ON NB3F8L3010CMNTWG 3:1:10 lvcmos fanout buffer Datasheet

NB3F8L3010C
3.3V / 2.5V / 1.8V / 1.5V
3:1:10 LVCMOS Fanout Buffer
Description
The NB3F8L3010C is a 3:1:10 Clock / Data fanout buffer operating
on a 3.3 V / 2.5 V Core VDD and two flexible 3.3 V / 2.5 V / 1.8 V /
1.5 V VDDOn supplies which must be equal or less than VDD.
A Mux selects between a Crystal input, or either of two
differential/SE Clock / Data inputs. Differential Inputs accept
LVPECL, LVDS, HCSL, or SSTL and Single−Ended levels. The
MUX control lines, SEL0 and SEL1, select CLK0/CLK0,
CLK1/CLK1, or Crystal input pins per Table 3. The Crystal input is
disabled when a Clock input is selected. Output enable pin, OE,
synchronously forces a High Impedance state (HZ) when Low per
Table 4.
Outputs consist of 10 single−ended LVCMOS outputs.
Features
•
•
•
•
•
•
•
•
•
•
•
•
Ten CMOS / LVTTL Outputs up to 200 MHz
Differential Inputs Accept LVPECL, LVDS, HCSL, or SSTL
Crystal Oscillator Interface
Crystal Input Frequency Range: 10 MHz to 50 MHz
Output Skew: 10 ps Typical
Additive RMS Phase Jitter @ 125 MHz, (12 kHz – 20 MHz): 0.03 ps
(Typical)
Synchronous Output Enable
Output Defined Level When Input is Floating
Power Supply Modes:
♦ Single 3.3 V
♦ Single 2.5 V
♦ Mixed 3.3 V ± 5% Core/2.5 V ± 5% Output Operating Supply
♦ Mixed 3.3 V ± 5% Core/1.8 V ± 0.2 V Output Operating Supply
♦ Mixed 3.3 V ± 5% Core/1.5 V ± 0.15 V Output Operating Supply
♦ Mixed 2.5 V ± 5% Core/ 1.8 V ± 0.2 V Output Operating Supply
♦ Mixed 2.5 V ± 5% Core /1.5 V ± 0.15 V Output Operating Supply
Two Separate Output Bank Power Supplies
Industrial temp. range -40°C to 85°C
These are Pb−Free Devices
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MARKING
DIAGRAM
1
1
32
QFN32
G SUFFIX
CASE 488AM
A
WL
YY
WW
G
NB3F8L
3010C
AWLYYWWG
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
ORDERING INFORMATION
See detailed ordering and shipping information page 12 of this
data sheet.
Applications
•
•
•
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Clock Distribution
Networking and Communications
High End Computing
Wireless and Wired Infrastructure
End Products
•
•
•
•
Servers
Ethernet Switch/Routers
ATE
Test and Measurement
© Semiconductor Components Industries, LLC, 2015
September, 2015 − Rev. 6
1
Publication Order Number:
NB3F8L3010C/D
NB3F8L3010C
BANK A
VDD
Q0
VDDOA
VDDOB
GND
Q1
SEL0
Q2
SEL1
Q3
CLK0
CLK0
Q4
CLK1
CLK1
BANK B
XTAL_IN
OSC
XTAL_OUT
Q5
Q6
Q7
Q8
Q9
SYNC
OE
GND
OE
SEL0
SEL1
CLK1
CLK1
GND
GND
32
31
30
29
28
27
26
25
Figure 1. Simplified Logic Diagram
Exposed Pad (EP)
Q0
1
24
Q9
VDDOA
2
23
VDDOB
Q1
3
22
Q8
GND
4
21
GND
NB3F8L3010C
Q3
7
18
Q6
Q4
8
17
Q5
CLK0
XTAL_IN
GND
GND 16
VDDOB
GND 15
19
14
6
CLK0 13
VDDOA
XTAL_OUT 12
Q7
11
20
VDD 10
5
9
Q2
Figure 2. Pinout Configuration (Top View)
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NB3F8L3010C
Table 1. PIN DESCRIPTION
Input
Default
Number
Name
Type
Description
1, 3, 5, 7,
8
Q0, Q1, Q2,
Q3, Q4
LVCMOS
Outputs − Bank A
17, 18,
20, 22, 24
Q5, Q6, Q7,
Q8, Q9
LVCMOS
Outputs − Bank B
2, 6
VDDOA
Power
Positive Supply Pins for Bank A Outputs Q0 − Q4
19, 23
VDDOB
Power
Positive Supply Pins for Bank B Outputs Q5 − Q9
4, 9, 15,
16, 21,
25, 26, 32
GND
GND
Ground Supply
10
VDD
Power
VDD Positive Supply pin for Core and Inputs.
11
XTAL_IN
XTAL OSC / CLK Input
12
XTAL_OUT
XTAL OSC Output
13
CLK0
Diff / SE Input
Pulldown
Non-inverting clock/data input 0.
14
CLK0
Diff / SE Input
Pullup /
Pulldown
Inverting differential clock input 0.
27
CLK1
Diff / SE Input
Pullup /
Pulldown
Inverting differential clock input 1
28
CLK1
Diff / SE Input
Pulldown
Non-inverting clock/data input 1
29
SEL1
LVCMOS / LVTTL
Input
Pulldown
Input clock select. See Table 3 for function. Input Pulldown
30
SEL0
LVCMOS / LVTTL
Input
Pulldown
Input clock select. See Table 3 for function. Input Pulldown
31
OE
LVCMOS / LVTTL
Input
Pulldown
Output Enable Control. See Table 4 for function.
−
EP
−
Crystal Oscillator Interface or External Clock Source at
LVCMOS Levels
Crystal Oscillator Interface
The Exposed Pad (EP) on the QFN−32 package bottom is
thermally connected to the die for improved heat transfer out
of package. The exposed pad must be attached to a heat−
sinking conduit. The pad is electrically connected to the die,
and must be electrically connected to GND.
1. All VDD, VDDOn and GND pins must be externally connected to a power supply to guarantee proper operation. Bypass each VDD and VDDOn
with 0.01 mF CAP to GND.
Table 2. PIN CHARACTERISTICS
Symbol
CIN
R
Parameter
Min
Typ
Max
Unit
Input Capacitance
4
pF
Input Pulldown Resistor; Input Pulldown Resistor
50
kW
CPD
Power Dissipation Capacitance (per output)
VDDO = 3.3 V
VDDO = 2.5 V
VDDO = 1.8 V
VDDO = 1.5 V
pF
ROUT
Output Impedance
VDDO = 3.3 V
VDDO = 2.5 V
VDDO = 1.8 V
VDDO = 1.5 V
W
20
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NB3F8L3010C
FUNCTION TABLES
Table 3. CLOCK ENABLE (SELx) FUNCTION TABLE
Table 5. DIFF IN/OUT TABLE (Diff or S.E.)
SEL[1:0] Input
Selected Input Clock
Input Condition
Output
00
CLK0/CLK0
CLK0/1; CLK0/1 = OPEN
Logic LOW
01
CLK1/CLK1
CLK0/1; CLK0/1 = GND
Undefined
10
Crystal Osc Input
CLK0/1 = HIGH; CLK0/1 = LOW
Logic HIGH
11
Crystal Osc Input
CLK0/1 = LOW; CLK0/1 = HIGH
Logic LOW
Table 4. CLOCK OUTPUT ENABLE (OE) FUNCTION
TABLE
OE Input
Q[9:0] Output
0
High Impedance
1
Outputs Enabled
Table 6. CRYSTAL CHARACTERISTICS
Parameter
Min
Mode of Oscillation
Typ
Max
Unit
Fundamental
Frequency
50
MHz
Equivalent Series Resistance (ESR)
10
50
W
Shunt Capacitance
7
pF
100
mW
Drive Power
Table 7. ATTRIBUTES
Characteristic
ESD Protection
Value
Human Body Model
Machine Model
Moisture Sensitivity (Note 2)
Flammability Rating
>2 kV
200 V
QFN32
Oxygen Index: 28 to 34
Level 3
UL 94 V−0 @ 0.125 in
Transistor Count
474 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
2. For additional information, see Application Note AND8003/D.
Table 8. MAXIMUM RATINGS (Note 3)
Symbol
Parameter
VDD,
VDDOn
Positive Power Supply
VI
Input Voltage
XTAL_IN
Diff, SELx, OE Inputs
VO
Output Voltage
Condition
Rating
Unit
GND = 0 V
4.6
V
0 v VI v VDD
–0.5 v VI v VDD + 0.5
V
– 0.5 v VO v VDDOn + 0.5
V
TA
Operating Temperature Range, Industrial
−40 to +85
_C
Tstg
Storage Temperature Range
−65 to +150
_C
θJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
31
27
_C/W
θJC
Thermal Resistance (Junction−to−Case)
(Note 3)
12
_C/W
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power).
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NB3F8L3010C
Table 9. POWER SUPPLY DC CHARACTERISTICS VDD = 3.3 V ± 5% (3.135 V to 3.465 V) or VDD = 2.5 V ±5% (2.375 V to
2.625 V) and VDDOn = 3.3 V ± 5% (3.135 V to 3.465 V) or 2.5 V ± 5% (2.375 V to 2.625 V) or 1.8 V ± 0.2 V (1.6 V to 2.0 V) or 1.5 V ±
0.15 V (1.35 V to 1.65 V); TA = −40°C to 85°C
Parameter
Symbol
IDD
IDDO
Test Conditions
VDD Power Supply
Current
OE = 0, no load
3.3 V ± 5%; VDDOn = 3.3 V ± 5% or 2.5 V ± 5% or
1.8 V ± 0.2 V or 1.5 V ± 0.15 V
2.5 V ± 5%; VDDOn = 2.5 V ± 5% or 1.8 V ± 0.2 V
or 1.5 V ± 0.15 V
VDDO Power Supply
Current
OE = 0, no load
3.3 V ± 5%; VDDOn = 3.3 V ± 5% or 2.5 V ± 5% or
1.8 V ± 0.2 V or 1.5 V ± 0.15 V
2.5 V ± 5%; VDDOn = 2.5 V ± 5% or 1.8 V ± 0.2 V
or 1.5 V ± 0.15 V
Min
Typ
Max
Unit
30
50
mA
5
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
Table 10. DC CHARACTERISTICS TA = −40°C to 85°C
Symbol
Parameter
Test Conditions
Min
VIH
LVCMOS / LVTTL Input High Voltage
(OE, SELx)
VDD = 3.3 V ±5%
VDD = 2.5 V ± 5%
VIL
LVCMOS / LVTTL Input Low Voltage
(OE, SELx)
VDD = 3.3 V ±5%
VDD = 2.5 V ± 5%
IIH
Input High Current
Max
Unit
2
1.7
VDD + 0.3
VDD + 0.3
V
−0.3
−0.3
0.8
0.7
V
mA
OE, SELx,
CLKx/CLKx
IIL
Typ
VDD = VIN = 3.465 V
VDD = VIN = 3.465 V or 2.625 V
150
150
mA
Input Low Current
OE, SELx
CLKx
CLKx
VOH
VOL
VDD = 3.465 V; VIN = 0.0 V
VDD = 3.465 V or 2.625 V VIN = 0.0 V
VDD = 3.465 V or 2.625 V VIN = 0.0 V
−5
−5
−150
VDDOn = 3.3 V ± 5%
2.6
VDDOn = 2.5 V ± 5%
1.8
VDDOn = 1.8 V ± 0.2 V
1.2
VDDOn = 1.5 V ± 0.15 V
0.9
Output High Voltage (Note 4)
Output Low Voltage (Note 4)
V
VDDOn = 3.3 V ± 5% or 2.5 V ± 5%
0.5
VDDOn = 1.8 V ± 0.2 V
0.4
VDDOn = 1.5 V ± 0.15 V
0.37
V
VPP
Peak−to−Peak Input Voltage
VIL > −0.3 V
CLKx/CLKx
VDD = 3.3 V ±5% or VDD = 2.5 V ± 5%
0.15
1.3
V
VIHCMR
Input High Level Common Mode
Range
VCM = VIH; VIL > −0.3 V CLKx/CLKx
VDD = 3.3 V ±5% or VDD = 2.5 V ± 5%
0.5
VDD − 0.85
V
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
4. Outputs terminated with 50 W to VDDOn/2. See Parameter Measurement Information..
Table 11. AC CHARACTERISTICS VDD = 3.3 V ± 5% (3.135 V to 3.465 V) or VDD = 2.5 V ±5% (2.375 V to 2.625 V) and
VDDOn = 3.3 V ± 5% (3.135 V to 3.465 V) or 2.5 V ± 5% (2.375 V to 2.625 V) or 1.8 V ± 0.2 V (1.6 V to 2.0 V) or 1.5 V ± 0.15 V (1.35 V
to 1.65 V); TA = −40°C to 85°C
Symbol
fMAX
Parameter
Output Frequency
Test Conditions
Min
Typ
Max
Unit
Using External
Crystal
10
50
MHz
Using External
Clock Source
(Note 5)
DC
200
MHz
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NB3F8L3010C
Table 11. AC CHARACTERISTICS VDD = 3.3 V ± 5% (3.135 V to 3.465 V) or VDD = 2.5 V ±5% (2.375 V to 2.625 V) and
VDDOn = 3.3 V ± 5% (3.135 V to 3.465 V) or 2.5 V ± 5% (2.375 V to 2.625 V) or 1.8 V ± 0.2 V (1.6 V to 2.0 V) or 1.5 V ± 0.15 V (1.35 V
to 1.65 V); TA = −40°C to 85°C
Symbol
Parameter
tsk(o)
Output Skew (Notes 6 and 7)
tJITTERF
Additive RMS
Phase Jitter
(Integrated
12 kHz *
20 MHz)
(Note 8)
Test Conditions
Input clock from
CLK0/CLK0 or
CLK1/CLK1
Max
Unit
10
55
ps
VDDOn = 3.3 V ± 5%
0.03
VDDOn = 2.5 V ± 5%
0.03
0.03
VDDOn = 1.5 V ± 0.15 V
0.03
VDDOn = 3.3 V ± 5%
0.03
VDDOn = 2.5 V ± 5%
0.03
VDDOn = 1.8 V ± 0.2 V
0.03
VDDOn = 1.5 V ± 0.15 V
0.03
VDDOn = 3.3 V ± 5%
0.03
VDDOn = 2.5 V ± 5%
0.03
VDDOn = 1.8 V ± 0.2 V
0.03
VDDOn = 1.5 V ± 0.15 V
0.03
Input clock from
crystal
odc
Typ
VDDOn = 1.8 V ± 0.2 V
External clock
over drives
crystal interface
tR / tF
Min
Output Rise/Fall Time (20% and 80%)
ps
VDDOn = 3.3 V ± 5%
150
350
500
VDDOn = 2.5 V ± 5%
150
350
500
VDDOn = 1.8 V ± 0.2 V
150
350
600
VDDOn = 1.5 V ± 0.15 V
150
350
600
VDDOn = 3.3 V ± 5%
45
55
VDDOn = 2.5 V ± 5%
40
60
VDDOn = 1.8 V ± 0.2 V
40
60
VDDOn = 1.5 V ± 0.15 V
40
60
Output Duty Cycle
ps
%
tEN
Output Enable
Time (Note 9)
OE
4
cycles
tDIS
Output Disable
Time (Note 9)
OE
4
cycles
MUX_ISOLATION
MUX_ISOLATION
155.52 MHz
55
dB
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
5. XTAL_IN can be overdriven relative to a signal a crystal would provide.
6. Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDOn/2.
7. This parameter is defined in accordance with JEDEC Standard 65.
8. See phase noise plot.
9. These parameters are guaranteed by characterization. Not tested in production. See Parameter Measurement Information
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NB3F8L3010C
PARAMETER MEASUREMENT INFORMATION
VDD = +1.65 V ±5%
VDD = +1.25 V ±5%
VDDOn = VDD = +1.65 V ±5%
VDDOn = VDD = +1.25 V ±5%
SCOPE
Qx
SCOPE
Qx
Z = 50 W
LVCMOS
Z = 50 W
LVCMOS
50 W
50 W
GND = +1.65 V ±5%
GND = +1.25 V ±5%
3.3 V Core / 3.3 V Output Load AC Test Circuit
2.5 V Core / 2.5 V Output Load AC Test Circuit
(Terminating to VDDOn/2)
(Terminating to VDDOn/2)
VDD = +2.05 V ±5%
VDD = +2.4 V ±5%
VDDOn = +1.25 V ±5%
VDDOn = +0.9 V ±0.1 V
SCOPE
Qx
SCOPE
Qx
Z = 50 W
LVCMOS
Z = 50 W
LVCMOS
50 W
50 W
GND = +1.25 V ±5%
GND = +0.9 V ±0.1 V
3.3 V Core / 2.5 V Output Load AC Test Circuit
3.3 V Core / 1.8 V Output Load AC Test Circuit
(Terminating to VDDOn/2)
(Terminating to VDDOn/2)
VDD = +2.55 V ±5%
VDD = +1.6 V ±5%
VDDOn = +0.75 V ±0.15 V
VDDOn = +0.9 V ±0.1 V
SCOPE
Qx
SCOPE
Qx
Z = 50 W
LVCMOS
Z = 50 W
LVCMOS
50 W
50 W
GND = +0.75 V ±0.15 V
GND = +0.9 V ±0.1 V
3.3 V Core / 1.5 V Output Load AC Test Circuit
2.5 V Core / 1.8 V Output Load AC Test Circuit
(Terminating to VDDOn/2)
(Terminating to VDDOn/2)
VDD = +1.75 V ±5%
VDDOn = +0.75 V ±0.15 V
SCOPE
Qx
Z = 50 W
LVCMOS
50 W
GND = +0.75 V ±0.5 V
2.5 V Core / 1.5 V Output Load AC Test Circuit
(Terminating to VDDOn/2)
Figure 3. Operational Supply and Termination Test Conditions
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NB3F8L3010C
PARAMETER MEASUREMENT INFORMATION
VDDOn/2
VDD
Qx
CLK
Xpoint
VPP
VCMR
VDDOn/2
CLK
Qv
GND
tsk(0)
Differential Input Level
Within Device Output Skew
VDD
VDD/2
OE
tEN tDIS
tPW
Qx
VOH
tPeriod
VDDOn/2
VOL
VDDOn/2
Qx
VDDOn/2
0V
odc = (tPW / tPeriod) x 100%
Output Enable /Disable
(OE HIGH = Enabled)
Output Duty Cycle / Pulse Width / Period
80%
Qx
80%
20%
tR
Amplitud e (dB)
Spectrum of Output Signal Qx
20%
tF
A0
MUX_ISOL = A0 - A1
MUX selects
static input
A1
Output Rise/Fall Time
MUX selects
active inpu t clock
signal
fc
(Fundamental)
Frequ ency (Hz)
MUX Isolation
Figure 4. Operational Waveforms and MUX Input Isolation Plot
APPLICATION INFORMATION
Recommendations for Unused LVCMOS Output Pins
LVCMOS Control Pins
Inputs:
All control pins have internal pulldowns; additional
resistance is not required but can be added for additional
protection. A 1 kW resistor can be used.
CLK/CLK Inputs
For applications not requiring the use of the differential
input, both CLK and CLK can be left floating. Though not
required, but for additional protection, a 1 kW resistor can be
tied from CLK to ground.
Power Supplies
VDD is the power supply for the core and input circuitry.
VDDOA and VDDOB are two separate positive power
supplies for two banks of outputs:
VDDOA pins 2 and 6 are connected internally for outputs
Q0 − Q4.
VDDOB pins 19 and 23 are connected internally for outputs
Q5 − Q9.
Crystal Inputs
For applications not requiring the use of the crystal
oscillator input, both XTAL_IN and XTAL_OUT can be left
floating. Though not required, but for additional protection,
a 1 kW resistor can be tied from XTAL_IN to ground.
LVCMOS Outputs
A 33 W series terminating resistor may be used on each
clock output if the trace is longer than 1 inch.
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NB3F8L3010C
Differential Input with Single−Ended Interconnect
amplitude in half. Termination may be done by using Rs or
by using R1 and R2. First, Rs = 0 and then R3 and R4 in
parallel should equal the transmission line impedance. For
most 50 W applications, R1 and R2 can be 100 W. The
differential input can handle full rail LVCMOS signaling,
but it is recommended that the amplitude be reduced. The
datasheet specifies a differential amplitude which needs to
be doubled for a single ended equivalent stimulus. VILmin
cannot be less than −0.3 V and VIHmax cannot be more than
VDD + 0.3 V. The datasheet specifications are characterized
and guaranteed by using a differential signal.
Refer to Figure 5 to interconnect a single−ended to a
Differential Pair of inputs. The reference bias voltage VREF
= VDD/2 is generated by the resistor divider of R3 and R4.
Bypass capacitor (C1) can filter noise on the DC bias. This
bias circuit should be located as close to the input pin as
possible. Adjust R1 and R2 to common mode voltage of the
signal input swing to preserve duty cycle.
This configuration requires that the sum of the output
impedance of the driver (Ro) and the series resistance (Rs)
equals the transmission line impedance. In addition,
matched termination by R1 and R2 will attenuate the signal
VDD
Single
Ended RO
Driver
VDD
Rs
R1
100 W
VDD
R3
1 kW
Zo = 50 W
CLKx
Differential In
Z0 = RO + Rs
R2
100 W
GND = 0.0
R4
1 kW
GND = 0.0
CLKx
C1
0.1 mF
GND = 0.0
Figure 5. Differential Input with Single−ended Interconnect
Crystal Input Interface
CLOCK Overdriving the XTAL Interface
The device has been characterized with 18 pF parallel
resonant crystals. The capacitor values, C1 and C2, shown
in Figure 6 below as 15 pF were determined using an 18 pF
parallel resonant crystal and were chosen to minimize the
ppm error. The optimum C1 and C2 values can be slightly
adjusted for different board layouts.
The XTAL_IN input can accept a single−ended LVCMOS
signal through an AC coupling capacitor. A general
LVCMOS interface diagram is shown in Figure 7 and a
general LVPECL interface in Figure 8. The XTAL_OUT
pin must be left floating. The maximum amplitude of the
input signal should not exceed 2 V and the input edge rate
can be as slow as 10 ns. This configuration requires that the
output impedance of the driver (Ro) plus the series
resistance (Rs) equals the transmission line impedance. In
addition, matched termination at the crystal input will
attenuate the signal in half. This can be done in one of two
ways. First, R1 and R2 in parallel should equal the
transmission line impedance. For most 50 W applications,
R1 and R2 can be 100 W. This can also be accomplished by
removing R1 and making R2 50 W. By overdriving the
crystal oscillator, the device will be functional, but note, the
device performance is guaranteed by using a quartz crystal.
Figure 6. Crystal Input Interface
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NB3F8L3010C
VDD
LVMOS
VDD
R1
100 W
Rs
C1
0.1 mF
Zo = 50 W
RO
XTAL_IN
Z0 = RO + Rs
R2
100 W
GND = 0.0 V
XTAL_OUT
GND = 0.0 V
Figure 7. General Diagram for LVCMOS Driver to XTAL Input Interface Use Rs or R1 / R2
VDD
C1
0.1 mF
Zo = 50 W
XTAL_IN
LVPECL
Zo = 50 W
XTAL_OUT
50 W
50 W
GND = 0.0 V
VTT = VDD − 2.0 V
Figure 8. General Diagram for LVPECL Driver to XTAL Input Interface
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NB3F8L3010C
Differential Clock Input Interface
input interfaces suggested here are examples only. If the
driver is from another vendor, use their termination
recommendation. Please consult with the vendor of the
driver component to confirm the driver termination
requirements.
The CLK / CLK accept LVDS, LVPECL, SSTL, HCSL
differential signals. Signals must meet the VPP and VCMR
input requirements. Figures 9 to 13 show interface
examples for the CLK / CLK input with built−in 50 W
terminations driven by the most common driver types. The
VDD = +3.3 V
VDD = +3.3 V
VDD = +3.3 V
125 W
Qx
125 W
CLKx
Zo = 50 W
LVPECL
CLKx
Zo = 50 W
Qx
VDD = +3.3 V
84 W
VDD = +3.3 V
CLKx
Qx
Zo = 50 W
LVPECL
Differential
In
Qx
84 W
GND = 0.0 V
GND = 0.0 V
CLKx
Zo = 50 W
50 W
GND = 0.0 V
Differential
In
50 W
GND = 0.0 V
50 W
GND = 0.0 V
GND = 0.0 V
Figure 9. CLK / CLK Input Driven by 3.3 V LVPECL
Driver (Thevenin Parallel Termination)
VDD = +3.3 V
Qx 33 W (Opt)
VDD = +3.3 V
VDD = +3.3 V
CLKx
Zo = 50 W
50 W
CLKx
Zo = 50 W
100 W
LVDS
Differential
In
Zo = 50 W
CLKx
Differential
In
Qx
50 W
GND = 0.0 V
VDD = +3.3 V
Qx
CLKx
Zo = 50 W
HCSL
Qx 33 W (Opt)
Figure 10. CLK / CLK Input Driven by 3.3 V
LVPECL Driver (“Y” Parallel Termination)
GND = 0.0 V
GND = 0.0 V
GND = 0.0 V
GND = 0.0 V
Figure 11. CLK / CLK Input Driven by a 3.3 V
HCSL Driver
Figure 12. CLK / CLK Input Driven by 3.3 V
LVDS Driver
VDD = +2.5 V
VDD = +3.3 V
VDD = +2.5 V
120 W
Qx
120 W
CLKx
Zo = 50 W
SSTL
CLKx
Zo = 50 W
Qx
Differential
In
120 W
120 W
GND = 0.0 V
GND = 0.0 V
GND = 0.0 V
Figure 13. CLK / CLK Input Driven by 2.5 V SSTL Driver
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11
NB3F8L3010C
VFQFN EPAD Thermal Release Path
to ground through these vias. The vias act as “heat pipes”.
The number of vias (i.e. “heat pipes”) is application specific
and dependent upon the package power dissipation as well
as electrical conductivity requirements. Thus, thermal and
electrical analysis and/or testing are recommended to
determine the minimum number needed. Maximum thermal
and electrical performance is achieved when an array of vias
is incorporated in the land pattern. It is recommended to use
as many vias connected to ground as possible. It is also
recommended that the via diameter should be 12 to 13 mils
(0.30 to 0.33 mm) with 1 oz copper via barrel plating. This
is desirable to avoid any solder wicking inside the via during
the soldering process which may result in voids in solder
between the exposed pad/slug and the thermal land.
Precautions should be taken to eliminate any solder voids
between the exposed heat slug and the land pattern. Note:
These recommendations are to be used as a guideline only.
In order to maximize both the removal of heat from the
package and the electrical performance, a land pattern must
be incorporated on the Printed Circuit Board (PCB) within
the footprint of the package corresponding to the exposed
metal pad or exposed heat slug on the package, as shown in
Figure 14. The solderable area on the PCB, as defined by the
solder mask, should be at least the same size/shape as the
exposed pad/slug area on the package to maximize the
thermal/electrical performance. Sufficient clearance should
be designed on the PCB between the outer edges of the land
pattern and the inner edges of pad pattern for the leads to
avoid any shorts. While the land pattern on the PCB provides
a means of heat transfer and electrical grounding from the
package to the board through a solder joint, thermal vias are
necessary to effectively conduct from the surface of the PCB
to the ground plane(s). The land pattern must be connected
Figure 14. Suggested Assembly for Exposed Pad Thermal Release Path – Cut−away View (not to scale)
ORDERING INFORMATION
Package
Shipping†
NB3F8L3010CMNG
QFN32
(Pb−Free)
74 Units / Rail
NB3F8L3010CMNR4G
QFN32
(Pb−Free)
1000 / Tape & Reel
NB3F8L3010CMNTWG
QFN32
(Pb−Free)
1000 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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12
NB3F8L3010C
PACKAGE DIMENSIONS
QFN32 5x5, 0.5P
CASE 488AM
ISSUE A
A
D
PIN ONE
LOCATION
ÉÉ
ÉÉ
L
L
B
L1
DETAIL A
ALTERNATE TERMINAL
CONSTRUCTIONS
E
0.15 C
0.15 C
A
DETAIL B
0.10 C
ÉÉÉ
ÉÉÉ
ÇÇÇ
EXPOSED Cu
TOP VIEW
(A3)
A1
MOLD CMPD
DETAIL B
ALTERNATE
CONSTRUCTION
0.08 C
SEATING
PLANE
C
SIDE VIEW
NOTE 4
K
D2
MILLIMETERS
MIN
MAX
1.00
0.80
−−−
0.05
0.20 REF
0.18
0.30
5.00 BSC
2.95
3.25
5.00 BSC
2.95
3.25
0.50 BSC
0.20
−−−
0.30
0.50
−−−
0.15
5.30
3.35
17
8
32X
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
L1
RECOMMENDED
SOLDERING FOOTPRINT*
DETAIL A
9
NOTES:
1. DIMENSIONS AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.30MM FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
32X
0.63
L
E2
1
32
3.35 5.30
25
e
e/2
32X
b
0.10
M
C A B
0.05
M
C
BOTTOM VIEW
NOTE 3
0.50
PITCH
32X
0.30
DIMENSION: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and the
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries.
SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed
at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation
or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets
and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each
customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended,
or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which
the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or
unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim
alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable
copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
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Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
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USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5817−1050
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13
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NB3F8L3010C/D