To all our customers Regarding the change of names mentioned in the document, such as Hitachi Electric and Hitachi XX, to Renesas Technology Corp. The semiconductor operations of Mitsubishi Electric and Hitachi were transferred to Renesas Technology Corporation on April 1st 2003. These operations include microcomputer, logic, analog and discrete devices, and memory chips other than DRAMs (flash memory, SRAMs etc.) Accordingly, although Hitachi, Hitachi, Ltd., Hitachi Semiconductors, and other Hitachi brand names are mentioned in the document, these names have in fact all been changed to Renesas Technology Corp. Thank you for your understanding. Except for our corporate trademark, logo and corporate statement, no changes whatsoever have been made to the contents of the document, and these changes do not constitute any alteration to the contents of the document itself. Renesas Technology Home Page: http://www.renesas.com Renesas Technology Corp. Customer Support Dept. April 1, 2003 Cautions Keep safety first in your circuit designs! 1. Renesas Technology Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corporation product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corporation or a third party. 2. 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Please contact Renesas Technology Corporation or an authorized Renesas Technology Corporation product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. 6. The prior written approval of Renesas Technology Corporation is necessary to reprint or reproduce in whole or in part these materials. 7. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. 8. Please contact Renesas Technology Corporation for further details on these materials or the products contained therein. HAT2142H Silicon N Channel Power MOS FET Power Switching ADE-208-1583E (Z) 6th. Edition Sep. 2002 Features • Capable of 7 V gate drive • Low drive current • High density mounting • Low on-resistance RDS(on) = 35 mΩ typ. (at VGS = 10 V) Outline LFPAK 5 5 D 4 G 3 1 2 4 1, 2, 3 Source 4 Gate 5 Drain S S S 1 2 3 HAT2142H Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 100 V Gate to source voltage VGSS ± 20 V Drain current ID 10 A 40 A Drain peak current ID(pulse) Body-drain diode reverse drain current IDR Avalanche current IAP Avalanche energy EAR Note1 10 A 10 A Note 3 10 mJ Note2 15 W Note 3 Channel dissipation Pch Channel temperature Tch 150 °C Storage temperature Tstg – 55 to + 150 °C Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Tc = 25°C 3. Value at Tch = 25°C, Rg ≥ 50 Ω Rev.5, Sep. 2002, page 2 of 2 HAT2142H Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS 100 — — V ID = 10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ± 20 — — V IG = ±100 µA, VDS = 0 Gate to source leak current IGSS — — ± 10 µA VGS = ±16 V, VDS = 0 Zero gate voltage drain current IDSS — — 1 µA VDS = 100 V, VGS = 0 Gate to source cutoff voltage VGS(off) 2.0 — 3.5 V VDS = 10 V, I D = 1 mA Static drain to source on state RDS(on) — 35 44 mΩ ID = 5 A, VGS = 10 V resistance RDS(on) — 38 51 mΩ ID = 5 A, VGS = 7 V Forward transfer admittance |yfs| 9 15 — S ID = 5 A, VDS = 10 V Input capacitance Ciss — 2000 — pF VDS = 10 V Output capacitance Coss — 175 — pF VGS = 0 Reverse transfer capacitance Crss — 90 — pF f = 1 MHz Total gate charge Qg — 32 — nc VDD = 50 V Gate to source charge Qgs — 8.0 — nc VGS = 10 V Gate to drain charge Qgd — 7.5 — nc ID = 10 A Turn-on delay time td(on) — 18 — ns VGS = 10 V, ID = 5 A Rise time tr — 11 — ns VDD ≅ 30 V Turn-off delay time td(off) — 60 — ns RL = 6 Ω Fall time tf — 9 — ns Rg = 4.7 Ω Body–drain diode forward voltage VDF — 0.82 1.07 V IF = 10 A, VGS = 0 — 50 — ns IF = 10 A, VGS = 0 diF/ dt = 100 A/ µs Body–drain diode reverse recovery trr time Note4 Note4 Note4 Note4 Notes: 4. Pulse test Rev.5, Sep. 2002, page 3 of 3 HAT2142H Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area 500 ID (A) 100 30 20 10 0 10 10 Drain Current Channel Dissipation Pch (W) 40 1 50 100 150 200 Tc (°C) 10 V 4.5 V Operation in this area is limited by R DS(on) Op s s 0m s era tio n Typical Transfer Characteristics 10 Pulse Test 8 V DS = 10 V Pulse Test 8 ID (A) 4.0 V 6 3.8 V 4 2 VGS = 3.5 V Drain Current ID (A) DC =1 µs Tc = 25°C 0.01 1 shot Pulse 0.1 0.3 1 3 10 30 100 Drain to Source Voltage VDS (V) Typical Output Characteristics Drain Current PW 0µ 0.1 Case Temperature 10 1m 10 6 4 2 25°C Tc = 75°C -25°C 0 2 4 6 Drain to Source Voltage Rev.5, Sep. 2002, page 4 of 4 8 VDS (V) 10 0 1 2 3 Gate to Source Voltage 4 VGS (V) 5 400 300 200 ID = 5 A 100 2A 1A 0 Static Drain to Source on State Resistance R DS(on) (m Ω) Pulse Test 4 8 12 Gate to Source Voltage 16 20 V GS (V) Static Drain to Source on State Resistance vs. Temperature 100 Pulse Test 5A I D = 1 A, 2 A 80 60 40 20 0 -25 V GS = 7 V Static Drain to Source on State Resistance vs. Drain Current 100 Pulse Test Drain to Source On State Resistance R DS(on) (m Ω) Drain to Source Saturation Voltage vs. Gate to Source Voltage 1 A, 2 A, 5 A 10 V 0 25 50 75 100 125 150 Case Temperature Tc (°C) 50 VGS = 7 V 10 V 20 10 0.1 0.3 1 3 Drain Current 10 30 I D (A) 100 Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) Drain to Source Voltage V DS(on) (mV) HAT2142H 100 Tc = -25°C 30 10 75°C 25°C 3 1 0.3 0.1 0.1 V DS = 10 V Pulse Test 0.3 1 3 10 30 100 Drain Current I D (A) Rev.5, Sep. 2002, page 5 of 5 HAT2142H Body-Drain Diode Reverse Recovery Time Typical Capacitance vs. Drain to Source Voltage 10000 Capacitance C (pF) Reverse Recovery Time trr (ns) 100 50 20 3000 Ciss 1000 300 Coss 100 Crss 10 0.1 di / dt = 100 A / µs V GS = 0, Ta = 25°C 30 VGS = 0 f = 1 MHz 10 0.3 1 3 10 30 100 Reverse Drain Current I DR (A) 0 V GS VDD = 100 V 50 V 25 V 16 12 V DS 100 50 0 8 VDD = 100 V 50 V 25 V 8 16 24 32 Gate Charge Qg (nc) Rev.5, Sep. 2002, page 6 of 6 4 0 40 20 30 40 50 Switching Characteristics V GS = 10 V, V DS = 30 V PW = 5 µs Switching Time t (ns) 200 V GS (V) I D = 10 A 150 500 20 Gate to Source Voltage Drain to Source Voltage V DS (V) Dynamic Input Characteristics 250 10 Drain to Source Voltage V DS (V) 200 100 t d(off) 50 20 10 t d(on) tr tf 5 0.1 0.2 0.5 1 2 5 10 20 50 100 Drain Current I D (A) HAT2142H 8 Repetitive Avalanche Energy E AR(mJ) (A) 10 Reverse Drain Current I F Maximum Avalanche Energy vs. Channel Temperature Derating Reverse Drain Current vs. Source to Drain Voltage 10 V V GS = 0 5V 6 4 2 Pulse Test 0 0.4 0.8 1.2 Source to Drain Voltage 1.6 2.0 5 I AP = 10A V DD = 50 V duty < 0.1 % Rg > 50 Ω 4 3 2 1 0 25 V SDF (V) 50 75 100 125 150 Channel Temperature Tch (˚C) Avalanche Test Circuit V DS Monitor Avalanche Waveform EAR = L 1 2 I AP Monitor L • IAP2 • VDSS VDSS - V DD V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin 15 V 50Ω 0 VDD Rev.5, Sep. 2002, page 7 of 7 HAT2142H Normalized Transient Thermal Impedance γs (t) Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θch - c(t) = γs (t) • θch - c θch - c = 8.33°C/ W, Tc = 25°C 0.1 0.05 0.03 PDM 0.02 1 0.0 0.01 10 µ D= e uls PW T PW p ot T sh 1 100 µ 1m 100 m 10 m 1 10 Pulse Width PW (s) Switching Time Test Circuit Switching Time Waveform Vout Monitor Vin Monitor Rg 90% D.U.T. RL Vin Vin 10 V V DS = 30 V Vout 10% 10% 90% td(on) Rev.5, Sep. 2002, page 8 of 8 tr 10% 90% td(off) tf HAT2142H Package Dimensions As of January, 2002 Unit: mm 4.9 5.3 Max 4.0 ± 0.2 +0.05 1.0 4.2 6.1 –0.3 +0.1 3.95 5 4 0˚ – 8˚ +0.25 +0.05 0.20 –0.03 0.6 –0.20 1.3 Max 1 1.1 Max +0.03 0.07 –0.04 3.3 0.25 –0.03 0.75 Max 1.27 0.10 0.40 ± 0.06 0.25 M Hitachi Code JEDEC JEITA Mass (reference value) LFPAK — — 0.080 g Rev.5, Sep. 2002, page 9 of 9 HAT2142H Disclaimer 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Sales Offices Hitachi, Ltd. Semiconductor & Integrated Circuits Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: (03) 3270-2111 Fax: (03) 3270-5109 URL http://www.hitachisemiconductor.com/ For further information write to: Hitachi Semiconductor (America) Inc. 179 East Tasman Drive San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Hitachi Europe Ltd. Electronic Components Group Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322 Hitachi Asia Ltd. Hitachi Tower 16 Collyer Quay #20-00 Singapore 049318 Tel : <65>-6538-6533/6538-8577 Fax : <65>-6538-6933/6538-3877 URL : http://semiconductor.hitachi.com.sg Hitachi Europe GmbH Electronic Components Group Dornacher Str 3 D-85622 Feldkirchen Postfach 201, D-85619 Feldkirchen Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Asia Ltd. (Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road Hung-Kuo Building Taipei (105), Taiwan Tel : <886>-(2)-2718-3666 Fax : <886>-(2)-2718-8180 Telex : 23222 HAS-TP URL : http://semiconductor.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel : <852>-2735-9218 Fax : <852>-2730-0281 URL : http://semiconductor.hitachi.com.hk Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan. Colophon 7.0 Rev.5, Sep. 2002, page 10 of 10