ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 ADC122S655 Dual 12-Bit, 200 kSPS to 500 kSPS, Simultaneous Sampling A/D Converter Check for Samples: ADC122S655 FEATURES DESCRIPTION • The ADC122S655 is a dual 12-bit, 200 kSPS to 500 kSPS simultaneous sampling Analog-to-Digital (A/D) converter. The analog inputs on both channels are sampled simultaneously to preserve their relative phase information to each other. The converter is based on a successive-approximation register architecture where the differential nature of the analog inputs is maintained from the internal trackand-hold circuits throughout the A/D converter to provide excellent common-mode signal rejection. The ADC122S655 features an external reference that can be varied from 1.0V to VA. 1 23 • • • • • • True Simultaneous Sampling Differential Inputs Specified Performance from 200 kSPS to 500 kSPS External Reference Wide Input Common-Mode Voltage Range Single High-Speed Serial Data Output Operating Temperature Range of −40°C to +105°C SPI™/ QSPI™/MICROWIRE/DSP Compatible Serial Interface APPLICATIONS • • • • • • • Motor Control Power Meters/Monitors Multi-Axis Positioning Systems Instrumentation and Control Systems Data Acquisition Systems Medical Instruments Direct Sensor Interface KEY SPECIFICATIONS • • • • • • • Conversion Rate: 200 kSPS to 500 kSPS INL: ±1 LSB (max) DNL: ±0.95 LSB (max) SNR: 71 dBc (min) THD: -72 dBc (min) ENOB: 11.25 bits (min) Power Consumption at 500 kSPS – Converting, VA = 5V, VREF = 2.5V: 11 mW (typ) – Power-Down, VA = 5V, VREF = 2.5V: 3 µW (typ) The ADC122S655's serial data output is binary 2's complement and is compatible with several standards, such as SPI, QSPI, MICROWIRE, and many common DSP serial interfaces. The serial clock (SCLK) and chip select bar (CS) are shared by both channels. Operating from a single 5V analog supply and a reference voltage of 2.5V, the total power consumption while operating at 500 kSPS is typically 11 mW. With the ADC122S655 operating in powerdown mode, the power consumption reduces to 3 µW. The differential input, low power consumption, and small size make the ADC122S655 ideal for direct connection to sensors in motor control applications. Operation is specified over the industrial temperature range of −40°C to +105°C and clock rates of 6.4 MHz to 16 MHz. The ADC122S655 is available in a 10lead VSSOP package. Connection Diagram VREF 1 10 CHA+ 2 9 SCLK CHA - 3 ADC122S655 8 DOUT CHB - 4 7 VA CHB+ 5 6 GND CS 1 2 3 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SPI, QSPI are trademarks of Motorola, Incorporated. All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2008–2013, Texas Instruments Incorporated ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com Block Diagram SAR CHA+ S/H CHA- CHARGE REDISTRIBUTION DAC COMPARATOR SERIAL INTERFACE SAR VREF CHBS/H CHB+ CHARGE REDISTRIBUTION DAC COMPARATOR PIN DESCRIPTIONS AND EQUIVALENT CIRCUITS Pin No. 2 Symbol Description 1 VREF Voltage Reference Input. A voltage reference between 1V and VA must be applied to this input. VREF must be decoupled to GND with a minimum ceramic capacitor value of 0.1 µF. A bulk capacitor value of 1.0 µF to 10 µF in parallel with the 0.1 µF is recommended for enhanced performance. 2 CHA+ Non-Inverting Input for Channel A. CHA+ is the positive analog input for the differential signal applied to Channel A. 3 CHA− Inverting Input for Channel A. CHA− is the negative analog input for the differential signal applied to Channel A. 4 CHB− Inverting Input for Channel B. CHB− is the negative analog input for the differential signal applied to Channel B. 5 CHB+ Non-Inverting Input for Channel B. CHB+ is the positive analog input for the differential signal applied to Channel B. 6 GND Ground. GND is the ground reference point for all signals applied to the ADC122S655. 7 VA Analog Power Supply input. A voltage source between 4.5V and 5.5V must be applied to this input. VA must be decoupled to GND with a minimum ceramic capacitor value of 0.1 µF. A bulk capacitor value of 1.0 µF to 10 µF in parallel with the 0.1 µF is recommended for enhanced performance. 8 DOUT Serial Data Output for Channel A and Channel B. The serial data output word is comprised of 4 null bits, 12 data bits (ChA conversion result), 4 null bits, and 12 data bits (ChB conversion result). During a conversion, the data is output on the falling edges of SCLK and is valid on the rising edges. 9 SCLK Serial Clock. SCLK is used to control data transfer and serves as the conversion clock. 10 CS Chip Select Bar. CS is active low. The ADC122S655 is actively converting when CS is LOW and Power-Down Mode when CS is HIGH. A conversion begins on the fall of CS. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) (2) (3) −0.3V to 6.5V Analog Supply Voltage VA Voltage on Any Pin to GND −0.3V to (VA +0.3V) (4) ±10 mA Input Current at Any Pin Package Input Current (4) ±50 mA (5) Power Consumption at TA = 25°C See ESD Susceptibility (6) Human Body Model Machine Model Charge Device Model 2500V 250V 1000V Junction Temperature +150°C Storage Temperature −65°C to +150°C (1) (2) (3) (4) (5) (6) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Operation of the device beyond the maximum Operating Ratings is not recommended. All voltages are measured with respect to GND = 0V, unless otherwise specified. If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and specifications. When the input voltage at any pin exceeds the power supplies (that is, VIN < GND or VIN > VA), the current at that pin should be limited to 10 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 10 mA to five. The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula PDMAX = (TJmax − TA)/θJA. The values for maximum power dissipation listed above will be reached only when the ADC122S655 is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is reversed). Such conditions should always be avoided. Human body model is a 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is a 220 pF capacitor discharged through 0 Ω. Charge device model simulates a pin slowly acquiring charge (such as from a device sliding down the feeder in an automated assembler) then rapidly being discharged. Operating Ratings (1) (2) −40°C ≤ TA ≤ +105°C Operating Temperature Range Supply Voltage, VA +4.5V to +5.5V Reference Voltage, VREF 1.0V to VA Input Common-Mode Voltage, VCM See Figure 36 Digital Input Pins Voltage Range 0 to VA Clock Frequency 6.4 MHz to 16 MHz −VREF to +VREF Differential Analog Input Voltage (1) (2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Operation of the device beyond the maximum Operating Ratings is not recommended. All voltages are measured with respect to GND = 0V, unless otherwise specified. Package Thermal Resistance Package θJA 10-lead VSSOP 240°C / W Soldering process must comply with TI's Reflow Temperature Profile specifications. Refer to http://www.ti.com/packaging (1) (1) Reflow temperature profiles are different for lead-free packages. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 3 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com ADC122S655 Converter Electrical Characteristics (1) The following specifications apply for VA = +4.5V to 5.5V, VREF = 2.5V, fSCLK = 6.4 to 16 MHz, fIN = 100 kHz, CL = 25 pF, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX; all other limits are at TA = 25°C. Symbol Parameter Conditions Typical Limits Units STATIC CONVERTER CHARACTERISTICS Resolution with No Missing Codes INL DNL OE GE Integral Non-Linearity ±0.5 Integral Non-Linearity Matching 0.02 Differential Non-Linearity ±0.4 Differential Non-Linearity Matching 0.02 Offset Error 0.2 Offset Error Matching 0.1 Positive Gain Error −2 Positive Gain Error Matching 0.2 Negative Gain Error Bits ±1 LSB (max) ±0.95 LSB (max) ±3 LSB (max) LSB LSB LSB ±5 LSB (max) ±8 LSB (max) LSB 3 Negative Gain Error Matching 12 0.2 LSB DYNAMIC CONVERTER CHARACTERISTICS SINAD Signal-to-Noise Plus Distortion Ratio fIN = 100 kHz, −0.1 dBFS 72.5 69.5 dBc (min) SNR Signal-to-Noise Ratio fIN = 100 kHz, −0.1 dBFS 73.2 71 dBc (min) THD Total Harmonic Distortion fIN = 100 kHz, −0.1 dBFS −83 −72 dBc (max) SFDR Spurious-Free Dynamic Range fIN = 100 kHz, −0.1 dBFS 84 72 dBc (min) ENOB Effective Number of Bits fIN = 100 kHz, −0.1 dBFS 11.8 11.25 bits (min) FPBW −3 dB Full Power Bandwidth Output at 70.7%FS with Differential Input FS Input Single-Ended Input 26 MHz 22 MHz ISOL Channel-to-Channel Isolation fIN < 1 MHz −90 dBc ANALOG INPUT CHARACTERISTICS VIN Differential Input Range IDCL DC Leakage Current CINA Input Capacitance CMRR Common Mode Rejection Ratio VREF Reference Voltage Range VIN = VREF or VIN = -VREF −VREF V (min) +VREF V (max) ±1 µA (max) In Track Mode 20 pF In Hold Mode 3 pF −90 dB See the Specification Definitions for the test condition 1.0 V (min) VA V (max) DIGITAL INPUT CHARACTERISTICS VIH Input High Voltage 2.4 V (min) VIL Input Low Voltage 0.8 V (max) IIN Input Current ±1 µA (max) CIND Input Capacitance 2 4 pF (max) ISOURCE = 200 µA VA − 0.02 VA − 0.2 V (min) ISOURCE = 1 mA VA − 0.09 ISINK = 200 µA 0.01 0.4 V (max) ISINK = 1 mA 0.08 VIN = 0V or VA DIGITAL OUTPUT CHARACTERISTICS VOH Output High Voltage VOL Output Low Voltage IOZH, IOZL TRI-STATE Leakage Current Force 0V or VA COUT Force 0V or VA TRI-STATE Output Capacitance Output Coding (1) 4 2 V V ±1 µA (max) 4 pF (max) Binary 2'S Complement Tested limits are specified to TI's AOQL (Average Outgoing Quality Level). Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 ADC122S655 Converter Electrical Characteristics (1) (continued) The following specifications apply for VA = +4.5V to 5.5V, VREF = 2.5V, fSCLK = 6.4 to 16 MHz, fIN = 100 kHz, CL = 25 pF, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX; all other limits are at TA = 25°C. Symbol Parameter Conditions Typical Limits Units POWER SUPPLY CHARACTERISTICS 4.5 V (min) 5.5 V (max) 2.2 2.75 mA (max) 50 60 µA (max) VA Analog Supply Voltage IVA (Conv) Analog Supply Current, Continuously Converting fSCLK = 16 MHz, fS = 500 kSPS, fIN = 20 kHz, VA = 5V IVREF (Conv) Reference Current, Continuously Converting fSCLK = 16 MHz, fS = 500 kSPS, VREF = 2.5V IVA (PD) Analog Supply Current, Power Down fSCLK = 16 MHz, VA = 5.0V Mode (CS high) fSCLK = 0, VA = 5.0V (2) IVREF (PD) Reference Current, Power Down Mode (CS high) fSCLK = 16 MHz, VREF = 2.5V PWR (Conv) Power Consumption, Continuously Converting fSCLK = 16 MHz, fS = 500 kSPS, fIN = 20 kHz, VA = 5.0V, VREF = 2.5V PWR (PD) Power Consumption, Power Down Mode (CS high) fSCLK = 16 MHz, VA = 5.0V, VREF = 2.5V 75 fSCLK = 0, VA = 5.0V, VREF = 2.5V 2.6 PSRR Power Supply Rejection Ratio See the Specification Definitions for the test condition −85 fSCLK = 0, VREF = 2.5V (2) 15 0.5 µA 1.1 µA (max) 0.05 0.1 µA (max) 11.1 13.9 mW (max) 5.8 µW (max) 0.05 µA µW dB AC ELECTRICAL CHARACTERISTICS fSCLK Maximum Clock Frequency fSCLK Minimum Clock Frequency 1.6 6.4 MHz (max) Maximum Sample Rate (3) 625 500 kSPS (min) Minimum Sample Rate 50 200 kSPS (min) fS 20 16 MHz (min) tACQ Track/Hold Acquisition Time 3 SCLK cycles tCONV Conversion Time 12 SCLK cycles tAD Aperture Delay (2) (3) 6 ns Specified by design, characterization, or statistical analysis and is not tested at final test. While the maximum sample rate is fSCLK/32, the actual sample rate may be lower than this by having the CS rate slower than fSCLK/32. ADC122S655 Timing Specifications (1) The following specifications apply for VA = +4.5V to 5.5V, VREF = 2.5V, fSCLK = 6.4 MHz to 16 MHz, CL = 25 pF, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C. Symbol tCSSU (1) (2) Parameter Conditions CS Setup Time prior to an SCLK rising edge Typical Limits Units 4 7 ns (min) 1/ fSCLK 1/ fSCLK - 3 ns (max) tEN DOUT Enable Time after the falling edge of CS 9 20 ns (max) tDH DOUT Hold time after an SCLK Falling edge 9 6 ns (min) tDA DOUT Access time after an SCLK Falling edge 20 26 ns (max) tDIS DOUT Disable Time after the rising edge of CS (2) 10 20 ns (max) tCH SCLK High Time 25 ns (min) tCL SCLK Low Time 25 ns (min) tr DOUT Rise Time 7 ns tf DOUT Fall Time 7 ns Tested limits are specified to TI's AOQL (Average Outgoing Quality Level). tDIS is the time for DOUT to change 10%. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 5 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com Timing Diagrams tACQ tCONV CS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 SCLK DOUT DB11 DB10 DB9 4 Leading Zeroes DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 Channel A Data tPower Down CS 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 SCLK DOUT DB11 DB10 DB9 4 Leading Zeroes DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 Channel B Data Figure 1. ADC122S655 Single Conversion Timing Diagram tACQ tPD tCONV tCONV tACQ CS 1 2 3 4 5 6 15 16 17 18 19 20 21 22 31 32 33 34 35 36 37 38 47 48 SCLK DOUT DB11 DB10 DB1 DB0 DB11 DB10 LSB MSB DB1 DB0 DB11 DB10 LSB MSB DB1 DB0 HI-Z MSB Channel A Data Channel B Data LSB Channel A Data Figure 2. ADC122S655 Continuous Conversion Timing Diagram 2.4V DOUT 0.8V tf tr Figure 3. DOUT Rise and Fall Times SCLK VIL tDA 2.4V DOUT 0.8V tDH Figure 4. DOUT Hold and Access Times 6 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 SCLK 1 2 tCSSU CS Figure 5. Valid CS Assertion Times CS VIH 90% 90% DOUT 10% tDIS 90% DOUT 10% 10% Figure 6. Voltage Waveform for tDIS Specification Definitions APERTURE DELAY is the time between the fourth falling edge of SCLK and the time when the input signal is acquired or held for conversion. COMMON MODE REJECTION RATIO (CMRR) is a measure of how well in-phase signals common to both input pins are rejected. To calculate CMRR, the change in output offset is measured while the common mode input voltage is changed from 2V to 3V. CMRR = 20 LOG ( Δ Output Offset / Δ Common Input) (1) CONVERSION TIME is the time required, after the input voltage is acquired, for the ADC to convert the input voltage to a digital word. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. DUTY CYCLE is the ratio of the time that a repetitive digital waveform is high to the total time of one period. The specification here refers to the SCLK. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion or SINAD. ENOB is defined as (SINAD − 1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits. FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental drops 3 dB below its low frequency value for a full scale input. INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from negative full scale (½ LSB below the first code transition) through positive full scale (½ LSB above the last code transition). The deviation of any given code from this straight line is measured from the center of that code value. MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC122S655 is specified not to have any missing codes. NEGATIVE FULL-SCALE ERROR is the difference between the differential input voltage at which the output code transitions from negative full scale to the next code and −VREF + 0.5 LSB. NEGATIVE GAIN ERROR is the difference between the negative full-scale error and the offset error. OFFSET ERROR is the difference between the differential input voltage at which the output code transitions from code 000h to 001h and 1/2 LSB. POSITIVE FULL-SCALE ERROR is the difference between the differential input voltage at which the output code transitions to positive full scale and VREF minus 1.5 LSB. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 7 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com POSITIVE GAIN ERROR is the difference between the positive full-scale error and the offset error. POWER SUPPLY REJECTION RATIO (PSRR) is a measure of how well a change in supply voltage is rejected. PSRR is calculated from the ratio of the change in offset error for a given change in supply voltage, expressed in dB. For the ADC122S655, VA is changed from 4.5V to 5.5V. PSRR = 20 LOG (ΔOffset / ΔVA) (2) SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms value of the sum of all other spectral components below one-half the sampling frequency, not including harmonics or d.c. SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of the input signal to the rms value of all of the other spectral components below half the clock frequency, including harmonics but excluding d.c. SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the desired signal amplitude to the amplitude of the peak spurious spectral component, where a spurious spectral component is any signal present in the output spectrum that is not present at the input and may or may not be a harmonic. TOTAL HARMONIC DISTORTION (THD) is the ratio of the rms total of the first five harmonic components at the output to the rms level of the input signal frequency as seen at the output, expressed in dB. THD is calculated as THD = 20 ‡ log10 A f 22 + + A f 62 A f 12 (3) where Af1 is the RMS power of the input frequency at the output and Af2 through Af6 are the RMS power in the first 5 harmonic frequencies. THROUGHPUT TIME is the minimum time required between the start of two successive conversion. 8 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 Typical Performance Characteristics VA = 5.0V, VREF = 2.5V, TA = +25°C, fSAMPLE = 500 kSPS, fSCLK = 16 MHz, fIN = 100 kHz unless otherwise stated. DNL - 500 kSPS INL - 500 kSPS Figure 7. Figure 8. DNL vs. VA INL vs. VA Figure 9. Figure 10. DNL vs. VREF INL vs. VREF Figure 11. Figure 12. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 9 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com Typical Performance Characteristics (continued) VA = 5.0V, VREF = 2.5V, TA = +25°C, fSAMPLE = 500 kSPS, fSCLK = 16 MHz, fIN = 100 kHz unless otherwise stated. 10 DNL vs. SCLK FREQUENCY INL vs. SCLK FREQUENCY Figure 13. Figure 14. DNL vs. TEMPERATURE INL vs. TEMPERATURE Figure 15. Figure 16. SINAD vs. VA THD vs. VA Figure 17. Figure 18. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 Typical Performance Characteristics (continued) VA = 5.0V, VREF = 2.5V, TA = +25°C, fSAMPLE = 500 kSPS, fSCLK = 16 MHz, fIN = 100 kHz unless otherwise stated. SINAD vs. VREF THD vs. VREF Figure 19. Figure 20. SINAD vs. SCLK FREQUENCY THD vs. SCLK FREQUENCY Figure 21. Figure 22. SINAD vs. INPUT FREQUENCY THD vs. INPUT FREQUENCY Figure 23. Figure 24. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 11 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com Typical Performance Characteristics (continued) VA = 5.0V, VREF = 2.5V, TA = +25°C, fSAMPLE = 500 kSPS, fSCLK = 16 MHz, fIN = 100 kHz unless otherwise stated. 12 SINAD vs. TEMPERATURE THD vs. TEMPERATURE Figure 25. Figure 26. VA CURRENT vs. VA VA CURRENT vs. SCLK FREQ Figure 27. Figure 28. VA CURRENT vs. TEMPERATURE VREF CURRENT vs. SCLK FREQ Figure 29. Figure 30. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 Typical Performance Characteristics (continued) VA = 5.0V, VREF = 2.5V, TA = +25°C, fSAMPLE = 500 kSPS, fSCLK = 16 MHz, fIN = 100 kHz unless otherwise stated. VREF CURRENT vs. TEMP CMRR vs. CM RIPPLE FREQ Figure 31. Figure 32. SPECTRAL RESPONSE - 500 kSPS Figure 33. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 13 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com FUNCTIONAL DESCRIPTION The ADC122S655 is a dual 12-bit, simultaneous sampling Analog-to-Digital (A/D) converter. The converter is based on a successive-approximation register (SAR) architecture where the differential nature of the analog inputs is maintained from the internal track-and-hold circuits throughout the A/D converter. The analog inputs on both channels are sampled simultaneously to preserve their relative phase information to each other. The architecture and process allow the ADC122S655 to acquire and convert dual analog signals at sample rates up to 500 kSPS while consuming very little power. The ADC122S655 requires an external reference, external clock, and an analog power supply. The analog supply (VA) can range from 4.5V to 5.5V and the external reference can be any voltage between 1V and VA. The value of the reference voltage determines the range of the analog input, while the reference input current depends upon the conversion rate. Analog inputs are presented at the inputs of Channel A and Channel B. Upon initiation of a conversion, the differential input at these pins is sampled on the internal capacitor array. The analog input signals are disconnected from the external circuitry while a conversion is in progress. The external clock can take on values as indicated in the Electrical Characteristics Table. The duty cycle of the clock is essentially unimportant, provided the minimum clock high and low times are met. The minimum clock frequency is set by internal capacitor leakage. Each conversion requires thiry-two clock cycles to complete. The ADC122S655 offers a high-speed serial data output that is binary 2's complement and compatible with several standards, such as SPI, QSPI, MICROWIRE, and many common DSP serial interfaces. The digital conversion result of Channel A and Channel B is clocked out on the falling edges of the SCLK input and is provided serially at DOUT, most significant bit first. The result of Channel A is output before the result of Channel B, with four zeros in between the two results. The digital data provided on DOUT is that of the conversion currently in progress. With CS held low after the result of Channel B is output, the ADC122S655 will continuously convert the analog inputs until CS is de-asserted (brought high). Having a single, serial DOUT makes the ADC122S655 an excellent replacement for two independent ADCs that are part of a daisy chain configuration and allows a system designer to save valuable board space and power. REFERENCE INPUT The externally supplied reference voltage sets the analog input range. The ADC122S655 will operate with a reference voltage in the range of 1V to VA. Operation with a reference voltage below 1V is also possible with slightly diminished performance. As the reference voltage (VREF) is reduced, the range of acceptable analog input voltages is reduced. Assuming a proper common-mode input voltage, the differential peak-to-peak input range is limited to twice VREF. See Input Common Mode Voltage for more details. Reducing the value of VREF also reduces the size of the least significant bit (LSB). The size of one LSB is equal to twice the reference voltage divided by 4096. When the LSB size goes below the noise floor of the ADC122S655, the noise will span an increasing number of codes and overall performance will suffer. For example, dynamic signals will have their SNR degrade, while D.C. measurements will have their code uncertainty increase. Since the noise is Gaussian in nature, the effects of this noise can be reduced by averaging the results of a number of consecutive conversions. Additionally, since offset and gain errors are specified in LSB, any offset and/or gain errors inherent in the A/D converter will increase in terms of LSB size as the reference voltage is reduced. The reference input and the analog inputs are connected to the capacitor array through a switch matrix when the input is sampled. Hence, the current requirements at the reference and at the analog inputs are a series of transient spikes that occur at a frequency dependent on the operating sample rate of the ADC122S655. The reference current changes only slightly with temperature. See the curves, Reference Current vs. SCLK Frequency and Reference Current vs. Temperature in the Typical Performance Characteristics section for additional details. 14 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 ANALOG SIGNAL INPUTS The ADC122S655 has dual differential inputs where the effective input voltage that is digitized is CHA+ minus CHA− (DIFFINA) and CHB+ minus CHB− (DIFFINB). As is the case with all differential input A/D converters, operation with a fully differential input signal or voltage will provide better performance than with a single-ended input. However, the ADC122S655 can be presented with a single-ended input as shown in Single-Ended Input Operation and APPLICATION CIRCUITS. The current required to recharge the input sampling capacitor will cause voltage spikes at the + and − inputs. Do not try to filter out these noise spikes. Rather, ensure that the noise spikes settle out during the acquisition period (three SCLK cycles after the fall of CS). This is true for both Channel A and Channel B since both channels are converted simultaneously on the fourth falling edge of SCLK after CS is asserted. Differential Input Operation With a fully differential input voltage or signal, a positive full scale output code (0111 1111 1111b or 7FFh) will be obtained when DIFFINA or DIFFINB is greater than or equal to VREF − 1.5 LSB. A negative full scale code (1000 0000 0000b or 800h) will be obtained when DIFFINA or DIFFINB is greater than or equal to −VREF + 0.5 LSB. This ignores gain, offset and linearity errors, which will affect the exact differential input voltage that will determine any given output code. Figure 34 shows the ADC122S655 being driven by a full-scale differential source. VREF 2 VCM V VCM - REF 2 VCM + RS SRC CS + ADC122S655 - RS VREF 2 VCM V VCM - REF 2 VCM + Figure 34. Differential Input Single-Ended Input Operation For single-ended operation, the non-inverting inputs of the ADC122S655 can be driven with a signal that has a maximum to minimum value range that is equal to or less than twice the reference voltage. The inverting inputs should be biased at a stable voltage that is halfway between these maximum and minimum values. In order to utilize the entire dynamic range of the ADC122S655, the reference voltage is limited at VA / 2. This allows the non-inverting inputs the maximum swing range of ground to VA. Figure 35 shows the ADC122S655 being driven by a full-scale single-ended source. Even though the design of the ADC122S655 is optimized for a differential input, there is very little performance degradation while operating the ADC122S655 in single-ended fashion. VCM + VREF VCM VCM - VREF RS SRC CS + ADC122S655 - VCM Figure 35. Single-Ended Input Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 15 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com Input Common Mode Voltage The allowable input common mode voltage (VCM) range depends upon the supply and reference voltages used for the ADC122S655. The ranges of VCM for differential and single-ended operation are depicted in Figure 36 and Figure 37. Equations for calculating the minimum and maximum common mode voltages for differential and single-ended operation are shown in Table 1. 6 COMMON-MODE VOLTAGE (V) Differential Input 5 VA = 5.0V 3.75 2.5 1.25 0 -1 0.0 2.0 2.5 3.0 1.0 4.0 5.0 VREF (V) Figure 36. VCM range for Differential Input operation 6 COMMON-MODE VOLTAGE (V) Single-Ended Input 5 VA = 5.0V 3.75 2.5 1.25 0 -1 0.0 1.25 0.75 1.75 2.5 VREF (V) Figure 37. VCM range for single-ended operation Table 1. Allowable VCM Range Input Signal Differential Single-Ended Minimum VCM Maximum VCM VREF / 2 VA − VREF / 2 VREF VA − VREF SERIAL DIGITAL INTERFACE The ADC122S655 communicates via a synchronous serial interface as shown in the Timing Diagrams section. CS, chip select, initiates conversions and frames the serial data transfers. SCLK (serial clock) controls both the conversion process and the timing of the serial data. DOUT is the serial data output pin, where the conversion results of Channel A and Channel B are sent as a serial data stream, with the result of Channel A output before the result of Channel B. A serial frame is initiated on the falling edge of CS and ends on the rising edge of CS. The ADC122S655's DOUT is in a high impedance state when CS is high (asserted) and is active when CS is low (de-asserted); thus CS acts as an output enable. A timing diagram for a single conversion is shown in Figure 1. 16 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 During the first three cycles of SCLK, the ADC122S655 is in acquisition mode (tACQ), tracking the input voltage on both Channel A and Channel B. For the next twelve SCLK cycles (tCONV), the conversion of Channel A and Channel B is accomplished simultaneously and data is presented on DOUT, one bit at a time. SCLK falling edges one through four clock out leading zeros while falling edges five through sixteen clock out the conversion result of Channel A, MSB first. The process is repeated in order to clock out the result of Channel B, with SCLK falling edges seventeen through twenty clocking out four zeros followed by falling edges twenty-one through thirty-two clokcing out the conversion result of Channel B. If there is more than one conversion in a frame (continuous conversion mode), the ADC122S655 will re-enter acquisition mode on the falling edge of SCLK after the N*32 rising edge of SCLK and re-enter conversion mode on the N*32+4 falling edge of SCLK as shown in Figure 2. "N" is an integer value. The ADC122S655 can enter acquisition mode under three different conditions. The first condition involves CS going low (asserted) with SCLK high. In this case, the ADC122S655 enters acquisition mode on the first falling edge of SCLK after CS is asserted. In the second condition, CS goes low with SCLK low. Under this condition, the ADC122S655 automatically enters acquisition mode and the falling edge of CS is seen as the first falling edge of SCLK. In the third condition, CS and SCLK go low simultaneously and the ADC122S655 immediately enters acquisition mode. While there is no timing restriction with respect to the falling edges of CS and the falling edge of SCLK, see Figure 5 for setup and hold time requirements for the falling edge of CS with respect to the rising edge of SCLK. CS Input The CS (chip select bar) is an active low input that is TTL and CMOS compatible. The ADC122S655 transitions from acquisition mode, to conversion mode, to power-down mode when CS is low and is always in power-down mode when CS is high. The falling edge of CS marks the beginning of a conversion where the input to Channel A and Channel B are tracked by the input sampling capacitor. The rising edge of CS marks the end of a conversion window. As a result, CS frames the conversion window and can be used to control the sample rate of the ADC122S655. While the SCLK frequency is limited to a range of 6.4 MHz to 16 MHz, the frequency of CS has no limitation. This allows a system designer to operate the ADC122S655 at sample rates approaching zero samples per second if conserving power is very important. See Burst Mode Operation for more details. Multiple conversions can occur within a given conversion frame with each conversion requiring thirty-two SCLK cycles. This is referred to as continuous conversion mode and is shown in Figure 2 of the Timing Diagrams section. Proper operation requires that the fall of CS not occur simultaneously with a rising edge of SCLK. If the fall of CS occurs during the rising edge of SCLK, the data might be clocked out one bit early. Whether or not the data is clocked out early depends upon how close the CS transition is to the SCLK transition, the device temperature, and characteristics of the individual device. To ensure that the MSB is always clocked out at a given time (the 5th falling edge of SCLK), it is essential that the fall of CS always meet the timing requirement specified in the Timing Specification table. SCLK Input The SCLK (serial clock) serves two purposes in the ADC122S655. It is used by the ADC122S655 as the conversion clock and it is used as the serial clock to output the conversion results. The SCLK input is TTL and CMOS compatible. Internal settling time requirements limit the maximum clock frequency while internal capacitor leakage limits the minimum clock frequency. The ADC122S655 offers specified performance with the clock rates indicated in the Electrical Characteristics Table. Data Output(s) The conversion result of Channel A and Channel B is output on DOUT, with the result of Channel A being output before the result of Channel B. The data output format of the ADC122S655 is binary, two’s complement, as shown in Table 2. This table indicates the ideal output code for a given input voltage and does not include the effects of offset, gain error, linearity errors, or noise. Each data output bit is output on the falling edges of SCLK. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 17 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com Table 2. Ideal Output Code vs. Input Voltage Analog Input (+IN) − (−IN) 2's Complement Binary Output 2's Comp. Hex Code 2's Comp. Dec Code VREF − 1.5 LSB 0111 1111 1111 7FF 2047 + 0.5 LSB 0000 0000 0001 001 1 − 0.5 LSB 0000 0000 0000 000 0 0V − 1.5 LSB 1111 1111 1111 FFF −1 −VREF + 0.5 LSB 1000 0000 0000 800 −2048 While data is output on the falling edges of SCLK, receiving systems have the option of capturing the data from the ADC122S655 on the subsequent rising or falling edge of SCLK. If a receiving system is going to capture data on the subsequent falling edges of SCLK, it is important to make sure that the minimum hold time after an SCLK falling edge (tDH) is acceptable. See Figure 4 for DOUT hold and access times. DOUT is enabled on the falling edge of CS and disabled on the rising edge of CS. If CS is raised prior to the 16th falling edge of SCLK, the current conversion is aborted and DOUT will go into its high impedance state. A new conversion will begin when CS is taken LOW. Applications Information OPERATING CONDITIONS We recommend that the following conditions be observed for operation of the ADC122S655: −40°C ≤ TA ≤ +105°C +4.5V ≤ VA ≤ +5.5V 1V ≤ VREF ≤ VA 6.4 MHz ≤ fSCLK ≤ 16 MHz VCM: See Input Common Mode Voltage POWER CONSUMPTION The architecture, design, and fabrication process allow the ADC122S655 to operate at conversion rates up to 500 kSPS while consuming very little power. The ADC122S655 consumes the least amount of power while operating in power down mode. For applications where power consumption is critical, the ADC122S655 should be operated in power down mode as often as the application will tolerate. To further reduce power consumption, stop the SCLK while CS is high. Burst Mode Operation Normal operation of the ADC122S655 requires the SCLK frequency to be thirty-two times the sample rate and the CS rate to be the same as the sample rate. However, in order to minimize power consumption in applications requiring sample rates below 200 kSPS, the ADC122S655 should be run with an SCLK frequency of 16 MHz and a CS rate as slow as the system requires. When this is accomplished, the ADC122S655 is operating in burst mode. The ADC122S655 enters into power down mode at the end of each conversion, minimizing power consumption. This causes the converter to spend the longest possible time in power down mode. Since power consumption scales directly with conversion rate, minimizing power consumption requires determining the lowest conversion rate that will satisfy the requirements of the system. 18 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 POWER SUPPLY CONSIDERATIONS AND PCB LAYOUT For best performance, care should be taken with the physical layout of the printed circuit board. This is especially true with a low reference voltage or when the conversion rate is high. At high clock rates there is less time for settling, so it is important that any noise settles out before the conversion begins. Analog Power Supply Any ADC architecture is sensitive to spikes on the power supply, reference, and ground pins. These spikes may originate from switching power supplies, digital logic, high power devices, and other sources. Power to the ADC122S655 should be clean and well bypassed. A 0.1 µF ceramic bypass capacitor and a 1 µF to 10 µF capacitor should be used to bypass the ADC122S655 supply, with the 0.1 µF capacitor placed as close to the ADC122S655 package as possible. Since the ADC122S655 has a separate analog and reference pin, the user has two options. The first option is to tie the analog and reference supply pins together and power them with the same power supply. This is the most cost effective way of powering the ADC122S655 but it is also the least ideal. As stated previously, noise from the analog supply pin can couple into the reference supply pin and adversely affect performance. The other option involves the user powering the analog and reference supply pins with separate supply voltages. These supply voltages can have the same amplitude or they can be different. The only design constraint is that the reference supply voltage be less than the analog supply voltage. Voltage Reference The reference source must have a low output impedance and needs to be bypassed with a minimum capacitor value of 0.1 µF. A larger capacitor value of 1 µF to 10 µF placed in parallel with the 0.1 µF is preferred. While the ADC122S655 draws very little current from the reference on average, there are higher instantaneous current spikes at the reference input. The reference input of the ADC122S655, like all A/D converters, does not reject noise or voltage variations. Keep this in mind if the reference voltage is derived from the power supply. Any noise and/or ripple from the supply that is not rejected by the external reference circuitry will appear in the digital results. The use of an active reference source is recommended. The LM4040 and LM4050 shunt reference families and the LM4132 and LM4140 series reference families are excellent choices for a reference source. PCB Layout Capacitive coupling between the noisy digital circuitry and the sensitive analog circuitry can lead to poor performance. The solution is to keep the analog circuitry separated from the digital circuitry and the clock line as short as possible. Digital circuits create substantial supply and ground current transients. The logic noise generated could have significant impact upon system noise performance. To avoid performance degradation of the ADC122S655 due to supply noise, avoid sharing the power supplies for VA and VREF with other digital circuitry on the board. Generally, analog and digital lines should cross each other at 90° to avoid crosstalk. However, to maximize accuracy in high resolution systems, avoid crossing analog and digital lines altogether. It is important to keep clock lines as short as possible and isolated from other lines, including other digital lines. In addition, the clock line should also be treated as a transmission line and be properly terminated. The analog input should be isolated from noisy signal traces to avoid coupling of spurious signals into the input. Any external component (e.g., a filter capacitor) connected between the converter's input pins and ground or to the reference input pin and ground should be connected to a very clean point in the ground plane. A single, uniform ground plane and the use of split power planes are recommended. The power planes should be located within the same board layer. All analog circuitry (input amplifiers, filters, reference components, etc.) should be placed over the analog power plane. All digital circuitry and I/O lines should be placed over the digital power plane. Furthermore, the GND pin on the ADC122S655 and all the components in the reference circuitry and input signal chain that are connected to ground should be connected to the ground plane at a quiet point. Avoid connecting these points too close to the ground point of a microprocessor, microcontroller, digital signal processor, or other high power digital device. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 19 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com APPLICATION CIRCUITS The following figures are examples of the ADC122S655 in typical application circuits. These circuits are basic and will generally require modification for specific circumstances. Data Acquisition Figure 38 shows a basic low cost, low power data acquisition circuit. The analog supply pin is powered by the system +5V supply and the 2.5V reference voltage is generated by the LM4040-2.5 shunt reference. +5V + 2 k: 10 PF ADC122S655 + LM4040-2.5 VREF VA 0.1 PF 0.1 PF 10 PF CHA+ SCLK CHA- DOUT GND CSB Microcontroller DIFFINA CHBDIFFINB CHB+ Figure 38. Low cost, low power Data Acquisition System Current Sensing Application Figure 39 shows an example of interfacing a pair of current transducers to the ADC122S655. The current transducers convert an input current into a voltage that is converted by the ADC122S655. Since the output voltage of the current transducers are single-ended and centered around a common-mode voltage of 2.5V, the ADC122S655 is configured with the output of the transducer driving the non-inverting inputs and the commonmode output voltage of the transducer driving the inverting input. The output of the transducer has an output range of ±2V around the common-mode voltage of 2.5V. As a result, a series reference voltage of 2.0V is connected to the ADC122S655. This will allow all of the codes of the ADC122S655 to be available for the application. This configuration of the ADC122S655 is referred to as a single-ended application of a differential ADC. All of the elements in the application are conveniently powered by the same +5V power supply, keeping circuit complexity and cost to a minimum. +5V + 10 PF LM4132-2.0 + IIN IOUT VREF 10 PF 2.5V + 2.0V OUT IIN +5V IOUT VCM GND ADC122S655 0.1 PF CHA+ ADC 2.5V IOUT SCLK CHASerial Interface GND IIN VA 0.1 PF 2.5V VCM IIN +5V IOUT OUT GND DOUT CSB CHBADC 2.5V + 2.0V CHB+ LTSR-15NPs Figure 39. Interfacing the ADC122S655 to a Current Transducer 20 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 ADC122S655 www.ti.com SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 Bridge Sensor Application Figure 40 shows an example of interfacing the ADC122S655 to a pair of bridge sensors. The application assumes that the bridge sensors require buffering and amplification to fully utilize the dynamic range of the ADC and thus optimize the performance of the entire signal path. The amplification stage for each ADC input consists of a pair of opamps from the LMP7704. The amplification stage offers the benefit of high input impedance and potentially high amplification. On the other hand, it offers no common-mode rejection of noise coming from the bridge sensors. The application circuit assumes the bridge sensors are powered from the same +5V power supply voltage as the analog supply pin on the ADC122S655. This has the benefit of providing the ideal common-mode input voltage for the ADC122S655 while keeping design complexity and cost to a minimum. The LM4132-4.1, a 4.1V series reference, is used as the reference voltage in the application. +5V +5V = VA + - 470 pF 100 k: ADC122S655 180 : ADC_A 2 k: 100 k: + Bridge Sensor 180 : AV = 100 V/V SCLK DOUT Serial Interface LMP7704 +5V CSB + - 470 pF 100 k: 180 : ADC_B 2 k: 100 k: + Bridge Sensor 180 : VREF AV = 100 V/V LM4132-4.1 + 0.1 PF 4.7 PF +5V + 4.7 PF Figure 40. Interfacing the ADC122S655 to Bridge Sensors Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 21 ADC122S655 SNAS445A – FEBRUARY 2008 – REVISED MARCH 2013 www.ti.com REVISION HISTORY Changes from Original (March 2013) to Revision A • 22 Page Changed layout of National Data Sheet to TI format .......................................................................................................... 21 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC122S655 PACKAGE OPTION ADDENDUM www.ti.com 11-Apr-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (°C) Top-Side Markings (3) (4) ADC122S655CIMM/NOPB ACTIVE VSSOP DGS 10 1000 Green (RoHS & no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 105 X96C ADC122S655CIMMX/NOPB ACTIVE VSSOP DGS 10 3500 Green (RoHS & no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 105 X96C (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Top-Side Marking for that device. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1 Samples PACKAGE MATERIALS INFORMATION www.ti.com 21-Mar-2013 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant ADC122S655CIMM/NOPB VSSOP DGS 10 1000 178.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1 ADC122S655CIMMX/NOP VSSOP B DGS 10 3500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 21-Mar-2013 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) ADC122S655CIMM/NOPB VSSOP DGS 10 1000 210.0 185.0 35.0 VSSOP DGS 10 3500 367.0 367.0 35.0 ADC122S655CIMMX/NOP B Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily performed. TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional restrictions. Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use of any TI components in safety-critical applications. In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and requirements. Nonetheless, such components are subject to these terms. No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties have executed a special agreement specifically governing such use. Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and regulatory requirements in connection with such use. TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of non-designated products, TI will not be responsible for any failure to meet ISO/TS16949. Products Applications Audio www.ti.com/audio Automotive and Transportation www.ti.com/automotive Amplifiers amplifier.ti.com Communications and Telecom www.ti.com/communications Data Converters dataconverter.ti.com Computers and Peripherals www.ti.com/computers DLP® Products www.dlp.com Consumer Electronics www.ti.com/consumer-apps DSP dsp.ti.com Energy and Lighting www.ti.com/energy Clocks and Timers www.ti.com/clocks Industrial www.ti.com/industrial Interface interface.ti.com Medical www.ti.com/medical Logic logic.ti.com Security www.ti.com/security Power Mgmt power.ti.com Space, Avionics and Defense www.ti.com/space-avionics-defense Microcontrollers microcontroller.ti.com Video and Imaging www.ti.com/video RFID www.ti-rfid.com OMAP Applications Processors www.ti.com/omap TI E2E Community e2e.ti.com Wireless Connectivity www.ti.com/wirelessconnectivity Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2013, Texas Instruments Incorporated Mouser Electronics Authorized Distributor Click to View Pricing, Inventory, Delivery & Lifecycle Information: Texas Instruments: ADC122S655CIMM/NOPB ADC122S655CIMMX/NOPB