PD - 94027A HEXFET® POWER MOSFET THRU-HOLE (TO-257AA) IRF5Y9540CM 100V, P-CHANNEL Product Summary Part Number BVDSS IRF5Y9540CM -100V RDS(on) 0.117Ω ID -18A Fifth Generation HEXFET® power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. These devices are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits. TO-257AA Features: n n n n n n n Low RDS(on) Avalanche Energy Ratings Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Light Weight Absolute Maximum Ratings Parameter ID @ VGS = -10V, TC = 25°C ID @ VGS = -10V, TC = 100°C IDM PD @ TC = 25°C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current ➀ Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy ➁ Avalanche Current ➀ Repetitive Avalanche Energy ➀ Peak Diode Recovery dv/dt ➂ Operating Junction Storage Temperature Range Lead Temperature Weight Units -18 -11 -72 75 0.6 ±20 256 -11 7.5 4.4 -55 to 150 A W W/°C V mJ A mJ V/ns o 300 (0.063in./1.6mm from case for 10sec) 4.3 (Typical) C g For footnotes refer to the last page www.irf.com 1 11/17/00 IRF5Y9540CM Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified) Min Typ Max Units — — V -0.11 — V/°C — 0.117 Ω — — — — -4.0 — -25 -250 V S( ) Test Conditions VGS = 0V, ID = -250µA Reference to 25°C, ID = -1.0mA VGS = 10V, ID = -11A ➃ VDS = VGS, ID = -250µA VDS = -50V, IDS = -11A ➃ VDS = -100V ,VGS=0V VDS = -80V, VGS = 0V, TJ =125°C VGS = -20V VGS = 20V VGS =-10V, ID = -11A VDS = -80V Ω Parameter BVDSS Drain-to-Source Breakdown Voltage -100 ∆BV DSS/∆T J Temperature Coefficient of Breakdown — Voltage RDS(on) Static Drain-to-Source On-State — Resistance VGS(th) Gate Threshold Voltage -2.0 gfs Forward Transconductance 5.3 IDSS Zero Gate Voltage Drain Current — — µA IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (‘Miller’) Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance — — — — — — — — — — — — — — — — — — — 6.8 -100 100 109 19 53 29 135 87 84 — Ciss C oss C rss Input Capacitance Output Capacitance Reverse Transfer Capacitance — — — 1390 428 246 — — — nA nC VDD = -50V, ID = -11A, RG = 7.5Ω ns Measured from drain lead (6mm/ 0.25in. from package) to source lead (6mm/0.25in. from package) nH pF VGS = 0V, VDS = -25V f = 1.0MHz Source-Drain Diode Ratings and Characteristics Parameter Min Typ Max Units IS ISM VSD t rr Q RR Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) ➀ Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge ton Forward Turn-On Time — — — — — — — — — — -18 -72 -1.6 220 1200 Test Conditions A V ns nC Tj = 25°C, IS = -11A, VGS = 0V ➃ Tj = 25°C, IF = -11A, di/dt ≥ 100A/µs VDD ≤ -50V ➃ Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. Thermal Resistance Parameter RthJC Junction-to-Case Min Typ Max Units — — 1.67 Test Conditions °C/W Note: Corresponding Spice and Saber models are available on the G&S Website. For footnotes refer to the last page 2 www.irf.com IRF5Y9540CM 100 100 VGS -15V -10V -8.0V -7.0V -6.0V -5.5V -5.0V BOTTOM -4.5V -4.5V 20µs PULSE WIDTH T = 25 C 1 10 -4.5V 1 20µs PULSE WIDTH T = 150 C ° J 0.1 0.1 10 ° J 0.1 0.1 100 1 10 100 -VDS , Drain-to-Source Voltage (V) -VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 100 -I D , Drain-to-Source Current (A) -I D , Drain-to-Source Current (A) 1 2.5 TJ = 25 ° C TJ = 150 ° C 10 1 15 V DS = -25V 20µs PULSE WIDTH 0.1 4 6 8 10 12 14 -VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com R DS(on) , Drain-to-Source On Resistance (Normalized) -I D , Drain-to-Source Current (A) 10 VGS -15V -10V -8.0V -7.0V -6.0V -5.5V -5.0V BOTTOM -4.5V TOP TOP ID = -18A 2.0 1.5 1.0 0.5 0.0 -60 -40 -20 VGS = -10V 0 20 40 60 80 100 120 140 160 TJ , Junction Temperature( °C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRF5Y9540CM VGS = Ciss = Crss = Coss = C, Capacitance (pF) 2000 0V, f = 1MHz Cgs + Cgd , Cds SHORTED Cgd Cds + Cgd 1500 Ciss 1000 Coss Crss 500 20 -VGS , Gate-to-Source Voltage (V) 2500 10 VDS =-80V VDS =-50V VDS =-20V 12 8 4 FOR TEST CIRCUIT SEE FIGURE 13 0 100 0 20 -VDS , Drain-to-Source Voltage (V) 60 80 100 120 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 1000 -I D , Drain-to-Source Current (A) -ISD , Reverse Drain Current (A) 40 QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage TJ = 150 ° C 10 OPERATION IN THIS AREA LIMITED BY R DS(on) 100 TJ = 25 ° C 1 0.1 0.2 V GS = 0 V 0.8 1.4 2.0 -VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 16 0 1 ID = -11A 2.6 10 1ms Tc = 25°C Tj = 150°C Single Pulse 10ms 1 1 10 100 1000 -VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF5Y9540CM 20 RD V DS VGS -ID , Drain Current (A) 16 D.U.T. RG + 12 V DD -10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 8 Fig 10a. Switching Time Test Circuit 4 td(on) tr t d(off) tf VGS 0 10% 25 50 75 100 125 150 TC , Case Temperature ( °C) 90% Fig 9. Maximum Drain Current Vs. Case Temperature VDS Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 1 D = 0.50 0.20 0.10 0.1 PDM 0.05 0.02 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.01 0.00001 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRF5Y9540CM D .U .T RG VD D IA S -20V -10V tp A D R IV E R 0.0 1Ω 15V Fig 12a. Unclamped Inductive Test Circuit EAS , Single Pulse Avalanche Energy (mJ) 600 L VDS ID -5.0A -7.0A BOTTOM -11A TOP 500 400 300 200 100 0 25 IAS 50 75 100 125 150 Starting TJ , Junction Temperature( ° C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current tp V (BR)DSS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG -12V 12V .2µF .3µF -10V QGS QGD D.U.T. +VDS VGS VG -3mA Charge Fig 13a. Basic Gate Charge Waveform 6 IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRF5Y9540CM Footnotes: Repetitive Rating; Pulse width limited by ISD ≤ -11A, di/dt ≤ -350 A/µs, maximum junction temperature. VDD = -25 V, Starting TJ = 25°C, L= 4.2mH Peak IAS = -11A, RG= 25Ω Pulse width ≤ 400 µs; Duty Cycle ≤ 2% VDD ≤ -100V, TJ ≤ 150°C Case Outline and Dimensions — TO-257AA IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111 IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936 Data and specifications subject to change without notice. 11/00 www.irf.com 7