AD ADG5204BRUZ-RL7 High voltage, latch-up proof, 4-channel multiplexer automatic test equipment Datasheet

High Voltage, Latch-Up Proof,
4-Channel Multiplexer
ADG5204
FEATURES
FUNCTIONAL BLOCK DIAGRAM
Latch-up proof
3 pF off source capacitance
26 pF off drain capacitance
−0.6 pC charge injection
Low leakage: 0.4 nA maximum at 85°C
±9 V to ±22 V dual-supply operation
9 V to 40 V single-supply operation
48 V supply maximum ratings
Fully specified at ±15 V, ±20 V, +12 V, and +36 V
VSS to VDD analog signal range
ADG5204
S1
S2
D
S3
S4
A0
A1
EN
09768-001
1 OF 4
DECODERS
Figure 1.
APPLICATIONS
Automatic test equipment
Data acquisition
Instrumentation
Avionics
Audio and video switching
Communication systems
GENERAL DESCRIPTION
PRODUCT HIGHLIGHTS
The ADG5204 is a complementary metal oxide semiconductor
(CMOS) analog multiplexer, comprising four single channels.
1.
The ultralow capacitance and charge injection of these switches
make them ideal solutions for data acquisition and sample-andhold applications, where low glitch and fast settling are required.
Fast switching speed together with high signal bandwidth make
the ADG5204 suitable for video signal switching.
2.
3.
The ADG5204 is designed on a trench process, which guards
against latch-up. A dielectric trench separates the P and N
channel transistors, thereby preventing latch-up even under
severe overvoltage conditions.
4.
The ADG5204 switches one of four inputs to a common output,
D, as determined by the 3-bit binary address lines, A0, A1, and
EN. Logic 0 on the EN pin disables the device. Each switch conducts equally well in both directions when on, and each switch
has an input signal range that extends to the supplies. In the off
condition, signal levels up to the supplies are blocked. All switches
exhibit break-before-make switching action.
5.
6.
Trench Isolation Guards Against Latch-Up.
A dielectric trench separates the P and N channel transistors,
thereby preventing latch-up even under severe overvoltage
conditions.
Ultralow Capacitance and <1 pC Charge Injection.
Dual-Supply Operation.
For applications where the analog signal is bipolar, the
ADG5204 can be operated from dual supplies up to ±22 V.
Single-Supply Operation.
For applications where the analog signal is unipolar, the
ADG5204 can be operated from a single rail power supply
up to 40 V.
3 V Logic-Compatible Digital Inputs.
VINH = 2.0 V, VINL = 0.8 V.
No VL Logic Power Supply Required.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2011 Analog Devices, Inc. All rights reserved.
ADG5204
TABLE OF CONTENTS
Features .............................................................................................. 1
Absolute Maximum Ratings ............................................................8
Applications....................................................................................... 1
ESD Caution...................................................................................8
Functional Block Diagram .............................................................. 1
Pin Configurations and Function Descriptions ............................9
General Description ......................................................................... 1
Truth Table .....................................................................................9
Product Highlights ........................................................................... 1
Typical Performance Characteristics ........................................... 10
Revision History ............................................................................... 2
Test Circuits..................................................................................... 14
Specifications..................................................................................... 3
Terminology .................................................................................... 16
±15 V Dual Supply ....................................................................... 3
Trench Isolation.............................................................................. 17
±20 V Dual Supply ....................................................................... 4
Applications Information .............................................................. 18
12 V Single Supply........................................................................ 5
Outline Dimensions ....................................................................... 19
36 V Single Supply........................................................................ 6
Ordering Guide .......................................................................... 19
Continuous Current per Channel, Sx or D............................... 7
REVISION HISTORY
5/11—Revision 0: Initial Version
Rev. 0 | Page 2 of 20
ADG5204
SPECIFICATIONS
±15 V DUAL SUPPLY
VDD = 15 V ± 10%, VSS = −15 V ± 10%, GND = 0 V, unless otherwise noted.
Table 1.
Parameter
ANALOG SWITCH
Analog Signal Range
On Resistance, RON
On-Resistance Match
Between Channels, ∆RON
On-Resistance Flatness, RFLAT(ON)
LEAKAGE CURRENTS
Source Off Leakage, IS (Off)
Drain Off Leakage, ID (Off)
Channel On Leakage, ID, IS (On)
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current, IINL or IINH
25°C
160
200
4.5
8
38
50
−40°C to +85°C
−40°C to +125°C
Unit
Test Conditions/Comments
VDD to VSS
V max
Ω typ
Ω max
Ω typ
VS = ±10 V, IS = −1 mA, see Figure 24
VDD = +13.5 V, VSS = −13.5 V
VS = ±10 V, IS = −1 mA
250
280
9
10
65
70
tON (EN)
tOFF (EN)
Break-Before-Make Time Delay, tD
nA typ
ISS
0.2
0.4
nA max
nA typ
0.1
0.02
0.2
0.4
1.2
VS = VD = ±10 V, see Figure 26
0.5
1.2
nA max
nA typ
nA max
V min
V max
μA typ
μA max
pF typ
VIN = VGND or VDD
2.0
0.8
0.002
3
175
230
155
205
150
175
80
285
320
255
285
200
215
−0.6
−80
−80
136
−6.8
3
26
30
45
55
0.001
VDD/VSS
1
VS = VS = ±10 V, VD = ∓10 V, see Figure 23
0.1
0.01
30
Charge Injection, QINJ
Off Isolation
Channel-to-Channel Crosstalk
−3 dB Bandwidth
Insertion Loss
CS (Off)
CD (Off)
CD, CS (On)
POWER REQUIREMENTS
IDD
VS = ±10 V, IS = −1 mA
VDD = +16.5 V, VSS = −16.5 V
0.01
±0.1
Digital Input Capacitance, CIN
DYNAMIC CHARACTERISTICS 1
Transition Time, tTRANSITION
Ω max
Ω typ
Ω max
70
1
±9/±22
Guaranteed by design; not subject to production test.
Rev. 0 | Page 3 of 20
ns typ
ns max
ns typ
ns max
ns typ
ns max
ns typ
ns min
pC typ
dB typ
dB typ
MHz typ
dB typ
pF typ
pF typ
pF typ
μA typ
μA max
μA typ
μA max
V min/max
VS = VS = ±10 V, VD = ∓10 V, see Figure 23
RL = 300 Ω, CL = 35 pF
VS = 10 V, see Figure 29
RL = 300 Ω, CL = 35 pF
VS = 10 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS = 10 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS1 = VS2 = 10 V, see Figure 30
VS = 0 V, RS = 0 Ω, CL = 1 nF, see Figure 32
RL = 50 Ω, CL = 5 pF, f = 100 kHz, see Figure 25
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 28
RL = 50 Ω, CL = 5 pF, see Figure 27
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 27
VS = 0 V, f = 1 MHz
VS = 0 V, f = 1 MHz
VS = 0 V, f = 1 MHz
VDD = +16.5 V, VSS = −16.5 V
Digital inputs = 0 V or VDD
Digital inputs = 0 V or VDD
GND = 0 V
ADG5204
±20 V DUAL SUPPLY
VDD = +20 V ± 10%, VSS = −20 V ± 10%, GND = 0 V, unless otherwise noted.
Table 2.
Parameter
ANALOG SWITCH
Analog Signal Range
On Resistance, RON
On-Resistance Match
Between Channels, ∆RON
On-Resistance Flatness, RFLAT(ON)
25°C
140
160
4.5
8
33
45
−40°C to +85°C
−40°C to +125°C
Unit
Test Conditions/Comments
VDD to VSS
V max
Ω typ
Ω max
Ω typ
VS = ±15 V, IS = −1 mA, see Figure 24
VDD = +18 V, VSS = −18 V
VS = ±15 V, IS = −1 mA
200
230
9
10
55
60
Ω max
Ω typ
Ω max
VS = ±15 V, IS = −1 mA
nA typ
VS = ±15 V, VD = ∓15 V, see Figure 23
LEAKAGE CURRENTS
Source Off Leakage, IS (Off)
0.01
0.1
0.01
0.2
0.4
Drain Off Leakage, ID (Off)
nA max
nA typ
0.1
0.02
0.2
0.4
1.2
VS = VD = ±15 V, see Figure 26
0.5
1.2
nA max
nA typ
nA max
V min
V max
μA typ
μA max
pF typ
VIN = VGND or VDD
Channel On Leakage, ID, IS (On)
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current, IINL or IINH
VDD = +22 V, VSS = −22 V
2.0
0.8
0.002
±0.1
Digital Input Capacitance, CIN
DYNAMIC CHARACTERISTICS 1
Transition Time, tTRANSITION
3
Break-Before-Make Time Delay, tD
160
215
150
185
150
175
75
Charge Injection, QINJ
Off Isolation
−0.6
−80
ns typ
ns max
ns typ
ns max
ns typ
ns max
ns typ
ns min
pC typ
dB typ
−80
150
−6
3
26
30
dB typ
MHz typ
dB typ
pF typ
pF typ
pF typ
tON (EN)
tOFF (EN)
260
290
225
255
195
210
30
Channel-to-Channel Crosstalk
−3 dB Bandwidth
Insertion Loss
CS (Off)
CD (Off)
CD, CS (On)
POWER REQUIREMENTS
IDD
ISS
50
70
0.001
VDD/VSS
1
110
1
±9/±22
Guaranteed by design; not subject to production test.
Rev. 0 | Page 4 of 20
μA typ
μA max
μA typ
μA max
V min/max
VS = ±15 V, VD = ∓15 V, see Figure 23
RL = 300 Ω, CL = 35 pF
VS = 10 V, see Figure 29
RL = 300 Ω, CL = 35 pF
VS = 10 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS = 10 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS1 = VS2 = 10 V, see Figure 30
VS = 0 V, RS = 0 Ω, CL = 1 nF, see Figure 32
RL = 50 Ω, CL = 5 pF, f = 100 kHz,
see Figure 25
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 28
RL = 50 Ω, CL = 5 pF, see Figure 27
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 27
VS = 0 V, f = 1 MHz
VS = 0 V, f = 1 MHz
VS = 0 V, f = 1 MHz
VDD = +22 V, VSS = −22 V
Digital inputs = 0 V or VDD
Digital inputs = 0 V or VDD
GND = 0 V
ADG5204
12 V SINGLE SUPPLY
VDD = 12 V ± 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.
Table 3.
Parameter
ANALOG SWITCH
Analog Signal Range
On Resistance, RON
On-Resistance Match
Between Channels, ∆RON
On-Resistance Flatness, RFLAT(ON)
LEAKAGE CURRENTS
Source Off Leakage, IS (Off)
Drain Off Leakage, ID (Off)
Channel On Leakage, ID, IS (On)
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current, IINL or IINH
25°C
340
500
5
20
145
280
0.01
0.1
0.01
0.1
0.02
0.2
−40°C to +85°C
−40°C to +125°C
Unit
Test Conditions/Comments
0 V to VDD
V max
Ω typ
Ω max
Ω typ
VS = 0 V to 10 V, IS = −1 mA, see Figure 24
VDD = 10.8 V, VSS = 0 V
VS = 0 V to 10 V, IS = −1 mA
610
700
21
22
335
370
0.2
0.4
0.4
1.2
0.5
1.2
2.0
0.8
0.002
±0.1
Digital Input Capacitance, CIN
DYNAMIC CHARACTERISTICS 1
Transition Time, tTRANSITION
tON (EN)
tOFF (EN)
Break-Before-Make Time Delay, tD
3
240
350
250
335
160
195
140
445
515
420
485
220
240
60
Charge Injection, QINJ
Off Isolation
Channel-to-Channel Crosstalk
−3 dB Bandwidth
Insertion Loss
CS (Off)
CD (Off)
CD, CS (On)
POWER REQUIREMENTS
IDD
−1.2
−80
−80
106
−11
3.5
29
33
40
VDD
1
65
9/40
Guaranteed by design; not subject to production test.
Rev. 0 | Page 5 of 20
Ω max
Ω typ
Ω max
nA typ
nA max
nA typ
nA max
nA typ
nA max
V min
V max
μA typ
μA max
pF typ
ns typ
ns max
ns typ
ns max
ns typ
ns max
ns typ
ns min
pC typ
dB typ
dB typ
MHz typ
dB typ
pF typ
pF typ
pF typ
μA typ
μA max
V min/max
VS = 0 V to 10 V, IS = −1 mA
VDD = 13.2 V, VSS = 0 V
VS = 1 V/10 V, VD = 10 V/1 V, see Figure 23
VS = 1 V/10 V, VD = 10 V/1 V, see Figure 23
VS = VD = 1 V/10 V, see Figure 26
VIN = VGND or VDD
RL = 300 Ω, CL = 35 pF
VS = 8 V, see Figure 29
RL = 300 Ω, CL = 35 pF
VS = 8 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS = 8 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS1 = VS2 = 8 V, see Figure 30
VS = 6 V, RS = 0 Ω, CL = 1 nF, see Figure 32
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 25
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 28
RL = 50 Ω, CL = 5 pF, see Figure 27
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 27
VS = 6 V, f = 1 MHz
VS = 6 V, f = 1 MHz
VS = 6 V, f = 1 MHz
VDD = 13.2 V
Digital inputs = 0 V or VDD
GND = 0 V, VSS = 0 V
ADG5204
36 V SINGLE SUPPLY
VDD = 36 V ± 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.
Table 4.
Parameter
ANALOG SWITCH
Analog Signal Range
On Resistance, RON
On-Resistance Match
Between Channels, ∆RON
On-Resistance Flatness, RFLAT(ON)
LEAKAGE CURRENTS
Source Off Leakage, IS (Off)
Drain Off Leakage, ID (Off)
Channel On Leakage, ID, IS (On)
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current, IINL or IINH
25°C
150
170
4.5
8
35
50
0.01
0.1
0.01
0.1
0.02
0.2
−40°C to +85°C
−40°C to +125°C
Unit
Test Conditions/Comments
0 V to VDD
V max
Ω typ
Ω max
Ω typ
VS = 0 V to 30 V, IS = −1 mA, see Figure 24
VDD = 32.4 V, VSS = 0 V
VS = 0 V to 30 V, IS = −1 mA
215
245
9
10
60
65
0.2
0.4
0.4
1.2
0.5
1.2
2.0
0.8
0.002
±0.1
Digital Input Capacitance, CIN
DYNAMIC CHARACTERISTICS 1
Transition Time, tTRANSITION
tON (EN)
tOFF (EN)
Break-Before-Make Time Delay, tD
3
180
250
170
220
170
210
80
275
305
251
285
215
220
30
Charge Injection, QINJ
Off Isolation
Channel-to-Channel Crosstalk
−3 dB Bandwidth
Insertion Loss
CS (Off)
CD (Off)
CD, CS (On)
POWER REQUIREMENTS
IDD
−0.6
−80
−80
136
−6.7
3
26
30
85
100
VDD
1
130
9/40
Guaranteed by design; not subject to production test.
Rev. 0 | Page 6 of 20
Ω max
Ω typ
Ω max
nA typ
nA max
nA typ
nA max
nA typ
nA max
V min
V max
μA typ
μA max
pF typ
ns typ
ns max
ns typ
ns max
ns typ
ns max
ns typ
ns min
pC typ
dB typ
dB typ
MHz typ
dB typ
pF typ
pF typ
pF typ
μA typ
μA max
V min/max
VS = 0 V to 30 V, IS = −1 mA
VDD = 39.6 V, VSS = 0 V
VS = 1 V/30 V, VD = 30 V/1 V, see Figure 23
VS = 1 V/30 V, VD = 30 V/1 V, see Figure 23
VS = VD = 1 V/30 V, see Figure 26
VIN = VGND or VDD
RL = 300 Ω, CL = 35 pF
VS = 18 V, see Figure 29
RL = 300 Ω, CL = 35 pF
VS = 18 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS = 18 V, see Figure 31
RL = 300 Ω, CL = 35 pF
VS1 = VS2 = 18 V, see Figure 30
VS = 18 V, RS = 0 Ω, CL = 1 nF, see Figure 32
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 25
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 28
RL = 50 Ω, CL = 5 pF, see Figure 27
RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 27
VS = 18 V, f = 1 MHz
VS = 18 V, f = 1 MHz
VS = 18 V, f = 1 MHz
VDD = 39.6 V
Digital inputs = 0 V or VDD
GND = 0 V, VSS = 0 V
ADG5204
CONTINUOUS CURRENT PER CHANNEL, Sx OR D
Table 5.
Parameter
CONTINUOUS CURRENT, Sx OR D PINS
VDD = +15 V, VSS = −15 V
TSSOP (θJA = 112.6°C/W)
LFCSP (θJA = 30.4°C/W)
VDD = +20 V, VSS = −20 V
TSSOP (θJA = 112.6°C/W)
LFCSP (θJA = 30.4°C/W)
VDD = 12 V, VSS = 0 V
TSSOP (θJA = 112.6°C/W)
LFCSP (θJA = 30.4°C/W)
VDD = 36 V, VSS = 0 V
TSSOP (θJA = 112.6°C/W)
LFCSP (θJA = 30.4°C/W)
25°C
85°C
125°C
Unit
24.5
35.7
7.5
7.7
2.8
2.8
mA max
mA max
26
37
7.5
7.7
2.8
2.8
mA max
mA max
18
28
7
7.7
2.8
2.8
mA max
mA max
30
41
7.7
7.7
2.8
2.8
mA max
mA max
Rev. 0 | Page 7 of 20
ADG5204
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 6.
Parameter
VDD to VSS
VDD to GND
VSS to GND
Analog Inputs 1
Digital Inputs1
Peak Current, Sx or D Pins
Continuous Current, Sx or D 2
Operating Temperature Range
Storage Temperature Range
Junction Temperature
Thermal Impedance, θJA
16-Lead TSSOP, θJA Thermal
Impedance (4-Layer Board)
16-Lead LFCSP, θJA Thermal
Impedance (4-Layer Board)
Reflow Soldering Peak
Temperature, Pb Free
1
2
Rating
48 V
−0.3 V to +48 V
+0.3 V to −48 V
VSS − 0.3 V to VDD + 0.3 V or
30 mA, whichever occurs first
VSS − 0.3 V to VDD + 0.3 V or
30 mA, whichever occurs first
81 mA (pulsed at 1 ms,
10% duty cycle maximum)
Data + 15%
−40°C to +125°C
−65°C to +150°C
150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Only one absolute maximum rating can be applied at any
one time.
ESD CAUTION
112.6°C/W
30.4°C/W
260(+0/−5)°C
Overvoltages at the Sx and D pins are clamped by internal diodes. Limit
current to the maximum ratings given.
See Table 5.
Rev. 0 | Page 8 of 20
ADG5204
14 A1
13 NC
16 EN
15 A0
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
A0
1
14
A1
EN
2
13
GND
VSS
3
12
VDD
S1
4
11
S3
NC 2
ADG5204
11 VDD
S2
5
10
S4
S1 3
TOP VIEW
(Not to Scale)
10 S3
D
6
9
NC
S2 4
NC
7
8
NC
12 GND
NOTES
1. NC = NO CONNECT.
2. EXPOSED PAD TIED TO SUBSTRATE, VSS.
Figure 2. TSSOP Pin Configuration
09768-003
NC 7
S4
NC 8
9
D 6
NC = NO CONNECT
VSS 1
NC 5
TOP VIEW
(Not to Scale)
09768-002
ADG5204
Figure 3. LFCSP Pin Configuration
Table 7. Pin Function Descriptions
TSSOP
1
2
3
4
5
6
7 to 9
10
11
12
13
14
N/A1
1
Pin No.
LFCSP
15
16
Mnemonic
A0
EN
1
3
4
6
2, 5, 7, 8, 13
9
10
11
12
14
EP
Description
Logic Control Input.
Active High Digital Input. When this pin is low, the device is disabled and all switches are off.
When this pin is high, the Ax logic inputs determine the on switches.
Most Negative Power Supply Potential.
Source Terminal. Can be an input or an output.
Source Terminal. Can be an input or an output.
Drain Terminal. Can be an input or an output.
No Connect. These pins are open.
Source Terminal. Can be an input or an output.
Source Terminal. Can be an input or an output.
Most Positive Power Supply Potential.
Ground (0 V) Reference.
Logic Control Input.
Exposed Pad. The exposed pad is connected internally. For increased reliability of the solder
joints and maximum thermal capability, it is recommended that the pad be soldered to the
substrate, VSS.
VSS
S1
S2
D
NC
S4
S3
VDD
GND
A1
Exposed Pad
N/A means not applicable.
TRUTH TABLE
Table 8.
EN
0
1
1
1
1
1
A1
X1
0
0
1
1
A0
X1
0
1
0
1
S1
Off
On
Off
Off
Off
X is don’t care.
Rev. 0 | Page 9 of 20
S2
Off
Off
On
Off
Off
S3
Off
Off
Off
On
Off
S4
Off
Off
Off
Off
On
ADG5204
TYPICAL PERFORMANCE CHARACTERISTICS
160
TA = 25°C
140
VDD = +18V
VSS = –18V
ON RESISTANCE (Ω)
100
VDD = +20V
VSS = –20V
80
VDD = +22V
VSS = –22V
60
100
60
40
20
20
–20
–15
–10
–5
0
5
10
15
20
25
VS, VD (V)
0
0
TA = 25°C
5
10
15
20
25
30
35
40
VS, VD (V)
Figure 4. RON as a Function of VD or VS, Dual Supply
250
VDD = 39.6V
VSS = 0V
VDD = 36V
VSS = 0V
80
40
0
–25
VDD = 32.4V
VSS = 0V
120
09768-104
ON RESISTANCE (Ω)
120
TA = 25°C
140
09768-107
160
Figure 7. RON as a Function of VD or VS, Single Supply
250
VDD = +9V
VSS = –9V
200
VDD = +15V
VSS = –15V
200
ON RESISTANCE (Ω)
150
VDD = +13.2V
VSS = –13.2V
100
VDD = +16.5V
VSS = –16.5V
VDD = +15V
VSS = –15V
100
TA = –40°C
50
–15
–10
–5
0
5
10
15
20
VS, VD (V)
0
–15
09768-105
0
–20
500
0
5
10
15
Figure 8. RON as a Function of VD or VS, for Different Temperatures,
±15 V Dual Supply
VDD = 9V
VSS = 0V
180
VDD = 10.8V
VSS = 0V
400
160
300
ON RESISTANCE (Ω)
VDD = 12V
VSS = 0V
VDD = 13.2V
VSS = 0V
350
250
200
150
140
TA = +25°C
80
TA = –40°C
60
20
6
8
10
12
VS, VD (V)
14
09768-106
50
4
TA = +85°C
100
40
0
TA = +125°C
120
100
2
–5
200
TA = 25°C
450
0
–10
VS, VD (V)
Figure 5. RON as a Function of VD or VS, Dual Supply
ON RESISTANCE (Ω)
TA = +25°C
09768-108
50
TA = +85°C
150
VDD = +20V
VSS = –20V
0
–20
–15
–10
–5
0
5
10
15
20
VS, VD (V)
Figure 9. RON as a Function of VD or VS, for Different Temperatures,
±20 V Dual Supply
Figure 6. RON as a Function of VD or VS, Single Supply
Rev. 0 | Page 10 of 20
09768-109
ON RESISTANCE (Ω)
TA = +125°C
ADG5204
100
500
I I (ON) + +
IS (OFF) + – D, S
TA = +125°C
340
TA = +85°C
50
300
TA = +25°C
250
200
TA = –40°C
150
100
0
IS (OFF) – +
–50
ID (OFF) + –
–100
ID, IS (ON) – –
–150
50
VDD = 12V
VSS = 0V
0
2
4
6
8
10
12
VS, VD (V)
0
20
40
60
80
100
120
TEMPERATURE (°C)
Figure 10. RON as a Function of VD or VS for Different Temperatures,
12 V Single Supply
250
VDD = +20V
VSS = –20V
VBIAS = +15V/–15V
–200
09768-110
0
ID (OFF) – +
09768-113
400
LEAKAGE CURRENT (pA)
ON RESISTANCE (Ω)
450
Figure 13. Leakage Current vs. Temperature, ±20 V Dual Supply
40
VDD = 36V
VSS = 0V
IS (OFF) + –
ID (OFF) – +
20
LEAKAGE CURRENT (pA)
ON RESISTANCE (Ω)
200
TA = +125°C
150
TA = +85°C
TA = +25°C
100
TA = –40°C
0
IS (OFF) – +
–20
ID, IS (ON) + +
–40
ID (OFF) + –
–60
ID, IS (ON) – –
–80
5
10
15
20
25
30
35
VS, VD (V)
ID (OFF) – +
ID, IS (ON) + +
50
IS (OFF) + –
ID (OFF) – +
LEAKAGE CURRENT (pA)
IS (OFF) – +
ID (OFF) + –
ID, IS (ON) – –
–30
–40
–50
120
ID, IS (ON) + +
IS (OFF) + –
–50
IS (OFF) – +
–100
ID (OFF) + –
–150
–200
60
80
100
120
TEMPERATURE (°C)
09768-112
LEAKAGE CURRENT (pA)
100
0
–10
–60 VDD = +15V
VSS = –15V
VBIAS = +10V/–10V
–70
0
20
40
80
Figure 14. Leakage Current vs. Temperature, 12 V Single Supply
0
–20
60
TEMPERATURE (°C)
Figure 11. RON as a Function of VD or VS for Different Temperatures,
36 V Single Supply
10
40
Figure 12. Leakage Current vs. Temperature, ±15 V Dual Supply
ID, IS (ON) – –
VDD = 36V
VSS = 0V
VBIAS = 1V/30V
–250
0
20
40
60
80
100
120
TEMPERATURE (°C)
Figure 15. Leakage Current vs. Temperature, 36 V Single Supply
Rev. 0 | Page 11 of 20
09768-115
0
09768-111
0
–100 VDD = 12V
VSS = 0V
VBIAS = 1V/10V
–120
0
20
09768-114
50
ADG5204
300
250
–60
200
150
VDD = +15V
VSS = –15V
–80
VDD = +20V
VSS = –20V
100
–100
50
100k
1M
10M
100M
1G
FREQUENCY (Hz)
0
–40
09768-116
–120
10k
0
20
40
60
80
100
120
Figure 19. Transition Time vs. Temperature
0
TA = 25°C
VDD = +15V
VSS = –15V
TA = 25°C
VDD = +15V
VSS = –15V
–20
–40
–40
ACPSRR (dB)
CROSSTALK (dB)
–20
–20
TEMPERATURE (°C)
Figure 16. Off Isolation vs. Frequency, ±15 V Dual Supply
0
VDD = +36V
VSS = 0V
VDD = +12V
VSS = 0V
–40
TIME (ns)
OFF ISOLATION (dB)
–20
350
TA = 25°C
VDD = +15V
VSS = –15V
09768-120
0
BETWEEN S1 AND S2
–60
NO DECOUPLING CAPACITORS
–60
–80
–80
BETWEEN S1 AND S4
–100
–100
–120
10k
–120
1k
1M
10M
100M
1G
FREQUENCY (Hz)
VDD = +20V
VSS = –20V
35
CAPACITANCE (pF)
0.5
VDD = +36V
VSS = 0V
VDD = +12V
VSS = 0V
–0.5
–1.0
DRAIN OFF
25
20
15
10
–1.5
–10
0
10
20
30
VS (V)
40
0
–15
–10
–5
0
5
10
VS (V)
Figure 21. Capacitance vs. Source Voltage, Dual Supply
Figure 18. Charge Injection vs. Source Voltage
Rev. 0 | Page 12 of 20
15
09768-123
–2.5
–20
SOURCE OFF
5
–2.0
09768-119
CHARGE INJECTION (pC)
SOURCE/DRAIN ON
30
1.0
0
10M
TA = 25°C
VDD = +15V
VSS = –15V
1.5
VDD = +15V
VSS = –15V
1M
Figure 20. ACPSRR vs. Frequency, ±15 V Dual Supply
40
TA = 25°C
2.0
100k
FREQUENCY (Hz)
Figure 17. Crosstalk vs. Frequency, ±15 V Dual Supply
2.5
10k
09768-121
100k
09768-117
DECOUPLING CAPACITORS
ADG5204
0
TA = 25°C
–2 VDD = +15V
VSS = –15V
–6
–8
–10
–12
–14
–16
–18
–20
100k
1M
10M
FREQUENCY (Hz)
100M
1G
09768-125
ATTENUATION (dB)
–4
Figure 22. Bandwidth
Rev. 0 | Page 13 of 20
ADG5204
TEST CIRCUITS
A
Sx
D
ID (OFF)
NC
VD
09768-006
VS
ID (ON)
A
Sx
D
A
VD
NC = NO CONNECT
Figure 23. Off Leakage
09768-007
IS (OFF)
Figure 26. On Leakage
VDD
VSS
0.1µF
0.1µF
VDD
NETWORK
ANALYZER
VSS
50Ω
Sx
VS
D
V
Sx
RL
50Ω
GND
D
VOUT
09768-005
VOUT WITH SWITCH
VOUT WITHOUT SWITCH
INSERTION LOSS = 20 log
Figure 27. Bandwidth
Figure 24. On Resistance
VDD
VSS
VDD
09768-009
IDS
VS
VSS
0.1µF
0.1µF
0.1µF
0.1µF
VDD
NETWORK
ANALYZER
NETWORK
ANALYZER
VSS
VOUT
50Ω
Sx
50Ω
VDD
S1
VSS
RL
50Ω
D
S2
VS
RL
50Ω
D
VOUT
VS
VS
GND
CHANNEL-TO-CHANNEL CROSSTALK = 20 log
Figure 25. Off Isolation
VOUT
VS
Figure 28. Channel-to-Channel Crosstalk
Rev. 0 | Page 14 of 20
09768-010
OFF ISOLATION = 20 log
VOUT
09768-008
RL
50Ω
GND
ADG5204
VDD VSS
0.1µF
VDD VSS
S1
A1
S2
A0
S3
S4
VIN
2.4V
EN
GND
3V
ADDRESS
DRIVE (VIN)
VS1
VS4
50%
VOUT
tTRANSITION
CL
35pF
RL
300Ω
90%
90%
VOUT
D
50%
0V
09768-012
0.1µF
tTRANSITION
Figure 29. Address to Output Switching Times
VIN
300Ω
2.4V
0.1µF
VDD VSS
S1
S2
S3
S4
EN
VOUT
D
GND
0V
VOUT
CL
35pF
RL
300Ω
3V
ADDRESS
DRIVE (VIN)
VS1
A1
A0
80%
80%
09768-013
0.1µF
VDD VSS
tD
Figure 30. Break-Before-Make Time Delay, tD
VDD VSS
0.1µF
VDD VSS
S1
A1
S2
A0
S3
S4
EN
VS
3V
50%
VOUT
VOUT
D
RL
300Ω
300Ω
50%
0V
0.9VOUT
OUTPUT
0.1VOUT
0V
CL
35pF
tON (EN)
tOFF (EN)
Figure 31. Enable-to-Output Switching Delay
VDD
VSS
VDD
VSS
Sx
D
VOUT
RS
VS
DECODER
∆VOUT
QINJ = CL × ∆VOUT
VOUT
VIN
CL
1nF
SW OFF
SW OFF
SW ON
GND
VIN
A1 A2
SW OFF
SW OFF
09768-015
VIN
GND
ENABLE
DRIVE (VIN)
09768-014
0.1µF
EN
Figure 32. Charge Injection
Rev. 0 | Page 15 of 20
ADG5204
TERMINOLOGY
IDD
The positive supply current.
CIN
The digital input capacitance.
ISS
The negative supply current.
tTRANSITION
The delay time between the 50% and 90% points of the digital
input and switch-on condition when switching from one address
state to another.
VD, VS
The analog voltage on Terminal D and Terminal S.
RON
The ohmic resistance between Terminal D and Terminal S.
RFLAT(ON)
Flatness that is defined as the difference between the maximum
and minimum value of on resistance measured over the specified
analog signal range.
tON (EN)
The delay between applying the digital control input and the
output switching on. See Figure 31.
tOFF (EN)
The delay between applying the digital control input and the
output switching off. See Figure 31.
Charge Injection
A measure of the glitch impulse transferred from the digital
input to the analog output during switching.
IS (Off)
The source leakage current with the switch off.
ID (Off)
The drain leakage current with the switch off.
Off Isolation
A measure of unwanted signal coupling through an off switch.
ID, IS (On)
The channel leakage current with the switch on.
Crosstalk
A measure of unwanted signal that is coupled through from one
channel to another as a result of parasitic capacitance.
VINL
The maximum input voltage for Logic 0.
Bandwidth
The frequency at which the output is attenuated by 3 dB.
VINH
The minimum input voltage for Logic 1.
On Response
The frequency response of the on switch.
IINL, IINH
The input current of the digital input.
Insertion Loss
The loss due to the on resistance of the switch.
CS (Off)
The off switch source capacitance, which is measured with
reference to ground.
CD (Off)
The off switch drain capacitance, which is measured with
reference to ground.
CD (On), CS (On)
The on switch capacitance, which is measured with reference to
ground.
ACPSRR (AC Power Supply Rejection Ratio)
The ratio of the amplitude of signal on the output to the amplitude
of the modulation. This is a measure of the ability of the device
to avoid coupling noise and spurious signals that appear on the
supply voltage pins to the output of the switch. The dc voltage on
the device is modulated by a sine wave of 0.62 V p-p.
Rev. 0 | Page 16 of 20
ADG5204
TRENCH ISOLATION
In the ADG5204, an insulating oxide layer (trench) is placed
between the NMOS and the PMOS transistors of each CMOS
switch. Parasitic junctions, which occur between the transistors
in junction isolated switches, are eliminated, and the result is a
completely latch-up proof switch.
PMOS
P WELL
N WELL
TRENCH
BURIED OXIDE LAYER
HANDLE WAFER
Figure 33. Trench Isolation
Rev. 0 | Page 17 of 20
09768-004
In junction isolation, the N and P wells of the PMOS and
NMOS transistors form a diode that is reverse-biased under
normal operation. However, during overvoltage conditions, this
diode can become forward-biased. A silicon controlled rectifier
(SCR) type circuit is formed by the two transistors causing a
significant amplification of the current that, in turn, leads to
latch-up. By using trench isolation, this diode is removed, and
the result is a latch-up proof switch.
NMOS
ADG5204
APPLICATIONS INFORMATION
The ADG52xx family of switches and multiplexers provide a
robust solution for instrumentation, industrial, automotive,
aerospace, and other harsh environments that are prone to
latch-up, which is an undesirable high current state that can
lead to device failure and persists until the power supply is
turned off. The ADG5204 high voltage multiplexer allows
single-supply operation from 9 V to 40 V and dual-supply
operation from ±9 V to ±22 V.
Rev. 0 | Page 18 of 20
ADG5204
OUTLINE DIMENSIONS
5.10
5.00
4.90
14
8
4.50
4.40
4.30
6.40
BSC
1
7
PIN 1
0.65 BSC
1.20
MAX
0.15
0.05
COPLANARITY
0.10
0.30
0.19
0.20
0.09
0.75
0.60
0.45
8°
0°
SEATING
PLANE
061908-A
1.05
1.00
0.80
COMPLIANT TO JEDEC STANDARDS MO-153-AB-1
Figure 34. 14-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-14)
Dimensions shown in millimeters
PIN 1
INDICATOR
4.10
4.00 SQ
3.90
0.35
0.30
0.25
0.65
BSC
16
13
PIN 1
INDICATOR
12
1
EXPOSED
PAD
4
2.70
2.60 SQ
2.50
9
0.80
0.75
0.70
0.45
0.40
0.35
8
0.05 MAX
0.02 NOM
COPLANARITY
0.08
0.20 REF
SEATING
PLANE
5
BOTTOM VIEW
0.20 MIN
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
COMPLIANT TO JEDEC STANDARDS MO-220-WGGC.
08-16-2010-C
TOP VIEW
Figure 35. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
4 mm × 4 mm Body, Very Very Thin Quad
(CP-16-17)
Dimensions shown in millimeters
ORDERING GUIDE
Model 1
ADG5204BRUZ
ADG5204BRUZ-RL7
ADG5204BCPZ-RL7
1
Temperature Range
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
Package Description
14-Lead Thin Shrink Small Outline Package [TSSOP]
14-Lead Thin Shrink Small Outline Package [TSSOP]
16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
Z = RoHS Compliant Part.
Rev. 0 | Page 19 of 20
Package Option
RU-14
RU-14
CP-16-17
ADG5204
NOTES
©2011 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D09768-0-5/11(0)
Rev. 0 | Page 20 of 20
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