EMLSI EM621FP8GV-55LL 256k x8 bit low power and low voltage full cmos static ram Datasheet

EM620FV8BT Series
Low Power, 256Kx8 SRAM
Document Title
256K x8 bit Low Power and Low Voltage Full CMOS Static RAM
Revision History
Revision No.
History
Draft Date
0.0
Initial Draft
July 16, 2007
0.1
0.1 Revision
VIH level change from 2.0V to 2.2V
Aug. 16, 2007
0.2
0.2 Revision
Fix typo error
Nov. 13, 2007
Emerging Memory & Logic Solutions Inc.
4F Korea Construction Financial Cooperative B/D, 301-1 Yeon-Dong, Jeju-Si, Jeju-Do, Rep.of Korea
Tel : +82-64-740-1712 Fax : +82-64-740-1749~1750 / Homepage : www.emlsi.com
Remark
Zip Code : 690-719
The attached data sheets are provided by EMLSI reserve the right to change the specifications and products. EMLSI will answer to your
questions about device. If you have any questions, please contact the EMLSI office.
1
EM620FV8BT Series
Low Power, 256Kx8 SRAM
256K x8 Bit Low Power and Low Voltage CMOS Static RAM
GENERAL DESCRIPTION
FEATURES
The EM620FV8BT series are fabricated by EMLSI’s
advanced full CMOS process technology. The families
support industrial temperature range and Chip Scale Package for user flexibility of system design. The families also
supports low data retention voltage for battery back-up
operation with low data retention current.
The EM620FV8BT series are available in KGD, JEDEC
standard 32 pin 8mm x 20mm TSOP.
- Process Technology : 0.15mm Full CMOS
- Organization :256K x8
- Power Supply Voltage
=> EM620FV8BS Series : 2.7V~3.6V
- Low Data Retention Voltage : 1.5V (MIN)
- Three state output and TTL Compatible
- Packaged product designed for 45/55/70ns
- Package Type: 32-TSOP1
PRODUCT FAMILY
Power Dissipation
Product
Family
Operating
Temperature
Vcc Range
Speed
Standby
(ISB1, Typ.)
Operating
(ICC1.Max)
PKG Type
EM620FV8BT-45LF
Industrial (-40 ~ 85oC)
2.7V~3.6V
45ns
1µA
3mA
32-TSOP1
EM620FV8BT-55LF
Industrial (-40 ~ 85oC)
2.7V~3.6V
55ns
1µA
3mA
32-TSOP1
EM620FV8BT-70LF
Industrial (-40 ~ 85oC)
2.7V~3.6V
70ns
1µA
3mA
32-TSOP1
FUNCTIONAL BLOCK DIAGRAM
PIN DESCRIPTION
Pre-charge Circuit
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
EM620FV8BT-45LF
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
OE
A10
CS1
I/O 7
I/O 6
I/O 5
I/O 4
I/O 3
VSS
I/O 2
I/O 1
I/O 0
A0
A1
A2
A3
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
VCC
VSS
Row Select
A11
A9
A8
A13
WE
CS2
A15
VCC
A17
A16
A14
A12
A7
A6
A5
A4
I/O0 ~ I/O7
Data
Cont
Memory Array
1024 x 2048
I/O Circuit
Column Select
A10 A11 A12 A13 A14 A15 A16 A17
Name
Function
Name
Function
CS1,CS2
Chip select inputs
Vcc
Power Supply
OE
Output Enable input
Vss
Ground
WE
Write Enable input
NC
No Connection
A0~A17
Address Inputs
I/O0~I/O7
Data Inputs/Outputs
WE
OE
CS1
CS2
2
Control Logic
EM620FV8BT Series
Low Power, 256Kx8 SRAM
ABSOLUTE MAXIMUM RATINGS *
Parameter
Symbol
Voltage on Any Pin Relative to Vss
Minimum
Unit
VIN, VOUT
-0.2 to 4.0V
V
Voltage on Vcc supply relative to Vss
VCC
-0.2 to 4.0V
V
Power Dissipation
PD
1.0
W
Operating Temperature
TA
-40 to 85
o
C
* Stresses greater than those listed above “Absolute Maximum Ratings” may cause permanent damage to the device. Functional oper-
ation should be restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods
may affect reliability.
FUNCTIONAL DESCRIPTION
CS1
CS2
OE
WE
I/O0-7
Mode
Power
H
X
X
X
High-Z
Deselected
Stand by
X
L
X
X
High-Z
Deselected
Stand by
L
H
H
H
High-Z
Output Disabled
Active
L
H
L
H
Data Out
Read
Active
L
H
X
L
Data In
Write
Active
Note: X means don’t care. (Must be low or high state)
3
EM620FV8BT Series
Low Power, 256Kx8 SRAM
RECOMMENDED DC OPERATING CONDITIONS 1)
Parameter
Symbol
Min
Typ
Max
Unit
Supply voltage
VCC
2.7
3.3
3.6
V
Ground
VSS
0
0
0
V
Input high voltage
VIH
2.2
-
VCC + 0.22)
V
Input low voltage
VIL
-0.23)
-
0.6
V
1.
2.
3.
4.
TA= -40 to 85oC, otherwise specified
Overshoot: VCC +2.0 V in case of pulse width < 20ns
Undershoot: -2.0 V in case of pulse width < 20ns
Overshoot and undershoot are sampled, not 100% tested.
CAPACITANCE1) (f =1MHz, TA=25oC)
Item
Symbol
Test Condition
Min
Max
Unit
Input capacitance
CIN
VIN=0V
-
8
pF
Input/Ouput capacitance
CIO
VIO=0V
-
10
pF
1. Capacitance is sampled, not 100% tested.
DC AND OPERATING CHARACTERISTICS
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Input leakage current
ILI
VIN=VSS to VCC
-1
-
1
uA
Output leakage current
ILO
CS1=VIH or CS2=VIL or OE=VIH or WE=VIL
VIO=VSS to VCC
-1
-
1
uA
Operating power supply
ICC
IIO=0mA, CS1=VIL, CS2=WE=VIH, VIN=VIH or VIL
-
-
3
mA
ICC1
Cycle time=1µs, 100% duty, IIO=0mA,
CS1<0.2V, CS2>VCC-0.2V,
VIN<0.2V or VIN>VCC-0.2V
-
-
3
mA
45ns
-
-
35
ICC2
Cycle time = Min, IIO=0mA, 100% duty,
CS1=VIL, CS2=VIH,
VIN=VIL or VIH
55ns
-
-
30
70ns
-
-
25
Average operating current
mA
Output low voltage
VOL
IOL = 2.1mA
-
-
0.4
V
Output high voltage
VOH
IOH = -1.0mA
2.4
-
-
V
Standby Current (TTL)
ISB
-
-
0.3
mA
-
11)
10
uA
Standby Current (CMOS)
ISB1
CS1=VIH, CS2=VIL, Other inputs=VIH or VIL
CS1>VCC-0.2V, CS2>VCC-0.2V (CS1 controlled)
or 0V<CS2<0.2V (CS2 controlled),
Other inputs = 0~VCC
(Typ. condition : VCC=3.3V @ 25oC)
(Max. condition : VCC=3.6V @ 85oC)
NOTES
1. Typical values are measured at Vcc=3.3V, TA=25oC and not 100% tested.
4
LF
EM620FV8BT Series
Low Power, 256Kx8 SRAM
VTM3)
AC OPERATING CONDITIONS
Test Conditions (Test Load and Test Input/Output Reference)
R12)
Input Pulse Level : 0.4 to 2.2V
Input Rise and Fall Time : 5ns
Input and Output reference Voltage : 1.5V
Output Load (See right) : CL1) = 100pF + 1 TTL (70ns)
CL1) = 30pF + 1 TTL (45ns/55ns)
1. Including scope and Jig capacitance
R2=3150 ohm
2. R1=3070 ohm,
3. VTM=2.8V
4. CL = 5pF + 1 TTL (measurement with tLZ1,2, tHZ1,2, tOLZ, tOHZ, tWHZ)
R22)
CL1)
READ CYCLE (Vcc = 2.7V to 3.6V, Gnd = 0V, TA = -40oC to +85oC)
Parameter
Symbol
45ns
55ns
70ns
Min
Max
Min
Max
Min
Max
Unit
Read cycle time
tRC
45
-
55
-
70
-
ns
Address access time
tAA
-
45
-
55
-
70
ns
Chip select to output
tCO1, tCO2
-
45
-
55
-
70
ns
tOE
-
25
-
25
-
35
ns
tLZ1, tLZ2
10
-
10
-
10
-
ns
Output enable to low-Z output
tOLZ
5
-
5
-
5
-
ns
Chip disable to high-Z output
tHZ1, tHZ2
0
20
0
20
0
25
ns
Output disable to high-Z output
tOHZ
0
15
0
20
0
25
ns
Output hold from address change
tOH
10
-
10
-
10
-
ns
Output enable to valid output
Chip select to low-Z output
WRITE CYCLE (Vcc = 2.7V to 3.6V, Gnd = 0V, TA = -40oC to +85oC)
Parameter
Symbol
45ns
55ns
70ns
Unit
Min
Max
Min
Max
Min
Max
tWC
45
-
55
-
70
-
ns
tCW1, tCW2
45
-
45
-
60
-
ns
Address setup time
tAS
0
-
0
-
0
-
ns
Address valid to end of write
tAW
45
-
45
-
60
-
ns
Write pulse width
tWP
35
-
40
-
50
-
ns
Write recovery time
tWR
0
-
0
-
0
-
ns
Write to ouput high-Z
tWHZ
0
15
0
20
0
20
ns
Data to write time overlap
tDW
25
Data hold from write time
tDH
0
-
0
-
0
-
ns
End write to output low-Z
tOW
5
-
5
-
5
-
ns
Write cycle time
Chip select to end of write
5
25
30
ns
EM620FV8BT Series
Low Power, 256Kx8 SRAM
TIMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS1=OE=VIL, CS2=WE=VIH)
tRC
Address
tAA
tOH
Data Out
Data Valid
Previous Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE = VIH)
tRC
Address
tAA
tOH
tCO1,2
CS1
CS2
tHZ1,2
tOE
OE
Data Out
High-Z
tOHZ
tOLZ
Data Valid
tWHZ
tLZ1,2
NOTES (READ CYCLE)
1. tHZ1,2 and tOHZ are defined as the outputs achieve the open circuit conditions and are not referenced to output voltage levels.
2. At any given temperature and voltage condition, tHZ1,2(Max.) is less than tLZ1,2(Min.) both for a given device and from device to
device interconnection.
6
EM620FV8BT Series
Low Power, 256Kx8 SRAM
TIMING WAVEFORM OF WRITE CYCLE(1) (WE CONTROLLED)
tWC
Address
tCW1,2(2)
tWR(4)
CS1
CS2
tAW
tWP(1)
WE
tAS(3)
Data in
tDW
High-Z
High-Z
Data Valid
tWHZ
Data out
tDH
tOW
Data Undefined
TIMING WAVEFORM OF WRITE CYCLE(2) (CS1 CONTROLLED)
tWC
Address
tAS(3)
tCW1,2(2)
tWR(4)
CS1
CS2
tAW
tWP(1)
WE
tDW
Data in
Data out
Data Valid
High-Z
High-Z
7
tDH
EM620FV8BT Series
Low Power, 256Kx8 SRAM
TIMING WAVEFORM OF WRITE CYCLE(3) (CS2 CONTROLLED)
tWC
Address
tCW1,2(2)
tWR(4)
CS1
tAS(3)
CS2
tAW
tWP(1)
WE
tDW
Data in
Data out
tDH
Data Valid
High-Z
High-Z
NOTES (WRITE CYCLE)
1. A write occurs during the overlap(tWP) of low CS1, a high CS2 and low WE. A write begins at the latest
transition among CS1 goes low, CS2 goes high and WE goes low. A write ends at the earliest transition
among CS1 goes high, CS2 goes low and WE goes high. The tWP is measured from the beginning of write
to the end of write.
2. tCW is measured from the CS1 going low or CS2 going high to end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end or write to the address change. tWR applied in case a write ends as CS1
or WE going high or CS2 going low.
8
EM620FV8BT Series
Low Power, 256Kx8 SRAM
DATA RETENTION CHARACTERISTICS
Parameter
Symbol
VCC for Data Retention
VDR
Data Retention Current
IDR
Chip Deselect to Data Retention Time
tSDR
Operation Recovery Time
tRDR
Test Condition
ISB1 Test Condition
(Chip Disabled) 1)
VCC=1.5V, ISB1 Test Condition
(Chip Disabled) 1)
See data retention wave form
Min
Typ2)
Max
Unit
1.5
-
3.6
V
-
0.5
5.0
µA
0
-
-
tRC
-
-
NOTES
1. See the ISB1 measurement condition of data sheet page 4.
2. Typical value is measured at TA=25oC and not 100% tested.
DATA RETENTION WAVE FORM
tSDR
Data Retention Mode
tRDR
Vcc
3.0V
2.2V
VDR
CS1 > Vcc-0.2V
CS1
GND
Data Retention Mode
Vcc
3.0V
CS2
tRDR
tSDR
VDR
0.4V
CS2 < 0.2V
GND
9
ns
EM620FV8BT Series
Low Power, 256Kx8 SRAM
PACKAGE DIMENSIONS
32Pin - TSOP Type1
Unit : millimeters/Inches
10
EM620FV8BT Series
Low Power, 256Kx8 SRAM
SRAM PART CODING SYSTEM
EM X XX X X X XX X X - XX XX
1. EMLSI Memory
11. Power
2. Product Type
10. Speed
3. Density
4. Function
9. Package
5. Technology
8. Generation
6. Operating Voltage
7. Organization
1. Memory Component
EM --------------------- Memory
7. Organization
8 ---------------------- x8 bit
16 ---------------------- x16 bit
2. Product Type
6 ------------------------ SRAM
8. Generation
Blank ----------------- 1st generation
A ----------------------- 2nd generation
B ----------------------- 3rd generation
C ----------------------- 4th generation
D ----------------------- 5th generation
E ----------------------- 6th generation
F ----------------------- 7th generation
G ---------------------- 8th generation
3. Density
1 ------------------------- 1M
2 ------------------------- 2M
4 ------------------------- 4M
8 ------------------------- 8M
4. Function
0 ----------------------- Dual CS
1 ----------------------- Single CS
2 ----------------------- Multiplexed
3 ------------- Single CS / LBB, UBB(tBA=tOE)
4 ------------- Single CS / LBB, UBB(tBA=tCO)
5 ------------- Dual CS / LBB, UBB(tBA=tOE)
6 ------------- Dual CS / LBB, UBB(tBA=tCO)
9. Package
Blank ---------------- KGD, 48&36FpBGA
S ---------------------- 32 sTSOP1
T ---------------------- 32 TSOP1
U ---------------------- 44 TSOP2
V ---------------------- 32 SOP
5. Technology
F ------------------------- Full CMOS
10. Speed
45 ---------------------55 ---------------------70 ---------------------85 ---------------------10 ---------------------12 ----------------------
6. Operating Voltage
T ------------------------- 5.0V
V ------------------------- 3.3V
U ------------------------- 3.0V
S ------------------------- 2.5V
R ------------------------- 2.0V
P ------------------------- 1.8V
45ns
55ns
70ns
85ns
100ns
120ns
11. Power
LL ---------------------- Low Low Power
LF ---------------------- Low Low Power(Pb-Free & Green)
L ---------------------- Low Power
S ---------------------- Standard Power
11
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