Rohm MCH155A Multi-layer ceramic chip capacitor Datasheet

MCH15
Ceramic capacitors
Multi-layer ceramic chip capacitors
MCH15 (1005 (0402) size, chip capacitor)
!External dimensions (Units : mm)
!Features
1) Small size (1.0 x 0.5 x 0.5 mm) makes it perfect
for lightweight portable devices.
2) Comes packed either in tape to enable automatic
mounting or in bulk cases.
3) Precise uniformity of shape and dimensions facilitates
highly efficient automatic mounting.
4) Barrier layer and end terminations to improve
solderability.
0.1Min.
0.3Min.
0.5±0.05
0.5±0.05
0.5±0.05
1.0±0.05
0.5±0.05
!Structure
External electrode ΙΙΙ (coating layer)
Internal electrode
Ceramic element
External electrode ΙΙ (barrier layer)
External electrode Ι (thick membrane layer)
!Product designation
Basic ordening unit (pcs.)
Code Product thickness Packaging specifications
Reel
K
0.5mm
Paper tape (width 8 mm, pitch 2 mm) φ180mm (7in.)
10,000
L
0.5mm
Paper tape (width 8 mm, pitch 2 mm) φ330mm (13in.)
50,000
C
0.5mm
Bulk case
−
50,000
Reel (φ180, φ330mm) : compatible with EIAJ ET-7200A
Bulk case: compatible with EIAJ ET-7201A
Part No.
M C H
Rated voltage
Code Voltage
2
25V
3
16V
5
50V
Packaging style
1 5
5
F N
1 0 3
Z
K
Nominal Capacitance tolerance
Capacitance-temperature characteristics
Code Code Operating temperature (°C) Temp. coefficient or percent change capacitance Code
tolerance
A CG(C0G)
0±30ppm/°C
−55~+125
C ± 0.25pF (0.5 ~ 5pF)
CN
R
−55~+125
±15%
D ± 0.5pF (5.1 ~ 10pF)
3-digit designation J ± 5% (11pF or more)
B
−25~+85
±10%
according
to
IEC
(X7R)
(−55~+125)
(±15%)
K
± 10%
FN
F
−25~+85
+30%,−80%
(Y5V)
(+22%,−82%)
(−30~+85)
Z + 80%, −20%
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
!Capacitance range
For thermal compensation
Part number
Capacitance (pF)
Temperature
characteristics
Rated voltage
(V)
Tolerance
MCH15
Part number
A
(CG) (C0G)
Capacitance (pF)
50V
47
51
56
1.1
1.2
1.3
62
68
75
1.5
1.6
1.8
82
91
100
C ( ± 0.25pF)
110
120
130
2.7
3
3.3
150
160
180
3.6
3.9
4
200
220
240
4.3
4.7
5
270
300
330
5.1
5.6
6
360
390
430
6.2
6.8
7
470
510
560
7.5
8
8.2
D ( ± 0.5pF)
Rated voltage
(V)
Tolerance
0.5
0.75
1
2
2.2
2.4
Temperature
characteristics
MCH15
A
(CG) (C0G)
50V
J ( ± 5%)
Product thickness (mm) 0.5 ± 0.05
9
9.1
10
11
12
13
15
16
18
20
22
24
J ( ± 5%)
27
30
33
36
39
43
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
High dielectric constant
Part number
Capacitance (pF)
MCH15
Temperature
characteristics
Rated voltage (V)
Tolerance
CN (R) (B) (X7R)
50V
16V
K ( ±10%)
FN (F) (Y5V)
50V
25V
16V
Z ( +80, −20%)
220
270
330
390
470
560
680
820
1,000
1,200
1,500
1,800
2,200
2,700
3,300
3,900
4,700
5,600
6,800
8,200
10,000 (0.01µF)
12,000
15,000
18,000
22,000
27,000
33,000
39,000
47,000
56,000
68,000
82,000
100,000 (0.1µF)
120,000
150,000
180,000
220,000
270,000
330,000
390,000
470,000
560,000
Product thickness (mm) 0.5 ± 0.05
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
!Characteristics
Class 1 (For thermal compensation)
Temperature characteristics
A (CG) (C0G)
Item
Operating temperature
Test methods/conditions
(based on JIS C 5102)
−55°C ~ 125°C
Nominal capacitance (C)
Must be within the specified tolerance range.
Based on paragraph 7.8 and paragraph 9
Measured at room temperature and standard humidity,
Dissipation factor (tanδ)
100/(400+20C)% or less: Less than 30 pF
0.1% or less : 30 pF or larger
1000pF or less Measurement frequency : 1 ± 0.1MHz
Measurement voltage : 1 ± 0.1Vrms.
Over 1000pF Measurement frequency : 1 ± 0.1kHz
Measurement voltage : 1 ± 0.1Vrms.
Insulation resistance (IR)
Withstanding voltage
Temperature characteristics
Terminal adherence
Appearance
Resistance
to vibration
Rate of capacitance change
Dissipation factor (tanδ)
Appearance
Rate of capacitance change
There must be no mechanical damage.
Must be within initial tolerance.
Must satisfy initial specified value.
10,000MΩ or 500MΩ ⋅ µF,
whichever is smaller
The temperature coefficients in table 12, paragraph 7.12 are
calculated at 20°C and high temperature.
Based on paragraph 8.11. 2.
Apply 5N for 10 ± 1s in the
direction indicated by the arrow.
Chip is mounted to a board in the manner
shown on the right, subjected to vibration
(type A in paragraph 8.2), and measured
24 ± 2 hrs. later.
Pressure (5N)
Test board
Capacitor
Board
Based on paragraph 8.13
Soldering temperature : 235 ± 5°C
Soldering time
: 2 ± 0.5s
Based on paragraph 8.14.
Soldering temperature : 260 ± 5°C
Soldering time
: 5 ± 0.5s
Preheating
: 150 ± 10°C for 1 to 2 min.
The insulation must not be damaged.
± 2.5% or ± 0.25 pF, whichever is larger.
Must satisfy initial specified value.
Insulation resistance
10,000MΩ or 500MΩ ⋅ µF,
whichever is smaller
Rate of capacitance change
Based on paragraph 7.1
Apply 300% of the rated voltage for 1 to 5s then measure.
There must be no mechanical damage.
Dissipation factor (tanδ)
Appearance
Based on paragraph 7.6
Measurement is made after rated voltage is applied for 60 ± 5s.
There must be no mechanical damage.
± 2.5% or ± 0.25 pF, whichever is larger.
Insulation resistance
Rate of capacitance change
Hightemperature
load test
No detachment or signs of detachment.
Must satisfy initial specified value.
Appearance
Humidity load
test
Within 0 ± 30ppm/°C
Dissipation factor (tanδ)
Withstanding voltage
Temperature
cycling
The insulation must not be damaged.
At least 3/4 of the surface of the two terminals
must be covered with new solder.
Solderability
Resistance
to soldering
heat
10,000MΩ or 500MΩ ⋅ µF,
whichever is smaller
There must be no mechanical damage.
± 7.5% or ± 0.75 pF, whichever is larger.
Dissipation factor (tanδ)
0.5% or less
Insulation resistance
500MΩ or 25MΩ ⋅ µF,
whichever is smaller
Appearance
There must be no mechanical damage.
Rate of capacitance change
± 3.0% or ± 0.3 pF, whichever is larger.
Dissipation factor (tanδ)
0.3% or less
Insulation resistance
1,000MΩ or 50MΩ ⋅ µF,
whichever is smaller
Based on paragraph 9.3
Number of cycles : 5
Capacitance measured after 24 ± 2 hrs.
Based on paragraph 9.9
Test temperature : 40 ± 2°C
Relative humidity : 90% to 95%
Applied voltage : rated voltage
Test time
: 500 to 524 hrs.
Capacitance measured after 24 ± 2 hrs.
Based on paragraph 9.10
Test temperature : Max. operating temp.
Applied voltage : rated voltage × 200%
Test time
: 1,000 to 1,048 hrs.
Capacitance measured after 24 ± 2 hrs.
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
Class 2 (High dielectric constant)
Temperature characteristics
CN (R) (B) (X7R)
FN (F) (Y5V)
−55°C ~ +125°C
−30°C ~ +85°C
Item
Operating temperature
Nominal capacitance (C)
Dissipation factor (tanδ)
Insulation resistance (IR)
Withstanding voltage
Temperature characteristics
Terminal adherence
Appearance
Resistance
to vibration
Rate of capacitance change
Dissipation factor (tanδ)
Solderability
Appearance
Resistance
to soldering
heat
Within ± 15%
+ 22, + 82%
No detachment or signs of detachment
There must be no mechanical damage.
Must be within initial tolerance.
Must satisfy initial specified value.
Within ± 20.0%
10,000MΩ or 500MΩ ⋅ µF, whichever is smaller
Rate of capacitance change
Within ± 7.5%
Within ± 20.0%
Insulation resistance
10,000MΩ or 500MΩ ⋅ µF, whichever is smaller
Insulation resistance
Appearance
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
The temperature coefficients in paragraph 7.12,
table 8, condition B, are based on measurements
carried out at 20°C, with no voltage applied.
Based on paragraph 8. 11. 2.
Apply 5N for 10 ± 1s
in the direction indicated
by the arrow.
Pressure (5N)
Test board
Capacitor
Chip is mounted to a board in the
manner shown on the right, subjected
to vibration (type A in paragraph 8.2),
and measured 48 ± 4 hrs. later.
Board
Based on paragraph 8. 13
Soldering temperature : 235 ± 5°C
: 2 ± 0.5s
Soldering time
Based on paragraph 8. 14.
Soldering temperature : 260 ± 5°C
Soldering time
: 5 ± 0.5s
Preheating
: 150 ± 10°C for
1 to 2 min.
The insulation must not be damaged.
Must satisfy initial specified value.
Dissipation factor (tanδ)
Based on paragraph 7.1
Apply 250% of the rated voltage for 1 to 5s then measure.
There must be no mechanical damage.
Dissipation factor (tanδ)
Rate of capacitance change
Based on paragraph 7.6
Measurement is made after rated voltage
is applied for 60 ± 5s.
There must be no mechanical damage.
Within ± 5.0%
Insulation resistance
Appearance
Hightemperature
load test
The insulation must not be damaged.
Must satisfy initial specified value.
Appearance
Humidity load
test
10,000MΩ or 500MΩ ⋅ µF, whichever is smaller
Dissipation factor (tanδ)
Withstanding voltage
Temperature
cycling
Based on paragraph 7.8
Measured at room temperature and standard humidity,
Measurement frequency: 1 ± 0.1 kHz
2.5% or less
5.0% or less
(when rated voltage is 16V: 3.5% or less) (when rated voltage is 16V: 7.5% or less) Measurement voltage : 1.0 ± 0.2 Vrms.
Must be within the specified tolerance range.
At least 3/4 of the surface of the two terminals must be covered with new solder.
Rate of capacitance change
Test methods/conditions
(based on JIS C 5102)
There must be no mechanical damage.
± 12.5% or less
Within ± 30.0%
5.0% or less
7.5% or less
(when rated voltage is 16V: 10.0%)
500MΩ or 25MΩ ⋅ µF, whichever is smaller
Based on paragraph 9.3
Number of cycles : 5
Capacitance measured after 48 ± 4 hrs.
Based on paragraph 9.9
Test temperature : 40 ± 2°C
Relative humidity : 90% to 95%
Applied voltage : rated voltage
Test time
: 500 to 524 hrs.
Capacitance measured after 48 ± 4 hrs.
There must be no mechanical damage.
Within ± 10.0%
Within ± 30.0%
5.0% or less
7.5% or less
(when rated voltage is 16V: 10.0%)
Based on paragraph 9.10
Test temperature : Max. operating temp.
Applied voltage : rated voltage × 200%
Test time
: 1,000 to 1,048 hrs.
Capacitance measured after 48 ± 4 hrs.
1,000MΩ or 50MΩ ⋅ µF, whichever is smaller
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
!Packaging specifications
(Units : mm)
Reel
9.0 ± 0.3
φ180 mm plastic reel
t
φJ
A
D
φ13 ± 0.2
E
C
B
11.4 ± 1.0
φ 60 + 1
0
0
φ180 −1.5
Taping
F
t1
Label position
H
Pulling direction
(Paper taping)
9.5 ± 0.5
φ330 mm plastic reel
F
H
J
t
t1
Symbol
Size
A
φ80 ± 1
E
8.0
3.5 1.75 2.0 4.0 φ1.5 0.7
0.8
Dimensions
±0.3 ±0.05 ±0.1 ±0.05 ±0.1 +0.1
±0.05 MAX.
0
φ330 ± 2
D
φ13 ± 0.2
C
Symbol
13.5 ± 1.0
B
0.65 ±0.1 1.15 ±0.1
1005
Label position
EIAJ ET-7200A compliant
Bulk case
slider
12
shutter
36
110
EIAJ ET-7201 A compliant
MCH15
50,000pcs/case
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
!Electrical characteristics
gA (C0G) Characteristics
1000000
4
100000
3
10000
2
1
1000
0
IMPEDANCE (Ω)
RATE OF CAPACITANCE CHANGE : (%)
5
−1
−2
−3
−4
−5
−50
0
50
1pF
100
10pF
10
1
100pF
0.1
100
1
10
100
1000
TEMPERATURE (°C)
FREQUENCY (MHz)
Fig.1 Capacitance-temperature
characteristics
Fig.2 Impedance-frequency
characteristics
10000
gCN (X7R) Characteristics
10000
20
1000
10
0
−20
−30
10
5
−80
−40
0
40
80
120
IMPEDANCE (Ω)
100
−10
Dissipation factor (%)
CAPACITANCE CHANGE : (%)
30
10
1
1,000pF
0.1
10,000pF
0.01
0.001
160
1
10
100
1000
10000
FREQUENCY (MHz)
TEMPERATURE : (°C)
Fig.4 Impedance-frequency
characteristics
Fig.3 Capacitance-temperature
characteristics
10000
20
10
0
−10
−20
−30
−40
−50
−60
−70
−80
1000
60
50
40
30
20
10
−80
−40
0
40
80
120
TEMPERATURE : (°C)
Fig.5 Capacitance-temperature
characteristics
160
IMPEDANCE (Ω)
100
Dissipation factor (%)
CAPACITANCE CHANGE : (%)
gFN (Y5V) Characteristics
10
1
1,000pF
0.1
10,000pF
0.01
100,000pF
0.001
1
10
100
1000
10000
FREQUENCY (MHz)
Fig.6 Impedance-frequency
characteristics
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
gTemperature cycling test
A (C0G) Characteristics (100pF)
0.6
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
1.0
0
0.5
1 × 1012
0.3
0.2
−2.0
0.1
−3.0
1 × 1011
1 × 1010
0
TESTED
INITIAL VALUE
Fig.7 Rate of capacitance change
TESTED
Fig.9 Insulation resistance
CN (X7R) Characteristics (1,000pF)
6.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
10.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
5.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
1 × 1012
0
4.0
IIR : (Ω)
5.0
3.0
−5.0
2.0
−10.0
1.0
−15.0
1 × 1011
1 × 1010
0
INITIAL VALUE
TESTED
INITIAL VALUE
Fig.10 Rate of capacitance change
6.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−30 / +85°C 100cyc
20.0
TESTED
INITIAL VALUE
Fig.11 tanδ
FN (Y5V) Characteristics (10,000pF)
30.0
TESTED
Fig.12 Insulation resistance
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−30 / +85°C 100cyc
5.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−30 / +85°C 100cyc
1 × 1012
0.0
4.0
IR : (Ω)
10.0
tanδ : (%)
RATE OF CAPACITANCE CHANGE : (%)
INITIAL VALUE
TESTED
Fig.8 tanδ
tanδ : (%)
RATE OF CAPACITANCE CHANGE : (%)
15.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
0.4
−1.0
INITIAL VALUE
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
IR : (Ω)
2.0
tanδ : (%)
RATE OF CAPACITANCE CHANGE : (%)
3.0
3.0
−10.0
2.0
−20.0
1.0
1 × 1011
0
−30.0
INITIAL VALUE
TESTED
Fig.13 Rate of capacitance change
INITIAL VALUE
Fig.14 tanδ
TESTED
1 × 1010
INITIAL VALUE
TESTED
Fig.15 Insulation resistance
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
gHigh-temperature load test
0.3
−1.0
0.2
−2.0
0.1
1 × 1011
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
0
0
240
420
720
0
1000
240
480
720
1000
1 × 1010
0
240
480
720
1000
TIME (h)
TIME (h)
TIME (h)
Fig.16 Rate of capacitance change
Fig.17 tanδ
Fig.18 Insulation resistance
CN (X7R) Characteristics (1,000pF)
6.0
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
5.0
5.0
0
3.0
2.0
−10.0
1.0
0
240
480
720
1 × 1012
1 × 1011
1 × 1010
0
1000
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
4.0
−5.0
−15.0
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
IR : (Ω)
10.0
0
240
480
720
0
1000
240
480
720
1000
TIME (h)
TIME (h)
TIME (h)
Fig.19 Rate of capacitance change
Fig.20 tanδ
Fig.21 Insulation resistance
FN (Y5V) Characteristics (10,000pF)
6.0
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+85°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
20.0
1 × 1012
tanδ : (%)
10.0
0.0
−10.0
4.0
3.0
1 × 1011
2.0
−20.0
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+85°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
1.0
−30.0
0
240
480
720
1000
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+85°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
5.0
IR : (Ω)
30.0
1 × 1012
0.4
IR : (Ω)
0.0
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
0.5
tanδ : (%)
1.0
15.0
RATE OF CAPACITANCE CHANGE : (%)
0.6
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
2.0
−3.0
RATE OF CAPACITANCE CHANGE : (%)
A (C0G) Characteristics (100pF)
tanδ : (%)
RATE OF CAPACITANCE CHANGE : (%)
3.0
0
0
240
480
720
1000
1 × 1010
0
240
480
720
1000
TIME (h)
TIME (h)
TIME (h)
Fig.22 Rate of capacitance change
Fig.23 tanδ
Fig.24 Insulation resistance
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MCH15
Ceramic capacitors
gHumidity load test
A (C0G) Characteristics (100pF)
1.0
0.0
−2.0
0.1
480
720
1 × 1010
0
1000
240
480
720
0
1000
240
480
720
1000
TIME (h)
TIME (h)
TIME (h)
Fig.25 Rate of capacitance change
Fig.26 tanδ
Fig.27 Insulation resistance
CN (X7R) Characteristics (1,000pF)
6.0
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
5.0
0
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
5.0
3.0
2.0
−10.0
1.0
1 × 1011
0
0
240
480
720
1 × 1012
4.0
−5.0
−15.0
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
IR : (Ω)
10.0
0
1000
240
480
720
1000
1 × 1010
0
240
480
720
1000
TIME (h)
TIME (h)
TIME (h)
Fig.28 Rate of capacitance change
Fig.29 tanδ
Fig.30 Insulation resistance
FN (Y5V) Characteristics (10,000pF)
6.0
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
20.0
1 × 1012
tanδ : (%)
10.0
0.0
4.0
3.0
−10.0
2.0
−20.0
1.0
−30.0
1 × 1011
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
0
0
240
480
720
1000
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
5.0
IR : (Ω)
30.0
1 × 1012
1 × 1011
0
240
tanδ : (%)
RATE OF CAPACITANCE CHANGE : (%)
0.3
0.2
0
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
0.4
−1.0
15.0
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
0.5
IR : (Ω)
2.0
−3.0
RATE OF CAPACITANCE CHANGE : (%)
0.6
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
tanδ : (%)
RATE OF CAPACITANCE CHANGE : (%)
3.0
0
240
480
720
1000
1 × 1010
0
240
480
720
1000
TIME (h)
TIME (h)
TIME (h)
Fig.31 Rate of capacitance change
Fig.32 tanδ
Fig.33 Insulation resistance
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.