STMicroelectronics M58LW032C110N1T 32 mbit 2mb x16, uniform block, burst 3v supply flash memory Datasheet

M58LW032C
32 Mbit (2Mb x16, Uniform Block, Burst)
3V Supply Flash Memory
FEATURES SUMMARY
■ WIDE x16 DATA BUS for HIGH BANDWIDTH
■
Figure 1. Packages
SUPPLY VOLTAGE
– VDD = 2.7 to 3.6V core supply voltage for Program, Erase and Read operations
■
– VDDQ = 1.8 to VDD for I/O Buffers
SYNCHRONOUS/ASYNCHRONOUS READ
– Synchronous Burst read
– Asynchronous Random Read
– Asynchronous Address Latch Controlled
Read
TSOP56 (N)
14 x 20 mm
– Page Read
■
ACCESS TIME
TBGA
– Synchronous Burst Read up to 56MHz
– Asynchronous Page Mode Read 90/25ns,
110/25ns
– Random Read 90ns, 110ns
■
TBGA64 (ZA)
10 x 13 mm
PROGRAMMING TIME
– 16 Word Write Buffer
– 12µs Word effective programming time
■
32 UNIFORM 64 KWord MEMORY BLOCKS
■
ENHANCED SECURITY
– Block Protection/ Unprotection
– Smart Protection: irreversible block locking
system
– VPEN signal for Program Erase Enable
– 128 bit Protection Register with 64 bit Unique
Code in OTP area
■
PROGRAM and ERASE SUSPEND
■
COMMON FLASH INTERFACE
■
100,000 PROGRAM/ERASE CYCLES per
BLOCK
■
ELECTRONIC SIGNATURE
– Manufacturer Code: 0020h
– Device Code M58LW032C : 8822h
April 2003
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TABLE OF CONTENTS
SUMMARY DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 2. Logic Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 1. Signal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 3. TSOP56 Connections. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Figure 4. TBGA64 Connections (Top view through package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Figure 5. Block Addresses. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
SIGNAL DESCRIPTIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Address Inputs (A1-A21). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Data Inputs/Outputs (DQ0-DQ15). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Chip Enable (E). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Output Enable (G). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Write Enable (W). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Reset/Power-Down (RP). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Latch Enable (L). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Clock (K).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Valid Data Ready (R). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Status/(Ready/Busy) (STS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Program/Erase Enable (VPEN). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
VDD Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
VDDQ Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
VSS Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
VSSQ Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
BUS OPERATIONS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Address Latch.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Bus Read. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Bus Write. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Output Disable. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Power-Down. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Standby. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Table 2. Bus Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
READ MODES. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Asynchronous Read Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Asynchronous Latch Controlled Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Asynchronous Random Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Asynchronous Page Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Synchronous Read Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Synchronous Burst Read. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Single Synchronous Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
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CONFIGURATION REGISTER . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Read Select Bit (CR15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
X-Latency Bits (CR13-CR11). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Internal Clock Divider Bit (CR10). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Y-Latency Bit (CR9). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Valid Data Ready Bit (CR8). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Burst Type Bit (CR7). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Valid Clock Edge Bit (CR6). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Burst Length Bit (CR2-CR0). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Table 3. Configuration Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Table 4. Burst Type Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Figure 6. Burst Configuration X-1-1-1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Figure 7. Burst Configuration X-2-2-2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
COMMAND INTERFACE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Read Memory Array Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Read Electronic Signature Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Read Query Command.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Read Status Register Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Clear Status Register Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Block Erase Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Word Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Write to Buffer and Program Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Program/Erase Suspend Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Program/Erase Resume Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Set Configuration Register Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Block Protect Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Blocks Unprotect Command.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Protection Register Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Configure STS Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Table 5. Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Table 6. Configuration Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Table 7. Read Electronic Signature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Table 8. Read Protection Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Figure 8. Protection Register Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Table 9. Program, Erase Times and Program Erase Endurance Cycles . . . . . . . . . . . . . . . . . . . 25
STATUS REGISTER . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Program/Erase Controller Status Bit (SR7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Erase Suspend Status Bit ( SR6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Erase Status Bit (SR5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Program Status Bit (SR4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
VPEN Status Bit (SR3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Program Suspend Status Bit (SR2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Block Protection Status Bit (SR1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
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Reserved (SR0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Table 10. Status Register Bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
MAXIMUM RATING. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Table 11. Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
DC and AC PARAMETERS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 12. Operating and AC Measurement Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Figure 9. AC Measurement Input Output Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Figure 10. AC Measurement Load Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 13. Capacitance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 14. DC Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Figure 11. Asynchronous Bus Read AC Waveforms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Table 15. Asynchronous Bus Read AC Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 12. Asynchronous Latch Controlled Bus Read AC Waveforms . . . . . . . . . . . . . . . . . . . . . 33
Table 16. Asynchronous Latch Controlled Bus Read AC Characteristics . . . . . . . . . . . . . . . . . . . 33
Figure 13. Asynchronous Page Read AC Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Table 17. Asynchronous Page Read AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 14. Asynchronous Write AC Waveform, Write Enable Controlled . . . . . . . . . . . . . . . . . . . 35
Figure 15. Asynchronous Latch Controlled Write AC Waveform, Write Enable Controlled . . . . . . 35
Table 18. Asynchronous Write and Latch Controlled Write AC Characteristics, Write Enable
Controlled. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 16. Asynchronous Write AC Waveforms, Chip Enable Controlled . . . . . . . . . . . . . . . . . . . 37
Figure 17. Asynchronous Latch Controlled Write AC Waveforms, Chip Enable Controlled . . . . . 37
Table 19. Asynchronous Write and Latch Controlled Write AC Characteristics, Chip Enable
Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 18. Synchronous Burst Read AC Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 19. Synchronous Burst Read - Continuous - Valid Data Ready Output . . . . . . . . . . . . . . . 40
Table 20. Synchronous Burst Read AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Figure 20. Reset, Power-Down and Power-up AC Waveform. . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Table 21. Reset, Power-Down and Power-up AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 41
PACKAGE MECHANICAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Figure 21. TSOP56 - 56 lead Plastic Thin Small Outline, 14 x 20 mm, Package Outline . . . . . . .
Table 22. TSOP56 - 56 lead Plastic Thin Small Outline, 14 x 20 mm, Package Mechanical Data
Figure 22. TBGA64 10x13mm - 8x8 ball array, 1mm pitch, Package Outline . . . . . . . . . . . . . . . .
Table 23. TBGA64 10x13mm - 8x8 ball array, 1mm pitch, Package Mechanical Data . . . . . . . . .
42
42
43
43
PART NUMBERING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 24. Ordering Information Scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 4
APPENDIX A. BLOCK ADDRESS TABLE. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 25. Block Addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
APPENDIX B. COMMON FLASH INTERFACE - CFI. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Table 26. Query Structure Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
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Table 27. CFI - Query Address and Data Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 28. CFI - Device Voltage and Timing Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 29. Device Geometry Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 30. Block Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 31. Extended Query information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
46
47
47
48
49
APPENDIX C. FLOW CHARTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Figure 23. Write to Buffer and Program Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . .
Figure 24. Program Suspend & Resume Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . .
Figure 25. Erase Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 26. Erase Suspend & Resume Flowchart and Pseudo Code. . . . . . . . . . . . . . . . . . . . . . .
Figure 27. Block Protect Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 28. Blocks Unprotect Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 29. Protection Register Program Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . .
Figure 30. Command Interface and Program Erase Controller Flowchart (a) . . . . . . . . . . . . . . . .
Figure 31. Command Interface and Program Erase Controller Flowchart (b) . . . . . . . . . . . . . . . .
Figure 32. Command Interface and Program Erase Controller Flowchart (c). . . . . . . . . . . . . . . .
50
51
52
53
54
55
56
57
58
59
REVISION HISTORY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Table 32. Document Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
5/61
M58LW032C
SUMMARY DESCRIPTION
M58LW032C is a 32 Mbit (2Mb x16) non-volatile
memory that can be read, erased and reprogrammed. These operations can be performed using a single low voltage (2.7V to 3.6V) core supply.
On power-up the memory defaults to Read mode
with an asynchronous bus where it can be read in
the same way as a non-burst Flash memory.
The memory is divided into 32 blocks of 1Mbit that
can be erased independently so it is possible to
preserve valid data while old data is erased. Program and Erase commands are written to the
Command Interface of the memory. An on-chip
Program/Erase Controller simplifies the process of
programming or erasing the memory by taking
care of all of the special operations that are required to update the memory contents. The end of
a Program or Erase operation can be detected and
any error conditions identified in the Status Register. The command set required to control the
memory is consistent with JEDEC standards.
The device supports synchronous burst read and
asynchronous read from all blocks of the memory
array; at power-up the device is configured for
asynchronous read. In asynchronous mode an
Address Latch input can be used to latch addresses in Latch Controlled mode. In synchronous burst
mode, data is output on each clock cycle at frequencies of up to 56MHz.
The Write Buffer allows the microprocessor to program from 1 to 16 Words in parallel, both speeding
up the programming and freeing up the microprocessor to perform other work. A Word Program
command is available to program a single Word.
Erase can be suspended in order to perform either
Read or Program in any other block and then resumed. Program can be suspended to Read data
in any other block and then resumed. Each block
can be programmed and erased over 100,000 cycles.
The M58LW032C has several security features to
increase data protection.
6/61
Block Protection, where each block can be
individually protected against program or erase
operations. All blocks are protected during
power-up. The protection of the blocks is nonvolatile; after power-up the protection status of
each block is restored to the state when power
was last removed.
■ Program Erase Enable input VPEN, program or
erase operations are not possible when the
Program Erase Enable input VPEN is low.
■ Smart Protection, which allows protected blocks
to be permanently locked. This feature is not
described in the datasheet for security reasons.
Please contact STMicroelectronics for further
details.
■ 128 bit Protection Register, divided into two 64
bit segments: the first contains a unique device
number written by ST, the second is user
programmable. The user programmable
segment can be protected.
The Reset/Power-Down pin is used to apply a
Hardware Reset to the memory and to set the device in power-down mode.
The device features an Auto Low Power mode. If
the bus becomes inactive during Asynchronous
Read operations, the device automatically enters
Auto Low Power mode. In this mode the power
consumption is reduced to the Auto Low Power
supply current.
The STS signal is an open drain output that can be
used to identify the Program/Erase Controller status. It can be configured in two modes: Ready/
Busy mode where a static signal indicates the status of the P/E.C, and Status mode where a pulsing
signal indicates the end of a Program or Block
Erase operation. In Status mode it can be used as
a system interrupt signal, useful for saving CPU
time.
The memory is available in TSOP56 (14 x 20 mm)
and TBGA64 (10 x 13mm, 1mm pitch) packages.
■
M58LW032C
Figure 2. Logic Diagram
Table 1. Signal Names
A1-A21
Address inputs
DQ0-DQ15
Data Inputs/Outputs
E
Chip Enable
G
Output Enable
K
Clock
L
Latch Enable
R
Valid Data Ready
STS
Status/(Ready/Busy)
RP
Reset/Power-Down
STS
VPEN
Program/Erase Enable
R
W
Write Enable
VDD
Supply Voltage
VDDQ
Input/Output Supply Voltage
VSS
Ground
VSSQ
Input/Output Ground
NC
Not Connected Internally
VDD VDDQ
21
A1-A21
VPEN
16
W
E
DQ0-DQ15
M58LW032C
G
RP
L
K
VSS VSSQ
AI06208
7/61
M58LW032C
Figure 3. TSOP56 Connections
NC
R
A21
A20
A19
A18
A17
A16
VDD
A15
A14
A13
A12
E
VPEN
RP
A11
A10
A9
A8
VSS
A7
A6
A5
A4
A3
A2
A1
1
56
14
43
M58LW032C
15
42
28
29
NC
W
G
STS
DQ15
DQ7
DQ14
DQ6
VSS
DQ13
DQ5
DQ12
DQ4
VDDQ
VSSQ
DQ11
DQ3
DQ10
DQ2
VDD
DQ9
DQ1
DQ8
DQ0
NC
K
NC
L
AI06209
8/61
M58LW032C
Figure 4. TBGA64 Connections (Top view through package)
1
2
3
4
5
6
7
8
A
A1
A6
A8
VPEN
A13
VDD
A18
NC
B
A2
VSS
A9
E
A14
NC
A19
R
C
A3
A7
A10
A12
A15
NC
A20
A21
D
A4
A5
A11
RP
NC
NC
A16
A17
E
DQ8
DQ1
DQ9
DQ3
DQ4
NC
DQ15
STS
F
K
DQ0
DQ10
DQ11
DQ12
NC
NC
G
G
NC
NC
DQ2
VDDQ
DQ5
DQ6
DQ14
W
H
L
NC
VDD
VSS
DQ13
VSSQ
DQ7
NC
AI06210b
9/61
M58LW032C
Figure 5. Block Addresses
Word (x16) Bus Width
1FFFFFh
1F0000h
1EFFFFh
1 Mbit or
64 KWords
1 Mbit or
64 KWords
1E0000h
Total of 32
1 Mbit Blocks
01FFFFh
010000h
00FFFFh
1 Mbit or
64 KWords
1 Mbit or
64 KWords
000000h
AI06254
Note: Also see Appendix A, Table 25 for a full listing of the Block Addresses.
10/61
M58LW032C
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram and Table 11, Signal
Names, for a brief overview of the signals connected to this device.
Address Inputs (A1-A21). The Address Inputs
are used to select the cells to access in the memory array during Bus Read operations either to
read or to program data to. During Bus Write operations they control the commands sent to the
Command Interface of the internal state machine.
Chip Enable and Latch Enable must be low when
selecting the addresses.
The address inputs are latched on the rising edge
of Chip Enable, Write Enable or Latch Enable,
whichever occurs first in a Write operation. The
address latch is transparent when Latch Enable is
low, VIL. The address is internally latched in an
Erase or Program operation.
Data Inputs/Outputs (DQ0-DQ15). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation, or are used
to input the data during a program operation. During Bus Write operations they represent the commands sent to the Command Interface of the
internal state machine. When used to input data or
Write commands they are latched on the rising
edge of Write Enable or Chip Enable, whichever
occurs first.
When Chip Enable and Output Enable are both
low, V IL, the data bus outputs data from the memory array, the Electronic Signature, the Block Protection status, the CFI Information or the contents
of the Status Register. The data bus is high impedance when the chip is deselected, Output Enable
is high, VIH, or the Reset/Power-Down signal is
low, V IL. When the Program/Erase Controller is
active the Ready/Busy status is given on DQ7.
Chip Enable (E). The Chip Enable, E, input activates the memory control logic, input buffers, decoders and sense amplifiers. Chip Enable, E, at
VIH deselects the memory and reduces the power
consumption to the Standby level, IDD1.
Output Enable (G). The Output Enable, G, gates
the outputs through the data output buffers during
a read operation. When Output Enable, G, is at VIH
the outputs are high impedance. Output Enable,
G, can be used to inhibit the data output during a
burst read operation.
Write Enable (W). The Write Enable input, W,
controls writing to the Command Interface, Input
Address and Data latches. Both addresses and
data can be latched on the rising edge of Write Enable (also see Latch Enable, L).
Reset/PowerReset/Power-Down (RP). The
Down pin can be used to apply a Hardware Reset
to the memory.
A Hardware Reset is achieved by holding Reset/
Power-Down Low, VIL, for at least tPLPH. When
Reset/Power-Down is Low, VIL, the Status Register information is cleared and the power consumption is reduced to power-down level. The device is
deselected and outputs are high impedance. If Reset/Power-Down goes low, V IL,during a Block
Erase, a Write to Buffer and Program or a Block
Protect/Unprotect the operation is aborted and the
data may be corrupted. In this case the Ready/
Busy pin stays low, V IL, for a maximum timing of
tPLPH + tPHRH, until the completion of the Reset/
Power-Down pulse.
After Reset/Power-Down goes High, V IH, the
memory will be ready for Bus Read and Bus Write
operations after tPHQV. Note that Ready/Busy
does not fall during a reset, see Ready/Busy Output section.
In an application, it is recommended to associate
Reset/Power-Down pin, RP, with the reset signal
of the microprocessor. Otherwise, if a reset operation occurs while the memory is performing an
Erase or Program operation, the memory may output the Status Register information instead of being initialized to the default Asynchronous
Random Read.
Latch Enable (L). The Bus Interface is configured to latch the Address Inputs on the rising edge
of Latch Enable, L. In synchronous bus operations
the address is latched on the active edge of the
Clock when Latch Enable is Low, V IL or on the rising of Latch Enable, whichever occurs first. Once
latched, the addresses may change without affecting the address used by the memory. When Latch
Enable is Low, VIL, the latch is transparent.
Clock (K). The Clock, K, is used to synchronize
the memory with the external bus during Synchronous Bus Read operations. The Clock can be configured to have an active rising or falling edge. Bus
signals are latched on the active edge of the Clock
during synchronous bus operations. In Synchronous Burst Read mode the address is latched on
the first active clock edge when Latch Enable is
low, VIL, or on the rising edge of Latch Enable,
whichever occurs first.
During asynchronous bus operations the Clock is
not used.
Valid Data Ready (R). The Valid Data Ready
output, R, is an open drain output that can be used
to identify if the memory is ready to output data or
not. The Valid Data Ready output is only active
during Synchronous Burst Read operations when
the Burst Length is set to Continuous. The Valid
Data Ready output can be configured to be active
on the clock edge of the invalid data read cycle or
one cycle before. Valid Data Ready Low, V OL, in-
11/61
M58LW032C
dicates that the data is not, or will not be valid. Valid Data Ready in a high-impedance state indicates
that valid data is or will be available.
Unless Synchronous Burst Read has been selected, Valid Data Ready is high-impedance. It may be
tied to other components with the same Valid Data
Ready signal to create a unique System Ready
signal.
The Valid Data Ready, R, output has an internal
pull-up resistor of approximately 1 MΩ powered
from VDDQ, designers should use an external pullup resistor of the correct value to meet the external
timing requirements for Valid Data Ready rising.
Refer to Figure 19.
Status/(Ready/Busy) (STS). The STS signal is
an open drain output that can be used to identify
the Program/Erase Controller status. It can be
configured in two modes:
■ Ready/Busy - the pin is Low, VOL, during
Program and Erase operations and high
impedance when the memory is ready for any
Read, Program or Erase operation.
■ Status - the pin gives a pulsing signal to indicate
the end of a Program or Block Erase operation.
After power-up or reset the STS pin is configured
in Ready/Busy mode. The pin can be configured
for Status mode using the Configure STS command.
When the Program/Erase Controller is idle, or suspended, STS can float High through a pull-up resistor. The use of an open-drain output allows the
STS pins from several memories to be connected
to a single pull-up resistor (a Low will indicate that
one, or more, of the memories is busy).
12/61
STS is not Low during a reset unless the reset was
applied when the Program/Erase controller was
active. Ready/Busy can rise before Reset/PowerDown rises.
Program/Erase Enable (VPEN). The Program/
Erase Enable input, VPEN, is used to protect all
blocks, preventing Program and Erase operations
from affecting their data.
Program/Erase Enable must be kept High during
all Program/Erase Controller operations, otherwise the operations is not guaranteed to succeed
and data may become corrupt.
VDD Supply Voltage. VDD provides the power
supply to the internal core of the memory device.
It is the main power supply for all operations
(Read, Program and Erase).
VDDQ Supply Voltage. VDDQ provides the power
supply to the I/O pins and enables all Outputs to
be powered independently from VDD. VDDQ can be
tied to VDD or can use a separate supply.
It is recommended to power-up and power-down
VDD and VDDQ together to avoid any condition that
would result in data corruption.
VSS Ground. Ground, VSS, is the reference for
the core power supply. It must be connected to the
system ground.
VSSQ Ground. VSSQ ground is the reference for
the input/output circuitry driven by V DDQ. VSSQ
must be connected to V SS.
Note: Each device in a system should have
VDD and VDDQ decoupled with a 0.1µF ceramic
capacitor close to the pin (high frequency, inherently low inductance capacitors should be
as close as possible to the package). See Figure 10, AC Measurement Load Circuit.
M58LW032C
BUS OPERATIONS
There are six standard bus operations that control
the device. These are Address Latch, Bus Read,
Bus Write, Output Disable, Power-Down and
Standby. See Table 2, Bus Operations, for a summary.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect Bus Write operations.
Address Latch. Address latch operations input
valid addresses.
A valid bus operation involves setting the desired
address on the Address Inputs, setting Chip Enable and Latch Enable Low, V IL and keeping Write
Enable High, VIH; the address is latched on the rising edge of Address Latch.
Bus Read. Bus Read operations are used to output the contents of the Memory Array, the Electronic Signature, the Status Register, the Common
Flash Interface and the Block Protection Status.
A valid bus operation involves setting the desired
address on the Address Inputs, applying a Low
signal, V IL, to Chip Enable, Output Enable and
Latch Enable and keeping Write Enable High, V IH.
The data read depends on the previous command
written to the memory (see Command Interface
section). See Figures 11, 12, 13, 18 and 19 Read
AC Waveforms, and Tables 15, 16, 17 and 20
Read AC Characteristics, for details of when the
output becomes valid.
Bus Write. Bus Write operations write Commands to the memory or latch addresses and input
data to be programmed.
A valid Bus Write operation begins by setting the
desired address on the Address Inputs and setting
Latch Enable Low, V IL. The Address Inputs are
latched by the Command Interface on the rising
edge of Chip Enable or Write Enable, whichever
occurs first. The Data Inputs/Outputs are latched
by the Command Interface on the rising edge of
Chip Enable or Write Enable, whichever occurs
first. Output Enable must remain High, V IH, during
the Bus Write operation.
See Figures 14, 15, 16 and 17, Write AC Waveforms, and Tables 18 and 19, Write AC Characteristics, for details of the timing requirements.
Output Disable. The The Data Inputs/Outputs
are high impedance when the Output Enable is at
VIH.
Power-Down. The memory is in Power-Down
mode when Reset/Power-Down, RP, is Low. The
power consumption is reduced to the Power-Down
level, IDD2, and the outputs are high impedance,
independent of Chip Enable, Output Enable or
Write Enable.
Standby. Standby disables most of the internal
circuitry, allowing a substantial reduction of the
current consumption. The memory is in standby
when Chip Enable is at VIH. The power consumption is reduced to the standby level IDD1 and the
outputs are set to high impedance, independently
from the Output Enable or Write Enable inputs.
If Chip Enable switches to V IH during a program or
erase operation, the device enters Standby mode
when finished.
Table 2. Bus Operations
Operation
E
G
W
RP
L
A1-A21
DQ0-DQ15
Address Latch
VIL
X
VIH
VIH
VIL
Address
Data Output or Hi-Z (2)
Bus Read
VIL
VIL
VIH
VIH
VIL
Address
Data Output
Bus Write
VIL
VIH
VIL
VIH
VIL
Address
Data Input
Output Disable
VIL
VIH
VIH
VIH
X
X
High Z
Power-Down
X
X
X
VIL
X
X
High Z
Standby
VIH
X
X
VIH
X
X
High Z
Note: 1. X = Don’t Care VIL or VIH .
2. Depends on G
13/61
M58LW032C
READ MODES
Read operations can be performed in two different
ways depending on the settings in the Configuration Register. If the clock signal is ‘don’t care’ for
the data output, the read operation is asynchronous; if the data output is synchronized with clock,
the read operation is synchronous.
The read mode and format of the data output are
determined by the Configuration Register. (See
Configuration Register section for details).
On Power-up or after a Hardware Reset the memory defaults to Asynchronous Read mode.
Asynchronous Read Modes
In Asynchronous Read operations the clock signal
is ‘don’t care’. The device outputs the data corresponding to the address latched, that is the memory array, Status Register, Common Flash
Interface, Electronic Signature or Block Protection
Status depending on the command issued. CR15
in the Configuration Register must be set to ‘1’ for
asynchronous operations.
During Asynchronous Read operations, if the bus
is inactive for a time equivalent to tAVQV, the device automatically enters Auto Low Power mode.
In this mode the internal supply current is reduced
to the Auto Low Power supply current, IDD5. The
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Automatic Low Power is only available in Asynchronous Read modes.
Asynchronous Read operations can be performed
in three different ways, Asynchronous Latch Controlled Read, Asynchronous Random Read and
Asynchronous Page Read.
Asynchronous Latch Controlled Read.
In Asynchronous Latch Controlled Read operations read the address is latched in the memory
before the value is output on the data bus, allowing
the address to change during the cycle without affecting the address that the memory uses.
A valid bus operation involves setting the desired
address on the Address Inputs, setting Chip Enable and Latch Enable Low, V IL and keeping Write
Enable High, VIH; the address is latched on the rising edge of Address Latch. Once latched, the Address Inputs can change. Set Output Enable Low,
VIL, to read the data on the Data Inputs/Outputs;
see Figure 12, Asynchronous Latch Controlled
Read AC Waveforms and Table 16, Asynchronous Latch Controlled Read AC Characteristics for
details on when the output becomes valid.
See Figures 12, Asynchronous Latch Controlled
Read AC Waveforms, and Table 16, Asynchronous Latch Controlled Read AC Characteristics,
for details.
14/61
Asynchronous Random Read. As the Latch Enable input is transparent when set Low, V IL, Asynchronous Random Read operations can be
performed by holding Latch Enable Low, VIL
throughout the bus operation.
See Figures 11, Asynchronous Random Read AC
Waveforms, and Table 15, Asynchronous Random Read AC Characteristics, for details.
Asynchronous Page Read. In
Asynchronous
Page Read mode a Page of data is internally read
and stored in a Page Buffer. Each memory page is
4 Words and has the same A3-A22, only A1 and
A2 may change.
The first read operation within the Page has the
normal access time (tAVQV), subsequent reads
within the same Page have much shorter access
times (tAVQV1). If the Page changes then the normal, longer timings apply again.
See Figures 13, Asynchronous Page Read AC
Waveforms, and Table 17, Asynchronous Page
Read AC Characteristics, for details.
Synchronous Read Modes
In Synchronous Read mode the data output is synchronized with the clock. CR15 in the Configuration Register must be set to ‘0’ for synchronous
operations.
Synchronous Burst Read. In
Synchronous
Burst Read mode the data is output in bursts synchronized with the clock. It is possible to perform
burst reads across bank boundaries.
Synchronous Burst Read mode can only be used
to read the memory array. For other read operations, such as Read Status Register, Read CFI,
Read Electronic Signature and Block Protection
Status, Single Synchronous Read or Asynchronous Read must be used.
In Synchronous Burst Read mode the flow of the
data output depends on parameters that are configured in the Configuration Register.
A valid Synchronous Burst Read operation begins
when the address is set on the Address Inputs,
Write Enable is High, VIH, and Chip Enable and
Latch Enable are Low, V IL, during the active edge
of the Clock. The address is latched on the first active clock edge when Latch Enable is low, or on
the rising edge of Latch Enable, whichever occurs
first. The data becomes available for output after
the X-latency specified in the Burst Control Register has expired. The output buffers are activated
by setting Output Enable Low, V IL. See Figures 6
and 7 for examples of Synchronous Burst Read
operations.
The number of Words to be output during a Synchronous Burst Read operation can be configured
as 4 Words, 8 Words or Continuous (Burst Length
M58LW032C
bits CR2-CR0). In Synchronous Continuous Burst
Read mode one Burst Read operation can access
the entire memory sequentially. If the starting address is not associated with a page (4 Word)
boundary the Valid Data Ready, R, output goes
Low, V IL, to indicate that the data will not be ready
in time and additional wait-states are required. The
Valid Data Ready output timing (bit CR8) can be
changed in the Configuration Register.
The order of the data output can be modified
through the Burst Type bit in the Configuration
Register. The burst sequence can be sequential or
interleaved.
See Table 20, Synchronous Read AC Characteristics and Figure 18 and 19, Synchronous Burst
Read AC Waveform for details.
Single Synchronous Read. Single
Synchronous Read operations are similar to Synchronous
Burst Read operations except that only the first
data output after the X latency is valid. Single Synchronous Reads are used to read the Status Register, CFI, Electronic Signature and Block
Protection Status.
15/61
M58LW032C
CONFIGURATION REGISTER
The Configuration Register is used to configure
the type of bus access that the memory will perform. The Configuration Register bits are described in Table 3. They specify the selection of
the burst length, burst type, burst X and Y latencies and the Read operation. See figures 6 and 7
for examples of Synchronous Burst Read configurations.
The Configuration Register is set through the
Command Interface and will retain its information
until it is re-configured, the device is reset, or the
device goes into Reset/Power-Down mode. The
Configuration Register is read using the Read
Electronic Signature Command at address 05h.
Read Select Bit (CR15). The Read Select bit,
CR15, is used to switch between asynchronous
and synchronous Bus Read operations. When the
Read Select bit is set to ’1’, Bus Read operations
are asynchronous; when the Read Select but is
set to ’0’, Bus Read operations are synchronous.
On reset or power-up the Read Select bit is set to
’1’ for asynchronous access.
X-Latency Bits (CR13-CR11). The
X-Latency
bits are used during Synchronous Bus Read operations to set the number of clock cycles between
the address being latched and the first data becoming available. For correct operation the X-Latency bits can only assume the values in Table 3,
Configuration Register.
Internal Clock Divider Bit (CR10). The Internal
Clock Divider Bit is used to divide the internal clock
by two. When CR10 is set to ‘1’ the internal clock
is divided by two, which effectively means that the
X and Y-Latency values are multiplied by two, that
is the number of clock cycles between the address
being latched and the first data becoming available will be twice the value set in CR13-CR11, and
the number of clock cycles between consecutive
reads will be twice the value set in CR9. For example 8-1-1-1 will become 16-2-2-2. When CR10 is
set to ‘0’ the internal clock runs normally and the X
and Y-Latency values are those set in CR13-CR11
and CR9.
Y-Latency Bit (CR9). The Y-Latency bit is used
during Synchronous Bus Read operations to set
16/61
the number of clock cycles between consecutive
reads. The Y-Latency value depends on both the
X-Latency value and the setting in CR9.
When the Y-Latency is 1 the data changes each
clock cycle; when the Y-Latency is 2 the data
changes every second clock cycle. See Table 3,
Configuration Register for valid combinations of
the Y-Latency, the X-Latency and the Clock frequency.
Valid Data Ready Bit (CR8). The Valid Data
Ready bit controls the timing of the Valid Data
Ready output pin, R. When the Valid Data Ready
bit is ’0’ the Valid Data Ready output pin is driven
Low for the active clock edge when invalid data is
output on the bus. When the Valid Data Ready bit
is ’1’ the Valid Data Ready output pin is driven Low
one clock cycle prior to invalid data being output
on the bus.
Burst Type Bit (CR7). The Burst Type bit is used
to configure the sequence of addresses read as
sequential or interleaved. When the Burst Type bit
is ’0’ the memory outputs from interleaved addresses; when the Burst Type bit is ’1’ the memory
outputs from sequential addresses. See Tables 4,
Burst Type Definition, for the sequence of addresses output from a given starting address in
each mode.
Valid Clock Edge Bit (CR6). The Valid Clock
Edge bit, CR6, is used to configure the active edge
of the Clock, K, during Synchronous Burst Read
operations. When the Valid Clock Edge bit is ’0’
the falling edge of the Clock is the active edge;
when the Valid Clock Edge bit is ’1’ the rising edge
of the Clock is active.
Burst Length Bit (CR2-CR0). The Burst Length
bits set the maximum number of Words that can
be output during a Synchronous Burst Read operation.
Table 3, Configuration Register gives the valid
combinations of the Burst Length bits that the
memory accepts; Tables 4, Burst Type Definition,
give the sequence of addresses output from a given starting address for each length.
CR5 CR4 and CR3 are reserved for future use.
M58LW032C
Table 3. Configuration Register
Address
Bit
Mnemonic
Bit Name
Reset
Value
16
CR15
Read Select
1
15
14
to
12
11
10
9
8
7
6 to 4
3
to
1
Value
0
Synchronous Burst Read
1
Asynchronous Bus Read (default at power-up)
CR14
CR13-CR11
CR10
CR9
CR8
CR7
CR6
Reserved
X-Latency(2)
Internal
Clock Divider
Reserved
010
X-Latency = 4, 4-1-1-1 (use only with Y-Latency = 1)(1)
011
X-Latency = 5, 5-1-1-1, 5-2-2-2
100
X-Latency = 6, 6-1-1-1, 6-2-2-2
101
X-Latency = 7, 7-1-1-1, 7-2-2-2
110
X-Latency = 8, 8-1-1-1, 8-2-2-2
XXX
0
X and Y-Latencies remains as set in CR13-CR11 and
CR9
1
Divides internal clock, X and Y-Latencies multiplied by 2
0
Y-Latency = 1
1
Y-Latency = 2
0
R valid Low during valid Clock edge
1
R valid Low one cycle before valid Clock edge
0
Interleaved
1
Sequential
0
Falling Clock edge
1
Rising Clock edge
X
Y-Latency(3)
X
Valid Data
Ready
X
Burst Type
X
Valid Clock
Edge
001
X
CR5-CR3
CR2-CR0
Description
Reserved
Burst Length
XXX
001
4 Words
010
8 Words
111
Continuous
Note: 1. 4 - 2 - 2 - 2 (represents X-Y-Y-Y) is not allowed.
2. X latencies can be calculated as: (t AVQV – tLLKH + tQVKH) + tSYSTEM MARGIN < (X -1) tK. (X is an integer number from 4 to 8 and tK
is the clock period).
3. Y latencies can be calculated as: tKHQV + tSYSTEM MARGIN + tQVKH < Y tK.
4. tSYSTEM MARGIN is the time margin required for the calculation.
17/61
M58LW032C
Table 4. Burst Type Definition
Starting
Address
x4
Sequential
x4
Interleaved
x8
Sequential
x8
Interleaved
Continuous
0
0-1-2-3
0-1-2-3
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6-7-8-9-10..
1
1-2-3-0
1-0-3-2
1-2-3-4-5-6-7-0
1-0-3-2-5-4-7-6
1-2-3-4-5-6-7-8-9-10-11..
2
2-3-0-1
2-3-0-1
2-3-4-5-6-7-0-1
2-3-0-1-6-7-4-5
2-3-4-5-6-7-8-9-10-11-12..
3
3-0-1-2
3-2-1-0
3-4-5-6-7-0-1-2
3-2-1-0-7-6-5-4
3-4-5-6-7-8-9-10-11-12-13..
4
–
–
4-5-6-7-0-1-2-3
4-5-6-7-0-1-2-3
4-5-6-7-8-9-10-11-2-13-14..
5
–
–
5-6-7-0-1-2-3-4
5-4-7-6-1-0-3-2
5-6-7-8-9-10-11-12-13-14..
6
–
–
6-7-0-1-2-3-4-5
6-7-4-5-2-3-0-1
6-7-8-9-10-11-12-13-14-15..
7
–
–
7-0-1-2-3-4-5-6
7-6-5-4-3-2-1-0
7-8-9-10-11-12-13-14-15-16..
8
–
–
–
–
8-9-10-11-12-13-14-15-16-17..
Figure 6. Burst Configuration X-1-1-1
0
1
2
3
4
5
6
7
8
9
K
ADD
VALID
L
DQ
4-1-1-1
DQ
DQ
DQ
DQ
5-1-1-1
6-1-1-1
7-1-1-1
8-1-1-1
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
VALID
AI05512
18/61
M58LW032C
Figure 7. Burst Configuration X-2-2-2
0
1
2
3
4
5
6
7
8
9
K
ADD
VALID
L
DQ
DQ
DQ
DQ
NV
5-2-2-2
6-2-2-2
VALID
NV
VALID
NV
VALID
NV
VALID
NV
VALID
NV
NV
VALID
NV
VALID
NV
VALID
NV
7-2-2-2
8-2-2-2
NV=NOT VALID
AI05513
19/61
M58LW032C
COMMAND INTERFACE
All Bus Write operations to the memory are interpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. The Commands are summarized in Table
5, Commands. Refer to Table 5 in conjunction with
the text descriptions below.
After power-up or a Reset operation the memory
enters Read mode.
Synchronous Read operations and Latch Controlled Bus Read operations can only be used to
read the memory array. The Electronic Signature,
CFI or Status Register will be read in asynchronous mode or single synchronous burst mode.
Once the memory returns to Read Memory Array
mode the bus will resume the setting in the Configuration Register automatically.
Read Memory Array Command. The Read Memory Array command returns the memory to Read
mode. One Bus Write cycle is required to issue the
Read Memory Array command and return the
memory to Read mode. Once the command is issued the memory remains in Read mode until another command is issued. From Read mode Bus
Read commands will access the memory array.
While the Program/Erase Controller is executing a
Program, Erase, Block Protect, Blocks Unprotect
or Protection Register Program operation the
memory will not accept the Read Memory Array
command until the operation completes.
Read Electronic Signature Command. The Read
Electronic Signature command is used to read the
Manufacturer Code, the Device Code, the Block
Protection Status, the Configuration Register and
the Protection Register. One Bus Write cycle is required to issue the Read Electronic Signature
command. Once the command is issued subsequent Bus Read operations read the Manufacturer
Code, the Device Code, the Block Protection Status, the Configuration Register or the Protection
Register until another command is issued. Refer to
Table 7, Read Electronic Signature, Table 8, Read
Protection Register and Figure 8, Protection Register Memory Map for information on the addresses.
Read Query Command. The Read Query Command is used to read data from the Common Flash
Interface (CFI) Memory Area. One Bus Write cycle
is required to issue the Read Query Command.
Once the command is issued subsequent Bus
Read operations read from the Common Flash Interface Memory Area. See Appendix B, Tables 26,
27, 28, 29, 30 and 31 for details on the information
contained in the Common Flash Interface (CFI)
memory area.
Read Status Register Command. The Read Status Register command is used to read the Status
20/61
Register. One Bus Write cycle is required to issue
the Read Status Register command. Once the
command is issued subsequent Bus Read operations read the Status Register until another command is issued.
The Status Register information is present on the
output data bus (DQ1-DQ7) when both Chip Enable and Output Enable are low, V IL.
See the section on the Status Register and Table
10 for details on the definitions of the Status Register bits
Clear Status Register Command. The Clear Status Register command can be used to reset bits
SR1, SR3, SR4 and SR5 in the Status Register to
‘0’. One Bus Write is required to issue the Clear
Status Register command.
The bits in the Status Register are sticky and do
not automatically return to ‘0’ when a new Write to
Buffer and Program, Erase, Block Protect, Block
Unprotect or Protection Register Program command is issued. If any error occurs then it is essential to clear any error bits in the Status Register by
issuing the Clear Status Register command before
attempting a new Program, Erase or Resume
command.
Block Erase Command. The Block Erase command can be used to erase a block. It sets all of
the bits in the block to ‘1’. All previous data in the
block is lost. If the block is protected then the
Erase operation will abort, the data in the block will
not be changed and the Status Register will output
the error.
Two Bus Write operations are required to issue the
command; the second Bus Write cycle latches the
block address in the internal state machine and
starts the Program/Erase Controller. Once the
command is issued subsequent Bus Read operations read the Status Register. See the section on
the Status Register for details on the definitions of
the Status Register bits.
During the Erase operation the memory will only
accept the Read Status Register command and
the Program/Erase Suspend command. All other
commands will be ignored. Typical Erase times
are given in Table 9.
See Appendix C, Figure 25, Block Erase Flowchart and Pseudo Code, for a suggested flowchart
on using the Block Erase command.
Word Program Command. The Word Program
command is used to program a single word in the
memory array. Two Bus Write operations are required to issue the command; the first write cycle
sets up the Word Program command, the second
write cycle latches the address and data to be programmed in the internal state machine and starts
the Program/Erase Controller.
M58LW032C
If the block being programmed is protected an error will be set in the Status Register and the operation will abort without affecting the data in the
memory array. The block must be unprotected using the Blocks Unprotect command.
Write to Buffer and Program Command. The
Write to Buffer and Program command is used to
program the memory array.
Up to 16 Words can be loaded into the Write Buffer
and programmed into the memory. Each Write
Buffer has the same A5-A21 addresses.
Four successive steps are required to issue the
command.
1. One Bus Write operation is required to set up
the Write to Buffer and Program Command. Issue the set up command with the selected
memory Block Address where the program operation should occur (any address in the block
where the values will be programmed can be
used). Any Bus Read operations will start to output the Status Register after the 1st cycle.
2. Use one Bus Write operation to write the same
block address along with the value N on the
Data Inputs/Output, where N+1 is the number of
Words to be programmed.
3. Use N+1 Bus Write operations to load the address and data for each Word into the Write
Buffer. See the constraints on the address combinations listed below. The addresses must
have the same A5-A21.
4. Finally, use one Bus Write operation to issue the
final cycle to confirm the command and start the
Program operation.
Invalid address combinations or failing to follow
the correct sequence of Bus Write cycles will set
an error in the Status Register and abort the operation without affecting the data in the memory array. The Status Register should be cleared before
re-issuing the command.
If the block being programmed is protected an error will be set in the Status Register and the operation will abort without affecting the data in the
memory array. The block must be unprotected using the Blocks Unprotect command.
See Appendix C, Figure 23, Write to Buffer and
Program Flowchart and Pseudo Code, for a suggested flowchart on using the Write to Buffer and
Program command.
Program/Erase Suspend Command. The
Program/Erase Suspend command is used to pause a
Word Program, Write to Buffer and Program or
Erase operation. The command will only be accepted during a Program or an Erase operation. It
can be issued at any time during an Erase operation but will only be accepted during a Word Pro-
gram or Write to Buffer and Program command if
the Program/Erase Controller is running.
One Bus Write cycle is required to issue the Program/Erase Suspend command and pause the
Program/Erase Controller. Once the command is
issued it is necessary to poll the Program/Erase
Controller Status bit (SR7) to find out when the
Program/Erase Controller has paused; no other
commands will be accepted until the Program/
Erase Controller has paused. After the Program/
Erase Controller has paused, the memory will continue to output the Status Register until another
command is issued.
During the polling period between issuing the Program/Erase Suspend command and the Program/
Erase Controller pausing it is possible for the operation to complete. Once the Program/Erase
Controller Status bit (SR7) indicates that the Program/Erase Controller is no longer active, the Program Suspend Status bit (SR2) or the Erase
Suspend Status bit (SR6) can be used to determine if the operation has completed or is suspended. For timing on the delay between issuing the
Program/Erase Suspend command and the Program/Erase Controller pausing see Table 9.
During Program/Erase Suspend the Read Memory Array, Read Status Register, Read Electronic
Signature, Read Query and Program/Erase Resume commands will be accepted by the Command Interface. Additionally, if the suspended
operation was Erase then the Write to Buffer and
Program, and the Program Suspend commands
will also be accepted. When a program operation
is completed inside a Block Erase Suspend the
Read Memory Array command must be issued to
reset the device in Read mode, then the Erase Resume command can be issued to complete the
whole sequence. Only the blocks not being erased
may be read or programmed correctly.
See Appendix C, Figure 24, Program Suspend &
Resume Flowchart and Pseudo Code, and Figure
26, Erase Suspend & Resume Flowchart and
Pseudo Code, for suggested flowcharts on using
the Program/Erase Suspend command.
Program/Erase Resume Command. The
Program/Erase Resume command can be used to restart the Program/Erase Controller after a
Program/Erase Suspend operation has paused it.
One Bus Write cycle is required to issue the Program/Erase Resume command. Once the command is issued subsequent Bus Read operations
read the Status Register.
Set Configuration Register Command. The
Set Configuration Register command is used to
write a new value to the Burst Configuration Control Register which defines the burst length, type,
X and Y latencies, Synchronous/Asynchronous
21/61
M58LW032C
Read mode and the valid Clock edge configuration.
Two Bus Write cycles are required to issue the Set
Configuration Register command. Once the command is issued the memory returns to Read mode
as if a Read Memory Array command had been issued.
The value for the Configuration Register is presented on A1-A16. CR0 is on A1, CR1 on A2, etc.;
the other address bits are ignored.
Block Protect Command. The Block Protect
command is used to protect a block and prevent
Program or Erase operations from changing the
data in it. Two Bus Write cycles are required to issue the Block Protect command; the second Bus
Write cycle latches the block address in the internal state machine and starts the Program/Erase
Controller. Once the command is issued subsequent Bus Read operations read the Status Register. See the section on the Status Register for
details on the definitions of the Status Register
bits.
During the Block Protect operation the memory will
only accept the Read Status Register command.
All other commands will be ignored. Typical Block
Protection times are given in Table 9.
The Block Protection bits are non-volatile, once
set they remain set through reset and powerdown/power-up. They are cleared by a Blocks Unprotect command.
See Appendix C, Figure 27, Block Protect Flowchart and Pseudo Code, for a suggested flowchart
on using the Block Protect command.
Blocks Unprotect Command. The Blocks Unprotect command is used to unprotect all of the
blocks. Two Bus Write cycles are required to issue
the Blocks Unprotect command; the second Bus
Write cycle starts the Program/Erase Controller.
Once the command is issued subsequent Bus
Read operations read the Status Register. See the
section on the Status Register for details on the
definitions of the Status Register bits.
During the Block Unprotect operation the memory
will only accept the Read Status Register command. All other commands will be ignored. Typical
Block Protection times are given in Table 9.
See Appendix C, Figure 28, Block Unprotect Flowchart and Pseudo Code, for a suggested flowchart
on using the Block Unprotect command.
Protection Register Program Command. The
Protection Register Program command is used to
Program the 64 bit user segment of the Protection
Register. The segment is programmed 16 bits at a
22/61
time. Two write cycles are required to issue the
Protection Register Program command.
■ The first bus cycle sets up the Protection
Register Program command.
■ The second latches the Address and the Data to
be written to the Protection Register and starts
the Program/Erase Controller.
Read operations output the Status Register content after the programming has started.
The user-programmable segment can be locked
by programming bit 1 of the Protection Register
Lock location to ‘0’ (see Table 8). Bit 0 of the Protection Register Lock location locks the factory
programmed segment and is programmed to ‘0’ in
the factory. The locking of the Protection Register
is not reversible, once the lock bits are programmed no further changes can be made to the
values stored in the Protection Register, see Figure 8, Protection Register Memory Map. Attempting to program a previously protected Protection
Register will result in a Status Register error.
The Protection Register Program cannot be suspended. See Appendix C, Figure 29, Protection
Register Program Flowchart and Pseudo Code,
for the flowchart for using the Protection Register
Program command.
Configure STS Command.
The Configure STS command is used to configure
the Status/(Ready/Busy) pin. After power-up or reset the STS pin is configured in Ready/Busy
mode. The pin can be configured in Status mode
using the Configure STS command (refer to Status/(Ready/Busy) section for more details.
Two write cycles are required to issue the Configure STS command.
■ The first bus cycle sets up the Configure STS
command.
■ The second specifies one of the four possible
configurations (refer to Table 6, Configuration
Codes):
– Ready/Busy mode
– Pulse on Erase complete mode
– Pulse on Program complete mode
– Pulse on Erase or Program complete mode
The device will not accept the Configure STS command while the Program/Erase controller is busy
or during Program/Erase Suspend. When STS pin
is pulsing it remains Low for a typical time of
250ns. Any invalid Configuration Code will set an
error in the Status Register.
M58LW032C
Command
Cycles
Table 5. Commands
Bus Operations
1st Cycle
Op.
Addr. Data
2nd Cycle
Subsequent
Op.
Addr.
Data
Read Memory Array
≥2
Write
X
FFh
Read
RA
RD
Read Electronic Signature
≥2
Write
X
90h
Read
IDA(3)
IDD(3)
Read Status Register
2
Write
X
70h
Read
X
SRD
Read Query
≥2
Write
X
98h
Read
QA(4)
QD(4)
Clear Status Register
1
Write
X
50h
Block Erase
2
Write
X
20h
Write
BA
D0
Word Program
2
Write
X
40h
10h
Write
PA
PD
BA
E8h
Write
BA
N
Write to Buffer and
Program
4 + N Write
Program/Erase Suspend
1
Write
X
B0h
Program/Erase Resume
1
Write
X
D0h
Set Configuration Register
2
Write
X
60h
Write
BCR
03h
Block Protect
2
Write
X
60h
Write
BA
01h
Blocks Unprotect
2
Write
X
60h
Write
X
D0h
Protection Register
Program
2
Write
X
C0h
Write
PRA
PRD
Configure STS command
2
Write
X
B8h
Write
X
CC
Op.
Write
Final
Addr. Data Op. Addr. Data
PA
PD Write
X
D0h
Note: 1. X Don’t Care; RA Read Address, RD Read Data, IDA Identifier Address, IDD Identifier Data, SRD Status Register Data, PA Program
Address; PD Program Data, QA Query Address, QD Query Data, BA Any address in the Block, BCR Configuration Register value,
CC Configuration Code.
2. Base Address, refer to Figure 8 and Table 8 for more information.
3. For Identifier addresses and data refer to table 7, Read Electronic Signature.
4. For Query Address and Data refer to Appendix B, CFI.
23/61
M58LW032C
Table 6. Configuration Codes
Configuration
Code
DQ1
DQ2
Mode
00h
0
0
Ready/Busy
01h
0
1
Pulse on Erase
complete
02h
1
0
Pulse on
Program
complete
03h
1
1
Pulse on Erase
or Program
complete
STS Pin
VOL during P/E
operations
Hi-Z when the
memory is ready
Description
The STS pin is Low during Program and
Erase operations and high impedance when
the memory is ready for any Read, Program
or Erase operation.
Supplies a system interrupt pulse at the end
of a Block Erase operation.
Pulse Low then
High when
operation
completed(2)
Supplies a system interrupt pulse at the end
of a Program operation.
Supplies a system interrupt pulse at the end
of a Block Erase or Program operation.
Note: 1. DQ2-DQ7 are reserved
2. When STS pin is pulsing it remains Low for a typical time of 250ns.
Table 7. Read Electronic Signature
Code
Address (A21-A1)
Data (DQ15-DQ0)
Manufacturer Code
000000h
0020h
Device Code
000001h
8822h
Block Protection Status
SBA+02h
0000h (Block Unprotected)
0001h (Block Protected)
Configuration Register
000005h
BCR
000080h(2)
PRD
Protection Register
Note: 1. SBA is the Start Base Address of each block, BCR is Configuration Register data, PRD is Protection Register Data.
2. Base Address, refer to Figure 8 and Table 8 for more information.
Table 8. Read Protection Register
Word
Use
A8
A7
A6
A5
A4
A3
A2
A1
Lock
Factory, User
1
0
0
0
0
0
0
0
0
Factory (Unique ID)
1
0
0
0
0
0
0
1
1
Factory (Unique ID)
1
0
0
0
0
0
1
0
2
Factory (Unique ID)
1
0
0
0
0
0
1
1
3
Factory (Unique ID)
1
0
0
0
0
1
0
0
4
User
1
0
0
0
0
1
0
1
5
User
1
0
0
0
0
1
1
0
6
User
1
0
0
0
0
1
1
1
7
User
1
0
0
0
1
0
0
0
24/61
M58LW032C
Figure 8. Protection Register Memory Map
WORD
ADDRESS
88h
User Programmable
85h
84h
Unique device number
81h
80h
Protection Register Lock
1
0
AI05501
Table 9. Program, Erase Times and Program Erase Endurance Cycles
M58LW032C
Parameters
Unit
Typ(1,2)
Max(2)
Block (1Mb) Erase
1.2
4.8(4)
s
Chip Program (Write to Buffer)
24
72(4)
s
Chip Erase Time
37
110 (4)
s
192 (3)
576 (4)
µs
Word/Byte Program Time
(Word/Byte Program command)
16
48 (4)
µs
Program Suspend Latency Time
1
20 (5)
µs
Erase Suspend Latency Time
1
25 (5)
µs
Block Protect Time
18
30 (5)
µs
0.75
1.2 (5)
s
Min
Program Write Buffer
Blocks Unprotect Time
Program/Erase Cycles (per block)
Data Retention
Note: 1.
2.
3.
4.
5.
100,000
cycles
20
years
Typical values measured at room temperature and nominal voltages.
Sampled, but not 100% tested.
Effective byte programming time 6µs, effective word programming time 12µs.
Maximum value measured at worst case conditions for both temperature and VDD after 100,000 program/erase cycles.
Maximum value measured at worst case conditions for both temperature and VDD.
25/61
M58LW032C
STATUS REGISTER
The Status Register provides information on the
current or previous Program, Erase, Block Protect
or Blocks Unprotect operation. The various bits in
the Status Register convey information and errors
on the operation. They are output on DQ7-DQ0.
To read the Status Register the Read Status Register command can be issued. The Status Register
is automatically read after Program, Erase, Block
Protect, Blocks Unprotect and Program/Erase Resume commands. The Status Register can be
read from any address.
The Status Register can only be read using Asynchronous Bus Read or Single Synchronous Read
operations. Once the memory returns to Read
Memory Array mode the bus will resume the setting in the Configuration Register automatically.
The contents of the Status Register can be updated during an Erase or Program operation by toggling the Output Enable pin or by dis-activating
(Chip Enable, VIH) and then reactivating (Chip Enable and Output Enable, V IL) the device.
Status Register bits SR5, SR4, SR3 and SR1 are
associated with various error conditions and can
only be reset with the Clear Status Register command. The Status Register bits are summarized in
Table 10, Status Register Bits. Refer to Table 10
in conjunction with the following text descriptions.
Program/Erase Controller Status Bit (SR7). The
Program/Erase Controller Status bit indicates
whether the Program/Erase Controller is active or
inactive. When the Program/Erase Controller Status bit is Low, VOL, the Program/Erase Controller
is active and all other Status Register bits are High
Impedance; when the bit is High, V OH, the Program/Erase Controller is inactive.
The Program/Erase Controller Status is Low immediately after a Program/Erase Suspend command is issued until the Program/Erase Controller
pauses. After the Program/Erase Controller pauses the bit is High.
During Program, Erase, Block Protect and Blocks
Unprotect operations the Program/Erase Controller Status bit can be polled to find the end of the
operation. The other bits in the Status Register
should not be tested until the Program/Erase Controller completes the operation and the bit is High.
After the Program/Erase Controller completes its
operation the Erase Status, Program Status and
Block Protection Status bits should be tested for
errors.
Erase Suspend Status Bit ( SR6). The
Erase
Suspend Status bit indicates that an Erase operation has been suspended and is waiting to be resumed. The Erase Suspend Status should only be
considered valid when the Program/Erase Controller Status bit is High (Program/Erase Controller
26/61
inactive); after a Program/Erase Suspend command is issued the memory may still complete the
operation rather than entering the Suspend mode.
When the Erase Suspend Status bit is Low, V OL,
the Program/Erase Controller is active or has completed its operation; when the bit is High, VOH, a
Program/Erase Suspend command has been issued and the memory is waiting for a Program/
Erase Resume command.
When a Program/Erase Resume command is issued the Erase Suspend Status bit returns Low.
Erase Status Bit (SR5). The Erase Status bit
can be used to identify if the memory has failed to
verify that the block has erased correctly or that all
blocks have been unprotected successfully. The
Erase Status bit should be read once the Program/
Erase Controller Status bit is High (Program/Erase
Controller inactive).
When the Erase Status bit is Low, V OL, the memory has successfully verified that the block has
erased correctly or all blocks have been unprotected successfully. When the Erase Status bit is
High, VOH, the erase operation has failed. Depending on the cause of the failure other Status
Register bits may also be set to High, VOH.
■ If only the Erase Status bit (SR5) is set High,
VOH, then the Program/Erase Controller has
applied the maximum number of pulses to the
block and still failed to verify that the block has
erased correctly or that all the blocks have been
unprotected successfully.
■ If the failure is due to an erase or blocks
unprotect with VPEN low, VOL, then VPEN Status
bit (SR3) is also set High, VOH.
■ If the failure is due to an erase on a protected
block then Block Protection Status bit (SR1) is
also set High, VOH.
■ If the failure is due to a program or erase
incorrect command sequence then Program
Status bit (SR4) is also set High, VOH.
Once set High, the Erase Status bit can only be reset Low by a Clear Status Register command or a
hardware reset. If set High it should be reset before a new Program or Erase command is issued,
otherwise the new command will appear to fail.
Program Status Bit (SR4). The Program Status
bit is used to identify a Program or Block Protect
failure. The Program Status bit should be read
once the Program/Erase Controller Status bit is
High (Program/Erase Controller inactive).
When the Program Status bit is Low, V OL, the
memory has successfully verified that the Write
Buffer has programmed correctly or the block is
protected. When the Program Status bit is High,
VOH, the program or block protect operation has
M58LW032C
failed. Depending on the cause of the failure other
Status Register bits may also be set to High, VOH.
■ If only the Program Status bit (SR4) is set High,
VOH, then the Program/Erase Controller has
applied the maximum number of pulses to the
byte and still failed to verify that the Write Buffer
has programmed correctly or that the Block is
protected.
■ If the failure is due to a program or block protect
with VPEN low, VOL, then VPEN Status bit (SR3)
is also set High, VOH.
■ If the failure is due to a program on a protected
block then Block Protection Status bit (SR1) is
also set High, VOH.
■ If the failure is due to a program or erase
incorrect command sequence then Erase
Status bit (SR5) is also set High, VOH.
Once set High, the Program Status bit can only be
reset Low by a Clear Status Register command or
a hardware reset. If set High it should be reset before a new Program or Erase command is issued,
otherwise the new command will appear to fail.
VPEN Status Bit (SR3). The VPEN Status bit can
be used to identify if a Program, Erase, Block Protection or Block Unprotection operation has been
attempted when VPEN is Low, VIL.
When the VPEN Status bit is Low, VOL, no Program, Erase, Block Protection or Block Unprotection operations have been attempted with VPEN
Low, VIL, since the last Clear Status Register command, or hardware reset. When the VPEN Status
bit is High, VOH, a Program, Erase, Block Protection or Block Unprotection operation has been attempted with VPEN Low, VIL.
Once set High, the VPEN Status bit can only be reset by a Clear Status Register command or a hardware reset. If set High it should be reset before a
new Program, Erase, Block Protection or Block
Unprotection command is issued, otherwise the
new command will appear to fail.
Program Suspend Status Bit (SR2). The Program Suspend Status bit indicates that a Program
operation has been suspended and is waiting to
be resumed. The Program Suspend Status should
only be considered valid when the Program/Erase
Controller Status bit is High (Program/Erase Controller inactive); after a Program/Erase Suspend
command is issued the memory may still complete
the operation rather than entering the Suspend
mode.
When the Program Suspend Status bit is Low,
VOL, the Program/Erase Controller is active or has
completed its operation; when the bit is High, VOH,
a Program/Erase Suspend command has been issued and the memory is waiting for a Program/
Erase Resume command.
When a Program/Erase Resume command is issued the Program Suspend Status bit returns Low.
Block Protection Status Bit (SR1). The Block
Protection Status bit can be used to identify if a
Program or Erase operation has tried to modify the
contents of a protected block.
When the Block Protection Status bit is Low, V OL,
no Program or Erase operations have been attempted to protected blocks since the last Clear
Status Register command or hardware reset;
when the Block Protection Status bit is High, VOH,
a Program (Program Status bit SR4 set High) or
Erase (Erase Status bit SR5 set High) operation
has been attempted on a protected block.
Once set High, the Block Protection Status bit can
only be reset Low by a Clear Status Register command or a hardware reset. If set High it should be
reset before a new Program or Erase command is
issued, otherwise the new command will appear to
fail.
Reserved (SR0). SR0 of the Status Register is
reserved. Its value should be masked.
27/61
M58LW032C
Table 10. Status Register Bits
OPERATION
SR7
SR6
SR5
SR4
SR3
SR2
SR1
RB
Result
(Hex)
Program/Erase Controller active
0
Hi-Z
VOL
N/A
Write Buffer not ready
0
Hi-Z
VOL
N/A
Write Buffer ready
1
0
0
0
0
0
0
Hi-Z
80h
Write Buffer ready in Erase Suspend
1
1
0
0
0
0
0
Hi-Z
C0h
Program suspended
1
0
0
0
0
1
0
Hi-Z
84h
Program suspended in Erase Suspend
1
1
0
0
0
1
0
Hi-Z
C4h
Program/Block Protect completed
successfully
1
0
0
0
0
0
0
Hi-Z
80h
Program completed successfully in Erase
Suspend
1
1
0
0
0
0
0
Hi-Z
C0h
Program/Block protect failure due to
incorrect command sequence
1
0
1
1
0
0
0
Hi-Z
B0h
Program failure due to incorrect command
sequence in Erase Suspend
1
1
1
1
0
0
0
Hi-Z
F0h
1
0
0
1
1
0
0
Hi-Z
98h
Program failure due to VPEN error in Erase
Suspend
1
1
0
1
1
0
0
Hi-Z
D8h
Program failure due to Block Protection
1
0
0
1
0
0
1
Hi-Z
92h
Program failure due to Block Protection in
Erase Suspend
1
1
0
1
0
0
1
Hi-Z
D2h
Program/Block Protect failure due to cell
failure
1
0
0
1
0
0
0
Hi-Z
90h
Program failure due to cell failure in Erase
Suspend
1
1
0
1
0
0
0
Hi-Z
D0h
Erase Suspended
1
1
0
0
0
0
0
Hi-Z
C0h
Erase/Blocks Unprotect completed
successfully
1
0
0
0
0
0
0
Hi-Z
80h
Erase/Blocks Unprotect failure due to
incorrect command sequence
1
0
1
1
0
0
0
Hi-Z
B0h
Erase/Blocks Unprotect failure due to
VPEN error
1
0
1
0
1
0
0
Hi-Z
A8h
Erase failure due to Block Protection
1
0
1
0
0
0
1
Hi-Z
A2h
Erase/Blocks Unprotect failure due to
failed cells in Block
1
0
1
0
0
0
0
Hi-Z
A0h
Program/Block Protect failure due to
VPEN error
28/61
M58LW032C
MAXIMUM RATING
Stressing the device above the ratings listed in Table 11, Absolute Maximum Ratings, may cause
permanent damage to the device. These are
stress ratings only and operation of the device at
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device
reliability.
Refer
also
to
the
STMicroelectronics SURE Program and other relevant quality documents.
Table 11. Absolute Maximum Ratings
Value
Symbol
Parameter
Unit
Min
Max
TBIAS
Temperature Under Bias
–40
125
°C
TSTG
Storage Temperature
–55
150
°C
Input or Output Voltage
–0.6
VDDQ +0.6
V
Supply Voltage
–0.6
5.0
V
VIO
VDD, VDDQ
29/61
M58LW032C
DC AND AC PARAMETERS
This section summarizes the operating and measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC
and AC characteristics Tables that follow, are derived from tests performed under the Measure-
ment Conditions summarized in Table 12,
Operating and AC Measurement Conditions. Designers should check that the operating conditions
in their circuit match the measurement conditions
when relying on the quoted parameters.
Table 12. Operating and AC Measurement Conditions
M58LW032C
Units
90, 110
Parameter
Min
Max
Supply Voltage (VDD)
2.7
3.6
V
Input/Output Supply Voltage (VDDQ)
1.8
VDD
V
Grade 1
0
70
°C
Grade 6
–40
85
°C
Ambient Temperature (TA)
Load Capacitance (CL)
30
pF
Clock Rise and Fall Times
3
ns
Input Rise and Fall Times
4
ns
Input Pulses Voltages
0 to VDDQ
V
Input and Output Timing Ref. Voltages
0.5 VDDQ
V
Figure 9. AC Measurement Input Output
Waveform
Figure 10. AC Measurement Load Circuit
1.3V
1N914
VDDQ
VDD
3.3kΩ
VDDQ
0.5 VDDQ
DEVICE
UNDER
TEST
0V
DQS
CL
AI00610
0.1µF
0.1µF
CL includes JIG capacitance
AI03459
Table 13. Capacitance
Symbol
CIN
COUT
Parameter
Input Capacitance
Output Capacitance
Note: 1. TA = 25°C, f = 1 MHz
2. Sampled only, not 100% tested.
30/61
Test Condition
Typ
Max
Unit
VIN = 0V
6
8
pF
VOUT = 0V
8
12
pF
M58LW032C
Table 14. DC Characteristics
Symbol
Parameter
Test Condition
Min
Max
Unit
ILI
Input Leakage Current
0V≤ VIN ≤ VDDQ
±1
µA
ILO
Output Leakage Current
0V≤ VOUT ≤VDDQ
±5
µA
IDD
Supply Current (Random Read)
E = VIL, G = VIH, fadd = 6MHz
20
mA
IDDB
Supply Current (Burst Read)
E = VIL, G = VIH, fclock = 50MHz
30
mA
IDD1
Supply Current (Standby)
E = VIH, RP = VIH
40
µA
IDD5
Supply Current (Auto Low-Power)
E = VIL, RP = VIH
40
µA
IDD2
Supply Current (Reset/Power-Down)
RP = VIL
40
µA
IDD3
Supply Current (Program or Erase,
Block Protect, Block Unprotect)
Program or Erase operation in
progress
30
mA
IDD4
Supply Current
(Erase/Program Suspend)
E = VIH
40
µA
VIL
Input Low Voltage
–0.5
VDDQ x 0.3
V
VIH
Input High Voltage
VDDQ x 0.7
VDDQ + 0.5
V
VOL
Output Low Voltage
IOL = 100µA
0.2
V
VOH
Output High Voltage
IOH = –100µA
VLKO
VDD Supply Voltage (Erase and
Program lockout)
VDDQ –0.2
V
2
V
31/61
M58LW032C
Figure 11. Asynchronous Bus Read AC Waveforms
tAVAV
A1-A21
VALID
tELQV
tELQX
tAXQX
E
L
tGLQV
tEHQZ
tGLQX
tEHQX
G
tAVQV
tGHQZ
tGHQX
DQ0-DQ15
OUTPUT
AI06255
Note: Asynchronous Read CR15 = 1
Table 15. Asynchronous Bus Read AC Characteristics.
M58LW032C
Symbol
Parameter
Unit
90
110
tAVAV
Address Valid to Address Valid
Min
90
110
ns
tAVQV
Address Valid to Output Valid
Max
90
110
ns
tELQX
Chip Enable Low to Output Transition
Min
0
0
ns
tELQV
Chip Enable Low to Output Valid
Max
90
110
ns
tGLQX
Output Enable Low to Output Transition
Min
0
0
ns
tGLQV
Output Enable Low to Output Valid
Max
25
25
ns
tEHQX
Chip Enable High to Output Transition
Min
0
0
ns
tGHQX
Output Enable High to Output Transition
Min
0
0
ns
tAXQX
Address Transition to Output Transition
Min
0
0
ns
tEHQZ
Chip Enable High to Output Hi-Z
Max
25
25
ns
tGHQZ
Output Enable High to Output Hi-Z
Max
20
20
ns
32/61
M58LW032C
Figure 12. Asynchronous Latch Controlled Bus Read AC Waveforms
A1-A21
VALID
tAVLH
tLHAX
tAVLL
L
tLHLL
tLLLH
tEHLX
tELLH
tELLL
E
tGLQV
tEHQZ
tGLQX
tEHQX
G
tLLQX
tGHQZ
tLLQV
tGHQX
DQ0-DQ15
OUTPUT
AI06256b
Note: Asynchronous Read CR15 = 1
Table 16. Asynchronous Latch Controlled Bus Read AC Characteristics
M58LW032C
Symbol
Parameter
Unit
90
110
tAVLL
Address Valid to Latch Enable Low
Min
0
0
ns
tAVLH
Address Valid to Latch Enable High
Min
10
10
ns
tLHLL
Latch Enable High to Latch Enable Low
Min
10
10
ns
tLLLH
Latch Enable Low to Latch Enable High
Min
10
10
ns
tELLL
Chip Enable Low to Latch Enable Low
Min
0
0
ns
tELLH
Chip Enable Low to Latch Enable High
Min
10
10
ns
tLLQX
Latch Enable Low to Output Transition
Min
0
0
ns
tLLQV
Latch Enable Low to Output Valid
Min
90
110
ns
tLHAX
Latch Enable High to Address Transition
Min
6
6
ns
tGLQX
Output Enable Low to Output Transition
Min
0
0
ns
tGLQV
Output Enable Low to Output Valid
Max
25
25
ns
tEHLX
Chip Enable High to Latch Enable Transition
Min
0
0
ns
Note: For other timings see Table 15, Asynchronous Bus Read Characteristics.
33/61
M58LW032C
Figure 13. Asynchronous Page Read AC Waveforms
A1-A2
VALID
A3-A21
VALID
VALID
tAVQV
tELQV
tAXQX
tELQX
E
L
tAVQV1
tGLQV
tGLQX
tEHQZ
tAXQX1
tEHQX
G
tGHQZ
tGHQX
DQ0-DQ15
OUTPUT
OUTPUT
AI06257
Note: Asynchronous Read CR15 = 1
Table 17. Asynchronous Page Read AC Characteristics
M58LW032C
Symbol
Parameter
Unit
90, 110
tAXQX1
Address Transition to Output Transition
Min
6
ns
tAVQV1
Address Valid to Output Valid
Max
25
ns
Note: For other timings see Table 15, Asynchronous Bus Read Characteristics.
34/61
M58LW032C
Figure 14. Asynchronous Write AC Waveform, Write Enable Controlled
A1-A21
VALID
tAVWH
tWHAX
E
L
tWHEH
tELWL
G
tWLWH
tGHWL
tWHGL
tWHWL
W
tDVWH
DQ0-DQ15
INPUT
tWHDX
RB
tVPHWH
tWHBL
VPEN
AI06258
Figure 15. Asynchronous Latch Controlled Write AC Waveform, Write Enable Controlled
A1-A21
VALID
tAVLH
L
tELLL
tLHAX
tLLLH
tLHGL
tWLLH
tLHWH
E
tELWL
tWHEH
G
tGHWL
tWLWH
tWHWL
tWHGL
W
tDVWH
DQ0-DQ15
INPUT
tWHDX
RB
tVPHWH
tWHBL
VPEN
AI06259
35/61
M58LW032C
Table 18. Asynchronous Write and Latch Controlled Write AC Characteristics, Write Enable
Controlled.
M58LW032C
Symbol
Parameter
Unit
90, 110
tAVLH
Address Valid to Latch Enable High
Min
10
ns
tAVWH
Address Valid to Write Enable High
Min
50
ns
tDVWH
Data Input Valid to Write Enable High
Min
50
ns
tELWL
Chip Enable Low to Write Enable Low
Min
0
ns
tELLL
Chip Enable Low to Latch Enable Low
Min
0
ns
tLHAX
Latch Enable High to Address Transition
Min
6
ns
tLHGL
Latch Enable High to Output Enable Low
Min
95
ns
tLHWH
Latch Enable High to Write Enable High
Min
0
ns
tLLLH
Latch Enable low to Latch Enable High
Min
10
ns
tLLWH
Latch Enable Low to Write Enable High
Min
50
ns
Program/Erase Enable High to Write Enable High
Min
0
ns
tWHAX
Write Enable High to Address Transition
Min
0
ns
tWHBL
Write Enable High to Ready/Busy low
Max
500
ns
tWHDX
Write Enable High to Input Transition
Min
0
ns
tWHEH
Write Enable High to Chip Enable High
Min
0
ns
tGHWL
Output Enable High to Write Enable Low
Min
20
ns
tWHGL
Write Enable High to Output Enable Low
Min
35
ns
tWHWL
Write Enable High to Write Enable Low
Min
30
ns
tWLWH
Write Enable Low to Write Enable High
Min
70
ns
tWLLH
Write Enable Low to Latch Enable High
Min
10
ns
tVPHWH
36/61
M58LW032C
Figure 16. Asynchronous Write AC Waveforms, Chip Enable Controlled
A1-A21
VALID
tAVEH
tEHAX
W
tWLEL
tEHWH
G
tGHEL
tELEH
tEHEL
tEHGL
E
L
tDVEH
DQ0-DQ15
INPUT
tEHDX
RB
tVPHEH
tEHBL
VPEN
AI06260
Figure 17. Asynchronous Latch Controlled Write AC Waveforms, Chip Enable Controlled
A1-A21
VALID
tAVLH
tLHAX
tAVEH
tEHAX
L
tWLLL
tLLLH
tLHEH
tELLH
tLHGL
W
tWLEL
tEHWH
G
tGHEL
tELEH
tEHEL
tEHGL
E
tDVEH
DQ0-DQ15
INPUT
tEHDX
RB
tVPHEH
tEHBL
VPEN
AI06261
37/61
M58LW032C
Table 19. Asynchronous Write and Latch Controlled Write AC Characteristics, Chip Enable
Controlled
M58LW032C
Symbol
Parameter
Unit
90, 110
tAVLH
Address Valid to Latch Enable High
Min
10
ns
tAVEH
Address Valid to Chip Enable High
Min
50
ns
tDVEH
Data Input Valid to Chip Enable High
Min
50
ns
tEHAX
Chip Enable High to Address Transition
Min
0
ns
tEHBL
Chip Enable High to Ready/Busy low
Max
500
ns
tEHDX
Chip Enable High to Input Transition
Min
0
ns
tEHWH
Chip Enable High to Write Enable High
Min
0
ns
tEHGL
Chip Enable High to Output Enable Low
Min
35
ns
tEHEL
Chip Enable High to Chip Enable Low
Min
30
ns
tELEH
Chip Enable Low to Chip Enable High
Min
70
ns
tELLH
Chip Enable Low to Latch Enable High
Min
10
ns
tGHEL
Output Enable High to Chip Enable Low
Min
20
ns
tLHAX
Latch Enable High to Address Transition
Min
6
ns
tLHGL
Latch Enable High to Output Enable Low
Min
35
ns
tLHEH
Latch Enable High to Chip Enable High
Min
0
ns
tLLLH
Latch Enable low to Latch Enable High
Min
10
ns
tLLEH
Latch Enable Low to Chip Enable High
Min
50
ns
Program/Erase Enable High to Chip Enable High
Min
0
ns
tWLEL
Write Enable Low to Chip Enable Low
Min
0
ns
tWLLL
Write Enable Low to Latch Enable Low
Min
0
ns
tVPHEH
38/61
DQ0-DQ15
G
E
L
A1-A21
K
VALID
tAVKH
tAVLH
tELKH
tELLH
tLLLH
tLLKH
tKHLL
0
1
tLHAX
tKHAX
2
tQVKH
tKHQV
tGLKH
X-1
Q1
X
tKHQX
Q2
X+Y
Q3
X+2Y
tGHQZ
tGHQX
tEHQZ
tEHQX
X+2Y+1
X+2Y+2
AI06262
M58LW032C
Figure 18. Synchronous Burst Read AC Waveform
Note: Valid Clock Edge = Rising (CR6 = 1)
39/61
M58LW032C
Figure 19. Synchronous Burst Read - Continuous - Valid Data Ready Output
K
Output (2)
V
V
V
NV
NV
V
V
tRLKH
R
(3)
AI05510
Note: 1. Valid Data Ready = Valid Low during valid clock edge (CR8 = 0)
2. V= Valid output, NV= Not Valid output.
3. R is an open drain output with an internal pull up resistor of 1MΩ. Depending on the Valid Data Ready pin capacitance load an
external pull up resistor must be chosen according to the system clock period.
Table 20. Synchronous Burst Read AC Characteristics
M58LW032C
Symbol
Unit
Parameter
90, 110
tAVKH
Address Valid to Active Clock Edge
Min
7
ns
tAVLH
Address Valid to Latch Enable High
Min
10
ns
tELKH
Chip Enable Low to Active Clock Edge
Min
10
ns
tELLH
Chip Enable Low to Latch Enable High
Min
10
ns
tGLKH
Output Enable Low to Valid Clock Edge
Min
20
ns
tKHAX
Valid Clock Edge to Address Transition
Min
5
ns
tKHLL
Valid Clock Edge to Latch Enable Low
Min
0
ns
tKHLH
Valid Clock Edge to Latch Enable High
Min
0
ns
tKHQX
Valid Clock Edge to Output Transition
Min
3
ns
tLLKH
Latch Enable Low to Valid Clock Edge
Min
6
ns
tLLLH
Latch Enable Low to Latch Enable High
Min
7
ns
tKHQV
Valid Clock Edge to Output Valid
Max
15
ns
tQVKH
Output Valid to Active Clock Edge
Min
5
ns
tRLKH
Valid Data Ready Low to Valid Clock Edge
Min
5
ns
Note: For other timings see Table 15, Asynchronous Bus Read Characteristics.
40/61
M58LW032C
Figure 20. Reset, Power-Down and Power-up AC Waveform
W
E, G
DQ0-DQ15
tPHQV
RB
tPLRH
RP
tVDHPH
tPLPH
VDD, VDDQ
Power-Up
and Reset
Reset during
Program or Erase
AI05521
Table 21. Reset, Power-Down and Power-up AC Characteristics
M58LW032C
Symbol
Parameter
Unit
90
110
tPHQV
Reset/Power-Down High to Data Valid
Max
130
150
ns
tPLPH
Reset/Power-Down Low to Reset/Power-Down High
Min
100
100
ns
tPLRH
Reset/Power-Down Low to Ready High
Max
30
30
µs
Supply Voltages High to Reset/Power-Down High
Min
0
0
µs
tVDHPH
41/61
M58LW032C
PACKAGE MECHANICAL
Figure 21. TSOP56 - 56 lead Plastic Thin Small Outline, 14 x 20 mm, Package Outline
A2
1
N
e
E
B
N/2
D1
A
CP
D
DIE
C
A1
TSOP-a
α
L
Note: Drawing is not to scale.
Table 22. TSOP56 - 56 lead Plastic Thin Small Outline, 14 x 20 mm, Package Mechanical Data
mm
inches
Symbol
Typ
Min
A
Typ
Min
1.20
Max
0.0472
A1
0.05
0.15
0.0020
0.0059
A2
0.95
1.05
0.0374
0.0413
B
0.17
0.27
0.0067
0.0106
C
0.10
0.21
0.0039
0.0083
D
19.80
20.20
0.7795
0.7953
D1
18.30
18.50
0.7205
0.7283
E
13.90
14.10
0.5472
0.5551
–
–
–
–
L
0.50
0.70
0.0197
0.0276
α
0°
5°
0°
5°
N
56
e
CP
42/61
Max
0.50
0.0197
56
0.10
0.0039
M58LW032C
Figure 22. TBGA64 10x13mm - 8x8 ball array, 1mm pitch, Package Outline
D
D1
FD
FE
E
SD
SE
E1
ddd
BALL "A1"
A
e
b
A2
A1
BGA-Z23
Note: Drawing is not to scale.
Table 23. TBGA64 10x13mm - 8x8 ball array, 1mm pitch, Package Mechanical Data
millimeters
inches
Symbol
Typ
Min
A
A1
Max
Typ
Min
1.200
0.300
0.200
A2
0.350
0.0472
0.0118
0.0079
0.850
b
0.400
0.500
Max
0.0138
0.0335
0.0157
0.0197
D
10.000
9.900
10.100
0.3937
0.3898
0.3976
D1
7.000
–
–
0.2756
–
–
ddd
0.100
0.0039
e
1.000
–
–
0.0394
–
–
E
13.000
12.900
13.100
0.5118
0.5079
0.5157
E1
7.000
–
–
0.2756
–
–
FD
1.500
–
–
0.0591
–
–
FE
3.000
–
–
0.1181
–
–
SD
0.500
–
–
0.0197
–
–
SE
0.500
–
–
0.0197
–
–
43/61
M58LW032C
PART NUMBERING
Table 24. Ordering Information Scheme
Example:
M58LW032C
110 N
1
T
Device Type
M58
Architecture
L = Page Mode, Burst
Operating Voltage
W = VDD = 2.7V to 3.6V; VDDQ = 1.8 to VDD
Device Function
032C = 32 Mbit (x16), Uniform Block
Speed
90 = 90ns
110 = 110ns
Package
N = TSOP56: 14 x 20 mm
ZA = TBGA64: 10 x 13mm, 1mm pitch
Temperature Range
1 = 0 to 70 °C
6 = –40 to 85 °C
Option
Blank = Standard Packing
T = Tape & Reel Packing
E = Lead-free Package, Standard Packing
F = Lead-free Package, Tape & Reel Packing
Note: Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of available options (Speed, Package, etc...) or for further information on any aspect of this device, please contact the ST Sales Office nearest to you.
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APPENDIX A. BLOCK ADDRESS TABLE
Table 25. Block Addresses
Block
Number
Address Range
(x16 Bus Width)
32
1F0000h-1FFFFFh
31
1E0000h-1EFFFFh
30
1D0000h-1DFFFFh
29
1C0000h-1CFFFFh
28
1B0000h-1BFFFFh
27
1A0000h-1AFFFFh
26
190000h-19FFFFh
25
180000h-18FFFFh
24
170000h-17FFFFh
23
160000h-16FFFFh
22
150000h-15FFFFh
21
140000h-14FFFFh
20
130000h-13FFFFh
19
120000h-12FFFFh
18
110000h-11FFFFh
17
100000h-10FFFFh
16
0F0000h-0FFFFFh
15
0E0000h-0EFFFFh
14
0D0000h-0DFFFFh
13
0C0000h-0CFFFFh
12
0B0000h-0BFFFFh
11
0A0000h-0AFFFFh
10
090000h-09FFFFh
9
080000h-08FFFFh
8
070000h-07FFFFh
7
060000h-06FFFFh
6
050000h-05FFFFh
5
040000h-04FFFFh
4
030000h-03FFFFh
3
020000h-02FFFFh
2
010000h-01FFFFh
1
000000h-00FFFFh
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APPENDIX B. COMMON FLASH INTERFACE - CFI
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to determine
various electrical and timing parameters, density
information and functions supported by the memory. The system can interface easily with the de-
vice, enabling the software to upgrade itself when
necessary.
When the CFI Query Command (RCFI) is issued
the device enters CFI Query mode and the data
structure is read from the memory. Tables 26, 27,
28, 29, 30 and 31 show the addresses used to retrieve the data.
Table 26. Query Structure Overview
Offset
Sub-section Name
Description
00h
Manufacturer Code
01h
Device Code
10h
CFI Query Identification String
Command set ID and algorithm data offset
1Bh
System Interface Information
Device timing and voltage information
27h
Device Geometry Definition
Flash memory layout
P(h)(1)
Primary Algorithm-specific Extended Query Table
Additional information specific to the Primary
Algorithm (optional)
A(h)(2)
Alternate Algorithm-specific Extended Query Table
Additional information specific to the Alternate
Algorithm (optional)
Block Status Register
Block-related Information
(SBA+02)h
Note: 1. Offset 15h defines P which points to the Primary Algorithm Extended Query Address Table.
2. Offset 19h defines A which points to the Alternate Algorithm Extended Query Address Table.
3. SBA is the Start Base Address for each block.
Table 27. CFI - Query Address and Data Output
Data
Address A21-A1
Instruction
10h
51h
"Q"
11h
52h
"R"
12h
59h
"Y"
13h
01h
14h
00h
15h
31h
16h
00h
17h
00h
18h
00h
19h
00h
1Ah(2)
00h
Query ASCII String
51h; "Q"
52h; "R"
59h; "Y"
Primary Vendor:
Command Set and Control Interface ID Code
Primary algorithm extended Query Address Table: P(h)
Alternate Vendor:
Command Set and Control Interface ID Code
Alternate Algorithm Extended Query address Table
Note: 1. Query Data are always presented on DQ7-DQ0. DQ15-DQ8 are set to ’0’.
2. Offset 19h defines A which points to the Alternate Algorithm Extended Query Address Table.
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Table 28. CFI - Device Voltage and Timing Specification
Address A21-A1
Data
Description
1Bh
27h (1)
VDD Min, 2.7V
1Ch
36h (1)
VDD max, 3.6V
1Dh
00h (2)
VPP min – Not Available
1Eh
00h (2)
VPP max – Not Available
1Fh
04h
2n µs typical time-out for Word, DWord prog – Not Available
20h
08h
2n µs, typical time-out for max buffer write
21h
0Ah
2n ms, typical time-out for Erase Block
22h
00h (3)
23h
04h
2n x typical for Word Dword time-out max – Not Available
24h
04h
2n x typical for buffer write time-out max
25h
04h
2n x typical for individual block erase time-out maximum
26h
00h (3)
2n x typical for chip erase max time-out – Not Available
2n ms, typical time-out for chip erase – Not Available
Note: 1. Bits are coded in Binary Code Decimal, bit7 to bit4 are scaled in Volts and bit3 to bit0 in mV.
2. Bit7 to bit4 are coded in Hexadecimal and scaled in Volts while bit3 to bit0 are in Binary Code Decimal and scaled in 100mV.
3. Not supported.
Table 29. Device Geometry Definition
Address A21-A1
Data
Description
27h
16h
n where 2n is number of bytes memory Size
28h
01h
Device Interface
29h
00h
Organization Sync./Async.
2Ah
05h
2Bh
00h
2Ch
01h
2Dh
1Fh
2Eh
00h
2Fh
00h
30h
02h
Maximum number of bytes in Write Buffer, 2n
Bit7-0 = number of Erase Block Regions in device
Number (n-1) of Erase Blocks of identical size; n=64
Erase Block Region Information
x 256 bytes per Erase block (128K bytes)
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Table 30. Block Status Register
Address A21-A1
Data
Selected Block Information
0
Block UnProtected
1
Block Protected
0
Last erase operation ended successfully (2)
1
Last erase operation not ended successfully (2)
0
Reserved for future features
bit0
(BA+2)h(1)
bit1
bit7-2
Note: 1. BA specifies the block address location, A21-A17.
2. Not Supported.
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Table 31. Extended Query information
Address
offset
Address
A21-A2
Data (Hex)
x16 Bus Width
(P)h
31h
50h
"P"
(P+1)h
32h
52h
"R"
(P+2)h
33h
49h
"I"
(P+3)h
34h
31h
Major version number
(P+4)h
35h
31h
Minor version number
(P+5)h
36h
CEh
(P+6)h
37h
01h
(P+7)h
38h
00h
(P+8)h
39h
00h
Optional Feature: (1=yes, 0=no)
bit0, Chip Erase Supported (0=no)
bit1, Suspend Erase Supported (1=yes)
bit2, Suspend Program Supported (1=yes)
bit3, Protect/UnProtect Supported (1=yes)
bit4, Queue Erase Supported (0=no)
bit5, Instant Individual Block locking (0=no)
bit6, Protection bits supported (1=yes)
bit7, Page Read supported (1=yes)
bit8, Synchronous Read supported (1=yes)
bits 9 to 31 reserved for future use
(P+9)h
3Ah
01h
(P+A)h
3Bh
01h
(P+B)h
3Ch
00h
(P+C)h
3Dh
33h
VDD OPTIMUM Program/Erase voltage conditions
(P+D)h
3Eh
00h
VPP OPTIMUM Program/Erase voltage conditions
(P+E)h
3Fh
01h
OTP protection: No. of protection register fields
(P+F)h
40h
80h
Protection Register’s start address, least significant bits
(P+10)h
41h
00h
Protection Register’s start address, most significant bits
(P+11)h
42h
03h
n where 2n is number of factory reprogrammed bytes
(P+12)h
43h
03h
n where 2n is number user programmable bytes
(P+13)h
44h
03h
Page Read: 2n Bytes (n = bits 0-7)
(P+14)h
45h
03h
Synchronous mode configuration fields
(P+15)h
46h
01h
n where 2n+1 is the number of Words for the burst Length = 4
(P+16)h
47h
02h
n where 2n+1 is the number of Words for the burst Length = 8
(P+17)h
48h
07h
Burst Continuous
Description
Query ASCII string - Extended Table
Function allowed after Suspend:
Program allowed after Erase Suspend (1=yes)
Bit 7-1 reserved for future use
Block Status Register
bit0, Block Protect Bit status active (1=yes)
bit1, Block Lock-Down Bit status active (not available)
bits 2 to 15 reserved for future use
Note: 1. Bit7 to bit4 are coded in Hexadecimal and scaled in Volt while bit3 to bit0 are in Binary Code Decimal and scaled in mV.
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M58LW032C
APPENDIX C. FLOW CHARTS
Figure 23. Write to Buffer and Program Flowchart and Pseudo Code
Start
Write to Buffer E8h
Command, Block Address
Read Status
Register
NO
SR7 = 1
NO
Write to Buffer
Timeout
YES
YES
Note 1: N+1 is number of Words
to be programmed
Write N(1),
Block Address
Try Again Later
Write Buffer Data,
Start Address
X=0
X=N
YES
NO
Note 2: Next Program Address must
have same A5-A21.
Write Next Buffer Data,
Next Program Address(2)
X=X+1
Program Buffer to Flash
Confirm D0h
Read Status
Register
SR7 = 1
NO
YES
Note 3: A full Status Register Check must be
done to check the program operation's
success.
Full Status
Register Check(3)
End
AI06263b
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Figure 24. Program Suspend & Resume Flowchart and Pseudo Code
Start
Write B0h
Program/Erase Suspend Command:
– write B0h
– write 70h
Write 70h
do:
– read status register
Read Status
Register
SR7 = 1
NO
while SR7 = 1
YES
SR2 = 1
NO
Program Complete
If SR2 = 0, Program completed
YES
Read Memory Array command:
– write FFh
– one or more data reads
from other blocks
Write FFh
Read data from
another block
Write D0h
Write FFh
Program Continues
Read Data
Program Erase Resume Command:
– write D0h
to resume erasure
– if the program operation completed
then this is not necessary. The device
returns to Read Array as normal
(as if the Program/Erase Suspend
command was not issued).
AI00612b
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M58LW032C
Figure 25. Erase Flowchart and Pseudo Code
Start
Erase command:
– write 20h
– write D0h to Block Address
(A12-A17)
(memory enters read Status
Register after the Erase command)
Write 20h
Write D0h to
Block Address
NO
Read Status
Register
Suspend
SR7 = 1
YES
NO
Suspend
Loop
do:
– read status register
– if Program/Erase Suspend command
given execute suspend erase loop
while SR7 = 1
YES
SR3 = 0
NO
VPEN Invalid
Error (1)
NO
Command
Sequence Error
NO
Erase
Error (1)
NO
Erase to Protected
Block Error
If SR3 = 1, VPEN invalid error:
– error handler
YES
SR4, SR5 = 0
If SR4, SR5 = 1, Command Sequence error:
– error handler
YES
SR5 = 0
If SR5 = 1, Erase error:
– error handler
YES
SR1 = 0
If SR1 = 1, Erase to Protected Block Error:
– error handler
YES
End
AI00613C
Note: 1. If an error is found, the Status Register must be cleared (Clear Status Register Command) before further Program or Erase operations.
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Figure 26. Erase Suspend & Resume Flowchart and Pseudo Code
Start
Write B0h
Program/Erase Suspend Command:
– write B0h
– write 70h
Write 70h
do:
– read status register
Read Status
Register
SR7 = 1
NO
while SR7 = 1
YES
SR6 = 1
NO
Erase Complete
If SR6 = 0, Erase completed
YES
Read Memory Array command:
– write FFh
– one or more data reads
from other blocks
Write FFh
Read data from
another block
or Program
Write D0h
Write FFh
Erase Continues
Read Data
Program/Erase Resume command:
– write D0h to resume the Erase
operation
– if the Program operation completed
then this is not necessary. The device
returns to Read mode as normal
(as if the Program/Erase suspend
was not issued).
AI00615b
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M58LW032C
Figure 27. Block Protect Flowchart and Pseudo Code
Start
Write 60h
Block Address
Block Protect Command
– write 60h, Block Adress
– write 01h, Block Adress
Write 01h
Block Address
do:
– read status register
Read Status Register
SR7 = 1
NO
while SR7 = 1
YES
SR3 = 1
YES
VPEN Invalid Error
If SR3 = 1, VPEN Invalid Error
YES
Invalid Command
Sequence Error
If SR4 = 1, SR5 = 1 Invalid Command Sequence
Error
YES
Block Protect
Error
NO
SR4, SR5 = 1,1
NO
SR4 = 1
If SR4 = 1, Block Protect Error
NO
Write FFh
Read Memory Array Command:
– write FFh
Block Protect
Sucessful
AI06157b
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M58LW032C
Figure 28. Blocks Unprotect Flowchart and Pseudo Code
Start
Write 60h
Blocks Unprotect Command
– write 60h, Block Adress
– write D0h, Block Adress
Write D0h
do:
– read status register
Read Status Register
SR7 = 1
NO
while SR7 = 1
YES
SR3 = 1
YES
VPEN Invalid Error
If SR3 = 1, VPEN Invalid Error
YES
Invalid Command
Sequence Error
If SR4 = 1, SR5 = 1 Invalid Command
Sequence Error
YES
Blocks Unprotect
Error
NO
SR4, SR5 = 1,1
NO
SR5 = 1
If SR5 = 1, Blocks Unprotect Error
NO
Write FFh
Read Memory Array Command:
– write FFh
Blocks Unprotect
Sucessful
AI06158b
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M58LW032C
Figure 29. Protection Register Program Flowchart and Pseudo Code
Start
Write C0h
Protection Register Program Command
– write C0h
– write Protection Register Address,
Protection Register Data
Write
PR Address, PR Data
do:
– read status register
Read Status Register
SR7 = 1
NO
while SR7 = 1
YES
YES
SR3, SR4 = 1,1
VPEN Invalid Error
If SR3 = 1, SR4 = 1 VPEN Invalid Error
NO
YES
Protection Register
Program Error
If SR1 = 0, SR4 = 1 Protection Register
Program Error
YES
Protection Register
Program Error
If SR1 = 1, SR4 = 1 Program Error due to
Protection Register Protection
SR1, SR4 = 0,1
NO
SR1, SR4 = 1,1
NO
Write FFh
Read Memory Array Command:
– write FFh
PR Program
Sucessful
AI06159b
Note: PR = Protection Register
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Figure 30. Command Interface and Program Erase Controller Flowchart (a)
WAIT FOR
COMMAND
WRITE
90h
NO
YES
READ
SIGNATURE
98h
NO
YES
CFI
QUERY
70h
NO
YES
READ
STATUS
READ
ARRAY
NO
50h
YES
CLEAR
STATUS
E8h
NO
YES
PROGRAM
BUFFER
LOAD
20h(1)
NO
YES
ERASE
SET-UP
NO
PROGRAM
COMMAND
ERROR
FFh
D0h
YES
NO
YES
D0h
NO
YES
C
A
ERASE
COMMAND
ERROR
B
Note 1. The Erase command (20h) can only be issued if the flash is not already in Erase Suspend.
AI03618
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M58LW032C
Figure 31. Command Interface and Program Erase Controller Flowchart (b)
A
B
ERASE
READ
STATUS
YES
(READ STATUS)
Program/Erase Controller
READY Status bit in the Status
Register
?
NO
READ
ARRAY
B0h
YES
NO
YES
FFh
READ
STATUS
NO
ERASE
SUSPEND
NO
YES
ERASE
SUSPENDED
READY
?
NO
READ
STATUS
YES
WAIT FOR
COMMAND
WRITE
READ
STATUS
YES
70h
NO
READ
SIGNATURE
YES
90h
NO
CFI
QUERY
YES
98h
NO
PROGRAM
BUFFER
LOAD
YES
E8h
NO
PROGRAM
COMMAND
ERROR
NO
D0h
YES
c
D0h
YES
READ
STATUS
(ERASE RESUME)
NO
READ
ARRAY
AI03619
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M58LW032C
Figure 32. Command Interface and Program Erase Controller Flowchart (c).
B
C
PROGRAM
READ
STATUS
YES
READY
?
(READ STATUS)
Program/Erase Controller
Status bit in the Status
Register
NO
READ
ARRAY
B0h
NO
YES
YES
NO
READ
STATUS
FFh
PROGRAM
SUSPEND
NO
YES
PROGRAM
SUSPENDED
READY
?
NO
YES
WAIT FOR
COMMAND
WRITE
READ
STATUS
YES
READ
STATUS
70h
NO
READ
SIGNATURE
YES
90h
NO
CFI
QUERY
YES
98h
NO
READ
ARRAY
NO
D0h
YES
READ
STATUS
(PROGRAM RESUME)
AI00618
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REVISION HISTORY
Table 32. Document Revision History
Date
Version
Revision Details
11-Mar-2002
-01
First Issue (Data Brief)
10-Jul-2002
-02
Document expanded to full Product Preview
06-Aug-2002
2.1
Revision numbering modified: a minor revision will be indicated by incrementing the
digit after the dot, and a major revision, by incrementing the digit before the dot
(revision version 02 equals 2.0).
Word Effective Programming Time modified. Program Write Buffer and Block Erase
Time parameters modified in Table 9. Speed Class 90ns added. VDD, VDDQ, VSS and
VSSQ signal descriptions modified.
02-Sep-2002
2.2
Figure 12, Asynchronous Latch Controlled Bus Read AC Waveforms, modified.
2.3
REVISION HISTORY moved to after the appendices. Table 9, Program, Erase Times
and Program Erase Endurance Cycles table modified. All DU connections changed to
NC in Table 4, TBGA64 Connections (Top view through package). VIL max and VIH
min modified in Table 14, DC Characteristics. Block Protect setup command address
modified in Table 5, Commands. Data and Descriptions clarified in CFI Table 31,
Extended Query information.
3.0
Document promoted to full datasheet. Summary Description clarified, Bus Operations
clarified, Smart Protection added, Read Modes section added, Status Register and
Configuration Register bit nomenclature modified, VPEN Invalid Error clarified in
Flowcharts. Lead-free packing options added to Ordering Information Scheme.
16-Dec-2002
29-Apr-2003
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Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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