ACT5880 Rev 2, 03-Sep-13 15 Channels Advanced PMU for Smart Phone FEATURES GENERAL DESCRIPTION • Flexible CCCV Charger with Internal MOSFET The ACT5880 is a complete, cost effective, highlyefficient ActivePMUTM power management solution, optimized for portable devices like smart phones, Mobile Internet Devices. − Programmable Charge Current − Programmable Charge Termination Voltage − Programmable OVP threshold − Regulation against Die Thermal Condition − Charge Status Output, LED driving − Battery Thermal Condition Monitor − Battery Installation Detection − USB Charging Compatible • Fifteen Channels of Power Supplies − Two Step-Down DC/DC Converters − One Step-up Regulator, ~40V, ~750mA Switch − Seven High PSRR LDOs − Three Low Quiescent Current LDOs − One Always-on LDO − One Back-up Battery/Super-Capacitor Charger • Advanced System Control and Interfaces − I2CTM Serial Interface − Touch Screen Controller with Three AUX Inputs • Advanced Function − Real Time Clock − Three CC/PWM LED Drivers, ODO1 Supports up to 40V This device features two step-down DC/DC converters, one step-up DC/DC regulator, seven high PSRR LDOs, three low quiescent current LDOs, one always-on LDO, and one back-up battery/super-capacitor charger, along with a complete battery charging solution. This device also integrates a touch screen controller interface with three AUX inputs, three current controlled LED drivers, and a Real Time Clock. The two step-down DC/DC converters utilize a high efficiency, fixed-frequency (2MHz), current-mode PWM control architecture that requires a minimum number of external components. Two step-down DC/DCs are capable of supplying up to 1200mA and 700mA of output current. All LDOs are highperformance, low-noise, regulators that supply up to 360mA of output current. The back-up battery charger supports up to 3.5mA of output current. The ACT5880 is available in a compact, Pb-Free and RoHS-compliant, 81 balls, 6mmx6mm FCFBGA package with 1mm height. TYPICAL APPLICATION DIAGRAM Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -1- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TABLE OF CONTENTS General Description ..................................................................................................................................... p. 01 Functional Block Diagram ............................................................................................................................ p. 04 Ordering Information .................................................................................................................................... p. 05 Pin Configuration ......................................................................................................................................... p. 06 Pin Descriptions ........................................................................................................................................... p. 07 Absolute Maximum Ratings ......................................................................................................................... p. 11 I2C Interface Electrical Characteristics ........................................................................................................ p. 12 Global Register Map .................................................................................................................................... p. 13 Register and Bit Descriptions ...................................................................................................................... p.18 Interrupt Descriptions................................................................................................................................... p. 42 Step-Down DC/DC and LDO Output Voltage Setting .................................................................................. p. 44 VBBAT Output Voltage Setting .................................................................................................................... p. 44 Charger Voltage Setting .............................................................................................................................. p. 44 Fast Charge Current Setting ........................................................................................................................ p. 44 Non-Linear Duty Setting .............................................................................................................................. p. 45 Step-Up DC/DC Voltage Setting .................................................................................................................. p. 45 System Control Electrical Characteristics.................................................................................................... p. 46 Step-Down DC/DC Electrical Characteristics .............................................................................................. p. 47 Step-Up DC/DC Electrical Characteristics................................................................................................... p. 48 Low-Noise LDO Electrical Characteristics ................................................................................................... p. 49 Single-Cell Li+ Charger Electrical Characteristics ....................................................................................... p. 50 Back-Up Battery Charger Electrical Characteristics .................................................................................... p. 52 Always-On Low Power LDO Electrical Characteristics ............................................................................... p. 52 Real Time Clock Electrical Characteristics .................................................................................................. p. 53 Open-Drain Driver Electrical Characteristics ............................................................................................... p. 53 TSC ADC Electrical Characteristics ............................................................................................................ p. 54 Typical Performance Characteristics ........................................................................................................... p. 55 Application Information ................................................................................................................................ p. 60 System and Control Information....................................................................................................... p. 60 Device Power States ........................................................................................................................ p. 60 System Control Signals .................................................................................................................... p. 60 Control Sequences ........................................................................................................................... p. 61 House Keeping Functions ............................................................................................................... p. 62 Step-Down DC/DC Regulators .................................................................................................................... p. 64 General Description.......................................................................................................................... p. 64 Manipulation ..................................................................................................................................... p. 64 Summary of Key Specifications ....................................................................................................... p. 64 Component Selection ....................................................................................................................... p. 65 PCB Layout Considerations............................................................................................................. p. 65 Configurable Step-Up DC/DC Regulator ..................................................................................................... p. 66 General Description.......................................................................................................................... p. 66 Voltage Regulation Option ............................................................................................................... p. 66 Current Regulation Option ............................................................................................................... p. 66 Component Selection ...................................................................................................................... p. 67 PCB Layout Considerations............................................................................................................. p. 67 Low-Noise, Low-Dropout Linear Regulators................................................................................................ p. 68 General Description.......................................................................................................................... p. 68 Output Current Limit ......................................................................................................................... p. 68 Configuration Options....................................................................................................................... p. 68 OK[ ] and Output Fault Interrupt ....................................................................................................... p. 68 The Always-On LDO and the Backup Battery Charger ....................................................................p. 69 Component Selection ....................................................................................................................... p. 69 PCB Layout Considerations ............................................................................................................. p. 70 Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -2- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TABLE OF CONTENTS CONT’D Open-Drain Drivers ...................................................................................................................................... p. 71 Operation Modes .............................................................................................................................. p. 71 Typical Application Consideration .................................................................................................... p. 72 TSD ADC ..................................................................................................................................................... p. 73 4-wire Touch Screen Interface ........................................................................................................ p. 73 Internal Reference ........................................................................................................................... p. 74 TSC ADC Registers ......................................................................................................................... p. 75 Acquisition Configuration ................................................................................................................. p. 75 Interrupt and Status Bits ................................................................................................................... p. 75 Application Program Consideration .................................................................................................. p. 75 Real Time Clock .......................................................................................................................................... p. 76 Single-Cell Li+ Battery Charger ................................................................................................................... p. 78 Program and Manipulate .................................................................................................................. p. 78 Power Path Management ................................................................................................................. p. 78 CC/CV Charging Profile ................................................................................................................... p. 79 Summary of Key Specifications ....................................................................................................... p. 79 Charger State-Machine .................................................................................................................... p. 80 Charge State Output ........................................................................................................................ p. 81 Safe Charge and Operation ............................................................................................................. p. 81 Typical Application Consideration .................................................................................................... p. 82 Thermal Analysis ......................................................................................................................................... p. 85 Package Outline and Dimensions ............................................................................................................... p. 86 Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -3- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 FUNCTIONAL BLOCK DIAGRAM VSYS BODY AND VSYS CONTROL ACT5880 CHGIN VBAT nSTAT INPUT SENSE CURRENT SENSE CHARGE STATUS VOLTAGE SENSE + TH PRECONDITION ACIN BATID Charge Control CHGLEV VP1 INL45 THERMAL REGULATION REG4, REG5 INL6 110°C OUT1 REG7 INL89 To BAT SW1 REG6 INL7 VIO Li+ Battery CHGIN OUT1 REG8, REG9 INL1011 GP1 REG10, REG11 INL1213 REG12, REG13 VP2 nIRQ To BAT nRSTO SW2 OUT2 OUT2 nPBSTAT GP2 VSYS To BAT nPBIN SW3 PWRHLD HFPWR FB3 ON6 GP3 ON9 System Control VSEL SCL SDA REG4 LDO REG5 LDO ODO1 ODO2 Open-Drain Driver #1 REG6 LDO ODO3 Open-Drain Driver #2 REG7 LDO Open-Drain Driver #3 REG8 LDO GLED REG9 LDO REFBP Reference BBCIN To VBAT REG10 LDO Back-Up Battery Charger VBBAT REG11 LDO REG12 LDO + Back-Up Battery Or Super Cap OUT3 OUT3 VALIVE RTC Controller Touch Screen Controller REG13 LDO OUT4 OUT4 OUT5 OUT5 OUT6 OUT6 OUT7 OUT7 OUT8 OUT8 OUT9 OUT9 OUT10 OUT10 OUT11 OUT11 OUT12 OUT12 OUT13 OUT13 GA VIO To VBAT Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -4- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 ORDERING INFORMATIONc PART NUMBER VOUT1/VSTBY1d VOUT2 REG3 MODE VOUT3 VOUT4 VOUT5 VOUT6 VOUT7 ACT5880WX1150-T 1.2V/1.2V 1.8V Voltage 5V 2.9V 2.9V 2.9V 3.0V VOUT8 VOUT9 VOUT10 VOUT11 VOUT12 VOUT13 VVBAT VBBAT ILIMBB VALIVE 2.5V 1.2V 3.3V 1.8V 1.8V 2.8V 4.2V 2.7V 5mA 1.8V OPEN DRAIN DRIVER DUTY SETTING OPTION BATTERY INSTALLATION DETECTION OPTION BATTERY THERMAL CONDITION OPTION BATTERY THERMAL OR BATTERY INSTALLATION INTERRUPT OPTION Linear Enable Enable Battery Thermal PART NUMBER PACKAGE PINS TEMPERATURE RANGE PACKING ACT5880WX1150-T FBGA 81 -40°C to +85°C Tape and Reel c: All Active-Semi components are RoHS Compliant and with Pb-free plating unless specified differently. The term Pb-free means semiconductor products that are in compliance with current RoHS (Restriction of Hazardous Substances) standards. d: Drive VSEL to a logic high to select VSTBY1 as a output regulation voltage of REG1. The VSTBY1 can be set by software via I2C interface, refer to appropriate sections of this datasheet for VSTBY1 setting. PACKAGE APPEARANCE AND TOP MARKS Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -5- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PIN CONFIGURATION TOP VIEW A B C D E F G H J SW3 SW3 GP3 GP3 FB3 nRSTO CHGIN nIRQ BATID nSTAT OUT3 INL45 CHGIN VBAT VBAT HFPWR PWRHLD INL89 OUT4 CHGIN VBAT ODO3 OUT9 OUT8 OUT5 INL7 GP1 ODO1 OUT13 INL1213 GA GP2 REFBP OUT2 EN6 EN9 SW2 SW2 VP2 VP2 SW1 SW1 GP1 OUT12 VSYS SW1 VP1 VSEL CLK32 VP1 OUT1 XTAL- XTAL+ VBBAT AUX1 BBCIN AUX2 1 2 SCL 3 4 VD ACIN CHGLEV INL6 nPBIN nPBSTAT OUT6 OUT7 GLED ODO2 OUT11INL1011 OUT10 GP2 TH XNEG YPOS YNEG SDA VALIVE AUX0 5 6 7 GD 8 XPOS 9 81 balls FC FBGA (Pitch: 0.5mm; Ball: 0.3mm) Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -6- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PIN DESCRIPTIONS PIN NAME DESCRIPTION A1 SW3 The Switch Node of the Step-up DC/DC. Same function as pin A2. A2 SW3 The Switch Node of the Step-up DC/DC. Same function as pin A1. A3 FB3 The Current Feedback Input in constant current mode, or leave it unconnected in voltage regulation mode. Connect to current sense resistor in serial in the WLED string, sense the voltage to ground to regulate the WLED string current in constant current driver mode, or connect to the voltage sense tip in inverse regulator mode. These modes are factory programmable only. A4 nRSTO The Reset Output, OD and Active Low. Asserted low during power up and keep low for 260ms for system reset after OUT1 is in regulation. Refer to The Power-On Sequences section for more details . A5 CHGIN The Charger Input. Power input to the charger and the system, same function as pin B5 and pin C5. Bypass to GA with a 6.8μF high quality ceramic capacitor. A6 nIRQ The Interrupt Request Output, OD and Active Low. Asserted low when specified conditions qualified. De-asserted when reading the respective register bits or writing the respective register bits. A7 BATID The Battery Installed Detection. Connect to the ID pin of the battery house connector, to detect if a battery pack is installed by checking the voltage at this pin. Refer to The Battery Installed Detection section for more details. A8 nSTAT The Charger Status Output, OD with Internal 8mA Current Limit. Sink current when the charger is in precondition, fast charge and top-off states. It turns into high-Z in other charge states. A9 TH The Thermistor Monitoring Input. Monitor the battery pack temperature by reading the NTC thermistor in battery pack and only allow charging when the temperature is in a suitable temperature window. B1 GP3 The Ground Path of Step-up DC/DC. Provide the direct ground return path between internal switch, the external storage capacitor and the input decoupling capacitor. Same function as pin B2. Connect GA, GP1, GP2 and GP3 to a single point as close to the IC as possible. B2 GP3 The Ground Path of Step-up DC/DC. Same function as pin B1. B3 OUT3 The Step-up DC/DC Voltage Sense Node in the Voltage Regulation Mode, Over-Voltage Protection Sense Input in the Constant Current Mode. Connect to the Step-up DC/DC output in both modes. The modes are factory programmable only options. Bypass to GA with a 2.2μF high quality ceramic capacitor. B4 INL45 The Input Node for the LDO REG4 and REG5. Bypass to GA with a 1μF high quality ceramic capacitor placed as close to the IC as possible. B5 CHGIN The Charger Input. Same function as pin A5 and pin C5. B6 VBAT The Charger Output. Feed power to the battery and the system. Connect to the battery pack positive terminal, same function as pin B7 and pin C6.Bypass to GA with a 4.7μF high quality ceramic capacitor. B7 VBAT The Charger Output. Same function as pin B6 and pin C6. B8 ACIN The Adaptor Charging Input Detection. Pull this pin to a logic high when an adaptor is available or ground it otherwise. B9 CHGLEV The Charge Current Level Selection. A logic input to select charging current when the ACIN is pulled low, which is presumably for charging from the USB VBUS. Set high for 450mA charging and low for 90mA charging. The status of this pin does not affect the charging current during adaptor charging when the ACIN is pulled high. C1 HFPWR The Hand-Free Power Request Input. Pull this pin high to request system power on if this chip is not enabled, to initialize the normal power up procedure. When the IC is already enabled, logic changes at this pin asserts nIRQ to request for system host service. C2 PWRHLD C3 INL89 The Power Hold Input. Pull this pin high to hold the IC to be in enable state. The Input Node for the LDO REG8 and REG9. Bypass to GA with a 1μF high quality ceramic capacitor. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -7- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PIN DESCRIPTIONS PIN NAME DESCRIPTION C4 OUT4 The Output of the LDO REG4. Bypass to GA with a 3.3μF high quality ceramic capacitor. C5 CHGIN The Charger Input. Same function as pin A5 and pin B5. C6 VBAT The Charger Output. Same function as pin B6 and pin B7. C7 INL6 The Input Node for the LDO REG6. Bypass to GA with a 1μF high quality ceramic capacitor. The Push-Button Input. Drive nPBIN to GA through a 50kΩ resistor to enable the IC. When the IC is enabled, driving nPBIN to GA through a 50kΩ resistor asserts the nIRQ to call interrupt service from the host system, and driving nPBIN to GA directly asserts a manual reset procedure. nPBIN is internally pulled up to VSYS through a 35kΩ resistor. C8 nPBIN C9 nPBSTAT D1 ODO3 The Open Drain Output 3. A current driver output with programmable output current. It could operate in constant current mode, switch on/off mode or PWM mode. The maximum voltage is 6V for this pin. D2 OUT9 The Output of the LDO REG9. Bypass to GA with a 2.2μF high quality ceramic capacitor. D3 OUT8 The Output of the LDO REG8. Bypass to GA with a 3.3μF high quality ceramic capacitor. D4 OUT5 The Output of the LDO REG5. Bypass to GA with a 2.2μF high quality ceramic capacitor. D5 INL7 The Input Node for the LDO REG7. Bypass to GA with a 1μF high quality ceramic capacitor. D6 OUT6 The Output of the LDO REG6. Bypass to GA with a 3.3μF high quality ceramic capacitor. D7 OUT7 The Output of the LDO REG7. Bypass to GA with a 3.3μF high quality ceramic capacitor. D8 EN6 The Enable Input to the LDO REG6, Active High. This input takes effective only when this IC is enabled. D9 EN9 The Enable Input to the LDO REG9, Active High. This input takes effective only when this IC is enabled. E1 GLED The Ground Node for ODO1, ODO2 and ODO3. E2 ODO2 The Open Drain Output 2. A current driver output with programmable output current. It could operate in constant current mode, switch on/off mode or PWM mode. The maximum voltage is 6V for this pin. E3 OUT11 The Output of the LDO REG11. Bypass to GA with a 1μF high quality ceramic capacitor. E4 INL1011 The Input Node for the LDO REG10 and REG11. Bypass to GA with a 1μF high quality ceramic capacitor. E5 OUT10 The Output of the LDO REG10. Bypass to GA with a 1.5μF high quality ceramic capacitor. E6 GP2 The Ground Path of the Step-down DC/DC REG2. Provide the direct ground return path between the internal switch, the external storage capacitor and the input decoupling capacitor. Same function as pin E7. Connect GA, GP1, GP2 and GP3 to a single point as close to the IC as possible. E7 GP2 The Ground Path of the Step-down DC/DC REG2. Same function as pin E6. Active-Low Open-Drain Push-Button Status Output. nPBSTAT is asserted low whenever the nPBIN is pushed, and is high-Z otherwise. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -8- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PIN DESCRIPTIONS PIN NAME DESCRIPTION E8 SW2 The Switch Node of the Step-down DC/DC REG2. Same function as pin E9. E9 SW2 The Switch Node of the Step-down DC/DC REG2. Same function as pin E8. F1 GP1 The Ground Path of the Step-down DC/DC REG1. Provide the direct ground return path between the internal switch, the external storage capacitor and the input decoupling capacitor. Same function as pin G3. F2 ODO1 The Open Drain Output 1. A current driver output with programmable output current. It could operate in constant current mode, switch on/off mode or PWM mode. The maximum voltage is 40V for this pin. F3 OUT13 The Output of the LDO REG13. Bypass to GA with a 1.5μF high quality ceramic capacitor. F4 INL1213 The Input Node for the LDO REG12 and REG13. Bypass to GA with a 1μF high quality ceramic capacitor. F5 GA Analog Ground. Connect GA directly to a quiet ground node. Connect GA, GP1, GP2 and GP3 to a single point as close to the IC as possible. F6 REFBP The Reference Bypass Node. Bypass to GA with a 47nF capacitor for noise suppression and PSRR performance improvement. This pin is discharged to GA in shutdown. F7 OUT2 F8 VP2 The Switch Power Input Node of the Step-down DC/DC REG2. Same function as pin F9. F9 VP2 The Switch Power Input Node of the Step-down DC/DC REG2. Same function as pin F8. G1 SW1 The Switch Node of the Step-down DC/DC REG1. Same function as pin G2 and pin H1. G2 SW1 The Switch Node of the Step-down DC/DC REG1. Same function as pin G1 and pin H1. G3 GP1 The Ground Path of the Step-down DC/DC REG1. Same function as pin F1. G4 OUT12 The Output of the LDO REG12. Bypass to GA with a 2.2μF high quality ceramic capacitor. G5 VSYS The Internal Bias Bypass. This rail is available all time that this IC works, bypass to GA with a 1μF high quality ceramic capacitor. G6 VD G7 XNEG One of ADC Input, Internally Configured as the Touch Screen Force-Sense Node XNEG with an internal force switch. G8 YPOS One of ADC Input, Internally Configured as the Touch Screen Force-Sense Node YPOS with an internal force switch. G9 YNEG One of ADC Input, Internally Configured as the Touch Screen Force-Sense Node YNEG with an internal force switch. H1 SW1 The Switch Node of the Step-down DC/DC REG1. Same function as pin G1 and pin G2. H2 VP1 The Switch Power Input Node of the Step-down DC/DC REG1. Same function as pin J2. H3 VSEL H4 SCL The Clock for the I2C compatible Serial Interface. Does the same function as the SCL of a normal 400kHz fast I2C slave device. H5 SDA The Data for the I2C compatible Serial Interface. Does the same function as the SDA of a normal 400kHz fast I2C slave device. The Step-down DC/DC REG2 Feedback Node. Connect it to the output node of REG2. The Power Input for Biasing the ADC Circuit. Bypass to GD with a 100nF high quality ceramic capacitor. The Output Voltage Selection Input for the Step-down DC/DC REG1. Allow the output voltage of the step-down DC/DC REG1 flies between 2 preset voltages by asserting different logic level at this pin. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -9- www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PIN DESCRIPTIONS PIN NAME DESCRIPTION H6 VALIVE H7 AUX0 H8 GD H9 XPOS One of ADC Input, Internally Configured as the Touch Screen Force-Sense Node XPOS with an internal force switch. J1 CLK32 The 32kHz Oscillation Output, OD. A pull-up resistor at load end in range of 150kΩ to 300kΩ is recommended. J2 VP1 J3 OUT1 The Step-down DC/DC REG1 Feedback Node. Connect it to the output node of REG1. J4 XTAL- The 32kHz Oscillator Crystal Node. This node is pick-up node. Connect it to any terminal of an external crystal. J5 XTAL+ The 32kHz Oscillator Crystal Node. This node is driving node. Connect it to any terminal of an external crystal. J6 VBBAT The Back-up Battery Node. Connect it to the positive node of a back-up battery or storage super cap. The back-up battery charger circuit charges battery or super cap at this node with limited current and outputs a programmable voltage after charging for powering the always-on low power LDO. J7 AUX1 The Auxiliary ADC Input AUX1. J8 BBCIN The Back-up Battery Charger Circuit Input. Bypass to GA with a 1μF high quality ceramic capacitor. J9 AUX2 The Auxiliary ADC Input AUX2. The Always-On Low Power LDO Output. Bypass to GA with a 1μF high quality ceramic capacitor. The Auxiliary ADC Input AUX0. The Ground Node of the ADC Circuit in the IC. The Switch Power Input Node of the Step-down DC/DC REG1. Same function as pin H2. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 10 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 ABSOLUTE MAXIMUM RATINGSc PARAMETER VALUE CHGIN to GA (Continuous) 7 BATID, TH, ACIN, HFPWR, VSYS and nSTAT to GA 6 ODO1 to GLED 42 ODO2, ODO3 to GLED 5 ON6, ON9, REFBP, BBCIN, VALIVE, VBBAT, XTAL-, XTAL+, CLK32, VSEL, VBAT, CHGLEV, SDA, SCL, PWRHLD, nIRQ, nRSTO, nPBSTAT, nPBIN, OUT1 and OUT2 to GA 6 XPOS, XNEG, YPOS, YNEG, AUX0, AUX1, AUX2, VD to GD 6 SW1 to GP1 -0.3 to (VP1 + 0.3) SW2 to GP2 -0.3 to (VP2 + 0.3) OUT3, SW3, FB3 to any GP3 UNIT V 42 OUT6 to GA -0.3 to (INL6 + 0.3) OUT7 to GA -0.3 to (INL7 + 0.3) OUT8, OUT9 to GA -0.3 to (INL89 + 0.3) OUT10, OUT11 to GA -0.3 to (INL1011 + 0.3) OUT12, OUT13 to GA -0.3 to (INL1213 + 0.3) Difference between any two ground groups: GP1, GP2, GP3, GLED, GD, GA -0.3 to + 0.3 Junction to Ambient Thermal Resistance (θJA) 43 °C/W Power Dissipation, TA=25 ˚C 2 W Power Dissipation Degrading for TA>25 ˚C 25 mW/°C Operating Junction Temperature (TJ) -40 to 150 Operating Ambient Temperature range (TA) -40 to 85 Storage Temperature -55 to 150 Lead Temperature (soldering for 10 sec.) °C 300 c: Do not exceed these limits to prevent damage to the device. Exposure to absolute maximum rating conditions for long periods may affect device reliability. Functional operation at conditions other than the operation conditions specified is not implied. Only one absolute maximum rating should be applied at any time. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 11 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 I2C INTERFACE ELECTRICAL CHARACTERISTICS (VVSYS = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS MIN SCL, SDA Input Low VVSYS = 3.1V to 5.5V, TA = -40ºC to 85ºC SCL, SDA Input High VVSYS = 3.1V to 5.5V, TA = -40ºC to 85ºC TYP UNIT 0.4 V 1.4 V SCL, SDA Leakage Current SDA Output Low MAX IOL = 5mA 1 µA 0.3 V SCL Clock Period, tSCL 1.5 µs SDA Data Setup Time, tSU 100 ns SDA Data Hold Time, tHD 300 ns Start Setup Time, tST For Start Condition 100 ns Stop Setup Time, tSP For Stop Condition 100 ns Figure 1: I2C Compatible Serial Bus Timing tSCL SCL tST tHD tSU tSP SDA Start condition Stop condition Note: Each session of data transfer is with a start condition, a 7-bits slave address plus a bit to instruct for read or write, followed by an acknowledge bit, a register address byte followed by an acknowledge bit, and a data byte followed by an acknowledge bit and a stop condition. The device address, the register address and the data are all MSB first transferred. Each bit volume is prepared during the SCL is low, is latched-in by the rising edge of the SCL. The data byte is accepted and is put effective by the time that the last bit volume is latched-in. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 12 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 GLOBAL REGISTER MAP FUNCTION ADDR. BLOCK SYS 0x00 BITS NAMES AND DEFAULTS D7 TRST D6 D5 D4 nSYSMODE nSYSLVMSK nSYSSTAT 0 0 0 R EVENT1 EVENT2 EVENT4 RFU 0 0 0 0 SYS 0x01 SYS 0x3C Set to 0x80 before setting nWKALM and RAAI. SYS 0x3D Set to 0x08 before setting nWKALM and RAAI. SYS 0x6C SYS 0x6D REG1 REG1 REG1 REG2 REG2 REG2 REG2 REG3 REG3 REG4 REG4 REG5 REG5 0x10 0x11 0x12 0x20 0x22 0x28 0x29 0x30 0x31 0x40 0x41 0x44 0x45 D3 D2 D1 D0 SYSLEV[3] SYSLEV[2] SYSLEV[1] SYSLEV[0] 0 0 0 0 SCRATCH[3] SCRATCH[2] SCRATCH[1] SCRATCH[0] x x x x RFU RFU STB STA RFU RFU DATAB DATAA x x 0 1 x x 0 0 RFU RFU POSB POSA RFU RFU NEGB RFU x x 0 1 x x 0 x x x VSET0[5] VSET0[4] VSET0[3] VSET0[2] VSET0[1] VSET0[0] 0 0 0 1 1 0 0 0 x x VSET1[5] VSET1[4] VSET1[3] VSET1[2] VSET1[1] VSET1[0] 0 0 0 1 1 0 0 0 ON PHASE MODE DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 0 0 1 0 0 ON PHASE MODE DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 1 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 0 0 1 0 0 x x LOWIQ x x x nFLTMSK OK 1 0 1 0 0 0 0 R VSET[7] VSET[6] VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 1 0 1 0 1 0 0 ON PHASE RFU DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 0 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 0 1 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 0 1 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 0 0 0 0 0 0 R Cont'd in next page. Note: SYS: The registers for the system control block; REG1 to REG5: The registers for regulators that generate the OUT1 to OUT5. RTC: The registers for Real Time Clock block. RFU is the bit reserved for future use. R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 13 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 GLOBAL REGISTER MAP FUNCTION ADDR. BLOCK REG6 REG6 REG7 REG7 REG8 REG8 REG9 REG9 REG10 REG10 REG11 REG11 0x48 0x49 0x4C 0x4D 0x50 0x51 0x54 0x55 0x58 0x59 0x5C 0x5D REG12 0x60 REG12 0x61 REG13 REG13 0x64 0x65 BITS NAMES AND DEFAULTS D7 D6 D5 D4 D3 D2 D1 D0 VSET[0] x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] 0 0 1 1 0 1 0 1 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 0 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 1 0 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 0 0 1 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 0 1 1 0 0 0 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 0 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 1 0 0 1 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 1 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 0 0 1 0 0 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 0 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 0 0 1 0 0 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 0 0 0 0 0 0 0 R x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 0 0 ON DIS LOWIQ DELAY[2] DELAY[1] DELAY[0] nFLTMSK OK 0 0 0 0 0 0 0 R Cont'd in next page. Note: REG6 to REG13: The registers for regulators that generate the OUT6 to OUT13. RFU is the bit reserved for future use. R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 14 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 GLOBAL REGISTER MAP BITS NAMES AND DEFAULTS FUNCTION ADDR. BLOCK ODO1 ODO1 ODO2 ODO2 ODO3 ODO3 ODO RTC RTC RTC RTC RTC 0x70 0x71 0x73 0x74 0x76 0x77 0x79 RTC RTC 0xA0 D1 D0 ISCALE1[1] ISCALE1[0] ISET1[5] ISET1[4] ISET1[3] ISET1[2] ISET1[1] ISET1[0] 0 0 0 0 0 0 0 0 DUTY1[7] DUTY1[6] DUTY1[5] DUTY1[4] DUTY1[3] DUTY1[2] DUTY1[1] DUTY1[0] 0 0 0 0 0 0 0 0 ISCALE2[1] ISCALE2[0] ISET2[5] ISET2[4] ISET2[3] ISET2[2] ISET2[1] ISET2[0] 0 0 0 0 0 0 0 0 DUTY2[7] DUTY2[6] DUTY2[5] DUTY2[4] DUTY2[3] DUTY2[2] DUTY2[1] DUTY2[0] 0 0 0 0 0 0 0 0 ISCALE3[1] ISCALE3[0] ISET3[5] ISET3[4] ISET3[3] ISET3[2] ISET3[1] ISET3[0] 0 0 0 0 0 0 0 0 DUTY3[7] DUTY3[6] DUTY3[5] DUTY3[4] DUTY3[3] DUTY3[2] DUTY3[1] DUTY3[0] 0 0 0 0 0 0 OK3 RFU RFU RFU BUFFER R R R R 0 0 0 0 x x SEC[5] SEC[4] SEC[3] SEC[2] SEC[1] SEC[0] x x R R R R R R x x MIN[5] MIN[4] MIN[3] MIN[2] MIN[1] MIN[0] x x R R R R R R x x x HR[4] HR[3] HR[2] HR[1] HR[0] 0x98 0x9C D2 OK2 0x8D RTC D3 0 0x8C 0x94 D4 OK1 0x88 RTC D5 0 0x84 0x90 D6 THERMAL_OK 0x80 RTC D7 x x x R R R R R DAY[7] DAY[6] DAY[5] DAY[4] DAY[3] DAY[2] DAY[1] DAY[0] R R R R R R R R DAY[15] DAY[14] DAY[13] DAY[12] DAY[11] DAY[10] DAY[9] DAY[8] R R R R R R R R x x x x 0 0 0 0 0 0 x x ALMMIN[5] ALMMIN[4] ALMMIN[3] ALMMIN[2] ALMMIN[1] ALMMIN[0] x x 0 0 0 0 0 0 x x x ALMHR[4] ALMHR[3] ALMHR[2] ALMHR[1] ALMHR[0] 0 ALMSEC[5] ALMSEC[4] ALMSEC[3] ALMSEC[2] ALMSEC[1] ALMSEC[0] x x x 0 0 0 0 CLKSRC nWKALM x x x x x x 0 0 0 0 0 0 0 0 x RCL RAAI RDAI RHAI RMAI RSAI RTCEN x 0 0 0 0 0 0 0 Cont'd in next page. Note: ODO1 to ODO3: The registers for the open drain driver ODO1 to ODO3; The ODO is the shared register for all the 3 drivers. RTC: The registers for Real Time Clock block. RFU is the bit reserved for future use. R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 15 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 GLOBAL REGISTER MAP BITS NAMES AND DEFAULTS FUNCTION ADDR. BLOCK RTC RTC RTC RTC RTC RTC BBU BBU BBU CHG 0xA4 0xA8 0xAC 0xB0 0xB1 D7 D6 D5 D4 D3 D2 D1 D0 x x SETSEC[5] SETSEC[4] SETSEC[3] SETSEC[2] SETSEC[1] SETSEC[0] x x 0 0 0 0 0 0 x x SETMIN[5] SETMIN[4] SETMIN[3] SETMIN[2] SETMIN[1] SETMIN[0] x x 0 0 0 0 0 0 x x x SETHR[4] SETHR[3] SETHR[2] SETHR[1] SETHR[0] x x x 0 0 0 0 0 SETDAY[7] SETDAY[6] SETDAY[5] SETDAY[4] SETDAY[3] SETDAY[2] SETDAY[1] SETDAY[0] 0 0 0 0 0 SETDAY[15] SETDAY[14] SETDAY[13] SETDAY[12] SETDAY[11] 0xB4 0xC8 0xC9 0xCA 0xD0 0 0 0 0 0 0 0 x x ALMINT DAYINT HRINT MININT SECINT x x x 0 0 0 0 0 x x VSETBB[5] VSETBB[4] VSETBB[3] VSETBB[2] VSETBB[1] VSETBB[0] 1 0 1 0 1 x x 1 ONBB ONRTC RFU 1 1 x x x UNLOCKBB SCRATCH[3] SCRATCH[2] SCRATCH[1] SCRATCH[0] 0 0 0 0 x x 1 0 0 1 0 0 VSET[3] VSET[2] VSET[1] VSET[0] ISET[3] ISET[2] ISET[1] ISET[0] 0 1 0 0 1 SUSCHG ENVISET 0 0 0 0 1 0 0 PRETIMO[0] OVPSET[1] OVPSET[0] 0 0 0 0 TIMR_DAT TEMP_DAT or BATT_DAT INPUT_DAT CHG_DAT R R R R TIMR_TOT TEMP_NEG or BATT_NEG INPUT_NEG CHG_NEG TOTTIMO[1] TOTTIMO[0] PRETIMO[1] CHG 0 0 TEMP_POS TIMR_PRE INPUT_POS or BATT_POS 0xDA 0 VSETRTC[5] VSETRTC[4] VSETRTC[3] VSETRTC[2] VSETRTC[1] VSETRTC[0] TEMP_STAT TIMR_STAT INPUT_STAT CHG_STAT or 0xD8 BATT_STAT CHG 0 SETDAY[8] x 0xD1 0xD9 0 SETDAY[9] 0 CHG CHG 0 SETDAY[10] 0 0 CHG_POS 0 0 0 0 0 0 0 0 RFU RFU CHGSTAT0 CHGSTAT1 RFU x x x x x R R x x x x Cont'd in next page. Note: RTC: The registers for Real Time Clock block; BBU is for the backup battery unit, which includes a backup battery charger and an always-on low power LDO. RFU is the bit reserved for future use. R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 16 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 GLOBAL REGISTER MAP FUNCTION ADDR. BLOCK TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC TSC ADC 0xF0 0xF1 0xE0 0xE1 0xE2 0xE3 0xE4 0xE5 0xE6 0xE7 0xE8 0xE9 TSC ADC 0xEA TSC ADC 0xEB TSC ADC TSC ADC TSC ADC TSC ADC 0xEC 0xED 0xEE 0xEF BITS NAMES AND DEFAULTS D7 D6 D5 D4 D3 nEN SINGEL 1 0 0 0 0 CLEN PENWKEN PENSTAT PENIRQ DATARDY CHANNEL[2] CHANNEL[1] CHANNEL[0] D2 D1 D0 CH03 CH47 ACQ 0 0 0 nAUTO PENMSK DATAMASK 0 0 R R R 1 0 0 XPOS[11] XPOS[10] XPOS[9] XPOS[8] XPOS[7] XPOS[6] XPOS[5] XPOS[4] x x x x x x x x XPOS[3] XPOS[2] XPOS[1] XPOS[0] x x x x x x x x x x x x YPOS[11] YPOS[10] YPOS[9] YPOS[8] YPOS[7] YPOS[6] YPOS[5] YPOS[4] x x x x x x x x YPOS[3] YPOS[2] YPOS[1] YPOS[0] x x x x x x x x x x x x Z1POS[11] Z1POS[10] Z1POS[9] Z1POS[8] Z1POS[7] Z1POS[6] Z1POS[5] Z1POS[4] x x x x x x x x Z1POS[3] Z1POS[2] Z1POS[1] Z1POS[0] x x x x x x x x x x x x Z2POS[11] Z2POS[10] Z2POS[9] Z2POS[8] Z2POS[7] Z2POS[6] Z2POS[5] Z2POS[4] x x x x x x x x Z2POS[3] Z2POS[2] Z2POS[1] Z2POS[0] x x x x x x x x x x x x AUX0[11] AUX0[10] AUX0[9] AUX0[8] AUX0[7] AUX0[6] AUX0[5] AUX0[4] x x x x x x x x AUX0[3] AUX0[2] AUX0[1] AUX0[0] x x x x x x x x x x x x AUX1[11] AUX1[10] AUX1[9] AUX1[8] AUX1[7] AUX1[6] AUX1[5] AUX1[4] x x x x x x x x AUX1[3] AUX1[2] AUX1[1] AUX1[0] x x x x x x x x x x x x AUX2[11] AUX2[10] AUX2[9] AUX2[8] AUX2[7] AUX2[6] AUX2[5] AUX2[4] x x x x x x x x AUX2[3] AUX2[2] AUX2[1] AUX2[0] x x x x x x x x x x x x AUX3[11] AUX3[10] AUX3[9] AUX3[8] AUX3[7] AUX3[6] AUX3[5] AUX3[4] x x x x x x x x AUX3[3] AUX3[2] AUX3[1] AUX3[0] x x x x x x x x x x x x Note: RFU is the bit reserved for future use. R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 17 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS BLOCK ADDRESS and BIT 7 0x00 SYS 0x01 NAME TRST DEFAULT and ACCESS 0 DESCRIPTION W/R Reset Timer Setting. Defines the reset time-out threshold. Reset time-out is 65ms when value is 1, reset time-out is 260ms when value is 0. 6 nSYSMODE 0 W/R SYSLEV Mode Select. Defines the response to the SYSLEV voltage detector, 0: automatic shut down when VVSYS falls below the programmed VSYSLEV threshold, 1: Generate an interrupt when VVSYS falls below the programmed VSYSLEV threshold. 5 nSYSLVMSK 0 W/R System Voltage Level Interrupt Mask. SYSLEV interrupt is masked by default, set to 1 to unmask this interrupt. 4 nSYSSTAT 0 R VVSYS Status Indication. Value is 0 when VVSYS > VSYSLEV, value is 1 when VVSYS < VSYSLEV. 3 SYSLEV[3] 0 2 SYSLEV[2] 0 1 SYSLEV[1] 0 0 SYSLEV[0] 0 7 EVENT1 0 WE/R For internal use only. 6 EVENT2 0 WE/R For internal use only. 5 EVENT4 0 4 RFU 0 3 SCRATCH[3] x 2 SCRATCH[2] x 1 SCRATCH[1] x 0 SCRATCH[0] x 0x3C [7:0] 0x3D [7:0] W/R W/R 4 bits to set the threshold of VSYSLEV. SYSLEV[3:0] = 0000 is for 2.2V. The voltage is linear coded with LSB for 0.1V in the range of 2.2V to 3.7V, where LSB is SYSLEV[0]. The hysteresis is 0.2V in rising. The setting is effective only when VVSYS > VUVLO. Write 1 to enable the sleep mode of REG2, 0 to enable the normal buck mode operation of REG2. WE/R For internal use only. 4 bits scratch register for the equipment system to use. Data in those bits are kept until the VSYS loses. W/R Set to 0x80 before setting nWKALM and RAAI. W/R Set to 0x08 before setting nWKALM and RAAI. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 18 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT SYS 0x6D DEFAULT and ACCESS DESCRIPTION 7 RFU x WE/R Reserved for future use. 6 RFU x WE/R Reserved for future use. 5 0x6C NAME STB 0 W/R Write and read for different functions, as flag bit or mask bit, for the HFPWR assertion interrupt. Write 1 allow interrupt, write 0 mask interrupt; Read 1 when interrupt asserted, 0 if no interrupt. Also see DATAB[ ], POSB[ ] and NEGB[ ] for the status and conditions. W/R Write and read for different functions, as flag bit or mask bit, for the "enable key" push-button assertion interrupt. Write 1 allow interrupt, write 0 mask interrupt; Read 1 when interrupt asserted, 0 if no interrupt. Also see DATAA[ ], POSA[ ] for the status and conditions. 4 STA 1 3 RFU x WE/R Reserved for future use. 2 RFU x WE/R Reserved for future use. 1 DATAB 0 W/R This bit needs to be set 1 for asserting interrupt when HFPWR asserted. 0 DATAA 0 W/R This bit needs to be set 1 for asserting interrupt when "enable key" asserted. 7 RFU x WE/R Reserved for future use. 6 RFU x WE/R Reserved for future use. 5 POSB 0 W/R This bit needs to be set 1 for asserting interrupt when HFPWR asserted. 4 POSA 1 W/R This bit needs to be set 1 for asserting interrupt when "enable key" asserted. 3 RFU x WE/R Reserved for future use. 2 RFU x WE/R Reserved for future use. 1 NEGB 0 0 RFU x W/R This bit needs to be set 1 for asserting interrupt when HFPWR de-asserted. WE/R Reserved for future use. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 19 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x10 0x11 REG1 0x12 NAME DEFAULT and ACCESS DESCRIPTION For internal use only. 7 x 0 W/R 6 x 0 W/R 5 VSET0[5] 0 W/R 4 VSET0[4] 1 W/R 3 VSET0[3] 1 2 VSET0[2] 0 1 VSET0[1] 0 0 VSET0[0] 0 7 x 0 W/R 6 x 0 W/R 5 VSET1[5] 0 W/R 4 VSET1[4] 1 W/R 3 VSET1[3] 1 2 VSET1[2] 0 1 VSET1[1] 0 0 VSET1[0] 0 7 ON 1 W/R Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 to turn off the regulator. 6 PHASE 0 W/R Regulator Phase Control. Set bit to 1 for the regulator to operate 180° out of phase with the oscillator, set bit to 0 for the regulator to operate in phase with the oscillator. 5 MODE 0 W/R Regulator Mode Select. Set bit to 1 for fixed-frequency PWM mode under all load conditions, set bit to 0 to allow PFM mode under light-load conditions. 4 DELAY[2] 0 3 DELAY[1] 0 W/R 2 DELAY[0] 0 Regulator Turn-on Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. 1 nFLTMSK 0 W/R Regulator Fault Interrupt Mask. Set bit to 1 to enable faultinterrupt when the output is out of regulation, set bit to 0 to disable fault-interrupt. 0 OK R R Voltage Setting for the REG1 output when VSEL=0. Default setting is 1.2V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R For internal use only. Voltage Setting for the REG1 when VSEL=1. Default setting is 1.2V (This voltage setting is also known as "Standby Voltage"). Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 20 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x20 0x22 NAME DEFAULT and ACCESS 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 0 0 1 0 0 W/R W/R W/R W/R W/R W/R W/R W/R 7 ON 1 W/R Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 to turn off the regulator. 6 PHASE 1 W/R Regulator Phase Control. Set bit to 1 for the regulator to operate 180° out of phase with the oscillator, set bit to 0 for the regulator to operate in phase with the oscillator. 5 MODE 0 W/R Regulator Mode Select. Set bit to 1 for fixed-frequency PWM mode under all load conditions, set bit to 0 to allow PFM mode under light -load conditions. 4 DELAY[2] 0 W/R 3 DELAY[1] 0 W/R 2 DELAY[0] 0 W/R 1 nFLTMSK 0 W/R 0 OK R R 7 6 5 4 3 2 1 0 7 6 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] x x 0 W/R For internal use only. 0 W/R 1 W/R Voltage Setting for the linear regulation part of the REG2, which is 0 W/R active in sleep mode. Default setting is 1.8V. Refer to the STEP0 W/R DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for 1 W/R details. 0 W/R 0 W/R 1 WE/R Not used. 0 WE/R 5 LOWIQ 1 W/R 4 x 0 x Not used. 3 x 0 x Not used. 2 x 0 x Not used. 1 nFLTMSK 0 W/R 0 OK 0 R REG2 0x28 0x29 DESCRIPTION Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. For internal use only. Voltage Setting for the buck regulation part of the REG2, which is active in normal mode (Refer to byte 0x28 for REG2 output voltage in sleep mode). Default setting is 1.8V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt when the output is out of regulation, set bit to 0 to disable faultinterrupt. Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current mode, set bit to 0 for normal mode. If it is set to 1, the backup battery charger stops in the deep sleep mode. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt when the output is out of regulation, set bit to 0 to disable faultinterrupt. Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. - 21 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x30 NAME DEFAULT and ACCESS Voltage Setting for the REG3 output. Default setting is 5V. Refer to the table of STEP-UP DC/DC VOLTAGE SETTING for details. 7 VSET[7] 0 6 VSET[6] 1 5 VSET[5] 0 4 VSET[4] 1 3 VSET[3] 0 2 VSET[2] 1 1 VSET[1] 0 0 VSET[0] 0 7 ON 0 W/R Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 to turn off the regulator. 6 PHASE 0 W/R Regulator Phase Control. Set bit to 1 for the regulator to operate 180° out of phase with the oscillator, set bit to 0 for the regulator to operate in phase with the oscillator. 5 RFU 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 OK W/R REG3 0x31 DESCRIPTION WE/R Reserved for future use. W/R Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. 0 W/R Regulator Fault Interrupt Mask. Set bit to 1 to enable faultinterrupt when the output is out of regulation, set bit to 0 to disable fault-interrupt. R W/R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 22 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x40 REG4 0x41 0x44 REG5 0x45 NAME DEFAULT and ACCESS DESCRIPTION 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 0 1 7 ON 1 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 2 DELAY[1] DELAY[0] 0 0 1 nFLTMSK 0 0 OK R 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 0 1 7 ON 1 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R W/R For internal use only. W/R Voltage Setting for the REG4 output. Default setting is 2.9V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. W/R For internal use only. W/R Voltage Setting for the REG5 output. Default setting is 2.9V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 23 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x48 REG6 0x49 0x4C REG7 0x4D NAME DEFAULT and ACCESS DESCRIPTION 7 x 0 W/R For internal use only. 6 5 4 3 2 1 0 x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 1 1 0 1 0 1 W/R 7 ON 0 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 1 0 7 ON 1 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R W/R Voltage Setting for the REG6 output. Default setting is 2.9V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. W/R For internal use only. W/R Voltage Setting for the REG7 output. Default setting is 3.0V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 24 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x50 REG8 0x51 0x54 REG9 0x55 NAME DEFAULT and ACCESS DESCRIPTION 7 x 0 W/R For internal use only. 6 5 4 3 2 1 0 x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 1 1 0 0 0 1 W/R 7 ON 1 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 0 1 1 0 0 0 7 ON 0 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R W/R Voltage Setting for the REG8 output. Default setting is 2.5V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. W/R For internal use only. W/R Voltage Setting for the REG9 output. Default setting is 1.2V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 25 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x58 REG10 0x59 0x5C REG11 0x5D NAME DEFAULT and ACCESS DESCRIPTION 7 x 0 W/R For internal use only. 6 5 4 3 2 1 0 x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 1 1 1 0 0 1 W/R 7 ON 0 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 0 0 1 0 0 7 ON 0 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R W/R Voltage Setting for the REG10 output. Default setting is 3.3V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. W/R For internal use only. W/R Voltage Setting for the REG11 output. Default setting is 1.8V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 26 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x60 REG12 0x61 0x64 REG13 0x65 NAME DEFAULT and ACCESS DESCRIPTION 7 x 0 W/R For internal use only. 6 5 4 3 2 1 0 x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 1 0 0 1 0 0 W/R 7 ON 0 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R 7 6 5 4 3 2 1 0 x x VSET[5] VSET[4] VSET[3] VSET[2] VSET[1] VSET[0] 0 0 1 1 0 1 0 0 7 ON 0 Regulator On/Off Bit. Set bit to 1 to turn on the regulator, set bit to 0 W/R to turn off the regulator. 6 DIS 0 W/R 5 LOWIQ 0 4 DELAY[2] 0 3 DELAY[1] 0 2 DELAY[0] 0 1 nFLTMSK 0 0 OK R W/R Voltage Setting for the REG12 output. Default setting is 1.8V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. W/R For internal use only. W/R Voltage Setting for the REG13 output. Default setting is 2.8V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R Output Discharge Control. Set bit to 1 to discharged the LDO output to GA through 1.5kΩ resistor when in shutdown. LDO Low-IQ Mode Control. Set bit to 1 for low quiescent current W/R mode, set bit to 0 for normal mode. Regulator Turn-On Delay Control. DELAY[2:0]=000 for no delay. Other code to delay relationship: 001 for 2ms, 010 for 4ms, 011 for W/R 8ms, 100 for 16ms, 101 for 32ms, 110 for 64ms and 111 for 128ms. There is a propagation delay for about 100μs if selecting no delay. Regulator Fault Interrupt Mask. Set bit to 1 to enable fault-interrupt W/R when the output is out of regulation, set bit to 0 to disable faultinterrupt. R Regulator Power-OK Status. Value is 0 when the output is out of regulation, value is 1 when the output is in regulation. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 27 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x70 ODO1 0x71 0x73 ODO2 0x74 NAME DEFAULT and ACCESS DESCRIPTION 7 ISCALE1[1] 0 6 ISCALE1[0] 0 Set the LSB weight of the linear current setting of the open-drain driver. [1:0]=00 for 0.4mA, 01 for 0.8mA, 10 for 1.2mA, 11 for 1.6mA. 5 ISET1[5] 0 Driver output current setting in linear code, no offset. 4 ISET1[4] 0 3 ISET1[3] 0 [5:0]=0 for 0mA output. Full scale output currents are 25.2mA, 50.4mA, 75.6mA and 100.8mA respectively with different LSB weights. 2 ISET1[2] 0 1 ISET1[1] 0 0 ISET1[0] 0 7 DUTY1[7] 0 PWM duty setting. [7:0]=0x00 for 0%, [7:0]=0xFF for 100%. 6 DUTY1[6] 0 5 DUTY1[5] 0 For linear duty setting option, the LSB weight is 0.4% for code 0x00 to 0xFE, which is 0% to 99.2% of duty. The code 0xFF is forced for 100% duty. 4 DUTY1[4] 0 3 DUTY1[3] 0 2 DUTY1[2] 0 1 DUTY1[1] 0 0 DUTY1[0] 0 7 ISCALE2[1] 0 6 ISCALE2[0] 0 5 ISET2[5] 0 Driver output current setting in linear code, no offset. 4 ISET2[4] 0 3 ISET2[3] 0 [5:0]=0 for 0mA output. Full scale output currents are 25.2mA, 50.4mA, 75.6mA and 100.8mA respectively with different LSB weights. 2 ISET2[2] 0 1 ISET2[1] 0 0 ISET2[0] 0 7 DUTY2[7] 0 PWM duty setting. [7:0]=0x00 for 0%, [7:0]=0xFF for 100%. 6 DUTY2[6] 0 5 DUTY2[5] 0 For linear duty setting option, the LSB weight is 0.4% for code 0x00 to 0xFE, which is 0% to 99.2% of duty. The code 0xFF is forced for 100% duty. 4 DUTY2[4] 0 3 DUTY2[3] 0 2 DUTY2[2] 0 1 DUTY2[1] 0 0 DUTY2[0] 0 W/R W/R W/R W/R W/R W/R For the non-linear duty setting option, refer to the table of NONLINEAR DUTY SETTING for code to duty cross. Set the LSB weight of the linear current setting of the open-drain driver. [1:0]=00 for 0.4mA, 01 for 0.8mA, 10 for 1.2mA, 11 for 1.6mA. For the non-linear duty setting option, refer to the table of NONLINEAR DUTY SETTING for code to duty cross. Note: W/R: Write and read accessible. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 28 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x76 ODO3 0x77 ODO 0x79 NAME DEFAULT and ACCESS DESCRIPTION 7 ISCALE3[1] 0 6 ISCALE3[0] 0 Set the LSB weight of the linear current setting of the opendrain driver. [1:0]=00 for 0.4mA, 01 for 0.8mA, 10 for 1.2mA, 11 for 1.6mA. 5 ISET3[5] 0 Driver output current setting in linear code, no offset. 4 ISET3[4] 0 3 ISET3[3] 0 [5:0]=0 for 0mA output. Full scale output currents are 25.2mA, 50.4mA, 75.6mA and 100.8mA respectively with different LSB weights. 2 ISET3[2] 0 1 ISET3[1] 0 0 ISET3[0] 0 7 DUTY3[7] 0 PWM duty setting. [7:0]=0x00 for 0%, [7:0]=0xFF for 100%. 6 DUTY3[6] 0 5 DUTY3[5] 0 For linear duty setting option, the LSB weight is 0.4% for code 0x00 to 0xFE, which is 0% to 99.2% of duty. The code 0xFF is forced for 100% duty. 4 DUTY3[4] 0 3 DUTY3[3] 0 2 DUTY3[2] 0 1 DUTY3[1] 0 0 DUTY3[0] 0 7 THERMAL_OK 1 R Driver circuit over temperature indicator. This bit is cleared to 0 if the driver circuit over temperature happens. 6 OK1 0 R Indicator for ODO1 out current of regulation (open LED detected). 5 OK2 0 R Indicator for ODO2 out current of regulation (open LED detected). 4 OK3 0 R Indicator for ODO3 out current of regulation (open LED detected). 3 RFU 1 R Reserved for future use. 2 RFU 0 W/R Reserved for future use. 1 RFU 0 W/R Reserved for future use. 0 BUFFER 0 W/R Set 1 to select data buffers. Buffered data is updated to each output simultaneously when this bit is cleared to 0, for synchronized output. W/R W/R W/R For the non-linear duty setting option, refer to the table of NONLINEAR DUTY SETTING for code to duty cross. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 29 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x80 0x84 RTC 0x88 0x8C NAME DEFAULT and ACCESS DESCRIPTION 7 x x x Not used. 6 x x x Not used. 5 SEC[5] 0 4 SEC[4] 0 3 SEC[3] 0 2 SEC[2] 0 1 SEC[1] 0 0 SEC[0] 0 7 x x x Not used. 6 x x R RTC hours data, mod 24, HR[0] is the LSB. 5 MIN[5] 0 4 MIN[4] 0 3 MIN[3] 0 2 MIN[2] 0 1 MIN[1] 0 0 MIN[0] 0 7 x x x Not used. 6 x x x Not used. 5 x x x Not used. 4 HR[4] 0 3 HR[3] 0 2 HR[2] 0 1 HR[1] 0 0 HR[0] 0 7 DAY[7] 0 6 DAY[6] 0 5 DAY[5] 0 4 DAY[4] 0 3 DAY[3] 0 2 DAY[2] 0 1 DAY[1] 0 0 DAY[0] 0 RTC seconds data, mod 60, SEC[0] is the LSB. R RTC hours data, mod 24, HR[0] is the LSB. R RTC hours data, mod 24, HR[0] is the LSB. R Elapsed days counter, the lower byte of the 16 bits counter. DAY[0] is the LSB. R Note: R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 30 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x8D 0x90 RTC 0x94 0x98 NAME DEFAULT and ACCESS DESCRIPTION Elapsed days counter, the upper byte of the 16 bits counter. DAY[15] is the MSB. 7 DAY[15] 0 6 DAY[14] 0 5 DAY[13] 0 4 DAY[12] 0 3 DAY[11] 0 2 DAY[10] 0 1 DAY[9] 0 0 DAY[8] 0 7 x x x Not used. 6 x x x Not used. 5 ALMSEC[5] 0 4 ALMSEC[4] 0 3 ALMSEC[3] 0 2 ALMSEC[2] 0 1 ALMSEC[1] 0 0 ALMSEC[0] 0 7 x x x Not used. 6 x x x Not used. 5 ALMMIN[5] 0 4 ALMMIN[4] 0 3 ALMMIN[3] 0 2 ALMMIN[2] 0 1 ALMMIN[1] 0 0 ALMMIN[0] 0 7 x x x Not used. 6 x x x Not used. 5 x x x Not used. 4 ALMHR[4] 0 3 ALMHR[3] 0 2 ALMHR[2] 0 1 ALMHR[1] 0 0 ALMHR[0] 0 R The hours of the alarm time setting, mod 24. The ALMHR[0] is the LSB. W/R The minutes of the alarm time setting, mod 60. The ALMMIN[0] is the LSB. W/R The hours of the alarm time setting, mod 24. The ALMHR[0] is the LSB. W/R Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 31 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0x9C 0xA0 RTC 0xA4 0xA8 NAME DEFAULT and ACCESS DESCRIPTION 7 CLKSRC 0 W/R Set 0 for using the xtal oscillator; Set 1 for using the buck switch clock. 6 nWKALM 0 W/R Set 0 for enabling alarm against time match. Register 0x3C and 0x3D need to be set 0x80 and 0x08 previous to setting this bit. 5 x 0 x Not used. 4 x 0 x Not used. 3 x 0 x Not used. 2 x 0 x Not used. 1 x 0 x Not used. 0 x 0 x Not used. 7 x x x Not used. 6 RCL 0 W/R Set 1 to load RTC with the data stored in all setting registers by its 0 to 1 transition. 5 RAAI 0 W/R Set 1 for enabling RTC alarm. Register 0x3C and 0x3D need to be set 0x80 and 0x08 previous to setting this bit. 4 RDAI 0 W/R Set 1 for interrupt assertion for 1s when day count changes. 3 RHAI 0 W/R Set 1 for interrupt assertion for 1s when hours count changes. 2 RMAI 0 W/R Set 1 for interrupt assertion for 1s when minute count changes. 1 RSAI 0 W/R Set 1 for interrupt assertion for 0.5s when second count changes. 0 RTCEN 0 W/R Set 1 to enable the RTC, set 0 to disable the RTC. This bit is cleared to 0 when the RTC power losses. 7 x x x Not used. 6 x x x Not used. 5 SETSEC[5] 0 W/R 4 SETSEC[4] 0 W/R 3 SETSEC[3] 0 W/R 2 SETSEC[2] 0 W/R 1 SETSEC[1] 0 W/R 0 SETSEC[0] 0 W/R 7 x x x Not used. 6 x x x Not used. 5 SETMIN[5] 0 W/R 4 SETMIN[4] 0 W/R 3 SETMIN[3] 0 W/R 2 SETMIN[2] 0 W/R 1 SETMIN[1] 0 W/R 0 SETMIN[0] 0 W/R Setting register for seconds. Store the seconds into this register firstly, then set the RCL[ ] to 1 to load the RTC. Setting register for minutes. Store the minutes into this register firstly, then set the RCL[ ] to 1 to load the RTC. Note: W/R: Write and read accessible. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 32 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xAC 0xB0 RTC 0xB1 0xB4 NAME DEFAULT and ACCESS DESCRIPTION Not used. 7 x x 6 x x 5 x x 4 SETHR[4] 0 3 SETHR[3] 0 2 SETHR[2] 0 1 SETHR[1] 0 0 SETHR[0] 0 7 SETDAY[7] 0 6 SETDAY[6] 0 5 SETDAY[5] 0 4 SETDAY[4] 0 3 SETDAY[3] 0 2 SETDAY[2] 0 1 SETDAY[1] 0 0 SETDAY[0] 0 7 SETDAY[15] 0 6 SETDAY[14] 0 5 SETDAY[13] 0 4 SETDAY[12] 0 3 SETDAY[11] 0 2 SETDAY[10] 0 1 SETDAY[9] 0 0 SETDAY[8] 0 7 x x x Not used. 6 x x x Not used. 5 x x x Not used. 4 ALMINT 0 W/R Interrupt flag. Read 1 if timing alarm asserted. Write 0 to clear. 3 DAYINT 0 W/R Interrupt flag. Read 1 if timing alarm asserted. Write 0 to clear. 2 HRINT 0 W/R Interrupt flag. Read 1 if timing alarm asserted. Write 0 to clear. 1 MININT 0 W/R Interrupt flag. Read 1 if timing alarm asserted. Write 0 to clear. 0 SECINT 0 W/R Interrupt flag. Read 1 if every second alarm asserted, Write 0 to clear. x Setting register for hours. Store the hours into this register firstly, then set the RCL[ ] to 1 to load the RTC. W/R Setting register for the elapsed days. Store the lower byte of days into this register firstly, then set the RCL[ ] to 1 to load the RTC. The SETDAY[0] is the LSB of the days word. W/R Setting register for the elapsed days. Store the upper byte of days into this register firstly, then set the RCL[ ] to 1 to load the RTC. The SETDAY[15] is the MSB of the days word. W/R Note: W/R: Write and read accessible. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 33 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xC8 BBU 0xC9 0xCA CHG 0xD0 NAME DEFAULT and ACCESS DESCRIPTION 7 x 0 W/R For internal use only. 6 x 0 W/R For internal use only. 5 VSETBB[5] 1 4 VSETBB[4] 1 3 VSETBB[3] 0 2 VSETBB[2] 1 1 VSETBB[1] 0 0 VSETBB[0] 1 7 ONBB 1 W/R Set 1 enable, set 0 disable the back-up battery charger. 6 ONRTC 1 W/R Set 1 enable the always-on LDO, which powers the RTC block. Set 0 disable the always-on LDO for saving power when not used. 5 RFU 0 4 UNLOCKBB 0 3 SCRATCH[3] x 2 SCRATCH[2] x 1 SCRATCH[1] x 0 SCRATCH[0] x 7 x 0 W/R For internal use only. 6 x 0 W/R For internal use only. 5 VSETRTC[5] 1 4 VSETRTC[4] 0 3 VSETRTC[3] 0 2 VSETRTC[2] 1 1 VSETRTC[1] 0 0 VSETRTC[0] 0 7 VSET[3] 0 6 VSET[2] 1 5 VSET[1] 0 4 VSET[0] 1 3 ISET[3] 0 2 ISET[2] 1 1 ISET[1] 0 0 ISET[0] 0 Voltage setting for back-up battery charger, default 2.7V. This byte only could be written when the UNLOCBB is set to 1. Refer to the table of VBBAT VOLTAGE SETTINGS for details. W/R WE/R Reserved for future use. W/R Set 1 to allow change the back-up battery charger output voltage. 4 bits register for the equipment system to use. Data in those bits are kept until both the main battery and back-up battery loses. W/R Always-on LDO output voltage setting, default is 1.8V. Refer to the STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING table for details. W/R W/R W/R Battery regulation voltage setting for the voltage output in the topoff state. The ENVISET[ ] has to be set to 1 for changing these bits. Refer to the table of CHARGER VOLTAGE SETTING for details. Fast charge current setting for the maximum current for fast charge. The ENVISET[ ] has to be set to1 for changing these bits. Refer to the table of FAST CHARGING CURRENT SETTING for details. Note: W/R: Write and read accessible. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 34 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xD1 DEFAULT and ACCESS DESCRIPTION 7 SUSCHG 0 W/R Set 1 to force the charger into suspend state. Set 0 to allow charging. 6 ENVISET 0 W/R Set 1 to enable the changes to charger voltage and current settings. 5 TOTTIMO[1] 0 W/R Entire cycle safe timer time-out setting. [1:0]=00 for 180 minutes, 01 for 240 minutes, 10 for 300 minutes and 11 for no time-out. 4 TOTTIMO[0] 0 W/R Entire cycle safe timer time-out setting. [1:0]=00 for 180 minutes, 01 for 240 minutes, 10 for 300 minutes and 11 for no time-out. 3 PRETIMO[1] 0 W/R Pre-condition safe timer time-out setting. [1:0]=00 for 40 minutes, 01 for 60 minutes, 10 for 80 minutes and 11 for no time-out. 2 PRETIMO[0] 0 W/R Pre-condition safe timer time-out setting. [1:0]=00 for 40 minutes, 01 for 60 minutes, 10 for 80 minutes and 11 for no time-out. 1 OVPSET[1] 1 W/R Over-voltage thresholds setting, [1:0]=00 for 6.3V, 01 for 6.5V, 10 for 6.7V and 11 for 6.9V. 0 OVPSET[0] 0 W/R Over-voltage thresholds setting, [1:0]=00 for 6.3V, 01 for 6.5V, 10 for 6.7V and 11 for 6.9V. 0 Charge Time-out Interrupt Flag/Mask. Write this bit with TIMR_PRE[ ] and/or TIMR_TOT[ ] to 1 to allow interrupt when charge safety timers expire. Read this bit to get charge time-out interrupt status, read back W/R value is 1 when interrupt is generated and it is automatically cleared to 0 upon reading, read back value is 0 when no interrupt is generated. Also see TIMR_DAT[ ], TIMR_PRE[ ] and TIMR_TOT[ ]. 0 Battery Temperature or Battery Installation Detection Interrupt Flag/ Mask. Write this bit with TEMP_POS[ ] (BATT_POS[ ]) or/and TEMP_NEG[ ] (BATT_NEG[ ]) to 1 to allow interrupt when a battery temperature event occurs or a battery installation event occurs. Read W/R this bit to get the battery temperature or battery installation detection Interrupt status, read back value is 1 when interrupt is generated and it is automatically cleared to 0 upon reading, read back value is 0 when no interrupt is generated. Also see TEMP_DAT[ ], BATT_DAT[ ], TEMP_POS[ ], TEMP_NEG[ ], BATT_POS[ ] and BATT_NEG[ ]. 0 Input Voltage Interrupt Flag/Mask. Write this bit with INPUT_POS[ ] or/ and INPUT_NEG[ ] to 1 to allow interrupt when CHGIN UVLO or OVP condition occurs. Read this bit to get input voltage interrupt status, read W/R back value is 1 when interrupt is generated and it is automatically cleared to 0 upon reading, read back value is 0 when no interrupt is generated. Also see INPUT_DAT[ ], INPUT_POS[ ] and INPUT_NEG[ ]. Charge State Interrupt Flag/Mask. Write this bit with CHG_POS[ ] or/and CHG_NEG[ ] to 1 to allow interrupt when the state machine gets in or out of EOC state. Read this bit to get the EOC state interrupt status, read W/R back value is 1 when interrupt is generated and it is automatically cleared to 0 upon reading, read back value is 0 when no interrupt is generated. Also see CHG_DAT[ ], CHG_POS[ ] and CHG_NEG[ ]. 7 6 CHG NAME 5 TIMR_STAT TEMP_STAT or BATT_STAT INPUT_STAT 0xD8 4 CHG_STAT 0 3 TIMR_DAT 0 R Charge Timer Status. Value is 1 when precondition time-out or total charge time-out occurs. Value is 0 in other cases. 2 TEMP_DAT or BATT_DAT 0 R Temperature or Battery Installation Status. Value is 1 when battery temperature is inside of valid range or battery installation is detected. Value is 0 in other cases. 1 INPUT_DAT 0 R Input Voltage Detection Status. Value is 1 when CHGIN voltage is valid, value is 0 when CHGIN voltage is not valid. The valid range is VUVLO<VCHGIN<VOVP. 0 CHG_DAT 0 R Charge State Machine Status. Value is 1 when the charger state machine is in EOC state. Value is 0 in other cases. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 35 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT NAME DEFAULT and ACCESS W/R Pre-charge Time-out Interrupt Mask. Set both this bit and TIMR_STAT[ ] to 1 to allow interrupt when a Pre-charge time-out event occurs. 0 W/R Battery Temperature or Battery Installation Detection Interrupt Mask. Write this bit with TEMP_STAT[ ] (BATT_STAT[ ]) to 1 to allow interrupt when the main battery temperature goes into the valid range or when the main battery is being installed. INPUT_POS 0 W/R Input Voltage Interrupt Mask. Write this bit with INPUT_STAT[ ] to 1 to allow interrupt when CHGIN input voltage goes into the valid range. The valid range is VUVLO<VCHGIN<VOVP. 4 CHG_POS 0 W/R Charge State Interrupt Mask. Write this bit with CHG_STAT[ ] to 1 to allow interrupt when the state machine gets in the EOC state. 3 TIMR_TOT 0 W/R Total Charge Time-out Interrupt Mask. Set both this bit and TIMR_STAT[ ] to 1 to allow interrupt when a total charge time-out event occurs. 2 TEMP_NEG or BATT_NEG 0 W/R Battery Temperature or Battery Installation Detection Interrupt Mask. Write this bit with TEMP_STAT[ ] (BATT_STAT[ ]) to 1 to allow interrupt when the main battery temperature goes out of the valid range or when the main battery is being removed. 1 INPUT_NEG 0 W/R Input Voltage Interrupt Mask. Write this bit with INPUT_STAT[ ] to 1 to allow interrupt when CHGIN input voltage goes out of the valid range. The valid range is VUVLO<VCHGIN<VOVP. 0 CHG_NEG 0 W/R Charge State Interrupt Mask. Write this bit with CHG_STAT[ ] to 1 to allow interrupt when the state machine gets out of the EOC state. 7 RFU x WE/R Reserved for future use. 6 RFU x WE/R Reserved for future use. 5 CHGSTAT0 0 R 4 CHGSTAT1 0 R Charger Status. [1:0]=00, charger is off for forced suspend, timeout fault, battery temperature invalid, and operation in LDO mode; 01 is for in Sleep state; 10 is for in the Fast-Charge state, the Top-off state; 11 is for in the Pre-condition state. 3 RFU x R Reserved for future use. 2 x x x Not used. 1 x x x Not used. 0 x x x Not used. 7 TIMR_PRE 6 TEMP_POS or BATT_POS 5 0 0xD9 CHG 0xDA DESCRIPTION Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 36 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xF0 TSC ADC 0xF1 NAME DEFAULT and ACCESS DESCRIPTION 7 nEN 1 W/R Set bit to 0 to enable the TSC ADC block, set bit to 1 to disable it. 6 SINGLE 0 W/R Set bit to 1 for one channel only acquisition, set bit to 0 for multichannel scanning. 5 CHANNEL[2] 0 4 CHANNEL[1] 0 W/R 3 CHANNEL[0] 0 Specify which channel to measure for one channel only acquisition. Channel[2:0]=0 for X-coordinate position, 1 for Y-coordinate position, 2 for Z-coordinate position 1, 3 for Z-coordinate position 2, 4 for AUX0, 5 for AUX1, 6 for AUX2 and 7 for AUX3. W/R Set bit to 1 for scanning channel 0 to channel 3, set bit to 0 for not scanning. Refer to the REGISTER AND BIT DESCRIPTIONS section for CHANNEL[2], CHANNEL[1] and CHANNEL[0] for channel coding. 2 CH03 0 1 CH47 0 W/R Set bit to 1 for scanning channel 4 to channel 7, set bit to 0 for not scanning. Refer to the REGISTER AND BIT DESCRIPTIONS section descriptions for CHANNEL[2], CHANNEL[1] and CHANNEL[0] for channel coding. 0 ACQ 0 W/R Write and read for different functions. Set bit from 0 to 1 initializes an acquisition procedure designated by the SINGLE, CHANNEL[2:0] or CH03, CH47. 7 CLEN 0 W/R Data Length of Conversion. Set bit to 0 for 12 bits, set bit to 1 for 8 bits. 6 PENWKEN 0 W/R Pen Entry Wake-up Enable. Set bit to 1 to allow waking-up against pen entry. 5 PENSTAT R R Pen Touch Detection Instant Status. Read back value is 1 for in touching, read back value is 0 for no touching. 4 PENIRQ R R Pen Touch Detection Interrupt Status. Read back value is 1 when a pen touch interrupt is generated and it is automatically cleared to 0 upon reading. Read back value is 0 when no interrupt is generated. R Data Ready Interrupt Status. Read back value is 1 when the data ready interrupt is generated and it is automatically cleared to 0 upon reading. Read back value is 0 when no interrupt generated. To start a new conversion, this bit must be cleared to 0. 3 DATARDY R 2 nAUTO 1 W/R Acquisition Starting Mode Setting. Set bit to 1 for starting acquisition by when the ACQ bit is set 1. Set bit to 0 for automatic starting by when pen touch is detected. The interrupt asserts only when the acquisition completes and the data is ready. 1 PENMASK 0 W/R Write or read for different functions. Pen Touch Interrupt Mask. Set bit to 1 to mask the pen touch detection interrupt, set bit to 0 to allow pen touch detection interrupt. 0 DATAMASK 0 W/R Write or read for different functions. Data Ready Interrupt Mask. Set bit to 1 to mask the data ready interrupt, set bit to 0 to allow data ready interrupt. Note: W/R: Write and read accessible. R: Read accessible, writing to the bit does not make change to the volume. WE/R: Write and read accessible, write exact what it is before to avoid unexpected behavior. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 37 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xE0 0xE1 NAME DEFAULT and ACCESS 7 XPOS[11] 0 6 XPOS[10] 0 5 XPOS[9] 0 4 XPOS[8] 0 3 XPOS[7] 0 2 XPOS[6] 0 1 XPOS[5] 0 0 XPOS[4] 0 7 XPOS[3] 0 6 XPOS[2] 0 5 XPOS[1] 0 4 XPOS[0] 0 X-coordinate position. [11] is the MSB. Force drive voltage and full range input is same as internal 2.5V reference voltage. R X-coordinate position. [0] is the LSB. R Not used. Data reading in those bits is not certain. 3 2 x x 7 YPOS[11] 0 6 YPOS[10] 0 5 YPOS[9] 0 4 YPOS[8] 0 3 YPOS[7] 0 2 YPOS[6] 0 1 YPOS[5] 0 0 YPOS[4] 0 7 YPOS[3] 0 6 YPOS[2] 0 5 YPOS[1] 0 4 YPOS[0] 0 1 DESCRIPTION x 0 TSC ADC 0xE2 0xE3 Y-coordinate position. [11] is the MSB. Force drive voltage and full range input is same as internal 2.5V reference voltage. R Y-coordinate position. [0] is the LSB. R Not used. Data reading in those bits is not certain. 3 2 1 x x x 0 Note: R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 38 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xE4 0xE5 NAME DEFAULT and ACCESS 7 Z1POS[11] 0 6 Z1POS[10] 0 5 Z1POS[9] 0 4 Z1POS[8] 0 3 Z1POS[7] 0 2 Z1POS[6] 0 1 Z1POS[5] 0 0 Z1POS[4] 0 7 Z1POS[3] 0 6 Z1POS[2] 0 5 Z1POS[1] 0 4 Z1POS[0] 0 Z-coordinate position 1. [11] is the MSB. Force drive voltage and full range input is same as internal 2.5V reference voltage. R Z-coordinate position 1. [0] is the MSB. R Not used. Data reading in those bits is not certain. 3 2 x x 7 Z2POS[11] 0 6 Z2POS[10] 0 5 Z2POS[9] 0 4 Z2POS[8] 0 3 Z2POS[7] 0 2 Z2POS[6] 0 1 Z2POS[5] 0 0 Z2POS[4] 0 7 Z2POS[3] 0 6 Z2POS[2] 0 5 Z2POS[1] 0 4 Z2POS[0] 0 1 DESCRIPTION x 0 TSC ADC 0xE6 0xE7 Z-coordinate position 2. [11] is the MSB. Force drive voltage and full range input is same as internal 2.5V reference voltage. R Z-coordinate position 2. [0] is the MSB. R Not used. Data reading in those bits is not certain. 3 2 1 x x x 0 Note: R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 39 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xE8 0xE9 NAME DEFAULT and ACCESS 7 AXU0[11] 0 6 AXU0[10] 0 5 AXU0[9] 0 4 AXU0[8] 0 3 AXU0[7] 0 2 AXU0[6] 0 1 AXU0[5] 0 0 AXU0[4] 0 7 AXU0[3] 0 6 AXU0[2] 0 5 AXU0[1] 0 4 AXU0[0] 0 AXU0 data acquisition. [11] is the MSB. Full input range is the same as internal reference voltage 2.5V. R AXU0 data acquisition. [0] is the LSB. R Not used. Data reading in those bits is not certain. 3 2 x x 7 AXU1[11] 0 6 AXU1[10] 0 5 AXU1[9] 0 4 AXU1[8] 0 3 AXU1[7] 0 2 AXU1[6] 0 1 AXU1[5] 0 0 AXU1[4] 0 7 AXU1[3] 0 6 AXU1[2] 0 5 AXU1[1] 0 4 AXU1[0] 0 1 DESCRIPTION x 0 TSC ADC 0xEA 0xEB AXU1 data acquisition. [11] is the MSB. Full input range is the same as internal reference voltage 2.5V. R AXU1 data acquisition. [0] is the LSB. R Not used. Data reading in those bits is not certain. 3 2 1 x x x 0 Note: R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 40 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REGISTER AND BIT DESCRIPTIONS CONT’D BLOCK ADDRESS and BIT 0xEC 0xED NAME DEFAULT and ACCESS 7 AXU2[11] 0 6 AXU2[10] 0 5 AXU2[9] 0 4 AXU2[8] 0 3 AXU2[7] 0 2 AXU2[6] 0 1 AXU2[5] 0 0 AXU2[4] 0 7 AXU2[3] 0 6 AXU2[2] 0 5 AXU2[1] 0 4 AXU2[0] 0 AXU2 data acquisition. [11] is the MSB. Full input range is the same as internal reference voltage 2.5V. R AXU2 data acquisition. [0] is the LSB. R Not used. Data reading in those bits is not certain. 3 2 x x 7 AXU3[11] 0 6 AXU3[10] 0 5 AXU3[9] 0 4 AXU3[8] 0 3 AXU3[7] 0 2 AXU3[6] 0 1 AXU3[5] 0 0 AXU3[4] 0 7 AXU3[3] 0 6 AXU3[2] 0 5 AXU3[1] 0 4 AXU3[0] 0 1 DESCRIPTION x 0 TSC ADC 0xEE 0xEF AXU3 data acquisition. [11] is the MSB. Full input range is the same as internal reference voltage 2.5V. R AXU3 data acquisition. [0] is the LSB. R Not used. Data reading in those bits is not certain. 3 2 1 x x x 0 Note: R: Read accessible, writing to the bit does not make change to the volume. X is uncertain volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 41 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 INTERRUPT DESCRIPTIONS BLOCK SITUATION SYS VVSYS<VSYSLEV SYS "Enable Key" press assertion SYS HFPWR assertion SYS HFPWR assertion REG1 OUT1 fault REG2 OUT2 fault in buck operation REG2 OUT2 fault in linear operation REG3 OUT3 fault REG4 OUT4 fault REG5 OUT5 fault REG6 OUT6 fault REG7 OUT7 fault REG8 OUT8 fault REG9 OUT9 fault REG10 OUT10 fault REG11 OUT11 fault REG12 OUT12 fault REG13 OUT13 fault CONFIGURATION IDENTIFICATION nSYSMODE nSYSLVMSK nSYSSTAT 1 1 1 STA POSA STA DATAA* 1 1 1 1 STB POSB STB DATAB* 1 1 1 1 STB NEGB STB DATAB* 1 1 1 1 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 nFLTMSK OK* 1 0 Note: *: Instant state output, the reading is the volume by the time of reading. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 42 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 INTERRUPT DESCRIPTIONS BLOCK SITUATION CONFIGURATION IDENTIFICATION RAAI ALMINT 1 1 RDAI DAYINT 1 1 RHAI HRINT 1 1 RMAI MININT 1 1 RSAI SECINT 1 1 RTC Alarm assertion RTC Day counts changes RTC Hour counts changes RTC Minute counts changes RTC Second counts changes CHG Pre-condition safety timer timeout TIMR_STAT 1 1 1 1 1 CHG Total charge safety timer timeout nFLTMSK TIMR_TOT TIMR_TOT TIMR_STAT TIMR_DAT 1 1 1 1 1 CHG Battery thermal condition becomes valid, for the respective option only. TEMP_STAT TEMP_POS TEMP_POS TEMP_STAT TEMP_DAT* 1 1 1 1 1 CHG Battery thermal condition beTEMP_STAT comes invalid, for the respective 1 option only. TEMP_NEG TEMP_NEG TEMP_STAT TEMP_DAT* 1 1 1 1 CHG Battery installation detected, for the respective option only. BATT_STAT BATT_POS BATT_POS BATT_STAT BATT_DAT* 1 1 1 1 1 CHG Battery installation not detected, for the respective option only. BATT_STAT BATT_NEG BATT_NEG BATT_STAT BATT_DAT* 1 1 1 1 0 CHG ACIN input valid INPUT_STAT INPUT_POS 1 1 CHG ACIN input not valid INPUT_STAT INPUT_NEG 1 1 1 1 0 CHG Charge state jumps into the end of charge sleep state. CHG_STAT CHG_POS CHG_POS CHG_STAT CHG_DAT* 1 1 1 1 1 Charge state jumps out of the end of charge sleep state. CHG_STAT CHG_NEG CHG_NEG CHG_STAT CHG_DAT* 1 1 1 1 0 PENMASK nAUTO DATARDY PENIRQ PENSTAT* 0 1 1 1 1 ACQ PENMASK 0 0 DATAMASK DATARDY ACQ DATAMASK 0 1 0 0 CHG TSC ADC Pen touch detected TSC ADC TSC ADC conversion done TIMR_PRE TIMR_PRE TIMR_STAT TIMR_DAT INPUT_POS INPUT_STAT INPUT_DAT* 1 1 1 INPUT_NEG INPUT_STAT INPUT_DAT* Note: *: Instant state output, the reading is the volume by the time of reading. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 43 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 STEP-DOWN DC/DC AND LDO OUTPUT VOLTAGE SETTING (not apply to VBBAT) Unit: V REGx/VSET[5:3] REGx/VSET[2:0] 000 001 010 011 100 101 110 111 000 0.600 0.800 1.000 1.200 1.600 2.000 2.400 3.200 001 0.625 0.825 1.025 1.250 1.650 2.050 2.500 3.300 010 0.650 0.850 1.050 1.300 1.700 2.100 2.600 3.400 011 0.675 0.875 1.075 1.350 1.750 2.150 2.700 3.500 100 0.700 0.900 1.100 1.400 1.800 2.200 2.800 3.600 101 0.725 0.925 1.125 1.450 1.850 2.250 2.900 3.700 110 0.750 0.950 1.150 1.500 1.900 2.300 3.000 3.800 111 0.775 0.975 1.175 1.550 1.950 2.350 3.100 3.900 VBBAT OUTPUT VOLTAGE SETTING (with around 10μA load current) Unit: V VSET[5:3] VSET[2:0] 000 001 010 011 100 101 110 111 000 0.400 0.600 0.800 1.000 1.400 1.800 2.200 3.000 001 0.425 0.625 0.825 1.050 1.450 1.850 2.300 3.100 010 0.450 0.650 0.850 1.100 1.500 1.900 2.400 3.200 011 0.475 0.675 0.875 1.150 1.550 1.950 2.500 3.300 100 0.500 0.700 0.900 1.200 1.600 2.000 2.600 3.400 101 0.525 0.725 0.925 1.250 1.650 2.050 2.700 3.500 110 0.550 0.750 0.950 1.300 1.700 2.100 2.800 3.600 111 0.575 0.775 0.975 1.350 1.750 2.150 2.900 3.700 CHARGER VOLTAGE SETTING Unit: V VSET[3:0] 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 4.1 4.12 4.14 4.16 4.18 4.2 4.22 4.24 4.26 4.28 4.30 4.32 4.34 4.36 4.38 4.4 FAST CHARGE CURRENT SETTING Unit: mA ISET[3:0] 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 90 300 350 400 450 500 550 600 Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. 650 - 44 - 700 750 800 850 900 950 1000 www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 NON-LINEAR DUTY SETTING DUTY_[4:1], DUTY_[0] is ignored for its less change. [7:5] 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 000 0.0 0.1 0.1 0.2 0.2 0.3 0.3 0.4 0.4 0.5 0.5 0.6 0.6 0.7 0.7 0.8 001 0.8 0.9 0.9 1.0 1.0 1.0 1.1 1.1 1.2 1.2 1.3 1.3 1.4 1.4 1.5 1.5 010 1.6 1.7 1.8 1.9 2.0 2.1 2.2 2.3 2.4 2.5 2.6 2.7 2.8 2.9 3.0 3.1 011 3.2 3.4 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2 5.4 5.6 5.8 6.0 6.2 100 6.4 6.8 7.2 7.6 8.0 8.4 8.8 9.2 9.6 10 10 11 11 12 12 12 101 13 14 15 15 16 17 18 18 19 20 21 22 22 23 24 25 110 26 27 29 31 32 34 35 37 38 40 41 43 45 46 48 49 111 52 53 55 58 61 64 67 73 77 80 83 86 89 92 95 100 STEP-UP DC/DC VOLTAGE SETTING Unit: V VSET [7:4] VSET[3:0] 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 0000 0001 3.0 for all codes before 01000000. 0010 0011 0100 3.0 3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 3.9 4.0 4.1 4.2 4.3 4.4 4.5 0101 4.6 4.7 4.8 4.9 5.0 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 6.0 6.1 0110 6.2 6.3 6.4 6.5 6.5 6.7 6.8 6.9 7.0 7.1 7.2 7.3 7.4 7.5 7.6 7.7 0111 7.8 7.9 8.0 8.1 8.2 8.3 8.4 8.5 8.6 8.7 8.8 8.9 9.0 9.1 9.2 9.3 1000 9.4 9.5 9.6 9.7 9.8 9.9 10.0 10.1 10.2 10.3 10.4 10.5 10.6 10.7 10.8 10.9 1001 11.0 11.1 11.2 11.3 11.4 11.5 11.6 11.7 11.8 11.9 12.0 12.1 12.2 12.3 12.4 12.5 1010 12.6 12.8 13.0 13.2 13.4 13.6 13.8 14.0 14.2 14.4 14.6 14.8 15.0 15.2 15.4 15.6 1011 15.8 16.0 16.2 16.4 16.6 16.8 17.0 17.2 17.4 17.6 17.8 18.0 18.2 18.4 18.6 18.8 1100 19.0 19.4 19.8 20.2 20.6 21.0 21.6 21.8 22.2 22.6 23 23.4 23.8 24.2 24.6 25.0 1101 25.4 25.8 26.2 26.6 27.0 27.4 27.8 28.2 28.6 29.0 29.4 29.8 30.2 30.6 31 31.4 1110 31.8 32.2 32.6 33.0 33.4 33.8 34.2 34.6 35 35.4 35.8 36.2 36.6 37 37.4 37.8 1111 38.2 38.6 39.0 39.4 39.8 40.2 40.6 41.0 Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 45 - 41.4 for all codes after 11111000. www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 SYSTEM CONTROL ELECTRICAL CHARACTERISTICS (VVBAT = 3.6V, TA = 25°C, unless otherwise specified.) TEST CONDITIONS PARAMETER MIN TYP MAX Operation Range VVSYS 2.6 5.5 Operation Range VCHGIN 4.2 6 UVLO Threshold Voltage VVSYS Rising 2.4 UVLO Hysteresis VVSYS Falling 0.2 SYSLEV Programming Range VVSYS, for SYSLEV[3:0]=0000 to 1111, and VVBAT>VUVLO 0.1 SYSLEV Hysteresis VVSYS Rising 0.2 Voltage Reference TA = -40°C to +85°C 1.2 Voltage Reference Accuracy Reset Time-out 2.5 2.6 V LOWIQ[ ] = 0 -0.5 0.5 LOWIQ[ ] = 1 -1.5 1.5 TRST[ ] = 0 260 TRST[ ] = 1 65 Oscillator Frequency 1.8 IO Logic High Input 2 IO Leakage Current % ms 2.2 MHz 1.4 VVBAT=2.5V to 5.5V, TA = -40°C to 85°C. IO Logic Low Input UNIT HFPWR, PWRHLD, nIRQ, nRSTO, 0-5.5V applied. nPBSTAT V 0.4 -1 IO Output Low Sinking 10mA. Shutdown Current All circuit blocks off 12 No Load Current Deep sleep: REG2 in linear mode, the VBBAT and the VALIVE are on, the RTC is disabled, VVSYS=4.0V. 48 Thermal Shutdown Temperature Temperature rising 160 Thermal Shutdown Hysteresis Temperature falling 20 1 μA 0.3 V 18 μA °C Note: See the I2C INTERFACE ELECTRICAL CHARACTERISTICS for SCL and SDA specifications. See the TYPICAL PERFORMANCE CHARACTERISTICS for: The Reference Voltage Line Regulation. The Reference Voltage Temperature Coefficient. The Oscillator Frequency Line Voltage Pulling. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 46 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 STEP-DOWN DC/DC ELECTRICAL CHARACTERISTICS (VVP1 = VVP2 = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER CONDITIONS MIN Operating Voltage Range, VVP1, VVP2 2.7 UVLO, VVP1, VVP2 2.5 UVLO Hysteresis Maximum Load Current MAX 6 2.6 V mV 0.6 3.9 For output ≥1.2V -1 1 For output <1.2V -1.5 1.5 REG2 in LDO mode, LOWIQ[ ] = 0, IOUT = 10mA -1.5 1.5 The REG1 1.2 EVENT4[ ]=0, the REG2, buck mode 0.7 EVENT4[ ]=1, the REG2, linear mode 0.02 REG1 or REG2 in buck mode, IOUT = 10mA UNIT 2.7 100 Output Programming Range Output Voltage Accuracy TYP V % A Line Regulation VVPX = Max (VOUT +1V, 3.2V) to 5.5V 0.15 %/V Load Regulation Load = 10mA to full maximum load 1.7 %/mA 2 Turn-On Propagation Delay From the I C last bit latched or PWRHLD set 1 to output changes. 150 Soft Start Ramp Time, REG1 and REG2 buck mode. Time between 2 intersection points of the ramp slope and 2 voltages; 0% and 100% of the final, no and full load. 400 Switch Frequency Normal operation, is the system oscillator frequency. µs 1.8 2 REG1, Load = 200mA, VOUT1 = 1.2V 90 REG2, Load=200mA, VOUT2=1.8V 93 OK[ ] asserts 0 93 Switch Frequency Fold-back Switch Frequency folds-back to 1/4 of normal Voltage Threshold to Normal frequency. 25 No Load Current 65 Efficiency OK Threshold to Normal Ratio Shutdown Current 2.2 MHz % 1 µA Note: See the TYPICAL PERFORMANCE CHARACTERISTICS for: The REG1 Soft-Start from Last I2C Bit, Full Load. The REG1 Soft-Start from PWRHLD Set 1, No Load. The REG1 Step Transition Response, Full Load. The REG1 Efficiency Plot. The REG2 Efficiency Plot. The REG1 Load Transition Response. The REG2 Load Transition Response. The REG2 Buck mode to the Linear Mode Transition. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 47 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 STEP-UP DC/DC ELECTRICAL CHARACTERISTICS (VPOWER = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER CONDITIONS MIN Operating Voltage Range VVBAT 2.7 UVLO VVBAT 2.5 UVLO Hysteresis TYP MAX 6 2.6 Output Voltage Accuracy IOUT=10mA. Maximum Load Current VPOWER=4.2V, VOUT3=5V, Voltage regulation option. FB3 Feedback Voltage FB3 Input Current V 2.7 100 Output Programming Range UNIT mV 3 41.4 V -3 3 % 0.5 A Not available in voltage regulation mode, / mV contact Active-semi for more details. / nA 2 Turn-On Propagation Delay From the I C last bit latched or PWRHLD set 1 to output changes. Soft Start Ramp Time, voltage regulation option. Time between 2 intersection points of the ramp slope and 2 voltages; 0% and 100% of the final, no and full load. Switch Frequency Normal operation, is the system oscillator frequency. 150 µs 200 1.8 2 Minimum Off-Time 40 Minimum On-Time 75 Efficiency Voltage regulation option, VOUT3=5V, Load=200mA. Switch Current Limit OK Threshold to Normal Ratio OK[ ] asserts 0 No Load Current Switch in operation 2.2 90 MHz ns 90 % 0.75 A 93 % 1300 Switch stops 80 Shutdown Current µA 1 Note: The VPOWER is the voltage input that the Step-up DC/DC inductor connects to. See the TYPICAL PERFORMANCE CHARACTERISTICS for: The REG3 Start up Waveform, Full Load. The REG3 Step Transition Response, Full Load. The REG3 Efficiency Plot. The REG3 Load Transition Response. The REG3 External PWM Modulation to Current. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 48 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 LOW-NOISE LDO ELECTRICAL CHARACTERISTICS (VINL = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER Operating Voltage Range TEST CONDITIONS VINL MIN 6 0.6 3.9 TA = 25°C -1.5 +1.5 TA = -40°C to 85°C -2.5 +2.5 Output Voltage Accuracy LOWIQ[ ]=0 Line Regulation VINL = (VOUT + 0.5V) to 5.5V Load Regulation Load=1mA to maximum load current. COUT=1μF, At 1kHz, LOWIQ[ ]=Any Load=20mA, Power Supply Rejection Ratio VOUT=1.8V, REG5, LOWIQ[ ]=0 (PSRR) REG6, REG9, At 10kHz. REG10, REG11, LOWIQ[ ]=1 REG12,REG13 Current Limit UNIT V % 1 %/V 0.03 %/A -80 -70 dB -60 REG4, REG6, REG7, REG8 0.36 REG5, REG9, REG12 0.25 REG10, REG13 0.15 REG11 0.08 When 5% Voltage drop is seen from the normal output voltage. MAX 2.4 Output Programming Range Maximum Load Current TYP A REG4, REG6, REG7, REG8 0.41 0.68 REG5, REG9, REG12 0.28 0.47 REG10, REG13 0.17 0.28 REG11 0.09 0.15 A 0.22 Dropout Voltage Set load current to 1/4 of max output current; Ramp down input supply until VOUT=VSET - 100mV. 140 mV Output Noise REG5, REG6, REG9, REG10, REG11, REG12, REG13, COUT=1μF, Load=20mA, VOUT=1.8V, LOWIQ[ ]=0 30 µVRMS Turn-On Propagation Delay From the I2C last bit latched or PWRHLD, ON6 or ON9 set 1 to output changes. 150 Soft-Start Ramp Time Time between 2 intersection points of the ramp slope and 2 voltages; 0% and 100% of the final, no and full load. μs 30 150 OK Threshold to Normal Ratio OK[ ] asserts 0 89 Current Limit Fold-Back Ratio Ratio to the current limit, when output short circuit. 45 Discharge Resistance LDO Disabled, DIS[ ] = 1 1.5 Stable COUT Range kΩ REG4, REG6, REG7, REG8 3.3 20 REG5, REG9, REG12 2.2 20 REG10, REG13 1.5 20 1 20 REG11 No Load Current % LOWIQ[ ]=0 22 LOWIQ[ ]=1 15 Shutdown Current μF μA 1 Note: See the TYPICAL PERFORMANCE CHARACTERISTICS for: The REG4 Start up Waveform, No Load; The REG4 Start up Waveform, Full Load; The REG4 voltage step transition response; The REG4 Load Transition Response. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 49 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 SINGLE-CELL LI+ CHARGER ELECTRICAL CHARACTERISTICS (VCHGIN = 5V, TA = 25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CHARGE INPUT 0 7 4.2 6.0 Input Voltage Range Nominal condition VCHGIN Valid for Charging Input Voltage Range VCHGIN CHGIN OVP Threshold VCHGIN rising, OVPSET[1:0] = 00 6.3 CHGIN OVP Threshold Adjustment Step LSB weight for threshold adjustment, OVPSET[1:0] from 00 to 11 stepping up. 200 CHGIN OVP Threshold Hysteresis VCHGIN falling 200 CHGIN UVLO Threshold VCHGIN rising CHGIN UVLO Hysteresis VCHGIN falling Logic Low Input Level Logic High Input Level CHGIN Supply Current 3.8 4.0 mV 4.2 500 For ACIN and CHGLEV. V V mV 0.4 1.4 V VCHGIN < VUVLO 50 100 Suspended, SUSCHG[ ]=1. 200 300 End of charge sleep, CHG_DAT reads 1. 800 1200 4.179 4.2 4.221 V 19.5 20 20.5 mV µA CHARGE REGULATION Battery Regulation Voltage Adjustment Resolution For top-off, floatVSET[3:0]=0101 ing or LDO mode operation; No load Weight of the LSB, at VBAT. VSET[3:0]=0000 to 1111 Line Regulation VCHGIN =4.5V to 5.5V, IBAT=10mA Load Regulation IBAT=100mA to 1000mA Battery Regulation Voltage Fast Charge Current Fast Charge Current Adjustment Resolution Precondition Charge Current, ratio to fast charge current. 0.1 %/V 0.001 0.001 0.001 %/mA CHGLEV=0 and ACIN=0, or ISET[3:0]=0000 75 90 105 mA CHGLEV=1 and ACIN=0, or ISET[3:0]=0100 0.4 0.45 0.5 ACIN=1, ISET[3:0]=1111 0.9 1 1.1 A Change per adjacent code stepping for ISET [3:0] =0001 to 1111, from 0.3A to 1A. ISET[3:0]=0001 to 1111 50 8 ISET[3:0]=0000 10 mA 12 45 Precondition Threshold VVBAT rising. 2.75 Precondition Threshold Hysteresis VVBAT falling. End of Charge Residual Ratio Ratio to the fast charge current Charge Restart Drop Thermal Regulation Action RangeNOTE 2.85 % mA 3 150 V mV 8 10 12 % Drop of the battery regulation voltage, falling. 180 220 264 mV Thermal regulation starts to current cut temperature range, at the sensor junction. 90 140 ˚C Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 50 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 SINGLE-CELL LI+ CHARGER ELECTRICAL CHARACTERISTICS CONT’D (VCHGIN = 5V, TA = 25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT On-Resistance Path resistance from CHGIN to VBAT, in fully on state. Reverse Blocking Put-in Threshold VCHGIN to VVBAT difference on the closed blocking switch decreasing going. 28 32 42 Reverse Blocking Put-out Threshold VCHGIN to VVBAT difference on the blocked switch increasing going. 80 93 113 VBAT Reverse Leakage VCHGIN <VUVLO or Charging suspended, SUSCHG [ ]=1. 0.5 Ω mV 8 µA CHARGE TIMING Precondition Safe Timer Timeout Programming Range PRETIMO[1:0]=00 to 10 (11 for no timeout) 60 120 Total charge Time-out Period Programming Range TOTTIMO[1:0]=00 to 10 (11 for no timeout). 180 360 State Transition Delay Time The time of a new state conditions to be qualified. min 32 ms CONDITIONING AND INDICATION DRIVING Battery Installation Trap Level Voltage at BATID; Level for installation detected. No Battery Installation Level Voltage at BATID; Level for no installation detected. Cell Hot Trap Divider Ratio Cell Cold Trap Divider Ratio 2 0.349 Dividing of VCHGIN. Decreasing trip for hot trap, increasing trip for cold trap. 0.748 Hot/Cold Trap Reverse Trips Hysteresis nSTAT Sinking Current VnSTAT=1V to 6V. Input Leakage Applying 0V to 5V on the BATID, the TH, the nSTAT. V 2.5 -1 30 mV 8 mA 1 μA Note: The thermal regulation action range is characterized at small current situation, is guaranteed by design verification, characterization and production process control. See the TYPICAL PERFORMANCE CHARACTERISTICS for: The Charge Current to Battery Voltage, at 5V Input. The Charge Current to Battery Voltage, at 6V Input. The Charge Current to Ambient Temperature, 6V Input. The Charger Load Transition Response, LDO Mode. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 51 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 BACK-UP BATTERY CHARGER ELECTRICAL CHARACTERISTICS (VVBAT = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 2.5V or VVBBAT+1.2 5.5 0.4 3.7 2.552 2.795 V 200 mV Charge Valid Voltage Range VBBCIN Regulation Voltage Range Programmable by setting VSETBB[3:0] Output Voltage Accuracy ILOAD=10μA. Load Regulation Drop Per Decade Change of Current ILOAD=1mA 150 Dropout Voltage ILOAD=1mA, 100mV more drop from the output voltage at the input voltage is 1.2V above the output. 1.18 V 5 mA Maximum Charge Current No Load Operation Current 10 Stable COUT For ILOAD~5mA Reverse Blocking Leakage Current flows out off the BBCIN pin at VVBBAT=3.6V, VBBCIN=0V to 2V. 1 Output Short Circuit Current V µA µF 10 nA 100 mA Note: See the TYPICAL PERFORMANCE CHARACTERISTICS for: The Backup Battery Charge Current to Input Voltage. ALWAYS-ON LOW POWER LDO ELECTRICAL CHARACTERISTICS (VVBAT = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 1.8V or VVALIVE+0.5 5.5 Operation Voltage Range VBBCIN or VVBBAT Regulation Voltage Range Programmable by setting VSETRTC[3:0]. 0.6 3.9 Output Voltage Accuracy Include load regulation and line input regulation. -3.5 2.5 Dropout Voltage IOUT=5mA, VOUT=3.1V, 100mV more drop from the output voltage at the input voltage is 1V above the output. Maximum Output Current No Load Operation Current Stable COUT Reverse Blocking Leakage 150 7 25 RTCEN[ ]=0 For ILOAD~5mA 1 For ILOAD~20mA 2.2 VVBBAT=3.6V, VBBCIN=0V to 2V. Output Short Circuit Current Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. % mV 50 mA 7 µA µF 4 µA 100 - 52 - V mA www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REAL TIME CLOCK ELECTRICAL CHARACTERISTICS (VVBAT = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER Minimum Sustainable Supply TEST CONDITIONS MIN TYP Crystal type: MC-146;TXC 9H03200010; AB38T. 1.2 Oscillation Starting Supply 1.4 Maximum Supply Voltage V 3.6 Maintaining Operation Current No alarm enabled. Shutdown Current Disabled. CLK32K Output Duty Test with 5kΩ pull-up to 1.8V. CLK32K Cycle to Cycle Jitter Falling edge to falling edge, evaluated for 100ms. OC Output Low 10mA sinking. 5 µA 10 100 nA 90 % ns 0.3 Maximum OC Pull-up Voltage OC Pin Capacitance MAX UNIT 5.5 OC output off, the board and stripe parasitic removed. 2 V pF OPEN-DRAIN DRIVER ELECTRICAL CHARACTERISTICS (VVBAT = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER Current Adjustment Weight Output Current Range TEST CONDITIONS Load Regulation 0.4 ISCALE_[1:0]=01 0.8 ISCALE_[1:0]=10 1.2 ISCALE_[1:0]=11 1.6 Programmable by setting ISET_[5:0]=000000 to 111111 ISCALE_[1:0] =01, ISET_[5:0] =100000 for 25.6mA. Output Low Voltage Leakage Current TYP MAX UNIT ISCALE_[1:0]=00 Absolute Current Error Chanel to Chanel Mismatch MIN Sinks from 1V source 0 100.8 -2.5 2.5 ODO1, ODO2 and ODO3, current change for sinking from 1V to sinking from 2.5V; ODO1 also from 2V to from 5V. 0.5 2.5 0.2 0.3 0.2 0.3 Feed in with 5mA from external source. 0.35 ODO1, sinking from 40V source. 5 ODO2, ODO3, sinking from 5.5V source. 1 Internal PWM Frequency 244 PWM Duty Adjustment Linear adjustment option, non-linear adjustment option. Chanel to Chanel Delay BUFFER[ ]=1 (if set 0, the delay is 1/4 of the PWM cycle). 1 ODO2, ODO3 40 ODO1 15 Current-On Slew Rate mA/bit Over-eating TemperatureNOTE 0 ISET_[5:0]=000001 Shutdown Current ISET_[5:0]=000000 mA V µA Hz 100 ms mA/µs 135 Operation Current mA °C 27 1 µA Note: Guaranteed by design verification, characterization and production process control. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 53 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TSC ADC ELECTRICAL CHARACTERISTICS (VVBAT = VVD = 3.6V, TA = 25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS MIN TYP 2.9 5.5 Operation Voltage Range VVD Reference Voltage (VREF) TA = -40°C to +85°C 2.5 Maximum Available Resolution CLEN=0 12 Full Scale Dynamic Range at Input (FSDRNOTE1) XPOS, YPOS, XNEG, YNEG, AUX0, AUX1, AUX2. VREF AUX3 6.024 Absolute DC Conversion Error AUX3, measured with VVBAT=3.9V. -21 TSC Conversion Time CLEN=0(for 12 bits resolution), Switch frequency (Counts of internal clock cycles 2MHz. of the device) INLNOTE2 DNLNOTE2 OffsetNOTE2 Gain ErrorNOTE2 Effective Numbers of BitsNOTE2 MAX UNIT bits V 21 225 The standard deviation plus the 1st movement of the worst. INL and DNL are from DC sweep histogram analysis; Offset and Gain Error are from least square linear approximation, from data of input in 10% to 90% FSDR; Effective Numbers of Bits is the worst FWHMNOTE3 of reading a DC volume in same range. Test on channel 0 to channel 6 only, 12 bits conversion. V mV μs -4 5 -1 1 8 LSB 1.5 bit Input Impedance 11 MΩ Input capacitance 32 pF Input leakage Current Touch Detection Trap Thresholds Voltage at the XPOS when pen touch trapped. Force Current At force driving voltage drop 5%. Force Switch On-Impedance Conversion Operation Current 0.1 μA 1 V 17 mA 4 Ω 210 Shutdown Current 1 μA NOTE1: DC Full Scale Dynamic Range at input. NOTE2: Guaranted by design verfication, characterization and production process control. NOTE3: Full Width of Half Magnititude. See The TYPICAL PERFORMANCE CHARACTERISTICS for: The DC Sweep Histogram DNL Note: Guaranteed by design verification, characterization and production process control. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 54 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TYPICAL PERFORMANCE CHARACTERISTICS (VVSYS = 3.6V, TA = 25°C, unless otherwise specified.) The waveform captures and the plots: 1. The Reference Voltage Line Regulation. 2. The Reference Voltage Temperature Coefficient. 3. The Oscillator Frequency Line Voltage Pulling. 4. The Oscillator Frequency Temperature Pulling. 5. The REG1 Soft-Start from Last I2C Bit, Full Load. 6. The REG1 Soft-Start from PWRHLD Set 1, No Load. 7. The REG1 Step Transition Response, Full Load. 8. The REG1 Efficiency Plot. 9. The REG2 Efficiency Plot. 10. The REG1 Load Transition Response. 11. The REG2 Load Transition Response. 12. The REG2 Buck mode to the Linear Mode Transition. 13. The REG3 Start up Waveform, Full Load. 14. The REG3 Step Transition Response, Full Load. 15. The REG3 Efficiency Plot. 16. The REG3 Load Transition Response. 17. The REG3 External PWM to Current Output. 18. The REG4 Start up Waveform, No Load. 19. The REG4 Start up Waveform, Full Load; 20. The REG4 voltage step transition response. 21. The REG4 Load Transition Response. 22. The Charge Current vs. VVBAT, VCHGIN=5V. 23. The Charge Current vs. VVBAT, VCHGIN=6V. 24. The Charge Current vs. Ambient Temperature, 6V input. 25. The Charger Load Transition Response , LDO Mode. 26. The Backup Battery Charge Current vs. VVSYS 27. The DC Sweep Histogram DNL 28. The DC input Effective Numbers of Bits. 2. The Reference Voltage Temperature Coefficient VREF (V) 1.25 1.24 1.23 1.22 1.21 1.20 1.19 1.18 1.17 1.16 1.15 2.5 3 3.5 4 4.5 5 5.5 ACT5880-002 ACT5880-001 VREF (V) 1. The Reference Voltage Line Regulation 1.25 1.24 1.23 1.22 1.21 1.20 1.19 1.18 1.17 1.16 1.15 -40 -20 0 20 VSYS (V) 60 80 100 120 140 Temperature (°C) 4. The Oscillator Frequency Temperature Pulling 3. The Oscillator Frequency Line Voltage Pulling 2.04 2.10 Frequency (MHz) 2.06 ACT5880-004 ACT5880-003 2.08 Frequency (MHz) 40 2.02 2.00 1.98 2.05 2.00 1.95 1.90 1.96 2.5 3 3.5 4 4.5 5 -40 5.5 VSYS (V) Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. -20 0 20 40 60 80 100 120 Temperature (°C) - 55 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TYPICAL PERFORMANCE CHARACTERISTICS CONT’D (TA = 25°C, unless otherwise specified.) 6. The REG1 Start from PWRHLD set, no load 5. The REG1 Start from Last I2C Bit, Full Load ACT5880-006 ACT5880-005 CH1 CH1 CH2 CH2 CH1: VSCL, 2V/div CH2: VOUT1, 0.5V/div TIME: 100μs/div CH1: VOUT1, 0.5V/div CH2: PWRHLD, 2V/div TIME: 100μs/div 8. The REG1 (1.2V) Efficiency vs. Load Current 7. The REG1 Step Transition Response, Full Load ACT5880-008 ACT5880-007 95 85 Efficiency (%) CH2 CH3 75 65 VVP1=3.0V VVP1=3.6V 55 VVP1=4.0V 45 CH1 1 CH1: VSCL, 2V/div, CH2: VSDA, 2V/div, CH2: VOUT1, 0.5V/div TIME: 10μs/div 100 1000 Load Current (mA) 10. The REG1 Load Transition Response 9. The REG2 (1.8V) Efficiency vs. Load Current ACT5880-010 ACT5880-009 95 Efficiency (%) 10 75 CH2 55 CH1 VVP2=3.0V VVP2=3.6V VVP2=4.0V 35 1 10 100 CH1: VOUT1, AC coupled, 10mV/div CH2: Load Current, 200mA/div TIME: 400μs/div Load Current (mA) Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 56 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TYPICAL PERFORMANCE CHARACTERISTICS CONT’D (TA = 25°C, unless otherwise specified.) 12. The REG2 Buck to Linear Mode Transition 11. The REG2 Load Transition Response, Full Load ACT5880-012 ACT5880-011 CH2 CH1 CH1 CH2 CH1: VOUT2, AC coupled, 10mV/div CH2: Load Current, 200mA/div TIME: 400μs/div CH1: VOUT2, 0.5V/div CH2: VSDA, 5V/div TIME: 400μs/div 14. The REG3 Step Transition Response, Full Load 13. The REG3 Start up Waveform, Full Load ACT5880-014 ACT5880-013 CH1 CH2 CH1 CH3 CH1: VSDA, 2V/div CH2: VOUT3, 1V/div CH3: VSCL, 2V/div TIME: 400μs/div CH1: VOUT3,1V/div TIME: 200μs/div 16. The REG3 Load Transition Response 15. The REG3 Efficiency vs. Load Current Efficiency (%) ACT5880-016 ACT5880-015 90 80 CH2 VVP3=4.2V VVP3=3.6V 70 CH1 VVP3=3.0V 60 1 CH1: VOUT3, AC coupled, 200mV/div CH2: Load Current, 100mA/div TIME: 400μs/div 10 100 Load Current (mA) Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 57 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TYPICAL PERFORMANCE CHARACTERISTICS CONT’D (TA = 25°C, unless otherwise specified.) 18. The REG4 Start up Waveform, No Load 17. The REG3 External PWM Modulation to Current ACT5880-018 ACT5880-017 CH1 CH1 CH2 CH1: PWM signal CH2: LED Current (sensed on sample resistor) TIME: About 1KHz, 20% Duty Cycle CH1: VOUT4, 0.5V/div TIME: 40μs/div 20. The REG4 Step Transition Response 19. The REG4 Start up Waveform, Full Load ACT5880-020 ACT5880-019 CH2 CH1 CH1 CH3 CH1: VSDA, 2V/div CH2: VOUT4, 0.5V/div CH3: VSCL, 2V/div TIME: 100μs/div CH1: VOUT4,0.5V/div TIME: 40μs/div 22. The Charge Current vs. VVBAT, VCHGIN=5V 21. The REG4 Load Transition Response Charge Current (A) CH1 CH1: VOUT4, AC coupled, 50mV/div CH2: Load Current, 200mA/div TIME: 400μs/div Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. ACT5880-022 ACT5880-021 CH2 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 ACIN/CHGLEV=1/1 ACIN/CHGLEV=0/1 ACIN/CHGLEV=0/0 0 1 2 3 4 5 VVBAT - 58 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TYPICAL PERFORMANCE CHARACTERISTICS CONT’D 24. The Charge Current vs. Ambient Temperature, VCHGIN=6V ISET for 1.0A Max Charge Current (A) ACIN/CHGLEV=1/1 ACT5880-024 1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 23. The Charge Current vs. VVBAT, VCHGIN=6V ACT5880-023 Charge Current (A) (TA = 25°C, unless otherwise specified.) ACIN/CHGLEV=0/1 ACIN/CHGLEV=0/0 ISET for 0.85A Max 1 ISET for 0.45A Max ISET for 0.3A Max ISET for 0.09A Max 0 0 1 2 3 4 Ambient Temperature (°C) VVBAT 26. Backup Battery Charge Current vs. VVSYS 25. Charger Load Transition Response, LDO Mode Charge Current (A) CH2 ACT5880-026 5 ACT5880-025 CH1 80 40 0 5 4 3 2 1 0 1 3 4 5 6 28. The DC Input Effective Numbers of Bits 27. The DC Sweep Histogram DNL ACT5880-028 2 1.5 1 0.5 0 -0.5 -1 -1.5 -2 2 VVSYS ACT5880-027 200 Counts DNL (bits) CH1: VVBAT, AC coupled, 100mV/div CH2: Load Current, 200mA/div TIME: 200μs/div 100 0 0 1000 2000 3000 4000 CODE (LSB) CODE (Decimal) Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 59 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 APPLICATION INFORMATION The ACT5880 is a combinations of many circuit blocks including step-down DC/DCs, a step-up DC/DC, LDOs, an RTC, an ADC block with a front end for both TSC and general purpose analogue signal acquisition. Each of those blocks has its own control and configuration register, shares the same interface block, same house keeping block which provides common resource to other blocks, including operation supervising, interrupts, clock reference and voltage references. Those blocks make a two layers architecture in system point of view. System and Control Information Figure 1 shows the top level functional block diagram of the ACT5880. The ACT5880 manages 3 different power inputs and 4 groups of functional macro-blocks. The ACT5880 can be enabled, when system control interface and most power regulators are available for using, only when either the adaptor power or the main battery is available, or both of them are available; When there is only the backup power available, only the always-on regulator keeps the VALIVE output and RTC running. be turned into enable state only when either or both the adaptor power and the main battery are available. In the enable state, the ACT5880 power rails may or may not output, dependent on how those regulators are programmed. There are 5 events or signals that pull the ACT5880 into the enable state, which are the nPBIN assertion, the valid adaptor input voltage, the HFPWR assertion, the PWRHLD assertion and the RTC alarm wake-up event. The ACT5880 turns into disable state only when all those 5 events or signals are de-asserted. System Control Signals There are 7 foreign signals and 2 internal signals for the system control in the ACT5880. Table 1 lists those signals. Table 1: The System Control Signals to The ACT5880 SIGNALS Figure 1: PBIN Push-Button input assertion. HFPWR Hand-free power requested. PWRHLD The Top Level Block Diagram of The ACT5880 Dedicated on/off control for OUT6. ON9 Dedicated on/off control for OUT9. SCL (ACOK) (ALARM) Device Power States The ACT5880 has 2 powered states, which are enable state and disable state. The ACT5880 could Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Input for request to hold the power output. ON6 SDA The backup battery charger, the always-on regulator and the RTC circuit are not subject to the enable status of the ACT5880. Whenever there is any of adaptor power and/or main battery power are available, the backup battery charger charges or floating charges the backup battery or the storage cap, the always-on regulator outputs to the RTC staff. DESCRIPTIONS I2C compatible serial interface. Internal signal, is true when the CHGIN input voltage is valid. Internal signal, is true when the RTC alarm happens if the RTC wake-up is set. All manipulation and configuration registers are accessible through the "fast mode" (up to 400kHz) I2C compatible interface with standard I2C session frame for read/write to one of single byte addressed registers. The ACT5880 is a slave device with device address of [1011010] or 86. In each read/write session, the device address is sent firstly with the 8th bit indicating that the session is for read (1) or for write (0), followed by a register address byte and the bidirectional transferred data byte, each aligns MSB first and is followed by an acknowledge bit. Among those 9 signals, the ON6, the ON9, the SDA and SLC of the I2C interface work only when the ACT5880 is enabled. - 60 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 Push-button Inputs The nPBIN features dual-functions input, by detecting if it is directly shorted to ground or pulled to ground through a resistor of around 50kΩ (good in range of 24kΩ to 82kΩ). See the Figure 2 for the external connection, the push-button that directly grounds the nPBIN input is namely the "Reset Key", is identified as a manual reset request by the ACT5880 when it is pressed; The other push-button is namely the "Enable Key", is identified as a device enable request when it is pressed. When either "Reset Key" or "Enable Key" is pressed, the nPBSTAT asserts low; In both cases the ACT5880 may assert interrupt to the application system if it is programmed so, by pulling the nIRQ low. reset timer expires, nRSTO is de-asserted. If the equipment system pulls the PWRHLD (or any of the HFPWR, ACOK or RTC alarm wake-up) to a logic high before the push-button is released, the enable state of the ACT5880 is kept. If this does not happen, the ACT5880 goes back to the disable state. The Figure 3 shows the states of the ACT5880 and its power rails. The ACT5880 has 2 programmable reset timeout, which is optional on default setting and programmable in operation. When "Enable Key" is pressed in ACT5880 enable state, the response depends on if the OUT1 outputs is normal at the moment. Figure 3: Power Rail Sequence Figure 2: The External Circuit for The Push button Input ACT5880 nPBSTAT Output nPBSTAT is an open-drain output that reflects the state of the nPBIN input; nPBSTAT is asserted low whenever nPBIN is asserted, and is high-Z otherwise. This output is typically used as an push button status signal to the processor, to initiate a software-programmable routine such as operating mode selection or to open a menu. Connect nPBSTAT to an appropriate supply voltage (typically IO voltage) through a 10kΩ or greater resistor. When OUT1 is already enabled, the push button event only asserts nPBSTAT (and the nIRQ if it is programmed so). When the OUT1 is disabled, the push button event starts OUT1 and pulls the nRSTO low until the reset time-out expires after the OUT1 is in regulation, also asserts nPBSTAT (and nIRQ if it is programmed so), while no change to other rails.Figure 4 shows the "Enable Key" push button event when OUT1 is disabled. Figure 4: REG1 to nRSTO Sequence Control Sequences Power Output Sequence A typical enable sequence initiates as a result of pressing “Enable Key”, which is one of the 5 events mentioned in the "Device Power States", and it turns ACT5880 into the power-on default state or last powered state before being turned off by removing all the 5 events. When REG1 reaches its power-OK threshold, nRSTO is asserted low. If REG1 is above its power-OK threshold when the Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. See Figure 4 for illustration of pressing of "Enable Key" when OUT1 does not output. When OUT1 is in - 61 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 normal output state, the key press event only asserts nPBSTAT (and the nIRQ when it is programmed so). When OUT1 is disabled, the key press event starts OUT1 and pulls the nRSTO low until the reset timeout expires after the OUT1 is regulated, also asserts nPBSTAT (and nIRQ when it is programmed so), while no change to other rails. When the manual reset asserts, the ACT5880 pulls the nRSTO output low instantly and holds it low until reset time-out expires after the "Reset Key" is released. As the nRSTO is kept low for a while after the "Reset Key" is released and the power outputs of the ACT5880 remain unchanged, it is assured that the host processor is stopped if no any other of the 5 events holds it on, or is kept on if there is other event holds it. SLEEP Modes The ACT5880 features two sleep modes for low quiescent current operation. The sleep mode is a mode that the PWRHLD is kept high by a circuit external to the ACT5880. Comparing to the normal operation state with different power rail configurations, the sleep mode is a state the host processor keeps essential system functions working. The power rail configurations in sleep mode are in two subsets; One subset keeps at least one of REG1 and REG2 in buck operation, while all the rest rails are flexible to be programmed into any states, the other subset could have both REG1 and REG2 buck mode off while all LDO rails are only programmable in the quiescent current mode, or are forced off if in the low noise mode. As the power rails need to be controlled through the host processor in this mode, it needs to be carefully handled to keep the essential system working. The deep sleep mode further reduces the quiescent current by stopping all other circuits in the ACT5880 by releasing the PWRHLD to low. In this mode only the always-on regulator, and the linear regulation circuit of the REG2 stay working. In deep sleep mode, the operation resumes normal by asserting PWRHLD (or any of nPBIN, HFPWR, ACOK or RTC alarm wake-up events), when REG2 starts its buck regulation and other regulators resume their previous states before the removing of PWRHLD. This implies that the deep sleep state has to be put from an operation state of the system by de-asserting PWRHLD. Other ways like turning off the I/O power which may turns the PWRHLD off consequently, may put the system in a state that it could not resume by the assertion of PWRHLD (or any of the nPBIN HFPWR, ACOK or RTC alarm wake-up), until the reloading of power on default Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. state (refer to UVLOs and Low System Voltage Alert section for more information). In both modes, the nRSTO asserts against the resuming of REG1. Interrupts The ACT5880 asserts interrupt as designated for a function or when the house keeping circuit finds a condition does not meet the reliable operation situation, by pulling the nIRQ output low. The nIRQ is an open-drain output, which is good for wired-or with other interrupt request sources in the equipment system. Every possible interrupt in the ACT5880 can be masked by resetting/setting the respective register bit. When interrupt asserted, the interrupt is cleared by reading the respective register byte or clearing a respective bit. There are totally 35 different sources/conditions for interrupt assertion, refer to INTERRUPT DESCRIBPTIONS section for a summary. It is practically necessary to mask all the unused interrupts to assure that the equipment system runs efficiently, and to unmask the interrupts in case by case basis for specified applications. House Keeping Functions The house keeping functions for the ACT5880 itself include the internal biasing, voltage reference sharing in different blocks, UVLO (Under Voltage Lock-Out), regulation status monitoring, over current protection and over temperature protection. The house-keeping functions assure the ACT5880 only operates reliably in proper system situation, asserts interrupt to the system or shutdown the ACT5880 when necessary condition does not meet. Refer to the following sections for details. The VSYS and the REFBP The VSYS is the internal bias rail bypass node, the REFBP is the bypass node for the on-chip reference. The VSYS is driven by an internal preregulation circuit, whose output is automatically routed to connect the VBAT when there is no input power at CHGIN is available. Proper bypass on those nodes reduces the noise and improves the PSRR of every regulator. Capacitors around 47nF~68nF for the REFBP and 1μF~2.2μF for the VSYS are recommended for their bypassing. UVLOs and Low System Voltage Alert The ACT5880 has a system UVLO, a VVSYS comparator for low system voltage alert and UVLOs for step-down and step-up DC/DCs. The system - 62 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 UVLO circuit monitors the voltage at VSYS, it stops the normal operation when the VVSYS is less than the VUVLO, reloads registers with default power on states and starts normal operation when the VVSYS is greater than VUVLO. the REGISTER AND BIT DESCRIPTIONS section for more details. Table 2: The House-keeping Oriented Interrupts. All circuit blocks stop but the always-on VALIVE output and the RTC circuit keep running when the system UVLO asserts. The always-on regulator keeps output even when its output voltage drops, the RTC keeps running until its input voltage is too low, the RTCEN bit is reset. INTERRUPT FOR The VVSYS comparator circuit is configurable for stopping the system as the UVLO function does or asserting a system voltage low alert when it sees the VVSYS is less than a programmable threshold. The threshold is programmed by setting the SYSLEV[3:0] in a register, refer to the GLOBAL REGISTER MAP and REGISTER AND BIT DESCRIPTIONS sections for more details. CONDITIONS System Voltage low VVSYS<Voltage set by SYSLEV[3:0] Regulator out of regulation REG1, REG2, REG3 output 7% less than normal; REG4 to REG13 11% less than normal; REG3 over voltage in constant current output mode. Each step-down DC/DCs and the step-up DC/DC has its own UVLO to assure it only operates when both its input voltage and the VVSYS are in proper range. Over-Current Each regulator has its own over-current protection. For step-down DC/DCs and the step-up DC/DC , the over-current condition triggers to reduce the switch frequency to ¼ of normal frequency. In LDOs, it triggers fold-back current limit. In both case, the over-current protection consequently causes the drop of output voltage and so the house-keeping interrupt assertion if this function is enabled. Each regulator is safe in unlimited-time output short-circuit (but not the step-up DC/DC, in which the rectifier diode might be burned off). Over-temperature When the die temperature goes to about 160°C, the whole circuit of the ACT5880 is shutdown, including all function blocks, with about 20°C hysteresis when temperature falls for recovering. This threshold temperature is higher than functional temperature thresholds used for other temperature dependent circuits, including the die-temperature regulation in charger and the open-drain driver circuit. House-keeping Oriented Interrupts There are 14 sources/conditions in 2 types interrupt oriented for house-keeping, each is programmable for allowing interrupt or masked. Table 2 lists the house-keeping oriented interrupt types. Refer to the INTERRUPT DESCRIPTIONS section for a summary of all possible interrupts and Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 63 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 STEP-DOWN DC/DC REGULATORS General Description Summary of key specifications REG1 and REG2 are fixed-frequency, current-mode, synchronous PWM step-down DC/DC converters that achieve peak efficiencies of up to 97%. These regulators operate at a fixed frequency around 2MHz, minimizing noise in sensitive applications and allowing the use of small external components. Additionally, REG1 and REG2 are available with a variety of standard and custom output voltages, and may be software-controlled via the I2C interface for systems that require advanced power management functions. Finally, REG2 features a unique SLEEP mode function that significantly reduces quiescent power consumption yet maintains a regulated output voltage that can supplies up to 10mA nominal (50mA maximum). Table 3: By default, REG1 and REG2 operate in fixedfrequency PWM mode at medium to heavy load, then transit to a proprietary power-saving mode at light load for having better efficiency. In applications where low noise is critical, fixed-frequency PWM operation may be retained across the entire load current range (in compromising of the light-load efficiency) by setting the respective MODE[ ] bit via I2C. REG1 and REG2 are capable of operating at up to 100% duty cycle. During 100% duty-cycle operation, the high-side power MOSFET is held on continuously, providing a direct connection from the input to the output (through the inductor), ensuring the lowest possible dropout voltage in battery powered applications. REG1 has 2 banks of registers for setting the output voltage, with the VSEL input to select to output voltage set in which bank. REG2 has a buck unit and a synergetic linear regulation unit, which is designed to replace the buck unit in light load operation. The linear unit has almost the same programmable features as an LDO, but with a bit to program if to turn on when the buck is tuned off, and it should not be set to active discharge in shutdown. Manipulation The output voltages and few other operation options of REG1, the buck unit and synergetic linear unit in REG2 are programmable through the I2C operation. Refer to the REGISTER AND BIT DESCRIPTIONS section for details and the step-down DC/DC converter and LDO Voltage Setting for the code to voltage cross. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Key Specifications of Step-down DC/DC Converters PARAMETER Operation Voltage VOLUME 2.7V to 5.5V Active Mode Quiescent Supply Current 65μA Sleep Mode Quiescent Supply Current 23μA Shutdown Current 1μA Default Output Voltage Output Range Maximum Output Current 1.2V and 1.2V/REG1, 1.8V/ REG2 0.6V to 3.9V 1.2A/REG1, 0.6A/REG2 10mA/REG2 in Sleep Mode Soft-Start Step Transient Both REG1 and REG2 implement constant slope control for soft start ramping in 400μs nominal, as well as the step up transition for outputting two different voltages. This assures no overshoot during start up and changes of voltages. The output voltage drop is load condition dependent during turning off or step down transition. REG2 Sleep Mode When set the EVENT4 bit of the system register, the buck operation of REG2 stops and the linear regulator unit starts smoothly with no dropping at output. When the "Enable Key" is pressed or the EVENT4 is cleared, the REG2 is set back to buck operation and the linear regulation unit stops, also in seamless smooth transition. The EVENT4 bit should be cleared by software when wanting the REG2 resumes from the sleep mode to normal mode. When REG2 is set off before the set of EVENT4, the assertion of EVENT4 starts REG2 in sleep mode. In this condition the clear of EVENT4 sets the REG2 off, without turning it into buck operation. Irregular Conditions Both REG1 and REG2 are output short-circuit safe. The over current protection and the over temperature shutdown protection prevent the ACT5880 from being damaged by thermal over stress. When the output voltage drops about 7% off the normal output voltage, the OK bit for the regulator is cleared. When interrupt is unmasked, - 64 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 this change asserts interrupt to alert the system for out of regulation. Component Selection Each step-down DC/DC regulator utilizes currentmode control and a proprietary internal compensation scheme to simultaneously simplify external component selection and optimize transient performance over its full operating range. No compensation design is required; simply follow a few simple guidelines described below when choosing external components. Inductor Selection The inductors with inductance 1.5µH to 2.2µH for REG1 and 1.5µH to 3.3µH for REG2 are recommended. Input and Output Capacitor Selection REG1 and REG2 are designed to operate with small 22µF~27µF and 10µF~22µF output capacitors respectively, over their output voltage ranges. The input bypass capacitors sink the quick component in current, help in suppressing of EMI and improving the efficiency. Capacitance in range 2μF to 10μF is commonly sufficient. X5R and X7R dielectrics are recommended for those capacitors for their suitable and stable characteristics to better performance. PCB Layout Considerations The high frequency element in the inductor current alternates between the switch ground path and the input bypass capacitor ground path. Place and route the two paths close, then place the ground end of output capacitor close to them, then place the inductor close is the better order in layout design. Though the practice is difficult to place all components close to the ACT5880, it is necessary to give the step-down DC/DCs the priority for closer placement. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 65 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 CONFIGURABLE STEP-UP DC/DC REGULATOR General Description The step-up DC/DC regulator in the ACT5880 is factory-programmable for the options of operation in voltage regulation mode, constant current mode and negative output mode, which are options against ordering. The step-up DC/DC has 80ns typical minimum ontime and 40ns minimum off-time, with the flexible factory programmable loop compensation and slope compensation, could output in large dynamic range from slightly high than input to 40V. The output voltage in voltage regulation mode and the over voltage protection threshold, the switch operation to the system clock phase alignment, and the turn-on delay time are configurable though the I2C interface. The circuit is enabled and starts to output after the specified turn-on delay when the ON[ ] bit is set to 1. When the ON[ ] is cleared, the step-up DC/DC circuit is shutdown. When the interrupt function is not masked and the power ok condition is not met, the circuit asserts interrupt. The power ok condition for the voltage regulation mode is that the output voltage is within 7% of the normal output voltage. For the constant current mode, the power ok condition is the overvoltage does not occur. The interrupt function is masked by setting the nFLTMSK[ ] bit. The overvoltage detection monitors the voltage seen at voltage feedback error amplifier input, with an threshold about 30mV to the 1.2V reference voltage. When the on-time or off-time of the switching is close to the respective minimums, pulse-skipping happens to stay in regulation, which is normal when the input voltage and the output voltage are too close or too far. See the STEP-UP DC/DC VOLTAGE SETTING table for VSET code to voltage cross. This code to voltage cross applies to both the output voltage and the over voltage threshold. sense resistor tap. The voltage on the sense resistor is regulated at 200mV, the output current is then derived from the resistance and this 200mV volume. Figure 6 shows the internal block diagram and the external circuit for constant current operation. The output current can be controlled by feeding a voltage DIMMING into the resistive network composed of RCS, RDM1 and RDM2. The DIMMING voltage can be an analogue signal or a logic signal, which implements analogue current control or PWM on/off control to the current output. When using a logic signal as DIMMING for turning on and off the constant current output, the on and off delay limits the maximum available frequency used for dimming, which is typically less than 2.2kHz. Refer to the waveform captures in TYPICAL PERFORMANCE CHARACTERISTIC section for more details. Figure 5: The REG3 Circuit for Voltage Regulation Mode. Figure 6: The REG3 Circuit for Current Mode. Voltage Regulation Option In voltage regulation mode operation, the output is sampled at the OUT3 pin with an internal divider network. Figure 5 shows the internal block diagram and the external circuit for the step-up DC/DC in voltage regulation mode. Current Regulation Option In current regulation mode operation, the current is sensed in the sinking path at the low end current Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 66 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 Inversion Regulation Option When programmed as an inversion regulator option, the error amplifier in the FB3 feedback path is phase inverted for the negative output regulation. An external positive reference voltage is employed for bias an external divider, whose tap connects to the FB3. The voltage at FB3 is still regulated at 200mV in inversion application. output capacitor, the inductor and then the input capacitor. Irregular Conditions When the load condition, or input to output ratio pull the output out of regulation, the switch current limit prevent the circuit from over stress. As the rectifier diode is serial in the output path, short the output to a voltage lower than input voltage would cause excessive high current through the diode and might damage the diode. Current limit switch or thermal fuse is desired if there is possibility of shorting the boost output. Component Selection Table 4 lists the suitable component specifications. The better high frequency performance is important to both inductor and capacitor. Capacitors with X5R or X7R serial dielectrics are recommended. The inductor DC saturation current should be at least 30% over the limit of switch current. For applications that do not require high current, options with lower current limit are available upon ordering, which is necessary when selecting the inductor with smaller saturation current. Table 4: The Components Selection for REG3. L (μH) COUT (μF) CIN (μF) Voltage, 500mA, 5V 10~15 22~27 2.2 Voltage, 35mA, 40V 22 0.68 2.2 Current 35mA, 40V 22 0.47 2.2 Current 100mA, 20V 15 0.68 2.2 Operation conditions PCB Layout Considerations The inductor current alternately goes into the output capacitor and the power switch, place the output capacitor close to the switch node SW3 and connect the capacitor ground to the same current loop back node GP3 would reduce the risk of excessive noise conducting. Practically it might be difficult to place all components close to the chip. When the available space is constraint, the order for being close to the chip is the rectifier diode, the Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 67 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 LOW-NOISE, LOW-DROPOUT LINEAR REGULATORS General Description Output Current Limit There are total 13 low drop-out linear regulators in the ACT5880. Except for the one for backup battery charger and the always-on LDO, the rest 11 LDOs have similar way to control and to program through the access of sets of registers, but the one tied for REG2 has an additional control access though a joint manipulation. Refer to Table 5 for a quick summary of output currents and default output voltages for each LDOs. Each LDO contains current-limit circuitry featuring a current-limit fold-back function. During normal and moderate overload conditions, the regulators can support more than their rated output currents. During extreme overload conditions, however, the current limit is reduced by approximately 30%, reducing power dissipation within the IC. Configuration Options Table 5 Output Voltage Programming The Key Specifications of LDOs. NAME DEFAULT DEFAULT STATUS OUTPUT(V) MAXIMUM OUTPUT (mA) REG4 ON 2.9 360 REG5 ON 2.9 250 REG6 OFF 2.9 360 REG7 ON 3.0 360 REG8 ON 2.5 360 REG9 OFF 1.2 250 REG10 ON 3.3 150 REG11 OFF 1.8 80 REG12 OFF 1.8 250 REG13 OFF 2.8 150 LDO tied in REG2 OFF 1.8 10 Backup Battery Charger ON 2.7 5 Always-on LDO ON 1.8 3.5 The OUT6 and the OUT9 also have pin control inputs for controlling their on/off together with the on/off bit controls through the register access. When both the ON bit and ON pin input are used for control, the later change takes effect. Upon the power up, if the default of ON bit is different than the ON pin input, the OUT is ON. In other words, the OUT upon power on is off only both the ON bit and ON pin input are set for off. This arbitration is enough and does well to most cases. However, if one input sets the OUT to have a status that it already outputs for in the condition that the OUT sets for the complementary status by other input, the input should send out a toggle, instead of repeat the same logic volume. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. By default, each LDO powers up and regulates to its default output voltage. Once the system is enabled, each output voltage may be independently programmed to a different value by writing to the regulator's VSET[-] register via the I2C serial interface as shown in the STEP-DOWN DC/DC and LDO OUTPUT VOLTAGE SETTING table. Enable / Disable Control During normal operation, each LDO may be enabled or disabled via the I2C interface by writing to that LDO's ON[ ] bit. To enable the LDO set ON[ ] to 1, to disable the LDO clear ON[ ] to 0. Output Discharge Each of the ACT5880’s LDOs features an optional output discharge function, which discharges the output to ground through a 1kΩ resistance when the LDO is disabled. This feature may be enabled or disabled by setting DIS[-] via; set DIS[-] to 1 to enable this function, clear DIS[-] to 0 to disable it. Low-Power Mode Each of ACT5880's LDOs features a LOWIQ[-] bit which, when set to 1, reduces the LDO's quiescent current by about 30%, saving power and extending battery lifetime. OK[ ] and Output Fault Interrupt Each LDO features a power-OK status bit that be read by the system microprocessor via interface. If an output voltage is lower than power-OK threshold, typically 7% below programmed regulation voltage, the value of regulator's OK[-] bit will be 0. can the the the that If a LDO's nFLTMSK[-] bit is set to 1, the ACT5880 will interrupt the processor if that LDO's output voltage falls below the power-OK threshold. In this case, nIRQ will assert low and remain asserted until the OK[-] bit has been read via I2C. - 68 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 The Always-on LDO and the Backup Battery Charger Two regulators are specialized for always-on powers, as a backup battery charger and a low voltage, low quiescent current always-on regulator. The backup battery charger is a low power voltage regulator with preset current limit of up to 5mA nominal as a constant-voltage and constant-current charger. If applications like the RAM data keeping requires larger current option, contact factory for ordering. The always-on LDO and the backup battery charger have programmable output voltages, which are set individually as other LDOs but the backup battery charger uses different code to voltage cross as what in the VBBAT OUTPUT VOLTAGE SETTING table. As the VBBAT is internally connected to power the always-on LDO, and the always-on LDO powers the RTC, if the RTC function is used, the outputs of both regulator should have enough headroom for the RTC operation. The backup battery charger LDO outputs at slightly lower voltage than the code voltage with a current related drop before it falls into current regulation, which would have output the exact code voltage when the output current were zero. This drop has close to logarithmic trend to the load current (i.e., doubled every decade change of load current). Typically the backup battery charger input, the BBCIN connects to the main battery; Its output, the VBBAT connects to a backup battery coin cell or a super cap, charges and floats at the programmed voltage. Its precise voltage setting and current setting accommodate to various battery chemicals of 1.5V to 3.6V output and super caps. When the input power removes, the backup battery charger turns itself shutdown with almost 0 leakage backward from the cell. The input of the always-on regulator is internally routed to available powers, which is the internal bias in the ACT5880, the VSYS, or the VBBAT. The always-on regulator output is internally connected to power the RTC block. When the RTC function is enabled, the minimum voltage to start oscillation or to maintain the RTC functional is greater than the minimum available programmable output voltage. writing to the byte. It is highly recommended to reset the UNLOCK bit after each writing, to avoid possible accidental change to the voltage setting for VBBAT. For configuration and manipulation, refer to THE REGISTERS and BITS DESCRIPTION for detail. Irregular Conditions The LDO circuit monitors the output and asserts interrupt if out of regulation happens, if the function is allowed. When short circuit or over current happens, the output current limit folds back to about the 0.45 times of the maximum output current. Each LDO is safe in output short circuit. The individual LDO does not have its own over temperature protection circuit. Subject to the whole die's thermal condition, the LDOs are turned off when die over temperature happens. Component Selection Input Capacitor Selection Each LDO requires a small ceramic input capacitor to supply current to support fast transients at the input of the LDO. Output Capacitor Selection Each LDO requires a small ceramic output capacitor for stability. Each output capacitor should be connected directly between the output and GA pins, as close to the output as possible, and with a short, direct connection. The input and output capacitor values are listed in Table 6. High quality ceramic capacitors such as X7R and X5R dielectric types are strongly recommended. Table 6 Component Recommendation for LDOs The data in register bits for the always-on LDO output voltage setting are kept until both the system power and VALIVE fail. Two accesses are designed for change the VBBAT regulation voltage. The first access is to set UNLOCK bit, to allow the change to the voltage configuration byte, then the VBBAT is changed by Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 69 - LDO NAME OUTPUT CAP (μF) INPUT CAP (μF) REG4, REG6, REG7, REG8 3.3 1 REG5, REG9, REG12 2.2 1 REG10, REG13 1.5 1 REG11 1 1 LDO tied in REG2 1~1.5 - Backup Battery Charger 1~1.5 - Always-on LDO 1~1.5 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PCB Layout Considerations PCB Layout Considerations The ACT5880’s LDOs provide good DC, AC, and noise performance over a wide range of operating conditions, and are relatively insensitive to layout considerations. When designing a PCB, however, careful layout is necessary to prevent other circuitry from degrading LDO performance. A good design places input and output capacitors as close to the LDO inputs and output as possible, and utilizes a star-ground configuration for all regulators to prevent noise-coupling through ground. Output traces should be routed to avoid close proximity to noisy nodes, particularly the SW nodes of the DC/DCs. REFBP is a filtered reference noise, and internally has a direct connection to the linear regulator controller. Any noise injected onto REFBP will directly affect the outputs of the linear regulators, and therefore special care should be taken to ensure that no noise is injected to the outputs via REFBP. As with the LDO output capacitors, the REFBP bypass capacitor should be placed as close to the IC as possible, with short, direct connections to the star-ground. Avoid the use of via whenever possible. Noisy nodes, such as from the DC/DCs, should be routed as far away from REFBP as possible. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 70 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 OPEN-DRAIN DRIVERS The ODO1, the ODO2 and the ODO3 are open-drain drivers, which could operate as simple open-drain outputs, or as constant current sinkers, set by individual configuration. Each of them could also output in PWM pattern for extended output power adjustment range. One of the driver output, the ODO1, has high operation voltage range of up to 40V and the other 2 have the ranges of up to 5V, make them flexible and powerful. implemented in the driver circuitry additional to the current-on slew rate limit of 40mA/μs nominal, which assure no flicker, no fake operation in various size for high quality image display. Figure 7: The PWM Adjustment Curves. 1 0.9 Each driver is configured and manipulated through the access to respective register bit. Refer to THE REGISTER BIT DESCRIPTION for more details. Non‐linear code 0.8 Expotential Curve 0.7 Linear code 0.6 The BUFFER bit sets how a current setting or PWM duty cycle affects the output. When the BUFFER is set to 0, the data written into the respective current or duty register affects the output instantly; When it is set to 1, the data written into the register does not affect the output until the bit is set to 0. This BUFFER bit has power over all the 3 drivers, which makes the outputs of drivers change simultaneously, independent to when the data is set. 0.5 0.4 0.3 0.2 0.1 0 0 50 100 150 200 250 Operation Modes Combined Modulations Constant Current Driving The current is set by configuring the weight for LSB and a 6 bits current code. Combining the weight and the current code, the adjustment to current for each driver covers 0 to 100.8mA nominal. PWM Switching Each driver could be turned on and off with an internal generated PWM pattern at nominal 244Hz. The duty cycle of PWM pattern is either linear coded or non-linear coded, optioned against ordering. If linear coded, the duty cycle is the ratio of the integer volume put into the duty register over 255. See respective tables for non-linear coded duty cycle setting and the register setting. Figure 7 shows the duty cycle to code plot for both the linear and non-linear code, with an exponential curve for reference. The non-linear coded duty cycle setting provides a close to exponential code to brightness approximation, which gives similar feeling difference in changing the code linearly, against the Webber's law. Phase Shift and Delay In case of driving backlight assembly with long wire and close to the EMI sensitive LCD display, both PWM phase shift and sequential on are Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. The PWM pattern could modulate the constant current output on and off, as well as the simple open drain output on and off. The combined modulation extends the dynamic range for backlight brightness adjustment. For multi-strings backlight application, the current setting could be used for matching different strings while the PWM is used for overall brightness control. Inductive Load For inductive load driving, like driving a vibrator motor, an external dump clamp diode is desired to avoid voltage overstress by current breaking voltage surge caused by the serial inductance. As specified in the characteristics table, the drivers have a controlled current on slew rate of 40mA/μs nominal. This slew rate control only applies on the turning on of the current, not on the turning off. Irregular Conditions The driver block has her own overheat monitoring, with a threshold temperature lower than the over temperature shutdown threshold. If overheat is detected in this block, the drivers are turned off before the system is possibly forced into thermalshutdown. Each driver also has a LED open detection circuit, which monitors the driving level of the output stage. When it is driven saturated, then - 71 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 brightness. Figure 8: A Sample Circuit for the OTG Power. VBAT Low LED bias voltage or high serial impedance may cause false reading of an open LED situation. The host system needs other measures to verify the true situation and takes action accordingly. SW3 ACT5880 OUT3 ODOx This open LED detection function provides a way of driving headroom detection for making adaptive backlight driving, which is biasing the LED with a voltage just enough for maintain the wanted current. QOTG Typical Application Consideration Figure 8 shows a sample of how this approach is used in a slightly different way, which is meaningful sample of how the comprehensive use of the ACT5880 capability benefits the application. In the circuit, the step-up DC/DC output is used to bias the WLED, and to power the USB OTG port as well. The WLED forward voltage drop is in range of 2.8V to 3.8V typical, dependent on LED temperature and brightness wanted. During the backlight only operation, the step-up DC/DC output should be adaptively set to a voltage for maintaining proper headroom on the driver output, in which the voltage is normally less than 5V. During powering the OTG port, the step-up DC/DC outputs 5V, in which case a large drop on the LED driver is seen. For reducing the thermal generated in the driver, the constant current should be increased as high as possible, and as such the drop on driver decreases, while the PWM duty ratio is reduced for maintain the stable Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. d=(i0-ib)/(i-ib) where the ib is a characterized parameter for a given LED type from the test of finding the duty ratio dm at a current iM for keeping the same brightness, in which the volume of iM used should be close to the available maximum current in the particular circuit. The curves and their linear approximations for deriving the equation are shown in Figure 9. Figure 9: Deriving Adjustment for Maintaining Brightness. PWM Constant Brightness Curve - 72 - Inf brightness approx line The mix-modulation to power output brings another approach of adaptive backlighting, which is to draw the possible maximum current from a bias power with varying voltage such as a battery by checking if the headroom is sufficiently kept, and stabilize the light output, what is the product of current and PWM duty ratio, by change the PWM duty ratio. VBUS Device System The duty ratio d for keeping the same brightness is the function of the current i, the current at 100% duty ratio i0, and a constant ib, as showed in the equation below: D=d The thermal constraint of the ACT5880 plays the limit of effective use of its capability. Cooperation between the programmable step-up DC/DC of the ACT5880 and the adaptive headroom management could realize the feasible thermal design for high power backlighting of up to 100mA and 40V. VBUS D=100% With the thoughtful function design and the parameter design, the driver circuit in the ACT5880 provides high flexible and rich solutions for design trade-off. The range of constant current, the range of voltage and its programmability are enough to most mobile backlight applications with up to 7" display. 3V I/O Brightness Emission Curve 0 brightness approx line (0,0) Line ar a ppro x. an open-LED is detected presumably. The overheat and open-LED situation does not send out signal to alert the system, the system could identify the situation by ready respective bits in the ODO register (0x79). i0 ib Current i www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TSC ADC The ACT5880 has a shared SAR ADC with a statemachine for deploying actions to do resistive touch panel measurement as well as normal ADC conversion. The features and performance of the circuit are optimized for applications with hand-held size touch panel and related housekeeping. The shared ADC core has 12 or 8 bits resolutions, assures that it fits both the position measurement and the contact evaluation. Table 7: The Key Feature of the TSC ADC. PARAMETERS The touch screen measurement circuit employs an analogue front end and a touch detection circuit with acquisition management, makes the circuit a full function TSC (i.e., the touch screen controller). Refer to Figure 10 for the top level block diagram of the TSC ADC circuit. Resolution (bits) 12 or 8 Input Impedance 11MΩ Input Capacitance 32pF Force Driving Voltage and ADC Reference 2.5V Maximum Force Driving Current 18mA Full Scale Input Voltage AUX0, AUX1, AUX2 2.5V AUX3(VD) 6.024V Figure 10: The TSC ADC Block Diagram. Table 8: The Touch Screen Interface Connections. XPOS XNEG YPOS YNEG CHANNEL DESCRIPTION PEN Hi-Z Hi-Z GND Standby ADC Hi-Z 2.5V GND 0 Y-coordinate 2.5V GND ADC Hi-Z 1 X-coordinate ADC GND 2.5V Hi-Z 2 Z2-coordinate Hi-Z GND 2.5V ADC 3 Z1-coordinate Notes: PEN: The pen touch detection connects to this pin; 2.5V: The 2.5V reference buffer output; ADC: One of the ADC channel input. The analogue front end is designed to provide force driving bias and signal routes for 4-wire type resistive touch panel and the auxiliary inputs for common purpose ADC. Both the touch panel measurement and the common purpose ADC conversion are organized to manipulate with operation to same sets of registers, the state machine controls scanning to get each signal converted in a sequential frame or doing a single channel conversion, as it is programmed. Refer to Acquisition Configuration for details. And refer to Table 7 for the key specifications. 4-wire Touch Screen Interface The TSC ADC has following internal connections for touch screen force and sense, as showed in Table 8. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. The respective force and sense to touch panel is shown in Figure 11. The resistors lay in vertical and horizontal represent the equivalent resistances of the transparent films split by the touch spot, the resistors lay oblique is the equivalent of the films contacting in the touch spot, the paths in bold are the force current goes through. Considering the current into the ADC input is neglecting comparing the force current and the even gradient slope of potential in the area between two bias bar, the channel 0 and channel 1 read exact the electrical equivalent coordinates in the axes (the electrical equivalent coordinates then are scaled to graphic user interface coordinates by the application software). Giving the 3 equivalent resistors in the force paths for the channel 2 or channel 3 connections make the Z axis, the channel - 73 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 2 and channel 3 read the 2 coordinate equivalences Z2 and Z1 on Z axis. These Z2 and Z1 are used for contact evaluation; Refer to Contact Evaluation for more details. Figure 11: The Simplified Circuits for Touch Screen Measuring. YPOS: 2.5V YPOS: ADC XPOS: ADC XNEG: Hi-Z YNEG : GND Channel :0 Y-coordinate XPOS: 2.5V YNEG : Hi-Z Channel :1 X-coordinate YPOS: 2.5V XPOS: ADC XNEG: GND YNEG : Hi-Z Channel :2 Z2-coordinate XNEG: GND YPOS : 2.5V XPOS: Hi-Z XNEG: GND YNEG : ADC Channel :3 Z1-coordinate Touch Detection When the function is enabled, the touch detection circuit measures the contact between two film layers of the touch screen panel. The detection circuit only biases the XPOS in standby when no any conversion in progress and no conversion result waiting for system to read. When contact between 2 film layers happens, a touch event is detected and an interrupt asserts for request system service. The layer to layer coupling may cause false touch detection when applying the bias, the first touch event right after applying should be ignored. A wake-up against pen touch detection function is designed for further power saving in applications like E-book, in which the main processor may power off. To enable this function, the PENWKEN bit needs to be set and the TSC ADC circuit needs to be powered independently to the operation of the ACT5880, such as being powered with battery directly. Contact Evaluation The (Z1−Z2) read the resistive divide ratio of the contact impedance over the whole force path impedance. As the film resistors in the path are coordinate dependent, the (Z1−Z2) are Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. consequently X coordinate and Y coordinate dependent. The linear estimation on the film resistor impedances are used to normalize the (Z1−Z2) to proportional factor C to one of the two film impedances. As a sample, giving the effective dimensions of the touch films is 1:F for X-dimension to Y-dimension ratio and the X film impedance is 1, the Y film impedance is then F and the film thickness is same; Also giving the full scale reading is FS, the Y film resistor impedance in the path is (FS−Y)·F, the C is derived as: C=(Z1−Z2)·[X+(FS−Y)]⁄[FS−(Z1−Z2)]. The volume C represents the tightness of contact in the touch spot, which is proportional to the touch pressure and touch area size. The high resolution conversion, the reference buffer force driving and the flexible acquisition features make the ACT5880 suitable for contact evaluation applications like finger touch and fingers touch. The finger touch has low contact impedance than the round tip touch; the C volume can be used to detect the finger touch. With two additional I/O pins to pull the Hi-Z pins in channel 2 and channel 3 connections to ground separately, the equivalent span changes of the touch spot on X axis and Y axis can be evaluated, so forth the 2 fingers wiping shaped touch is identified. See connections in Figure 12 for reference. Figure 12: The 2 Fingers Touch Measuring. YPOS: 2.5V XPOS : ADC YPOS: 2.5V XPOS: GND XNEG: GND YNEG: GND XNEG: GND YNEG: ADC Y touch spot span evaluation , the YNEG grounded during Channel 2 measurement . X touch spot span evaluation , the YNEG grounded during Channel 3 measurement. Internal Reference The TSC ADC circuit has an internal reference buffer to generate a 2.5V reference voltage for the ADC circuit and the force driving in the analogue front end. This reference is user trim-able for getting better accuracy is necessary. Refer to the REGISTER AND BIT DESCRIPTIONS section for more details. - 74 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 TSC ADC Registers The conversion manipulation and the configuration are all user accessible through the register bits writing or reading. Purposes of most register bits are straight and clear, refer to the REGISTER AND BIT DESCRIPTIONS section for detail. Acquisition Configuration another layer. This mechanism causes a false touching at the first time enabling the pen touch detection function, which should be ignored by application software. This mechanism also causes false reading of around center point touching if reading without touching detected firstly. There is no false reading in automatic conversion operation when the nAUTO[ ] is cleared to 0, where the conversion starts only when touching is detected. The whole TSC ADC circuit could be disabled by setting the nEN bit for reducing the operation current. For any TSC ADC operation, clear the nEN bit to 0 firstly. The acquisition configuration includes how an acquisition is started, how conversions are grouped in an acquisition, the conversion length selection, the calibration time selection, the conversion clock divider selection, and selection of sampling to conversion start delay. The analogue front end only provides force driving to the touch panel when the group scan to touch screen interface is selected, which reduces the power consumption for driving the panel when it is not measured. When the group scan is not selected, 3 of the 4 touch screen interface pins could be used as normal input path for ADC. Interrupts and Status Bits If not masked, interrupt is asserted when a touch is detected and/or an acquisition is done and the result waits for being read. Each of the interrupt conditions could be masked by its mask bit and the status of the detection and acquisition could be read through the I2C interface, regardless if it is masked. Refer to the REGISTER AND BIT DESCRIPTIONS section for detail. Application Program Consideration Touch spot tracking desires intensive computing. Dynamic processing resource allocation and interrupt mask reconfiguration are necessary to accelerate the tracking process. Before any touch press is detected, the TSC ADC is set to wait for touch press event and to assert interrupt when a touch is detected. When touch press is ever detected, the pen-touch detection interrupt should be masked and the interrupt disposing routine should initialize for a polling routine which starts conversion and reads result with a fix time interval. When applying the force voltage onto one layer of the touch screen, a coupled voltage is seen at another layer through the layer to layer capacitance if there is no effective resistive leakage path at the Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 75 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 REAL TIME CLOCK The real time clock or namely the RTC circuit in the ACT5880 is powered by the VALIVE output of the always-on LDO. The circuit includes a crystal oscillator running with 32.768kHz quartz resonator, a rank of counters and manipulation interface. The RTC time counts for seconds, minutes, hours and days, alarms against comparison of second, minute and hour, outputs a square wave at its oscillator's frequency, asserts interrupt or wakes up the system if it is configured so. The data settings and the configuring are through I2C operation. Refer to the REGISTER MAP AND DESCRIPTIONS section for details. A bit in the control register, RTCEN[ ], enables the RTC circuit when it set 1, whose default is 0. Whenever power loss happens, it returns to 0 to disable the RTC counter. It is necessary to check this bit to assure the RTC runs normally before taking the time from the RTC. The oscillator and the square wave output are not affected by this bit, which keeps operation until it could works. Crystal Selection A precise 32.768k clock crystal is required to run the oscillator. The oscillation circuit works properly with large variety of load capacitances, CL1 and CL2 in range of 5pF to 30pF. The maximum serial resistance RS of the crystal for having stable oscillation is about 60kΩ to this device, while the less serial resistance is the easier to starting and maintaining oscillation. Commonly, the bigger size crystals have less serial resistance. For small size SMD crystal, an external shut resistor is required. Table 9 lists few crystal models and the external component parameter suggested. Refer to Figure 13 for the circuit diagram. Figure 13: The Crystal Oscillation Circuit. CL2 RSH CL1 time set in respective registers, interrupt asserts in normal operation or wake-up the ACT5880, then to wake up the host system, just as if a power-on button press event happens. To enable the alarm function, 2 control bytes, 0x3C and 0x3D need to be set to 0x80 and 0x08 respectively first, then set the RAAI[ ] bit and clear the nWKALM[ ] bit. When an interrupt occurs, its assertion is kept until the 0x3C is read for clearing; an internal latch circuit enabled by the nWKALM[ ] bit (=0) forces an onstate for possible wake-up, which also generates and holds both nIRQ and nPBSTAT low. The nWKALM[ ] bit has to be set 1 to release the forced on state and the nIRQ low state after the alarm, to allow other signals like PWRHLD to take control of power state again. Following is a sample of setting RTC alarm or wake up functions: To enable the RTC wake-up alarm: Set RTCEN[ ]=1 to enable the RTC running; Typical Crystal Parameters. Set low 8 bits of Day by writing 0xB0, high 8 bits of Day by writing 0xB1; CL1, CL2 (pF) RSH (MΩ) 10 (7~15) 5.6 (4.7~8.2) Set Seconds/Minutes/Hours by writing 0xA4, 0xA8, 0xAC; MC-146 TXC 9H03 2000 10 ACT5880 XTAL- Table 9: MODEL XTAL+ Set RCL[ ]=1 to load counters; Set byte 0x3C to 0x80; AB38T Set byte 0x3D to 0x08; Set alarm Seconds/Minutes/Hours by writing 0x90, 0x94, 0x98; RTC Interrupt and Wake-up The RTC can be configured to assert interrupt and/ or to wake-up the ACT5880 from disabled state or deep sleep state. When the hour counts, the minute counts and the second counts all match the alarm Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Set nWKALM[ ]=0, RAAI[ ]=1 to enable the alarm. - 76 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 To clear the RTC wake-up alarm interrupt: Set bit nWKALM[ ] = 1 ; Read byte 0x3C; Read byte 0x3D. To disable the RTC wake-up alarm: Set bit nWKALM[ ] = 1; Set bit RAAI[ ] = 0. And every change interrupt is also available in the ACT5880, enabled by setting respective register bits of the RDAI[ ], RHAI[ ], RMAI[ ] and RSAI[ ]. This functions helps in maintaining the clock display refresh against the day counts changes, the hour counts changes, the minute counts changes and the second counts changes. When the every change happens, the interrupt output is kept for 0.5s for second change, for 1s for minute change, hour change and day change. Resetting respective enabling bit to 0 clears the interrupt output immediately. Oscillator Square Wave Output The CLK32 is the shaped output of the oscillator, an open-drain output that requires an external pull-up resistor. The pull-up resistor is pulled-up to the same rail that powers the circuit that wants the clock input, is easy for logic level interfacing between the RTC circuit and the system. The pull-up resistance is selected against the edge slope rate wanted and the parasitic capacitance of the connection, which is typically in range of 7pF to 35pF for pins and normal trace width of 5mil to 10mil and length of 400mil to 1000mil. Typically, a 300k resistance is the highest volume acceptable to most systems and placing the resistor close to the input pin provides slightly better performance. Refer to Figure 14 for the circuit diagram. Figure 14: The Output Circuit of the CLK32 Output. System VCC RDDW (Placed close to input side ) System ACT5880 CLK32 Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 77 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 SINGLE-CELL LI+ BATTERY CHARGER The charger circuit in the ACT5880 deploys the constant current and constant voltage scheme for charging, with pre-condition charging and suspending. Most parameters for CC/CV control is programmable, together with the battery installed detection, the adaptor charging detection, the battery thermal condition, the die temperature regulation, the charging time-out counters and the LDO mode operation, it composes an autonomicable, flexible yet powerful battery management sub system, which satisfies most applications. precondition finishes, which reduces the time to wait before start. Additionally, the ACT5880 provides a LDO mode for starting system without battery. Figure 15: The Power Path of the Charger in the ACT5880. Joint-node Program and Manipulate Most of the charging profile control parameters are programmed by writing respective registers though the I2C interface. The charge states, the logic inputs are read and the charge behavior is manipulated through the same interface by reading or writing respective bits. Most programming and manipulation are done with one time access to respective register. For changing the battery regulation voltage and the fast charger current, which are safe related, an enable bit, the ENVISET[ ] register has to be set firstly, to avoid the accidental change. Refer to the REGISTER AND BIT DESCRIPTIONS section for more details. Power Path Management The ACT5880 has simple power path management. Refer to Figure 15, the charger only has one controlled path for pre-condition charging, fast charging and providing power to the load. By any time, the regulated voltage and regulated current apply to the load and the battery simultaneously. The load directly pours current from the battery or from the charge path, provides the most efficient way of using the energy stored in the battery. This is the most common path management in cellular phone and smart phone designs. Few issues need to be carefully designed for the optimizing use of this path management: 1.Start from a weak/dead battery; Charger Control The ACT5880 provides rich of programmability and effective solutions for dealing with these issues against system designer's trade-off. The ACT5880 has a pre-condition timer and a total charge timer for safe charging of a weak/dead battery, and it does not start the system until the battery voltage is charged to high enough voltage. The ACT5880 itself is designed to start at as low voltage as the precondition finishes, which reduces the time to wait before start. Additionally, the ACT5880 provides a LDO mode for starting system without battery. When the current goes into load is bigger than the current threshold for end of charge detection, the charging termination may never happen. The system operates in this situation, is known as long cord powered time operation. In this situation the system could program the charger to output at a slightly lower voltage for safe floating. Adaptor Input Detection The ACIN is the detection of adaptor charging input, which is a logic input with precise logic thresholds. A resistor divider can be used for sensing the voltage applies at the adaptor input receptacle for simple detection. Ref to the "USB Charging" and "Dual Input and USB-OTG Paths" for detection of USB adaptor. 2.Charging termination. The ACT5880 provides rich of programmability and effective solutions for dealing with these issues against system designer's trade-off. The ACT5880 has a pre-condition timer and a total charge timer for safe charging of a weak/dead battery, and it does not start the system until the battery voltage is charged to high enough voltage. The ACT5880 itself is designed to start at as low voltage as the Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. System Load Battery Installed Detection A grounded resistor in battery assembly is desired together with the BATID of the ACT5880 for the battery installed detection. The BATID is a logic input with higher voltage precise logic thresholds , please refer to the SINGEL-CELL LI+ CHARGER ELECTRICAL CHARACTERISTICS table for more details. - 78 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 Figure 16: The Battery Installation Detection Circuit. CHGIN Battery Assembly RIDUP ACT5880 curves. The top-off portion of curves, which is in shorter period comparing to the fast charge period, are plotted with expended time scale for showing in detail. Summary of Key Specifications Table 10: BATID The Key Specification of the Charger Block. RID PARAMETER VOLUME TYPE Battery Regulation Voltage (V) 4.10 to 4.40 Programmable Fast Charge Current (mA) 90 to 1000 Programmable End-of-Charge Current Residual Ratio 10.00% Fixed Total Charge Time-out (minutes) 180 to 300 Programmable or Disabled Pre-condition Threshold (V) 2.8 Fixed Pre-condition Current (mA, or %/Fast Charge Current) 45mA or 10% Fixed Pre-condition Time-out (minutes) 40 to 80 Programmable or disabled Operation Voltage (V) 4.2 to 6 Fixed UVLO Voltage (V) 3.1, 4 Programmable Over Voltage Threshold (V) 6.3 to 6.9 Programmable Input Voltage Range (V) 0 to 7 Fixed Regulation Die Temp(°C) 140 max. Fixed Hot Threshold, % 34.9 Fixed Cold Threshold, % 74.8 Fixed Refer to Figure 16, the RID is known as battery identification resistor in many commodity battery pack designs, which is also used to identify the battery model for the system. The resistance of RID could be specified by ordering the battery pack, or be whatever the commodity battery packs have, for examples, the Nokia BLB-2 has a 68kΩ resistor and the Nokia BLC-2 has a 75kΩ resistor. The RIDUP is recommended to pull up to CHGIN, whose resistance is derived from the thresholds and the suitable charging voltage range. The battery installed detection works only when there is suitable charging voltage applied on the CHGIN, no power loss occurs if not attaching onto an external power source. When there is an external power available at the CHGIN, the logic level at the BATID decides if to operate as a normal CCCV charger or to operate in LDO mode, in which the charger regulator works like a LDO for outputting the battery regulation voltage. When the voltage the CHGIN is higher than the "No Battery Installation Level" specified in the electrical characteristics table, the charger is in LDO mode, the maximum charge current still works to limit the maximum output current. When the battery does not have an ID resistor, ground the BATID with a resistor to force the logic level is equal to battery installed for normal charge operation; Or connect it to an I/O of the system to allow the system to control the logic level. CC/CV Charging Profile The core of the charger is a state machine which manages the state transitions for the CC/CV charging with a precondition state. The state machine waits for the available condition for operation. If the input power is available and battery is detected, it monitors either the voltage at VBAT or the current through the charge path, and regulates either the current or the voltage, as the profile showed in Figure 17. The profile is showed in time plane with typical I and V change to time Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Charge Current Sharing The charge current may go into the battery or the load, decided by their dynamic impedances. During Top-off state or floating, the fast voltage regulation loop puts most current into the charger path until the charge path current reaches the fast charge current limit, reduces the AC current into battery. This prevents the battery from aging caused by continuous passing AC current. Thermal Regulation The ACT5880 has an internal thermal feedback loop that reduces the charge current when necessary to ensure the die temperature does not - 79 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 rise far beyond a thermal threshold of nominal 100°C. The current reduction is about 50mA/°C for die temperature over the threshold. This feature prevents the ACT5880 from excessive junction temperature and makes it more accommodating of aggressive thermal designs without risk of damage. When the thermal regulation reduces the current, it takes longer time to charge the battery. The thermal regulation is counted in end of charge detection, which assures that the battery could be charged to the same status as a normal charged battery when the end of charge detected. in fast-charge state, when the cell is charged with the fast charge current, or a less current restricted by the thermal regulation and power source capability. Once the VVBAT reaches the battery regulation voltage; the state machine jumps into Top-Off State. Table 11: The State Transition Summary. CURRENT STATE NEXT STATE CONDITIONS Any state Sleep VCHGIN<VVBAT, SUSCHG=1 or (total charge timer time-out) Any state Temp-Fault Battery Temp Out of Range Temp-Fault Sleep Battery Temp is OK Pre-condition Time-Fault Pre-condition timer times-out. Time-Fault Sleep Presumably battery replaced. Sleep Fast-Charge SUSCHG=0, VCHGIN valid and VVBAT< (BRV-200mV) Pre-condition Fast-Charge VVBAT>PTV, not Temp-Fault. Fast-Charge Top-Off VVBAT=BRV and not (Total Charge TimeOut ) Top-Off Sleep ICHG=IEOC and not (Charge TimeOut ) Sleep Pre-condition VVBAT<PTV Figure 17: The Charging Profile of the ACT5880 Charger. VVBAT ICHARGE Precondition Top-off Suspend (or floating ) Fast charge VBAT regulation (voltage ) Fast charge regulation (current) Precondition threshold (voltage ) Top-off start (voltage ) Precondition regulation (current) Current=0 End of charge threshold (current) t Expended scale Charger State-Machine The I and V parameter changes, input condition and the time-out outputs of 2 timers trigger the state transitions. State Transition Table The LDO mode is a lonely state when the BATID detection is configured and the BATID reads invalid. The other states are subset available when the BATID reads valid or the BATID detection is not configured. Refer to Table 11 for transition details. Pre-condition State When the VVBAT is less than the precondition threshold voltage, the cell is charged at a reduced current of either 45mA or 10% of the fast charge current, whichever is the greater. Fast-Charge State When VVBAT is greater than the precondition threshold and before it reaches to the battery regulation voltage, or over 200mV falls down from the battery regulation voltage, the charger operates Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Note: The PTV stands for pre-condition threshold voltage, the BRV stands for battery regulation voltage, the ICHG stands for charge path current and the IEOC stands for end of charge current. Top-Off State In the Top-Off state, the cell is charged in constant voltage mode where the VVBAT is regulated at battery regulation voltage, which equals to the charge termination voltage specified in battery specification. The charge current goes less and less from the fast charge current as the charging is on and on, against the chemical and physical composition changes in the cell. Once the charge current goes less than the end of charge current threshold, the state machine jumps into Sleep State while the cell is recognized as full charged, the state is also the state of Sleep. - 80 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 Sleep State In the Sleep State, the charger represents as highimpedance to the cell and is with only the leakage current. The VVBAT is actively monitored by the state machine all the time. When VVBAT drop of typical 200mV being seen, the state machine begins a new charge cycle. Time-Fault State If the function is enabled, the pre-condition charge time are counted. When the pre-condition time-out happens, the state machine jumps into Time-Fault State. The Time-Fault State could only exit into End -of-Charge State when VVBAT ever goes to less than the pre-condition threshold voltage or BATID ever reads invalid, which is presumably a battery replacement. Charge input power recycle does not reset the Time-Fault State. Temp-Fault When this function is enabled, the battery temperature is monitored whenever a suitable power applies on CHGIN. When battery is too cold or too hot, the state machine jumps into Sleep State for the temp-fault. In this state, the charger represents as high impedance to the cell, the charger circuitry remains functional waiting for the battery thermal condition changes. of the latest status of the respective state by the time of reading and a bit to specify which kind of change for asserting interrupt. It is factory-option to have the Temp-Fault state or the BATID state to use the same set of 3 bits for configuring and flag. When Temp-Fault option is selected, which enables the battery thermal condition, the BATID state is not cared for interrupting. When the BATID is selected, the battery thermal condition is disabled, then the BATID state uses the set of the 3 bits. Refer to the INTERRUPT DESCRIPTION table for more details. Reading the CHGSTAT byte to clear the asserted interrupt. Safe Charge and Operation It is important to a system running on high energy battery that it only charges and operates on a qualified cell, and the behavior is within an predictable safe situation. The ACT5880 has following features available for system design selection. Resistive Battery Identification The ACT5880 has 3 auxiliary ADC inputs. The auxiliary input could be used to read voltage when forcing a current through the designed identification resistor in the battery pack. Charge State Output Charge Safety Timer nSTAT Output The nSTAT is an open-drain output for simple charge status output. It has an internal 8mA current limit and is capable to drive an LED for visual indication without the need of current limit resistor or other external circuitry doing the current limit. The nSTAT sinks current in precondition state, fastcharge state and top-off state. It turns into high impedance in sleep state and time-fault state. CHG_STAT0[ ] and CHG_STAT1[ ] registers indicate 4 different charge states, which are the Off state (the force suspend state, the Time-Fault state, the Temp-Fault state or the LDO mode), the Sleep state, the Fast-Charge state or Top-Off state and the Pre-condition state. Those bits can be read through the I2C interface. The ACT5880 has 2 configurable time-out timers to count the elapsed time during precondition and the overall elapsed time during charge. When this function is enabled, if the cell could not be charged to correct state in predicted maximum time, the charger stops charging and restarts only when the battery is replaced presumably. Both time-out periods are programmable, refer to the REGISTER MAP AND DESCRIPTIONS section for more details. Battery Thermal Condition Charge Oriented Interrupts The battery thermal condition is a feature option against ordering. If this feature is optioned, the battery temperature is monitored and the charging is allowed only when the battery voltage is within a specified temperature window for the safe of battery and the equipment normal operation. When the configuration enables to assert interrupt, the state change in the charger asserts interrupt to call service from the host system. The interrupt configuration is flexible to select which state and what kind of state change for interrupt assertion. Each interrupt has 2 bits to allow interrupt, one bit Precise window comparators are used for battery thermal condition, see the Figure 18 for circuit diagram. The window thresholds are trimmed to 2 precise ratios, and the external sense string is forced with the same force voltage used for comparators, the VCHGIN. The 2 resistors, RA and Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 81 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 RB, are used to condition the string to have the desired ratios at the wanted hot threshold temperature and cold threshold temperature. Figure 18: The Battery Thermal Condition Circuit. CHGIN Battery Assembly NTC =r·R2 5 0.748 RA =A·R2 5 ACT5880 TH RB =B·R2 5 0.349 USB circuit, the pull-up of charge state LED, the pull-up for BATID input, the pull-up for ACIN input and the pull-up for TH input. It may not be allowed to apply higher voltage on the CHGIN considering those other connections. Typical Application Consideration The charger circuit is well compensated, can be used to charge various capacities cells without modifying the input and output decoupling caps, which is 6.8μF~22μF for the input and 4.7μ~10μF for the output. Autonomic and Slave Charge GA (Ground ) The charge state machine in the ACT5880 is a complete autonomy. It senses the condition parameters, manages charge profile and indicates charge status without any foreign involvement. The normal temperature range cells typically work in -20°C to 40°C while the extended range is -20°C to 60°C. Giving the a NTC thermistor with 25°C characteristic resistance of R25, the resistance ratio at hot threshold temperature is rH and at cold threshold temperature is rC, the proportion factor A and B for having the 2 precise ratios 0.748 and 0.349 are found as: A=0.411·(rC−rH) B=0.220·rC−1.22·rH It is necessary to verify how much power is desired to bias the selected NTC thermister, to assure no excessive self heating generated. The resistance ratio r is the ratio of the resistance at a temperature to the resistance at 25°C. This ratio is found from the NTC specification in a table or a curve plot. Reverse Block The ACT5880 has a reverse block circuit in the charge path. Whenever the VCHGIN is less than VVBAT, as low as to 0V, the reverse block circuit prevents the reverse leakage from VBAT to CHGIN and the state machine jumps into Sleep State. This reverse block circuit does not work in LDO mode operation. Input Over Voltage The CHGIN allows applying continuous 12V and momentary 14V on it. When the voltage applied on CHGIN is greater than the over voltage threshold, the state machine jumps into Sleep State and charging stops. The charger wakes up the host system, and calls for host system involvement if it is configured so. With this mechanism, the ACT5880 could work as a slave charger with host system involvement on demand. Li+ Poly Cell and Li+ Cell Charge The scheme and the default setting are optimized for single cell Li+ poly charging. Li+ poly cells with 4.2V charge termination voltage, which are the most common battery types in phone designs. In case of using 18650 cylindrical cell, which is typically with 4.1V charge termination voltage (the termination voltage is anode material dependent, is specified for a battery model), applying 4.2V on it does not cause instant damage. It is possible to start with 4.2V battery regulation voltage and then program it to 4.1V later, but this is not rational for safe charging. Contact factory for ordering parts with 4.1V default. NiMH cells charge Though the charge scheme is not optimized for charging NiMH cells, its current limit and voltage limit, auto-restart features make the ACT5880 charger a practically applicable charger in fix wireless terminal applications for 3 NiMH cells charging with its 4.2V to 4.4V battery regulation voltages. In this kind of applications, the cells are floating charged at 1.4V to 1.47V per cell, which is in the good range for floating and uses the most part of the battery capability. Figure 19 shows the typical curves for NiMH battery. As in the real application circuitry often has other connection to the CHGIN, such as the VBUS of Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 82 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 1.4V RDDW is 220kΩ. The input of an adaptor in compliance with the "Battery Charging" and the "YD/T1591" specifications is identified if both the CHGIN and the ACIN are read valid. Only the CHGIN read valid is for USB host attached or for hub attached, while only the ACIN read valid is for USB OTG A-device attached or for an over-loaded weak adaptor attached. The resistive detection provides reliable detection in most cases but the case of a USB OTG A-device powering the VBUS with its local 5V, which is a known operation state of the device. The RDUP and the RISO should be placed close to the traces connecting the USB receptacle pins and USB PHY pins, for less branching effect, which is important to running high speed transmission. 1.2V Figure 20: Figure 19: The Charge and Discharge Curves for NiMH Cell. 1.6V 1C 0.33C 0.1C 1.4V 1.2V Charge Curve at 25˚C 80% 100%120% 1.6V 40˚C 20˚C 0˚C 1.4V 1.2V Charge Curve at 1C charge 80% 100%120% 1.0V 0.2C discharge at 25˚C The Sample Circuit for USB Charging. 1C VBUS 1.8C Long Cord Power Operation When a device whose normal operation is with a power cord connected, the charger may frequently seesaw charges the battery. Programming the fast charge current to a smaller volume could have the end of charge current less than the operation current and then the end of charge condition does not happen, forces the charger into floating. The floating state causes less aging than the frequent seesaw charge does. For staying in floating, the total charge time-out function should be disabled and the battery regulation should be programmed to 100mV lower than the nominal battery charge termination voltage, which is desired for safe floating and enlarges the battery life cycles. USB Charging The ACT5880 provides the adaptor charge input detection, the battery installed detection, the CHGLEV charge current set input and with few programmable registers for the USB charging. 3 situations in battery powered devices specified in the "Battery Charging" specification of the USB IF are supported, the no-battery situation, the weak/dead battery situation and the battery normal situation. Specified device behavior in those situations is required only if the power source is identified as a host charger or a hub charger. The ACT5880 deploys the resistive method recommended by the USB IF for the power source identification, with its precise threshold ACIN input. Ref to the Figure 20, a sample circuit uses single port for both USB connection and charging, in which the RDUP is 220kΩ, the RISO is 240kΩ and the Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Foreign Adaptor or USB VBUS DD+ RISO USB connectors Device USB I/F RDUP ACIN RDDW CHGIN ACT5880 When a suitable voltage power applied on the CHGIN, and while charging function allowed (SUSCHG=0), if no battery detected, the charger path turns into the LDO mode, in which it regulates the VBAT voltage to power the system. The system defines its way of operation in no-battery situation, either as a no-battery USB device or turns its self into device suspend mode with less than 2.5mA drawn from USB port. In the LDO mode, the output voltage is set by the VSET[ ], the pass current is limited to the fast charge current set as a function of the ISET[ ] and the CHGLEV, and the charge timers are cleared. The thermal regulation keeps preventing the die from overheating. When a USB or a hub is attached while the device is with a weak/dead battery from the device system point of view, while the charging function is default enabled (SUSCHG=0), the ACT5880 starts charging with the fast charge set by the CHGLEV or precondition charges the battery, dependent on if the battery voltage is greater or less than the precondition threshold. The CHGLEV should be connected to an I/O of the host system with a pulldown resistor around 1MΩ. Before the processor - 83 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 could start normal operation and possibly changes the I/O output, the ACT5880 preconditions and then charges battery with only 90mA current limit, as specified in the "Battery Charging", until the battery is charged to high enough voltage for device system to start. with VGTH greater than 2V and to be effectively conductive when VGTH is 5V. The QOTG is used to isolate the capacitance on 5V rail during the VBUS pulsing required by the SRP, and also provides a controlled path for using the external 5V from VBUS to replace the internal 5V rail. If USB attaching is identified in a battery normal system, the device system should start and try to connect the host within 100ms, as required by the USB protocol. Within this 100ms, 100mA drawn from the port is allowed, what is greater than the 90mA the ACT5880 takes. After the connection , the device system takes control of charging, either charging as a standard load to USB port or pouring larger current as allowed, or turning into USB SUSPEND without charging. Figure 22: The Sample Circuit for Using External 5V rail. VCC RIDUP 5V rail QOTG VBUS DD+ ID VBUS Device System Fast Charge Current Adaptive The over load to the USB port or a weak adaptor could be identified by the loss of reading CHGIN valid while the ACIN keeps reading valid. If the over load happens, the device system could program the ACT5880 to a less fast charge current volume to make the power source normal while still getting as much as possible power. 3V I/O CHGIN ACT5880 Figure 23: The Sample Circuit of Dual-inputs and External 5V. Dual inputs and USB-OTG Paths In applications that 2 power input receptacles wanted, 2 low forward voltage diodes and a 240kΩ resistor RDAD are used in addition to circuit in Figure 20, as showed in Figure 21. When no suitable input attaches to the Adaptor In, the circuit works similarly to the circuit in the Figure 20. When suitable input attaches to the Adaptor In, both ACIN and CHGIN are read valid, regardless what attaches to the USB receptacle. RIDUP VCC 3V I/O VBUS DDN DDP RISO RDUP Device USB I/F 3V I/O 3V I/O ACIN RDDW The Sample Circuit for Dual-inputs Charging. VBUS VBUS DDN DDP DD+ Device USB I/F USB connectors RDUP Adaptor In CHGIN Figure 23 is a sample of providing high current 5V from an adaptor to the VBUS and for replacing the internal 5V rail. All the 3 PFETs should be good for control with 3V I/O, level shifters are desired otherwise. ACIN RDAD CHGIN ACT5880 RDAD RISO RDDW Adaptor In QOTG VBUS DD+ ID Figure 21: Foreign Adaptor or USB 5V rail ACT5880 Figure 22 is the typical circuit connecting a 5V internal rail to the VBUS for providing power for OTG application. In this circuit the QOTG has to be Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 84 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 THERMAL ANALYSIS The package thermal dissipation is not designed to handle the total heating generated by run every circuit at its maximum rating, which is an over-killed situation for true applications. The sum of nominal LDO maximum current is 2.18A and the total DC/DC input equivalent current is 0.95A to 1.06A for battery voltage 3.6V to 4.2V, which are 2.4W to 3.3W power dissipation respectively in the ACT5880. Those numbers are greater than the maximum power dissipation for the ACT5880 in FC FBGA package, what is around 2W at 25°C. Thermal Budget Allocation during Charging Reference to the total current in Table 12, what is over the possible maximum charge current of the ACT5880. This implies that in worst case there is no current from adaptor is allocated for charge. Eventually, the die temperature regulation to charge current would allocate the thermal budget to other circuits, to the circuit desired for system operation firstly. Typical Operation Condition The worst case thermal budget analysis against the typical application is necessary. A sample case is simultaneous video capture and transmission operation condition. Table 12 is a reference for thermal budget analysis with experience data. Users should use their own data to replace those in this table for their designs. Table 12: The Thermal Condition Analysis. CHANNEL VOLTAGE CURRENT BUDGE LOAD BLOCK (V) (mA) T OUT1 DC/DC 1.2 Out:600 In:190 0.07 COREs OUT2 DC/DC 1.8 Out:350 In:165 0.07 Memory OUT3 DC/DC 5 Out:300 In:390 0.13 4.3’’ Backlight and OTG OUT4 2.85 150 0.2 RF TxRx OUT5 2.85 150 0.2 RF digital OUT6 2.85 50 0.07 TCXO OUT7 3 200 0.24 I/O, ROMs OUT8 2.5 150 0.26 I/O, Memory OUT9 1.2 50 0.15 PLL OUT10 3.3 50 0.04 CODEC OUT11 1.8 25 0.06 SIM OUT12 1.8 150 0.36 Camera digital OUT13 2.8 80 0.11 Camera analog 3 OD drivers 0 0 LED Total 1800 1.96 Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 85 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. ACT5880 Rev 2, 03-Sep-13 PACKAGE OUTLINE AND DIMENSIONS 81 Balls FC FBGA; Pitch: 0.5mm; Ball: 0.3mm. Active-Semi, Inc. reserves the right to modify the circuitry or specifications without notice. Users should evaluate each product to make sure that it is suitable for their applications. Active-Semi products are not intended or authorized for use as critical components in life-support devices or systems. Active-Semi, Inc. does not assume any liability arising out of the use of any product or circuit described in this datasheet, nor does it convey any patent license. Active-Semi and its logo are trademarks of Active-Semi, Inc. For more information on this and other products, contact [email protected] or visit http://www.active-semi.com. is a registered trademark of Active-Semi. Active-Semi Confidential―Do Not Copy or Distribute ActivePMUTM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. - 86 - www.active-semi.com Copyright © 2013 Active-Semi, Inc. 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