ISSI IS61C3216-12TI 32k x 16 high-speed cmos static ram Datasheet

OS-CON DATA SHEET
No.OS02N-DFSVP051
OS-CON 6SVP470M
Frequency (kHz)
Impedance (ohm)
ESR (ohm)
0.12
2.824
0.084
0.5
0.691
0.044
1
0.353
0.037
10
0.046
0.017
100
0.010
0.009
500
0.013
0.009
1000
0.024
0.009
5000
0.103
0.022
10000
0.230
0.024
Frequency characteristics
1000
Impedance (ohm)
ESR (ohm)
ESR, Impedance (ohm)
100
10
1
0.1
0.01
0.001
0.1
1
10
100
1000
10000
Frequency (kHz)
Measureing equipment: HP4194A
Test fixture: HP16047C
Measuring position: root of leads
OS Engineering Department, OS-CON Control Department
Saga SANYO Industries Co., Ltd.
n = 3p.(Ave.)
Room temperature
OS-CON DATA SHEET
SVP series
Test item
Endurance
(After V.P.S test)
Test temperature
105 deg.C
Model
Applied voltage
6.3V
Lot No.
6SVP470M
130106406
Tangent of loss angle (120Hz)
Change in capacitance (120Hz)
Tangent of loss angle
20
Percent delta [%]
10
0
-10
-20
-30
-40
2000
0
Time[h]
ESR (100kHz)
Leakage current (6.3V 60s)
10000
100
90
80
70
60
50
40
30
20
10
0
1000
100
10
1
0.1
0.01
0
2000
Time[h]
Note:
2000
Time[h]
Leakage current(µA)
ESR(mohm)
0
0.15
0.14
0.13
0.12
0.11
0.1
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
0
2000
Time[h]
n =30p.
V.P.S test conditions : 230deg.C×75s×2times
(V.P.S=Vapor Phase Soldering method)
Start on September 10, 2001
Executed by R. Kawachino
End on December 2, 2001
Drawn by S. Yoshino
No.OS02D-DESVP051
OS Engineering Departmaent, OS-CON Control Department, Saga SANYO Industries Co., Ltd.
OS-CON DATA SHEET
SVP series
Test item
Damp heat (Steady state)
(After V.P.S test)
Test temperature
60 deg.C
Model
Test humidity
90% RH
Lot No.
6SVP470M
060202471
Change in capacitance (120Hz)
Tangent of loss angle (120Hz)
Tangent of loss angle
20
Percent delta [%]
10
0
-10
-20
-30
-40
1000
0
Time[h]
ESR (100kHz)
Leakage current (6.3V 60s)
100
90
80
70
60
50
40
30
20
10
0
10000
1000
100
10
1
0.1
0.01
0
1000
Time[h]
Note:
1000
Time[h]
Leakage current(µA)
ESR(mohm)
0
0.15
0.14
0.13
0.12
0.11
0.1
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
0
1000
Time[h]
n =20p.
V.P.S test conditions : 230deg.C×75s×2times
(V.P.S = Vapor Phase Soldering method)
Start on November 7, 2001
Executed by R. Kawachino
End on December 20, 2001
Drawn by M. Kimura
No.OS02D-DHSVP051
OS Engineering Department, OS-CON Control Department, Saga SANYO Industries Co., Ltd.
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