FUJITSU SEMICONDUCTOR DATA SHEET DS05-20907-3E FLASH MEMORY CMOS 32 M (4M × 8/2M × 16) BIT MirrorFlashTM* MBM29PL32TM/BM 90/10 ■ DESCRIPTION The MBM29PL32TM/BM is a 32M-bit, 3.0 V-only Flash memory organized as 4M bytes by 8 bits or 2M words by 16 bits. The MBM29PL32TM/BM is offered in 48-pin TSOP(1) and 48-ball FBGA. The device is designed to be programmed in-system with the standard 3.0 V VCC supply. 12.0 V VPP and 5.0 V VCC are not required for write or erase operations. The devices can also be reprogrammed in standard EPROM programmers. (Continued) ■ PRODUCT LINE UP Part No. MBM29PL32TM/BM 90 10 3.0 V to 3.6 V 3.0 V to 3.6 V Max Address Access Time 90 ns 100 ns Max CE Access Time 90 ns 100 ns Max Page Read Access Time 25 ns 30 ns VCC ■ PACKAGES 48-pin plastic TSOP (1) 48-ball plastic FBGA (FPT-48P-M19) (BGA-48P-M20) * : MirrorFlashTM is a trademark of Fujitsu Limited. Notes : • Programming in byte mode ( × 8) is prohibited. • Programming to the address that already contains data is prohibited. (It is mandatory to erase data prior to overprogram on the same address.) MBM29PL32TM/BM90/10 (Continued) The standard MBM29PL32TM/BM offers access times of 90 ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention the devices have separate chip enable (CE), write enable (WE), and output enable (OE) controls. The MBM29PL32TM/BM supports command set compatible with JEDEC single-power-supply EEPROMS standard. Commands are written into the command register. The register contents serve as input to an internal statemachine which controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the devices is similar to reading from 5.0 V and 12.0 V Flash or EPROM devices. The MBM29PL32TM/BM is programmed by executing the program command sequence. This will invoke the Embedded Program AlgorithmTM which is an internal algorithm that automatically times the program pulse widths and verifies proper cell margin. Erase is accomplished by executing the erase command sequence. This will invoke the Embedded Erase AlgorithmTM which is an internal algorithm that automatically preprograms the array if it is not already programmed before executing the erase operation. During erase, the device automatically times the erase pulse widths and verifies proper cell margin. The device also features a sector erase architecture. The sector mode allows each sector to be erased and reprogrammed without affecting other sectors. All sectors are erased when shipped from the factory. The device features single 3.0 V power supply operation for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. A low VCC detector automatically inhibits write operations on the loss of power. The end of program or erase is detected by Data Polling of DQ7, by the Toggle Bit feature on DQ6. Once the end of a program or erase cycle has been completed, the devices internally return to the read mode. Fujitsu Flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability, and cost effectiveness. The devices electrically erase all bits within a sector simultaneously via hot-hole assisted erase. The words are programmed one word at a time using the EPROM programming mechanism of hot electron injection. 2 MBM29PL32TM/BM90/10 ■ FEATURES • 0.23 µm Process Technology • Single 3.0 V read, program and erase Minimizes system level power requirements • Industry-standard pinouts 48-pin TSOP (1) (Package suffix: TN - Normal Bend Type) 48-ball FBGA(Package suffix: PBT) • Minimum 100,000 program/erase cycles • High performance Page mode Fast 8 bytes / 4 words access capability • Sector erase architecture Eight 8K byte and sixty-three 64K byte sectors Eight 4K word and sixty-three 32K word sectors Any combination of sectors can be concurrently erased. Also supports full chip erase • Boot Code Sector Architecture T = Top sector B = Bottom sector • HiddenROM 256 bytes / 128 words of HiddenROM, accessible through a “HiddenROM Entry” command sequence Factory serialized and protected to provide a secure electronic serial number (ESN) • WP/ACC input pin At VIL, allows protection of outermost two 8K bytes / 4K words sectors, regardless of sector protection/unprotection status At VACC, increases program performance • Embedded EraseTM* Algorithms Automatically pre-programs and erases the chip or any sector • Embedded ProgramTM* Algorithms Automatically writes and verifies data at specified address • Data Polling and Toggle Bit feature for detection of program or erase cycle completion • Ready/Busy output (RY/BY) Hardware method for detection of program or erase cycle completion • Automatic sleep mode When addresses remain stable, automatically switches themselves to low power mode • Program Suspend/Resume Suspends the program operation to allow a read in another address • Low VCC write inhibit ≤ 2.5 V • Erase Suspend/Resume Suspends the erase operation to allow a read data and/or program in another sector within the same device • Sector Group Protection Hardware method disables any combination of sector groups from program or erase operations • Sector Group Protection Set function by Extended sector protect command • Fast Programming Function by Extended Command • Temporary sector group unprotection Temporary sector group unprotection via the RESET pin This feature allows code changes in previously locked sectors • In accordance with CFI (Common Flash Memory Interface) * : Embedded EraseTM and Embedded ProgramTM are trademarks of Advanced Micro Devices, Inc. 3 MBM29PL32TM/BM90/10 ■ PIN ASSIGNMENTS 48-pin Plastic TSOP(1) (Top View) A15 A14 A13 A12 A11 A10 A9 A8 A19 A20 WE RESET N.C. WP/ACC RY/BY A18 A17 A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 (Marking Side) (FPT-48P-M19) 48-ball plastic FBGA (Top View) Marking Side A6 B6 C6 D6 E6 A13 A12 A14 A15 A16 A5 B5 C5 D5 A9 A8 A10 A11 A4 B4 C4 WE RESET N.C. A3 B3 RY/BY WP/ ACC D4 A19 C3 D3 A18 A20 E5 F6 H6 F5 G5 H5 DQ7 DQ14 DQ13 DQ6 E4 F4 DQ5 DQ12 E3 F3 G4 H4 VCC DQ4 G3 H3 DQ2 DQ10 DQ11 DQ3 A2 B2 C2 D2 E2 F2 G2 H2 A7 A17 A6 A5 DQ0 DQ8 DQ9 DQ1 A1 B1 C1 D1 E1 F1 G1 H1 A3 A4 A2 A1 A0 CE OE VSS (BGA-48P-M20) 4 G6 BYTE DQ15/ VSS A-1 A16 BYTE VSS DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE VSS CE A0 MBM29PL32TM/BM90/10 ■ PIN DESCRIPTIONS MBM29PL32TM/BM Pin Configuration Pin Function A20 to A0, A-1 Address Inputs DQ15 to DQ0 Data Inputs/Outputs CE Chip Enable OE Output Enable WE Write Enable WP/ACC RESET Hardware Write Protection/Program Acceleration Hardware Reset Pin/Temporary Sector Group Unprotection BYTE Select Byte or Word mode RY/BY Ready/Busy Output VCC Device Power Supply VSS Device Ground N.C. No Internal Connection 5 MBM29PL32TM/BM90/10 ■ BLOCK DIAGRAM DQ15 to DQ0 VCC VSS WE RESET Input/Output Buffers Erase Voltage Generator State Control WP/ACC BYTE Command Register Program Voltage Generator Chip Enable Output Enable Logic CE OE STB Timer for Program/Erase Address Latch Y-Gating X-Decoder Cell Matrix A1, A0 (A-1) ■ LOGIC SYMBOL A-1 21 A20 to A0 16 or 8 DQ 15 to DQ 0 OE WE WP/ACC RESET BYTE 6 RY/BY Data Latch Y-Decoder A20 to A2 CE STB MBM29PL32TM/BM90/10 ■ DEVICE BUS OPERATION MBM29PL32TM/BM User Bus Operations (Word Mode : BYTE = VIH) Operation CE OE WE A0 A1 A2 A3 A6 A9 DQ0 to DQ15 RESET WP/ ACC Standby H X X X X X X X X Hi-Z H X Autoselect Manufacture Code*1 L L H L L L L L VID Code H X Autoselect Device Code*1 L L H H L L L L VID Code H X Read L L H A0 A1 A2 A3 A6 A9 DOUT H X Output Disable L H H X X X X X X Hi-Z H X Write (Program/Erase) L H L A0 A1 A2 A3 A6 A9 *3 H *4 Enable Sector Group Protection*2 L H L L H L L L X *3 VID H Temporary Sector Group Unprotection X X X X X X X X X *3 VID H Reset (Hardware) X X X X X X X X X Hi-Z L X Sector Write Protection X X X X X X X X X X H L Legend : L = VIL, H = VIH, X = VIL or VIH. See “■ ELECTRICAL CHARACTERISTICS 1. DC Characteristics” for voltage levels. Hi-Z = High-Z, VID = 11.5 V to 12.5 V *1 : Manufacturer and device codes may also be accessed via a command register write sequence. See “Sector Group Protection Verify Autoselect Codes”. *2 : Refer to “Sector Group Protection” in ■ FUNCTIONAL DESCRIPTION. *3 : DIN or DOUT as required by command sequence, data pulling, or sector protect algorithm *4 : If WP/ACC = VIL, the outermost two sectors remain protected. If WP/ACC = VIH, the outermost two sectors will be protected or unprotected as determined by the method specified in “Sector Group Protection” in ■ FUNCTIONAL DESCRIPTION. 7 MBM29PL32TM/BM90/10 MBM29PL32TM/BM User Bus Operations (Byte Mode : BYTE = VIL) Operation CE OE WE DQ15/ A0 A-1 A1 A2 A3 A6 A9 DQ0 to WP/ RESET DQ7 ACC Standby H X X X X X X X X X Hi-Z H X Autoselect Manufacture Code*1 L L H L L L L L L VID Code H X Autoselect Device Code*1 L L H L H L L L L VID Code H X Read L L H A-1 A0 A1 A2 A3 A6 A9 DOUT H X Output Disable L H H X X X X X X X Hi-Z H X Write (Erase) L H L A-1 A0 A1 A2 A3 A6 A9 *3 H *4 Enable Sector Group Protection*2 L H L L L H L L L X *3 VID H Temporary Sector Group Unprotection X X X X X X X X X X *3 VID H Reset (Hardware) X X X X X X X X X X Hi-Z L X Sector Write Protection X X X X X X X X X X X H L Legend : L = VIL, H = VIH, X = VIL or VIH. See “■ ELECTRICAL CHARACTERISTICS 1. DC Characteristics” for voltage levels. Hi-Z = High-Z, VID = 11.5 V to 12.5 V *1 : Manufacturer and device codes may also be accessed via a command register write sequence. See “MBM29PL32TM/BM Standard Command Definitions”. *2 : Refer to “Sector Group Protection”. *3 : DIN or DOUT as required by command sequence, data pulling, or sector protect algorithm *4 : If WP/ACC = VIL, the outermost two sectors remain protected. If WP/ACC = VIH, the outermost two sectors will be protected or unprotected as determined by the method specified in “Sector Group Protection” in page 23. 8 MBM29PL32TM/BM90/10 MBM29PL32TM/BM Standard Command Definitions*1 First Bus Second Bus Third Bus Bus Write Write Cycle Write Cycle Write Cycle Cycles Req'd Command Sequence Addr Data Addr Reset*2 Reset*2 Autoselect Program Chip Erase Sector Erase Word/ Byte Word Byte Word Byte Word Word Byte Word Byte 1 3 3 4 6 6 XXXh F0h 555h AAAh 555h AAAh 555h 555h AAAh 555h AAAh AAh AAh — 2AAh 555h 2AAh 555h AAh 2AAh AAh AAh 2AAh 555h 2AAh 555h Data — 55h 55h 55h 55h 55h Fourth Bus Read/Write Cycle Addr Data Addr — 555h AAAh 555h AAAh 555h 555h AAAh 555h AAAh — — — — RA*13 RD*13 — — — — 90h 00h*13 04h*13 — — — — A0h — — — — 80h 80h PA 555h AAAh 555h AAAh — Addr Data Addr Data — F0h — Data Fifth Bus Sixth Bus Write Cycle Write Cycle PD AAh AAh 2AAh 555h 2AAh 555h 55h 555h AAAh 10h 55h SA 30h Program/Erase Suspend*3 1 XXXh B0h — — — — — — — — — — Program/Erase Resume*3 1 XXXh 30h — — — — — — — — — — 20h — — — — — — — — — — — — — — — — — — — — — — 55h SA 25h SA 0Fh PA PD WBL PD — — — — — — — — — F0h — — — — — — SD*13 — — — — Set to Fast Mode*4 Word Byte 3 555h AAAh AAh 2AAh 555h 55h Fast Program*4 Word 2 XXXh A0h Reset from Fast Mode*5 Word/ Byte 2 XXXh 90h XXXh 00h*12 Write to Buffer Word Byte Program Buffer to Flash (Confirm) Write to Buffer Abort Reset*6 Word Extended Sector Group Protection*7,*8 Word Query*9 Byte Byte Word Byte HiddenROM Entry*10 Word HiddenROM Program *10,*11 Word HiddenROM Exit*11 Byte Byte Word Byte 20 1 3 4 1 3 4 4 555h AAAh SA AAh 29h 555h AAAh AAh 555h AAAh 555h AAAh 555h AAAh 2AAh 555h — PD 2AAh AAh XXXh 60h 55h PA 98h AAh AAh AAh 555h 555h AAAh 555h 55h AAAh SGA SGA 60h SGA 40h — — — — — — — — — — 88h — — — — — — A0h PA PD — — — — 90h XXXh 00h — — — — 2AAh 555h 2AAh 555h 2AAh 555h 55h 55h 55h 555h AAAh 555h AAAh 555h AAAh *13 (Continued) 9 MBM29PL32TM/BM90/10 (Continued) Legend : Address bits A20 to A11 = X = “H” or “L” for all address commands except for Program Address (PA), Sector Address (SA) and Sector Group Address (SGA). Bus operations are defined in “MBM29PL32TM/BM User Bus Operations (Word Mode : BYTE = VIH)” and “MBM29PL32TM/BM User Bus Operations (Byte Mode : BYTE = VIL)”. RA = Address of the memory location to be read. PA = Address of the memory location to be programmed. Addresses are latched on the falling edge of the write pulse. SA = Address of the sector to be programmed / erased. The combination of A20, A19, A18, A17, A16, A15, A14, A13 and A12 will uniquely select any sector. See “Sector Address Table (MBM29PL32TM)” and “Sector Address Table (MBM29PL32BM)”. SGA = Sector Group Address to be protected. See “Sector Group Address Table (MBM29PL32TM)” and “Sector Group Address Table (MBM29PL32BM)”. RD = Data read from location RA during read operation. PD = Data to be programmed at location PA. Data is latched on the rising edge of write plus. WBL = Write Buffer Location HRA = Address of the HiddenROM area ; MBM29PL32TM (Top Boot Type)Word Mode : 1FFF7Fh to 1FFFFFh Byte Mode : 3FFEFFh to 3FFFFFh MBM29PL32BM (Bottom Boot Type)Word Mode : 000000h to 00007Fh Byte Mode : 000000h to 0000FFh *1 : The command combinations not described in “MBM29PL32TM/BM Standard Command Definitions” are illegal. *2 : Both of these reset commands are equivalent except for "Write to Buffer Abort" reset. *3 : The Erase Suspend and Erase Resume command are valid only during a sector erase operation. *4 : The Set to Fast Mode command is required prior to the Fast Program command. *5 : The Reset from Fast Mode command is required to return to the read mode when the device is in fast mode. *6 : Reset to the read mode. The Write to Buffer Abort Reset command is required after the Write to Buffer operation was aborted. *7 : This command is valid while RESET = VID. *8 : Sector Group Address (SGA) with A6 = 0, A3 = 0, A2 = 0, A1 = 1, and A0 = 0 *9 : The valid address are A6 to A0. *10 : The HiddenROM Entry command is required prior to the HiddenROM programming. *11 : This command is valid during HiddenROM mode. *12 : The data “F0h” is also acceptable. *13 : Indicates read cycle. 10 MBM29PL32TM/BM90/10 Sector Group Protection Verify Autoselect Codes Type Manufacturer’s Code Word Device Code Byte Word MBM29PL32TM Extended Device Code*2 Byte Word Byte Word MBM29PL32BM Byte Word Byte Sector Group Protection*4 A20 to A12 A6 A3 A2 A1 A0 A-1*1 Code (HEX) X VIL VIL VIL VIL VIL VIL 04h X VIL VIL VIL VIL VIH X 227Eh VIL 7Eh X VIL VIH VIH VIH VIL X 221Ah VIL 1Ah X VIL VIH VIH VIH VIH X 2201h VIL 01h X VIL VIH VIH VIH VIL X 221Ah VIL 1Ah X VIL VIH VIH VIH VIH X 2200h VIL 00h Sector Group Addresses VIL VIL VIL VIH VIL VIL *3 *1 : A-1 is for Byte mode. *2 : At Word mode, a read cycle at address 01h ( at Byte mode, 02h ) outputs device code. When 227Eh ( at Byte mode, 7Eh ) is output, it indicates that reading two additional codes, called Extended Device Codes, will be required. Therefore the system may continue reading out these Extended Device Codes at the address of 0Eh ( at Byte mode, 1Ch ), as well as at 0Fh ( at Byte mode, 1Eh ). *3 : Outputs 01h at protected sector group addresses and outputs 00h at unprotected sector group addresses. *4 : Toggle CE, provided SGA = fix and WE = fix. The data in the first cycle is invalid. The data in the second one is valid. 11 MBM29PL32TM/BM90/10 Sector Address Table (MBM29PL32TM) Sector Address Sector A20 A19 A18 A17 A16 A15 A14 A13 A12 Sector Size (Kbytes/ Kwords) ×8) (× Address Range ×16) (× Address Range SA0 0 0 0 0 0 0 X X X 64/32 000000h to 00FFFFh 000000h to 007FFFh SA1 0 0 0 0 0 1 X X X 64/32 010000h to 01FFFFh 008000h to 00FFFFh SA2 0 0 0 0 1 0 X X X 64/32 020000h to 02FFFFh 010000h to 017FFFh SA3 0 0 0 0 1 1 X X X 64/32 030000h to 03FFFFh 018000h to 01FFFFh SA4 0 0 0 1 0 0 X X X 64/32 040000h to 04FFFFh 020000h to 027FFFh SA5 0 0 0 1 0 1 X X X 64/32 050000h to 05FFFFh 028000h to 02FFFFh SA6 0 0 0 1 1 0 X X X 64/32 060000h to 06FFFFh 030000h to 037FFFh SA7 0 0 0 1 1 1 X X X 64/32 070000h to 07FFFFh 038000h to 03FFFFh SA8 0 0 1 0 0 0 X X X 64/32 080000h to 08FFFFh 040000h to 047FFFh SA9 0 0 1 0 0 1 X X X 64/32 090000h to 09FFFFh 048000h to 04FFFFh SA10 0 0 1 0 1 0 X X X 64/32 0A0000h to 0AFFFFh 050000h to 057FFFh SA11 0 0 1 0 1 1 X X X 64/32 0B0000h to 0BFFFFh 058000h to 05FFFFh SA12 0 0 1 1 0 0 X X X 64/32 0C0000h to 0CFFFFh 060000h to 067FFFh SA13 0 0 1 1 0 1 X X X 64/32 0D0000h to 0DFFFFh 068000h to 06FFFFh SA14 0 0 1 1 1 0 X X X 64/32 0E0000h to 0EFFFFh 070000h to 077FFFh SA15 0 0 1 1 1 1 X X X 64/32 0F0000h to 0FFFFFh 078000h to 07FFFFh SA16 0 1 0 0 0 0 X X X 64/32 100000h to 10FFFFh 080000h to 087FFFh SA17 0 1 0 0 0 1 X X X 64/32 110000h to 11FFFFh 088000h to 08FFFFh SA18 0 1 0 0 1 0 X X X 64/32 120000h to 12FFFFh 090000h to 097FFFh SA19 0 1 0 0 1 1 X X X 64/32 130000h to 13FFFFh 098000h to 09FFFFh SA20 0 1 0 1 0 0 X X X 64/32 140000h to 14FFFFh 0A0000h to 0A7FFFh SA21 0 1 0 1 0 1 X X X 64/32 150000h to 15FFFFh 0A8000h to 0AFFFFh SA22 0 1 0 1 1 0 X X X 64/32 160000h to 16FFFFh 0B0000h to 0B7FFFh SA23 0 1 0 1 1 1 X X X 64/32 170000h to 17FFFFh 0B8000h to 0BFFFFh SA24 0 1 1 0 0 0 X X X 64/32 180000h to 18FFFFh 0C0000h to 0C7FFFh SA25 0 1 1 0 0 1 X X X 64/32 190000h to 19FFFFh 0C8000h to 0CFFFFh SA26 0 1 1 0 1 0 X X X 64/32 1A0000h to 1AFFFFh 0D0000h to 0D7FFFh SA27 0 1 1 0 1 1 X X X 64/32 1B0000h to 1BFFFFh 0D8000h to 0DFFFFh SA28 0 1 1 1 0 0 X X X 64/32 1C0000h to 1CFFFFh 0E0000h to 0E7FFFh SA29 0 1 1 1 0 1 X X X 64/32 1D0000h to 1DFFFFh 0E8000h to 0EFFFFh SA30 0 1 1 1 1 0 X X X 64/32 1E0000h to 1EFFFFh 0F0000h to 0F7FFFh SA31 0 1 1 1 1 1 X X X 64/32 1F0000h to 1FFFFFh 0F8000h to 0FFFFFh (Continued) 12 MBM29PL32TM/BM90/10 Sector Address Sector A20 A19 A18 A17 A16 A15 A14 A13 A12 Sector Size (Kbytes/ Kwords) ×8) (× Address Range ×16) (× Address Range SA32 1 0 0 0 0 0 X X X 64/32 200000h to 20FFFFh 100000h to 107FFFh SA33 1 0 0 0 0 1 X X X 64/32 210000h to 21FFFFh 108000h to 10FFFFh SA34 1 0 0 0 1 0 X X X 64/32 220000h to 22FFFFh 110000h to 117FFFh SA35 1 0 0 0 1 1 X X X 64/32 230000h to 23FFFFh 118000h to 11FFFFh SA36 1 0 0 1 0 0 X X X 64/32 240000h to 24FFFFh 120000h to 127FFFh SA37 1 0 0 1 0 1 X X X 64/32 250000h to 25FFFFh 128000h to 12FFFFh SA38 1 0 0 1 1 0 X X X 64/32 260000h to 26FFFFh 130000h to 137FFFh SA39 1 0 0 1 1 1 X X X 64/32 270000h to 27FFFFh 138000h to 13FFFFh SA40 1 0 1 0 0 0 X X X 64/32 280000h to 28FFFFh 140000h to 147FFFh SA41 1 0 1 0 0 1 X X X 64/32 290000h to 29FFFFh 148000h to 14FFFFh SA42 1 0 1 0 1 0 X X X 64/32 2A0000h to 2AFFFFh 150000h to 157FFFh SA43 1 0 1 0 1 1 X X X 64/32 2B0000h to 2BFFFFh 158000h to 15FFFFh SA44 1 0 1 1 0 0 X X X 64/32 2C0000h to 2CFFFFh 160000h to 167FFFh SA45 1 0 1 1 0 1 X X X 64/32 2D0000h to 2DFFFFh 168000h to 16FFFFh SA46 1 0 1 1 1 0 X X X 64/32 2E0000h to 2EFFFFh 170000h to 177FFFh SA47 1 0 1 1 1 1 X X X 64/32 2F0000h to 2FFFFFh 178000h to 17FFFFh SA48 1 1 0 0 0 0 X X X 64/32 300000h to 30FFFFh 180000h to 187FFFh SA49 1 1 0 0 0 1 X X X 64/32 310000h to 31FFFFh 188000h to 18FFFFh SA50 1 1 0 0 1 0 X X X 64/32 320000h to 32FFFFh 190000h to 197FFFh SA51 1 1 0 0 1 1 X X X 64/32 330000h to 33FFFFh 198000h to 19FFFFh SA52 1 1 0 1 0 0 X X X 64/32 340000h to 34FFFFh 1A0000h to 1A7FFFh SA53 1 1 0 1 0 1 X X X 64/32 350000h to 35FFFFh 1A8000h to 1AFFFFh SA54 1 1 0 1 1 0 X X X 64/32 360000h to 36FFFFh 1B0000h to 1B7FFFh SA55 1 1 0 1 1 1 X X X 64/32 370000h to 37FFFFh 1B8000h to 1BFFFFh SA56 1 1 1 0 0 0 X X X 64/32 380000h to 38FFFFh 1C0000h to 1C7FFFh SA57 1 1 1 0 0 1 X X X 64/32 390000h to 39FFFFh 1C8000h to 1CFFFFh SA58 1 1 1 0 1 0 X X X 64/32 3A0000h to 3AFFFFh 1D0000h to 1D7FFFh SA59 1 1 1 0 1 1 X X X 64/32 3B0000h to 3BFFFFh 1D8000h to 1DFFFFh SA60 1 1 1 1 0 0 X X X 64/32 3C0000h to 3CFFFFh 1E0000h to 1E7FFFh SA61 1 1 1 1 0 1 X X X 64/32 3D0000h to 3DFFFFh 1E8000h to 1EFFFFh SA62 1 1 1 1 1 0 X X X 64/32 3E0000h to 3EFFFFh 1F0000h to 1F7FFFh SA63 1 1 1 1 1 1 0 0 0 8/4 3F0000h to 3F1FFFh 1F8000h to 1F8FFFh SA64 1 1 1 1 1 1 0 0 1 8/4 3F2000h to 3F3FFFh 1F9000h to 1F9FFFh (Continued) 13 MBM29PL32TM/BM90/10 (Continued) Sector Address Sector A20 A19 A18 A17 A16 A15 A14 A13 A12 Sector Size (Kbytes/ Kwords) ×8) (× Address Range ×16) (× Address Range SA65 1 1 1 1 1 1 0 1 0 8/4 3F4000h to 3F5FFFh 1FA000h to 1FAFFFh SA66 1 1 1 1 1 1 0 1 1 8/4 3F6000h to 3F7FFFh 1FB000h to 1FBFFFh SA67 1 1 1 1 1 1 1 0 0 8/4 3F8000h to 3F9FFFh 1FC000h to 1FCFFFh SA68 1 1 1 1 1 1 1 0 1 8/4 3FA000h to 3FBFFFh 1FD000h to 1FDFFFh SA69 1 1 1 1 1 1 1 1 0 8/4 3FC000h to 3FDFFFh 1FE000h to 1FEFFFh SA70 1 1 1 1 1 1 1 1 1 8/4 3FE000h to 3FFFFFh 1FF000h to 1FFFFFh Note : The address range is A20 to A-1 if in Byte mode (BYTE = VIL) . The address range is A20 to A0 if in Word mode (BYTE = VIH) . 14 MBM29PL32TM/BM90/10 Sector Address Table (MBM29PL32BM) Sector Address Sector A20 A19 A18 A17 A16 A15 A14 A13 A12 Sector Size (Kbytes/ Kwords) ×8) (× Address Range ×16) (× Address Range SA70 1 1 1 1 1 1 X X X 64/32 3F0000h to 3FFFFFh 1F8000h to 1FFFFFh SA69 1 1 1 1 1 0 X X X 64/32 3E0000h to 3EFFFFh 1F0000h to 1F7FFFh SA68 1 1 1 1 0 1 X X X 64/32 3D0000h to 3DFFFFh 1E8000h to 1EFFFFh SA67 1 1 1 1 0 0 X X X 64/32 3C0000h to 3CFFFFh 1E0000h to 1E7FFFh SA66 1 1 1 0 1 1 X X X 64/32 3B0000h to 3BFFFFh 1D8000h to 1DFFFFh SA65 1 1 1 0 1 0 X X X 64/32 3A0000h to 3AFFFFh 1D0000h to 1D7FFFh SA64 1 1 1 0 0 1 X X X 64/32 390000h to 39FFFFh 1C8000h to 1CFFFFh SA63 1 1 1 0 0 0 X X X 64/32 380000h to 38FFFFh 1C0000h to 1C7FFFh SA62 1 1 0 1 1 1 X X X 64/32 370000h to 37FFFFh 1B8000h to 1BFFFFh SA61 1 1 0 1 1 0 X X X 64/32 360000h to 36FFFFh 1B0000h to 1B7FFFh SA60 1 1 0 1 0 1 X X X 64/32 350000h to 35FFFFh 1A8000h to 1AFFFFh SA59 1 1 0 1 0 0 X X X 64/32 340000h to 34FFFFh 1A0000h to 1A7FFFh SA58 1 1 0 0 1 1 X X X 64/32 330000h to 33FFFFh 198000h to 19FFFFh SA57 1 1 0 0 1 0 X X X 64/32 320000h to 32FFFFh 190000h to 197FFFh SA56 1 1 0 0 0 1 X X X 64/32 310000h to 31FFFFh 188000h to 18FFFFh SA55 1 1 0 0 0 0 X X X 64/32 300000h to 30FFFFh 180000h to 187FFFh SA54 1 0 1 1 1 1 X X X 64/32 2F0000h to 2FFFFFh 178000h to 17FFFFh SA53 1 0 1 1 1 0 X X X 64/32 2E0000h to 2EFFFFh 170000h to 177FFFh SA52 1 0 1 1 0 1 X X X 64/32 2D0000h to 2DFFFFh 168000h to 16FFFFh SA51 1 0 1 1 0 0 X X X 64/32 2C0000h to 2CFFFFh 160000h to 167FFFh SA50 1 0 1 0 1 1 X X X 64/32 2B0000h to 2BFFFFh 158000h to 15FFFFh SA49 1 0 1 0 1 0 X X X 64/32 2A0000h to 2AFFFFh 150000h to 157FFFh SA48 1 0 1 0 0 1 X X X 64/32 290000h to 29FFFFh 148000h to 14FFFFh SA47 1 0 1 0 0 0 X X X 64/32 280000h to 28FFFFh 140000h to 147FFFh SA46 1 0 0 1 1 1 X X X 64/32 270000h to 27FFFFh 138000h to 13FFFFh SA45 1 0 0 1 1 0 X X X 64/32 260000h to 26FFFFh 130000h to 137FFFh SA44 1 0 0 1 0 1 X X X 64/32 250000h to 25FFFFh 128000h to 12FFFFh SA43 1 0 0 1 0 0 X X X 64/32 240000h to 24FFFFh 120000h to 127FFFh SA42 1 0 0 0 1 1 X X X 64/32 230000h to 23FFFFh 118000h to 11FFFFh SA41 1 0 0 0 1 0 X X X 64/32 220000h to 22FFFFh 110000h to 117FFFh SA40 1 0 0 0 0 1 X X X 64/32 210000h to 21FFFFh 108000h to 10FFFFh SA39 1 0 0 0 0 0 X X X 64/32 200000h to 20FFFFh 100000h to 107FFFh SA38 0 1 1 1 1 1 X X X 64/32 1F0000h to 1FFFFFh 0F8000h to 0FFFFFh (Continued) 15 MBM29PL32TM/BM90/10 Sector Address Sector A20 A19 A18 A17 A16 A15 A14 A13 A12 Sector Size (Kbytes/ Kwords) ×8) (× Address Range ×16) (× Address Range SA37 0 1 1 1 1 0 X X X 64/32 1E0000h to 1EFFFFh 0F0000h to 0F7FFFh SA36 0 1 1 1 0 1 X X X 64/32 1D0000h to 1DFFFFh 0E8000h to 0EFFFFh SA35 0 1 1 1 0 0 X X X 64/32 1C0000h to 1CFFFFh 0E0000h to 0E7FFFh SA34 0 1 1 0 1 1 X X X 64/32 1B0000h to 1BFFFFh 0D8000h to 0DFFFFh SA33 0 1 1 0 1 0 X X X 64/32 1A0000h to 1AFFFFh 0D0000h to 0D7FFFh SA32 0 1 1 0 0 1 X X X 64/32 190000h to 19FFFFh 0C8000h to 0CFFFFh SA31 0 1 1 0 0 0 X X X 64/32 180000h to 18FFFFh 0C0000h to 0C7FFFh SA30 0 1 0 1 1 1 X X X 64/32 170000h to 17FFFFh 0B8000h to 0BFFFFh SA29 0 1 0 1 1 0 X X X 64/32 160000h to 16FFFFh 0B0000h to 0B7FFFh SA28 0 1 0 1 0 1 X X X 64/32 150000h to 15FFFFh 0A8000h to 0AFFFFh SA27 0 1 0 1 0 0 X X X 64/32 140000h to 14FFFFh 0A0000h to 0A7FFFh SA26 0 1 0 0 1 1 X X X 64/32 130000h to 13FFFFh 098000h to 09FFFFh SA25 0 1 0 0 1 0 X X X 64/32 120000h to 12FFFFh 090000h to 097FFFh SA24 0 1 0 0 0 1 X X X 64/32 110000h to 11FFFFh 088000h to 08FFFFh SA23 0 1 0 0 0 0 X X X 64/32 100000h to 10FFFFh 080000h to 087FFFh SA22 0 0 1 1 1 1 X X X 64/32 0F0000h to 0FFFFFh 078000h to 07FFFFh SA21 0 0 1 1 1 0 X X X 64/32 0E0000h to 0EFFFFh 070000h to 077FFFh SA20 0 0 1 1 0 1 X X X 64/32 0D0000h to 0DFFFFh 068000h to 06FFFFh SA19 0 0 1 1 0 0 X X X 64/32 0C0000h to 0CFFFFh 060000h to 067FFFh SA18 0 0 1 0 1 1 X X X 64/32 0B0000h to 0BFFFFh 058000h to 05FFFFh SA17 0 0 1 0 1 0 X X X 64/32 0A0000h to 0AFFFFh 050000h to 057FFFh SA16 0 0 1 0 0 1 X X X 64/32 090000h to 09FFFFh 048000h to 04FFFFh SA15 0 0 1 0 0 0 X X X 64/32 080000h to 08FFFFh 040000h to 047FFFh SA14 0 0 0 1 1 1 X X X 64/32 070000h to 07FFFFh 038000h to 03FFFFh SA13 0 0 0 1 1 0 X X X 64/32 060000h to 06FFFFh 030000h to 037FFFh SA12 0 0 0 1 0 1 X X X 64/32 050000h to 05FFFFh 028000h to 02FFFFh SA11 0 0 0 1 0 0 X X X 64/32 040000h to 04FFFFh 020000h to 027FFFh SA10 0 0 0 0 1 1 X X X 64/32 030000h to 03FFFFh 018000h to 01FFFFh SA9 0 0 0 0 1 0 X X X 64/32 020000h to 02FFFFh 010000h to 017FFFh SA8 0 0 0 0 0 1 X X X 64/32 010000h to 01FFFFh 008000h to 00FFFFh SA7 0 0 0 0 0 0 1 1 1 8/4 00E000h to 00FFFFh 007000h to 007FFFh SA6 0 0 0 0 0 0 1 1 0 8/4 00C000h to 00DFFFh 006000h to 006FFFh SA5 0 0 0 0 0 0 1 0 1 8/4 00A000h to 00BFFFh 005000h to 005FFFh (Continued) 16 MBM29PL32TM/BM90/10 (Continued) Sector Address Sector A20 A19 A18 A17 A16 A15 A14 A13 A12 Sector Size (Kbytes/ Kwords) ×8) (× Address Range ×16) (× Address Range SA4 0 0 0 0 0 0 1 0 0 8/4 008000h to 009FFFh 004000h to 004FFFh SA3 0 0 0 0 0 0 0 1 1 8/4 006000h to 007FFFh 003000h to 003FFFh SA2 0 0 0 0 0 0 0 1 0 8/4 004000h to 005FFFh 002000h to 002FFFh SA1 0 0 0 0 0 0 0 0 1 8/4 002000h to 003FFFh 001000h to 001FFFh SA0 0 0 0 0 0 0 0 0 0 8/4 000000h to 001FFFh 000000h to 000FFFh Note : The address range is A20 to A-1 if in Byte mode (BYTE = VIL) . The address range is A20 to A0 if in Word mode (BYTE = VIH) . 17 MBM29PL32TM/BM90/10 Sector Group Address Table (MBM29PL32TM) Sector Group A20 A19 A18 A17 A16 A15 A14 A13 A12 Sectors SGA0 0 0 0 0 X X X X X SA0 to SA3 SGA1 0 0 0 1 X X X X X SA4 to SA7 SGA2 0 0 1 0 X X X X X SA8 to SA11 SGA3 0 0 1 1 X X X X X SA12 to SA15 SGA4 0 1 0 0 X X X X X SA16 to SA19 SGA5 0 1 0 1 X X X X X SA20 to SA23 SGA6 0 1 1 0 X X X X X SA24 to SA27 SGA7 0 1 1 1 X X X X X SA28 to SA31 SGA8 1 0 0 0 X X X X X SA32 to SA35 SGA9 1 0 0 1 X X X X X SA36 to SA39 SGA10 1 0 1 0 X X X X X SA40 to SA43 SGA11 1 0 1 1 X X X X X SA44 to SA47 SGA12 1 1 0 0 X X X X X SA48 to SA51 SGA13 1 1 0 1 X X X X X SA52 to SA55 SGA14 1 1 1 0 X X X X X SA56 to SA59 0 0 0 1 X X X SA60 to SA62 1 0 SGA15 18 1 1 1 1 SGA16 1 1 1 1 1 1 0 0 0 SA63 SGA17 1 1 1 1 1 1 0 0 1 SA64 SGA18 1 1 1 1 1 1 0 1 0 SA65 SGA19 1 1 1 1 1 1 0 1 1 SA66 SGA20 1 1 1 1 1 1 1 0 0 SA67 SGA21 1 1 1 1 1 1 1 0 1 SA68 SGA22 1 1 1 1 1 1 1 1 0 SA69 SGA23 1 1 1 1 1 1 1 1 1 SA70 MBM29PL32TM/BM90/10 Sector Group Address Table (MBM29PL32BM) Sector Group A20 A19 A18 A17 A16 A15 A14 A13 A12 Sectors SGA0 0 0 0 0 0 0 0 0 0 SA0 SGA1 0 0 0 0 0 0 0 0 1 SA1 SGA2 0 0 0 0 0 0 0 1 0 SA2 SGA3 0 0 0 0 0 0 0 1 1 SA3 SGA4 0 0 0 0 0 0 1 0 0 SA4 SGA5 0 0 0 0 0 0 1 0 1 SA5 SGA6 0 0 0 0 0 0 1 1 0 SA6 SGA7 0 0 0 0 0 0 1 1 1 SA7 0 1 1 0 X X X SA8 to SA10 1 1 SGA8 0 0 0 0 SGA9 0 0 0 1 X X X X X SA11 to SA14 SGA10 0 0 1 0 X X X X X SA15 to SA18 SGA11 0 0 1 1 X X X X X SA19 to SA22 SGA12 0 1 0 0 X X X X X SA23 to SA26 SGA13 0 1 0 1 X X X X X SA27 to SA30 SGA14 0 1 1 0 X X X X X SA31 to SA34 SGA15 0 1 1 1 X X X X X SA35 to SA38 SGA16 1 0 0 0 X X X X X SA39 to SA42 SGA17 1 0 0 1 X X X X X SA43 to SA46 SGA18 1 0 1 0 X X X X X SA47 to SA50 SGA19 1 0 1 1 X X X X X SA51 to SA54 SGA20 1 1 0 0 X X X X X SA55 to SA58 SGA21 1 1 0 1 X X X X X SA59 to SA62 SGA22 1 1 1 0 X X X X X SA63 to SA66 SGA23 1 1 1 1 X X X X X SA67 to SA70 19 MBM29PL32TM/BM90/10 Common Flash Memory Interface Code A6 to A0 DQ15 to DQ0 Description 10h 11h 12h 0051h 0052h 0059h Query-unique ASCII string “QRY” 13h 14h 0002h 0000h Primary OEM Command Set (02h = Fujitsu standard) 15h 16h 0040h 0000h Address for Primary Extended Table 17h 18h 0000h 0000h Alternate OEM Command Set (00h = not applicable) 19h 1Ah 0000h 0000h Address for Alternate OEM Extended Table (00h = not applicable) 1Bh 0027h VCC Min (write/erase) DQ7 to DQ4: 1 V/bit, DQ3 to DQ0: 100 mV/bit 1Ch 0036h VCC Max (write/erase) DQ7 to DQ4: 1 V/bit, DQ3 to DQ0: 100 mV/bit 1Dh 0000h VPP Min voltage (00h = no Vpp pin) 1Eh 0000h VPP Max voltage (00h =no Vpp pin) 1Fh 0007h Typical timeout per single write 2N µs 20h 0007h Typical timeout for Min size buffer write 2N µs 21h 000Ah Typical timeout per individual sector erase 2N ms 22h 0000h Typical timeout for full chip erase 2N ms 23h 0001h Max timeout for write 2N times typical 24h 0005h Max timeout for buffer write 2N times typical 25h 0004h Max timeout per individual sector erase 2N times typical 26h 0000h Max timeout for full chip erase 2N times typical 27h 0016h Device Size = 2N byte 28h 29h 0002h 0000h Flash Device Interface description 02h : × 8/ × 16 2Ah 2Bh 0005h 0000h Max number of byte in multi-byte write = 2N 2Ch 0002h Number of Erase Block Regions within device (02h = Boot) 2Dh 2Eh 2Fh 30h 0007h 0000h 0020h 0000h Erase Block Region 1 Information 31h 32h 33h 34h 003Eh 0000h 0000h 0001h Erase Block Region 2 Information (Continued) 20 MBM29PL32TM/BM90/10 (Continued) A6 to A0 DQ15 to DQ0 Description 35h 36h 37h 38h 0000h 0000h 0000h 0000h Erase Block Region 3 Information 39h 3Ah 3Bh 3Ch 0000h 0000h 0000h 0000h Erase Block Region 4 Information 40h 41h 42h 0050h 0052h 0049h Query-unique ASCII string “PRI” 43h 0031h Major version number, ASCII 44h 0033h Minor version number, ASCII 45h 0008h Address Sensitive Unlock Required 46h 0002h Erase Suspend (02h = To Read & Write) 47h 0004h Number of sectors in per group 48h 0001h Sector Temporary Unprotection (01h = Supported) 49h 0004h Sector Protection Algorithm 4Ah 0000h Dual Operation (00h = Not Supported) 4Bh 0000h Burst Mode Type (00h = Not Supported) 4Ch 0001h Page Mode Type (01h = 4-Word Page Supported) 4Dh 00B5h VACC (Acceleration) Supply Minimum DQ7 to DQ4: 1 V/bit, DQ3 to DQ0: 100 mV/bit 4Eh 00C5h VACC (Acceleration) Supply Maximum DQ7 to DQ4: 1 V/bit, DQ3 to DQ0: 100 mV/bit 4Fh 00XXh CFI Write Protect (02h = Bottom Boot Device with WP Protect 03h = Top Boot Device with WP Protect) 50h 01h Program Suspend (01h = Supported) 21 MBM29PL32TM/BM90/10 ■ FUNCTIONAL DESCRIPTION Standby Mode There are two ways to implement the standby mode on the device, one using both the CE and RESET pins, and the other via the RESET pin only. When using both pins, CMOS standby mode is achieved with CE and RESET input held at VCC ±0.3 V. Under this condition the current consumed is less than 5 µA Max. During Embedded Algorithm operation, VCC active current (ICC2) is required even when CE = “H”. The device can be read with standard access time (tCE) from either of these standby modes. When using the RESET pin only, CMOS standby mode is achieved with RESET input held at VSS ±0.3 V (CE = “H” or “L”) . Under this condition the current consumed is less than 5 µA Max. Once the RESET pin is set high, the device requires tRH as a wake-up time for output to be valid for read access. During standby mode, the output is in the high impedance state, regardless of OE input. Automatic Sleep Mode Automatic sleep mode works to restrain power consumption during read-out of device data. It can be useful in applications such as handy terminal, which requires low power consumption. To activate this mode, the device automatically switch themselves to low power mode when the device addresses remain stable after tACC + 30 ns from data valid. It is not necessary to control CE, WE, and OE in this mode. The current consumed is typically 1 µA (CMOS Level). Since the data are latched during this mode, the data are continuously read out. When the addresses are changed, the mode is automatically canceled and the device read-out the data for changed addresses. Autoselect The Autoselect mode allows reading out of a binary code and identifies its manufacturer and type.It is intended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. To activate this mode, the programming equipment must force VID on address pin A9. Two identifier bytes may then be sequenced from the devices outputs by toggling A0. All addresses can be either High or Low except A6, A3,A2,A1 and A0. See “MBM29PL32TM/BM User Bus Operations (Word Mode : BYTE = VIH)” and “MBM29PL32TM/BM User Bus Operations (Byte Mode : BYTE = VIL)” in ■DEVICE BUS OPERATION. The manufacturer and device codes may also be read via the command register, for instances when the device is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in “MBM29PL32TM/BM Standard Command Definitions” in ■DEVICE BUS OPERATION.Refer to Autoselect Command section. In Word mode, a read cycle from address 00h returns the manufacturer’s code (Fujitsu = 04h) . A read cycle at address 01h outputs device code. When 227Eh is output, it indicates that two additional codes, called Extended Device Codes will be required. Therefore the system may continue reading out these Extended Device Codes at addresses of 0Eh and 0Fh. Notice that the above applies to Word mode. The addresses and codes differ from those of Byte mode. Refer to “Sector Group Protection Verify Autoselect Codes” in ■DEVICE BUS OPERATION. Read Mode The device has two control functions required to obtain data at the outputs. CE is the power control and used for a device selection. OE is the output control and used to gate data to the output pins. Address access time (tACC) is equal to the delay from stable addresses to valid output data. The chip enable access time (tCE) is the delay from stable addresses and stable CE to valid data at the output pins. The output enable access time is the delay from the falling edge of OE to valid data at the output pins. (Assuming the addresses have been stable for at least tACC-tOE time.) When reading out a data without changing addresses after power-up, input hardware reset or to change CE pin from “H” or “L”. 22 MBM29PL32TM/BM90/10 Page Mode Read The device is capable of fast read access for random locations within limited address location called Page. The Page size of the device is 8 bytes / 4 words, within the appropriate Page being selected by the higher address bits A20 to A2 and the address bits A1 to A0 in Word mode ( A1 to A-1 in Byte mode) determining the specific word within that page. This is an asynchronous operation with the microprocessor supplying the specific word location. The initial page access is equal to the random access (tACC) and subsequent Page read access (as long as the locations specified by the microprocessor fall within that Page) is equivalent to the page address access time (tPACC). Here again, CE selects the device and OE is the output control and should be used to gate data to the output pins if the device is selected. Fast Page mode, accesses are obtained by keeping A20 to A2 constant and changing A1 and A0 in Word mode ( A1 to A-1 in Byte mode ) to select the specific word within that Page. Output Disable With the OE input at logic high level (VIH), output from the devices are disabled. This may cause the output pins to be in a high impedance state. Write Device erasure and programming are accomplished via the command register. The contents of the register serve as inputs to the internal state machine. The state machine outputs dictate the device function. The command register itself does not occupy any addressable memory location. The register is a latch used to store the commands, along with the address and data information needed to execute the command. The command register is written by bringing WE to VIL, while CE is at VIL and OE is at VIH. Addresses are latched on the falling edge of WE or CE, whichever starts later; while data is latched on the rising edge of WE or CE, whichever starts first. Standard microprocessor write timings are used. Refer to AC Write Characteristics and the Erase/Programming Waveforms for specific timing parameters. Sector Group Protection The device features hardware sector group protection. This feature will disable both program and erase operations in any combination of thirty two sector groups of memory.See “Sector Group Address Table (MBM29PL32TM)” and “Sector Group Address Table (MBM29PL32BM)” in ■DEVICE BUS OPERATION. The user‘s side can use the sector group protection using programming equipment. The device is shipped with all sector groups that are unprotected. To activate it, the programming equipment must force VID on address pin A9 and control pin OE, CE = VIL and A6 = A3 = A2 = A0 = VIL, A1 = VIH. The sector group addresses (A20, A19, A18, A17, A16, A15, A14, A13, and A12) should be set to the sector to be protected. “Sector Address Table (MBM29PL32TM)” and “Sector Address Table (MBM29PL32BM)” in ■DEVICE BUS OPERATION defines the sector address for each of the seventy-one (71) individual sectors, and “Sector Group Address Table (MBM29PL32TM)” and “Sector Group Address Table (MBM29PL32BM)” in ■DEVICE BUS OPERATION defines the sector group address for each of the twenty-four (24) individual group sectors. Programming of the protection circuitry begins on the falling edge of the WE pulse and is terminated with the rising edge of the same. Sector group addresses must be held constant during the WE pulse. See “Sector Group Protection Timing Diagram” in ■SWITCHING WAVEFORMS and “Sector Group Protection Algorithm” in ■FLOW CHART for sector group protection timing diagram and algorithm. To verify programming of the protection circuitry, the programming equipment must force VID on address pin A9 with CE and OE at VIL and WE at VIH. Scanning the sector group addresses (A20, A19, A18, A17, A16, A15, A14, A13, and A12) while (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) will produce a logical “1” code at device output DQ0 for a protected sector. Otherwise the device will produce “0” for unprotected sectors. In this mode, the lower order addresses, except for A0, A1, A2, A3, and A6 can be either High or Low. Address locations with A1 = VIL are reserved for Autoselect manufacturer and device codes. A-1 requires applying to VIL on Byte mode. It is also possible to determine if a sector group is protected in the system by writing an Autoselect command. Performing a read operation at the address location XX02h, where the higher order addresses(A20, A19, A18, A17, A16, A15, A14, A13, and A12) are the desired sector group address will produce a logical “1” at DQ0 for a protected sector group. See “Sector Group Protection Verify Autoselect Codes” in ■DEVICE BUS OPERATION for Autoselect codes. 23 MBM29PL32TM/BM90/10 Temporary Sector Group Unprotection This feature allows temporary unprotection of previously protected sector groups of the devices in order to change data. The Sector Group Unprotection mode is activated by setting the RESET pin to high voltage (VID). During this mode, formerly protected sector groups can be programmed or erased by selecting the sector group addresses. Once the VID is taken away from the RESET pin, all the previously protected sector groups will be protected again. Refer to “Temporary Sector Group Unprotection Timing Diagram” in ■SWITCHING WAVEFORMS and “Temporary Sector Group Unprotection Algorithm” in ■FLOW CHART. Hardware Reset The devices may be reset by driving the RESET pin to VIL from VIH. The RESET pin has a pulse requirement and has to be kept low (VIL) for at least “tRP” in order to properly reset the internal state machine. Any operation in the process of being executed will be terminated and the internal state machine will be reset to the read mode “tREADY” after the RESET pin is driven low. Furthermore, once the RESET pin goes high, the devices require an additional “tRH” before it will allow read access. When the RESET pin is low, the devices will be in the standby mode for the duration of the pulse and all the data output pins will be tri-stated. If a hardware reset occurs during a program or erase operation, the data at that particular location will be corrupted. Write Protect (WP) The Write Protection function provides a hardware method of protecting certain outermost 8K bytes / 4K words sectors without using VID. This function is one of two provided by the WP/ACC pin. If the system asserts VIL on the WP/ACC pin, the device disables program and erase functions in the outermost 8K bytes / 4K words sectors independently of whether this sector was protected or unprotected using the method described in “Sector Group Protection" above. If the system asserts VIH on the WP/ACC pin, the device reverts of whether the outermost 8K bytes / 4K words sectors were last set to be protected to the unprotected status. Sector protection or unprotection for this sector depends on whether this was last protected or unprotected using the method described in “Sector protection/ unprotection”. Accelerated Program Operation The device offers accelerated program operation which enables programming in high speed. If the system asserts VACC to the WP/ACC pin, the device automatically enters the acceleration mode and the time required for program operation will reduce to about 85%. This function is primarily intended to allow high speed programing, so caution is needed as the sector group becomes temporarily unprotected. The system would use a fast program command sequence when programming during acceleration mode. Set command to fast mode and reset command from fast mode are not necessary. When the device enters the acceleration mode, the device is automatically set to fast mode. Therefore, the present sequence could be used for programming and detection of completion during acceleration mode. Removing VACC from the WP/ACC pin returns the device to normal operation. Do not remove VACC from the WP/ ACC pin while programming. See “Accelerated Program Timing Diagram” in ■SWITCHING WAVEFORM. 24 MBM29PL32TM/BM90/10 ■ COMMAND DEFINITIONS Device operations are selected by writing specific address and data sequences into the command register. “MBM29PL32TM/BM Standard Command Definitions” in ■DEVICE BUS OPERATION shows the valid register command sequences. Note that the Erase Suspend (B0h) and Erase Resume (30h) commands are valid only while the Sector Erase operation is in progress. Also the Program Suspend (B0h) and Program Resume (30h) commands are valid only while the Program operation is in progress.Moreover Reset commands are functionally equivalent, resetting the device to the read mode. Please note that commands must be asserted to DQ7 to DQ0 and DQ15 to DQ8 bits are ignored. Reset Command In order to return from Autoselect mode or Exceeded Timing Limits (DQ5 = 1) to Read mode, the Reset operation is initiated by writing the Reset command sequence into the command register. The devices remain enabled for reads until the command register contents are altered. The devices will automatically be in the reset state after power-up. In this case, a command sequence is not required in order to read data. Autoselect Command Flash memories are intended for use in applications where the local CPU alters memory contents. Therefore, manufacture and device codes must be accessible while the devices reside in the target system. PROM programmers typically access the signature codes by raising A9 to a high voltage. However applying high voltage onto the address lines is not generally desired system design practice. The device contains an Autoselect command operation to supplement traditional PROM programming methodology. The operation is initiated by writing the Autoselect command sequence into the command register. The Autoselect command sequence is initiated first by writing two unlock cycles. This is followed by a third write cycle that contains the address and the Autoselect command. Then the manufacture and device codes can be read from the address, and an actual data of memory cell can be read from the another address. Following the command write, a read cycle from address 00h returns the manufactures’s code (Fujitsu = 04h). A read cycle at address 01h outputs device code. When 227Eh is output, it indicates that two additional codes, called Extended Device Codes will be required. Therefore the system may continue reading out these Extended Device Codes at address of 0Eh as well as at 0Fh. Notice that above applies to Word mode. The addresses and codes differ from those of Byte mode. Refer to “Sector Group Protection Verify Autoselect Codes” in ■DEVICE BUS OPERATION. To terminate the operation, it is necessary to write the Reset command into the register. To execute the Autoselect command during the operation, Reset command must be written before the Autoselect command. Programming The devices are programmed on a word-by-word basis. Programming is a four bus cycle operation. There are two “unlock” write cycles. These are followed by the program set-up command and data write cycles. Addresses are latched on the falling edge of CE or WE, whichever happens later and the data is latched on the rising edge of CE or WE, whichever happens first. The rising edge of CE or WE (whichever happens first) starts programming. Upon executing the Embedded Program Algorithm command sequence, the system is not required to provide further controls or timings. The device will automatically provide adequate internally generated program pulses and verify the programmed cell margin. The system can determine the status of the program operation by using DQ7 (Data Polling), DQ6 (Toggle Bit) or RY/BY. The Data Polling and Toggle Bit are automatically performed at the memory location being programmed. The programming operation is completed when the data on DQ7 is equivalent to data written to this bit at which the devices return to the read mode and plogram addresses are no longer latched. Therefore, the devices require that a valid address to the devices be supplied by the system at this particular instance. Hence Data Polling requires the same address which is being programmed. If hardware reset occurs during the programming operation, the data being written is not guaranteed. 25 MBM29PL32TM/BM90/10 Programming is allowed in any address sequence and across sector boundaries. Beware that a data “0” cannot be programmed back to a “1”. Attempting to do so may result in either failure condition or an apparent success according to the data polling algorithm. But a read from Reset mode will show that the data is still “0”. Only erase operations can convert “0”s to “1”s. Note that attempting to program a “1” over a “0” will result in programming failure. This precaution is the same with Fujitsu standard NOR devices. “Embedded ProgramTM Algorithm” in ■FLOW CHART illustrates the Embedded ProgramTM Algorithm using typical command strings and bus operations. Program Suspend/Resume The Program Suspend command allows the system to interrupt a program operation so that data can be read from any address. Writing the Program Suspend command (B0h) during Embedded Program operation immediately suspends the programming. When the Program Suspend command is written during a programming process, the device halts the program operation within 1us and updates the status bits.After the program operation has been suspended, the system can read data from any address. The data at program-suspended address is not valid. Normal read timing and command definitions apply. After the Program Resume command (30h) is written, the device reverts to programming. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. See "Write Operation Status" for more information. When issuing program suspend command in 4 µs after issuing program command, determine the status of program operation by reading status bit at more 4 µs after issuing program resume command. The system also writes the Autoselect command sequence in the Program Suspend mode. The device allows reading Autoselect codes at the addresses within programming sectors, since the codes are not stored in the memory. When the device exits the Autoselect mode, the device reverts to the Program Suspend mode, and is ready for another valid operation. See "Autoselect Command Sequence" for more information. The system must write the Program Resume command to exit from the Program Suspend mode and continue the programming operation. Further writes of the Resume command are ignored. Another Program Suspend command can be written after the device resumes programming. Do not read CFI code after HiddenROM Entry and Exit in program suspend mode. Write Buffer Programming Operations Write Buffer Programming allows the system write to series of 16 words in one programming operation. This results in faster effective word programming time than the standard programming algorithms. The Write Buffer Programming command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle selecting the Sector Address in which programming will occur. In forth cycle contains both Sector Address and unique code for data bus width will be loaded into the page buffer at the Sector Address in which programming will occur. The system then writes the starting address/data combination. This “starting address” must be the same Sector Address used in third and fourth cycles and its lower addresses of A3 to A0 should be 0h. All subsequent address must be incremented by 1. Addresses are latched on the falling edge of CE or WE, whichever happens later and the data is latched on the rising edge of CE or WE, whichever happens first. The rising edge of CE or WE (whichever happens first) starts programming. Upon executing the Write Buffer Programming Operations command sequence, the system is not required to provide further controls or timings. The device will automatically provide adequate internally generated program pulses and verify the programmed cell margin. DQ7(Data Polling), DQ6(Toggle Bit), DQ5(Exceeded Timing Limits), DQ1(Write-to-Buffer Abort) should be monitored to determine the device status during Write Buffer Programming. In addition to these functions, it is also possible to indicate to the host system that Write Buffer Programming Operations are either in progress or have been completed by RY/BY. See “Hardware Sequence Flags”. The Data polling techniques described in “Data Polling Algorithm” in ■FLOW CHART should be used while monitoring the last address location loaded into the write buffer. In addition, it is not neccessary to specify an 26 MBM29PL32TM/BM90/10 address in Toggle Bit techniques described in “Toggle Bit Algorithm” in ■FLOW CHART. The automatic programing operation is completed when the data on DQ7 is equivalent to the data written to this bit at which time the device returns to the read mode and addresses are no longer latched ( See "Hardware Sequence Flags"). The write-buffer programming operation can be suspended using the standard program suspend/resume commands. Once the write buffer programming is set, the system must then write the “Program Buffer to Flash” command at the Sector Address. Any other address/data combination will abort the Write Buffer Programming operation and the device will continue busy state. The Write Buffer Programming Sequence can be ABORTED by doing the following : • Different Sector Address is asserted. • Write data other than the “Program Buffer to Flash" command after the specified number of “data load” cycles. A “Write-to-Buffer-Abort Reset” command sequence must be written to the device to return to read mode. (See “MBM29PL32TM/BM Standard Command Definitions” in ■DEVICE BUS OPERATION for details on this command sequence.) Chip Erase Chip erase is a six bus cycle operation. It begins two “unlock” write cycles followed by writing the “set-up” command, and two “unlock” write cycles followed by the chip erase command which invokes the Embedded Erase algorithm. The device does not require the user to program the device prior to erase. Upon executing the Embedded Erase Algorithm the devices automatically programs and verifies the entire memory for an all zero data pattern prior to electrical erase (Preprogram function). The system is not required to provide any controls or timings during these operations. The system can determine the erase operation status by using DQ7 (Data Polling), DQ6 (Toggle Bit I) and DQ2 (Toggle Bit II) or RY/BY output signal. The chip erase begins on the rising edge of the last CE or WE, whichever happens first from last command sequence and completes when the data on DQ7 is “1” (See Write Operation Status section.) at which time the device returns to read mode. Sector Erase Sector erase is a six bus cycle operation. There are two “unlock” write cycles. These are followed by writing the “set-up” command. Two more “unlock” write cycles are then followed by the Sector Erase command. Multiple sectors may be erased concurrently by writing the same six bus cycle operations. This sequence is followed by writes of the Sector Erase command to addresses in other sectors desired to be concurrently erased. The time between writes must be less than Erase Time-out time(tTOW). Otherwise that command will not be accepted and erasure will not start. It is recommended that processor interrupts be disabled during this time to guarantee this condition. The interrupts can reoccur after the last Sector Erase command is written. A time-out of “tTOW” from the rising edge of last CE or WE, whichever happens first, will initiate the execution of the Sector Erase command(s). If another falling edge of CE or WE, whichever happens first occurs within the “tTOW” timeout window the timer is reset (monitor DQ3 to determine if the sector erase timer window is still open, see section DQ3, Sector Erase Timer). Resetting the devices once execution has begun will corrupt the data in the sector. In that case, restart the erase on those sectors and allow them to complete (refer to the Write Operation Status). Loading the sector erase buffer may be done in any sequence and with any number of sectors (0 to 70). Sector erase does not require the user to program the devices prior to erase. The devices automatically program all memory locations in the sector(s) to be erased prior to electrical erase using the Embedded Erase Algorithm. When erasing a sector, the remaining unselected sectors remain unaffected. The system is not required to provide any controls or timings during these operations. The system can determine the status of the erase operation by using DQ7 (Data Polling), DQ6 (Toggle Bit) or RY/BY. The sector erase begins after the “tTOW” time-out from the rising edge of CE or WE whichever happens first for the last sector erase command pulse and completes when the data on DQ7 is “1” (see Write Operation Status section), at which the devices return to the read mode. Data polling and Toggle Bit must be performed at an address within any of the sectors being erased. 27 MBM29PL32TM/BM90/10 Erase Suspend/Resume The Erase Suspend command allows the user to interrupt Sector Erase operation and then perform read or programming to a sector not being erased. This command is applicable ONLY during the Sector Erase operation within the time-out period for sector erase. Writting the Erase Suspend command (B0h) during the Sector Erase time-out results in immediate termination of the time-out period and suspension of the erase operation. Writing the "Erase Resume" command (30h) resumes the erase operation. When the "Erase Suspend" command is written during the Sector Erase operation, the device takes maximum of “tSPD” to suspend the erase operation. When the devices enter the erase-suspended mode, the RY/BY output pin will be at High-Z and the DQ7 bit will be at logic “1” and DQ6 will stop toggling. The user must use the address of the erasing sector for reading DQ6 and DQ7 to determine if the erase operation has been suspended. Further writes of the Erase Suspend command are ignored. To resume the operation of Sector Erase, the Resume command (30h) should be written. Any further writes of the Resume command at this point will be ignored. Another Erase Suspend command can be written after the chip has resumed erasing. Do not issue program command after entering erase-suspend-read mode. Fast Mode Set/Reset The device has Fast Mode function. It dispenses with the initial two unclock cycles required in the standard program command sequence by writing Fast Mode command into the command register. In this mode, the required bus cycle for programming consists of two cycles instead of four bus cycles in standard program command. The read operation is also executed after exiting this mode. During the Fast mode, do not write any command other than the Fast program/Fast mode reset command. To exit from this mode, write Fast Mode Reset command into the command register. (Refer to the “Embedded ProgramTM Algorithm for Fast Mode” in ■FLOW CHART.) The VCC active current is required even CE = VIH during Fast Mode. Fast Programming During Fast Mode, the programming can be executed with two bus cycles operation. The Embedded Program Algorithm is executed by writing program set-up command (A0h) and data write cycles (PA/PD). See “Embedded ProgramTM Algorithm for Fast Mode” in ■FLOW CHART. Extended Sector Group Protection In addition to normal sector group protection, the device has Extended Sector Group Protection as extended function. This function enables protection of the sector group by forcing VID on RESET pin and writes a command sequence. Unlike conventional procedures, it is not necessary to force VID and control timing for control pins. The only RESET pin requires VID for sector group protection in this mode. The extended sector group protection requires VID on RESET pin. With this condition, the operation is initiated by writing the set-up command (60h) into the command register. Then the sector group addresses pins (A20, A19, A18, A17, A16, A15, A14, A13 and A12) and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) should be set to the sector group to be protected (set VIL for the other addresses pins is recommended), and write extended sector group protection command (60h). A sector group is typically protected in 250 µs. To verify programming of the protection circuitry, the sector group addresses pins (A20, A19, A18, A17, A16, A15, A14, A13 and A12) and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) should be set and write a command (40h). Following the command write, a logical “1” at device output DQ0 will produce for protected sector in the read operation. If the output data is logical “0”, write the extended sector group protection command (60h) again. To terminate the operation, set RESET pin to VIH. (Refer to the “Extended Sector Group Protection Timing Diagram” in ■SWITCHING WAVEFORMS and “Extended Sector Group Protection Algorithm” in ■FLOW CHART.) 28 MBM29PL32TM/BM90/10 Query Command (CFI : Common Flash Memory Interface) The CFI (Common Flash Memory Interface) specification outlines device and host system software interrogation handshake which allows specific vendor-specified software algorithms to be used for entire families of devices. This allows device-independent, JEDEC ID-independent, and forward-and backward-compatible software support for the specified flash device families. Refer to CFI specification in detail. The operation is initiated by writing the query command (98h) into the command register. Following the command write, a read cycle from specific address retrieves device information. Please note that output data of upper byte (DQ15 to DQ8) is “0”. Refer to the CFI code table. To terminate operation, it is necessary to write the Reset command sequence into the register. (See “Common Flash Memory Interface Code” in ■DEVICE BUS OPERATION.) HiddenROM Mode (1) HiddenROM Region The HiddenROM (HiddenROM) feature provides a Flash memory region that the system may access through a new command sequence. This is primarily intended for customers who wish to use an Electronic Serial Number (ESN) in the device with the ESN protected against modification. Once the HiddenROM region is protected, any further modification of that region is impossible. This ensures the security of the ESN once the product is shipped to the field. The HiddenROM region is 256 bytes / 128 words in length. After the system writes the HiddenROM Entry command sequence, it may read the HiddenROM region by using device addresses A6 to A0 (A20 to A7 are all “0”). That is, the device sends only program command that would normally be sent to the address to the HiddenROM region. This mode of operation continues until the system issues the Exit HiddenROM command sequence, or until power is removed from the device. On power-up, or following a hardware reset, the device reverts to sending commands to the address. If you request Fujitsu to program the ESN in the device, please contact a Fujitsu representative for more information. (2) HiddenROM Entry Command The device has a HiddenROM area with One Time Protect function. This area is to enter the security code and to unable the change of the code once set. Programming is allowed in this area until it is protected. However, once it gets protected, it is impossible to unprotect. Therefore, extreme caution is required. The HiddenROM area is 256 bytes / 128 words. This area is in SA0 . Therefore, write the HiddenROM entry command sequence to enter the HiddenROM area. It is called HiddenROM mode when the HiddenROM area appears. Sectors other than the block area SA0 can be read during HiddenROM mode. Read/program of the HiddenROM area is possible during HiddenROM mode. Write the HiddenROM reset command sequence to exit the HiddenROM mode. Note that any other commands should not be issued than the HiddenROM program/protection/reset commands during the HiddenROM mode. When you issue the other commands including the suspend resume capability, send the HiddenROM reset command first to exit the HiddenROM mode and then issue each command. 29 MBM29PL32TM/BM90/10 (3) HiddenROM Program Command To program the data to the HiddenROM area, write the HiddenROM program command sequence during HiddenROM mode. This command is the same as the usual program command, except that it needs to write the command during HiddenROM mode. Therefore the detection of completion method is the same as in the past, using the DQ7 data pooling, DQ6 Toggle bit or RY/BY. You should pay attention to the address to be programmed. If an address not in the HiddenROM area is selected, the previous data will be deleted. During the write into the HiddenROM region, the program suspend command issuance is prohibited. (4) HiddenROM Protect Command There are two methods to protect the HiddenROM area. One is to write the sector group protect setup command (60h) , set the sector address in the HiddenROM area and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) , and write the sector group protect command (60h) during the HiddenROM mode. The same command sequence may be used because it is the same as the extension sector group protect in the past, except that it is in the HiddenROM mode and does not apply high voltage to the RESET pin. Please refer to above mentioned “Extended Sector Group Protection” for details of sector group protect setting. The other method is to apply high voltage (VID) to A9 and OE, set the sector address in the HiddenROM area and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) , and apply the write pulse during the HiddenROM mode. To verify the protect circuit, apply high voltage (VID) to A9, specify (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) and the sector address in the HiddenROM area, and read. When “1” appears on DQ0, the protect setting is completed. “0” will appear on DQ0 if it is not protected. Apply write pulse again. The same command sequence could be used for the above method because other than the HiddenROM mode, it is the same as the sector group protect previously mentioned. Take note that other sector groups will be affected if an address other than those for the HiddenROM area is selected for the sector group address, so please be careful. Pay close attention that once it is protected, protection CANNOT BE CANCELLED. 30 MBM29PL32TM/BM90/10 Write Operation Status Detailed in “Hardware Sequence Flags” are all the status flags which can determine the status of the device for current mode operation. When checking Hardware Sequence Flags during program operations, it should be checked 4 µs after issuing program command. During sector erase, the part provides the status flags automatically to the I/O ports. The information on DQ2 is address sensitive. If an address from an erasing sector is consecutively read, then the DQ2 bit will toggle. However DQ2 will not toggle if an address from a non-erasing sector is consecutively read. This allows the user to determine which sectors are erasing. Once erase suspend is entered address sensitivity still applies. If the address of a non-erasing sector (one available for read) is provided, then stored data can be read from the device. If the address of an erasing sector (one unavailable for read) is applied, the device will output its status bits. Hardware Sequence Flags DQ7 DQ6 DQ5 DQ3 DQ2 DQ1*3 DQ7 Toggle 0 0 1 0 0 Toggle 0 1 Toggle*1 N/A Program-Suspend-Read (Program Suspended Sector) Data Data Data Data Data Data Program-Suspend-Read (Non-Program Suspended Sector) Data Data Data Data Data Data 1 1 0 0 Toggle*1 N/A Erase-Suspend-Read (Non-Erase Suspended Sector) Data Data Data Data Data Data Erase-Suspend-Program (Non-Erase Suspended Sector) DQ7 Toggle 0 0 1*2 N/A DQ7 Toggle 1 0 1 N/A 0 Toggle 1 1 N/A N/A DQ7 Toggle 1 0 N/A N/A BUSY State DQ7 Toggle 0 N/A N/A 0 Exceeded Timing Limits DQ7 Toggle 1 N/A N/A 0 ABORT State N/A Toggle 0 N/A N/A 1 Status Embedded Program Algorithm Embedded Erase Algorithm In Progress Program Suspend Mode Erase-Suspend-Read (Erase Suspended Sector) Erase Suspend Mode Embedded Program Algorithm Exceeded Embedded Erase Algorithm Time Erase Erase-Suspend-Program Limits Suspend (Non-Erase Suspended Sector) Mode Write to Buffer*4 *1 : Successive reads from the erasing or erase-suspend sector will cause DQ2 to toggle. *2 : Reading from non-erase suspend sector address will indicate logic “1” at the DQ2 bit. *3 : DQ1 indicates the Write-to-Buffer ABORT status during Write-Buffer-Programming operations. *4 : The Data Polling algorithm detailed in “Data Polling Algorithm” in ■FLOW CHART should be used for WriteBuffer-Programming operations. Note that DQ7 during Write-Buffer-Programming indicates the data-bar for DQ7 data for the LAST LOADED WRITE-BUFFER ADDRESS location. 31 MBM29PL32TM/BM90/10 DQ7 Data Polling The devices feature Data Polling as a method to indicate to the host that the Embedded Algorithms are in progress or completed. During the Embedded Program Algorithm, an attempt to read devices will produce reverse data last written to DQ7. Upon completion of the Embedded Program Algorithm, an attempt to read the device will produce true data last written to DQ7. During the Embedded Erase Algorithm, an attempt to read the device will produce a “0” at the DQ7 output. Upon completion of the Embedded Erase Algorithm, an attempt to read device will produce a “1” at the DQ7 output. The flowchart for Data Polling (DQ7) is shown in “Data Polling Algorithm” in ■FLOW CHART. For programming, the Data Polling is valid after the rising edge of fourth write pulse in the four write pulse sequence. For chip erase and sector erase, the Data Polling is valid after the rising edge of the sixth write pulse in the six write pulse sequence. Data Polling must be performed at sector addresses of sectors being erased, not protected sectors. Otherwise, the status may become invalid. If a program address falls within a protected sector, Data polling on DQ7 is active for approximately 1 µs, then the device returns to read mode. After an erase command sequence is written, if all sectors selected for erasing are protected, Data Polling on DQ7 is active for approximately 100 µs, then the device returns to read mode. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. Once the Embedded Algorithm operation is close to being completed, the device data pins (DQ7) may change asynchronously while the output enable (OE) is asserted low. This means that the device is driving status information on DQ7 at one instant of time, and then that byte’s valid data the next. Depending on when the system samples the DQ7 output, it may read the status or valid data. Even if the device completes the Embedded Algorithm operation and DQ7 has a valid data, the data outputs on DQ6 to DQ0 may still be invalid. The valid data on DQ7 to DQ0 will be read on the successive read attempts. The Data Polling feature is active only during the Embedded Programming Algorithm, Embedded Erase Algorithm, Erace Suspendmode or sector erase time-out. See “Data Polling during Embedded Algorithm Operation Timing Diagram” in ■SWITCHING WAVEFORM for the Data Polling timing specifications and diagram. DQ6 Toggle Bit I The device also feature the “Toggle Bit I” as a method to indicate to the host system that the Embedded Algorithms are in progress or completed. During an Embedded Program or Erase Algorithm cycle, successive attempts to read (CE or OE toggling) data from the devices will result in DQ6 toggling between one and zero. Once the Embedded Program or Erase Algorithm cycle is completed, DQ6 will stop toggling and valid data will be read on the next successive attempts. During programming, the Toggle Bit I is valid after the rising edge of the fourth write pulse in the four write pulse sequences. For chip erase and sector erase, the Toggle Bit I is valid after the rising edge of the sixth write pulse in the six write pulse sequences. The Toggle Bit I is active during the sector time out. In programm operation, if the sector being written to is protected, the Toggle bit will toggle for about 1 µs and then stop toggling with the data unchanged. In erase, the device will erase all the selected sectors except for the protected ones. If all selected sectors are protected, the chip will toggle the Toggle bit for about 100 µs and then drop back into read mode, having data kept remained. Either CE or OE toggling will cause the DQ6 to toggle. See “ Toggle Bit l Timing Diagramduring Embedded Algorithm Operations” in ■SWITCHING WAVEFORM for the Toggle Bit I timing specifications and diagram. 32 MBM29PL32TM/BM90/10 DQ5 Exceeded Timing Limits DQ5 will indicate if the program or erase time has exceeded the specified limits (internal pulse count). Under these conditions DQ5 will produce a “1”. This is a failure condition indicating that the program or erase cycle was not successfully completed. Data Polling is the only operating function of the device under this condition. The CE circuit will partially power down the device under these conditions (to approximately 2 mA). The OE and WE pins will control the output disable functions as described in “MBM29PL32TM/BM User Bus Operations (Word Mode : BYTE = VIH)” and “MBM29PL32TM/BM User Bus Operations (Byte Mode : BYTE = VIL)” in ■DEVICE BUS OPERATION. The DQ5 failure condition may also appear if a user tries to program a non blank location without pre-erase. In this case the device locks out and never completes the Embedded Algorithm operation. Hence, the system never reads a valid data on DQ7 bit and DQ6 never stop toggling. Once the device has exceeded timing limits, the DQ5 bit will indicate a “1”. Note that this is not a device failure condition since the device was incorrectly used. If this occurs, reset the device with command sequence. DQ3 Sector Erase Timer After the completion of the initial sector erase command sequence the sector erase time-out will begin. DQ3 will remain low until the time-out is complete. Data Polling and Toggle Bit are valid after the initial sector erase command sequence. If Data Polling or the Toggle Bit I indicates a valid erase command has been written, DQ3 may be used to determine whether the sector erase timer window is still open. If DQ3 is “1” the internally controlled erase cycle has begun. If DQ3 is “0”, the device will accept additional sector erase commands. To insure the command has been accepted, the system software should check the status of DQ3 prior to and following each subsequent Sector Erase command. If DQ3 were high on the second status check, the command may not have been accepted. See “Hardware Sequence Flags”. DQ2 Toggle Bit II This Toggle bit II, along with DQ6, can be used to determine whether the devices are in the Embedded Erase Algorithm or in Erase Suspend. Successive reads from the erasing sector will cause DQ2 to toggle during the Embedded Erase Algorithm. If the devices are in the erase-suspended-read mode, successive reads from the erase-suspended sector will cause DQ2 to toggle. When the device is in the erase-suspended-program mode, successive reads from the non-erase suspended sector will indicate a logic “1” at the DQ2 bit. DQ6 is different from DQ2 in that DQ6 toggles only when the standard program or Erase, or Erase Suspend Program operation is in progress. The behavior of these two status bits, along with that of DQ7, is summarized as follows: For example, DQ2 and DQ6 can be used together to determine if the erase-suspend-read mode is in progress. (DQ2 toggles while DQ6 does not.) See also “Hardware Sequence Flags” and “DQ2 vs. DQ6” in ■SWITCHING WAVEFORM. Furthermore, DQ2 can also be used to determine which sector is being erased. At the erase mode, DQ2 toggles if this bit is read from an erasing sector. 33 MBM29PL32TM/BM90/10 Reading Toggle Bits DQ6 / DQ2 Whenever the system initially begins reading Toggle bit status, it must read DQ7 to DQ0 at least twice in a row to determine whether a Toggle bit is toggling. Typically a system would note and store the value of the Toggle bit after the first read. After the second read, the system would compare the new value of the Toggle bit with the first. If the Toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ7 to DQ0 on the following read cycle. However, if, after the initial two read cycles, the system determines that the Toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5) . If it is, the system should then determine again whether the Toggle bit is toggling, since the Toggle bit may have stopped toggling just as DQ5 went high. If the Toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the Toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor the Toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation. (Refer to “Toggle Bit Algorithm” in ■FLOW CHART.) Toggle Bit Status DQ7 DQ6 DQ2 DQ7 Toggle 1 Erase 0 Toggle Toggle *1 Erase-Suspend-Read (Erase-Suspended Sector) 1 1 Toggle *1 DQ7 Toggle 1 *2 Mode Program Erase-Suspend-Program *1 : Successive reads from the erasing or erase-suspend sector will cause DQ2 to toggle. *2 : Reading from the non-erase suspend sector address will indicate logic “1” at the DQ2 bit. DQ1 Write-to-Buffer Abort DQ1 indicates whether a Write-to-Buffer operation was aborted. Under these conditions DQ1 produces a "1". The system must issue the Write-to-Buffer-Abort-Reset command sequence to return the device to reading array data. See "Write Buffer Programming Operations" section for more details. RY/BY Ready/Busy The device provides a RY/BY open-drain output pin to indicate to the host system that the Embedded Algorithms are either in progress or has been completed. If the output is low, the device is busy with either a program or erase operation. If the output is high, the device is ready to accept any read/write or erase operation. If the device is placed in an Erase Suspend mode, the RY/BY output will be high, by means of connecting with a pullup resister to VCC. During programming, the RY/BY pin is driven low after the rising edge of the fourth WE pulse. During an erase operation, the RY/BY pin is driven low after the rising edge of the sixth WE pulse. The RY/BY pin will indicate a busy condition during the RESET pulse. See “RY/BY Timing Diagram during Program/Erase Operation Timing Diagram” and “RESET Timing Diagram ( During Embedded Algorithms )” in ■SWITCHING WAVEFORM for a detailed timing diagram. The RY/BY pin is pulled high in standby mode. Since this is an open-drain output, RY/BY pins can be tied together in parallel with a pull-up resistor to VCC. 34 MBM29PL32TM/BM90/10 Word/Byte Configuration BYTE pin selects the byte (8-bit) mode or word (16-bit) mode for the device. When this pin is driven high, the device operates in the word (16-bit) mode. Data is read and programmed at DQ15 to DQ0. When this pin is driven low, the device operates in byte (8-bit) mode. In this mode, DQ15/A-1 pin becomes the lowest address bit, and DQ14 to DQ8 bits are tri-stated. However, the command bus cycle is always an 8-bit operation and hence commands are written at DQ7 to DQ0 and DQ15 to DQ8 bits are ignored. Data Protection The device is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transitions. During power up the device automatically reset the internal state machine in Read mode. Also, with its control register architecture, alteration of memory contents only occurs after successful completion of specific multi-bus cycle command sequences. The device also incorporates several features to prevent inadvertent write cycles resulting form VCC power-up and power-down transitions or system noise. (1) Low VCC Write Inhibit To avoid initiation of a write cycle during VCC power-up and power-down, a write cycle is locked out for VCC less than VLKO. If VCC < VLKO, the command register is disabled and all internal program/erase circuits are disabled. Under this condition, the device will reset to the read mode. Subsequent writes will be ignored until the VCC level is greater than VLKO. It is the user’s responsibility to ensure that the control pins are logically correct to prevent unintentional writes when VCC is above VLKO. If Embedded Erase Algorithm is interrupted, the intervened erasing sector(s) is(are) not valid. (2) Write Pulse “Glitch” Protection Noise pulses of less than 3 ns (typical) on OE, CE, or WE will not initiate a write cycle. (3) Logical Inhibit Writing is inhibited by holding any one of OE = VIL, CE = VIH, or WE = VIH. To initiate a write, CE and WE must be a logical zero while OE is a logical one. (4) Power-up Write Inhibit Power-up of the devices with WE = CE = VIL and OE = VIH will not accept commands on the rising edge of WE. The internal state machine is automatically reset to read mode on power-up. (5) Sector Protection Device user is able to protect each sector group individually to store and protect data. Protection circuit voids both write and erase commands that are addressed to protected sectors. Any commands to write or erase addressed to protected sector are ignored . 35 MBM29PL32TM/BM90/10 ■ ABSOLUTE MAXIMUM RATINGS Parameter Rating Symbol Storage Temperature Max Tstg –55 +125 °C TA –20 +85 °C VIN, VOUT –0.5 VCC +0.5 V VCC –0.5 +4.0 V VIN –0.5 +12.5 V VACC –0.5 +12.5 V Ambient Temperature with Power Applied Voltage with Respect to Ground All Pins Except A9, OE, and RESET *1,*2 Power Supply Voltage *1 1, 3 Input Voltage A9, OE, and RESET * * Input Voltage WP/ACC *1,*3 Unit Min *1 : Voltage is defined on the basis of VSS = GND = 0 V. *2 : Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, input or I/O pins may undershoot VSS to –0.2 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods of up to 20 ns *3 : Minimum DC input voltage is –0.5V. During voltage transitions, these pins may undershoot VSS to –0.2 V for periods of up to 20 ns.Voltage difference between input and supply voltage ( VIN–VCC) dose not exceed to +9.0 V. Maximum DC input voltage is +12.5 V which may overshoot to +14.0 V for periods of up to 20 ns . WARNING: Semiconductor devices can be permanently damaged by application of stress (voltage, current, temperature, etc.) in excess of absolute maximum ratings. Do not exceed these ratings. ■ RECOMMENDED OPERATING CONDITIONS Parameter Ambient Temperature Symbol 90 10 VCC Supply Voltage * TA VCC Value Min Max –20 +70 –20 +85 +3.0 +3.6 Unit °C V * : Voltage is defined on the basis of VSS = GND = 0V. WARNING: The recommended operating conditions are required in order to ensure the normal operation of the semiconductor device. All of the device’s electrical characteristics are warranted when the device is operated within these ranges. Always use semiconductor devices within their recommended operating condition ranges. Operation outside these ranges may adversely affect reliability and could result in device failure. No warranty is made with respect to uses, operating conditions, or combinations not represented on the data sheet. Users considering application outside the listed conditions are advised to contact their FUJITSU representatives beforehand. 36 MBM29PL32TM/BM90/10 ■ MAXIMUM OVERSHOOT/MAXIMUM UNDERSHOOT +0.6 V 20 ns 20 ns –0.5 V –2.0 V 20 ns Maximum Undershoot Waveform 20 ns VCC +2.0 V VCC +0.5 V 0.7 × VCC 20 ns 20 ns Maximum Overshoot Waveform 1 20 ns +14.0 V +12.5 V VCC +0.5 V 20 ns 20 ns Note: This waveform is applied for A9, OE, RESET, and ACC. Maximum Overshoot Waveform 2 37 MBM29PL32TM/BM90/10 ■ ELECTRICAL CHARACTERISTICS 1. DC Characteristics Parameter Symbol Conditions Typ Max –2.0 — +2.0 –1.0 — +1.0 –1.0 — +1.0 µA — — 35 µA — 18 20 — 16 20 — 35 50 — 35 50 VIN = VSS to VCC, VCC = VCC Max Output Leakage Current ILO VOUT = VSS to VCC, VCC = VCC Max A9, OE, RESET Inputs Leakage Current ILIT VCC = VCC Max, A9, OE, RESET = 12.5 V CE = VIL, OE = VIH, Word f = 5 MHz Byte CE = VIL, OE = VIH, Word f = 10 MHz Byte µA mA VCC Active Current (Intra-Page Read ) *2 ICC2 CE = VIL, OE = VIH, tPRC = 25ns, 4-Word — 10 20 mA VCC Active Current (Program / Erase) *2,*3 ICC3 CE = VIL, OE = VIH — 50 60 mA VCC Standby Current *2 ICC4 CE = VCC ±0.3 V, RESET = VCC ±0.3 V, OE = VIH, WP/ACC = VCC ±0.3 V — 1 5 µA VCC Reset Current *2 ICC5 RESET = VCC ±0.3 V, WP/ACC = VCC ±0.3 V — 1 5 µA VCC Automatic Sleep Current *4 ICC6 CE = VSS ±0.3 V, RESET = VCC ±0.3 V, VIN = VCC ±0.3V or Vss ±0.3V, WP/ACC = VCC ±0.3 V — 1 5 µA VCC Active Current (Erase-Suspend-Program) *2 ICC7 CE = VIL, OE = VIH — 50 60 mA — 20 IACC CE = VIL, OE = VIH, WP/ACC pin Vcc = Vcc Max, WP/ACC =VACC Vcc Pin Max — ACC Accelerated Program Current — — 60 Input Low Level VIL — –0.5 — 0.6 V Input High Level VIH — 0.7×VCC — VCC + 0.3 V Voltage for WP/ACC Sector Protection/Unprotection and Program Acceleration mA VACC VCC = 3.0 V to 3.6 V 11.5 12.0 12.5 V Voltage for Autoselect, and Temporary Sector Unprotected VID VCC = 3.0 V to 3.6 V 11.5 12.0 12.5 V Output Low Voltage Level VOL IOL = 4.0 mA, VCC = VCC Min — — 0.45 V Output High Voltage Level VOH IOH = –2.0 mA, VCC = VCC Min 0.85×VCC — — V Low VCC Lock-Out Voltage VLKO 2.3 — 2.5 V — *1 : The lCC current listed includes both the DC operating current and the frequency dependent component. *2 : Maximum ICC values are tested with VCC = VCC Max *3 : ICC active while Embedded Erase or Embedded Program or Write Buffer Programming is in progress. *4 : Automatic sleep mode enables the low power mode when address remain stable for tACC + 30 ns. 38 Unit WP/ACC pin ILI ICC1 Min Others Input Leakage Current VCC Active Current (Read ) *1,*2 Value MBM29PL32TM/BM90/10 2. AC Characteristics • Read Only Operations Characteristics Symbols Parameter Value* Condition JEDEC Standard 90 10 Unit Min Max Min Max 90 100 ns Read Cycle Time tAVAV tRC Address to Output Delay tAVQV tACC CE = VIL, OE = VIL 90 100 ns Chip Enable to Output Delay tELQV tCE OE = VIL 90 100 ns Page Read Cycle Time — tPRC 25 30 ns Page Address to Output Delay — tPACC 25 30 ns Output Enable to Output Delay tGLQV tOE — 25 30 ns Chip Enable to Output High-Z tEHQZ tDF — 25 30 ns — tOEH — 0 0 ns — 10 10 ns Output Enable to Output High-Z tGHQZ tDF — 25 30 ns Output Hold Time From Addresses, CE or OE, Whichever Occurs First tAXQX tOH — 0 0 ns — tREADY — 20 20 µs Output Enable Read Hold Time Toggle and Data Polling RESET Pin Low to Read Mode — — CE = VIL, OE = VIL * : Test Conditions : Output Load : 1 TTL gate and 30 pF Input rise and fall times : 5 ns Input pulse levels : 0.0 V or VCC Timing measurement reference level Input : VCC / 2 Output : VCC / 2 3.3 V Diode = 1N3064 or Equivalent 2.7 kΩ Device Under Test 6.2 kΩ CL Diode = 1N3064 or Equivalent Test Conditions 39 MBM29PL32TM/BM90/10 • Write (Erase/Program) Operations Value Symbol Parameter JEDEC Standard 90 10 Unit Min Typ Max Min Typ Max Write Cycle Time tAVAV tWC 90 100 ns Address Setup Time tAVWL tAS 0 0 ns — tASO 15 15 ns tWLAX tAH 45 45 ns — tAHT 0 0 ns Data Setup Time tDVWH tDS 35 35 ns Data Hold Time tWHDX tDH 0 0 ns OE Setup Time — tOES 0 0 ns CE High During Toggle Bit Polling — tCEPH 20 20 ns OE High During Toggle Bit Polling — tOEPH 20 20 ns Read Recover Time Before Write (OE High to WE Low) tGHWL tGHWL 0 0 ns Read Recover Time Before Write (OE High to CE Low) tGHEL tGHEL 0 0 ns CE Setup Time tELWL tCS 0 0 ns WE Setup Time tWLEL tWS 0 0 CE Hold Time tWHEH tCH 0 0 ns WE Hold Time tEHWH tWH 0 0 ns CE Pulse Width tELEH tCP 35 35 ns Write Pulse Width tWLWH tWP 35 35 ns CE Pulse Width High tEHEL tCPH 25 25 ns Write Pulse Width High tWHWL tWPH 30 30 ns Effective Page Programming Time Per Word (Write Buffer Programming) tWHWH1 tWHWH1 23.5 23.5 µs 100 100 µs Address Setup Time to OE Low During Toggle Bit Polling Address Hold Time Address Hold Time from CE or OE High During Toggle Bit Polling Programming Time Word ns tWHWH2 tWHWH2 1.0 1.0 s VCC Setup Time — tVCS 50 50 µs Recovery Time From RY/BY — tPB 0 0 ns Erase/Program Valid to RY/BY Delay — tBUSY 90 90 ns Rise Time to V * — tVIDR 500 500 ns Rise Time to VACC *3 — tVACCR 500 500 ns Voltage Transition Time *2 — tVLHT 4 4 µs Sector Erase Operation * 1 ID 2 (Continued) 40 MBM29PL32TM/BM90/10 (Continued) Value Symbol Parameter JEDEC Standard 90 10 Unit Min Typ Max Min Typ Max — tWPP 100 100 µs 2 — tOESP 4 4 µs 2 CE Setup Time to WE Active * — tCSP 4 4 µs RESET Pulse Width — tRP 500 500 ns RESET High Time Before Read — tRH 100 100 ns Delay Time from Embedded Output Enable — tEOE 90 100 ns Erase Time-out Time — tTOW 50 50 µs Erase Suspend Transition Time — tSPD 20 20 µs Write Pulse Width *2 OE Setup Time to WE Active * *1 : This does not include the preprogramming time. *2 : This timing is for Sector Group Protection operation. *3 : This timing is for Accelerated Program operation. 41 MBM29PL32TM/BM90/10 ■ ERASE AND PROGRAMMING PERFORMANCE Limits Parameter Unit Remarks 15 s Excludes programming time prior to erasure 100 3000 µs — 23.5 — µs Chip Programming Time — — 300 s Absolute Maximum Programming Time (16 words) — — 6 ms 100,000 — — cycle Min Typ Max Sector Erase Time — 1 Programming Time — Effective Page Programming Time (Write Buffer Programming) Erase/Program Cycle Excludes system-level overhead Non programming within the same page — ■ TSOP (1) PIN CAPACITANCE Value Parameter Input Capacitance Symbol CIN Test Setup Unit Min Typ Max VIN = 0 — 8 10 pF Output Capacitance COUT VOUT = 0 — 8.5 12 pF Control Pin Capacitance CIN2 VIN = 0 — 8 10 pF RESET pin and WP/ACC Pin Capacitance CIN3 VIN = 0 — 20 25 pF Notes : • Test conditions TA = +25°C, f = 1.0 MHz • DQ15/A-1 pin capacitance is stipulated by output capacitance. ■ FBGA PIN CAPACITANCE Value Parameter Input Capacitance Symbol CIN Test Setup Typ Max VIN = 0 — 8 10 pF Output Capacitance COUT VOUT = 0 — 8.5 12 pF Control Pin Capacitance CIN2 VIN = 0 — 8 10 pF RESET pin and WP/ACC Pin Capacitance CIN3 VIN = 0 — 15 20 pF Notes : • Test conditions TA = +25°C, f = 1.0 MHz • DQ15/A-1 pin capacitance is stipulated by output capacitance. 42 Unit Min MBM29PL32TM/BM90/10 ■ SWITCHING WAVEFORMS • Key to Switching Waveforms WAVEFORM INPUTS OUTPUTS Must Be Steady Will Be Steady May Change from H to L Will Be Changing from H to L May Change from L to H Will Be Changing from L to H “H” or “L” Any Change Permitted Changing State Unknown Does Not Apply Center Line is HighImpedance “Off” State tRC Address Address Stable tACC CE tOE tDF OE tOEH WE tCE Data High-Z tOH Output Valid High-Z Read Operation Timing Diagram 43 MBM29PL32TM/BM90/10 A20 to A2 Address Valid A1 to A0 (A-1) Aa Ab Ac tRC tPRC tACC CE tCE OE tOEH tOE tDF tPACC WE tOH High-Z Data Da tPACC tOH Db tOH Dc Page Read Operation Timing Diagram tRC Address Address Stable tACC CE tRH tRP tRH tCE RESET tOH Data High-Z Output Valid Hardware Reset/Read Operation Timing Diagram 44 MBM29PL32TM/BM90/10 3rd Bus Cycle Data Polling 555h Address PA tWC tAS PA tRC tAH CE tCH tCS tCE OE tGHWL tWP tWPH tOE tWHWH1 WE tDS Data A0h tOH tDF tDH PD DQ7 DOUT DOUT Notes : • PA is address of the memory location to be programmed. • PD is data to be programmed at word address. • DQ7 is the output of the complement of the data written to the device. • DOUT is the output of the data written to the device. • Figure indicates the last two bus cycles out of four bus cycle sequence. Alternate WE Controlled Program Operation Timing Diagram 45 MBM29PL32TM/BM90/10 3rd Bus Cycle Address Data Polling PA 555h tWC tAS PA tAH WE tWS tWH OE tGHEL tCP tCPH tWHWH1 CE tDS tDH Data A0h PD DQ 7 D OUT Notes : • PA is address of the memory location to be programmed. • PD is data to be programmed at word address. • DQ7 is the output of the complement of the data written to the device. • DOUT is the output of the data written to the device. • Figure indicates the last two bus cycles out of four bus cycle sequence. Alternate CE Controlled Program Operation Timing Diagram 46 MBM29PL32TM/BM90/10 555h Address tWC 2AAh tAS 555h 555h 2AAh SA* SA* tAH CE tCS tCH OE tGHWL tWP tWPH tDS tDH tTOW WE AAh 10h for Chip Erase 55h 80h AAh 55h Data 10h/ 30h 30h tBUSY RY/BY tVCS VCC * : SA is the sector address for Sector Erase. Address = 555h (Word), AAAh (Byte) for Chip Erase. Chip/Sector Erase Operation Timing Diagram 47 MBM29PL32TM/BM90/10 XXXh Address tWC CE tCS tCH tWP WE tDS tSPD B0h Data RY/BY Erase Suspend Operation Timing Diagram 48 MBM29PL32TM/BM90/10 VA Address CE tCH tDF tOE OE tOEH WE 4 µs tCE * Data DQ7 DQ7 DQ7 = Valid Data High-Z tWHWH1 or 2 DQ6 to DQ0 DQ6 to DQ0 = Output Flag Data tBUSY DQ6 to DQ0 Valid Data High-Z tEOE RY/BY * : DQ7 = Valid Data (The device has completed the Embedded operation.) Note : When checking Hardware Sequence Flags during program operations, it should be checked 4 µs after issuing program command. Data Polling during Embedded Algorithm Operation Timing Diagram 49 MBM29PL32TM/BM90/10 Address tAHT tASO tAHT tAS CE tCEPH WE tOEPH 4 µs tOEH OE tOE tDH DQ6/DQ2 tCE Toggle Data Data Toggle Data * Toggle Data Stop Toggling Output Valid tBUSY RY/BY * : DQ6 stops toggling (The device has completed the Embedded operation). Note : When checking Hardware Sequence Flags during program operations, it should be checked 4 µs after issuing program command. Toggle Bit l Timing Diagram during Embedded Algorithm Operations E nter E m bedded E rasing WE E rase S uspend E rase E nter E rase S uspend P rogram E rase S uspend R ead E rase S uspend P rogram DQ6 DQ2* T oggle D Q 2 and D Q 6 w ith O E or C E * : DQ2 is read from the erase-suspended sector. DQ2 vs. DQ6 50 E rase R esum e E rase S uspend R ead E rase E rase C om plete MBM29PL32TM/BM90/10 CE Rising edge of the last WE signal WE Entire programming or erase operations RY/BY tBUSY RY/BY Timing Diagram during Program/Erase Operation Timing Diagram CE, OE tRH RESET tRP tREADY RESET Timing Diagram ( Not during Embedded Algorithms ) 51 MBM29PL32TM/BM90/10 WE RESET tRP tRB RY/BY tREADY RESET Timing Diagram ( During Embedded Algorithms ) 52 MBM29PL32TM/BM90/10 A20, A19, A18, A17, A16 A15, A14, A13, A12 SGAX SGAY A6, A3, A2, A0 A1 VID VIH A9 tVLHT VID VIH OE tVLHT tVLHT tVLHT tWPP WE tOESP tCSP CE Data 01h tVCS tOE VCC SGAX : Sector Group Address to be protected SGAY : Next Sector Group Address to be protected Sector Group Protection Timing Diagram 53 MBM29PL32TM/BM90/10 VCC tVCS tVIDR tVLHT VID VSS, VIL or VIH RESET CE WE tVLHT Program or Erase Command Sequence RY/BY Unprotection period Temporary Sector Group Unprotection Timing Diagram 54 tVLHT MBM29PL32TM/BM90/10 VCC tVCS RESET tVLHT tVIDR Address SGAX SGAX SGAY A6, A3, A2, A0 A1 CE OE TIME-OUT WE Data 60h 60h 40h 01h 60h tOE SGAX: Sector Group Address to be protected SGAY : Next Sector Group Address to be protected TIME-OUT : Time-Out window = 250 µs (Min) Extended Sector Group Protection Timing Diagram 55 MBM29PL32TM/BM90/10 VCC tVACCR tVCS tVLHT VACC ACC CE WE tVLHT Program Command Sequence Acceleration period Accelerated Program Timing Diagram 56 tVLHT MBM29PL32TM/BM90/10 ■ FLOW CHART EMBEDDED ALGORITHMS Start Write Program Command Sequence (See Below) Data Polling No Increment Address No Verify Data ? Yes Embedded Program Algorithm in progress Last Address ? Yes Programming Completed Program Command Sequence (Address/Command): 555h/AAh 2AAh/55h 555h/A0h Program Address/Program Data Note : The sequence is applied for Word ( ×16 ) mode. The addresses differ from Byte ( × 8 ) mode. Embedded ProgramTM Algorithm 57 MBM29PL32TM/BM90/10 EMBEDDED ALGORITHMS Start Write Erase Command Sequence (See Below) Data Polling No Data = FFh ? Yes Embedded Erase Algorithm in progress Erasure Completed Chip Erase Command Sequence (Address/Command): Individual Sector/Multiple Sector Erase Command Sequence (Address/Command): 555h/AAh 555h/AAh 2AAh/55h 2AAh/55h 555h/80h 555h/80h 555h/AAh 555h/AAh 2AAh/55h 2AAh/55h 555h/10h Sector Address /30h Sector Address /30h Sector Address /30h Note : The sequence is applied for Word ( ×16 ) mode. The addresses differ from Byte ( × 8 ) mode. Embedded EraseTM Algorithm 58 Additional sector erase commands are optional. MBM29PL32TM/BM90/10 Start Wait 4 µs after issuing Program Command Read Byte (DQ 7 to DQ 0) Addr. = VA DQ 7 = Data? VA = Valid address for programming = Any of the sector addresses within the sector being erased during sector erase or multiple sector erases operation = Any of the sector addresses within the sector not being protected during chip erase operation Yes No No DQ 5 = 1? Yes Read Byte (DQ 7 to DQ 0) Addr. = VA DQ 7 = Data? * Yes No Fail Pass * : DQ7 is rechecked even if DQ5 = “1” because DQ7 may change simultaneously with DQ5. Note : Data polling on sector-group protected sector may fail. Data Polling Algorithm 59 MBM29PL32TM/BM90/10 Start Wait 4 µs after issuing Program Command Read DQ7 to DQ0 Addr. = "H" or "L" Read DQ7 to DQ0 Addr. = "H" or "L" DQ6 = Toggle *1 *1 No ? Yes No DQ5 = 1? Yes *1, *2 Read DQ7 to DQ0 Addr. = "H" or "L" Read DQ7 to DQ0 Addr. = "H" or "L" DQ6 = Toggle ? Yes No Program/Erase Operation Not Complete.Write Reset Command Program/Erase Operation Complete *1 : Read Toggle bit twice to determine whether it is toggling. *2 : Recheck Toggle bit because it may stop toggling as DQ5 changes to “1”. Toggle Bit Algorithm 60 MBM29PL32TM/BM90/10 Start Setup Sector Group Addr. (A20, A19, A18, A17, A16, A15, A14, A13, A12) PLSCNT = 1 OE = VID, A9 = VID CE = VIL, RESET = VIH A6 = A3 = A2 = A0 = VIL, A1 = VIH Activate WE Pulse Increment PLSCNT Time out 100 µs WE = VIH, CE = OE = VIL (A9 should remain VID) Read from Sector Group Addr. = SGA, A1 = VIH A6 = A3 = A2 = A0 = VIL ( )* No PLSCNT = 25? Yes Remove VID from A9 Write Reset Command No Data = 01h? Yes Protect Another Sector Group? Yes No Device Failed Remove VID from A9 Write Reset Command Sector Group Protection Completed * : A-1 is VIL in Byte ( × 8 ) mode. Sector Group Protection Algorithm 61 MBM29PL32TM/BM90/10 Start RESET = VID *1 Perform Erase or Program Operations RESET = VIH Temporary Sector Group Unprotection Completed *2 *1 : All protected sector groups are unprotected. *2 : All previously protected sector groups are protected. Temporary Sector Group Unprotection Algorithm 62 MBM29PL32TM/BM90/10 Start RESET = VID Wait to 4 µs Device is Operating in Temporary Sector Group Unprotection Mode No Extended Sector Group Protection Entry? Yes To Setup Sector Group Protection Write XXXh/60h PLSCNT = 1 To Protect Sector Group Write 60h to Sector Address (A6 = A3 = A2 = A0 =VIL, A1 = VIH) Time Out 250 µs Increment PLSCNT To Verify Sector Group Protection Write 40h to Sector Address (A6 = A3 = A2 = A0 =VIL, A1 = VIH) Setup Next Sector Group Address Read from Sector Group Address (A6 = A3 = A2 = A0 =VIL, A1 = VIH) No No PLSCNT = 25? Yes Data = 01h? Yes Remove VID from RESET Write Reset Command Yes Protection Other Sector Group? No Device Failed Remove VID from RESET Write Reset Command Sector Group Protection Completed Extended Sector Group Protection Algorithm 63 MBM29PL32TM/BM90/10 FAST MODE ALGORITHM Start 555h/AAh Set Fast Mode 2AAh/55h 555h/20h XXXh/A0h Program Address/Program Data Data Polling Verify Data? No In Fast Program Yes Increment Address No Last Address ? Yes Programming Completed XXXh/90h Reset Fast Mode XXXh/F0h Notes : • The sequence is applied for Word ( ×16 ) mode. • The addresses differ from Byte ( × 8 ) mode. Embedded ProgramTM Algorithm for Fast Mode 64 MBM29PL32TM/BM90/10 ■ ORDERING INFORMATION Part No. MBM29PL32TM90TN MBM29PL32TM10TN MBM29PL32TM90PBT MBM29PL32TM10PBT MBM29PL32BM90TN Package Access Time (ns) 48-pin, plastic TSOP (1) (FPT-48P-M19) (Normal Bend) 90 ns 48-ball, plastic FBGA (BGA-48P-M20) 48-pin, plastic TSOP (1) (FPT-48P-M19) (Normal Bend) MBM29PL32BM10TN MBM29PL32BM90PBT MBM29PL32BM10PBT MBM29PL32TM/BM 48-ball, plastic FBGA (BGA-48P-M20) 90 100 ns Remarks Top Sector 90 ns 100 ns 90 ns 100 ns Bottom Sector 90 ns 100 ns TN PACKAGE TYPE TN = 48-Pin Thin Small Outline Package (TSOP(1) Standard Pinout) PBT = 48-Ball Fine pitch Ball Grid Array Package (FBGA) SPEED OPTION 90 = 90 ns access time 10 = 100 ns access time DEVICE NUMBER/DESCRIPTION 32 Mbit (4M × 8/2M × 16) MirrorFlash with Page Mode, Boot Sector 3.0 V-only Read, Program, and Erase 65 MBM29PL32TM/BM90/10 ■ PACKAGE DIMENSIONS Note 1) * : Values do not include resin protrusion. Resin protrusion and gate protrusion are +0.15(.006)Max(each side). Note 2) Pins width and pins thickness include plating thickness. Note 3) Pins width do not include tie bar cutting remainder. 48-pin plastic TSOP(1) (FPT-48P-M19) LEAD No. 1 48 INDEX Details of "A" part 0.25(.010) 0~8˚ 0.60±0.15 (.024±.006) 24 25 * 12.00±0.20 20.00±0.20 (.787±.008) * 18.40±0.20 (.724±.008) "A" 0.10(.004) (.472±.008) +0.10 1.10 –0.05 +.004 .043 –.002 (Mounting height) +0.03 0.17 –0.08 +.001 .007 –.003 C 0.10±0.05 (.004±.002) (Stand off height) 0.50(.020) 0.22±0.05 (.009±.002) 0.10(.004) M 2003 FUJITSU LIMITED F48029S-c-6-7 Dimensions in mm (inches) Note : The values in parentheses are reference values. (Continued) 66 MBM29PL32TM/BM90/10 (Continued) 48-ball plastic FBGA (BGA-48P-M20) +0.12 8.00±0.20(.315±.008) +.003 1.08 –0.13 .043 –.005 (Mounting height) 0.38±0.10(.015±.004) (Stand off) 5.60(.220) 0.80(.031)TYP 6 5 6.00±0.20 (.236±.008) 4 4.00(.157) 3 2 1 H (INDEX AREA) G F E D 48-ø0.45±0.05 (48-ø.018±.002) C B A ø0.08(.003) M 0.10(.004) C 2003 FUJITSU LIMITED B48020S-c-2-2 Dimensions in mm (inches) Note : The values in parentheses are reference values. 67 MBM29PL32TM/BM90/10 FUJITSU LIMITED All Rights Reserved. The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering. The information, such as descriptions of function and application circuit examples, in this document are presented solely for the purpose of reference to show examples of operations and uses of Fujitsu semiconductor device; Fujitsu does not warrant proper operation of the device with respect to use based on such information. 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Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the prior authorization by Japanese government will be required for export of those products from Japan. F0407 FUJITSU LIMITED Printed in Japan