TI ISO7240MDW Quad digital isolator Datasheet

ISO7240
ISO7241
ISO7242
www.ti.com
SLLS868 – SEPTEMBER 2007
QUAD DIGITAL ISOLATORS
FEATURES
1
•
•
•
•
•
•
1, 25, and 150-Mbps Signaling Rate Options
– Low Channel-to-Channel Output Skew;
1 ns Max
– Low Pulse-Width Distortion (PWD);
2 ns Max
– Low Jitter Content; 1 ns Typ at 150 Mbps
Typical 25-Year Life at Rated Working Voltage
(see application note SLLA197 and Figure 14)
4000-Vpeak Isolation, 560-Vpeak Working Voltage
UL 1577 Certified
4 kV ESD Protection
Operate With 3.3-V or 5-V Supplies
•
•
High Electromagnetic Immunity (see
application report SLLA181)
–40°C to 125°C Operating Range
APPLICATIONS
•
•
•
•
Industrial Fieldbus
Computer Peripheral Interface
Servo Control Interface
Data Acquisition
DESCRIPTION
The ISO7240, ISO7241 and ISO7242 are quad-channel digital isolators with multiple channel configurations with
output enable function. These devices have logic input and output buffers separated by TI’s silicon dioxide (SiO2)
isolation barrier. Used in conjunction with isolated power supplies, these devices block high voltage, isolate
grounds, and prevent noise currents from entering the local ground and interfering with or damaging sensitive
circuitry.
The ISO7240 has all four channels in the same direction while the ISO7241 has three channels the same
direction and one channel in opposition. The ISO7242 has two channels in each direction.
The A and C option devices have TTL input thresholds and a noise-filter at the input that prevents transient
pulses from being passed to the output of the device. The M option devices have CMOS Vcc/2 input thresholds
and do not have the input noise-filter or the additional propagation delay.
A periodic update pulse is sent across the barrier to ensure the proper dc level of the output. If this dc-refresh
pulse is not received, the input is assumed to be unpowered or not being actively driven, and the failsafe circuit
drives the output to a logic high state. (Contact TI for a logic low failsafe option).
These devices may be powered from either 3.3-V or 5-V supplies on either side in any 3.3-V / 3.3-V, 5-V / 5-V,
5-V / 3.3-V, or 3.3-V / 5-V combination. Note that the signal input pins are 5-V tolerant regardless of the voltage
supply level being used.
These devices are characterized for operation over the ambient temperature range of –40°C to 125°C.
ISO7240
VCC1
GND1
INA
INB
INC
IND
NC
GND1
1
2
3
4
5
6
7
8
ISO7241
16
15
14
13
12
11
10
9
VCC2
GND2
OUTA
OUTB
OUTC
OUTD
EN
GND2
VCC1
GND1
INA
INB
INC
OUTD
EN1
GND1
1
2
3
4
5
6
7
8
ISO7242
16
15
14
13
12
11
10
9
VCC2
GND2
OUTA
OUTB
OUTC
IND
EN2
GND2
VCC1
GND1
INA
INB
OUTC
OUTD
EN1
GND1
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
VCC2
GND2
OUTA
OUTB
INC
IND
EN2
GND2
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated
ISO7240
ISO7241
ISO7242
www.ti.com
SLLS868 – SEPTEMBER 2007
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
FUNCTION DIAGRAM
Galvanic Isolation
Barrier
DC Channel
Filter
OSC
+
PWM
Pulse Width
Demodulation
Vref
Carrier Detect
EN
IN
Input
+
Filter
Data MUX
AC Detect
Vref
OUT
Output Buffer
AC Channel
Table 1. Device Function Table ISO724x
VCC1
PU
(1)
2
VCC2
PU
(1)
INPUT
(IN)
OUTPUT ENABLE
(EN)
OUTPUT
(OUT)
H
H or Open
H
L
H or Open
L
X
L
Z
Open
H or Open
H
PD
PU
X
H or Open
H
PD
PU
X
L
Z
PU = Powered Up; PD = Powered Down ; X = Irrelevant; H = High Level; L = Low Level
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ISO7240
ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
AVAILABLE OPTIONS
PRODUCT
SIGNALING
RATE
INPUT
THRESHOLD
ISO7240ADW
1 Mbps
~1.5 V (TTL)
(CMOS compatible)
ISO7240CDW
25 Mbps
~1.5 V (TTL)
(CMOS compatible)
ISO7240MDW
150 Mbps
Vcc/2 (CMOS)
ISO7240M
ISO7241ADW (1)
1 Mbps
~1.5 V (TTL)
(CMOS compatible)
ISO7241A
ISO7241CDW (1)
25 Mbps
~1.5 V (TTL)
(CMOS compatible)
ISO7241MDW (1)
150 Mbps
Vcc/2 (CMOS)
ISO7241M
ISO7242ADW (1)
1 Mbps
~1.5 V (TTL)
(CMOS compatible)
ISO7242A
ISO7242CDW (1)
25 Mbps
~1.5 V (TTL)
(CMOS compatible)
ISO7242MDW (1)
150 Mbps
Vcc/2 (CMOS)
(1)
CHANNEL
CONFIGURATION
MARKED
AS
ISO7240A
4/0
3/1
2/2
ISO7240C
ISO7241C
ISO7242C
ISO7242M
ORDERING
NUMBER
ISO7240ADW (rail)
ISO7240ADWR (reel)
ISO7240CDW (rail)
ISO7240CDWR (reel)
ISO7240MDW (rail)
ISO7240MDWR (reel)
ISO7241ADW (rail)
ISO7241ADWR (reel)
ISO7241CDW (rail)
ISO7241CDWR (reel)
ISO7241MDW (rail)
ISO7241MDWR (reel)
ISO7242ADW (rail)
ISO7242ADWR (reel)
ISO7242CDW (rail)
ISO7242CDWR (reel)
ISO7242MDW (rail)
ISO7242MDWR (reel)
Product Preview
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3
ISO7240
ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
ABSOLUTE MAXIMUM RATINGS (1)
(2)
VCC
Supply voltage
VI
Voltage at IN, OUT, EN
, VCC1, VCC2
IO
Output current
ESD
Electrostatic Field-Induced-Charged Device
discharge
Model
TJ
Maximum junction temperature
Human Body Model
JEDEC Standard 22, Test Method A114-C.01
Machine Model
(1)
(2)
JEDEC Standard 22, Test Method C101
VALUE
UNIT
–0.5 to 6
V
–0.5 to 6
V
±15
mA
±4
All pins
kV
±1
ANSI/ESDS5.2-1996
±200
V
170
°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to network ground terminal and are peak voltage values.
RECOMMENDED OPERATING CONDITIONS
MIN
VCC
Supply voltage, VCC1, VCC2
IOH
High-level output current
IOL
Low-level output current
tui
1/tui
4.5
5.5
3
3.6
Input pulse width
Signaling rate
UNIT
V
mA
–4
mA
ISO724xA
1
μs
ISO724xC
40
ISO724xM
6.67
ISO724xA
0
250
1000
ISO724xC
0
30 (1)
25
ISO724xM
0
200 (1)
150
High-level input voltage (IN)
VIL
Low-level input voltage (IN)
VIH
High-level input voltage (IN) (EN on all devices)
VIL
Low-level input voltage (IN) (EN on all devices)
TJ
Junction temperature
H
External magnetic field-strength immunity per IEC 61000-4-8 & IEC 61000-4-9 certification
4
MAX
4
VIH
(1)
TYP
ISO724xM
ISO724xA, ISO724xC
ns
5
kbps
Mbps
0.7 VCC
VCC
V
0
0.3 VCC
V
2
VCC
V
0
0.8
V
150
°C
1000
A/m
Typical value at room temperature and well-regulated power supply.
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ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
ELECTRICAL CHARACTERISTICS
VCC1 and VCC2 at 5-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
1
3
UNIT
SUPPLY CURRENT
ISO7240A/C/M
ICC1
ICC2
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
VI = VCC or 0 V, All channels, no load,
EN2 at 3 V
1
3
7
10.5
mA
TBD
VI = VCC or 0 V, All channels, no load,
EN1 at 3 V, EN2 at 3 V
TBD
mA
TBD
TBD
VI = VCC or 0 V, All channels, no load,
EN1 at 3 V, EN2 at 3 V
TBD
mA
TBD
VI = VCC or 0 V, All channels, no load,
EN2 at 3 V
15
22
16
22
17
mA
25
TBD
VI = VCC or 0 V, All channels, no load,
EN1 at 3 V, EN2 at 3 V
TBD
mA
TBD
TBD
VI = VCC or 0 V, All channels, no load,
EN1 at 3 V, EN2 at 3 V
TBD
mA
TBD
ELECTRICAL CHARACTERISTICS
IOFF
Sleep mode output current
EN at VCC, Single channel
VCC – 0.4
IOH = –20 μA, See Figure 1
VCC – 0.1
VOH
High-level output voltage
VOL
Low-level output voltage
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 4
μA
0
IOH = –4 mA, See Figure 1
V
IOL = 4 mA, See Figure 1
0.4
IOL = 20 μA, See Figure 1
0.1
150
IN from 0 V to VCC
mV
10
–10
25
Product Folder Link(s): ISO7240 ISO7241 ISO7242
μA
1
pF
50
kV/μs
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V
5
ISO7240
ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
SWITCHING CHARACTERISTICS
VCC1 and VCC2 at 5-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion (1) |tPHL – tPLH|
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion (1) |tPHL – tPLH|
tPLH, tPHL
Propagation delay
(1)
MAX
10
18
See Figure 1
42
ISO724xM
22
tsk(pp)
Part-to-part skew
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
tf
Output signal fall time
tPHZ
Propagation delay, high-level-to-high-impedance output
15
20
tPZH
Propagation delay, high-impedance-to-high-level output
15
20
tPLZ
Propagation delay, low-level-to-high-impedance output
15
20
tPZL
Propagation delay, high-impedance-to-low-level output
15
20
tfs
Failsafe output delay time from input power loss
See Figure 3
Peak-to-peak eye-pattern jitter
150 Mbps NRZ data input, Same
polarity input on all channels, See
Figure 5
(1)
(2)
(3)
6
1
ISO724xA/C
ISO724xM
(3)
2
ns
9
ns
2
ns
0
ISO724xA/C
ISO724xM
0
1
2
See Figure 1
ISO724xM
ns
2.5
10
Pulse-width distortion
(2)
UNIT
80
PWD
tjit(pp)
|tPHL – tPLH|
TYP
40
ISO724xA
ISO724xC
MIN
ns
2
See Figure 2
ns
12
μs
1
ns
Also referred to as pulse skew.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
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ISO7240
ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
ELECTRICAL CHARACTERISTICS
VCC1 at 5-V, VCC2 at 3.3-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
1
3
UNIT
SUPPLY CURRENT
ICC1
ICC2
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
VI = VCC or 0 V, All channels, no load, EN2 at 3 V
1
3
7
10.5
mA
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
VI = VCC or 0 V, All channels, no load, EN2 at 3 V
9.5
15
10
15
10.5
mA
17
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
ELECTRICAL CHARACTERISTICS
IOFF
VOH
Sleep mode output current
High-level output voltage
EN at VCC, Single channel
IOH = –4 mA, See Figure 1
μA
0
ISO7240
VCC – 0.4
ISO724x
(5-V side)
VCC – 0.8
IOH = –20 μA, See Figure 1
V
VCC – 0.1
IOL = 4 mA, See Figure 1
0.4
IOL = 20 μA, See Figure 1
0.1
VOL
Low-level output voltage
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
CMTI
Common-mode transient immunity VI = VCC or 0 V, See Figure 4
150
IN from 0 V to VCC
mV
10
–10
IN at VCC, VI = 0.4 sin (4E6πt)
25
Product Folder Link(s): ISO7240 ISO7241 ISO7242
μA
1
pF
50
kV/μs
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7
ISO7240
ISO7241
ISO7242
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SWITCHING CHARACTERISTICS
VCC1 at 5-V, VCC2 at 3.3-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
40
80
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion (1) |tPHL – tPLH|
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion (1) |tPHL – tPLH|
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion(1) |tPHL – tPLH|
tsk(pp)
Part-to-part skew
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
tf
Output signal fall time
tPHZ
Propagation delay, high-level-to-high-impedance output
15
20
tPZH
Propagation delay, high-impedance-to-high-level output
15
20
tPLZ
Propagation delay, low-level-to-high-impedance output
15
20
tPZL
Propagation delay, high-impedance-to-low-level output
15
20
tfs
Failsafe output delay time from input power loss
See Figure 3
Peak-to-peak eye-pattern jitter
150 Mbps PRBS NRZ data input,
Same polarity input on all
channels, See Figure 5
tjit(pp)
(1)
(2)
(3)
8
ISO724xA
ISO724xC
11
See Figure 1
20
46
12
28
1
ISO724xA/C
ISO724xM
(3)
2
ns
7.5
ns
2.5
ns
0
ISO724xA/C
ISO724xM
0
1
2
See Figure 1
ISO724xM
ns
3
ISO724xM
(2)
UNIT
ns
2
See Figure 2
ns
18
μs
1
ns
Also known as pulse skew
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
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ISO7240
ISO7241
ISO7242
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ELECTRICAL CHARACTERISTICS
VCC1 at 3.3-V, VCC2 at 5-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
0.5
1
1
2
3
5
UNIT
SUPPLY CURRENT
ICC1
ICC2
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
VI = VCC or 0 V, All channels, no load, EN2 at 3 V
mA
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
VI = VCC or 0 V, All channels, no load, EN2 at 3 V
15
22
16
22
17
mA
25
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
TBD
VI = VCC or 0 V, All channels, no load, EN1 at 3 V,
EN2 at 3 V
TBD
mA
TBD
ELECTRICAL CHARACTERISTICS
IOFF
VOH
Sleep mode output current
High-level output voltage
EN at VCC, Single channel
IOH = –4 mA, See Figure 1
μA
0
ISO7240
VCC – 0.4
ISO724x
(5-V side)
VCC – 0.8
IOH = –20 μA, See Figure 1
V
VCC – 0.1
IOL = 4 mA, See Figure 1
0.4
IOL = 20 μA, See Figure 1
0.1
VOL
Low-level output voltage
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient
immunity
VI = VCC or 0 V, See Figure 4
150
IN from 0 V to VCC
mV
10
–10
25
Product Folder Link(s): ISO7240 ISO7241 ISO7242
μA
1
pF
50
kV/μs
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V
9
ISO7240
ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
SWITCHING CHARACTERISTICS
VCC1 at 3.3-V and VCC2 at 5-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion (1) |tPHL – tPLH|
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion (1) |tPHL – tPLH|
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion(1) |tPHL – tPLH|
tsk(pp)
Part-to-part skew
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
tf
Output signal fall time
tPHZ
Propagation delay, high-level-to-high-impedance output
tPZH
Propagation delay, high-impedance-to-high-level output
tPLZ
Propagation delay, low-level-to-high-impedance output
tPZL
Propagation delay, high-impedance-to-low-level output
tfs
Failsafe output delay time from input power loss
See Figure 3
Peak-to-peak eye-pattern jitter
150 Mbps NRZ data input, Same polarity
input on all channels, See Figure 5
tjit(pp)
(1)
(2)
(3)
10
TYP
40
ISO724xA
ISO724xC
MIN
11
22
51
12
26
See Figure 1
ISO724xM
1
2
10
0
ISO724xA/C
2.5
ISO724xM
0
1
2
See Figure 1
ISO724xM
ns
3
ISO724xM
(3)
UNIT
80
ISO724xA/C
(2)
MAX
ns
ns
ns
2
See Figure 2
ns
15
20
15
20
15
20
15
20
ns
12
μs
1
ns
Also known as pulse skew
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
Submit Documentation Feedback
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Product Folder Link(s): ISO7240 ISO7241 ISO7242
ISO7240
ISO7241
ISO7242
www.ti.com
SLLS868 – SEPTEMBER 2007
ELECTRICAL CHARACTERISTICS
VCC1 and VCC2 at 3.3 V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
0.5
1
1
2
3
5
UNIT
SUPPLY CURRENT
ICC1
ICC2
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
TBD
ISO7242A/C/M
Quiescent
TBD
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
ISO7240A/C/M
Quiescent
ISO7240A
1 Mbps
ISO7240C/M
25 Mbps
ISO7241A/C/M
Quiescent
ISO7241A
1 Mbps
ISO7241C/M
25 Mbps
ISO7242A/C/M
Quiescent
ISO7242A
1 Mbps
ISO7242C/M
25 Mbps
VI = VCC or 0 V, all channels, no load,
EN2 at 3 V
mA
TBD
VI = VCC or 0 V, all channels, no load,
EN1 at 3 V, EN2 at 3 V
TBD
VI = VCC or 0 V, all channels, no load,
EN1 at 3 V, EN2 at 3 V
mA
TBD
TBD
VI = VCC or 0 V, all channels, no load,
EN2 at 3 V
9.5
15
10
15
10.5
17
mA
TBD
VI = VCC or 0 V, all channels, no load,
EN1 at 3 V, EN2 at 3 V
TBD
TBD
TBD
VI = VCC or 0 V, all channels, no load,
EN1 at 3 V, EN2 at 3 V
mA
TBD
TBD
ELECTRICAL CHARACTERISTICS
IOFF
Sleep mode output current
EN at VCC, single channel
VCC – 0.4
IOH = –20 μA, See Figure 1
VCC – 0.1
VOH
High-level output voltage
VOL
Low-level output voltage
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 4
μA
0
IOH = –4 mA, See Figure 1
V
IOL = 4 mA, See Figure 1
0.4
IOL = 20 μA, See Figure 1
0.1
150
IN from 0 V or VCC
mV
10
–10
25
Product Folder Link(s): ISO7240 ISO7241 ISO7242
μA
1
pF
50
kV/μs
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V
11
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ISO7242
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SLLS868 – SEPTEMBER 2007
SWITCHING CHARACTERISTICS
VCC1 and VCC2 at 3.3-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
Propagation delay
PWD
Pulse-width distortion |tPHL – tPLH| (1)
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion |tPHL – tPLH| (1)
tPLH, tPHL
Propagation delay
PWD
Pulse-width distortion |tPHL – tPLH| (1)
tsk(pp)
Part-to-part skew (2)
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
tf
Output signal fall time
tPHZ
Propagation delay, high-level-to-high-impedance output
15
20
tPZH
Propagation delay, high-impedance-to-high-level output
15
20
tPLZ
Propagation delay, low-level-to-high-impedance output
15
20
tPZL
Propagation delay, high-impedance-to-low-level output
15
20
tfs
Failsafe output delay time from input power loss
See Figure 3
Peak-to-peak eye-pattern jitter
150 Mbps PRBS NRZ data input, same
polarity input on all channels, See Figure 5
tjit(pp)
(1)
(2)
(3)
12
45
MAX
tPLH, tPHL
ISO724xA
ISO724xC
12
See Figure 1
25
56
12
32
ISO724xM
1
2
9
ISO724xM
0
ISO724xA/C
3
ISO724xM
0
1
ns
ns
ns
2
See Figure 1
ISO724xM
ns
4
ISO724xA/C
(3)
UNIT
85
2
See Figure 2
ns
18
μs
1
ns
Also referred to as pulse skew.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
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SLLS868 – SEPTEMBER 2007
ISOLATION BARRIER
PARAMETER MEASUREMENT INFORMATION
IN
Input
Generator
VI
50 W
NOTE A
VCC1
VI
VCC1/2
VCC1/2
OUT
0V
tPHL
tPLH
CL
NOTE B
VO
VO
VOH
90%
50%
50%
10%
tr
VOL
tf
A.
The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3
ns, tf ≤ 3 ns, ZO = 50Ω.
B.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 1. Switching Characteristic Test Circuit and Voltage Waveforms
Vcc
Vcc
ISOLATION BARRIER
0V
RL = 1 kW ±1%
IN
Input
Generator
VI
OUT
EN
Vcc/2
VI
t PZL
VO
VO
CL
Vcc/2
0V
t PLZ
Vcc
0.5 V
50%
NOTE
B
50 W
VOL
3V
ISOLATION BARRIER
NOTE A
IN
Input
Generator
VI
Vcc
OUT
VO
Vcc/2
VI
Vcc/2
0V
EN
50 W
t PZH
CL
NOTE
B
RL = 1 kW ±1%
VO
VOH
50%
0.5 V
t PHZ
0V
NOTE A
A.
The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3
ns, tf ≤ 3 ns, ZO = 50Ω.
B.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 2. Enable/Disable Propagation Delay Time Test Circuit and Waveform
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ISO7241
ISO7242
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SLLS868 – SEPTEMBER 2007
PARAMETER MEASUREMENT INFORMATION (continued)
VI
0V
or
VCC1
ISOLATION BARRIER
VCC1
IN
VCC1
VI
OUT
2.7 V
VO
0V
VOH
tfs
CL
NOTE B
VO
50%
VOL
A.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
B.
The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3
ns, tf ≤ 3 ns, ZO = 50Ω.
Figure 3. Failsafe Delay Time Test Circuit and Voltage Waveforms
VCC1
VCC2
ISOLATION BARRIER
C = 0.1 mF± 1%
IN
S1
GND1
C = 0.1 mF± 1%
OUT
NOTE B
Pass-fail criteria:
Output must
remain stable
VOH or VOL
GND2
VCM
A.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
B.
The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3
ns, tf ≤ 3 ns, ZO = 50Ω.
Figure 4. Common-Mode Transient Immunity Test Circuit and Voltage Waveform
VCC1
DUT
Tektronix
HFS9009
IN
OUT
0V
Tektronix
784D
PATTERN
GENERATOR
VCC/2
Jitter
NOTE: PRBS bit pattern run length is 216 – 1. Transition time is 800 ps. NRZ data input has no more than five consecutive 1s
or 0s.
Figure 5. Peak-to-Peak Eye-Pattern Jitter Test Circuit and Voltage Waveform
14
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ISO7241
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SLLS868 – SEPTEMBER 2007
DEVICE INFORMATION
PACKAGE CHARACTERISTICS
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
L(I01)
Minimum air gap (Clearance)
Shortest terminal-to-terminal distance through air
7.7
mm
L(I02)
Minimum external tracking (Creepage)
Shortest terminal-to-terminal distance across the
package surface
8.1
mm
0.008
mm
Minimum Internal Gap (Internal
Clearance)
Distance through the insulation
RIO
Isolation resistance
Input to output, VIO = 500 V, all pins on each side of the
barrier tied together creating a two-terminal device
CIO
Barrier capacitance Input to output
CI
Input capacitance to ground
>1012
Ω
VI = 0.4 sin (4E6πt)
1
pF
VI = 0.4 sin (4E6πt)
1
pF
DEVICE I/O SCHEMATICS
Enable
VCC
Output
Input
VCC
VCC
VCC
VCC
VCC
1 MW
500 W
EN
IN
8W
500 W
OUT
13 W
1 MW
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ISO7242
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SLLS868 – SEPTEMBER 2007
REGULATORY INFORMATION
UL
Recognized under 1577 Component Recognition Program (1)
File Number: E181974
(1)
Production tested ≥ 3000 VRMS for 1 second in accordance with UL
1577.
THERMAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Low-K Thermal Resistance
θJA
Junction-to-air
θJB
Junction-to-Board Thermal Resistance
θJC
Junction-to-Case Thermal Resistance
PD
(1)
MIN
TYP MAX
(1)
168
High-K Thermal Resistance
°C/W
96.1
61
°C/W
48
°C/W
VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF,
Input a 50% duty cycle square wave
Device Power Dissipation
UNIT
220
mW
Tested in accordance with the Low-K or High-K thermal metric definitions of EIA/JESD51-3 for leaded surface mount packages.
TYPICAL CHARACTERISTIC CURVES
3.3-V RMS SUPPLY CURRENT
vs
SIGNALING RATE
5-V RMS SUPPLY CURRENT
vs
SIGNALING RATE
45
35
VCC1 = 3.3 V,
VCC2 = 3.3 V,
TA = 25°C,
Load = 15 pF,
All Channels
25
ICC - Supply Current - mA/RMS
ICC - Supply Current - mA/RMS
30
40
ICC2
20
15
10
ICC1
5
35
VCC1 = 5 V,
VCC2 = 5 V,
TA = 25°C,
Load = 15 pF,
All Channels
30
ICC2
25
20
ICC1
15
10
5
0
0
25
50
75
100
Signaling Rate - Mbps
125
150
0
0
25
Figure 6.
16
50
75
100
125
150
Signaling Rate - Mbps
Figure 7.
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SLLS868 – SEPTEMBER 2007
TYPICAL CHARACTERISTIC CURVES (continued)
PROPAGATION DELAY
vs
FREE-AIR TEMPERATURE
INPUT VOLTAGE THRESHOLD
vs
FREE-AIR TEMPERATURE
1.4
45
tPLH
40
3.3 V
tPHL
Input Voltage Threshold - V
Propagation Delay - ns
35
5V
30
tPLH
25
tPHL
20
15
10
Load = 15 pF,
Air Flow at 7 cf/m,
Low-K Board
5
-25
-10
5
80
65
35
20
50
TA - Free-Air Temperature - °C
95
110
125
1.2
Air Flow at 7 cf/m,
Low_K Board
1.15
5 V Vth1.1
3.3 V Vth-25
-10
5
20
35
50
65
80
TA - Free-Air Temperature - °C
95
Figure 8.
Figure 9.
VCC1 FAILSAFE THRESHOLD
vs
FREE-AIR TEMPERATURE
HIGH-LEVEL OUTPUT CURRENT
vs
HIGH-LEVEL OUTPUT VOLTAGE
110
125
50
VCC at 5 V or 3.3 V,
Load = 15 pF,
Air Flow at 7/cf/m,
Low-K Board
VCC = 5 V
Load = 15 pF,
TA = 25°C
40
2.7
IO - Output Current - mA
VCC1 - Failsafe Threshold - V
2.8
3.3 V Vth+
1.25
1
-40
3
2.9
1.3
1.05
0
-40
5 V Vth+
1.35
Vfs+
2.6
2.5
Vfs-
2.4
2.3
2.2
VCC = 3.3 V
30
20
10
2.1
2
-40
-25
-10
5
20
35
50
65
80
95
110
125
0
0
TA - Free-Air Temperature - °C
Figure 10.
2
4
VO - Output Voltage - V
6
Figure 11.
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SLLS868 – SEPTEMBER 2007
TYPICAL CHARACTERISTIC CURVES (continued)
LOW-LEVEL OUTPUT CURRENT
vs
LOW-LEVEL OUTPUT VOLTAGE
50
Load = 15 pF,
TA = 25°C
45
IO - Output Current - mA
40
35
VCC = 3.3 V
30
25
VCC = 5 V
20
15
10
5
0
0
1
2
3
VO - Output Voltage - V
4
5
Figure 12.
18
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SLLS868 – SEPTEMBER 2007
APPLICATION INFORMATION
VCC1
20 mm
Max From
20 mm
Max From
VCC1
VCC2
VCC2
0.1 mF
0.1 mF
1
16
2
15
IN A
3
14
OUTA
IN B
4
13
OUTB
IN C
5
12
OUTC
IN D
6
11
OUTD
7
10
8
9
GND1
NC
GND1
ISO7240x
GND2
EN
GND2
Figure 13. Typical ISO724x Application Circuit
LIFE EXPECTANCY vs. WORKING VOLTAGE
WORKING LIFE -- YEARS
100
VIORM at 560-V
28 Years
10
0
120
250
500
750
880
1000
WORKING VOLTAGE (VIORM) -- V
Figure 14. Time-Dependant Dielectric Breakdown Testing Results
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PACKAGE MATERIALS INFORMATION
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4-Oct-2007
TAPE AND REEL BOX INFORMATION
Device
Package Pins
Site
Reel
Diameter
(mm)
Reel
Width
(mm)
A0 (mm)
B0 (mm)
K0 (mm)
P1
(mm)
W
Pin1
(mm) Quadrant
ISO7240ADWR
DW
16
SITE 35
330
16
10.9
10.78
3.0
12
16
Q1
ISO7240CDWR
DW
16
SITE 35
330
16
10.9
10.78
3.0
12
16
Q1
ISO7240MDWR
DW
16
SITE 35
330
16
10.9
10.78
3.0
12
16
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
4-Oct-2007
Device
Package
Pins
Site
Length (mm)
Width (mm)
Height (mm)
ISO7240ADWR
DW
16
SITE 35
406.0
348.0
63.0
ISO7240CDWR
DW
16
SITE 35
406.0
348.0
63.0
ISO7240MDWR
DW
16
SITE 35
406.0
348.0
63.0
Pack Materials-Page 2
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