TI1 CDC3S04YFFR Quad sine-wave clock buffer with ldo Datasheet

CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
Quad Sine-Wave Clock Buffer With LDO
Check for Samples: CDC3S04
FEATURES
DESCRIPTION
•
•
The CDC3S04 is a four-channel low-power low-jitter
sine-wave clock buffer. It can be used to buffer a
single master clock to multiple peripherals. The four
sine-wave outputs (CLK1–CLK4) are designed for
minimal channel-to-channel skew and ultralow
additive output jitter.
1
•
•
•
•
•
•
•
•
1:4 Low-Jitter Clock Buffer
Single-Ended Sine-Wave Clock Input and
Outputs
Ultralow Phase Noise and Standby Current
Individual Clock Request Inputs for Each
Output
On-Chip Low-Dropout Output (LDO) for
Low-Noise TCXO Supply
Serial I2C Interface (Compatible With
High-Speed Mode, 3.4 Mbit/s)
1.8-V Device Power Supply
Wide Temperature Range, –30°C to 85°C
ESD Protection: 2 KV HBM, 750 V CDM, and
100 V MM
Small 20-Pin Chip-Scale Package: 0.4-mm
Pitch WCSP (1.6 mm × 2 mm)
Each output has its own clock request inputs which
enables the dedicated clock output. These clock
requests are active-high (can also be changed to be
active-low via I2C), and an output signal is generated
that can be sent back to the master clock to request
the clock (MCLK_REQ). MCKL_REQ is an
open-source output and supports the wired-OR
function (default mode). It needs an external pulldown
resistor. MCKL_REQ can be changed to wired-AND
or push-pull functionality via I2C.
The CDC3S04 also provides an I2C interface
(Hs-mode) that can be used to enable or disable the
outputs, select the polarity of the REQ inputs, and
allow control of internal decoding.
APPLICATIONS
•
•
•
•
•
The CDC3S04 features an on-chip high-performance
LDO that accepts voltages from 2.3 V to 5.5 V and
outputs a 1.8-V supply. This 1.8-V supply can be
used to power an external 1.8-V TCXO. It can be
enabled or disabled for power saving at the TCXO.
Cellular Phones
Smart Phones
Mobile Handsets
Portable Systems
Wireless Modems Including GPS, WLAN,
W-BT, D-TV, DVB-H, FM Radio, WiMAX, and
System Clock
VDD_DIG
VDD_ANA
WCSP
LDO
VBAT
VLDO
REQ1
RESET
Reset
A
CLK1
B
REQ2
MCLK_IN
CLK2
CLK3
REQ4
SCLH
SDAH
ADR_A0
2
CLK2
MCLK_
RESET
IN
REQ1
CLK1
VDD_
ANA
GND_
ANA
C
REQ4
CLK4
REQ3
CLK3
D
VDD_
DIG
GND_ MCLK_
REQ
DIG
ADR_
A0
E
VLDO
VBAT
SDAH
SCLH
1
2
3
4
REQ3
MCLK_REQ
REQ2
CLK4
I C
Control
Register
Top View
(Solder Ball Underneath)
Decoder
GND_DIG
GND_ANA
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION (CONTINUED)
A low signal at the RESET input switches the outputs CLK1 and CLK4 into the default state. In this configuration,
CLK1 and CLK4 are ON (see Table 1); the remaining device function is not affected. Also, the RESET input
provides a glitch filter which rejects spikes of typical 300 ns on the RESET line to preserve false reset. A
complete device reset to the default condition can be initiated by a power-up cycle of VDD_DIG.
The CDC3S04 operates from two 1.8-V supplies. There is a core supply (VDD_DIG/GND_DIG) for the core logic
and a low-noise analog supply (VDD_ANA/GND_ANA) for the sine-wave outputs. The CDC3S04 is designed for
sequence-less power up. Both supply voltages may be applied in any order.
The CDC3S04 is offered in a 0.4-mm pitch WCSP package (1.6 mm × 2 mm) and is optimized for low standby
current (0.5 µA). It is characterized for operation from –30°C to 85°C.
DEVICE INFORMATION
PIN FUNCTIONS
NAME
BALL NO.
TYPE
FUNCTION
ADR_A0
D4
Input
Selectable address bit A0 of slave-address register; internal 500-kΩ pulldown resistor
CLK1
A4
Output
Clock output 1
CLK2
A2
Output
Clock output 2
CLK3
C4
Output
Clock output 3
CLK4
C2
Output
Clock output 4
GND_ANA
B4
Ground
Ground for sine-wave buffer
GND_DIG
D2
Ground
Ground for core logic
MCLK_IN
B1
Input
Master clock input
MCLK_RE
Q
D3
Output
Clock request to the master clock source; active-high; open-source output for wired-OR
connection (default condition). Can be changed to push-pull output or wired-AND output via I2C.
REQ1
A3
Input
Clock request from peripheral 1; internal 500-kΩ pulldown resistor
REQ2
A1
Input
Clock request from peripheral 2; internal 500-kΩ pulldown resistor
REQ3
C3
Input
Clock request from peripheral 3; internal 500-kΩ pulldown resistor
REQ4
C1
Input
Clock request from peripheral 4; internal 500-kΩ pulldown resistor
RESET
B2
Input
Peripheral reset signal provided by application processor. The signal is active-low and switches
CLK1 and CLK4 outputs to ON (see Table 1). On-chip LDO is enabled. Internal 1-MΩ pullup
resistor and 300-ns (typ) glitch filter.
SCLH
E4
Input
I2C clock input – Hs-mode. Internal 1-MΩ pullup resistor
SDAH
E3
Input/output I2C data input/output – Hs-mode. Internal 1-MΩ pullup resistor
VBAT
E2
Power
Supply pin to internal LDO
VDD_ANA
B3
Power
1.8-V power supply for sine-wave buffer
VDD_DIG
D1
Power
1.8-V power supply for core logic. Power up of VDD_DIG resets the whole device to the default
condition.
VLDO
E1
Output
1.8-V supply for external TCXO; LDO is enabled if RESET (default mode) or REQx is active.
LDO is not enabled if only VBAT is on.
2
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
FUNCTION SELECTION TABLES
Table 1. Reset and Request (REQx) Conditions for Clock Outputs (1)
RESET (2)
PRIORITY BIT (3)
0
(3)
On
1
1
(1)
(2)
CLK1
0
CLK2
CLK3
Controlled by REQ2
Controlled by REQ3
CLK4
Controlled by REQ2INT
Controlled by REQ3INT
On
0
Controlled by REQ1
Controlled by REQ2
Controlled by REQ3
Controlled by REQ4
1
Controlled by REQ1INT
Controlled by REQ2INT
Controlled by REQ3INT
Controlled by REQ4INT
Shaded cells show the default setting after power up.
RESET resets REQ1PRIO/REQ4PRIO and REQ1INT/REQ4INT bits to their default values (CLK1/4 is ON) but does not change the
remaining internal SW bits. During RESET, any I2C operation is blocked until RESET is deactivated. A minimum pulse duration of
500 ns must be applied to activate RESET (the internal glitch-filter suppresses spikes of typical 300 ns).
Priority bit defines if the external control pins (HW controlled) or the SW bits (SW controlled) have priority. It can be set in the
configuration register, Byte 2, Bits 0–3.
Table 2. Request Signal Condition for Clock Outputs (1)
REQ-Signals (2)
REQx
(REQ1/2/3/4)
CLKx
(CLK1/2/3/4)
MCLK_REQ
LDO (3)
Active-low
0
Clock
High
On
1
Disabled to high
Low (if all REQx are high)
Off (if all REQx are high)
0
Disabled to high (4)
Low (if all REQx are low)
Off (if all REQx are low)
1
Clock (4)
High
On
Active-high
(1)
(2)
(3)
(4)
Shaded cells show the default setting after power up.
Polarity of REQ1, REQ2, REQ3, and REQ4 are register-configurable via I2C (see Table 3, Byte 0, Bits 0–3). Default setting is
active-high.
The LDO is controlled by an on-chip decoder, but can also be SW controlled (see Table 3, Byte 2, Bits 4–5).
CLK1 and CLK4 are ON after device power up (default condition). CLK2 and CLK3 are controlled by external REQ2 and REQ3,
respectively.
POWER GROUPS
NAME
DESCRIPTION
VBAT
Supply pin for LDO provided by main battery. LDO is not working if only VBAT is on.
VLDO
1.8-V low-drop output voltage for external TCXO. LDO is enabled if VBAT and VDD_DIG are on and REQx or RESET is
active (see Table 2).
VDD_DIG
1.8-V power supply for core logic and I2C logic. VDD_DIG must be supplied for correct device operation. Power up of
VDD_DIG resets the whole device to the default condition.
VDD_ANA
1.8-V power supply for sine-wave buffers. For correct sine-wave buffer function, all three power supplies (VBAT, VDD_DIG
and VDD_ANA) must be on. But, VDD_ANA can be switched on and off at any time. If off, the sine-wave outputs are switched
to high-impedance.
POWER-UP SEQUENCE
The CDC3S04 is designed for sequence-less power up. VBAT, VDD_DIG, and VDD_ANA may be applied in any
order. Recommended power-on sequence is VBAT first, followed by VDD_DIG and VDD_ANA. Recommended
power-off sequence is in reverse order.
Copyright © 2009–2011, Texas Instruments Incorporated
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CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
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ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
VDD_ANA
VDD_DIG
Supply voltage range
VBAT
Battery supply voltage range
VI
Input voltage range (2)
VO
Output voltage range
VLDO
Output voltage range
(1)
(3)
(2) (3)
VALUE
UNIT
–0.5 to 2.5
V
–0.5 to 6.5
V
–0.5 to VDD + 0.5
V
–0.5 to VDD + 0.5
V
–0.5 to VBAT + 0.5
V
Input current (Vi < 0, Vi > VDD)
±20
mA
IO
Continuous output current
±20
mA
ILDO
Continuous output current
±20
mA
Tstg
Storage temperature range
–65 to 150
°C
(1)
(2)
(3)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
The input VI and output VO positive voltages are limited to the absolute maximum rating for VDD = 2.5 V.
THERMAL CHARACTERISTICS for 20-pin WCSP (YFF) (1)
PARAMETER
AIRFLOW
(lfm)
20-PIN
WCSP
0
71
200
62
UNIT
°C/W
TJA
Thermal resistance, junction-to-ambient
400
59
TJC
Thermal resistance, junction-to- case
–
17.5
°C/W
TJB
Thermal resistance, junction-to-board
–
20.5
°C/W
TJ
Maximum junction temperature
–
125
°C
(1)
The package thermal impedance is calculated in accordance with JESD 51 and JEDEC2S2P (high-k board).
RECOMMENDED OPERATING CONDITIONS
MIN
NOM
MAX
UNIT
VDD_ANA
Device supply voltage
1.65
1.8
1.95
V
VDD_DIG
Device supply voltage
1.65
1.8
1.95
V
VIH
Input voltage ADR_A0, REQx, RESET
VIL
0.65 VDD_DIG
VIS
Sine-wave input voltage – MCLK_IN; ac-coupled amplitude
CL
Sine-wave output load (1)
COUT
LDO output capacitance (stabilize the internal control loop)
0.8
TA
Operating free-air temperature
–30
(1)
4
V
0.35 VDD_DIG
0.5
10
V
1.2
VPP
30
pF
µF
2.2
85
°C
2
10 pF is the typical load-driving capability. The drive capability can be optimized for 30 pF by the I C register (Byte 3, Bits 7–4).
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
0.1
0.2
2
2.6
UNIT
OVERALL PARAMETER
IDD_ANA
VBAT = 5.5 V;
VDD_ANA = 1.95 V;
Analog supply current (1)
LDO is on; VIS = 1 VPP;
(seeFigure 8 through Figure 12)
fMCLK_IN = 38.4 MHz;
RL = 10 kΩ; CL = 10 pF (2)
IDD_DIG
Digital supply current
(see Figure 8 through
Figure 12)
VBAT = 5.5 V; VDD_DIG = 1.95 V; VDD_ANA
= off;
LDO = off; VIS = 1 Vpp; fMCLK_IN = 38.4
MHz;
CL= 10 pF; RL= 10 kΩ
ISB
Standby current
VBAT = 5.5 V; VDD_DIG/VDD_ANA = 1.95 V;
All outputs disabled (no input clock; LDO
off; no REQ; RESET is inactive; I2C is in
idle mode); includes 1-MΩ pullup at I2C
and RESET
fMCLK_IN
Input frequency
Sine wave
VOH
VOL
VIK
IIH
IIL
MCLK_REQ high-level output
voltage
MCLK_REQ low-level output
voltage
LVCMOS input voltage
Input current ADR_A0, REQx
(500-kΩ pulldown)
Input current RESET (1-MΩ
pullup)
Input current ADR_A0, REQx
(500-kΩ pulldown)
Input current RESET (1-MΩ
pullup)
Off (no REQ)
Per output
0.01
Wired-OR output;
IOH = –2 mA; VDD_DIG = 1.65 V (See
Figure 3.)
VDD_DIG – 0.45
Push-pull output; VDD_DIG = 1.65 V,
IOH = –2 mA
VDD_DIG – 0.45
mA
0.1
mA
0.5
10
µA
38.4
52
MHz
V
Wired-AND output; IOL = 2 mA
VDD_DIG = 1.65 V
0.45
Push-pull output; VDD_DIG = 1.65 V,
IOL = 2 mA
0.45
VDD_DIG = 1.65 V; II = –18 mA
–1.2
V
V
6
µA
VI = VDD_DIG; VDD_DIG = 1.95 V
2
–2
µA
VI = 0 V; VDD_DIG = 1.95 V
–3
CI
Input capacitance ADR_A0,
REQx, RESET
VIK
SCLH/SDAH input clamp
voltage
VDD_DIG = 1.65 V; II = –18 mA
II
SCLH/SDAH input current
0.1 VDD_DIG < VI < 0.9 VDD_DIG
VIH
SDA/SCL input high voltage
VIL
SDAH/SCLH input low voltage
Vhys
Hysteresis of Schmitt-trigger
inputs
VOL
SDAH low-level output voltage
IOL = 3 mA, VDD_DIG = 1.65 V
SCLH input capacitance
VI = 0 V or VI = VDD_DIG (3)
3
5
SDAH input capacitance
VI = 0 V or VI = VDD_DIG (3)
8
10
VI = 0 V or VDD_DIG
3
pF
SDAH/SCLH PARAMETER (Hs-Mode)
CI
(1)
(2)
(3)
–1.2
V
10
µA
0.7 VDD_DIG
V
0.3 VDD_DIG
0.1 VDD_DIG
V
V
0.2 VDD_DIG
V
pF
The total current consumption when no output is active is calculated by IDD_ANA(off) + IDD_DIG.
For CL = 30 pF, the typical current for one output is 2.2 mA (see Figure 8).
The I2C standard specifies a maximum CI of 10 pF.
Copyright © 2009–2011, Texas Instruments Incorporated
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CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
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ELECTRICAL CHARACTERISTICS (continued)
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
52
MHz
SINE-WAVE PARAMETER (MCLK_IN is sine-wave signal, CL = 10 pF)
fOUT
Output frequency
VOS
Output gain level
(see Figure 17)
MCLK_IN-to-CLKx; 10 kΩ, 0.5 ≤ VIS ≤
1.2 VPP
10 pF; ac-coupled;
fMCLK_IN > 1 MHz
VIS = 0.5 VPP
Output voltage
tjitadd(rms)
Additive rms jitter (4)
pnadd
Additive phase noise at fOUT =
38.4 MHz (5)
RIN
Input resistance
CIN
Input capacitance
–1
–0.3
0
dB
445
mVPP
490
500
10 Hz to 10 MHz; fOUT = 38.4 MHz
0.3
0.6
10 kHz to 10 MHz; fOUT = 38.4 MHz
0.1
0.2
At offset = 1 kHz
–142
–135
At offset = 10 kHz
–152
–145
At offset = 100 kHz
–157
–150
At dc level
12
fMCLK_IN = 38.4 MHz
15
5
psRMS
dBc/Hz
kΩ
7
pF
5.5
V
1.9
V
ELECTRICAL CHARACTERISTIC of LDO (COUT = 0.8 to 2.7 µF) (6)
VBAT
VLDO
Input voltage range
LDO output voltage
2.3
(7)
2.3 V < VBAT < 5.5 V, lLOAD = 5 mA
1.72
1.8
Maximum line regulation
2.3 V < VBAT ≤ 5.5 V, lLOAD = 5 mA
0.5%
Maximum load regulation
0 < ILOAD < 5 mA, VBAT = 2.3 V or 5.5 V;
TJ = 25°C
0.5%
ILOAD
Load current
COUT = 0.8 µF to 2.7 µF
0
ILCL
LDO output current limit
VLDO = 0.9 × VLDO(TYP)
10
ILGND
LDO ground pin current (8)
VBAT = 3.6 V; 0 < ILOAD < 5 mA
ILSHDN
LDO shutdown current
2.3 V < VBAT < 5.5 V
ΔVLDO
PSRR
VN
(4)
(5)
(6)
(7)
(8)
6
VBAT = 2.3 V (for min)
VBAT = 2.5 V (for typ)
Power-supply rejection ratio
(ripple rejection) (see Figure 20) VLDO = 1.8 V
ILOAD = 5 mA
Vripple = 0.1 Vpp
Output noise voltage (see
Figure 21)
5
50
100 Hz
60
68
1 kHz
55
62
10 kHz
45
52
100 kHz
33
40
1 MHz
37
46
10 MHz
60
67
BW = 10 Hz to 100 kHz; VLDO = 1.8 V;
ILOAD= 5 mA
mA
60
mA
150
µA
0.2
µA
dB
30
µVRMS
Additive rms jitter is the integrated rms jitter that the device adds to the signal chain. It is calculated by
t jitadd(rms) = (t jitout(rms)2 - t jitin(rms)2 )
. Specified with the supply ripple noise of 30 µV(rms) from 10 Hz to 100 kHz.
Additive phase noise is the amount of phase noise that the device adds to the signal chain. It is calculated by
Ladd (dB) = 10 log (100.1 Lout – 100.1 Lin).
Minimum COUT should be 100 nF to allow for stable LDO operation.
LDO output voltage includes maximum line and load regulation.
LDO ground pin current does not change over VBAT.
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TIMING REQUIREMENTS
over operating free-air temperature range (unless otherwise noted) VLDO = 1.8 V; CL = 10 pF; RL = 10 kΩ
PARAMETER
TEST CONDITIONS
MIN
TYP (1)
MAX
UNIT
TIMING PARAMETER
tPD
tLH
Propagation delay time
MCLK_IN-to-CLKx; fMCLK_IN = 38.4 MHz
Propagation delay time, low-to-high
REQx-to-MCLK_REQ (wired-OR, CL= 15 pF,
RL= 10 kΩ);
CLKx on-time – REQ-to-CLKx
CLKx on-time – RESET-to-CLKx (3)
tCLK
(2)
CLKx off-time – REQ-to-CLKx
CLKx on-time – VDD_ANA to-CLKx
tSP
Pulse duration of spikes that must be
suppressed by the input filter for
RESET (3)
tsk(o)
Output skew (4)
fMCLK_IN = 38.4 MHz; VVDD_ANA is on;
VIS = 1 V; VOS = –1 dB (see Figure 5 and
Figure 6)
fMCLK_IN = 38.4 MHz ; VIS = 1 V;
VOS = –1 dB; measurement starts when
VDD_ANA is 90% of 1.7 V (see Figure 7)
3
ns
15
ns
0.3
0.4
µs
0.6
0.8
µs
25
ns
50
µs
100
ns
20
fMCLK_IN = 38.4 MHz; CLK1-to-CLK4
25
50
ps
VLDO = 1.7 V, ILDO = 5 mA,
2.3 V < VBAT < 5.5 V; COUT = 2.7 µF
100
300
µs
(5)
LDO on-time
– REQ-to-LDO;
– RESET-to-LDO
tLDO
(1)
(2)
(3)
(4)
(5)
All typical values are at nominal VDD_ANA and VDD_DIG.
CLK on-time is measured with valid input signal (VIS = 1 Vpp). In case a TXCO is used, the LDO and TCXO are already on.
Pulses above 500 ns are interpreted as a valid reset signal. Total time from RESET-to-CLKx is the sum of tSP + tCLK_/RESET.
Output skew is calculated as the greater of the difference between the fastest and the slowest tPLH or the difference between the fastest
and the slowest tPHL.
LDO off-time depends on the discharge time of the R-C components (seeFigure 4).
PARAMETER
MIN
MAX
UNIT
SDAH/SCLH TIMING REQUIREMENTS, Hs-Mode (CBUS = 100 pF for each I2C line; see Figure 24 and Figure 25)
fSCLH
SCLH clock frequency
tsu(START)
START setup time (SCLH high before SDAH low)
160
ns
th(START)
START hold time (SCLH low after SDAH low)
160
ns
tLOW
Low period of the SCLH clock
160
ns
tHIGH
High period of the SCLH clock
60
th(SDAH)
SDAH hold time (SDAH valid after SCLH low)
tsu(SDAH)
SDAH setup time
10
SCLH rise time
10
40
SDAH rise time
10
80
SCLH fall time
10
40
10
80
tr
tf
SDAH fall time
tsu(STOP)
STOP setup time
tSP
Pulse duration of spikes that must be suppressed by the input filter for SDAH and
SCLH
(1)
0
0 (1)
3.4
ns
70
ns
ns
160
0
MHz
ns
ns
ns
10
ns
A device must internally provide a data hold time to bridge the undefined period between VIH and VIL of the falling edge of the SCLH
signal. An input circuit with a threshold as low as possible for the falling edge of the SCLH signal minimizes this hold time.
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CDC3S04
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PARAMETER MEASUREMENT INFORMATION
Measuring Point
10 nF
100 nF
15 K
TCXO
15 K
10 pF
Figure 1. Input Circuit
10 kW
Figure 2. Output Circuit
LDO
200 W
VLDO
10 kW
Figure 3. Wired OR
8
TCXO
2.2 mF
i.e. time constant(RxC) is 440 ms for 63% discharge.
Figure 4. LDO Output Circuit
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
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TYPICAL CHARACTERISTICS
CLKx on Time
RESET
CLKx
90% of Final Amplitude
Figure 5. CLKx On-Time From RESET Off-to-On
REQx
CLKx on Time
CLKx
90% of Final Amplitude
Figure 6. CLKx On-Time From REQ Off-to-On
90% of 1.7 V
VDD_ANA
CLKx on Time
CLKx
90% of Final Amplitude
100 ms
200 ms
300 ms
400 ms
500 ms
600 ms
700 ms
800 ms
900 ms
Figure 7. CLKx On-Time From VDD_ANA Off-to-On
Copyright © 2009–2011, Texas Instruments Incorporated
9
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
OUTPUT LOAD (CL) AT 38.4 MHz INPUT CLOCK
10
9
IDD_ANA / CLK1&CLK2&CLK3&CLK4
Supply Current – mA
8
7
IDD_ANA / CLK1&CLK2&CLK3
6
5
IDD_ANA / CLK1&CLK2
4
3
IDD_ANA / CLK1
2
1
IDD_ANA / CLKx off
IDD_DIG
0
0
5
10
15
20
25
30
Output Load – pF
35
40
45
50
Figure 8.
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
OUTPUT LOAD (CL) AT 26 MHz INPUT CLOCK
10
9
IDD_ANA / CLK1&CLK2&CLK3&CLK4
Supply Current – mA
8
7
IDD_ANA / CLK1&CLK2&CLK3
6
5
IDD_ANA / CLK1&CLK2
4
3
IDD_ANA / CLK1
2
1
IDD_ANA / CLKx off
IDD_DIG
0
0
5
10
15
20
25
30
Output Load – pF
35
40
45
50
Figure 9.
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
INPUT FREQUENCY (MCLK_IN)
9
IDD_ANA / CLK1&CLK2&CLK3&CLK4
8
Supply Current – mA
7
IDD_ANA / CLK1&CLK2&CLK3
6
5
IDD_ANA / CLK1&CLK2
4
3
IDD_ANA / CLK1
2
1
IDD_ANA / CLKx off
IDD_DIG
0
0
1
10
Input Frequency – MHz
100
Figure 10.
10
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
INPUT VOLTAGE LEVEL AT 38.4 MHz INPUT CLOCK
9
IDD_ANA / CLK1&CLK2&CLK3&CLK4
8
Supply Current – mA
7
IDD_ANA / CLK1&CLK2&CLK3
6
5
IDD_ANA / CLK1&CLK2
4
3
IDD_ANA / CLK1
2
1
IDD_ANA / CLKx off
0
0.5
0.6
IDD_DIG
0.7
0.8
0.9
Input Voltage Level – VPP
1.0
1.1
1.2
Figure 11.
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
INPUT VOLTAGE LEVEL AT 26 MHz INPUT CLOCK
9
IDD_ANA / CLK1&CLK2&CLK3&CLK4
8
Supply Current – mA
7
IDD_ANA / CLK1&CLK2&CLK3
6
5
IDD_ANA / CLK1&CLK2
4
3
IDD_ANA / CLK1
2
1
IDD_ANA / CLKx off
0
0.5
0.6
IDD_DIG
0.7
0.8
0.9
Input Voltage Level – VPP
1.0
1.1
1.2
Figure 12.
Copyright © 2009–2011, Texas Instruments Incorporated
11
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
TCXO INPUT CLOCK
vs
OUTPUT CLOCK AT 38.4 MHz
MCLK_IN input signal from TCXO
CDC3S04 output signal at CLKx
Figure 13.
TCXO INPUT CLOCK
vs
OUTPUT CLOCK AT 26 MHz
MCLK_IN input signal from TCXO
CDC3S04 output signal at CLKx
Figure 14.
12
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
SINE WAVE INPUT CLOCK
vs
OUTPUT CLOCK AT 38.4 MHz
MCLK_IN sinusoidal input signal
CDC3S04 output signal at CLKx
Figure 15.
SINE WAVE INPUT CLOCK
vs
OUTPUT CLOCK AT 26 MHz
MCLK_IN sinusoidal input signal
CDC3S04 output signal at CLKx
Figure 16.
Copyright © 2009–2011, Texas Instruments Incorporated
13
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
OUTPUT GAIN
vs
INPUT FREQUENCY (MCLK_IN)
1
0
VIS = 1 VPP
VDD_ANA = 1.8 V
Output Gain – dB
-1
–2
–3
–4
–5
–6
–7
1k
10k
100k
1M
10M
100M
Input Frequency – Hz
Figure 17.
INPUT
vs
OUTPUT PHASE-NOISE PERFORMANCE WITH 38.4-MHz TCXO
CLKx Output
CLKx Output Highdrive
MCLK_IN Input
Figure 18.
14
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
INPUT
vs
OUTPUT PHASE-NOISE PERFORMANCE WITH 26-MHz TCXO
CLKx Output
CLKx Output Highdrive
MCLK_IN Input
Figure 19.
LDO POWER SUPPLY REJECTION
vs
FREQUENCY (PSRR)
REF 50.000 dB
5.000 dB/div
80 dB
75 dB
70 dB
65 dB
60 dB
55 dB
50 dB
45 dB
40 dB
START 100 Hz
1 kHz
10 kHz
100 kHz
1 MHz
STOP 10 MHz
Figure 20.
Copyright © 2009–2011, Texas Instruments Incorporated
15
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
TYPICAL CHARACTERISTICS (continued)
LDO OUTPUT SPECTRAL NOISE DENSITY
vs
FREQUENCY
1800
Spectral Noise Density – nV/ Hz
1600
1400
1200
1000
800
600
400
200
0
10
100
1k
10k
100k
Frequency – Hz
Figure 21.
16
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
DETAILED DESCRIPTION
SDAH/SCLH SERIAL INTERFACE (Hs-Mode)
This section describes the SDAH/SCLH interface of the CDC3S04 device. The CDC3S04 operates as a slave
device of the two-wire serial SDAH/SCLH bus, compatible with the popular I2C specification (UM10204-I2C-bus
specification and user manual Rev. 03–19 June 2007). It operates in the high-speed mode (up to 3.4 Mbit/s) and
supports 7-bit addressing. The CDC3S04 is fully downward compatible with fast- and standard-mode (F/S)
devices for bidirectional communication in a mixed-speed bus system.
Data Protocol
The device supports byte-write and byte-read operations only. There is no block-write or block-read operation
supported; therefore, no command code byte is needed.
When a byte has been sent, it is written into the internal register and is immediately effective.
Slave Receiver Address (7 bits)
Device
A6
A5
A4
A3
A2
A1
A0 (1)
R/W
CDC3S04
1
1
0
1
1
0
0
1/0
(1)
Address bit A0 is selectable by the ADR_A0 input (pin D1). This allows addressing of two devices
connected to the same I2C bus. The default value is 0, set by an internal pulldown resistor.
Byte-Write Programming Sequence
F/S-Mode
S
Master Code
Hs-Mode
A
Sr
Slave Address
0000 1XXX
(Hs-Mode Master Code)
R/W
A
0 (Write)
Data
A
Data
A
P
Data Transferred
(n Bytes + Acknowledge)
A = Acknowledge (SDAH LOW)
A = Acknowledge (SDAH HIGH)
S = START Condition
P = STOP Condition
From Master to Slave
From Slave to Master
Figure 22. Byte-Write Protocol
Byte-Read Programming Sequence
F/S-Mode
S
Master Code
Hs-Mode
A
0000 1XXX
(Hs-Mode Master Code)
Sr
Slave Address
R/W
A
1 (Read)
From Master to Slave
From Slave to Master
Data
A
Data
A
P
Data Transferred
(n Bytes + Acknowledge)
A = Acknowledge (SDAH LOW)
A = Acknowledge (SDAH HIGH)
S = START Condition
P = STOP Condition
Figure 23. Byte-Read Protocol
Copyright © 2009–2011, Texas Instruments Incorporated
17
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
Sr
Sr
P
tr(DA)
tf(DA)
SDAH
tsu(STA)
th(DAT)
th(STA)
tsu(DAT)
tsu(STO)
SCLH
tr(CL1)
(1)
t(Low)
t(High)
(1)
tr(CL)
tf(CL)
tr(CL1)
t(Low)
t(High)
= MCS current source pull-up
= Rp resistor pull-up
T0451-01
(1)
First rising edge of the SCLH signal after Sr and after each acknowledge bit.
Figure 24. Definition of Timing for a Complete Hs-Mode Transfer
The following diagram shows how the CDC3S04 clock buffer is connected to the SDAH/SCLH serial interface
bus. Multiple devices can be connected to the bus, but the speed may need to be reduced (3.4 MHz is the
maximum) if many devices are connected.
Note that the pullup resistors (RP) depend on the supply voltage, bus capacitance, and number of connected
devices. For more details, see the I2C bus specification.
CDC3S04
Rp
Rp
Master
Slave
SDAH
SCLH
CBUS CBUS
Figure 25. SDAH/SCLH Hardware Interface
SDAH/SCLH Configuration Registers
The output stages are user configurable. Table 3 explains the programmable functions of the CDC3S04.
18
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
Table 3. Configuration Register (Shaded Cells Marks Power-Up/Default Setting)
Offset
00h
01h
BIT (1)
Acronym
Default (2)
0
1
7
REQ4INT
1b
1b
CLK4 off/on (4)
Off
On
6
REQ3INT
0b
–
CLK3 off/on (4)
Off
On
5
REQ2INT
0b
–
CLK2 off/on (4)
Off
On
4
REQ1INT
1b
1b
CLK1 off/on (4)
Off
On
3
REQ4POL
1b
–
Selects polarity of REQ4
Active-low
Active-high
2
REQ3POL
1b
–
Selects polarity of REQ3
Active-low
Active-high
1
REQ2POL
1b
–
Selects polarity of REQ2
Active-low
Active-high
0
REQ1POL
1b
–
Selects polarity of REQ1
Active-low
Active-high
Not used for
decoding
Used for
decoding
03h
04h–Bh (5)
(1)
(2)
(3)
(4)
(5)
(3)
Description
7
MREQ4
1b
–
Defines if REQ4 is used to decode
MCLK_REQ
6
MREQ3
1b
–
Defines if REQ3 is used to decode
MCLK_REQ
5
MREQ2
1b
–
Defines if REQ2 is used to decode
MCLK_REQ
4
MREQ1
1b
–
Defines if REQ1 is used to decode
MCLK_REQ
3
MCLKOUT1
00b
–
Selects MCLK_REQ output type
00 = wired-OR (default setting)
01 = wired-AND
1x = push-pull
00b
–
Reserved
00b
–
MCLK_REQ generation (see Figure 27)
0x = decoder controlled (default setting)
10 = low
11 = high
00b
–
Switches LDO on or off:
00 = LDO is on (default setting)
01 = LDO is off
1x = decoder controlled (see Figure 27)
2
02h
RESET
MCLKOUT0
0–1
–
7
MREQCTRL1
6
MREQCTRL0
5
LDOEN1
R/W
R/W
4
LDOEN0
3
REQ4PRIO
1b
1b
Defines external vs internal REQ4 priority
REQ4
REQ4INT
2
REQ3PRIO
0b
–
Defines external vs internal REQ3 priority
REQ3
REQ3INT
1
REQ2PRIO
0b
–
Defines external vs internal REQ2 priority
REQ2
REQ2INT
0
REQ1PRIO
1b
1b
Defines external vs internal REQ1 priority
REQ1
REQ1INT
7
HIGHDRIVE4
0b
–
Enables high-drive capability CLK4
Typical
High
6
HIGHDRIVE3
0b
–
Enables high-drive capability CLK3
Typical
High
5
HIGHDRIVE2
0b
–
Enables high-drive capability CLK2
Typical
High
4
HIGHDRIVE1
0b
–
Enables high-drive capability CLK1
Typical
High
0–3
–
0b
–
Reserved
–
Reserved
–
Type
R/W
R/W
R/W
All data is transferred with the MSB first.
A device reset to default condition is initiated by a VDD_DIG power-up sequence.
"–" means that dedicated bits do not change at RESET.
Inactive as long as the REQxPRIO bit is low, external REQx pins are valid (see Figure 26)
Writing data beyond 03h may affect device function.
Copyright © 2009–2011, Texas Instruments Incorporated
19
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
REQ1PRIO
REQ1POL
‘1’
REQ1
active-high
XNOR
REQ3POL
‘1’
REQ3 ‘x’
XNOR
REQ2
CLK1 enabled
signal from externel pin
0
REQ2INT
1
CLK2
enabled if REQ2=’1'
disabled if REQ2=’0'
internal signals or
bits from configuration register
REQ3PRIO
XNOR
REQ3
0
REQ3INT
active-high
1
CLK3
enabled if REQ3=’1'
disabled if REQ3=’0'
REQ4PRIO
REQ4POL
‘1’
REQ4
active-high
0
REQ1INT
1
‘1’
REQ2PRIO
REQ2POL
‘1’
REQ2 ‘x’
active-high
REQ1
XNOR
REQ4
0
REQ4INT
1
‘1’
CLK4 enabled
Figure 26. Clock Output Enable Signal
(Shaded Line Marks Power-Up/Default Setting)
REQ1PRIO
REQ1POL
‘1’
REQ1
active-high
XNOR
REQ2PRIO
REQ2POL
‘1’
REQ2 ‘x’
REQ1
0
REQ1INT
1
‘1’
XNOR
REQ2
REQ2INT
active-high
REQ3 ‘x’
XNOR
REQ3INT
active-high
REQ4POL
‘1’
REQ4
active-high
REQ3
XNOR
REQ4PRIO
REQ4
internal signals or
bits from configuration register
AND
MREQ2
‘1’
0
LDOEN1
AND
LDOEN0
‘0’
0
1
REQ3PRIO
REQ3POL
‘1’
signal from/to
externel pin
MREQ1
‘1’
AND
0
0
MREQ
CTRL0
1
MREQ4
‘1’
0
1
OR
MREQ3
‘1’
‘1’
‘1’
1
LDO is
enabled
MCLK_REQ
MREQCTRL1
AND
REQ4INT
1
‘1’
Figure 27. Decoding Scheme for MCLK_REQ and LDOEN
(Shaded Line Marks Power-Up/Default Setting)
20
Copyright © 2009–2011, Texas Instruments Incorporated
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
APPLICATION INFORMATION
VDD_DIG VDD_ANA
VLDO
LDO
VBAT
REQ1
CLK1
TCXO
REQ2
MCLK_IN
38.4MHz
Battery
Peripheral 1
Peripheral 2
CLK2
MCLK_REQ
REQ3
CLK3
RESET
2
REQ4
I C (Hs-mode)
GND_DIG
CLK4
Peripheral 3
Peripheral 4
GND_ANA
Figure 28. Clock Distribution Scheme
Copyright © 2009–2011, Texas Instruments Incorporated
21
CDC3S04
SCAS883B – OCTOBER 2009 – REVISED MAY 2011
www.ti.com
REVISION HISTORY
Changes from Original (October 2009) to Revision A
Page
•
Changed the format on page 1 (moved 2 paragraphs from page 2 to page 1) .................................................................... 1
•
Changed the X axis from 0.1us to 100us....900us ............................................................................................................... 9
•
Changed Offset 00h Bit 4 Default value from 0h to 1b ....................................................................................................... 19
Changes from Revision A (July 2010) to Revision B
•
22
Page
Changed Table 3 "Offset" values listed in "Default" and "RESET" columns from "h" to "b". ............................................. 19
Copyright © 2009–2011, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com
12-Apr-2011
PACKAGING INFORMATION
Orderable Device
CDC3S04YFFR
Status
(1)
ACTIVE
Package Type Package
Drawing
DSBGA
YFF
Pins
Package Qty
20
3000
Eco Plan
(2)
Green (RoHS
& no Sb/Br)
Lead/
Ball Finish
SNAGCU
MSL Peak Temp
(3)
Samples
(Requires Login)
Level-1-260C-UNLIM
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
23-Nov-2011
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
CDC3S04YFFR
Package Package Pins
Type Drawing
SPQ
DSBGA
3000
YFF
20
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
180.0
8.4
Pack Materials-Page 1
1.63
B0
(mm)
K0
(mm)
P1
(mm)
2.08
0.69
4.0
W
Pin1
(mm) Quadrant
8.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
23-Nov-2011
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
CDC3S04YFFR
DSBGA
YFF
20
3000
210.0
185.0
35.0
Pack Materials-Page 2
D: Max = 1.99 mm, Min = 1.93 mm
E: Max = 1.59 mm, Min = 1.53 mm
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