NSC LMV112SD 40 mhz dual clock buffer Datasheet

LMV112
40 MHz Dual Clock Buffer
General Description
Features
The LMV112 is a high speed dual clock buffer designed for
portable communications and accurate multi-clock systems.
The LMV112 integrates two 40 MHz low noise buffers which
optimizes application and out performs large discrete solutions. This device enables superb system operation between
the base band and the oscillator signal path while eliminating
crosstalk.
(Typical values are: VSUPPLY = 2.7V and CL = 20 pF, unless
otherwise specified)
n Small signal bandwidth
40 MHz
n Supply voltage range
2.4V to 5V
n Slew rate
110 V/µs
n Total supply current
1.6 mA
n Shutdown current
59 µA
n Rail-to-rail input and output
n Individual buffer enable pins
n Rapid Ton technology
n Crosstalk rejection circuitry
n 8-pin LLP, pin access packaging
n Temperature range
−40˚C to 85˚C
National Semiconductor’s unique technology and design deliver accuracy, capacitance and load resistance while increasing the drive capability of the device. The low power
consumption makes the LMV112 perfect for battery applications.
The robust, independent, and flexible buffers are designed to
provide the customer with the ability to manage complex
clock signals in the latest wireless applications. The buffers
deliver 110 V/µs internal slew rate with independent shutdown and duty cycle precision. The patented analog circuit
drives capacitive loads beyond 20 pF. National’s proven
biasing technique has 1V centering, rail-to-rail input/output
unity gain, and AC coupled convenient inputs. These integrated cells save space and require no external bias resistors. National’s rapid recovery after disable optimizes performance and current consumption. The LMV112 offers
individual enable pin controls and since there is no internal
ground reference either single or split supply configurations
offer additional system flexibility and power choices.
The LMV112 is a proven replacement for any discrete circuitry and simplifies board layout while minimizing related
parasitic components.
The LMV112 is produced in the small LLP package which
offers high quality while minimizing its use of PCB space.
National’s advanced packaging offers direct PCB-IC evaluation via pin access.
Applications
n
n
n
n
n
3G mobile applications
WLAN–WiMAX modules
TD_SCDMA multi-mode MP3 and camera
GSM modules
Oscillator modules
Typical Application
20135302
© 2005 National Semiconductor Corporation
DS201353
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LMV112 40 MHz Dual Clock Buffer
June 2005
LMV112
Absolute Maximum Ratings (Note 1)
Soldering Information
Infrared or Convection (35 sec.)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltages (V+– V−)
Operating Ratings (Note 1)
5.5V
Supply Voltage (V+ – V−)
ESD Tolerance (Note 2)
Human Body
Machine Model
−40˚C to +85˚C
Package Thermal Resistance (Notes 3, 4)
200V
LLP-8 (θJA)
−65˚C to +150˚C
Junction Temperature (Note 3)
2.4V to 5.0V
Temperature Range (Notes 3, 4)
2000V
Storage Temperature Range
235˚C
217˚C/W
+150˚C
2.7V Electrical Characteristics
Unless otherwise specified, all limits are guaranteed for TJ = 25˚C, VDD = 2.7V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (Note 4)
Symbol
Parameter
Conditions
Min
(Note 6)
Typ
(Note 5)
Max
(Note 6)
Units
Frequency Domain Response
SSBW
Small Signal Bandwidth
VIN = 0.63 VPP; −3 dB
40
MHz
FPBW
Full Power Bandwidth
VIN = 1.6 VPP; −3 dB
28
MHz
GFN
Gain Flatness < 0.1 dB
f > 100 kHz
3.4
MHz
Distortion and Noise Performance
en
Input-Referred Voltage Noise
f = 1 MHz
26
ISOLATION
Output to Input
f = 1 MHz
91
dB
CT
Crosstalk Rejection
f = 26 MHz, PIN = 0 dBm
54
dB
0.1 VPP Step (10-90%), f = 1 MHz
7
ns
nV/
Time Domain Response
tr
Rise Time
tf
Fall Time
ts
Settling Time to 0.1%
1 VPP Step, f = 1 MHz
6
ns
118
ns
OS
Overshoot
0.1 VPP Step, f = 1 MHz
41
%
SR
Slew Rate (Note 7)
VIN = 1.6 VPP, f = 26 MHz
110
V/µs
Static DC Performance
IS
Supply Current
Enable1,2 = VDD ; No Load
Enable1,2 = VSS ; No Load
PSRR
Power Supply Rejection Ratio
DC (3.0V to 5.0V)
ACL
Small Signal Voltage Gain
VOUT = 0.1 VPP
VOS
Output Offset Voltage
TC VOS
Temperature Coefficient Output
Offset Voltage (Note 8)
ROUT
Output Resistance
1.6
2.0
2.1
mA
59
72
78
µA
58
57
68
0.97
0.95
1.01
1.05
1.07
V/V
0.4
16
17
mV
4
f = 100 kHz
0.5
f = 26 MHz
140
Enable = VDD
141
Enable = VSS
141
Enable = VDD
2.3
Enable = VSS
2.3
f = 26 MHz, Enable = VDD
10.4
f = 26 MHz, Enable = VSS
10.9
dB
µV/˚C
Ω
Miscellaneous Performance
RIN
CIN
ZIN
Input Resistance per Buffer
Input Capacitance per Buffer
Input Impedance
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2
kΩ
pF
kΩ
(Continued)
Unless otherwise specified, all limits are guaranteed for TJ = 25˚C, VDD = 2.7V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (Note 4)
Symbol
VO
ISC
Parameter
Conditions
Min
(Note 6)
Typ
(Note 5)
2.65
2.63
2.69
Output Swing Positive
VIN = VDD
Output Swing Negative
VIN = VSS
Output Short-Circuit Current
(Note 9)
Sourcing
−18
−13
−27
Sinking
20
16
30
10
Ven_hmin
Enable High Active Minimum
Voltage
1.2
Ven_lmax
Enable Low Inactive Maximum
Voltage
0.6
Max
(Note 6)
Units
V
50
65
mV
mA
V
5V Electrical Characteristics
Unless otherwise specified, all limits are guaranteed for TJ = 25˚C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (Note 4)
Symbol
Parameter
Conditions
Min
(Note 6)
Typ
(Note 5)
Max
(Note 6)
Units
Frequency Domain Response
SSBW
Small Signal Bandwidth
VIN = 0.63 VPP; −3 dB
42
MHz
FPBW
Full Power Bandwidth
VIN = 1.6 VPP; −3 dB
31
MHz
GFN
Gain Flatness < 0.1 dB
f > 100 kHz
4.9
MHz
Distortion and Noise Performance
en
Input-Referred Voltage Noise
f = 1 MHz
27
ISOLATION
Output to Input
f = 1 MHz
90
dB
CT
Crosstalk Rejection
f = 26 MHz, PIN = 0 dBm
61
dB
0.1 VPP Step (10-90%), f = 1 MHz
7
ns
6
ns
ns
nV/
Time Domain Response
tr
Rise Time
tf
Fall Time
ts
Settling Time to 0.1%
1 VPP Step, f = 1 MHz
80
OS
Overshoot
0.1VPP Step, f = 1 MHz
20
%
SR
Slew Rate (Note 7)
VIN = 1.6 VPP, f = 26 MHz
120
V/µs
Static DC Performance
IS
Supply Current
Enable1,2 = VDD ; No Load
Enable1,2 = VSS ; No Load
PSRR
Power Supply Rejection Ratio
DC (3.0V to 5.0V)
ACL
Small Signal Voltage Gain
VOUT = 0.1 VPP
VOS
Output Offset Voltage
TC VOS
Temperature Coefficient Output
Offset Voltage (Note 8)
ROUT
Output Resistance
2.5
3.5
3.8
mA
62
80
89
µA
58
57
68
0.99
0.97
1.00
1.01
1.03
V/V
1.3
16
17
mV
3
f = 100 kHz
0.5
f = 26 MHz
118
3
dB
µV/˚C
Ω
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LMV112
2.7V Electrical Characteristics
LMV112
5V Electrical Characteristics
(Continued)
Unless otherwise specified, all limits are guaranteed for TJ = 25˚C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (Note 4)
Symbol
Parameter
Conditions
Min
(Note 6)
Typ
(Note 5)
Max
(Note 6)
Units
Miscellaneous Performance
RIN
CIN
ZIN
VO
ISC
Input Resistance per Buffer
Input Capacitance per Buffer
Input Impedance
Enable = VDD
134
Enable = VSS
134
Enable = VDD
2.0
Enable = VSS
2.0
f = 26 MHz, Enable = VDD
7.2
f = 26 MHz, Enable = VSS
8.0
Output Swing Positive
VIN = VDD
4.96
4.94
Output Swing Negative
VIN = VSS
Output Short-Circuit Current
(Note 9)
Sourcing
-40
-28
-68
Sinking
70
50
98
kΩ
pF
kΩ
4.99
10
Ven_hmin
Enable High Active Minimum
Voltage
1.2
Ven_lmax
Enable Low Inactive Maximum
Voltage
0.6
V
40
55
mV
mA
V
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables.
Note 2: Human Body Model: 1.5 kΩ in series with 100 pF. Machine Model: 0Ω in series with 200 pF.
Note 3: The maximum power dissipation is a function of TJ(MAX), θJA , and TA. The maximum allowable power dissipation at any ambient temperature is
PD = (TJ(MAX) − TA) / θJA. All numbers apply for packages soldered directly onto a PC board.
Note 4: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of
the device such that TJ = TA . There is no guarantee of parametric performance as indicated in the electrical tables under conditions of internal self-heating where
TJ > TA.
Note 5: Typical Values represent the most likely parametric norm.
Note 6: All limits are guaranteed by testing or statistical analysis.
Note 7: Slew rate is the average of the positive and negative slew rate.
Note 8: Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total temperature change.
Note 9: Short−Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed
junction temperature of 150˚C.
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4
LMV112
Block Diagram
20135301
Pin Description
Pin No.
Pin Name
1
VDD
Voltage supply connection
2
IN 1
Input 1
3
IN 2
Input 2
4
ENABLE 2
5
VSS
6
OUT 2
7
OUT 1
8
ENABLE 1
Description
Enable buffer 2
Ground connection
Output 2
Output 1
Enable buffer 1
Connection Diagram
8-Pin LLP
20135331
Top View
Ordering Information
Package
Part Number
8-Pin LLP
No Pull Back
LMV112SD
LMV112SDX
Package Marking
Transport Media
1k Units Tape and Reel
112SD
4.5k Units Tape and Reel
5
NSC Drawing
SDA08A
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LMV112
Typical Performance Characteristics TJ = 25˚C, VDD = 2.7V, VSS = 0V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ and CCOUPLING = 1 nF, unless otherwise specified.
Frequency Response
Phase Response
20135303
20135304
Frequency Response Over Temperature
Frequency Response Over Temperature
20135305
20135306
Phase Response Over Temperature
Phase Response Over Temperature
20135307
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20135308
6
Full Power Bandwidth
Gain Flatness 0.1 dB (GFN)
20135310
20135309
Voltage Noise
Isolation Output to Input vs. Frequency
20135329
20135317
Crosstalk Rejection vs. Frequency
Transient Response Positive
20135314
20135311
7
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LMV112
Typical Performance Characteristics TJ = 25˚C, VDD = 2.7V, VSS = 0V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ and CCOUPLING = 1 nF, unless otherwise specified. (Continued)
LMV112
Typical Performance Characteristics TJ = 25˚C, VDD = 2.7V, VSS = 0V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ and CCOUPLING = 1 nF, unless otherwise specified. (Continued)
Transient Response Negative
Small Signal Pulse Response
20135312
20135325
Small Signal Pulse Response
Large Signal Pulse Response
20135326
20135327
Large Signal Pulse Response
ISUPPLY vs. VSUPPLY
20135328
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20135332
8
ISUPPLY vs. VSUPPLY
ISUPPLY vs. VSUPPLY
20135333
20135334
PSRR vs. Frequency
VOS vs. VSUPPLY
20135324
20135335
ROUT vs. Frequency
Input Impedance vs. Frequency
20135316
20135315
9
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LMV112
Typical Performance Characteristics TJ = 25˚C, VDD = 2.7V, VSS = 0V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ and CCOUPLING = 1 nF, unless otherwise specified. (Continued)
LMV112
Typical Performance Characteristics TJ = 25˚C, VDD = 2.7V, VSS = 0V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ and CCOUPLING = 1 nF, unless otherwise specified. (Continued)
VOUT vs. IOUT (Sourcing)
VOUT vs. IOUT (Sourcing)
20135336
20135337
VOUT vs. IOUT (Sinking)
VOUT vs. IOUT (Sinking)
20135338
20135339
ISC Sourcing vs. VSUPPLY over Temperature
ISC Sinking vs. VSUPPLY over Temperature
20135341
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20135342
10
ISUPPLY vs VENABLE
ISUPPLY vs VENABLE
20135347
20135348
11
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LMV112
Typical Performance Characteristics TJ = 25˚C, VDD = 2.7V, VSS = 0V, Enable1,2 = VDD, CL = 20
pF, RL = 30 kΩ and CCOUPLING = 1 nF, unless otherwise specified. (Continued)
LMV112
A block diagram of the isolation is shown in Figure 2.
Crosstalk rejection between buffers prevents signals from
affecting each other. Figure 2 shows a Base band IC and a
Bluetooth module as examples of this. See the characteristic
graphic labeled “Crosstalk Rejection vs. Frequency” for more
information.
Application Section
GENERAL
The LMV112 is designed to minimize the effects of spurious
signals from the base band chip to the oscillator. Also the
influence of varying load resistance and capacitance to the
oscillator is minimized, while the drive capability is increased.
The inputs of the LMV112 are internally biased at 1V, making
AC coupling possible without external bias resistors.
To optimize current consumption, the buffer not in use can
be disabled by connecting the enable pin to VSS.
The LMV112 has no internal ground reference; therefore,
either single or split supply configurations can be used.
The LMV112 is an easy replacement for discrete circuitry. It
simplifies board layout and minimizes the effect of layout
related parasitic components.
20135345
INPUT CONFIGURATION
AC coupling is made possible by biasing the input. A large
DC load at the oscillator input could change the load impedance and therefore it’s oscillating frequency. To avoid external resistors the inputs are internally biased. This biasing is
set at 1V as depicted in Figure 1. Because this biasing is set
at 1V, the maximum amplitude of the AC signal is 2 VPP.
The coupling capacitance should be large enough to let the
AC signal pass. This is a unity gain buffer with rail-to-rail
inputs and outputs.
FIGURE 2. Isolation Block Diagram
DRIVING CAPACITIVE LOADS
Each buffer can drive a capacitive load. Be aware that every
capacitor directly connected to the output becomes part of
the loop of the buffer. In most applications the load consists
of the capacitance of copper tracks and the input capacitance of the application blocks. Capacitance reduces the
gain/phase margin and increases the instability. It leads to
peaking in the frequency response and in extreme situations
oscillations can occur. To drive a large capacitive load it is
recommended that a series resistor is included between the
buffer and the load capacitor. The best value for this isolation
resistance is often found by experimentation.
The LMV112 datasheet reflects measurements with capacitance loads of 20 pF at the output of the buffers. Most
common applications will probably use a lower capacitance
load, which will result in lower peaking and significantly
greater bandwidth, see Figure 3.
20135344
FIGURE 1. Input Configuration
FREQUENCY PULLING
Frequency pulling is the frequency variation of an oscillator
caused by a varying load. In the typical application, the load
of the oscillator is a fixed capacitor (C1) and the input
impedance of the buffer.
To keep the input impedance as constant as possible, the
input is biased at 1V, even when the part is disabled. A
simplified schematic of the input configuration is shown in
Figure 1.
20135346
FIGURE 3. Bandwidth and Peaking
ISOLATION AND CROSSTALK
Output to input isolation prevents the clock from being affected by spurious signals generated by the digital blocks at
the output buffer. See the characteristic graphic entitled “Isolation Output to Input vs. Frequency.”
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12
Another important issue is the value of the components,
which also determines the sensitivity to disturbances. Resistor value’s should be but avoid using values that cause a
significant increase in power consumption while loading inputs or outputs to heavily.
(Continued)
LAYOUT DESIGN RECOMMENDATION
Careful consideration for circuitry design and PCB layout will
eliminate problems and will optimize the performance of the
LMV112. It is best to have the same ground plane on the
PCB for all power supply lines. This gives a low impedance
return path for all decoupling and other ground connections.
To ensure a clean supply voltage it is best to place decoupling capacitors close to the LMV112, between VCC and
ground. The output of the VCO must be correctly terminated
with proper load impedance.
13
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LMV112
Application Section
LMV112 40 MHz Dual Clock Buffer
Physical Dimensions
inches (millimeters) unless otherwise noted
8-Pin LLP
NS Package Number SDA08A
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves
the right at any time without notice to change said circuitry and specifications.
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