Microsemi APT58M50J N-channel mosfet Datasheet

APT58M50J
500V, 58A, 0.065Ω Max
N-Channel MOSFET
S
S
Power MOS 8™ is a high speed, high voltage N-channel switch-mode power MOSFET.
A proprietary planar stripe design yields excellent reliability and manufacturability. Low
switching loss is achieved with low input capacitance and ultra low Crss "Miller" capacitance. The intrinsic gate resistance and capacitance of the poly-silicon gate structure
help control slew rates during switching, resulting in low EMI and reliable paralleling,
even when switching at very high frequency. Reliability in flyback, boost, forward, and
other circuits is enhanced by the high avalanche energy capability.
D
G
SO
2
T-
27
"UL Recognized"
file # E145592
ISOTOP ®
D
APT58M50J
Single die MOSFET
G
S
TYPICAL APPLICATIONS
FEATURES
• Fast switching with low EMI/RFI
• PFC and other boost converter
• Low RDS(on)
• Buck converter
• Ultra low Crss for improved noise immunity
• Two switch forward (asymmetrical bridge)
• Low gate charge
• Single switch forward
• Avalanche energy rated
• Flyback
• RoHS compliant
• Inverters
Absolute Maximum Ratings
Symbol
ID
Parameter
Unit
Ratings
Continuous Drain Current @ TC = 25°C
58
Continuous Drain Current @ TC = 100°C
37
A
IDM
Pulsed Drain Current
VGS
Gate-Source Voltage
±30
V
EAS
Single Pulse Avalanche Energy 2
1845
mJ
IAR
Avalanche Current, Repetitive or Non-Repetitive
42
A
1
270
Thermal and Mechanical Characteristics
Typ
Max
Unit
W
PD
Total Power Dissipation @ TC = 25°C
540
RθJC
Junction to Case Thermal Resistance
0.23
RθCS
Case to Sink Thermal Resistance, Flat, Greased Surface
Operating and Storage Junction Temperature Range
VIsolation
RMS Voltage (50-60hHz Sinusoidal Waveform from Terminals to Mounting Base for 1 Min.)
WT
Torque
Package Weight
Terminals and Mounting Screws.
Microsemi Website - http://www.microsemi.com
-55
150
°C/W
°C
V
2500
1.03
oz
29.2
g
10
in·lbf
1.1
N·m
2-2007
TJ,TSTG
0.15
Rev A
Min
Characteristic
050-8096
Symbol
Static Characteristics
TJ = 25°C unless otherwise specified
Symbol
Parameter
Test Conditions
Min
VBR(DSS)
Drain-Source Breakdown Voltage
VGS = 0V, ID = 250µA
500
∆VBR(DSS)/∆TJ
Breakdown Voltage Temperature Coefficient
RDS(on)
Drain-Source On Resistance
VGS(th)
Gate-Source Threshold Voltage
∆VGS(th)/∆TJ
Zero Gate Voltage Drain Current
IGSS
Gate-Source Leakage Current
Dynamic Characteristics
Symbol
Forward Transconductance
Ciss
Input Capacitance
Crss
Reverse Transfer Capacitance
Coss
Output Capacitance
TJ = 125°C
0.60
0.055
4
-10
0.065
5
25
500
±100
Min
f = 1MHz
Co(er)
5
Effective Output Capacitance, Energy Related
Typ
Max
65
13500
185
1455
VGS = 0V, VDS = 25V
Effective Output Capacitance, Charge Related
Unit
V
V/°C
Ω
V
mV/°C
µA
nA
Unit
S
pF
845
VGS = 0V, VDS = 0V to 333V
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
td(on)
Turn-On Delay Time
tf
VGS = 0V
Test Conditions
VDS = 50V, ID = 42A
4
td(off)
TJ = 25°C
Max
TJ = 25°C unless otherwise specified
Co(cr)
tr
VDS = 500V
Typ
VGS = ±30V
Parameter
gfs
3
VGS = VDS, ID = 2.5mA
Threshold Voltage Temperature Coefficient
IDSS
Reference to 25°C, ID = 250µA
VGS = 10V, ID = 42A
3
APT58M50J
Current Rise Time
Turn-Off Delay Time
425
340
75
155
60
70
155
50
VGS = 0 to 10V, ID = 42A,
VDS = 250V
Resistive Switching
VDD = 333V, ID = 42A
RG = 2.2Ω 6 , VGG = 15V
Current Fall Time
nC
ns
Source-Drain Diode Characteristics
Symbol
IS
ISM
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode) 1
Test Conditions
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
Diode Forward Voltage
ISD = 42A, TJ = 25°C, VGS = 0V
trr
Reverse Recovery Time
ISD = 42A 3
Qrr
Reverse Recovery Charge
Peak Recovery dv/dt
Typ
Max
Unit
58
A
G
VSD
dv/dt
Min
D
270
S
diSD/dt = 100A/µs, TJ = 25°C
ISD ≤ 42A, di/dt ≤1000A/µs, VDD = 100V,
TJ = 125°C
1.0
720
20
V
ns
µC
8
V/ns
1 Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
2 Starting at TJ = 25°C, L = 2.08mH, RG = 2.2Ω, IAS = 42A.
050-8096
Rev A
2-2007
3 Pulse test: Pulse Width < 380µs, duty cycle < 2%.
4 Co(cr) is defined as a fixed capacitance with the same stored charge as COSS with VDS = 67% of V(BR)DSS.
5 Co(er) is defined as a fixed capacitance with the same stored energy as COSS with VDS = 67% of V(BR)DSS. To calculate Co(cr) for any value of
VDS less than V(BR)DSS, use this equation: Co(er) = -3.14E-7/VDS^2 + 7.31E-8/VDS + 2.09E-10.
6 RG is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemi reserves the right to change, without notice, the specifications and information contained herein.
350
V
GS
= 10V
TJ = -55°C
250
200
TJ = 25°C
150
100
TJ = 150°C
50
= 7,8 & 10V
GS
120
6V
100
80
60
40
5V
20
TJ = 125°C
0
25
20
15
10
5
0
VDS(ON), DRAIN-TO-SOURCE VOLTAGE (V)
4.5V
0
2.5
280
NORMALIZED TO
VGS = 10V @ 42A
VDS> ID(ON) x RDS(ON) MAX.
250µSEC. PULSE TEST
@ <0.5 % DUTY CYCLE
240
ID, DRAIN CURRENT (A)
2.0
1.5
1.0
0.5
30
25
20
15
10
5
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 2, Output Characteristics
Figure 1, Output Characteristics
200
TJ = -55°C
160
TJ = 25°C
120
TJ = 125°C
80
40
0
25 50 75 100 125 150
0
-55 -25
TJ, JUNCTION TEMPERATURE (°C)
Figure 3, RDS(ON) vs Junction Temperature
0
120
0
8
7
6
5
4
3
2
1
VGS, GATE-TO-SOURCE VOLTAGE (V)
Figure 4, Transfer Characteristics
20,000
Ciss
80
TJ = 125°C
60
40
1000
Coss
100
Crss
20
16
20 30 40 50 60 70 80
ID, DRAIN CURRENT (A)
Figure 5, Gain vs Drain Current
10
500
400
300
200
100
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 6, Capacitance vs Drain-to-Source Voltage
12
VDS = 100V
10
VDS = 250V
8
6
VDS = 400V
4
2
500
400
300
200
100
Qg, TOTAL GATE CHARGE (nC)
Figure 7, Gate Charge vs Gate-to-Source Voltage
0
0
280
ID = 42A
14
0
10
90
240
200
160
TJ = 25°C
120
TJ = 150°C
80
40
0
1.5
1.2
0.9
0.6
0.3
VSD, SOURCE-TO-DRAIN VOLTAGE (V)
Figure 8, Reverse Drain Current vs Source-to-Drain Voltage
0
2-2007
0
Rev A
0
VGS, GATE-TO-SOURCE VOLTAGE (V)
C, CAPACITANCE (pF)
TJ = -55°C
TJ = 25°C
ISD, REVERSE DRAIN CURRENT (A)
gfs, TRANSCONDUCTANCE
10,000
100
050-8096
RDS(ON), DRAIN-TO-SOURCE ON RESISTANCE
V
J
ID, DRIAN CURRENT (A)
ID, DRAIN CURRENT (A)
T = 125°C
140
300
0
APT58M50J
160
100
I
DM
13µs
Rds(on)
100µs
1ms
10ms
1
100ms
DC line
100µs
1ms
Rds(on)
0.1
10ms
TJ = 150°C
TC = 25°C
1
100ms
DC line
Scaling for Different Case & Junction
Temperatures:
ID = ID(T = 25 C)*(TJ - TC)/125
C
°
800
100
10
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 10, Maximum Forward Safe Operating Area
800
100
10
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 9, Forward Safe Operating Area
TJ (°C)
1
TC (°C)
0.0506
0.0624
0.118
Dissipated Power
(Watts)
0.0212
0.180
ZEXT are the external thermal
impedances: Case to sink,
sink to ambient, etc. Set to
zero when modeling only
the case to junction.
0.511
Figure 11, Transient Thermal Impedance Model
0.25
D = 0.9
0.20
0.7
0.15
0.5
Note:
0.10
PDM
ZθJC, THERMAL IMPEDANCE (°C/W)
13µs
10
TJ = 125°C
TC = 75°C
1
IDM
ZEXT
10
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
100
0.1
APT58M50J
300
300
0.3
t2
0.05
t1 = Pulse Duration
t
0.1
0
t1
0.05
10-5
Duty Factor D = 1/t2
Peak TJ = PDM x ZθJC + TC
SINGLE PULSE
10-1
10-2
10-3
RECTANGULAR PULSE DURATION (seconds)
Figure 12. Maximum Effective Transient Thermal Impedance Junction-to-Case vs Pulse Duration
10-4
1.0
SOT-227 (ISOTOP®) Package Outline
11.8 (.463)
12.2 (.480)
31.5 (1.240)
31.7 (1.248)
7.8 (.307)
8.2 (.322)
r = 4.0 (.157)
(2 places)
W=4.1 (.161)
W=4.3 (.169)
H=4.8 (.187)
H=4.9 (.193)
(4 places)
25.2 (0.992)
0.75 (.030) 12.6 (.496) 25.4 (1.000)
0.85 (.033) 12.8 (.504)
4.0 (.157)
4.2 (.165)
(2 places)
2-2007
14.9 (.587)
15.1 (.594)
Rev A
3.3 (.129)
3.6 (.143)
38.0 (1.496)
38.2 (1.504)
050-8096
8.9 (.350)
9.6 (.378)
Hex Nut M4
(4 places)
1.95 (.077)
2.14 (.084)
* Source
30.1 (1.185)
30.3 (1.193)
Drain
* Emitter terminals are shorted
internally. Current handling
capability is equal for either
Source terminal.
* Source
Gate
Dimensions in Millimeters and (Inches)
ISOTOP® is a registered trademark of ST Microelectronics NV. Microsemi's products are covered by one or more of U.S.patents 4,895,810 5,045,903 5,089,434 5,182,234
5,019,522 5,262,336 6,503,786 5,256,583 4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 and foreign patents. US and Foreign patents pending. All Rights Reserved.
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