MMFT3055V Power MOSFET 1 Amp, 60 Volts N−Channel SOT−223 These Power MOSFETs are designed for low voltage, high speed switching applications in power supplies, converters and power motor controls, these devices are particularly well suited for bridge circuits where diode speed and commutating safe operating areas are critical and offer additional safety margin against unexpected voltage transients. http://onsemi.com 1 AMPERE, 60 VOLTS RDS(on) = 130 mW N−Channel Features D • Avalanche Energy Specified • IDSS and VDS(on) Specified at Elevated Temperature • Pb−Free Package is Available G MAXIMUM RATINGS (TC = 25°C unless otherwise noted) S Symbol Value Unit Drain−to−Source Voltage VDSS 60 Vdc Drain−to−Gate Voltage (RGS = 1.0 MW) VDGR 60 Vdc Gate−to−Source Voltage − Continuous − Non−repetitive (tp ≤ 10 ms) VGS VGSM ± 20 ± 25 Vdc Vpk ID ID Adc IDM 1.7 1.4 6.0 Total PD @ TA = 25°C mounted on 1″ sq. Drain pad on FR−4 bd material Total PD @ TA = 25°C mounted on 0.70″ sq. Drain pad on FR−4 bd material Total PD @ TA = 25°C mounted on min. Drain pad on FR−4 bd material Derate above 25°C PD 2.1 W Operating and Storage Temperature Range TJ, Tstg Rating Drain Current − Continuous Drain Current − Continuous @ 100°C Drain Current − Single Pulse (tp ≤ 10 ms) Single Pulse Drain−to−Source Avalanche Energy − Starting TJ = 25°C (VDD = 25 Vdc, VGS = 10 Vdc, Peak IL = 3.4 Apk, L = 10 mH, RG = 25 W ) Thermal Resistance − Junction to Ambient on 1″ sq. Drain padon FR−4 bd material − Junction to Ambient on 0.70″ sq. Drain pad on FR−4 bd material − Junction to Ambient on min. Drain pad on FR−4 bd material Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 s 1 Apk August, 2006 − Rev. 4 2 MARKING DIAGRAM AND PIN ASSIGNMENT 4 Drain AYW V3055 G G 0.94 6.3 mW/°C −55 to 175 °C EAS 1 Gate 2 Drain 3 Source mJ 58 RqJA 70 RqJA 88 RqJA 159 TL TO−261AA CASE 318E STYLE 3 3 1.7 °C/W A = Assembly Location Y = Year W = Work Week G = Pb−Free Package V3055 = Device Code (Note: Microdot may be in either location) ORDERING INFORMATION 260 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. © Semiconductor Components Industries, LLC, 2006 4 1 Shipping† Device Package MMFT3055VT1 SOT−223 1000 Tape & Reel MMFT3055VT1G SOT−223 (Pb−Free) 1000 Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Publication Order Number: MMFT3055V/D MMFT3055V ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Symbol Characteristic Min Typ Max Unit 60 − − 63 − − Vdc mV/°C − − − − 10 100 − − 100 nAdc 2.0 − 2.8 5.6 4.0 − Vdc mV/°C − 0.115 0.13 − − − − 0.27 0.25 gFS 1.0 2.7 − mhos Ciss − 360 500 pF Coss − 110 150 Crss − 25 50 td(on) − 8.0 20 OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage (VGS = 0 Vdc, ID = 0.25 mAdc) Temperature Coefficient (Positive) (Cpk ≥ 2.0) (Note 3) V(BR)DSS Zero Gate Voltage Drain Current (VDS = 60 Vdc, VGS = 0 Vdc) (VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) IDSS Gate−Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS mAdc ON CHARACTERISTICS (Note 1) Gate Threshold Voltage (VDS = VGS, ID = 250 mAdc) Threshold Temperature Coefficient (Negative) (Cpk ≥ 2.0) (Note 3) VGS(th) Static Drain−to−Source On−Resistance (VGS = 10 Vdc, ID = 0.85 Adc) (Cpk ≥ 2.0) (Note 3) RDS(on) Drain−to−Source On−Voltage (VGS = 10 Vdc, ID = 1.7 Adc) (VGS = 10 Vdc, ID = 0.85 Adc, TJ = 150°C) VDS(on) Forward Transconductance (VDS = 8.0 Vdc, ID = 1.7 Adc) W Vdc DYNAMIC CHARACTERISTICS Input Capacitance Output Capacitance (VDS = 25 Vdc, VGS = 0 Vdc, f = 1.0 MHz) Transfer Capacitance SWITCHING CHARACTERISTICS (Note 2) Turn−On Delay Time Rise Time Turn−Off Delay Time (VDD = 30 Vdc, ID = 1.7 Adc, VGS = 10 Vdc, RG = 9.1 W) Fall Time Gate Charge (VDS = 48 Vdc, ID = 1.7 Adc, VGS = 10 Vdc) tr − 9.0 20 td(off) − 32 60 tf − 18 40 QT − 13 20 Q1 − 2.0 − Q2 − 5.0 − Q3 − 4.0 − − − 0.85 0.7 1.6 − trr − 40 − ta − 34 − tb − 6.0 − QRR − 0.089 − − 4.5 − − 7.5 − ns nC SOURCE−DRAIN DIODE CHARACTERISTICS Forward On−Voltage (Note 1) (IS = 1.7 Adc, VGS = 0 Vdc) (IS = 1.7 Adc, VGS = 0 Vdc, TJ = 150°C) Reverse Recovery Time (IS = 1.7 Adc, VGS = 0 Vdc, dIS/dt = 100 A/ms) Reverse Recovery Stored Charge VSD Vdc ns mC INTERNAL PACKAGE INDUCTANCE Internal Drain Inductance (Measured from the drain lead 0.25″ from package to center of die) LD Internal Source Inductance (Measured from the source lead 0.25″ from package to source bond pad) LS 1. Pulse Test: Pulse Width ≤ 300 ms, Duty Cycle ≤ 2%. 2. Switching characteristics are independent of operating junction temperature. Max limit − Typ 3. Reflects typical values. Cpk = 3 x SIGMA http://onsemi.com 2 nH nH MMFT3055V TYPICAL ELECTRICAL CHARACTERISTICS VGS = 10 V 7V 6V I D , DRAIN CURRENT (AMPS) 3.5 3 4 TJ = 25°C 5V 5.5 V 2.5 2 4.5 V 1.5 1 0 3 2.5 2 1.5 0.5 3.5 V 0 6 7 8 3 4 5 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 1 9 2 100°C 25°C 1 4V 0.5 VDS ≥ 10 V 3.5 I D , DRAIN CURRENT (AMPS) 4 0 10 TJ = −55°C 2 3 2.5 0.2 0.15 25°C 0.1 7 7.5 0.125 VGS = 10 V 0.110 15 V 0.065 0.025 0 0.5 1 1.5 3 2.5 2 ID, DRAIN CURRENT (AMPS) 0.050 4 3.5 0 Figure 3. On−Resistance versus Drain Current and Temperature 2.0 1.8 1 0.5 1.5 3 2 2.5 ID, DRAIN CURRENT (AMPS) 3.5 4 Figure 4. On−Resistance versus Drain Current and Gate Voltage 1000 VGS = 10 V ID = 0.85 A VGS = 0 V 1.6 1.4 I DSS , LEAKAGE (nA) RDS(on) , DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) 6.5 0.080 0.05 0 6 0.095 −55°C 0.075 5.5 0.140 TJ = 100°C 0.125 5 TJ = 25°C 0.155 0.175 4.5 0.170 VGS = 10 V 0.225 4 Figure 2. Transfer Characteristics R DS(on) , DRAIN−TO−SOURCE RESISTANCE (OHMS) R DS(on) , DRAIN−TO−SOURCE RESISTANCE (OHMS) Figure 1. On−Region Characteristics 0.25 3.5 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 1.2 1.0 0.8 0.6 TJ = 125°C 100 100°C 0.4 0.2 0 −50 −25 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) 150 10 175 0 Figure 5. On−Resistance Variation with Temperature 5 10 15 20 25 30 35 40 45 50 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 6. Drain−To−Source Leakage Current versus Voltage http://onsemi.com 3 55 60 MMFT3055V POWER MOSFET SWITCHING Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (Dt) are determined by how fast the FET input capacitance can be charged by current from the generator. The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that t = Q/IG(AV) The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off−state condition when calculating td(on) and is read at a voltage corresponding to the on−state when calculating td(off). At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses. During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following: tr = Q2 x RG/(VGG − VGSP) tf = Q2 x RG/VGSP where VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are: td(on) = RG Ciss In [VGG/(VGG − VGSP)] td(off) = RG Ciss In (VGG/VGSP) 1100 TJ = 25°C Ciss 900 C, CAPACITANCE (pF) VGS = 0 V VDS = 0 V 1000 800 700 Crss 600 500 Ciss 400 300 Coss 200 Crss 100 0 10 5 0 VGS 5 10 15 20 25 VDS GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 7. Capacitance Variation http://onsemi.com 4 30 9 27 QT 8 24 7 21 VGS 6 Q1 18 Q2 5 15 4 12 3 9 ID = 1.7 A TJ = 25°C 2 1 0 Q3 0 2 VDS 4 6 10 8 12 6 3 0 14 1000 t, TIME (ns) 10 VDS , DRAIN−TO−SOURCE VOLTAGE (VOLTS) VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) MMFT3055V VDD = 30 V ID = 1.7 A VGS = 10 V TJ = 25°C 100 td(off) tf tr 10 1 td(on) 1 10 100 RG, GATE RESISTANCE (OHMS) QT, TOTAL CHARGE (nC) Figure 8. Gate−To−Source and Drain−To−Source Voltage versus Total Charge Figure 9. Resistive Switching Time Variation versus Gate Resistance DRAIN−TO−SOURCE DIODE CHARACTERISTICS 2 VGS = 0 V TJ = 25°C I S , SOURCE CURRENT (AMPS) 1.8 1.6 1.4 1.2 1 0.8 0.6 0.4 0.2 0 0.5 0.55 0.6 0.7 0.65 0.75 0.8 0.85 0.9 VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) Figure 10. Diode Forward Voltage versus Current SAFE OPERATING AREA reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature. Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 13). Maximum energy at currents below rated continuous ID can safely be assumed to equal the values indicated. The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance−General Data and Its Use.” Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 ms. In addition the total power averaged over a complete switching cycle must not exceed (TJ(MAX) − TC)/(RqJC). A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For http://onsemi.com 5 MMFT3055V SAFE OPERATING AREA 60 VGS = 20 V SINGLE PULSE TC = 25°C EAS, SINGLE PULSE DRAIN−TO−SOURCE AVALANCHE ENERGY (mJ) I D , DRAIN CURRENT (AMPS) 10 10 ms 1 100 ms 500 ms 0.1 1s RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.01 0.1 1.0 10 40 30 20 10 0 100 25 50 75 100 125 150 175 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C) Figure 11. Maximum Rated Forward Biased Safe Operating Area Figure 12. Maximum Avalanche Energy versus Starting Junction Temperature 1 Rthja(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE dc ID = 1.7 A 50 0.1 0.01 D = 0.5 0.2 0.1 0.05 0.02 0.01 0.001 SINGLE PULSE 0.0001 1.0E−05 1.0E−04 1.0E−03 1.0E−02 1.0E−01 t, TIME (s) 1.0E+00 1.0E+01 Figure 13. Thermal Response di/dt IS trr ta tb TIME 0.25 IS tp IS Figure 14. Diode Reverse Recovery Waveform http://onsemi.com 6 1.0E+02 1.0E+03 MMFT3055V PACKAGE DIMENSIONS SOT−223 (TO−261) CASE 318E−04 ISSUE L NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. D b1 4 HE 1 2 3 E b e1 e C q A 0.08 (0003) DIM A A1 b b1 c D E e e1 L1 HE A1 L1 MIN 1.50 0.02 0.60 2.90 0.24 6.30 3.30 2.20 0.85 1.50 6.70 0° q STYLE 3: PIN 1. 2. 3. 4. MILLIMETERS NOM MAX 1.63 1.75 0.06 0.10 0.75 0.89 3.06 3.20 0.29 0.35 6.50 6.70 3.50 3.70 2.30 2.40 0.94 1.05 1.75 2.00 7.00 7.30 10° − MIN 0.060 0.001 0.024 0.115 0.009 0.249 0.130 0.087 0.033 0.060 0.264 0° INCHES NOM 0.064 0.002 0.030 0.121 0.012 0.256 0.138 0.091 0.037 0.069 0.276 − MAX 0.068 0.004 0.035 0.126 0.014 0.263 0.145 0.094 0.041 0.078 0.287 10° GATE DRAIN SOURCE DRAIN SOLDERING FOOTPRINT* 3.8 0.15 2.0 0.079 2.3 0.091 2.3 0.091 6.3 0.248 2.0 0.079 1.5 0.059 SCALE 6:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: [email protected] N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5773−3850 http://onsemi.com 7 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative MMFT3055V/D