TI1 LMP93601NHZR Low-noise, high gain, 3-channel afe for thermopile sensor Datasheet

Product
Folder
Sample &
Buy
Support &
Community
Tools &
Software
Technical
Documents
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
LMP93601 Low-Noise, High Gain, 3-Channel AFE for Thermopile Sensors
1 Features
3 Description
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
The LMP93601 is an optimized Analog-Front-End
(AFE) for occupancy detecting thermopile arrays up
to 16 x 16 and thermopile mass flow sensors. The
AFE combines excellent noise performance, low
offset voltage, high gain, and low-power consumption
at sampling rates ideal for monitoring thermopile
sensors.
High Gain, Programmable up to 4096
Low Gain Error Drift, <10 ppm/°C
Low Offset Voltage and Drift; 1 uV, 50 nV/°C
Low Input Bias Current, 1.3 nA
Low Input Offset Current, 120 pA
VCM Output Signal for Level Shifting, AVDD/3
Three Differential EMI Hardened Inputs
16-bit Δ∑ Analog-to-Digital Converter
Low Noise Performance, ENOB 15.3 bits
Four Output Data Rates, up to 1.3 kSPS
Internal Voltage Reference for ADC
SPI Interface Transfer Rate, 20 MHz
Brown-Out Detect
PGA Over-Range Detect
Separate Analog and Digital Supplies, 2.7 to 5.5 V
Low Current Consumption, 1.1 mA
Low Power Shutdown Mode, < 0.1µA
Operating Temp. –25 to 85 °C
1
The LMP93601 is a precision, 16-bit, analog-to-digital
converter (ADC) offered in a leadless WQFN-24
package. The device features three differential EMI
hardened
inputs,
a
low-noise,
high-gain
programmable gain amplifier (PGA), a level shifting
voltage source, an internal reference, and a
programmable sampling rate. The many integrated
features and the simple control of the LMP93601
through an SPI-compatible interface ease precision
measurements of thermopile sensor signals.
Device Information
PART NUMBER
LMP93601
PACKAGE
BODY SIZE
WQFN (24)
5.00 mm x 4.00 mm
(1) For all available packages, see the orderable addendum at
the end of the datasheet.
2 Applications
•
•
•
•
Thermopile Array Measurement
Thermopile Flow Measurements
Bridge Sensor Interface
Gesture Recognition
Analog Supply Vs. Offset Voltage Plot
4 Simplified Thermopile Array System
Diagram
10
8
6
Vos (µV)
4
2
0
±2
±4
±6
Y-Decoder
Vref
SPI
IR sensor
X by Y Array
Analog Data
X-Decoder
AFE
LMP93601
MCU
Digital
Data
±25ƒC
25°C
85°C
±8
±10
2.5
3.0
3.5
4.0
4.5
AVDD (V)
5.0
5.5
6.0
C001
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Simplified Thermopile Array System Diagram....
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
8
1
1
1
1
2
3
4
Absolute Maximum Ratings ...................................... 4
Handling Ratings....................................................... 4
Recommended Operating Conditions....................... 4
Thermal Information .................................................. 4
Electrical Characteristics........................................... 5
Timing Requirements ................................................ 7
Noise Performance ................................................... 8
Typical Characteristics ............................................ 12
Detailed Description ............................................ 15
8.1 Overview ................................................................. 15
8.2 Functional Block Diagram ....................................... 15
8.3
8.4
8.5
8.6
8.7
8.8
9
Feature Description.................................................
Device Functional Modes........................................
Programming...........................................................
Register Maps .........................................................
Multi Byte Access (Auto Increment) Mode..............
Multi-Channel Data Read........................................
16
21
25
27
30
31
Application and Implementation ........................ 33
9.1 Application Information............................................ 33
9.2 Typical Applications ................................................ 33
10 Power Supply Recommendations ..................... 36
11 Layout................................................................... 36
11.1 Layout Guidelines ................................................. 36
11.2 Layout Example .................................................... 37
12 Device and Documentation Support ................. 38
12.1 Trademarks ........................................................... 38
12.2 Electrostatic Discharge Caution ............................ 38
12.3 Glossary ................................................................ 38
13 Mechanical, Packaging, and Orderable
Information ........................................................... 38
5 Revision History
Changes from Original (March 2014) to Revision A
Page
•
Added application curves ...................................................................................................................................................... 3
•
Changed Handling Ratings format ........................................................................................................................................ 3
2
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
6 Pin Configuration and Functions
AVDD
XCAP1
XCAP2
AGND
DGND
24
23
22
21
20
LMP93601
24 Pin
Top View
VCM
1
19
IOVDD
IN1P
2
18
SDO
IN1N
3
17
SCLK
IN2P
4
16
IOGND
IN2N
5
15
CSB
IN3P
6
14
SDI
IN3N
7
13
DRDYB
9
10
11
12
PWDNB
RSTB
SYNC
XCLK
AGND
8
LMP93601
Pin Functions
PIN (1)
NAME
NUMBER
TYPE(I/O) (2)
DESCRIPTION
VCM
1
Analog in/output
INP1
2
Analog input
Input signal positive pin
INN1
3
Analog input
Input signal negative pin
INP2
4
Analog input
Input signal positive pin
INN2
5
Analog input
Input signal negative pin
INP3
6
Analog input
Input signal positive pin
INN3
7
Analog input
Input signal negative pin
AGND
8
Analog ground
PWDNB
9
Digital input
Enable, active low
RSTB
10
Digital input
Master reset, active low
SYNC
11
Digital input
Sync, active high
XCLK
12
Digital input
External clock source
DRDYB
13
Digital output
SDI
14
Digital input
Serial data input
CSB
15
Digital input
Chip select, active low
IOGND
16
Digital IO ground
SCLK
17
Digital input
SDO
18
Digital output
IOVDD
19
Digital IO supply rail
DGND
20
Digital ground
AGND
21
Analog ground
XCAP2
22
Digital LDO
External Cap2
XCAP1
23
Analog
External Cap1
AVDD
24
Analog
Analog supply rail
(1)
(2)
Sensor common mode bias voltage
Data ready signal, active low, push-pull
Serial interface clock
Serial data output; push-pull
For best performance, it is recommended that the DAP is connected to AGND (refer to Mechanical, Packaging and Orderable
Information ). All three “GND” connections (AGND, DGND and IOGND) must be connected to system ground and cannot be left floating.
There is no pull-up/-down for any digital I/O
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
3
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
Analog Supply Voltage, AVDD
-0.3
6.0
UNIT
V
Digital Supply Range, IOVDD; ( IOVDD must always be lower than or equal to AVDD supply)
-0.3
6.0
V
Voltage between any two analog pins
6.0
V
Voltage between any two digital pins
6.0
V
Voltage between XCAP2 and any GND (A, D or IO)
Input current at any pin
-5.0
2.2
V
+5.0
mA
125
°C
Junction Temperature
(1)
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
7.2 Handling Ratings
MIN
Tstg
Storage temperature range
V(ESD)
(1)
(2)
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all
pins (1)
MAX
UNIT
150
°C
2000 K
Charged device model (CDM), per JEDEC specification
JESD22-C101, all pins (2)
V
500
JEDEC document JEP155 states that 2000 -V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 500-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
MIN
MAX
Analog Supply Voltage, AVDD
2.7
5.5
V
Fclk
3.6
4.4
MHz
2.7
AVDD
Digital Supply Voltage, IOVDD
Supply Ground
UNIT
V
AGND = DGND = IOGND
Temperature range
-25
85
°C
7.4 Thermal Information
SYMBOL
THERMAL METRIC
WQFN
24 PINS
UNIT
ΘJA
Thermal resistance, junction to ambient
37.9
°C/W
ΘJC
Thermal resistance, junction to case
4.8
°C/W
ΨJB
Thermal resistance, junction to board
19.4
°C/W
4
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
7.5 Electrical Characteristics
Typical conditions: TA=+25⁰C, AVDD=IOVDD=3.3 V, INP1/INN1 enabled with VICM=AVDD/3. PGA gain=64, PGA over-range
masked, digital gain=1. SPS select=1057 SPS. fXCLK=4.00 MHz. Conversion power mode. XCAP1=1 uF. XCAP2=0.1 uF.
SYMBOL
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
INPUTS
XTLK
Crosstalk across input
channels
Channel1 enabled with a 100 kΩ resistor
as input, channel 2 disabled with 1 V
peak-peak , 100 Hz signal as input.
80
Differential input
impedance
Zin
10//7
Common mode input
impedance
Input bias current
Ios
Input offset current on
differential channels
Maximum of INP1-INN1, .., INP3-INN3
TCIos
Input offset current drift
on differential channels
Maximum of INP1-INN1, .., INP3-INN3
Vos
Input referred offset
voltage
Input short on chip, PGA 64 DG =1, CH1
TCVos
Input referred offset drift
with temperature
Input short on chip
Input differential range
for AVDD≥3V
-15
BW
Channel bandwidth
nA
-200
pA
-0.5
pA/⁰C
-64
+64
-32
+32
Programmable gain settings =64; ± 3%
-16
PGA = 64 V/V; CMRR ≥ 80 dB
PGA = 64 V/V ; CMRR ≥ 72 dB
-25 C to 85 C
Output data rate
PGA
Programmable gain
settings
uV (2)
nV/⁰C
Programmable gain settings =32; ± 3%
mV
+16
±8
±1
V
0.3
AVDD1.4
0.4
AVDD1.45
See
Figure 16
265
ODR
+15
Programmable gain settings =16; ± 3%
PGA bypass
Input common mode
range.
-1.3
1
(1)
MΩ//pF (1)
50
Programmable gain settings = 128; ± 3%
VICM
MΩ//pF
100//4.5
IB
Vdiff
dB
V (3)
Hz
SPS
530
1057
1326
Bypass mode
Digital Gain
Total AFE Gain
1
V/V
1, 2, 4, 8,
16 and 32
V/V
Programmable gain
settings (analog and
digital)
16 - 4096
V/V
Gain error
2x
0.3 %
PGA bypassed
GE drift with temperature
(1)
(2)
(3)
V/V
Programmable gain
settings
Gain steps
GE
16, 32 , 64
and 128
-0.3 %
-9
ppm/⁰C
Value from simulation
The input referred offset is measure by an on-chip short.
Temperature limits are ensured by statistical analysis or design
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
5
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Electrical Characteristics (continued)
Typical conditions: TA=+25⁰C, AVDD=IOVDD=3.3 V, INP1/INN1 enabled with VICM=AVDD/3. PGA gain=64, PGA over-range
masked, digital gain=1. SPS select=1057 SPS. fXCLK=4.00 MHz. Conversion power mode. XCAP1=1 uF. XCAP2=0.1 uF.
SYMBOL
PARAMETER
TEST CONDITION
ENOB (4)
Effective number of bits
THD
Total harmonic distortion 100 Hz, 50 mVpp differential input, PGA
(Linearity)
16 V/V
RMS noise in a 1 kHz
BW
Noise
MIN
Common mode rejection
ratio (at DC)
Power supply rejection
ratio (at DC)
PSRR
MAX
91
dB
uVrms
1
VICM = 0.3 to AVDD-1.4 V
80
127
VICM = 0.4 to AVDD-1.45 V, over
operating temperature range
-25 C to 85 C
72
127
Supply ; 2.7 to 5.5 V
80
120
Supply ; 2.7 to 5.5 V, over operating
temperature range
-25 C to 85 C
72
120
Hz
dB (3)
dB (3)
VRF = 100 mVPP
EMIRR
EMI rejection ratio
UNIT
Bits
0.67 (5)
PGA = 64 V/V
1/ƒ noise corner
CMRR
TYP
15.3
dB
f=400 MHz
86
f=900 MHz
87
f=1800 MHz
85
f=2400 MHz
84
VCM
V VCM
Output voltage
Tstrp VCM
Startup time
Acc VCM
Accuracy
0.2
%
TC VCM
Drift over temperature
0.5
ppm/⁰C
Output current
0.5
mA
I VCM
Load regulation
Zload VCM
To within 90% of final value
0 to 200uA
AVDD/3
V
10
ms
4
Load range
15
2.2//100
mV
MΩ//nF
SLAVE SPI INTERFACE
Clock frequency
1
20
MHz
DIGITAL INPUT/OUTPUT CHARACTERISTICS
VIH
Logical “1” Input Voltage
VIL
Logical “0” Input Voltage
0.7x
IOVDD
V
0.3x
IOVDD
VOH
Isource=300uA
VOL
Isink=300uA
V
IOVDD0.150
IOGND
+0.150
POWER SUPPLY
AVDD
Analog supply voltage
range
IOVDD
Digital supply voltage
range
(4)
6
AVDD ≥ IOVDD
5.5
AVDD
V
V (6)
ENOB is a DC ENOB spec, not the dynamic ENOB that is measured using FFT and SINAD:
ENOB
(5)
(6)
2.7
ª 2 u Vref / Gain º
log2 «
»
¬ RMSNoise ¼
See Table 1 for detailed noise performance
IOVDD always ≤ AVDD and IOVDD minimum is 2.7 V
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Electrical Characteristics (continued)
Typical conditions: TA=+25⁰C, AVDD=IOVDD=3.3 V, INP1/INN1 enabled with VICM=AVDD/3. PGA gain=64, PGA over-range
masked, digital gain=1. SPS select=1057 SPS. fXCLK=4.00 MHz. Conversion power mode. XCAP1=1 uF. XCAP2=0.1 uF.
SYMBOL
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
SUPPLY CURRENT
IIOVDD
IAVDD
Digital on AFE
Analog on AFE
Shutdown Mode, XCLK off
0.1
1
µA
Standby Mode
1.9
25
µA
Conversion Power Mode
2.7
25
µA
Conversion Power Mode,
PGA bypassed
3
µA
Shutdown Mode, XCLK off
0.1
1
µA
Standby Mode
175
250
µA
Conversion Power Mode
1.1
1.6
mA
Conversion Power Mode, 230 μA PGA
bypassed
230
µA
TEMPERATURE RANGE
Operating
–25
85
°C
7.6 Timing Requirements
Under typical conditions with maximum total load capacitance 10 pF.
MIN
TYP
MAX
UNIT
tPH
High Period, SCLK
25
ns
tPL
Low Period, SCLK
25
ns
tSU
SDI input setup time
10
ns
tH
SDI input hold time
10
tOD
SDO output hold time
tCSS
CSB setup time
25
ns
tCSH
CSB hold time
25
ns
tIAG
CSB high time
50
ns
ns
13.5
ns
Figure 1. SPI Write Timing Diagram
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
7
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
CSB
1
7
8
9
15
16
SCLK
SDI
R/W
7 -bit register
address (n)
8-bit data read
from address (n)
SDO
Figure 2. SPI Read Timing Diagram
7.7 Noise Performance
Table 1. Noise In µVRMS at AVDD= 3.3 V, AGND = 0 V, and Internal Reference = 2.4 VRMS
ODR (SPS)
PGA Gain (V/V)
D-Gain (V/V)
Vn (uVrms)
1
Below the resolution
of the 16 bit SDM.
2
Below the resolution
of the 16 bit SDM.
4
0.661
8
0.597
16
0.578
16
32
265
64
128
8
Submit Documentation Feedback
32
0.574
1
Below the resolution
of the 16 bit SDM.
2
0.516
4
0.396
8
0.368
16
0.361
32
0.362
1
0.556
2
0.321
4
0.287
8
0.281
16
0.275
32
0.277
1
0.298
2
0.254
4
0.247
8
0.242
16
0.242
32
0.240
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Noise Performance (continued)
Table 1. Noise In µVRMS at AVDD= 3.3 V, AGND = 0 V, and Internal Reference = 2.4 VRMS (continued)
ODR (SPS)
PGA Gain (V/V)
D-Gain (V/V)
Vn (uVrms)
1
Below the resolution
of the 16 bit SDM.
2
0.944
4
0.888
8
0.831
16
0.810
32
0.816
1
0.509
2
0.609
4
0.543
8
0.517
16
0.521
32
0.511
1
0.569
2
0.421
4
0.397
8
0.396
16
0.397
32
0.395
1
0.377
2
0.348
4
0.340
16
32
530
64
128
8
0.341
16
0.340
32
0.339
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
9
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Noise Performance (continued)
Table 1. Noise In µVRMS at AVDD= 3.3 V, AGND = 0 V, and Internal Reference = 2.4 VRMS (continued)
ODR (SPS)
PGA Gain (V/V)
D-Gain (V/V)
Vn (uVrms)
1
1.565
2
1.517
4
1.410
8
1.409
16
1.398
32
1.401
1
0.932
2
0.903
4
0.834
8
0.839
16
0.829
32
0.824
1
0.667
2
0.596
4
0.580
16
32
1057
64
128
10
Submit Documentation Feedback
8
0.580
16
0.579
32
0.574
1
0.501
2
0.481
4
0.476
8
0.476
16
0.473
32
0.470
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Noise Performance (continued)
Table 1. Noise In µVRMS at AVDD= 3.3 V, AGND = 0 V, and Internal Reference = 2.4 VRMS (continued)
ODR (SPS)
PGA Gain (V/V)
D-Gain (V/V)
Vn (uVrms)
1
2.331
2
1.743
4
1.743
8
1.665
16
1.648
32
1.681
1
1.189
2
0.975
4
0.981
8
0.954
16
0.941
32
0.937
1
0.733
2
0.677
4
0.670
16
32
1326
64
128
8
0.667
16
0.660
32
0.663
1
0.575
2
0.546
4
0.541
8
0.537
16
0.540
32
0.538
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
11
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
10
10
8
8
6
6
4
4
2
2
Vos (µV)
Vos (µV)
7.8 Typical Characteristics
0
±2
±4
0
±2
±4
±6
±6
±25ƒC
25°C
85°C
±8
±10
2.5
3.0
3.5
4.0
4.5
5.0
5.5
±25ƒC
25°C
85°C
±8
±10
6.0
AVDD (V)
0.0
0.5
1.0
1.5
2.0
C001
Figure 3. Vos vs AVDD (V)
C002
Figure 4. Vos vs Vcm (V)
10
0.20
AVDD=2.7 V
AVDD=3.3 V
AVDD=5.5 V
0.15
5
0.10
Ios (nA)
Ibias (nA)
2.5
Vcm (V)
0
0.05
0.00
±0.05
±5
±0.10
AVDD=2.7 V
AVDD=3.3 V
AVDD=5.5 V
±10
±50
0
50
±0.15
±0.20
100
Temperature (ƒC)
±50
0
50
100
Temperature (ƒC)
C003
Figure 5. Ibias vs Temperature
C004
Figure 6. Ios vs Temperature
10
0.20
0.15
0.10
Ios (nA)
Ibias (nA)
5
0
0.05
0.00
±0.05
±5
±0.10
VCM=0.6 V
VCM=1.1 V
VCM=1.9 V
±10
±50
0
50
±0.20
100
Temperature (ƒC)
VCM=0.6 V
VCM=1.1 V
VCM=1.9 V
±0.15
±50
C005
Figure 7. Ibias vs Temperature
12
Submit Documentation Feedback
0
50
Temperature (ƒC)
100
C006
Figure 8. Ios vs Temperature
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Typical Characteristics (continued)
1.0
1.0
IAVDD_SD 3.3 V
IAVDD_SD 5.5 V
0.8
IOVDD (µA)
IAVDD (µA)
0.8
IOVDD_SD 3.3 V
IOVDD_SD 5.5 V
0.6
0.4
0.2
0.6
0.4
0.2
0.0
0.0
±25
0
25
50
75
Temperature (ƒC)
100
±25
Figure 9. IAVDD vs Temperature
50
75
IOVDD (µA)
1.1
1.0
IAVDD_2.7 V
IAVDD_3.3 V
IAVDD_5.5 V
0.8
±25
0
25
50
75
Temperature (ƒC)
C008
IOVDD_2.7 V
IOVDD_3.3 V
IOVDD_5.5 V
10
0.9
100
Figure 10. IOVDD vs Temperature
12
1.2
IAVDD (mA)
25
Temperature (ƒC)
1.3
8
6
4
2
0
100
±25
0
25
50
75
Temperature (ƒC)
C009
Figure 11. I AVDD vs Temperature
100
C010
Figure 12. IOVDD vs Temperature
300
3.5
250
3.0
2.5
200
IOVDD (µA)
IAVDD (µA)
0
C007
150
100
2.0
1.5
1.0
50
IAVDD_Bypass 3.3 V
IAVDD_STB 3.3 V
0
±25
0
25
50
75
Temperature (ƒC)
100
0.5
IOVDD_Bypass 3.3 V
IOVDD_STB 3.3 V
0.0
±25
C011
Figure 13. IAVDD vs Temperature
0
25
50
75
Temperature (ƒC)
Product Folder Links: LMP93601
C012
Figure 14. IOVDD vs Temperature
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
100
13
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Typical Characteristics (continued)
2.0
1.5
1.0
GE (%)
0.5
0.0
±0.5
PGA128
PGA64
PGA32
PGA16
PGA Bypass
±1.0
±1.5
±2.0
±25
0
25
50
75
Temperature (ƒC)
100
C013
Figure 15. GE (%) vs Temperature
14
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
8 Detailed Description
8.1 Overview
The LMP93601 Analog-Front-End is a unique device designed from ground up specifically for interfacing to
16 x 16 MEMS (Micro-electro-mechanical systems) thermopile arrays, and thermopile mass flow sensors
with very low output signals in the range of 1 µV to 600 µV. For signal conditioning of thermopile sensors, the
AFE is required to have very low noise performance, very low offset voltage, very high gain, and low-power
consumption at sampling rates to process several frames per second.
The signal chain includes a PGA featuring low offset voltage (0.7 µVrms), low input bias current (–1.3 nA),
and programmable gain of 1x, 16x, 32x, 64x and 128x. The total gain of the signal path combined with the
programmable digital gain of the 16-bit Delta-Sigma data converter is up to 4096x.
The signal chain features excellent total noise performance of below 0.5 uVrms at programmable sampling
rates of up to 1.3 kSPS, while providing optimal power consumption during full operation (1.1 mA). The
device features ultra-low shutdown current (0.1 µA), and standby mode current of 250 µA.
Other features include Low EMI sensitivity due to EMI hardened input stage, Internal reference voltage for
the ADC, output reference voltage for thermopile sensors (VCM), a brown-out detector for low-battery
condition, synchronous serial communication (SPI) communication up to 20 MHz, flex routing multiplexer for
interfacing to multiple flow sensors, and PGA over range detection.
8.2 Functional Block Diagram
AVDD
PGA Over-range
Detect
AVDD/3
INP1
EMIF
INN1
EMIF
INP2
EMIF
INN2
EMIF
INP3
EMIF
INN3
EMIF
Flex Routing MUX
VCM
XCAP2
Brownout
Detect
+
PGA
XCAP1
XCAP2
LDO, VREF &
Comm. Mode
Generator
IOVDD
RSTB
Control Unit
CSB
16-bit û™$'&
û™
Modulator
FIR
FLTR
SDO
SPI
-
SDI
SCLK
XCLK
LMP93601
AGND
PWDNB
DRDYB
SYNC
DGND
IOGND
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
15
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
8.3 Feature Description
8.3.1 Data Format
The LMP93601 provides 16 bits of data in binary two's complement format. The positive full-scale input produces
an output code of 7FFFh and the negative full-scale input produces an output code of 8000h. The output clips at
these codes for signals that exceed full-scale (FS). Table 2 summarizes the ideal output codes for different input
signals.
8.3.2 Transfer Function
The ADC output code in decimal is given by the relation:
codedec
Vdiff u PGA u DG u 216
2 u Vref
(1)
Table 2. Example of ADC Output Code
CODE (HEX)
CODE (DEC)
PGA (V/V)
DG (V/V)
VDIF (V)
1946
6470
64
1
7.404E-3
3000
12288
16
4
14.063E-3
D0FC
-12036
16
1
-55.096E-3
FFFC
-4
64
1
-4.578E-6
8.3.3 Input Routing Mux
The LMP93601 offers 5 differential input channel configurations for its 3 differential input pairs:
• For 1-ch system: One of the 3 channels, Ch1, Ch2, or Ch3 is enabled
• For 2-ch system: Ch1 & Ch2 are enabled
• For 3-ch system: Ch1, Ch2, Ch3 are enabled
8.3.4 Programmable Gain Amplifier
The PGA provides a high input impedance to interface with signal sources that may have relatively high output
impedance, such as thermopiles. The Programmable Gain amplifier gain can be programmed to 16, 32 64, and
128 V/V.
The maximum differential input voltage (Vdiff) of the PGA is ±64 mV when the programmed analog gain is 16
V/V. With analog gain programmed to 64V/V the maximum differential input voltage of the PGA is ±16 mV.
The input common mode voltage range of the PGA is AGND+0.3+Vdiff*Gain/2 to AVDD-1.40-Vdiff*Gain/2.
The PGA also has an EMIRR filter incorporated. The EMIRR filter is a single pole roll off providing enhanced
noise immunity for unwanted RF signals.
8.3.5 PGA Bypass Mode
The PGA can be bypassed to access the 16 bit Delta-Sigma modulator directly. This mode results in a typical
gain of 1 V/V at a supply current of typically 230 µA. The input common mode range in the PGA-bypass mode is
rail to rail and the maximum differential input voltage that can be applied to the Delta-Sigma modulator is ± 1.2
Vpp differential. The typical noise at 1057 SPS is 20 uVrms. Typical input impedance in the PGA bypass mode is
1.3 MΩ//7 pF. In the PGA-bypass mode, the PGA and overrange detectors are disabled. To access the PGAbypass mode the following SPI write sequence must be followed in this exact order:
Table 3. PGA Bypass Mode SPI Write Sequence
16
ADDRESS
WRITE
0x1
Program as normal
DESCRIPTION
0x02
Program as normal
0x03
See Table 4 below
0x05
8'h01
Mask PGA OR detectors (else the conversion will read 7FFF)
0x60
8'h93
First write to address 0x60
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Table 3. PGA Bypass Mode SPI Write Sequence (continued)
ADDRESS
WRITE
0x60
8'h60
Second write to address 0x60
DESCRIPTION
0x63
8'h10
Override
0x61
8'h28
PGA bypass and OR detectors shutdown
0x04
8'h01
Conversion mode
0x00
8'h01
lock
Table 4. PGA Bypass Register 0x03 Setting Description
ADDR [6:0]
0x03
NAME
Config3
# OF BITS
5
TYPE
R/W
DEFAULT
DESCRIPTION
8’h52
PGA settings for
differential channels
[6:4] Digital 3’b000: 1
3’b001: 2
3’b010: 4
3’b011: 8
3’b100: 16
3’b101: 32(default)
3’b110-111: Reserved
[1:0] Analog
2’b00: 16
2’b01: 32
2’b10: 64 (default)
2’b11: 128 [7] always 0
[2] Bypass PGA, bit [1:0]
would be ignored
To exit the PGA-bypass mode, a reset is required, either via the RSTB or SPI. Failure to follow this exact
sequence may result in the device becoming unresponsive, thereby requiring a reset, either via the RSTB or SPI.
8.3.6 Over-Range Detection
The PGA has over-range detection and when signals are outside the minimum or maximum allowed signal, an
out of range condition will be reported as “0x7FFF” for the corresponding channel. A status register provides
further details of the out of range condition. The overrange detectors are at the output of the PGA and check for
five conditions:
• PGA positive output low
• PGA negative output low
• PGA positive output high
• PGA negative output high
• PGA differential output high
The “output high” overrange detectors typically trip at AVDD-1.28 V. Both “output low” overrange detectors
typically trip at 0.11 V and the differential overrange detector is typically at +1.22 and -1.22 V differential.
For example, if the input common mode is below 0.11 V and a zero differential voltage (shorted input) is applied,
both the PGA positive and PGA negative “output low” detectors would trip. Likewise, if the input common mode is
over AVDD-1.28 and a zero differential voltage (shorted input) is applied, both the PGA positive and PGA
negative “output high” detectors would trip.
For the differential output high detector to trip, the output of the PGA has to be greater than 1.22 V or less than
–1.22 V. At a gain of 64, this would translate to an input referred differential voltage of Vdiff = 1.22/64 = 19 mV
8.3.7 Analog-To-Digital Converter (ADC)
The 16 bit Sigma Delta Modulator (SDM) takes the output signal of the PGA and converts this signal into a high
resolution bit stream that is further processed by the digital filters. The 2.4 V reference for the SDM is internally
generated and requires a high-performance, low ESR (<0.1 Ω), and Low ESL(<1nH) 1uF (±10%) external bypass
capacitor for optimal performance on the XCAP1 pin. This reference should not be used to drive external
circuitry.
The SDM clock uses a divided-down external clock (XCLK).
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
17
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
8.3.8 Programmable Digital Filters
A programmable digital filter behind the SDM reconstructs the signal from the SDM output bit stream. The filter
consists of programmable filter stages. Each of the stages further filters and decimates the bit stream so that the
data rate and bandwidth of the signal is reduced and at the same time the resolution is enhanced.
An example of the filter response when programmed for 265, 530, 1057 or 1326 SPS is shown in Figure 16.
Figure 16. Bandwidth and Module Noise Performance
18
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
8.3.9 Common Mode Voltage Generator
The common mode reference generator (VCM) provides an AVDD/3 reference. It can drive a 100nF (±10%)
external capacitance with typical ESR/ESL of 0.1 Ω and 1 nH. It can also be used to drive guard traces placed
around the input PCB traces to reduce PCB leakage currents to the inputs. The VCM can be disabled with the
Reference Enable register. In case the VCM is disabled, an external common mode voltage that tracks the
common mode of the input channel(s) needs to be connected to the VCM pin to function as a reference for the
over-range detection circuitry. In case the VCM is disabled, it is recommended to add an external 10 kΩ series
resistor.
8.3.10 Low Drop-Out Regulator (LDO)
The on chip LDO generates 1.2V for the digital core. A 100nF (+/-10%) external capacitance with low ESR/ESL
(typical 0.1 ohm and 1 nH) is required on the XCAP2 pin to provide adequate supply bypass for the internal
digital core. The LDO should not be used to drive external circuitry.
8.3.11 External Clock
The LMP93601 does not have an internal oscillator and needs an external clock, XCLK. The XCLK needs to be
running all the time when the LMP93601 is operating. The SYNC, DRDYB, and RSTB are synchronous to XCLK.
The LMP93601 operating range for XCLK is 3.6 to 4.4 MHz.
8.3.12 Operating Modes
The LMP93601 can be programmed to convert data in continuous-time or single shot modes.
8.3.13 Data Ready Function (DRDYB)
DRDYB is an active low output signal. It is asserted when new data is ready to be read and should be used by
the MCU for data capturing.
When DRDYB is asserted, the MCU can capture the data any time before the next DRDYB is asserted. The time
is defined as 1/ODR. Please note that if data is not read within the time period, it will be over-written internally in
the LMP93601 by the new data.
For DRDYB de-assertion, it is normally cleared by a data read. In the following example: it is de-asserted on the
14th SCLK rising edge.
If data has not been read when the new data is about to be ready, DRDYB will be de-asserted for 15 XCLK
periods (defined as tDRDYB) so that LMP93601 can re-assert the DRDYB. Once this happens, the µC should wait
for the next DRDYB assertion before issuing an SPI read protocol.
DRDYB assertion and de-assertion is synchronous to XCLK and SCLK respectively in normal operation.
Figure 17. DRDYB Behavior for A Complete Read Operation
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
19
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
t1/ODRt
DRDYB
tDRDYB
SDO
ch3
CONV
DRDYB
ch1
ch2
ch3
*
ch1
ch2
ch3
ch1
*
*
The above example is to show how DRDYB functions if more than 1 channel is enabled. DRDBYB is only issued every round-robin. DRDYB is de-asserted when
the LMP93601 starts to output data.
ch1
CONV
DRDYB
ch1
ch1
*
*
ch1
*
ch1
ch1
*
*
ch1
*
ch1
*
The above example is to show how DRDYB functions if only 1 channel is enabled. DRDYB is de-asserted when the LMP93601 starts to output data.
Figure 18. DRDYB Behavior for an Incomplete Read Operation
8.3.14 Synchronous Serial Peripheral Interface (SPI)
The serial peripheral interface (SPI) interface allows access to the control registers of the LMP93601. The serial
interface is a generic 4-wire synchronous interface compatible with SPI type of interfaces used on many
microcontrollers and DSP controllers. A typical serial interface access cycle is exactly 16 bits long, which
includes an 8-bit command field (R/WB + 7-bit address) to provide a maximum of 128 direct access addresses,
and an 8-bit data field.
LMP93601’s SCLK can be in either idle high or idle low state when CSB is de-asserted. The first incoming data
on the SCLK rising edge, and all incoming data at SDI is captured on the SCLK rising edge. Outgoing data is
sourced at SDO on the SCLK falling edge and the MCU can capture data from the LMP93601 on the SCLK
rising edge.
8.3.15 Power Management Mode; Standby, Conversion and Shutdown
The device can be placed in Standby and Conversion mode via the SPI. In Conversion mode, the ADC and PGA
are operating and converting data. In Standby mode the PGA and ADC are disabled and not converting data. In
Standby mode the contents of the registers are unaffected, and there is a drastic power reduction. Only the
internal reference, LDO, VCM driver and the digital are on.
The reaction time going from Standby mode to Conversion mode is approximately 100 µs.
The LMP93601 can be put in shutdown mode by taking the PWDNB pin low. In shutdown mode, all internal
circuitry is disabled and no register settings are maintained. The power consumption is very low (< 0.1 uA).
Releasing the PWDNB (taking it high) will “wake up” the device and it will return to the default Standby mode.
Wake up time from shutdown can be up to 10 ms.
Table 5. Wake Up Time From Low Power Modes
20
Mode
Registers
Power
Wake Up Time
Programmable via
Shutdown
Not maintained
~0.1 µA
Less than 10 ms to go to
Standby mode
PWDNB pin
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Table 5. Wake Up Time From Low Power Modes (continued)
Mode
Registers
Power
Wake Up Time
Programmable via
Standby
Maintained
~175 µA
~100 µs to go to
conversion mode
SPI
Conversion
Maintained
1.1 mA
n/a
SPI
8.3.16 Power-On Sequence and Reset (POR) Function
An internal power on reset is generated after both the internal LDO (to supply the internal digital) and IOVDD
reach valid values. The internal LDO will reach stable values only after the AVDD has reached at least 2.7 V.
The device should be powered up with AVDD enabled and stabilized first, then the IOVDD. This allows the
device to start in the default power up state and ensures that the internal power on reset is generated after both
the internal LDO (to supply the internal digital) and IOVDD reach valid values. The internal LDO will reach stable
values only after the AVDD has reached at least 2.7 V for 1 ms. Alternatively, AVDD and IOVDD can be
connected together, but this can result in an erroneous brown-out condition being reported when the ramp time
of the supplies is slower than 0.1 V/ms. For example, if the AVDD = IOVDD are linearly ramped from 0 to 3.3 V
in longer than 330 µs, the brown could possibly trigger and be logged in the status register and the first
conversion result could read ‘7FFF’. To avoid this erroneous brown-out report, three alternative solutions are
available:
a. After the supplies are stable, reset the part (either with the RSTB pin or with a soft reset via SPI). After this
reset, the part can be programmed and used as intended.
b. Or, after the supplies are stable, program the part as desired, but before initiating the first conversion, read
back the status register(s) of the enabled channel(s) to clear the erroneous brown-out status.
c. Or, wait supplying the XCLK to the part until after the supplies are stable
8.3.17 Brown-Out Detection Function
A brown-out detection circuit monitors the AVDD. It triggers an alarm only when AVDD falls below ~2.55 V and
stays below 2.55 V for more than 16 fxclk cycles. The brown-out detection has a hysteresis of ~65 mV. The
alarm will result in “0x7FFF” data and the appropriate channel status register(s) can be read to decode the alarm.
The brown-out error function can be masked via SPI with the “alarm mask” register.
8.3.18 Reset Function
The device can be reset to the default (Standby) state via the SPI or taking the RSTB pin low. The reaction time
from the reset (either via SPI or RSTB pin) to the device getting to Standby mode is on the order of 100 µs. See
Table 6
8.4 Device Functional Modes
8.4.1 Single-Shot Mode
In Single Shot mode each conversion is triggered by a Start Trigger from the microcontroller unit (MCU) to the
LMP93601 by pulsing the SYNC pin or via a start SPI command (SYNC is recommended for exact timing
control). After the LOCK bit is set, the external µC should wait 3 XCLK cycles before it sends a start trigger. This
is to allow the internal synchronizer enough time to synchronize the SPI write of the LOCK bit into the XCLK
domain. This assumes the analog has already settled (otherwise, allow ~100 µs to go from standby to conversion
mode).
The SYNC has typical setup/hold time of 20 ns with respect to XCLK, as shown in Figure 19.
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
21
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Device Functional Modes (continued)
thold
XCLK
tsetup
SYNC
DRDYB
tvalid
Figure 19. Single Shot Sync Setup/Hold Time
22
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Device Functional Modes (continued)
See Figure 20 for details regarding the Single Shot Flow Chart.
MCU sets the
Sensor Select Mux
Lines
System Power-Up
Start Trigger can
be issued by
pulsing the SYNC
pin or writing the
START Command
via SPI
MCU Issues
Start Trigger
Read LMP93601
Status
Check if
LMP93601
initialization is
complete
Device Ready?
No
No
DRDYB Falling
Edge detected by
MCU?
Yes
Yes
Write
Configuration
Lock Configuration
(1) MCU Switches
the Sensor Select
Mux Lines for the
next conversion
(2) MCU Issues a
Read for the
current conversion
result
Note: MCU can
read the
conversion data
anytime before
the next DRDYB
assertion
Figure 20. Single Shot Flow Chart
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
23
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Device Functional Modes (continued)
8.4.2 Continuous Mode
In Continuous mode the LMP93601 only requires a single Start Trigger to start. The Start Trigger can start either
by a SYNC or a Start command via the SPI (SYNC is recommended). After the LOCK bit is set, the external
MCU should wait 3 XCLK cycles before it sends a start trigger. This allows the internal synchronizer enough time
to synchronize the SPI write of the LOCK bit into the XCLK domain. This assumes the analog has already settled
(else allow ~100 µs to go from standby to conversion mode).
It will convert all enabled channels without requiring another Start Trigger. Figure 21 shows the Continuous Mode
Flow Chart.
System Power-Up
MCU sets the
Sensor Select Mux
Lines
Read LMP93601
Status
Check if
LMP93601
initialization is
complete
Device Ready?
MCU Issues
Start Trigger
No
No
DRDYB Falling
Edge detected by
MCU?
Yes
Yes
Write
Configuration
Lock Configuration
Start Trigger can be
issued by pulsing the
SYNC pin or writing
the START Command
via SPI
Note: It only needs to
be provided once.
(1) MCU Switches
the Sensor Select
Mux Lines for the
next conversion
(2) MCU Issues a
Read for the
current conversion
result
Note: MCU ensures
that there is enough
settling from DRDYB
to next conversion
start.
Note: MCU can read
the conversion data
anytime before the
next DRDYB assertion
Figure 21. Continuous Mode Flow Chart
24
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
8.5 Programming
8.5.1 Window to Capture Data and Status
SPI Protocols can be asynchronous to XCLK. Data and status read can only happen between the consecutive
DRDYB falling edges. For example, after DRDYB is asserted by the LMP93601, the MCU has to finish reading
all data before DRDYB is asserted again.
For best performance in continuous acquisition mode, it is recommended to read the data within 70 µs after
DRDYB is asserted in order to keep the SPI activity during conversion to a minimum.
NOTE
The de-assertion of DRDYB happens after a data read command is received.
Prior Ch1
conversion is
over-ranged
Input
Condition
CONV
Tno_rd
tTrdt
Good
Good
Over-range
Good
Good
Good
Good
Good
ch2
ch1
ch2
ch1
ch2
ch1
ch2
ch1
DRDYB
*
*
**
Ch1 data
Good data
Over-range data
Good data
Good data
Ch2 data
Good data
Good data
Over-range data
Good data
Ch1 status
Status: Good
Ch2 status
Status: Good
Status: over-range
Status: Good
Status: Good
Status: over-range
Status: Good
Status: Good
Data Read
Status Read
Ch1 data is overwritten but overranged status is still
available.
Ch1 status is
cleared only after
it is read.
Ch2 status
not cleared.
Ch1 & Ch2
status is read.
Ch2 status is cleared since the
previous status is read and a
within-range data is converted.
Ch1 status is cleared after it is read even though the latest data is within range.
Ch2 status is not cleared since the current status is still over-range. It is cleared only after a within-range data is converted.
*DRDYB is de-asserted by data read.
**Since data is not read by the MCU, DRDYB is de-asserted by the LMP93601 automatically so that it can be asserted again
when the new data is available. In this case, both data & status should not be read by the MCU during the Tno_rd time duration.
Figure 22. Channel Data Transfer Timing Diagram
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
25
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Programming (continued)
Prior Ch1
conversion is
over-ranged
Input
Condition
CONV
Good
Over-range
Good
Good
Good
Good
Good
Good
ch2
ch1
ch2
ch1
ch2
ch1
ch2
ch1
*
DRDYB
*
*
Ch1 data
Good data
Over-range data
Over-range data
Good data
Ch2 data
Good data
Good data
Good data
Good data
Ch1 status
Status: Good
Status: over-range (1)
Ch2 status
Status: Good
Status: Good
Status: over-range (2)
Status: Good
Status: Good
Status: Good
Data Read
Status Read
Ch1 status(1) is overwritten by a different
over-range status(2).
Ch1 & Ch2
status is read.
Ch1 status is
cleared only after
it is read.
If the LMP93601 gets multiple over-ranged data, the latest status is reported.
*DRDYB is de-asserted by SPI data read.
Figure 23. Channel Data Transfer Timing Diagram
8.5.2 Single Byte Access
WRITE: A single byte write access is a total of 16 SCLK periods during CSB assertion. Incoming data is captured
on the rising edge of the SCLK. A command byte consists of an R/W bit and a 7-bit address field and R/W = 0
for write protocols.
CSB
1
7
8
9
15
16
SCLK
SDI
R/W
7-bit register
address (n)
8-bit data written
to address (n)
Figure 24. Single Byte Write Access
READ: Similar to a write, the LMP93601 captures incoming data on the SCLK rising edge. After the 8th rising
edge, the LMP93601 output data is sourced on the SCLK falling edge and the MCU should capture it on the
rising edge. R/W = 1 for read protocols.
26
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Programming (continued)
CSB
1
7
8
9
15
16
SCLK
R/W
SDI
7 -bit register
address (n)
8-bit data read
from address (n)
SDO
Figure 25. Single Byte Read Access
8.6 Register Maps
Table 6. LMP93601 Internal Registers
ADDR
[6:0]
Name
# of Bits
Type
Default
Description
Locked when
conversion is
enabled?
0x00
Lock
1
R/W (1)
‘h00
[0]
n/a (2)
0: configuration bits are writeable (default)
1: configuration bits are read-only (that is, locked)
unless noted.
[7:1] always 0
0x01
Config1
4
R/W
(1)
‘h00
[7] continuous/single shot:
Y
0: Continuous – the part will convert all enabled
channels sequentially in a round-robin manner.
After all channels are converted, it will repeat the
round-robin. (default)
1: Single-Shot - the part will convert all enabled
channels once in a round-robin manner after
receiving a start-trigger (SYNC pulse preferred). It
will wait for the next trigger before converting all
enabled channels again.
[2:0] Channel enable
Channel enable configuration for the 3 channels
(Ch1-3):
3’b000: Only Ch1 is enabled(default)
3’b001: Only Ch2 is enabled
3’b010: Only Ch3 is enabled
3’b011: Only Ch1 & Ch2 enabled
3’b100: Ch1, 2, & 3 enabled
3’b101, 3’b110, 3’b111: Reserved
[6:3]: always 0
(1)
(2)
R/W = Read or Write
n/a = not applicable
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
27
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Register Maps (continued)
Table 6. LMP93601 Internal Registers (continued)
ADDR
[6:0]
Name
# of Bits
Type
Default
0x02
Config2
3
R/W (1)
’h82
Description
Locked when
conversion is
enabled?
[7] Reference Output Enables for VCM
Y
0: Disable the corresponding VCM output
1: Enable the corresponding VCM output
(default)
VCM = AVDD/3
[1:0] SPS select
Global setting for all enabled channels
2’b00: 265 sps
2’b01: 530 sps
2’b10: 1057 sps(default)
2’b11: 1326 sps
[6:2] always 0
0x03
Config3
5
R/W (1)
’h52
PGA settings for differential channels. All
channels will always have the same setting.
Y
[6:4] Digital
3’b000: 1
3’b001: 2
3’b010: 4
3’b011: 8
3’b100: 16
3’b101: 32(default)
3’b110-111: Reserved
[1:0] Analog
2’b00: 16
2’b01: 32
2’b10: 64 (default)
2’b11: 128
[7], [3:2] always 0
[2] , Bypass PGA, bit [1:0] would be ignored.
See for more details
0x04
Config4
1
R/W (1)
‘h00
[0] Power Mode
Y
0: Standby (default)
1: Conversion Mode (user still has to write the
lock bit and then provide a start-trigger before
conversion starts)
[7:1] always 0
28
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Register Maps (continued)
Table 6. LMP93601 Internal Registers (continued)
ADDR
[6:0]
Name
# of Bits
Type
Default
0x05
Alarm
mask
3
R/W (1)
‘h00
Description
Locked when
conversion is
enabled?
[7] Brownout Mask
Y
0: when brown-out is detected, all enabled
channels’ conversion result will be 0x7FFF
(default)
1: when brown-out is detected, the conversion
result is not affected.
[6]: Digital Gain Over range Mask
0: when digital gain over-range is detected for a
channel, its conversion result will be 0x7FFF
(default)
1: when digital gain over-range is detected,
conversion result is not affected.
[0] PGA over-range Mask
0: when any of the PGA over-range is detected
for a channel, its conversion result will be 0x7FFF
(default)
1: when any of the PGA over-range is detected,
conversion result is not affected
[5:1] always 0
0x06
sdo_cfg
1
R/W (1)
‘h00
[0] SDO always driven mode
N
0: SDO only driven during the read back frames
of a SPI read, all other time, SDO is in Hi-Z
(Default)
1: SDO always driven mode: SDO driven high by
LMP93601 except during the read back frame of
a SPI read
[7:1] always 0
0x07
Soft reset
1
R/W (1)
‘h00
[0]: Soft reset
N
0: normal (Default)
1: Reset all registers hence part will be in default
condition
To reset via SPI, one should write first a 1 to this
bit and then a 0.
[7:1] always 0
0x0f
START
1
WO (3)
n/a (2)
[7] Start
This is a write-only location. If written, it will act as
the trigger to start the conversion sequence.
Only writeable
if LOCK is 1
In continuous mode, the round robin is triggered
by a write to this register. The round robin will be
repeated so only 1 write is needed.
In Single-Shot mode, the round robin is triggered
by a write to this register and all enabled
channels will be converted once. The chip will
wait for the next write to the START register
before starting the next round robin conversion.
NOTE: For accurate timing control, SYNC pulse
as a start-trigger is preferred since it is
synchronous to the XCLK domain.
[6:0] always 0
(3)
WO = Write Only
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
29
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Register Maps (continued)
Table 6. LMP93601 Internal Registers (continued)
ADDR
[6:0]
Name
# of Bits
Type
Default
Description
Locked when
conversion is
enabled?
NOTE The following status register addresses are mapped in ascending order for easy read-back.
0x10
general
Status
1
RO (4)
‘h00
[0]: when this bit is high, the LMP93601 is ready
to be programmed.
n/a (2)
0x11
Status1
8
RO (4)
n/a (2)
[7:0]: Status for CH1:
[0] - Digital gain overrange
[1] - PGA positive output low
[2] - PGA negative output low
[3] - PGA positive output high
[4] - PGA negative output high
[5] - PGA differential output high
[6] - Sign of PGA out.
This alone does not trigger 7FFF error code.
[7] Brown out
n/a (2)
0x12
Status2
8
RO (4)
n/a (2)
[7:0] Status for CH2:
n/a (2)
0x13
Status3
8
RO (4)
n/a (2)
same bit map as CH1 status (above)
[7:0] Status for CH3:
n/a (2)
same bit map as CH1 status (above)
Channel Results:
When over-range is detected, the corresponding channel result will read back 0x7FFF, unless it is masked.
When brown-out is detected, the converted channel result will read back 0x7FFF, unless it is masked.
NOTE The following channel result register addresses are mapped in ascending order for easy read-back.
0x20
CH1 LSB
8
RO (4)
n/a (2)
CH1 Result[7:0]
n/a (2)
0x21
CH1 MSB
8
RO (4)
n/a (2)
CH1 Result[15:8]
n/a (2)
8
RO
(4)
n/a
(2)
CH2 Result[7:0]
n/a (2)
(4)
n/a
(2)
CH2 Result[15:8]
n/a (2)
CH3 Result[7:0]
n/a (2)
CH3 Result[15:8]
n/a (2)
0x22
0x23
CH2 MSB
8
RO
0x24
CH3 LSB
8
RO (4)
n/a (2)
8
RO
(4)
n/a
(2)
RO
(4)
8’h73
LMP93601 chip ID
n/a (2)
RO
(4)
8’h00
LMP93601 Revision ID
n/a (2)
0x25
0x7E
0x7F
(4)
CH2 LSB
CH3 MSB
Chip ID
Revision
ID
8
8
RO = Read Only
8.7 Multi Byte Access (Auto Increment) Mode
This interface will support address auto-increment feature. An access cycle may be extended to multiple
registers simply by keeping the CSB asserted beyond the stated 16 clocks of the standard 16-bit protocol. In this
mode, CSB must be asserted during 8*(1+N) clock cycles of SCLK, where N is the number of bytes to write or
read during the access cycle. The auto-incrementing address mode is useful to access a block of registers of
incrementing addresses.
WRITE: Example: if 2 bytes of data are sent by the MCU to the LMP93601, both addresses (n) and (n+1) will be
written at the 16th and 24th rising edges of SCLK respectively. Similarly, if another 8 bits of data is sent, they will
be written in the next address location.
30
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Multi Byte Access (Auto Increment) Mode (continued)
CSB
1
7
8
9
15
16
17
23
24
SCLK
SDI
R/W
7-bit register
address (n)
8 -bit data written
to address (n+1)
8-bit data written
to address (n)
Figure 26. Example Multi Byte Write Access
READ: Example: if a read address is sent from the MCU to the LMP93601, the LMP93601 will first output the
data at location (n). If another 8 SCLKs are sent, the data at location (n+1) will be output. Similarly, the
LMP93601 will continue to send the data at the next address location until CSB is de-asserted.
CSB
1
7
8
9
15
16
17
23
24
SCLK
SDI
R/W
7-bit register
address (n)
8-bit data read
from address (n)
SDO
8-bit data read from
address (n+1)
Figure 27. Example Multi Byte Read Access
NOTE
If a read (or write) is not 8*(1+N) clock cycles, the last byte will not be read or written. For
example if 20 clocks were used, only the 1st data byte is being written, not the 2nd one.
8.8 Multi-Channel Data Read
CH1, CH2 and CH3 results can be read by a single SPI transaction in Little Endian Format:
• Byte Level: Ch1[7:0], Ch1[15:8], Ch2[7:0], Ch2[15:8], Ch3[7:0], Ch3[15:8]…..
• Bit Level: Ch1[7], [6], [5], [4], [3], [2], [1], [0], [15], [14], [13], [12]. [11], [10], [9], [8], Ch2[7]……..
The overhead is a single byte of command which consists of a READ bit and a 7-bit address field.
NOTE
ADC rate is 1326 SPS (max). If all 3 channels are enabled, the conversion rate for each
channel is 1326 SPS/3 = 426SPS.
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
31
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Multi-Channel Data Read (continued)
CSB
1
8
9
16
17
24
25
32
33
40
41
48
49
56
SCLK
SDI
SDO
R + 7-bit Address
Ch1[7 :0]
Ch 1[15: 8]
Ch 2[7:0]
Ch2[15:8]
Ch3[7:0]
Ch 3[15 :8]
Figure 28. Example Multi Channel Read Access
32
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
Micro-electro-mechanical systems (MEMS) thermopile sensor arrays are gaining popularity in building
automation applications for efficient control of heating, ventilation, and air conditioning (HVAC) system in
residential and commercial buildings. The sensors are installed in the building rooms for detecting the presence
and the motion of the occupants in the rooms. Depending on the presence or absence of people in the room, the
HVAC system is turned on or off respectively. In addition, the thermopile sensor are used for detecting flow of air
in the in the duct-work system in the buildings.
A typical MEMS thermopile array sensor consists of a number of thermopile elements arranged in a matrix
configuration. Each element of the array is accessed by selecting the corresponding XY address in the array
using internal or external decoder circuits. An output frame consists of differential signals form X by Y elements.
Each frame is transferred to the analog-front-end via OUTP (positive output) and OUTN (negative output) output
pins of the sensor in serial format. The analog output signal of the MEMS thermopile sensor is in the micro volt
range. It needs to be amplified significantly before made available to the input of an ADC for digitization.
9.2 Typical Applications
3.3V
PGA Over-range
Detect
Vref
IR sensor
X by Y Array
OUTP
OUTN
X-Decoder
X_3
X_0
AGND
VCM
INP1
INN1
Brownout
Detect
AVDD/3
EMIF
EMIF
INP2
EMIF
INN2
EMIF
INP3
EMIF
INN3
EMIF
AGND
Flex Routing MUX
Y_0
Y-Decoder
Y_3
+
PGA
-
LDO, VREF &
Comm. mode
Generator
16-bit û™$'&
û™
FIR
Modulator FLTR
IOVDD
XCAP2
AVDD
XCAP1
VDD
Control Unit
SPI
RSTB
PWDNB
DRDYB
SYNC
CSB
SDO
SDI
SCLK
XCLK
LMP93601
DGND
DVDD
IOGND
GPIO
GPIO
INT
GPIO
External
MPU
CSB
SDI
SDO
SCLK
GPTM
GPIO
GND
Figure 29. LMP93601 Thermopile Array Interface
9.2.1 Design Requirements
The application requires a microcontroller (MCU) such as Texas Instruments MSP430x, or TM4C129x series of
MCUs connected via Synchronous Serial Interface (SPI) to the LMP93601 AFE. As shown in Figure 29, the X
and Y decoder lines of the thermopile sensor (transducer) needs to be interfaced to the GPIO (General Purpose
Input Output) pins of the MCU. The LMP93601 would require an external clock signal of 4 MHz (±3%).The timer
subsystem of the MCU is well suited to generate the clock signal. A timer output pin shall be used to interface
the output of the MCU timer to the XCLK pin of the LMP93601.
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
33
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
Typical Applications (continued)
The device provides a reference voltage output (VCM) source to center the output of the sensor around AVDD/3.
If the sensor does not provide a reference input pin, the INPx, INNx inputs of the LMP93601 should be
connected (pulled-up) to VCM output via 2.2 MΩ resistors.
The data converter of the LMP93601 is an incremental delta-sigma type ADC, the modulator is reset after every
conversion. Therefore, after each thermopile element is sampled and the ADC modulator goes through a reset,
there is no possibility of any trace of signal from the previously sampled element.
To sample each thermopile element in the sensor array, the X and Y decoder signals must be provided over the
GPIO, then firmware should allow settling of the data on the decoder. The SYNC pin is provided to signal the
beginning of conversion to LMP93601 ADC. A GPIO of the MCU needs to be interfaced to the SYNC input pin of
the LMP93601 for this purpose.
9.2.2 Detailed Design Procedure
In thermopile array systems, settling time of the signal path plays an important role when higher frame transfer
rates are desired. A frame is an array of X by Y thermopile elements. While the data from each pixel is being
transferred out of the sensor in a sequence, the MUX output must settle to the proper voltage from the element
in the array that is being accessed. The total analog signal path settling time is determined by combined sensor’s
settling time (tssnsr) and AFE’s settling time (tsafe). The settling time is determined by the sum of capacitances of
the following: pixel in the array, sensor’s MUX, AFE’s MUX, PCB, AFE’s input stage, and sensor’s resistance.
To achieve faster settling time, total capacitance in the signal path should be kept as low as possible. Therefore,
the system designers should take the resistance of the sensor and the related capacitance into consideration to
achieve optimal performance of the signal path. For example, the pixel-to-pixel settling time should be keep
below 70 μs to process five frame per second (1326 SPS) using a 16 x 16 array sensor. A simplified thermopile
array sensor equivalent circuit is shown in Figure 30.
Sensor MUX
RS1
Vs
+
-
Sensor side
CS1
Ccm
Pixel 1
R1
Cm
RSn
OUTP
VCM
R2
Pixel
C1
OUTN
Vs
+
-
CSn
Ccm
Pixel n
Figure 30. Simplified Thermopile Sensor Array
The value of biasing resistors; R1 and R2, should be much higher than the value of the sensor output resistance
RSx (that is, R1 = R2 > 10 * RSx).
34
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
Typical Applications (continued)
The bias current of the sensor and the leakage current of the sensor’s MUX should be considered as well. In
Figure 31 R1 and R2 need to be matched closely to avoid introduction of differential offset error voltage in the
signal path due to mismatched current flow through these resistors. Moreover, Ios through RSx needs to be
calibrated out over temperature. To simplify the circuit in Figure 31 the MUX inside the AFE is not shown.
Figure 31.
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
35
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
10 Power Supply Recommendations
The LMP93601 requires two sources of power, AVDD and IOVDD. These pins can be supplied from the
same supply rail as the MCU, from separate regulators or from a battery source. However, it is recommend
that the MCU and the IOVDD share the same supply and the AVDD be supplied from a separate regulator.
In any case, for proper operation, the supply range must remain within the 2.7 V to 5.5 V limits and IOVDD
must always be lower than or equal to AVDD supply. It is highly recommended that during power up, the
AVDD and IOVDD supplies ramp up in a manner to ensure the "IOVDD ≤ AVDD" requirement is not violated.
11 Layout
11.1 Layout Guidelines
To achieve high noise performance of the LMP93601, particular attention must be paid to the layout of the input
signals, inputs INPx and INNx. To avoid introduction of differential noise into the pins, the input traces must lay
out symmetrically.
Proper power-supply decoupling is required on both AVDD and IOVDD. The Supply pins should be decoupled
with at least a 0.1 μF bypass capacitor each. The bypass capacitors should be placed as close to the powersupply pins as possible with a low impedance connection. For very sensitive systems, or for systems in harsh
noise environments, avoiding the use of vias for connecting the bypass capacitor may offer superior bypass and
noise immunity.
It is recommended that in the layout, analog components [such as ADCs, amplifiers, references, digital-to-analog
converters (DACs), and analog MUXs] be separated from digital components [such as microcontrollers, complex
programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), radio frequency (RF)
transceivers, universal serial bus (USB) transceivers, and switching regulators]. The best placement for each
application is unique to the geometries, components, and PCB fabrication capabilities employed. That is, there is
no single layout that is perfect for every design and careful consideration must always be used when designing
with any analog component.
TI recommends placing 47 Ω resistors in series with all digital input and output pins (CS, SCLK, DIN,
DOUT/DRDY, and DRDY). This resistance smooths sharp transitions, suppresses overshoot, and offers some
overvoltage protection. Care must be taken to still meet all SPI timing requirements because the additional
resistors interact with the bus capacitances present on the digital signal lines.
TI also strongly recommends that digital components, especially RF portions, be kept as far as practically
possible from analog circuitry in a given system. Additionally, one should minimize the distance that digital
control traces run through analog areas and avoid placing these traces near sensitive analog components. Digital
return currents usually flow through a ground path that is as close as possible to the digital path. If a solid ground
connection to a plane is not available, these currents may find paths back to the source that interfere with analog
performance. The implications that layout has on the temperature-sensing functions are much more significant
than for ADC functions.
The internal ADC reference supply of the LMP93601 requires a 1 µF high performance (low ESR & ESL) cap on
the XCAP1. This cap must be placed in the immediate proximity of the pin. For best performance it is
recommended that the DAP be connected to AGND. All three "GND" connections (AGND, DGND, and IOGND)
must be connected to system ground and cannot be left floating.
36
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
11.2 Layout Example
XCAP1
$VHFWLRQRI3&%¶V
GND Plain
XCAP2
AVDD Filter CAP
AGND
DGND
CAP to be placed in close
proximity of XCAP1 pin
Symmetrical input
signal traces
IO GND
AGND
Digital signal Edge
Smoothing Resistor
Grounded DAP
Figure 32. LMP93601 Layout Example
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
37
LMP93601
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
www.ti.com
12 Device and Documentation Support
12.1 Trademarks
All trademarks are the property of their respective owners.
12.2 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.3 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designed devices. This data is subject to change without notice and revision of this
document. For browser-based versions of this data sheet, refer to the left-hand navigation.
38
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: LMP93601
PACKAGE OPTION ADDENDUM
www.ti.com
28-Aug-2014
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
LMP93601NHZR
ACTIVE
WQFN
NHZ
24
4500
Green (RoHS
& no Sb/Br)
CU SN
Level-1-260C-UNLIM
-25 to 85
L93601
LMP93601NHZT
ACTIVE
WQFN
NHZ
24
250
Green (RoHS
& no Sb/Br)
CU SN
Level-1-260C-UNLIM
-25 to 85
L93601
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
28-Aug-2014
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
28-Aug-2014
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
LMP93601NHZR
WQFN
NHZ
24
4500
330.0
12.4
4.3
5.3
1.3
8.0
12.0
Q1
LMP93601NHZT
WQFN
NHZ
24
250
178.0
12.4
4.3
5.3
1.3
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
28-Aug-2014
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
LMP93601NHZR
WQFN
NHZ
24
4500
367.0
367.0
35.0
LMP93601NHZT
WQFN
NHZ
24
250
210.0
185.0
35.0
Pack Materials-Page 2
MECHANICAL DATA
NHZ0024B
SQA24B (Rev A)
www.ti.com
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and
complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale
supplied at the time of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of
non-designated products, TI will not be responsible for any failure to meet ISO/TS16949.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation
www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom
www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2014, Texas Instruments Incorporated