ATMEL ATA6663 Lin transceiver Datasheet

Features
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Operating Range from 5V to 27V
Baud Rate up to 20Kbaud
Improved Slew Rate Control According to LIN Specification 2.0, 2.1 and SAEJ2602-2
Fully Compatible with 3.3V and 5V Devices
Atmel ATA6663: TXD Time-out Timer, Atmel ATA6664: No TXD Time-out Timer
Normal and Sleep Mode
Wake-up Capability via LIN Bus (90µs Dominant)
External Wake-up via WAKE Pin (35µs Low Level)
INH Output to Control an External Voltage Regulator or to Switch the Master Pull-up
Very Low Standby Current During Sleep Mode (10µA)
Wake-up Source Recognition
Bus Pin Short-circuit Protected versus GND and Battery
LIN Input Current < 2µA if VBAT Is Disconnected
Overtemperature Protection
High EMC Level
Interference and Damage Protection According to ISO/CD 7637
Fulfills the OEM “Hardware Requirements for LIN in Automotive Applications Rev.1.1”
LIN Transceiver
Atmel ATA6663
Atmel ATA6664
1. Description
The Atmel ATA6663 is a fully integrated LIN transceiver complying with the LIN
specification 2.0, 2.1 and SAEJ2602-2. The Atmel ATA6664 is an identical version,
the only difference is that the TXD-dominant Time-out function is disabled so the
device is able to send a static low signal to the LIN bus. It interfaces the LIN protocol
handler and the physical layer. The device is designed to handle the low-speed data
communication in vehicles, for example, in convenience electronics. Improved slope
control at the LIN bus ensures secure data communication at up to 20Kbaud with an
RC oscillator for protocol handling. Sleep Mode guarantees minimal current consumption even in the case of a floating bus line or a short circuit on the LIN bus to GND.
The ATA6663/ATA6664 feature advanced EMI and ESD performance.
9146D–AUTO–09/10
Figure 1-1.
Block Diagram
7
VS
6
LIN
Receiver
RXD
1
Filter
Short-circuit and overtemperature protection
Wake-up bus timer
TXD
TXD
time-out
timer
4
Slew rate control
(only ATA6663)
VS
VS
Control unit
WAKE
Wake-up
timer
3
5
Sleep mode
2
GND
8
EN
INH
2. Pin Configuration
Figure 2-1.
Pinning SO8
RXD
EN
WAKE
TXD
Table 2-1.
8
7
6
5
INH
VS
LIN
GND
Pin Description
Pin
Symbol
1
RXD
2
EN
Enables normal mode; when the input is open or low, the device is in sleep mode
3
WAKE
High voltage input for local wake-up request. If not needed, connect directly to VS
4
TXD
Transmit data input; active low output (strong pull-down) after a local wake-up request
5
GND
Ground, heat sink
6
LIN
7
VS
Battery supply
INH
Battery-related inhibit output for controlling an external voltage regulator or to switch-off the LIN master
pull-up resistor; active high after a wake-up request
8
2
1
2
3
4
Function
Receive data output (open drain)
LIN bus line input/output
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
3. Functional Description
3.1
Physical Layer Compatibility
Since the LIN physical layer is independent from higher LIN layers (e.g., the LIN protocol
layer), all nodes with a LIN physical layer according to LIN2.x can be used along with LIN
physical layer nodes, which are according to older versions (i.e., LIN1.0, LIN1.1, LIN1.2,
LIN1.3), without any restrictions.
3.2
Supply Pin (VS)
Undervoltage detection is implemented to disable transmission if VS falls to a value below 5V
in order to avoid false bus messages. After switching on VS, the IC switches to fail-safe mode
and INHIBIT is switched on. The supply current in sleep mode is typically 10µA.
3.3
Ground Pin (GND)
The Atmel ATA6663/ATA6664 does not affect the LIN Bus in the case of a GND disconnection. It is able to handle a ground shift up to 11.5% of VS.
3.4
Bus Pin (LIN)
A low-side driver with internal current limitation and thermal shutdown, and an internal pull-up
resistor are implemented as specified by LIN2.x. The voltage range is from –27V to +40V. This
pin exhibits no reverse current from the LIN bus to VS, even in the case of a GND shift or VBatt
disconnection. The LIN receiver thresholds are compatible to the LIN protocol specification.The fall time (from recessive to dominant) and the rise time (from dominant to recessive)
are slope controlled. The output has a self-adapting short-circuit limitation: During current limitation, as the chip temperature increases, the current is reduced.
Note:
3.5
The internal pull-up resistor is only active in normal and fail-safe mode.
Input/Output Pin (TXD)
In Normal Mode the TXD pin is the microcontroller interface to control the state of the LIN output. TXD must be at Low- level in order to have a low LIN Bus. If TXD is high, the LIN output
transistor is turned off and the Bus is in recessive state. The TXD pin is compatible to both a
3.3V or 5V supply. During fail-safe Mode, this pin is used as output and is signalling the wakeup source (see Section 3.14 “Wake-up Source Recognition” on page 8). It is current limited to
< 8mA.
3.6
TXD Dominant Time-out Function (only Atmel ATA6663)
The TXD input has an internal pull-down resistor. An internal timer prevents the bus line from
being driven permanently in dominant state. If TXD is forced to low longer than tDOM > 40ms,
the pin LIN will be switched off (recessive mode). To reset this mode, TXD needs to be
switched to high (> 10µs) before switching LIN to dominant again.
Note:
The ATA6664 does not provide this functionality.
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9146D–AUTO–09/10
3.7
Output Pin (RXD)
This pin forwards information on the state of the LIN bus to the microcontroller. LIN high
(recessive) is indicated by a high level at RXD, LIN low (dominant) is reported by a low voltage
at RXD. The output is an open drain, therefore, it is compatible to a 3.3V or 5V power supply.
The AC characteristics are defined by a pull-up resistor of 5kΩ to 5V and a load capacitor of
20pF. The output is short-current protected. In unpowered mode (VS = 0V), RXD is switched
off. For ESD protection a Zener diode with VZ = 6.1V is integrated.
3.8
Enable Input Pin (EN)
This pin controls the operation mode of the device. If EN = 1, the device is in normal mode,
with the transmission path from TXD to LIN and from LIN to RXD both active. At a falling edge
on EN, while TXD is already set to high, the device switches to sleep mode and transmission
is not possible. In sleep mode, the LIN bus pin is connected to VS with a weak pull-up current
source. The device can transmit only after being woken up (see Section 3.9, “Inhibit Output
Pin (INH)” ).
During sleep mode the device is still supplied from the battery voltage. The supply current is
typically 10µA. The pin EN provides a pull-down resistor in order to force the transceiver into
sleep mode in case the pin is disconnected.
3.9
Inhibit Output Pin (INH)
This pin is used to control an external voltage regulator or to switch on/off the LIN Master
pull-up resistor in case the device is used in a Master node. The inhibit pin provides an internal
switch towards pin VS which is protected by temperature monitoring. If the device is in normal
or fail-safe mode, the inhibit high-side switch is turned on. When the device is in sleep mode,
the inhibit switch is turned off, thus disabling the voltage regulator or other connected external
devices.
A wake-up event on the LIN bus or at pin WAKE will switch the INH pin to the VS level. After a
system power-up (VS rises from zero), the pin INH switches automatically to the VS level.
3.10
Wake-up Input Pin (WAKE)
This pin is a high-voltage input used to wake-up the device from sleep mode. It is usually
connected to an external switch in the application to generate a local wake-up. A pull-up current source with typically –10µA is implemented. The voltage threshold for a wake-up signal is
3V below the VS voltage with an output current of typically –3µA.
If a local wake-up is not needed in the application, pin WAKE can directly be connected to pin
VS.
4
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
3.11
Operation Modes
1. Normal Mode
This is the normal transmitting and receiving mode. All features are available.
2. Sleep Mode
In this mode the transmission path is disabled and the device is in low-power mode.
Supply current from VBatt is typically 10µA. A wake-up signal from the LIN bus or via
pin WAKE will be detected and will switch the device to fail-safe mode. If EN then
switches to high, normal mode is activated. Input debounce timers at pin WAKE
(tWAKE), LIN (tBUS) and EN (tsleep,tnom) prevent unwanted wake-up events due to automotive transients or EMI. In sleep mode the INH pin remains floating. The internal
termination between pin LIN and pin VS is disabled. Only a weak pull-up current (typical 10 µA) between pin LIN and pin VS is present. Sleep mode can be activated
independently from the actual level on pin LIN or WAKE.
3. Fail-safe Mode
At system power-up or after a wake-up event, the device automatically switches to
fail-safe mode. It switches the INH pin to a high state, to the VS level when VS
exceeds 5V. LIN communication is switched off. The microcontroller of the application
will then confirm normal mode by setting the EN pin to high.
Figure 3-1.
Mode of Operation
Power-up
a
a: Power-up (VS > 3V)
b: VS < 5V
c: Bus wake-up event
d: Wake-up from wake switch
Fail-safe Mode
Communication: OFF
RXD: see table of Modes
INH: high (INH HS switch ON) if VS > 5V
b
EN = 1
& NOT b
b
c or d
Go to sleep command
EN = 0
Normal Mode
INH: high (INH HS switch ON)
Communication: ON
Table 3-1.
Local wake-up event
EN = 1
Sleep Mode
INH: high impedance (INH HS switch OFF)
Communication: OFF
Table of Operation Modes
Mode of Operation
Transceiver
Fail-safe
Off
Normal
Sleep
On
Off
INH
On, except
VS < 5V
On
Off
RXD
High, except after
wake-up
LIN depending
High ohmic
LIN
Recessive
TXD depending
Recessive
Wake-up events from sleep mode:
• LIN bus
• EN pin
• WAKE pin
• VS undervoltage
Figure 3-1 on page 5, Figure 3-2 on page 6 and Figure 3-5 on page 8 show the details of
wake-up operations.
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9146D–AUTO–09/10
3.12
Remote Wake-up via Dominant Bus State
A voltage lower than the LIN pre-wake detection VLINL at pin LIN activates the internal LIN
receiver and starts the wake-up detection timer.
A falling edge at pin LIN, followed by a dominant bus level VBUSdom maintained for a certain
time period (tBUS) and a rising edge at pin LIN results in a remote wake-up request. The device
switches to fail-safe mode. Pin INH is activated (switches to VS) and the internal termination
resistor is switched on. The remote wake-up request is indicated by a low level at pin RXD to
interrupt the microcontroller (see Figure 3-2).
Figure 3-2.
LIN Wake-up Waveform Diagram
Bus wake-up filtering time
(tBUS)
LIN bus
High
INH
Low or floating
RXD
High or floating
Low
External
voltage
regulator
Off state
Regulator wake-up time delay
Normal
Mode
EN High
EN
Node in sleep state
Microcontroller start-up
delay time
In sleep mode the device has a very low current consumption, even during short-circuits or
floating conditions on the bus. A floating bus can arise if the Master pull-up resistor is missing,
e.g., in case it is switched off when the LIN Master is in sleep mode or if the power supply of
the Master node is switched off.
To minimize the current consumption IVS during voltage levels at the LIN-pin below the LIN
pre-wake threshold, the receiver is activated only for a specific time tmon. If tmon elapses while
the voltage at the bus is lower than pre-wake detection low (VLINL) and higher than the LIN
dominant level, the receiver is switched off again and the circuit reverts to sleep mode. The
current consumption is then the result of IVSsleep plus ILINwake. If a dominant state is reached on
the bus no wake-up will occur. Even if the voltage exceeds the pre-wake detection high
(VLINH), the IC will remain in sleep mode (see Figure 3-3 on page 7).
This means the LIN bus must be above the Pre-wake detection threshold VLINH for a few
microseconds before a new LIN wake-up is possible.
6
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
Figure 3-3.
Floating LIN Bus During Sleep Mode
LIN Pre-wake
VLINL
LIN BUS
LIN dominant state
VBUSdom
tmon
IVSsleep
+ ILINwake
IVSfail
IVS
IVSsleep
Mode of
operation
Sleep Mode
Int. Pull-up
Resistor
RLIN
IVSsleep
Wake-up Detection Phase
Sleep Mode
off (disabled)
If the Atmel® ATA6663/ATA6664 is in sleep mode and the voltage level at the LIN is in dominant state (VLIN < VBUSdom) for a time period exceeding tmon (during a short circuit at LIN, for
example), the IC switches back to sleep mode. The VS current consumption then consists of
IVSsleep plus ILINWAKE. After a positive edge at pin LIN the IC switches directly to fail-safe mode
(see Figure 3-4).
Figure 3-4.
Short Circuit to GND on the LIN Bus During Sleep Mode
LIN Pre-wake
LIN BUS
VLINL
LIN dominant state
VBUSdom
tmon
tmon
IVSfail
IVS
Mode of
operation
Int. Pull-up
Resistor
RLIN
IVSsleep
Sleep Mode
Wake-up Detection Phase
off (disabled)
IVSsleep
+ ILINwake
Sleep Mode
Fail-Safe Mode
on (enabled)
7
9146D–AUTO–09/10
3.13
Local Wake-up via Pin WAKE
A falling edge at pin WAKE, followed by a low level maintained for a certain time period
(tWAKE), results in a local wake-up request. According to ISO7637, the wake-up time ensures
that no transient creates a wake-up. The device then switches to fail-safe mode. Pin INH is
activated (switches to V S ) and the internal termination resistor is switched on. The local
wake-up request is indicated both by a low level at pin RXD to interrupt the microcontroller and
by a strong pull-down at pin TXD (see Figure 3-5). The voltage threshold for a wake-up signal
is 3V below the VS voltage with an output current of typically –3µA. Even in case of a continuous low at pin WAKE it is possible to switch the IC into sleep mode via a low level at pin EN.
The IC will remain in sleep mode for an unlimited time. To generate a new wake-up at pin
WAKE, a high signal > 6 µs is required. A negative edge then starts the wake-up filtering time
again.
Figure 3-5.
Wake-up from Wake-up Switch
State change
Wake pin
INH
Low or floating
RXD
High or floating
TXD
TXD weak pull-down resistor
High
Low
High
TXD strong pull-down
Weak
pull-down
Wake filtering time
tWAKE
Voltage
regulator
On state
Off state
Regulator wake-up time delay
EN
Node in
operation
EN High
Node in sleep state
Microcontroller start-up
delay time
3.14
Wake-up Source Recognition
The device can distinguish between a local wake-up request (pin WAKE) and a remote
wake-up request (LIN bus). The wake-up source can be read at pin TXD in fail-safe mode. If
an external pull-up resistor (typically 5kΩ) has been added on pin TXD to the power supply of
the microcontroller, a high level indicates a remote wake-up request (weak pull-down at pin
TXD), a low level indicates a local wake-up request (strong pull-down at pin TXD).
The wake-up request flag (indicated at pin RXD) as well as the wake-up source flag (indicated
at pin TXD) are reset immediately if the microcontroller sets pin EN to high (see Figure 3-2 on
page 6 and Figure 3-5 on page 8).
8
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
3.15
Fail-safe Features
• During a short-circuit at LIN to VBAT, the output limits the output current to IBUS_LIM. Due
to the power dissipation, the chip temperature exceeds Toff, and the LIN output is switched
off. The chip cools down, and after a hysteresis of Thys, it switches the output on again.
• During a short-circuit from LIN to GND the IC can be switched to sleep mode, and even in
this case the current consumption is lower than 45µA. When the short-circuit has elapsed,
the IC starts with a remote wake-up.
• If the Atmel® ATA6663/ATA6664 is in sleep mode and a floating condition occurs on the
bus, the IC switches back to sleep mode automatically. The current consumption is lower
than 45µA in this case.
• The reverse current is < 2µA at pin LIN during loss of VBAT. This is the best behavior for bus
systems where some slave nodes are supplied from battery or ignition.
• Pin EN provides a pull-down resistor to force the transceiver into sleep mode if EN is
disconnected
• Pin RXD is set floating if VBAT is disconnected
• Pin TXD provides a pull-down resistor to provide a static low if TXD is disconnected
• The INH output transistor is protected by temperature monitoring
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9146D–AUTO–09/10
4. Absolute Maximum Ratings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Parameters
Max.
Unit
–0.3
+40
V
Wake DC and transient voltage (with 2.7kΩ serial resistor)
- Transient voltage according to ISO7637 (coupling 1nF)
–3
–150
+40
+100
V
V
Logic pins (RXD, TXD, EN)
–0.3
+5.5
V
LIN
- DC voltage
- Transient voltage according to ISO7637 (coupling 1nF)
–27
–150
+40
+100
V
V
INH
- DC voltage
–0.3
VS + 0.3
V
VS
- Continuous supply voltage
Symbol
ESD according to IBEE LIN EMC
Test specification 1.0 according to IEC 61000-4-2
- Pin VS, LIN to GND
- Pin WAKE (2.7kΩ serial resistor)
Min.
Typ.
±8
±6
KV
KV
±6
KV
±3
KV
CDM ESD STM 5.3.1
±750
V
Machine Model ESD AEC-Q100-Rev.F (003)
±200
V
ESD HBM according to STM5.1
with 1.5kΩ / 100pF
- Pin VS, LIN, WAKE, INH to GND
HBM ESD
ANSI/ESD-STM5.1
JESD22-A114
AEC-Q100 (002)
Junction temperature
Tj
–40
+150
°C
Storage temperature
Tstg
–55
+150
°C
Symbol
Min.
Max.
Unit
145
K/W
5. Thermal Characteristics
Parameters
Thermal resistance junction ambient
RthJA
Special heat sink at GND (pin 5) on PCB (fused lead
frame to pin 5)
RthJA
Typ.
80
K/W
Thermal shutdown
Toff
150
165
180
°C
Thermal shutdown hysteresis
Thys
5
10
20
°C
10
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
6. Electrical Characteristics
5V < VS < 27V, Tj = –40°C to +150°C
No.
1
1.1
1.2
Parameters
Test Conditions
Pin
Symbol
Min.
Typ.
Max.
Unit
Type*
5
13.5
27
V
A
VS Pin
DC voltage range nominal
Supply current in sleep mode
1.3
Supply current in normal mode
1.4
7
VS
Sleep mode
VLIN > VS – 0.5V
VS < 14V
7
IVSsleep
10
20
µA
A
Sleep mode,
bus shorted to GND
VLIN = 0V
VS < 14V
7
IVSsleep_sc
23
45
µA
A
Bus recessive
VS < 14V
7
IVSrec
0.9
1.3
mA
A
Bus dominant
VS < 14V
Total bus load > 500Ω
7
IVSdom
1.2
2
mA
A
Bus recessive
VS < 14V
7
IVSfail
0.5
1.1
mA
A
1.5
Supply current in fail-safe mode
1.6
VS undervoltage threshold on
7
VSth
4
4.95
V
A
1.7
VS undervoltage threshold off
7
VSth
4.05
5
V
A
1.8
VS undervoltage threshold
hysteresis
7
VSth_hys
50
500
mV
A
1.3
8
mA
A
0.4
V
A
2
RXD Output Pin (Open Drain)
2.1
Low-level output sink current
Normal mode
VLIN = 0V, VRXD = 0.4V
1
IRXDL
2.2
RXD saturation voltage
5-kΩ pull-up resistor to 5V
1
VsatRXD
2.3
High-level leakage current
Normal mode
VLIN = VBAT, VRXD = 5V
1
IRXDH
–3
+3
µA
A
2.4
ESD Zener diode
IRXD = 100µA
1
VZRXD
5.8
8.6
V
A
3
2.5
TXD Input Pin
3.1
Low-level voltage input
4
VTXDL
–0.3
+0.8
V
A
3.2
High-level voltage input
4
VTXDH
2
7
V
A
600
kΩ
A
+3
µA
A
8
mA
A
+0.8
V
A
3.3
Pull-down resistor
VTXD = 5V
4
RTXD
125
3.4
Low-level leakage current
VTXD = 0V
4
ITXD_leak
–3
3.5
Low-level output sink current
Fail-safe mode, local wake-up
VTXD = 0.4V
VLIN = VBAT
4
ITXD
1.3
2
VENL
–0.3
4
250
2.5
EN Input Pin
4.1
Low-level voltage input
4.2
High-level voltage input
2
VENH
2
4.3
Pull-down resistor
VEN = 5V
2
REN
125
4.4
Low-level input current
VEN = 0V
2
IEN
–3
250
7
V
A
600
kΩ
A
+3
µA
A
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
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6. Electrical Characteristics (Continued)
5V < VS < 27V, Tj = –40°C to +150°C
No.
5
Parameters
Test Conditions
Pin
Symbol
Min.
VS –
0.75
Typ.
Max.
Unit
Type*
VS
V
A
50
Ω
A
INH Output Pin
5.1
High-level voltage
Normal or fail-safe mode
IINH = –15mA
8
VINHH
5.2
Switch-on resistance between
VS and INH
Normal or fail-safe mode
8
RINH
5.3
Leakage current
Sleep mode
VINH = 0V/27V, VS = 27V
8
IINHL
–3
+3
µA
A
3
VWAKEH
VS –
1V
VS +
0.3V
V
A
VS –
3.3V
V
A
µA
A
6
30
WAKE Pin
6.1
High-level input voltage
6.2
Low-level input voltage
IWAKE = typically –3µA
3
VWAKEL
–1V
6.3
Wake pull-up current
VS < 27V
3
IWAKE
–30
6.4
High-level leakage current
VS = 27V, VWAKE = 27V
3
IWAKE
–5
+5
µA
A
0.9 ×
VS
VS
V
A
7
–10
LIN Bus Driver
7.1
Driver recessive output voltage
RLOAD = 500Ω / 1kΩ
6
VBUSrec
7.2
Driver dominant voltage
VBUSdom_DRV_LoSUP
VVS = 7V, Rload = 500Ω
6
V_LoSUP
1.2
V
A
7.3
Driver dominant voltage
VBUSdom_DRV_HiSUP
VVS = 18V, Rload = 500Ω
6
V_HiSUP
2
V
A
7.4
Driver dominant voltage
VBUSdom_DRV_LoSUP
VVS = 7V, Rload = 1000Ω
6
V_LoSUP_1k
0.6
V
A
7.5
Driver dominant voltage
VBUSdom_DRV_HiSUP
VVS = 18V, Rload = 1000Ω
6
V_HiSUP_1k_
0.8
V
A
7.6
Pull-up resistor to VS
The serial diode is mandatory
6
RLIN
20
47
kΩ
A
7.7
In pull-up path with Rslave
Voltage drop at the serial diodes
ISerDiode = 10mA
6
VSerDiode
0.4
1.0
V
D
7.8
LIN current limitation
VBUS = VBAT_max
6
IBUS_LIM
40
200
mA
A
7.9
Input leakage current at the
receiver, including pull-up
resistor as specified
Input leakage current
Driver off
VBUS = 0V, VS = 12V
6
IBUS_PAS_dom
–1
mA
A
7.10
Leakage current LIN recessive
Driver off
8V < VBAT < 18V
8V < VBUS < 18V
VBUS ≥ VBAT
6
IBUS_PAS_rec
7.11
Leakage current at ground loss;
control unit disconnected from
GNDDevice = VS
ground; loss of local ground must VBAT =12V
not affect communication in the 0V < VBUS < 18V
residual network
6
IBUS_NO_Gnd
–10
30
120
10
20
µA
A
+0.5
+10
µA
A
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
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Atmel ATA6663/ATA6664
6. Electrical Characteristics (Continued)
5V < VS < 27V, Tj = –40°C to +150°C
No.
Parameters
Pin
Symbol
7.12
Leakage current at loss of
battery; node has to substain the VBAT disconnected
current that can flow under this VSUP_Device = GND
condition; bus must remain
0V < VBUS < 18V
operational under this condition
6
IBUS_NO_Bat
7.13
Capacitance on pin LIN to GND
6
CLIN
8
Test Conditions
Min.
Typ.
Max.
Unit
Type*
0.1
2
µA
A
20
pF
D
0.525
× VS
V
A
LIN Bus Receiver
8.1
Center of receiver threshold
VBUS_CNT =
(Vth_dom + Vth_rec) / 2
6
VBUS_CNT
0.475 ×
VS
8.2
Receiver dominant state
VEN = 5V
6
VBUSdom
–27
0.4 ×
VS
V
A
8.3
Receiver recessive state
VEN = 5V
6
VBUSrec
0.6 ×
VS
40
V
A
8.4
Receiver input hysteresis
VHYS = Vth_rec – Vth_dom
6
VBUShys
0.028 ×
VS
0.175
× VS
V
A
8.5
Pre-wake detection LIN
High-level input voltage
6
VLINH
VS –
2V
VS +
0.3V
V
A
8.6
Pre-wake detection LIN
Low-level input voltage
Switches the LIN receiver on
6
VLINL
–27V
VS –
3.3V
V
A
8.7
LIN Pre-wake pull-up current
VS < 27V
VLIN = 0V
6
ILINWAKE
–30
–10
µA
A
9
0.5 ×
VS
0.1 ×
VS
Internal Timers
9.1
Dominant time for wake-up via
LIN bus
VLIN = 0V
6
tBUS
30
90
150
µs
A
9.2
Time of low pulse for wake-up
via pin WAKE
VWAKE = 0V
3
tWAKE
7
35
50
µs
A
9.3
Time delay for mode change
from fail-safe mode to normal
mode via pin EN
VEN = 5V
2
tnorm
2
7
15
µs
A
9.4
Time delay for mode change
from normal mode into sleep
mode via pin EN
VEN = 0V
2
tsleep
7
15
24
µs
A
9.5
Atmel ATA6663:
TXD dominant time out time
VTXD = 0V
4
tdom
40
60
85
ms
A
9.6
Power-up delay between VS = 5V
VVS = 5V
until INH switches to high
7, 8
tVS
200
µs
A
9.7
Monitoring time for wake-up via
LIN bus
6
tmon
15
ms
A
6
10
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
13
9146D–AUTO–09/10
6. Electrical Characteristics (Continued)
5V < VS < 27V, Tj = –40°C to +150°C
No.
Parameters
10
LIN Bus Driver AC Parameter with Different Bus Loads
Load 1 (small): 1nF, 1kΩ ; Load 2 (large): 10nF, 500Ω ; RRXD = 5kΩ ; CRXD = 20pF;
Load 3 (medium): 6.8nF, 660Ω characterized on samples; 10.1 and 10.2 specifies the timing parameters for proper
operation at 20Kbit/s, 10.3 and 10.4 at 10.4Kbit/s.
10.1
10.2
10.3
10.4
11
Test Conditions
Pin
Symbol
Min.
Typ.
Max.
Unit
Type*
Duty cycle 1
THRec(max) = 0.744 × VS
THDom(max) = 0.581 × VS
VS = 7.0V to 18V
tBit = 50µs
D1 = tbus_rec(min) / (2 × tBit)
6
D1
Duty cycle 2
THRec(min) = 0.422 × VS
THDom(min) = 0.284 × VS
VS = 7.0V to 18V
tBit = 50µs
D2 = tbus_rec(max) / (2 × tBit)
6
D2
Duty cycle 3
THRec(max) = 0.778 × VS
THDom(max) = 0.616 × VS
VS = 7.0V to 18V
tBit = 96µs
D3 = tbus_rec(min) / (2 × tBit)
6
D3
Duty cycle 4
THRec(min) = 0.389 × VS
THDom(min) = 0.251 × VS
VS = 7.0V to 18V
tBit = 96µs
D4 = tbus_rec(max) / (2 × tBit)
6
D4
0.590
6
µs
A
+2
µs
A
0.396
A
0.581
A
0.417
A
A
Receiver Electrical AC Parameters of the LIN Physical Layer
LIN receiver, RXD load conditions: CRXD = 20pF, Rpull-up = 5kΩ
11.1
Propagation delay of receiver
(see Figure 6-1 on page 15)
trec_pd = max(trx_pdr , trx_pdf)
VS = 7.0V to 18V
1
trx_pd
11.2
Symmetry of receiver
propagation delay rising edge
minus falling edge
trx_sym = trx_pdr – trx_pdf
VS = 7.0V to 18V
1
trx_sym
–2
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
14
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
Figure 6-1.
Definition of Bus Timing Parameter
tBit
tBit
tBit
TXD
(Input to transmitting node)
tBus_dom(max)
tBus_rec(min)
Thresholds of
THRec(max)
receiving node 1
VS
(Transceiver supply
of transmitting node)
THDom(max)
LIN Bus Signal
Thresholds of
THRec(min)
receiving node 2
THDom(min)
tBus_dom(min)
tBus_rec(max)
RXD
(Output of receiving node 1)
trx_pdr(1)
trx_pdf(1)
RXD
(Output of receiving node 2)
trx_pdr(2)
trx_pdf(2)
15
9146D–AUTO–09/10
Figure 6-2.
Application Circuit
Master node
pull-up
VBAT
22 µF
100 nF
12V
1k
7
Atmel ATA6663/ATA6664
5 kΩ
VDD
VS
Receiver
1
LIN sub bus
5V
RXD
Filter
Microcontroller
LIN
Wake-up bus timer
4
TXD
Time-out
timer
TXD
220 pF
VS
VS
Control unit
10 kΩ
2.7 kΩ
16
Slew rate control
Short-circuit and
overtemperature
protection
(only ATA6663)
GND IO
External
switch
6
3
WAKE
Wake-up
timer
5
Sleep mode
GND
2
8
EN
INH
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
7. Ordering Information
Extended Type Number
Package
Remarks
ATA6663-FAQW
DFN8
LIN transceiver, Pb-free, 8k, taped and reeled
ATA6663-TAQY
SO8
LIN transceiver, Pb-free, 4k, taped and reeled
ATA6664-TAQY
SO8
LIN transceiver, Pb-free, 4k, taped and reeled
8. Package Information
Figure 8-1.
SO8
Package: SO 8
Dimensions in mm
5±0.2
4.9±0.1
0.1+0.15
1.4
0.2
3.7±0.1
0.4
1.27
3.8±0.1
6±0.2
3.81
8
5
technical drawings
according to DIN
specifications
1
4
Drawing-No.: 6.541-5031.01-4
Issue: 1; 15.08.06
17
9146D–AUTO–09/10
Figure 8-2.
DFN8
Top View
D
8
E
PIN 1 ID
technical drawings
according to DIN
specifications
1
A
A3
A1
Dimensions in mm
Side View
Partially Plated Surface
Bottom View
4
COMMON DIMENSIONS
E2
1
Z
(Unit of Measure = mm)
Symbol
MIN
NOM
MAX
A
0.8
0.9
1
e
A1
A3
0.0
0.15
0.02
0.2
0.05
0.25
D2
D
2.9
3
3.1
D2
2.35
2.4
2.45
E
2.9
3
3.1
E2
1.55
1.6
1.65
L
0.35
0.4
0.45
b
e
0.25
0.28
0.65 BSC
0.35
8
5
L
Z 10:1
NOTE
b
Package Drawing Contact:
[email protected]
18
TITLE
Package: VQFN_3x3_8L
Exposed pad 2.4x1.6
03/03/10
DRAWING NO. REV.
6.543-5165.02-4
1
Atmel ATA6663/ATA6664
9146D–AUTO–09/10
Atmel ATA6663/ATA6664
9. Revision History
Please note that the following page numbers referred to in this section refer to the specific revision
mentioned, not to this document.
Revision No.
History
9146D-AUTO-09/10
• Section 7 “Ordering Information” on page 17 changed
• Section 8 “Package Information” on pages 17 to 18 changed
9146C-AUTO-07/10
• Section 6 “Electrical Characteristics” numbers 9.4 and 9.5 on page 13
changed
9146B-AUTO-05/10
• Features changed
• Headings 3.6 and 3.10: text changed
• Abs.Max.Ratings table: row “ESD HBM acc. to STM5.1” changed
19
9146D–AUTO–09/10
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