Cypress CY7C188-20VC 32k x 9 static ram Datasheet

CY7C188
32K x 9 Static RAM
Features
Functional Description
• High speed
The CY7C188 is a high-performance CMOS static RAM
organized as 32,768 words by 9 bits. Easy memory expansion
is provided by an active-LOW chip enable (CE1), an
active-HIGH chip enable (CE2), an active-LOW output enable
(OE), and tri-state drivers. The device has an automatic
power-down feature that reduces power consumption by more
than 75% when deselected.
— 15 ns
• Automatic power-down when deselected
• Low active power
— 660 mW
• Low standby power
Writing to the device is accomplished by taking CE1 and write
enable (WE) inputs LOW and CE2 input HIGH. Data on the
nine I/O pins (I/Oo – I/O8) is then written into the location
specified on the address pins (A0 – A14).
— 55 mW
• CMOS for optimum speed/power
• TTL-compatible inputs and outputs
• Easy memory expansion with CE1, CE2, and OE
features
• Available in non Pb-free 32-Lead (300-Mil) Molded SOJ
Reading from the device is accomplished by taking CE1 and
OE LOW while forcing WE and CE2 HIGH. Under these conditions, the contents of the memory location specified by the
address pins will appear on the I/O pins.
The nine input/output pins (I/O0 – I/O8) are placed in a
high-impedance state when the device is deselected (CE1
HIGH or CE2 LOW), the outputs are disabled (OE HIGH), or
during a write operation (CE1 LOW, CE2 HIGH, and WE LOW).
The CY7C188 is available in standard 300-mil-wide SOJ.
Logic Block Diagram
Pin Configuration
SOJ
Top View
I/O0
I/O1
I/O2
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
ROW DECODER
INPUT BUFFER
32K x 9
ARRAY
I/O3
I/O4
I/O5
I/O6
COLUMN
DECODER
POWER
DOWN
Cypress Semiconductor Corporation
Document #: 38-05053 Rev. *A
I/O0
I/O1
I/O2
I/O3
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VCC
A14
CE2
WE
A13
A9
A10
A11
OE
A12
CE1
I/O8
I/O7
I/O6
I/O5
I/O4
C188–2
I/O7
I/O8
A7
A8
A9
A 10
A 11
A 12
A 13
A 14
CE1
CE2
WE
OE
NC
NC
A8
A7
A6
A5
A4
A3
A2
A1
A0
C188–1
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised September 28, 2006
CY7C188
Selection Guide
Maximum Access Time (ns)
–15
15
–20
20
Maximum Operating Current (mA)
120
170
Maximum CMOS Standby Current (mA)
10
15
DC Input Voltage[1] ................................. –0.5V to VCC +0.5V
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on VCC Relative to GND
(Pin 32 to Pin 16) .......................................... –0.5V to + 7.0V
DC Voltage Applied to Outputs
in High Z State[1] ....................................–0.5V to VCC + 0.5V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current .................................................... >200 mA
Operating Range
Range
Ambient
Temperature
VCC
Commercial
0°C to +70°C
5V ± 10%
Electrical Characteristics Over the Operating Range[2]
–15
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
VIH
Input HIGH Voltage
Voltage[1]
Min.
–20
Max.
Min.
2.4
Max.
2.4
0.4
Unit
V
0.4
V
2.2
VCC + 0.3
2.2
VCC + 0.3
V
–0.5
0.8
–0.5
0.8
V
VIL
Input LOW
IIX
Input Leakage Current
GND ≤ VI ≤ VCC
–5
+5
–5
+5
µA
IOZ
Output Leakage Current
GND ≤ VI ≤ VCC,
Output Disabled
–5
+5
–5
+5
µA
ICC
VCC Operating
Supply Current
VCC = Max., IOUT = 0 mA,
f = fMAX = 1/tRC
120
170
mA
ISB1
Automatic CE
Power-Down Current—
TTL Inputs
Max. VCC, CE1 ≥ VIH
or CE2 ≤ VIL,VIN ≥ VIH or
VIN ≤ VIL, f = fMAX
35
35
mA
ISB2
Automatic CE
Power-Down Current
— CMOS Inputs
Max. VCC, CE1 ≥ VCC –0.3V or
CE2 ≤ 0.3V, VIN ≥ VCC – 0.3V
or VIN ≤ 0.3V, f = 0
10
15
mA
Capacitance[3]
Parameter
Description
CIN: Addresses
Input Capacitance
CIN: Controls
Input Capacitance
COUT
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Max.
Unit
6
pF
8
pF
8
pF
Notes:
1. Minimum voltage is equal to –2.0V for pulse durations less than 20 ns.
2. See the last page of this specification for Group A subgroup testing information.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05053 Rev. *A
Page 2 of 7
CY7C188
AC Test Loads and Waveforms[4, 5]
R1 481Ω
R1 481Ω
5V
5V
OUTPUT
ALLINPUTPULSES
OUTPUT
R2
255Ω
30 pF
INCLUDING
JIGAND
SCOPE
Equivalent to:
3.0V
R2
255Ω
5 pF
INCLUDING
JIGAND
SCOPE
(a)
(b)
10%
90%
10%
90%
GND
≤ 3 ns
≤ 3 ns
C188–3
C188–4
THÉVENIN EQUIVALENT
167Ω
OUTPUT
1.73V
Switching Characteristics Over the Operating Range[2, 4]
–15
Parameter
Description
Min.
–20
Max.
Min.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
15
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE1 LOW or CE2 HIGH to Data Valid
15
20
ns
tDOE
OE LOW to Data Valid
7
9
ns
15
Z[6]
tLZOE
OE LOW to Low
tHZOE
OE HIGH to High Z[5,6]
3
20
CE1 LOW or CE2 HIGH to Low
tHZCE
CE1 HIGH or CE2 LOW to High Z[5, 6]
tPU
CE1 LOW or CE2 HIGH to Power-Up
tPD
CE1 HIGH or CE2 LOW to Power-Down
3
ns
9
3
7
0
ns
ns
9
0
15
ns
ns
0
7
Z[6]
ns
3
0
tLZCE
WRITE
20
ns
ns
20
ns
CYCLE[7, 8]
tWC
Write Cycle Time
15
20
ns
tSCE
CE1 LOW or CE2 HIGH to Write End
10
15
ns
tAW
Address Set-Up to Write End
10
15
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Set-Up to Write Start
0
0
ns
tPWE
WE Pulse Width
10
15
ns
tSD
Data Set-Up to Write End
8
10
ns
tHD
Data Hold from Write End
0
tHZWE
WE LOW to High Z[5]
0
tLZWE
WE HIGH to Low
Z[5, 6]
3
0
7
0
3
ns
7
ns
ns
Notes:
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 30-pF load capacitance.
5. tHZOE, tHZCE, and tHZWE are specified with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. The internal write time of the memory is defined by the overlap of CE1, LOW, CE2 HIGH, and WE LOW. All three signals must be asserted to initiate a write and any
signal can terminate a write by being deasserted. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
8. The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document #: 38-05053 Rev. *A
Page 3 of 7
CY7C188
Switching Waveforms
Read Cycle No. 1[9,10]
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
C188–5
Read Cycle No. 2 (Chip-Enable Controlled)[10,11,12]
tRC
CE1
tACE
OE
tHZOE
tHZCE
tDOE
DATA OUT
tLZOE
HIGH IMPEDANCE
HIGH
IMPEDANCE
DATA VALID
tLZCE
VCC
SUPPLY
CURRENT
tPD
tPU
ICC
50%
50%
ISB
C188–6
Write Cycle No. 1 (WE Controlled)[7,12,13,14]
tWC
ADDRESS
CE1
tAW
tSA
tHA
tPWE
WE
OE
tSD
DATA I/O
tHD
DATA IN VALID
NOTE 15
tHZOE
C188–7
Notes:
9. Device is continuously selected. OE, CE = VIL.
10. WE is HIGH for read cycle.
11. Address valid prior to or coincident with CE transition LOW.
12. Timing parameters are the same for all chip enable signals (CE1 and CE2), so only the timing for CE1 is shown.
13. Data I/O is high impedance if OE = VIH.
14. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.
15. During this period, the I/Os are in the output state and input signals should not be applied.
Document #: 38-05053 Rev. *A
Page 4 of 7
CY7C188
Switching Waveforms (Continued)
Write Cycle No.2 (CE Controlled)[7,12,13,14]
tWC
ADDRESS
tSCE
CE1
tSA
tAW
tHA
WE
tSD
tHD
DATA IN VALID
DATA I/O
C188–8
Write Cycle No. 3 (WE Controlled, OE LOW)[8,12,14]
tWC
ADDRESS
CE
tAW
tHA
tSA
WE
tSD
NOTE 15
DATA I/O
tHD
DATA IN VALID
tLZWE
tHZWE
C188–9
Truth Table
CE
WE
OE
Input/Output
Mode
Power
H
X
X
High Z
Deselect/Power-Down
Standby (ISB)
L
H
L
Data Out
Read
Active (ICC)
L
L
X
Data In
Write
Active (ICC)
L
H
H
High Z
Deselect, Output Disabled
Active (ICC)
Ordering Information
Speed
(ns)
Ordering Code
Package
Name
Package Type
Operating
Range
15
CY7C188–15VC
51-85041
32-Lead (300-Mil) Molded SOJ
Commercial
20
CY7C188–20VC
51-85041
32-Lead (300-Mil) Molded SOJ
Commercial
Document #: 38-05053 Rev. *A
Page 5 of 7
CY7C188
Package Diagrams
32-Lead (300-Mil) Molded SOJ (51-85041)
PIN 1 I.D
DIMENSIONS IN INCHES
0.330
0.292
0.340
0.305
MIN.
MAX.
LEAD COPLANARITY 0.004 MAX.
0.810
0.830
0.128 *
0.140
0.050
TYP.
0.026
0.032
0.014
*
0.025
MIN.
0.006
0.012
0.260
*
0.275
51-85041-*A
0.020
All products and company names mentioned in this document may be the trademarks of their respective holders
Document #: 38-05053 Rev. *A
Page 6 of 7
© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
CY7C188
Document History Page
Document Title: CY7C188 32K x 9 Static RAM
Document Number: 38-05053
Orig. of
Issue Date Change
Description of Change
107155
09/10/01
SZV
Change from Spec number: 38-00220 to 38-05053
506367
See ECN
NXR
Changed the description of IIX from Input Load Current to Input Leakage
Current in DC Electrical Characteristics table
Removed IOS parameter from DC Electrical Characteristics table
Updated Ordering Information table
REV.
ECN NO.
**
*A
Document #: 38-05053 Rev. *A
Page 7 of 7
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