128K x 36, 256K x 18 3.3V Synchronous SRAMs 2.5V I/O, Flow-Through Outputs Burst Counter, Single Cycle Deselect Description Features ◆ ◆ ◆ ◆ ◆ ◆ ◆ ◆ IDT71V2577 IDT71V2579 The IDT71V2577/79 are high-speed SRAMs organized as 128K x 36/256K x 18. The IDT71V2577/79 SRAMs contain write, data, address and control registers. There are no registers in the data output path (flow-through architecture). Internal logic allows the SRAM to generate a self-timed write based upon a decision which can be left until the end of the write cycle. The burst mode feature offers the highest level of performance to the system designer, as the IDT71V2577/79 can provide four cycles of data for a single address presented to the SRAM. An internal burst address counter accepts the first cycle address from the processor, initiating the access sequence. The first cycle of output data will flow-through from the array after a clock-to-data access time delay from the rising clock edge of the same cycle. If burst mode operation is selected (ADV=LOW), the subsequent three cycles of output data will be available to the user on the next three rising clock edges. The order of these three addresses are defined by the internal burst counter and the LBO input pin. The IDT71V2577/79 SRAMs utilize IDT’s latest high-performance CMOS process and are packaged in a JEDEC standard 14mm x 20mm 100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array (BGA) and a 165 fine pitch ball grid array (fBGA). 128K x 36, 256K x 18 memory configurations Supports fast access times: Commercial: – 7.5ns up to 117MHz clock frequency Commercial and Industrial: – 8.0ns up to 100MHz clock frequency – 8.5ns up to 87MHz clock frequency LBO input selects interleaved or linear burst mode Self-timed write cycle with global write control (GW), byte write enable (BWE), and byte writes (BWx) 3.3V core power supply Power down controlled by ZZ input 2.5V I/O Packaged in a JEDEC Standard 100-pin plastic thin quad flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch ball grid array (fBGA) Pin Description Summary A0-A17 Address Inputs Input Synchronous CE Chip Enable Input Synchronous CS0, CS1 Chip Selects Input Synchronous OE Output Enable Input Asynchronous GW Global Write Enable Input Synchronous BWE Byte Write Enable Input Synchronous BW1, BW2, BW3, BW4(1) Individual Byte Write Selects Input Synchronous CLK Clock Input N/A ADV Burst Address Advance Input Synchronous ADSC Address Status (Cache Controller) Input Synchronous ADSP Address Status (Processor) Input Synchronous LBO Linear / Interleaved Burst Order Input DC ZZ Sleep Mode Input Asynchronous I/O0-I/O31, I/OP1-I/OP4 Data Input / Output I/O Synchronous VDD, VDDQ Core Power, I/O Power Supply N/A VSS Ground Supply N/A 4877 tbl 01 NOTE: 1. BW3 and BW4 are not applicable for the IDT71V2579. OCTOBER 2000 1 © 2000 ntegrated Device Technology, Inc. DSC-4877/06 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Pin Definition(1) Symbol Pin Function I/O Active Description A0-A17 Address Inputs I N/A Synchronous Address inputs. The address register is triggered by a combi-nation of the rising edge of CLK and ADSC Low or ADSP Low and CE Low. ADSC Address Status (Cache Controller) I LOW Synchronous Address Status from Cache Controller. ADSC is an active LOW input that is used to load the address registers with new addresses. ADSP Address Status (Processor) I LOW Synchronous Address Status from Processor. ADSP is an active LOW input that is used to load the address registers with new addresses. ADSP is gated by CE. ADV Burst Address Advance I LOW Synchronous Address Advance. ADV is an active LOW input that is used to advance the internal burst counter, controlling burst access after the initial address is loaded. When the input is HIGH the burst counter is not incremented; that is, there is no address advance. BWE Byte Write Enable I LOW Synchronous byte write enable gates the byte write inputs BW1-BW4. If BWE is LOW at the rising edge of CLK then BWx inputs are passed to the next stage in the circuit. If BWE is HIGH then the byte write inputs are blocked and only GW can initiate a write cycle. BW1-BW4 Individual Byte Write Enables I LOW Synchronous byte write enables. BW1 controls I/O0-7, I/OP1, BW2 controls I/O8-15, I/OP2, etc. Any active byte write causes all outputs to be disabled. CE Chip Enable I LOW Synchronous chip enable. CE is used with CS0 and CS1 to enable the IDT71V2577/79. CE also gates ADSP. CLK Clock I N/A This is the clock input. All timing references for the device are made with respect to this input. CS0 Chip Select 0 I HIGH Synchronous active HIGH chip select. CS0 is used with CE and CS1 to enable the chip. CS1 Chip Select 1 I LOW Synchronous active LOW chip select. CS1 is used with CE and CS0 to enable the chip. GW Global Write Enable I LOW Synchronous global write enable. This input will write all four 9-bit data bytes when LOW on the rising edge of CLK. GW supersedes individual byte write enables. I/O0-I/O31 I/OP1-I/OP4 Data Input/Output I/O N/A Synchronous data input/output (I/O) pins. The data input path is registered, triggered by the rising edge of CLK. The data output path is flow-through (no output register). LBO Linear Burst Order I LOW Asynchronous burst order selection input. When LBO is HIGH, the inter-leaved burst sequence is selected. When LBO is LOW the Linear burst sequence is selected. LBO is a static input and must not change state while the device is operating. OE Output Enable I LOW Asynchronous output enable. When OE is LOW the data output drivers are enabled on the I/O pins if the chip is also selected. When OE is HIGH the I/O pins are in a high-impedance state. VDD Power Supply N/A N/A 3.3V core power supply. VDDQ Power Supply N/A N/A 2.5V I/O Supply. VSS Ground N/A N/A Ground. NC No Connect N/A N/A NC pins are not electrically connected to the device. ZZ Sleep Mode 1 HIGH Asynchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the IDT71V2577/79 to its lowest power consumption level. Data retention is guaranteed in Sleep Mode. NOTE: 1. All synchronous inputs must meet specified setup and hold times with respect to CLK. 6.42 2 4877 tbl 02 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Functional Block Diagram LBO ADV CLK 2 Binary Counter ADSC Burst Logic Q0 CLR ADSP Q1 CLK EN ADDRESS REGISTER A0 - A16/17 GW BWE INTERNAL ADDRESS Burst Sequence CEN 2 A0,A1 17/18 A0* A1* 128K x 36/ 256K x 18BIT MEMORY ARRAY A2 - A17 36/18 17/18 Byte 1 Write Register 36/18 Byte 1 Write Driver BW1 9 Byte 2 Write Register Byte 2 Write Driver BW2 9 Byte 3 Write Register Byte 3 Write Driver BW3 9 Byte 4 Write Register Byte 4 Write Driver BW4 9 CE CS0 CS1 D Q Enable Register DATA INPUT REGISTER CLK EN ZZ Powerdown OE OE I/O0 - I/O31 I/OP1 - I/OP4 OUTPUT BUFFER 36/18 4877 drw 01 6.42 3 , IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Absolute Maximum Ratings(1) Symbol Rating Commerical & Industrial Values Unit VTERM(2) Terminal Voltage with Respect to GND -0.5 to +4.6 V VTERM(3,6) Terminal Voltage with Respect to GND -0.5 to VDD V VTERM(4,6) Terminal Voltage with Respect to GND -0.5 to VDD +0.5 V VTERM(5,6) Terminal Voltage with Respect to GND -0.5 to VDDQ +0.5 V Commercial Operating Temperature -0 to +70 Industrial Operating Temperature -40 to +85 o C Temperature Under Bias -55 to +125 o C Storage Temperature -55 to +125 TA (7) TBIAS TSTG o Recommended Operating Temperature and Supply Voltage Grade Temperature(1) VSS VDD VDDQ Commercial 0°C to +70°C 0V 3.3V±5% 2.5V±5% Industrial -40°C to +85°C 0V 3.3V±5% 2.5V±5% NOTES: 1. TA is the “instant on” case temperature. Recommended DC Operating Conditions C Symbol o C Power Dissipation 2.0 W IOUT DC Output Current 50 mA Parameter Min. Typ. Max. Unit VDD Core Supply Voltage 3.135 3.3 3.465 V VDDQ I/O Supply Voltage 2.375 2.5 2.625 V VSS Supply Voltage V VIH Input High Voltage - Inputs VIH VIL PT 4877 tbl 04 Input High Voltage - I/O Input Low Voltage 0 0 0 1.7 ____ VDD + 0.3 ____ 1.7 (2) -0.3 ____ V (1) VDDQ + 0.3 0.7 V V 4877 tbl 05 NOTES: 1. VIH (max) = VDDQ + 1.0V for pulse width less than tCYC/2, once per cycle. 2. VIL (min) = -1.0V for pulse width less than tCYC/2, once per cycle. 4877 tbl 03 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VDD terminals only. 3. VDDQ terminals only. 4. Input terminals only. 5. I/O terminals only. 6. This is a steady-state DC parameter that applies after the power supplies have ramped up. Power supply sequencing is not necessary; however, the voltage on any input or I/O pin cannot exceed VDDQ during power supply ramp up. 7. TA is the “instant on” case temperature. 100 Pin TQFP Capacitance 119 BGA Capacitance (TA = +25°C, f = 1.0MHz) Symbol Parameter(1) CIN Input Capacitance CI/O I/O Capacitance (TA = +25°C, f = 1.0MHz) Max. Unit Symbol VIN = 3dV 5 pF CIN Input Capacitance VOUT = 3dV 7 pF CI/O I/O Capacitance 4877 tbl 07 165 fBGA Capacitance (TA = +25°C, f = 1.0MHz) Symbol Parameter(1) CIN Input Capacitance CI/O I/O Capacitance Parameter(1) Conditions Conditions Max. Unit VIN = 3dV TBD pF VOUT = 3dV TBD pF 4877 tbl 07b NOTE: 1. This parameter is guaranteed by device characterization, but not production tested. 6.42 4 Conditions Max. Unit V IN = 3dV 7 pF VOUT = 3dV 7 pF 4877 tbl 07a IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges A6 A7 CE CS0 BW4 BW3 BW2 BW1 CS1 VDD VSS CLK GW BWE OE ADSC ADSP ADV A8 A9 Pin Configuration 128K x 36 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 I/OP3 I/O16 I/O17 VDDQ VSS I/O18 I/O19 I/O20 I/O21 VSS VDDQ I/O22 I/O23 VSS(1) VDD NC VSS I/O24 I/O25 VDDQ VSS I/O26 I/O27 I/O28 I/O29 VSS VDDQ I/O30 I/O31 I/OP4 1 80 2 79 3 4 78 77 5 76 6 75 7 74 8 73 9 72 71 10 11 70 12 69 13 68 14 15 67 66 16 65 17 64 18 63 19 62 20 61 21 60 22 59 23 58 24 57 25 56 26 55 27 54 28 53 29 52 30 51 I/OP2 I/O15 I/O14 VDDQ VSS I/O13 I/O12 I/O11 I/O10 VSS VDDQ I/O9 I/O8 VSS NC VDD ZZ(3) I/O7 I/O6 VDDQ VSS I/O5 I/O4 I/O3 I/O2 VSS VDDQ I/O1 I/O0 I/OP1 NC NC A10 A11 A12 A13 A14 A15 A16 LBO A5 A4 A3 A2 A1 A0 NC(2) NC(2) VSS VDD 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 100 TQFP Top View NOTES: 1. Pin 14 does not have to be directly connected to VSS as long as the input voltage is < VIL. 2. Pins 38 and 39 can be either NC or connected to VSS. 3. Pin 64 can be left unconnected and the device will always remain in active mode. 6.42 5 4877 drw 02a , IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges A6 A7 CE CS0 NC NC BW2 BW1 CS1 VDD VSS CLK GW BWE OE ADSC ADSP ADV A8 A9 Pin Configuration 256K x 18 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 NC NC NC 1 80 2 79 3 VDDQ VSS NC NC I/O8 I/O9 VSS VDDQ I/O10 I/O11 VSS(1) VDD NC VSS I/O12 I/O13 VDDQ VSS I/O14 I/O15 I/OP2 NC VSS VDDQ NC NC NC 4 78 77 5 76 6 75 7 74 8 73 9 72 71 10 11 70 12 69 13 68 14 15 67 66 16 65 17 64 18 63 19 62 20 61 21 60 22 59 23 58 24 57 25 56 26 55 27 54 28 53 29 52 51 30 A10 NC NC VDDQ VSS NC I/OP1 I/O7 I/O6 VSS VDDQ I/O5 I/O4 VSS NC VDD ZZ(3) I/O3 I/O2 VDDQ VSS I/O1 I/O0 NC NC VSS VDDQ NC NC NC LBO A5 A4 A3 A2 A1 A0 NC(2) NC(2) VSS VDD NC NC A11 A12 A13 A14 A15 A16 A17 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 100 TQFP Top View NOTES: 1. Pin 14 does not have to be directly connected to VSS as long as the input voltage is < VIL. 2. Pins 38 and 39 can be either NC or connected to VSS. 3. Pin 64 can be left unconnected and the device will always remain in active mode. 6.42 6 4877 drw 02b , IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Pin Configuration 128K x 36, 119 BGA 1 2 3 4 5 6 7 A VDDQ A6 A4 ADSP A8 A16 VDDQ B NC CS0 A3 ADSC A9 CS1 NC C NC A7 A2 VDD A12 A15 NC D I/O16 I/OP3 VSS NC VSS I/OP2 I/O15 E I/O17 I/O18 VSS CE VSS I/O13 I/O14 F VDDQ I/O19 VSS OE VSS I/O12 VDDQ G I/O20 I/O21 BW3 ADV BW2 I/O11 I/O10 H I/O22 I/O23 VSS GW VSS I/O9 I/O8 J VDDQ VDD NC VDD NC VDD VDDQ K I/O24 I/O26 VSS CLK VSS I/O6 I/O7 BW1 I/O4 I/O5 L I/O25 I/O27 BW4 NC(2) M VDDQ I/O28 VSS BWE VSS I/O3 VDDQ N I/O29 I/O30 VSS A1 VSS I/O2 I/O1 P I/O31 I/OP4 VSS A0 VSS I/O0 I/OP1 R NC A5 LBO VDD VSS A13 NC T NC NC A10 A11 A14 NC ZZ(3) U VDDQ DNU(4) DNU(4) DNU(2,4) DNU(4) DNU(4) , VDDQ 4877 drw 02c Top View Pin Configuration 256K x 18, 119 BGA 1 2 3 4 5 6 7 A VDDQ A6 A4 ADSP A8 A16 VDDQ B NC CS0 A3 ADSC A9 CS1 NC C NC A7 A2 VDD A13 A17 NC D I/O8 NC VSS NC VSS I/O7 NC E NC I/O9 VSS CE VSS NC I/O6 F VDDQ NC VSS OE VSS I/O5 VDDQ G NC I/O10 BW2 ADV VSS NC I/O4 H I/O11 NC VSS GW VSS I/O3 NC J VDDQ VDD NC VDD NC VDD VDDQ K NC I/O12 VSS CLK VSS NC I/O2 L I/O13 NC VSS NC(2) BW1 I/O1 NC M VDDQ I/O14 VSS BWE VSS NC VDDQ N I/O15 NC VSS A1 VSS I/O0 NC P NC I/OP2 VSS A0 VSS NC I/OP1 R NC A5 LBO VDD VSS A12 NC T NC A10 A15 NC A14 A11 ZZ(3) U VDDQ DNU(4) DNU(4) DNU(2,4) DNU(4) Top View DNU(4) VDDQ , 4877 drw 02d NOTES: 1. R5 does not have to be directly connected to VSS as long as the input voltage is < VIL. 2. L4 and U4 can be either NC or connected to VSS. 3. T7 can be left unconnected and the device will always remain in active mode. 4. DNU = Do not use U2, U3, U4, U5 and U6 are reserved for respective JTAG pins: TDI, TDO, TMS, TCK and TRST on future revisions. Within the current version these pins are not connected. 6.42 7 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Pin Configuration 128K x 36, 165 fBGA 1 2 3 4 5 6 7 8 9 10 11 A NC(4) A7 CE1 BW3 BW2 CS1 BWE ADSC ADV A8 NC B NC A6 CS 0 BW4 BW1 CLK GW OE ADSP A9 NC(4) C I/OP3 NC VDDQ VSS VSS VSS VSS VSS VDDQ NC I/OP2 D I/O17 I/O16 VDDQ VDD VSS VSS VSS VDD VDDQ I/O15 I/O14 E I/O19 I/O18 VDDQ VDD VSS VSS VSS VDD VDDQ I/O13 I/O12 F I/O21 I/O20 VDDQ VDD VSS VSS VSS VDD VDDQ I/O11 I/O10 G I/O23 I/O22 VDDQ VDD VSS VSS VSS VDD VDDQ I/O9 I/O8 H VSS (1) (2) NC NC VDD VSS VSS VSS VDD NC NC ZZ(3) J I/O25 I/O24 VDDQ VDD VSS VSS VSS VDD VDDQ I/O7 I/O6 K I/O27 I/O26 VDDQ VDD VSS VSS VSS VDD VDDQ I/O5 I/O4 L I/O29 I/O28 VDDQ VDD VSS VSS VSS VDD VDDQ I/O3 I/O2 M I/O31 I/O30 VDDQ VDD VSS VSS VSS VDD VDDQ I/O1 I/O0 N I/OP4 NC VDDQ VSS DNU(5) NC(4) NC(2) VSS VDDQ NC I/OP1 P NC NC(4) A5 A2 DNU(5) A1 DNU(5) A10 A13 A14 NC(4) R LBO NC(4) A4 A3 DNU(5) A0 DNU(5) A11 A12 A15 A16 4877 tbl 17 Pin Configuration 256K x 18, 165 fBGA 1 2 3 4 5 6 7 8 9 10 11 A NC A7 CE BW2 NC CS1 BWE ADSC ADV A8 A10 B NC A6 CS0 NC BW1 CLK GW OE ADSP A9 NC(4) C NC NC VDDQ VSS VSS VSS VSS VSS VDDQ NC I/OP1 D NC I/O8 VDDQ VDD VSS VSS VSS VDD VDDQ NC I/O7 E NC I/O9 VDDQ VDD VSS VSS VSS VDD VDDQ NC I/O6 F NC I/O10 VDDQ VDD VSS VSS VSS VDD VDDQ NC I/O5 G NC I/O11 VDDQ VDD VSS VSS VSS VDD VDDQ NC I/O4 NC NC VDD VSS VSS VSS VDD NC NC ZZ(3) (4) (1) (2) H VSS J I/O12 NC VDDQ VDD VSS VSS VSS VDD VDDQ I/O3 NC K I/O13 NC VDDQ VDD VSS VSS VSS VDD VDDQ I/O2 NC L I/O14 NC VDDQ VDD VSS VSS VSS VDD VDDQ I/O1 NC M I/O15 NC VDDQ VDD VSS VSS VSS VDD VDDQ I/O0 NC N I/OP2 NC (4) VDDQ VSS (5) DNU (5) (4) NC (2) NC VSS VDDQ NC NC (5) P NC NC A5 A2 DNU A1 DNU A11 A14 A15 NC(4) R LBO NC(4) A4 A3 DNU(5) A0 DNU(5) A12 A13 A16 A17 4877 tbl 17a NOTES: 1. H1 does not have to be directly VSS as long as input voltage is < VIL. 2. H2 and N7 can be either NC or connected to VSS. 3. H11 can be left unconnected and the device will always remain in active mode. 4. Pins P11, N6, B11, A1, R2 and P2 are reserved for 9M, 18M, 36M, 72M, 144M and 288M respectively. 5. DNU = Do not use; Pins P5, P7, R5, R7 and N5 are reserved for respective JTAG pins: TDI, TDO, TMS, TCK and TRST on future revisions. Within the current version these pins are not connected. 6.42 8 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range (VDD = 3.3V ± 5%) Symbol Parameter Test Conditions Min. Max. Unit |ILI| Input Leakage Current VDD = Max., VIN = 0V to V DD ___ 5 µA |ILI| ZZ and LBO Input Leakage Current(1) V DD = Max., VIN = 0V to V DD ___ 30 µA 5 µA |ILO| Output Leakage Current VOUT = 0V to V DDQ , Device Deselected ___ V OL Output Low Voltage IOL = +6mA, VDD = Min. ___ 0.4 V VOH Output High Voltage IOH = -6mA, VDD = Min. 2.0 ___ V 4877 tbl 08 NOTE: 1. The LBO pin will be internally pulled to VDD if it is not actively driven in the application and the ZZ pin will be internally pulled to V SS if not actively driven. DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(1) 7.5ns Symbol Parameter Test Conditions 8ns 8.5ns Com'l Only Com'l Ind Com'l Ind Unit IDD Operating Power Supply Current Device Selected, Outputs Open, V DD = Max., V DDQ = Max., VIN > VIH or < VIL, f = fMAX(2) 255 200 210 180 190 mA ISB1 CMOS Standby Power Supply Current Device Deselected, Outputs Open, VDD = Max., V DDQ = Max., VIN > VHD or < VLD, f = 0(2,3) 30 30 35 30 35 mA ISB2 Clock Running Power Supply Current Device Deselected, Outputs Open, VDD = Max., V DDQ = Max., VIN > VHD or < VLD, f = fMAX(2,3) 90 85 95 80 90 mA IZZ Full Sleep Mode Supply Current ZZ > VHD, VDD = Max. 30 30 35 30 35 mA 4877 tbl 09 NOTES: 1. All values are maximum guaranteed values. 2. At f = fMAX, inputs are cycling at the maximum frequency of read cycles of 1/tCYC while ADSC = LOW; f=0 means no input lines are changing. 3. For I/Os VHD = VDDQ - 0.2V, VLD = 0.2V. For other inputs VHD = VDD - 0.2V, VLD = 0.2V. AC Test Conditions AC Test Load (VDDQ = 2.5V) Input Pulse Levels Input Rise/Fall Times 50Ω 0 to 2.5V I/O 2ns Input Timing Reference Levels (VDDQ/2) Output Timing Reference Levels (VDDQ/2) AC Test Load VDDQ/2 Z0 = 50Ω , 4877d03 Figure 1. AC Test Load 6 See Figure 1 5 4877 tbl 10 4 ∆tCD 3 (Typical, ns) 2 1 20 30 50 80 100 Capacitance (pF) 200 4877d05 Figure 2. Lumped Capacitive Load, Typical Derating 6.42 9 , IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Synchronous Truth Table(1,3) Address Used CE CS 0 CS1 ADSP ADSC ADV GW BWE BWx OE(2) CLK I/O De se le cte d Cycle , Po we r Do wn No ne H X X X L X X X X X ↑ HI-Z De se le cte d Cycle , Po we r Do wn No ne L X H L X X X X X X ↑ HI-Z De se le cte d Cycle , Po we r Do wn No ne L L X L X X X X X X ↑ HI-Z De se le cte d Cycle , Po we r Do wn No ne L X H X L X X X X X ↑ HI-Z De se le cte d Cycle , Po we r Do wn No ne L L X X L X X X X X ↑ HI-Z Re ad Cycle , Be g in B urst Exte rnal L H L L X X X X X L ↑ D OUT Re ad Cycle , Be g in B urst Exte rnal L H L L X X X X X H ↑ HI-Z Re ad Cycle , Be g in B urst Exte rnal L H L H L X H H X L ↑ D OUT Re ad Cycle , Be g in B urst Exte rnal L H L H L X H L H L ↑ D OUT Re ad Cycle , Be g in B urst Exte rnal L H L H L X H L H H ↑ HI-Z Write Cycle , Be g in Burst Exte rnal L H L H L X H L L X ↑ D IN Write Cycle , Be g in Burst Exte rnal L H L H L X L X X X ↑ D IN Re ad Cycle , Co ntinue Burst Ne xt X X X H H L H H X L ↑ D OUT Re ad Cycle , Co ntinue Burst Ne xt X X X H H L H H X H ↑ HI-Z Re ad Cycle , Co ntinue Burst Ne xt X X X H H L H X H L ↑ D OUT Re ad Cycle , Co ntinue Burst Ne xt X X X H H L H X H H ↑ HI-Z Re ad Cycle , Co ntinue Burst Ne xt H X X X H L H H X L ↑ D OUT Re ad Cycle , Co ntinue Burst Ne xt H X X X H L H H X H ↑ HI-Z Re ad Cycle , Co ntinue Burst Ne xt H X X X H L H X H L ↑ D OUT Re ad Cycle , Co ntinue Burst Ne xt H X X X H L H X H H ↑ HI-Z Write Cycle , Co ntinue Burst Ne xt X X X H H L H L L X ↑ D IN Write Cycle , Co ntinue Burst Ne xt X X X H H L L X X X ↑ D IN Write Cycle , Co ntinue Burst Ne xt H X X X H L H L L X ↑ D IN Write Cycle , Co ntinue Burst Ne xt H X X X H L L X X X ↑ D IN Re ad Cycle , Susp e nd Burst Curre nt X X X H H H H H X L ↑ D OUT Re ad Cycle , Susp e nd Burst Curre nt X X X H H H H H X H ↑ HI-Z Re ad Cycle , Susp e nd Burst Curre nt X X X H H H H X H L ↑ D OUT Re ad Cycle , Susp e nd Burst Curre nt X X X H H H H X H H ↑ HI-Z Re ad Cycle , Susp e nd Burst Curre nt H X X X H H H H X L ↑ D OUT Re ad Cycle , Susp e nd Burst Curre nt H X X X H H H H X H ↑ HI-Z Re ad Cycle , Susp e nd Burst Curre nt H X X X H H H X H L ↑ D OUT Re ad Cycle , Susp e nd Burst Curre nt H X X X H H H X H H ↑ HI-Z Write Cycle , S usp e nd Burst Curre nt X X X H H H H L L X ↑ D IN Write Cycle , S usp e nd Burst Curre nt X X X H H H L X X X ↑ D IN Write Cycle , S usp e nd Burst Curre nt H X X X H H H L L X ↑ D IN Write Cycle , S usp e nd Burst Curre nt H X X X H H L X X X ↑ Operation D IN 4877 tbl 11 NOTES: 1. L = VIL, H = VIH, X = Don’t Care. 2. OE is an asynchronous input. 3. ZZ = low for this table. 6.42 10 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Synchronous Write Function Truth Table(1, 2) Operation GW BWE BW1 BW2 BW3 BW4 Read H H X X X X Read H L H H H H Write all Bytes L X X X X X Write all Bytes H L L L L L (3) H L L H H H (3) H L H L H H (3) H L H H L H (3) H L H H H L Write Byte 1 Write Byte 2 Write Byte 3 Write Byte 4 4877 tbl 12 NOTES: 1. L = VIL, H = VIH, X = Don’t Care. 2. BW3 and BW4 are not applicable for the IDT71V2579. 3. Multiple bytes may be selected during the same cycle. Asynchronous Truth Table(1) Operation (2) OE ZZ I/O Status Power Read L L Data Out Active Read H L High-Z Active Write X L High-Z – Data In Active Deselected X L High-Z Standby Sleep Mode X H High-Z Sleep 4877 tbl 13 NOTES: 1. L = VIL, H = VIH, X = Don’t Care. 2. Synchronous function pins must be biased appropriately to satisfy operation requirements. Interleaved Burst Sequence Table (LBO=VDD) Sequence 1 Sequence 2 Sequence 3 Sequence 4 A1 A0 A1 A0 A1 A0 A1 A0 First Address 0 0 0 1 1 0 1 1 Second Address 0 1 0 0 1 1 1 0 Third Address 1 0 1 1 0 0 0 1 Fourth Address (1) 1 1 1 0 0 1 0 0 4877 tbl 14 NOTE: 1. Upon completion of the Burst sequence the counter wraps around to its initial state. Linear Burst Sequence Table (LBO=VSS) Sequence 1 Sequence 2 Sequence 3 Sequence 4 A1 A0 A1 A0 A1 A0 A1 A0 First Address 0 0 0 1 1 0 1 1 Second Address 0 1 1 0 1 1 0 0 Third Address 1 0 1 1 0 0 0 1 1 1 0 0 0 1 1 Fourth Address (1) NOTE: 1. Upon completion of the Burst sequence the counter wraps around to its initial state. 6.42 11 0 4877 tbl 15 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges AC Electrical Characteristics (VDD = 3.3V ±5%, Commercial and Industrial Temperature Ranges) 8ns 7.5ns(5) Symbol Parameter 8.5ns Min. Max. Min. Max. Min. Max. Unit 8.5 ____ 10 ____ 11.5 ____ ns Clock Parameter tCYC Clock Cycle Time tCH(1) Clock High Pulse Width 3 ____ 4 ____ 4.5 ____ ns tCL(1) Clock Low Pulse Width 3 ____ 4 ____ 4.5 ____ ns ____ 7.5 ____ 8 ____ 8.5 ns 2 ____ 2 ____ ns Output Parameters tCD Clock High to Valid Data tCDC Clock High to Data Change 2 ____ tCLZ(2) Clock High to Output Active 0 ____ 0 ____ 0 ____ ns tCHZ(2) Clock High to Data High-Z 2 3.5 2 3.5 2 3.5 ns tOE Output Enable Access Time ____ 3.5 ____ 3.5 ____ 3.5 ns tOLZ(2) Output Enable Low to Output Active 0 ____ 0 ____ 0 ____ ns tOHZ(2) Outp ut Enable High to Output High-Z ____ 3.5 ____ 3.5 ____ 3.5 ns Set Up Times tSA Address Setup Time 1.5 ____ 2 ____ 2 ____ ns tSS Address Status Setup Time 1.5 ____ 2 ____ 2 ____ ns 2 ____ 2 ____ ns tSD Data In Setup Time 1.5 ____ tSW Write Setup Time 1.5 ____ 2 ____ 2 ____ ns tSAV Address Advance Setup Time 1.5 ____ 2 ____ 2 ____ ns tSC Chip Enable/Select Setup Time 1.5 ____ 2 ____ 2 ____ ns 0.5 ____ 0.5 ____ 0.5 ____ ns 0.5 ____ 0.5 ____ ns Hold Times tHA Address Hold Time tHS Address Status Hold Time 0.5 ____ tHD Data In Hold Time 0.5 ____ 0.5 ____ 0.5 ____ ns tHW Write Hold Time 0.5 ____ 0.5 ____ 0.5 ____ ns 0.5 ____ 0.5 ____ ns tHAV Address Advance Hold Time 0.5 ____ tHC Chip Enable/Select Hold Time 0.5 ____ 0.5 ____ 0.5 ____ ns Sleep Mode and Configuration Parameters tZZPW ZZ Pulse Width 100 ____ 100 ____ 100 ____ ns tZZR(3) ZZ Recovery Time 100 ____ 100 ____ 100 ____ ns 34 ____ 40 ____ 50 ____ tCFG (4) Configuration Set-up Time NOTES: 1. Measured as HIGH above VIH and LOW below VIL. 2. Transition is measured ±200mV from steady-state. 3. Device must be deselected when powered-up from sleep mode. 4. tCFG is the minimum time required to configure the device based on the LBO input. LBO is a static input and must not change during normal operation. 5. Commercial temperature range only. 6.42 12 ns 4877 tbl 16 6.42 13 Output Disabled tSC tSA tSS tHS tOLZ tOE O1(Ax) tHC Flow-through Read Ax tHA tOHZ Ay (1) tCH tCD tSAV tHAV O1(Ay) tCDC tSW tCL O3(Ay) O4(Ay) (Burst wraps around to its initial state) ADV HIGH suspends burst Burst Flow-through Read O2(Ay) tHW O1(Ay) tCHZ O2(Ay) NOTES: 1. O1 (Ax) represents the first output from the external address Ax. O1 (Ay) represents the first output from the external address Ay; O2 (Ay) represents the next output data in the burst sequence of the base address Ay, etc. where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. 2. ZZ input is LOW and LBO is Don't Care for this cycle. 3. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. DATAOUT OE ADV (Note 3) CE, CS1 GW, BWE, BWx ADDRESS ADSC ADSP CLK tCYC 4877 drw 06 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Timing Waveform of Flow-Through Read Cycle(1,2) , 6.42 14 Ax (2) Single Read tSA tHA tSS tHS tCLZ tCD tOE O1(Ax) tOHZ tSW Ay tCH Write I1(Ay) tSD tHD tCL tHW Az tCD tOLZ O2(Az) O3(Az) Flow-through Burst Read O1(Az) tCDC 4877 drw 07 O4(Az) , NOTES: 1. Device is selected through entire cycle; CE and CS1 are LOW, CS0 is HIGH. 2. ZZ input is LOW and LBO is Don't Care for this cycle. 3. O1 (Ax) represents the first output from the external address Ax. I1 (Ay) represents the first input from the external address Ay; O1 (Az) represents the first output from the external address Az; O2 (Az) represents the next output data in the burst sequence of the base address Az, etc. where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. DATAOUT DATAIN OE ADV GW ADDRESS ADSP CLK tCYC IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Timing Waveform of Combined Flow-Through Read and Write Cycles(1,2,3) 6.42 15 DATAOUT DATAIN OE ADV (Note 3) CE, CS1 GW ADDRESS ADSC ADSP CLK tHC O4(Aw) Ax (1) Ay tCL tOHZ I1(Ax) I1(Ay) I2(Ay) (ADV suspends burst) tSAV GW is ignored when ADSP initiates a cycle and is sampled on the next cycle rising edge tCH I2(Ay) (2) I3(Ay) tHAV I4(Ay) tSD I1(Az) tHW tSW Az I2(Az) tHD 4877 drw 08 I3(Az) , NOTES: 1. ZZ input is LOW, BWE is HIGH and LBO is Don't Care for this cycle. 2. O4 (Aw) represents the final output data in the burst sequence of the base address Aw. I1 (Ax) represents the first input from the external address Ax. I1 (Ay) represents the first input from the external address Ay; I2 (Ay) represents the next input data in the burst sequence of the base address Ay, etc. where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. In the case of input I2 (Ay) this data is valid for two cycles because ADV is high and has suspended the burst. 3. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. O3(Aw) tSC tSA tHA tSS tHS tCYC IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Timing Waveform of Write Cycle No. 1 - GW Controlled(1,2,3) 6.42 16 tHC Burst Read O3(Aw) tSC tSA tHA tSS tHS O4(Aw) Ax Ay tCL Single Write tOHZ I1(Ax) I1(Ay) Burst Write I2(Ay) (ADV HIGH suspends burst) I2(Ay) BWx is ignored when ADSP initiates a cycle and is sampled on the next clock rising edge BWE is ignored when ADSP initiates a cycle and is sampled on the next cycle rising edge tCH I3(Ay) I4(Ay) tSD Extended Burst Write I1(Az) tSAV tHW tSW tHW tSW Az I2(Az) tHD 4877 drw 09 I3(Az) , NOTES: 1. ZZ input is LOW, GW is HIGH and LBO is Don't Care for this cycle. 2. O4 (Aw) represents the final output data in the burst sequence of the base address Aw. I1 (Ax) represents the first input from the external address Ax. I1 (Ay) represents the first input from the external address Ay; I2 (Ay) represents the next input data in the burst sequence of the base address Ay, etc. where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. In the case of input I2 (Ay) this data is valid for two cycles because ADV is high and has suspended the burst. 3. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. DATAOUT DATAIN OE ADV (Note 3) CE, CS1 BWx BWE ADDRESS ADSC ADSP CLK tCYC IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Timing Waveform of Write Cycle No. 2 - Byte Controlled(1,2,3) 6.42 17 tSS tSC tSA Ax tOE tOLZ tHS Single Read O1(Ax) tHC tHA tCH tCL tZZPW Snooze Mode tZZR NOTES: 1. Device must power up in deselected Mode 2. LBO is Don't Care for this cycle. 3. It is not necessary to retain the state of the input registers throughout the Power-down cycle. 4. CS timing transitions are identical but inverted to the CE and CS1 signaals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. ZZ DATAOUT OE ADV (Note 4) CE, CS1 GW ADDRESS ADSC ADSP CLK tCYC Az 4877 drw 13 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Timing Waveform of Sleep (ZZ) and Power-Down Modes(1,2,3) , IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Non-Burst Read Cycle Timing Waveform CLK ADSP ADSC ADDRESS Av Aw Ax Ay Az GW, BWE, BWx CE, CS1 CS0 OE (Av) DATAOUT (Aw) (Ax) (Ay) , 4877 drw 10 NOTES: 1. ZZ input is LOW, ADV is HIGH and LBO is Don't Care for this cycle. 2. (Ax) represents the data for address Ax, etc. 3. For read cycles, ADSP and ADSC function identically and are therefore interchangable. Non-Burst Write Cycle Timing Waveform CLK ADSP ADSC ADDRESS Av Aw Ax Ay Az (Ax) (Ay) (Az) GW CE, CS1 CS0 DATAIN (Av) (Aw) 4877 drw 11 NOTES: 1. ZZ input is LOW, ADV and OE are HIGH, and LBO is Don't Care for this cycle. 2. (Ax) represents the data for address Ax, etc. 3. Although only GW writes are shown, the functionality of BWE and BWx together is the same as GW. 4. For write cycles, ADSP and ADSC have different limitations. 6.42 18 , IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges 100-Pin Thin Quad Plastic Flatpack (TQFP) Package Diagram Outline 6.42 19 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges 119 Ball Grid Array (BGA) Package Diagram Outline 6.42 20 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges 165 Fine Pitch Ball Grid Array (fBGA) Package Diagram Outline 6.42 21 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Ordering Information IDT XXX S X XX X Device Type Power Speed Package Process/ Temperature Range Blank I Commercial (0°C to +70°C) Industrial (-40°C to +85°C) PF BG BQ 100-pin Plastic Thin Quad Flatpack (TQFP) 119 Ball Grid Array (BGA) 165 Fine Pitch Ball Grid Array (fBGA) 75* 80 85 Access Time in Tenths of Nanoseconds 71V2577 71V2579 128K x 36 Flow-Through Burst Synchronous SRAM with 2.5V I/O 256K x 18 Flow-Through Burst Synchronous SRAM with 2.5V I/O , *Commercial temperature range only. 6.42 22 4877 drw 12 IDT71V2577, IDT71V2579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with 2.5V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges Datasheet Document History 7/23/99 9/17/99 12/31/99 04/04/00 Pg. 2 Pg. 3 Pg. 8 Pg. 18 Pg. 20 Pg. 1, 4, 8, 11, 19 Pg. 18 Pg. 4 06/01/00 07/15/00 Pg. 20 Pg. 7 Pg. 8 Pg. 20 10/25/00 Pg. 8 Updated to new format Revised I/O pin description Revised block diagram for flow-through functionality Revised ISB1 and IZZ for speeds 7.5 to 8.5ns Added 119-lead BGA package diagram Added Datasheet Document History Added Industrial Temperature range offerings Add 100pin TQFP Package Diagram Outline Add capacitance table for BGA package; Add Industrial temperature to table; insert note to Absolute Max Rating table and Recommended Operating Temperature tables. Add new package offering, 13 x 15mm 165 fBGA Correct 119BGA Package Diagram Outline Add note reference to BG119 pinout Add DNU reference note to BQ165 pinout Update BG119 Package Diagram Outline Dimensions Remove Preliminary status Add reference note to pin N5 on BQ165 pinout, reserved for JTAG TRST CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com The IDT logo is a registered trademark of Integrated Device Technology, Inc. 6.42 23 for Tech Support: [email protected] 800-544-7726, x4033