TI1 LM98722CCMTX 3 channel, 16-bit, 45 msps analog front end with lvds/cmos output integrated ccd/cis sensor timing generator and spread spectrum clock generation Datasheet

LM98722
www.ti.com
SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
LM98722 3 Channel, 16-Bit, 45 MSPS Analog Front End with LVDS/CMOS Output,
Integrated CCD/CIS Sensor Timing Generator and Spread Spectrum Clock Generation
Check for Samples: LM98722
FEATURES
APPLICATIONS
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2
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LVDS/CMOS Outputs
LVDS/CMOS/Crystal Clock Source with PLL
Multiplication
Integrated Flexible Spread Spectrum Clock
Generation
CDS or S/H Processing for CCD or CIS
sensors
Independent Gain/Offset Correction for Each
Channel
Automatic per-Channel Gain and Offset
Calibration
Programmable Input Clamp Voltage
Flexible CCD/CIS Sensor Timing Generator
KEY SPECIFICATIONS
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Maximum Input Level:
– 1.2 or 2.4 Volt Modes
– (both with + or - polarity option)
ADC Resolution: 16-Bit
ADC Sampling Rate: 45 MSPS
INL: +18/-25 LSB (typ)
Channel Sampling Rate: 22.5/22.5/15 MSPS
PGA Gain Steps: 256 Steps
PGA Gain Range: 0.64 to 8.3x
Analog DAC Resolution: +/-9 Bits
Analog DAC Range: +/-307mV or +/-614mV
Digital DAC Resolution: +/-6 Bits
Digital DAC Range: -2048 LSB to + 2016 LSB
SNR: -74dB (@0dB PGA Gain)
Power Dissipation: 630mW (LVDS)
Operating Temp: 0 to 70°C
Supply Voltage: 3.3V Nominal (3.0V to 3.6V
range)
Multi-Function Peripherals
High-speed Currency/Check Scanners
Flatbed or Handheld Color Scanners
High-speed Document Scanners
DESCRIPTION
The LM98722 is a fully integrated, high performance
16-Bit, 45 MSPS signal processing solution for digital
color copiers, scanners, and other image processing
applications. High-speed signal throughput is
achieved with an innovative architecture utilizing
Correlated Double Sampling (CDS), typically
employed with CCD arrays, or Sample and Hold
(S/H) inputs (for higher speed CCD or CMOS image
sensors). The signal paths utilize 8 bit Programmable
Gain Amplifiers (PGA), a +/-9-Bit offset correction
DAC and independently controlled Digital Black Level
correction loops for each input. The PGA and offset
DAC are programmed independently allowing unique
values of gain and offset for each of the three analog
inputs. The signals are then routed to a 45MHz high
performance analog-to-digital converter (ADC). The
fully
differential
processing
channel
shows
exceptional noise immunity, having a very low noise
floor of -74dB. The 16-bit ADC has excellent dynamic
performance making the LM98722 transparent in the
image reproduction chain.
A very flexible integrated Spread Spectrum Clock
Generation (SSCG) modulator is included to assist
with EM compliance and reduce system costs.
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2013, Texas Instruments Incorporated
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Reference
Generator
PGA
Digital
Offset
16 Bit ADC
Blue Ch
Black Level
White Level
Correction
CCD Timing Generator
16
Green Ch
Black Level
White Level
Correction
CLKOUT/
VC
SH2
Data Out
Config
(CMOS/LVDS)
INCLK-
INCLK+
DOUT0/
TXOUT0-
DOUT1/
TXOUT0+
DOUT2/
TXOUT1-
DOUT3/
TXOUT1+
DOUT4/
TXOUT2-
DOUT5/
TXOUT2+
DOUT6/
TXCLK-
DOUT7/
TXCLK+
CLK
VCLP
Reference
DAC
CDS
or
Sample/Hold
Amplifier
COLOR3PGA[7:0]
3:1
MUX
Red Ch
Black Level
White Level
Correction
CE
SCLK
SDO
SDI
SEN
SSCG
VCLP Reference
Configuration
Input Bias/
Clamping
Black
Level
Offset
DAC
PGA
COLOR2PGA[7:0]
Serial
Interface
Data Output
COLOR3ODDDAC[9:0]
M
U
X
CDS
or
Sample/Hold
Amplifier
Black
Level
Offset
DAC
Config
Registers
RESET
CCD Timing
Generator
COLOR3EVENDAC[9:0]
Input Bias/
Clamping
COLOR2ODDDAC[9:0]
M
U
X
PGA
COLOR1PGA[7:0]
CAL
Sensor Drivers
COLOR2EVENDAC[9:0]
Input Bias/
Clamping
Black
Level
Offset
DAC
VD DGND DVB
LM98722
OSB
OSG
OSR
M
U
X
CDS
or
Sample/Hold
Amplifier
COLOR1ODDDAC[9:0]
COLOR1EVENDAC[9:0]
VA AGND
LM98722
SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
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System Block Diagram
CCD/CIS Sensor
Analog Front End
SPI
Image Processor/
ASIC
Motor
Controllers
LM98722 Overall Chip Block Diagram
SH5
SH4
SH3
SH1
RS
CP
PHIC2
PHIC1
PHIB2
PHIB1
PHIA2
PHIA1
SH_R
VREFT
VREFB
VCLP
Figure 1. Chip Block Diagram
Copyright © 2009–2013, Texas Instruments Incorporated
LM98722
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SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
LM98722 Pin Out Diagram
PHIC2
1
56
SH5
PHIC1
2
55
SH4
SH1
3
54
PHIB2
CE
4
53
PHIB1
CAL
5
52
VC
RESET
6
51
DGND
SH_R
7
50
PHIA2
SDI
8
49
PHIA1
SDO
9
48
CP
SCLK
10
47
RS
SEN
11
46
SH3
VA
12
45
CLKOUT/SH2
AGND
13
44
VC
VA
14
43
VD
VREFB
15
42
DGND
VREFT
16
41
DOUT0/TXOUT0-
VA
17
40
DOUT1/TXOUT0+
AGND
18
39
DOUT2/TXOUT1-
VCLP
19
38
DOUT3/TXOUT1+
VA
20
37
DOUT4/TXOUT2-
IBIAS
21
36
DOUT5/TXOUT2+
AGND
22
35
DOUT6/TXCLK-
OSR
23
34
DOUT7/TXCLK+
AGND
24
33
INCLK-
OSG
25
32
INCLK+
AGND
26
31
DVB
OSB
27
30
CPOFILT1
CPOFILT2
28
29
DGND
56 Pin TSSOP
(not to scale)
Figure 2. TSSOP Package
See Package Number DGG0056A
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Typical Application Diagram
Serial Interface and Device Control Bus
CCD Timing Generator Output Bus
PHIC2
SH5
PHIC1
SH4
SH1
PHIB2
CE
PHIB1
CAL
CCD Clock Drivers
DGND
SH_R
PHIA2
SDI
PHIA1
SDO
VA
0.1 PF
0.1 PF
0.1 PF
RS
SEN
SH3
CLKOUT/SH2
AGND
VC
VA
VD
VREFB
0.1 PF
0.1 PF
0.1 PF
AGND
CCD Sensor
&
Output Signal
Buffers
0.1 PF
DGND
CP
SCLK
VA
0.1 PF
VC
VC
RESET
VC
0.1 PF
VD
0.1 PF
DGND
DGND
VREFT
D0/TXOUT0-
VA
D1/TXOUT0+
AGND
D2/TXOUT1-
VCLP
D3/TXOUT1+
VA
D4/TXOUT2-
IBIAS
D5/TXOUT2+
AGND
D6/TXCLK-
OSR
D7/TXCLK+
AGND
INCLK-
OSG
INCLK+
AGND
LVDS Deserializer
(DS90CR218A or
equiv.)
*
100:
DVB
OSB
CPOFILT1
CPOFILT2
0.1 PF
DGND
DGND
AGND
DGND
ASIC and Clock Gen
0.1 PF
3.3V
3.3V
VA
+
4.7 PF
AGND
VD VC
+
4.7 PF
* 100: used for LVDS INCLK only.
If using CMOS INCLK, 100: is removed and INCLK- connected to DGND.
DGND
Figure 3. Typical Application Diagram
4
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Pin Descriptions (1)
Pin
Name
I/O
Typ
Res
Description
1
PHIC2
O
D
PU
Configurable high speed sensor timing output.
2
PHIC1
O
D
PD
Configurable high speed sensor timing output.
3
SH1
O
D
PU
Configurable low speed sensor timing output.
4
CE
I
D
Chip Serial Interface Address Setting Input
CE Level
Address
VD
01
Float
10
DGND
00
5
CAL
I
D
PD
Initiate calibration sequence. Leave unconnected or tie to DGND if unused.
6
RESET
I
D
PU
Active-low master reset. NC when function not being used.
7
SH_R
I
D
PD
External request for an SH interval.
8
SDI
I
D
PD
Serial Interface Data Input.
9
SDO
O
D
10
SCLK
I
D
PD
Serial Interface shift register clock.
11
SEN
I
D
PU
Active-low chip enable for the Serial Interface.
12
VA
P
Analog power supply. Bypass voltage source with 4.7μF and pin with 0.1μF to AGND.
13
AGND
P
Analog ground return.
14
VA
P
Analog power supply. Bypass voltage source with 4.7μF and pin with 0.1μF to AGND.
15
VREFB
O
A
Bottom of ADC reference. Bypass with a 0.1μF capacitor to ground.
16
VREFT
O
A
Top of ADC reference. Bypass with a 0.1μF capacitor to ground.
17
VA
P
Analog power supply. Bypass voltage source with 4.7μF and pin with 0.1μF to AGND.
18
AGND
P
Analog ground return.
19
VCLP
A
Input Clamp Voltage. Normally bypassed with a 0.1μF , and a 4.7μF capacitor to AGND.
An external reference voltage may be applied to this pin.
20
VA
P
Analog power supply. Bypass voltage source with 4.7μF and pin with 0.1μF to AGND.
21
IBIAS
A
Bias setting pin. Connect a 9.0 kOhm 1% resistor to AGND.
22
AGND
P
Analog ground return.
23
OSR
A
Analog input signal. Typically sensor Red output AC-coupled thru a capacitor.
24
AGND
P
Analog ground return.
25
OSG
A
Analog input signal. Typically sensor Green output AC-coupled thru a capacitor.
26
AGND
P
Analog ground return.
27
OSB
A
Analog input signal. Typically sensor Blue output AC-coupled thru a capacitor.
28
CPOFILT2
A
Charge Pump Filter Capacitor. Bypass this supply pin with a 0.1μF capacitor to
CPOFILT1.
29
DGND
P
Digital ground return.
30
CPOFILT1
A
Charge Pump Filter Capacitor. Bypass this supply pin with a 0.1μF capacitor to
CPOFILT2.
31
DVB
O
D
Digital Core Voltage bypass. Not an input. Bypass with 0.1μF capacitor to DGND.
32
INCLK+
I
D
Clock Input. Non-Inverting input for LVDS clocks or CMOS clock input. CMOS clock is
selected when pin 29 is held at DGND, otherwise clock is configured for LVDS operation.
33
INCLK-
I
D
Clock Input. Inverting input for LVDS clocks, connect to DGND for CMOS clock.
34
DOUT7/
O
D
Bit 7 of the digital video output bus in CMOS Mode, LVDS Frame Clock+ in LVDS Mode.
O
D
Bit 6 of the digital video output bus in CMOS Mode, LVDS Frame Clock- in LVDS Mode.
O
D
Bit 5 of the digital video output bus in CMOS Mode, LVDS Data Out2+ in LVDS Mode.
IO
O
I
I
I
Serial Interface Data Output.
TXCLK+
35
DOUT6/
TXCLK-
36
DOUT5/
TXOUT2+
(1)
(I=Input), (O=Output), (IO=Bi-directional), (P=Power), (D=Digital), (A=Analog), (PU=Pull Up with an internal resistor), (PD=Pull Down
with an internal resistor.).
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Pin Descriptions(1) (continued)
Pin
37
Name
DOUT4/
I/O
Typ
Res
Description
O
D
Bit 4 of the digital video output bus in CMOS Mode, LVDS Data Out2- in LVDS Mode.
O
D
Bit 3 of the digital video output bus in CMOS Mode, LVDS Data Out1+ in LVDS Mode.
O
D
Bit 2 of the digital video output bus in CMOS Mode, LVDS Data Out1- in LVDS Mode.
O
D
Bit 1 of the digital video output bus in CMOS Mode, LVDS Data Out0+ in LVDS Mode.
O
D
Bit 0 of the digital video output bus in CMOS Mode, LVDS Data Out0- in LVDS Mode.
O
D
TXOUT238
DOUT3/
TXOUT1+
39
DOUT2/
TXOUT1-
40
DOUT1/
TXOUT0+
41
DOUT0/
TXOUT0-
42
DGND
43
VD
P
Power supply for the digital circuits. Bypass this supply pin with 0.1μF capacitor. A single
4.7μF capacitor should be used between the supply and the VD, VR and VC pins.
44
VC
P
Power supply for the sensor control outputs. Bypass this supply pin with 0.1μF capacitor.
45
CLKOUT/SH2
O
D
Output clock for registering output data when using CMOS outputs, or a configurable low
speed sensor timing output.
46
SH3
O
D
Configurable low speed sensor timing output.
47
RS
O
D
Configurable high speed sensor timing output.
48
CP
O
D
Configurable high speed sensor timing output.
49
PHIA1
O
D
Configurable high speed sensor timing output.
50
PHIA2
O
D
Configurable high speed sensor timing output.
51
DGND
P
Digital ground return.
52
VC
P
Power supply for the sensor control outputs.
Bypass this supply pin with 0.1μF capacitor.
53
PHIB1
O
D
Configurable high speed sensor timing output.
54
PHIB2
O
D
Configurable high speed sensor timing output.
55
SH4
O
D
Configurable low speed sensor timing output.
56
SH5
O
D
Configurable low speed sensor timing output.
6
PD
Configurable sensor control output.
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings (1) (2) (3)
Supply Voltage (VA,VR,VD,VC)
4.2V
Voltage on Any Input Pin(Not to exceed 4.2V)
−0.3V to
(VA + 0.3V)
Voltage on Any Output Pin(execpt DVB and not to exceed 4.2V)
−0.3V to
(VA + 0.3V)
DVB Output Pin Voltage
Input Current at any pin other than Supply Pins
2.0V
(4)
±25 mA
Package Input Current (except Supply Pins) (4)
±50 mA
Maximum Junction Temperature (TA)
150°C
Thermal Resistance (θJA)
<66°C/W
Package Dissipation at TA = 25°C (5)
ESD Rating (6)
>1.89W
Human Body Model
2500V
Machine Model
250V
−65°C to +150°C
Storage Temperature
Soldering process must comply with Texas Instrument’s Reflow Temperature Profile specifications. Refer to www.ti.com/packaging
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(7)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions. Operation of the device beyond the Operating Ratings is not
recommended.
All voltages are measured with respect to AGND = DGND = 0V, unless otherwise specified.
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
When the input voltage (VIN) at any pin exceeds the power supplies (VIN < GND or VIN > VA or VD), the current at that pin should be
limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can simultaneously safely exceed the
power supplies with an input current of 25 mA to two.
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJMAX, θJA and the ambient temperature,
TA. The maximum allowable power dissipation at any temperature is PD = (TJMAX – TA)/θJA. The values for maximum power dissipation
listed above will be reached only when the device is operated in a severe fault condition (e.g. when input or output pins are driven
beyond the power supply voltages, or the power supply polarity is reversed). Such conditions should always be avoided.
Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through 0Ω.
Reflow temperature profiles are different for lead-free and non-lead-free packages.
Operating Ratings (1) (2)
0°C ≤ TA ≤ +70°C
Operating Temperature Range
All Supply Voltage
(1)
(2)
+3.0V to +3.6V
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions. Operation of the device beyond the Operating Ratings is not
recommended.
All voltages are measured with respect to AGND = DGND = 0V, unless otherwise specified.
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Electrical Characteristics
The following specifications apply for VA = VD = VC = 3.3V, CL = 10pF, and fINCLK = 15MHz unless otherwise specified.
Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C.
Parameter
Test Conditions
Min (1)
Typ (2)
Max (1) (3)
Units
CMOS Digital Input DC Specifications (RESETb, SH_R, SCLK, SENb)
VIH
Logical “1” Input Voltage
VIL
Logical “0” Input Voltage
VIHYST
Logic Input Hysteresis
IIH
Logical “1” Input Current
IIL
Logical “0” Input Current
2.0
V
0.8
V
0.6
VIH = VD
RESET,SEN
100
nA
SH_R, SCLK, SDI, CAL
65
μA
CE
30
nA
RESETSEN
-65
μA
SH_R, SCLK, SDI, CAL
-100
nA
CE
-30
μA
VIL = DGND
CMOS Digital Output DC Specifications (SH1 to SH5, RS, CP, PHIA, PHIB, PHIC)
VOH
Logical “1” Output Voltage
IOUT = -0.5mA
VOL
Logical “0” Output Voltage
IOUT = 1.6mA
IOS
Output Short Circuit Current
VOUT = DGND
18
VOUT= VD
-25
VOUT = DGND
20
VOUT = VD
-25
IOZ
CMOS Output TRI-STATE Current
3.0
V
0.21
V
mA
nA
CMOS Digital Output DC Specifications (CMOS Data Outputs)
VOH
Logical “1” Output Voltage
IOUT = -0.5mA
2.3
V
VOL
Logical “0” Output Voltage
IOUT = 1.6mA
0.12
V
IOS
Output Short Circuit Current
VOUT = DGND
12
mA
VOUT= VD
-14
IOZ
CMOS Output TRI-STATE Current
VOUT = DGND
20
VOUT = VD
-25
nA
LVDS/CMOS Clock Receiver DC Specifications (INCLK+ and INCLK- Pins)
VIHL
VILL
Differential LVDS Clock
RL = 100Ω
High Threshold Voltage
VCM (LVDS Input Common Mode
Voltage)= 1.25V
Differential LVDS Clock
200
mV
-200
mV
2.0
V
Low Threshold Voltage
VIHC
CMOS Clock
INCLK- = DGND
High Threshold Voltage
VILC
CMOS Clock
0.8
V
260
μA
Low Threshold Voltage
IIHL
CMOS Clock
230
Input High Current
IILC
CMOS Clock
-135
-120
μA
Input Low Current
(1)
(2)
(3)
8
Test limits are ensured to TI's AOQL (Average Outgoing Quality Level).
Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical
specifications are not ensured.
The analog inputs are protected as shown in Figure 4. Input voltage magnitudes beyond the supply rails will not damage the device,
provided the current is limited per Note 4 under the Absolute Maximum Ratings Table. However, input errors will be generated If the
input goes above VA and below AGND.
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Electrical Characteristics (continued)
The following specifications apply for VA = VD = VC = 3.3V, CL = 10pF, and fINCLK = 15MHz unless otherwise specified.
Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C.
Parameter
Test Conditions
Min (1)
Typ (2)
Max (1) (3)
Units
mV
LVDS Output DC Specifications
VOD
Differential Output Voltage
VOS
LVDS Output Offset Voltage
IOS
Output Short Circuit Current
RL = 100Ω
280
390
490
1.08
1.20
1.33
V
VOUT = 0V, RL = 100Ω
8.5
mA
LVDS Output Data Format
139
162
mA
LVDS Output Data Format
(Powerdown)
3.1
4.5
mA
CMOS Output Data Format
(40 MHz)
137
161
mA
LVDS Output Data Format
50
65
mA
LVDS Output Data Format
(Powerdown)
5.5
8
mA
CMOS Output Data Format
(ATE Loading of CMOS Outputs
> 50 pF) (40 MHz)
48
62
mA
Typical sensor outputs:
1
4
mA
LVDS Output Data Format
630
736
mW
LVDS Output Data Format
(Powerdown)
28
32
mW
CMOS Output Data Format
(ATE Loading of CMOS Outputs
> 50pF) (40 MHz)
600
740
mW
CDS Gain=1x, PGA Gain=1x
2.3
CDS Gain=2x, PGA Gain= 1x
1.22
Power Supply Specifications
IA
ID
IC
VA Analog Supply Current
VD Digital Output Driver Supply
Current
VC CCD Timing Generator Output
Driver Supply Current
SH1-SH5, PHIA, PHIB, PHIC,
RS, CP
(ATE Loading of CMOS
Outputs > 50pF)
PWR
Average Power Dissipation
Input Sampling Circuit Specifications
VIN
Input Voltage Level
IIN_SH
Sample and Hold Mode
Source Followers Off
Input Leakage Current
CDS Gain = 1x
19
(-103)
(-95)
(-152)
(-141)
(-250)
(-50)
Vp-p
25
μA
50
μA
250
nA
OSX = VA (OSX = AGND)
Source Followers Off
CDS Gain = 2x
33
OSX = VA (OSX = AGND)
Source Followers On
CDS Gain = 2x
20
OSX = VA (OSX = AGND)
CSH
Sample/Hold Mode
CDS Gain = 1x
2.5
pF
Equivalent Input Capacitance
IIN_CDS
RCLPIN
CDS Gain = 2x
4
CDS Mode
Source Followers Off
10
Input Leakage Current
OSX = VA (OSX = AGND)
CLPIN Switch Resistance
(-250)
pF
250
nA
55
Ω
(-50)
16
(OSX to VCLP Node)
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Electrical Characteristics (continued)
The following specifications apply for VA = VD = VC = 3.3V, CL = 10pF, and fINCLK = 15MHz unless otherwise specified.
Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C.
Parameter
Test Conditions
Min (1)
Typ (2)
Max (1) (3)
Units
VCLP Reference Circuit Specifications
VVCLP
ISC
VCLP Voltage 000
VCLP Voltage Setting = 000
0.85VA
V
VCLP Voltage 001
VCLP Voltage Setting = 001
0.9VA
V
VCLP Voltage 010
VCLP Voltage Setting = 010
0.95VA
V
VCLP Voltage 011
VCLP Voltage Setting = 011
0.6VA
V
VCLP Voltage 100
VCLP Voltage Setting = 100
0.55VA
V
VCLP Voltage 101
VCLP Voltage Setting = 101
0.4VA
V
VCLP Voltage 110
VCLP Voltage Setting = 110
0.35VA
V
VCLP Voltage 111
VCLP Voltage Setting = 111
0.15VA
V
VCLP DAC Short Circuit Output
Current
0001 xxxxb VCLP Config.
Register =
30
mA
10
Bits
Black Level Offset DAC Specifications
Resolution
Monotonicity
Ensured by characterization
Offset Adjustment Range
CDS Gain = 1x
Referred to AFE Input
Minimum DAC Code = 0x000
-614
Maximum DAC Code = 0x3FF
614
mV
CDS Gain = 2x
Minimum DAC Code = 0x000
-307
Maximum DAC Code = 0x3FF
307
mV
Offset Adjustment Range
Minimum DAC Code = 0x000
-17500
-16130
Referred to AFE Output
Maximum DAC Code = 0x3FF
+16130
+17500
DAC LSB Step Size
CDS Gain = 1x
1.2
mV
Referred to AFE Output
(32)
(LSB)
LSB
DNL
Differential Non-Linearity
-0.85
+0.74/
-0.37
+2.4
LSB
INL
Integral Non-Linearity
-2.5
+0.72/
-0.56
+2.5
LSB
PGA Specifications
Gain Resolution
8
Monotonicity
Maximum Gain
Minimum Gain
PGA Function
Bits
Ensured by characterization
CDS Gain = 1x
7.7
8.3
8.8
V/V
CDS Gain = 1x
17.7
18.4
18.9
dB
CDS Gain = 1x
0.58
0.64
0.70
V/V
CDS Gain = 1x
-4.7
-4.2
-3.5
dB
Gain (V/V) = (180/(277-PGA Code))
Gain (dB) = 20LOG10(180/(277-PGA Code))
Channel Matching
Minimum PGA Gain
3
Maximum PGA Gain
12.7
%
ADC Specifications
VREFT
Top of Reference
2.07
V
VREFB
Bottom of Reference
0.89
V
VREFT VREFB
Differential Reference Voltage
10
1.06
1.18
Overrange Output Code
65535
Underrange Output Code
0
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1.30
V
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LM98722
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SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
Electrical Characteristics (continued)
The following specifications apply for VA = VD = VC = 3.3V, CL = 10pF, and fINCLK = 15MHz unless otherwise specified.
Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C.
Parameter
Min (1)
Test Conditions
Typ (2)
Max (1) (3)
Units
Digital Offset “DAC” Specifications
Resolution
7
Bits
32
LSB
Digital Offset DAC LSB Step Size
Referred to AFE Output
Offset Adjustment Range
Min DAC Code =7b0000000
-2048
Referred to AFE Output
Mid DAC Code =7b1000000
0
Max DAC Code = 7b1111111
+2016
LSB
Full Channel Performance Specifications
DNL
INL
Differential Non-Linearity
Integral Non-Linearity
See
(4)
-0.999
+0.8/-0.7
2.5
LSB
See
(4)
-75
+18/-25
75
LSB
26
LSB RMS
Minimum PGA Gain (4)
SNR
Total Output Noise
Channel to Channel Crosstalk
(4)
-76
dB
10
Maximum PGA Gain (4)
-56
dB
96
LSB RMS
Mode 3
26
Mode 2
17
LSB
This parameter ensured by design and characterization.
AC Timing Specifications
The following specifications apply for VA = VD = VC = 3.3V, CL = 10pF, and fINCLK = 15MHz unless otherwise specified.
Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C. (1)
Parameter
Test Conditions
Min (2)
Typ (3)
Max (2)
Units
Input Clock Timing Specifications
fINCLK
Input Clock Frequency
INCLK = PIXCLK
0.66
15 (Mode 3)
(Pixel Rate Clock)
1
22.5 (Mode 2)
1
22.5 (Mode 1)
INCLK = ADCCLK
(ADC Rate Clock)
MHz
45 (Mode 3)
2
45 (Mode 2)
MHz
22.5 (Mode 1)
Tdc
Input Clock Duty Cycle
40/60
50/50
60/40
%
Full Channel Latency Specifications
3 Channel Mode Pipeline Delay
tLAT3
2 Channel Mode Pipeline Delay
tLAT2
(1)
(2)
(3)
PIXPHASE0
24
PIXPHASE1
23 1/2
PIXPHASE2
23
PIXPHASE3
22 1/2
PIXPHASE0
21
PIXPHASE1
20 1/2
PIXPHASE2
20
PIXPHASE3
19 1/2
TADC
TADC
The analog inputs are protected as shown in Figure 4. Input voltage magnitudes beyond the supply rails will not damage the device,
provided the current is limited per Note 4 under the Absolute Maximum Ratings Table. However, input errors will be generated If the
input goes above VA and below AGND.
Test limits are ensured to TI's AOQL (Average Outgoing Quality Level).
Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical
specifications are not ensured.
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LM98722
SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
www.ti.com
AC Timing Specifications (continued)
The following specifications apply for VA = VD = VC = 3.3V, CL = 10pF, and fINCLK = 15MHz unless otherwise specified.
Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C.(1)
Parameter
1 Channel Mode Pipeline Delay
tLAT1
Test Conditions
Min (2)
Typ (3)
PIXPHASE0
19
PIXPHASE1
18 1/2
PIXPHASE2
18
PIXPHASE3
17 1/2
Max (2)
Units
TADC
SH_R Timing Specifications
tSHR_S
SH_R Setup Time
2
ns
tSHR_H
SH_R Hold Time
2
ns
LVDS Output Timing Specifications
TXpp0
TXCLK to Pulse Position 0
LVDS Output
-0.46
0
0.46
ns
TXpp1
TXCLK to Pulse Position 1
Specifications not
2.71
3.17
3.63
ns
TXpp2
TXCLK to Pulse Position 2
tested in production.
5.89
6.35
6.81
ns
TXpp3
TXCLK to Pulse Position 3
Min/Max ensured
9.06
9.52
9.98
ns
TXpp4
TXCLK to Pulse Position 4
by design,
12.24
12.70
13.16
ns
TXpp5
TXCLK to Pulse Position 5
characterization and statistical
15.41
15.87
16.33
ns
TXpp6
TXCLK to Pulse Position 6
analysis.
18.59
19.05
19.51
ns
2
6
9
ns
15/22.5/22.5
MHz
45/45/22.5
MHz
CMOS Output Timing Specifications
fINCLK = 40MHz
tCRDO
CLKOUT Rising Edge to CMOS
Output Data Transition
INCLK = ADCCLK
(ADC Rate Clock)
Serial Interface Timing Specifications
fSCLK <= fINCLK
INCLK = PIXCLK
(Pixel Rate Clock)
fSCLK
Input Clock Frequency
Mode 3/2/1
fSCLK <= fINCLK
INCLK = ADCCLK
(ADC Rate Clock)
Mode 3/2/1
SCLK Duty Cycle
50/50
ns
tIH
Input Hold Time
1.5
ns
tIS
Input Setup Time
2.5
ns
tSENSC
SCLK Start Time After SEN Low
1.5
ns
tSCSEN
SEN High after last SCLK Rising
Edge
2.5
ns
tSENW
SEN Pulse Width
INCLK present
6
TINCLK
INCLK stopped (4) (5)
50
ns
tOD
Output Delay Time
tHZ
Data Output to High Z
(4)
(5)
12
11
14
ns
0.5
TSCLK
If the input INCLK is divided down to a lower internal clock rate via the PLL, the parameter tSENW will be increased by the same factor.
When the Spread Spectrum Clock Generation feature is enabled, tSENW should be increased by 1.
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Product Folder Links: LM98722
LM98722
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SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
VA
I/O
To Internal Circuitry
AGND
Figure 4.
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Product Folder Links: LM98722
13
LM98722
SNAS487A – SEPTEMBER 2009 – REVISED APRIL 2013
www.ti.com
REVISION HISTORY
Changes from Original (April 2013) to Revision A
•
14
Page
Changed layout of National Data Sheet to TI format .......................................................................................................... 13
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PACKAGE OPTION ADDENDUM
www.ti.com
11-Apr-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
(2)
MSL Peak Temp
Op Temp (°C)
Top-Side Markings
(3)
(4)
LM98722CCMT/NOPB
ACTIVE
TSSOP
DGG
56
34
Green (RoHS
& no Sb/Br)
CU SN
Level-2-260C-1 YEAR
0 to 70
LM98722CCMT
LM98722CCMTX/NOPB
ACTIVE
TSSOP
DGG
56
1000
Green (RoHS
& no Sb/Br)
CU SN
Level-2-260C-1 YEAR
0 to 70
LM98722CCMT
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a
continuation of the previous line and the two combined represent the entire Top-Side Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
Samples
PACKAGE MATERIALS INFORMATION
www.ti.com
8-Apr-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
LM98722CCMTX/NOPB
Package Package Pins
Type Drawing
TSSOP
DGG
56
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
1000
330.0
24.4
Pack Materials-Page 1
8.6
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
14.5
1.8
12.0
24.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
8-Apr-2013
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
LM98722CCMTX/NOPB
TSSOP
DGG
56
1000
367.0
367.0
45.0
Pack Materials-Page 2
MECHANICAL DATA
MTSS003D – JANUARY 1995 – REVISED JANUARY 1998
DGG (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
48 PINS SHOWN
0,27
0,17
0,50
48
0,08 M
25
6,20
6,00
8,30
7,90
0,15 NOM
Gage Plane
1
0,25
24
0°– 8°
A
0,75
0,50
Seating Plane
0,15
0,05
1,20 MAX
PINS **
0,10
48
56
64
A MAX
12,60
14,10
17,10
A MIN
12,40
13,90
16,90
DIM
4040078 / F 12/97
NOTES: A.
B.
C.
D.
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
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