IRF IRFP4127PBF High efficiency synchronous rectification in smp Datasheet

IRFP4127PbF
HEXFET® Power MOSFET
Application
 High Efficiency Synchronous Rectification in SMPS
 Uninterruptible Power Supply
High Speed Power Switching
 Hard Switched and High Frequency Circuits
VDSS
200V
RDS(on) typ.
17m
D
G
21m
max
S
ID
75A
Benefits
Improved Gate, Avalanche and Dynamic dV/dt Ruggedness
Fully Characterized Capacitance and Avalanche SOA
Enhanced body diode dV/dt and dI/dt Capability
Lead-Free, RoHS Compliant




S
D
G
TO-247AC
Base part number
Package Type
IRFP4127PbF
TO-247AC
G
D
S
Gate
Drain
Source
Standard Pack
Form
Quantity
Tube
25
Orderable Part Number
IRFP4127PbF
Parameter
Continuous Drain Current, VGS @ 10V
Max.
75
Units
ID @ TC = 25°C
ID @ TC = 100°C
Continuous Drain Current, VGS @ 10V
53
A
IDM
Pulsed Drain Current 
300
PD @TC = 25°C
Maximum Power Dissipation
341
W
Linear Derating Factor
2.3
W/°C
VGS
dv/dt
TJ
TSTG
Gate-to-Source Voltage
Peak Diode Recovery dv/dt
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 seconds
(1.6mm from case)
± 20
57
V
V/ns
Mounting Torque, 6-32 or M3 Screw
-55 to + 175
°C
300
10 lbf·in (1.1 N·m)
Avalanche Characteristics
EAS (Thermally limited)
Single Pulse Avalanche Energy 
mJ
244
Thermal Resistance
Parameter
Junction-to-Case 
Case-to-Sink, Flat Greased Surface
Junction-to-Ambient 
RJC
RCS
RJA
1
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Typ.
–––
0.24
–––
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Max.
0.4
–––
40
Units
°C/W
March 09, 2015
IRFP4127PbF
Static @ TJ = 25°C (unless otherwise specified)
Parameter
Min.
Typ. Max. Units
200
–––
–––
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient
–––
0.23
–––
RDS(on)
Static Drain-to-Source On-Resistance
–––
17
21
VGS(th)
Gate Threshold Voltage
3.0
–––
5.0
IDSS
Drain-to-Source Leakage Current
–––
–––
20
–––
–––
250
–––
–––
–––
–––
–––
3.0
100
-100
–––
Drain-to-Source Breakdown Voltage
V(BR)DSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Gate Resistance
IGSS
RG
V
Conditions
VGS = 0V, ID = 250µA
V/°C Reference to 25°C, ID = 5mA
m VGS = 10V, ID = 44A 
V
µA
nA
VDS = VGS, ID = 250µA
VDS = 200 V, VGS = 0V
VDS =200V,VGS = 0V,TJ =125°C
VGS = 20V
VGS = -20V

Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
VDS = 50V, ID =44A
ID = 44A
VDS = 100V
nC
VGS = 10V
ID = 44A, VDS =0V, VGS = 10V
VDD = 100V
ID = 44A
ns
RG= 2.7
VGS = 10V
gfs
Qg
Qgs
Qgd
Qsync
td(on)
tr
Forward Transconductance
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain Charge
Total Gate Charge Sync. (Qg - Qgd)
Turn-On Delay Time
Rise Time
45
–––
–––
–––
–––
–––
–––
–––
100
30
31
69
17
18
–––
150
–––
–––
–––
–––
–––
S
td(off)
Turn-Off Delay Time
–––
56
–––
tf
Ciss
Coss
Crss
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
–––
–––
–––
–––
22
5380
410
86
–––
–––
–––
–––
Coss eff.(ER)
Effective Output Capacitance (Energy Related)
–––
360
–––
Coss eff.(TR)
Output Capacitance (Time Related)
–––
590
–––
Parameter
Continuous Source Current
(Body Diode) 
Pulsed Source Current
(Body Diode)
Min.
Typ. Max. Units
–––
–––
75
–––
–––
300
VSD
Diode Forward Voltage
–––
–––
1.3
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
IRRM
Reverse Recovery Current
–––
–––
–––
–––
–––
136
139
458
688
8.3
–––
–––
–––
–––
–––
VGS = 0V
VDS = 50V
ƒ = 1.0MHz
pF
VGS = 0V, VDS = 0V to 160V
See Fig.11
VGS = 0V, VDS = 0V to 160V
Diode Characteristics
IS
ISM
A
V
Conditions
MOSFET symbol
showing the
integral reverse
p-n junction diode.
D
G
S
TJ = 25°C,IS = 44A,VGS = 0V 
TJ = 25°C
VDD = 100V
TJ = 125°C
IF = 44A,
TJ = 25°C di/dt = 100A/µs 
nC
TJ = 125°C
A TJ = 25°C 
ns
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Recommended max EAS limit, starting TJ = 25°C, L = 0.25mH, RG = 25, IAS = 44A, VGS =10V.
ISD 4A, di/dt A/µs, VDD V(BR)DSS, TJ  175°C.
Pulse width 400µs; duty cycle  2%.
Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS.
Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques
refer to application note #AN-994
Ris measured at TJ approximately 90°C








2
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March 09, 2015
IRFP4127PbF
1000
1000
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
100
10
BOTTOM
1
0.1
 60µs PULSE WIDTH
Tj = 25°C
4.5V
100
0.01
BOTTOM
10
4.5V
1
 60µs PULSE WIDTH
Tj = 175°C
0.1
0.1
1
10
100
0.1
VDS, Drain-to-Source Voltage (V)
100
3.5
VDS = 50V
 60µs PULSE WIDTH
RDS(on) , Drain-to-Source On Resistance
(Normalized)
ID, Drain-to-Source Current )
10
Fig 2. Typical Output Characteristics
1000
100
T J = 175°C
10
T J = 25°C
1
0.1
3.0
4.0
5.0
6.0
7.0
ID = 44A
VGS = 10V
3.0
2.5
2.0
1.5
1.0
0.5
8.0
-60 -40 -20
VGS, Gate-to-Source Voltage (V)
8000
16
VGS, Gate-to-Source Voltage (V)
ID= 44A
Coss = Cds + Cgd
Ciss
4000
2000
Coss
1
VDS= 40V
8
4
0
10
100
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage
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VDS= 160V
VDS= 100V
0
Crss
0
20 40 60 80 100 120 140 160 180
Fig 4. Normalized On-Resistance vs. Temperature
VGS = 0V,
f = 1 MHZ
Ciss = C gs + Cgd, C ds SHORTED
Crss = C gd
6000
0
T J , Junction Temperature (°C)
Fig 3. Typical Transfer Characteristics
C, Capacitance (pF)
1
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
3
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
TOP
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
TOP
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20
40
60
80
100
120
QG Total Gate Charge (nC)
Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage
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IRFP4127PbF
VDS = 50V
 60µs PULSE WIDTH
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current  )
1000
100
T J = 175°C
10
T J = 25°C
1
0.1
3.0
4.0
5.0
6.0
7.0
1
10msec
40
20
0
125
150
Tc = 25°C
Tj = 175°C
Single Pulse
0.1
1
175
Id = 5mA
240
220
200
180
-60 -40 -20 0 20 40 60 80 100120140160180
T J , Temperature ( °C )
Fig 10. Drain-to–Source Breakdown Voltage
Fig 9. Maximum Drain Current vs. Case Temperature
8.0
EAS, Single Pulse Avalanche Energy (mJ)
1200
6.0
Energy (µJ)
100
260
T C , CaseTemperature (°C)
4.0
2.0
0.0
ID
7.7A
12.6A
BOTTOM 44A
TOP
1000
800
600
400
200
0
0
40
80
120
160
200
VDS, Drain-to-Source Voltage (V)
Fig 11. Typical Coss Stored Energy
4
10
Fig 8. Maximum Safe Operating Area
V(BR)DSS , Drain-to-Source Breakdown Voltage (V)
ID , Drain Current (A)
60
100
DC
0.1
VDS, Drain-to-Source Voltage (V)
80
75
1msec
0.01
8.0
Fig 7. Typical Source-Drain Diode Forward Voltage
50
OPERATION IN
THIS AREA
LIMITED BY RDS(on)
10
VGS, Gate-to-Source Voltage (V)
25
100µsec
100
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25
50
75
100
125
150
175
Starting T J, Junction Temperature (°C)
Fig 12. Maximum Avalanche Energy vs. Drain Current
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IRFP4127PbF
Thermal Response ( Z thJC ) °C/W
1
D = 0.50
0.1
0.20
0.10
J
0.05
0.01
0.02
0.01
SINGLE PULSE
( THERMAL RESPONSE )
0.001
1E-006
1E-005
R1
R1
J
1
R2
R2
R3
R3
R4
R4
C
1
2
2
3
3
4
C
4
Ci= iRi
Ci= iRi
Ri (°C/W)
I (sec)
0.02
0.000019
0.08333
0.000078
0.181667
0.001716
0.11333
0.008764
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case
100
Avalanche Current (A)
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming  Tj = 150°C and
Tstart = 25°C (Single Pulse)
10
1
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming j = 25°C and
Tstart = 150°C.
0.1
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
tav (sec)
Fig 14. Typical Avalanche Current vs. Pulse Width
EAR , Avalanche Energy (mJ)
250
TOP
Single Pulse
BOTTOM 1% Duty Cycle
ID = 44A
200
150
100
50
0
25
50
75
100
125
150
175
Starting T J , Junction Temperature (°C)
Fig 15. Maximum Avalanche Energy vs. Temperature
5
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IRFP4127PbF
50
ID = 1.0A
ID = 1.0mA
ID = 250µA
5.0
40
30
IRRM - (A)
VGS(th) Gate threshold Voltage (V)
6.0
4.0
3.0
20
I F = 29A
2.0
10
1.0
0
-75 -50 -25
0
25
50
75
VR = 100V
T J = 125°C
T J = 25°C
100 200 300 400 500 600 700 800 900 1000
100 125 150 175
dif / dt - (A / µs)
T J , Temperature ( °C )
Fig 17. Typical Recovery Current vs. dif/dt
60
3000
50
2500
40
2000
QRR - (nC)
IRRM - (A)
Fig 16. Threshold Voltage vs. Temperature
30
20
1500
1000
I F = 44A
VR = 100V
T J = 125°C
10
VR = 100V
T J = 125°C
500
T J = 25°C
T J = 25°C
0
I F = 29A
0
100 200 300 400 500 600 700 800 900 1000
100 200 300 400 500 600 700 800 900 1000
dif / dt - (A / µs)
dif / dt - (A / µs)
Fig 18. Typical Recovery Current vs. dif/dt
Fig 19. Typical Stored Charge vs. dif/dt
3000
2500
QRR - (nC)
2000
1500
1000
I F = 44A
VR = 100V
T J = 125°C
500
T J = 25°C
0
100 200 300 400 500 600 700 800 900 1000
dif / dt - (A / µs)
Fig 20. Typical Stored Charge vs. dif/dt
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IRFP4127PbF
Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs
V(BR)DSS
tp
15V
L
VDS
D.U.T
RG
IAS
20V
tp
DRIVER
+
V
- DD
A
I AS
0.01
Fig 22a. Unclamped Inductive Test Circuit
Fig 22b. Unclamped Inductive Waveforms
Fig 23a. Switching Time Test Circuit
Fig 23b. Switching Time Waveforms
Id
Vds
Vgs
Vgs(th)
Qgs1 Qgs2
Fig 24a. Gate Charge Test Circuit
7
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Qgd
Qgodr
Fig 24b. Gate Charge Waveform
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IRFP4127PbF
TO-247AC Package Outline
Dimensions are shown in millimeters (inches)
E
Q
A
A
E2/2
"A"
A2
E2
2X
D
B
L1
"A"
L
SEE
VIEW"B"
2x b2
3x b
Ø .010
BA
c
b4
e
A1
2x
LEAD TIP
ØP
Ø.010
B A
-A-
S
D1
VIEW: "B"
THERMAL PAD
PLATING
BASEMETAL
E1
Ø.010
(c)
B A
VIEW: "A" - "A"
(b, b2, b4)
SECTION: C-C, D-D, E-E
TO-247AC Part Marking Information
Notes: This part marking information applies to devices produced after 02/26/2001
EXAMPLE: THIS IS AN IRFPE30
WITH ASSEMBLY
LOT CODE 5657
ASSEMBLED ON WW 35, 2001
IN THE ASSEMBLY LINE "H"
Note: "P" in assembly line position
indicates "Lead-Free"
INTERNATIONAL
RECTIFIER
LOGO
PART NUMBER
IRFPE30
56
135H
57
ASSEMBLY
LOT CODE
DATE CODE
YEAR 1 = 2001
WEEK 35
LINE H
TO-247AC package is not recommended for Surface Mount Application.
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
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IRFP4127PbF
Qualification Information†
Industrial
Qualification Level
(per JEDEC JESD47F) ††
Moisture Sensitivity Level
TO-247AC
N/A
Yes
RoHS Compliant
†
Qualification standards can be found at International Rectifier’s web site: http://www.irf.com/product-info/reliability/
††
Applicable version of JEDEC standard at the time of product release.
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 101N Sepulveda., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
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March 09, 2015
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