SemiHow HFS10N65S 650v n-channel mosfet Datasheet

BVDSS = 650 V
RDS(on) typ = 0.83 Ω
HFS10N65S
ID = 9.2 A
650V N-Channel MOSFET
TO-220F
FEATURES
 Originative New Design
1
 Superior Avalanche Rugged Technology
 Robust Gate Oxide Technology
2
3
1.Gate 2. Drain 3. Source
 Very Low Intrinsic Capacitances
 Excellent Switching Characteristics
 Unrivalled Gate Charge : 29 nC (Typ.)
 Extended Safe Operating Area
 Lower RDS(ON) : 0.83 Ω (Typ.) @VGS=10V
 100% Avalanche Tested
Absolute Maximum Ratings
Symbol
TC=25℃ unless otherwise specified
Parameter
Value
Units
650
V
VDSS
Drain-Source Voltage
ID
Drain Current
– Continuous (TC = 25℃)
9.2*
A
Drain Current
– Continuous (TC = 100℃)
5.5*
A
IDM
Drain Current
– Pulsed
36.8*
A
VGS
Gate-Source Voltage
±30
V
EAS
Single Pulsed Avalanche Energy
(Note 2)
650
mJ
IAR
Avalanche Current
(Note 1)
9.2
A
EAR
Repetitive Avalanche Energy
(Note 1)
15.6
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
4.5
V/ns
PD
Power Dissipation (TC = 25℃)
- Derate above 25℃
50
W
TJ, TSTG
Operating and Storage Temperature Range
TL
Maximum lead temperature for soldering purposes,
1/8” from case for 5 seconds
(Note 1)
0.4
W/℃
-55 to +150
℃
300
℃
*Drain current limited by maximum junction temperature
Thermal Resistance Characteristics
Symbol
Parameter
Typ.
Max.
RθJC
Junction-to-Case
--
2.5
RθJA
Junction-to-Ambient
--
62.5
Units
℃/W
◎ SEMIHOW REV.A0,Sep 2009
HFS10N65S
Sep 2009
Symbol
Parameter
unless otherwise specified
Test Conditions
Min
Typ
Max
Units
On Characteristics
VGS
RDS(ON)
Gate Threshold Voltage
VDS = VGS, ID = 250 ㎂
2.0
--
4.0
V
Static Drain-Source
On-Resistance
VGS = 10 V, ID = 4.6 A
--
0.83
1.0
Ω
VGS = 0 V, ID = 250 ㎂
650
--
--
V
ID = 250 ㎂, Referenced to 25℃
--
0.7
--
V/℃
VDS = 650 V, VGS = 0 V
--
--
1
㎂
VDS = 520 V, TC = 125℃
--
--
10
㎂
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
ΔBVDSS Breakdown Voltage Temperature
Coefficient
/ΔTJ
IDSS
Zero Gate Voltage Drain Current
IGSSF
Gate-Body Leakage Current,
Forward
VGS = 30 V, VDS = 0 V
--
--
100
㎁
IGSSR
Gate-Body Leakage Current,
Reverse
VGS = -30 V, VDS = 0 V
--
--
-100
㎁
--
1450
1885
㎊
--
145
190
㎊
--
13
17
㎊
--
23
55
㎱
--
69
150
㎱
--
144
300
㎱
--
77
165
㎱
--
29
38
nC
--
6.8
--
nC
--
10.3
--
nC
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
Switching Characteristics
td(on)
Turn-On Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
VDS = 325 V, ID = 9.2 A,
RG = 25 Ω
(Note 4,5)
VDS = 520V, ID = 9.2 A,
VGS = 10 V
(Note 4,5)
Gate-Drain Charge
Source-Drain Diode Maximum Ratings and Characteristics
IS
Continuous Source-Drain Diode Forward Current
--
--
9.2
ISM
Pulsed Source-Drain Diode Forward Current
--
--
36.8
VSD
Source-Drain Diode Forward Voltage
IS = 9.2 A, VGS = 0 V
--
--
1.4
V
trr
Reverse Recovery Time
--
420
--
㎱
Qrr
Reverse Recovery Charge
IS = 9.2 A, VGS = 0 V
diF/dt = 100 A/μs (Note 4)
--
4.2
--
μC
A
Notes ;
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L=14.2mH, IAS=9.2A, VDD=50V, RG=25Ω, Starting TJ =25°C
3. ISD≤9.2A, di/dt≤200A/μs, VDD≤BVDSS , Starting TJ =25 °C
4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature
◎ SEMIHOW REV.A0,Sep 2009
HFS10N65S
Electrical Characteristics TC=25 °C
HFS10N65S
ID, Drain Current [A]
ID, Drain Current [A]
Typical Characteristics
VGS, Gate-Source Voltage [V]
VDS, Drain-Source Voltage [V]
Figure 1. On Region Characteristics
Figure 2. Transfer Characteristics
IDR, Reverse Drain Current [A]
RDS(ON)[Ω],
Drain-Source On-Resistance
2.0
VGS = 10V
1.5
1.0
VGS = 20V
0.5
* Note : TJ = 25oC
0.0
0
5
10
15
20
25
30
35
ID, Drain Current[A]
VSD, Source-Drain Voltage [V]
Figure 4. Body Diode Forward Voltage
Variation with Source Current
and Temperature
Figure 3. On Resistance Variation vs
Drain Current and Gate Voltage
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
Capacitances [pF]
2500
Ciss
2000
1500
Coss
∗ Note ;
1. VGS = 0 V
2. f = 1 MHz
1000
Crss
500
12
VDS = 130V
VGS, Gate-Source Voltage [V]
3000
10
VDS = 325V
VDS = 520V
8
6
4
2
* Note : ID = 9.2A
0
10-1
0
100
101
0
4
8
12
16
20
24
28
VDS, Drain-Source Voltage [V]
QG, Total Gate Charge [nC]
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
32
◎ SEMIHOW REV.A0,Sep 2009
HFS10N65S
Typical Characteristics
(continued)
RDS(ON), (Normalized)
Drain-Source On-Resistance
BVDSS, (Normalized)
Drain-Source Breakdown Voltage
2.5
2.0
1.5
1.0
∗ Note :
1. VGS = 10 V
2. ID = 4.6 A
0.5
0.0
-100
-50
0
50
100
150
200
TJ, Junction Temperature [oC]
TJ, Junction Temperature [oC]
Figure 8. On-Resistance Variation
vs Temperature
Figure 7. Breakdown Voltage Variation
vs Temperature
10
Operation in This Area
is Limited by R DS(on)
10 µs
8
10
0
10
10-1
ID, Drain Current [A]
100 µs
1 ms
10 ms
100 ms
DC
1
* Notes :
1. TC = 25 oC
6
4
2
2. TJ = 150 oC
3. Single Pulse
10-2
100
101
102
0
25
103
50
75
Figure 9. Maximum Safe Operating Area
100
125
150
Figure 10. Maximum Drain Current
vs Case Temperature
D=0.5
0.2
* Notes :
1. ZθJC(t) = 2.5 oC/W Max.
2. Duty Factor, D=t1/t2
3. TJM - TC = PDM * ZθJC(t)
0.1
10-1
100
TC, Case Temperature [oC]
VDS, Drain-Source Voltage [V]
ZθJC(t), Thermal Response
ID, Drain Current [A]
102
0.05
0.02
0.01
10-2
10-5
PDM
t1
single pulse
10-4
10-3
10-2
t2
10-1
100
101
t1, Square Wave Pulse Duration [sec]
Figure 11. Transient Thermal Response Curve
◎ SEMIHOW REV.A0,Sep 2009
HFS10N65S
Fig 12. Gate Charge Test Circuit & Waveform
50KΩ
12V
VGS
Same Type
as DUT
Qg
200nF
10V
300nF
VDS
VGS
Qgs
Qgd
DUT
3mA
Charge
Fig 13. Resistive Switching Test Circuit & Waveforms
RL
VDS
VDS
90%
VDD
RG
( 0.5 rated VDS )
Vin
DUT
10V
10%
tr
td(on)
td(off)
t on
tf
t off
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms
BVDSS
1
EAS = ---- LL IAS2 -------------------2
BVDSS -- VDD
L
VDS
VDD
ID
BVDSS
IAS
RG
10V
ID (t)
DUT
VDS (t)
VDD
tp
Time
◎ SEMIHOW REV.A0,Sep 2009
HFS10N65S
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
VDS
_
IS
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• IS controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
IS
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
Vf
VDD
Body Diode
Forward Voltage Drop
◎ SEMIHOW REV.A0,Sep 2009
HFS10N65S
Package Dimension
TO-220F
±0.20
±0.20
0
0.2
2.54±0.20
6.68±0.20
0.70±0.20
12.42±0.20
3.30±0.20
2.76±0.20
1.47max
9.75±0.20
15.87±0.20
φ
8±
1
.
3
0.80±0.20
0.50±0.20
2.54typ
2.54typ
◎ SEMIHOW REV.A0,Sep 2009
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