ADC11DV200 www.ti.com SNAS477 – APRIL 2009 ADC11DV200 Dual 11-bit, 200 MSPS Low-Power A/D Converter with Parallel LVDS/CMOS Outputs Check for Samples: ADC11DV200 FEATURES DESCRIPTION • • • • • • The ADC11DV200 is a monolithic analog-to-digital converter capable of converting two analog input signals into 11-bit digital words at rates up to 200 Mega Samples Per Second (MSPS). The digital output mode is selectable and can be either differential LVDS or CMOS signals. This converter uses a differential, pipelined architecture with digital error correction and an on-chip sample-and-hold circuit to minimize die size and power consumption while providing excellent dynamic performance. A unique sample-and-hold stage yields a full-power bandwidth of 900MHz. Fabricated in core CMOS process, the ADC11DV200 may be operated from a single 1.8V power supply. The ADC11DV200 achieves approximately 10.06 effective bits at Nyquist and consumes just 280mW at 170MSPS in CMOS mode 450mW at 200MSPS in LVDS mode. The power consumption can be scaled down further by reducing sampling rates. 1 2 • • • • Single 1.8V Power Supply Operation. Power Scaling with Clock Frequency. Internal Sample-and-Hold. Internal or External Reference. Power Down Mode. Offset Binary or 2's Complement Output Data Format. LVDS or CMOS Output Signals. 60-Pin WQFN Package, (9x9x0.8mm, 0.5mm Pin-Pitch) Clock Duty Cycle Stabilizer. IF Sampling Bandwidth > 900MHz. APPLICATIONS • • • • • Digital Predistortion (DPD) Wireless Communications Infrastructure Medical Imaging Portable Instrumentation Digital Video KEY SPECIFICATIONS • • • • • • • • • Resolution 11 Bits Conversion Rate 200 MSPS ENOB 10.06 bits (typ) @Fin=70 MHz SNR 62.5 dBFS (typ) @Fin=70 MHz SINAD 62.3 dBFS (typ) @Fin=70 MHz SFDR 82 dBFS (typ) @Fin=70 MHz LVDS Power 450 mW (typ) @Fs=200 MSPS CMOS Power 280 mW (typ) @Fs=170 MSPS Operating Temp. Range −40°C to +85°C. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009, Texas Instruments Incorporated ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Block Diagram VIN A+ S/H VIN A- CLK+ CLK- 11 Bit 200 MSPS Pipeline Converter Timing Control 11 DCS Digital Error Correction VRPA VRMA VRNA Output Clock Reference VREF Output Formatter Output Buffer (CMOS/LVDS) Data Out DRDY VRPB VRMB VRNB Digital Error Correction 11 11 Bit 200 MSPS Pipeline Converter VIN B+ VIN B- S/H AGND VIN BVIN B+ AGND VRM B VRP B DRGND DB6/D8 + 46 DB7/D8 47 DB8/D9 + 48 49 DB9/D9 - DA10/D10+ 50 DB10/D1051 PDB 52 53 VD AGND 54 55 CLK - CLK + 56 AGND 57 VA 58 59 60 VA Connection Diagram 1 45 2 44 3 43 4 42 5 41 6 40 ADC11DV200 60 LEAD WQFN (TOP VIEW) 7 DB0/D5 + 9 37 10 36 11 35 DRDYB/DRDY - PDA 12 * Exposed pad must be soldered to ground 34 plane to ensure rated performance. 33 13 VIN A- 38 DRDYA/DRDY + AGND VIN A+ DA9/D4 DA8/D4 + DA7/D3 - 14 32 15 31 DA6/D3 + VDR Submit Documentation Feedback DRGND 30 29 DA5/D2 - 28 DA3/D1- DA4/D2 + 27 26 DA2/D1 + 25 DA1/D0 - 24 DA0/D0 + 23 AGND OUTSEL 21 22 VD 19 20 DF/DCS REXT 18 VA VREF 17 VA 16 AGND 2 DB3/D6 - DB1/D5 - VA VRM A DB4/D7 + 39 8 VRP A DB5/D7 - DB2/D6 + VRN B VRN A VDR Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Pin Descriptions and Equivalent Circuits Pin No. Symbol Equivalent Circuit Description ANALOG I/O 13 3 VINA+ VINB+ 14 2 VINAVINB- 10 6 VRPA VRPB 11 5 VRMA VRMB VA Differential analog input pins. The differential full-scale input signal level is 1.5VP-P with each input pin signal centered on a common mode voltage, VCM. AGND VA VA VA 9 7 VRNA VRNB VA These pins should each be bypassed to AGND with a low ESL (equivalent series inductance) 0.1 µF capacitor placed very close to the pin to minimize stray inductance. An 0201 size 0.1 µF capacitor should be placed between VRP and VRN as close to the pins as possible. VRP and VRN should not be loaded. VRM may be loaded to 1mA for use as a temperature stable 0.9V reference. It is recommended to use VRM to provide the common mode voltage, VCM for the differential analog inputs. AGND AGND Reference Voltage select pin and external reference input. The relationship between the voltage on the pin and the reference voltage is as follows: VA 17 1.4V ≤ VREF ≤ VA The internal 0.75V reference is used. 0.2V ≤ VREF ≤ 1.4V The external reference voltage is used. Note: When using an external reference, be sure to bypass with a 0.1µF capacitor to AGND as close to the pin as possible. AGND ≤ VREF ≤ 0.2V The internal 0.5V reference is used. VREF AGND VA 19 Ibias Programming resistor for analog bias current. Nominally a 3.3kΩ to AGND for 200MSPS, or tie to VA to use the internal frequency scaling current. REXT AGND Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 3 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Pin Descriptions and Equivalent Circuits (continued) Pin No. Symbol Equivalent Circuit Description VA 20 Data Format/Duty Cycle Correction selection pin. (see Table 1) DF/DCS AGND DIGITAL I/O Clock input pins signal. The analog inputs are sampled on the rising edge of this signal. The clock can be configured for single-ended mode by shorting the CLK- pin to AGND. When in differential mode, the common mode voltage for the clock is internally set to 1.2V. VA 57 56 CLK + CLK - AGND 36 53 PD_A PD_B Two-state input controlling Power Down. PD = VA, Power Down is enabled and power dissipation is reduced. PD = AGND, Normal operation. VA Two-state input controlling Output Mode. OUTSEL = VD, LVDS Output Mode. OUTSEL = AGND, CMOS Output Mode. 23 OUTSEL AGND LVDS Output Mode 4 24, 25 26, 27 28, 29 32, 33 34, 35 39, 40 41, 42 43, 44 47, 48 49, 50 51, 52 D0+,D0D1+, D1D2+, D2D3+, D3D4+, D4D5+, D5D6+, D6D7+, D7D8+, D8D9+, D9D10+, D10- 37 38 DRDY+ DRDY- LVDS Output pairs for bits 0 through 10. A-channel and Bchannel digital LVDS outputs are interleaved. A channel is ready at rising edge of DRDY and B channel is ready at the falling edge of DRDY. VDR - + + + - DRGND Data Ready Strobe. This signal is a LVDS DDR clock used to capture the output data. A-channel data is valid on the rising edge of this signal and B-channel data is valid on the falling edge. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Pin Descriptions and Equivalent Circuits (continued) Pin No. Symbol Equivalent Circuit Description CMOS Output Mode Digital data output pins that make up the 11-bit conversion result for Channel A. DA0 (pin 24) is the LSB, while DA10 (pin 51) is the MSB of the output word. Output levels are CMOS compatible. 24-29, 32-35,51 DA0-DA10 39-44, 47-50,52 DB0-DB10 Digital data output pins that make up the 11-bit conversion result for Channel B. DB0 (pin 39) is the LSB, while DB10 (pin 52) is the MSB of the output word. Output levels are CMOS compatible. 37 DRDYA Data Ready Strobe for channel A. This signal is used to clock the A-Channel output data. DRDYA is a SDR clock with same frequency as CLK rate and data is valid on the rising edges. 38 DRDYB VDR DRGND VA DRGND Data Ready Strobe for channel B. This signal is used to clock the B-Channel output data. DRDYB is a SDR clock with same frequency as CLK rate and data is valid on the rising edges. ANALOG POWER Positive analog supply pins. These pins should be connected to a quiet source and be bypassed to AGND with 0.1 µF capacitors located close to the power pins. 8, 16, 18, 59, 60 VA 1, 4, 12, 15, 22, 55, 58, EP AGND The ground return for the analog supply. Exposed Pad (EP) must be soldered to AGND to ensure rated performance. 21, 54 VD Positive digital supply pins. These pins should be connected to a quiet source and be bypassed to AGND with 0.1 µF capacitors located close to the power pins. 31, 45 VDR Positive driver supply pin for the output drivers. This pin should be connected to a quiet voltage source and be bypassed to DRGND with a 0.1 µF capacitor located close to the power pin. 30, 46 DRGND DIGITAL POWER The ground return for the digital output driver supply. This pin should be connected to the system digital ground. Table 1. Voltage on DF/DCS Pin and Corresponding Chip Response Voltage on DF/DCS Results Suggestions Min Max DF DCS 0 mV 200mV 1 1 2's complement data, duty cycle correction on Tie to AGND 250 mV 600 mV 0 0 Offset binary data, duty cycle correction off Leave floating 750 mV 1250 mV 1 0 2's complement data, duty cycle correction off 1400mV VA 0 1 Offset binary data, duty cycle correction on Tie to VA These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 5 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Absolute Maximum Ratings (1) (2) (3) −0.3V to 2.2V Supply Voltage (VA, VD VDR) −0.3V to (VA +0.3V) Voltage on Any Pin (Not to exceed 2.2V) Input Current at Any Pin other than Supply Pins Package Input Current (4) ±25 mA (4) ±50 mA Max Junction Temp (TJ) +150°C Thermal Resistance (θJA) (5) 30°C/W ESD Rating (6) Human Body Model 2500V Machine Model 250V Human Body Model 750V −65°C to +150°C Storage Temperature Soldering process must comply with TI's Reflow Temperature Profile specifications. Refer to www.ti.com/packaging. (7) (1) (2) (3) (4) (5) (6) (7) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is specified to be functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Operation of the device beyond the maximum Operating Ratings is not recommended. All voltages are measured with respect to GND = AGND = DRGND = 0V, unless otherwise specified. If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications. When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA), the current at that pin should be limited to ±5 mA. The ±50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of ±5 mA to 10. The maximum allowable power dissipation is dictated by TJ,max, the junction-to-ambient thermal resistance, (θJA), and the ambient temperature, (TA), and can be calculated using the formula PD,max = (TJ,max - TA )/θJA. The values for maximum power dissipation listed above will be reached only when the device is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is reversed). Such conditions should always be avoided. Human Body Model is 100 pF discharged through a 1.5 kΩ resistor. Machine Model is 220 pF discharged through 0Ω resistor. Charged device model simulates a pin slowly acquiring charge (such as from a device sliding down the feeder in an automated assembler) then rapidly being discharged. Reflow temperature profiles are different for lead-free and non-lead-free packages. Operating Ratings (1) (2) −40°C ≤ TA ≤ +85°C Operating Temperature Supply Voltage (VA, VD, VDR) Clock Duty Cycle +1.7V to +1.9V (DCS Enabled) (DCS disabled) VCM (1) (2) 6 30/70 % 48/52 % 0.8V to 1.0V Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is specified to be functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Operation of the device beyond the maximum Operating Ratings is not recommended. All voltages are measured with respect to GND = AGND = DRGND = 0V, unless otherwise specified. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Converter Electrical Characteristics Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, CLK duty cycle = 50%, DCS = ON, Internal 0.75V Reference, LVDS Output. Typical values are for TA = 25°C. Boldface limits apply for TMIN ≤ TA ≤ TMAX. All other limits apply for TA = +25°C (1) (2) Symbol Parameter Conditions Typical Units (Limits) (3) Limits Resolution with No Missing Codes 11 Bits (min) INL Integral Non Linearity 0.65 1.5 -1.5 LSB (max) LSB (min) DNL Differential Non Linearity 0.32 0.75 -0.65 LSB (max) LSB (min) PGE Positive Gain Error 0.57 ±3 %FS (max) NGE Negative Gain Error 0.60 ±2.7 %FS (max) TC PGE Positive Gain Error Tempco −40°C ≤ TA ≤ +85°C 13 TC NGE Negative Gain Error Tempco −40°C ≤ TA ≤ +85°C 15 VOFF Offset Error TC VOFF Offset Error Tempco STATIC CONVERTER CHARACTERISTICS 0.1 −40°C ≤ TA ≤ +85°C ppm/°C ppm/°C ±0.55 4 %FS (max) ppm/°C Under Range Output Code 0 0 Over Range Output Code 2047 2047 1 0.85 REFERENCE AND ANALOG INPUT CHARACTERISTICS V (min) V (max) VRM Common Mode Output Voltage 0.9 VCM Analog Input Common Mode Voltage 0.9 V CIN VIN Input Capacitance (each pin to AGND) (4) VRP VRN 1 pF 2.5 pF Internal Reference Top 1.33 V Internal Reference Bottom 0.55 V Internal Reference Accuracy EXT VREF (1) VIN = 0.75 Vdc ± 0.5 (CLK LOW) V (CLK HIGH) (VRP-VRN) 0.78 V 0.5 1.0 External Reference Voltage V (Min) V (max) The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided current is limited per Absolute Maximum Ratings, Note 4. However, errors in the A/D conversion can occur if the input goes above VA or below AGND. VA I/O To Internal Circuitry AGND (2) (3) (4) With a full scale differential input of 1.5VP-P , the 11-bit LSB is 732.8µV. Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. The input capacitance is the sum of the package/pin capacitance and the sample and hold circuit capacitance. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 7 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Dynamic Converter Electrical Characteristics Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, CLK duty cycle = 50%, DCS = ON, Internal 0.75V Reference, LVDS Output. Typical values are for TA = 25°C. Boldface limits apply for TMIN ≤ TA ≤ TMAX. All other limits apply for TA = +25°C (1) (2) Symbol Parameter Conditions Typical (3) Limits Units (Limits) (4) DYNAMIC CONVERTER CHARACTERISTICS, AIN= -1dBFS FPBW SNR SFDR ENOB Full Power Bandwidth Signal-to-Noise Ratio (5) -1 dBFS Input, −3 dB Corner (6) Spurious Free Dynamic Range (7) Effective Number of Bits H2 Second Harmonic Distortion H3 Third Harmonic Distortion SINAD Signal-to-Noise and Distortion Ratio IMD Intermodulation Distortion Cross Talk (1) (9) (9) (8) 900 MHz fIN = 10 MHz, Vref = 0.75V 62.5 dBFS fIN = 10 MHz, Vref = 1.0V 63.8 fIN = 70 MHz, Vref = 0.75V 62.5 dBFS 61.5 dBFS (min) fIN = 70 MHz, Vref = 1.0V 63.7 dBFS fIN = 10 MHz, Vref = 0.75V 82 dBFS fIN = 10 MHz, Vref = 1.0V 82.4 dBFS fIN = 70 MHz, Vref = 0.75V 82 fIN = 70 MHz, Vref = 1.0V 81.8 dBFS fIN = 10 MHz 10.06 Bits fIN = 70 MHz 10.06 fIN = 10 MHz -94 fIN = 70 MHz -94 fIN = 10 MHz -85 fIN = 70 MHz -84 fIN = 10 MHz 62.3 fIN = 70 MHz 62.3 fIN1 = 69 MHz AIN1 = -7 dBFS fIN2 = 70 MHz AIN2 = -7 dBFS fIN1 = 69 MHz AIN1 = -1 dBFS fIN2 = 70MHz AIN2 = -1 dBFS 71.5 dBFS (min) 9.84 Bits (min) -71.5 dBFS (min) dBFS dBFS -71.5 dBFS (min) 61 dBFS (min) dBFS 93 dBFS 97 dBFS The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided current is limited per Absolute Maximum Ratings, Note 4. However, errors in the A/D conversion can occur if the input goes above VA or below AGND. VA I/O To Internal Circuitry AGND (2) (3) (4) (5) (6) (7) (8) (9) 8 With a full scale differential input of 1.5VP-P , the 11-bit LSB is 732.8µV. Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. Units of dBFS indicates the value that would be attained with a full-scale input signal. This parameter is specified by design and/or characterization and is not tested in production. SNR minimum and typical values are for LVDS mode. Typical values for CMOS mode are typically 0.2dBFS lower. SFDR minimum and typical values are for LVDS mode. Typical values for CMOS mode are typically 2dBFS lower. SINAD minimum and typical values are for LVDS mode. Typical values for CMOS mode are typically 0.1dBFS lower. This parameter is specified by design and/or characterization and is not tested in production. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Power Supply Electrical Characteristics Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, CLK duty cycle = 50%, DCS = ON, Internal 0.75V Reference, LVDS Output. Typical values are for TA = 25°C. Boldface limits apply for TMIN ≤ TA ≤ TMAX. All other limits apply for TA = 25°C (1) (2) Symbol Parameter Conditions Typical (3) Limits Units (Limits) LVDS OUTPUT MODE IA Analog Supply Current ID Digital Supply Current IDR Output Driver Supply Current Power Consumption Power Down Power Consumption CMOS OUTPUT MODE 160 Full Operation, External 3.3kΩ Bias 148 168 mA (max) Full Operation 36 41 mA (max) 64 83 mA (max) 525 mW (max) Internal Bias 473 External 3.3kΩ Bias 450 PDA=PDB=VA 57 Full Operation, Internal Bias 138 Full Operation, External 3.3kΩ Bias 124 mA mW mW (4) IA Analog Supply Current ID Digital Supply Current Power Consumption Power Down Power Consumption (1) Full Operation, Internal Bias Full Operation 31 Internal Bias 310 External 3.3kΩ Bias 280 PDA=PDB=VA 60 mA mA mW mW The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided current is limited per Absolute Maximum Ratings, Note 4. However, errors in the A/D conversion can occur if the input goes above VA or below AGND. VA I/O To Internal Circuitry AGND (2) (3) (4) With a full scale differential input of 1.5VP-P , the 11-bit LSB is 732.8µV. Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. CMOS Specifications are for FCLK = 170 MHz. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 9 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Input/Output Logic Electrical Characteristics Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, CLK duty cycle = 50%, DCS = ON, Internal 0.75V Reference. Typical values are for TA = 25°C. Boldface limits apply for TMIN ≤ TA ≤ TMAX. All other limits apply for TA = 25°C (1) (2) Symbol Parameter Conditions Typical (3) Limits Units (Limits) DIGITAL INPUT CHARACTERISTICS (PD_A,PD_B) Logical “1” Input Voltage (4) VA = 1.9V 0.89 V (min) VIN(0) Logical “0” Input Voltage (4) VA = 1.7V 0.67 V (max) IIN(1) Logical “1” Input Current VIN = 1.8V 10.6 µA IIN(0) Logical “0” Input Current VIN = 0V -7.6 µA CIN Digital Input Capacitance 2 pF 330 mVP-P VIN(1) LVDS OUTPUT CHARACTERISTICS (D0-D10,DRDY) VOD LVDS differential output voltage ±VOD Output Differential Voltage Unbalance (4) 0 VOS LVDS common-mode output voltage ±VOS Offset Voltage Unbalance RL Intended Load Resistance (4) 50 1.25 V 50 CMOS OUTPUT CHARACTERISTICS (DA0-DA10,DB0-DB10,DRDYA, DRDYB) mV mV 100 Ω 1.8 V (5) VOH Logical "1" Output Voltage VDR = 1.8V (Unloaded) VOL Logical "0" Output Voltage VDR = 1.8V (Unloaded) 0 V +IOSC Output Short Circuit Source Current VOUT = 0V -20 mA -IOSC Output SHort Circuit Sink Current VOUT = VDR 20 mA COUT Digital Output Capacitance 2 pF (1) The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided current is limited per Absolute Maximum Ratings, Note 4. However, errors in the A/D conversion can occur if the input goes above VA or below AGND. VA I/O To Internal Circuitry AGND (2) (3) (4) (5) 10 With a full scale differential input of 1.5VP-P , the 11-bit LSB is 732.8µV. Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. This parameter is specified by design and/or characterization and is not tested in production. CMOS Specifications are for FCLK = 170 MHz. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Timing and AC Characteristics Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, CLK duty cycle = 50%, DCS = ON, Internal 0.75V Reference. Typical values are for TA = 25°C. Timing measurements are taken at 50% of the signal amplitude. Boldface limits apply for TMIN ≤ TA ≤ TMAX. All other limits apply for TA = 25°C (1) (2) Symbol Parameter Conditions Typical (3) Limits Units (Limits) 200 MHz (max) LVDS OUTPUT MODE Maximum Clock Frequency Minimum Clock Frequency DCS On DCS Off 65 45 MHz (min) tCH Clock High Time DCS On DCS Off 1.5 2.4 ns (min) tCL Clock Low Time DCS On DCS Off 1.5 2.4 ns (min) tCONV Conversion Latency 5/5.5 (A/B) Clock Cycles tODA Output Delay of CLK to A-Channel Data Relative to rising edge of CLK 2.7 1.46 ns (min) tODB Output Delay of CLK to B-Channel Data Relative to falling edge of CLK 2.7 1.46 ns (min) tSU Data Output Setup Time Relative to DRDY 1.2 0.7 ns (min) tH Data Output Hold Time Relative to DRDY 1.2 0.7 ns (min) tAD Aperture Delay 0.7 ns tAJ Aperture Jitter 0.3 ps rms tSKEW Data-Data Skew 20 CMOS OUTPUT MODE 470 ps 170 MHz (4) Maximum Clock Frequency Minimum Clock Frequency DCS On DCS Off 65 25 MHz Clock High Time DCS On DCS Off 1.76 2.82 ns DCS On DCS Off 1.76 2.82 ns Conversion Latency 5.5 Clock Cycles tOD Output Delay of CLK to DATA Relative to falling edge of CLK 4.5 3.15 5.81 ns (min) ns (max) tSU Data Output Setup Time Relative to DRDY 2.5 1.79 ns (min) tH Data Output Hold Time Relative to DRDY 3.4 2.69 ns (min) tAD Aperture Delay 0.7 ns tAJ Aperture Jitter 0.3 ps rms tCH tCL tCONV (1) The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided current is limited per Absolute Maximum Ratings, Note 4. However, errors in the A/D conversion can occur if the input goes above VA or below AGND. VA I/O To Internal Circuitry AGND (2) (3) (4) With a full scale differential input of 1.5VP-P , the 11-bit LSB is 732.8µV. Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. CMOS Specifications are for FCLK = 170 MHz. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 11 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Specification Definitions APERTURE DELAY is the time after the falling edge of the clock to when the input signal is acquired or held for conversion. APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample. Aperture jitter manifests itself as noise in the output. The amount of SNR reduction can be calculated as SNR Reduction = 20 x log10[½ x π x ƒA x tj] (1) CLOCK DUTY CYCLE is the ratio of the time during one cycle that a repetitive digital waveform is high to the total time of one period. The specification here refers to the ADC clock input signal. COMMON MODE VOLTAGE (VCM) is the common DC voltage applied to both input terminals of the ADC. CONVERSION LATENCY is the number of clock cycles between initiation of conversion and when that data is presented to the output driver stage. Data for any given sample is available at the output pins the Pipeline Delay plus the Output Delay after the sample is taken. New data is available at every clock cycle, but the data lags the conversion by the pipeline delay. CROSSTALK is coupling of energy from one channel into the other channel. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion Ratio or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits. FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental drops 3 dB below its low frequency value for a full scale input. GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated as: Gain Error = Positive Full Scale Error − Negative Full Scale Error (2) It can also be expressed as Positive Gain Error and Negative Gain Error, which are calculated as: PGE = Positive Full Scale Error - Offset Error NGE = Offset Error - Negative Full Scale Error (3) INTEGRAL NON LINEARITY (INL) is a measure of the deviation of each individual code from a best fit straight line. The deviation of any given code from this straight line is measured from the center of that code value. INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the power in the intermodulation products to the total power in the original frequencies. IMD is usually expressed in dBFS. LSB (LEAST SIGNIFICANT BIT) is the bit that has the smallest value or weight of all bits. This value is VFS/2n, where “VFS” is the full scale input voltage and “n” is the ADC resolution in bits. MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC is ensured not to have any missing codes. MSB (MOST SIGNIFICANT BIT) is the bit that has the largest value or weight. Its value is one half of full scale. NEGATIVE FULL SCALE ERROR is the difference between the actual first code transition and its ideal value of ½ LSB above negative full scale. OFFSET ERROR is the difference between the two input voltages [(VIN+) – (VIN-)] required to cause a transition from code 2047 to 2048. OUTPUT DELAY is the time delay after the falling edge of the clock before the data update is presented at the output pins. PIPELINE DELAY (LATENCY) See CONVERSION LATENCY. POSITIVE FULL SCALE ERROR is the difference between the actual last code transition and its ideal value of 1½ LSB below positive full scale. 12 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 POWER SUPPLY REJECTION RATIO (PSRR) is a measure of how well the ADC rejects a change in the power supply voltage. PSRR is the ratio of the Full-Scale output of the ADC with the supply at the minimum DC supply limit to the Full-Scale output of the ADC with the supply at the maximum DC supply limit, expressed in dB. SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms value of the sum of all other spectral components below one-half the sampling frequency, not including harmonics or DC. SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of the input signal to the rms value of all of the other spectral components below half the clock frequency, including harmonics but excluding d.c. SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the input signal and the peak spurious signal, where a spurious signal is any signal present in the output spectrum that is not present at the input. TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB, of the rms total of the first six harmonic levels at the output to the level of the fundamental at the output. THD is calculated as (4) where f1 is the RMS power of the fundamental (output) frequency and f2 through f7 are the RMS power of the first six harmonic frequencies in the output spectrum. SECOND HARMONIC DISTORTION (2ND HARM) is the difference expressed in dB, between the RMS power in the input frequency at the output and the power in its 2nd harmonic level at the output. THIRD HARMONIC DISTORTION (3RD HARM) is the difference, expressed in dB, between the RMS power in the input frequency at the output and the power in its 3rd harmonic level at the output. Timing Diagrams VINA tAD VINB CLK N CLK N+5 1/fCLK CLK tCH Latency = 5 CLK Cycles tCL DRDY (DDR) tSU tODB tODA D10-D0 AN-1 tH BN-1 AN BN AN+1 BN+1 AN+2 BN+2 AN+3 Figure 1. LVDS Output Timing Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 13 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com VINA tAD VINB CLK N+5 CLK N 1/fCLK CLK tCH Latency = 5.5 tCL CLK Cycles DRDYA (DDR) tOD Data N-1 DA10-DA0 tSU tH Data N+1 Data N Data N+2 DRDYB (DDR) Data N-1 DB10-DB0 Data N+1 Data N Figure 2. CMOS Output Timing Transfer Characteristic Output Code 2047 2046 MID-SCALE POINT POSITIVE FULL-SCALE TRANSITION (VFS+) 1024 NEGATIVE FULL-SCALE TRANSITION OFFSET ERROR (VFS-) 2 1 0 -1 * VREF (VIN +) > (VIN -) (VIN +) < (VIN -) 0.0V 1 * VREF Analog Input Voltage (VIN +) - (VIN -) Figure 3. Transfer Characteristic 14 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Typical Performance Characteristics DNL, INL Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, 50% Duty Cycle, DCS Enabled, LVDS Output, VCM = VRM, TA = 25°C. DNL INL Figure 4. Figure 5. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 15 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Typical Performance Characteristics Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, 50% Duty Cycle, DCS disabled, LVDS Output, VCM = VRM, fIN = 70 MHz, TA = 25°C. 16 SNR, SINAD, SFDR vs. VA Distortion vs. VA Figure 6. Figure 7. SNR, SINAD, SFDR vs. Temperature Distortion vs. Temperature Figure 8. Figure 9. SNR, SINAD, SFDR vs. Clock Duty Cycle, fIN = 10MHz Distortion vs. Clock Duty Cycle, fIN = 10MHz Figure 10. Figure 11. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 Typical Performance Characteristics (continued) Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, 50% Duty Cycle, DCS disabled, LVDS Output, VCM = VRM, fIN = 70 MHz, TA = 25°C. SNR, SINAD, SFDR vs. Ext. Reference Voltage Distortion vs. Ext. Reference Voltage Figure 12. Figure 13. SNR, SINAD, SFDR vs. Clock Frequency Distortion vs. Clock Frequency Figure 14. Figure 15. SNR, SINAD, SFDR vs. Ext. VCM Distortion vs. Ext. VCM Figure 16. Figure 17. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 17 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Typical Performance Characteristics (continued) Unless otherwise specified, the following specifications apply: AGND = DRGND = 0V, VA = VD = VDR = +1.8V, fCLK = 200 MHz, 50% Duty Cycle, DCS disabled, LVDS Output, VCM = VRM, fIN = 70 MHz, TA = 25°C. Spectral Response @ 10 MHz Input Spectral Response @ 70 MHz Input Figure 18. Figure 19. Spectral Response @ 170 MHz Input IMD, fIN1 = 69 MHz, fIN2 = 70 MHz Figure 20. Figure 21. Total Power vs. Clock Frequency, fIN = 10 MHz Figure 22. 18 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 FUNCTIONAL DESCRIPTION Operating on a single +1.8V supply, the ADC11DV200 digitizes two differential analog input signals to 11 bits, using a differential pipelined architecture with error correction circuitry and an on-chip sample-and-hold circuit to ensure maximum performance. The user has the choice of using an internal 0.75V stable reference, or using an external 0.75V reference. Any external reference is buffered on-chip to ease the task of driving that pin. Duty cycle stabilization and output data format are selectable using the quad state function DF/DCS pin (pin 20). The output data can be set for offset binary or two's complement. Applications Information OPERATING CONDITIONS We recommend that the following conditions be observed for operation of the ADC11DV200: 1.7V ≤ VA ≤ 1.9V 1.7V ≤ VDR ≤ VA 45 MHz ≤ fCLK ≤ 200 MHz, with DCS off 65 MHz ≤ fCLK ≤ 200 MHz, with DCS on 0.75V internal reference VREF = 0.75V (for an external reference) VCM = 0.9V (from VRM) ANALOG INPUTS Signal Inputs Differential Analog Input Pins The ADC11DV200 has a pair of analog signal input pins for each of two channels. VIN+ and VIN− form a differential input pair. The input signal, VIN, is defined as VIN = (VIN+) – (VIN−) (5) Figure 23shows the expected input signal range. Note that the common mode input voltage, VCM, should be 0.9V. Using VRM (pins 5,11) for VCM will ensure the proper input common mode level for the analog input signal. The positive peaks of the individual input signals should each never exceed 2.2V. Each analog input pin of the differential pair should have a maximum peak-to-peak voltage of 1.5V, be 180° out of phase with each other and be centered around VCM.The peak-to-peak voltage swing at each analog input pin should not exceed the 1V or the output data will be clipped. Figure 23. Expected Input Signal Range For single frequency sine waves the full scale error in LSB can be described as approximately EFS = 2048 ( 1 - sin (90° + dev)) (6) Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 19 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com Where dev is the angular difference in degrees between the two signals having a 180° relative phase relationship to each other (see Figure 24). For single frequency inputs, angular errors result in a reduction of the effective full scale input. For complex waveforms, however, angular errors will result in distortion. Figure 24. Angular Errors Between the Two Input Signals Will Reduce the Output Level or Cause Distortion It is recommended to drive the analog inputs with a source impedance less than 100Ω. Matching the source impedance for the differential inputs will improve even ordered harmonic performance (particularly second harmonic). Table 2 indicates the input to output relationship of the ADC11DV200. Table 2. Input to Output Relationship VIN VIN Binary Output 2’s Complement Output VCM − VREF/2 VCM + VREF/2 000 0000 0000 100 0000 0000 VCM − VREF/4 VCM + VREF/4 010 0000 0000 110 0000 0000 VCM VCM 100 0000 0000 000 0000 0000 VCM + VREF/4 VCM − VREF/4 110 0000 0000 010 0000 0000 VCM + VREF/2 VCM − VREF/2 111 1111 1111 011 1111 1111 + − Negative Full-Scale Mid-Scale Positive Full-Scale Driving the Analog Inputs The VIN+ and the VIN− inputs of the ADC11DV200 have an internal sample-and-hold circuit which consists of an analog switch followed by a switched-capacitor amplifier. Figure 25 and Figure 26 show examples of single-ended to differential conversion circuits. The circuit in Figure 25 works well for input frequencies up to approximately 70MHz, while the circuit in Figure 26 works well above 70MHz. VIN 0.1 PF 20: ADT1-1WT 18 pF 50: ADC Input 0.1 PF 0.1 PF 20: VRM Figure 25. Low Input Frequency Transformer Drive Circuit VIN ETC1-1-13 25: 0.1 PF 30: 27 pF 25: 0.1 PF ADC Input 30: ETC1-1-13 VRM 0.1 PF Figure 26. High Input Frequency Transformer Drive Circuit 20 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 One short-coming of using a transformer to achieve the single-ended to differential conversion is that most RF transformers have poor low frequency performance. A differential amplifier can be used to drive the analog inputs for low frequency applications. The amplifier must be fast enough to settle from the charging glitches on the analog input resulting from the sample-and-hold operation before the clock goes high and the sample is passed to the ADC core. Input Common Mode Voltage The input common mode voltage, VCM, should be in the range of 0.8V to 1.0V and be a value such that the peak excursions of the analog signal do not go more negative than ground or more positive than the VA supply. It is recommended to use VRM (pins 5,11) as the input common mode voltage. If the ADC11DV200 is operated with VA=1.8V, a resistor of approximately 1KΩ should be used from the VRM pin to AGND. This will help maintain stability over the entire temperature range when using a high supply voltage. Reference Pins The ADC11DV200 is designed to operate with an internal or external voltage reference. The voltage on the VREF pin selects the source and level of the reference voltage. An internal 0.75 Volt reference is used when a voltage between 1.4 V to VA is applied to the VREF pin. An internal 0.5 Volt reference is sued when a voltage between 0.2V and AGND is applied to the VREF pin. If a voltage between 0.2V and 1.4V is applied to the VREF pin, then that voltage is used for the reference. SNR will improve without a significant degradation in SFDR for VREF=1.0V. SNR will decrease if VREF=0.5V, yet linearity will be maintained. If using an external reference the VREF pin should be bypassed to ground with a 0.1 µF capacitor close to the reference input pin. It is important that all grounds associated with the reference voltage and the analog input signal make connection to the ground plane at a single, quiet point to minimize the effects of noise currents in the ground path. The Reference Bypass Pins (VRP, VRM, and VRN) for channels A and B are made available for bypass purposes. These pins should each be bypassed to AGND with a low ESL (equivalent series inductance) 0.1 µF capacitor placed very close to the pin to minimize stray inductance. A 0.1 µF capacitor should be placed between VRP and VRN as close to the pins as possible. This configuration is shown in Figure 27. It is necessary to avoid reference oscillation, which could result in reduced SFDR and/or SNR. VRM may be loaded to 1mA for use as a temperature stable 0.9V reference. The remaining pins should not be loaded. Smaller capacitor values than those specified will allow faster recovery from the power down mode, but may result in degraded noise performance. Loading any of these pins, other than VRM may result in performance degradation. The nominal voltages for the reference bypass pins are as follows: VRM = 0.9 V VRP = 1.33 V VRN = 0.55 V DF/DCS Pin Duty cycle stabilization and output data format are selectable using this quad state function pin. When enabled, duty cycle stabilization can compensate for clock inputs with duty cycles ranging from 30% to 70% and generate a stable internal clock, improving the performance of the part. See Table 1 for DF/DCS voltage vs output format description. DCS mode of operation is limited to 65 MHz ≤ fCLK ≤ 200 MHz. DIGITAL INPUTS Digital CMOS compatible inputs consist of CLK, PD_A, PD_B, and OUTSEL. Clock Input The CLK controls the timing of the sampling process. To achieve the optimum noise performance, the clock input should be driven with a stable, low jitter clock signal in the range indicated in the Electrical Table. The clock input signal should also have a short transition region. This can be achieved by passing a low-jitter sinusoidal clock source through a high speed buffer gate. The trace carrying the clock signal should be as short as possible and should not cross any other signal line, analog or digital, not even at 90°. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 21 ADC11DV200 SNAS477 – APRIL 2009 www.ti.com If the clock is interrupted, or its frequency is too low, the charge on the internal capacitors can dissipate to the point where the accuracy of the output data will degrade. This is what limits the minimum sample rate. The clock line should be terminated at its source in the characteristic impedance of that line. Take care to maintain a constant clock line impedance throughout the length of the line. Refer to Application Note AN-905 (SNLA035) for information on setting characteristic impedance. It is highly desirable that the the source driving the ADC clock pins only drive that pin. The duty cycle of the clock signal can affect the performance of the A/D Converter. Because achieving a precise duty cycle is difficult, the ADC11DV200 has a Duty Cycle Stabilizer. DIGITAL OUTPUTS Digital outputs consist of the LVDS signals D0-D10 and DRDY. The ADC11DV200 has 12 LVDS compatible data output pins: 11 data output pins corresponding to the converted input value, and a data ready (DRDY) signal that should be used to capture the output data. Valid data is present at these outputs while the PD pin is low. A-Channel data should be captured and latched with the rising edge of the DRDY signal and B-Channel data should be captured and latched with the falling edge of DRDY. To minimize noise due to output switching, the load currents at the digital outputs should be minimized. This can be achieved by keeping the PCB traces less than 2 inches long; longer traces are more susceptible to noise. The characteristic impedance of the LVDS traces should be 100Ω, and the effective capacitance < 10pF. Try to place the 100Ω termination resistor as close to the receiving circuit as possible. (See Figure 27) +1.8V +1.8V +1.8V 2x 0.1 PF 2x 0.1 PF 5x 0.1 PF + 17 11 0.1 PF 0.1 PF 0.1 PF 6 0.1 PF 7 0.1 PF 20 31 45 DRDYDRDY+ 0.1 PF VRPB VRNB ADC11DV200 18 pF 2 13 14 20 D10D10+ VRMB 0.1 PF 1 0.1 PF 21 54 10 V A RP 9 VRNA 5 0.1 PF 0.1 PF VREF VRMA 0.1 PF 50 VIN_A VDR VDR 0.1 PF VD VD VA VA VA VA VA 8 16 18 59 60 10 PF VINA+ VINA- ADT1-1WT 50 VIN_B 1 20 0.1 PF 0.1 PF 2 18 pF 0.1 PF 20 3 2 VINB+ VINB- ADT1-1WT DF/DCS PD_A PD_B 36 53 23 CLK- 100 50 D949 D9+ 48 D847 D8+ 44 D743 D7+ 42 D641 D6+ 40 D539 D5+ 35 D434 D4+ 33 D332 D3+ 29 D228 D2+ 27 D126 D1+ 25 D024 D0+ 100 100 100 100 100 100 100 100 100 100 - + + + + + - Receiver + + + + + + - DF/DCS PD_A PD_B OUTSEL 1 4 12 15 22 55 58 AGND AGND AGND AGND AGND AGND AGND OUTSEL 20 CLK+ 52 51 + DR GND DR GND 56 100 30 46 57 Crystal Oscillator 38 37 Figure 27. Application Circuit 22 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 ADC11DV200 www.ti.com SNAS477 – APRIL 2009 POWER SUPPLY CONSIDERATIONS The power supply pins should be bypassed with a 0.1 µF capacitor and with a 100 pF ceramic chip capacitor close to each power pin. Leadless chip capacitors are preferred because they have low series inductance. As is the case with all high-speed converters, the ADC11DV200 is sensitive to power supply noise. Accordingly, the noise on the analog supply pin should be kept below 100 mVP-P. No pin should ever have a voltage on it that is in excess of the supply voltages, not even on a transient basis. Be especially careful of this during power turn on and turn off. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Links: ADC11DV200 23 PACKAGE OPTION ADDENDUM www.ti.com 24-Jan-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Qty Drawing Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (°C) Top-Side Markings (3) (4) ADC11DV200CISQ/NOPB ACTIVE WQFN NKA 60 1000 Green (RoHS & no Sb/Br) SN Level-3-260C-168 HR -40 to 85 11DV200 CISQ ADC11DV200CISQE/NOPB ACTIVE WQFN NKA 60 250 Green (RoHS & no Sb/Br) SN Level-3-260C-168 HR -40 to 85 11DV200 CISQ ADC11DV200CISQX/NOPB ACTIVE WQFN NKA 60 2000 Green (RoHS & no Sb/Br) SN Level-3-260C-168 HR -40 to 85 11DV200 CISQ (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) Only one of markings shown within the brackets will appear on the physical device. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1 Samples PACKAGE MATERIALS INFORMATION www.ti.com 21-Mar-2013 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing ADC11DV200CISQ/NOPB WQFN SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant NKA 60 1000 330.0 16.4 9.3 9.3 1.3 12.0 16.0 Q1 ADC11DV200CISQE/NOP B WQFN NKA 60 250 178.0 16.4 9.3 9.3 1.3 12.0 16.0 Q1 ADC11DV200CISQX/NOP B WQFN NKA 60 2000 330.0 16.4 9.3 9.3 1.3 12.0 16.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 21-Mar-2013 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) ADC11DV200CISQ/NOPB WQFN NKA 60 1000 358.0 343.0 63.0 ADC11DV200CISQE/NOP B WQFN NKA 60 250 213.0 191.0 55.0 ADC11DV200CISQX/NOP B WQFN NKA 60 2000 358.0 343.0 63.0 Pack Materials-Page 2 MECHANICAL DATA NKA0060A SQA60A (Rev A) www.ti.com IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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