Product Folder Order Now Support & Community Tools & Software Technical Documents bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 bq25910 I2C Controlled 6-A Three-Level Switch Mode, Single-Cell Parallel Battery Charger for Fast Charging 1 Features 2 Applications • • • • • • 1 • • • • • • • • Parallel Charger Operation Provides Fast Charging in Dual Charger Configuration High Efficiency 750-kHz Switch Mode Three-Level Buck Parallel Charger – Reduced Ripple to Support Low Profile Inductor – 95.4% Charge Efficiency at 1.5 A from 5-V Input – 93.3% Charge Efficiency at 3 A from 9-V Input – Superior Efficiency Compared to Traditional Buck Converter in Compact Form Factor Single Input to Support USB Input and Adjustable High Voltage Adapters – Support 3.9-V to 14-V Input Voltage Range with 20-V Absolute Maximum Input Voltage Rating – Input Current Limit (500 mA to 3.6 A with 100mA resolution) to Support USB2.0 and USB 3.0 Standard and High Voltage Adaptors – Maximum Power Tracking by Input Voltage Limit (VINDPM) up to 14 V Flexible I2C Mode for Optimal System Performance High Integration Includes all MOSFETs, Current Sensing and Loop Compensation – Lossless Charge Current Sensing without Sense Resistor < 10-µA Low Battery Leakage Current During Stand-By Mode High Accuracy – ±0.4% Charge Voltage Regulation – ±10% Charge Current Regulation – ±7.5% Input Current Regulation – Remote Differential Battery Sensing Safety – Thermal Regulation and Thermal Shutdown – Input UVLO and Overvoltage Protection – Battery OVP – Input Dynamic Power Management (DPM) – Charging Safety Timer – Flying Capacitor Short Circuit Protection – Output Voltage Short Circuit Protection Available in 36-Ball WCSP Package Smart Phone Tablet Wireless Charging Portable Electronics Electronic Point of Sales (ePOS) 3 Description The bq25910 is an integrated three-level switch-mode parallel battery charge management device for single cell Li-ion and Li-polymer batteries. Utilization of the three-level converter maintains highest switch-mode operation efficiency while reducing solution footprint and increasing power density. The device supports fast charging with high input voltage for a wide range of portable devices. The solution integrates reverseblocking FET (QBLK), and four switching FETs (QHSA, QHSB, QLSB, QLSA). The I2C serial interface with charging and system settings makes the device a truly flexible solution. Device Information(1) PART NUMBER PACKAGE bq25910 BODY SIZE (NOM) DSBGA (36) 2.41 mm x 2.44 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Schematic USB VBUS SW BTST I2C Bus SYS Host Control BAT Master VBUS CFLY+ ICHG SW I2C Bus CFLY± Host Host Control BATP + BATN bq25910 Copyright © 2017, Texas Instruments Incorporated 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 6.1 6.2 6.3 6.4 6.5 6.6 6.7 7 1 1 1 2 3 5 Absolute Maximum Ratings ...................................... 5 ESD Ratings.............................................................. 5 Recommended Operating Conditions....................... 6 Thermal Information .................................................. 6 Electrical Characteristics........................................... 7 Timing Requirements .............................................. 10 Typical Characteristics ............................................ 11 Detailed Description ............................................ 13 7.1 7.2 7.3 7.4 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ 13 14 15 21 7.5 Programming .......................................................... 24 7.6 Register Maps ......................................................... 28 8 Application and Implementation ........................ 43 8.1 Application Information............................................ 43 8.2 Typical Application ................................................. 43 9 Power Supply Recommendations...................... 50 10 Layout................................................................... 51 10.1 Layout Guidelines ................................................. 51 10.2 Layout Example .................................................... 52 11 Device and Documentation Support ................. 53 11.1 11.2 11.3 11.4 11.5 11.6 Device Support...................................................... Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 53 53 53 53 53 53 12 Mechanical, Packaging, and Orderable Information ........................................................... 53 4 Revision History Changes from Original (September 2017) to Revision A • 2 Page Changed from Advance Information to Production Data ....................................................................................................... 1 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 5 Pin Configuration and Functions bq25910-YFF (I2C controlled) 36-Pin DSBGA Top View 1 2 3 4 5 6 A VBUS PMID CFLY+ SW CFLY± GND B VBUS PMID CFLY+ SW CFLY± GND C VBUS PMID CFLY+ SW CFLY± GND D CDRV+ PMID CFLY+ SW CFLY± GND E CDRV± SDA INT SW CFLY± GND F SCL CAUX REGN BATN BATP IND_ SNS x (1) Top View = Xray through a soldered down part with A1 starting in upper left hand corner. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 3 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Pin Functions PIN I/O DESCRIPTION NAME NO. BATN F4 AI Negative Battery Sense Terminal – Kelvin connect via 100-Ω resistor as close as possible to negative battery terminal BATP F5 AI Positive Battery Sense Terminal – Kelvin connect via 100-Ω resistor as close as possible to positive battery terminal CAUX F2 P Auxiliary Capacitor – Bypass CAUX to GND with at least a 4.7-μF, 10-V ceramic capacitor CDRV+ D1 P Gate Drive Supply Positive Terminal – CDRV is used to generate multilevel gate drive rails. Connect a 220-nF, 6.3-V ceramic capacitor across CDRV+ and CDRV-. CDRV– E1 P Gate Drive Supply Negative Terminal – CDRV is used to generate multilevel gate drive rails. Connect a 220-nF, 6.3-V ceramic capacitor across DRV+ and DRV-. P Flying Capacitor Positive Terminal – Connect 20-μF, 16-V ceramic capacitor across CFLY+ and CFLY–. Refer to Application and Implementation section for more information on selecting CFLY. P Flying Capacitor Negative Terminal – Connect 20-μF, 16-V ceramic capacitor across CFLY+ and CFLY–. Refer to Application and Implementation section for more information on selecting CFLY. - Ground Return A3 B3 CFLY+ C3 D3 A5 B5 CFLY– C5 D5 E5 A6 B6 GND C6 D6 E6 IND_SNS F6 AI Output Inductor Sense Input – Kelvin connect as close as possible to the output of the switched inductor. INT E3 DO Open-Drain Interrupt Output – Connect INT to the logic rail via a 10-kΩ resistor. The INT pin sends active low, 256-μs pulse to the host to report charger device status and fault. A2 PMID B2 C2 P Reverse Blocking MOSFET and QHSA MOSFET Connection – Given the total input capacitance, place 1 μF on VBUS, and the rest on PMID, as close to the device as possible. Typical value: 10-μF, 25-V ceramic capacitor D2 REGN F3 P Gate Drive Supply – Bias supply for internal MOSFETs driver and device. Bypass REGN to GND with a 4.7-μF, 10-V ceramic capacitor. SCL F1 DI I2C Interface Open-Drain Clock Line – Connect SCL to the logic rail through a 10-kΩ resistor. SDA E2 DIO I2C Interface Open-Drain Data Line – Connect SDA to the logic rail through a 10-kΩ resistor. A4 B4 SW C4 P Inductor Connection – Connect to the switched side of the external inductor (Recommended: 330 nH for up to 9-V applications or 470 nH for up to 12-V applications). Refer to Application and Implementation section for more information on selecting inductor. P Input Supply – VBUS is connected to the external DC supply. Bypass VBUS to GND with at least 1-μF, 25-V ceramic capacitor, placed as close to the device as possible. D4 E4 A1 VBUS B1 C1 4 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) Voltage range (with respect to GND) MIN MAX UNIT VBUS (converter not switching) –2 20 V PMID (converter not switching) –0.3 20 V CDRV+, CDRV- –0.3 20 V CFLY+ –0.3 16 (2) V DC –0.3 7 V Pulse < 30ns CFLY+ to SW, SW to CFLY–, CFLY– to GND, CAUX to GND –0.3 11 V BATP, BATN, IND_SNS –0.3 6 V REGN –0.3 6 V Voltage range (with respect to GND) SDA, SCL, /INT –0.3 6 V Output sink current /INT 6 mA Junction Temperature, TJ –40 150 °C Storage temperature, Tstg –40 150 °C (1) (2) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. This condition is contingent on the fact that 0V < VCFLY < 8V 6.2 ESD Ratings V(ESD) (1) (2) Electrostatic discharge VALUE UNIT Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 V Charged device model (CDM), per JEDEC specification JESD22-C101 (2) ±250 V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 5 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN VVBUS Input voltage IVBUS Average input current (VBUS) ISW Average output current (SW) VBAT Battery voltage (BATP - BATN) TA Operating free-air temperature (1) NOM MAX 3.9 V 3.3 A 6 A 4.775 V 85 °C 14 –40 UNIT (1) The inherent switching noise voltage spikes should not exceed the absolute maximum rating on either CFLY+, SW, or CFLY- pins. A tight layout minimizes switching noise. 6.4 Thermal Information bq25910 THERMAL METRIC (1) YFF (DSBGA) UNIT 36-PINS RΘJA Junction-to-ambient thermal resistance 52.8 °C/W RΘJC(top) Junction-to-case (top) thermal resistance 0.3 °C/W RΘJB Junction-to-board thermal resistance 11.1 °C/W ΨJT Junction-to-top characterization parameter 0.2 °C/W ΨJB Junction-to-board characterization parameter 11.1 °C/W (1) 6 For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 6.5 Electrical Characteristics VVBUS_UVLOZ < VVBUS < VVBUS_OV and VVBUS > VBAT + VSLEEP, TJ = –40°C to +125°C, and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT QUIESCENT CURRENTS IBAT Battery discharge current (BATP, BATN, SW) IVBUS_HIZ Input supply current (VBUS) in HIZ IVBUS VBAT = 4.5V, VBUS = 0 - 5V, SCL, SDA = 0V or 1.8V, TJ < 85°C, EN_CHG = 0 Input supply current (VBUS) 6.5 10 μA VBUS = 5V, High-Z Mode, no battery 30 μA VBUS < VVBUS_OV, High-Z Mode, no battery 50 μA VBUS > VSLEEPZ, VBAT = 3.8V, ICHG = 0A, converter not switching 20 μA VBUS > VSLEEPZ, VBAT = 3.8V, converter switching, IOUT = 0A 13 mA VBUS / VBAT POWER UP VVBUS_OP VBUS operating range 3.9 VVBUS_UVLOZ VBUS rising for active I2C, no battery VBUS rising 14 3.6 V V VSLEEP Enter sleep mode threshold VBUS falling, VBUS - VBAT, VBAT = 4V, TJ = 0°C - 85°C VSLEEPZ Exit sleep mode threshold VBUS rising, VBUS - VBAT, VBAT = 4V, TJ = 0°C - 85°C VBUS over-voltage rising threshold VBUS rising 14 14.3 14.7 V VBUS over-voltage falling threshold VBUS falling 13.3 13.65 14 V VVBUS_OV 15 60 110 mV 115 220 275 mV VBAT_UVLOZ Battery for active I2C, no VBUS 2.3 V VPOORSRC Bad adapter detection threshold 3.7 V IPOORSRC Bad adapter detection current source 20 mA POWER-PATH RON_QBLK (QBLK) Top reverse blocking MOSFET onresistance between VBUS and PMID (QBLK) TJ = –40°C - 125°C 14 22 mΩ RON_QHSA (Q1) Outer, high-side switching MOSFET on-resistance between PMID and CFLY+ (Q1) TJ = –40°C - 125°C 22 40 mΩ RON_QHSB (Q3) Inner, high-side switching MOSFET on-resistance between CFLY+ and SW (Q3) TJ = –40°C - 125°C 12 20 mΩ RON_QLSB (Q4) Inner, low-side switching MOSFET on-resistance between SW and CFLY- (Q4) TJ = –40°C - 125°C 8 13 mΩ RON_QLSA (Q2) Outer, low-side switching MOSFET on-resistance between CFLY- and GND (Q2) TJ = –40°C - 125°C 8 13 mΩ BATTERY CHARGER VREG_RANGE Typical charge voltage regulation range VREG_STEP Typical charge voltage regulation step VREG_ACC Charge voltage regulation accuracy ICHG_RANGE Typical charge current regulation range ICHG_STEP Typical charge current regulation step ICHG_ACC Charge current regulation accuracy 3.5 4.775 5 VREG = 4.2V or 4.35V or 4.4V, TJ = –40°C - 85°C mV -0.4 0.4 % 1000 6000 mA 50 ICHG = 2A, 3A, 4A, 5A, 6A, TJ = –40°C - 85°C -10 mA 10 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 V % 7 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Electrical Characteristics (continued) VVBUS_UVLOZ < VVBUS < VVBUS_OV and VVBUS > VBAT + VSLEEP, TJ = –40°C to +125°C, and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS VBUS = 9V, ICHG = 4A, ITERM = 1.0A, TJ = 0°C - 85°C ITERM_ACC Termination current regulation accuracy VBAT_SHORT Short battery voltage falling threshold VBAT falling MIN TYP MAX UNIT 0.9 1 1.1 A 1.85 2.00 2.15 V VBAT LOWV Rising threshold to start fast-charging VBAT rising, VBATLOW = 3.2V 3.1 3.2 3.3 V VBAT LOWV Falling threshold to stop fast-charging VBAT falling, VBATLOW = 3.2V 2.9 3 3.1 V VBAT LOWV Rising threshold to start fast-charging VBAT rising, VBATLOW = 3.5V 3.4 3.5 3.6 V VBAT LOWV Falling threshold to stop fast-charging VBAT falling, VBATLOW = 3.5V 3.2 3.3 3.4 V RBATP BATP Input resistance VBAT = 4V, VBUS = 5V, EN_CHG = 0 0.6 MΩ RBATN BATN Input resistance VBAT = 4V, VBUS = 5V, EN_CHG = 0 0.6 MΩ VBAT_LOWV VBAT_LOWV INPUT VOLTAGE / CURRENT REGULATION VINDPM_RANGE Input voltage regulation range VINDPM_STEP Input voltage regulation step VINDPM_ACC Input voltage regulation accuracy IINDPM_RANGE Input current regulation range IINDPM_STEP Input current regulation step IINDPM_ACC 3.9 14 100 VINDPM = 4.3V 4.121 4.3 4.447 V VINDPM = 7.8V 7.566 7.8 8.034 V VINDPM = 10.8V 10.476 10.8 11.124 500 3600 100 Input current regulation accuracy V mV V mA mA IINDPM = 500mA, TJ = –40°C - 85°C 410 500 mA IINDPM = 1500mA, TJ = –40°C - 85°C 1275 1500 mA IINDPM = 2500mA, TJ = –40°C - 85°C 2125 2500 mA IINDPM = 3000mA, TJ = –40°C - 85°C 2540 3000 mA BATTERY OVER-VOLTAGE PROTECTION VBAT_OVP Battery over-voltage rising threshold VBAT rising, as percentage of VREG 102 104 106 % Battery over-voltage falling threshold VBAT falling, as percentage of VREG 100 102 103 % THERMAL REGULATION AND THERMAL SHUTDOWN TREG TSHUT Junction temperature regulation accuracy TREG = 80°C 80 °C TREG = 120°C 120 °C Thermal Shutdown Rising threshold Temperature Increasing 150 °C Thermal Shutdown Falling threshold Temperature Decreasing 120 °C BUCK MODE OPERATION FSW PWM switching frequency DMAX Maximum PWM Duty Cycle Switching-node frequency 1.35 1.5 1.65 MHz 97 % V REGN LDO VREGN REGN LDO output voltage IREGN REGN LDO current limit 8 VVBUS = 12V, IREGN = 40mA 4.85 5 VVBUS = 5V, IREGN = 20mA 4.7 4.8 VVBUS = 5V, VREGN = 3.8V 50 Submit Documentation Feedback V mA Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Electrical Characteristics (continued) VVBUS_UVLOZ < VVBUS < VVBUS_OV and VVBUS > VBAT + VSLEEP, TJ = –40°C to +125°C, and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT I2C INTERFACE (SCL, SDA) VIH Input high threshold level, SDA and SCL Pull-up rail 1.8V VIL Input low threshold level, SDA and SCL Pull-up rail 1.8V 0.4 V VOL Output low threshold level, SDA Sink current = 5mA 0.4 V IBIAS High level leakage current, SDA and SCL Pull-up rail 1.8V 1 μA 1.3 V LOGIC OUTPUT PIN (/INT) VOL Output low threshold level Sink current = 5mA IOUT_BIAS High level leakage current Pull-up rail 1.8V 0.4 V 1 μA Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 9 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 6.6 Timing Requirements PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VBUS/BAT POWER UP tVBUS_OV VBUS OVP reaction time tPOORSRC Bad adapter detection duration VBUS rising above VBUS_OV threshold to converter turn off 200 ns 30 ms 20 ms 250 ms 1 µs BATTERY CHARGER tBAT_LOWV_DGL Deglitchg time for BAT_LOWV comparator VBAT crossing VBAT_LOWV threshold (rising and falling) tTERM_DGL Deglitch time for charge termination Charge current falling below ITERM tBATOVP_DGL Deglitch time for battery over-voltage to disable charge tSAFETY Charge Safety Timer Accuracy CHG_TIMER[1:0] = 12 hours 10.8 12 13.2 hr 1000 kHz I2C INTERFACE fSCL SCL clock frequency DIGITAL CLOCK AND WATCHDOG TIMER fDIG tWDT 10 Digital clock REGN LDO enabled 1.35 1.5 1.65 MHz Watchdog Reset time WATCHDOG[1:0] = 160s, REGN LDO enabled 136 160 sec Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 96 3 95 2.7 95 2.7 94 2.4 94 2.4 93 2.1 93 2.1 92 1.8 92 1.8 91 1.5 91 1.5 90 1.2 90 1.2 89 0.9 89 0.9 88 0.6 88 0.3 87 0 86 VBUS = 5 V VBUS = 9 V VBUS = 12 V 87 VBUS = 5 V VBUS = 9 V VBUS = 12 V 86 0 1 2 3 4 Change Current (A) 5 6 0.6 VBUS = 5 V VBUS = 9 V 1 2 D001 0.3 3 4 Charge Current (A) 5 6 D002 VBAT = 3.8 V, Inductor = HMLQ25201B-R33 (330 nH, 17 mΩ max) Figure 2. Charge Efficiency vs Charge Current Figure 1. Charge Efficiency vs Charge Current 15 15 VBUS = 5 V, ICHG = 2.5 A VBUS = 9 V, ICHG = 2.5 A VBUS = 12 V, ICHG = 2.5 A 10 VBUS = 5 V VBUS = 9 V VBUS = 12 V 10 5 Accuracy (%) Accuracy (%) VBUS = 5 V VBUS = 9 V 0 0 VBAT = 3.8 V, Inductor = DFE252012F-R47 (470 nH, 23 mΩ max) Power Loss (W) 3 Efficiency (%) 96 Power Loss (W) Efficiency (%) 6.7 Typical Characteristics 0 -5 -10 5 0 -5 -10 -15 2.9 -15 3.1 3.3 3.5 3.7 3.9 VBAT (V) 4.1 4.3 4.5 1 2 D010 3 4 ICHG Setting (A) 5 6 D003 VBAT = 3.8 V Figure 3. Charge Current Accuracy vs Battery Voltage Figure 4. Charge Current Accuracy vs I2C ICHG Setting 15 0.5 ICHG = 1.5 A ICHG = 2.5 A ICHG = 3.5 A 0.4 0.3 0.2 5 Accuracy (%) Accuracy (%) 10 0 -5 0.1 0 -0.1 -0.2 -0.3 -10 VBUS = 5 V VBUS = 9 V VBUS = 12 V -0.4 -15 -40 -20 0 20 40 Temperature (qC) 60 80 100 -0.5 3.5 D011 3.7 3.9 4.1 4.3 VREG Setting (V) 4.5 4.7 D004 VBUS = 5 V, VBAT = 3.8 V Figure 5. Charge Current Accuracy vs Temperature Figure 6. Battery Voltage Regulation Accuracy vs I2C VREG Setting Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 11 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Typical Characteristics (continued) 1300 0.5 VBAT = 4.1 V VBAT = 4.2 V VBAT = 4.35 V VBAT = 4.4 V 0.3 1200 Termination Current (mA) 0.4 Accuracy (%) 0.2 0.1 0 -0.1 -0.2 -0.3 1100 1000 900 VBUS = 5 V VBUS = 9 V VBUS = 12 V 800 -0.4 700 -0.5 -40 -20 0 20 40 Temperature (qC) 60 0 80 90 10 VBUS = 9 V 30 40 50 60 Temperature (qC) 70 0 -1 -2 -3 -4 -5 -6 -7 -8 -9 -10 -11 -12 -13 -14 -15 90 D005 Figure 8. Termination Current vs Temperature 10 IINDPM = 500 mA IINDPM = 900 mA IINDPM = 1.5 A IINDPM = 2.0 A IINDPM = 3.0 A Accuracy (%) 5 VBUS = 5 V VBUS = 9 V VBUS = 12 V 0 0.5 1 1.5 2 2.5 IINDPM Setting (A) 3 0 -5 -10 -15 -20 -40 3.5 -20 0 D007 VBAT = 3.8 V 20 40 Temperature (qC) 60 80 100 D013 VBUS = 5 V, VBAT = 3.8 V Figure 9. Input Current Limit Accuracy vs I2C IINDPM Setting Figure 10. Input Current Limit Accuracy vs Temperature 3 2 1.8 2 TREG = 60qC TREG = 80qC TREG = 100qC TREG = 120qC 1.6 Charge Current (A) Accuracy (%) 80 VREG = 4.35 V Figure 7. Battery Voltage Regulation Accuracy vs Temperature Accuracy (%) 20 D012 1 0 -1 1.4 1.2 1 0.8 0.6 0.4 0.2 -2 0 -3 3 4 5 6 7 8 9 10 VINDPM Setting (V) 11 12 13 -0.2 40 60 80 D008 100 120 Temperature (qC) 140 160 180 D009 ICHG = 1.9 A Figure 11. Input Voltage Limit Accuracy vs I2C VINDPM Setting 12 Submit Documentation Feedback Figure 12. Charge Current vs Temperature Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7 Detailed Description 7.1 Overview The bq25910 is an integrated three-level switch-mode parallel battery charge management device for single cell Li-ion and Li-polymer batteries. Utilization of the three-level converter maintains highest switch-mode operation efficiency while reducing solution footprint and increasing power density. The device supports fast charging with high input voltage for a wide range of portable devices. The solution integrates reverse-blocking FET (QBLK), and four switching FETs (QHSA, QHSB, QLSB, QLSA). The I2C serial interface with charging and system settings makes the device a truly flexible solution. The device supports a wide range of input sources, including standard USB host port, USB charging port, and USB compliant adjustable high voltage adapter. The device is compliant with USB 2.0 and USB 3.0 power specifications with input current and voltage regulation. After initiating a charging cycle with host control, the device completes a charging cycle without software control. It automatically detects battery voltage and charges the battery in two-phases: constant current and constant voltage. At the end of the charging cycle, the charger automatically terminates when the charge current is below a preset limit (termination current) in the constant voltage phase. The device provides various safety features for battery charging, including charging safety timer, battery overvoltage, and over-current protections. Thermal regulation reduces charge current when the device junction temperature exceeds 120°C (programmable via I2C). The INT output immediately notifies the host when the charger changes state or a fault occurs. The bq25910 is available in space-saving 36-bump 2.41 x 2.44 mm2 WCSP. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 13 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.2 Functional Block Diagram The device is a highly integrated 6-A three-level switch-mode parallel battery charger for single-cell Li-ion and Lipolymer batteries. It integrates a reverse-blocking FET (QBLK), four switching FETs for three-level operation (QHSA – QLSA), and bootstrap cap control to drive HS gates. VBUS PMID VVBUS_UVLO 1 F VSLEEP REGN QBLK + UVLO + BLKFET CONTROL 10 F QHSA BATLOWV SLEEP REGN LDO EN_CHG 4.7 F REGN REGN CFLY+ + VBUS _ OVP VVBUS_OV VO,REF QHSB D0 2x 10 F SR 0 VVBUS IIN VBAT + IINDPM D180 BAT_OVP SR180 VSW GATE DRIVERS, CURRENT SENSE, CFLY PRE-CHARGE AND MONITOR QLSB DC-DC CONTROL VBAT VBAT_REG 330nH/ 470nH OCP + IC_TJ + VBAT_OVP + + VINDPM + TREG ICHG ICHG ICHG_REG CFLY± QLSA EN_CHARGE GND GND CFLY_FAULT REF DAC POORSRC CONVERTER CONTROL STATE MACHINE + VPOORSRC IND_SNS VVBUS IC_TJ TSHUTDOWN + TSHUT BATP 20 F VBAT TERMINATION CHARGE CONTROL STATE MACHINE INT + BATLOWV BATSNS BATN ICHG ITERM + CAUX FETS & CONTROL VBAT_LOWV VBAT CAUX 4.7 F BATSHORT + VBAT_SHORT VBAT I2C INTERFACE bq25910 BOOTSTRAP CAP CONTROL CDRV+ 220 nF SCL SDA CDRV± Copyright © 2017, Texas Instruments Incorporated Figure 13. bq25910 I2C Controlled Functional Block Diagram 14 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.3 Feature Description 7.3.1 Device Power-On-Reset (POR) The internal bias circuits are powered from the higher voltage of VBUS and VBAT. When VVBUS rises above VVBUS_UVLOZ, or VBAT rises above VBAT_UVLOZ, the sleep comparator and battery depletion comparator are active. I2C interface is ready for communication and all the registers are reset to default value. The host can access all the registers after POR. 7.3.2 Device Power Up from Battery without Input Source If only battery is present, the device consumes up to IBAT quiescent current. The REGN LDO stays off to minimize the current draw. I2C interface is ready for communication as long as VBAT is above VBAT_UVLOZ. 7.3.3 Device Power Up from Input Source When an input source is plugged in, and the EN_CHG bit is set to 1, the device checks the input source voltage and battery voltage to turn on REGN LDO, all the bias circuits and begin charging. The startup sequence from input source is as listed: 1. Power up REGN LDO 2. Poor source qualification 3. CFLY and CAUX pre-charging routine 4. Converter Power-up 7.3.4 Power Up REGN LDO The REGN LDO supplies internal bias circuits and power FET gate drivers. The pull-up rail of INT can be connected to REGN as well. The REGN LDO is enabled when all the following conditions are met: 1. VBUS above VBUS_UVLOZ 2. VBUS above VBAT + VSLEEPZ 3. VBUS below VVBUS_OV 4. VBAT above VBAT_LOWV 5. EN_CHG bit = 1 6. ICHG ≠ 0 A If one of the above conditions is not met, the device is in high impedance mode (HIZ) with REGN LDO off. The device draws less than IVBUS_HIZ from VBUS in this state. 7.3.5 Poor Source Qualification After REGN LDO powers up, the device checks the current capability of the input source. The input source has to meet the following requirements in order to operate the buck converter: 1. VBUS voltage below VVBUS_OV 2. VBUS voltage above VPOORSRC when pulling IPOORSRC (typical 20 mA) Once the conditions are met, the status register bit PG_STAT is set high and the INT pin is pulsed to signal the host. If VBUS_OV is detected (condition 1 above), the device automatically retries detection once the overvoltage fault goes away. If a poor source is detected (condition 2 above), the device repeats poor source qualification routine every 2 seconds. After 7 consecutive failures, the device sets POORSRC_STAT, sends an INT pulse to notify the host, goes to HIZ mode and resets EN_CHG bit. Adapter re-plugin and/or EN_CHG toggle is required to restart device operation. 7.3.6 Converter Power-Up Prior to converter switching, the flying and auxiliary capacitors, CFLY, and CAUX are charged to VBUS/2. After the capacitors have been pre-charged, the converter is enabled and the switching FETs QHSA – QLSB start switching. As a battery charger, the device deploys a highly-efficient 750-kHz three-level step-down switching regulator. The fixed frequency oscillator keeps tight control of the switching frequency under all conditions of input voltage, battery voltage, charge current and temperature, simplifying output filter design. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 15 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Feature Description (continued) The charge current is soft-started into the desired value by starting from 300 mA and increasing the current up to ICHG programmed value over time. This "soft-start" also applies when increasing the ICHG register value while charging. 7.3.7 Three-Level Buck Converter Theory of Operation The three-level converter is a combination of a switched capacitor and a switched inductor circuit. Assuming the flying capacitor, CFLY, remains balanced at VIN/2, the VSW node can be presented with three different voltages: VIN, VIN/2, and GND. The gate driving scheme is similar to a two-phase buck converter. The outer FETs (QHSA and QLSA) are driven with a complimentary signal with duty cycle D = VOUT/VIN. The inner FETs (QHSB and QLSB) are driven with a second complimentary signal of equal duty cycle, but phase shifted by 180°. By employing this driving scheme, there is a smooth transition around 50% duty ratio, where the VSW node moves from presenting GND and VIN/2 to presenting VIN and VIN/2. The three-level can achieve higher efficiency which cannot be easily obtained using traditional buck converter. The high efficiency is due to reduced inductor ripple (volt-seconds), reduced switching loss, and use of a compact inductor with lower DCR. The device integrates low RDSON FETs to optimize conduction loss. It also integrates control circuit to monitor CFLY stability and pre-conditioning. D < 0.50 L VSW VIN QHSA VIN QHSB + + ± VSW VIN/2 QLSB ± CO CFLY VO + VO ± t VSW VIN QLSA D > 0.50 VO VIN/2 t Figure 14. (a) Three-Level Buck Converter Circuit, (b) Time-Domain VSW and VO Waveforms, and (c) Inductor Current Ripple Comparison Across Duty Ratio D < 0.50 VSW QHSA L VSW QHSB QHSA VIN + QHSA QHSB QLSB ± CO CFLY + VO VIN ± + + ± QLSB ± CO CFLY + VO VIN ± + + ± ± CO CFLY QLSA QLSA L VSW QHSB QLSB + ± L + VO ± QLSA Figure 15. Three-Level Buck Converter States for Duty Ratios < 0.50 D > 0.50 VSW QHSA L VSW QHSB QHSA VIN + CO CFLY QHSA QHSB QLSB ± QLSA + VO ± VIN + ± + QLSB ± CO CFLY L VSW QHSB QLSB + ± L + VO VIN ± + ± + ± CO CFLY QLSA + VO ± QLSA Figure 16. Three-Level Buck Converter States for Duty Ratios > 0.50 16 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Feature Description (continued) 7.3.8 Host Mode and Default Mode 7.3.8.1 Host Mode and Default Mode in bq25910 The bq25910 is a host controlled charger, and will automatically shut off when the I2C watchdog timer is not reset within the timer period. In default (HIZ) mode, the device automatically disables charging until the host writes the EN_CHG bit high again and resets the watchdog timer via the WD_RST bit. When the charger is in default mode, WD_STAT bit is HIGH. When the charger is in host mode, WD_STAT bit is LOW. After power-on-reset, the device starts in default mode with watchdog timer expired. All the registers are in the default settings. In default mode, the device remains in HIZ mode and will not charge the battery. Writing a 1 to the WD_RST bit forces the charger out of default mode and into host mode. All the device parameters can be programmed by the host. To keep the device in host mode, the host has to reset the watchdog timer by writing 1 to WD_RST bit before the watchdog timer expires (WD_STAT bit is set), or disable watchdog timer by setting WATCHDOG bits = 00. When the watchdog timer is expired (WD_STAT bit = 1), the device returns to default mode and registers are reset to default values except as detailed in the I2C register section. As long as the watchdog timer is expired (WD_STAT bit = 1), the device remains in Default Mode without charging the battery, regardless of the EN_CHG bit state. In order to enable charge after watchdog expired, write WD_RST = 1, and EN_CHG = 1. POR Watchdog timer expired Reset registers I2C interface enabled Default Mode Watchdog timer expired Reset selective registers N Y Watchdog Timer Expired? WD_RST bit = 1? N Y Host Mode Start Watchdog timer Host programs registers WD_RST bit = 1? N Y Figure 17. Watchdog Timer Flow Chart The REG_RST bit can be used to reset all of the registers (except STATUS registers) to their default value at any time. 7.3.9 Battery Charging Management The device charges single-cell Li-Ion battery with up to 6-A charge current for high-capacity battery. 7.3.9.1 Autonomous Charging Cycle When battery charging is enabled (EN_CHG bit = 1) and the battery is above VBAT_LOWV, the device autonomously completes a charging cycle. The device default charging parameters are listed in Table 1. The host can always control the charging operations and optimize the charging parameters by writing to the corresponding registers through I2C. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 17 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Feature Description (continued) Table 1. Charging Parameter Default Settings PARAMETER A • • • • VALUE VBAT to start fast charge (VBATLOWV) 3.5 V Charging voltage (VREG) 4.350 V Charging current (ICHG) 3.500 A Termination current (ITERM) 1.000 A Safety timer (CHG_TIMER) 12 hours new charge cycle starts when the following conditions are valid: Converter starts Battery charging is enabled by EN_CHG bit, and ICHG register is not 0 mA Battery voltage above VBAT_LOWV No safety timer fault The charger device automatically terminates the charging cycle when the charging current is below termination threshold, and device not in DPM mode or thermal regulation. Once termination is detected, an INT is asserted to the host and the EN_CHG bit gets reset to zero. After the charge is done, EN_CHG bit can initiate a new charging cycle. Once a charging cycle is complete, an INT pulse is asserted to notify the host. In addition the status register (CHRG_STAT) indicates the different charging phases (any change in CHRG_STAT will generate an INT to notify the host): • 000: Charging disable • 001: Reserved • 010: Reserved • 011: Fast charge (constant current mode) • 100: Taper charge (constant voltage mode) • 101: Reserved • 110: Reserved • 111: Reserved 7.3.10 Master Charger and Parallel Charger Interactions A master charger is required in the system to manage pre-charging and full termination of the battery. The bq25910 monitors the battery voltage and compares it to VBAT_LOWV to ensure battery can safely take fast-charge current. Once the bq25910 turns on and begins fast-charging, the host has two options: disable (HIZ) the master charger, or continue running the master charger along with the parallel charger. For the first option, once battery voltage reaches VBAT_LOWV, the master charger maintains the BATFET on to supply system from battery (EN_HIZ = 1 on master charger), and the bq25910 provides both the charge current and system current if required. It is recommended to select VBAT_LOWV equal to minimum system voltage in order to maintain system operation during transition. The bq25910 will then fast-charge the battery up to VREG and continue to regulate voltage while battery current tapers down. After the bq25910 detects termination, the host can re-enable the master charger to regulate battery voltage in CV mode down to lower termination currents. The second mode of operation requires both chargers to stay on. In order to maximize efficiency, it is recommended to run the master charger at lower charge current than the bq25910. For example, the master charger might be set at 1 A and the bq25910 at 3.5 A to achieve total charge current of 4.5 A. In this mode of operation, the master charger provides mostly system current, while the bq25910 provides mostly charge current. In this mode of operation, the bq25910 can select VBAT_LOWV as low as the battery dictates for fast-charge, since the master charger can maintain system voltage regulation and ensure system continues to operate through the transition. After the bq25910 detects termination, the master charger automatically continues to regulate battery voltage in CV mode down to lower termination current. Figure 18 shows both options with charge current for each device as well as battery voltage. 18 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Voltage 4.35V BATP - BATN SYS_MIN 3.5V BATP - BATN Time Current 4.5A bq2591x ICHG Master Charger ICHG 2A Time Master Charger: Pre-charges BAT Master Charger: HIZ or ,&+* ” 1A Master Charger: HIZ or ,&+* ” 1A Master Charger: ITERM << 0.5A bq25910: Off bq25910: ICHG = 4.5A bq25910: ITERM = 1A bq25910: Off Figure 18. Master Charger and bq25910 Handoff 7.3.11 Battery Charging Profile The device charges the battery in two phases: constant current, and constant voltage. At the beginning of a charging cycle, the device checks the battery voltage and regulates current / voltage as needed. If the battery voltage is below VBAT_LOWV, it is the master charger responsibility to increase VBAT up to VBAT_LOWV so the parallel charger can initiate fast charging. As BAT increases to VBAT_LOWV, the master charger can stay in HIZ and the bq25910 can start fast-charging the battery with up-to 6-A ICHG. Alternatively, the master charger can remain on to maintain the system load from adapter, while the bq25910 charges the battery. The default charging settings can be found in Table 2. Table 2. Battery Charger Setting VBAT CHARGING CURRENT REG DEFAULT SETTING CHRG_STAT <2V Master controlled (IBATSHORT ) bq25910 off 000 2 V – VBAT_LOWV Master controlled (IPRECHG ) bq25910 off 000 > VBAT_LOWV ICHG 3.500 A 011 VREG TAPER down to ITERM 4.350 V 100 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 19 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com If the charger device is in DPM regulation or thermal regulation during charging, the charging current can be less than the programmed value. In this case, termination is temporarily disabled and the charging safety timer is counted at half the clock rate. bq25910 Charge Cycle Fast Charge ICHG bq25910 on VREG Battery Current Battery Voltage VBATLOWV ITERM 3.0V 0A Pre-Charge Master Charger CHRG_STAT[2:0] CC Master Charger CC bq25910 CV bq25910 CV Master Charger 000 011 100 000 Figure 19. Battery Charging Profile Highlighting Parallel Charger Region of Operation After the device signals charge termination done (CHRG_TERM_FLAG = 1), the master charger may choose to continue charging in CV mode or finish the charging cycle completely. The bq25910 will not start a re-charge cycle automatically, and a toggle on EN_CHG bit is required to restart a charge cycle. 7.3.11.1 Charging Termination The device terminates a charge cycle when the battery voltage is at VREG, and the current is below termination current (ITERM). After the charging cycle is completed, the converter turns off and enters HIZ mode. At this point, the master charger can continue charging the battery down to a lower termination current, or just provide the system load from the adapter through its buck converter. When termination occurs, the status register CHRG_STAT is set to 000, the CHRG_TERM_FLAG is set to 1, and an INT pulse is asserted to the host. The CHRG_TERM_FLAG should be used to determine if termination was detected. Termination is temporarily disabled when the charger device is in input current, input voltage or thermal regulation. Termination can be disabled by writing 0 to EN_TERM bit prior to charge termination. In this case, the device will continue regulating the battery voltage to VREG value until the safety timer runs out or until the EN_CHG bit is cleared. 7.3.11.2 Differential Battery Voltage Remote Sensing For high current charging systems, resistance between the charger output and battery cell terminal such as board routing, connector, MOSFETs and sense resistor can force the charging process to move from constant current to constant voltage too early, thereby increasing charge time. To speed up the charging cycle, the device provides differential remote sensing terminals for battery positive and negative terminals, which can extend the constant current charge time to deliver maximum power to the battery. The device regulates BATP – BATN = VBAT to the programmed VREG voltage. By connecting the sense terminals as close the battery as possible, the charger can deliver maximum charging power to battery. The kelvin connections to the battery can be made via a 100-Ω resistor. 20 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.3.11.3 Charging Safety Timer The device has built-in safety timer to prevent extended charging cycle due to abnormal battery conditions. The user can program fast charge safety timer through I2C (CHG_TIMER bits). When safety timer expires, the TMR_FLAG bit is set to 1, and an INT pulse is asserted to the host. The safety timer feature can be disabled via I2C using EN_TIMER bit. During input voltage, current or thermal regulation, the safety timer counts at half clock rate as the actual charge current is likely to be below the register setting. For example, if the charger is in input current regulation (IINDPM_STAT = 1) throughout the whole charging cycle, and the safety timer is set to 5 hours, then the timer will expire in 10 hours. This half clock rate feature can be disabled by setting TMR2X_EN = 0. Changing the TMR2X_EN bit while the device is running has no effect on the safety timer count, other than forcing the timer to count at half the rate under the conditions dictated above. 7.4 Device Functional Modes 7.4.1 Lossless Current Sensing In high current charging systems, extra resistance between the charger output and the battery contribute to power loss and temperature rise. The bq25910 regulates the output current without the need of a sense resistor, thereby reducing system power loss and operating temperature. Switching FET current information is used in conjunction to inductor DCR sensing to regulate output current accurately. For optimal operation, the voltage drop across the DCR should be below 180 mV. For example, to achieve 6-A charging, the DCR should be below 30 mΩ. In addition to lossless current regulation, the switching FET current is monitored on a cycle-by-cycle basis to ensure safe operation. 7.4.2 Dynamic Power Management To meet maximum current limit in USB spec and avoid over-loading the adapter, the device features Dynamic Power Management (DPM), which continuously monitors the input current and input voltage. When input source is over-loaded, either the current exceeds the input current limit (IINDPM) or the voltage falls below the input voltage limit (VINDPM). The device then reduces the charge current until the input current falls below the input current limit and the input voltage rises above the input voltage limit. During DPM mode, the status register bits VINDPM_STAT (VINDPM) and/or IINDPM_STAT (IINDPM) is/are set to 1. Figure 20 shows the IINDPM response with 9-V/1.33-A (12-W) adapter, 4.0-V battery, 3.5-A charge current, and bq25910 in CV mode. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 21 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Device Functional Modes (continued) SYSTEM LOAD ISYS VBUS SYS VBUS bq25898 (Hi-Z Mode) BAT IOUT,910 IBUS SW2 VBUS IBAT + VBAT GND bq25910 VBUS 9.0V 8.5V 4A 3A 2A 1A 0A IOUT IBAT IBUS ISYS -1A CV IINDPM CV Figure 20. DPM Response 7.4.3 Interrupt to Host (INT) In some applications, the host does not always monitor the charger operation. The INT pin notifies the system host on the device operation. By default, the following events will generate an active-low, 256-μs INT pulse. 1. Good input source detected (three conditions below met) – VVBUS > VBAT (not in sleep) – VVBUS < VVBUS_OV – VVBUS > VVPOORSRC (typ 3.7 V) when IPOORSRC (typ 20 mA) current is applied (not a poor source) 2. Good input source removed 3. POORSRC routine failed 7 consecutive times (connected adaptor was found to be a poor source) 4. Capacitor pre-charge routine failed (CFLY / CAUX failed to pre-charge) 5. Entering IINDPM regulation 6. Entering VINDPM regulation 7. Entering device Junction Temperature Regulation 22 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Device Functional Modes (continued) 8. I2C Watchdog timer expired – At initial power-up, this INT gets asserted to signal I2C is ready for communication 9. Charger changes state (CHRG_STAT value change) 10. VBUS over-voltage detected 11. Junction temperature shutdown (TSHUT) 12. Battery over-voltage detected (BATOVP) 13. CFLY fault detected 14. Charge Safety Timer Expired Each one of these INT sources can be masked off to prevent INT pulses from being sent out when they occur. Three bits exist for each one of these events: • The STAT bit holds the current status of each INT source • The FLAG bit holds information on which source produced an INT, regardless of current status. • The MASK bit is used to prevent the device from sending out INT for each particular event. When one of the above conditions occurs, the device sends out an INT pulse and keeps track of which source generated the INT via the FLAG registers. The FLAG register bits are automatically reset to zero after the host reads them, and a new edge on STAT bit is required to re-assert the FLAG. IINDPM_STAT IINDPM_FLAG TREG_STAT TREG_FLAG INT I2C Flag Read Figure 21. INT Generation Behavior Example 7.4.4 Protections 7.4.4.1 Voltage and Current Monitoring The device closely monitors the input and output voltage, as well as switching FET currents for safe buck mode operation. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 23 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Device Functional Modes (continued) 7.4.4.1.1 Input Over-Voltage (VVBUS_OV) The valid input voltage range for buck mode operation is VVBUS_OP. If VBUS voltage exceeds VVBUS_OV, the device stops switching immediately to protect the power FETs. During input over-voltage, an INT pulse is asserted to signal the host, and the VBUS_OVP_STAT and VBUS_OVP_FLAG fault register bits get set. The device automatically starts switching again when the over-voltage condition goes away. 7.4.4.1.2 Input Under-Voltage (VPOORSRC) The valid input voltage range for buck mode operation is VVBUS_OP. If VBUS voltage falls below VPOORSRC, the device stops switching. During input under-voltage, an INT pulse is asserted to signal the host, and the PG_STAT bit gets cleared. The PG_FLAG bit will get set to signal this event. The device automatically attempts to restart switching when the under-voltage condition goes away. 7.4.4.1.3 Flying Capacitor Over- or Under-Voltage Protection (VCFLY_OVP and VCFLY_UVP) Under normal operating conditions the flying capacitor is balanced by the converter. However, during line transients or other failures, capacitor mis-balance is possible. The device constantly monitors the flying capacitor voltage. If VCFLY exceeds the protection limits, the device stops switching immediately. When this fault is detected, an INT pulse is asserted to notify the host, and the CFLY_STAT and CFLY_FLAG fault register bits get set. The device automatically attempts to re-balance the cap and resumes charging if successful. If the device fails to re-balance CFLY, the CAP_COND_STAT and CAP_COND_FLAG fault register bits get set, and an EN_CHG toggle is required to re-attempt charging. 7.4.4.1.4 Over Current Protection The device monitors the outer switching FET current on a cycle-by-cycle basis . If an over-current is detected, the device responds by forcing the switching FETs to immediately discharge the inductor current and attempt current ramp-up once again. 7.4.4.2 Thermal Regulation and Thermal Shutdown The device monitors internal junction temperature TJ to avoid overheating the chip and limits the device surface temperature in buck mode. When the internal junction temperature exceeds the preset thermal regulation limit (TREG bits), the device reduces charge current. A wide thermal regulation range from 60°C to 120°C allows the user to optimize the system thermal performance. During thermal regulation, the actual charging current is usually below the programmed value in ICHG registers. Therefore, termination is disabled, the safety timer runs at half the clock rate, the status register TREG_STAT bit goes high, and an INT is asserted to the host. Additionally, the device has thermal shutdown to turn off the converter when device surface temperature exceeds TSHUT. The fault register TSHUT_STAT is set and an INT pulse is asserted to the host. The converter turns back on when device temperature is below TSHUT_HYS. 7.4.4.3 Battery Protection 7.4.4.3.1 Battery Over-Voltage Protection (BATOVP) The battery over-voltage limit is clamped at 4% above the battery regulation voltage. When battery over-voltage occurs, the charger device immediately disables charge. The fault register BATOVP_STAT bit goes high and an INT pulse is asserted to signal the host. 7.5 Programming 7.5.1 Serial Interface The device uses I2C compatible interface for flexible charging parameter programming and instantaneous device status reporting. I2C is a bi-directional 2-wire serial interface. Only two open-drain bus lines are required: a serial data line (SDA), and a serial clock line (SCL). Devices can be considered as masters or slaves when performing data transfers. A master is a device which initiates a data transfer on the bus and generates the clock signals to permit that transfer. At that time, any device addressed is considered a slave. 24 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Programming (continued) The device operates as a slave device with address 4BH, receiving control inputs from the master device like micro-controller or digital signal processor through REG00-REG0D. Register read beyond REG0D (0x0D) returns 0xFF. The I2C interface supports both standard mode (up to 100 kbits/s), and fast mode (up to 400 kbits/s). When the bus is free, both lines are HIGH. The SDA and SCL pins are open drain and must be connected to the positive supply voltage via a current source or pull-up resistor. 7.5.2 Data Validity The data on the SDA line must be stable during the HIGH period of the clock. The HIGH or LOW state of the data line can only change when the clock signal on SCL line is LOW. One clock pulse is generated for each data bit transferred. SDA SCL Data line stable; Data valid Change of data allowed Figure 22. Bit Transfers on the I2C Bus 7.5.3 START and STOP Conditions All transactions begin with a START (S) and are terminated with a STOP (P). A HIGH to LOW transition on the SDA line while SCL is HIGH defines a START condition. A LOW to HIGH transition on the SDA line when the SCL is HIGH defines a STOP condition. START and STOP conditions are always generated by the master. The bus is considered busy after the START condition, and free after the STOP condition. SDA SDA SCL SCL STOP (P) START (S) Figure 23. START and STOP Conditions on the I2C Bus 7.5.4 Byte Format Every byte on the SDA line must be 8 bits long. The number of bytes to be transmitted per transfer is unrestricted. Each byte has to be followed by an ACKNOWLEDGE (ACK) bit. Data is transferred with the Most Significant Bit (MSB) first. If a slave cannot receive or transmit another complete byte of data until it has performed some other function, it can hold the SCL line low to force the master into a wait state (clock stretching). Data transfer then continues when the slave is ready for another byte of data and releases the SCL line. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 25 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Programming (continued) Acknowledgement signal from receiver Acknowledgement signal from slave MSB SDA SCL S or Sr 1 2 8 7 2 1 9 8 P or Sr 9 ACK ACK START or Repeated START STOP or Repeated START Figure 24. Data Transfer on the I2C Bus 7.5.5 Acknowledge (ACK) and Not Acknowledge (NACK) The ACK signaling takes place after byte. The ACK bit allows the receiver to signal the transmitter that the byte was successfully received and another byte may be sent. All clock pulses, including the acknowledge 9th clock pulse, are generated by the master. The transmitter releases the SDA line during the acknowledge clock pulse so the receiver can pull the SDA line LOW and it remains stable LOW during the HIGH period of this 9th clock pulse. A NACK is signaled when the SDA line remains HIGH during the 9th clock pulse. The master can then generate either a STOP to abort the transfer or a repeated START to start a new transfer. 7.5.6 Slave Address and Data Direction Bit After the START signal, a slave address is sent. This address is 7 bits long, followed by the 8 bit as a data direction bit (bit R/W). A zero indicates a transmission (WRITE) and a one indicates a request for data (READ). The device 7-bit address is defined as 1001 011’ (0x4BH) by default. The address bit arrangement for 4BH is shown in Figure 25. Slave Address 1 0 0 1 0 1 1 R/W Figure 25. 14: 7-Bit Addressing (4BH) SDA SCL S 1-7 START ADDRESS 8 R/W 9 ACK 1-7 8 DATA 9 1-7 ACK 8 DATA 9 ACK P STOP 2 Figure 26. Complete Data Transfer on I C Bus 7.5.7 Single Read and Write Figure 27. Single Write 26 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Programming (continued) Figure 28. Single Read If the register address is not defined, the charger device sends back NACK and returns to the idle state. 7.5.8 Multi-Read and Multi-Write The charger device supports multi-read and multi-write of all registers. Figure 29. Multi-Write Figure 30. Multi-Read Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 27 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6 Register Maps 7.6.1 I2C Registers Table 3 lists the memory-mapped registers for the I2C. All register offset addresses not listed in Table 3 should be considered as reserved locations and the register contents should not be modified. Table 3. I2C Register Summary Table Address Access Type Acronym Register Name 0h R/W REG00 Battery Voltage Limit Section Go 1h R/W REG01 Charge Current Limit Go 2h R/W REG02 Input Voltage Limit Go 3h R/W REG03 Input Current Limit Go 4h R/W REG04 RESERVED Go 5h R/W REG05 Charger Control 1 Go 6h R/W REG06 Charger Control 2 Go 7h R REG07 INT Status Go 8h R REG08 FAULT Status Go 9h R REG09 INT Flag Go Ah R REG0A FAULT Flag Go Bh R/W REG0h INT Mask Go Ch R/W REG0C FAULT Mask Go Dh R/W REG0D Part Information Go Complex bit access types are encoded to fit into small table cells. Table 4 shows the codes that are used for access types in this section. Table 4. I2C Access Type Codes Access Type Code Description R Read W Write Read Type R Write Type W Reset Value 28 -n Value after reset -X Undefined value Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.1 Battery Voltage Regulation Limit Register (Address = 0h) [reset = AAh] REG00 is shown in Figure 31 and described in Table 5. Return to Summary Table. Figure 31. REG00 Register 7 6 5 4 3 2 1 0 VREG[7:0] R/W-AAh Table 5. REG00 Register Field Descriptions Field Type Reset by REG_RST Reset by WATCHDOG Description 7 VREG[7] R/W Yes Yes 640 mV 6 VREG[6] R/W Yes Yes 320 mV 5 VREG[5] R/W Yes Yes 160 mV 4 VREG[4] R/W Yes Yes 80 mV 3 VREG[3] R/W Yes Yes 40 mV 2 VREG[2] R/W Yes Yes 20 mV 1 VREG[1] R/W Yes Yes 10 mV 0 VREG[0] R/W Yes Yes 5 mV Bit Charge voltage limit: Offset: 3.5 V Range: 3.5 V to 4.775 V Default 4.35 V Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 29 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.2 Charger Current Limit Register (Address = 1h) [reset = 46h] REG01 is shown in Figure 32 and described in Table 6. Return to Summary Table. Figure 32. REG01 Register 7 RESERVED R/W-0h 6 5 4 3 ICHG[6:0] R/W-46h 2 1 0 Table 6. REG01 Register Field Descriptions Field Type Reset by REG_RST Reset by WATCHDOG 7 RESERVED R/W Yes Yes Reserved bit always reads 0h 6 ICHG[6] R/W Yes Yes 3200 mA 5 ICHG[5] R/W Yes Yes 1600 mA 4 ICHG[4] R/W Yes Yes 800 mA 3 ICHG[3] R/W Yes Yes 400 mA 2 ICHG[2] R/W Yes Yes 200 mA 1 ICHG[1] R/W Yes Yes 100 mA 0 ICHG[0] R/W Yes Yes 50 mA Bit 30 Description Fast charge current limit Offset: 0 mA Range: 0 mA to 6000 mA Default: 3500 mA NOTE: ICHG > 6 A (78h) clamped to 6 A ICHG < 300 mA (06h) clamped to 0 A Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.3 Input Voltage Limit Register (Address = 2h) [reset = 04h] REG02 is shown in Figure 33 and described in Table 7. Return to Summary Table. Figure 33. REG02 Register 7 RESERVED R/W-0h 6 5 4 3 VINDPM[6:0] R/W-04h 2 1 0 Table 7. REG02 Register Field Descriptions Field Type Reset by REG_RST Reset by WATCHDOG 7 RESERVED R/W Yes No Reserved bit always reads 0h 6 VINDPM[6] R/W Yes No 6400 mV 5 VINDPM[5] R/W Yes No 3200 mV 4 VINDPM[4] R/W Yes No 1600 mV 3 VINDPM[3] R/W Yes No 800 mV 2 VINDPM[2] R/W Yes No 400 mV 1 VINDPM[1] R/W Yes No 200 mV 0 VINDPM[0] R/W Yes No 100 mV Bit Description Absolute input-voltage limit Offset: 3.9 V Range: 3.9 V to 14 V Default: 4.3 V NOTE: VINDPM > 14 V (65h) clamped to 14 V Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 31 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.4 Input Current Limit Register (Address = 3h) [reset = 13h] REG03 is shown in Figure 34 and described in Table 8. Return to Summary Table. Figure 34. REG03 Register 7 6 5 4 3 RESERVED R/W-0h 2 1 0 INDPM[5:0] R/W-13h Table 8. REG03 Register Field Descriptions Bit Field Type Reset by REG_RST Reset by WATCHDOG 7-6 RESERVED R/W Yes No Reserved bit always reads 0h 5 INDPM[5] R/W Yes No 3200 mA 4 INDPM[4] R/W Yes No 1600 mA 3 INDPM[3] R/W Yes No 800 mA 2 INDPM[2] R/W Yes No 400 mA 1 INDPM[1] R/W Yes No 200 mA 0 INDPM[0] R/W Yes No 100 mA 32 Description Input current limit Offset: 500 mA Range: 500 mA to 3600 mA Default: 2400 mA NOTE: INDPM > 3600 mA (1Fh) clamped to 3600mA Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.5 Reserved Register (Address = 4h) [reset = 03h] REG04 is shown in Figure 35 and described in Table 9. Return to Summary Table. Figure 35. REG04 Register 7 6 5 4 3 2 1 0 RESERVED R/W-0h R/W-3h Table 9. REG04 Register Field Descriptions Bit Field Type Reset by REG_RST Reset by WATCHDOG 7-0 RESERVED R/W Yes Yes Description Reserved bit always reads 03h Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 33 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.6 Charger Control 1 Register (Address = 5h) [reset = 9Dh] REG05 is shown in Figure 36 and described in Table 10. Return to Summary Table. When the WATCHDOG[1:0] bits change (writing the same value does not change these bits), the internal counter is reset. The same applies for the CHG_TIMER bits (changing the value in the register will reset the CHG_TIMER). Figure 36. REG05 Register 7 EN_TERM R/W-1h 6 WD_RST R/W-0h 5 4 WATCHDOG[1:0] R/W-1h 3 EN_TIMER R/W-1h 2 1 CHG_TIMER[1:0] R/W-2h 0 TMR2X_EN R/W-1h Table 10. REG05 Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG EN_TERM R/W Yes Yes Description Termination control 0h = Disable termination 1h = Enable termination 6 WD_RST R/W Yes Yes I2C watchdog-timer reset 0h = Normal 1h = Reset (bit returns to 0 after time reset) 5-4 WATCHDOG[1:0] R/W Yes Yes I2C watchdog-timer settings 0h = Disable watchdog timer 1h = 40 s 2h = 80 s 3h = 160 s 3 EN_TIMER R/W Yes Yes Charging safety-timer enable 0h = Disable 1h = Enable 2-1 CHG_TIMER[1:0] R/W Yes Yes Fast-charge safety timer setting 0h = 5 hours 1h = 8 hours 2h = 12 hours 3h = 20 hours 0 TMR2X_EN R/W Yes Yes Safety timer behavior during DPM or TREG 0h = Safety timer always counts normally 1h = Safety timer count slowed by 2x during input DPM or TREG 34 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.7 Charger Control 2 Register (Address = 6h) [reset = 33h] REG06 is shown in Figure 37 and described in Table 11. Return to Summary Table. When the watchdog timer expires (WD_STAT = 1h), the EN_CHG bit is held in reset. To enable the charger after the watchdog expires, write a value of 1h to the WD_RST bit and a value of 1h to the EN_CHG bit. Figure 37. REG06 Register 7 6 5 RESERVED R/W-0h 4 TREG[1:0] R/W-3h 3 EN_CHG R/W-0h 2 RESERVED R/W-0h 1 0 VBATLOWV[1:0] R/W-3h Table 11. REG06 Register Field Descriptions Bit Field Type Reset by REG_RST Reset by WATCHDOG 7-6 RESERVED R/W Yes Yes Reserved bit always reads 0h 5-4 TREG[1:0] R/W Yes Yes Thermal regulation threshold Description 0h = 60°C 1h = 80°C 2h = 100°C 3h = 120°C 3 EN_CHG R/W Yes Yes Charger enable configuration 0h = Charger disabled 1h = Charger enabled 2 1-0 RESERVED R/W Yes Yes Reserved bit always reads 0h VBATLOWV[1:0] R/W Yes No VBAT_LOWV threshold to start charging at ICHG programmed setting: 0h = 2.6 V 1h = 2.9 V 2h = 3.2 V 3h = 3.5 V Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 35 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.8 INT Status Register (Address = 7h) [reset = X] REG07 is shown in Figure 38 and described in Table 12. Return to Summary Table. Figure 38. REG07 Register 7 PG_STAT R-X 6 INDPM_STAT R-X 5 VINDPM_STAT R-X 4 TREG_STAT R-X 3 WD_STAT R-X 2 1 CHRG_STAT[2:0] R-X 0 Table 12. REG07 Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG PG_STAT R Yes Yes Description Power-good status 0h = Not power good 1h = Power good 6 INDPM_STAT R Yes Yes INDPM status 0h = Normal 1h = In INDPM regulation 5 VINDPM_STAT R Yes Yes VINDPM status 0h = Normal 1h = In VINDPM regulation 4 TREG_STAT R Yes Yes Device thermal-regulation status 0h = Normal 1h = In thermal regulation 3 WD_STAT R Yes No I2C watchdog-timer status 0h = Normal 1h = Watchdog timer expired 2-0 CHRG_STAT[2:0] R Yes Yes Charge status 0h = Not charging 1h = Reserved 2h = Reserved 3h = Fast charging (CC mode) 4h = Taper charging (CV mode) 5h = Reserved 6h = Reserved 7h = Reserved 36 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.9 FAULT Status Register (Address = 8h) [reset = X] REG08 is shown in Figure 39 and described in Table 13. Return to Summary Table. When the watchdog timer expires (WD_STAT = 1h), the VBUS_OVP_STAT, TSHUT_STAT, BATOVP_STAT, and CFLY_STAT bits are held in reset until the watchdog fault is cleared (WD_RST bit = 1h, or changing the WATCHDOG[1:0] bits). Figure 39. REG08 Register 7 VBUS_OVP_S TAT R-X 6 TSHUT_STAT 5 BATOVP_STA T R-X R-X 4 CFLY_STAT 3 RESERVED R-X R-0h 2 CAP_COND_S TAT R-X 1 POORSRC_ST AT R-X 0 RESERVED R-0h Table 13. REG08 Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG VBUS_OVP_STAT R Yes Yes Description Input-overvoltage status 0h = Normal 1h = Device in overvoltage protection 6 TSHUT_STAT R Yes Yes Device temperature-shutdown status 0h = Normal 1h = Device in thermal-shutdown protection 5 BATOVP_STAT R Yes Yes Battery overvoltage status 0h = Normal 1h = BATOVP (VBAT > VBATOVP) 4 CFLY_STAT R Yes Yes Flying capacitor status 0h = Normal 1h = Flying capacitor fault (VCFLY_UVP or OVP) 3 Reserved R Yes Yes Reserved bit always reads 0 2 CAP_COND_STAT R Yes Yes Capacitor precondition status 0h = Normal 1h = CFLY or CAUX precondition failed 1 POORSRC_STAT R Yes Yes Poor-source-detection status 0h = Normal 1h = POORSRC routine failed 7 consecutive times 0 RESERVED R Yes Yes Reserved bit always reads 0 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 37 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.10 INT Flag Status Register (Address = 9h) [reset = 00h] REG09 is shown in Figure 40 and described in Table 14. Return to Summary Table. All bits in REG09 are automatically cleared after a read. Figure 40. REG09 Register 7 PG_FLAG 6 INDPM_FLAG 5 VINDPM_FLAG 4 TREG_FLAG 3 WD_FLAG R-0h R-0h R-0h R-0h R-0h 2 CHRG_TERM_ FLAG R-0h 1 RESERVED 0 CHRG_FLAG R-0h R-0h Table 14. REG09 Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG PG_FLAG R Yes No Description Power-good INT flag 0h = Normal 1h = PG-signal toggle detected 6 INDPM_FLAG R Yes No INDPM-regulation INT flag 0h = Normal 1h = INDPM-signal rising edge detected 5 VINDPM_FLAG R Yes No VINDPM-regulation INT flag 0h = Normal 1h = VINDPM-signal rising edge detected 4 TREG_FLAG R Yes No Device temperature-regulation INT flag 0h = Normal 1h = TREG-signal rising edge detected 3 WD_FLAG R Yes No I2C-watchdog INT flag 0h = Normal 1h = WD_STAT-signal rising edge detected 2 CHRG_TERM_FLAG R Yes No Charger-termination INT flag 0h = Normal 1h = Charger-termination signal rising edge detected 1 RESERVED R Yes No Reserved bit always reads 0 0 CHRG_FLAG R Yes No Charger status INT flag 0h = Normal 1h = CHRG_STAT[2:0] bits changed (transition to any state) 38 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.11 FAULT Flag Register (Address = Ah) [reset = 00h] REG0A is shown in Figure 41 and described in Table 15. Return to Summary Table. All bits in REG0A are automatically cleared after a read. Figure 41. REG0A Register 7 VBUS_OVP_FL AG R-0h 6 TSHUT_FLAG 5 BATOVP_FLA G R-0h R-0h 4 CFLY_FLAG 3 TMR_FLAG R-0h R-0h 2 CAP_COND_F LAG R-0h 1 POORSRC_FL AG R-0h 0 RESERVED R-0h Table 15. REG0A Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG VBUS_OVP_FLAG R Yes No Description Input-overvoltage INT flag 0h = Normal 1h = VBUS_OVP signal rising edge detected 6 TSHUT_FLAG R Yes No Thermal-shutdown INT flag 0h = Normal 1h = TSHUT signal rising edge detected 5 BATOVP_FLAG R Yes No Battery-overvoltage INT flag 0h = Normal 1h = BATOVP signal rising edge detected 4 CFLY_FLAG R Yes No Flying capacitor fault INT flag 0h = Normal 1h = Flying capacitor fault signal rising edge detected 3 TMR_FLAG R Yes No Charger safety-timer fault INT flag 0h = Normal 1h = Charger safety-timer expired rising edge 2 CAP_COND_FLAG R Yes No Capacitor precondition fault INT flag 0h = Normal 1h = CAP_COND_STAT signal rising edge detected 1 POORSRC_FLAG R Yes No Poor-source-fault INT flag 0h = Normal 1h = POORSRC_STAT signal rising edge detected 0 RESERVED R Yes No Reserved bit always reads 0 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 39 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.12 INT Mask Register (Address = Bh) [reset = 00h] REG0h is shown in Figure 42 and described in Table 16. Return to Summary Table. Figure 42. REG0h Register 7 PG_MASK 6 INDPM_MASK R/W-0h R/W-0h 5 VINDPM_MAS K R/W-0h 4 TREG_MASK 3 WD_MASK R/W-0h R/W-0h 2 CHRG_TERM_ MASK R/W-0h 1 RESERVED 0 CHRG_MASK R/W-0h R/W-0h Table 16. REG0h Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG PG_MASK R/W Yes No Description Power-good INT mask 0h = PG toggle produces INT pulse 1h = PG toggle does not produce INT pulse 6 INDPM_MASK R/W Yes No INDPM-regulation INT mask 0h = INDPM entry produces INT pulse 1h = INDPM entry does not produce INT pulse 5 VINDPM_MASK R/W Yes No VINDPM-regulation INT mask 0h = VINDPM entry produces INT pulse 1h = VINDPM entry does not produce INT pulse 4 TREG_MASK R/W Yes No Device temperature-regulation INT mask 0h = TREG entry produces INT pulse 1h = TREG entry does not produce INT pulse 3 WD_MASK R/W Yes No I2C watchdog-timer INT mask 0h = WD_STAT rising edge produces INT pulse 1h = WD_STAT rising edge does not produce INT pulse 2 CHRG_TERM_MASK R/W Yes No Charger-termination INT mask 0h = CHRG-termination detection produces INT pulse 1h = CHRG-termination detection does not produce INT pulse 1 RESERVED R/W Yes No Reserved bit always reads 0 0 CHRG_MASK R/W Yes No Charger-status INT mask 0h = CHRG_STAT[2:0] bit change produces INT pulse 1h = CHRG_STAT[2:0] bit change does not produce INT pulse 40 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 7.6.1.13 FAULT Mask Register (Address = Ch) [reset = 00h] REG0C is shown in Figure 43 and described in Table 17. Return to Summary Table. Figure 43. REG0C Register 7 VBUS_OVP_M ASK R/W-0h 6 TSHUT_MASK R/W-0h 5 BATOVP_MAS K R/W-0h 4 CFLY_MASK 3 TMR_MASK R/W-0h R/W-0h 2 1 CAP_COND_M POORSRC_MA ASK SK R/W-0h R/W-0h 0 RESERVED R/W-0h Table 17. REG0C Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG VBUS_OVP_MASK R/W Yes No Description Input overvoltage INT mask 0h = VBUS_OVP rising edge produces INT pulse 1h = VBUS_OVP rising edge does not produce INT pulse 6 TSHUT_MASK R/W Yes No Thermal-shutdown INT mask 0h = TSHUT rising edge produces INT pulse 1h = TSHUT rising edge does not produce INT pulse 5 BATOVP_MASK R/W Yes No Battery-overvoltage INT mask 0h = BATOVP rising edge produces INT pulse 1h = BATOVP rising edge does not produce INT pulse 4 CFLY_MASK R/W Yes No Flying capacitor fault INT mask 0h = CFLY-fault rising edge produces INT pulse 1h = CFLY-fault rising edge does not produce INT pulse 3 TMR_MASK R/W Yes No Charger safety-timer fault INT mask 0h = Timer expired rising edge produces INT pulse 1h = Timer expired rising edge does not produce INT pulse 2 CAP_COND_MASK R/W Yes No Capacitor precondition-fault INT mask 0h = CAP_COND_FLAG rising edge produces INT pulse 1h = CAP_COND_FLAG rising edge does not produce INT pulse 1 POORSRC_MASK R/W Yes No Poor-source-fault INT mask 0h = POORSRC_FLAG rising edge produces INT pulse 1h = POORSRC_FLAG rising edge does not produce INT pulse 0 RESERVED R/W Yes No Reserved bit always reads 0 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 41 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 7.6.1.14 Part Information Register (Address = Dh) [reset = 09h] REG0D is shown in Figure 44 and described in Table 18. Return to Summary Table. Figure 44. REG0D Register 7 REG_RST R/W-0h 6 5 4 3 2 PN[3:0] R-1h 1 DEV_REV[2:0] R-1h 0 Table 18. REG0D Register Field Descriptions Bit 7 Field Type Reset by REG_RST Reset by WATCHDOG REG_RST R/W No No Description Register preset 0h = Keep the current register settings 1h = Reset to default register values and reset the safety timer NOTE: This bit resets to 0 after the register reset is complete. 6-3 PN[3:0] R No No 2-0 DEV_REV[2:0] R No No Part number 1h = bq25910 42 Device revision: 001 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 8 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 8.1 Application Information A typical application consists of the device configured as an I2C controlled single cell, parallel battery charger for Li-Ion and Li-polymer batteries used in a wide range of smartphones and other portable devices. It integrates an input reverse-block FET (QBLK), four switching FETs for three-level operation (QHSA – QLSA), and a bootstrap cap control to drive HS gates. 8.2 Typical Application VBUS SYSTEM LOAD SW 1 PF 20 PF GND PMID1 10 PF I2C Bus SYS bq25600 / bq25898 / PMIC BAT 10 PF VBUS CFLY + 1 PF 10 PF 10 PF ICHG1 PMID2 SW2 470nH / 330nH 10 PF CDRV+ CFLY - CDRV- IND_ SNS 220 nF 20 PF 100 VDD + BATP VBAT 100 - 10k 10k 10k BATN GND SDA Host REGN SCL INT 4.7 PF CAUX bq25910 4.7 PF Figure 45. bq25910 Application Test Configuration Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 43 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Typical Application (continued) 8.2.1 Design Requirements For this design example, use the parameters shown in Table 19. Table 19. Design Parameters PARAMETER VALUE Input Voltage Range 3.9 V to 14 V Input Current Limit 2.4 A Fast Charge Current 3.5 A Battery Regulation Voltage 4.35 V 8.2.2 Detailed Design Procedure 8.2.2.1 External Passive Recommendation The following part numbers are recommended for correct operation of bq25910. Table 20. Recommended External Components PASSIVE Inductor UP TO 9VBUS ±10% UP TO 12VBUS ±10% HMLQ25201B-R33 DFE252012F-R47 MPIM252010E-R33 DFE252010F-R47 CFLY (10 μF, X5R, 16 V) 2x GRM188R61C106MAALD CAUX (4.7 μF, X5R, 16 V) 1x GRM155R61A475MEAAD 8.2.2.2 Inductor Selection The bq25910 is a three-level converter with a fixed switching frequency of 750 kHz, allowing the use of small inductor and capacitor values. The inductor saturation current should be higher than the output current (ICHG) plus half the ripple current (IRIPPLE): I ISAT t ICHG RIPPLE 2 (1) The inductor ripple current depends on input voltage (VBUS), duty cycle (D = VBAT/VBUS), switching frequency (fsw) and inductance (L): VBUS 0.5 u D 0.5 IRIPPLE D 0.5 2 Lfsw (2) The maximum inductor ripple current happens with D = 1/3 or D = 2/3. The recommended value of inductance is 330 nH for 9-V applications or 470 nH for 12-V applications (750 kHz). 44 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 Figure 46. Inductor Current Ripple as function of VBUS with Fixed VBAT Table 21. Recommended Inductor values VBUS INDUCTOR VALUE 3.9 V < VBUS < 10 V 330 nH 3.9 V < VBUS < 14 V 470 nH 8.2.2.3 Input Capacitor Input capacitor should have enough ripple current rating to absorb input switching ripple current. The worst case RMS current occurs when duty cycle is 0.5. If the converter does not operate at 50% duty cycle, then the worst case capacitor RMS current ICIN occurs where the duty cycle is closest to 50% and can be estimated by the following equation: ICIN ICHG D 1 D (3) Low ESR ceramic capacitor such as X7R or X5R is preferred for input decoupling capacitor and should be placed as close as possible to PMID and GND pins. Voltage rating of the capacitor must be higher than normal input voltage level. 25-V rating or higher capacitor is preferred for 12-V input voltage. 10-μF capacitance is suggested for up-to 6-A charging current. 8.2.2.4 Flying Capacitor Flying capacitor selection must meet criteria related to current ripple and voltage ripple. Just as the input capacitor, the flying capacitor should also have enough ripple current rating to absorb the RMS current through it: ICFLY 2 0.5 § D 0.5 ¨ I2CHG ¨ © I2RIPPLE · ¸ 12 ¸¹ (4) This function becomes maximum when D = 0.5, because at that point the capacitor is in series with the inductor for a complete switching cycle, and their RMS currents are the same. The flying capacitor should be sized to handle the full charge current in the scenario where D = 0.5. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 45 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com Figure 47. Flying Capacitor RMS Current vs. VBUS with Fixed VBAT and ICHG Additionally, the flying capacitor voltage ripple should be kept under 10% of VBUS/2 to ensure loop stability. This quantity is given by the following equation: 'VCFLY ICHG 0.5 D 0.5 CFLY fSW (5) It is recommended to use at least two 16-V, 10-μF, low ESR ceramic capacitors in parallel to achieve both RMS current rating and maintain voltage ripple <10% in the flying capacitor for up-to 6-A charge current application. The following curve shows what the ripple voltage of CFLY might look like for such a configuration by taking into account voltage derating of the capacitor and plugging the effective capacitance value into equation above at different charge currents and VBUS voltages. Figure 48. Flying Capacitor Ripple Voltage vs. VBUS with Fixed VBAT Table 22. Recommended CFLY Values 46 CHARGE CURRENT CFLY CONFIGURATION ICHG < 3.5 A 1 x 0603 (10 μF, X5R, 16 V) ICHG > 3.5 A 2 x 0603 (10 μF, X5R, 16 V) Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 8.2.2.5 Output Capacitor Output capacitor also should have enough ripple current rating to absorb output switching ripple current. The output capacitor RMS current ICOUT is given: I ICOUT RIPPLE | 0.29 u IRIPPLE 2 3 (6) The output capacitor voltage ripple can be calculated as follows: IRIPPLE 'VSYS 16CO fSW (7) At certain input/output voltage and switching frequency, the voltage ripple can be reduced by increasing the output filter LC. The preferred ceramic capacitor is 20 μF, 6.3 V or higher rating, X7R or X5R. 8.2.3 Application Curves CBUS = 1 µF, CPMID = 10 µF, CBAT = 20 µF, CFLY = 20 µF, L = DFE252012F-R47 (470 nH) (unless otherwise noted) VBUS = 5 V, VBAT = 3.8 V VBUS = 12 V, VBAT = 3.8 V Figure 49. Adapter Power Up with Charge Enabled VBUS = 5 V, VBAT = 3.5 V, ICHG = 3 A Figure 50. HV Adapter Power Up with Charge Enabled VBUS = 12 V, VBAT = 3.5 V, ICHG = 4 A Figure 51. Charge Disable Figure 52. HV Adapter Charge Disable Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 47 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com CBUS = 1 µF, CPMID = 10 µF, CBAT = 20 µF, CFLY = 20 µF, L = DFE252012F-R47 (470 nH) (unless otherwise noted) VBUS = 5 V -> 12 V -> 5 V, VBAT = 4 V, ICHG = 1 A CH 1 = VBUS, CH2 = SW, CH3 = CFLY differential, CH4 = VBAT Figure 53. Line Transient Response in CC Mode VBUS = 12 V, VBAT = 4.35 V, ICHG = 4 A, IBAT = 1 A -> 4 A -> 1A CH 1 = VBUS, CH2 = ILOAD, CH3 = CFLY differential, CH4 = VBAT Figure 54. Load Transient Response in CV Mode VBUS = 5 V, VBAT = 3.8 V, ICHG = 2 A, (D > 50%) VBAT = 4.1 V, VINDPM = 4.3 V Figure 56. PWM Switching Waveform Figure 55. VINDPM Response VBUS = 8 V, VBAT = 3.8 V, ICHG = 2 A, (D approx. 50%) VBUS = 12 V, VBAT = 3.8 V, ICHG = 2 A (D < 50%) Figure 57. PWM Switching Waveform 48 Submit Documentation Feedback Figure 58. PWM Switching Waveform Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 CBUS = 1 µF, CPMID = 10 µF, CBAT = 20 µF, CFLY = 20 µF, L = DFE252012F-R47 (470 nH) (unless otherwise noted) VBUS = 5 V, VBAT = 3.8 V VBUS = 12 V, VBAT = 3.8 V Figure 60. Adapter Removal Figure 59. Adapter Removal Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 49 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 9 Power Supply Recommendations In order to charge single-cell Li-Ion battery, the device requires a power supply between 3.9 V and 14 V with at least 500-mA current rating connected to VBUS. Additionally, a single-cell Li-Ion battery with voltage > VBAT_LOWV should be connected between at the output of the switched inductor, between BATP and BATN terminals. 50 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 10 Layout 10.1 Layout Guidelines The switching node rise and fall times should be minimized for minimum switching loss. Proper layout of the components to minimize high frequency current path loops is important to prevent electrical and magnetic field radiation and high-frequency resonant problems. Here is a PCB layout priority list for proper layout. Layout PCB according to this specific order is essential. 1. Utilize at least four-layer board for optimal layout, and assign one layer as solid ground plane near the IC to minimize high-frequency current path 2. Place flying capacitor as close to CLFY+ and CLFY– bumps as possible. Minimize the copper area of this trace to lower electrical and magnetic field radiation but make the trace wide enough to carry the charging current. Do not use multiple layers in parallel for this connection. 3. Place input capacitor as close as possible to PMID bumps and PGND bumps and use solid GND plane underneath the IC. Use plenty of vias close to PMID capacitor GND terminal and IC PGND bumps to ensure low parasitic connection to GND plane. 4. Place inductor input terminal as close to SW bumps as possible. Minimize the copper area of this trace to lower electrical and magnetic field radiation but make the trace wide enough to carry the charging current. 5. Put output capacitor near to the inductor and the device. Ground connections need to be tied to the device ground with a short copper trace connection or GND plane. 6. Decoupling capacitors should be placed next to the device and make trace connection as short as possible. 7. Ensure that there are sufficient thermal vias directly under bumps of the power FETs, connecting to copper on other layers. 8. The via size and number should be enough for a given current path. 9. Route BATP and BATN away from switching nodes such as SW and CFLY+, CFLY–. Refer to the EVM design and Figure 61 for the recommended component placement with trace and via locations. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 51 bq25910 SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 www.ti.com 10.2 Layout Example 0603 0603 0603 GND SW 1008 0603 PMID VBUS VBUS C+ PMID C+ C- SW C- GND BAT GND VBUS PMID C+ SW C- GND VBUS PMID C+ SW C- GND CDRV+ CDRV+ PMID C+ SW C- GND CDRV- CDRV- SDA INT SW C- GND CAUX REGN BATN BATP IND_ SNS CAUX REGN 0201 0603 SCL 0603 GND GND 0402 0402 GND SCL SDA /INT BATN BATP Figure 61. bq25910 PCB Layout Example 52 Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 bq25910 www.ti.com SLVSDU0A – SEPTEMBER 2017 – REVISED FEBRUARY 2018 11 Device and Documentation Support 11.1 Device Support 11.1.1 Third-Party Products Disclaimer 11.1.1.1 Third-Party Products Disclaimer TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE. 11.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 11.3 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 11.4 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 11.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 11.6 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 12 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Documentation Feedback Copyright © 2017–2018, Texas Instruments Incorporated Product Folder Links: bq25910 53 PACKAGE OPTION ADDENDUM www.ti.com 9-Mar-2018 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) BQ25910YFFR ACTIVE DSBGA YFF 36 3000 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 BQ25910 BQ25910YFFT ACTIVE DSBGA YFF 36 250 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 BQ25910 PQ25910YFFT ACTIVE DSBGA YFF 36 250 TBD Call TI Call TI -40 to 85 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 9-Mar-2018 In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 PACKAGE OUTLINE YFF0036 DSBGA - 0.625 mm max height SCALE 4.500 DIE SIZE BALL GRID ARRAY B E A BUMP A1 CORNER D C 0.625 MAX SEATING PLANE BALL TYP 0.30 0.12 0.05 C 2 TYP SYMM F D: Max = 2.472 mm, Min =2.412 mm E D 2 TYP C B 36X A 0.4 TYP E: Max = 2.444 mm, Min =2.384 mm SYMM 1 2 3 4 5 6 0.3 0.2 0.015 C A B 0.4 TYP 4222008/A 03/2015 NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. www.ti.com EXAMPLE BOARD LAYOUT YFF0036 DSBGA - 0.625 mm max height DIE SIZE BALL GRID ARRAY (0.4) TYP 36X ( 0.23) 1 2 3 4 5 6 A (0.4) TYP B C SYMM D E F SYMM LAND PATTERN EXAMPLE SCALE:25X ( 0.23) METAL 0.05 MAX 0.05 MIN ( 0.23) SOLDER MASK OPENING SOLDER MASK OPENING METAL UNDER SOLDER MASK NON-SOLDER MASK DEFINED (PREFERRED) SOLDER MASK DEFINED SOLDER MASK DETAILS NOT TO SCALE 4222008/A 03/2015 NOTES: (continued) 3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints. For more information, see Texas Instruments literature number SNVA009 (www.ti.com/lit/snva009). www.ti.com EXAMPLE STENCIL DESIGN YFF0036 DSBGA - 0.625 mm max height DIE SIZE BALL GRID ARRAY (0.4) TYP (R0.05) TYP 36X ( 0.25) 1 2 4 3 5 6 A (0.4) TYP METAL TYP B C SYMM D E F SYMM SOLDER PASTE EXAMPLE BASED ON 0.1 mm THICK STENCIL SCALE:30X 4222008/A 03/2015 NOTES: (continued) 4. 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