AUIRFS3004 AUIRFSL3004 AUTOMOTIVE GRADE HEXFET® Power MOSFET Features Advanced Process Technology Ultra Low On-Resistance 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified * VDSS 40V RDS(on) typ. max. 1.4m ID (Silicon Limited) 1.75m 340A ID (Package Limited) 195A D D Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. Base part number Package Type AUIRFSL3004 TO-262 AUIRFS3004 D2-Pak D2Pak S D G TO-262 AUIRFS3004 AUIRFSL3004 S G G Gate D Drain Standard Pack Form Quantity Tube 50 Tube 50 Tape and Reel Left 800 S Source Orderable Part Number AUIRFSL3004 AUIRFS3004 AUIRFS3004TRL Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified. Symbol Parameter Max. ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 340 ID @ TC = 100°C ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Package Limited) 240 195 IDM PD @TC = 25°C Pulsed Drain Current Maximum Power Dissipation 1310 380 VGS dv/dt EAS IAR EAR TJ TSTG Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery Single Pulse Avalanche Energy (Thermally Limited) Avalanche Current Repetitive Avalanche Energy Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case) Thermal Resistance Symbol RJC RJA Parameter Junction-to-Case Junction-to-Ambient (PCB Mount), D2 Pak Units A W 2.5 ± 20 4.4 300 See Fig.14,15, 22a, 22b W/°C V V/ns mJ A mJ -55 to + 175 °C 300 Typ. Max. Units ––– ––– 0.40 40 °C/W HEXFET® is a registered trademark of Infineon. *Qualification standards can be found at www.infineon.com 1 2015-10-20 AUIRFS/SL3004 Static @ TJ = 25°C (unless otherwise specified) Parameter V(BR)DSS Drain-to-Source Breakdown Voltage Min. 40 Typ. Max. Units ––– ––– V Conditions VGS = 0V, ID = 250µA V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– RDS(on) Static Drain-to-Source On-Resistance ––– 1.4 1.75 VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA gfs Forward Trans conductance Drain-to-Source Leakage Current ––– ––– ––– 20 S IDSS 1170 ––– VDS = 10V, ID = 195A VDS = 40V, VGS = 0V ––– ––– 250 IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Internal Gate Resistance ––– ––– ––– ––– ––– 2.2 100 -100 ––– RG 0.037 ––– V/°C Reference to 25°C, ID = 5mA m VGS = 10V, ID = 195A µA nA VDS = 40V,VGS = 0V,TJ =125°C VGS = 20V VGS = -20V Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Qg Qgs Qgd Qsync td(on) tr td(off) tf Ciss Coss Total Gate Charge Gate-to-Source Charge Gate-to-Drain Charge Total Gate Charge Sync. (Qg - Qgd) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 160 40 68 92 23 220 90 130 9200 2020 240 ––– ––– ––– ––– ––– ––– ––– ––– ––– Crss Reverse Transfer Capacitance ––– 1340 ––– Coss eff.(ER) Effective Output Capacitance (Energy Related) ––– 2440 ––– VDD = 26V ID = 195A ns RG= 2.7 VGS = 10V VGS = 0V VDS = 25V pF ƒ = 1.0MHz, See Fig. 5 VGS = 0V, VDS = 0V to 32V Coss eff.(TR) Effective Output Capacitance (Time Related) ––– 2690 ––– VGS = 0V, VDS = 0V to 32V Min. Typ. Max. Units ––– ––– 340 ––– ––– 1310 ––– ––– ––– ––– ––– ––– ––– 27 31 18 41 1.2 1.3 ––– ––– ––– ––– ––– Diode Characteristics Parameter Continuous Source Current IS (Body Diode) Pulsed Source Current ISM (Body Diode) VSD Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge IRRM ton Reverse Recovery Current Forward Turn-On Time ID = 187A VDS = 20V nC VGS = 10V Conditions MOSFET symbol showing the A integral reverse p-n junction diode. V TJ = 25°C,IS = 195A,VGS = 0V TJ = 25°C VDD = 34V ns TJ = 125°C IF = 195A, TJ = 25°C di/dt = 100A/µs nC TJ = 125°C A TJ = 25°C Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Calculated continuous current based on maximum allowable junction temperature. Bond wire current limit is 195A. Note that current limitations arising from heating of the device leads may occur with some lead mounting arrangements. Repetitive rating; pulse width limited by max. junction temperature. Limited by TJmax, starting TJ = 25°C, L = 0.016mH, RG = 25, IAS = 195A, VGS =10V. Part not recommended for use above this value. ISD 195A, di/dt 930A/µs, VDD V(BR)DSS, TJ 175°C. Pulse width 400µs; duty cycle 2%. Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS. Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS. When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994 R is measured at TJ approximately 90°C. RJC value shown is at time zero 2 2015-10-20 AUIRFS/SL3004 10000 10000 1000 BOTTOM VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 4.8V 4.5V TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 4.8V 4.5V 1000 4.5V 100 4.5V 100 BOTTOM 60µs PULSE WIDTH 60µs PULSE WIDTH Tj = 175°C Tj = 25°C 10 10 0.1 1 10 0.1 100 V DS, Drain-to-Source Voltage (V) Fig. 1 Typical Output Characteristics R DS(on) , Drain-to-Source On Resistance (Normalized) ID, Drain-to-Source Current (A) 100 Fig. 2 Typical Output Characteristics 100 T J = 175°C T J = 25°C 10 1 VDS = 25V 60µs PULSE WIDTH 0.1 1 2 3 4 5 6 7 ID = 195A VGS = 10V 1.5 1.0 0.5 8 -60 -40 -20 0 20 40 60 80 100 120 140160 180 T J , Junction Temperature (°C) VGS, Gate-to-Source Voltage (V) Fig. 4 Normalized On-Resistance vs. Temperature Fig. 3 Typical Transfer Characteristics VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED 14.0 Crss = C gd 12.0 ID = 187A VGS, Gate-to-Source Voltage (V) 100000 Coss = Cds + Cgd C, Capacitance (pF) 10 2.0 1000 Ciss 10000 Coss Crss 1000 100 1 10 100 VDS , Drain-to-Source Voltage (V) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 3 1 V DS, Drain-to-Source Voltage (V) VDS = 32V VDS = 20V 10.0 8.0 6.0 4.0 2.0 0.0 0 50 100 150 200 QG, Total Gate Charge (nC) Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 2015-10-20 AUIRFS/SL3004 10000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) 1000 T J = 175°C 100 T J = 25°C 10 1 OPERATION IN THIS AREA LIMITED BY R DS (on) 1000 100µsec 1msec 100 10msec DC 10 Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 0.1 1 0.0 0.5 1.0 1.5 2.0 1 VSD , Source-to-Drain Voltage (V) V(BR)DSS , Drain-to-Source Breakdown Voltage (V) 350 Limited By Package ID, Drain Current (A) 250 200 150 100 50 0 25 50 75 100 125 150 50 Id = 5mA 48 46 44 42 40 -60 -40 -20 0 20 40 60 80 100 120 140160 180 175 T J , Temperature ( °C ) T C , Case Temperature (°C) Fig 9. Maximum Drain Current vs. Case Temperature EAS , Single Pulse Avalanche Energy (mJ) 1.8 ID TOP 30A 54A BOTTOM 195A 1200 1.6 1000 1.4 Energy (µJ) Fig 10. Drain-to-Source Breakdown Voltage 1400 2.0 1.2 1.0 0.8 0.6 0.4 0.2 0.0 -5 0 5 10 15 20 25 30 35 40 45 VDS, Drain-to-Source Voltage (V) Fig 11. Typical COSS Stored Energy 4 100 Fig 8. Maximum Safe Operating Area Fig. 7 Typical Source-to-Drain Diode 300 10 VDS , Drain-to-Source Voltage (V) 800 600 400 200 0 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) Fig 12. Maximum Avalanche Energy vs. Drain Current 2015-10-20 AUIRFS/SL3004 Thermal Response ( Z thJC ) °C/W 1 D = 0.50 0.1 0.20 0.10 J 0.05 0.02 0.01 0.01 R1 R1 J 1 R2 R2 R3 R3 C 2 1 3 2 4 3 C 4 Ci= iRi Ci= iRi I (sec) 0.00646 0.000005 0.10020 0.000124 0.18747 0.001374 0.10667 0.008465 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 Ri (°C/W) R4 R4 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1000 Avalanche Current (A) Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche pulsewidth, tav, assuming Tj = 150°C and Tstart =25°C (Single Pulse) 0.01 100 0.05 0.10 10 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming j = 25°C and Tstart = 150°C. 1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 14. Avalanche Current vs. Pulse width Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.infineon.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long as Tjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 18a, 18b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 13, 14). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see Figures 13) 320 TOP Single Pulse BOTTOM 1.0% Duty Cycle ID = 195A EAR , Avalanche Energy (mJ) 280 240 200 160 120 80 40 0 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) Fig 15. Maximum Avalanche Energy vs. Temperature 5 PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav 2015-10-20 4.5 10 4.0 9 IF = 78A V R = 34V TJ = 25°C TJ = 125°C 8 3.5 3.0 2.5 IRRM (A) VGS(th) , Gate threshold Voltage (V) AUIRFS/SL3004 ID = 250µA ID = 1.0mA ID = 1.0A 2.0 7 6 5 4 1.5 3 1.0 2 -75 -50 -25 0 25 50 75 100 125 150 175 200 100 200 T J , Temperature ( °C ) 400 500 diF /dt (A/µs) Fig 16. Threshold Voltage vs. Temperature Fig. 17 - Typical Recovery Current vs. dif/dt 11 350 IF = 117A V R = 34V 10 9 TJ = 25°C TJ = 125°C 8 7 QRR (nC) IRRM (A) 300 6 5 300 IF = 78A V R = 34V 250 TJ = 25°C TJ = 125°C 200 150 4 3 100 2 1 50 100 200 300 400 500 100 200 diF /dt (A/µs) 300 400 500 diF /dt (A/µs) Fig. 18 - Typical Recovery Current vs. dif/dt Fig. 19 - Typical Stored Charge vs. dif/dt 400 IF = 117A V R = 34V 350 TJ = 25°C TJ = 125°C QRR (nC) 300 250 200 150 100 50 0 100 200 300 400 500 diF /dt (A/µs) Fig. 20 - Typical Stored Charge vs. dif/dt 6 2015-10-20 AUIRFS/SL3004 Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs V(BR)DSS 15V tp L VDS D.U.T RG IAS 20V tp DRIVER + V - DD A 0.01 Fig 22a. Unclamped Inductive Test Circuit Fig 23a. Switching Time Test Circuit I AS Fig 22b. Unclamped Inductive Waveforms Fig 23b. Switching Time Waveforms Id Vds Vgs Vgs(th) Qgs1 Qgs2 Fig 24a. Gate Charge Test Circuit 7 Qgd Qgodr Fig 24b. Gate Charge Waveform 2015-10-20 AUIRFS/SL3004 D2Pak (TO-263AB) Package Outline (Dimensions are shown in millimeters (inches)) D2Pak (TO-263AB) Part Marking Information Part Number AUFS3004 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 8 2015-10-20 AUIRFS/SL3004 TO-262 Package Outline (Dimensions are shown in millimeters (inches) TO-262 Part Marking Information Part Number AUFSL3004 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 9 2015-10-20 AUIRFS/SL3004 D2Pak (TO-263AB) Tape & Reel Information (Dimensions are shown in millimeters (inches)) TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.65 (.065) 1.60 (.063) 1.50 (.059) 11.60 (.457) 11.40 (.449) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 60.00 (2.362) MIN. 26.40 (1.039) 24.40 (.961) 3 30.40 (1.197) MAX. 4 Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 10 2015-10-20 AUIRFS/SL3004 Qualification Information Automotive (per AEC-Q101) Comments: This part number(s) passed Automotive qualification. Infineon’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. Qualification Level Moisture Sensitivity Level D2-Pak Machine Model Human Body Model ESD MSL1 TO-262 Charged Device Model RoHS Compliant Class M4 (+/- 800V)† AEC-Q101-002 Class H3A (+/- 6000V)† AEC-Q101-001 Class C5 (+/- 2000V)† AEC-Q101-005 Yes † Highest passing voltage. Revision History Date 10/20/2015 Comments Updated datasheet with corporate template Corrected ordering table on page 1. 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Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 11 2015-10-20