Siemens BSS110 Sipmos small-signal transistor (p channel enhancement mode logic level) Datasheet

BSS 110
SIPMOS ® Small-Signal Transistor
• P channel
• Enhancement mode
• Logic Level
• VGS(th) = -0.8...-2.0 V
Pin 1
Pin 2
S
Pin 3
G
Type
VDS
ID
RDS(on)
Package
Marking
BSS 110
-50 V
-0.17 A
10 Ω
TO-92
SS 110
Type
BSS 110
BSS 110
BSS 110
Ordering Code
Q62702-S500
Q62702-S278
Q67000-S568
D
Tape and Reel Information
E6288
E6296
E6325
Maximum Ratings
Parameter
Symbol
Drain source voltage
VDS
V
Drain-gate voltage
-50
Unit
V
DGR
RGS = 20 kΩ
-50
Gate source voltage
VGS
Continuous drain current
ID
TA = 35 °C
± 20
A
-0.17
IDpuls
DC drain current, pulsed
TA = 25 °C
-0.68
Ptot
Power dissipation
TA = 25 °C
Semiconductor Group
Values
W
0.63
1
12/05/1997
BSS 110
Maximum Ratings
Parameter
Symbol
Values
Unit
Chip or operating temperature
Tj
-55 ... + 150
°C
Storage temperature
Tstg
-55 ... + 150
Thermal resistance, chip to ambient air 1)
RthJA
≤ 200
DIN humidity category, DIN 40 040
K/W
E
IEC climatic category, DIN IEC 68-1
55 / 150 / 56
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Static Characteristics
Drain- source breakdown voltage
V(BR)DSS
VGS = 0 V, ID = -0.25 mA, Tj = 25 °C
Gate threshold voltage
-50
-
-
-0.8
-1.5
-2
VGS(th)
VGS=VDS, ID = -1 mA
Zero gate voltage drain current
V
IDSS
µA
VDS = -50 V, VGS = 0 V, Tj = 25 °C
-
-0.1
-1
VDS = -50 V, VGS = 0 V, Tj = 125 °C
-
-2
-60
VDS = -25 V, VGS = 0 V, Tj = 25 °C
-
-
-0.1
Gate-source leakage current
IGSS
VGS = -20 V, VDS = 0 V
Drain-Source on-state resistance
-
-1
-10
Ω
RDS(on)
VGS = -10 V, ID = -0.17 A
Semiconductor Group
nA
-
2
5.3
10
12/05/1997
BSS 110
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Dynamic Characteristics
Transconductance
gfs
VDS≥ 2 * ID * RDS(on)max, ID = -0.17 A
Input capacitance
0.05
pF
-
30
40
-
17
25
-
8
12
Crss
VGS = 0 V, VDS = -25 V, f = 1 MHz
Turn-on delay time
-
Coss
VGS = 0 V, VDS = -25 V, f = 1 MHz
Reverse transfer capacitance
0.09
Ciss
VGS = 0 V, VDS = -25 V, f = 1 MHz
Output capacitance
S
td(on)
ns
VDD = -30 V, VGS = -10 V, ID = -0.27 A
RG = 50 Ω
Rise time
-
7
10
-
12
18
-
10
13
-
20
27
tr
VDD = -30 V, VGS = -10 V, ID = -0.27 A
RG = 50 Ω
Turn-off delay time
td(off)
VDD = -30 V, VGS = -10 V, ID = -0.27 A
RG = 50 Ω
Fall time
tf
VDD = -30 V, VGS = -10 V, ID = -0.27 A
RG = 50 Ω
Semiconductor Group
3
12/05/1997
BSS 110
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Symbol
Values
Parameter
min.
typ.
Unit
max.
Reverse Diode
Inverse diode continuous forward current IS
TA = 25 °C
Inverse diode direct current,pulsed
-
-0.17
-
-
-0.68
VSD
VGS = 0 V, IF = -0.34 A
Semiconductor Group
-
ISM
TA = 25 °C
Inverse diode forward voltage
A
V
-
4
-0.95
-1.2
12/05/1997
BSS 110
Power dissipation
Ptot = ƒ(TA)
Drain current
ID = ƒ(TA)
parameter: VGS ≥ -10 V
0.70
-0.18
W
A
0.60
Ptot
ID
0.55
-0.14
0.50
-0.12
0.45
0.40
-0.10
0.35
-0.08
0.30
0.25
-0.06
0.20
-0.04
0.15
0.10
0.05
0.00
0
-0.02
20
40
60
80
100
120
°C
160
0.00
0
20
40
60
80
100
120
TA
°C
160
TA
Safe operating area ID=f(VDS)
Drain-source breakdown voltage
V(BR)DSS = ƒ(Tj)
parameter : D = 0.01, TC=25°C
-60
V
-58
V(BR)DSS-57
-56
-55
-54
-53
-52
-51
-50
-49
-48
-47
-46
-45
-60
-20
20
60
100
°C
160
Tj
Semiconductor Group
5
12/05/1997
BSS 110
Typ. output characteristics
ID = ƒ(VDS)
parameter: tp = 80 µs
-0.38
Ptot = 1W
A
Typ. drain-source on-resistance
RDS (on) = ƒ(ID)
parameter: tp = 80 µs, Tj = 25 °C
32
l j
k
i
Ω
-0.32
VGS [V]
-2.0
ID
RDS (on)
h a
-0.28
-0.24
g
-0.20
-0.16
-2.5
c
-3.0
d
-3.5
e
-4.0
f
-4.5
g
-5.0
h
-6.0
f i
-7.0
j
-8.0
-0.12
e
-0.08
b
k
-9.0
l
-10.0
a
b
c
d
e
f
24
20
16
12
8
g
d
i
c
4 VGS [V] =
-0.04
0.00
0.0
a
-1.0
-2.0
-3.0
-4.0
a
b
c
d
e
f
-2.5
-2.0
-3.0 -3.5 -4.0 -4.5 -5.0 -6.0
b
-5.0
V
g
h
i
j
-7.0 -8.0 -9.0 -10.0
0
0.00 -0.04 -0.08 -0.12 -0.16 -0.20 -0.24 -0.28 A -0.34
-6.5
VDS
ID
Typ. transfer characteristics ID = f(VGS)
parameter: tp = 80 µs
VDS≥ 2 x ID x RDS(on)max
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 µs,
VDS≥2 x ID x RDS(on)max
-0.9
0.16
A
ID
h
j
S
gfs
-0.7
0.12
-0.6
0.10
-0.5
0.08
-0.4
0.06
-0.3
0.04
-0.2
0.02
-0.1
0.0
0
-1
-2
-3
-4
-5
-6
-7
-8
V
-10
VGS
Semiconductor Group
6
0.00
0.0
-0.1
-0.2
-0.3
-0.4
-0.5
-0.6
A
ID
-0.8
12/05/1997
BSS 110
Drain-source on-resistance
RDS (on) = ƒ(Tj)
parameter: ID = -0.17 A, VGS = -10 V
Gate threshold voltage
VGS (th) = ƒ(Tj)
parameter: VGS = VDS, ID = -1 mA
24
-4.6
Ω
V
-4.0
20
RDS (on)
VGS(th)
18
-3.6
-3.2
16
-2.8
14
98%
12
-2.4
98%
10
-2.0
8
-1.6
typ
typ
6
-1.2
4
-0.8
2
-0.4
2%
0
-60
-20
20
60
100
°C
0.0
-60
160
-20
20
60
100
Tj
°C
160
Tj
Typ. capacitances
C = f (VDS)
parameter:VGS=0V, f = 1 MHz
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj, tp = 80 µs
10 3
-10 0
pF
A
IF
C
10 2
-10 -1
Ciss
Coss
10 1
-10 -2
Crss
Tj = 25 °C typ
Tj = 150 °C typ
Tj = 25 °C (98%)
Tj = 150 °C (98%)
10 0
0
-5
-10
Semiconductor Group
-15
-20
-25
-30
V
VDS
-40
-10 -3
0.0
-0.4
-0.8
-1.2
-1.6
-2.0
-2.4
V
-3.0
VSD
7
12/05/1997
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