NB3N3002 3.3V, Crystal to 25MHz, 100MHz, 125MHz and 200MHz HCSL Clock Generator http://onsemi.com Description The NB3N3002 is a precision, low phase noise clock generator that supports PCI−Express and Ethernet requirements. The device accepts a 25 MHz fundamental mode parallel resonant crystal and generates a differential HCSL output at 25 MHz, 100 MHz, 125 MHz or 200 MHz clock frequencies. Outputs can interface with LVDS with proper termination (See Figure 5). This device is housed in 5.0 mm x 4.4 mm narrow body TSSOP 16 pin package. MARKING DIAGRAM 1 TSSOP−16 DT SUFFIX CASE 948F Features • • • • • • • • • • • 16 16 A L Y W G Uses 25 MHz Fundamental Mode Parallel Resonant Crystal External Loop Filter is Not Required HCSL Differential Output or LVDS with Proper Termination For Selectable Multipliers of the Input Frequency Output Enable with Tri−State Outputs PCIe Gen1, Gen2, Gen3 Jitter Compliant Typical TIE RMS jitter of 2.5 ps Phase Noise: @ 100 MHz Offset Noise Power 100 Hz −109.4 dBc 1 kHz −127.8 dBc 10 kHz −136.2 dBc 100 kHz −138.8 dBc 1 MHz −138.2 dBc 10 MHz −161.4 dBc 20 MHz −163.00 dBc Operating Range 3.3 V ±5% Industrial Temperature Range −40°C to +85°C These are Pb−Free Devices 1 NB3N 3002 ALYWG G = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package (*Note: Microdot may be in either location) ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 6 of this data sheet. VDD X1/CLK 25 MHz Clock or Crystal X2 Clock Buffer Crystal Oscillator Charge Pump Phase Detector CLK HSCL Output VCO CLK BM GND SEL0 SEL1 OE IREF Figure 1. NB3N3002 Simplified Logic Diagram © Semiconductor Components Industries, LLC, 2013 October, 2013 − Rev. 6 1 Publication Order Number: NB3N3002/D NB3N3002 SEL0 1 16 VDD SEL1 2 15 CLK GND 3 14 CLK X1/CLK 4 13 GND X2 5 12 VDD OE 6 11 NC GND 7 10 NC GND 8 9 IREF Figure 2. Pin Configuration (Top View) Table 1. PIN DESCRIPTION Pin Symbol I/O Description 1 Sel0 Input LVTTL/LVCMOS frequency select input 0. Internal pullup resistor to VDD. See output select table 2 for details. 2 Sel1 Input LVTTL/LVCMOS frequency select input 1. Internal pullup resistor to VDD. See output select Table 2 for details. 12, 16 VDD Power Supply 4 X1/CLK Input Crystal or Clock input. Connect to 25 MHz crystal source or single−ended clock. 5 X2 Input Crystal input. Connect to a 25 MHz crystal or leave unconnected for clock input. 6 OE Input Output enable tri−states output when connected to GND. Internal pullup resistor to VDD. 3, 7, 8, 13 GND Power Supply 9 IREF Output 15 CLK HCSL or LVDS Output Noninverted clock output. (For LVDS levels see Figure 5) 14 CLK HCSL or LVDS Output Inverted clock output. (For LVDS levels see Figure 5) 10,11 NC Positive supply voltage pins are connected to +3.3 V supply voltage. Ground 0 V. These pins provide GND return path for the devices. Output current reference pin. Precision resistor (typ. 475 W) is connected from pin 9 to GND to set the output current. Do not connect Recommended Crystal Parameters Table 2. OUTPUT FREQUENCY SELECT TABLE WITH 25MHz CRYSTALS SEL1* SEL0* CLK Multiplier fCLK (MHz) L L 1x 25 L H 4x 100 H L 5x 125 H H 8x 200 Crystal Frequency Load Capacitance Shunt Capacitance, C0 Equivalent Series Resistance Initial Accuracy at 25 °C Temperature Stability Aging *Pins SEL1 and SEL0 default high when left open. http://onsemi.com 2 Fundamental AT−Cut 25 MHz 16−20 pF 7 pF Max 50 W Max ±20 ppm ±30 ppm ±20 ppm NB3N3002 Table 3. ATTRIBUTES Characteristic Value ESD Protection Human Body Model > 2 kV RPU − OE, SEL0 and SEL1 Pull−up Resistor 100 kW Moisture Sensitivity, Indefinite Time Out of Dry Pack (Note 1) Level 1 Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in Transistor Count 7623 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 1. For additional information, see Application Note AND8003/D. Table 4. MAXIMUM RATINGS (Note 2) Symbol Parameter Condition 1 Condition 2 Rating Units 4.6 V −0.5 V to VDD+0.5 V V VDD Positive Power Supply GND = 0 V VI Input Voltage (VIN) GND = 0 V TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm TSSOP–16 TSSOP–16 138 108 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) (Note 3) TSSOP−16 33 to 36 °C/W Tsol Wave Solder 265 °C GND v VI v VDD Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 2. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and not valid simultaneously. If stress limits are exceeded device functional operation is not implied, damage may occur and reliability may be affected. 3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power). Table 5. DC CHARACTERISTICS (VDD = 3.3 V ±5%, GND = 0 V, TA = −40°C to +85°C) Symbol Characteristic Min Typ Max Unit IDD Power Supply Current (Note 4) 65 95 mA IDDOE Power Supply Current when OE is Set Low 35 65 mA VIH Input HIGH Voltage (X1/CLK, Sel0, Sel1,and OE) 0.7 * VDD VDD + 300 mV VIL Input LOW Voltage (X1/CLK, Sel0, Sel1, and OE) GND − 300 0.3* VDD mV VOH Output HIGH Voltage (See Figure 4) 660 700 850 mV VOL Output LOW Voltage (See Figure 4) −150 0 150 mV Vcross Crossing Voltage Magnitude (Absolute) 250 400 mV DVcross Change in Magnitude of Vcross 150 mV NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 4. NB3N circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500 lfpm is maintained. 5. Measurement taken with outputs terminated with RS = 33.2 W, RL = 49.9 W, with load capacitance of 2 pF and current biasing resistor, RREF, from IREF (Pin 9) to GND of 475 W. See Figure 3. http://onsemi.com 3 NB3N3002 Table 6. AC CHARACTERISTICS (VDD = 3.3 V ±5%, GND = 0 V, TA = −40°C to +85°C; Note 7) Symbol fCLKIN Characteristic Min Clock/Crystal Input Frequency fCLKOUT Output Clock Frequency qNOISE Phase−Noise Performance tjitter (TIE) OE tDUTY_CYCLE Max 25 25 200 MHz dBc/Hz −103/−109 @ 1 kHz offset from carrier −118/−127.8 @ 10 kHz offset from carrier −122/−136.2 @ 100 kHz offset from carrier −130/−138.8 @ 1 MHz offset from carrier −138/−138.2 @ 10 MHz offset from carrier −149/−164 RMS Phase Jitter (at 125 MHz @ 1 MHz − 40 MHz) TIE RMS Jitter (Note 8) Unit MHz fCLK = 200 MHz/100 MHz @ 100 Hz offset from carrier tjit(f) Typ 0.25 fCLK = 200 MHz 0.50 ps 2.5 Cycle−to−Cycle RMS Jitter (Note 9) fCLK = 200 MHz 2 5 Cycle−to−Cycle Peak to Peak Jitter (Note 9) fCLK = 200 MHz 20 35 Period RMS Jitter (Note 9) fCLK = 200 MHz 1.5 3 Period Peak−to−Peak Jitter (Note 9) fCLK = 200 MHz 10 20 Output Enable/Disable Time ps 1.0 ms Output Clock Duty Cycle (Measured at cross point) 45 50 55 % tR Output Risetime (Measured from 175 mV to 525 mV, Figure 4) 175 340 700 ps tF Output Falltime (Measured from 525 mV to 175 mV, Figure 4) 175 340 700 ps DtR Output Risetime Variation (Single−Ended) 125 ps DtF Output Falltime Variation (Single−Ended) 125 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 6. NB3N circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500 lfpm is maintained. 7. Measurement taken from differential output on single−ended channel terminated with RS = 33.2 W, RL = 49.9 W, with load capacitance of 2 pF and current biasing resistor, RREF, from IREF (Pin 9) to GND of 475 W. See Figures 3 and 4. 8. Sampled with 20000 cycles to capture jitter component down to 100 kHz. 9. Sampled with 20000 cycles. http://onsemi.com 4 NB3N3002 Table 7. AC ELECTRICAL CHARACTERISTICS − PCI EXPRESS JITTER SPECIFICATIONS, VDD = 3.3 V ± 5%, TA = −40°C to 85°C Characteristic Symbol Test Conditions Min Typ Max PCIe Inductry Spec Unit Phase Jitter P−P (Notes 11 and 14) TJ PCIe Gen1 ƒ = 100 MHz, 25 MHz Crystal Input Evaluation Band: 0 Hz − Nyquist (clock frequency/2) 6 21 86 ps Phase Jitter RMS (Notes 11 and 14) tREFCLK_HF_RMS (PCIe Gen 2) ƒ = 100 MHz, 25 MHz Crystal Input High Band: 1.5 MHz − Nyquist (clock frequency/2) 0.6 3 3.1 ps Phase Jitter RMS (Notes 11 and 14) tREFCLK_LF_RMS (PCIe Gen 2) ƒ = 100 MHz, 25 MHz Crystal Input Low Band: 10 kHz − 1.5 MHz 0.08 0.3 3 ps Phase Jitter RMS (Notes 13 and 14) tREFCLK_RMS (PCIe Gen 3) ƒ = 100 MHz, 25 MHz Crystal Input Evaluation Band: 0 Hz − Nyquist (clock frequency/2) 0.23 0.7 0.8 ps 10. Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. 11. Peak−to−Peak jitter after applying system transfer function for the Common Clock Architecture. Maximum limit for PCI Express Gen 1 is 86 ps peak−to−peak for a sample size of 106 clock periods. 12. RMS jitter after applying the two evaluation bands to the two transfer functions defined in the Common Clock Architecture and reporting the worst case results for each evaluation band. Maximum limit for PCI Express Generation 2 is 3.1 ps RMS for tREFCLK_HF_RMS (High Band) and 3.0ps RMS for tREFCLK_LF_RMS (Low Band). 13. RMS jitter after applying system transfer function for the common clock architecture. 14. This parameter is guaranteed by characterization. Not tested in production RL = 33.2 W HCSL Driver Zo = 50 W HCSL Receiver RL = 33.2 W Zo = 50 W RL = 49.9 W IREF RREF = 475 W RL = 49.9 W Figure 3. Typical Termination for Output Driver and Device Evaluation 700 mV 525 mV 525 mV 175 mV 175 mV 0 mV tR 340 ps 340 ps tF Figure 4. HCSL Output Parameter Characteristics http://onsemi.com 5 NB3N3002 HCSL Driver Qx Zo = 50 W 100 W Qx IREF 100 W Zo = 50 W RL = 150 W LVDS Receiver RL = 150 W RREF = 475 W Figure 5. HCSL Interface Termination to LVDS ORDERING INFORMATION Package Shipping† NB3N3002DTG TSSOP−16 (Pb−Free) 96 Units / Rail NB3N3002DTR2G TSSOP−16 (Pb−Free) 2500 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 6 NB3N3002 PACKAGE DIMENSIONS TSSOP−16 CASE 948F ISSUE B 16X K REF 0.10 (0.004) 0.15 (0.006) T U T U M S V S K S ÉÉÉ ÇÇÇ ÇÇÇ ÉÉÉ K1 2X L/2 16 9 J1 B −U− L SECTION N−N J PIN 1 IDENT. N 8 1 0.25 (0.010) M 0.15 (0.006) T U S A −V− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH. PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE −W−. N DIM A B C D F G H J J1 K K1 L M F DETAIL E −W− C 0.10 (0.004) −T− SEATING PLANE D H G DETAIL E MILLIMETERS MIN MAX 4.90 5.10 4.30 4.50 −−− 1.20 0.05 0.15 0.50 0.75 0.65 BSC 0.18 0.28 0.09 0.20 0.09 0.16 0.19 0.30 0.19 0.25 6.40 BSC 0_ 8_ SOLDERING FOOTPRINT* 7.06 1 0.65 PITCH 16X 0.36 16X 1.26 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 7 INCHES MIN MAX 0.193 0.200 0.169 0.177 −−− 0.047 0.002 0.006 0.020 0.030 0.026 BSC 0.007 0.011 0.004 0.008 0.004 0.006 0.007 0.012 0.007 0.010 0.252 BSC 0_ 8_ NB3N3002 ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: [email protected] N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 http://onsemi.com 8 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative NB3N3002/D