NanoAmp N16D1618LPAZ2-10I 512k ã 16 bits ã 2 banks low power synchronous dram Datasheet

NanoAmp Solutions, Inc.
670 North McCarthy Blvd. Suite 220, Milpitas, CA 95035
ph: 408-935-7777, FAX: 408-935-7770
www.nanoamp.com
N16D1618LPA
Advance Information
512K × 16 Bits × 2 Banks Low Power Synchronous DRAM
DESCRIPTION
These N16D1618LPA are low power 16,777,216 bits CMOS Synchronous DRAM organized as 2 banks of 524,288
words x 16 bits. These products are offering fully synchronous operation and are referenced to a positive edge of the
clock. All inputs and outputs are synchronized with the rising edge of the clock input. The data paths are internally
pipelined to achieve very high bandwidth. All input and output voltage levels are compatible with LVTTL.
Features
• Auto refresh and self refresh.
• All inputs and outputs referenced to the positive
edge of the system clock.
• All pins are compatible with LVTTL interface.
• Data mask function by DQM.
• 4K refresh cycle / 64ms.
• Internal dual banks operation.
• Programmable Burst Length and Burst Type.
- 1, 2, 4, 8 or Full Page for Sequential Burst.
- 4 or 8 for Interleave Burst.
• Burst Read Single Write operation.
• JEDEC standard 1.8V power supply.
• Programmable CAS Latency : 2,3 clocks.
• Special Function Support.
-PASR (Partial Array Self Refresh)
-Auto TCSR(Temperature Compensated Self Refresh)
• Programmable Driver Strength Control.
- Full Strength or 1/2, 1/4 of Full Strength
• Automatic precharge, includes CONCURRENT
Auto Precharge Mode and controlled Precharge
• Deep Power Down Mode
Table 1: Ordering Information
PART NO.
N16D1618LPAZ2-75I
CLOCK Freq.
Temperature
VDD/VDDQ
INTERFACE
133MHz
N16D1618LPAZ2-10I
100MHz
N16D1618LPAC2-60I
166MHz
N16D1618LPAC2-75I
133MHz
N16D1618LPAC2-10I
100MHz
N16D1618LPAT2-60I
166MHz
N16D1618LPAT2-75I
133MHz
N16D1618LPAT2-10I
100MHz
PACKAGE
48-Ball Green
FBGA
-25o C to
85o C
1.8V/1.8V
LVTTL
60-Ball Green
WBGA
50-Pin Green
TSOP II
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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N16D1618LPA
NanoAmp Solutions, Inc.
Advance Information
Figure 1: Package Configuration (60Ball WBGA)
6.4 0.1
3.9
1.25
1
2
3
4
5
6
0.65
7
A
VSS
DQ15
DQ0
VDD
B
DQ14
VSSQ
VDDQ
DQ1
C
DQ13
VDDQ
VSSQ
DQ2
D
DQ12
DQ11
DQ4
DQ3
E
DQ10
VSSQ
VDDQ
DQ5
E
F
DQ9
VDDQ
VSSQ
DQ6
F
G
DQ8
NC
NC
DQ7
G
H
NC
NC
NC
NC
H
J
NC
UDQM
LDQM
/WE
J
K
NC
CLK
/RAS
/CAS
L
CKE
NC
NC
/CS
M
A11
A9
NC
NC
N
A8
A7
A0
A10
P
A6
A5
A2
A1
R
VSS
A4
A3
VDD
Unit [mm]
0.65
A
B
C
D
10.1 0.1
9.1
K
L
M
N
P
R
0.3 0.05
7
6
5
4
3
2
[Top View]
1
1.0max
0.23 0.05
[Bottom View]
Note:
1. All Dimensions in millimeters
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Advance Information
Figure 2: Package Configuration (48Balls FBGA)
6.0 0.1
1.125
3.75
Unit [mm]
0.75
4
5
6
A
CLK
/CS
A0
A1
A2
/CAS
B
DQ8
NC
A3
A4
CKE
DQ0
C
DQ9
DQ10
A5
A6
DQ1
DQ2
D
VSS
DQ11
/RAS
A7
DQ3
VDDQ
E
VDD
DQ12
NC
NC
DQ4
VSSQ
F
DQ14
DQ13
NC
NC
DQ5
DQ6
G
DQ15
NC
UDQM
LDQM
/WE
DQ7
H
NC
A8
A9
A10
A11
NC
A
B
C
D
5.25
3
E
F
G
0.30 0.05
H
6
5
4
3
2
1
1.0max
[Top View]
8 0.1
2
0.75
1
0.23 0.05
[Bottom View]
Note:
1. All Dimensions in millimeters
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Advance Information
Figure 3: Package Configuration (50 Pin TSOP II)
11.76 ± 0.20
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
50 Pin
TSOP II
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
GND
DQ15
DQ14
GNDQ
DQ13
DQ12
VDDQ
DQ11
DQ10
GNDQ
DQ9
DQ8
VDDQ
NC
UDQM
CLK
CKE
NC
A9
A8
A7
A6
A5
A4
GND
0.80 BSC
20.95 ± 0.10
VDD
DQ0
DQ1
GNDQ
DQ2
DQ3
VDDQ
DQ4
DQ5
GNDQ
DQ6
DQ7
VDDQ
LDQM
/WE
/CAS
/RAS
/CS
A11
A10
A0
A1
A2
A3
VDD
0.49
0.27
1.03 MAX
[Top View]
10.16 ± 0.10
0.80 NOM
1.20 MAX
1.00 ± 0.05
0.17 NOM
0o - 8o
0.15
0.05
0.50 ± 0.10
NOTES:
1. All dimensions in millimeters unless otherwise noted
2. BSC = Basic lead spacing between centers
3. MAX / MIN
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Advance Information
Table 2: Pin Descriptions
PIN
PIN NAME
DESCRIPTIONS
CLK
System Clock
The system clock input. All other inputs are registered to the
SDRAM on the rising edge of the CLK
CKE
Clock Enable
Controls internal clock signal and when deactivated, the
SDRAM will be one of the states among power down, suspend
or self refresh.
/CS
Chip Select
A11
A0~A10
Bank Address
Address
Enable or disable all inputs except CLK, CKE and DQM
Selects bank to be activated during /RAS activity
Selects bank to be read/written during /CAS activity
Row Address : RA0~RA10
Column Address: CA0~CA7
Auto Precharge : A10
/RAS, /CAS, /WE
Row Address Strobe,
Column Address Strobe,
Write Enable
/RAS, /CAS and /WE define the operation
Refer function truth table for details
LDQM/UDQM
Data Input/Output Mask
Controls output buffers in read mode and masks input data in
write mode
DQ0~DQ15
VDD/VSS
VDDQ/VSSQ
NC
Data Input/Output
Power Supply/Ground
Data Output Power/Ground
No Connection
Multiplexed data input/output pin
Power supply for internal circuits and input buffers
Power Supply for output buffers
No Connection
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Advance Information
Figure 4: Functional Block Diagram
EXTENDED
MODE
REGISTER
CLK
CLOCK
CKE
GENERATOR
TCSR
PASR
ADDRESS
ROW DECODER
ROW DECODER
ROW
MODE
REGISTER
ADDRESS
BUFFER &
REFRESH
COUNTER
BANK B
BANK A
SENSE AMPLIFIER
/CAS
/WE
CONTROL LOGIC
/RAS
COMMAND DECODER
/CS
COLUMN DECODER
& LATCH CIRCUIT
COLUMN
ADDRESS
BUFFER &
BURST
COUNTER
DATA CONTROL CIRCUIT
DQM
LATCH CIRCUIT
INPUT & OUTPUT
BUFFER
DQ
Stock No. 23395- Rev L 1/06
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Figure 5: Simplified State Diagram
EXTENDED
SELF
MODE
REGISTER
EM
R
SET
REFRESH
S
LF
SE
SE
LF
MRS
MODE
CBR
REF
IDLE
REGISTER
IT
EX
REFRESH
SET
CK
E
D
DP
EX
D
DP
POWER
IT
↓
ACT
DEEP
CK
E
POWER
DOWN
DOWN
CKE ↓
ROW
DOWN
W
AU RIT
TO
E
PR WIT
EC
H
HA
RG
E
READ
WRITE
READ
CKE ↓
READ
WRITE
CKE
CKE
CKE ↓
CKE ↓
ON
PRECHARGE
READ A
SUSPEND
erm
et
n)
atio
min
ter
POWER
CKE
ina
t
ge
har
rec
E(P
PR
CKE
READ A
ion
)
WRITE A
READ
SUSPEND
PR
E(P
rec
har
g
WRITE A
SUSPEND
CKE ↓
E
RG
HA
EC
PR
H
IT
TO
AU ITE W
WR
PRE
WRITE
SUSPEND
POWER
BS
T
T
BS
WRITE
ACTIVE
CKE
ACTIVE
PRECHARGE
Automatic Sequence
Manual Input
Stock No. 23395- Rev L 1/06
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Figure 6: Mode Register Definition
A11
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
Address Bus
11
0
10
9
8
WB
0
0
7
6
5
4
CAS Latency
0
3
BT
2
1
0
Mode Register (Mx)
Burst Length
M9
Write Burst Mode
M6
M5
M4
CAS Latency
M3
Burst Type
0
Burst Read and Burst Write
0
0
0
Reserved
0
Sequential
1
Burst Read and Single Write
0
0
1
1
1
Interleave
0
1
0
0
1
1
0
1
Burst Length
M2
M1
M0
0
0
0
1
1
2
0
0
1
2
2
1
3
0
1
0
4
4
0
Reserved
0
1
1
8
8
0
1
Reserved
1
0
0
Reserved
Reserved
1
1
0
Reserved
1
0
1
Reserved
Reserved
1
1
1
Reserved
1
1
0
Reserved
Reserved
1
1
1
Full Page
Reserved
M3 = 0
M3 = 1
Note: M11(A11) must be sest to “0” to select mode Register (vs. the Extend Mode Register)
Burst Type
Accesses within a given burst may be programmed to be
either sequential or interleaved; this is referred to as the
burst type and is selected via bit M3. The ordering of
accesses within a burst is determined by the burst
length, the burst type and the starting column address,
as shown in Table 3 .
Starting Column
Address
A2
A1
Full
Page
A0
Sequential
Interleave
0-1
0
0-1
1-0
1-0
0
0
0-1-2-3
0-1-2-3
0
1
1-2-3-0
1-0-3-2
1
0
2-3-0-1
2-3-0-1
1
1
3-0-1-2
3-2-1-0
0
0
0
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6-7
0
0
1
1-2-3-4-5-6-7-0
1-0-3-2-5-4-7-6
0
1
0
2-3-4-5-6-7-0-1
2-3-0-1-6-7-4-5
0
1
1
3-4-5-6-7-0-1-2
3-2-1-0-7-6-5-4
1
0
0
4-5-6-7-0-1-2-3
4-5-6-7-0-1-2-3
1
0
1
5-6-7-0-1-2-3-4
5-4-7-6-1-0-3-2
1
1
0
6-7-0-1-2-3-4-5
6-7-4-5-2-3-0-1
1
1
1
7-0-1-2-3-4-5-6
7-6-5-4-3-2-1-0
Cn, Cn+1. Cn+2,
Cn+3, Cn+4…
…Cn-1, Cn...
Not Supported
4
8
Order of Access Within a Burst
1
2
N=A0~7
(Location 0-256)
1. For full-page accesses: y = 256
2. For a burst length of two, A1-A7 select the block-oftwo burst; A0 selects the starting column within the
block.
Table 3: Burst Definition
Burst
Length
Note :
3. For a burst length of four, A2-A7 select the block-offour burst; A0-A1 select the starting column within the
block.
4. For a burst length of eight, A3-A7 select the block-ofeight burst; A0-A2 select the starting column within the
block.
5. For a full-page burst, the full row is selected and A0A7 select the starting column.
6. Whenever a boundary of the block is reached within a
given sequence above, the following access wraps
within the block.
7. For a burst length of one, A0-A7 select the unique
column to be accessed, and mode register bit M3 is
ignored.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Advance Information
Figure 7: Extended Mode Register
A11
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
Address Bus
11
1
10
0
9
0
E6
E5
Driver Strength
0
0
Full Strength
0
1
1/2 Strength
1
0
1/4 Strength
1
1
Reserved
8
0
7
6
0
5
DS
4
3
2
TCSR
1
PASR
E4
E3
Maximum Case
Temp.
0
0
85°
0
1
70°
1
0
45°
1
1
Auto
E2
E1
E0
0
0
0
All Banks
0
0
1
One Bank (A11=0)
0
Extended Mode Register (Ex)
Self Refresh Coverage
0
1
0
Reserved
0
1
1
Reserved
1
0
0
Reserved
1
0
1
Half of One Bank (A11=0, Row Address MSB=0)
1
1
0
Quarter of One Bank (A11=0, Row Address 2 MSB=0)
1
1
1
Reserved
Note: 1. E11(A11) must be set to “1” to select Extend Mode Register (vs. the base Mode Register)
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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FUNCTIONAL DESCRIPTION
In general, this 16Mb SDRAM (512K x 16Bits x 2banks) is a dual-bank DRAM that operates at 1.8V and includes a
synchronous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the 8,388,608bit banks is organized as 2,048 rows by 256 columns by 16-bits. Read and write accesses to the SDRAM are burst
oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE
command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to
be accessed (A11 select the bank, A0-A10 select the row). The address bits (A11 select the bank, A0-A7 select the
column) registered coincident with the READ or WRITE command are used to select the starting column location for
the burst access. Prior to normal operation, the SDRAM must be initialized. The following sections provide detailed
information covering device initialization, register definition, command descriptions and device operation.
Power up and Initialization
SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those
specified may result in undefined operation. Once power is applied to VDD and VDDQ(simultaneously) and the clock is
stable(stable clock is defined as a signal cycling within timing constraints specified for the clock pin), the SDRAM
requires a 100µs delay prior to issuing any command other than a COMMAND INHIBIT or NOP. CKE must be held
high during the entire initialization period until the RECHARGE command has been issued. Starting at some point
during this 100µs period and continuing at least through the end of this period, COMMAND INHIBIT or NOP
commands should be applied. Once the 100µs delay has been satisfied with at least one COMMAND INHIBIT or NOP
command having been applied, a PRECHARGE command should be applied. All banks must then be precharged,
thereby placing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are
complete, the SDRAM is ready for mode register programming. Because the mode register will power up in an
unknown state, it should be loaded prior to applying any operational command. And a extended mode register set
command will be issued to program specific mode of self refresh operation(PASR). The following these cycles, the Low
Power SDRAM is ready for normal operation.
REGISTER DEFINITION
Mode Register
The mode register is used to define the specific mode of operation of the SDRAM. This definition includes the selection
of a burst length, a burst type, a CAS latency, an operating mode and a write burst mode. The mode register is
programmed via the LOAD MODE REGISTER command and will retain the stored information until it is programmed
again or the device loses power. Mode register bits M0-M2 specify the burst length, M3 specifies the type of burst
(sequential or interleaved), M4-M6 specify the CAS latency, M7 and M8 specify the operating mode, M9 specifies the
write burst mode, and M10 should be set to zero. M11 should be set to zero to prevent extended mode register. The
mode register must be loaded when all banks are idle, and the controller must wait the specified time before initiating
the subsequent operation. Violating either of these requirements will result in unspecified operation.
EXTENDED MODE REGISTER
The Extended Mode Register controls the functions beyond those controlled by the Mode Register. These additional
functions are special features of the BATRAM device. They include Temperature Compensated Self Refresh (TCSR)
Control, and Partial Array Self Refresh (PASR) and Driver Strength (DS). The Extended Mode Register is programmed
via the Mode Register Set command (A11=1) and retains the stored information until it is programmed again or the
device loses power. The Extended Mode Register must be programmed with E7 through E10 set to “0”. The Extended
Mode Register must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the
specified time before before initiating any subsequent operation. Violating either of these requirements results in
unspecified operation.
Stock No. 23395- Rev L 1/06
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Burst Length
Read and write accesses to the SDRAM are burst oriented, with the burst length being programmable, as shown in
Figure 1. The burst length determines the maximum number of column locations that can be accessed for a given
READ or WRITE command. Burst lengths of 1, 2, 4 or 8 locations are available for both the sequential and the
interleaved burst types, and a full-page burst is available for the sequential type. The full-page burst is used in
conjunction with the BURST TERMINATE command to generate arbitrary burst lengths.
Reserved states should not be used, as unknown operation or incompatibility with future versions may result. When a
READ or WRITE command is issued, a block of columns equal to the burst length is effectively selected. All accesses
for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The
block is uniquely selected by A1-A7 when the burst length is set to two; by A2-A7 when the burst length is set to four;
and by A3-A7 when the burst length is set to eight. The remaining (least significant) address bit(s) is (are) used to
select the starting location within the block. Full-page bursts wrap within the page if the boundary is reached.
Bank(Row) Active
The Bank Active command is used to activate a row in a specified bank of the device. This command is initiated by
activating /CS, /RAS and deasserting /CAS, /WE at the positive edge of the clock. The value on the A11 selects the
bank, and the value on the A0-A10 selects the row. This row remains active for column access until a precharge
command is issued to that bank. Read and write operations can only be initiated on this activated bank after the
minimum tRCD time is passed from the activate command.
Read
The READ command is used to initiate the burst read of data. This command is initiated by activating /CS, /CAS, and
deasserting /WE, /RAS at the positive edge of the clock. A11 input select the bank, A0-A7 address inputs select the
starting column location. The value on input A10 determines whether or not Auto Precharge is used. If Auto Precharge
is selected the row being accessed will be precharged at the end of the READ burst; if Auto Precharge is not selected,
the row will remain active for subsequent accesses. The length of burst and the CAS latency will be determined by the
values programmed during the MRS command.
Write
The WRITE command is used to initiate the burst write of data. This command is initiated by activating /CS, /CAS, /WE
and deasserting /RAS at the positive edge of the clock. A11 input select the bank, A0-A7 address inputs select the
starting column location. The value on input A10 determines whether or not Auto Precharge is used. If Auto Precharge
is selected the row being accessed will be precharged at the end of the WRITE burst; if Auto Precharge is not selected,
the row will remain active for subsequent accesses.
Stock No. 23395- Rev L 1/06
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CAS Latency
The CAS latency is the delay, in clock cycles, between the registration of a READ command and the availability of the
first piece of output data. The latency can be set to two or three clocks. If a READ command is registered at clock edge
n, and the latency is m clocks, the data will be available by clock edge n + m. The DQs will start driving as a result of
the clock edge one cycle earlier (n + m - 1), and provided that the relevant access times are met, the data will be valid
by clock edge n + m. For example, assuming that the clock cycle time is such that all relevant access times are met, if
a READ command is registered at T0 and the latency is programmed to two clocks, the DQs will start driving after T1
and the data will be valid by T2, as shown in Figure 2. Reserved states should not be used as unknown operation or
incompatibility with future versions may result.
Figure 8: CAS Latency
T0
T1
T3
T2
CLK
READ
COMMAND
NOP
NOP
tOH
tLZ
DQ
Dout
tAC
CAS Latency=2
T0
T1
T3
T2
T4
CLK
COMMAND
READ
NOP
NOP
tLZ
DQ
NOP
tOH
Dout
tAC
CAS Latency=3
DON’T CARE
UNDEFINED
Operating Mode
The normal operating mode is selected by setting M7 and M8 to zero; the other combinations of values for M7 and M8
are reserved for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts.
Test modes and reserved states should not be used because unknown operation or incompatibility with future versions
may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2 applies to both READ and WRITE bursts; when M9 = 1, the
programmed burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Table 4: Command Truth Table
COMMAND
Command Inhibit (NOP)
CKEn-1
CKEn
CS
RAS
CAS
WE
DQM
H
X
H
X
X
X
X
ADDR
A10
Note
X
No Operation (NOP)
H
X
L
H
H
H
X
X
Mode Register Set
H
X
L
L
L
L
X
OP-CODE
4
Extended Mode Register Set
H
X
L
L
L
L
X
OP-CODE
4
Active (select bank and activate
row)
H
X
L
L
H
H
X
Bank/Row
Read
H
X
L
H
L
H
L/H
Bank/Col
L
5
Read with Autoprecharge
H
X
L
H
L
H
L/H
Bank/Col
H
5
Write
H
X
L
H
L
L
L/H
Bank/Col
L
5
Write with Autoprecharge
H
X
L
H
L
L
L/H
Bank/Col
H
5
Precharge All Banks
H
X
L
L
H
L
X
X
H
Precharge Selected Bank
H
X
L
L
H
L
X
Bank
L
Burst stop
H
H
L
H
H
L
X
Auto Refresh
H
H
L
L
L
H
X
X
3
Self Refresh Entry
H
L
L
L
L
H
X
X
3
Self Refresh Exit
L
H
H
X
X
X
L
H
H
H
X
X
2
Precharge Power Down Entry
H
L
X
X
Precharge Down Exit
L
H
X
X
Clock Suspend Entry
H
L
X
X
Clock Suspend Exit
L
H
X
X
Deep Power Down Entry
H
L
X
X
Deep Power Down Exit
L
H
X
X
H
X
X
X
L
H
H
H
H
X
X
X
L
H
H
H
H
X
X
X
L
V
V
V
X
L
H
H
X
L
X
6
Note :
1. CKEn is the logic state of CKE at clock edge n; CKEn-1 was the state of CKE at the previoys clock edge.
H: High Level, L: Low Level, X: Don't Care, V: Valid
2. Exiting Self Refresh occurs by asynchronously bringing CKE from low to high and will put the device in the all banks idle state once
tXSR is met. Command Inhibit or NOP commands should be issued on any clock edges occuring during the tXSR period. A mimum
of two NOP commands must be provided during tXSR period.
3. During refresh operation, internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE.
4. A0-A10 define OP CODE written to the mode register, and A11 must be issued 0 in the mode register set, and 1 in the extended
mode register set.
5. DQM “L” means the data Write/Ouput Enable and “H” means the Write inhibit/Output High-Z. Write DQM Latency is 0 CLK and
Read DQM Latency is 2 CLK.
6. Standard SDRAM parts assign this command sequence as Burst Terminate. For Bat Ram parts, the Burst Terminate command is
assigned to the Deep Power Down function.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
13
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Table 5: Function Truth Table
Current
State
IDLE
ROW
ACTIVE
READ
WRITE
Command
/CS
/RAS
/CAS
/WE
A11
A0-A10
L
L
L
L
OP CODE
L
L
L
H
X
L
L
H
L
BA
L
L
H
H
BA
L
H
L
L
L
H
L
H
L
H
H
H
H
X
X
L
L
L
L
L
L
L
Action
Description
Note
Mode Register Set
Set the Mode Register
14
X
Auto or Self Refresh
Start Auto or Self Refresh
5
X
Precharge
No Operation
Row Addr
Bank Active
Activate the Specific Bank
and Row
BA
Col Addr/A10
Write/Write AP
ILLEGAL
4
BA
Col Addr/A10
Read/Read AP
ILLEGAL
4
X
X
NOP
NOP
3
X
X
X
Device Deselect
NOP or Power Down
3
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
H
L
BA
X
Precharge
Precharge
7
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4
6
6
L
H
L
L
BA
Col Addr/A10
Write/Write AP
Start Write : Optional
AP(A10 = H)
L
H
L
H
BA
Col Addr/A10
Read/Read AP
Start Read: Optional
AP(A10 = H)
L
H
H
H
X
X
NOP
NOP
H
X
X
X
X
X
Device Deselect
NOP
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
Termination Burst :
Start the Precharge
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4
8,9
8
L
H
L
L
BA
Col Addr/A10
Write/Write AP
Termination Burst:
Start Write(AP)
L
H
L
H
BA
Col Addr/A10
Read/Read AP
Termination Burst:
Start Read(AP)
L
H
H
H
X
X
NOP
Continue the Burst
H
X
X
X
X
X
Device Deselect
Continue the Burst
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
Auto or Self Refresh
ILLEGAL
13
X
L
L
H
L
BA
X
Precharge
Termination Burst :
Start the Precharge
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4
8,9
8
L
H
L
L
BA
Col Addr/A10
Write/Write AP
Termination Burst:
Start Write(AP)
L
H
L
H
BA
Col Addr/A10
Read/Read AP
Termination Burst:
Start Read(AP)
L
H
H
H
X
X
NOP
Continue the Burst
H
X
X
X
X
X
Device Deselect
Continue the Burst
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
14
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Table 5: Function Truth Table
Current
State
READ
with
AUTO
PRECHARGE
WRITE
with
AUTO
PRECHARGE
PRECHARGING
ROW
ACTIVATING
Command
/CS
/RAS
/CAS
/WE
A11
A0-A10
Action
Description
Note
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
4,12
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4,12
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
12
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
12
L
H
H
H
X
X
NOP
Continue the Burst
H
X
X
X
X
X
Device Deselect
Continue the Burst
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
4,12
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4,12
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
12
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
12
L
H
H
H
X
X
NOP
Continue the Burst
H
X
X
X
X
X
Device Deselect
Continue the Burst
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
No Operation: Bank(s)
Idle after tRP
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4,12
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
4,12
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
4,12
L
H
H
H
X
X
NOP
No Operation: Bank(s)
Idle after tRP
H
X
X
X
X
X
Device Deselect
No Operation: Bank(s)
Idle after tRP
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
4,12
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4, 11,
12
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
4,12
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
4,12
L
H
H
H
X
X
NOP
No Operation: Row Activated after tRCD
H
X
X
X
X
X
Device Deselect
No Operation: Row Activated after tRCD
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
15
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Table 5: Function Truth Table
Current
State
WRITE
RECOVERING
Write
Recovering with
Auto Precharge
REFRES
HING
Mode
Register
Accessing
Command
/CS
/RAS
/CAS
/WE
A11
A0-A10
Action
Description
Note
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
4,13
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4,12
L
H
L
L
BA
Col Addr/A10
Write/Write AP
Start Write : Optional
AP(A10 = H)
L
H
L
H
BA
Col Addr/A10
Read/Read AP
Start Write : Optional
AP(A10 = H)
L
H
H
H
X
X
NOP
No Operation : Row Active
after tDPL
H
X
X
X
X
X
Device Deselect
No Operation : Row Active
after tDPL
9
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
4,13
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
4,12
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
4,12
4,9,
12
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
L
H
H
H
X
X
NOP
No Operation : Precharge
after tDPL
H
X
X
X
X
X
Device Deselect
No Operation : Precharge
after tDPL
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
13
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
13
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
13
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
13
L
H
H
H
X
X
NOP
No Operation : Idle after
tRC
H
X
X
X
X
X
Device Deselect
No Operation : Idle after
tRC
L
L
L
L
OP CODE
Mode Register Set
ILLEGAL
13,14
L
L
L
H
X
X
Auto or Self Refresh
ILLEGAL
13
L
L
H
L
BA
X
Precharge
ILLEGAL
13
L
L
H
H
BA
Row Addr
Bank Active
ILLEGAL
13
L
H
L
L
BA
Col Addr/A10
Write/Write AP
ILLEGAL
13
L
H
L
H
BA
Col Addr/A10
Read/Read AP
ILLEGAL
13
L
H
H
H
X
X
NOP
No Operation : Idle after 2
Clock Cycle
H
X
X
X
X
X
Device Deselect
No Operation : Idle after 2
Clock Cycle
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
16
N16D1618LPA
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Advance Information
Note :
1. H: Logic High, L: Logic Low, X: Don't care, BA: Bank Address, AP: Auto Precharge.
2. All entries assume that CKE was active during the preceding clock cycle.
3. If both banks are idle and CKE is inactive, then in power down cycle
4. Illegal to bank in specified states. Function may be legal in the bank indicated by Bank Address,
depending on the state of that bank.
5. If both banks are idle and CKE is inactive, then Self Refresh mode.
6. Illegal if tRCD is not satisfied.
7. Illegal if tRAS is not satisfied.
8. Must satisfy burst interrupt condition.
9. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
10. Must mask preceding data which don't satisfy tDPL.
11. Illegal if tRRD is not satisfied
12. Illegal for single bank, but legal for other banks in multi-bank devices.
13. Illegal for all banks.
14. Mode Register Set and Extended Mode Register Set is same command truth table except A11.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Table 6: CKE Truth Table
Current
State
Self
Refresh
CKE
Deep
Power
Down
All Bank
Idle
Any State
other than
listed
above
Action
Note
Prev
Cycle
Current
Cycle
/CS
/RAS
/CAS
/WE
A11
A0-A10
H
X
X
X
X
X
X
X
INVALID
2
3
L
H
H
X
X
X
X
X
Exit Self Refresh with
Device Deselect
L
H
L
H
H
H
X
X
Exit Self Refresh with
No Operation
3
L
H
L
H
H
L
X
X
ILLEGAL
3
L
H
L
H
L
X
X
X
ILLEGAL
3
L
H
L
L
X
X
X
X
ILLEGAL
3
L
L
X
X
X
X
X
X
Maintain Self Refresh
H
X
L
Power
Down
Command
L
H
H
X
X
X
X
X
X
INVALID
2
H
X
X
X
X
X
L
H
H
H
X
X
Power Down Mode
Exit, All Banks Idle
3
L
X
X
X
X
X
L
X
X
X
ILLEGAL
3
X
X
L
X
X
L
L
L
X
X
X
X
X
X
Maintain Power Down
Mode
H
X
X
X
X
X
X
X
INVALID
2
6
L
H
X
X
X
X
X
X
Deep Power Down
Mode Set
L
L
X
X
X
X
X
X
Maintain Deep Power
Down Mode
H
H
H
X
X
X
H
H
L
H
X
X
H
H
L
L
H
X
H
H
L
L
L
H
H
H
L
L
L
L
H
L
H
X
X
X
H
L
L
H
X
X
H
L
L
L
H
X
H
L
L
L
L
H
H
L
L
L
L
L
L
X
X
X
X
X
Refer to the Idle State
section of the Current
State Truth Table
X
X
Op-Code
X
X
4
4
4
Auto Refresh
Mode Register Set
5
Refer to the Idle State
section of the Current
State Truth Table
4
4
X
Entry Self Refresh
5
Op-Code
Mode Register Set
X
Power Down
H
H
X
X
X
X
X
X
Refer to Operations of
the Current State
Truth Table
H
L
X
X
X
X
X
X
Begin Clock Suspend
next cycle
L
H
X
X
X
X
X
X
Exit Clock Suspend
next cycle
L
L
X
X
X
X
X
X
Maintain Clock Suspend
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
4
5
18
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NanoAmp Solutions, Inc.
Advance Information
Note :
1. H: Logic High, L: Logic Low, X: Don't care
2. For the given current state CKE must be low in the previous cycle.
3. When CKE has a low to high transition, the clock and other inputs are re-enabled asynchronously. When exiting power down mode,
a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes high.
4. The address inputs depend on the command that is issued.
5. The Precharge Power Down mode, the Self Refresh mode, and the Mode Register Set can only be entered from the all banks idle
state.
6. When CKE has a low to high transition, the clock and other inputs are re-enabled asynchronously. When exiting deep power down
mode, a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes high and is maintained
for a minimum 100usec.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Table 7: ABSOLUTE MAXIMUM RATING
PARAMETER
SYMBOL
Ambient Temperature (Industrial)
RATING
-25 ~ 85
TA
Ambient Temperature (Commerical)
Storage Temperature
UNIT
°C
0 ~ 70
TSTG
-55~150
°C
Voltage on Any Pin Relative to VSS
VIN, VOUT
-1.0~2.6
V
Voltage on VDD Relative to VSS
VDD, VDDQ
-1.0~2.6
V
Short Circuit Output Current
IOS
50
mA
Power Dissipation
PD
1
W
Note :
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Table 8: Capacitance (TA = 25°C, f = 1MHz, VDD = 1.8V)
PARAMETER
Input Capacitance
PIN
SYMBOL
MIN
MAX
UNIT
CLK
Cl1
2
4
pF
A0~A11, CKE, /CS
/RAS, /CAS, /WE, L(U)DQM
Cl2
2
4
pF
DQ0~DQ15
CIO
3
5
pF
Data Input / Output
Capacitance
Table 9: DC CHARACTERISTIC & OPERATION CONDITION (TA = -25 to 85°C)
PARAMETER
SYMBOL
MIN
TYP
MAX
UNIT
NOTE
VDD
1.65
1.8
1.95
V
VDDQ
1.65
1.8
1.95
V
1
Input High Voltage
VIH
0.8VDDQ
--
VDDQ+0.3
V
2
Input Low Voltage
VIL
-0.3
0
0.3
V
3
Output Logic High Current
VOH
0.9VDDQ
--
--
V
IOH = -0.1mA
Output Logic Low Current
VOL
--
--
0.2
V
IOL = +0.1mA
Power Supply Voltage
Input Leakage Current
ILI
-1
--
1
µA
4
Output Leakage Current
ILO
-1.5
--
1.5
µA
5
Note :
1. VDDQ must not exceed the level of VDD
2. VIH(max) = VDDQ+1.5V AC. The overshoot voltage duration is ≤ 3ns
3. VIL(min) = -1.0V AC. The overshoot voltage duration is ≤ 3ns.
4. Any input 0V ≤ VIN ≤ VDDQ.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with tri-state outputs
5. DOUT is disabled, 0V ≤ VOUT ≤ VDDQ.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Table 10: AC OPERATNG CONDITION (TA = -25 to 85°C, VDD=1.8V ± 0.15V, VSS = 0V)
PARAMETER
AC Input High / Low Level Voltage
Input Timing Measurement Reference Level Voltage
SYMBOL
TYP
UNIT
VIH / VIL
0.9 × VDDQ / 0.2
V
Vtrip
0.5 × VDDQ
V
Input Rise / Fall Time
tR / tF
1/1
ns
Output Timing Measurement Reference Level
Voutref
0.5 × VDDQ
V
CL
30
pF
Output Load Capacitance for Access Time Measurement
VTT=0.5 x VDDQ
VDDQ
500Ω
Output
50Ω
Output
500Ω
Z0=50Ω
30pF
DC Output Load Circuit
30pF
AC Output Load Circuit
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
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Table 11: DC CHARACTERISTIC (DC Operating Conditions Unless Otherwise Noted)
PARAMETER
SYM
Operating Current
Precharge Standby Current in
Power Down Mode
NOTE
1
ICC2P
CKE ≤ VIL (max), tCK=10ns
60
uA
--
ICC2PS
CKE & CLK ≤VIL(max), tCK=∞
60
uA
--
ICC2N
CKE≥VIH (min), /CS≥VIH(min),
tCK=10ns
Input Signal are changed one time
during 2clks.
6
mA
--
tCK=∞
Input signals are stable
1
mA
--
CKE≥VIH (min), /CS≥VIH(min)
ICC3P
CKE≤VIL(max), tCK=10ns
0.5
mA
--
ICC3PS
CKE & CLK ≤VIL(max), tCK=∞
0.5
mA
--
ICC3N
CKE≥VIH(min), /CS≥VIH(min),
tCK=10ns
Input Signals are changed one time
during 2clks
12
mA
--
6
mA
--
mA
1
mA
2
CKE≥VIH(min), CLK ≤ VIL(max)
tCK=∞
Input Signals are stable
Operating Current
(Burst Mode)
ICC4
tCK≥tCK(min), IOL=0mA, Page
Burst
All Banks Activated, tCCD = 1clk
Auto Refresh Current
ICC5
tRC ≥ tRFC (min) All banks active
ICC6
CKE ≤ 0.2V
1Bank
UNIT
10
mA
ICC3NS
2Bank
75
35
Active Standby Current in Non
Power-Down Mode
Self
Refresh
Current
60
Burst Length=1, One Bank Active
tRC ≥ tRC (min) IOL=0mA
ICC2NS
PASR
SPEED
ICC1
Precharge Standby Current in
Non Power Down Mode
Active Standby Current in PowerDown Mode
TEST CONDITION
55
45
35
30
TCSR
45~85C
-25~45C
65 ~ 80
45~85C
uA
60 ~ 75
-25~45C
Deep Power Down Mode Current
50 ~ 65
45 ~ 60
ICC7
5
uA
Note:
1. Measured with outputs open.
2. Refresh period is 64ms.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
22
N16D1618LPA
NanoAmp Solutions, Inc.
Advance Information
Table 12: AC CHARACTERISTIC (AC Operating Conditions Unless Otherwise Noted)
PARAMETER
CLK Cycle Time
Access time from CLK (pos. edge)
SYM
-60
MIN
-75
MAX
MIN
MAX
MIN
tCK3
6.0
CL=2
tCK2
10
CL=3
tAC3
5.5
6
8
CL=2
tAC2
8
8
8
10
1000
10
MAX
CL=3
1000
7.5
-10
10
UNIT
NOTE
1000
1
2
CLK High-Level Width
tCH
2.5
2.5
2.5
3
CLK Low-Level Width
tCL
2.5
2.5
2.5
3
tCKS
1.5
2.0
2.0
CKE Hold Time
tCKH
1.0
1.0
1.0
/CS, /RAS, /CAS, /WE, DQM Setup Time
tCMS
1.5
2.0
2.0
/CS, /RAS, /CAS, /WE, DQM Hold TIme
tCMH
1.0
1.0
1.0
Address Setup Time
tAS
1.5
2.0
2.0
Address Hold Time
tAH
1.0
1.0
1.0
Data-In Setup Time
tDS
1.5
2.0
2.0
Data-In Hold Time
tDH
1.0
1.0
1.0
CKE Setup Time
Data-Out High-Impedance Time
from CLK (pos.edge)
ns
CL=3
tHZ3
5.5
6
8
CL=2
tHZ2
8
8
8
Data-Out Low-Impedance Time
tLZ
1.0
1.0
1.0
Data-Out Hold Time (load)
tOH
2.5
2.5
2.5
Data-Out Hold Time (no load)
tOHN
1.8
1.8
1.8
ACTIVE to PRECHARGE command
tRAS
42
PRECHARGE command period
tRP
18
22.5
20
ACTIVE bank a to ACTIVE bank a command
tRC
60
67.5
60
ACTIVE bank a to ACTIVE bank b command
tRRD
12
15
20
ACTIVE to READ or WRITE delay
tRCD
18
22.5
20
READ/WRITE command to READ/WRITE
command
tCCD
1
1
1
CLK
6
WRITE command to input data delay
tDWD
0
0
0
CLK
6
Data-in to PRECHARGE command
tDPL
12
15
20
Data-in to ACTIVE command
tDAL
30
37.5
40
DQM to data high-impedance during
READs
tDQZ
2
2
2
6
DQM to data mask during WRITES
tDQM
0
0
0
6
LOAD MODE REGISTER command to
ACTIVE or REFRESH command
tMRD
2
2
2
8
CL=3
tROH3
3
3
3
CL=2
tROH2
2
2
2
Last data-in to burst STOP command
tBDL
1
1
1
Last data-in to new READ/WRITE command
tCDL
1
1
1
6
tCKED
1
1
1
9
CKE to clock enable or power-down exit
setup mode
tPED
1
1
1
9
Self Refresh Exit Time
tSRE
1
1
1
10
Data-out to high-impedance from
PRECHARGE command
CKE to clock disable or power-down entry
mode
100K
45
100K
40
4
100K
5
ns
7
7
6
CLK
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
6
23
N16D1618LPA
NanoAmp Solutions, Inc.
Advance Information
Table 12: AC CHARACTERISTIC (AC Operating Conditions Unless Otherwise Noted)
PARAMETER
SYM
-60
MIN
-75
MAX
MIN
64
-10
MAX
MIN
64
64
Refresh Period (4,096 rows)
tREF
AUTO REFRESH period
tRFC
66
67.5
70
Exit SELF REFRESH to ACTIVE command
tXSR
66
67.5
70
tT
0.5
Transition time
1.2
0.5
1.2
MAX
0.5
UNIT
NOTE
ms
5
ns
5
1.2
Note:
1. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the
clock pin) during access or precharge states (READ, WRITE, including tDPL, and PRECHARGE commands). CKE may be used
to reduce the data rate.
2. tAC at CL = 3 with no load is 5.5ns and is guaranteed by design. Access time to be measured with input signals of 1V/ns edge
rate, from 0.8V to 0.2V. If tR > 1ns, then (tR/2-0.5)ns should be added to the parameter.
3. AC characteristics assume tT = 1ns. If tR & tF > 1ns, then [(tR+tF)/2-1]ns should be added to the parameter.
4. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid
data element will meet tOH before going High-Z.
5. Parameter guaranteed by design.
A. Target values listed with alternative values in parentheses.
B. tRFC must be less than or equal to tRC+1CLK
tXSR must be less than or equal to tRC+1CLK
6. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter.
7. Timing actually specified by tDPL plus tRP; clock(s) specified as a reference only at minimum cycle rate
8. JEDEC and PC100 specify three clocks.
9. Timing actually specified by tCKs; clock(s) specified as a reference only at minimum cycle rate.
10. A new command can be given tRC after self refresh exit.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
24
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NanoAmp Solutions, Inc.
Advance Information
SPECIAL OPERATION FOR LOW POWER CONSUMPTION
TEMPERATURE COMPENSATED SELF REFRESH
Temperature Compensated Self Refresh allows the controller to program the Refresh interval during SELF REFRESH
mode, according to the case temperature of the Low Power SDRAM device. This allows great power savings during
SELF REFRESH during most operating temperature ranges. Only during extreme temperatures would the controller
have to select a TCSR level that will guarantee data during SELF REFRESH. Every cell in the DRAM requires
refreshing due to the capacitor losing its charge over time. The refresh rate is dependent on temperature. At higher
temperatures a capacitor loses charge quicker than at lower temperatures, requiring the cells to be refreshed more
often. Historically, during Self Refresh, the refresh rate has been set to accommodate the worst case, or highest
temperature range expected.
Thus, during ambient temperatures, the power consumed during refresh was unnecessarily high, because the refresh
rate was set to accommodate the higher temperatures. Setting E4 and E3, allow the DRAM to accommodate more
specific temperature regions during SELF REFRESH. There are four temperature settings, which will vary the SELF
REFRESH current according to the selected temperature. This selectable refresh rate will save power when the DRAM
is operating at normal temperatures.
PARTIAL ARRAY SELF REFRESH
For further power savings during SELF REFRESH, the PASR feature allows the controller to select the amount of
memory that will be refreshed during SELF REFRESH. The refresh options are Two Bank;all two banks, One
Bank;bank a. WRITE and READ commands can still occur during standard operation, but only the selected banks will
be refreshed during SELF REFRESH. Data in banks that are disabled will be lost.
DEEP POWER DOWN
Deep Power Down is an operating mode to achieve maximum power reduction by eliminating the power of the whole
memory array of the devices. Data will not be retained once the device enters Deep Power Down Mode. This mode is
entered by having all banks idle then /CS and /WE held low with /RAS and /CAS held high at the rising edge of the
clock, while CKE is low. This mode is exited by asserting CKE high.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
25
N16D1618LPA
NanoAmp Solutions, Inc.
Advance Information
Figure 9: Deep Power Down Mode Entry
CLK
CKE
/CS
/RAS
tRP
Deep Power Down Entry
Precharge if needed
Figure 10: Deep Power Down Mode Exit
CLK
CKE
/CS
/RAS
/CAS
/WE
100 µ s
Deep Power Down Exit
tRP
tRFC
Auto Refresh
All Banks Precharge
Auto Refresh
Mode Register Set
New Command
Extended Mode Register Set
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
26
N16D1618LPA
NanoAmp Solutions, Inc.
Advance Information
Ordering Information
N
16
D 16 18 LP A
XX - XX X
Temperature
C = Commercial (0-70C)
I = Industrial (-25 to 85)
NanoAmp Solutions
Speed
60 = 6.0ns (166MHz)
75 = 7.5ns (133MHz)
10 = 10ns (100MHz)
Package
Density
16= 16Mb
Product Type
Z2 = Green 48FBGA (RoHS Compliant)
C2 = Green 60WBGA (RoHS Compliant)
T2 = Green 50 TSOP2 (RoHS Compliant)
Generation
D = SDRAM
Data I/O Width
16 = 16 I/O
Power Supply
A = 1ST Generation
Features
LP = Low Power SDRAM
18 = 1.8V
Revision History
Revision
Date
Change Description
A
November 18, 2004
Initial ADVANCE Release
B
November 30, 2004
Changed Refresh Time to 4K / 64ms
C
December 15, 2004
General Update. Added BGA package option
D
February 16, 2005
Changed Driver Strength control EMRS Table
E
February 23, 2005
Changed Pin Ordering (Page 2)
Changed Pin Name BA to A11
F
March 1, 2005
Removed 2/3 Reg Drive Strength (Page 1)
Updated Extend Mode Register Diagram (Page 8)
Modifed Pin Name Description (Page 10)
Updated Command Truth Table (Burst Stop). Changed CKEn “X” to “H” (Page 12)
Updated Partial Array Description. Changed Bank 0 to Bank a (Page 24)
G
March 3, 2005
Updated Mode Register and Extended Mode Register Diagram (Page 7, 8, 9, 24)
Fixed Typo in Table 3 (Page 7)
Updated Footnote #14(Page 16)
Deleted tSRE from AC Timing Table and Footnote #10 (Page 22, 23)
H
May 3, 2005
Changed 48FBGA and 60WBGA package thickness to 1.0mm Max
Added Pb-Free ordering option for 48FBGA package and 60WBGA package
I
May 11, 2005
Changed 48FBGA package option to Green instead of Pb-Free.
J
June 14, 2005
Added 50-pin TSOP II package option
K
August 15, 2005
L
January 2006
Updated AC/DC characteristics and added green TSOP II
Designated green package to be RoHS Compliant
© 2004 - 2005 Nanoamp Solutions, Inc. All rights reserved.
NanoAmp Solutions, Inc. ("NanoAmp") reserves the right to change or modify the information contained in this data sheet and the products described therein, without prior notice.
NanoAmp does not convey any license under its patent rights nor the rights of others. Charts, drawings and schedules contained in this data sheet are provided for illustration purposes only and they vary depending upon specific applications.
NanoAmp makes no warranty or guarantee regarding suitability of these products for any particular purpose, nor does NanoAmp assume any liability arising out of the application
or use of any product or circuit described herein. NanoAmp does not authorize use of its products as critical components in any application in which the failure of the NanoAmp
product may be expected to result in significant injury or death, including life support systems and critical medical instrument.
Stock No. 23395- Rev L 1/06
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
27
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