AUIRLR3110Z AUIRLU3110Z Features l l l l l l l Advanced Process Technology Ultra Low On-Resistance 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified * D G S Description VDSS RDS(on) typ. max. ID (Silicon Limited) ID (Package Limited) k I-Pak AUIRLU3110Z D-Pak AUIRLR3110Z Specifically designed for Automotive applications, thi Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. 100V 11mΩ 14mΩ 63A 42A Absolute Maximum Ratings Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied.Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified. Parameter ID @ TC = 25°C ID @ TC = 100°C ID @ TC = 25°C IDM PD @TC = 25°C VGS EAS (Thermally limited) EAS (Tested ) IAR EAR TJ TSTG Max. Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Package Limited) c Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Single Pulse Avalanche Energy Tested Value Avalanche Current Repetitive Avalanche Energy Operating Junction and Storage Temperature Range Reflow Soldering Temperature, for 10 seconds Mounting Torque, 6-32 or M3 screw d c h g Units k k 63 45 42 250 140 0.95 ±16 110 140 See Fig.12a, 12b, 15, 16 A W W/°C V mJ A mJ -55 to + 175 °C 300 10 lbf in (1.1N m) y y Thermal Resistance RθJC RθJA RθJA 2014-8-24 j Parameter Junction-to-Case Junction-to-Ambient (PCB mount) Junction-to-Ambient i 1 Typ. Max. Units ––– ––– ––– 1.05 40 110 °C/W www.kersemi.com AUIRLR/U3110Z Static Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter V(BR)DSS ΔV(BR)DSS/ΔTJ RDS(on) Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance VGS(th) Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current gfs IDSS IGSS Min. Typ. Max. 100 ––– ––– ––– 1.0 52 ––– ––– ––– ––– ––– 0.077 11 12 ––– ––– ––– ––– ––– ––– ––– ––– 14 16 2.5 ––– 20 250 200 -200 Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Units Conditions V VGS = 0V, ID = 250μA V/°C Reference to 25°C, ID = 1mA mΩ VGS = 10V, ID = 38A VGS = 4.5V, ID = 32A V VDS = VGS, ID = 100μA S VDS = 25V, ID = 38A μA VDS = 100V, VGS = 0V VDS = 100V, VGS = 0V, TJ = 125°C nA VGS = 16V VGS = -16V e e Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Qg Qgs Qgd td(on) tr td(off) tf LD Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance ––– ––– ––– ––– ––– ––– ––– ––– 34 10 15 24 110 33 48 4.5 48 ––– ––– ––– ––– ––– ––– ––– nC ns nH ID = 38A VDS = 50V VGS = 4.5V VDD = 50V ID = 38A RG = 3.7Ω VGS = 4.5V Between lead, e e D LS Internal Source Inductance ––– 7.5 ––– 6mm (0.25in.) from package Ciss Coss Crss Coss Coss Coss eff. Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance ––– ––– ––– ––– ––– ––– 3980 310 130 1820 170 320 ––– ––– ––– ––– ––– ––– and center of die contact VGS = 0V VDS = 25V ƒ = 1.0MHz VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz VGS = 0V, VDS = 80V, ƒ = 1.0MHz VGS = 0V, VDS = 0V to 80V pF G S f Source-Drain Ratings and Characteristics Min. Typ. Max. IS Continuous Source Current Parameter ––– ––– 63 Units ISM (Body Diode) Pulsed Source Current ––– ––– 250 showing the integral reverse VSD trr Qrr ton (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time 1.3 51 63 p-n junction diode. TJ = 25°C, IS = 38A, VGS = 0V TJ = 25°C, IF = 38A, VDD = 50V di/dt = 100A/μs A c ––– ––– ––– ––– 34 42 Conditions MOSFET symbol V ns nC D G e S e Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11). Limited by TJmax, starting TJ = 25°C, L = 0.16mH,RG = 25Ω, IAS = 38A, VGS =10V. Part not recommended for use above this value. Pulse width ≤ 1.0ms; duty cycle ≤ 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS . Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance. 2014-8-24 2 This value determined from sample failure population. 100% tested to this value in production. When mounted on 1" square PCB (FR-4 or G-10 Material). Rθ is measured at TJ approximately 90°C. Calculated continuous current based on maximum allowable junction temperature. Bond wire current limit is 42A. Note that current limitations arising from heating of the device leads may occur with some lead mounting arrangements. www.kersemi.com AUIRLR/U3110Z Qualification Information† Automotive (per AEC-Q101) Qualification Level Moisture Sensitivity Level Comments: This part number(s) passed Automotive qualification. IR’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. 3L-D PAK MSL1 3L-I PAK N/A Machine Model ESD †† ††† Class M4(+/- 700V ) (per AEC-Q101-002) Human Body Model ††† Class H1C(+/- 2000V ) (per AEC-Q101-001) Charged Device Model ††† Class C5(+/- 2000V ) (per AEC-Q101-005) Yes RoHS Compliant † Qualification standards can be found at International Rectifier’s web site: http//www.irf.com/ †† Exceptions to AEC-Q101 requirements are noted in the qualification report. ††† Highest passing voltage 2014-8-24 3 www.kersemi.com AUIRLR/U3110Z 1000 1000 VGS 15V 10V 8.0V 4.5V 3.5V 3.0V 2.7V 2.5V 100 BOTTOM 10 TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 100 1 0.1 2.5V BOTTOM 10 2.5V ≤60μs PULSE WIDTH ≤60μs PULSE WIDTH Tj = 175°C Tj = 25°C 0.01 0.1 1 10 1 100 0.1 1000 Fig 1. Typical Output Characteristics 10 100 1000 Fig 2. Typical Output Characteristics 1000 150 Gfs, Forward Transconductance (S) ID, Drain-to-Source Current (Α) 1 V DS, Drain-to-Source Voltage (V) V DS, Drain-to-Source Voltage (V) T J = 175°C 100 10 T J = 25°C 1 VDS = 25V ≤60μs PULSE WIDTH 0.1 0 2 4 6 8 10 12 14 T J = 25°C 125 100 T J = 175°C 75 50 V DS = 10V 300μs PULSE WIDTH 25 0 16 0 25 50 75 ID,Drain-to-Source Current (A) VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics 2014-8-24 VGS 15V 10V 8.0V 4.5V 3.5V 3.0V 2.7V 2.5V Fig 4. Typical Forward Transconductance vs. Drain Current 4 www.kersemi.com AUIRLR/U3110Z 100000 VGS, Gate-to-Source Voltage (V) ID= 38A C oss = C ds + C gd 10000 C, Capacitance(pF) 5.0 VGS = 0V, f = 1 MHZ C iss = C gs + C gd, C ds SHORTED C rss = C gd Ciss 1000 Coss Crss 100 4.0 VDS= 80V VDS= 50V 3.0 2.0 1.0 0.0 10 1 10 0 100 Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 1000 ID, Drain-to-Source Current (A) T J = 175°C T J = 25°C 1 100μsec 1msec 10msec 10 DC Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 1 0.1 0 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 1 10 100 1000 VDS, Drain-to-Source Voltage (V) VSD, Source-to-Drain Voltage (V) Fig 8. Maximum Safe Operating Area Fig 7. Typical Source-Drain Diode Forward Voltage 2014-8-24 40 OPERATION IN THIS AREA LIMITED BY R DS(on) 100 10 30 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 1000 ISD, Reverse Drain Current (A) 20 QG Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) 100 10 5 www.kersemi.com AUIRLR/U3110Z 70 ID, Drain Current (A) 60 RDS(on) , Drain-to-Source On Resistance (Normalized) 3.0 Limited By Package 50 40 30 20 10 0 ID = 63A VGS = 10V 2.5 2.0 1.5 1.0 0.5 25 50 75 100 125 150 175 -60 -40 -20 0 20 40 60 80 100120140160180 T C , Case Temperature (°C) T J , Junction Temperature (°C) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Normalized On-Resistance vs. Temperature Thermal Response ( Z thJC ) 10 1 D = 0.50 0.20 0.10 0.05 0.1 τJ 0.02 0.01 0.01 R1 R1 τJ τ1 R2 R2 τC τ2 τ1 τ2 Ci= τi/Ri Ci i/Ri SINGLE PULSE ( THERMAL RESPONSE ) τ Ri (°C/W) τi (sec) 0.383 0.000267 0.667 0.003916 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 2014-8-24 6 www.kersemi.com AUIRLR/U3110Z EAS , Single Pulse Avalanche Energy (mJ) 300 15V DRIVER L VDS D.U.T RG VGS 20V + V - DD IAS tp A 0.01Ω Fig 12a. Unclamped Inductive Test Circuit ID 4.4A 6.5A BOTTOM 38A TOP 250 200 150 100 50 0 25 V(BR)DSS 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) tp Fig 12c. Maximum Avalanche Energy vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms 3.0 VGS(th) Gate threshold Voltage (V) QG 10 V QGS QGD VG Charge Fig 13a. Basic Gate Charge Waveform 2.5 2.0 1.5 1.0 ID = 100μA ID = 250μA ID = 1.0mA ID = 1.0A 0.5 0.0 -75 -50 -25 0 L DUT 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) VCC 1K Fig 14. Threshold Voltage vs. Temperature Fig 13b. Gate Charge Test Circuit 2014-8-24 7 www.kersemi.com AUIRLR/U3110Z 100 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming Δ Tj = 150°C and Tstart =25°C (Single Pulse) Avalanche Current (A) Duty Cycle = Single Pulse 0.01 10 0.05 0.10 1 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming ΔΤ j = 25°C and Tstart = 150°C. 0.1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 15. Typical Avalanche Current vs.Pulsewidth EAR , Avalanche Energy (mJ) 150 TOP Single Pulse BOTTOM 1% Duty Cycle ID = 38A 125 100 75 50 25 0 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) Fig 16. Maximum Avalanche Energy vs. Temperature 2014-8-24 8 Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long as neither Tjmax nor Iav (max) is exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. ΔT = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 15, 16). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see figure 11) PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC Iav = 2DT/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav www.kersemi.com AUIRLR/U3110Z D.U.T Driver Gate Drive + - * D.U.T. ISD Waveform Reverse Recovery Current + RG P.W. Period VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer - D= Period P.W. + V DD • dv/dt controlled by R G • Driver same type as D.U.T. • I SD controlled by Duty Factor "D" • D.U.T. - Device Under Test + Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage - Body Diode VDD Forward Drop Inductor Curent ISD Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs RD V DS V GS D.U.T. RG + - V DD 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Fig 18a. Switching Time Test Circuit VDS 90% 10% VGS td(on) tr t d(off) tf Fig 18b. Switching Time Waveforms 2014-8-24 9 www.kersemi.com AUIRLR/U3110Z D-Pak (TO-252AA) Package Outline Dimensions are shown in millimeters (inches) D-Pak (TO-252AA) Part Marking Information Part Number AULR3110Z YWWA Logo XX or Date Code Y= Year WW= Work Week A= Automotive, Lead Free XX Lot Code 2014-8-24 10 www.kersemi.com I-Pak (TO-251AA) Package Outline AUIRLR/U3110Z ( Dimensions are shown in millimeters (inches) I-Pak (TO-251AA) Part Marking Information Part Number AULU3110Z YWWA Logo XX or Date Code Y= Year WW= Work Week A= Automotive, Lead Free XX Lot Code 2014-8-24 11 www.kersemi.com AUIRLR/U3110Z D-Pak (TO-252AA) Tape & Reel Information Dimensions are shown in millimeters (inches) TR TRR 16.3 ( .641 ) 15.7 ( .619 ) 12.1 ( .476 ) 11.9 ( .469 ) FEED DIRECTION TRL 16.3 ( .641 ) 15.7 ( .619 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 13 INCH 16 mm NOTES : 1. OUTLINE CONFORMS TO EIA-481. 2014-8-24 12 www.kersemi.com AUIRLR/U3110Z Ordering Information Base part Package Type AUIRLR3110Z DPak AUIRLU3110Z IPak 2014-8-24 Standard Pack Form Tube Tape and Reel Tape and Reel Left Tape and Reel Right Tube 13 Complete Part Number Quantity 75 2000 3000 3000 75 AUIRLR3110Z AUIRLR3110ZTR AUIRLR3110ZTRL AUIRLR3110ZTRR AUIRLU3110Z www.kersemi.com