ON MC74VHCT86A Quad 2-input xor gate / cmos logic level shifter Datasheet

MC74VHCT86A
Quad 2-Input XOR Gate /
CMOS Logic Level Shifter
with LSTTL−Compatible Inputs
The MC74VHCT86A is an advanced high speed CMOS 2−input
Exclusive−OR gate fabricated with silicon gate CMOS technology. It
achieves high speed operation similar to equivalent Bipolar Schottky
TTL while maintaining CMOS low power dissipation.
The internal circuit is composed of three stages, including a buffer
output which provides high noise immunity and stable output.
The device input is compatible with TTL−type input thresholds and
the output has a full 5 V CMOS level output swing. The input
protection circuitry on this device allows overvoltage tolerance on the
input, allowing the device to be used as a logic−level translator from
3.0 V CMOS logic to 5.0 V CMOS Logic or from 1.8 V CMOS logic
to 3.0 V CMOS Logic while operating at the high−voltage power
supply.
The MC74VHCT86A input structure provides protection when
voltages up to 7 V are applied, regardless of the supply voltage. This
allows it to be used to interface 5 V circuits to 3 V circuits. The output
structures also provide protection when VCC = 0 V. These input and
output structures help prevent device destruction caused by supply
voltage − input/output voltage mismatch, battery backup, hot
insertion, etc.
•
•
•
•
•
•
•
•
•
•
•
High Speed: tPD = 4.8 ns (Typ) at VCC = 5 V
Low Power Dissipation: ICC = 2 mA (Max) at TA = 25°C
TTL−Compatible Inputs: VIL = 0.8 V; VIH = 2.0 V
Power Down Protection Provided on Inputs and Outputs
Balanced Propagation Delays
Designed for 2 V to 5.5 V Operating Range
Low Noise: VOLP = 0.8 V (Max)
Pin and Function Compatible with Other Standard Logic Families
Latchup Performance Exceeds 300 mA
ESD Performance: HBM > 2000 V; Machine Model > 200 V
These Devices are Pb−Free and are RoHS Compliant
LOGIC DIAGRAM
A1
B1
A2
B2
A3
B3
A4
B4
14−LEAD SOIC
D SUFFIX
CASE 751A
14−LEAD TSSOP
DT SUFFIX
CASE 948G
PIN CONNECTION AND
MARKING DIAGRAM (Top View)
VCC
14
B4
13
A4
12
Y4
11
B3
10
A3
9
Y3
8
1
2
3
4
5
6
7
A1
B1
Y1
A2
B2
Y2
GND
For detailed package marking information, see the Marking
Diagram section on page 4 of this data sheet.
FUNCTION TABLE
Inputs
Output
A
B
Y
L
L
H
H
L
H
L
H
L
H
H
L
ORDERING INFORMATION
1
3
2
Device
Y1
MC74VHCT86ADR2G
4
6
5
Y2
9
Y = A)B
8
10
Package
Shipping
SOIC−14 2500 / Tape &
(Pb−Free)
Reel
MC74VHCT86ADTR2G TSSOP−14 2500 / Tape &
Reel
(Pb−Free)
Y3
12
11
13
© Semiconductor Components Industries, LLC, 2014
November, 2014 − Rev. 3
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Y4
1
Publication Order Number:
MC74VHCT86A/D
MC74VHCT86A
MAXIMUM RATINGS
Symbol
Value
Unit
VCC
DC Supply Voltage
Parameter
– 0.5 to + 7.0
V
Vin
DC Input Voltage
– 0.5 to + 7.0
V
Vout
DC Output Voltage
– 0.5 to + 7.0
– 0.5 to VCC + 0.5
V
VCC = 0
High or Low State
IIK
Input Diode Current
− 20
mA
IOK
Output Diode Current (VOUT < GND; VOUT > VCC)
± 20
mA
Iout
DC Output Current, per Pin
± 25
mA
ICC
DC Supply Current, VCC and GND Pins
± 50
mA
PD
Power Dissipation in Still Air,
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
_C
SOIC Package†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or V CC ).
Unused outputs must be left open.
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of
these limits are exceeded, device functionality should not be assumed, damage may occur and
reliability may be affected.
†Derating — SOIC Package: – 7 mW/_C from 65_ to 125_C
TSSOP Package: − 6.1 mW/_C from 65_ to 125_C
RECOMMENDED OPERATING CONDITIONS
Characteristics
Symbol
Min
Max
Unit
DC Supply Voltage
VCC
2.0
5.5
V
DC Input Voltage
VIN
0.0
5.5
V
VOUT
0.0
0.0
5.5
VCC
V
TA
−55
+85
°C
tr , tf
0
0
100
20
ns/V
DC Output Voltage
VCC = 0
High or Low State
Operating Temperature Range
Input Rise and Fall Time
VCC = 3.3V ± 0.3V
VCC = 5.0V ± 0.5V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
NOISE CHARACTERISTICS (Input tr = tf = 3.0ns, CL = 50pF, VCC = 5.0V, Measured in SOIC Package)
TA = 25°C
Symbol
Characteristic
Typ
Max
Unit
VOLP
Quiet Output Maximum Dynamic VOL
0.3
0.8
V
VOLV
Quiet Output Minimum Dynamic VOL
− 0.3
− 0.8
V
VIHD
Minimum High Level Dynamic Input Voltage
3.5
V
VILD
Maximum Low Level Dynamic Input Voltage
1.5
V
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2
MC74VHCT86A
DC ELECTRICAL CHARACTERISTICS
VCC
Symbol
Parameter
Test Conditions
Min
1.2
2.0
2.0
VIH
Minimum High−Level
Input Voltage
3.0
4.5
5.5
VIL
Maximum Low−Level
Input Voltage
3.0
4.5
5.5
VOH
Minimum High−Level
Output Voltage
VIN = VIH or VIL
VOL
Maximum Low−Level
Output Voltage
VIN = VIH or VIL
TA ≤ 85°C
TA = 25°C
(V)
Typ
Max
Min
1.2
2.0
2.0
3.0
4.5
2.9
4.4
VIN = VIH or VIL
IOH = −4mA
IOH = −8mA
3.0
4.5
2.58
3.94
VIN = VIH or VIL
IOL = 50μA
3.0
4.5
VIN = VIH or VIL
IOL = 4mA
IOL = 8mA
Min
0.53
0.8
0.8
3.0
4.5
Max
1.2
2.0
2.0
0.53
0.8
0.8
VIN = VIH or VIL
IOH = −50μA
TA ≤ 125°C
Max
V
0.53
0.8
0.8
2.9
4.4
2.9
4.4
2.48
3.80
2.34
3.66
Unit
V
V
V
0.0
0.0
0.1
0.1
0.1
0.1
0.1
0.1
3.0
4.5
0.36
0.36
0.44
0.44
0.52
0.52
V
V
IIN
Maximum Input
Leakage Current
VIN = 5.5V or GND
0 to
5.5
±0.1
±1.0
±1.0
μA
ICC
Maximum Quiescent
Supply Current
VIN = VCC or GND
5.5
2.0
20
40
μA
ICCT
Quiescent Supply
Current
Input: VIN = 3.4V
5.5
1.35
1.50
1.65
mA
IOPD
Output Leakage
Current
VOUT = 5.5V
0.0
0.5
5.0
10
μA
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0ns)
TA = 25°C
Symbol
Parameter
Propagation Delay,
A or B to Y
tPLH,
tPHL
Cin
Test Conditions
Min
TA = − 40 to 85°C
Typ
Max
Min
Max
Unit
ns
VCC = 3.3 ± 0.3V
CL = 15pF
CL = 50pF
7.0
9.5
11.0
14.5
1.0
1.0
13.0
16.5
VCC = 5.0 ± 0.5V
CL = 15pF
CL = 50pF
4.8
6.3
6.8
8.8
1.0
1.0
8.0
10.0
4
10
Input Capacitance
10
pF
Typical @ 25°C, VCC = 5.0V
18
CPD
Power Dissipation Capacitance (Note 1)
pF
1. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC / 4 (per gate). CPD is used to determine the
no−load dynamic power consumption; PD = CPD VCC2 fin + ICC VCC.
TEST POINT
3.0V
A or B
OUTPUT
50%
DEVICE
UNDER
TEST
GND
tPLH
Y
tPHL
CL*
VOH
50% VCC
VOL
*Includes all probe and jig capacitance
Figure 1. Switching Waveforms
Figure 2. Test Circuit
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3
MC74VHCT86A
MARKING DIAGRAMS
(Top View)
14
13
12
11
10
9
14 13 12 11 10
8
2
3
4
8
6
7
VHCT
86A
ALYWG
G
VHCT86AG
AWLYWW*
1
9
5
6
7
1
2
14−LEAD SOIC
D SUFFIX
CASE 751A
3
4
5
14−LEAD TSSOP
DT SUFFIX
CASE 948G
14
13
12
11
10
9
8
6
7
74VHCT86A
ALYWG*
1
2
3
4
5
14−LEAD SOEIAJ
M SUFFIX
CASE 965
A
WL, L
Y
WW, W
G or G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*See Applications Note #AND8004/D for date code and traceability information.
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4
MC74VHCT86A
PACKAGE DIMENSIONS
TSSOP−14
CASE 948G
ISSUE B
14X K REF
0.10 (0.004)
0.15 (0.006) T U
M
T U
V
S
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION SHALL
NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
S
S
N
2X
14
L/2
0.25 (0.010)
8
M
B
−U−
L
PIN 1
IDENT.
F
7
1
0.15 (0.006) T U
N
S
DETAIL E
K
A
−V−
ÉÉÉ
ÇÇÇ
ÇÇÇ
ÉÉÉ
K1
J J1
SECTION N−N
−W−
C
0.10 (0.004)
−T− SEATING
PLANE
D
H
G
DETAIL E
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
4.90
5.10
4.30
4.50
−−−
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.50
0.60
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
SOLDERING FOOTPRINT
7.06
1
0.65
PITCH
14X
0.36
14X
1.26
DIMENSIONS: MILLIMETERS
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5
INCHES
MIN MAX
0.193 0.200
0.169 0.177
−−− 0.047
0.002 0.006
0.020 0.030
0.026 BSC
0.020 0.024
0.004 0.008
0.004 0.006
0.007 0.012
0.007 0.010
0.252 BSC
0_
8_
MC74VHCT86A
PACKAGE DIMENSIONS
SOIC−14
D SUFFIX
CASE 751A−03
ISSUE J
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.127
(0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
−A−
14
8
−B−
P 7 PL
0.25 (0.010)
M
B
M
7
1
G
F
R X 45 _
C
−T−
SEATING
PLANE
D 14 PL
0.25 (0.010)
M
T B
J
M
K
S
A
DIM
A
B
C
D
F
G
J
K
M
P
R
S
MILLIMETERS
MIN
MAX
8.55
8.75
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0_
7_
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.337 0.344
0.150 0.157
0.054 0.068
0.014 0.019
0.016 0.049
0.050 BSC
0.008 0.009
0.004 0.009
0_
7_
0.228 0.244
0.010 0.019
SOLDERING FOOTPRINT
7X
7.04
14X
1.52
1
14X
0.58
1.27
PITCH
DIMENSIONS: MILLIMETERS
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