AD DAC8248FW Dual 12-bit (8-bit byte) double-buffered cmos d/a converter Datasheet

a
Dual 12-Bit (8-Bit Byte)
Double-Buffered CMOS D/A Converter
DAC8248
FEATURES
Two Matched 12-Bit DACs on One Chip
12-Bit Resolution with an 8-Bit Data Bus
Direct Interface with 8-Bit Microprocessors
Double-Buffered Digital Inputs
RESET to Zero Pin
12-Bit Endpoint Linearity (61/2 LSB) Over Temperature
15 V to 115 V Single Supply Operation
Latch-Up Resistant
Improved ESD Resistance
Packaged in a Narrow 0.3" 24-Pin DIP and 0.3" 24-Pin
SOL Package
Available in Die Form
APPLICATIONS
Multichannel Microprocessor-Controlled Systems
Robotics/Process Control/Automation
Automatic Test Equipment
Programmable Attenuator, Power Supplies, Window
Comparators
Instrumentation Equipment
Battery Operated Equipment
GENERAL DESCRIPTION
The DAC8248 is a dual 12-bit, double-buffered, CMOS digitalto-analog converter. It has an 8-bit wide input data port that interfaces directly with 8-bit microprocessors. It loads a 12-bit word in
two bytes using a single control; it can accept either a least significant byte or most significant byte first. For designs with a 12-bit or
16-bit wide data path, choose the DAC8222 or DAC8221.
PIN CONNECTIONS
24-Pin 0.3" Cerdip (W Suffix),
24-Pin Epoxy DIP (P Suffix),
24-Pin SOL (S Suffix)
The DAC8248’s double-buffered digital inputs allow both
DAC’s analog output to be updated simultaneously. This is particularly useful in multiple DAC systems where a common
LDAC signal updates all DACs at the same time. A single
RESET pin resets both outputs to zero.
The DAC8248’s monolithic construction offers excellent DACto-DAC matching and tracking over the full operating temperature range. The DAC consists of two thin-film R-2R resistor
ladder networks, two 12-bit, two 8-bit, and two 4-bit data registers, and control logic circuitry. Separate reference input and
feedback resistors are provided for each DAC. The DAC8248
(continued on page 4)
FUNCTIONAL BLOCK DIAGRAM
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700
Fax: 617/326-8703
DAC8248–SPECIFICATIONS
ELECTRICAL CHARACTERlSTICS (@ V
= +5 V or +15 V; VREF A = VREF B = +10 V; VOUTA = VOUT B = 0 V; AGND = DGND = 0 V;
TA = Full Temp Range specified in Absolute Maximum Ratings; unless otherwise noted. Specifications apply for DAC A and DAC B.)
Parameter
Symbol
STATIC ACCURACY
Resolution
Relative Accuracy
N
INL
Gain Temperature Coefficient
(∆Gain/∆Temperature)
TCGFS
ILKG
RREF
VINH
Digital Input Low
VINL
Input Current (VIN = 0 V
or VDD and VINL or VINH)
Input Capacitance
(Note 2)
IIN
CIN
DC Power Supply Rejection Ratio
(∆Gain/∆VDD)
(Notes 2, 3)
All Digital Inputs = 0s
TA = +25°C
TA = Full Temperature Range
(Note 4)
8
∆RREF
RREF
DIGITAL INPUTS
Digital Input High
POWER SUPPLY
Supply Current
Min
DAC8248
Typ
Max
12
DNL
GFSE
Input Resistance Match
Conditions
VDD = +5 V
VDD = +15 V
VDD = +5 V
VDD = +15 V
TA = +25°C
TA = Full Temperature Range
DB0–DB11
WR, LDAC, DAC A/DAC B,
LSB/MSB, RESET
Digital Inputs = VINL or VINH
Digital Inputs = 0 V or VDD
∆VDD = ± 5%
IDD
PSRR
Units
± 1/2
±1
±1
±1
±2
±4
Bits
LSB
LSB
LSB
LSB
LSB
LSB
±2
±5
ppm/°C
±5
11
± 10
± 50
15
nA
kΩ
± 0.2
±1
%
DAC8248A/E/G
DAC8248F/H
All Grades are Guaranteed Monotonic
DAC8248A/E
DAC8248G
DAC8248F/H
Differential Nonlinearity
Full-Scale Gain Error1
Output Leakage Current
IOUT A (Pin 2), IOUT B (Pin 24)
Input Resistance (VREF A, REF B)
DD
2.4
13.5
0.8
1.5
± 0.001 ± 1
± 10
10
10
V
V
V
V
µA
µA
pF
15
pF
2
100
mA
µA
0.002
%/%
350
1
ns
µs
90
pF
120
pF
–70
dB
–70
dB
2
AC PERFORMANCE CHARACTERISTICS
Propagation Delay5, 6
tPD
Output Current Setting Time6, 7
tS
Output Capacitance
CO
AC Feedthrough at
IOUT A or IOUT B
FTA
FTB
TA = +25°C
TA = +25°C
Digital Inputs = All 0s
COUT A, COUT B
Digital Inputs = All 1s
COUT A, COUT B
VREF A to IOUT A; VREF A = 20 V p-p
f = 100 kHz; TA = +25°C
VREF B to IOUT B; VREF B = 20 V p-p
f = 100 kHz; TA = +25°C
–2–
REV. B
DAC8248
Parameter
Symbol
DAC8248
Units
VDD = +5 V
+258C –408C to +858C
(Note 9)
VDD = +15 V
–558C to +1258C All Temps
(Note 10)
tCBS
130
170
180
80
ns min
tCBH
0
0
0
0
ns min
tAS
180
210
220
80
ns min
tAH
0
0
0
0
ns min
tLS
120
150
160
80
ns min
tLH
0
0
0
0
ns min
tDS
160
210
220
70
ns min
tDH
tWR
tLWD
tRWD
0
130
100
80
0
150
110
90
0
170
130
90
10
90
60
60
ns min
ns min
ns min
ns min
Switching Characteristics
(Notes 2, 8)
LSB/MSB Select to
Write Set-Up Time
LSB/MSB Select to
Write Hold Time
DAC Select to
Write Set-Up Time
DAC Select to
Write Hold Time
LDAC to
Write Set-Up Time
LDAC to
Write Hold Time
Data Valid to
Write Set-Up Time
Data Valid to
Write Hold Time
Write Pulse Width
LDAC Pulse Width
Reset Pulse Width
Conditions
NOTES
11
Measured using internal R FB A and RFB B. Both DAC digital inputs = 1111 1111 1111.
12
Guaranteed and not tested.
13
Gain TC is measured from +25°C to TMIN or from +25°C to TMAX.
14
Absolute Temperature Coefficient is approximately +50 ppm/°C.
15
From 50% of digital input to 90% of final analog output current. V REF A = VREF B = +10 V; OUT A, OUT B load = 100 Ω, CEXT = 13 pF.
16
WR, LDAC = 0 V; DB0–DB7 = 0 V to V DD or VDD to 0 V.
17
Settling time is measured from 50% of the digital input change to where the output settles within 1/2 LSB of full scale.
18
See Timing Diagram.
19
These limits apply for the commercial and industrial grade products.
10
These limits also apply as typical values for V DD = +12 V with +5 V CMOS logic levels and T A = +25°C.
Specifications subject to change without notice.
Burn-In Circuit
REV. B
–3–
DAC8248
(continued from page 1)
operates on a single supply from +5 V to +15 V, and it dissipates less than 0.5 mW at +5 V (using zero or VDD logic levels).
The device is packaged in a space-saving 0.3", 24-pin DIP.
The DAC8248 is manufactured with PMI’s highly stable thinfilm resistors on an advanced oxide-isolated, silicon-gate,
CMOS technology. PMI’s improved latch-up resistant design
eliminates the need for external protective Schottky diodes.
Package Type
uJA1
uJC
Units
24-Pin Hermetic DIP (W)
24-Pin Plastic DIP (P)
24-Pin SOL (S)
69
62
72
10
32
24
°C/W
°C/W
°C/W
NOTE
1
uJA specified for worst case mounting conditions, i.e., uJA is specified for device in
socket for cerdip and P-DIP packages; uJA is specified for device soldered to printed
circuit board for SOL package.
ABSOLUTE MAXIMUM RATINGS
CAUTION
(TA = +25°C, unless otherwise noted.)
1. Do not apply voltages higher than VDD or less than GND
potential on any terminal except VREF and RFB.
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
AGND to DGND . . . . . . . . . . . . . . . . . . –0.3 V, VDD +0.3 V
Digital Input Voltage to DGND . . . . . . . –0.3 V, VDD +0.3 V
IOUT A, IOUT B to AGND . . . . . . . . . . . . . . –0.3 V, VDD +0.3 V
VREF A, VREF B to AGND . . . . . . . . . . . . . . . . . . . . . . . . ± 25 V
VRFB A, VRFB B to AGND . . . . . . . . . . . . . . . . . . . . . . . . ± 25 V
Operating Temperature Range
AW Version . . . . . . . . . . . . . . . . . . . . . . . –55°C to +125°C
EW, FW, FP Versions . . . . . . . . . . . . . . . . –40°C to +85°C
GP, HP, HS Versions . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . +300°C
2. The digital control inputs are Zener-protected; however,
permanent damage may occur on unprotected units from
high energy electrostatic fields. Keep units in conductive
foam at all times until ready to use.
3. Do not insert this device into powered sockets; remove
power before insertion or removal.
4. Use proper antistatic handling procedures.
5. Devices can suffer permanent damage and/or reliability degradation if stressed above the limits listed under Absolute
Maximum Ratings for extended periods. This is a stress rating only and functional operation at or above this specification is not implied.
ORDERING GUIDE1
Model
Relative
Accuracy
(+5 V or +15 V)
Gain Error
(+5 V or +15 V)
Temperature
Range
Package
Description
DAC8248AW2
DAC8248EW
DAC8248GP
DAC8248FW
DAC8248HP
DAC8248FP
DAC8248HS3
± 1/2 LSB
± 1/2 LSB
± 1/2 LSB
± 1 LSB
± 1 LSB
± 1 LSB
± 1 LSB
± 1 LSB
± 1 LSB
± 2 LSB
± 4 LSB
± 4 LSB
± 4 LSB
± 4 LSB
–55°C to +125°C
–40°C to +85°C
0°C to +70°C
–40°C to +85°C
0°C to +70°C
–40°C to +85°C
0°C to +70°C
24-Pin Cerdip
24-Pin Cerdip
24-Pin Plastic DIP
24-Pin Cerdip
24-Pin Plastic DIP
24-Pin Plastic DIP
24-Pin SOL
NOTES
1
Burn-in is available on commercial and industrial temperature range parts in cerdip, plastic DIP, and TO-can packages.
2
For devices processed in total compliance to MIL-STD-883, add/883 after part number. Consult factory for 883 data sheet.
3
For availability and burn-in information on SO and PLCC packages, contact your local sales office.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the DAC8248 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
–4–
WARNING!
ESD SENSITIVE DEVICE
REV. B
DAC8248
DICE CHARACTERISTICS
11.
12.
13.
14.
15.
16.
17.
18.
19.
10.
11.
12.
AGND
IOUTA
RFB A
VREF A
DGND
DB7(MSB)
DB6
DB5
DB4
DB3
DB2
NC
13.
14.
15.
16.
17.
18.
19.
20.
21.
22.
23.
24.
NC
DB1
DB0(LSB)
RESET
LSB/MSB
DAC A/DAC B
LDAC
WR
VDD
VREF B
RFB B
IOUT B
SUBSTRATE (DIE BACKSIDE) IS INTERNALLY
CONNECTED TO VDD.
Die Size 0.124 × 0.132 inch, 16,368 sq. mils
(3.15 × 3.55 mm, 10.56 sq. mm)
WAFER TEST LIMITS @ V
DD
= +5 V or +15 V, VREF A = VREF B = +10 V, VOUT A = VOUT B = 0 V; AGND = DGND = 0 V; TA = 258C.
DAC8248G
Limit
Units
Endpoint Linearity Error
All Grades are Guaranteed Monotonic
Digital Inputs = 1111 1111 1111
Digital Inputs = 0000 0000 0000
Pads 2 and 24
±1
±1
±4
LSB max
LSB max
LSB max
± 50
nA max
Pads 4 and 22
8/15
kΩ min/kΩ max
VDD = +5 V
VDD = +15 V
VDD = +5 V
VDD = +15 V
VIN = 0 V or VDD; VINL or VINH
All Digital Inputs VINL or VINH
All Digital Inputs 0 V or VDD
±1
2.4
13.5
0.8
1.5
±1
2
0.1
% max
V min
V min
V max
V max
µA max
mA max
mA max
∆VDD = ± 5%
0.002
%/% max
Parameter
Symbol
Conditions
Relative Accuracy
Differential Nonlinearity
Full-Scale Gain Error1
Output Leakage
(IOUT A, IOUT B)
Input Resistance
(VREF A, VREF B)
VREF A, VREF B Input
Resistance Match
Digital Input High
INL
DNL
GFSE
ILKG
RREF
∆RREF
RREF
VINH
Digital Input Low
VINL
Digital Input Current
Supply Current
IIN
IDD
DC Supply Rejection
(∆Gain/∆VDD)
PSR
NOTES
1
Measured using internal R FB A and RFB B.
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
REV. B
–5–
DAC8248–Typical Performance Characteristics
Channel-to-Channel Matching (DAC
A & B are Superimposed)
Differential Nonlinearity vs. VREF
Differential Nonlinearity vs. VREF
Nonlinearity vs. VREF
Nonlinearity vs. VREF
Nonlinearity vs. VDD
Nonlinearity vs. Code at TA = –55 °C,
+25 °C, +125 °C for DAC A & B
(All Superimposed)
Absolute Gain Error Change vs. VREF
Nonlinearity vs. Code (DAC A & B
are Superimposed)
–6–
REV. B
DAC8248
Full-Scale Gain Error vs. Temperature
REV. B
Logic Input Threshold Voltage
vs. Supply Voltage (VDD)
Supply Current vs. Temperature
Supply Current vs. Logic Input Voltage
Multiplying Mode Frequency Response vs. Digital Code
Output Leakage Current vs. Temperature
Analog Crosstalk vs. Frequency
–7–
DAC8248
Four Cycle Update
Five Cycle Update
Write Timing Cycle Diagram
PARAMETER DEFINITIONS
GENERAL CIRCUIT DESCRIPTION
RESOLUTION (N)
CONVERTER SECTION
The resolution of a DAC is the number of states (2n) that the
full-scale range (FSR) is divided (or resolved) into; where n is
equal to the number of bits.
The DAC8248 incorporates two multiplying 12-bit current output CMOS digital-to-analog converters on one monolithic chip.
It contains two highly stable thin-film R-2R resistor ladder networks, two 12-bit DAC registers, two 8-bit input registers, and
two 4-bit input registers. It also contains the DAC control logic
circuitry and 24 single-pole, double-throw NMOS transistor
current switches.
RELATIVE ACCURACY (INL)
Relative accuracy, or integral nonlinearity, is the maximum deviation of the analog output (from the ideal) from a straight line
drawn between the end points. It is expressed in terms of least
significant bit (LSB), or as a percent of full scale.
Figure 1 shows a simplified circuit for the R-2R ladder and transistor switches for a single DAC. R is typically 11 kΩ. The transistor switches are binarily scaled in size to maintain a constant
voltage drop across each switch. Figure 2 shows a single NMOS
transistor switch.
DIFFERENTIAL NONLINEARITY (DNL)
Differential nonlinearity is the worst case deviation of any adjacent analog output from the ideal 1 LSB step size. The deviation of the actual “step size” from the ideal step size of 1 LSB is
called the differential nonlinearity error or DNL. DACs with
DNL greater than ± 1 LSB may be nonmonotonic. ± 1/2 LSB
INL guarantees monotonicity and ± 1 LSB maximum DNL.
GAIN ERROR (GFSE)
Gain error is the difference between the actual and the ideal
analog output range, expressed as a percent of full-scale or in
terms of LSB value. It is the deviation in slope of the DAC
transfer characteristic from ideal.
Refer to PMI 1990/91 Data Book, Section 11, for additional
digital-to-analog converter definitions.
Figure 1. Simplified Single DAC Circuit Configuration.
(Switches Are Shown For All Digital Inputs at Zero)
–8–
REV. B
DAC8248
DIGITAL SECTION
The DAC8248’s digital inputs are TTL compatible at VDD = +5 V
and CMOS compatible at VDD = +15 V. They were designed to
convert TTL and CMOS input logic levels into voltage levels that
will drive the internal circuitry. The DAC8248 can use +5 V
CMOS logic levels with VDD = +12 V; however, supply current
will increase to approximately 5 mA–6 mA.
Figure 2. N-Channel Current Steering Switch
The binary-weighted currents are switched between IOUT and
AGND by the transistor switches. Selection between IOUT and
AGND is determined by the digital input code. It is important
to keep the voltage difference between IOUT and AGND terminals as close to zero as practical to preserve data sheet limits. It
is easily accomplished by connecting the DAC’s AGND to the
noninverting input of an operational amplifier and IOUT to the
inverting input. The amplifier’s feedback resistor can be eliminated by connecting the op amp’s output directly to the DAC’s
RFB terminal (by using the DAC’s internal feedback resistor,
RFB). The amplifier also provides the current-to-voltage conversion for the DAC’s output current.
The output voltage is dependent on the DAC’s digital input
code and VREF, and is given by:
VOUT = VREF × D/4096
where D is the digital input code integer number that is between
0 and 4095.
The DAC’s input resistance, RREF, is always equal to a constant
value, R. This means that VREF can be driven by a reference
voltage or current, ac or dc (positive or negative). It is recommended that a low temperature-coefficient external RFB resistor
be used if a current source is employed.
The DAC’s output capacitance (COUT) is code dependent and
varies from 90 pF (all digital inputs low) to 120 pF (all digital
inputs high).
To ensure accuracy over the full operating temperature range,
permanently turned “ON” MOS transistor switches were included in series with the feedback resistor (RFB) and the R-2R
ladder’s terminating resistor (see Figure 1). The gates of these
NMOS transistors are internally connected to VDD and will be
turned “OFF” (open) if VDD is not applied. If an op amp is using the DAC’s RFB resistor to close its feedback loop, then VDD
must be applied before or at the same time as the op amp’s supply; this will prevent the op amp’s output from becoming “open
circuited” and swinging to either rail. In addition, some applications require the DAC’s ladder resistance to fall within a certain
range and are measured at incoming inspection; VDD must be
applied before these measurements can be made.
REV. B
Figure 3 shows the DAC’s digital input structure for one bit.
This circuitry drives the DAC registers. Digital controls, φ and
φ, shown are generated from the DAC’s input control logic
circuitry.
Figure 3. Digital Input Structure For One Bit
The digital inputs are electrostatic-discharge (ESD) protected
with two internal distributed diodes as shown in Figure 3; they
are connected between VDD and DGND. Each input has a typical input current of less than 1 nA.
The digital inputs are CMOS inverters and draw supply current
when operating in their linear region. Using a +5 V supply, the
linear region is between +1.2 V to +2.8 V with current peaking
at +1.8 V. Using a +15 V supply, the linear region is from
+1.2 V to +12 V (current peaking at +3.9 V). It is recommended that the digital inputs be operated as close to the power
supply voltage and DGND as is practically possible; this will
keep supply currents to a minimum. The DAC8248 may be
operated with any supply voltage between the range of +5 V to
+15 V and still perform to data sheet limits.
The DAC8248’s 8-bit wide data port loads a 12-bit word in two
bytes: 8-bits then 4-bits (or 4-bits first then 8-bits, at users discretion) in a right justified data format. This data is loaded into
the input registers with the LSB/MSB and WR control pins.
Data transfer from the input registers to the DAC registers can
be automatic. It can occur upon loading of the second data byte
into the input register, or can occur at a later time through a
strobed transfer using the LDAC control pin.
–9–
DAC8248
Figure 4. Four Cycle Update Timing Diagram
Figure 5. Five Cycle Update Timing Diagram
–10–
REV. B
DAC8248
AUTOMATIC DATA TRANSFER MODE
Data may be transferred automatically from the input register to
the DAC register. The first cycle loads the first data byte into
the input register; the second cycle loads the second data byte
and simultaneously transfers the full 12-bit data word to the
DAC register. It takes four cycles to load and transfer two complete digital words for both DAC’s, see Figure 4 (Four Cycle
Update Timing Diagram) and the Mode Selection Table.
STROBED DATA TRANSFER MODE
Strobed data transfer allows the full 12-bit digital word to be
loaded into the input registers and transferred to the DAC registers at a later time. This transfer mode requires five cycles: four
to load two new data words into both DACs, and the fifth to
transfer all data into the DAC registers. See Figure 5 (Five Cycle
Update Timing Diagram) and the Mode Selection Table.
Strobed data transfer separating data loading and transfer operations serves two functions: the DAC output updating may be
more precisely controlled, and multiple DACs in a multiple
DAC system can be updated simultaneously.
RESET
The DAC8248 comes with a RESET pin that is useful in system
calibration cycles and/or during system power-up. All registers
are reset to zero when RESET is low, and latched at zero on the
rising edge of the RESET signal when WRITE is high.
INTERFACE CONTROL LOGIC
The DAC8248’s control logic is shown in Figure 6. This circuitry interfaces with the system bus and controls the DAC
functions.
Figure 6. Input Control Logic
MODE SELECTION TABLE
DIGITAL INPUTS
DAC A/B
WR
LSB/MSB
RESET
REGISTER STATUS
DAC A
DAC B
Input Register
DAC
Input Register
LDAC LSB
MSB
Register
LSB
MSB
L
L
L
L
H
H
H
H
X
X
X
X
L
L
L
L
L
L
L
L
H
H
X
H
L
L
H
H
L
L
H
H
X
X
X
X
H
H
H
H
H
H
H
H
H
H
L
g
H
L
H
L
H
L
H
L
H
L
X
X
WR
LAT
LAT
LAT
LAT
WR
LAT
WR
LAT
LAT
LAT
WR
LAT
LAT
LAT
LAT
WR
WR
LAT
LAT
LAT
LAT
LAT
WR
LAT
LAT
LAT
WR
WR
LAT
LAT
LAT
LAT
LAT
WR
LAT
LAT
WR
LAT
WR
LAT
LAT
LAT
LAT
LAT
LAT
LAT
WR
LAT
LAT
ALL REGISTERS ARE RESET TO ZEROS
ZEROS ARE LATCHED IN ALL REGISTERS
L = Low, H = High, X = Don’t Care, WR = Registers Being Loaded, LAT = Registers Latched.
REV. B
–11–
DAC
Register
LAT
WR
LAT
WR
LAT
WR
LAT
WR
LAT
WR
DAC8248
Table I. Unipolar Binary Code Table (Refer to Figure 7)
INTERFACE CONTROL LOGIC PIN FUNCTIONS
LSB/MSB – (PIN 17) LEAST SIGNIFICANT BIT (Active
Low)/ MOST SIGNIFICANT BIT (Active High). Selects
lower 8-bits (LSBs) or upper 4-bits (MSBs); either can be
loaded first. It is used with the WR signal to load data into the
input registers. Data is loaded in a right justified format.
Binary Number in
DAC Register
MSB
LSB
Analog Output, VOUT
DAC A/DAC B – (PIN 18) DAC SELECTION. Active low
for DAC A and Active High for DAC B.
1111 1111 1111
–VREF 
4096 
WR – (PIN 20) WRITE – Active Low. Used with the LSB/
MSB signal to load data into the input registers, or Active High
to latch data into the input registers.
1000 0000 0000
–VREF 
= – VREF
4096 
2
0000 0000 0001
–VREF 
4096 
0V
LDAC – (PIN 19) LOAD DAC. Used to transfer data simultaneously from DAC A and DAC B input registers to both
DAC output registers. The DAC register becomes transparent
(activity on the digital inputs appear at the analog output) when
both WR and LDAC are low. Data is latched into the output
registers on the rising edge of LDAC.
RESET – (PIN 16) – Active Low. Functions as a zero override; all registers are forced to zero when the RESET signal is
low. All registers are latched to zeros when the write signal is
high and RESET goes high.
APPLICATIONS INFORMATION
UNIPOLAR OPERATION
Figure 7 shows a simple unipolar (2-quadrant multiplication)
circuit using the DAC8248 and OP270 dual op amp (use two
OP42s for applications requiring higher speeds), and Table I
shows the corresponding code table. Resistors R1, R2, and R3,
R4 are used only if full-scale gain adjustments are required.
0000 0000 0000
(DAC A or DAC B)
 4095 
 2048 
1
 1 
NOTE
1 LSB = (2-12) (VREF)=
1
(VREF)
4096
Low temperature-coefficient (approximately 50 ppm/°C) resistors or trimmers should be used. Maximum full-scale error
without these resistors for the top grade device and VREF =
± 10 V is 0.024%, and 0.049% for the low grade. Capacitors C1
and C2 provide phase compensation to reduce overshoot and
ringing when high-speed op amps are used.
Full-scale adjustment is achieved by loading the appropriate
DAC’s digital inputs with 1111 1111 1111 and adjusting R1 (or
R3 for DAC B) so that:
 4095 
VOUT = VREF × 
4096 
Full-scale can also be adjusted by varying VREF voltage and
eliminating R1, R2, R3, and R4. Zero adjustment is performed by
Figure 7. Unipolar Configuration (2-Ouadrant Multiplication)
–12–
REV. B
DAC8248
loading the appropriate DAC’s digital inputs with 0000 0000
0000 and adjusting the op amp’s offset voltage to 0 V. It is recommended that the op amp offset voltage be adjusted to less
than 10% of 1 LSB (244 µV), and over the operating temperature range of interest. This will ensure the DAC’s monotonicity
and minimize gain and linearity errors.
BIPOLAR OPERATION
The bipolar (offset binary) 4-quadrant configuration using the
DAC8248 is shown in Figure 8, and the corresponding code is
shown in Table II. The circuit makes use of the OP470, a quad
op amp (use four OP42s for applications requiring higher
speeds).
The full-scale output voltage may be adjusted by varying VREF or
the value of R5 and R8, and thus eliminating resistors R1, R2,
R3, and R4. If resistors R1 through R4 are omitted, then R5, R6,
R7 (R8, R9, and R10 for DAC B) should be ratio-matched to
0.01% to keep gain error within data sheet specifications. The resistors should have identical temperature-coefficients if operating
over the full temperature range.
Zero and full-scale are adjusted in one of two ways and are at
the users discretion. Zero-output is adjusted by loading the appropriate DAC’s digital inputs with 1000 0000 0000 and varying R1 (R3 for DAC B) so that VOUT A (or VOUT B) equals 0 V.
If R1, R2 (R3, R4 for DAC B) are omitted, then zero output
can be adjusted by varying R6, R7 ratios (R9, R10 for DAC B).
Full-scale is adjusted by loading the appropriate DAC’s digital
inputs with 1111 1111 1111 and varying R5 (R8 for DAC B).
Table II. Bipolar (Offset Binary) Code Table
(Refer to Figure 8)
Binary Number in
DAC Register
MSB
LSB
Analog Output, VOUT
(DAC A or DAC B)
1111 1111 1111
+VREF 
1000 0000 0001
+VREF 
1000 0000 0000
0V
0111 1111 1111
–VREF 
0000 0000 0000
–VREF 
 2047 
2048 
 1 
2048 
 1 
2048 
 2048 
2048 
NOTE:
1 LSB=(2–11)(VREF) =
1
2048
(VREF)
SINGLE SUPPLY OPERATION
CURRENT STEERING MODE
Because the DAC8248’s R-2R resistor ladder terminating resistor is internally connected to AGND, it lends itself well for
single supply operation in the current steering mode configuration. This means that AGND can be raised above system
Figure 8. Bipolar Configuration (4-Quadrant Multiplication)
REV. B
–13–
DAC8248
ground as shown in Figure 9. The output voltage will be between +5 V and +10 V depending on the digital input code.
The output expression is given by:
VOUT = VOS × (D/4096)(VOS)
APPLICATIONS TIPS
GENERAL GROUND MANAGEMENT
Grounding techniques should be tailored to each individual system. Ground loops should be avoided, and ground current paths
should be as short as possible and have a low impedance.
where VOS = Offset Reference Voltage (+5 V in Figure 9)
D = Decimal Equivalent of the Digital Input Word
VOLTAGE SWITCHING MODE
Figure 10 shows the DAC8248 in another single supply configuration. The R-2R ladder is used in the voltage switching mode
and functions as a voltage divider. The output voltage (at the
VREF pin) exhibits a constant impedance R (typically 11 kΩ) and
must be buffered by an op amp. The RFB pins are not used and
are left open. The reference input voltage must be maintained
within +1.25 V of AGND, and VDD between +12 V and +15 V;
this ensures that device accuracy is preserved.
The output voltage expression is given by:
VOUT = VREF (D/4096)
where D = Decimal Equivalent of the Digital Input Word
The DAC8248’s AGND and DGND pins should be tied together at the device socket to prevent digital transients from appearing at the analog output. This common point then becomes
the single ground point connection. AGND and DGND is then
brought out separately and tied to their respective power supply
grounds. Ground loops can be created if both grounds are tied
together at more than one location, i.e., tied together at the device and at the digital and analog power supplies.
PC board ground plane can be used for the single point ground
connection should the connections not be practical at the device
socket. If neither of these connections are practical or allowed,
then the device should be placed as close as possible to the systems single point ground connection. Back-to-back Schottky diodes should then be connected between AGND and DGND.
POWER SUPPLY DECOUPLING
Power supplies used with the DAC8248 should be well filtered
and regulated. Local supply decoupling consisting of a 1 µF to
10 µF tantalum capacitor in parallel with a 0.1 µF ceramic is
highly recommended. The capacitors should be connected between the VDD and DGND pins and at the device socket.
Figure 9. Single Supply Operation (Current Switching Mode)
–14–
REV. B
DAC8248
Figure 10. Single Supply Operation (Voltage Switching Mode)
Figure 11. Digitally-Programmable Window Detector (Upper/Lower Limit Detector)
MICROPROCESSOR INTERFACE CIRCUITS
The DAC8248s versatile loading structure allows direct interface to an 8-bit microprocessor. Its simplicity reduces the number of required glue logic components. Figures 12 and 13 show
the DAC8248 interface configurations with the MC6809 and
MC68008 microprocessors.
REV. B
–15–
000000000
Figure 13. DAC8248 to MC68008 Interface
Figure 12. DAC8248 to MC6809 Interface
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
24-Lead Cerdip
(Q-24)
0.005 (0.13) MIN
0.098 (2.49) MAX
24
13
0.310 (7.87)
0.220 (5.59)
1
12
0.320 (8.13)
0.290 (7.37)
PIN 1
1.280 (32.51) MAX
0.200 (5.08)
MAX
0.060 (1.52)
0.015 (0.38)
0.150
(3.81)
MIN
0.200 (5.08)
0.125 (3.18)
0.023 (0.58)
0.014 (0.36)
0.100 (2.54)
BSC
0.070 (1.78) SEATING
0.030 (0.76) PLANE
15°
0°
0.015 (0.38)
0.008 (0.20)
24 Lead SOL
(R-24)
24-Lead Plastic DIP
(N-24)
1
12
PIN 1
0.210
(5.33)
MAX
0.200 (5.05)
0.125 (3.18)
0.280 (7.11)
0.240 (6.10)
0.325 (8.25)
0.300 (7.62) 0.195 (4.95)
0.115 (2.93)
0.060 (1.52)
0.015 (0.38)
0.150
(3.81)
MIN
0.022 (0.558)
0.014 (0.356)
0.100 (2.54)
BSC
0.070 (1.77)
0.045 (1.15)
SEATING
PLANE
24
13
1
12
PIN 1
0.015 (0.381)
0.008 (0.204)
0.0118 (0.30)
0.0040 (0.10)
–16–
0.1043 (2.65)
0.0926 (2.35)
0.0500
(1.27)
BSC
PRINTED IN U.S.A.
13
0.4193 (10.65)
0.3937 (10.00)
24
0.2992 (7.60)
0.2914 (7.40)
0.6141 (15.60)
0.5985 (15.20)
1.275 (32.30)
1.125 (28.60)
8°
0.0192 (0.49)
0°
SEATING
0.0125 (0.32)
0.0138 (0.35) PLANE
0.0091 (0.23)
0.0291 (0.74)
x 45°
0.0098 (0.25)
0.0500 (1.27)
0.0157 (0.40)
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