150 degree (1) 4 ESD testing is performed according to the ACE-Q100 standard. Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 THERMAL INFORMATION THERMAL METRIC (1) DRV3202-Q1 HTQP (80-PIN) θJA Junction-to-ambient thermal resistance 23.0 θJCtop Junction-to-case (top) thermal resistance 7.5 θJB Junction-to-board thermal resistance 7.6 ψJT Junction-to-top characterization parameter 0.2 ψJB Junction-to-board characterization parameter 7.4 θJCbot Junction-to-case (bottom) thermal resistance 0.3 UNIT °C/W spacer For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. PRODUCT PREVIEW (1) Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 5 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com SUPPLY VOLTAGE AND CURRENT VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS 5.3 12 18 V 20 35 mA SUPPLY INPUT VB VB Supply voltage IVB VB Operating current VB = 5.3 ~18 V, No PWM WATCHDOG Description The watchdog monitors the PRN signal and VCC supply level and generates a reset to the MCU through the RES pin if the status of the PRN is not normal or the VCC is lower than the specified threshold level. The watchdog can be disabled if WDEN is set high. Vbgr = 2.325 V (+0.75 V / ± 0.25 V) Band Gap VHS = 0.1 V Regulator (+0.75 V / ± 0.05 V) VCC PRODUCT PREVIEW R1 VDD Undervoltage Detection VCC VCC Low Voltage Detection (NMI) R_RES Reset Logic 3k VLVD RES R2 100 pF Option Clock Monitor Watch Dog Timer WDEN WDEN Open: Enable High: Disable PRN From CPU Disable During Power On Reset Power On Reset VNMI: Lower Threshold Voltage VHS: Hysteresis Voltage Figure 2. Watchdog Block Diagram 6 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 VB Do not switch to RES LOW when the VCC LOW time is less than tRES. VNMI+VHS VCC VNMI tRES VSTN tRES Ignore transient voltage falling NMI (Internal signal) Switch to NMI-LOW after tRES delay when VCC is lower than VNMIL tRES RES is HIGH after tON from NMI-HIGH if internal clock is not generated (In case of malfunction). RES signal should remain in low voltage (< -0.4 V) and in this case, controlled CPU should be in RES is HIGH after tON from of NMI-HIGH. tRH RES RES is LOW at NMI-LOW. tON Pwth RES is LOW at NMI-LOW. PRODUCT PREVIEW tRL tON tOFF PRN Detecting only rising edge of PRN signal Switch to RES LOW if PRN stays at a High or LOW level. If WDEN is LOW (or OPEN), and there is abnormal PRN: RES is active. If WDEN is HIGH, and there is abnormal PRN: no operation. WDEN NOTE: WDEN = High, VCC undervoltage condition sets RES = Low Figure 3. Watchdog Timing Chart WATCHDOG ELECTRICAL CHARACTERISTICS (1) VB = 12 V,TA = –40°C to 125°C (unless otherwise specified) PARAMETER (2) CONDITIONS MIN TYP MAX UNITS WATCHDOG VSTN Function start VCC voltage RES tON Power-on time RES tOFF Clock off reset time RES tRL Reset pulse low time RES tRH Reset pulse high time RES tRES Reset delay time RES Pwth Pulse width PRN (1) (2) Refer to Figure 3 – 0.8 1.3 V 32 40 48 ms 64 80 96 ms 16 20 24 ms 64 80 96 ms 30 71.5 90 µs 200 – – ns The watchdog function is disabled and the timing parameters are invalid when the WDEN is at a high level. Specified by design Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 7 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com SERIAL PORT I/F Description The SPI is used to receive an input byte from CPU and to transmit an output byte to CPU. Four signals are utilized according to the timing chart of Figure 4. LSB CS CK MSB Register Parallel Output Parallel Input /16 DIN MSB First Parallel Output Serial input Shift Register (16 bits) PRODUCT PREVIEW SCK Serial Output CK DOUT MSB First Parallel Input /16 Parallel Output EN LSB Parallel Input Output Latch (Transparent if EN = High) Internal Diagnosis Register MSB Figure 4. Block Diagram of SPI • • CS – Chip Select – This input signal is utilized to select this IC by CPU. – This input signal is normally high and the communication is possible only when it is forced low. – When this input signal falls, the communication between this IC and the CPU starts. – Transmitted data is latched and the DOUT pin comes out of high impedance. – When this input signal rises, the communication stops. – The DOUT pin goes into high impedance. Then, the internal input register updates with the received bits (only if the clock pulse numbers are right and the key bit of the DIN signals is correct). – The next falling edge starts another communication. – There is a minimum waiting time between two communications (Twait). – The pin has an internal pullup. SCK – Synchronization Serial Clock – This input signal is utilized to synchronize the communication by CPU. – It is normally high and the correct clock pulse number is 16. – At each falling edge, the CPU writes a new bit on the DIN input and this IC writes a new bit on the DOUT pin. At each rising edge, this IC reads the new bit on the DIN pin and the CPU reads the new bit on the DOUT pin. – The maximum clock frequency is 4 MHz. – The pin has an internal pullup. space 8 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com • • SLVSBS4 – DECEMBER 2012 DIN – Serial Input Data – This input signal is used to receive 16-bit data. – The bits are received in order from the MSB (first) to the LSB (last). – The pin has an internal pullup. DOUT – Serial Output Data – This output signal is used to transmit 16-bit data. – It is a 3-state output and it is in high impedance mode when CS is high. – The serial data bits are transmitted in order from the MSB (first) to the LSB (last). SPI ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER (1) CONDITIONS MIN TYP MAX UNITS Fop Operating frequency DC – 4 MHz Tlead Enable lead time 100 – – ns Twait Wait time between two successive communications 5 – – µs Tlag Enable lag time 100 – – ns Tpw SCLK pulse width 100 – – ns Tsu Data setup time 80 – – ns Th Data hold time 80 – – ns Tdis Disable time – – 80 ns Tdel Data delay time (SCK to DOUT) – – 80 ns (1) Refer to Figure 6 CL = 50 pF, Refer to Figure 6 PRODUCT PREVIEW SPI Specified by design Waiting Time From b9 Through b8 CS DIN b15~b10 b9~b8 Select Diagnosis or Command Register From b15 Through b10 b7~b0 Command Input or Diagnosis Result Output From b7 Through b0 DOUT b7~b0 Echo Back of b14~b9 Figure 5. SPI Bit Sequence Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 9 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 Tlead www.ti.com Tpw Tlag Tpw Twait CS SCK MSB DIN D14 D13 D11 D12 D10 D9 D7 D8 D6 D5 D3 D4 D2 D1 LSB Th Tsu MSB DOUT Hi-Z D14 D13 D11 D12 D9 D10 D6 D7 D8 D5 D4 D2 D3 D1 LSB Hi-Z Tdel Ten Tdis Figure 6. SPI AC Timing Definition Table 1. SPI Bit Map (DIN) PRODUCT PREVIEW ITEM B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 COMMAND1 0 0 0 0 0 1 – – SHM SRT – – – – – – COMMAND2 0 0 0 0 1 0 – – AG1 AG0 – – – – – – COMMAND3 0 0 0 0 1 1 – – – – – – – – – – DIAG_READ1 0 0 1 0 0 0 – – – – – – – – – – DIAG_READ2 0 1 0 0 0 0 – – – – – – – – – – DIAG_READ3 0 1 1 0 0 0 – – – – – – – – – – In Table 1, the B15–B10 are the control bits, so the each command depends on them (listed below). 1. B15-B10 = 0 0 0 0 0 1 These are the commands: 1) Phase AMP Sampling Hold Mode (B7 bit) MM0: OFF (through) (INITIAL VALUE) MM1: ON (use sample hold mode) 2) Phase AMP Short Mode [Short_Mode] (B6 bit) MM0: OFF (no calibration) (INITIAL VALUE) MM1: ON (use calibration mode) 2. B15-B10 = 0 0 0 0 1 0 These are the commands: 1) Phase AMP Gain (B7 bit and B6 bit) MMB7:0 B6:0; Gain x1 (INITIAL VALUE) MMB7:0 B6:1; Gain x2 MMB7:1 B6:0; Gain x3 MMB7:1 B6:1; Gain x4 3. B15-B10 = 0 0 0 0 1 1 4. B15-B10 = 0 0 1 0 0 0 Not used This command is to read the diagnosis of the current regulator, SPI communication, overvoltage detection, and input diagnosis. 5. B15-B10 = 0 1 0 0 0 0 6. B15-B10 = 0 1 1 0 0 0 This command is to read the diagnosis of SPI communication. Not used 10 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com 7. SLVSBS4 – DECEMBER 2012 B15-B10 = Other command This command sets the SPI-NG (DOUT, B7) bit. Table 2. SPI Bit Map (DOUT) ITEM B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 – – – – – – – – 0 0 0 0 0 1 1 0 – – – – – – – – DIAG_READ1 0 0 0 1 0 0 0 0 VCC Rsvd CCD VCO VDO CPLV TD EEP DIAG_READ2 0 0 1 0 0 0 0 0 SPI – – – – – – – DIAG_READ3 0 0 1 1 0 0 0 0 – – – – – – – – ON/OFF COMMAND ECHO BACK 1. B14-B9 = 0 0 1 0 0 0 This flag is cleared after the register is read by the CPU. 1) VCC Current Detection (B7) MM0: NORMAL MM1: Fail (Short to GND or open) 2) Overcurrent Detection (B6) MM0: NORMAL MM1: Fail (Overcurrent) PRODUCT PREVIEW 4) VCC Overvoltage Detection (B4) MM0: NORMAL MM1: Fail (VCC overvoltage) 5) VDD Overvoltage Detection (B3) MM0: NORMAL MM1: Fail (VDD overvoltage) 6) CPV Low Voltage Detection (B2) MM0: NORMAL MM1: Fail (CPV low voltage) 7) Thermal Detection (B1) MM0: NORMAL MM1: Fail (Overtemperature) 8) EEPROM* Data Consistency Check (B0) MM0: NORMAL MM1: Fail (EEPROM DATA CRC error) *ASIC calibration EEPROM NOTE Just after power-on of the IC, some of the bits listed above may be set depending on the apply sequence of VB. It is recommended to issue a DIAG_READ1 to clear these bits prior to all S/W sequences. 2. B14-B9 = 0 1 0 0 0 0 This flag is cleared after the register is read by the CPU. 1) SPI-NG (B7) MM0: NORMAL MM1: Fail (SPI read and write command is wrong) Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 11 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com Diag happen! Twait > 5 µs CS CLK MSB ~ bit10 bit9 bit8 bit7 ~ bit0 MSB ~ bit10 bit9 bit8 bit7 ~ bit0 DOUT Command Data for Diagnosis DOUT Command Data for Diagnosis DIN New Diagnosis Data During bit7 ~ bit0 Internal Diagnosis Shadow Register PRODUCT PREVIEW Internal Diagnosis Status Register DOUT Diagnosis Data Against DIN Command DIN ECHO Diagnosis New Diagnosis Data Hi-Z DIN ECHO Hi-Z New 'RQ¶W FDUH 'RQ¶W FDUH Figure 7. DIAG_READ Internal Diagnosis Register (Status Register and Shadow Register) If the diagnosis happens during the SPI communication, the function follows this protocol: The diagnosis information is stored in the shadow register when the diagnosis happens. After the output of the previous information a new diagnosis is sent from the shadow to the status register, and both registers are output through the DOUT pin. In this case, a FAULT signal continues to be output until a new diagnosis is read by the CPU. All diagnosis bits read by the DIAG_READ1 command happen before the CS falling edge. So, all the diagnosis events that happen right after the CS falling edge are not read by the current DIAG_READ1 command, instead they are read by the next DIAG_READ1 command. 12 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 CHARGE PUMP Description The charge pump block generates the supply for high-side and low-side pre-drivers to maintain the gate voltage on the external FETs. External storage cap (CCP) and bucket caps (C1, C2) are used to support pre-driver slope and switching frequency requirements. R1 and R2 can reduce switching current if required. The charge pump has a voltage supervisor for over and undervoltage, and a selectable stop condition for pre-drivers. VB PDCPV CP Supervisor CP Logic CP14 CPCLK MAX S2 VF UV CPDR2 C2 CPDR1 GFB PDCPV S4 VF PRODUCT PREVIEW S1 CCP VF CPDR4 C1 CPDR3 S3 GFB Figure 8. Charge Pump Block Diagram Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 13 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com CHARGE PUMP ELECTRICAL CHARACTERISTICS (1) VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS CHARGE PUMP Vchv1_0 VB = 5.3 V, Iload = 0 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 7 VB + 8 VB + 9 V Vchv1_1 VB = 5.3 V, Iload = 5 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 6 VB + 7 VB + 8 V Vchv1_2 VB = 5.3 V, Iload = 8 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 5 VB + 6 VB + 7 V Vchv2_0 VB = 12 V, Iload = 0 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 13 VB + 14 VB + 15 V VB = 12 V, Iload = 11 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 13 VB + 14 VB + 15 V Vchv2_2 VB = 12 V, Iload = 18 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 12.5 VB + 13.5 VB + 15 V Vchv3_0 VB = 18 V, Iload = 0 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 13 VB + 14 VB + 15 V Vchv3_1 VB = 18 V, Iload = 13 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 13 VB + 14 VB + 15 V Vchv3_2 VB = 18 V, Iload = 22 mA, C1 = C2 = 47 nF, CCP = 2.2 µF VB + 13 VB + 14 VB + 15 V 35 37.5 40 V VB + 4 VB + 4.5 VB + 5 V 1 2 Vchv2_1 Output voltage PRODUCT PREVIEW Vchvmax Maximum voltage VchvUV Undervoltage detection threshold Tchv (2) Rise time Ron On resistance S1~S4 (1) (2) No variation of the external components Specified by design 14 Submit Documentation Feedback VB = 5.3 V, C1 = C2 = 47 nF, CCP = 2.2 µF, VchvUV released 8 ms Ω Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 PRE-DRIVER Description PRODUCT PREVIEW The pre-driver block provides three high-side pre-drivers and three low-side pre-drivers to drive external Nchannel MOSFETs. The turn on side of the high-side pre-drivers supply the large N-channel transistor current to quickly charge and PMOS support output voltage up to PDCPV. The turn off side supplies the large N-channel transistor current to quickly discharge, while the low-side pre-drivers supply the large N-channel transistor current for charge and discharge. The output voltage of the low-side pre-driver is controlled by VB and it has VGS protection to make less than 18 V. The pre-driver has a stop condition in some fault conditions ($16 Error Detection). Figure 9. Pre-driver Block Diagram Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 15 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com PRE-DRIVER ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP Vchv – 2.7 Vchv – 1.35 MAX UNITS HIGH SIDE PRE-DRIVER VOH_H Output voltage high Isink = 10 mA, U(V/W)H – GFB VOL_H Output voltage low Isource = 10 mA, U(V/W)H – GFB RONH_HP ON resistance pull up (Pch) U(V/W)H = PDCPV - 1 V RONH_HN ON resistance pull up (Nch) U(V/W)H = PDCPV - 2.5 V RONL_H ON resistance pull down Ton_h (1) Turn-on time VB = 5.3 ~ 18 V, CL = 11 nF, RL = 0 Ω from 20% to 80% Toff_h (1) Turn-off time Th-ondly (1) Th-offdly (1) V PRODUCT PREVIEW 60 120 mV 135 270 Ω 8 16 Ω 6 12 Ω 100 300 500 ns VB = 5.3 ~ 18 V, CL = 11 nF, RL = 0 Ω from 80% to 20% 100 300 500 ns Output delay time VB = 5.3 ~ 18 V, CL = 11 nF, RL = 0 Ω to 20%, see Figure 10 100 200 400 ns Output delay time VB = 5.3 ~ 18 V, CL = 11 nF, RL = 0 Ω to 80%, see Figure 10 100 200 400 ns VB – 0.14 VB-0.07 70 140 mV LOW SIDE PRE-DRIVER VOH_L Output voltage high Isink = 10 mA, U(V/W)L – GFB VOL_L Output voltage low Isource = 10 mA, U(V/W)L – GFB V RONH_L ON resistance pull up 7 14 Ω RONL_L ON resistance pull down 7 14 Ω Turn-on time VB = 5.3 ~ 18 V, CL = 22 nF, RL = 0 Ω from 20% to 80% 100 300 800 ns Toff_I (1) Turn-off time VB = 5.3 ~ 18 V, CL = 22 nF, RL = 0 Ω from 80% to 20% 100 300 800 ns Tl-ondly (1) Output delay time VB = 5.3 ~ 18 V, CL = 22 nF, RL = 0 Ω to 20%, see Figure 10 100 200 400 ns Tl-offdly (1) Output delay time VB = 5.3 ~ 18 V, CL = 22 nF, RL = 0 Ω to 80%, see Figure 10 100 200 400 ns VCLAMP VGS protection voltage 16 18 20 V Ton_l (1) (1) Tdiff2 (1) Tdiff1 (1) 16 Differential time 1 VB = 5.3 ~ 18 V (Th-on)–(Tl-off), see Figure 10 –300 300 ns Differential time 2 VB = 5.3 ~ 18 V (Tl-on)–(Th-off), see Figure 10 –300 300 ns Specified by design Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 CTLUH CTLVH CTLWH CTLUL CTLVL CTLWL Th-ondly Th-offdly 80% 20% 20% Th-on(Th-ondly + Ton) 80% UL VL WL GFB Th-off(Th-offdly + Toff) PRODUCT PREVIEW 80% UH VH WH 80% 20% GFB 20% TI-ondly TI-offdly TI-off(TI-offdly + Toff) TI-on(TI-ondly + Ton) Figure 10. Delay Time from Input to Output Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 17 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com PHASE COMPARATOR Description A 3-channel comparator module monitors the external FET by detecting voltage across the drain-source for highside and low-side FETs. PHTM is the threshold level of comparators usable for sensorless communication. Figure 11 shows an example of the threshold level. There is no detection when CTLEN = Low. UHS, VHS, WHS CTLEN VCOM VCC PHxM + Clamp PMVx PHTM - Clamp Figure 11. Phase Comparator Block Diagram PRODUCT PREVIEW PHASE COMPARATORS ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS –15 – 15 mV 1.325 – 4.5 V PHASE COMPARATOR Viofs Input offset voltage Vinp Input voltage range (PHTM) Vinm Input voltage range (PHxM) Vihys Input hysteresis voltage VOH Output high voltage Isink = 2.5 mA VOL Output low voltage Isource = 2.5 mA (1) Response time (rising) Tres_tf (1) Response time (falling) Tres_tr (1) 18 VB = 5.3 ~18 V –1 – VB V 100 200 400 mV 0.9 × VCC – – V – – 0.1 × VCC V CL = 100 pF – 0.2 0.5 µs CL = 100 pF – 0.4 1 µs Specified by design Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 MOTOR CURRENT SENSE Description The operational amplifier is operating with an external resistor network for higher flexibility to adjust the current measurement to application requirements. The first stage amplifier is operating with the external resistor and the output voltage up to VB at ALFB. The gain of the amplifier is adjustable by external resistors from x10 to x30. The second stage amplifier is a buffer to MCU at ALV. Current sense has a comparator for motor overcurrent (OVAD). ADTH is the overcurrent threshold level and sets the value by the external resistor as well. Figure 13 shows the curve of the detection level. ALFB is divided by 2, compare this value with ADTH. In the recommended application, zero-point adjustment is required as a large error offset in the initial condition. OVAD + VCC - R3 ADTH ½ ALFB CLAMP R4 VCC CLAMP + ALV PRODUCT PREVIEW - VB - ALFB + R22 C1 Battery R11 ALP ALM *R11, R12, R21, R22 # 0.1% *VGain X10: R11 = R12 = 3 k , R21 = R22 = 30 k 1V X20: R11 = R12 = 1.5 k , R21 = R22 = 30 k X30: R11 = R12 = 1 k , R21 = R22 = 30 k C2 = 10 n ~ 20 nF C1 = 0 ~ 10 pF *ALV = VGain x (Rshunt x lmotor) + AREF *ADTH = {R4 / (R3 + R4)} x VCC *OVAD = (2 x ADTH ± AREF) / (Rshunt x VGain) + R12 R21 VCC Imotor Rshunt M AREF - C2 CLAMP Figure 12. Motor Current Sense Block Diagram MOTOR CURRENT SENSE ELECTRICAL CHARACTERISTICS (1) VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS MOTOR CURRENT (2) SENSE VOfs Input offset voltage VO_0 (1) (2) Output voltage (ALV) –5 VB = 5.3 ~ 18 V, Imotor = 0 A 5 1 mV V No variation of the external components Motor current is converted to voltage in test Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 19 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com MOTOR CURRENT SENSE ELECTRICAL CHARACTERISTICS(1) (continued) VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER VLine Linearity (ALV) VGain Gain CONDITIONS VB = 5.3 ~ 18 V, Rshunt = 1 mΩ, R11 = R12 = 1 kΩ, R21 = R22 = 30 kΩ MIN TYP MAX UNITS –2% 30 2% mV/A 10 30 Settling time (Rise) ALV ±1% VB = 5.3 ~ 18 V, Rshunt = 1 mΩ, C1 = 4.7 pF, CL = 100 pF, R11 = R12 = 1 kΩ, R21 = R22 = 30 kΩ, Imotor = 0 → 30 A, (ALV : 1→1.9 V) – 1 2.5 µs Settling time (Rise) ALV ±1% VB = 5.3 ~ 18 V, Rshunt = 1 mΩ, C1 = 4.7 pF, CL = 100 pF, R11 = R12 = 1 kΩ, R21 = R22 = 30 kΩ, Imotor = 0 → 100 A, (ALV : 1 → 4 V) – 1 2.5 µs Settling time (Fall) ALV ±1% VB = 5.3 ~ 18 V, Rshunt = 1 mΩ, C1 = 4.7 pF, CL = 100 pF, R11 = R12 = 1 kΩ, R21 = R22 = 30 kΩ, Imotor = 30 → 0 A, (ALV : 1.9 → 1 V) – 1 2.5 µs Settling time (Fall) ALV ±1% VB = 5.3 ~ 18 V, Rshunt = 1 mΩ, C1 = 4.7 pF, CL = 100 pF, R11 = R12 = 1 kΩ, R21 = R22 = 30 kΩ, Imotor = 100 → 0 A, (ALV : 4 → 1 V) – 1 2.5 µs OVAD Overcurrent threshold 150-A detection, Rshunt = 1 mΩ, R11 = R12 = 1 kΩ, R21 = R22 = 30 kΩ, R3 = 8.2 kΩ, R4 = 10 kΩ –10% 150 10% A TDEL_OVAD (3) Propagation delay (Rise or fall) – – 1.5 µs Tset_TR1 Tset_TR2 Tset_TF1 PRODUCT PREVIEW Tset_TF2 (3) Specified by design ALV ALFB / 2 VCC ADTH VLine = ûY / ûX ûY ûX VO_0 0A Imotor OVAD 0A Imotor *ALFB up to VB Figure 13. Motor Current Sense and Overcurrent 20 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 Motor Overcurrent OVAD OVCR Enable PreDRV Disable Enable Figure 14. Motor Overcurrent Event RES OVCR MOTOR OVERCURRENT OVAD PRE-DRIVER ENABLE OR DISABLE 0 – – 0 (Clear) Disable (1) 1 (1) (2) (3) (2) (3) 0 – 0 (Clear) 1 0 Keep Enable 1 1 (Set) Disable PRODUCT PREVIEW Table 3. Motor Overcurrent Truth Table Enable The CTLEN goes to Hi-Z because the external CPU will not drive it when RES = 0, then all the pre-drivers are turned off because CTLEN is internally pulled down. The OVAD is not set, even if a motor overcurrent error is generated during OVCR = 0. The OVAD is cleared if OVCR = 0 even when the motor overcurrent error is generated. Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 21 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com PHASE AMPLIFIER (Sample and Hold Mode and Through Mode) Description The 3-channel amplifier module monitors the drain-source for high-side and low-side FETs. Two modes (selected by the SPI) are provided: sample and hold mode, and through mode. Sample and hold is controlled by PSSx at the external pins and PSCx connects the charging capacitor. Through mode is real-time detection and the amplifier has x1–x4 gain control. SH_MODE High: Sample and Hold Mode Low: Through Mode VB R2 CLAMP open VCC VCC R1 - 7:1 + + PH1T PH2T PH3T VCC - - + CAL_MODE PTV1 PTV2 PTVx = ¼ x (R2 / R1) x (PHxT-½ x VB) + 2.5 V PTV3 Sample and Hold PSC CLAMP VCC - R1 PSC1 PSC2 PSC3 + 3:1 R2 CAL_MODE PRODUCT PREVIEW VCC - PSS1 PSS2 PSS3 + 2.5 V Figure 15. Sample and Hold Mode Block Diagram SHORT_MODE High: Sample and Hold Mode Low: Through Mode VB R2 CLAMP Short VCC 7:1 VCC R1 PH1T PH2T PH3T SHORT_MODE CLAMP VCC Open PTVx = ¼*(R2 / R1)*(PHxT ± ½*VB) + 2.5 V Disable PTV1 PTV2 PTV3 VCC R1 PSC1 PSC2 PSC3 3:1 R2 SHORT_MODE VCC PSS1 PSS2 PSS3 2.5 V Figure 16. Through Mode Block Diagram 22 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 SH_MODE High: Sample and Hold Mode Low: Through Mode VB R2 CLAMP Open/Short VCC Short/Open 2.5 V 7:1 PH1T PH2T PH3T VCC VCC R1 PTVX = 2.5 V PTV1 PTV2 PTV3 SHORT_MODE PSC CLAMP VCC R1 2.5 V 3:1 PSC1 PSC2 PSC3 SHORT_MODE R2 VCC PSS1 PSS2 PSS3 2.5 V Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 PRODUCT PREVIEW Figure 17. Short Mode (Optional) Block Diagram 23 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com PHASE AMPLIFIER ELECTRICAL CHARACTERISTICS (1) VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS PHASE AMPLIFIER Vofs_SH Output offset voltage, sample and hold mode VB = 5.3–18 V, Gain = 1 –50 – 50 mV Vofs_TH Output offset voltage, through mode VB = 5.3–18 V, Gain = 1 –50 – 50 mV Vin_cm Common mode input range VB = 5.3–18 V, Gain = 1–4 1.5 Vout_max Maximum output voltage VB = 5.3–18 V, Gain = 1–4 4.5 Vout_min Minimum output voltage VB = 5.3–18 V, Gain = 1–4 VB – 1.5 V – – V – – 0.5 V – 1 2 3 4 – PRODUCT PREVIEW Vgain (2) Gain Vout_SH0 Output voltage, sample and hold mode VB = 5.3–18 V, Gain = 1–4, PHxT = VB / 2 – 2.5 – V Vout_TH0 Output voltage, through mode – 2.5 – V Vout_SH1 Output voltage, sample and hold mode VB = 12 V, Gain = 1, PHxT = 1.5 V – 1.375 – V Vout_TH1 Output voltage, through mode – 1.375 – V Vout_SH2 Output voltage, sample and hold mode VB = 12 V, Gain = 1, PHxT = 10.5 V – 3.625 – V Vout_TH2 Output voltage, through mode VB = 12 V, Gain = 1, PHxT = 10.5 V – 3.625 – V STL_SHTR Settling time (rise), sample and hold mode PTVx ±1% VB = 12 V, Gain = 1, PSC = 470 pF, PTVx = 100 pF, PHxT = 1.5 V ≥ 10.5 V, (PTVx = 1.375 V → 3.625 V), see Figure 20 1.5 3 µs STL_THTR Settling time (rise), through mode PTVx ±1% VB = 12 V, Gain = 1, PTVx = 100 pF, PHxT = 1.5 V ≥ 10.5 V, (PTVx = 1.375 V → 3.625 V), see Figure 21 1.5 3 µs STL_SHTF Settling time (fall), sample and hold mode PTVx ±1% VB = 12 V, Gain = 1, PSC = 470 pF, PTVx = 100 pF, PHxT = 10.5 V ≥ 1.5 V, (PTVx = 3.625 V → 1.375 V), see Figure 20 1.5 3 µs STL_THTF VB = 12 V, Gain = 1, PTVx = 100 pF, Settling time (fall), through mode PTVx PHxT = 10.5 V ≥ 1.5V, ±1% (PTVx = 3.625 V → 1.375 V), see Figure 21 1.5 3 µs SH Error Voltage Falling voltage 5 75 mV (1) (2) VB = 5.3–18 V, Gain = 1–4 PHxT = VB / 2 VB = 12 V, Gain = 1, PHxT = 1.5 V VB = 5.3–18 V, PSC = 470 pF, TH = 1 mS, see Figure 19 No variation of the external components. Vgain is an SPI setting PHxT PSSx Sampling Time PTVx Figure 18. Sampling Timing Chart 24 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 TH PSSx PTVx SH Error Voltage Figure 19. Holding Timing Chart PHxT 50% 50% PRODUCT PREVIEW PSSx PTVx STL_SHTRx_XXX STL_SHTFx_XXX Figure 20. Settling Time Timing Chart (Sample and Hold Mode) PHxT PTVx STL_THTRx_XXX STL_THTFx_XXX Figure 21. Settling Time Timing Chart (Through Mode) Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 25 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com REGULATORS Description The regulator block offers a 5-V LDO and a 3.3-V LDO. The VCC LDO regulates VB down to 5 V with an external PNP controlled by the regulator block. The 5-V LDO is supplied to the MCU and other components. The 5-V LDO is protected against a short to GND fault, and the external resistors R1 and R2 set the undervoltage. The VDD regulator regulates VB down to 3.3-V with an internal FET and a controller. The regulators detect the overvoltage and undervoltage events of both supplies. VB Current Limit OC Rsns VCF B BG + AMP VCC B - PNP Tr CVCC PRODUCT PREVIEW Trim VCCT(VCC) AMPG VLVD Supervisor R1 Supervisor R2 OV UV * Rsns = 0.2 V / ICLVCC * VCCUV = 2.325 x {(R1+R2) / R2} Figure 22. VCC Block Diagram VB BG + AMP - VDD CVDD AMPG OV UV Supervisor Figure 23. VDD Block Diagram 26 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 VCC AND VDD ELECTRICAL CHARACTERISTICS (1) VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX 4.9 5 5.1 UNITS VCC VCC Output voltage IBVCC Base current VB = 5.3–18 V, Iload = 5–150 mA 1.5 hfePNP DC current gain of external VCC 100 VLRVCC Load regulation CVCC Load capacitance RVCC ESR of external capacitance VCCUV Undervoltage detection threshold VCCUVHY S Undervoltage detection threshold hysteresis VCCOV Overvoltage detection threshold ICLVCC Current limit Rsns = 0.51 Ω TVCC1 Rise time VCC > UVVCC, CVCC = 22 µF TVCC2 Rise time VCC > UVVCC, CVCC = 100 µF VDD Output voltage VB = 5.3–18 V, Iload = 0–2 mA CVDD Load capacitance VDDUV Undervoltage detection threshold 2.2 2.3 2.4 V VDDOV Overvoltage detection threshold 4.1 4.3 4.5 V 75 150 µs VB = 5.3–18 V, Iload = 5–150 mA –50 – 22 R1 = 7.5 kΩ, R2 = 10 kΩ, VCCUV > 4 V 3.97 V mA 4.07 50 mV 100 µF 300 mΩ 4.17 V 100 mV 6 6.5 7 300 400 550 mA V 0.3 0.5 ms 1 1.5 ms 3.3 3.6 Tvdd (1) (2) (2) 3 1 Rise time VDD > VDDUV, CVDD = 1 µF PRODUCT PREVIEW VDD V µF No variation of the external components Specified by design VB Monitor Description The block monitors VB overvoltage. VB + VB_OV BG - Figure 24. VB Monitor Block Diagram VB MONITOR ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS 26.5 27.5 VB MONITOR Vstop Pre-driver stop VB voltage 28.5 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 V 27 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com THERMAL SHUTDOWN Description The device has temperature sensors that produce a pre-driver stop condition if the chip temperature exceeds 175°. IPTAT TSD PRODUCT PREVIEW Figure 25. Thermal Shutdown Block Diagram THERMAL SHUTDOWN ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS 155 175 THERMAL SHUT DOWN TSD (1) (1) Thermal shut down threshold 195 °C Specified by design OSCILLATOR Description Oscillator block generates two 10-MHZ clock signals. OSC1 is the main clock used for internal logic synchronization and timing control. OSC2 is the secondary clock which is used to monitor the status of OSC1. OSC1(OSC2) VREF Figure 26. Oscillator Block Diagram 28 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 DRV3211-Q1 www.ti.com SLVSBS4 – DECEMBER 2012 OSCILLATOR ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS OSCILLATOR OSC OSC frequency 9 10 11 MHz I/O PRODUCT PREVIEW Figure 27. Input Buffer 1 Block Diagram Figure 28. Output Buffer 1 Block Diagram VDD VCC VCC Level Shift DOUT EN Figure 29. Output Buffer 2 Block Diagram VCC VDD VCC VCC R_RES RES Level Shift Figure 30. Output Buffer 3 Block Diagram Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 29 DRV3211-Q1 SLVSBS4 – DECEMBER 2012 www.ti.com ELECTRICAL CHARACTERISTICS VB = 12 V, TA = –40°C to 125°C (unless otherwise specified) PARAMETER CONDITIONS MIN TYP MAX UNITS INPUT BUFFER 1 VIH Input threshold logic high VIL Input threshold logic low 0.7 × VCC Ru Input pullup resistance 50 Rd Input pulldown resistance 50 V 0.3 × VCC V 100 150 kΩ 100 150 kΩ OUTPUT BUFFER 1 AND 2 VOH Output level logic high Isink = 2.5 mA VOL Output level logic low Isource = 2.5 mA 0.9 × VCC V 0.1 × VCC V 4.5 kΩ 0.1 × VCC V OUTPUT BUFFER 3 R_RES Pullup resistor VOL Output level logic low 1.5 3 Isource = 2 mA ERROR DETECTION Table 4. Error Detection PRODUCT PREVIEW ITEMS SPI PRE-DRIVER FAULT SIGNAL RES VB – Overvoltage – STOP L H CP – Overvoltage – STOP L H CP – Undervoltage Error Bit (CPLV) – L H VCC – Overvoltage Error Bit (VCO) – L H VCC – Undervoltage – STOP L L Error Bit (VCC) – H H VCC – Overcurrent Motor – Overcurrent Error Bit (OVAD) STOP H H VDD – Overvoltage Error Bit (VDO) – L H VDD – Undervoltage – STOP L L Thermal Shut Down Error Bit (TD) STOP H H Watchdog EEPROM Data Check Clock Monitor SPI 30 – – L L Error Bit (EEP) – L H – – L L Error Bit (SPI) – L H Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: DRV3211-Q1 PACKAGE OPTION ADDENDUM www.ti.com 21-Mar-2013 PACKAGING INFORMATION Orderable Device Status (1) DRV3211QPFPQ1 ACTIVE Package Type Package Pins Package Qty Drawing HTQFP PFP 80 96 Eco Plan Lead/Ball Finish (2) Green (RoHS & no Sb/Br) MSL Peak Temp Op Temp (°C) Top-Side Markings (3) CU NIPDAU Level-3-260C-168 HR (4) -40 to 125 DRV3211 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) Only one of markings shown within the brackets will appear on the physical device. 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