ON NLV74HC589ADG 8-bit serial or parallel-input/serial-output shift register with 3-state output Datasheet

MC74HC589A
8-Bit Serial or
Parallel-Input/Serial-Output
Shift Register with 3-State
Output
High−Performance Silicon−Gate CMOS
The MC74HC589A device consists of an 8−bit storage latch which
feeds parallel data to an 8−bit shift register. Data can also be loaded
serially (see the Function Table). The shift register output, QH, is a
3−state output, allowing this device to be used in bus−oriented
systems.
The HC589A directly interfaces with the SPI serial data port on
CMOS MPUs and MCUs.
Features
•
•
•
•
•
•
•
•
•
Output Drive Capability: 15 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1 mA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC
Standard No. 7 A
Chip Complexity: 526 FETs or 131.5 Equivalent Gates
NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
These Devices are Pb−Free, Halogen Free and are RoHS Compliant
SERIAL
DATA
INPUT
SA
A
B
PARALLEL
DATA
INPUTS
C
D
E
F
G
H
LATCH CLOCK
SHIFT CLOCK
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SOIC−16
D SUFFIX
CASE 751B
TSSOP−16
DT SUFFIX
CASE 948F
PIN ASSIGNMENT
B
1
16
VCC
C
2
15
A
D
3
14
E
4
13
F
5
12
SA
SERIAL SHIFT/
PARALLEL LOAD
LATCH CLOCK
G
6
11
H
7
10
GND
8
9
SHIFT CLOCK
OUTPUT
ENABLE
QH
MARKING DIAGRAMS
16
HC589AG
AWLYWW
14
1
SOIC−16
15
1
16
2
VCC = PIN 16
GND = PIN 8
3
4
5
DATA
LATCH
HC
589A
ALYWG
G
SHIFT
REGISTER
1
6
TSSOP−16
7
9
12
SERIAL
QH
DATA
OUTPUT
11
SERIAL SHIFT/ 13
PARALLEL LOAD
10
OUTPUT ENABLE
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
Figure 1. Logic Diagram
© Semiconductor Components Industries, LLC, 2014
August, 2014 − Rev. 7
A
WL, L
YY, Y
WW, W
G or G
See detailed ordering and shipping information in the package
dimensions section on page 10 of this data sheet.
1
Publication Order Number:
MC74HC589A/D
MC74HC589A
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
(Referenced to GND)
−0.5 to +7.0
V
Vin
DC Input Voltage
(Referenced to GND)
−0.5 ≤ VCC + 0.5
V
Vout
DC Output Voltage
(Referenced to GND)
−0.5 ≤ VCC + 0.5
V
Iin
DC Input Current, per Pin
±20
mA
Iout
DC Output Current, per Pin
±35
mA
ICC
DC Supply Current, VCC and GND Pins
±75
mA
IGND
DC Ground Current per Ground Pin
±75
mA
TSTG
Storage Temperature Range
−65 to +150
_C
260
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
TJ
Junction Temperature Under Bias
+150
_C
qJA
Thermal Resistance
PDIP
SOIC
TSSOP
78
112
148
_C/W
PD
Power Dissipation in Still Air at 85_C
PDIP
SOIC
TSSOP
750
500
450
mW
MSL
Moisture Sensitivity
FR
Flammability Rating
VESD
ILatchup
Level 1
Oxygen Index: 30% − 35%
ESD Withstand Voltage
Latchup Performance
UL 94 V−0 @ 0.125 in
Human Body Model (Note 1)
Machine Model (Note 2)
Charged Device Model (Note 3)
Above VCC and Below GND at 85_C (Note 4)
> 4000
> 200
> 1000
V
±300
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Tested to EIA/JESD22−A114−A.
2. Tested to EIA/JESD22−A115−A.
3. Tested to JESD22−C101−A.
4. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
Min
Max
Unit
DC Supply Voltage
(Referenced to GND)
2.0
6.0
V
DC Input Voltage, Output Voltage
(Referenced to GND)
0
VCC
V
−55
)125
_C
0
0
0
1000
800
500
400
ns
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time
VCC = 2.0 V
VCC = 3.0 V
VCC = 4.5 V
VCC = 6.0 V
(Figure 2)
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
5. Unused inputs may not be left open. All inputs must be tied to a high−logic voltage level or a low−logic input voltage level.
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2
MC74HC589A
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
VCC
V
−55_C to 25_C
≤ 85_C
≤ 125_C
Unit
Vout = 0.1 V or VCC *0.1 V
|Iout| ≤ 20 mA
2.0
3.0
4.5
6.0
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
V
Maximum Low−Level Input
Voltage
Vout = 0.1 V or VCC *0.1 V
|Iout| ≤ 20 mA
2.0
3.0
4.5
6.0
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
V
Minimum High−Level
Output Voltage
Vin = VIH or VIL
|Iout| ≤ 20 mA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
3.0
4.5
6.0
2.48
3.98
5.48
2.34
3.84
5.34
2.20
3.70
5.20
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
3.0
4.5
6.0
0.26
0.26
0.26
0.33
0.33
0.33
0.40
0.40
0.40
Symbol
Parameter
VIH
Minimum High−Level Input
Voltage
VIL
VOH
Test Conditions
|Iout| ≤ 2.4 mA
|Iout| ≤ 6.0 mA
|Iout| ≤ 7.8 mA
Vin = VIH or VIL
VOL
Guaranteed Limit
Maximum Low−Level
Output Voltage
Vin = VIH
|Iout| ≤ 20 mA
|Iout| ≤ 2.4 mA
|Iout| ≤ 6.0 mA
|Iout| ≤ 7.8 mA
Vin = VIH or VIL
V
Iin
Maximum Input Leakage
Current
Vin = VCC or GND
6.0
±0.1
±1.0
±1.0
mA
IOZ
Maximum Three−State
Leakage Current
Output in High−Impedance State
Vin = VIL or VIH
Vout = VCC or GND
6.0
±0.5
±5.0
±10
mA
ICC
Maximum Quiescent
Supply Current
(per Package)
Vin = VCC or GND
Iout = 0 mA
6.0
4
40
160
mA
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MC74HC589A
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6 ns)
VCC
Symbol
Parameter
Guaranteed Limit
V
−55_C to 25_C
≤ 85_C
≤ 125_C
Unit
fmax
Maximum Clock Frequency (50% Duty Cycle)
(Figures 3 and9)
2.0
3.0
4.5
6.0
6.0
15
30
35
4.8
10
24
28
4.0
8.0
20
24
MHz
tPLH,
tPHL
Maximum Propagation Delay, Latch Clock to QH
(Figures 2 and 9)
2.0
3.0
4.5
6.0
175
100
40
30
225
110
50
40
275
125
60
50
ns
tPLH,
tPHL
Maximum Propagation Delay, Shift Clock to QH
(Figures 3 and 9)
2.0
3.0
4.5
6.0
160
90
30
25
200
130
40
30
240
160
48
40
ns
tPLH,
tPHL
Maximum Propagation Delay, Serial Shift/Parallel Load to QH
(Figures 5 and 9)
2.0
3.0
4.5
6.0
160
90
30
25
200
130
40
30
240
160
48
40
ns
tPLZ,
tPHZ
Maximum Propagation Delay, Output Enable to QH
(Figures 4 and 10)
2.0
3.0
4.5
6.0
150
80
27
23
170
100
30
25
200
130
40
30
ns
tPZL,
tPZH
Maximum Propagation Delay, Output Enable to QH
(Figures 4 and 10)
2.0
3.0
4.5
6.0
150
80
27
23
170
100
30
25
200
130
40
30
ns
tTLH,
tTHL
Maximum Output Transition Time, Any Output
(Figures 2 and 9)
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
31
18
15
ns
Cin
Maximum Input Capacitance
−
10
10
10
pF
Cout
Maximum Three−State Output Capacitance
(Output in High−Impedance State)
−
15
15
15
pF
Typical @ 25_C, VCC = 5.0 V
CPD
Power Dissipation Capacitance (per Package)*
50
*Used to determine the no−load dynamic power consumption: PD = CPD VCC
2f
+ ICC VCC .
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4
pF
MC74HC589A
TIMING REQUIREMENTS (Input tr = tf = 6 ns)
VCC
Symbol
Parameter
Guaranteed Limit
V
−55_C to 25_C
≤ 85_C
≤ 125_C
Unit
tsu
Minimum Setup Time, A−H to Latch Clock
(Figure 6)
2.0
3.0
4.5
6.0
100
40
20
17
125
50
25
21
150
60
30
26
ns
tsu
Minimum Setup Time, Serial Data Input SA to Shift Clock
(Figure 7)
2.0
3.0
4.5
6.0
100
40
20
17
125
50
25
21
150
60
30
26
ns
tsu
Minimum Setup Time, Serial Shift/Parallel Load to Shift Clock
(Figure 8)
2.0
3.0
4.5
6.0
100
40
20
17
125
50
25
21
150
60
30
26
ns
th
Minimum Hold Time, Latch Clock to A−H
(Figure 6)
2.0
3.0
4.5
6.0
25
10
5
5
30
12
6
6
40
15
8
7
ns
th
Minimum Hold Time, Shift Clock to Serial Data Input SA
(Figure 7)
2.0
3.0
4.5
6.0
5
5
5
5
5
5
5
5
5
5
5
5
ns
tw
Minimum Pulse Width, Shift Clock
(Figure 3)
2.0
3.0
4.5
6.0
75
40
15
13
95
50
19
16
110
60
23
19
ns
tw
Minimum Pulse Width, Latch Clock
(Figure 2)
2.0
3.0
4.5
6.0
80
40
16
14
100
50
20
17
120
60
24
20
ns
tw
Minimum Pulse Width, Serial Shift/Parallel Load
(Figure 5)
2.0
3.0
4.5
6.0
80
40
16
14
100
50
20
17
120
60
24
20
ns
Maximum Input Rise and Fall Times
(Figure 2)
2.0
3.0
4.5
6.0
1000
800
500
400
1000
800
500
400
1000
800
500
400
ns
tr, tf
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5
MC74HC589A
FUNCTION TABLE
Inputs
Resulting Function
Output
Enable
Serial Shift/
Parallel Load
Latch
Clock
Shift
Clock
Serial
Input
SA
Parallel
Inputs
A−H
Data
Latch
Contents
Shift
Register
Contents
Output
QH
Force Output into High
Impedance State
H
X
X
X
X
X
X
X
Z
Load Parallel Data into Data
Latch
L
H
L, H,
X
a−h
a−h
U
U
Transfer Latch Contents to
Shift Register
L
L
L, H,
X
X
X
U
LRN → SRN
LRH
Contents of Input Latch and
Shift Register are Unchanged
L
H
L, H,
L, H,
X
X
U
U
U
Load Parallel Data into Data
Latch and Shift Register
L
L
X
X
a−h
a−h
a−h
h
Shift Serial Data into Shift
Register
L
H
D
X
*
SRA = D,
SRN → SRN+1
SRG → SRH
Load Parallel Data in Data
Latch and Shift Serial Data
into Shift Register
L
H
D
a−h
a−h
SRA = D,
SRN → SRN+1
SRG → SRH
Operation
LR
SR
a−h
D
=
=
=
=
X
latch register contents
shift register contents
data at parallel data inputs A−H
data (L, H) at serial data input SA
U = remains unchanged
X = don’t care
Z = high impedance
* = depends on Latch Clock input
SWITCHING WAVEFORMS
tr
LATCH
CLOCK
tf
1/fmax
VCC
90%
50%
10%
tw
tw
GND
tPLH
SHIFT
CLOCK
tPLH
QH
tTLH
Figure 3. (Serial Shift/Parallel Load = H)
VCC
tw
GND
tPLZ
tPHZ
50%
SERIAL SHIFT/
PARALLEL LOAD
HIGH
IMPEDANCE
50%
tPZH
QH
50%
50%
tPZL
QH
tPHL
tTHL
Figure 2. (Serial Shift/Parallel Load = L)
OUTPUT
ENABLE
GND
tPHL
90%
50%
10%
QH
VCC
50%
10%
VOL
90%
VOH
VCC
50%
50%
GND
tPLH
QH
tPHL
50%
HIGH
IMPEDANCE
Figure 4.
Figure 5.
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MC74HC589A
SWITCHING WAVEFORMS
DATA
VALID
A−H
DATA
VALID
VCC
SA
50%
GND
tsu
LATCH
CLOCK
VCC
50%
GND
th
tsu
SHIFT
CLOCK
50%
th
50%
Figure 6.
Figure 7.
VCC
SERIAL SHIFT/
PARALLEL
LOAD
50%
GND
tsu
SHIFT
CLOCK
50%
Figure 8.
TEST POINT
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
1 kW
OUTPUT
DEVICE
UNDER
TEST
CL *
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance.
*Includes all probe and jig capacitance.
Figure 10. Test Circuit
Figure 9. Test Circuit
PIN DESCRIPTIONS
Data Inputs
data in stage H is shifted out QH, being replaced by the data
previously stored in stage G.
A, B, C, D, E, F, G, H (Pins 15, 1, 2, 3, 4, 5, 6, 7)
Latch Clock (Pin 12)
Parallel data inputs. Data on these inputs are stored in the
data latch on the rising edge of the Latch Clock input.
Data latch clock. A low−to−high transition on this input
loads the parallel data on inputs A−H into the data latch.
SA (Pin 14)
Output Enable (Pin 10)
Serial data input. Data on this input is shifted into the shift
register on the rising edge of the Shift Clock input if Serial
Shift/Parallel Load is high. Data on this input is ignored
when Serial Shift/Parallel Load is low.
Active−low output enable A high level applied to this pin
forces the QH output into the high impedance state. A low
level enables the output. This control does not affect the state
of the input latch or the shift register.
Control Inputs
Serial Shift/Parallel Load (Pin 13)
Output
Shift register mode control. When a high level is applied
to this pin, the shift register is allowed to serially shift data.
When a low level is applied to this pin, the shift register
accepts parallel data from the data latch.
QH (Pin 9)
Serial data output. This pin is the output from the last stage
of the shift register. This is a 3−state output.
Shift Clock (Pin 11)
Serial shift clock. A low−to−high transition on this input
shifts data on the serial data input into the shift register and
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MC74HC589A
SHIFT CLOCK
SERIAL DATA
INPUT, SA
OUTPUT
ENABLE
SERIAL SHIFT/
PARALLEL LOAD
LATCH CLOCK
PARALLEL
DATA
INPUTS
A
L
H
L
L
B
L
L
L
L
C
L
H
L
L
D
L
L
L
L
E
L
H
L
H
F
L
H
L
H
G
L
L
L
L
H
L
H
H
H
QH
ÉÉÉÉ
ÉÉÉÉ
HIGH IMPEDANCE
H
SERIAL SHIFT
LOAD
RESET
LATCH
LATCH
AND
SHIFT REGISTER
L
H
H
L
H
L
H
LOAD
LATCH
Figure 11. Timing Diagram
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8
H
L
L
L
H
SERIAL SHIFT
SERIAL SHIFT
PARALLEL
LOAD
SHIFT REGISTER
L
PARALLEL
LOAD
SHIFT REGISTER
PARALLEL LOAD,
LATCH, AND
SHIFT REGISTER
L
H H
SERIAL
SHIFT
MC74HC589A
OUTPUT 10
ENABLE
14
SA
SHIFT
11
CLOCK
SERIAL SHIFT/ 13
PARALLEL
LOAD
12
LATCH
CLOCK
15
A
STAGE A
D
Q
C
S
D
C Q
R
STAGE B
B
PARALLEL
DATA
INPUTS
C
D
E
F
G
1
D
Q
C
2
S
D
C Q
R
STAGE C*
3
STAGE D*
4
STAGE E*
5
STAGE F*
6
STAGE G*
STAGE H
H
7
D
Q
C
VCC
S
D
C Q
R
*Stages C thru G (not shown in detail) are identical to stages A and B above.
Figure 12. Logic Detail
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9
9
QH
MC74HC589A
ORDERING INFORMATION
Package
Shipping†
MC74HC589ADG
SOIC−16
(Pb−Free)
48 Units / Rail
NLV74HC589ADG*
SOIC−16
(Pb−Free)
48 Units / Rail
MC74HC589ADR2G
SOIC−16
(Pb−Free)
2500 Tape & Reel
NLV74HC589ADR2G*
SOIC−16
(Pb−Free)
2500 Tape & Reel
MC74HC589ADTR2G
TSSOP−16
(Pb−Free)
2500 Tape & Reel
NLV74HC589ADTR2G*
TSSOP−16
(Pb−Free)
2500 Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable.
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MC74HC589A
PACKAGE DIMENSIONS
TSSOP−16
CASE 948F
ISSUE B
16X K REF
0.10 (0.004)
0.15 (0.006) T U
M
T U
S
V
S
S
K
ÉÉÉ
ÇÇÇ
ÇÇÇ
ÉÉÉ
K1
2X
L/2
16
9
J1
B
−U−
L
SECTION N−N
J
PIN 1
IDENT.
N
0.25 (0.010)
8
1
M
0.15 (0.006) T U
S
A
−V−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH. PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION SHALL
NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
N
F
DETAIL E
−W−
C
0.10 (0.004)
−T− SEATING
PLANE
H
D
DETAIL E
G
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
SOLDERING FOOTPRINT*
7.06
1
0.65
PITCH
16X
0.36
16X
1.26
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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11
MILLIMETERS
MIN
MAX
4.90
5.10
4.30
4.50
−−−
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.18
0.28
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.193 0.200
0.169 0.177
−−− 0.047
0.002 0.006
0.020 0.030
0.026 BSC
0.007
0.011
0.004 0.008
0.004 0.006
0.007 0.012
0.007 0.010
0.252 BSC
0_
8_
MC74HC589A
PACKAGE DIMENSIONS
SOIC−16
CASE 751B−05
ISSUE K
−A−
16
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR PROTRUSION
SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL CONDITION.
9
−B−
1
P
8 PL
0.25 (0.010)
8
B
M
S
DIM
A
B
C
D
F
G
J
K
M
P
R
G
R
K
F
X 45 _
C
−T−
SEATING
PLANE
J
M
D
MILLIMETERS
MIN
MAX
9.80
10.00
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0_
7_
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.386
0.393
0.150
0.157
0.054
0.068
0.014
0.019
0.016
0.049
0.050 BSC
0.008
0.009
0.004
0.009
0_
7_
0.229
0.244
0.010
0.019
16 PL
0.25 (0.010)
M
T B
S
A
S
SOLDERING FOOTPRINT*
8X
6.40
16X
1
1.12
16
16X
0.58
1.27
PITCH
8
9
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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MC74HC589A/D