CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 18-Mbit (512K x 36/1M x 18) Pipelined DCD Sync SRAM Functional Description [1] Features • Supports bus operation up to 250 MHz The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 SRAM integrates 512K x 36 and 1M x 18 SRAM cells with advanced synchronous peripheral circuitry and a two-bit counter for internal burst operation. All synchronous inputs are gated by registers controlled by a positive edge triggered clock input (CLK). The synchronous inputs include all addresses, all data inputs, address-pipelining chip enable (CE1), depth expansion chip enables (CE2 and CE3 [2]), burst control inputs (ADSC, ADSP, and ADV), write enables (BWX, and BWE), and global write (GW). Asynchronous inputs include the output enable (OE) and the ZZ pin. • Available speed grades are 250, 200, and 167 MHz • Registered inputs and outputs for pipelined operation • Optimal for performance (Double-Cycle deselect) • Depth expansion without wait state • 2.5V + 5% power supply (VDD) • Fast clock-to-output times, 2.6 ns (for 250 MHz device) • Provides high-performance 3-1-1-1 access rate • User selectable burst counter supporting Intel® Pentium® interleaved or linear burst sequences Addresses and chip enables are registered at rising edge of clock when either address strobe processor (ADSP) or address strobe controller (ADSC) are active. Subsequent burst addresses can be internally generated as controlled by the advance pin (ADV). • Separate processor and controller address strobes • Synchronous self timed writes • Asynchronous output enable • CY7C1386DV25/CY7C1387DV25 available in JEDEC-standard Pb-free 100-pin TQFP, Pb-free and non Pb-free 165-ball FBGA package. CY7C1386FV25/CY7C1387FV25 available in Pb-free and non Pb-free 119-ball BGA package Address, data inputs, and write controls are registered on-chip to initiate a self timed write cycle.This part supports byte write operations (see Pin Definitions on page 6 and Truth Table [4, 5, 6, 7, 8, 9] on page 9 for further details). Write cycles can be one to four bytes wide as controlled by the byte write control inputs. GW active LOW causes all bytes to be written. This device incorporates an additional pipelined enable register which delays turning off the output buffers an additional cycle when a deselect is executed.This feature allows depth expansion without penalizing system performance. • IEEE 1149.1 JTAG-Compatible Boundary Scan • ZZ sleep mode option The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 operates from a +2.5V power supply. All inputs and outputs are JEDEC-standard and JESD8-5-compatible. Selection Guide 250 MHz 200 MHz 167 MHz Unit Maximum Access Time 2.6 3.0 3.4 ns Maximum Operating Current 350 300 275 mA Maximum CMOS Standby Current 70 70 70 mA Notes 1. For best practices or recommendations, please refer to the Cypress application note AN1064, SRAM System Design Guidelines on www.cypress.com. 2. CE3, CE2 are for TQFP and 165 FBGA packages only. 119 BGA is offered only in 1 chip enable. Cypress Semiconductor Corporation Document Number: 38-05548 Rev. *E • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised Feburary 15, 2007 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Logic Block Diagram – CY7C1386DV25/CY7C1386FV25 [3] (512K x 36) ADDRESS REGISTER A0,A1,A 2 A[1:0] MODE ADV CLK BURST Q1 COUNTER AND LOGIC CLR Q0 ADSC ADSP BW D DQ D, DQP D BYTE WRITE REGISTER DQ D, DQP D BYTE WRITE DRIVER BW C DQ c ,DQP C BYTE WRITE REGISTER DQ c ,DQP C BYTE WRITE DRIVER DQ B ,DQP B BYTE WRITE REGISTER DQ B ,DQP B BYTE WRITE DRIVER BW B GW CE 1 CE 2 CE 3 OE ENABLE REGISTER ZZ SENSE AMPS OUTPUT REGISTERS OUTPUT BUFFERS DQs DQP A DQP B DQP C DQP D E DQ A, DQP A BYTE WRITE DRIVER DQ A, DQP A BYTE WRITE REGISTER BW A BWE MEMORY ARRAY INPUT REGISTERS PIPELINED ENABLE CONTROL Logic Block Diagram – CY7C1387DV25/CY7C1387FV25 [3] (1M x 18) A0, A1, A ADDRESS REGISTER 2 MODE ADV CLK A [1:0] Q1 BURST COUNTER AND CLR Q0 ADSC ADSP BW B BW A BWE CE 1 CE 2 CE 3 DQ B , DQP B BYTE DQ B, DQP B BYTE WRITE REGISTER DQ A, DQP A BYTE DQ A , DQP BYTE WRITE REGISTER ENABLE REGISTER PIPELINED ENABLE MEMORY ARRAY SENSE AMPS OUTPUT REGISTERS OUTPUT BUFFERS DQ s, DQP A DQP B E INPUT REGISTERS OE SLEEP CONTROL Note 3. CY7C1386FV25 and CY7C1387FV25 have only 1 chip enable (CE1). Document Number: 38-05548 Rev. *E Page 2 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Pin Configurations NC NC NC CY7C1387DV25 (1M x 18) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 Document Number: 38-05548 Rev. *E A NC NC VDDQ VSSQ NC DQPA DQA DQA VSSQ VDDQ DQA DQA VSS NC VDD ZZ DQA DQA VDDQ VSSQ DQA DQA NC NC VSSQ VDDQ NC NC NC A A A A A A A A A 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 VDDQ VSSQ NC NC DQB DQB VSSQ VDDQ DQB DQB NC VDD NC VSS DQB DQB VDDQ VSSQ DQB DQB DQPB NC VSSQ VDDQ NC NC NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE A A A A A1 A0 NC/72M NC/36M VSS VDD DQPB DQB DQB VDDQ VSSQ DQB DQB DQB DQB VSSQ VDDQ DQB DQB VSS NC VDD ZZ DQA DQA VDDQ VSSQ DQA DQA DQA DQA VSSQ VDDQ DQA DQA DQPA 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 CY7C1386DV25 (512K X 36) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE A A A A A1 A0 NC/72M NC/36M VSS VDD A A A A A A A A A DQPC DQC DQC VDDQ VSSQ DQC DQC DQC DQC VSSQ VDDQ DQC DQC NC VDD NC VSS DQD DQD VDDQ VSSQ DQD DQD DQD DQD VSSQ VDDQ DQD DQD DQPD A A CE1 CE2 NC NC BWB BWA CE3 VDD VSS CLK GW BWE OE ADSC ADSP ADV A A A A CE1 CE2 BWD BWC BWB BWA CE3 VDD VSS CLK GW BWE OE ADSC ADSP ADV A A 100-pin TQFP Pinout (3 Chip Enables) Page 3 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Pin Configurations (continued) 119-Ball BGA (1 Chip Enable) CY7C1386FV25 (512K x 36) A 1 VDDQ 2 A 3 A B C NC/288M NC/144M A A A A D E DQC DQC DQPC DQC F VDDQ G H J K DQC DQC VDDQ DQD L 4 ADSP 5 A 6 A 7 VDDQ ADSC VDD A A A A NC/576M NC/1G VSS VSS NC CE1 VSS VSS DQPB DQB DQB DQB DQC VSS OE VSS DQB VDDQ DQC DQC VDD DQD BWC VSS NC VSS ADV BWB VSS NC VSS DQB DQB VDD DQA DQB DQB VDDQ DQA DQD DQD DQA M BWA VSS DQA DQD BWD VSS NC VDDQ DQA VDDQ N DQD DQD VSS VSS DQA DQA GW VDD CLK BWE A1 P DQD DQPD VSS A0 VSS DQPA DQA R NC A MODE VDD NC A NC T U NC VDDQ NC/72M TMS A TDI A TCK A TDO NC/36M NC ZZ VDDQ CY7C1387FV25 (1M x 18) 1 2 3 4 5 6 7 A VDDQ A ADSP A A VDDQ B NC/288M A A A A A NC/576M C NC/144M A A ADSC VDD A A NC/1G D DQB NC VSS NC VSS DQPA NC E NC DQB VSS CE1 VSS NC DQA F VDDQ NC VSS DQA VDDQ NC DQB VDDQ DQB NC VDD BWB VSS NC OE ADV VSS G H J GW VDD NC VSS NC NC DQA VDD DQA NC VDDQ K NC DQB VSS CLK VSS NC DQA L M DQB VDDQ NC DQB NC VSS NC DQA NC NC VDDQ N DQB NC VSS BWE A1 BWA VSS VSS DQA NC P NC DQPB VSS A0 VSS NC DQA R T U NC NC/72M VDDQ A A TMS MODE A TDI VDD NC/36M TCK NC A TDO A A NC NC ZZ VDDQ Document Number: 38-05548 Rev. *E Page 4 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Pin Configurations (continued) 165-Ball FBGA Pinout (3 Chip Enable) CY7C1386DV25 (512K x 36) 1 2 3 4 5 6 7 8 9 10 11 A B C D E F G H J K L M N P NC/288M A CE1 BWC BWB CE3 BWE ADSC ADV A NC R NC/144M A CE2 BWD BWA CLK DQPC DQC NC DQC VDDQ VSS VSS VSS VSS GW VSS VSS OE VSS VDD ADSP VDDQ VDDQ VSS VDD A NC/576M VDDQ NC/1G DQB DQPB DQB DQC DQC VDDQ VDD VSS VSS VSS VDD VDDQ DQB DQB DQC DQC VDDQ VDD VSS VSS VSS VDD DQC NC DQD DQC NC DQD VDDQ NC VDDQ VDD VDD VDD VSS VSS VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDDQ DQB DQB VDDQ NC VDDQ DQB NC DQA DQB ZZ DQA DQD DQD VDDQ VDD VSS VSS VSS VDD VDDQ DQA DQA DQD DQD VDDQ VDD VSS VSS VSS VDD VDDQ DQA DQA DQD DQPD DQD NC VDDQ VDDQ VDD VSS VSS NC VSS A VSS NC VDD VSS VDDQ VDDQ DQA NC DQA DQPA NC NC/72M A A TDI A1 TDO A A A A MODE NC/36M A A TMS A0 TCK A A A A 8 9 10 11 A CY7C1387DV25 (1M x 18) 1 2 A B C D E F G H J K L M N P NC/288M A R 3 4 5 6 BWB NC CE3 NC BWA VSS VDD VSS VSS 7 CLK BWE GW ADSC OE ADV ADSP A VSS VSS VSS VSS VSS VDD VDDQ VDDQ NC/1G NC DQPA DQA NC/144M A CE1 CE2 NC NC NC DQB VDDQ VDDQ NC DQB VDDQ VDD VSS VSS VSS VDD VDDQ NC DQA NC NC NC DQB DQB VDD VDD VDD VDD VDDQ VDDQ NC VDDQ NC VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDD VSS VSS VSS ‘VSS VSS DQB NC NC VDDQ VDDQ NC VDDQ NC NC DQA DQA DQA ZZ NC DQB NC VDDQ VDD VSS VSS VSS VDD VDDQ DQA NC NC/576M A DQB NC VDDQ VDD VSS VSS VSS VDD VDDQ DQA NC DQB DQPB NC NC VDDQ VDDQ VDD VSS VSS NC VSS A VSS NC VDD VSS VDDQ VDDQ DQA NC NC NC NC NC/72M A A TDI A1 TDO A A A A MODE NC/36M A A TMS A0 TCK A A A A Document Number: 38-05548 Rev. *E Page 5 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Pin Definitions Name IO Description A0, A1, A InputSynchronous Address inputs used to select one of the address locations. Sampled at the rising edge of the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 [2] are sampled active. A1: A0 are fed to the two-bit counter.. BWA, BWB BWC, BWD InputSynchronous Byte write select inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM. Sampled on the rising edge of CLK. GW InputSynchronous Global write enable input, active LOW. When asserted LOW on the rising edge of CLK, a global write is conducted (all bytes are written, regardless of the values on BWX and BWE). BWE InputSynchronous Byte write enable input, active LOW. Sampled on the rising edge of CLK. This signal must be asserted LOW to conduct a byte write. CLK InputClock Clock input. Used to capture all synchronous inputs to the device. Also used to increment the burst counter when ADV is asserted LOW, during a burst operation. CE1 InputSynchronous Chip enable 1 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 [2] to select or deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled only when a new external address is loaded. CE2 [2] InputSynchronous Chip enable 2 input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 [2] to select or deselect the device. CE2 is sampled only when a new external address is loaded. CE3 [2] InputSynchronous Chip enable 3 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select or deselect the device. Not connected for BGA. Where referenced, CE3 [2] is assumed active throughout this document for BGA. CE3 is sampled only when a new external address is loaded. OE InputAsynchronous Output enable, asynchronous input, active LOW. Controls the direction of the IO pins. When LOW, the IO pins behave as outputs. When deasserted HIGH, DQ pins are tri-stated, and act as input data pins. OE is masked during the first clock of a read cycle when emerging from a deselected state. ADV InputSynchronous Advance input signal, sampled on the rising edge of CLK, active LOW. When asserted, it automatically increments the address in a burst cycle. ADSP InputSynchronous Address strobe from processor, sampled on the rising edge of CLK, active LOW. When asserted LOW, addresses presented to the device are captured in the address registers. A1: A0 are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH. ADSC InputSynchronous Address strobe from controller, sampled on the rising edge of CLK, active LOW. When asserted LOW, addresses presented to the device are captured in the address registers. A1: A0 are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ZZ InputAsynchronous ZZ sleep input, active HIGH. When asserted HIGH places the device in a non-time-critical sleep condition with data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin has an internal pull down. DQs, DQPs IOSynchronous Bidirectional data IO lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by the addresses presented during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQs and DQPX are placed in a tri-state condition. VDD Power Supply Power supply inputs to the core of the device. Document Number: 38-05548 Rev. *E Page 6 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Pin Definitions (continued) Name IO Ground VSS IO Ground VSSQ VDDQ Description Ground for the core of the device. Ground for the IO circuitry. IO Power Supply Power supply for the IO circuitry. MODE InputStatic Selects burst order. When tied to GND selects linear burst sequence. When tied to VDD or left floating selects interleaved burst sequence. This is a strap pin and must remain static during device operation. Mode pin has an internal pull up. TDO JTAG serial output Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. Synchronous If the JTAG feature is not used, this pin must be disconnected. This pin is not available on TQFP packages. TDI JTAG serial input Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG Synchronous feature is not used, this pin can be disconnected or connected to VDD. This pin is not available on TQFP packages. TMS JTAG serial input Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG Synchronous feature is not used, this pin can be disconnected or connected to VDD. This pin is not available on TQFP packages. TCK JTAGClock Clock input to the JTAG circuitry. If the JTAG feature is not used, this pin must be connected to VSS. This pin is not available on TQFP packages. NC – No Connects. Not internally connected to the die NC/(36M, 72M, 144M, 288M, 576M, 1G) – These pins are not connected. They will be used for expansion to the 36M, 72M, 144M, 288M, 576M, and 1G densities. Functional Overview All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 supports secondary cache in systems using either a linear or interleaved burst sequence. The interleaved burst order supports Pentium® and i486™ processors. The linear burst sequence is suited for processors that use a linear burst sequence. The burst order is user selectable, and is determined by sampling the MODE input. Accesses can be initiated with either the processor address strobe (ADSP) or the controller address strobe (ADSC). Address advancement through the burst sequence is controlled by the ADV input. A two-bit on-chip wraparound burst counter captures the first address in a burst sequence and automatically increments the address for the rest of the burst access. Byte write operations are qualified with the byte write enable (BWE) and byte write select (BWX) inputs. A global write enable (GW) overrides all byte write inputs and writes data to all four bytes. All writes are simplified with on-chip synchronous self timed write circuitry. Synchronous chip selects CE1, CE2, CE3 [2] and an asynchronous output enable (OE) provide for easy bank selection and output tri-state control. ADSP is ignored if CE1 is HIGH. Document Number: 38-05548 Rev. *E Single Read Accesses This access is initiated when the following conditions are satisfied at clock rise: (1) ADSP or ADSC is asserted LOW, (2) chip selects are all asserted active, and (3) the write signals (GW, BWE) are all deasserted HIGH. ADSP is ignored if CE1 is HIGH. The address presented to the address inputs is stored into the address advancement logic and the address register while being presented to the memory core. The corresponding data is allowed to propagate to the input of the output registers. At the rising edge of the next clock the data is allowed to propagate through the output register and onto the data bus within tCO if OE is active LOW. The only exception occurs when the SRAM is emerging from a deselected state to a selected state, its outputs are always tri-stated during the first cycle of the access. After the first cycle of the access, the outputs are controlled by the OE signal. Consecutive single read cycles are supported. The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 is a double-cycle deselect part. Once the SRAM is deselected at clock rise by the chip select and either ADSP or ADSC signals, its output will tri-state immediately after the next clock rise. Single Write Accesses Initiated by ADSP This access is initiated when both of the following conditions are satisfied at clock rise: (1) ADSP is asserted LOW, and (2) chip select is asserted active. The address presented is loaded into the address register and the address advancement logic while being delivered to the memory core. Page 7 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 The write signals (GW, BWE, and BWX) and ADV inputs are ignored during this first cycle. ADSP triggered write accesses require two clock cycles to complete. If GW is asserted LOW on the second clock rise, the data presented to the DQx inputs is written into the corresponding address location in the memory core. If GW is HIGH, then the write operation is controlled by BWE and BWX signals. The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 provides byte write capability that is described in the write cycle description table. Asserting the byte write enable input (BWE) with the selected byte write input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A synchronous self timed write mechanism has been provided to simplify the write operations. The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 is a common IO device, the output enable (OE) must be deasserted HIGH before presenting data to the DQ inputs. Doing so will tri-state the output drivers. As a safety precaution, DQ are automatically tri-stated whenever a write cycle is detected, regardless of the state of OE. Single Write Accesses Initiated by ADSC ADSC write accesses are initiated when the following conditions are satisfied: (1) ADSC is asserted LOW, (2) ADSP is deasserted HIGH, (3) chip select is asserted active, and (4) the appropriate combination of the write inputs (GW, BWE, and BWX) are asserted active to conduct a write to the desired byte(s). ADSC triggered write accesses require a single clock cycle to complete. The address presented is loaded into the address register and the address advancement logic while being delivered to the memory core. The ADV input is ignored during this cycle. If a global write is conducted, the data presented to the DQX is written into the corresponding address location in the memory core. If a byte write is conducted, only the selected bytes are written. Bytes not selected during a byte write operation will remain unaltered. A synchronous self timed write mechanism has been provided to simplify the write operations. The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 is a common IO device, the output enable (OE) must be deasserted HIGH before presenting data to the DQX inputs. Doing so will tri-state the output drivers. As a safety precaution, DQX are automatically tri-stated whenever a write cycle is detected, regardless of the state of OE. Document Number: 38-05548 Rev. *E Burst Sequences The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 provides a two-bit wraparound counter, fed by A[1:0], that implements either an interleaved or linear burst sequence. The interleaved burst sequence is designed specifically to support Intel Pentium applications. The linear burst sequence is designed to support processors that follow a linear burst sequence. The burst sequence is user selectable through the MODE input. Asserting ADV LOW at clock rise will automatically increment the burst counter to the next address in the burst sequence. Both read and write burst operations are supported. Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation sleep mode. Two clock cycles are required to enter into or exit from this sleep mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the sleep mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the sleep mode. CEs, ADSP, and ADSC must remain inactive for the duration of tZZREC after the ZZ input returns LOW. Interleaved Burst Address Table (MODE = Floating or VDD) First Address A1: A0 Second Address A1: A0 Third Address A1: A0 Fourth Address A1: A0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 Linear Burst Address Table (MODE = GND) First Address A1: A0 Second Address A1: A0 Third Address A1: A0 Fourth Address A1: A0 00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10 Page 8 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 ZZ Mode Electrical Characteristics Parameter Description Test Conditions Min. IDDZZ Sleep mode standby current tZZS Device operation to ZZ ZZ > VDD – 0.2V tZZREC ZZ recovery time ZZ < 0.2V tZZI ZZ Active to sleep current This parameter is sampled tRZZI ZZ Inactive to exit sleep current This parameter is sampled Max. Unit 80 mA 2tCYC ns ZZ > VDD – 0.2V 2tCYC ns 2tCYC ns 0 ns Truth Table [4, 5, 6, 7, 8, 9] Operation Add. Used CE1 CE2 CE3 ZZ ADSP ADSC ADV WRITE OE CLK DQ Deselect Cycle, Power Down None H X X L X L X X X L-H Tri-State Deselect Cycle, Power Down None L L X L L X X X X L-H Tri-State Deselect Cycle, Power Down None L X H L L X X X X L-H Tri-State Deselect Cycle, Power Down None L L X L H L X X X L-H Tri-State Deselect Cycle, Power Down None L X H L H L X X X L-H Tri-State Sleep Mode, Power Down None X X X H X X X X X X Tri-State READ Cycle, Begin Burst External L H L L L X X X L L-H Q READ Cycle, Begin Burst External L H L L L X X X H L-H Tri-State WRITE Cycle, Begin Burst External L H L L H L X L X L-H D READ Cycle, Begin Burst External L H L L H L X H L L-H Q READ Cycle, Begin Burst External L H L L H L X H H L-H Tri-State Next X X X L H H L H L L-H Q READ Cycle, Continue Burst READ Cycle, Continue Burst Next X X X L H H L H H L-H Tri-State READ Cycle, Continue Burst Next H X X L X H L H L L-H Q READ Cycle, Continue Burst Next H X X L X H L H H L-H Tri-State WRITE Cycle, Continue Burst Next X X X L H H L L X L-H D WRITE Cycle, Continue Burst Next H X X L X H L L X L-H D READ Cycle, Suspend Burst Current X X X L H H H H L L-H Q READ Cycle, Suspend Burst Current X X X L H H H H H L-H Tri-State READ Cycle, Suspend Burst Current H X X L X H H H L L-H Q READ Cycle, Suspend Burst Current H X X L X H H H H L-H Tri-State WRITE Cycle, Suspend Burst Current X X X L H H H L X L-H D WRITE Cycle, Suspend Burst Current H X X L X H H L X L-H D Notes 4. X = Don't Care, H = Logic HIGH, L = Logic LOW. 5. WRITE = L when any one or more byte write enable signals and BWE = L or GW = L. WRITE = H when all byte write enable signals, BWE, GW = H. 6. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock. 7. CE1, CE2, and CE3 are available only in the TQFP package. BGA package has only 2 chip selects CE1 and CE2. 8. The SRAM always initiates a read cycle when ADSP is asserted, regardless of the state of GW, BWE, or BWX. Writes may occur only on subsequent clocks after the ADSP or with the assertion of ADSC. As a result, OE must be driven HIGH prior to the start of the write cycle to allow the outputs to tri-state. OE is a don't care for the remainder of the write cycle. 9. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle all data bits are tri-state when OE is inactive or when the device is deselected, and all data bits behave as output when OE is active (LOW). Document Number: 38-05548 Rev. *E Page 9 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Partial Truth Table for Read/Write [5, 10] Function (CY7C1386DV25/CY7C1386FV25) GW BWE BWD BWC BWB BWA Read H H X X X X Read H L H H H H Write Byte A – (DQA and DQPA) H L H H H L Write Byte B – (DQB and DQPB) H L H H L H Write Bytes B, A H L H H L L Write Byte C – (DQC and DQPC) H L H L H H Write Bytes C, A H L H L H L Write Bytes C, B H L H L L H Write Bytes C, B, A H L H L L L Write Byte D – (DQD and DQPD) H L L H H H Write Bytes D, A H L L H H L Write Bytes D, B H L L H L H Write Bytes D, B, A H L L H L L Write Bytes D, C H L L L H H Write Bytes D, C, A H L L L H L Write Bytes D, C, B H L L L L H Write All Bytes H L L L L L Write All Bytes L X X X X X Truth Table for Read/Write [5, 10] Function (CY7C1387DV25/CY7C1387FV25) GW BWE BWB BWA Read H H X X Read H L H H Write Byte A – (DQA and DQPA) H L H L Write Byte B – (DQB and DQPB) H L L H Write All Bytes H L L L Write All Bytes L X X X Note 10. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid appropriate write will be done based on which byte write is active. Document Number: 38-05548 Rev. *E Page 10 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 incorporates a serial boundary scan test access port (TAP).This part is fully compliant with 1149.1. The TAP operates using JEDEC-standard 3.3V or 2.5V IO logic levels. The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull up resistor. TDO should be left unconnected. Upon power up, the device will come up in a reset state which will not interfere with the operation of the device. Test Data-In (TDI) The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. (See TAP Controller Block Diagram.) Test Data-Out (TDO) The TDO output ball is used to serially clock data out from the registers. The output is active depending upon the current state of the TAP state machine. The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. (See TAP Controller State Diagram.) TAP Controller Block Diagram TAP Controller State Diagram 1 unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. TEST-LOGIC RESET 0 0 0 RUN-TEST/ IDLE Bypass Register 1 SELECT DR-SCAN 1 SELECT IR-SCAN 0 1 1 2 1 0 0 1 CAPTURE-DR TDI CAPTURE-IR Selection Circuitry Instruction Register 31 30 29 . . . 2 1 0 0 S election Circuitr y TDO 0 Identification Register SHIFT-DR 0 SHIFT-IR 1 x . . . . . 2 1 0 1 EXIT1-DR 1 EXIT1-IR 0 0 PAUSE-IR 1 0 1 EXIT2-DR 0 1 UPDATE-IR 1 0 The 0 or 1 next to each state represents the value of TMS at the rising edge of TCK. Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test MODE SELECT (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. This pin may be left Document Number: 38-05548 Rev. *E TAP CONTROLLER EXIT2-IR 1 0 TCK TMS UPDATE-DR 1 Boundary Scan Register 1 0 PAUSE-DR 0 0 Performing a TAP Reset A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power up, the TAP is reset internally to ensure that TDO comes up in a High-Z state. TAP Registers Registers are connected between the TDI and TDO balls and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Page 11 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram. Upon power up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary ‘01’ pattern to allow for fault isolation of the board-level serial test data path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the Shift-DR controller state. IDCODE The IDCODE instruction causes a vendor specific 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO balls and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power up or whenever the TAP controller is given a test logic reset state. Boundary Scan Register SAMPLE Z The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO balls when the TAP controller is in a Shift-DR state. The SAMPLE Z command places all SRAM outputs into a High-Z state. The boundary scan register is loaded with the contents of the RAM input and output ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can be used to capture the contents of the input and output ring. The boundary scan order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions on page 15. TAP Instruction Set Overview Eight different instructions are possible with the three bit instruction register. All combinations are listed in Identification Codes on page 15. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO balls. Document Number: 38-05548 Rev. *E SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the input and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. As there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller's capture setup plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. Page 12 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required; that is, while data captured is shifted out, the preloaded data can be shifted in. the TAP controller, it will directly control the state of the output (Q-bus) pins, when the EXTEST is entered as the current instruction. When HIGH, it will enable the output buffers to drive the output bus. When LOW, this bit will place the output bus into a High-Z condition. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO balls. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the Shift-DR state. During Update-DR, the value loaded into that shift-register cell will latch into the preload register. When the EXTEST instruction is entered, this bit will directly control the output Q-bus pins. Note that this bit is preset HIGH to enable the output when the device is powered up, and also when the TAP controller is in the Test-Logic-Reset state. EXTEST Output Bus Tri-State IEEE Standard 1149.1 mandates that the TAP controller be able to put the output bus into a tri-state mode. Reserved The boundary scan register has a special bit located at bit #85 (for 119-BGA package) or bit #89 (for 165-fBGA package). When this scan cell, called the “extest output bus tri-state,” is latched into the preload register during the Update-DR state in These instructions are not implemented but are reserved for future use. Do not use these instructions. TAP Timing 1 2 Test Clock (TCK) 3 t t TH t TMSS t TMSH t TDIS t TDIH TL 4 5 6 t CYC Test Mode Select (TMS) Test Data-In (TDI) t TDOV t TDOX Test Data-Out (TDO) DON’T CARE Document Number: 38-05548 Rev. *E UNDEFINED Page 13 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 TAP AC Switching Characteristics Over the Operating Range [11, 12] Parameter Description Min. Max. Unit Clock tTCYC TCK Clock Cycle Time tTF TCK Clock Frequency tTH TCK Clock HIGH time 20 ns tTL TCK Clock LOW time 20 ns 50 ns 20 MHz Output Times tTDOV TCK Clock LOW to TDO Valid tTDOX TCK Clock LOW to TDO Invalid 0 ns tTMSS TMS Setup to TCK Clock Rise 5 ns tTDIS TDI Setup to TCK Clock Rise 5 ns tCS Capture Setup to TCK Rise 5 ns tTMSH TMS Hold after TCK Clock Rise 5 ns tTDIH TDI Hold after Clock Rise 5 ns tCH Capture Hold after Clock Rise 5 ns 10 ns Setup Times Hold Times TAP AC Test Conditions TAP AC Output Load Equivalent Input pulse levels .................................................VSS to 2.5V 1.25V Input rise and fall time..................................................... 1 ns Input timing reference levels .........................................1.25V Output reference levels.................................................1.25V 50Ω TDO Test load termination supply voltage.............................1.25V Z O= 50 Ω 20pF TAP DC Electrical Characteristics And Operating Conditions (0°C < TA < +70°C; VDD = 2.5V ±0.165V unless otherwise noted) [13] Parameter Description Test Conditions Min. Max. Unit VOH1 Output HIGH Voltage IOH = –1.0 mA 1.7 V VOH2 Output HIGH Voltage IOH = –100 µA 2.1 V VOL1 Output LOW Voltage IOL = 1.0 mA 0.4 V VOL2 Output LOW Voltage IOL = 100 µA 0.2 V 1.7 VDD + 0.3 V –0.3 0.7 V –5 5 µA VIH Input HIGH Voltage VIL Input LOW Voltage IX Input Load Current GND < VIN < VDDQ Note 11. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register. 12. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1ns. 13. All voltages referenced to VSS (GND). Document Number: 38-05548 Rev. *E Page 14 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Identification Register Definitions CY7C1386DV25/ CY7C1386FV25 Instruction Field Revision Number (31:29) CY7C1387DV25/ CY7C1387FV25 Description 000 000 Device Depth (28:24) 01011 01011 Reserved for internal use Device Width (23:18) 119-BGA 101110 101110 Defines the memory type and architecture. Device Width (23:18) 165-FBGA 000110 000110 Defines the memory type and architecture. Cypress Device ID (17:12) Cypress JEDEC ID Code (11:1) Describes the version number. 100101 010101 00000110100 00000110100 1 1 ID Register Presence Indicator (0) Defines the width and density Allows unique identification of SRAM vendor. Indicates the presence of an ID register. Scan Register Sizes Register Name Instruction Bit Size (x18) Bit Size (x36) 3 3 Bypass 1 1 ID 32 32 Boundary Scan Order (119-ball BGA package) 85 85 Boundary Scan Order (165-ball fBGA package) 89 89 Identification Codes Instruction Code Description EXTEST 000 Captures IO ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM outputs to High-Z state. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operations. SAMPLE Z 010 Captures IO ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High-Z state. RESERVED 011 Do Not Use. This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures IO ring contents. Places the boundary scan register between TDI and TDO. Does not affect SRAM operation. RESERVED 101 Do Not Use. This instruction is reserved for future use. RESERVED 110 Do Not Use. This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. Document Number: 38-05548 Rev. *E Page 15 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 119-Ball BGA Boundary Scan Order [14, 15] Bit # Ball ID Bit # Ball ID Bit # Ball ID Bit # Ball ID F6 45 G4 67 L1 2 H4 T4 23 24 E7 46 A4 68 M2 3 T5 25 D7 47 G3 69 N1 1 4 T6 26 H7 48 C3 70 P1 5 R5 27 G6 49 B2 71 K1 6 L5 28 E6 50 B3 72 L2 7 R6 29 D6 51 A3 73 8 U6 30 C7 52 C2 74 N2 P2 9 R7 31 B7 53 A2 75 R3 10 T7 32 C6 54 B1 76 T1 11 P6 33 A6 55 C1 77 R1 12 N7 34 C5 56 D2 78 T2 13 M6 35 B5 57 E1 79 L3 14 L7 36 G5 58 F2 80 R2 15 K6 37 B6 59 G1 81 T3 16 P7 38 D4 60 H2 82 L4 17 N6 39 B4 61 D1 83 N4 18 L6 40 F4 62 E2 84 P4 19 K7 41 M4 63 G2 85 Internal 20 J5 42 A5 64 H1 21 H6 43 K4 65 J3 22 G7 44 E4 66 2K Notes 14. Balls that are NC (No Connect) are preset LOW. 15. Bit #85 is preset HIGH. Document Number: 38-05548 Rev. *E Page 16 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 165-Ball BGA Boundary Scan Order [14, 16] Bit # Ball ID Bit # Ball ID Bit # Ball ID 1 N6 31 D10 61 G1 2 N7 32 C11 62 D2 3 N10 33 A11 63 E2 4 P11 34 B11 64 F2 5 P8 35 A10 65 G2 6 R8 36 B10 66 H1 7 R9 37 A9 67 H3 8 P9 38 B9 68 J1 9 P10 39 C10 69 K1 10 R10 40 A8 70 L1 11 R11 41 B8 71 M1 12 H11 42 A7 72 J2 13 N11 43 B7 73 K2 14 M11 44 B6 74 L2 15 L11 45 A6 75 M2 16 K11 46 B5 76 N1 17 J11 47 A5 77 N2 18 M10 48 A4 78 P1 19 L10 49 B4 79 R1 20 K10 50 B3 80 R2 21 J10 51 A3 81 P3 22 H9 52 A2 82 R3 23 H10 53 B2 83 P2 24 G11 54 C2 84 R4 25 F11 55 B1 85 P4 26 E11 56 A1 86 N5 27 D11 57 C1 87 P6 28 G10 58 D1 88 R6 29 F10 59 E1 89 Internal 30 E10 60 F1 Note 16. Bit #89 is preset HIGH. Document Number: 38-05548 Rev. *E Page 17 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Maximum Ratings DC Input Voltage ................................... –0.5V to VDD + 0.5V Exceeding the maximum ratings may impair the useful life of the device. For user guidelines, not tested. Storage Temperature ................................. –65°C to +150°C Ambient Temperature with Power Applied............................................. –55°C to +125°C Supply Voltage on VDD Relative to GND ....... –0.5V to +3.6V Supply Voltage on VDDQ Relative to GND ...... –0.5V to +VDD DC Voltage Applied to Outputs in Tri-State........................................... –0.5V to VDDQ + 0.5V Current into Outputs (LOW) ........................................ 20 mA Static Discharge Voltage........................................... >2001V (per MIL-STD-883, Method 3015) Latch-up Current .................................................... >200 mA Operating Range Ambient Temperature Commercial 0°C to +70°C Industrial –40°C to +85°C Range VDD VDDQ 2.5V ±5% 2.5V –5% to VDD Electrical Characteristics Over the Operating Range [17, 18] Parameter Description Test Conditions VDD Power Supply Voltage VDDQ IO Supply Voltage for 2.5V IO VOH Output HIGH Voltage for 2.5V IO, IOH = –1.0 mA VOL Output LOW Voltage for 2.5V IO, IOL = 1.0 mA [17] Min. Max. Unit 2.375 2.625 V 2.375 VDD V 2.0 V 0.4 V VIH Input HIGH Voltage for 2.5V IO 1.7 VDD + 0.3V V VIL Input LOW Voltage [17] for 2.5V IO –0.3 0.7 V IX Input Leakage Current except ZZ and MODE GND ≤ VI ≤ VDDQ –5 5 µA Input Current of MODE Input = VSS Input Current of ZZ 5 Input = VSS 30 IOZ Output Leakage Current GND ≤ VI ≤ VDDQ, Output Disabled IDD VDD Operating Supply Current ISB1 Automatic CE Power Down Current—TTL Inputs VDD = Max, Device Deselected, VIN ≥ VIH or VIN ≤ VIL f = fMAX = 1/tCYC µA µA –5 Input = VDD VDD = Max., IOUT = 0 mA, f = fMAX = 1/tCYC µA –30 Input = VDD µA 5 µA 4.0-ns cycle, 250 MHz 350 mA 5-ns cycle, 200 MHz 300 mA 6-ns cycle, 167 MHz 275 mA 4.0-ns cycle, 250 MHz 160 mA 5-ns cycle, 200 MHz 150 mA 6-ns cycle, 167 MHz –5 140 mA ISB2 Automatic CE VDD = Max, Device Deselected, All speeds Power Down VIN ≤ 0.3V or VIN > VDDQ – 0.3V, Current—CMOS Inputs f = 0 70 mA ISB3 VDD = Max, Device Deselected, 4.0-ns cycle, 250 MHz Automatic CE Power Down or VIN ≤ 0.3V or VIN > VDDQ – 0.3V 5-ns cycle, 200 MHz Current—CMOS Inputs f = fMAX = 1/tCYC 6-ns cycle, 167 MHz 135 mA 130 mA 125 mA Automatic CE Power Down Current—TTL Inputs 80 mA ISB4 VDD = Max, Device Deselected, VIN ≥ VIH or VIN ≤ VIL, f = 0 All Speeds Notes 17. Overshoot: VIH(AC) < VDD +1.5V (pulse width less than tCYC/2), undershoot: VIL(AC) > –2V (pulse width less than tCYC/2). 18. Tpower up: assumes a linear ramp from 0V to VDD(min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD. Document Number: 38-05548 Rev. *E Page 18 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Capacitance [19] Parameter 100 TQFP Package 119 BGA Package 165 FBGA Package Unit 5 8 9 pF 5 8 9 pF 5 8 9 pF Test Conditions 100 TQFP Package 119 BGA Package 165 FBGA Package Unit Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. 28.66 23.8 20.7 °C/W 4.08 6.2 4.0 °C/W Description CIN Input Capacitance CCLK Clock Input Capacitance CIO Input/Output Capacitance Test Conditions TA = 25°C, f = 1 MHz, VDD/VDDQ = 2.5V Thermal Resistance [19] Parameter Description ΘJA Thermal Resistance (Junction to Ambient) ΘJC Thermal Resistance (Junction to Case) AC Test Loads and Waveforms 2.5V IO Test Load R = 1667Ω 2.5V OUTPUT OUTPUT RL = 50Ω Z0 = 50Ω GND 5 pF R = 1538Ω VT = 1.25V (a) ALL INPUT PULSES VDDQ INCLUDING JIG AND SCOPE (b) 10% 90% 10% 90% ≤ 1 ns ≤ 1 ns (c) Note 19. Tested initially and after any design or process change that may affect these parameters. Document Number: 38-05548 Rev. *E Page 19 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Switching Characteristics Over the Operating Range [20, 21] Parameter tPOWER Description VDD(Typical) to the first Access [22] 250 MHz Min. Max. 200 MHz Min. Max. 167 MHz Min. Max. Unit 1 1 1 ms Clock tCYC Clock Cycle Time 4.0 5.0 6.0 ns tCH Clock HIGH 1.7 2.0 2.2 ns tCL Clock LOW 1.7 2.0 2.2 ns Output Times tCO Data Output Valid After CLK Rise tDOH Data Output Hold After CLK Rise Clock to Low-Z [23, 24, 25] tCHZ Clock to High-Z [23, 24, 25] tOEV OE LOW to Output Valid tOELZ OE LOW to Output Low-Z [23, 24, 25] tCLZ tOEHZ OE HIGH to Output High-Z 2.6 3.0 3.4 ns 1.0 1.3 1.3 ns 1.0 1.3 1.3 ns 2.6 3.0 2.6 0 [23, 24, 25] 3.0 0 2.6 3.4 ns 3.4 ns 0 3.0 ns 3.4 ns Setup Times tAS Address Setup Before CLK Rise 1.2 1.4 1.5 ns tADS ADSC, ADSP Setup Before CLK Rise 1.2 1.4 1.5 ns tADVS ADV Setup Before CLK Rise 1.2 1.4 1.5 ns tWES GW, BWE, BWX Setup Before CLK Rise 1.2 1.4 1.5 ns tDS Data Input Setup Before CLK Rise 1.2 1.4 1.5 ns tCES Chip Enable SetUp Before CLK Rise 1.2 1.4 1.5 ns tAH Address Hold After CLK Rise 0.3 0.4 0.5 ns tADH ADSP, ADSC Hold After CLK Rise 0.3 0.4 0.5 ns tADVH ADV Hold After CLK Rise 0.3 0.4 0.5 ns tWEH GW, BWE, BWX Hold After CLK Rise 0.3 0.4 0.5 ns tDH Data Input Hold After CLK Rise 0.3 0.4 0.5 ns tCEH Chip Enable Hold After CLK Rise 0.3 0.4 0.5 ns Hold Times Notes 20. Timing reference level is 1.25V when VDDQ = 2.5V. 21. Test conditions shown in (a) of AC Test Loads unless otherwise noted. 22. This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially before a read or write operation can be initiated. 23. tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of AC Test Loads and Waveforms on page 19. Transition is measured ± 200 mV from steady-state voltage. 24. At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve High-Z prior to Low-Z under the same system conditions. 25. This parameter is sampled and not 100% tested. Document Number: 38-05548 Rev. *E Page 20 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Switching Waveforms Read Cycle Timing [26] tCYC CLK tCH t ADS tCL tADH ADSP t ADS tADH ADSC t AS ADDRESS tAH A1 A2 tWES GW, BWE,BW A3 Burst continued with new base address tWEH X t CES Deselect cycle tCEH CE t ADVS tADVH ADV ADV suspends burst OE t Data Out (DQ) High-Z CLZ t OEHZ Q(A1) t OEV t CO t OELZ t DOH Q(A2) t CHZ Q(A2 + 1) Q(A2 + 2) Q(A2 + 3) Q(A2) Q(A2 + 1) Q(A3) t CO Single READ BURST READ DON’T CARE Burst wraps around to its initial state UNDEFINED Note 26. On this diagram, when CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. Document Number: 38-05548 Rev. *E Page 21 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Switching Waveforms (continued) Write Cycle Timing [26, 27] t CYC CLK tCH t ADS tCL tADH ADSP t ADS ADSC extends burst tADH t ADS tADH ADSC t AS tAH A1 ADDRESS A2 A3 Byte write signals are ignored for first cycle when ADSP initiates burst t WES tWEH BWE, BW X t WES tWEH GW t CES tCEH CE t ADVS tADVH ADV ADV suspends burst OE t Data in (D) High-Z t OEHZ DS t DH D(A1) D(A2) D(A2 + 1) D(A2 + 3) D(A3) D(A3 + 1) Data Out (Q) BURST READ BURST WRITE Single WRITE DON’T CARE Extended BURST WRITE UNDEFINED Note 27. Full width write can be initiated by either GW LOW, or by GW HIGH, BWE LOW and BWX LOW. Document Number: 38-05548 Rev. *E Page 22 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Switching Waveforms (continued) Read/Write Cycle Timing [26, 28, 29] t CYC CLK tCL tCH t ADS tADH t AS tAH ADSP ADSC ADDRESS A1 A2 A3 A4 A5 A6 t WES tWEH BWE, BW X t CES tCEH CE ADV OE t DS tCO Data In (D) t OELZ High-Z tOEHZ tCLZ Data Out (Q) tDH High-Z Q(A1) Q(A4) Q(A2) Back-to-Back READs D(A5) D(A3) DON’T CARE Q(A4+3) BURST READ Single WRITE D(A6) Back-to-Back WRITEs UNDEFINED Notes 28. The data bus (Q) remains in high-Z following a write cycle, unless a new read access is initiated by ADSP or ADSC. 29. GW is HIGH. Document Number: 38-05548 Rev. *E Page 23 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Switching Waveforms (continued) ZZ Mode Timing [30, 31] CLK t ZZ I t ZZREC ZZ t ZZI SUPPLY I DDZZ t RZZI ALL INPUTS (except ZZ) Outputs (Q) DESELECT or READ Only High-Z DON’T CARE Notes 30. Device must be deselected when entering ZZ sleep mode. See cycle descriptions table for all possible signal conditions to deselect the device. 31. DQs are in high-Z when exiting ZZ sleep mode. Document Number: 38-05548 Rev. *E Page 24 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Ordering Information Not all of the speed, package, and temperature ranges are available. Please contact your local sales representative or visit www.cypress.com for actual products offered. Speed (MHz) 167 Ordering Code CY7C1386DV25-167AXC Package Diagram Part and Package Type 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-Free Operating Range Commercial CY7C1387DV25-167AXC CY7C1386FV25-167BGC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) CY7C1387FV25-167BGC CY7C1386FV25-167BGXC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Pb-Free CY7C1387FV25-167BGXC CY7C1386DV25-167BZC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) CY7C1387DV25-167BZC CY7C1386DV25-167BZXC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free CY7C1387DV25-167BZXC CY7C1386DV25-167AXI 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-Free Industrial CY7C1387DV25-167AXI CY7C1386FV25-167BGI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) CY7C1387FV25-167BGI CY7C1386FV25-167BGXI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Pb-Free CY7C1387FV25-167BGXI CY7C1386DV25-167BZI 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) CY7C1387DV25-167BZI CY7C1386DV25-167BZXI 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free CY7C1387DV25-167BZXI 200 CY7C1386DV25-200AXC 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-Free Commercial CY7C1387DV25-200AXC CY7C1386FV25-200BGC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) CY7C1387FV25-200BGC CY7C1386FV25-200BGXC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Pb-Free CY7C1387FV25-200BGXC CY7C1386DV25-200BZC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) CY7C1387DV25-200BZC CY7C1386DV25-200BZXC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free CY7C1387DV25-200BZXC CY7C1386DV25-200AXI 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-Free Industrial CY7C1387DV25-200AXI CY7C1386FV25-200BGI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) CY7C1387FV25-200BGI CY7C1386FV25-200BGXI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Pb-Free CY7C1387FV25-200BGXI CY7C1386DV25-200BZI 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) CY7C1387DV25-200BZI CY7C1386DV25-200BZXI 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free CY7C1387DV25-200BZXI Document Number: 38-05548 Rev. *E Page 25 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Ordering Information (continued) Not all of the speed, package, and temperature ranges are available. Please contact your local sales representative or visit www.cypress.com for actual products offered. 250 CY7C1386DV25-250AXC 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-Free Commercial CY7C1387DV25-250AXC CY7C1386FV25-250BGC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) CY7C1387FV25-250BGC CY7C1386FV25-250BGXC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Pb-Free CY7C1387FV25-250BGXC CY7C1386DV25-250BZC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) CY7C1387DV25-250BZC CY7C1386DV25-250BZXC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free CY7C1387DV25-250BZXC CY7C1386DV25-250AXI 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-Free Industrial CY7C1387DV25-250AXI CY7C1386FV25-250BGI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) CY7C1387FV25-250BGI CY7C1386FV25-250BGXI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Pb-Free CY7C1387FV25-250BGXI CY7C1386DV25-250BZI 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) CY7C1387DV25-250BZI CY7C1386DV25-250BZXI 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free CY7C1387DV25-250BZXI Document Number: 38-05548 Rev. *E Page 26 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Package Diagrams Figure 1. 100-Pin Plastic Quad Flat pack (14 x 20 x 1.4 mm) (51-85050) 16.00±0.20 1.40±0.05 14.00±0.10 100 81 80 1 20.00±0.10 22.00±0.20 0.30±0.08 0.65 TYP. 30 12°±1° (8X) SEE DETAIL A 51 31 50 0.20 MAX. 0.10 1.60 MAX. R 0.08 MIN. 0.20 MAX. 0° MIN. SEATING PLANE STAND-OFF 0.05 MIN. 0.15 MAX. 0.25 NOTE: 1. JEDEC STD REF MS-026 GAUGE PLANE 0°-7° R 0.08 MIN. 0.20 MAX. 2. BODY LENGTH DIMENSION DOES NOT INCLUDE MOLD PROTRUSION/END FLASH MOLD PROTRUSION/END FLASH SHALL NOT EXCEED 0.0098 in (0.25 mm) PER SIDE BODY LENGTH DIMENSIONS ARE MAX PLASTIC BODY SIZE INCLUDING MOLD MISMATCH 3. DIMENSIONS IN MILLIMETERS 0.60±0.15 0.20 MIN. 51-85050-*B 1.00 REF. DETAIL Document Number: 38-05548 Rev. *E A Page 27 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Package Diagrams (continued) Figure 2. 119-Ball BGA (14 x 22 x 2.4 mm) (51-85115) 51-85115-*B Document Number: 38-05548 Rev. *E Page 28 of 30 CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Package Diagrams (continued) Figure 3. 165-Ball FBGA (13 x 15 x 1.4 mm) (51-85180) 165 FBGA 13 x 15 x 1.40 MM BB165D/BW165D BOTTOM VIEW PIN 1 CORNER BOTTOM VIEW TOP VIEW PIN 1 CORNER TOP VIEW Ø0.05 M C Ø0.25 MØ0.05 CAB MC PIN 1 CORNER Ø0.25 M C A B Ø0.50 -0.06 (165X) PIN 1 CORNER 1 2 1 +0.14 4 2 5 3 6 4 7 5 8 6 9 7 10 11 8 9 11 10 11 10 9 11 8 10 7 9 6 8 5 7 Ø0.50 -0.06 (165X) 4 6 3 +0.14 2 5 4 1 3 2 1A B A C B C B D C D C E D F 1.00 A 1.00 B F E G F G F H G H G J H K J L K M L N M P N P N R P R P 7.00 7.00 14.00 D E 14.00 15.00±0.10 E 15.00±0.10 15.00±0.10 A 15.00±0.10 3 J H K J L K M L N M R R A A A 1.00 5.00 A 1.00 5.00 10.00 10.00 B B 13.00±0.10 B 13.00±0.10 B 13.00±0.10 13.00±0.10 SEATING PLANE NOTES : NOTES : SOLDER PAD TYPE : NON-SOLDER MASK DEFINED (NSMD) PACKAGE WEIGHT SOLDER PAD: 0.475g TYPE : NON-SOLDER MASK DEFINED (NSMD) JEDEC REFERENCE : MO-216 / DESIGN 4.6C PACKAGE WEIGHT : 0.475g PACKAGE CODE : BB0AC : MO-216 / DESIGN 4.6C JEDEC REFERENCE PACKAGE CODE : BB0AC 51-85180-*A 0.35±0.06 C 0.35±0.06 0.36 0.36 SEATING PLANE C 0.15 C 1.40 MAX. 1.40 MAX. 0.15(4X) 0.15 C 0.53±0.05 0.53±0.05 0.25 C 0.25 C 0.15(4X) 51-85180-*A i486 is a trademark, and Intel and Pentium are registered trademarks of Intel Corporation. PowerPC is a trademark of IBM Corporation. All product and company names mentioned in this document are the trademarks of their respective holders. Document Number: 38-05548 Rev. *E Page 29 of 30 © Cypress Semiconductor Corporation, 2006-2007. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25 Document History Page Document Title: CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/ CY7C1387FV25 18-Mbit (512K x 36/1M x 18) Pipelined DCD Sync SRAM Document Number: 38-05548 REV. ECN NO. Issue Date Orig. of Change Description of Change ** 254550 See ECN RKF New data sheet *A 288531 See ECN SYT Edited description under “IEEE 1149.1 Serial Boundary Scan (JTAG)” for non-compliance with 1149.1 Removed 225 Mhz Speed Bin Added Pb-free information for 100-Pin TQFP, 119 BGA and 165 FBGA Packages Added comment of ‘Pb-free BG packages availability’ below the Ordering Information *B 326078 See ECN PCI Address expansion pins/balls in the pinouts for all packages are modified as per JEDEC standard Added description on EXTEST Output Bus Tri-State Changed description on the Tap Instruction Set Overview and Extest Changed Device Width (23:18) for 119-BGA from 000110 to 101110 Added separate row for 165 -FBGA Device Width (23:18) Changed ΘJA and ΘJC for TQFP Package from 31 and 6 °C/W to 28.66 and 4.08 °C/W respectively Changed ΘJA and ΘJC for BGA Package from 45 and 7 °C/W to 23.8 and 6.2 °C/W respectively Changed ΘJA and ΘJC for FBGA Package from 46 and 3 °C/W to 20.7 and 4.0 °C/W respectively Modified VOL, VOH test conditions Removed shading on DC Table for 200 MHz speed bin Removed comment of ‘Pb-free BG packages availability’ below the Ordering Information *C 418125 See ECN NXR Changed address of Cypress Semiconductor Corporation on Page# 1 from “3901 North First Street” to “198 Champion Court” Changed the description of IX from Input Load Current to Input Leakage Current on page# 18 Changed the IX current values of MODE on page # 18 from –5 µA and 30 µA to –30 µA and 5 µA Changed the IX current values of ZZ on page # 18 from –30 µA and 5 µA to °5 µA and 30 µA Changed VIH < VDD to VIH < VDDon page # 18 Updated Ordering Information Table *D 475009 See ECN VKN Converted from Preliminary to Final. Added the Maximum Rating for Supply Voltage on VDDQ Relative to GND Changed tTH, tTL from 25 ns to 20 ns and tTDOV from 5 ns to 10 ns in TAP AC Switching Characteristics table. Updated the Ordering Information table. *E 793579 See ECN VKN Added Part numbers CY7C1386FV25 and CY7C1387FV25 Added footnote# 3 regarding Chip Enable Updated Ordering Information table Document Number: 38-05548 Rev. *E Page 30 of 30