AD ADuM131E0BRWZ 3.0 kv rms/3.75 kv rms triple-channel digital isolator Datasheet

FUNCTIONAL BLOCK DIAGRAMS
APPLICATIONS
General-purpose multichannel isolation
Serial peripheral interface (SPI)/data converter isolation
Industrial field bus isolation
VDD1 1
GND1 2
VIA 3
VIB 4
VIC 5
NIC 6
DISABLE1 7
GND1 8
The ADuM130D/ADuM130E/ADuM131D/ADuM131E data
channels are independent and are available in a variety of configurations with a withstand voltage rating of 3.0 kV rms or
3.75 kV rms (see the Ordering Guide). The devices operate with
the supply voltage on either side ranging from 1.8 V to 5 V, providing compatibility with lower voltage systems as well as enabling
voltage translation functionality across the isolation barrier.
1
16 VDD2
ENCODE
DECODE
15 GND2
14 VOA
ENCODE
DECODE
13 VOB
ENCODE
DECODE
12 VOC
11 NIC
10 NIC
9
GND2
NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING.
Figure 1. ADuM130D Functional Block Diagram
1
ADuM130E
2
16 VDD2
15 GND2
3
ENCODE
DECODE
14 VOA
4
ENCODE
DECODE
13 VOB
ENCODE
DECODE
12 VOC
11 NIC
5
NIC 6
NIC 7
GND1 8
10 VE2
9 GND2
NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING.
13348-002
VDD1
GND1
VIA
VIB
VIC
Figure 2. ADuM130E Functional Block Diagram
VDD1
GND1
VIA
VIB
VOC
1
ADuM131D
2
16 VDD2
15 GND2
3
ENCODE
DECODE
14 VOA
4
ENCODE
DECODE
DECODE
ENCODE
13 VOB
12 VIC
5
NIC 6
DISABLE1 7
GND1 8
11 NIC
10 DISABLE2
9 GND2
NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING.
Figure 3. ADuM131D Functional Block Diagram
VDD1
GND1
VIA
VIB
VOC
GENERAL DESCRIPTION
The ADuM130D/ADuM130E/ADuM131D/ADuM131E1 are
triple-channel digital isolators based on Analog Devices, Inc.,
iCoupler® technology. Combining high speed, complementary
metal-oxide semiconductor (CMOS) and monolithic air core
transformer technology, these isolation components provide
outstanding performance characteristics superior to alternatives
such as optocoupler devices and other integrated couplers. The
maximum propagation delay is 13 ns with a pulse width distortion
of less than 3 ns at 5 V operation. Channel matching is tight at
3.0 ns maximum.
ADuM130D
13348-101
High common-mode transient immunity: 100 kV/μs
High robustness to radiated and conducted noise
Low propagation delay: 13 ns maximum for 5 V operation,
15 ns maximum for 1.8 V operation
150 Mbps maximum guaranteed data rate
Safety and regulatory approvals (pending)
UL recognition
3000 V rms/3750 V rms for 1 minute per UL 1577
CSA Component Acceptance Notice 5A
VDE certificate of conformity
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
VIORM = 849 V peak
CQC certification per GB4943.1-2011
Backward compatibility
ADuM130E1/ADuM131E1 pin-compatible with
ADuM1300/ADuM1301
Low dynamic power consumption
1.8 V to 5 V level translation
High temperature operation: 125°C
Fail-safe high or low options
16-lead, RoHS compliant, SOIC package
13348-001
FEATURES
1
ADuM131E
2
3
ENCODE
DECODE
4
ENCODE
DECODE
DECODE
ENCODE
5
NIC 6
VE1 7
GND1 8
16 VDD2
15 GND2
14 VOA
13 VOB
12 VIC
11 NIC
10 VE2
9 GND2
NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING.
13348-102
Data Sheet
3.0 kV RMS/3.75 kV RMS Triple-Channel
Digital Isolators
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Figure 4. ADuM131E Functional Block Diagram
Unlike other optocoupler alternatives, dc correctness is ensured
in the absence of input logic transitions. Two different fail-safe
options are available, in which the outputs transition to a predetermined state when the input power supply is not applied or
the inputs are disabled. The ADuM130E1/ADuM131E1 are pincompatible with the ADuM1300/ADuM1301.
Protected by U.S. Patents 5,952,849; 6,873,065; 6,903,578; and 7,075,329. Other patents are pending.
Rev. A
Document Feedback
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
©2015 Analog Devices, Inc. All rights reserved.
Technical Support
www.analog.com
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Recommended Operating Conditions .................................... 12
Applications ....................................................................................... 1
Absolute Maximum Ratings ......................................................... 13
General Description ......................................................................... 1
ESD Caution................................................................................ 13
Functional Block Diagrams ............................................................. 1
Truth Tables................................................................................. 14
Revision History ............................................................................... 2
Pin Configurations and Function Descriptions ......................... 15
Specifications..................................................................................... 3
Typical Performance Characteristics ........................................... 17
Electrical Characteristics—5 V Operation................................ 3
Applications Information .............................................................. 18
Electrical Characteristics—3.3 V Operation ............................ 4
Overview ..................................................................................... 18
Electrical Characteristics—2.5 V Operation ............................ 6
Printed Circuit Board (PCB) Layout ....................................... 18
Electrical Characteristics—1.8 V Operation ............................ 7
Propagation Delay Related Parameters ................................... 19
Insulation and Safety Related Specifications ............................ 9
Jitter Measurement ..................................................................... 19
Package Characteristics ............................................................... 9
Insulation Lifetime ..................................................................... 19
Regulatory Information ............................................................. 10
Outline Dimensions ....................................................................... 21
DIN V VDE V 0884-10 (VDE V 0884-10) Insulation
Characteristics ............................................................................ 11
Ordering Guide .......................................................................... 22
REVISION HISTORY
11/15—Rev. 0 to Rev. A
Added 16-Lead, Narrow Body SOIC Package ................ Universal
Changes to Title, Features Section, and General Description
Section ................................................................................................ 1
Added Table 9; Renumbered Sequentially .................................... 9
Changes to Table 10 and Table 11 .................................................. 9
Added Table 12 ............................................................................... 10
Changes to Table 13 ........................................................................ 10
Changes to Table 15 Title............................................................... 12
Added Figure 5; Renumbered Sequentially ................................ 12
Changes to Table 17 and Table 19 ................................................ 13
Added Table 18 ............................................................................... 13
Updated Outline Dimensions ....................................................... 21
Changes to Ordering Guide .......................................................... 22
7/15—Revision 0: Initial Version
Rev. A | Page 2 of 22
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS—5 V OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 5 V. Minimum/maximum specifications apply over the entire recommended
operation range of 4.5 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals.
Table 1.
Parameter
SWITCHING SPECIFICATIONS
Pulse Width
Data Rate 1
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Propagation Delay Skew
Channel Matching
Codirectional
Opposing Direction
Jitter
Symbol
Min
PW
6.6
150
4.8
tPHL, tPLH
PWD
7.2
0.5
1.5
tPSK
Max
Unit
Test Conditions/Comments
13
3
ns
Mbps
ns
ns
ps/°C
ns
Within pulse width distortion (PWD) limit
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
6.1
tPSKCD
tPSKOD
0.5
0.5
630
80
DC SPECIFICATIONS
Input Threshold
Logic High
Logic Low
Output Voltage
Logic High
VIH
VIL
0.7 × VDDx
VOH
VDDx − 0.1
VDDx − 0.4
Logic Low
VOL
Input Current per Channel
VE2 Enable Input Pull-Up Current
DISABLE1 Input Pull-Down Current
Tristate Output Current per Channel
Quiescent Supply Current
ADuM130D/ADuM130E
Typ
3.0
3.0
0.3 × VDDx
VDDx
VDDx −
0.2
0.0
0.2
+0.01
−3
9
+0.01
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
ns
ns
ps p-p
ps rms
Between any two devices at the same
temperature, voltage, and load
See the Jitter Measurement section
See the Jitter Measurement section
V
V
V
V
IOx 2 = −20 µA, VIx = VIxH 3
IOx2 = −4 mA, VIx = VIxH3
15
+10
V
V
µA
µA
µA
µA
IOx2 = 20 µA, VIx = VIxL 4
IOx2 = 4 mA, VIx = VIxL4
0 V ≤ VIx ≤ VDDx
VE2 = 0 V
DISABLE1 = VDDx
0 V ≤ VOx ≤ VDDx
1.35
1.73
9.7
1.87
2.6
2.9
15.2
3.0
mA
mA
mA
mA
VI 5 = 0 (E0, D0), 1 (E1, D1) 6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.62
1.61
7.4
5.34
2.7
2.8
11.4
7.2
mA
mA
mA
mA
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDDI (D)
IDDO (D)
UVLO
VDDxUV+
VDDxUV−
VDDxUVH
0.01
0.02
mA/Mbps
mA/Mbps
Inputs switching, 50% duty cycle
Inputs switching, 50% duty cycle
1.6
1.5
0.1
V
V
V
II
IPU
IPD
IOZ
−10
−10
−10
0.1
0.4
+10
ADuM131D/ADuM131E
Dynamic Supply Current
Dynamic Input
Dynamic Output
Undervoltage Lockout
Positive VDDx Threshold
Negative VDDx Threshold
VDDx Hysteresis
Rev. A | Page 3 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Parameter
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient
Immunity 7
Symbol
Min
Typ
tR/tF
|CMH|
75
|CML|
75
Data Sheet
Max
Unit
Test Conditions/Comments
2.5
100
ns
kV/µs
100
kV/µs
10% to 90%
VIx = VDDx, VCM = 1000 V,
transient magnitude = 800 V
VIx = 0 V, VCM = 1000 V,
transient magnitude = 800 V
150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible.
IOx is the Channel x output current, where x = A, B, or C.
VIxH is the input side logic high.
4
VIxL is the input side logic low.
5
VI is the voltage input.
6
E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers
to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section.
7
|CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode
voltage edges.
1
2
3
Table 2. Total Supply Current vs. Data Throughput
Parameter
SUPPLY CURRENT
ADuM130D/ADuM130E
Supply Current Side 1
Supply Current Side 2
ADuM131D/ADuM131E
Supply Current Side 1
Supply Current Side 2
Symbol
Min
1 Mbps
Typ
Max
Min
25 Mbps
Typ
Max
Min
100 Mbps
Typ
Max
Unit
IDD1
IDD2
5.6
1.9
9.0
3.7
6.3
3.1
9.8
4.9
9.4
6.8
14.3
10
mA
mA
IDD1
IDD2
4.6
3.6
7.2
5.8
5.5
4.6
8.3
6.8
8.8
8.0
11.9
11.3
mA
mA
ELECTRICAL CHARACTERISTICS—3.3 V OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 3.3 V. Minimum/maximum specifications apply over the entire recommended
operation range: 3.0 V ≤ VDD1 ≤ 3.6 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals.
Table 3.
Parameter
SWITCHING SPECIFICATIONS
Pulse Width
Data Rate 1
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Propagation Delay Skew
Channel Matching
Codirectional
Opposing Direction
Jitter
DC SPECIFICATIONS
Input Threshold
Logic High
Logic Low
Symbol
Min
PW
6.6
150
4.8
tPHL, tPLH
PWD
Typ
6.8
0.7
1.5
tPSK
Unit
Test Conditions/Comments
14
3
ns
Mbps
ns
ns
ps/°C
ns
Within PWD limit
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
7.5
tPSKCD
tPSKOD
VIH
VIL
Max
0.7
0.7
640
75
3.0
3.0
0.7 × VDDx
0.3 × VDDx
Rev. A | Page 4 of 22
ns
ns
ps p-p
ps rms
V
V
Between any two devices at the
same temperature, voltage, and
load
See the Jitter Measurement section
See the Jitter Measurement section
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Parameter
Output Voltage
Logic High
Logic Low
Symbol
Min
Typ
VOH
VDDx − 0.1
VDDx − 0.4
VDDx
VDDx − 0.2
0.0
0.2
+0.01
−3
9
+0.01
VOL
Input Current per Channel
VE2 Enable Input Pull-Up Current
DISABLE1 Input Pull-Down Current
Tristate Output Current per Channel
II
IPU
IPD
IOZ
−10
−10
−10
Max
Unit
Test Conditions/Comments
15
+10
V
V
V
V
µA
µA
µA
µA
IOx 2 = −20 µA, VIx = VIxH 3
IOx2 = −2 mA, VIx = VIxH3
IOx2 = 20 µA, VIx = VIxL 4
IOx2 = 2 mA, VIx = VIxL4
0 V ≤ VIx ≤ VDDx
VE2 = 0 V
DISABLE1 = VDDx
0 V ≤ VOx ≤ VDDx
0.1
0.4
+10
Quiescent Supply Current
ADuM130D/ADuM130E
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.25
1.65
9.57
1.79
2.5
2.8
15.0
2.9
mA
mA
mA
mA
VI 5 = 0 (E0, D0), 1 (E1, D1) 6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.52
1.52
7.28
5.24
2.6
2.6
11.3
7.1
mA
mA
mA
mA
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDDI (D)
IDDO (D)
UVLO
VDDxUV+
VDDxUV−
VDDxUVH
0.01
0.01
mA/Mbps
mA/Mbps
Inputs switching, 50% duty cycle
Inputs switching, 50% duty cycle
1.6
1.5
0.1
V
V
V
ADuM131D/ADuM131E
Dynamic Supply Current
Dynamic Input
Dynamic Output
Undervoltage Lockout
Positive VDDx Threshold
Negative VDDx Threshold
VDDx Hysteresis
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 7
tR/tF
|CMH|
75
2.5
100
ns
kV/µs
|CML|
75
100
kV/µs
10% to 90%
VIx = VDDx, VCM = 1000 V,
transient magnitude = 800 V
VIx = 0 V, VCM = 1000 V,
transient magnitude = 800 V
150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible.
IOx is the Channel x output current, where x = A, B, or C.
3
VIxH is the input side logic high.
4
VIxL is the input side logic low.
5
VI is the voltage input.
6
E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers
to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section.
7
|CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode
voltage edges.
1
2
Table 4. Total Supply Current vs. Data Throughput
Parameter
SUPPLY CURRENT
ADuM130D/ADuM130E
Supply Current Side 1
Supply Current Side 2
ADuM131D/ADuM131E
Supply Current Side 1
Supply Current Side 2
Symbol
Min
1 Mbps
Typ
Max
Min
25 Mbps
Typ
Max
Min
100 Mbps
Typ
Max
Unit
IDD1
IDD2
5.4
1.8
8.8
3.6
6.0
2.9
9.4
4.7
8.5
6.2
12.7
8.4
mA
mA
IDD1
IDD2
4.4
3.4
7.1
5.6
5.2
4.3
8.0
6.5
8.1
7.4
10.7
9.5
mA
mA
Rev. A | Page 5 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
ELECTRICAL CHARACTERISTICS—2.5 V OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 2.5 V. Minimum/maximum specifications apply over the entire recommended
operation range: 2.25 V ≤ VDD1 ≤ 2.75 V, 2.25 V ≤ VDD2 ≤ 2.75 V, −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals.
Table 5.
Parameter
SWITCHING SPECIFICATIONS
Pulse Width
Data Rate 1
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Propagation Delay Skew
Channel Matching
Codirectional
Opposing Direction
Jitter
Symbol
Min
PW
6.6
150
5.0
tPHL, tPLH
PWD
Typ
7.0
0.7
1.5
tPSK
tPSKCD
tPSKOD
0.7
0.7
770
160
VIH
VIL
0.7 × VDDx
VOH
VDDx − 0.1
VDDx − 0.4
Logic Low
VOL
II
IPU
IPD
IOZ
Unit
Test Conditions/Comments
14
3
ns
Mbps
ns
ns
ps/°C
ns
Within PWD limit
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
6.8
DC SPECIFICATIONS
Input Threshold
Logic High
Logic Low
Output Voltage
Logic High
Input Current per Channel
VE2 Enable Input Pull-Up Current
DISABLE1 Input Pull-Down Current
Tristate Output Current per Channel
Quiescent Supply Current
ADuM130D/ADuM130E
Max
3.0
3.0
0.3 × VDDx
−10
−10
−10
VDDx
VDDx − 0.2
0.0
0.2
+0.01
−3
9
+0.01
ns
ns
ps p-p
ps rms
Between any two devices at the
same temperature, voltage, load
See the Jitter Measurement section
See the Jitter Measurement section
V
V
15
+10
V
V
V
V
µA
µA
µA
µA
IOx 2 = −20 µA, VIx = VIxH 3
IOx2 = −2 mA, VIx = VIxH3
IOx2 = 20 µA, VIx = VIxL 4
IOx2 = 2 mA, VIx = VIxL4
0 V ≤ VIx ≤ VDDx
VE2 = 0 V
DISABLE1 = VDDx
0 V ≤ VOx ≤ VDDx
0.1
0.4
+10
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.2
1.61
9.52
1.76
2.4
2.7
14.9
2.8
mA
mA
mA
mA
VI 5 = 0 (E0, D0), 1 (E1, D1) 6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.47
1.48
7.23
5.19
2.5
2.5
11.2
7.0
mA
mA
mA
mA
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDDI (D)
IDDO (D)
0.01
0.01
mA/Mbps
mA/Mbps
Inputs switching, 50% duty cycle
Inputs switching, 50% duty cycle
VDDxUV+
VDDxUV−
VDDxUVH
1.6
1.5
0.1
V
V
V
ADuM131D/ADuM131E
Dynamic Supply Current
Dynamic Input
Dynamic Output
Undervoltage Lockout
Positive VDDx Threshold
Negative VDDx Threshold
VDDx Hysteresis
Rev. A | Page 6 of 22
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Parameter
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 7
Symbol
Min
Typ
tR/tF
|CMH|
75
|CML|
75
Max
Unit
Test Conditions/Comments
2.5
100
ns
kV/µs
100
kV/µs
10% to 90%
VIx = VDDx, VCM = 1000 V,
transient magnitude = 800 V
VIx = 0 V, VCM = 1000 V,
transient magnitude = 800 V
150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible.
IOx is the Channel x output current, where x = A, B, or C.
VIxH is the input side logic high.
4
VIxL is the input side logic low.
5
VI is the voltage input.
6
E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers
to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section.
7
|CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode
voltage edges.
1
2
3
Table 6. Total Supply Current vs. Data Throughput
Parameter
SUPPLY CURRENT
ADuM130E/ADuM130D
Supply Current Side 1
Supply Current Side 2
ADuM131E/ADuM131D
Supply Current Side 1
Supply Current Side 2
Symbol
1 Mbps
Typ
Max
Min
Min
25 Mbps
Typ
Max
Min
100 Mbps
Typ
Max
Unit
IDD1
IDD2
5.3
1.8
8.7
3.6
5.9
2.6
9.3
4.4
8.2
5.2
12.3
7.4
mA
mA
IDD1
IDD2
4.4
3.4
7.1
5.6
5.0
4.1
7.8
6.3
7.5
6.6
10.1
8.7
mA
mA
ELECTRICAL CHARACTERISTICS—1.8 V OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 1.8 V. Minimum/maximum specifications apply over the entire recommended
operation range: 1.7 V ≤ VDD1 ≤ 1.9 V, 1.7 V ≤ VDD2 ≤ 1.9 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals.
Table 7.
Parameter
SWITCHING SPECIFICATIONS
Pulse Width
Data Rate 1
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Propagation Delay Skew
Channel Matching
Codirectional
Opposing Direction
Jitter
DC SPECIFICATIONS
Input Threshold
Logic High
Logic Low
Output Voltage
Logic High
Symbol
Min
PW
6.6
150
5.8
tPHL, tPLH
PWD
Typ
8.7
0.7
1.5
tPSK
Max
Unit
Test Conditions/Comments
15
3
ns
Mbps
ns
ns
ps/°C
ns
Within PWD limit
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
7.0
tPSKCD
tPSKOD
0.7
0.7
600
90
VIH
VIL
0.7 × VDDx
VOH
VDDx − 0.1
VDDx − 0.4
3.0
3.0
0.3 × VDDx
VDDx
VDDx − 0.2
Rev. A | Page 7 of 22
ns
ns
ps p-p
ps rms
Between any two devices at the
same temperature, voltage, and
load
See the Jitter Measurement section
See the Jitter Measurement section
V
V
V
V
IOx 2 = −20 µA, VIx = VIxH 3
IOx2 = −2 mA, VIx = VIxH3
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Parameter
Logic Low
Input Current per Channel
VE2 Enable Input Pull-Up Current
DISABLE1 Input Pull-Down Current
Tristate Output Current per Channel
Quiescent Supply Current
ADuM130D/ADuM130E
Symbol
VOL
Min
II
IPU
IPD
IOZ
−10
−10
Data Sheet
Typ
0.0
0.2
+0.01
−3
9
+0.01
Max
0.1
0.4
+10
15
+10
Unit
V
V
µA
µA
µA
µA
Test Conditions/Comments
IOx2 = 20 µA, VIx = VIxL 4
IOx2 = 2 mA, VIx = VIxL4
0 V ≤ VIx ≤ VDDx
VE2 = 0 V
DISABLE1 = VDDx
0 V ≤ VOx ≤ VDDx
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.15
1.58
9.41
1.72
2.3
2.6
14.8
2.7
mA
mA
mA
mA
VI 5 = 0 (E0, D0), 1 (E1, D1) 6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDD1 (Q)
IDD2 (Q)
IDD1 (Q)
IDD2 (Q)
1.42
1.44
7.15
5.13
2.4
2.4
11.1
6.9
mA
mA
mA
mA
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 0 (E0, D0), 1 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
VI5 = 1 (E0, D0), 0 (E1, D1)6
IDDI (D)
IDDO (D)
UVLO
VDDxUV+
VDDxUV−
VDDxUVH
0.01
0.01
mA/Mbps
mA/Mbps
Inputs switching, 50% duty cycle
Inputs switching, 50% duty cycle
1.6
1.5
0.1
V
V
V
−10
ADuM131D/ADuM131E
Dynamic Supply Current
Dynamic Input
Dynamic Output
Undervoltage Lockout
Positive VDDx Threshold
Negative VDDx Threshold
VDDx Hysteresis
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 7
tR/tF
|CMH|
75
2.5
100
ns
kV/µs
|CML|
75
100
kV/µs
10% to 90%
VIx = VDDx, VCM = 1000 V,
transient magnitude = 800 V
VIx = 0 V, VCM = 1000 V,
transient magnitude = 800 V
150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible.
IOx is the Channel x output current, where x = A, B, or C.
3
VIxH is the input side logic high.
4
VIxL is the input side logic low.
5
VI is the voltage input.
6
E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers
to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section.
7
|CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode
voltage edges.
1
2
Table 8. Total Supply Current vs. Data Throughput
Parameter
SUPPLY CURRENT
ADuM130D/ADuM130E
Supply Current Side 1
Supply Current Side 2
ADuM131D/ADuM131E
Supply Current Side 1
Supply Current Side 2
Symbol
Min
1 Mbps
Typ
Max
Min
25 Mbps
Typ
Max
Min
100 Mbps
Typ
Max
Unit
IDD1
IDD2
5.2
1.7
8.6
3.5
5.8
2.5
9.3
4.3
8.1
5.2
12.2
7.3
mA
mA
IDD1
IDD2
4.3
3.3
7.0
5.5
4.9
4.0
7.7
6.2
7.26
6.5
10.0
8.6
mA
mA
Rev. A | Page 8 of 22
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
INSULATION AND SAFETY RELATED SPECIFICATIONS
For additional information, see www.analog.com/icouplersafety.
Table 9. R-16 Narrow Body [SOIC_N] Package
Parameter
Rated Dielectric Insulation Voltage
Minimum External Air Gap (Clearance)
Symbol
L (I01)
Value
3000
4.0
Unit
V rms
mm min
Minimum External Tracking (Creepage)
L (I02)
4.0
mm min
Minimum Clearance in the Plane of the Printed
Circuit Board (PCB Clearance)
L (PCB)
4.5
mm min
CTI
25.5
>400
II
μm min
V
Unit
V rms
mm min
Minimum Internal Gap (Internal Clearance)
Tracking Resistance (Comparative Tracking Index)
Material Group
Test Conditions/Comments
1-minute duration
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance path along body
Measured from input terminals to output terminals,
shortest distance through air, line of sight, in the PCB
mounting plane
Insulation distance through insulation
DIN IEC 112/VDE 0303 Part 1
Material Group (DIN VDE 0110, 1/89, Table 1)
Table 10. RW-16 Wide Body [SOIC_W] Package
Parameter
Rated Dielectric Insulation Voltage
Minimum External Air Gap (Clearance)
Symbol
L (I01)
Value
3750
7.8
Minimum External Tracking (Creepage)
L (I02)
7.8
mm min
Minimum Clearance in the Plane of the Printed
Circuit Board (PCB Clearance)
L (PCB)
8.1
mm min
CTI
25.5
>400
II
μm min
V
Minimum Internal Gap (Internal Clearance)
Tracking Resistance (Comparative Tracking Index)
Material Group
Test Conditions/Comments
1-minute duration
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance path along body
Measured from input terminals to output terminals,
shortest distance through air, line of sight, in the PCB
mounting plane
Insulation distance through insulation
DIN IEC 112/VDE 0303 Part 1
Material Group (DIN VDE 0110, 1/89, Table 1)
PACKAGE CHARACTERISTICS
Table 11.
Parameter
Resistance (Input to Output) 1
Capacitance (Input to Output)1
Input Capacitance 2
IC Junction to Ambient Thermal Resistance
R-16 Narrow Body [SOIC_N] Package
RW-16 Wide Body [SOIC_W] Package
1
2
Symbol
RI-O
CI-O
CI
θJA
θJA
Min
Typ
1013
2.2
4.0
76
45
Max
Unit
Ω
pF
pF
Test Conditions/Comments
°C/W
°C/W
Thermocouple located at center of package underside
Thermocouple located at center of package underside
f = 1 MHz
The device is considered a 2-terminal device: Pin 1 through Pin 8 are shorted together, and Pin 9 through Pin 16 are shorted together.
Input capacitance is from any input data pin to ground.
Rev. A | Page 9 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
REGULATORY INFORMATION
See Table 19 and the Insulation Lifetime section for details regarding recommended maximum working voltages for specific crossisolation waveforms and insulation levels.
Table 12. R-16 Narrow Body [SOIC_N] Package
UL (Pending)
Recognized Under UL 1577
Component Recognition
Program 1
Single Protection, 3000 V rms
Isolation Voltage
Double Protection, 3000 V rms
Isolation Voltage
File E214100
CSA (Pending)
Approved under CSA Component
Acceptance Notice 5A
VDE (Pending)
Certified according to DIN V VDE V
0884-10 (VDE V 0884-10):2006-12 2
CQC (Pending)
Certified under
CQC11-471543-2012
CSA 60950-1-07+A1+A2 and IEC
60950-1, second edition, +A1+A2:
Basic insulation at 400 V rms
(565 V peak)
Reinforced insulation at 200 V rms
(283 V peak)
IEC 60601-1 Edition 3.1: Basic
insulation (one means of patient
protection (1 MOPP)), 250 V rms
(354 V peak)
CSA 61010-1-12 and IEC 61010-1
third edition:
Basic insulation at 300 V rms mains,
400 V rms secondary (565 V peak)
Reinforced insulation at 300 V rms
mains, 200 V secondary (282 V peak)
File 205078
Reinforced insulation, VIORM =
565 V peak, VIOSM = 6000 V peak
Basic insulation, VIORM = 565 V peak,
VIOSM = 10 kV peak
GB4943.1-2011:
File 2471900-4880-0001
Basic insulation at
770 V rms (1089 V peak)
Reinforced insulation at
385 V rms (545 V peak)
Tropical climate, altitude
≤5000 m
File (pending)
In accordance with UL 1577, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the R-16 narrow body [SOIC_N] package is proof tested by applying an insulation
test voltage ≥ 3600 V rms for 1 sec.
2
In accordance with DIN V VDE V 0884-10, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the R-16 narrow body [SOIC_N] package is proof tested by applying an
insulation test voltage ≥ 1059 V peak for 1 sec (partial discharge detection limit = 5 pC). The * marking branded on the component designates DIN V VDE V 0884-10 approval.
1
Table 13. RW-16 Wide Body [SOIC_W] Package
UL (Pending)
Recognized Under UL 1577
Component Recognition
Program 1
Single Protection, 3750 V rms
Isolation Voltage
Double Protection, 3750 V rms
Isolation Voltage
File E214100
CSA (Pending)
Approved under CSA Component
Acceptance Notice 5A
VDE (Pending)
Certified according to DIN V VDE V
0884-10 (VDE V 0884-10):2006-12 2
CQC (Pending)
Certified under
CQC11-471543-2012
CSA 60950-1-07+A1+A2 and IEC 60950-1,
second edition, +A1+A2:
Basic insulation at 780 V rms
(1103 V peak)
Reinforced insulation at 390 V rms
(552 V peak)
IEC 60601-1 Edition 3.1: basic insulation
(1 means of patient protection (MOPP)),
490 V rms (693 V peak)
CSA 61010-1-12 and IEC 61010-1 third
edition:
Basic insulation at 300 V rms mains, 780 V
secondary (1103 V peak)
Reinforced insulation at 300 V rms mains,
390 V secondary (552 V peak)
File 205078
Reinforced insulation, VIORM =
849 V peak, VIOSM = 6000 V peak
Basic insulation, VIORM = 849 V peak,
VIOSM = 10 kV peak
GB4943.1-2011
File 2471900-4880-0001
Basic insulation at
780 V rms (1103 V peak)
Reinforced insulation at
390 V rms (552 V peak)
Tropical climate,
altitude ≤5000 m
File (pending)
In accordance with UL 1577, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the RW-16 wide body [SOIC_W] package is proof tested by applying an insulation
test voltage ≥ 4500 V rms for 1 sec.
2
In accordance with DIN V VDE V 0884-10, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the RW-16 wide body [SOIC_W] package is proof tested by applying an
insulation test voltage ≥ 1592 V peak for 1 sec (partial discharge detection limit = 5 pC). The * marking branded on the component designates DIN V VDE V 0884-10 approval.
1
Rev. A | Page 10 of 22
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
DIN V VDE V 0884-10 (VDE V 0884-10) INSULATION CHARACTERISTICS
These isolators are suitable for reinforced electrical isolation only within the safety limit data. Protective circuits ensure the maintenance
of the safety data. The * marking on packages denotes DIN V VDE V 0884-10 approval.
Table 14. R-16 Narrow Body [SOIC_N] Package
Description
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms
For Rated Mains Voltage ≤ 300 V rms
For Rated Mains Voltage ≤ 600 V rms
Climatic Classification
Pollution Degree per DIN VDE 0110, Table 1
Maximum Working Insulation Voltage
Input to Output Test Voltage, Method B1
Input to Output Test Voltage, Method A
After Environmental Tests Subgroup 1
After Input and/or Safety Test Subgroup 2
and Subgroup 3
Highest Allowable Overvoltage
Surge Isolation Voltage Basic
Surge Isolation Voltage Reinforced
Safety Limiting Values
Maximum Junction Temperature
Total Power Dissipation at 25°C
Insulation Resistance at TS
Test Conditions/Comments
VIORM × 1.875 = Vpd (m), 100% production test,
tini = tm = 1 sec, partial discharge < 5 pC
Symbol
Characteristic
Unit
VIORM
Vpd (m)
I to IV
I to IV
I to III
40/125/21
2
565
1059
V peak
V peak
848
V peak
678
V peak
VIOTM
VIOSM
4200
10000
V peak
V peak
VIOSM
6000
V peak
TS
PS
RS
150
1.64
>109
°C
W
Ω
Vpd (m)
VIORM × 1.5 = Vpd (m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
VIORM × 1.2 = Vpd (m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
V peak = 10 kV, 1.2 µs rise time, 50 µs,
50% fall time
V peak = 10 kV, 1.2 µs rise time, 50 µs,
50% fall time
Maximum value allowed in the event of a failure
(see Figure 5)
VIO = 500 V
Rev. A | Page 11 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
Table 15. RW-16 Wide Body [SOIC_W] Package
Description
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms
For Rated Mains Voltage ≤ 300 V rms
For Rated Mains Voltage ≤ 600 V rms
Climatic Classification
Pollution Degree per DIN VDE 0110, Table 1
Maximum Working Insulation Voltage
Input to Output Test Voltage, Method B1
Test Conditions/Comments
VIORM × 1.875 = Vpd (m), 100% production test,
tini = tm = 1 sec, partial discharge < 5 pC
Input to Output Test Voltage, Method A
After Environmental Tests Subgroup 1
Characteristic
Unit
VIORM
Vpd (m)
I to IV
I to IV
I to III
40/125/21
2
849
1592
V peak
V peak
1274
V peak
1019
V peak
VIOTM
5300
V peak
VIOSM
VIOSM
12,000
6000
V peak
V peak
TS
PS
RS
150
2.78
>109
°C
W
Ω
Vpd (m)
VIORM × 1.5 = Vpd (m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
VIORM × 1.2 = Vpd (m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
After Input and/or Safety Test Subgroup 2
and Subgroup 3
Highest Allowable Overvoltage
Surge Isolation Voltage
Basic
Reinforced
Safety Limiting Values
VPEAK = 12.8 kV, 1.2 µs rise time, 50 µs, 50% fall time
VPEAK = 10 kV, 1.2 µs rise time, 50 µs, 50% fall time
Maximum value allowed in the event of a failure
(see Figure 6)
Maximum Junction Temperature
Total Power Dissipation at 25°C
Insulation Resistance at TS
VIO = 500 V
3.0
1.8
1.6
SAFE LIMITING POWER (W)
2.5
1.4
1.2
1.0
0.8
0.6
0.4
2.0
1.5
1.0
0.5
0
0
0
50
100
150
AMBIENT TEMPERATURE (°C)
200
Figure 5. Thermal Derating Curve for R-16 Narrow Body [SOIC_N] Package,
Dependence of Safety Limiting Values with Ambient Temperature per
DIN V VDE V 0884-10
0
50
100
150
200
AMBIENT TEMPERATURE (°C)
13348-003
0.2
13348-202
SAFE OPERATING PVDD1 , PVDDA OR PVDDB POWER (W)
Symbol
Figure 6. Thermal Derating Curve, Dependence of Safety Limiting Values
with Ambient Temperature per DIN V VDE V 0884-10
RECOMMENDED OPERATING CONDITIONS
Table 16.
Parameter
Operating Temperature
Supply Voltages
Input Signal Rise and Fall Times
Rev. A | Page 12 of 22
Symbol
TA
VDD1, VDD2
Rating
−40°C to +125°C
1.7 V to 5.5 V
1.0 ms
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Table 17.
Parameter
Storage Temperature (TST) Range
Ambient Operating Temperature
(TA) Range
Supply Voltages (VDD1, VDD2)
Input Voltages (VIA, VIB, VIC, VE1, VE2,
DISABLE1, DISABLE2)
Output Voltages (VOA, VOB, VOC)
Average Output Current per Pin3
Side 1 Output Current (IO1)
Side 2 Output Current (IO2)
Common-Mode Transients4
Rating
−65°C to +150°C
−40°C to +125°C
−0.5 V to +7.0 V
−0.5 V to VDDI1 + 0.5 V
ESD CAUTION
−0.5 V to VDDO2 + 0.5 V
−10 mA to +10 mA
−10 mA to +10 mA
−150 kV/μs to +150 kV/μs
VDDI is the input side supply voltage.
VDDO is the output side supply voltage.
3
See Figure 5 for the R-16 narrow body [SOIC_N] package or Figure 6 for the
RW-16 wide body [SOIC_W] package for the maximum rated current values
for various ambient temperatures.
4
Refers to the common-mode transients across the insulation barrier.
Common-mode transients exceeding the absolute maximum ratings may
cause latch-up or permanent damage.
1
2
Table 18. Maximum Continuous Working Voltage R-16 Narrow Body [SOIC_N] Package 1
Parameter
AC Voltage
Bipolar Waveform
Basic Insulation
Reinforced Insulation
Unipolar Waveform
Basic Insulation
Reinforced Insulation
DC Voltage
Basic Insulation
Reinforced Insulation
1
2
Rating
Constraint 2
789 V peak
403 V peak
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
909 V peak
469 V peak
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
558 V peak
285 V peak
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
Refers to the continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for more details.
Insulation lifetime for the specified test condition is greater than 50 years.
Table 19. Maximum Continuous Working Voltage RW-16 Wide Body [SOIC_W] Package 1
Parameter
AC Voltage
Bipolar Waveform
Basic Insulation
Reinforced Insulation
Unipolar Waveform
Basic Insulation
Reinforced Insulation
DC Voltage
Basic Insulation
Reinforced Insulation
1
2
Rating
Constraint 2
849 V peak
768 V peak
50-year minimum insulation lifetime
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
1698 V peak
768 V peak
50-year minimum insulation lifetime
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
1092 V peak
543 V peak
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1
Refers to the continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for more details.
Insulation lifetime for the specified test condition is greater than 50 years.
Rev. A | Page 13 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
TRUTH TABLES
Table 20. ADuM130D/ADuM131D Truth Table (Positive Logic)
VIx Input1, 2
L
H
X
X4
X4
VDISABLEx Input1, 2
L or NC
L or NC
H
X4
X4
VDDI State2
Powered
Powered
Powered
Unpowered
Powered
VDDO State2
Powered
Powered
Powered
Powered
Unpowered
Default Low (D0),
VOx Output1, 2, 3
L
H
L
L
Indeterminate
Default High (D1),
VOx Output1, 2, 3
L
H
H
H
Indeterminate
Test Conditions/Comments
Normal operation
Normal operation
Inputs disabled, fail-safe output
Fail-safe output
1
L means low, H means high, X means don’t care, and NC means not connected.
VIx and VOx refer to the input and output signals of a given channel (A, B, or C). VDISABLEx refers to the input disable signal on the same side as the VIx inputs. VDDI and VDDO
refer to the supply voltages on the input and output sides of the given channel, respectively.
3
E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers
to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section.
4
Input pins (VIx, DISABLE1, and DISABLE2) on the same side as an unpowered supply must be in a low state to avoid powering the device through its ESD protection
circuitry.
2
Table 21. ADuM130E/ADuM131E Truth Table (Positive Logic)
VIx Input1, 2
L
H
X
L
X4
X4
VEx Input1, 2
H or NC
H or NC
L
H or NC
L4
X4
VDDI State2
Powered
Powered
Powered
Unpowered
Unpowered
Powered
VDDO State2
Powered
Powered
Powered
Powered
Powered
Unpowered
Default Low (E0),
VOx Output1, 2, 3
L
H
Z
L
Z
Indeterminate
1
Default High (E1),
VOx Output1, 2, 3
L
H
Z
H
Z
Indeterminate
Test Conditions/Comments
Normal operation
Normal operation
Outputs disabled
Fail-safe output
Outputs disabled
L means low, H means high, X means don’t care, and NC means not connected, and Z means high impedance.
VIx and VOx refer to the input and output signals of a given channel (A, B, C, or D). VEx refers to the output enable signal on the same side as the VOx outputs. VDDI and
VDDO refer to the supply voltages on the input and output sides of the given channel, respectively.
3
E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers
to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section.
4
Input pins (VIx, VE1, and VE2) on the same side as an unpowered supply must be in a low state to avoid powering the device through its ESD protection circuitry.
2
Rev. A | Page 14 of 22
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
VDD1 1
16
VDD2
VDD1 1
16 VDD2
GND1 2
15
GND2
GND1 2
15 GND2
VIA 3
14
VOA
VIA 3
13
VOB
VIB 4
12
VOC
VIC 5
NIC 6
11
NIC
NIC 6
11 NIC
DISABLE1 7
10
NIC
NIC 7
10 VE2
GND1 8
9
GND2
TOP VIEW
(Not to Scale)
NIC = NO INTERNAL CONNECTION.
LEAVE THIS PIN FLOATING.
GND1 8
ADuM130E
TOP VIEW
(Not to Scale)
14 VOA
13 VOB
12 VOC
9
GND2
NIC = NO INTERNAL CONNECTION.
LEAVE THIS PIN FLOATING.
13348-005
VIC 5
ADuM130D
13348-004
VIB 4
Figure 8. ADuM130E Pin Configuration
Figure 7. ADuM130D Pin Configuration
Table 22. Pin Function Descriptions
Pin No. 1
ADuM130D
ADuM130E
1
1
2, 8
2, 8
3
3
4
4
5
5
6, 10, 11
6, 7, 11
7
Not applicable
Mnemonic
VDD1
GND1
VIA
VIB
VIC
NIC
DISABLE1
9, 15
Not applicable
9, 15
10
GND2
VE2
12
13
14
16
12
13
14
16
VOC
VOB
VOA
VDD2
1
Description
Supply Voltage for Isolator Side 1.
Ground 1. Ground reference for Isolator Side 1.
Logic Input A.
Logic Input B.
Logic Input C.
No Internal Connection. Leave these pins floating.
Input Disable 1. This pin disables the isolator inputs. Outputs take on the logic state
determined by the fail-safe option shown in the Ordering Guide.
Ground 2. Ground reference for Isolator Side 2.
Output Enable 2. Active high logic input. When VE2 is high or disconnected, the VOA, VOB,
and VOC outputs are enabled. When VE2 is low, the VOA, VOB, and VOC outputs are disabled
to the high-Z state.
Logic Output C.
Logic Output B.
Logic Output A.
Supply Voltage for Isolator Side 2.
Reference the AN-1109 Application Note for specific layout guidelines.
Rev. A | Page 15 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
VDD1 1
16
VDD2
VDD1 1
16 VDD2
GND1 2
15
GND2
GND1 2
15 GND2
VIA 3
14
VOA
VIA 3
13
VOB
VIB 4
12
VIC
VOC 5
NIC 6
11
NIC
NIC 6
11 NIC
DISABLE1 7
10
DISABLE2
VE1 7
10 VE2
GND1 8
9
GND2
TOP VIEW
(Not to Scale)
NIC = NO INTERNAL CONNECTION.
LEAVE THIS PIN FLOATING.
GND1 8
ADuM131E
TOP VIEW
(Not to Scale)
14 VOA
13 VOB
12 VIC
9
GND2
NIC = NO INTERNAL CONNECTION.
LEAVE THIS PIN FLOATING.
13348-105
VOC 5
ADuM131D
13348-104
VIB 4
Figure 10. ADuM131E Pin Configuration
Figure 9. ADuM131D Pin Configuration
Table 23. Pin Function Descriptions
Pin No. 1
ADuM131D
ADuM131E
1
1
2, 8
2, 8
3
3
4
4
5
5
6, 11
6, 11
7
Not applicable
Mnemonic
VDD1
GND1
VIA
VIB
VOC
NIC
DISABLE1
Not applicable
7
VE1
9, 15
10
9, 15
Not applicable
GND2
DISABLE2
Not applicable
10
VE2
12
13
14
16
12
13
14
16
VIC
VOB
VOA
VDD2
1
Description
Supply Voltage for Isolator Side 1.
Ground 1. Ground reference for Isolator Side 1.
Logic Input A.
Logic Input B.
Logic Output C.
No Internal Connection. Leave this pin floating.
Input Disable 1. This pin disables the isolator inputs. Outputs take on the logic state
determined by the fail-safe option shown in the Ordering Guide.
Output Enable 1. Active high logic input. When VE1 is high or disconnected, the VOC
output is enabled. When VE1 is low, the VOC output is disabled to the high-Z state.
Ground 2. Ground reference for Isolator Side 2.
Input Disable 2. This pin disables the isolator inputs. Outputs take on the logic state
determined by the fail-safe option shown in the Ordering Guide.
Output Enable 2. Active high logic input. When VE2 is high or disconnected, the VOA and
VOB outputs are enabled. When VE2 is low, the VOA and VOB outputs are disabled to the
high-Z state.
Logic Input C.
Logic Output B.
Logic Output A.
Supply Voltage for Isolator Side 2.
Reference the AN-1109 Application Note for specific layout guidelines.
Rev. A | Page 16 of 22
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
TYPICAL PERFORMANCE CHARACTERISTICS
16
12
10
8
6
4
2
8
6
4
120
140
160
16
10
8
6
4
40
60
80
100
120
140
160
DATA RATE (Mbps)
Figure 12. ADuM130D/ADuM130E IDD2 Supply Current vs. Data Rate at
Various Voltages
16
10
8
6
4
40
60
80
100
DATA RATE (Mbps)
120
140
160
Figure 13. ADuM131D/ADuM131E IDD1 Supply Current vs. Data Rate at
Various Voltages
140
160
5.0V
3.3V
2.5V
1.8V
8
6
4
2
12
–20
0
20
40
60
80
100
120
140
5.0V
3.3V
2.5V
1.8V
10
8
6
4
2
0
–40
13348-112
20
120
Figure 15. Propagation Delay (tPLH) vs. Temperature at Various Voltages
2
0
100
80
TEMPERATURE (°C)
PROPAGATION DELAY (tPHL ) (ns)
12
60
10
14
5.0V
3.3V
2.5V
1.8V
14
12
0
–40
13348-111
20
40
Figure 14. ADuM131D/ADuM131E IDD2 Supply Current vs. Data Rate at
Various Voltages
2
0
20
DATA RATE (Mbps)
PROPAGATION DELAY (tPLH) (ns)
12
0
0
14
5.0V
3.3V
2.5V
1.8V
14
0
13348-113
100
60
80
DATA RATE (Mbps)
13348-114
40
Figure 11. ADuM130D/ADuM130E IDD1 Supply Current vs. Data Rate at
Various Voltages
IDD2 SUPPLY CURRENT (mA)
10
–20
0
20
40
60
80
TEMPERATURE (°C)
100
120
140
13348-115
20
13348-110
0
IDD1 SUPPLY CURRENT (mA)
12
2
0
0
5.0V
3.3V
2.5V
1.8V
14
IDD2 SUPPLY CURRENT (mA)
14
IDD1 SUPPLY CURRENT (mA)
16
5.0V
3.3V
2.5V
1.8V
Figure 16. Propagation Delay( tPHL) vs. Temperature at Various Voltages
Rev. A | Page 17 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
APPLICATIONS INFORMATION
PRINTED CIRCUIT BOARD (PCB) LAYOUT
The ADuM130D/ADuM130E/ADuM131D/ADuM131E use a
high frequency carrier to transmit data across the isolation barrier
using iCoupler chip scale transformer coils separated by layers of
polyimide isolation. Using an on/off keying (OOK) technique
and the differential architecture shown in Figure 18 and Figure 19,
the ADuM130D/ADuM130E/ADuM131D/ADuM131E have very
low propagation delay and high speed. Internal regulators and
input/output design techniques allow logic and supply voltages
over a wide range from 1.7 V to 5.5 V, offering voltage translation
of 1.8 V, 2.5 V, 3.3 V, and 5 V logic. The architecture is designed
for high common-mode transient immunity and high immunity to
electrical noise and magnetic interference. Radiated emissions
are minimized with a spread spectrum OOK carrier and other
techniques.
The ADuM130D/ADuM130E/ADuM131D/ADuM131E digital
isolators require no external interface circuitry for the logic
interfaces. Power supply bypassing is strongly recommended at
the input and output supply pins (see Figure 17). Bypass capacitors
are most conveniently connected between Pin 1 and Pin 2 for
VDD1 and between Pin 15 and Pin 16 for VDD2. The recommended
bypass capacitor value is between 0.01 µF and 0.1 µF. The total
lead length between both ends of the capacitor and the input
power supply pin must not exceed 10 mm. Bypassing between
Pin 1 and Pin 8 and between Pin 9 and Pin 16 must also be
considered, unless the ground pair on each package side is
connected close to the package.
Figure 18 illustrates the waveforms for models of the ADuM130D/
ADuM130E/ADuM131D/ADuM131E that have the condition of
the fail-safe output state equal to low, where the carrier waveform is
off when the input state is low. If the input side is off or not
operating, the fail-safe output state of low (the ADuM130D0,
ADuM131D0, ADuM130E0, and ADuM131E0 models) sets the
output to low. For the ADuM130D/ADuM130E/ADuM131D/
ADuM131E that have a fail-safe output state of high, Figure 19
illustrates the conditions where the carrier waveform is off
when the input state is high. When the input side is off or not
operating, the fail-safe output state of high (the ADuM130D1,
ADuM131D1, ADuM130E1, and ADuM131E1 models) sets the
output to high. See the Ordering Guide for the model numbers
that have the fail-safe output state of low or the fail-safe output
state of high.
VDD1
GND1
VIA
VIB
VIC/VOC
NIC
DISABLE1/VE1
GND1
VDD2
GND2
VOA
VOB
VIC/VOC
NIC
DISABLE2/VE2
GND2
NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING.
13348-010
OVERVIEW
Figure 17. Recommended PCB Layout
In applications involving high common-mode transients, ensure
that board coupling across the isolation barrier is minimized.
Furthermore, design the board layout such that any coupling that
does occur equally affects all pins on a given component side.
Failure to ensure this can cause voltage differentials between pins
exceeding the Absolute Maximum Ratings of the device, thereby
leading to latch-up or permanent damage.
See the AN-1109 Application Note for board layout guidelines.
REGULATOR
REGULATOR
TRANSMITTER
RECEIVER
VIN
GND1
13348-014
VOUT
GND2
Figure 18. Operational Block Diagram of a Single Channel with a Low Fail-Safe Output State
REGULATOR
REGULATOR
TRANSMITTER
RECEIVER
VIN
GND1
GND2
Figure 19. Operational Block Diagram of a Single Channel with a High Fail-Safe Output State
Rev. A | Page 18 of 22
13348-015
VOUT
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
PROPAGATION DELAY RELATED PARAMETERS
INSULATION LIFETIME
Propagation delay is a parameter that describes the time it takes
a logic signal to propagate through a component. The propagation
delay to a Logic 0 output may differ from the propagation delay
to a Logic 1 output.
All insulation structures eventually break down when subjected to
voltage stress over a sufficiently long period. The rate of insulation
degradation is dependent on the characteristics of the voltage
waveform applied across the insulation as well as on the materials
and material interfaces.
INPUT (VIx)
50%
OUTPUT (VOx)
13348-011
tPHL
tPLH
50%
Figure 20. Propagation Delay Parameters
Pulse width distortion is the maximum difference between these
two propagation delay values and is an indication of how accurately
the timing of the input signal is preserved.
Channel matching is the maximum amount the propagation
delay differs between channels within a single ADuM130D/
ADuM130E/ADuM131D/ADuM131E component.
Propagation delay skew is the maximum amount the propagation
delay differs between multiple ADuM130D/ADuM130E/
ADuM131D/ADuM131E components operating under the
same conditions.
JITTER MEASUREMENT
Figure 21 shows the eye diagram for the ADuM130D/ADuM130E/
ADuM131D/ADuM131E. The measurement was taken using an
Agilent 81110A pulse pattern generator at 150 Mbps with pseudorandom bit sequences (PRBS), 2(n − 1), n = 14, for 5 V supplies.
Jitter was measured with the Tektronix Model 5104B oscilloscope,
at 1 GHz, 10 GSPS with the DPOJET jitter and eye diagram
analysis tools. The result shows a typical measurement on the
ADuM130D/ADuM130E/ADuM131D/ADuM131E with
630 ps p-p jitter.
5
Surface Tracking
Surface tracking is addressed in electrical safety standards by
setting a minimum surface creepage based on the working voltage,
the environmental conditions, and the properties of the insulation
material. Safety agencies perform characterization testing on the
surface insulation of components that allows the components to be
categorized in different material groups. Lower material group
ratings are more resistant to surface tracking and, therefore, can
provide adequate lifetime with smaller creepage. The minimum
creepage for a given working voltage and material group is in each
system level standard and is based on the total rms voltage across
the isolation, pollution degree, and material group. The material
group and creepage for the ADuM130D/ADuM130E/
ADuM131D/ADuM131E isolators are presented in Table 9.
Insulation Wear Out
The lifetime of insulation caused by wear out is determined by
its thickness, material properties, and the voltage stress applied.
It is important to verify that the product lifetime is adequate at
the application working voltage. The working voltage supported
by an isolator for wear out may not be the same as the working
voltage supported for tracking. It is the working voltage applicable
to tracking that is specified in most standards.
Testing and modeling have shown that the primary driver of
long-term degradation is displacement current in the polyimide
insulation causing incremental damage. The stress on the insulation can be broken down into broad categories, such as dc stress,
which causes very little wear out because there is no displacement
current, and an ac component time varying voltage stress, which
causes wear out.
3
2
1
0
–10
–5
0
TIME (ns)
5
10
13348-012
VOLTAGE (V)
4
The two types of insulation degradation of primary interest are
breakdown along surfaces exposed to the air and insulation wear
out. Surface breakdown is the phenomenon of surface tracking
and the primary determinant of surface creepage requirements
in system level standards. Insulation wear out is the phenomenon
where charge injection or displacement currents inside the
insulation material cause long-term insulation degradation.
Figure 21. Eye Diagram
Rev. A | Page 19 of 22
ADuM130D/ADuM130E/ADuM131D/ADuM131E
The working voltage across the barrier from Equation 1 is
The ratings in certification documents are usually based on
60 Hz sinusoidal stress because this reflects isolation from line
voltage. However, many practical applications have combinations
of 60 Hz ac and dc across the barrier as shown in Equation 1.
Because only the ac portion of the stress causes wear out, the
equation can be rearranged to solve for the ac rms voltage, as
shown in Equation 2. For insulation wear out with the polyimide
materials used in these products, the ac rms voltage determines
the product lifetime.
VRMS = VAC RMS2 + VDC 2
(1)
VAC RMS = VRMS 2 − VDC 2
(2)
VRMS = VAC RMS2 + VDC 2
VRMS = 2402 + 4002
VRMS = 466 V
This VRMS value is the working voltage used together with the
material group and pollution degree when looking up the
creepage required by a system standard.
To determine if the lifetime is adequate, obtain the time varying
portion of the working voltage. To obtain the ac rms voltage,
use Equation 2.
or
VAC RMS = VRMS 2 − VDC 2
where:
VAC RMS is the time varying portion of the working voltage.
VRMS is the total rms working voltage.
VDC is the dc offset of the working voltage.
VAC RMS = 4662 − 4002
VAC RMS = 240 V rms
In this case, the ac rms voltage is simply the line voltage of
240 V rms. This calculation is more relevant when the waveform is
not sinusoidal. The value is compared to the limits for working
voltage in Table 19 for the expected lifetime, less than a 60 Hz
sine wave, and it is well within the limit for a 50-year service life.
Calculation and Use of Parameters Example
The following example frequently arises in power conversion
applications. Assume that the line voltage on one side of the
isolation is 240 V ac rms and a 400 V dc bus voltage is present
on the other side of the isolation barrier. The isolator material is
polyimide. To establish the critical voltages in determining the
creepage, clearance, and lifetime of a device, see Figure 22 and
the following equations.
Note that the dc working voltage limit in Table 19 is set by the
creepage of the package as specified in IEC 60664-1. This value
can differ for specific system level standards.
VAC RMS
VPEAK
VRMS
VDC
TIME
Figure 22. Critical Voltage Example
Rev. A | Page 20 of 22
13348-013
ISOLATION VOLTAGE
Data Sheet
Data Sheet
ADuM130D/ADuM130E/ADuM131D/ADuM131E
OUTLINE DIMENSIONS
10.00 (0.3937)
9.80 (0.3858)
9
16
4.00 (0.1575)
3.80 (0.1496)
1
8
1.27 (0.0500)
BSC
0.50 (0.0197)
0.25 (0.0098)
1.75 (0.0689)
1.35 (0.0531)
0.25 (0.0098)
0.10 (0.0039)
COPLANARITY
0.10
6.20 (0.2441)
5.80 (0.2283)
SEATING
PLANE
0.51 (0.0201)
0.31 (0.0122)
45°
8°
0°
0.25 (0.0098)
0.17 (0.0067)
1.27 (0.0500)
0.40 (0.0157)
COMPLIANT TO JEDEC STANDARDS MS-012-AC
060606-A
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
Figure 23. 16-Lead Standard Small Outline Package [SOIC_N]
Narrow Body (R-16)
Dimensions shown in millimeters and (inches)
10.50 (0.4134)
10.10 (0.3976)
9
16
7.60 (0.2992)
7.40 (0.2913)
8
1.27 (0.0500)
BSC
0.30 (0.0118)
0.10 (0.0039)
COPLANARITY
0.10
0.51 (0.0201)
0.31 (0.0122)
10.65 (0.4193)
10.00 (0.3937)
0.75 (0.0295)
45°
0.25 (0.0098)
2.65 (0.1043)
2.35 (0.0925)
SEATING
PLANE
8°
0°
0.33 (0.0130)
0.20 (0.0079)
COMPLIANT TO JEDEC STANDARDS MS-013-AA
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
Figure 24. 16-Lead Standard Small Outline Package [SOIC_W]
Wide Body
(RW-16)
Dimensions shown in millimeters and (inches)
Rev. A | Page 21 of 22
1.27 (0.0500)
0.40 (0.0157)
03-27-2007-B
1
ADuM130D/ADuM130E/ADuM131D/ADuM131E
Data Sheet
ORDERING GUIDE
Model1
ADuM130D1BRZ
ADuM130D1BRZ-RL7
ADuM130D0BRZ
ADuM130D0BRZ-RL7
ADuM130E1BRZ
ADuM130E1BRZ-RL7
ADuM130E0BRZ
ADuM130E0BRZ-RL7
ADuM130D1BRWZ
ADuM130D1BRWZ-RL
ADuM130D0BRWZ
ADuM130D0BRWZ-RL
ADuM130E1BRWZ
ADuM130E1BRWZ-RL
ADuM130E0BRWZ
ADuM130E0BRWZ-RL
ADuM131D1BRZ
ADuM131D1BRZ-RL7
ADuM131D0BRZ
ADuM131D0BRZ-RL7
ADuM131E1BRZ
ADuM131E1BRZ-RL7
ADuM131E0BRZ
ADuM131E0BRZ-RL7
ADuM131D1BRWZ
ADuM131D1BRWZ-RL
ADuM131D0BRWZ
ADuM131D0BRWZ-RL
ADuM131E1BRWZ
ADuM131E1BRWZ-RL
ADuM131E0BRWZ
ADuM131E0BRWZ-RL
1
Temperature
Range
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
No. of
Inputs,
VDD1
Side
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
No. of
Inputs,
VDD2
Side
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
Withstand
Voltage
Rating
(kV rms)
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.75
3.75
3.75
3.75
3.75
3.75
3.75
3.75
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.75
3.75
3.75
3.75
3.75
3.75
3.75
3.75
Fail-Safe
Output
State
High
High
Low
Low
High
High
Low
Low
High
High
Low
Low
High
High
Low
Low
High
High
Low
Low
High
High
Low
Low
High
High
Low
Low
High
High
Low
Low
Z = RoHS Compliant Part.
©2015 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D13348-0-11/15(A)
Rev. A | Page 22 of 22
Input
Disable
Yes
Yes
Yes
Yes
No
No
No
No
Yes
Yes
Yes
Yes
No
No
No
No
Yes
Yes
Yes
Yes
No
No
No
No
Yes
Yes
Yes
Yes
No
No
No
No
Output
Enable
No
No
No
No
Yes
Yes
Yes
Yes
No
No
No
No
Yes
Yes
Yes
Yes
No
No
No
No
Yes
Yes
Yes
Yes
No
No
No
No
Yes
Yes
Yes
Yes
Package
Description
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_N
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
16-Lead SOIC_W
Package
Option
R-16
R-16
R-16
R-16
R-16
R-16
R-16
R-16
RW-16
RW-16
RW-16
RW-16
RW-16
RW-16
RW-16
RW-16
R-16
R-16
R-16
R-16
R-16
R-16
R-16
R-16
RW-16
RW-16
RW-16
RW-16
RW-16
RW-16
RW-16
RW-16