32-Channel, 16-/14-Bit, Serial Input, Voltage Output DAC AD5372/AD5373 FEATURES 2.5 V to 5.5 V JEDEC-compliant digital levels Digital reset (RESET) Clear function to user-defined SIGGNDx Simultaneous update of DAC outputs 32-channel DAC in a 64-lead LQFP and 64-lead LFCSP AD5372/AD53731 guaranteed monotonic to 16/14 bits Maximum output voltage span of 4 × VREF (20 V) Nominal output voltage range of −4 V to +8 V Multiple, independent output voltage spans available System calibration function allowing user-programmable offset and gain Channel grouping and addressing features Thermal shutdown function DSP/microcontroller-compatible serial interface SPI serial interface APPLICATIONS Level setting in automatic test equipment (ATE) Variable optical attenuators (VOA) Optical switches Industrial control systems Instrumentation FUNCTIONAL BLOCK DIAGRAM VSS LDAC AGND DGND n = 16 FOR AD5372 n = 14 FOR AD5373 n 8 A/B SELECT REGISTER n 8 14 TO MUX 2s n X1 REGISTER n n M REGISTER C REGISTER OFS0 REGISTER n OFFSET DAC 0 BUFFER GROUP 0 VREF0 BUFFER n n X2A REGISTER X2B REGISTER MUX 2 CONTROL REGISTER VDD A/B MUX DVCC n DAC 0 REGISTER n OUTPUT BUFFER AND POWERDOWN CONTROL DAC 0 VOUT0 VOUT1 VOUT2 n VOUT3 VOUT4 VOUT5 SDI n n SCLK n n X1 REGISTER M REGISTER C REGISTER n X2A REGISTER X2B REGISTER MUX 2 SYNC n A/B MUX VOUT6 SERIAL INTERFACE n DAC 7 REGISTER n OUTPUT BUFFER AND POWERDOWN CONTROL DAC 7 14 BUSY n 8 n TO MUX 2s X1 REGISTER STATE MACHINE n n M REGISTER C REGISTER OFS1 REGISTER n OFFSET DAC 1 BUFFER GROUP 1 VREF1 BUFFER n n X2A REGISTER X2B REGISTER MUX 2 CLR A/B SELECT REGISTER A/B MUX 8 SIGGND0 n SDO RESET VOUT7 n DAC 0 REGISTER n OUTPUT BUFFER AND POWERDOWN CONTROL DAC 0 VOUT8 VOUT9 VOUT10 n VOUT11 VOUT12 VOUT13 n M REGISTER C REGISTER n X2A REGISTER X2B REGISTER n DAC 7 REGISTER n OUTPUT BUFFER AND POWERDOWN CONTROL DAC 7 VOUT15 SIGGND1 n AD5372/ AD5373 GROUP 2 TO GROUP 3 ARE IDENTICAL TO GROUP 1 VREF1 SUPPLIES GROUP 1 TO GROUP 3 SIGGND2 SIGGND3 VOUT16 TO VOUT31 05815-001 n n MUX 2 n X1 REGISTER A/B MUX VOUT14 n Figure 1. 1 Protected by U.S. Patent No. 5,969,657. Rev. C Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2007–2011 Analog Devices, Inc. All rights reserved. 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AD5372/AD5373 TABLE OF CONTENTS Features .............................................................................................. 1 Reference Selection .................................................................... 17 Applications....................................................................................... 1 Calibration................................................................................... 18 Functional Block Diagram .............................................................. 1 Additional Calibration............................................................... 19 Revision History ............................................................................... 2 Reset Function ............................................................................ 19 General Description ......................................................................... 3 Clear Function ............................................................................ 19 Specifications..................................................................................... 4 BUSY and LDAC Functions...................................................... 19 AC Characteristics........................................................................ 5 Power-Down Mode.................................................................... 20 Timing Characteristics ................................................................ 6 Thermal Shutdown Function ................................................... 20 Absolute Maximum Ratings............................................................ 9 Toggle Mode................................................................................ 20 ESD Caution.................................................................................. 9 Serial Interface ................................................................................ 21 Pin Configurations and Function Descriptions ......................... 10 SPI Write Mode .......................................................................... 21 Typical Performance Characteristics ........................................... 12 SPI Readback Mode ................................................................... 21 Terminology .................................................................................... 14 Register Update Rates ................................................................ 21 Theory of Operation ...................................................................... 15 Channel Addressing and Special Modes ................................. 22 DAC Architecture....................................................................... 15 Special Function Mode.............................................................. 23 Channel Groups.......................................................................... 15 Applications Information .............................................................. 24 A/B Registers and Gain/Offset Adjustment............................ 16 Power Supply Decoupling ......................................................... 24 Load DAC.................................................................................... 16 Power Supply Sequencing ......................................................... 24 Offset DACs ................................................................................ 16 Interfacing Examples ................................................................. 24 Output Amplifier........................................................................ 17 Outline Dimensions ....................................................................... 25 Transfer Function ....................................................................... 17 Ordering Guide .......................................................................... 26 REVISION HISTORY 7/11—Rev. B to Rev. C Added 64-Lead LFCSP Package........................................Universal Change to Features Section ............................................................. 1 Change to General Description Section ........................................ 3 Changes to Table 5............................................................................ 9 Added Figure 7; Renumbered Sequentially ................................ 10 Changes to Table 6.......................................................................... 10 Updated Outline Dimensions ....................................................... 24 Changes to Ordering Guide .......................................................... 25 2/08—Rev. A to Rev. B Added Table 1.................................................................................... 3 Changes to t10 Parameter ................................................................. 6 Added t23 Parameter ......................................................................... 6 Changes to Figure 4.......................................................................... 7 Changes to Absolute Maximum Ratings Section..........................9 Changes to Pin Configuration and Function Descriptions Section.............................................................................................. 10 Changes to Reset Function Section.............................................. 18 12/07—Rev. 0 to Rev. A Changes to Table 3.............................................................................6 Changes to AD5373 Transfer Function Section......................... 16 Changes to Calibration Section .................................................... 17 Changes to Table 8.......................................................................... 18 Changes to Register Update Rates Section.................................. 20 Changes to Ordering Guide .......................................................... 25 8/07—Revision 0: Initial Version Rev. C | Page 2 of 28 AD5372/AD5373 GENERAL DESCRIPTION The AD5372/AD5373 contain 32 16-/14-bit DACs in 64-lead LQFP and LFCSP packages. The devices provide buffered voltage outputs with a nominal span of 4× the reference voltage. The gain and offset of each DAC can be independently trimmed to remove errors. For even greater flexibility, the device is divided into four groups of eight DACs. Two offset DACs allow the output range of the groups to be altered. Group 0 can be adjusted by Offset DAC 0, and Group 1 to Group 3 can be adjusted by Offset DAC 1. The AD5372/AD5373 offer guaranteed operation over a wide supply range: VSS from −16.5 V to −4.5 V and VDD from 9 V to 16.5 V. The output amplifier headroom requirement is 1.4 V operating with a load current of 1 mA. The AD5372/AD5373 have a high speed serial interface that is compatible with SPI, QSPI™, MICROWIRE™, and DSP interface standards and can handle clock speeds of up to 50 MHz. The DAC registers are updated on reception of new data. All the outputs can be updated simultaneously by taking the LDAC input low. Each channel has a programmable gain and an offset adjust register. Each DAC output is gained and buffered on chip with respect to an external SIGGNDx input. The DAC outputs can also be switched to SIGGNDx via the CLR pin. Table 1. High Channel Count Bipolar DACs Model AD5360 AD5361 AD5362 AD5363 AD5370 AD5371 AD5372 AD5373 AD5378 AD5379 Resolution (Bits) 16 14 16 14 16 14 16 14 14 14 Nominal Output Span 4 × VREF (20 V) 4 × VREF (20 V) 4 × VREF (20 V) 4 × VREF (20 V) 4 × VREF (12 V) 4 × VREF (12 V) 4 × VREF (12 V) 4 × VREF (12 V) ±8.75 V ±8.75 V Output Channels 16 16 8 8 40 40 32 32 32 40 Rev. C | Page 3 of 28 Linearity Error (LSB) ±4 ±1 ±4 ±1 ±4 ±1 ±4 ±1 ±3 ±3 AD5372/AD5373 SPECIFICATIONS DVCC = 2.5 V to 5.5 V; VDD = 9 V to 16.5 V; VSS = −16.5 V to −8 V; VREF0 = VREF1 = 3 V; AGND = DGND = SIGGNDx = 0 V; CL = open circuit; RL = open circuit; gain (M), offset (C), and DAC offset registers at default values; all specifications TMIN to TMAX, unless otherwise noted. Table 2. Parameter ACCURACY Resolution Integral Nonlinearity (INL) Differential Nonlinearity (DNL) Zero-Scale Error Full-Scale Error Gain Error Zero-Scale Error2 Full-Scale Error2 Span Error of Offset DAC VOUTx Temperature Coefficient DC Crosstalk2 REFERENCE INPUTS (VREF0, VREF1)2 VREFx Input Current VREFx Range SIGGND INPUTS (SIGGND0 TO SIGGND3)2 DC Input Impedance Input Range SIGGNDx Gain OUTPUT CHARACTERISTICS2 Output Voltage Range Nominal Output Voltage Range Short-Circuit Current Load Current Capacitive Load DC Output Impedance DIGITAL INPUTS Input High Voltage Input Low Voltage Input Current CLR High Impedance Leakage Current Input Capacitance2 DIGITAL OUTPUTS (SDO, BUSY) Output Low Voltage Output High Voltage (SDO) SDO High Impedance Leakage Current High Impedance Output Capacitance2 AD5372 1 B Version AD53731 B Version Unit 16 ±4 ±1 14 ±1 ±1 Bits LSB max LSB max ±10 ±10 0.1 1 1 ±35 5 100 ±10 ±10 0.1 1 1 ±35 5 100 mV max mV max % FSR LSB typ LSB typ mV max ppm FSR/°C typ μV max ±10 2/5 ±10 2/5 μA max V min/V max Per input; typically ±30 nA ±2% for specified operation 50 ±0.5 0.995/1.005 50 ±0.5 0.995/1.005 kΩ min V min/V max min/max Typically 55 kΩ VSS + 1.4 VDD − 1.4 −4 to +8 15 ±1 2200 0.5 VSS + 1.4 VDD − 1.4 −4 to +8 15 ±1 2200 0.5 V min V max V min/V max mA max mA max pF max Ω max ILOAD = 1 mA ILOAD = 1 mA 1.7 2.0 0.8 ±1 ±20 10 1.7 2.0 0.8 ±1 ±20 10 V min V min V max μA max μA max pF max 0.5 DVCC − 0.5 ±5 10 0.5 DVCC − 0.5 ±5 10 V max V min μA max pF typ Rev. C | Page 4 of 28 Test Conditions/Comments 2 Guaranteed monotonic by design over temperature Before calibration Before calibration Before calibration After calibration After calibration See the Offset DACS section for details Includes linearity, offset, and gain drift Typically 20 μV; measured channel at midscale, full-scale change on any other channel VOUTx to DVCC, VDD, or VSS JEDEC compliant DVCC = 2.5 V to 3.6 V DVCC = 3.6 V to 5.5 V DVCC = 2.5 V to 5.5 V Excluding CLR pin Sinking 200 μA Sourcing 200 μA AD5372/AD5373 Parameter POWER REQUIREMENTS DVCC VDD VSS Power Supply Sensitivity2 ∆Full Scale/∆VDD ∆Full Scale/∆VSS ∆Full Scale/∆DVCC DICC IDD ISS Power-Down Mode DICC IDD ISS Power Dissipation (Unloaded) Junction Temperature 3 AD5372 1 B Version AD53731 B Version Unit 2.5/5.5 9/16.5 −16.5/−4.5 2.5/5.5 9/16.5 −16.5/−4.5 V min/V max V min/V max V min/V max −75 −75 −90 2 16 18 −16 −18 −75 −75 −90 2 16 18 −16 −18 dB typ dB typ dB typ mA max mA max mA max mA max mA max 5 35 −35 250 130 5 35 −35 250 130 μA typ μA typ μA typ mW typ °C max Test Conditions/Comments 2 DVCC = 5.5 V, VIH = DVCC, VIL = GND Outputs unloaded, DAC outputs = 0 V Outputs unloaded, DAC outputs = full scale Outputs unloaded, DAC outputs = 0 V Outputs unloaded, DAC outputs = full scale Bit 0 in the control register is 1 VSS = −8 V, VDD = 9.5 V, DVCC = 2.5 V TJ = TA + PTOTAL × θJA 1 Temperature range for B version: −40°C to +85°C. Typical specifications are at 25°C. Guaranteed by design and characterization; not production tested. 3 θJA represents the package thermal impedance. 2 AC CHARACTERISTICS DVCC = 2.5 V; VDD = 15 V; VSS = −15 V; VREF0 = VREF1 = 3 V; AGND = DGND = SIGGNDx = 0 V; CL = 200 pF; RL = 10 kΩ; gain (M), offset (C), and DAC offset registers at default values; all specifications TMIN to TMAX, unless otherwise noted. Table 3. Parameter DYNAMIC PERFORMANCE 1 Output Voltage Settling Time Slew Rate Digital-to-Analog Glitch Energy Glitch Impulse Peak Amplitude Channel-to-Channel Isolation DAC-to-DAC Crosstalk Digital Crosstalk Digital Feedthrough Output Noise Spectral Density @ 10 kHz 1 B Version Unit Test Conditions/Comments 20 30 1 5 10 100 10 0.2 0.02 250 μs typ μs max V/μs typ nV-s typ mV max dB typ nV-s typ nV-s typ nV-s typ nV/√Hz typ Full-scale change DAC latch contents alternately loaded with all 0s and all 1s VREF0, VREF1 = 2 V p-p, 1 kHz Effect of input bus activity on DAC output under test VREF0 = VREF1 = 0 V Guaranteed by design and characterization; not production tested. Rev. C | Page 5 of 28 AD5372/AD5373 TIMING CHARACTERISTICS DVCC = 2.5 V to 5.5 V; VDD = 9 V to 16.5 V; VSS = −16.5 V to −8 V; VREFx = 3 V; AGND = DGND = SIGGNDx = 0 V; CL = 200 pF to GND; RL = open circuit; gain (M), offset (C), and DAC offset registers at default values; all specifications TMIN to TMAX, unless otherwise noted. Table 4. SPI Interface Parameter 1, 2, 3 t1 t2 t3 t4 t5 t6 t7 t8 t9 4 t10 t11 t12 t13 t14 t15 t16 t17 t18 t19 t20 t21 t22 5 t23 Limit at TMIN, TMAX 20 8 8 11 20 10 5 5 42 1/1.5 600 20 10 3 0 3 20/30 140 30 400 270 25 80 Unit ns min ns min ns min ns min ns min ns min ns min ns min ns max μs typ/μs max ns max ns min ns min μs max ns min μs max μs typ/μs max ns max ns min μs max ns min ns max ns max Description SCLK cycle time SCLK high time SCLK low time SYNC falling edge to SCLK falling edge setup time Minimum SYNC high time 24th SCLK falling edge to SYNC rising edge Data setup time Data hold time SYNC rising edge to BUSY falling edge BUSY pulse width low (single-channel update); see Table 9 Single-channel update cycle time SYNC rising edge to LDAC falling edge LDAC pulse width low BUSY rising edge to DAC output response time BUSY rising edge to LDAC falling edge LDAC falling edge to DAC output response time DAC output settling time CLR/RESET pulse activation time RESET pulse width low RESET time indicated by BUSY low Minimum SYNC high time in readback mode SCLK rising edge to SDO valid RESET rising edge to BUSY falling edge 1 Guaranteed by design and characterization; not production tested. All input signals are specified with tR = tF = 2 ns (10% to 90% of DVCC) and timed from a voltage level of 1.2 V. 3 See Figure 4 and Figure 5. 4 t9 is measured with the load circuit shown in Figure 2. 5 t22 is measured with the load circuit shown in Figure 3. 2 200µA DVCC CL 50pF VOL TO OUTPUT PIN VOH (MIN) – VOL (MAX) 2 CL 50pF 200µA Figure 2. Load Circuit for BUSY Timing Diagram IOH Figure 3. Load Circuit for SDO Timing Diagram Rev. C | Page 6 of 28 05815-003 RL 2.2k Ω 05815-002 TO OUTPUT PIN IOL AD5372/AD5373 t1 SCLK 1 24 2 t3 t4 SYNC 24 t11 t6 t5 t7 SDI 1 t2 t8 DB0 DB23 t9 t10 BUSY t12 t13 LDAC1 t17 t14 VOUTx1 t15 t13 LDAC2 t17 VOUTx2 t16 CLR t18 VOUTx t19 RESET VOUTx t18 t20 BUSY 05815-004 t23 1 LDAC ACTIVE DURING BUSY. 2 LDAC ACTIVE AFTER BUSY. Figure 4. SPI Write Timing Rev. C | Page 7 of 28 AD5372/AD5373 t22 SCLK 48 t21 SYNC DB23 DB0 DB23 INPUT WORD SPECIFIES REGISTER TO BE READ DB0 NOP CONDITION DB0 SDO DB23 DB15 SELECTED REGISTER DATA CLOCKED OUT LSB FROM PREVIOUS WRITE Figure 5. SPI Read Timing OUTPUT VOLTAGE FULL-SCALE ERROR + ZERO-SCALE ERROR 8V ACTUAL TRANSFER FUNCTION IDEAL TRANSFER FUNCTION –4V DAC CODE 16383 ZERO-SCALE ERROR 05815-006 0 Figure 6. DAC Transfer Function Rev. C | Page 8 of 28 DB0 05815-005 SDI AD5372/AD5373 ABSOLUTE MAXIMUM RATINGS TA = 25°C, unless otherwise noted. Transient currents of up to 60 mA do not cause SCR latch-up. Table 5. Parameter VDD to AGND VSS to AGND DVCC to DGND Digital Inputs to DGND Digital Outputs to DGND VREF0, VREF1 to AGND VOUT0 through VOUT31 to AGND SIGGNDx to AGND AGND to DGND Operating Temperature Range (TA) Industrial (B Version) Storage Temperature Range Junction Temperature (TJ max) θJA Thermal Impedance 64-Lead LFCSP 64-Lead LQFP Reflow Soldering Peak Temperature Time at Peak Temperature Rating −0.3 V to +17 V −17 V to +0.3 V −0.3 V to +7 V −0.3 V to DVCC + 0.3 V −0.3 V to DVCC + 0.3 V −0.3 V to +5.5 V VSS − 0.3 V to VDD + 0.3 V −1 V to +1 V −0.3 V to +0.3 V Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION −40°C to +85°C −65°C to +150°C 130°C 25.5°C/W 45.5°C/W 230°C 10 sec to 40 sec Rev. C | Page 9 of 28 AD5372/AD5373 RESET BUSY VOUT27 SIGGND3 VOUT28 VOUT29 VOUT30 VOUT31 NC NC NC NC NC NC NC VDD 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 AD5372/AD5373 TOP VIEW (Not to Scale) VOUT6 VOUT7 DGND DVCC SYNC SCLK SDI SDO DVCC DGND AGND VOUT24 VOUT25 VOUT26 LDAC 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 PIN 1 INDICATOR CLR CLR LDAC VOUT26 VOUT25 VOUT24 AGND DGND DVCC SDO SDI SCLK SYNC DVCC DGND VOUT7 VOUT6 PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS VOUT5 VOUT4 SIGGND0 VOUT3 VOUT2 VOUT1 VOUT0 VREF0 VOUT23 VOUT22 VOUT21 VOUT20 VSS VDD SIGGND2 VOUT19 RESET 1 BUSY 2 VOUT27 48 VOUT5 47 VOUT4 3 46 SIGGND0 SIGGND3 4 45 VOUT3 VOUT28 5 44 VOUT2 VOUT29 6 43 VOUT1 VOUT30 7 42 VOUT0 VOUT31 8 41 VREF0 NC 9 40 VOUT23 NC 10 39 VOUT22 NC 11 38 VOUT21 NC 12 37 VOUT20 NC 13 36 VSS NC 14 35 VDD NC 15 34 SIGGND2 VDD 16 33 VOUT19 PIN 1 INDICATOR AD5372/AD5373 TOP VIEW (Not to Scale) NOTES 1. NC = NO CONNECT. 2. THE LEAD FRAME CHIP SCALE PACKAGE (LFCSP) HAS AN EXPOSED PAD ON THE UNDERSIDE. CONNECT THE EXPOSED PAD TO VSS. 05815-107 NC = NO CONNECT 05815-007 VOUT18 VOUT17 VOUT16 VOUT15 VOUT14 VOUT13 VOUT12 SIGGND1 VOUT11 VOUT10 VOUT9 VOUT8 NC NC VSS VSS VREF1 NC NC VOUT8 VOUT9 VOUT10 VOUT11 SIGGND1 VOUT12 VOUT13 VOUT14 VOUT15 VOUT16 VOUT17 VOUT18 VREF1 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 Figure 7. 64-Lead LFCSP Pin Configuration Figure 8. 64-Lead LQFP Pin Configuration Table 6. Pin Function Descriptions Pin No. 0 Mnemonic EPAD 1 2 RESET BUSY 42 to 45, 47 to 50, 21 to 24, 26 to 33, 37 to 40, 60 to 62, 3, 5 to 8 4 9 to 15, 19, 20 16, 35 VOUT0 to VOUT31 17, 36 VSS 18 25 34 41 46 51, 58 52, 57 VREF1 SIGGND1 SIGGND2 VREF0 SIGGND0 DGND DVCC 53 54 SYNC SCLK 55 SDI SIGGND3 NC VDD Description Exposed Pad. The lead frame chip scale package (LFCSP) has an exposed pad on the underside. Connected the exposed pad to VSS. Digital Reset Input. Digital Input/Open-Drain Output. BUSY is open drain when an output. See the BUSY and LDAC Functions section for more information. DAC Outputs. Buffered analog outputs for each of the 32 DAC channels. Each analog output is capable of driving an output load of 10 kΩ to ground. Typical output impedance of these amplifiers is 0.5 Ω. Reference Ground for DAC 24 to DAC 31. VOUT24 to VOUT31 are referenced to this voltage. No Connect. Positive Analog Power Supply; 9 V to 16.5 V for specified performance. These pins should be decoupled with 0.1 μF ceramic capacitors and 10 μF capacitors. Negative Analog Power Supply; −16.5 V to −8 V for specified performance. These pins should be decoupled with 0.1 μF ceramic capacitors and 10 μF capacitors. Reference Input for DAC 8 to DAC 31. This reference voltage is referred to AGND. Reference Ground for DAC 8 to DAC 15. VOUT8 to VOUT15 are referenced to this voltage. Reference Ground for DAC 16 to DAC 23. VOUT16 to VOUT23 are referenced to this voltage. Reference Input for DAC 0 to DAC 7. This reference voltage is referred to AGND. Reference Ground for DAC 0 to DAC 7. VOUT0 to VOUT7 are referenced to this voltage. Ground for All Digital Circuitry. The DGND pins should be connected to the DGND plane. Logic Power Supply; 2.5 V to 5.5 V. These pins should be decoupled with 0.1 μF ceramic capacitors and 10 μF capacitors. Active Low Input. This is the frame synchronization signal for the serial interface. Serial Clock Input. Data is clocked into the shift register on the falling edge of SCLK. This pin operates at clock speeds up to 50 MHz. Serial Data Input. Data must be valid on the falling edge of SCLK. Rev. C | Page 10 of 28 AD5372/AD5373 Pin No. 56 Mnemonic SDO 59 63 AGND LDAC 64 CLR Description Serial Data Output. CMOS output. SDO can be used for readback. Data is clocked out on SDO on the rising edge of SCLK and is valid on the falling edge of SCLK. Ground for All Analog Circuitry. The AGND pin should be connected to the AGND plane. Load DAC Logic Input (Active Low). See the BUSY and LDAC Functions section for more information. Asynchronous Clear Input (Level Sensitive, Active Low). See the Clear Function section for more information. Rev. C | Page 11 of 28 AD5372/AD5373 TYPICAL PERFORMANCE CHARACTERISTICS 0.0050 2 TA = 25°C VSS = –15V VDD = +15V VREFx = +4.096V 0.0025 AMPLITUDE (V) 0 –0.0025 05815-008 –1 –2 0 0 16384 32768 49152 –0.0050 65535 05815-011 INL (LSB) 1 0 1 2 DAC CODE Figure 9. Typical AD5372 INL Plot 1.0 VDD = +15V VSS = –15V DVCC = +5V VREFx = +3V 0.5 DNL (LSB) 0 0 –0.5 05815-009 –0.5 0 20 40 –1.0 80 60 05815-012 INL ERROR (LSB) 0.5 0 16384 49152 65535 Figure 13. Typical AD5372 DNL Plot Figure 10. Typical INL Error vs. Temperature 0 32768 DAC CODE TEMPERATURE (°C) 600 TA = 25°C VSS = –15V VDD = +15V VREFx = +4.096V OUTPUT NOISE (nV/√Hz) 500 –0.01 400 300 200 –0.02 0 2 4 6 8 TIME (µs) 10 0 05815-013 100 05815-010 AMPLITUDE (V) 5 4 Figure 12. Digital Crosstalk 1.0 –1.0 3 TIME (µs) 0 1 2 3 4 FREQUENCY (Hz) Figure 14. Output Noise Spectral Density Figure 11. Analog Crosstalk Due to LDAC Rev. C | Page 12 of 28 5 AD5372/AD5373 0.50 12 NUMBER OF UNITS DICC (mA) 0.45 DVCC = +5.5V 0.40 VSS = –15V VDD = +15V TA = 25°C 14 VSS = –12V VDD = +12V VREFx = +3V DVCC = +3.6V 0.35 DVCC = +2.5V 10 8 6 4 0.30 –20 0 20 40 60 0 80 05815-016 05815-014 0.25 –40 2 12.6 12.8 TEMPERATURE (°C) 13.2 13.4 Figure 17. Typical IDD Distribution Figure 15. DICC vs. Temperature 13.5 14 IDD DVCC = 5V TA = 25°C 12 NUMBER OF UNITS 13.0 12.5 ISS 10 8 6 4 VSS = –12V VDD = +12V VREFx = +3V 11.5 –40 –20 0 20 40 60 80 TEMPERATURE (°C) Figure 16. IDD/ISS vs. Temperature 2 0 05815-017 12.0 05815-015 IDD/ISS (mA) 13.0 IDD (mA) 0.30 0.35 0.40 DICC (mA) 0.45 Figure 18. Typical DICC Distribution Rev. C | Page 13 of 28 0.50 AD5372/AD5373 TERMINOLOGY Integral Nonlinearity (INL) Integral nonlinearity, or endpoint linearity, is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after adjusting for zero-scale error and full-scale error and is expressed in least significant bits (LSB). Differential Nonlinearity (DNL) Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of 1 LSB maximum ensures monotonicity. Zero-Scale Error Zero-scale error is the error in the DAC output voltage when all 0s are loaded into the DAC register. Zero-scale error is a measure of the difference between VOUT (actual) and VOUT (ideal), expressed in millivolts, when the channel is at its minimum value. Zero-scale error is mainly due to offsets in the output amplifier. Full-Scale Error Full-scale error is the error in the DAC output voltage when all 1s are loaded into the DAC register. Full-scale error is a measure of the difference between VOUT (actual) and VOUT (ideal), expressed in millivolts, when the channel is at its maximum value. Full-scale error does not include zero-scale error. Gain Error Gain error is the difference between full-scale error and zero-scale error. It is expressed as a percentage of the fullscale range (FSR). Output Voltage Settling Time Output voltage settling time is the amount of time it takes for the output of a DAC to settle to a specified level for a full-scale input change. Digital-to-Analog Glitch Energy Digital-to-analog glitch energy is the amount of energy that is injected into the analog output at the major code transition. It is specified as the area of the glitch in nV-s. It is measured by toggling the DAC register data between 0x7FFF and 0x8000 (AD5372) or 0x1FFF and 0x2000 (AD5373). Channel-to-Channel Isolation Channel-to-channel isolation refers to the proportion of input signal from the reference input of one DAC that appears at the output of another DAC operating from another reference. It is expressed in decibels and measured at midscale. DAC-to-DAC Crosstalk DAC-to-DAC crosstalk is the glitch impulse that appears at the output of one converter due to both the digital change and subsequent analog output change at another converter. It is specified in nV-s. Digital Crosstalk Digital crosstalk is defined as the glitch impulse transferred to the output of one converter due to a change in the DAC register code of another converter. It is specified in nV-s. Digital Feedthrough When the device is not selected, high frequency logic activity on the digital inputs of the device can be capacitively coupled both across and through the device to appear as noise on the VOUT pins. It can also be coupled along the supply and ground lines. This noise is digital feedthrough. Gain Error = Full-Scale Error − Zero-Scale Error VOUT Temperature Coefficient The VOUT temperature coefficient includes output error contributions from linearity, offset, and gain drift. DC Output Impedance DC output impedance is the effective output source resistance. It is dominated by package lead resistance. DC Crosstalk The DAC outputs are buffered by op amps that share common VDD and VSS power supplies. If the dc load current changes in one channel (due to an update), this change can result in a further dc change in one or more channel outputs. This effect is more significant at high load currents and is reduced as the load currents are reduced. With high impedance loads, the effect is virtually immeasurable. Multiple VDD and VSS terminals are provided to minimize dc crosstalk. Output Noise Spectral Density Output noise spectral density is a measure of internally generated random noise. Random noise is characterized as a spectral density (voltage per √Hz). It is measured by loading all DACs to midscale and measuring noise at the output. It is measured in nV/√Hz. Rev. C | Page 14 of 28 AD5372/AD5373 THEORY OF OPERATION DAC ARCHITECTURE The AD5372/AD5373 contain 32 DAC channels and 32 output amplifiers in a single package. The architecture of a single DAC channel consists of a 16-bit (AD5372) or 14-bit (AD5373) resistor-string DAC followed by an output buffer amplifier. The resistor-string section is simply a string of resistors (of equal value) from VREF0 or VREF1 to AGND. This type of architecture guarantees DAC monotonicity. The 16-bit (AD5372) or 14-bit (AD5373) binary digital code loaded to the DAC register determines at which node on the string the voltage is tapped off before being fed into the output amplifier. The output amplifier multiplies the DAC output voltage by 4. The nominal output span is 12 V with a 3 V reference and 20 V with a 5 V reference. CHANNEL GROUPS The 32 DAC channels of the AD5372/AD5373 are arranged into four groups of eight channels. The eight DACs of Group 0 derive their reference voltage from VREF0. Group 1 to Group 3 derive their reference voltage from VREF1. Each group has its own signal ground pin. Table 7. AD5372/AD5373 Registers Register Name X1A (Group) (Channel) X1B (Group) (Channel) M (Group) (Channel) C (Group) (Channel) X2A (Group) (Channel) Word Length in Bits 16 (14) 16 (14) 16 (14) 16 (14) 16 (14) X2B (Group) (Channel) 16 (14) DAC (Group) (Channel) OFS0 OFS1 Control 14 14 3 A/B Select 0 8 A/B Select 1 8 A/B Select 2 8 A/B Select 3 8 Description Input Data Register A, one for each DAC channel. Input Data Register B, one for each DAC channel. Gain trim registers, one for each DAC channel. Offset trim registers, one for each DAC channel. Output Data Register A, one for each DAC channel. These registers store the final, calibrated DAC data after gain and offset trimming. They are not readable or directly writable. Output Data Register B, one for each DAC channel. These registers store the final, calibrated DAC data after gain and offset trimming. They are not readable or directly writable. Data registers from which the DACs take their final input data. The DAC registers are updated from the X2A or X2B registers. They are not readable or directly writable. Offset DAC 0 data register: sets offset for Group 0. Offset DAC 1 data register: sets offset for Group 1 to Group 3. Bit 2 = A/B. 0 = global selection of X1A input data registers. 1 = global selection of X1B input data registers. Bit 1 = enable thermal shutdown. 0 = disable thermal shutdown. 1 = enable thermal shutdown. Bit 0 = software power-down. 0 = software power-up. 1 = software power-down. Each bit in this register determines whether a DAC in Group 0 takes its data from Register X2A or Register X2B (0 = X2A, 1 = X2B). Each bit in this register determines whether a DAC in Group 1 takes its data from Register X2A or Register X2B (0 = X2A, 1 = X2B). Each bit in this register determines whether a DAC in Group 2 takes its data from Register X2A or Register X2B (0 = X2A, 1 = X2B). Each bit in this register determines whether a DAC in Group 3 takes its data from Register X2A or Register X2B (0 = X2A, 1 = X2B). Table 8. AD5372/AD5373 Input Register Default Values Register Name X1A, X1B M C OFS0, OFS1 Control A/B Select 0 to A/B Select 3 AD5372 Default Value 0x5554 0xFFFF 0x8000 0x1555 0x00 0x00 Rev. C | Page 15 of 28 AD5373 Default Value 0x1555 0x3FFF 0x2000 0x1555 0x00 0x00 AD5372/AD5373 A/B REGISTERS AND GAIN/OFFSET ADJUSTMENT LOAD DAC Each DAC channel has seven data registers. The actual DAC data-word can be written to either the X1A or the X1B input register, depending on the setting of the A/B bit in the control register. If the A/B bit is 0, data is written to the X1A register. If the A/B bit is 1, data is written to the X1B register. Note that this single bit is a global control and affects every DAC channel in the device. It is not possible to set up the device on a perchannel basis so that some writes are to X1A registers and some writes are to X1B registers. All DACs in the AD5372/AD5373 can be updated simultaneously by taking LDAC low when each DAC register is updated from either its X2A or X2B register, depending on the setting of the A/B select registers. The DAC register is not readable or directly writable by the user. LDAC can be permanently tied low, and the DAC output is updated whenever new data appears in the appropriate DAC register. X1B REGISTER MUX X2B REGISTER DAC REGISTER DAC C REGISTER 05815-018 M REGISTER Figure 19. Data Registers Associated with Each DAC Channel Each DAC channel also has a gain (M) register and an offset (C) register, which allow trimming out of the gain and offset errors of the entire signal chain. Data from the X1A register is operated on by a digital multiplier and adder controlled by the contents of the M and C registers. The calibrated DAC data is then stored in the X2A register. Similarly, data from the X1B register is operated on by the multiplier and adder and stored in the X2B register. Although a multiplier and adder symbol are shown in Figure 19 for each channel, there is only one multiplier and one adder in the device, which are shared among all channels. This has implications for the update speed when several channels are updated at once, as described in the Register Update Rates section. Each time data is written to the X1A register, or to the M or C register with the A/B control bit set to 0, the X2A data is recalculated and the X2A register is automatically updated. Similarly, X2B is updated each time data is written to X1B, or to M or C with A/B set to 1. The X2A and X2B registers are not readable or directly writable by the user. When the output range is adjusted by changing the value of the offset DAC, an extra offset is introduced due to the gain error of the offset DAC. The amount of offset is dependent on the magnitude of the reference and how much the offset DAC moves from its default value. See the Specifications section for this offset. The worst-case offset occurs when the offset DAC is at positive or negative full scale. This value can be added to the offset present in the main DAC channel to give an indication of the overall offset for that channel. In most cases, the offset can be removed by programming the C register of the channel with an appropriate value. The extra offset caused by the offset DAC needs to be taken into account only when the offset DAC is changed from its default value. Figure 20 shows the allowable code range that can be loaded to the offset DAC, depending on the reference value used. Thus, for a 5 V reference, the offset DAC should not be programmed with a value greater than 8192 (0x2000). 5 RESERVED Data output from the X2A and X2B registers is routed to the final DAC register by a multiplexer. Whether each individual DAC takes its data from the X2A or from the X2B register is controlled by an 8-bit A/B select register associated with each group of eight DACs. If a bit in this register is 0, the DAC takes its data from the X2A register; if 1, the DAC takes its data from the X2B register (Bit 0 through Bit 7 control DAC 0 to DAC 7). Note that because there are 32 bits in four registers, it is possible to set up, on a per-channel basis, whether each DAC takes its data from the X2A or X2B register. A global command is also provided that sets all bits in the A/B select registers to 0 or to 1. 4 3 2 1 05815-019 X2A REGISTER MUX In addition to the gain and offset trim for each DAC, there are two 14-bit offset DACs, one for Group 0 and one for Group 1 to Group 3. These allow the output range of all DACs connected to them to be offset within a defined range. Thus, subject to the limitations of headroom, it is possible to set the output range of Group 0 or Group 1 to Group 3 to be unipolar positive, unipolar negative, or bipolar, either symmetrical or asymmetrical about 0 V. The DACs in the AD5372/AD5373 are factory trimmed with the offset DACs set at their default values. This gives the best offset and gain performance for the default output range and span. VREF (V) X1A REGISTER OFFSET DACs 0 0 4096 8192 12288 OFFSET DAC CODE Figure 20. Offset DAC Code Range Rev. C | Page 16 of 28 16383 AD5372/AD5373 OUTPUT AMPLIFIER Because the output amplifiers can swing to 1.4 V below the positive supply and 1.4 V above the negative supply, this limits how much the output can be offset for a given reference voltage. For example, it is not possible to have a unipolar output range of 20 V, because the maximum supply voltage is ±16.5 V. S1 DAC CHANNEL OUTPUT R5 60kΩ S2 R6 10kΩ CLR AD5373 Transfer Function CLR R1 20kΩ R4 60kΩ R3 20kΩ R2 20kΩ The input code is the value in the X1A or X1B register that is applied to the DAC (X1A, X1B default code = 5461). S3 CLR where: DAC_CODE should be within the range of 0 to 65,535. For 12 V span, VREFx = 3.0 V. For 20 V span, VREFx = 5.0 V. OFFSET_CODE is the code loaded to the offset DAC. It is multiplied by 4 in the transfer function because this DAC is a 14-bit device. On power-up, the default code loaded to the offset DAC is 5461 (0x1555). With a 3 V reference, this gives a span of −4 V to +8 V. SIGGNDx DAC_CODE = INPUT_CODE × (M + 1)/214 + C − 213 OFFSET DAC 05815-020 SIGGNDx where: M = code in gain register − default code = 214 – 1. C = code in offset register − default code = 213. Figure 21. Output Amplifier and Offset DAC The DAC output voltage is calculated as follows: Figure 21 shows details of a DAC output amplifier and its connections to the offset DAC. On power-up, S1 is open, disconnecting the amplifier from the output. S3 is closed, so the output is pulled to SIGGNDx (R1 and R2 are greater than R6). S2 is also closed to prevent the output amplifier from being open-loop. If CLR is low at power-up, the output remains in this condition until CLR is taken high. The DAC registers can be programmed, and the outputs assume the programmed values when CLR is taken high. Even if CLR is high at power-up, the output remains in the previous condition until VDD > 6 V and VSS < −4 V and the initialization sequence has finished. The outputs then go to their power-on default value. VOUT = 4 × VREFx × (DAC_CODE – OFFSET_CODE)/214 + VSIGGND TRANSFER FUNCTION The output voltage of a DAC in the AD5372/AD5373 is dependent on the value in the input register, the value of the M and C registers, and the value in the offset DAC. AD5372 Transfer Function The input code is the value in the X1A or X1B register that is applied to the DAC (X1A, X1B default code = 21,844). DAC_CODE = INPUT_CODE × (M + 1)/216 + C − 215 where: M = code in gain register − default code = 216 – 1. C = code in offset register − default code = 215. where: DAC_CODE should be within the range of 0 to 16,383. For 12 V span, VREFx = 3.0 V. For 20 V span, VREFx = 5.0 V. OFFSET_CODE is the code loaded to the offset DAC. On power-up, the default code loaded to the offset DAC is 5461 (0x1555). With a 3 V reference, this gives a span of −4 V to +8 V. REFERENCE SELECTION The AD5372/AD5373 have two reference input pins. The voltage applied to the reference pins determines the output voltage span on VOUT0 to VOUT31. VREF0 determines the voltage span for VOUT0 to VOUT7 (Group 0), and VREF1 determines the voltage span for VOUT8 to VOUT31 (Group 1 to Group 3). The reference voltage applied to each VREF pin can be different, if required, allowing the groups to have different voltage spans. The output voltage range and span can be adjusted further by programming the offset and gain registers for each channel as well as programming the offset DACs. If the offset and gain features are not used (that is, the M and C registers are left at their default values), the required reference levels can be calculated as follows: The DAC output voltage is calculated as follows: VREF = (VOUTMAX – VOUTMIN)/4 VOUT = 4 × VREFx × (DAC_CODE – (OFFSET_CODE × 4))/216 + VSIGGND If the offset and gain features of the AD5372/AD5373 are used, the required output range is slightly different. The selected output range should take into account the system offset and gain errors that need to be trimmed out. Therefore, the selected output range should be larger than the actual required range. Rev. C | Page 17 of 28 AD5372/AD5373 The required reference levels can be calculated as follows: CALIBRATION 1. 2. Identify the nominal output range on VOUT. Identify the maximum offset span and the maximum gain required on the full output signal range. Calculate the new maximum output range on VOUT, including the expected maximum offset and gain errors. Choose the new required VOUTMAX and VOUTMIN, keeping the VOUT limits centered on the nominal values. Note that VDD and VSS must provide sufficient headroom. Calculate the value of VREF as follows: The user can perform a system calibration on the AD5372/ AD5373 to reduce gain and offset errors to below 1 LSB. This reduction is achieved by calculating new values for the M and C registers and reprogramming them. VREF = (VOUTMAX – VOUTMIN)/4 1. 2. 3. 4. 5. The M and C registers should not be programmed until both the zero-scale and full-scale errors are calculated. Reducing Zero-Scale Error Zero-scale error can be reduced as follows: Reference Selection Example 3. If Nominal output range = 12 V (−4 V to +8 V) Zero-scale error = ±70 mV Set the output to the lowest possible value. Measure the actual output voltage and compare it to the required value. This gives the zero-scale error. Calculate the number of LSBs equivalent to the error and add this number to the default value of the C register. Note that only negative zero-scale error can be reduced. Reducing Full-Scale Error Gain error = ±3%, and Full-scale error can be reduced as follows: SIGGNDx = AGND = 0 V Then Gain error = ±3% => Maximum positive gain error = 3% => Output range including gain error = 12 + 0.03(12) = 12.36 V 1. 2. 3. Measure the zero-scale error. Set the output to the highest possible value. Measure the actual output voltage and compare it to the required value. Add this error to the zero-scale error. This is the span error, which includes the full-scale error. Calculate the number of LSBs equivalent to the span error and subtract this number from the default value of the M register. Note that only positive full-scale error can be reduced. Zero-scale error = ±70 mV => Maximum offset error span = 2(70 mV) = 0.14 V => Output range including gain error and zero-scale error = 12.36 V + 0.14 V = 12.5 V 4. VREF calculation Actual output range = 12.5 V, that is, −4.25 V to +8.25 V; VREF = (8.25 V + 4.25 V)/4 = 3.125 V AD5372 Calibration Example If the solution yields an inconvenient reference level, the user can adopt one of the following approaches: • • • Use a resistor divider to divide down a convenient, higher reference level to the required level. Select a convenient reference level above VREF and modify the gain and offset registers to digitally downsize the reference. In this way, the user can use almost any convenient reference level but can reduce the performance by overcompaction of the transfer function. Use a combination of these two approaches. This example assumes that a −4 V to +8 V output is required. The DAC output is set to −4 V but is measured at −4.03 V. This gives a zero-scale error of −30 mV. 1 LSB = 12 V/65,536 = 183.105 μV 30 mV = 164 LSBs The full-scale error can now be calculated. The output is set to 8 V and a value of 8.02 V is measured. This gives a full-scale error of +20 mV and a span error of +20 mV – (–30 mV) = +50 mV. 50 mV = 273 LSBs The errors can now be removed as follows: 1. 2. 3. Rev. C | Page 18 of 28 Add 164 LSBs to the default C register value: (32,768 + 164) = 32,932 Subtract 273 LSBs from the default M register value: (65,535 − 273) = 65,262 Program the M register to 65,262; program the C register to 32,932. AD5372/AD5373 ADDITIONAL CALIBRATION BUSY AND LDAC FUNCTIONS The techniques described in the previous section are usually enough to reduce the zero-scale and full-scale errors in most applications. However, there are limitations whereby the errors may not be sufficiently reduced. For example, the offset (C) register can only be used to reduce the offset caused by the negative zero-scale error. A positive offset cannot be reduced. Likewise, if the maximum voltage is below the ideal value, that is, a negative full-scale error, the gain (M) register cannot be used to increase the gain to compensate for the error. The value of an X2 (A or B) register is calculated each time the user writes new data to the corresponding X1, C, or M register. During the calculation of X2, the BUSY output goes low. While BUSY is low, the user can continue writing new data to the X1, M, or C register (see the Register Update Rates section for more details), but no DAC output updates can take place. These limitations can be overcome by increasing the reference value. With a 3 V reference, a 12 V span is achieved. The ideal voltage range, for the AD5372 or the AD5373, is −4 V to +8 V. Using a +3.1 V reference increases the range to −4.133 V to +8.2667 V. Clearly, in this case, the offset and gain errors are insignificant, and the M and C registers can be used to raise the negative voltage to −4 V and then reduce the maximum voltage to +8 V to give the most accurate values possible. RESET FUNCTION The reset function is initiated by the RESET pin. On the rising edge of RESET, the AD5372/AD5373 state machine initiates a reset sequence to reset the X, M, and C registers to their default values. This sequence typically takes 300 μs, and the user should not write to the part during this time. On power-up, it is recommended that the user bring RESET high as soon as possible to properly initialize the registers. When the reset sequence is complete (and provided that CLR is high), the DAC output is at a potential specified by the default register settings, which is equivalent to SIGGNDx. The DAC outputs remain at SIGGNDx until the X, M, or C register is updated and LDAC is taken low. The AD5372/AD5373 can be returned to the default state by pulsing RESET low for at least 30 ns. Note that, because the reset function is triggered by the rising edge, bringing RESET low has no effect on the operation of the AD5372/AD5373. CLEAR FUNCTION CLR is an active low input that should be high for normal operation. The CLR pin has an internal 500 kΩ pull-down resistor. When CLR is low, the input to each of the DAC output buffer stages (VOUT0 to VOUT31) is switched to the externally set potential on the relevant SIGGNDx pin. While CLR is low, all LDAC pulses are ignored. When CLR is taken high again, the DAC outputs return to their previous values. The contents of the input registers and DAC Register 0 to DAC Register 31 are not affected by taking CLR low. To prevent glitches from appearing on the outputs, CLR should be brought low whenever the output span is adjusted by writing to the offset DAC. The BUSY pin is bidirectional and has a 50 kΩ internal pull-up resistor. When multiple AD5372 or AD5373 devices are used in one system, the BUSY pins can be tied together. This is useful when it is required that no DAC in any device be updated until all other DACs are ready. When each device has finished updating the X2 (A or B) registers, it releases the BUSY pin. If another device has not finished updating its X2 registers, it holds BUSY low, thus delaying the effect of LDAC going low. The DAC outputs are updated by taking the LDAC input low. If LDAC goes low while BUSY is active, the LDAC event is stored and the DAC outputs are updated immediately after BUSY goes high. A user can also hold the LDAC input permanently low. In this case, the DAC outputs are updated immediately after BUSY goes high. Whenever the A/B select registers are written to, BUSY also goes low, for approximately 500 ns. The AD5372/AD5373 have flexible addressing that allows writing of data to a single channel, all channels in a group, the same channel in Group 0 to Group 3, the same channel in Group 1 to Group 3, or all channels in the device. This means that 1, 4, 8, or 32 DAC register values may need to be calculated and updated. Because there is only one multiplier shared among 32 channels, this task must be done sequentially so that the length of the BUSY pulse varies according to the number of channels being updated. Table 9. BUSY Pulse Widths Action Loading input, C, or M to 1 channel2 Loading input, C, or M to 4 channels Loading input, C, or M to 8 channels Loading input, C, or M to 32 channels 1 2 BUSY Pulse Width1 1.5 μs maximum 3.3 μs maximum 5.7 μs maximum 20.1 μs maximum BUSY pulse width = ((number of channels + 1) × 600 ns) + 300 ns. A single channel update is typically 1 μs. The AD5372/AD5373 contain an extra feature whereby a DAC register is not updated unless its X2A or X2B register has been written to since the last time LDAC was brought low. Normally, when LDAC is brought low, the DAC registers are filled with the contents of the X2A or X2B register, depending on the setting of the A/B select registers. However, the AD5372/AD5373 update the DAC register only if the X2A or X2B data has changed, thereby removing unnecessary digital crosstalk. Rev. C | Page 19 of 28 AD5372/AD5373 POWER-DOWN MODE TOGGLE MODE The AD5372/AD5373 can be powered down by setting Bit 0 in the control register to 1. This turns off the DACs, thus reducing the current consumption. The DAC outputs are connected to their respective SIGGNDx potentials. The power-down mode does not change the contents of the registers, and the DACs return to their previous voltage when the power-down bit is cleared to 0. The AD5372/AD5373 have two X2 registers per channel, X2A and X2B, which can be used to switch the DAC output between two levels with ease. This approach greatly reduces the overhead required by a microprocessor, which would otherwise need to write to each channel individually. When the user writes to the X1A, X1B, M, or C register, the calculation engine takes a certain amount of time to calculate the appropriate X2A or X2B value. If an application, such as a data generator, requires that the DAC output switch between two levels only, any method that reduces the amount of calculation time necessary is advantageous. For the data generator example, the user needs only to set the high and low levels for each channel once by writing to the X1A and X1B registers. The values of X2A and X2B are calculated and stored in their respective registers. The calculation delay, therefore, happens only during the setup phase, that is, when programming the initial values. To toggle a DAC output between the two levels, it is only required to write to the relevant A/B select register to set the MUX2 register bit. Furthermore, because there are eight MUX2 control bits per register, it is possible to update eight channels with a single write. Table 10 shows the bits that correspond to each DAC output. THERMAL SHUTDOWN FUNCTION The AD5372/AD5373 can be programmed to shut down the DACs if the temperature on the die exceeds 130°C. Setting Bit 1 in the control register to 1 enables this function (see Table 16). If the die temperature exceeds 130°C, the AD5372/AD5373 enter a thermal shutdown mode, which is equivalent to setting the power-down bit in the control register to 1. To indicate that the AD5372/AD5373 have entered thermal shutdown mode, Bit 4 of the control register is set to 1. The AD5372/AD5373 remain in thermal shutdown mode, even if the die temperature falls, until Bit 1 in the control register is cleared to 0. Table 10. DACs Selected by A/B Select Registers A/B Select Register 0 1 2 3 1 F7 VOUT7 VOUT15 VOUT23 VOUT31 F6 VOUT6 VOUT14 VOUT22 VOUT30 F5 VOUT5 VOUT13 VOUT21 VOUT29 F4 VOUT4 VOUT12 VOUT20 VOUT28 Bits1 F3 VOUT3 VOUT11 VOUT19 VOUT27 If the bit is set to 0, Register X2A is selected. If the bit is set to 1, Register X2B is selected. Rev. C | Page 20 of 28 F2 VOUT2 VOUT10 VOUT18 VOUT26 F1 VOUT1 VOUT9 VOUT17 VOUT25 F0 VOUT0 VOUT8 VOUT16 VOUT24 AD5372/AD5373 SERIAL INTERFACE The AD5372/AD5373 contain a high speed SPI operating at clock frequencies up to 50 MHz (20 MHz for read operations). To minimize both the power consumption of the device and on-chip digital noise, the interface powers up fully only when the device is being written to, that is, on the falling edge of SYNC. The serial interface is 2.5 V LVTTL-compatible when operating from a 2.5 V to 3.6 V DVCC supply. It is controlled by four pins: SYNC (frame synchronization input), SDI (serial data input pin), SCLK (clocks data in and out of the device), and SDO (serial data output pin for data readback). SPI READBACK MODE The AD5372/AD5373 allow data readback via the serial interface from every register directly accessible to the serial interface, that is, all registers except the X2A, X2B, and DAC data registers. To read back a register, it is first necessary to tell the AD5372/AD5373 which register is to be read. This is achieved by writing a word whose first two bits are the Special Function Code 00 to the device. The remaining bits then determine which register is to be read back. If a readback command is written to a special function register, data from the selected register is clocked out of the SDO pin during the next SPI operation. The SDO pin is normally threestated but becomes driven as soon as a read command is issued. The pin remains driven until the register data is clocked out. See Figure 5 for the read timing diagram. Note that due to the timing requirements of t22 (25 ns), the maximum speed of the SPI interface during a read operation should not exceed 20 MHz. SPI WRITE MODE The AD5372/AD5373 allow writing of data via the serial interface to every register directly accessible to the serial interface, that is, all registers except the X2A, X2B, and DAC registers. The X2A and X2B registers are updated when writing to the X1A, X1B, M, and C registers, and the DAC data registers are updated by LDAC. The serial word (see Table 11 or Table 12) is 24 bits long: 16 (AD5372) or 14 (AD5373) of these bits are data bits; six bits are address bits; and two bits are mode bits that determine what is done with the data. Two bits are reserved on the AD5373. REGISTER UPDATE RATES The value of the X2A register or the X2B register is calculated each time the user writes new data to the corresponding X1, C, or M register. The calculation is performed by a three-stage process. The first two stages take approximately 600 ns each, and the third stage takes approximately 300 ns. When the write to an X1, C, or M register is complete, the calculation process begins. If the write operation involves the update of a single DAC channel, the user is free to write to another register, provided that the write operation does not finish until the first-stage calculation is complete (that is, 600 ns after the completion of the first write operation). If a group of channels is being updated by a single write operation, the first-stage calculation is repeated for each channel, taking 600 ns per channel. In this case, the user should not complete the next write operation until this time has elapsed. The serial interface works with both a continuous and a burst (gated) serial clock. Serial data applied to SDI is clocked into the AD5372/AD5373 by clock pulses applied to SCLK. The first falling edge of SYNC starts the write cycle. At least 24 falling clock edges must be applied to SCLK to clock in 24 bits of data before SYNC is taken high again. If SYNC is taken high before the 24th falling clock edge, the write operation is aborted. If a continuous clock is used, SYNC must be taken high before the 25th falling clock edge. This inhibits the clock within the AD5372/ AD5373. If more than 24 falling clock edges are applied before SYNC is taken high again, the input data becomes corrupted. If an externally gated clock of exactly 24 pulses is used, SYNC can be taken high any time after the 24th falling clock edge. The input register addressed is updated on the rising edge of SYNC. For another serial transfer to take place, SYNC must be taken low again. Table 11. AD5372 Serial Word Bit Assignment I23 M1 I22 M0 I21 A5 I20 A4 I19 A3 I18 A2 I17 A1 I16 A0 I15 D15 I14 D14 I13 D13 I12 D12 I11 D11 I10 D10 I14 D12 I13 D11 I12 D10 I11 D9 I10 D8 I9 D9 I8 D8 I7 D7 I6 D6 I5 D5 I4 D4 I3 D3 I2 D2 I1 D1 I0 D0 I4 D2 I3 D1 I2 D0 I11 0 I01 0 Table 12. AD5373 Serial Word Bit Assignment I23 M1 1 I22 M0 I21 A5 I20 A4 I19 A3 I18 A2 I17 A1 I16 A0 I15 D13 I9 D7 I8 D6 Bit I1 and Bit I0 are reserved for future use and should be 0 when writing the serial word. These bits read back as 0. Rev. C | Page 21 of 28 I7 D5 I6 D4 I5 D3 AD5372/AD5373 CHANNEL ADDRESSING AND SPECIAL MODES If the mode bits are not 00, the data-word D15 to D0 (AD5372) or D13 to D0 (AD5373) is written to the device. Address Bit A5 to Address Bit A0 determine which channels are written to, and the mode bits determine to which register (X1A, X1B, C, or M) the data is written, as shown in Table 13 and Table 14. Data is to be written to the X1A register when the A/B bit in the control register is 0, or to the X1B register when the A/B bit is 1. Table 13. Mode Bits M1 1 1 0 0 M0 1 0 1 0 Action Write to DAC data (X) register Write to DAC offset (C) register Write to DAC gain (M) register Special function, used in combination with other bits of the data-word The AD5372/AD5373 have very flexible addressing that allows the writing of data to a single channel, all channels in a group, the same channel in Group 0 to Group 3, the same channel in Group 1 to Group 3, or all channels in the device. Table 14 shows which groups and which channels are addressed for every combination of Address Bit A5 to Address Bit A0. Table 14. Group and Channel Addressing Address Bit A2 to Address Bit A0 000 Address Bit A5 to Address Bit A3 011 100 101 Group 2, Group 3, Reserved Channel 0 Channel 0 000 All groups, all channels 001 Group 0, Channel 0 010 Group 1, Channel 0 001 Group 0, all channels Group 0, Channel 1 Group 1, Channel 1 Group 2, Channel 1 Group 3, Channel 1 Reserved 010 Group 1, all channels Group 0, Channel 2 Group 1, Channel 2 Group 2, Channel 2 Group 3, Channel 2 Reserved 011 Group 2, all channels Group 0, Channel 3 Group 1, Channel 3 Group 2, Channel 3 Group 3, Channel 3 Reserved 100 Group 3, all channels Group 0, Channel 4 Group 1, Channel 4 Group 2, Channel 4 Group 3, Channel 4 Reserved 101 Reserved Group 0, Channel 5 Group 1, Channel 5 Group 2, Channel 5 Group 3, Channel 5 Reserved 110 Reserved Group 0, Channel 6 Group 1, Channel 6 Group 2, Channel 6 Group 3, Channel 6 Reserved 111 Reserved Group 0, Channel 7 Group 1, Channel 7 Group 2, Channel 7 Group 3, Channel 7 Reserved Rev. C | Page 22 of 28 110 Group 0, Group 1, Group 2, Group 3; Channel 0 Group 0, Group 1, Group 2, Group 3; Channel 1 Group 0, Group 1, Group 2, Group 3; Channel 2 Group 0, Group 1, Group 2, Group 3; Channel 3 Group 0, Group 1, Group 2, Group 3; Channel 4 Group 0, Group 1, Group 2, Group 3; Channel 5 Group 0, Group 1, Group 2, Group 3; Channel 6 Group 0, Group 1, Group 2, Group 3; Channel 7 111 Group 1, Group 2, Group 3; Channel 0 Group 1, Group 2, Group 3; Channel 1 Group 1, Group 2, Group 3; Channel 2 Group 1, Group 2, Group 3; Channel 3 Group 1, Group 2, Group 3; Channel 4 Group 1, Group 2, Group 3; Channel 5 Group 1, Group 2, Group 3; Channel 6 Group 1, Group 2, Group 3; Channel 7 AD5372/AD5373 SPECIAL FUNCTION MODE If the mode bits are 00, then the special function mode is selected, as shown in Table 15. Bit I21 to Bit I16 of the serial data-word select the special function, and the remaining bits are data required for execution of the special function, for example, the channel address for data readback. The codes for the special functions are shown in Table 16. Table 17 shows the addresses for data readback. Table 15. Special Function Mode I23 0 I22 0 I21 S5 I20 S4 I19 S3 I18 S2 I17 S1 I16 S0 I15 F15 I14 F14 I13 F13 I12 F12 I11 F11 I10 F10 I9 F9 I8 F8 I7 F7 I6 F6 I5 F5 I4 F4 I3 F3 I2 F2 I1 F1 I0 F0 Table 16. Special Function Codes S5 0 0 0 0 0 0 0 0 0 0 0 0 Special Function Code S4 S3 S2 S1 S0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 0 0 1 1 1 1 0 0 0 0 1 1 0 0 1 1 0 0 1 1 0 1 0 1 0 1 0 1 0 1 Data (F15 to F0) 0000 0000 0000 0000 XXXX XXXX XXXX X[F2:F0] Action NOP. Write control register. F4 = overtemperature indicator (read-only bit). This bit should be 0 when writing to the control register. F3 = reserved. This bit should be 0 when writing to the control register. F2 = 1: Select Register X1B for input. F2 = 0: Select Register X1A for input. F1 = 1: Enable thermal shutdown mode. F1 = 0: Disable thermal shutdown mode. F0 = 1: Software power-down. F0 = 0: Software power-up. Write data in F13 to F0 to OFS0 register. Write data in F13 to F0 to OFS1 register. XX[F13:F0] XX[F13:F0] Reserved See Table 17 XXXX XXXX [F7:F0] XXXX XXXX [F7:F0] XXXX XXXX [F7:F0] XXXX XXXX [F7:F0] Reserved XXXX XXXX [F7:F0] Select register for readback. Write data in F7 to F0 to A/B Select Register 0. Write data in F7 to F0 to A/B Select Register 1. Write data in F7 to F0 to A/B Select Register 2. Write data in F7 to F0 to A/B Select Register 3. Block write to A/B select registers. F7 to F0 = 0: Write all 0s (all channels use the X2A register). F7 to F0 = 1: Write all 1s (all channels use the X2B register). Table 17. Address Codes for Data Readback1 F15 0 0 0 0 1 1 1 1 1 1 1 1 1 1 F14 0 0 1 1 0 0 0 0 0 0 0 0 0 F13 0 1 0 1 0 0 0 0 0 0 0 0 0 F12 F11 F10 F9 F8 F7 Bit F12 to Bit F7 select the channel to be read back, from Channel 0 = 001000 to Channel 31 = 100111 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 0 0 0 1 1 1 0 0 0 Bit F6 to Bit F0 are don’t cares for the data readback function. Rev. C | Page 23 of 28 0 1 1 0 1 1 0 0 1 1 0 1 0 0 1 0 1 0 Register Read X1A register X1B register C register M register Control register OFS0 data register OFS1 data register Reserved A/B Select Register 0 A/B Select Register 1 A/B Select Register 2 A/B Select Register 3 Reserved AD5372/AD5373 APPLICATIONS INFORMATION INTERFACING EXAMPLES The SPI interface of the AD5372/AD5373 is designed to allow the parts to be easily connected to industry-standard DSPs and microcontrollers. Figure 22 shows how the AD5372/AD5373 connects to the Analog Devices, Inc., Blackfin® DSP. The Blackfin has an integrated SPI port that can be connected directly to the SPI pins of the AD5372/AD5373 and programmable I/O pins that can be used to set or read the state of the digital input or output pins associated with the interface. The AD5372/AD5373 should have ample supply decoupling of 10 μF in parallel with 0.1 μF on each supply located as close to the package as possible, ideally right up against the device. The 10 μF capacitors are the tantalum bead type. The 0.1 μF capacitor should have low effective series resistance (ESR) and low effective series inductance (ESI)—typical of the common ceramic types that provide a low impedance path to ground at high frequencies— to handle transient currents due to internal logic switching. Digital lines running under the device should be avoided because they can couple noise onto the device. The analog ground plane should be allowed to run under the AD5372/AD5373 to avoid noise coupling. The power supply lines of the AD5372/AD5373 should use as large a trace as possible to provide low impedance paths and reduce the effects of glitches on the power supply line. Fast switching digital signals should be shielded with digital ground to avoid radiating noise to other parts of the board, and they should never be run near the reference inputs. It is essential to minimize noise on the VREF0 and VREF1 lines. Avoid crossover of digital and analog signals. Traces on opposite sides of the board should run at right angles to each other. This reduces the effects of feedthrough through the board. A microstrip technique is by far the best approach, but it is not always possible with a double-sided board. In this technique, the component side of the board is dedicated to ground plane, while signal traces are placed on the solder side. SPISELx SYNC SCK SCLK MOSI SDI MISO SDO PF10 RESET PF9 LDAC PF8 CLR PF7 BUSY ADSP-BF531 AD5372/ AD5373 05815-021 In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to ensure the rated performance. The printed circuit boards on which the AD5372/AD5373 are mounted should be designed so that the analog and digital sections are separated and confined to certain areas of the board. If the AD5372/AD5373 are in a system where multiple devices require an AGND-to-DGND connection, the connection should be made at one point only. The star ground point should be established as close as possible to the device. For supplies with multiple pins (VSS, VDD, DVCC), it is recommended that these pins be tied together and that each supply be decoupled only once. be taken to ensure that the ground pins are connected to the supply grounds before the positive or negative supplies are connected. This is required to prevent currents from flowing in directions other than toward an analog or digital ground. Figure 22. Interfacing to a Blackfin DSP The Analog Devices ADSP-21065L is a floating-point DSP with two serial ports (SPORTs). Figure 23 shows how one SPORT can be used to control the AD5372/AD5373. In this example, the transmit frame synchronization (TFSx) pin is connected to the receive frame synchronization (RFSx) pin. Similarly, the transmit and receive clocks (TCLKx and RCLKx) are also connected. The user can write to the AD5372/AD5373 by writing to the transmit register of the ADSP-21065L. A read operation can be accomplished by first writing to the AD5372/AD5373 to tell the part that a read operation is required. A second write operation with an NOP instruction causes the data to be read from the AD5372/AD5373. The DSP receive interrupt can be used to indicate when the read operation is complete. As is the case for all thin packages, care must be taken to avoid flexing the package and to avoid a point load on the surface of this package during the assembly process. POWER SUPPLY SEQUENCING When the supplies are connected to the AD5372/AD5373, it is important that the AGND and DGND pins be connected to the relevant ground plane before the positive or negative supplies are applied. In most applications, this is not an issue because the ground pins for the power supplies are connected to the ground pins of the AD5372/AD5373 via ground planes. When the AD5372/AD5373 are to be used in a hot-swap card, care should Rev. C | Page 24 of 28 AD5372/ AD5373 ADSP-21065L TFSx RFSx SYNC TCLKx RCLKx SCLK DTxA SDI DRxA SDO FLAG0 RESET FLAG1 LDAC FLAG2 CLR FLAG3 BUSY Figure 23. Interfacing to an ADSP-21065L DSP 05815-022 POWER SUPPLY DECOUPLING AD5372/AD5373 OUTLINE DIMENSIONS 0.60 MAX 9.00 BSC SQ 0.60 MAX 64 1 49 PIN 1 INDICATOR 48 PIN 1 INDICATOR 0.50 BSC 8.75 BSC SQ (BOTTOM VIEW) 0.50 0.40 0.30 16 17 33 32 0.25 MIN 7.50 REF 0.80 MAX 0.65 TYP 12° MAX FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. 0.05 MAX 0.02 NOM 0.30 0.23 0.18 SEATING PLANE 0.20 REF COMPLIANT TO JEDEC STANDARDS MO-220-VMMD-4 Figure 24. 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] 9 mm × 9 mm Body, Very Thin Quad (CP-64-3) Dimensions shown in millimeters 0.75 0.60 0.45 12.20 12.00 SQ 11.80 1.60 MAX 64 49 1 48 PIN 1 10.20 10.00 SQ 9.80 TOP VIEW (PINS DOWN) 1.45 1.40 1.35 0.15 0.05 SEATING PLANE VIEW A 0.20 0.09 7° 3.5° 0° 0.08 COPLANARITY 16 33 32 17 VIEW A 0.50 BSC LEAD PITCH 0.27 0.22 0.17 ROTATED 90° CCW COMPLIANT TO JEDEC STANDARDS MS-026-BCD Figure 25. 64-Lead Low Profile Quad Flat Package [LQFP] (ST-64-2) Dimensions shown in millimeters Rev. C | Page 25 of 28 051706-A 1.00 0.85 0.80 7.25 7.10 SQ 6.95 EXPOSED PAD 080108-C TOP VIEW AD5372/AD5373 ORDERING GUIDE Model 1 AD5372BSTZ AD5372BSTZ-REEL AD5372BCPZ AD5372BCPZ-RL7 AD5373BSTZ AD5373BSTZ-REEL AD5373BCPZ AD5373BCPZ-RL7 EVAL-AD5372EBZ EVAL-AD5373EBZ 1 Temperature Range −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C Package Description 64-Lead Low Profile Quad Flat Package (LQFP) 64-Lead Low Profile Quad Flat Package (LQFP) 64-Lead Lead Frame Chip Scale Package (LFCSP_VQ) 64-Lead Lead Frame Chip Scale Package (LFCSP_VQ) 64-Lead Low Profile Quad Flat Package (LQFP) 64-Lead Low Profile Quad Flat Package (LQFP) 64-Lead Lead Frame Chip Scale Package (LFCSP_VQ) 64-Lead Lead Frame Chip Scale Package (LFCSP_VQ) Evaluation Board Evaluation Board Z = RoHS Compliant Part. Rev. C | Page 26 of 28 Package Option ST-64-2 ST-64-2 CP-64-3 CP-64-3 ST-64-2 ST-64-2 CP-64-3 CP-64-3 AD5372/AD5373 NOTES Rev. C | Page 27 of 28 AD5372/AD5373 NOTES ©2007–2011 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05815-0-7/11(C) Rev. C | Page 28 of 28