STMicroelectronics M36WT864B85ZA6T 64 mbit 4mb x16, multiple bank, burst flash memory and 8 mbit 512k x16 sram, multiple memory product Datasheet

M36WT864TF
M36WT864BF
64 Mbit (4Mb x16, Multiple Bank, Burst) Flash Memory
and 8 Mbit (512K x16) SRAM, Multiple Memory Product
PRODUCT PREVIEW
FEATURES SUMMARY
■ SUPPLY VOLTAGE
SRAM
8 Mbit (512K x 16 bit)
– VDDF = 1.65V to 2.2V
■
– VDDS = VDDQF = 2.7V to 3.3V
– VPPF = 12V for Fast Program (optional)
■
EQUAL CYCLE and ACCESS TIMES: 70ns
■
LOW STANDBY CURRENT
■
ACCESS TIME: 70, 85, 100ns
■
LOW VDDS DATA RETENTION: 1.5V
■
LOW POWER CONSUMPTION
■
TRI-STATE COMMON I/O
ELECTRONIC SIGNATURE
■
AUTOMATIC POWER DOWN
■
– Manufacturer Code: 20h
– Top Device Code, M36WT864TF: 8810h
Figure 1. Packages
– Bottom Device Code, M36WT864BF: 8811h
FLASH MEMORY
PROGRAMMING TIME
■
– 8µs by Word typical for Fast Factory Program
– Double/Quadruple Word Program option
FBGA
– Enhanced Factory Program options
■
MEMORY BLOCKS
– Multiple Bank Memory Array: 4 Mbit Banks
– Parameter Blocks (Top or Bottom location)
■
Stacked LFBGA96 (ZA)
8 x 14mm
DUAL OPERATIONS
– Program Erase in one Bank while Read in
others
– No delay between Read and Write operations
■
BLOCK LOCKING
– All blocks locked at Power up
– Any combination of blocks can be locked
– WP for Block Lock-Down
■
SECURITY
– 128 bit user programmable OTP cells
– 64 bit unique device number
– One parameter block permanently lockable
■
COMMON FLASH INTERFACE (CFI)
■
100,000 PROGRAM/ERASE CYCLES per
BLOCK
July 2002
This is preliminary information on a new product now in development. Details are subject to change without notice.
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M36WT864TF, M36WT864BF
TABLE OF CONTENTS
SUMMARY DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 2. Logic Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 1. Signal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 3. LFBGA Connections (Top view through package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
SIGNAL DESCRIPTIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Address Inputs (A0-A18). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Address Inputs (A19-A21). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Data Input/Output (DQ0-DQ15). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Chip Enable (EF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Output Enable (GF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Write Enable (WF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Write Protect (WPF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Reset (RPF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Latch Enable (LF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Clock (KF).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Flash Wait (WAITF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SRAM Chip Enable (E1S, E2S). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SRAM Write Enable (WS). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SRAM Output Enable (GS).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SRAM Upper Byte Enable (UBS). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SRAM Lower Byte Enable (LBS). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
VDDF Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
VDDQF and VDDS Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
VPPF Program Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
VSSF ,VSSQF and VSSS Grounds. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
FUNCTIONAL DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Figure 4. Functional Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Table 2. Main Operation Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Flash Memory Component . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
SRAM Component. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Table 3. Flash Bank Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 5. Flash Block Addresses. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
FLASH BUS OPERATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Bus Read. . . . . . . .
Bus Write. . . . . . . .
Address Latch.. . . .
Output Disable. . . .
Standby. . . . . . . . .
Reset. . . . . . . . . . .
......
......
......
......
......
......
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
FLASH COMMAND INTERFACE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
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M36WT864TF, M36WT864BF
Table 4. Command Codes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
COMMAND INTERFACE - STANDARD COMMANDS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Read Array Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Read Status Register Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Read Electronic Signature Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Read CFI Query Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Clear Status Register Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Block Erase Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Bank Erase Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Program/Erase Suspend Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Program/Erase Resume Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Protection Register Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Set Configuration Register Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Block Lock Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Block Unlock Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Block Lock-Down Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Table 5. Flash Standard Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Table 6. Electronic Signature Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Figure 6. Flash Security Block and Protection Register Memory Map . . . . . . . . . . . . . . . . . . . . . . 22
COMMAND INTERFACE - FACTORY PROGRAM COMMANDS . . . . . . . . . . . . . . . . . . . . . . . . . 23
Double Word Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Quadruple Word Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Enhanced Factory Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Setup Phase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Program Phase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Verify Phase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Exit Phase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Quadruple Enhanced Factory Program Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Setup Phase. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Load Phase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Program and Verify Phase. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Exit Phase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Table 7. Flash Factory Program Commands. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
FLASH STATUS REGISTER . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Program/Erase Controller Status Bit (SR7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Erase Suspend Status Bit (SR6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Erase Status Bit (SR5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Program Status Bit (SR4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
VPPF Status Bit (SR3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Program Suspend Status Bit (SR2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Block Protection Status Bit (SR1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Bank Write/Multiple Word Program Status Bit (SR0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Table 8. Flash Status Register Bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3/92
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FLASH CONFIGURATION REGISTER . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Read Select Bit (CR15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
X-Latency Bits (CR13-CR11) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Wait Polarity Bit (CR10). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Data Output Configuration Bit (CR9) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Wait Configuration Bit (CR8) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Burst Type Bit (CR7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Valid Clock Edge Bit (CR6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Wrap Burst Bit (CR3). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Burst length Bits (CR2-CR0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Table 9. Flash Configuration Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Table 10. Burst Type Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 7. X-Latency and Data Output Configuration Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 8. Wait Configuration Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
FLASH READ MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Asynchronous Read Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Synchronous Burst Read Mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Single Synchronous Read Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
FLASH DUAL OPERATIONS AND MULTIPLE BANK ARCHITECTURE. . . . . . . . . . . . . . . . . . . . . . 36
Table 11. Dual Operations Allowed In Other Banks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Table 12. Dual Operations Allowed In Same Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
FLASH BLOCK LOCKING. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Reading a Block’s Lock Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Locked State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Unlocked State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Lock-Down State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Locking Operations During Erase Suspend . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Table 13. Flash Lock Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
FLASH PROGRAM AND ERASE TIMES AND ENDURANCE CYCLES. . . . . . . . . . . . . . . . . . . . . . . 39
Table 14. Flash Program, Erase Times and Endurance Cycles . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
SRAM OPERATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Standby/Power-Down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Output Disable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
MAXIMUM RATING. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Table 15. Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
4/92
M36WT864TF, M36WT864BF
DC AND AC PARAMETERS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Table 16. Operating and AC Measurement Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Figure 9. AC Measurement I/O Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Figure 10. AC Measurement Load Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Table 17. Device Capacitance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Table 18. Flash DC Characteristics - Currents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Table 19. Flash DC Characteristics - Voltages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 20. SRAM DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Figure 11. Flash Asynchronous Random Access Read AC Waveforms . . . . . . . . . . . . . . . . . . . . . 45
Figure 12. Flash Asynchronous Page Read AC Waveforms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Table 21. Flash Asynchronous Read AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Figure 13. Flash Synchronous Burst Read AC Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Figure 14. Flash Single Synchronous Read AC Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Figure 15. Flash Clock input AC Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Table 22. Flash Synchronous Read AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Figure 16. Flash Write AC Waveforms, Write Enable Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Table 23. Flash Write AC Characteristics, Write Enable Controlled . . . . . . . . . . . . . . . . . . . . . . . . 52
Figure 17. Flash Write AC Waveforms, Chip Enable Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 24. Flash Write AC Characteristics, Chip Enable Controlled. . . . . . . . . . . . . . . . . . . . . . . . . 54
Figure 18. Flash Reset and Power-up AC Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Table 25. Flash Reset and Power-up AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Figure 19. SRAM Address Controlled, Read AC Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 20. SRAM Chip Enable or Output Enable Controlled, Read AC Waveforms . . . . . . . . . . . . 56
Figure 21. SRAM Chip Enable or UBS/LBS Controlled, Standby AC Waveforms . . . . . . . . . . . . . 57
Table 26. SRAM Read and Standby AC Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 22. SRAM Write AC Waveforms, Write Enable Controlled. . . . . . . . . . . . . . . . . . . . . . . . . . 58
Figure 23. SRAM Write AC Waveforms, Chip Enable Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Figure 24. SRAM Write AC Waveforms, UB/LB Controlled. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Table 27. SRAM Write AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Figure 25. SRAM Low VDD Data Retention AC Waveforms, E1S Controlled. . . . . . . . . . . . . . . . . 61
Figure 26. SRAM Low VDD Data Retention AC Waveforms, E2S Controlled. . . . . . . . . . . . . . . . . 61
Table 28. SRAM Low VDD Data Retention Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
PACKAGE MECHANICAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Figure 27. Stacked LFBGA96 - 8x14mm, 8x10ball array, 0.8mm pitch, Bottom View Package Outline
62
Table 29. Stacked LFBGA96 - 8x14mm, 8x10 ball array, 0.8mm pitch, Package Mechanical Data 62
PART NUMBERING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
Table 30. Ordering Information Scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 3
REVISION HISTORY. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
Table 31. Document Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
APPENDIX A. FLASH BLOCK ADDRESS TABLES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
5/92
M36WT864TF, M36WT864BF
Table 32. Flash Top Boot Block Addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Table 33. Flash Bottom Boot Block Addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
APPENDIX B. FLASH COMMON FLASH INTERFACE. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 34. Query Structure Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 35. CFI Query Identification String . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 36. CFI Query System Interface Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Table 37. Device Geometry Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Table 38. Primary Algorithm-Specific Extended Query Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Table 39. Protection Register Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 40. Burst Read Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 41. Bank and Erase Block Region Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 42. Bank and Erase Block Region 1 Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
Table 43. Bank and Erase Block Region 2 Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
APPENDIX C. FLASH FLOWCHARTS AND PSEUDO CODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
Figure 28. Program Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
Figure 29. Double Word Program Flowchart and Pseudo code . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Figure 30. Quadruple Word Program Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . 78
Figure 31. Program Suspend & Resume Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . 79
Figure 32. Block Erase Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Figure 33. Erase Suspend & Resume Flowchart and Pseudo Code. . . . . . . . . . . . . . . . . . . . . . . . 81
Figure 34. Locking Operations Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Figure 35. Protection Register Program Flowchart and Pseudo Code . . . . . . . . . . . . . . . . . . . . . . 83
Figure 36. Enhanced Factory Program Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Enhanced Factory Program Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Figure 37. Quadruple Enhanced Factory Program Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
Quadruple Enhanced Factory Program Pseudo Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
APPENDIX D. FLASH COMMAND INTERFACE STATE TABLES . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Table 44. Command Interface States - Modify Table, Next State . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Table 45. Command Interface States - Modify Table, Next Output . . . . . . . . . . . . . . . . . . . . . . . . . 89
Table 46. Command Interface States - Lock Table, Next State . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Table 47. Command Interface States - Lock Table, Next Output . . . . . . . . . . . . . . . . . . . . . . . . . . 91
6/92
M36WT864TF, M36WT864BF
SUMMARY DESCRIPTION
The M36WT864 is a low voltage Multiple Memory
Product which combines two memory devices; a
64 Mbit Multiple Bank Flash memory and an 8 Mbit
SRAM. Recommended operating conditions do
not allow both the Flash and the SRAM to be active at the same time.
The memory is offered in a Stacked LFBGA96 (8
x 14mm, 0.8 mm pitch) package and is supplied
with all the bits erased (set to ‘1’).
Figure 2. Logic Diagram
VDDS
VDDQF
VDDF
VPPF
22
16
A0-A21
Table 1. Signal Names
A0-A18
Address Inputs
A19-A21
Address Inputs for Flash Chip only
DQ0-DQ15
Data Input/Output
VDDF
Flash Power Supply
VDDQF
Flash Power Supply for I/O Buffers
VPPF
Flash Optional Supply Voltage for Fast
Program & Erase
VSSF
Flash Ground
VSSQF
Flash Ground for I/O Buffers
VDDS
SRAM Power Supply
VSSS
SRAM Ground
NC
Not Connected Internally
DU
Do Not Use as Internally Connected
DQ0-DQ15
EF
GF
WF
WAITF
Flash control functions
LF
Latch Enable input
EF
Chip Enable input
GF
Output Enable input
WF
Write Enable input
E2S
RPF
Reset input
GS
WPF
Write Protect input
WS
KF
Flash Burst Clock
WAITF
Wait Data in Burst Mode
RPF
WPF
LF
M36WT864TF
M36WT864BF
KF
E1S
UBS
LBS
SRAM control functions
VSSF
VSSS
VSSQF
AI06270
E1S, E2S
Chip Enable inputs
GS
Output Enable input
WS
Write Enable input
UBS
Upper Byte Enable input
LBS
Lower Byte Enable input
7/92
M36WT864TF, M36WT864BF
Figure 3. LFBGA Connections (Top view through package)
1
2
#A
NC
#B
3
4
5
6
7
8
NC
NC
NC
NC
NC
NC
NC
A
A4
A18
A19
VSSS
WS
KF
A21
A11
B
A5
LBS
NC
VSSS
E2S
VDDS
NC
A12
C
A3
A17
NC
VPPF
VDDF
VSSF
A9
A13
D
A2
A7
NC
WPF
LF
A20
A10
A15
E
A1
A6
UBS
RP
WF
A8
A14
A16
F
A0
DQ8
DQ2
DQ10
DQ5
DQ13
WAITF
DU
G
GS
DQ0
DQ1
DQ3
DQ12
DQ14
DQ7
DU
H
E1S
GF
DQ9
DQ11
DQ4
DQ6
DQ15
DU
J
EF
DU
DU
VDDS
VDDS
DU
VDDQF
VSSS
K
VSSS
VSSQF
VDDQF
VDDF
VSSS
VSSQF
VSSF
VSSS
#C
NC
NC
NC
NC
#D
NC
NC
NC
NC
AI06271
8/92
M36WT864TF, M36WT864BF
SIGNAL DESCRIPTIONS
See Figure 2 Logic Diagram and Table 1,Signal
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A18). Addresses
A0-A18
are common inputs for the Flash and the SRAM
components. The Address Inputs select the cells
in the memory array to access during Bus Read
operations. During Bus Write operations they control the commands sent to the Command Interface
of the internal state machine. The Flash memory is
accessed through the Chip Enable (EF) and Write
Enable (WF) signals, while the SRAM is accessed
through two Chip Enable signals (E1S and E2S)
and the Write Enable signal (WS).
Address Inputs (A19-A21). Addresses A19-A21
are inputs for the Flash component only. The
Flash memory is accessed through the Chip Enable (EF) and Write Enable (WF) signals.
Data Input/Output (DQ0-DQ15). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation or inputs a command
or the data to be programmed during a Write Bus
operation.
Flash Chip Enable (EF). The Chip Enable input
activates the memory control logic, input buffers,
decoders and sense amplifiers. When Chip Enable is at VILand Reset is at VIH the device is in active mode. When Chip Enable is at VIH the
memory is deselected, the outputs are high impedance and the power consumption is reduced to the
stand-by level.
Flash Output Enable (GF). The Output Enable
controls data outputs during the Bus Read operation of the memory.
Flash Write Enable (WF). The Write Enable
controls the Bus Write operation of the memory’s
Command Interface. The data and address inputs
are latched on the rising edge of Chip Enable or
Write Enable whichever occurs first.
Flash Write Protect (WPF). Write Protect is an
input that gives an additional hardware protection
for each block. When Write Protect is at VIL, the
Lock-Down is enabled and the protection status of
the Locked-Down blocks cannot be changed.
When Write Protect is at VIH, the Lock-Down is
disabled and the Locked-Down blocks can be
locked or unlocked. (refer to Table 13, Lock Status).
Flash Reset (RPF). The Reset input provides a
hardware reset of the memory. When Reset is at
VIL, the memory is in reset mode: the outputs are
high impedance and the current consumption is
reduced to the Reset Supply Current IDD2. Refer to
Table 2, DC Characteristics - Currents for the value of IDD2. After Reset all blocks are in the Locked
state and the Configuration Register is reset.
When Reset is at VIH, the device is in normal operation. Exiting reset mode the device enters
asynchronous read mode, but a negative transition of Chip Enable or Latch Enable is required to
ensure valid data outputs.
The Reset pin can be interfaced with 3V logic without any additional circuitry. It can be tied to VRPH
(refer to Table 19, DC Characteristics).
Flash Latch Enable (LF). Latch Enable latches
the address bits on its rising edge. The address
latch is transparent when Latch Enable is at VIL
and it is inhibited when Latch Enable is at VIH.
Latch Enable can be kept Low (also at board level)
when the Latch Enable function is not required or
supported.
Flash Clock (KF). The clock input synchronizes
the Flash memory to the microcontroller during
synchronous read operations; the address is
latched on a Clock edge (rising or falling, according to the configuration settings) when Latch Enable is at VIL. Clock is don't care during
asynchronous read and in write operations.
Flash Wait (WAITF). Wait is a Flash output signal
used during synchronous read to indicate whether
the data on the output bus are valid. This output is
high impedance when Flash Chip Enable is at VIH
or Flash Reset is at VIL. It can be configured to be
active during the wait cycle or one clock cycle in
advance. The WAITF signal is not gated by Output
Enable.
SRAM Chip Enable (E1S, E2S). The Chip Enable inputs activate the SRAM memory control
logic, input buffers and decoders. E1S at VIH or
E2S at VIL deselects the memory and reduces the
power consumption to the standby level. E1S and
E2S can also be used to control writing to the
SRAM memory array, while WS remains at VIL. It
is not allowed to set EF at VIL, E1S at VIL and E2S
at VIH at the same time.
SRAM Write Enable (WS). The Write Enable input controls writing to the SRAM memory array.
WS is active low.
SRAM Output Enable (GS). The Output Enable
gates the outputs through the data buffers during
a read operation of the SRAM memory. GS is active low.
SRAM Upper Byte Enable (UBS). The Upper
Byte Enable input enables the upper byte for
SRAM (DQ8-DQ15). UBS is active low.
SRAM Lower Byte Enable (LBS). The Lower
Byte Enable input enables the lower byte for
SRAM (DQ0-DQ7). LBS is active low.
VDDF Supply Voltage. VDDF provides the power
supply to the internal core of the Flash memory de-
9/92
M36WT864TF, M36WT864BF
vice. It is the main power supply for all Flash operations (Read, Program and Erase).
VDDQF and VDDS Supply Voltage. VDDQF provides the power supply for the Flash memory I/O
pins and VDDS provides the power supply for the
SRAM control and I/O pins. This allows all Outputs
to be powered independently from the Flash core
power supply, VDDF. VDDQF can be tied to VDDS or
it can use a separate supply.
VPPF Program Supply Voltage. VPPF is both a
Flash control input and a Flash power supply pin.
The two functions are selected by the voltage
range applied to the pin.
If VPPF is kept in a low voltage range (0V to VDDQF)
VPPF is seen as a control input. In this case a voltage lower than VPPLKF gives an absolute protection against program or erase, while VPPF > VPP1F
enables these functions (see Tables 18 and 19,
DC Characteristics for the relevant values). VPPF
10/92
is only sampled at the beginning of a program or
erase; a change in its value after the operation has
started does not have any effect and program or
erase operations continue.
If VPPF is in the range of VPPHF it acts as a power
supply pin. In this condition VPPF must be stable
until the Program/Erase algorithm is completed.
VSSF ,VSSQF and VSSS Grounds. VSSF, VSSQF
and VSSS are the ground references for all voltage
measurements in the Flash (core and I/O Buffers)
and SRAM chips, respectively.
Note: Each device in a system should have
VDDF and VPPF decoupled with a 0.1µF ceramic
capacitor close to the pin (high frequency, inherently low inductance capacitors should be
as close as possible to the package). See Figure 10, AC Measurement Load Circuit. The
PCB trace widths should be sufficient to carry
the required VPPF program and erase currents.
M36WT864TF, M36WT864BF
FUNCTIONAL DESCRIPTION
The Flash and SRAM components have separate
power supplies and grounds and are distinguished
by three chip enable inputs: EF for the Flash memory and, E1S and E2S for the SRAM.
Recommended operating conditions do not allow
both the Flash and the SRAM to be in active mode
at the same time. The most common example is
simultaneous read operations on the Flash and
the SRAM which would result in a data bus contention. Therefore it is recommended to put the
SRAM in the high impedance state when reading
the Flash and vice versa (see Table 2 Main Operation Modes for details).
Figure 4. Functional Block Diagram
VDDF VDDQF VPPF
EF
GF
WF
RPF
WPF
LF
Flash Memory
64 Mbit (x16)
WAITF
KF
A19-A21
A0-A18
VDDS
VSSQF VSSF
DQ0-DQ15
E1S
E2S
GS
WS
SRAM
8 Mbit (x 16)
UBS
LBS
VSSS
AI06272
11/92
M36WT864TF, M36WT864BF
Table 2. Main Operation Modes
EF
GF
WF
LF
RPF
Bus Read
VIL
VIL
VIH
VIL(2)
VIH
SRAM must be disabled
Data Output
Bus Write
VIL
VIH
VIL
VIL(2)
VIH
SRAM must be disabled
Data Input
Address
Latch
VIL
X
VIH
VIL
VIH
SRAM must be disabled
Data Output
or Hi-Z (3)
Output
Disable
VIL
VIH
VIH
X
VIH
SRAM must be disabled
Hi-Z
Standby
VIH
X
X
X
VIH
Hi-Z
Any SRAM mode is allowed
Hi-Z
X
X
X
X
VIL
Hi-Z
Any SRAM mode is allowed
Hi-Z
Flash Memory
Operation Mode
SRAM
Reset
WAITF
E1S
E2S
GS
WS
UBS, LBS
DQ15-DQ0
Read
Flash must be disabled
VIL
VIH
VIL
VIH
VIL
Data out
Word Read
Write
Flash must be disabled
VIL
VIH
X
VIL
VIL
Data in
Word Write
VIH
X
X
X
X
Hi-Z
X
VIL
X
X
X
Hi-Z
X
X
X
X
VIH
Hi-Z
Standby/
Power Down
Any Flash mode is allowable
Data
Retention
Any Flash mode is allowable
VIH
VIL
X
X
X
Hi-Z
Output
Disable
Any Flash mode is allowable
VIL
VIH
VIH
VIH
X
Hi-Z
Note: 1.
2.
3.
4.
12/92
X = Don't care.
L can be tied to VIH if the valid address has been previously latched.
Depends on G.
WAIT signal polarity is configured using the Set Configuration Register command.
M36WT864TF, M36WT864BF
Flash Memory Component
The Flash memory is a 64 Mbit (4Mbit x16) nonvolatile Flash memory that may be erased electrically at block level and programmed in-system on
a Word-by-Word basis using a 1.65V to 2.2V VDD
supply for the circuitry and a 1.65V to 3.3V VDDQ
supply for the Input/Output pins. An optional 12V
VPPF power supply is provided to speed up customer programming.
The device features an asymmetrical block architecture with an array of 135 blocks divided into 4
Mbit banks. There are 15 banks each containing 8
main blocks of 32 KWords, and one parameter
bank containing 8 parameter blocks of 4 KWords
and 7 main blocks of 32 KWords. The Multiple
Bank Architecture allows Dual Operations, while
programming or erasing in one bank, Read operations are possible in other banks. Only one bank at
a time is allowed to be in Program or Erase mode.
It is possible to perform burst reads that cross
bank boundaries. The bank architecture is summarized in Table 3, and the memory maps are
shown in Figure 5. The Parameter Blocks are located at the top of the memory address space for
the M36WT864TF, and at the bottom for the
M36WT864BF.
Each block can be erased separately. Erase can
be suspended, in order to perform program in any
other block, and then resumed. Program can be
suspended to read data in any other block and
then resumed. Each block can be programmed
and erased over 100,000 cycles using the supply
voltage VDD. There are two Enhanced Factory
programming commands available to speed up
programming.
Program and Erase commands are written to the
Command Interface of the memory. An internal
Program/Erase Controller takes care of the timings necessary for program and erase operations.
The end of a program or erase operation can be
detected and any error conditions identified in the
Status Register. The command set required to
control the memory is consistent with JEDEC standards.
The device supports synchronous burst read and
asynchronous read from all blocks of the memory
array; at power-up the device is configured for
asynchronous read. In synchronous burst mode,
data is output on each clock cycle at frequencies
of up to 54MHz.
The device features an Automatic Standby mode.
During asynchronous read operations, after a bus
inactivity of 150ns, the device automatically
switches to the Automatic Standby mode. In this
condition the power consumption is reduced to the
standby value IDD4 and the outputs are still driven.
The Flash memory features an instant, individual
block locking scheme that allows any block to be
locked or unlocked with no latency, enabling instant code and data protection. All blocks have
three levels of protection. They can be locked and
locked-down individually preventing any accidental programming or erasure. There is an additional
hardware protection against program and erase.
When VPPF ≤ VPPLK all blocks are protected
against program or erase. All blocks are locked at
Power- Up.
The device includes a Protection Register and a
Security Block to increase the protection of a system’s design. The Protection Register is divided
into two segments: a 64 bit segment containing a
unique device number written by ST, and a 128 bit
segment One-Time-Programmable (OTP) by the
user. The user programmable segment can be
permanently protected. The Security Block, parameter block 0, can be permanently protected by
the user. Figure 6, shows the Security Block and
Protection Register Memory Map.
SRAM Component
The SRAM is an 8 Mbit (512Kb x16) asynchronous
random access memory which features a super
low voltage operation and low current consumption with an access time of 70ns. The memory operations can be performed using a single low
voltage supply, 2.7V to 3.3V.
13/92
M36WT864TF, M36WT864BF
Table 3. Flash Bank Architecture
Parameter Bank
4 Mbits
8 blocks of 4 KWords
7 blocks of 32 KWords
Bank 0
4 Mbits
-
8 blocks of 32 KWords
Bank 1
4 Mbits
-
8 blocks of 32 KWords
Bank 2
4 Mbits
-
8 blocks of 32 KWords
----
Main Blocks
----
Parameter Blocks
----
Bank Size
----
Number
Bank 13
4 Mbits
-
8 blocks of 32 KWords
Bank 14
4 Mbits
-
8 blocks of 32 KWords
Figure 5. Flash Block Addresses
Bottom Boot Block
Address lines A21-A0
Top Boot Block
Address lines A21-A0
000000h
007FFFh
32 KWord
038000h
03FFFFh
32 KWord
Bank 14
300000h
307FFFh
8 Main
Blocks
Parameter
Bank
3F0000h
3F7FFFh
3F8000h
3F8FFFh
3FF000h
3FFFFFh
8 Parameter
Blocks
4KWord
32 KWord
7 Main
Blocks
32 KWord
32 KWord
8 Main
Blocks
32 KWord
32 KWord
8 Main
Blocks
Bank 1
0B8000h
0BFFFFh
0C0000h
0C7FFFh
32 KWord
Bank 0
3D8000h
3BFFFFh
3C0000h
3C7FFFh
078000h
07FFFFh
080000h
087FFFh
32 KWord
8 Main
Blocks
4 KWord
Bank 0
32 KWord
8 Main
Blocks
007000h
007FFFh
008000h
00FFFFh
038000h
03FFFFh
040000h
047FFFh
32 KWord
Bank 1
378000h
37FFFFh
380000h
387FFFh
Parameter
Bank
32 KWord
Bank 2
338000h
33FFFFh
340000h
377FFFh
000000h
000FFFh
8 Main
Blocks
32 KWord
32 KWord
8 Main
Blocks
Bank 2
32 KWord
0F8000h
0FFFFFh
32 KWord
3C0000h
3C7FFFh
32 KWord
3F8000h
3FFFFFh
32 KWord
32 KWord
7 Main
Blocks
32 KWord
4 KWord
8 Parameter
Blocks
4 KWord
8 Main
Blocks
Bank 14
AI06273
14/92
M36WT864TF, M36WT864BF
FLASH BUS OPERATIONS
There are six standard bus operations that control
the Flash device. These are Bus Read, Bus Write,
Address Latch, Output Disable, Standby and Reset. See Table 2, Main Operating Modes, for a
summary.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect Bus Write operations.
Bus Read. Bus Read operations are used to output the contents of the Memory Array, the Electronic Signature, the Status Register and the
Common Flash Interface. Both Chip Enable and
Output Enable must be at VIL in order to perform a
read operation. The Chip Enable input should be
used to enable the device. Output Enable should
be used to gate data onto the output. The data
read depends on the previous command written to
the memory (see Command Interface section).
See Figures 11, 12, 13 and 14 Read AC Waveforms, and Tables 21 and 22 Read AC Characteristics, for details of when the output becomes
valid.
Bus Write. Bus Write operations write Commands to the memory or latch Input Data to be
programmed. A bus write operation is initiated
when Chip Enable and Write Enable are at VIL with
Output Enable at VIH. Commands, Input Data and
Addresses are latched on the rising edge of Write
Enable or Chip Enable, whichever occurs first. The
addresses can also be latched prior to the write
operation by toggling Latch Enable. In this case
the Latch Enable should be tied to VIH during the
bus write operation.
See Figures 16 and 17, Write AC Waveforms, and
Tables 23 and 24, Write AC Characteristics, for
details of the timing requirements.
Address Latch. Address latch operations input
valid addresses. Both Chip enable and Latch Enable must be at VIL during address latch operations. The addresses are latched on the rising
edge of Latch Enable.
Output Disable. The outputs are high impedance when the Output Enable is at VIH.
Standby. Standby disables most of the internal
circuitry allowing a substantial reduction of the current consumption. The memory is in stand-by
when Chip Enable and Reset are at VIH. The power consumption is reduced to the stand-by level
and the outputs are set to high impedance, independently from the Output Enable or Write Enable
inputs. If Chip Enable switches to VIH during a program or erase operation, the device enters Standby mode when finished.
Reset. During Reset mode the memory is deselected and the outputs are high impedance. The
memory is in Reset mode when Reset is at VIL.
The power consumption is reduced to the Standby
level, independently from the Chip Enable, Output
Enable or Write Enable inputs. If Reset is pulled to
VSS during a Program or Erase, this operation is
aborted and the memory content is no longer valid.
15/92
M36WT864TF, M36WT864BF
FLASH COMMAND INTERFACE
All Bus Write operations to the memory are interpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. An internal Program/Erase Controller handles all timings and verifies the correct execution
of the Program and Erase commands. The Program/Erase Controller provides a Status Register
whose output may be read at any time to monitor
the progress or the result of the operation.
The Command Interface is reset to read mode
when power is first applied, when exiting from Reset or whenever VDD is lower than VLKO. Command sequences must be followed exactly. Any
invalid combination of commands will reset the device to read mode.
Refer to Table 4, Command Codes and Appendix
D, Tables 44, 45, 46 and 47, Command Interface
States - Modify and Lock Tables, for a summary of
the Command Interface.
The Command Interface is split into two types of
commands: Standard commands and Factory
Program commands. The following sections explain in detail how to perform each command.
16/92
Table 4. Command Codes
Hex Code
Command
01h
Block Lock Confirm
03h
Set Configuration Register Confirm
10h
Alternative Program Setup
20h
Block Erase Setup
2Fh
Block Lock-Down Confirm
30h
Enhanced Factory Program Setup
35h
Double Word Program Setup
40h
Program Setup
50h
Clear Status Register
56h
Quadruple Word Program Setup
60h
Block Lock Setup, Block Unlock Setup,
Block Lock Down Setup and Set
Configuration Register Setup
70h
Read Status Register
75h
Quadruple Enhanced Factory Program
Setup
80h
Bank Erase Setup
90h
Read Electronic Signature
98h
Read CFI Query
B0h
Program/Erase Suspend
C0h
Protection Register Program
D0h
Program/Erase Resume, Block Erase
Confirm, Bank Erase Confirm, Block
Unlock Confirm or Enhanced Factory
Program Confirm
FFh
Read Array
M36WT864TF, M36WT864BF
COMMAND INTERFACE - STANDARD COMMANDS
The following commands are the basic commands
Read CFI Query Command
used to read, write to and configure the device.
The Read CFI Query command is used to read
Refer to Table 5, Standard Commands, in condata from the Common Flash Interface (CFI). The
junction with the following text descriptions.
Read CFI Query Command consists of one Bus
Read Array Command
Write cycle, to an address within one of the banks.
Once the command is issued subsequent Bus
The Read Array command returns the addressed
Read operations in the same bank read from the
bank to Read Array mode. One Bus Write cycle is
Common Flash Interface.
required to issue the Read Array command and return the addressed bank to Read Array mode.
If a Read CFI Query command is issued in a bank
Subsequent read operations will read the adthat is executing a Program or Erase operation the
dressed location and output the data. A Read Arbank will go into Read CFI Query mode, subseray command can be issued in one bank while
quent Bus Read cycles will output the CFI data
programming or erasing in another bank. However
and the Program/Erase controller will continue to
if a Read Array command is issued to a bank curProgram or Erase in the background. This mode
rently executing a Program or Erase operation the
supports asynchronous or single synchronous
command will be executed but the output data is
reads only, it does not support page mode or synnot guaranteed.
chronous burst reads.
Read Status Register Command
The status of the other banks is not affected by the
command (see Table 11). After issuing a Read
The Status Register indicates when a Program or
CFI Query command, a Read Array command
Erase operation is complete and the success or
should be issued to the addressed bank to return
failure of operation itself. Issue a Read Status
the bank to Read Array mode.
Register command to read the Status Register
See Appendix C, Common Flash Interface, Tables
content. The Read Status Register command can
34, 35, 36, 37, 38, 40, 41, 42 and 43 for details on
be issued at any time, even during Program or
the information contained in the Common Flash InErase operations.
terface memory area.
The following read operations output the content
Clear Status Register Command
of the Status Register of the addressed bank. The
Status Register is latched on the falling edge of E
The Clear Status Register command can be used
or G signals, and can be read until E or G returns
to reset (set to ‘0’) error bits 1, 3, 4 and 5 in the Stato VIH. Either E or G must be toggled to update the
tus Register. One bus write cycle is required to islatched data. See Table 8 for the description of the
sue the Clear Status Register command. After the
Status Register Bits. This mode supports asynClear Status Register command the bank returns
chronous or single synchronous reads only.
to read mode.
Read Electronic Signature Command
The error bits in the Status Register do not autoThe Read Electronic Signature command reads
matically return to ‘0’ when a new command is isthe Manufacturer and Device Codes, the Block
sued. The error bits in the Status Register should
Locking Status, the Protection Register, and the
be cleared before attempting a new Program or
Configuration Register.
Erase command.
The Read Electronic Signature command consists
Block Erase Command
of one write cycle to an address within one of the
The Block Erase command can be used to erase
banks. A subsequent Read operation in the same
a block. It sets all the bits within the selected block
bank will output the Manufacturer Code, the Deto ’1’. All previous data in the block is lost. If the
vice Code, the protection Status of the blocks in
block is protected then the Erase operation will
the targeted bank, the Protection Register, or the
abort, the data in the block will not be changed and
Configuration Register (see Table 6).
the Status Register will output the error. The Block
If a Read Electronic Signature command is issued
Erase command can be issued at any moment, rein a bank that is executing a Program or Erase opgardless of whether the block has been proeration the bank will go into Read Electronic Siggrammed or not.
nature mode, subsequent Bus Read cycles will
Two Bus Write cycles are required to issue the
output the Electronic Signature data and the Procommand.
gram/Erase controller will continue to program or
■ The first bus cycle sets up the Erase command.
erase in the background. This mode supports
■ The second latches the block address in the
asynchronous or single synchronous reads only, it
internal state machine and starts the Program/
does not support page mode or synchronous burst
Erase Controller.
reads.
17/92
M36WT864TF, M36WT864BF
If the second bus cycle is not Write Erase Confirm
(D0h), Status Register bits 4 and 5 are set and the
command aborts. Erase aborts if Reset turns to
VIL. As data integrity cannot be guaranteed when
the Erase operation is aborted, the block must be
erased again.
Once the command is issued the device outputs
the Status Register data when any address within
the bank is read. At the end of the operation the
bank will remain in Read Status Register mode until a Read Array, Read CFI Query or Read Electronic Signature command is issued.
During Erase operations the bank containing the
block being erased will only accept the Read Array, Read Status Register, Read Electronic Signature, Read CFI Query and the Program/Erase
Suspend command, all other commands will be ignored. Refer to Dual Operations section for detailed information about simultaneous operations
allowed in banks not being erased. Typical Erase
times are given in Table 14, Program, Erase
Times and Program/Erase Endurance Cycles.
See Appendix C, Figure 32, Block Erase Flowchart and Pseudo Code, for a suggested flowchart
for using the Block Erase command.
Bank Erase Command
The Bank Erase command can be used to erase a
bank. It sets all the bits within the selected bank to
’1’. All previous data in the bank is lost. The Bank
Erase command will ignore any protected blocks
within the bank. If all blocks in the bank are protected then the Bank Erase operation will abort
and the data in the bank will not be changed. The
Status Register will not output any error.
Two Bus Write cycles are required to issue the
command.
■ The first bus cycle sets up the Bank Erase
command.
■ The second latches the bank address in the
internal state machine and starts the Program/
Erase Controller.
If the second bus cycle is not Write Bank Erase
Confirm (D0h), Status Register bits SR4 and SR5
are set and the command aborts. Erase aborts if
Reset turns to VIL. As data integrity cannot be
guaranteed when the Erase operation is aborted,
the bank must be erased again.
Once the command is issued the device outputs
the Status Register data when any address within
the bank is read. At the end of the operation the
bank will remain in Read Status Register mode until a Read Array, Read CFI Query or Read Electronic Signature command is issued.
During Bank Erase operations the bank being
erased will only accept the Read Array, Read Status Register, Read Electronic Signature and Read
18/92
CFI Query command, all other commands will be
ignored. A Bank Erase operation cannot be suspended.
Refer to Dual Operations section for detailed information about simultaneous operations allowed in
banks not being erased. Typical Erase times are
given in Table 14, Program, Erase Times and Program/Erase Endurance Cycles.
Program Command
The memory array can be programmed word-byword. Only one Word in one bank can be programmed at any one time. Two bus write cycles
are required to issue the Program Command.
■ The first bus cycle sets up the Program
command.
■ The second latches the Address and the Data to
be written and starts the Program/Erase
Controller.
After programming has started, read operations in
the bank being programmed output the Status
Register content.
During Program operations the bank being programmed will only accept the Read Array, Read
Status Register, Read Electronic Signature, Read
CFI Query and the Program/Erase Suspend command. Refer to Dual Operations section for detailed information about simultaneous operations
allowed in banks not being programmed. Typical
Program times are given in Table 14, Program,
Erase Times and Program/Erase Endurance Cycles.
Programming aborts if Reset goes to VIL. As data
integrity cannot be guaranteed when the program
operation is aborted, the memory location must be
reprogrammed.
See Appendix C, Figure 28, Program Flowchart
and Pseudo Code, for the flowchart for using the
Program command.
Program/Erase Suspend Command
The Program/Erase Suspend command is used to
pause a Program or Block Erase operation. A
Bank Erase operation cannot be suspended.
One bus write cycle is required to issue the Program/Erase command. Once the Program/Erase
Controller has paused bits SR7, SR6 and/ or SR2
of the Status Register will be set to ‘1’. The command can be addressed to any bank.
During Program/Erase Suspend the Command Interface will accept the Program/Erase Resume,
Read Array (cannot read the suspended block),
Read Status Register, Read Electronic Signature
and Read CFI Query commands. Additionally, if
the suspend operation was Erase then the Clear
status Register, Program, Block Lock, Block LockDown or Block Unlock commands will also be accepted. The block being erased may be protected
M36WT864TF, M36WT864BF
by issuing the Block Lock, Block Lock-Down or
Protection Register Program commands. Only the
blocks not being erased may be read or programmed correctly. When the Program/Erase Resume command is issued the operation will
complete. Refer to the Dual Operations section for
detailed information about simultaneous operations allowed during Program/Erase Suspend.
During a Program/Erase Suspend, the device can
be placed in standby mode by taking Chip Enable
to VIH. Program/Erase is aborted if Reset turns to
VIL.
See Appendix C, Figure 31, Program Suspend &
Resume Flowchart and Pseudo Code, and Figure
33, Erase Suspend & Resume Flowchart and
Pseudo Code for flowcharts for using the Program/
Erase Suspend command.
Program/Erase Resume Command
The Program/Erase Resume command can be
used to restart the Program/Erase Controller after
a Program/Erase Suspend command has paused
it. One Bus Write cycle is required to issue the
command. The command can be written to any
address.
The Program/Erase Resume command does not
change the read mode of the banks. If the suspended bank was in Read Status Register, Read
Electronic signature or Read CFI Query mode the
bank remains in that mode and outputs the corresponding data. If the bank was in Read Array
mode subsequent read operations will output invalid data.
If a Program command is issued during a Block
Erase Suspend, then the erase cannot be resumed until the programming operation has completed. It is possible to accumulate suspend
operations. For example: suspend an erase operation, start a programming operation, suspend the
programming operation then read the array. See
Appendix C, Figure 31, Program Suspend & Resume Flowchart and Pseudo Code, and Figure 33,
Erase Suspend & Resume Flowchart and Pseudo
Code for flowcharts for using the Program/Erase
Resume command.
Protection Register Program Command
The Protection Register Program command is
used to Program the 128 bit user One-Time-Programmable (OTP) segment of the Protection Register and the Protection Register Lock. The
segment is programmed 16 bits at a time. When
shipped all bits in the segment are set to ‘1’. The
user can only program the bits to ‘0’.
Two write cycles are required to issue the Protection Register Program command.
■ The first bus cycle sets up the Protection
Register Program command.
The second latches the Address and the Data to
be written to the Protection Register and starts
the Program/Erase Controller.
Read operations output the Status Register content after the programming has started.
The segment can be protected by programming bit
1 of the Protection Lock Register. Bit 1 of the Protection Lock Register also protects bit 2 of the Protection Lock Register. Programming bit 2 of the
Protection Lock Register will result in a permanent
protection of Parameter Block #0 (see Figure 6,
Security Block and Protection Register Memory
Map). Attempting to program a previously protected Protection Register will result in a Status Register error. The protection of the Protection
Register and/or the Security Block is not reversible.
The Protection Register Program cannot be suspended. See Appendix C, Figure 35, Protection
Register Program Flowchart and Pseudo Code,
for a flowchart for using the Protection Register
Program command.
Set Configuration Register Command.
The Set Configuration Register command is used
to write a new value to the Burst Configuration
Control Register which defines the burst length,
type, X latency, Synchronous/Asynchronous Read
mode and the valid Clock edge configuration.
Two Bus Write cycles are required to issue the Set
Configuration Register command.
■ The first cycle writes the setup command and
the address corresponding to the Configuration
Register content.
■ The second cycle writes the Configuration
Register data and the confirm command.
Once the command is issued the memory returns
to Read mode.
The value for the Configuration Register is always
presented on A0-A15. CR0 is on A0, CR1 on A1,
etc.; the other address bits are ignored.
Block Lock Command
The Block Lock command is used to lock a block
and prevent Program or Erase operations from
changing the data in it. All blocks are locked at
power-up or reset.
Two Bus Write cycles are required to issue the
Block Lock command.
■ The first bus cycle sets up the Block Lock
command.
■ The second Bus Write cycle latches the block
address.
The lock status can be monitored for each block
using the Read Electronic Signature command.
Table. 13 shows the Lock Status after issuing a
Block Lock command.
■
19/92
M36WT864TF, M36WT864BF
The Block Lock bits are volatile, once set they remain set until a hardware reset or power-down/
power-up. They are cleared by a Block Unlock
command. Refer to the section, Block Locking, for
a detailed explanation. See Appendix C, Figure
34, Locking Operations Flowchart and Pseudo
Code, for a flowchart for using the Lock command.
Block Unlock Command
The Block Unlock command is used to unlock a
block, allowing the block to be programmed or
erased. Two Bus Write cycles are required to issue the Block Unlock command.
■ The first bus cycle sets up the Block Unlock
command.
■ The second Bus Write cycle latches the block
address.
The lock status can be monitored for each block
using the Read Electronic Signature command.
Table 13 shows the protection status after issuing
a Block Unlock command. Refer to the section,
Block Locking, for a detailed explanation and Appendix C, Figure 34, Locking Operations Flowchart and Pseudo Code, for a flowchart for using
the Unlock command.
20/92
Block Lock-Down Command
A locked or unlocked block can be locked-down by
issuing the Block Lock-Down command. A lockeddown block cannot be programmed or erased, or
have its protection status changed when WP is
low, VIL. When WP is high, VIH, the Lock-Down
function is disabled and the locked blocks can be
individually unlocked by the Block Unlock command.
Two Bus Write cycles are required to issue the
Block Lock-Down command.
■ The first bus cycle sets up the Block Lock
command.
■ The second Bus Write cycle latches the block
address.
The lock status can be monitored for each block
using the Read Electronic Signature command.
Locked-Down blocks revert to the locked (and not
locked-down) state when the device is reset on
power-down. Table. 13 shows the Lock Status after issuing a Block Lock-Down command. Refer to
the section, Block Locking, for a detailed explanation and Appendix C, Figure 34, Locking Operations Flowchart and Pseudo Code, for a flowchart
for using the Lock-Down command.
M36WT864TF, M36WT864BF
Commands
Cycles
Table 5. Flash Standard Commands
Bus Operations
1st Cycle
2nd Cycle
Op.
Add
Data
Op.
Add
Data
Read Array
1+
Write
BKA
FFh
Read
WA
RD
Read Status Register
1+
Write
BKA
70h
Read
BKA(2)
SRD
Read Electronic Signature
1+
Write
BKA
90h
Read
BKA(2)
ESD
Read CFI Query
1+
Write
BKA
98h
Read
BKA(2)
QD
Clear Status Register
1
Write
BKA
50h
Block Erase
2
Write
BKA
20h
Write
BA
D0h
Bank Erase
2
Write
BKA
80h
Write
BKA
D0h
Program
2
Write
BKA
40h or 10h
Write
WA
PD
Program/Erase Suspend
1
Write
X
B0h
Program/Erase Resume
1
Write
X
D0h
Protection Register Program
2
Write
PRA
C0h
Write
PRA
PRD
Set Configuration Register
2
Write
CRD
60h
Write
CRD
03h
Block Lock
2
Write
BKA
60h
Write
BA
01h
Block Unlock
2
Write
BKA
60h
Write
BA
D0h
Block Lock-Down
2
Write
BKA
60h
Write
BA
2Fh
Note: 1. X = Don't Care, WA=Word Address in targeted bank, RD=Read Data, SRD=Status Register Data, ESD=Electronic Signature Data,
QD=Query Data, BA=Block Address, BKA= Bank Address, PD=Program Data, PRA=Protection Register Address, PRD=Protection
Register Data, CRD=Configuration Register Data.
2. Must be same bank as in the first cycle. The signature addresses are listed in Table 6.
21/92
M36WT864TF, M36WT864BF
Table 6. Electronic Signature Codes
Code
Address (h)
Data (h)
Bank Address + 00
0020
Top
Bank Address + 01
8810
Bottom
Bank Address + 01
8811
Manufacturer Code
Device Code
Lock
0001
Unlocked
0000
Block Protection
Block Address + 02
Locked and Locked-Down
0003
Unlocked and Locked-Down
0002
Reserved
Bank Address + 03
Reserved
Configuration Register
Bank Address + 05
CR
ST Factory Default
0006
Security Block Permanently Locked
Protection Register Lock
0002
Bank Address + 80
OTP Area Permanently Locked
Security Block and OTP Area Permanently
Locked
0004
0000
Bank Address + 81
Bank Address + 84
Unique Device
Number
Bank Address + 85
Bank Address + 8C
OTP Area
Protection Register
Note: CR=Configuration Register.
Figure 6. Flash Security Block and Protection Register Memory Map
PROTECTION REGISTER
8Ch
SECURITY BLOCK
User Programmable OTP
85h
84h
Parameter Block # 0
Unique device number
81h
80h
Protection Register Lock
2
1
0
AI06181
22/92
M36WT864TF, M36WT864BF
COMMAND INTERFACE - FACTORY PROGRAM COMMANDS
Five bus write cycles are necessary to issue the
The Factory Program commands are used to
Quadruple Word Program command.
speed up programming. They require V PPF to be at
VPPH. Refer to Table 7, Factory Program Com■ The first bus cycle sets up the Double Word
mands, in conjunction with the following text deProgram Command.
scriptions.
■ The second bus cycle latches the Address and
Double Word Program Command
the Data of the first word to be written.
The Double Word Program command improves
■ The third bus cycle latches the Address and the
the programming throughput by writing a page of
Data of the second word to be written.
two adjacent words in parallel. The two words
■ The fourth bus cycle latches the Address and
must differ only for the address A0.
the Data of the third word to be written.
Programming should not be attempted when VPPF
■ The fifth bus cycle latches the Address and the
is not at VPPH. The command can be executed if
Data of the fourth word to be written and starts
VPPF is below VPPH but the result is not guaranthe Program/Erase Controller.
teed.
Read
operations to the bank being programmed
Three bus write cycles are necessary to issue the
output the Status Register content after the proDouble Word Program command.
gramming has started.
■ The first bus cycle sets up the Double Word
Programming aborts if Reset goes to VIL. As data
Program Command.
integrity cannot be guaranteed when the program
■ The second bus cycle latches the Address and
operation is aborted, the memory locations must
the Data of the first word to be written.
be reprogrammed.
■ The third bus cycle latches the Address and the
During Quadruple Word Program operations the
Data of the second word to be written and starts
bank being programmed will only accept the Read
the Program/Erase Controller.
Array, Read Status Register, Read Electronic Signature and Read CFI Query command, all other
Read operations in the bank being programmed
commands will be ignored.
output the Status Register content after the programming has started.
Dual operations are not supported during Quadruple Word Program operations and it is not recomDuring Double Word Program operations the bank
mended to suspend a Quadruple Word Program
being programmed will only accept the Read Aroperation. Typical Program times are given in Taray, Read Status Register, Read Electronic Signable 14, Program, Erase Times and Program/Erase
ture and Read CFI Query command, all other
Endurance Cycles.
commands will be ignored. Dual operations are
not supported during Double Word Program operSee Appendix C, Figure 30, Quadruple Word Proations and it is not recommended to suspend a
gram Flowchart and Pseudo Code, for the flowDouble Word Program operation. Typical Program
chart for using the Quadruple Word Program
times are given in Table 14, Program, Erase
command.
Times and Program/Erase Endurance Cycles.
Enhanced Factory Program Command
Programming aborts if Reset goes to VIL. As data
The Enhanced Factory Program command can be
integrity cannot be guaranteed when the program
used to program large streams of data within any
operation is aborted, the memory locations must
one block. It greatly reduces the total programbe reprogrammed.
ming time when a large number of Words are writSee Appendix C, Figure 29, Double Word Proten to a block at any one time.
gram Flowchart and Pseudo Code, for the flowThe use of the Enhanced Factory Program comchart for using the Double Word Program
mand requires certain operating conditions.
command.
■ VPPF must be set to VPPH
Quadruple Word Program Command
■ VDD must be within operating range
The Quadruple Word Program command im■ Ambient temperature, TA must be 25°C ± 5°C
proves the programming throughput by writing a
page of four adjacent words in parallel. The four
■ The targeted block must be unlocked
words must differ only for the addresses A0 and
Dual operations are not supported during the EnA1.
hanced Factory Program operation and the comProgramming should not be attempted when VPPF
mand cannot be suspended.
is not at VPPH. The command can be executed if
For optimum performance the Enhanced Factory
VPPF is below VPPH but the result is not guaranProgram commands should be limited to a maxiteed.
mum of 10 program/erase cycles per block. If this
23/92
M36WT864TF, M36WT864BF
limit is exceeded the internal algorithm will continue to work properly but some degradation in performance is possible. Typical Program times are
given in Table 14.
The Enhanced Factory Program command has
four phases: the Setup Phase, the Program Phase
to program the data to the memory, the Verify
Phase to check that the data has been correctly
programmed and reprogram if necessary and the
Exit Phase. Refer to Table 7, Enhanced Factory
Program Command and Figure 36, Enhanced
Factory Program Flowchart.
Setup Phase. The Enhanced Factory Program
command requires two Bus Write operations to initiate the command.
■ The first bus cycle sets up the Enhanced
Factory Program command.
■ The second bus cycle confirms the command.
The Status Register P/E.C. Bit 7 should be read to
check that the P/E.C. is ready. After the confirm
command is issued, read operations output the
Status Register data. The read Status Register
command must not be issued as it will be
interpreted as data to program.
Program Phase. The Program Phase requires
n+1 cycles, where n is the number of Words (refer
to Table 7, Enhanced Factory Program Command
and Figure 36, Enhanced Factory Program Flowchart).
Three successive steps are required to issue and
execute the Program Phase of the command.
1. Use one Bus Write operation to latch the Start
Address and the first Word to be programmed.
The Status Register Bank Write Status bit SR0
should be read to check that the P/E.C. is ready
for the next Word.
2. Each subsequent Word to be programmed is
latched with a new Bus Write operation. The
address can either remain the Start Address, in
which case the P/E.C. increments the address
location or the address can be incremented in
which case the P/E.C. jumps to the new
address. If any address that is not in the same
block as the Start Address is given with data
FFFFh, the Program Phase terminates and the
Verify Phase begins. The Status Register bit
SR0 should be read between each Bus Write
cycle to check that the P/E.C. is ready for the
next Word.
3. Finally, after all Words have been programmed,
write one Bus Write operation with data FFFFh
to any address outside the block containing the
Start Address, to terminate the programming
phase. If the data is not FFFFh, the command is
ignored.
The memory is now set to enter the Verify Phase.
24/92
Verify Phase. The Verify Phase is similar to the
Program Phase in that all Words must be resent to
the memory for them to be checked against the
programmed data. The Program/Erase Controller
checks the stream of data with the data that was
programmed in the Program Phase and reprograms the memory location if necessary.
Three successive steps are required to execute
the Verify Phase of the command.
1. Use one Bus Write operation to latch the Start
Address and the first Word, to be verified. The
Status Register bit SR0 should be read to check
that the Program/Erase Controller is ready for
the next Word.
2. Each subsequent Word to be verified is latched
with a new Bus Write operation. The Words
must be written in the same order as in the
Program Phase. The address can remain the
Start Address or be incremented. If any address
that is not in the same block as the Start
Address is given, the Verify Phase terminates.
Status Register bit SR0 should be read to check
that the P/E.C. is ready for the next Word.
3. Finally, after all Words have been verified, write
one Bus Write operation with data FFFFh to any
address outside the block containing the Start
Address, to terminate the Verify Phase.
If the Verify Phase is successfully completed the
memory returns to the Read mode. If the Program/
Erase Controller fails to reprogram a given location, the error will be signaled in the Status Register.
Exit Phase. Status Register P/E.C. bit SR7 set to
‘1’ indicates that the device has returned to Read
mode. A full Status Register check should be done
to ensure that the block has been successfully programmed. See the section on the Status Register
for more details.
Quadruple Enhanced Factory Program
Command
The Quadruple Enhanced Factory Program command can be used to program one or more pages
of four adjacent words in parallel. The four words
must differ only for the addresses A0 and A1. VPPF
must be set to VPPH during Quadruple Enhanced
Factory Program.
It has four phases: the Setup Phase, the Load
Phase where the data is loaded into the buffer, the
combined Program and Verify Phase where the
loaded data is programmed to the memory and
then automatically checked and reprogrammed if
necessary and the Exit Phase. Unlike the Enhanced Factory Program it is not necessary to resubmit the data for the Verify Phase. The Load
Phase and the Program and Verify Phase can be
repeated to program any number of pages within
the block.
M36WT864TF, M36WT864BF
Setup Phase. The Quadruple Enhanced Factory
Program command requires one Bus Write operation to initiate the load phase. After the setup
command is issued, read operations output the
Status Register data. The Read Status Register
command must not be issued as it will be
interpreted as data to program.
Load Phase. The Load Phase requires 4 cycles
to load the data (refer to Table 7, Factory Program
Commands and Figure 37, Quadruple Enhanced
Factory Program Flowchart). Once the first Word
of each Page is written it is impossible to exit the
Load phase until all four Words have been written.
Two successive steps are required to issue and
execute the Load Phase of the Quadruple Enhanced Factory Program command.
1. Use one Bus Write operation to latch the Start
Address and the first Word of the first Page to
be programmed. For subsequent Pages the first
Word address can remain the Start Address (in
which case the next Page is programmed) or
can be any address in the same block. If any
address is given that is not in the same block as
the Start Address, the device enters the Exit
Phase. For the first Load Phase Status Register
bit SR7 should be read after the first Word has
been issued to check that the command has
been accepted (bit 7 set to ‘0’). This check is not
required for subsequent Load Phases. Status
Register bit SR0 should be read to check that
the P/E.C. is ready for the next Word.
2. Each subsequent Word to be programmed is
latched with a new Bus Write operation. The
address is only checked for the first Word of
each Page as the order of the Words to be
programmed is fixed. The Status Register bit
SR0 should be read between each Bus Write
cycle to check that the P/E.C. is ready for the
next Word.
The memory is now set to enter the Program and
Verify Phase.
Program and Verify Phase. In the Program and
Verify Phase the four Words that were loaded in
the Load Phase are programmed in the memory
array and then verified by the Program/Erase Controller. If any errors are found the Program/Erase
Controller reprograms the location. During this
phase the Status Register shows that the Program/Erase Controller is busy, Status Register bit
SR7 set to ‘0’, and that the device is not waiting for
new data, Status Register bit SR0 set to ‘1’. When
Status Register bit SR0 is set to ‘0’ the Program
and Verify phase has terminated.
Once the Verify Phase has successfully completed subsequent pages in the same block can be
loaded and programmed. The device returns to
the beginning of the Load Phase by issuing one
Bus Write operation to latch the Address and the
first of the four new Words to be programmed.
Exit Phase. Finally, after all the pages have been
programmed, write one Bus Write operation with
data FFFFh to any address outside the block containing the Start Address, to terminate the Load
and Program and Verify Phases.
If the Program and Verify Phase has successfully
completed the memory returns to Read mode. If
the P/E.C. fails to program and reprogram a given
location, the error will be signaled in the Status
Register.
Status Register bit SR7 set to ‘1’ and bit 0 set to ‘0’
indicate that the device has returned to Read
mode. A full Status Register check should be done
to ensure that the block has been successfully programmed. See the section on the Status Register
for more details.
25/92
M36WT864TF, M36WT864BF
Table 7. Flash Factory Program Commands
Phase
Cycles
Command
Bus Write Operations
1st
2nd
3rd
Final -1
Add
Data
Add
Data
Add
Data
Final
Add
Data
Add
Data
WA4
PD4
Double Word Program(4)
3
BKA
35h
WA1
PD1
WA2
PD2
Quadruple Word
Program(5)
5
BKA
56h
WA1
PD1
WA2
PD2
WA3
PD3
Setup,
Program
2
+n
+1
BKA
30h
BA
D0h
WA1(2)
PD1
WAn(3)
PAn
NOT
FFFFh
WA1(2)
Verify, Exit
n
(2)
+1 WA1
PD1
WA2(3)
PD2 WA3(3)
PD3
WAn(3)
PAn
NOT
FFFFh
WA1(2)
75h
WA1(2)
PD1 WA2(7)
PD2
WA3(7)
PD3
WA4(7)
PD4
WA4i
PD4i
Enhanced
Factory
Program
(6)
Setup,
first Load
Quadruple
Enhanced
Factory
Program
(5,6)
5
BKA
First
Program &
Verify
Subsequent
Loads
Automatic
4
WA1i
(2)
PD1i
Subsequent
Program &
Verify
Exit
WA2i
(7)
PD2i
WA3i
(7)
PD3i
(7)
Automatic
1
NOT
WA1
FFFFh
(2)
Note: 1.
2.
3.
4.
5.
6.
WA=Word Address in targeted bank, BKA= Bank Address, PD=Program Data, BA=Block Address.
WA1 is the Start Address. NOT WA1 is any address that is not in the same block as WA1.
Address can remain Starting Address WA1 or be incremented.
Word Addresses 1 and 2 must be consecutive Addresses differing only for A0.
Word Addresses 1,2,3 and 4 must be consecutive Addresses differing only for A0 and A1.
A Bus Read must be done between each Write cycle where the data is programmed or verified to read the Status Register and
check that the memory is ready to accept the next data. n = number of Words, i = number of Pages to be programmed.
7. Address is only checked for the first Word of each Page as the order to program the Words in each page is fixed so subsequent
Words in each Page can be written to any address.
26/92
M36WT864TF, M36WT864BF
FLASH STATUS REGISTER
The Flash memory contains a Status Register
which provides information on the current or previous Program or Erase operations. Issue a Read
Status Register command to read the contents of
the Status Register, refer to Read Status Register
Command section for more details. To output the
contents, the Status Register is latched and updated on the falling edge of the Chip Enable or Output
Enable signals and can be read until Chip Enable
or Output Enable returns to VIH. The Status Register can only be read using single asynchronous
or single synchronous reads. Bus Read operations from any address within the bank, always
read the Status Register during Program and
Erase operations.
The various bits convey information about the status and any errors of the operation. Bits SR7, SR6,
SR2 and SR0 give information on the status of the
device and are set and reset by the device. Bits
SR5, SR4, SR3 and SR1 give information on errors, they are set by the device but must be reset
by issuing a Clear Status Register command or a
hardware reset. If an error bit is set to ‘1’ the Status
Register should be reset before issuing another
command. SR7 to SR1 refer to the status of the
device while SR0 refers to the status of the addressed bank.
The bits in the Status Register are summarized in
Table 8, Status Register Bits. Refer to Table 8 in
conjunction with the following text descriptions.
Program/Erase Controller Status Bit (SR7).
The Program/Erase Controller Status bit indicates
whether the Program/Erase Controller is active or
inactive in any bank. When the Program/Erase
Controller Status bit is Low (set to ‘0’), the Program/Erase Controller is active; when the bit is
High (set to ‘1’), the Program/Erase Controller is
inactive, and the device is ready to process a new
command.
The Program/Erase Controller Status is Low immediately after a Program/Erase Suspend command is issued until the Program/Erase Controller
pauses. After the Program/Erase Controller pauses the bit is High.
During Program, Erase, operations the Program/
Erase Controller Status bit can be polled to find the
end of the operation. Other bits in the Status Register should not be tested until the Program/Erase
Controller completes the operation and the bit is
High.
After the Program/Erase Controller completes its
operation the Erase Status, Program Status, VPPF
Status and Block Lock Status bits should be tested
for errors.
Erase Suspend Status Bit (SR6). The
Erase
Suspend Status bit indicates that an Erase opera-
tion has been suspended or is going to be suspended in the addressed block. When the Erase
Suspend Status bit is High (set to ‘1’), a Program/
Erase Suspend command has been issued and
the memory is waiting for a Program/Erase Resume command.
The Erase Suspend Status should only be considered valid when the Program/Erase Controller Status bit is High (Program/Erase Controller inactive).
SR7 is set within the Erase Suspend Latency time
of the Program/Erase Suspend command being
issued therefore the memory may still complete
the operation rather than entering the Suspend
mode.
When a Program/Erase Resume command is issued the Erase Suspend Status bit returns Low.
Erase Status Bit (SR5). The Erase Status bit
can be used to identify if the memory has failed to
verify that the block or bank has erased correctly.
When the Erase Status bit is High (set to ‘1’), the
Program/Erase Controller has applied the maximum number of pulses to the block or bank and
still failed to verify that it has erased correctly. The
Erase Status bit should be read once the Program/
Erase Controller Status bit is High (Program/Erase
Controller inactive).
Once set High, the Erase Status bit can only be reset Low by a Clear Status Register command or a
hardware reset. If set High it should be reset before a new Program or Erase command is issued,
otherwise the new command will appear to fail.
Program Status Bit (SR4). The Program Status
bit is used to identify a Program failure. When the
Program Status bit is High (set to ‘1’), the Program/Erase Controller has applied the maximum
number of pulses to the byte and still failed to verify that it has programmed correctly. The Program
Status bit should be read once the Program/Erase
Controller Status bit is High (Program/Erase Controller inactive).
Once set High, the Program Status bit can only be
reset Low by a Clear Status Register command or
a hardware reset. If set High it should be reset before a new command is issued, otherwise the new
command will appear to fail.
VPPF Status Bit (SR3). The VPPF Status bit can
be used to identify an invalid voltage on the VPPF
pin during Program and Erase operations. The
VPPF pin is only sampled at the beginning of a Program or Erase operation. Indeterminate results
can occur if VPPF becomes invalid during an operation.
When the VPPF Status bit is Low (set to ‘0’), the
voltage on the VPPF pin was sampled at a valid
voltage; when the VPPF Status bit is High (set to
‘1’), the VPPF pin has a voltage that is below the
27/92
M36WT864TF, M36WT864BF
VPPF Lockout Voltage, VPPLK, the memory is protected and Program and Erase operations cannot
be performed.
Once set High, the VPPF Status bit can only be reset Low by a Clear Status Register command or a
hardware reset. If set High it should be reset before a new Program or Erase command is issued,
otherwise the new command will appear to fail.
Program Suspend Status Bit (SR2). The Program Suspend Status bit indicates that a Program
operation has been suspended in the addressed
block. When the Program Suspend Status bit is
High (set to ‘1’), a Program/Erase Suspend command has been issued and the memory is waiting
for a Program/Erase Resume command. The Program Suspend Status should only be considered
valid when the Program/Erase Controller Status
bit is High (Program/Erase Controller inactive).
SR2 is set within the Program Suspend Latency
time of the Program/Erase Suspend command being issued therefore the memory may still complete the operation rather than entering the
Suspend mode.
When a Program/Erase Resume command is issued the Program Suspend Status bit returns Low.
Block Protection Status Bit (SR1). The Block
Protection Status bit can be used to identify if a
Program or Block Erase operation has tried to
modify the contents of a locked block.
When the Block Protection Status bit is High (set
to ‘1’), a Program or Erase operation has been attempted on a locked block.
28/92
Once set High, the Block Protection Status bit can
only be reset Low by a Clear Status Register command or a hardware reset. If set High it should be
reset before a new command is issued, otherwise
the new command will appear to fail.
Bank Write/Multiple Word Program Status Bit
(SR0). The Bank Write Status bit indicates whether the addressed bank is programming or erasing.
In Enhanced Factory Program mode the Multiple
Word Program bit shows if a Word has finished
programming or verifying depending on the phase.
The Bank Write Status bit should only be considered valid when the Program/Erase Controller Status SR7 is Low (set to ‘0’).
When both the Program/Erase Controller Status bit
and the Bank Write Status bit are Low (set to ‘0’),
the addressed bank is executing a Program or
Erase operation. When the Program/Erase Controller Status bit is Low (set to ‘0’) and the Bank
Write Status bit is High (set to ‘1’), a Program or
Erase operation is being executed in a bank other
than the one being addressed.
In Enhanced Factory Program mode if Multiple
Word Program Status bit is Low (set to ‘0’), the device is ready for the next Word, if the Multiple Word
Program Status bit is High (set to ‘1’) the device is
not ready for the next Word.
Note: Refer to Appendix C, Flowcharts and Pseudo Codes, for using the Status Register.
M36WT864TF, M36WT864BF
Table 8. Flash Status Register Bits
Bit
SR7
SR6
SR5
SR4
SR3
SR2
SR1
Name
P/E.C. Status
Erase Suspend Status
Erase Status
Program Status
VPPF Status
Type
Logic Level
Definition
'1'
Ready
'0'
Busy
'1'
Erase Suspended
'0'
Erase In progress or Completed
'1'
Erase Error
'0'
Erase Success
'1'
Program Error
'0'
Program Success
'1'
VPPF Invalid, Abort
'0'
VPPF OK
'1'
Program Suspended
'0'
Program In Progress or Completed
'1'
Program/Erase on protected Block, Abort
'0'
No operation to protected blocks
Status
Status
Error
Error
Error
Program Suspend Status Status
Block Protection Status
Error
SR7 = ‘0’ Program or erase operation in addressed bank
'0'
SR7 = ‘1’ No Program or erase operation in the device
Bank Write Status
Status
SR7 = ‘0’
'1'
Program or erase operation in a bank other than
the addressed bank
SR7 = ‘1’ Not Allowed
SR0
SR7 = ‘0’
Multiple Word Program
Status (Enhanced
Factory Program mode)
the device is NOT ready for the next word
'1'
SR7 = ‘1’ Not Allowed
Status
SR7 = ‘0’
the device is ready for the next Word
'0'
SR7 = ‘1’ the device is exiting from EFP
Note: Logic level '1' is High, '0' is Low.
29/92
M36WT864TF, M36WT864BF
FLASH CONFIGURATION REGISTER
The Flash memory contains a Configuration Register which is used to configure the type of bus access that the memory will perform. Refer to Read
Modes section for details on read operations.
The Configuration Register is set through the
Command Interface. After a Reset or Power-Up
the device is configured for asynchronous page
read (CR15 = 1). The Configuration Register bits
are described in Table 9. They specify the selection of the burst length, burst type, burst X latency
and the Read operation. Refer to Figures 7 and 8
for examples of synchronous burst configurations.
Read Select Bit (CR15)
The Read Select bit, CR15, is used to switch between asynchronous and synchronous Bus Read
operations. When the Read Select bit is set to ’1’,
read operations are asynchronous; when the
Read Select bit is set to ’0’, read operations are
synchronous. Synchronous Burst Read is supported in both parameter and main blocks and can be
performed across banks.
On reset or power-up the Read Select bit is set
to’1’ for asynchronous access.
X-Latency Bits (CR13-CR11)
The X-Latency bits are used during Synchronous
Read operations to set the number of clock cycles
between the address being latched and the first
data becoming available. For correct operation the
X-Latency bits can only assume the values in Table 9, Configuration Register.
The correspondence between X-Latency settings
and the maximum sustainable frequency must be
calculated taking into account some system parameters. Two conditions must be satisfied:
1. Depending on whether tAVK_CPU or tDELAY is
supplied either one of the following two
equations must be satisfied:
(n + 1) tK ≥ tACC - tAVK_CPU + tQVK_CPU
(n + 2) tK ≥ tACC + tDELAY + tQVK_CPU
2. and also
tK > tKQV + tQVK_CPU
where
n is the chosen X-Latency configuration code
tK is the clock period
tAVK_CPU is clock to address valid, L Low, or E
Low, whichever occurs last
tDELAY is address valid, L Low, or E Low to clock,
whichever occurs last
tQVK_CPU is the data setup time required by the
system CPU,
tKQV is the clock to data valid time
tACC is the random access time of the device.
30/92
Refer to Figure 7, X-Latency and Data Output
Configuration Example.
Wait Polarity Bit (CR10)
In synchronous burst mode the Wait signal indicates whether the output data are valid or a WAIT
state must be inserted. The Wait Polarity bit is
used to set the polarity of the Wait signal. When
the Wait Polarity bit is set to ‘0’ the Wait signal is
active Low. When the Wait Polarity bit is set to ‘1’
the Wait signal is active High (default).
Data Output Configuration Bit (CR9)
The Data Output Configuration bit determines
whether the output remains valid for one or two
clock cycles. When the Data Output Configuration
Bit is ’0’ the output data is valid for one clock cycle,
when the Data Output Configuration Bit is ’1’ the
output data is valid for two clock cycles.
The Data Output Configuration depends on the
condition:
■ tK > tKQV + tQVK_CPU
where tK is the clock period, tQVK_CPU is the data
setup time required by the system CPU and tKQV
is the clock to data valid time. If this condition is not
satisfied, the Data Output Configuration bit should
be set to ‘1’ (two clock cycles). Refer to Figure 7,
X-Latency and Data Output Configuration Example.
Wait Configuration Bit (CR8)
In burst mode the Wait bit controls the timing of the
Wait output pin, WAIT. When the Wait bit is ’0’ the
Wait output pin is asserted during the wait state.
When the Wait bit is ’1’ (default) the Wait output
pin is asserted one clock cycle before the wait
state.
WAIT is asserted during a continuous burst and
also during a 4 or 8 burst length if no-wrap configuration is selected. WAIT is not asserted during
asynchronous reads, single synchronous reads or
during latency in synchronous reads.
Burst Type Bit (CR7)
The Burst Type bit is used to configure the sequence of addresses read as sequential or interleaved. When the Burst Type bit is ’0’ the memory
outputs from interleaved addresses; when the
Burst Type bit is ’1’ (default) the memory outputs
from sequential addresses. See Tables 10, Burst
Type Definition, for the sequence of addresses
output from a given starting address in each mode.
Valid Clock Edge Bit (CR6)
The Valid Clock Edge bit, CR6, is used to configure the active edge of the Clock, K, during Synchronous Burst Read operations. When the Valid
Clock Edge bit is ’0’ the falling edge of the Clock is
M36WT864TF, M36WT864BF
the active edge; when the Valid Clock Edge bit is
’1’ the rising edge of the Clock is active.
Wrap Burst Bit (CR3)
The burst reads can be confined inside the 4 or 8
Word boundary (wrap) or overcome the boundary
(no wrap). The Wrap Burst bit is used to select between wrap and no wrap. When the Wrap Burst bit
is set to ‘0’ the burst read wraps; when it is set to
‘1’ the burst read does not wrap.
Burst length Bits (CR2-CR0)
The Burst Length bits set the number of Words to
be output during a Synchronous Burst Read operation as result of a single address latch cycle.
They can be set for 4 words, 8 words or continuous burst, where all the words are read sequentially.
In continuous burst mode the burst sequence can
cross bank boundaries.
In continuous burst mode or in 4, 8 words no-wrap,
depending on the starting address, the device asserts the WAIT output to indicate that a delay is
necessary before the data is output.
If the starting address is aligned to a 4 word
boundary no wait states are needed and the WAIT
output is not asserted.
If the starting address is shifted by 1,2 or 3 positions from the four word boundary, WAIT will be
asserted for 1, 2 or 3 clock cycles when the burst
sequence crosses the first 64 word boundary, to
indicate that the device needs an internal delay to
read the successive words in the array. WAIT will
be asserted only once during a continuous burst
access. See also Table 10, Burst Type Definition.
CR14, CR5 and CR4 are reserved for future use.
31/92
M36WT864TF, M36WT864BF
Table 9. Flash Configuration Register
Bit
CR15
Description
Value
0
Synchronous Read
1
Asynchronous Read (Default at power-on)
Read Select
CR14
CR13-CR11
Description
Reserved
010
2 clock latency
011
3 clock latency
100
4 clock latency
101
5 clock latency
111
Reserved
X-Latency
Other configurations reserved
CR10
CR9
CR8
CR7
CR6
0
WAIT is active Low
1
WAIT is active high (default)
0
Data held for one clock cycle
1
Data held for two clock cycles
0
WAIT is active during wait state
1
WAIT is active one data cycle before wait state (default)
0
Interleaved
1
Sequential (default)
0
Falling Clock edge
1
Rising Clock edge
Wait Polarity
Data Output
Configuration
Wait Configuration
Burst Type
Valid Clock Edge
CR5-CR4
CR3
CR2-CR0
32/92
Reserved
0
Wrap
1
No Wrap
001
4 words
010
8 words
111
Continuous (CR7 must be set to ‘1’)
Wrap Burst
Burst Length
M36WT864TF, M36WT864BF
Mode
Table 10. Burst Type Definition
Start
Address
4 Words
8 Words
Continuous Burst
Sequential
Interleaved
Sequential
Interleaved
0
0-1-2-3
0-1-2-3
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6...
1
1-2-3-0
1-0-3-2
1-2-3-4-5-6-7-0
1-0-3-2-5-4-7-6
1-2-3-4-5-6-7...
2
2-3-0-1
2-3-0-1
2-3-4-5-6-7-0-1
2-3-0-1-6-7-4-5
2-3-4-5-6-7-8...
3
3-0-1-2
3-2-1-0
3-4-5-6-7-0-1-2
3-2-1-0-7-6-5-4
3-4-5-6-7-8-9...
7-4-5-6
7-6-5-4
7-0-1-2-3-4-5-6
7-6-5-4-3-2-1-0
7-8-9-10-11-12-13...
Wrap
...
7
...
60
60-61-62-63-64-65-66...
61
61-62-63-WAIT-64-65-66...
62
62-63-WAIT-WAIT-64-65-66...
63
63-WAIT-WAIT-WAIT-64-6566...
Sequential
Interleaved
Sequential
0
0-1-2-3
0-1-2-3-4-5-6-7
1
1-2-3-4
1-2-3-4-5-6-7-8
2
2-3-4-5
2-3-4-5-6-7-8-9...
3
3-4-5-6
3-4-5-6-7-8-9-10
7-8-9-10
7-8-9-10-11-12-13-14
60
60-61-62-63
60-61-62-63-64-65-6667
61
61-62-63-WAIT-64
61-62-63-WAIT-64-6566-67-68
62
62-63-WAITWAIT-64-65
62-63-WAIT-WAIT-6465-66-67-68-69
63
63-WAIT-WAITWAIT-64-65-66
63-WAIT-WAIT-WAIT64-65-66-67-68-69-70
Interleaved
No-wrap
...
7
...
Same as for Wrap
(Wrap /No Wrap
has no effect on
Continuous Burst )
33/92
M36WT864TF, M36WT864BF
Figure 7. X-Latency and Data Output Configuration Example
X-latency
1st cycle
2nd cycle
3rd cycle
4th cycle
K
E
L
A21-A0
tDELAY
VALID ADDRESS
tAVK_CPU
tQVK_CPU
tK
tKQV
tACC
tQVK_CPU
DQ15-DQ0
VALID DATA VALID DATA
Note. Settings shown: X-latency = 4, Data Output held for one clock cycle
AI06182
Figure 8. Wait Configuration Example
E
K
L
A21-A0
DQ15-DQ0
VALID ADDRESS
VALID DATA VALID DATA
NOT VALID
VALID DATA
WAIT
CR8 = '0'
CR10 = '0'
WAIT
CR8 = '1'
CR10 = '0'
WAIT
CR8 = '0'
CR10 = '1'
WAIT
CR8 = '1'
CR10 = '1'
AI06972
34/92
M36WT864TF, M36WT864BF
FLASH READ MODES
Flash Read operations can be performed in two
different ways depending on the settings in the
Configuration Register. If the clock signal is ‘don’t
care’ for the data output, the read operation is
Asynchronous; if the data output is synchronized
with clock, the read operation is Synchronous.
The Read mode and data output format are determined by the Configuration Register. (See Configuration Register section for details). All banks
supports both asynchronous and synchronous
read operations. The Multiple Bank architecture
allows read operations in one bank, while write operations are being executed in another (see Tables 11 and 12).
Asynchronous Read Mode
In Asynchronous Read operations the clock signal
is ‘don’t care’. The device outputs the data corresponding to the address latched, that is the memory array, Status Register, Common Flash
Interface or Electronic Signature depending on the
command issued. CR15 in the Configuration Register must be set to ‘1’ for Asynchronous operations.
In Asynchronous Read mode a Page of data is internally read and stored in a Page Buffer. The
Page has a size of 4 Words and is addressed by
A0 and A1 address inputs. The address inputs A0
and A1 are not gated by Latch Enable in Asynchronous Read mode.
The first read operation within the Page has a
longer access time (Tacc, Random access time),
subsequent reads within the same Page have
much shorter access times. If the Page changes
then the normal, longer timings apply again.
Asynchronous Read operations can be performed
in two different ways, Asynchronous Random Access Read and Asynchronous Page Read. Only
Asynchronous Page Read takes full advantage of
the internal page storage so different timings are
applied.
See Table 21, Asynchronous Read AC Characteristics, Figure 11, Asynchronous Random Access
Read AC Waveform and Figure 12, Asynchronous
Page Read AC Waveform for details.
Synchronous Burst Read Mode
In Synchronous Burst Read mode the data is output in bursts synchronized with the clock. It is possible to perform burst reads across bank
boundaries.
Synchronous Burst Read mode can only be used
to read the memory array. For other read operations, such as Read Status Register, Read CFI
and Read Electronic Signature, Single Synchronous Read or Asynchronous Random Access
Read must be used.
In Synchronous Burst Read mode the flow of the
data output depends on parameters that are configured in the Configuration Register.
A burst sequence is started at the first clock edge
(rising or falling depending on Valid Clock Edge bit
CR6 in the Configuration Register) after the falling
edge of Latch Enable. Addresses are internally incremented and after a delay of 2 to 5 clock cycles
(X latency bits CR13-CR11) the corresponding
data are output on each clock cycle.
The number of Words to be output during a Synchronous Burst Read operation can be configured
as 4 or 8 Words or Continuous (Burst Length bits
CR2-CR0). The data can be configured to remain
valid for one or two clock cycles (Data Output Configuration bit CR9).
The order of the data output can be modified
through the Burst Type and the Wrap Burst bits in
the Configuration Register. The burst sequence
may be configured to be sequential or interleaved
(CR7). The burst reads can be confined inside the
4 or 8 Word boundary (Wrap) or overcome the
boundary (No Wrap). If the starting address is
aligned to a 4 Word Page the wrapped configuration has no impact on the output sequence. Interleaved mode is not allowed in Continuous Burst
Read mode or with No Wrap sequences.
A WAIT signal may be asserted to indicate to the
system that an output delay will occur. This delay
will depend on the starting address of the burst sequence; the worst case delay will occur when the
sequence is crossing a 64 word boundary and the
starting address was at the end of a four word
boundary.
WAIT is asserted during X latency and the Wait
state and is only deasserted when output data are
valid. In Continuous Burst Read mode a Wait state
will occur when crossing the first 64 Word boundary. If the burst starting address is aligned to a 4
Word Page, the Wait state will not occur.
The WAIT signal can be configured to be active
Low or active High (default) by setting CR10 in the
Configuration Register. The WAIT signal is meaningful only in Synchronous Burst Read mode, in
other modes, WAIT is always asserted (except for
Read Array mode).
See Table 22, Synchronous Read AC Characteristics and Figure 13, Synchronous Burst Read AC
Waveform for details.
Single Synchronous Read Mode
Single Synchronous Read operations are similar
to Synchronous Burst Read operations except that
only the first data output after the X latency is valid.
Other Configuration Register parameters have no
effect on Single Synchronous Read operations.
35/92
M36WT864TF, M36WT864BF
Synchronous Single Reads are used to read the
Electronic Signature, Status Register, CFI, Block
Protection Status, Configuration Register Status
or Protection Register. When the addressed bank
is in Read CFI, Read Status Register or Read
Electronic Signature mode, the WAIT signal is always asserted.
See Table 22, Synchronous Read AC Characteristics and Figure 14, Single Synchronous Read AC
Waveform for details.
FLASH DUAL OPERATIONS AND MULTIPLE BANK ARCHITECTURE
then a Program command can be issued to anothThe Multiple Bank Architecture of the Flash memer block, so the device can have one block in
ory provides flexibility for software developers by
Erase Suspend mode, one programming and othallowing code and data to be split with 4Mbit graner banks in Read mode. Bus Read operations are
ularity. The Dual Operations feature simplifies the
allowed in another bank between setup and consoftware management of the device and allows
firm cycles of program or erase operations. The
code to be executed from one bank while another
combination of these features means that read opbank is being programmed or erased.
erations are possible at any moment.
The Dual operations feature means that while programming or erasing in one bank, Read operaTables 11 and 12 show the dual operations possitions are possible in another bank with zero
ble in other banks and in the same bank. Note that
latency (only one bank at a time is allowed to be in
only the commonly used commands are repreProgram or Erase mode). If a Read operation is resented in these tables. For a complete list of posquired in a bank which is programming or erasing,
sible commands refer to Appendix D, Command
the Program or Erase operation can be suspendInterface State Tables.
ed. Also if the suspended operation was Erase
Table 11. Dual Operations Allowed In Other Banks
Commands allowed in another bank
Read
Array
Read
Status
Register
Read
CFI
Query
Idle
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Programming
Yes
Yes
Yes
Yes
–
–
Yes
–
Erasing
Yes
Yes
Yes
Yes
–
–
Yes
–
Program Suspended
Yes
Yes
Yes
Yes
–
–
–
Yes
Erase Suspended
Yes
Yes
Yes
Yes
Yes
–
–
Yes
Status of bank
Read
Electronic Program
Signature
Erase
Program/ Program/
Erase
Erase
Suspend Resume
Table 12. Dual Operations Allowed In Same Bank
Commands allowed in same bank
Status of bank
Read
Array
Read
Read
Read
Status
Electronic Program
CFI Query
Register
Signature
Erase
Program/ Program/
Erase
Erase
Suspend Resume
Idle
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Programming
–(2)
Yes
Yes
Yes
–
–
Yes
–
Erasing
–(2)
Yes
Yes
Yes
–
–
Yes
–
Program Suspended
Yes(1)
Yes
Yes
Yes
–
–
–
Yes
Erase Suspended
Yes(1)
Yes
Yes
Yes
Yes(1)
–
–
Yes
Note: 1. Not allowed in the Block or Word that is being erased or programmed.
2. The Read Array command is accepted but the data output is not guaranteed until the Program or Erase has completed.
36/92
M36WT864TF, M36WT864BF
FLASH BLOCK LOCKING
The Flash memory features an instant, individual
block locking scheme that allows any block to be
locked or unlocked with no latency. This locking
scheme has three levels of protection.
■ Lock/Unlock - this first level allows softwareonly control of block locking.
■
■
Lock-Down - this second level requires
hardware interaction before locking can be
changed.
VPPF ≤ VPPLK - the third level offers a complete
hardware protection against program and erase
on all blocks.
The protection status of each block can be set to
Locked, Unlocked, and Lock-Down. Table 13, defines all of the possible protection states (WP,
DQ1, DQ0), and Appendix C, Figure 34, shows a
flowchart for the locking operations.
Reading a Block’s Lock Status
The lock status of every block can be read in the
Read Electronic Signature mode of the device. To
enter this mode write 90h to the device. Subsequent reads at the address specified in Table 6,
will output the protection status of that block. The
lock status is represented by DQ0 and DQ1. DQ0
indicates the Block Lock/Unlock status and is set
by the Lock command and cleared by the Unlock
command. It is also automatically set when entering Lock-Down. DQ1 indicates the Lock-Down status and is set by the Lock-Down command. It
cannot be cleared by software, only by a hardware
reset or power-down.
The following sections explain the operation of the
locking system.
Locked State
The default status of all blocks on power-up or after a hardware reset is Locked (states (0,0,1) or
(1,0,1)). Locked blocks are fully protected from
any program or erase. Any program or erase operations attempted on a locked block will return an
error in the Status Register. The Status of a
Locked block can be changed to Unlocked or
Lock-Down using the appropriate software commands. An Unlocked block can be Locked by issuing the Lock command.
Unlocked State
Unlocked blocks (states (0,0,0), (1,0,0) (1,1,0)),
can be programmed or erased. All unlocked
blocks return to the Locked state after a hardware
reset or when the device is powered-down. The
status of an unlocked block can be changed to
Locked or Locked-Down using the appropriate
software commands. A locked block can be unlocked by issuing the Unlock command.
Lock-Down State
Blocks that are Locked-Down (state (0,1,x))are
protected from program and erase operations (as
for Locked blocks) but their protection status cannot be changed using software commands alone.
A Locked or Unlocked block can be Locked-Down
by issuing the Lock-Down command. LockedDown blocks revert to the Locked state when the
device is reset or powered-down.
The Lock-Down function is dependent on the WP
input pin. When WP=0 (VIL), the blocks in the
Lock-Down state (0,1,x) are protected from program, erase and protection status changes. When
WP=1 (VIH) the Lock-Down function is disabled
(1,1,x) and Locked-Down blocks can be individually unlocked to the (1,1,0) state by issuing the software command, where they can be erased and
programmed. These blocks can then be re-locked
(1,1,1) and unlocked (1,1,0) as desired while WP
remains high. When WP is low , blocks that were
previously Locked-Down return to the Lock-Down
state (0,1,x) regardless of any changes made
while WP was high. Device reset or power-down
resets all blocks , including those in Lock-Down, to
the Locked state.
Locking Operations During Erase Suspend
Changes to block lock status can be performed
during an erase suspend by using the standard
locking command sequences to unlock, lock or
lock-down a block. This is useful in the case when
another block needs to be updated while an erase
operation is in progress.
To change block locking during an erase operation, first write the Erase Suspend command, then
check the status register until it indicates that the
erase operation has been suspended. Next write
the desired Lock command sequence to a block
and the lock status will be changed. After completing any desired lock, read, or program operations,
resume the erase operation with the Erase Resume command.
If a block is locked or locked-down during an erase
suspend of the same block, the locking status bits
will be changed immediately, but when the erase
is resumed, the erase operation will complete.
Locking operations cannot be performed during a
program suspend. Refer to Appendix , Command
Interface State Table, for detailed information on
which commands are valid during erase suspend.
37/92
M36WT864TF, M36WT864BF
Table 13. Flash Lock Status
Current
Protection Status(1)
(WP, DQ1, DQ0)
Next Protection Status(1)
(WP, DQ1, DQ0)
Current State
Program/Erase
Allowed
After
Block Lock
Command
After
Block Unlock
Command
After Block
Lock-Down
Command
After
WP transition
1,0,0
yes
1,0,1
1,0,0
1,1,1
0,0,0
1,0,1(2)
no
1,0,1
1,0,0
1,1,1
0,0,1
1,1,0
yes
1,1,1
1,1,0
1,1,1
0,1,1
1,1,1
no
1,1,1
1,1,0
1,1,1
0,1,1
0,0,0
yes
0,0,1
0,0,0
0,1,1
1,0,0
0,0,1(2)
no
0,0,1
0,0,0
0,1,1
1,0,1
0,1,1
no
0,1,1
0,1,1
0,1,1
1,1,1 or 1,1,0 (3)
Note: 1. The lock status is defined by the write protect pin and by DQ1 (‘1’ for a locked-down block) and DQ0 (‘1’ for a locked block) as read
in the Read Electronic Signature command with A1 = VIH and A0 = VIL.
2. All blocks are locked at power-up, so the default configuration is 001 or 101 according to WP status.
3. A WP transition to VIH on a locked block will restore the previous DQ0 value, giving a 111 or 110.
38/92
M36WT864TF, M36WT864BF
FLASH PROGRAM AND ERASE TIMES AND ENDURANCE CYCLES
The Program and Erase times and the number of
of Program/ Erase cycles depends on the voltage
Program/ Erase cycles per block are shown in Tasupply used.
ble 14. In the Flash memory the maximum number
Table 14. Flash Program, Erase Times and Endurance Cycles
Typ
Typical after
100k W/E
Cycles
Max
Unit
0.3
1
2.5
s
Preprogrammed
0.8
3
4
s
Not Preprogrammed
1.1
4
s
Parameter
Condition
Min
Parameter Block (4 KWord) Erase(2)
Main Block (32 KWord) Erase
Preprogrammed
3
s
4.5
s
Parameter Block (4 KWord) Program(3)
40
ms
Main Block (32 KWord) Program(3)
300
ms
Word Program (3)
10
Program Suspend Latency
Erase Suspend Latency
Bank (4Mbit) Erase
VPPF = VDD
Not Preprogrammed
10
100
µs
5
10
µs
5
20
µs
Main Blocks
100,000
cycles
Parameter Blocks
100,000
cycles
Program/Erase Cycles (per Block)
Parameter Block (4 KWord) Erase
0.3
2.5
s
Main Block (32 KWord) Erase
0.9
4
s
Bank (4Mbit) Erase
3.5
s
t.b.a.(4)
s
510
ms
VPPF = VPPH
Bank (4Mbit) Program (Quad-Enhanced Factory Program)
4Mbit Program
Quadruple Word
Word/ Double Word/ Quadruple Word Program(3)
8
Parameter Block (4 KWord)
Program(3)
Quadruple Word
8
ms
Word
32
ms
Quadruple Word
64
ms
Word
256
ms
Main Block (32 KWord) Program(3)
100
µs
Main Blocks
1000
cycles
Parameter Blocks
2500
cycles
Program/Erase Cycles (per Block)
Note: 1.
2.
3.
4.
TA = –40 to 85°C; VDD = 1.65V to 2.2V; VDDQ = 1.65V to 3.3V.
The difference between Preprogrammed and not preprogrammed is not significant (‹30ms).
Excludes the time needed to execute the command sequence.
t.b.a. = to be announced
39/92
M36WT864TF, M36WT864BF
SRAM OPERATIONS
There are five standard operations that control the
SRAM component. These are Bus Read, Bus
Write, Standby/Power-down, Data Retention and
Output Disable. A summary is shown in Table 2,
Main Operation Modes
Read. Read operations are used to output the
contents of the SRAM Array. The data is output either by x8 (DQ0-DQ7) or x16 (DQ0-DQ15) depending on which of the LBS and UBS signals are
enabled. The SRAM is in Read mode whenever
Chip Enable, E2S, and Write Enable, WS, are at
VIH, and Output Enable, GS, and Chip Enable E1S
are at VIL.
Valid data will be available on the output pins after
a time of tAVQV after the last stable address. If the
Chip Enable or Output Enable access times are
not met, data access will be measured from the
limiting parameter (tELQV, tEHQV, or tGLQV) rather
than the address. Data out may be indeterminate
at tELQX, tGLQX and tBLQX, but data lines will always be valid at tAVQV (see Table 26, Figures 19
and 20).
Write. Write operations are used to write data to
the SRAM. The SRAM is in Write mode whenever
Write Enable, WS, and Chip Enable, E1S, are at
VIL, and Chip Enable, E2S, is at VIH.
Either the Chip Enable input, E1S or the Write Enable input, WS, must be deasserted during address transitions for subsequent write cycles.
A Write operation is initiated when E1S is at VIL,
E2S is at VIH and WS is at VIL. When UBS or LBS
are Low, the data is latched on the falling edge of
E1S, or WS, whichever occurs first. When UBS or
40/92
LBS are High, the data is latched on the falling
edge of UBS, or LBS , whichever occurs first.
The Write cycle is terminated on the rising edge of
E1S, WS , UBS or LBS, whichever occurs first.
If the Output is enabled (E1S=VIL, E2S=VIH,
GS=VIL and UBS=LBS=VIL), then WS will return
the outputs to high impedance within tWLQZ of its
falling edge. Care must be taken to avoid bus contention in this type of operation. The Data input
must be valid for tDVWH before the rising edge of
Write Enable, for tDVEH before the rising edge of
E1S or for tDVBH before the rising edge of UBS/
LBS, whichever occurs first, and remain valid for
tWHDX, tEHDX and tBHDX respectively.
(see Table 27, Figure 22, 23 and 24).
Standby/Power-Down. The SRAM component
has a chip enabled power-down feature which invokes an automatic standby mode (see Table 26,
Figure 19). The SRAM is in Standby mode whenever either Chip Enable is deasserted, E1S at VIH
or E2S at VIL.
Data Retention. The SRAM data retention performances as VDDS go down to VDR are described
in Table 28 and Figures 25 and 26. In E1S controlled data retention mode, the minimum standby
current mode is entered when E1S ≥ VDDS – 0.2V
and E2S ≤ 0.2V or E2S ≥ VDDS – 0.2V. In E2S
controlled data retention mode, minimum standby
current mode is entered when E2S ≤ 0.2V.
Output Disable. The SRAM is in the output disable state when GS and WS are both at VIH, refer
to Table 2 for more details.
M36WT864TF, M36WT864BF
MAXIMUM RATING
Stressing the device above the rating listed in the
Absolute Maximum Ratings table may cause permanent damage to the device. These are stress
ratings only and operation of the device at these or
any other conditions above those indicated in the
Operating sections of this specification is not im-
plied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device
reliability. Refer also to the STMicroelectronics
SURE Program and other relevant quality documents.
Table 15. Absolute Maximum Ratings
Value
Symbol
Min
Max
Unit
Ambient Operating Temperature
–40
85
°C
TBIAS
Temperature Under Bias
–40
125
°C
TSTG
Storage Temperature
–65
155
°C
Input or Output Voltage
–0.5
VDDQF+0.6
V
Supply Voltage
–0.2
2.45
V
Input/Output Supply Voltage
–0.2
3.3
V
Program Voltage
–0.2
14
V
Output Short Circuit Current
100
mA
Time for VPPF at VPPFH
100
hours
TA
VIO
VDDF
VDDQF / VDDS
VPPF
IO
tVPPFH
Parameter
41/92
M36WT864TF, M36WT864BF
DC AND AC PARAMETERS
This section summarizes the operating measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Conditions summarized in Table 16, Operating
and AC Measurement Conditions. Designers
should check that the operating conditions in their
circuit match the operating conditions when relying on the quoted parameters.
Table 16. Operating and AC Measurement Conditions
SRAM
Flash Memory
70
70/ 85/ 100
Parameter
Units
Min
Max
Min
Max
–
–
1.65
2.2
V
2.7
3.3
2.7
3.3
V
VPPF Supply Voltage (Factory environment)
11.4
12.6
V
VPPF Supply Voltage (Application environment)
-0.4
VDDQ+0
.4
V
– 40
85
°C
VDD Supply Voltage
VDDQ Supply Voltage
Ambient Operating Temperature
– 40
85
Load Capacitance (CL)
30
30
Input Rise and Fall Times
pF
2
Input Pulse Voltages
Input and Output Timing Ref. Voltages
5
ns
0 to VDDF
0 to VDDQ
V
VDDF/2
VDDQ/2
V
Figure 10. AC Measurement Load Circuit
Figure 9. AC Measurement I/O Waveform
VDDQF
VDDF
VDDF/2
VDDQF
VDDF
0V
16.7kΩ
AI06110
DEVICE
UNDER
TEST
Note: VDDF = VDDS
CL
0.1µF
16.7kΩ
0.1µF
CL includes JIG capacitance
AI06274
Table 17. Device Capacitance
Symbol
CIN
COUT
Parameter
Input Capacitance
Output Capacitance
Note: Sampled only, not 100% tested.
42/92
Test Condition
Min
Max
Unit
VIN = 0V
6
8
pF
VOUT = 0V
8
12
pF
M36WT864TF, M36WT864BF
Table 18. Flash DC Characteristics - Currents
Symbol
Parameter
Test Condition
ILI
Input Leakage Current
ILO
Output Leakage Current
Supply Current
Asynchronous Read (f=6MHz)
IDD1
Supply Current
Synchronous Read (f=40MHz)
Supply Current
Synchronous Read (f=54MHz)
Min
Typ
Max
Unit
0V ≤ VIN ≤ VDDQ
±1
µA
0V ≤ VOUT ≤ VDDQ
±1
µA
E = VIL, G = VIH
3
6
mA
4 Word
6
13
mA
8 Word
8
14
mA
Continuous
6
10
mA
4 Word
7
16
mA
8 Word
10
18
mA
Continuous
13
25
mA
RP = VSS ± 0.2V
10
50
µA
IDD2
Supply Current
(Reset)
IDD3
Supply Current (Standby)
E = VDD ± 0.2V
10
50
µA
IDD4
Supply Current (Automatic
Standby)
E = VIL, G = VIH
10
50
µA
VPPF = VPPH
8
15
mA
VPPF = VDD
10
20
mA
VPPF = VPPH
8
15
mA
VPPF = VDD
10
20
mA
Program/Erase in one
Bank, Asynchronous
Read in another Bank
13
26
mA
Program/Erase in one
Bank, Synchronous
Read in another Bank
16
30
mA
E = VDD ± 0.2V
10
50
µA
VPPF = VPPH
2
5
mA
VPPF = VDD
0.2
5
µA
VPPF = VPPH
2
5
mA
VPPF = VDD
0.2
5
µA
VPPF = VPPH
100
400
µA
VPPF ≤ VDD
0.2
5
µA
VPPF ≤ VDD
0.2
5
µA
Supply Current (Program)
IDD5 (1)
Supply Current (Erase)
IDD6 (1,2)
IDD7(1)
Supply Current
(Dual Operations)
Supply Current Program/ Erase
Suspended (Standby)
VPPF Supply Current (Program)
IPP1(1)
VPPF Supply Current (Erase)
IPP2
IPP3(1)
VPPF Supply Current (Read)
VPPF Supply Current (Standby)
Note: 1. Sampled only, not 100% tested.
2. VDD Dual Operation current is the sum of read and program or erase currents.
43/92
M36WT864TF, M36WT864BF
Table 19. Flash DC Characteristics - Voltages
Symbol
Parameter
Test Condition
Min
Typ
Max
Unit
VIL
Input Low Voltage
–0.5
0.4
V
VIH
Input High Voltage
VDDQ –0.4
VDDQ + 0.4
V
VOL
Output Low Voltage
IOL = 100µA
0.1
V
VOH
Output High Voltage
IOH = –100µA
VDDQ –0.1
VPP1
VPPF Program Voltage-Logic
Program, Erase
1
1.8
1.95
V
VPPH
VPPF Program Voltage Factory
Program, Erase
11.4
12
12.6
V
VPPLK
Program or Erase Lockout
0.9
V
VLKO
VDD Lock Voltage
VRPH
RP pin Extended High Voltage
V
1
V
3.3
V
Max
Unit
35
mA
4
mA
20
µA
Table 20. SRAM DC Characteristics
Symbol
Parameter
IDD1 (1,2)
Operating Supply Current
IDD2 (3)
Operating Supply Current
ISB
Standby Supply Current CMOS
ILI
Input Leakage Current
ILO
Output Leakage Current
VIH
Test Condition
VDDS = 3.3V, f = 1/tAVAV,
IOUT = 0mA
Min
Typ
70ns
VDDS = 3.3V, f = 1MHz,
IOUT = 0mA
VDDS = 3.3V, f = 0,
E1 ≥ VDDS –0.2V or E2 ≤ 0.2V or
LB=UB ≥ VDDS –0.2V
1
0V ≤ VIN ≤ VDDS
–1
1
µA
0V ≤ VOUT ≤ VDDS (4)
–1
1
µA
Input High Voltage
2.2
VDDS +
0.3
V
VIL
Input Low Voltage
–0.3
0.6
V
VOH
Output High Voltage
IOH = –1.0mA
VOL
Output Low Voltage
IOL = 2.1mA
Note: 1.
2.
3.
4.
44/92
2.4
Average AC current, cycling at tAVAV minimum.
E1 = VIL AND E2 = VIH, LB OR/AND UB = VIL, VIN = VIL OR VIH.
E1 ≤ 0.2V AND E2 ≥ VDDS –0.2V, LB OR/AND UB ≤ 0.2V, VIN ≤ 0.2V OR VIN ≥ VDDS –0.2V.
Output disabled.
V
0.4
V
Hi-Z
Hi-Z
tELLH
tLLLH
tAVLH
tELQV
tAVQV
tELTV
tGLQV
tAVAV
Outputs Enabled
tGLQX
tLHGL
tLLQV
tLHAX
tELQX
VALID
Valid Address Latch
Note. Write Enable, WF, is High, WAIT is active Low.
DQ0-DQ15
WAITF
GF
EF
LF
A0-A21
Data Valid
VALID
tAXQX
tEHTZ
tGHQZ
tGHQX
tEHQX
tEHQZ
Standby
VALID
AI06275
M36WT864TF, M36WT864BF
Figure 11. Flash Asynchronous Random Access Read AC Waveforms
45/92
46/92
Hi-Z
Note 1. WAIT is active Low.
DQ0-DQ15
WAITF(1)
GF
EF
LF
A0-A1
A2-A21
tELTV
tELQX
tGLQV
tGLQX
tELQV
tLLQV
Valid Address Latch
tELLH
tLLLH
tAVLH
VALID ADDRESS
tAVAV
Enabled
Outputs
tLHGL
tLHAX
VALID DATA
VALID DATA
VALID ADDRESS
Valid Data
VALID DATA
tAVQV1
VALID ADDRESS
VALID ADDRESS
VALID DATA
VALID ADDRESS
Standby
AI06276
M36WT864TF, M36WT864BF
Figure 12. Flash Asynchronous Page Read AC Waveforms
M36WT864TF, M36WT864BF
Table 21. Flash Asynchronous Read AC Characteristics
Symbol
Alt
Read Timings
70
85
100
Unit
tAVAV
tRC
Address Valid to Next Address Valid
Min
70(3)
85
100
ns
tAVQV
tACC
Address Valid to Output Valid (Random)
Max
70(3)
85
100
ns
tAVQV1
tPAGE
Address Valid to Output Valid (Page)
Max
20(3)
25
25
ns
tAXQX (1)
tOH
Address Transition to Output Transition
Min
0
0
0
ns
Chip Enable Low to Wait Valid
Max
14(3)
18
18
ns
tELTV
Latch Timings
M36WT864TF/BF
Parameter
(2)
tCE
Chip Enable Low to Output Valid
Max
70(3)
85
100
ns
tELQX (1)
tLZ
Chip Enable Low to Output Transition
Min
0
0
0
ns
Chip Enable High to Wait Hi-Z
Max
20(3)
20
20
ns
tELQV
tEHTZ
tEHQX (1)
tOH
Chip Enable High to Output Transition
Min
0
0
0
ns
tEHQZ (1)
tHZ
Chip Enable High to Output Hi-Z
Max
20(3)
20
20
ns
tGLQV (2)
tOE
Output Enable Low to Output Valid
Max
20
25
25
ns
tGLQX (1)
tOLZ
Output Enable Low to Output Transition
Min
0
0
0
ns
tGHQX (1)
tOH
Output Enable High to Output Transition
Min
0
0
0
ns
tGHQZ (1)
tDF
Output Enable High to Output Hi-Z
Max
20(3)
20
20
ns
tAVLH
tAVADVH
Address Valid to Latch Enable High
Min
10
10
10
ns
tELLH
tELADVH
Chip Enable Low to Latch Enable High
Min
10
10
10
ns
tLHAX
tADVHAX
Latch Enable High to Address Transition
Min
10
10
10
ns
Min
10
10
10
ns
tLLLH
tADVLADVH Latch Enable Pulse Width
tLLQV
tADVLQV
Latch Enable Low to Output Valid (Random)
Max
70(3)
85
100
ns
tLHGL
tADVHGL
Latch Enable High to Output Enable Low
Min
0
0
0
ns
Note: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV - tGLQV after the falling edge of E without increasing tELQV.
3. To be characterized.
47/92
48/92
Hi-Z
tELKH
Hi-Z
tLLLH
Address
Latch
tELTV
tKHAX
tAVKH
tLLKH
tAVLH
VALID ADDRESS
X Latency
tGLQX
Note 2
tKHTV
Note 1
tKHQV
VALID
Valid Data Flow
tKHQV
VALID
Note 2
tKHTX
tKHQX
tKHQX
VALID
Note 1. The number of clock cycles to be inserted depends on the X latency set in the Configuration Register.
2. The WAIT signal can be configured to be active during wait state or one cycle before. WAIT signal is active Low.
3. Address latched and data output on the rising clock edge.
WAITF
GF
EF
KF
LF
A0-A21
DQ0-DQ15
Boundary
Crossing
Note 2
tKHTV
tKHTX
tKHQV
tKHQX
NOT VALID
Data
Valid
tGHQZ
tGHQX
Standby
tEHTZ
AI06277
tEHQZ
tEHQX
tEHEL
VALID
M36WT864TF, M36WT864BF
Figure 13. Flash Synchronous Burst Read AC Waveforms
Hi-Z
tELKH
Hi-Z
tLLLH
tELTV
tKHAX
tAVKH
tLLKH
tAVLH
VALID ADDRESS
tGLQV
tGLQX
Note 1
Note 3
tKHTV
tKHQV
VALID
NOT VALID
NOT VALID
Note 1. The number of clock cycles to be inserted depends on the X latency set in the Configuration Register.
2. The WAIT signal is configured to be active during wait state. WAIT signal is active Low.
3. WAIT is always asserted when addressed bank is in Read CFI, Read SR or Read electronic signature mode.
WAIT signals valid data if the addressed bank is in Read Array mode.
4. Address latched and data output on the rising clock edge.
WAITF(2)
GF
EF
KF(4)
LF
A0-A21
DQ0-DQ15
NOT VALID
tGHQZ
tGHQX
tEHEL
tEHQZ
tEHTZ
NOT VALID
tEHQX
NOT VALID
AI06278
M36WT864TF, M36WT864BF
Figure 14. Flash Single Synchronous Read AC Waveforms
49/92
M36WT864TF, M36WT864BF
Figure 15. Flash Clock input AC Waveform
tKHKL
tKHKH
tr
tf
tKLKH
AI06981
Table 22. Flash Synchronous Read AC Characteristics
M36WT864TF/BF
Clock Specifications
Synchronous Read Timings
Symbol
Alt
Parameter
Unit
85
100
tAVKH
tAVCLKH
Address Valid to Clock High
Min
9
9
9
ns
tELKH
tELCLKH
Chip Enable Low to Clock High
Min
9
9
9
ns
tELTV
Chip Enable Low to Wait Valid
Max
14(3)
18
18
ns
tEHEL
Chip Enable Pulse Width
(subsequent synchronous reads)
Min
14(3)
14
14
ns
tEHTZ
Chip Enable High to Wait Hi-Z
Max
20(3)
20
20
ns
tKHAX
tCLKHAX
Clock High to Address Transition
Min
10
10
10
ns
tKHQV
tKHTV
tCLKHQV
Clock High to Output Valid
Clock High to WAIT Valid
Max
14(3)
18
18
ns
tKHQX
tKHTX
tCLKHQX
Clock High to Output Transition
Clock High to WAIT Transition
Min
4
4
4
ns
tLLKH
tADVLCLKH
Latch Enable Low to Clock High
Min
9
9
9
ns
Clock Period (f=40MHz)
Min
25
25
ns
tKHKH
tCLK
Clock Period (f=54MHz)
Min
18.5
tKHKL
tKLKH
Clock High to Clock Low
Clock Low to Clock High
Min
4.5
5
5
ns
tf
tr
Clock Fall or Rise Time
Max
3
3
3
ns
Note: 1. Sampled only, not 100% tested.
2. For other timings please refer to Table 21, Asynchronous Read AC Characteristics.
3. To be characterized.
50/92
70
ns
KF
VPPF
WPF
DQ0-DQ15
WF
GF
EF
LF
A0-A21
tWHDX
CONFIRM COMMAND
OR DATA INPUT
tVPHWH
tWHVPL
tWHWPL
tWHQV
tQVVPL
tQVWPL
STATUS REGISTER
STATUS REGISTER
READ
1st POLLING
tELQV
VALID ADDRESS
PROGRAM OR ERASE
tELKV
tWHEL
tWHGL
tWHAX
tWHAV
CMD or DATA
VALID ADDRESS
tAVWH
tWPHWH
tWHWL
tWHEH
tWHLL
tWLWH
tLHAX
COMMAND
tLLLH
SET-UP COMMAND
tDVWH
tGHWL
tELWL
tELLH
tAVLH
BANK ADDRESS
tAVAV
AI06279
M36WT864TF, M36WT864BF
Figure 16. Flash Write AC Waveforms, Write Enable Controlled
51/92
M36WT864TF, M36WT864BF
Table 23. Flash Write AC Characteristics, Write Enable Controlled
M36WT864TF/BF
Symbol
tAVAV
Alt
tWC
tAVLH
85
100
Address Valid to Next Address Valid
Min
70(3)
85
100
ns
Address Valid to Latch Enable High
Min
10
10
10
ns
tWC
Address Valid to Write Enable High
Min
45(3)
50
50
ns
tDVWH
tDS
Data Valid to Write Enable High
Min
45(3)
50
50
ns
Chip Enable Low to Latch Enable High
Min
10
10
10
ns
Chip Enable Low to Write Enable Low
Min
0
0
0
ns
tELQV
Chip Enable Low to Output Valid
Min
70(3)
85
100
ns
tELKV
Chip Enable High to Clock Valid
Min
9
9
9
ns
tGHWL
Output Enable High to Write Enable Low
Min
20
20
20
ns
tLHAX
Latch Enable High to Address Transition
Min
10
10
10
ns
tLLLH
Latch Enable Pulse Width
Min
10
10
10
ns
Write Enable High to Address Valid
Min
0
0
0
ns
tELWL
Write Enable Controlled Timings
Unit
70
tAVWH(4)
tELLH
tCS
tWHAV(4)
tWHAX(4)
tAH
Write Enable High to Address Transition
Min
0
0
0
ns
tWHDX
tDH
Write Enable High to Input Transition
Min
0
0
0
ns
tWHEH
tCH
Write Enable High to Chip Enable High
Min
0
0
0
ns
Write Enable High to Chip Enable Low
Min
25(3)
25
25
ns
tWHGL
Write Enable High to Output Enable Low
Min
0
0
0
ns
tWHLL
Write Enable High to Latch Enable Low
Min
0
0
0
ns
Write Enable High to Write Enable Low
Min
25
25
25
ns
Write Enable High to Output Valid
Min
95(3)
110
125
ns
Write Enable Low to Write Enable High
Min
45(3)
50
50
ns
tQVVPL
Output (Status Register) Valid to VPPF Low
Min
0
0
0
ns
tQVWPL
Output (Status Register) Valid to Write Protect
Low
Min
0
0
0
ns
VPPF High to Write Enable High
Min
200
200
200
ns
tWHVPL
Write Enable High to VPPF Low
Min
200
200
200
ns
tWHWPL
Write Enable High to Write Protect Low
Min
200
200
200
ns
tWPHWH
Write Protect High to Write Enable High
Min
200
200
200
ns
tWHEL(2)
tWHWL
tWPH
tWHQV
tWLWH
Protection Timings
Parameter
tVPHWH
tWP
tVPS
Note: 1. Sampled only, not 100% tested.
2. tWHEL has the values shown when reading in the targeted bank. System designers should take this into account and may insert a
software No-Op instruction to delay the first read in the same bank after issuing a command. If it is a Read Array operation in a
different bank tWHEL is 0ns.
3. To be characterized.
4. Meaningful only if LF is always kept low.
52/92
KF
VPPF
WPF
DQ0-DQ15
EF
GF
WF
LF
A0-A21
tGHEL
tELEH
tLHAX
COMMAND
SET-UP COMMAND
tDVEH
tLLLH
tELLH
tWLEL
tAVLH
BANK ADDRESS
tEHDX
tEHEL
tEHWH
CMD or DATA
tEHAX
CONFIRM COMMAND
OR DATA INPUT
tVPHEH
tWPHEH
tAVEH
VALID ADDRESS
tAVAV
tELKV
tEHVPL
tEHWPL
tWHEL
tWHQV
tEHGL
tQVVPL
tQVWPL
STATUS REGISTER
STATUS REGISTER
READ
1st POLLING
tELQV
VALID ADDRESS
PROGRAM OR ERASE
AI06280
M36WT864TF, M36WT864BF
Figure 17. Flash Write AC Waveforms, Chip Enable Controlled
53/92
M36WT864TF, M36WT864BF
Table 24. Flash Write AC Characteristics, Chip Enable Controlled
M36WT864TF/BF
Symbol
Alt
Chip Enable Controlled Timings
Unit
70
85
100
tAVAV
tWC
Address Valid to Next Address Valid
Min
70(3)
85
100
ns
tAVEH
tWC
Address Valid to Chip Enable High
Min
45(3)
50
50
ns
Address Valid to Latch Enable High
Min
10
10
10
ns
tAVLH
tDVEH
tDS
Data Valid to Write Enable High
Min
45(3)
50
50
ns
tEHAX
tAH
Chip Enable High to Address Transition
Min
0
0
0
ns
tEHDX
tDH
Chip Enable High to Input Transition
Min
0
0
0
ns
tEHEL
tWPH
Chip Enable High to Chip Enable Low
Min
25
25
25
ns
Chip Enable High to Output Enable Low
Min
0
0
0
ns
Chip Enable High to Write Enable High
Min
0
0
0
ns
Chip Enable Low to Clock Valid
Min
9
9
9
ns
Chip Enable Low to Chip Enable High
Min
45(3)
50
50
ns
tELLH
Chip Enable Low to Latch Enable High
Min
10
10
10
ns
tELQV
Chip Enable Low to Output Valid
Min
70(3)
85
100
ns
tGHEL
Output Enable High to Chip Enable Low
Min
20
20
20
ns
tLHAX
Latch Enable High to Address Transition
Min
10
10
10
ns
tLLLH
Latch Enable Pulse Width
Min
10
10
10
ns
Write Enable High to Chip Enable Low
Min
25(3)
25
25
ns
Write Enable High to Output Valid
Min
95
110
125
ns
Write Enable Low to Chip Enable Low
Min
0
0
0
ns
tEHVPL
Chip Enable High to VPPF Low
Min
200
200
200
ns
tEHWPL
Chip Enable High to Write Protect Low
Min
200
200
200
ns
tQVVPL
Output (Status Register) Valid to VPPF Low
Min
0
0
0
ns
tQVWPL
Output (Status Register) Valid to Write Protect
Low
Min
0
0
0
ns
VPPF High to Chip Enable High
Min
200
200
200
ns
Write Protect High to Chip Enable High
Min
200
200
200
ns
tEHGL
tEHWH
tCH
tELKV
tELEH
tWP
tWHEL(2)
tWHQV
tWLEL
Protection Timings
Parameter
tVPHEH
tWPHEH
tCS
tVPS
Note: 1. Sampled only, not 100% tested.
2. tWHEL has the values shown when reading in the targeted bank. System designers should take this into account and may insert a
software No-Op instruction to delay the first read in the same bank after issuing a command. If it is a Read Array operation in a
different bank tWHEL is 0ns.
3. To be characterized.
54/92
M36WT864TF, M36WT864BF
Figure 18. Flash Reset and Power-up AC Waveforms
tPHWL
tPHEL
tPHGL
tPHLL
WF, EF, GF, LF
tPLWL
tPLEL
tPLGL
tPLLL
RP
tVDHPH
tPLPH
VDD, VDDQ
Power-Up
Reset
AI06281
Table 25. Flash Reset and Power-up AC Characteristics
Symbol
Parameter
tPLWL
tPLEL
tPLGL
tPLLL
Reset Low to
Write Enable Low,
Chip Enable Low,
Output Enable Low,
Latch Enable Low
tPHWL
tPHEL
tPHGL
tPHLL
Test Condition
70
85
100
Unit
During Program
Min
10
10
10
µs
During Erase
Min
20
20
20
µs
Other Conditions
Min
80
80
80
ns
Reset High to
Write Enable Low
Chip Enable Low
Output Enable Low
Latch Enable Low
Min
30
30
30
ns
tPLPH (1,2)
RP Pulse Width
Min
50
50
50
ns
tVDHPH (3)
Supply Voltages High to Reset
High
Min
50
50
50
µs
Note: 1. The device Reset is possible but not guaranteed if tPLPH < 50ns.
2. Sampled only, not 100% tested.
3. It is important to assert RP in order to allow proper CPU initialization during Power-Up or Reset.
55/92
M36WT864TF, M36WT864BF
Figure 19. SRAM Address Controlled, Read AC Waveforms
tAVAV
A0-A18
VALID
tAVQV
tAXQX
DATA VALID
DQ0-DQ7 and/or DQ8-DQ15
AI05839
Note: E1S = Low, E2S = High, GS = Low, WS = High, UBS = Low and/or LBS = Low.
Figure 20. SRAM Chip Enable or Output Enable Controlled, Read AC Waveforms
tAVAV
VALID
A0-A18
tAVQV
tAXQX
tELQV
tEHQZ
E1S
E2S
tELQX
tGLQV
tGHQZ
GS
tGLQX
VALID
DQ0-DQ15
tBLQV
tBHQZ
UBS, LBS
tBLQX
AI06282
Note: Write Enable (WF) = High
56/92
M36WT864TF, M36WT864BF
Figure 21. SRAM Chip Enable or UBS/LBS Controlled, Standby AC Waveforms
E1S, UBS, LBS
E2S
tPU
IDD
tPD
50%
ISB
AI06283
Table 26. SRAM Read and Standby AC Characteristics
M36WT864TF/BF
Symbol
Parameter
Unit
70
tAVAV
Read Cycle Time
Min
70
ns
tAVQV
Address Valid to Output Valid
Max
70
ns
Data hold from address change
Min
5
ns
tBHQZ (2,3,4)
Upper/Lower Byte Enable High to Output Hi-Z
Max
25
ns
tBLQV
Upper/Lower Byte Enable Low to Output Valid
Max
70
ns
Upper/Lower Byte Enable Low to Output Transition
Min
5
ns
tEHQZ (2,3,4)
Chip Enable High to Output Hi-Z
Max
25
ns
tELQV
Chip Enable Low to Output Valid
Max
70
ns
Chip Enable Low to Output Transition
Min
5
ns
tGHQZ (2,3,4)
Output Enable High to Output Hi-Z
Max
25
ns
tGLQV
Output Enable Low to Output Valid
Max
35
ns
Output Enable Low to Output Transition
Min
5
ns
tPD (4)
Chip Enable or UB/LB High to Power Down
Max
0
ns
tPU (4)
Chip Enable or UB/LB Low to Power Up
Min
70
ns
tAXQX (1)
tBLQX (1)
tELQX (1)
tGLQX (1)
Note: 1. Test conditions assume transition timing reference level = 0.3VDDS or 0.7VDDS.
2. At any given temperature and voltage condition, tGHQZ is less than tGLQX, tBHQZ is less than tBLQX and tEHQZ is less than tELQX for
any given device.
3. These parameters are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output
voltage levels.
4. Tested initially and after any design or process changes that may affect these parameters.
57/92
M36WT864TF, M36WT864BF
Figure 22. SRAM Write AC Waveforms, Write Enable Controlled
tAVAV
VALID
A0-A18
tAVWH
tELWH
tAVEL
tWHAX
E1S
E2S
tWLWH
tAVWL
WS
tWHQX
tWLQZ
tWHDX
DQ0-DQ15
DATA INPUT
tDVWH
tBLBH
UBS, LBS
AI06284
Note: 1. During this period DQ0-DQ15 are in output state and input signals should not be applied.
58/92
M36WT864TF, M36WT864BF
Figure 23. SRAM Write AC Waveforms, Chip Enable Controlled
tAVAV
VALID
A0-A18
tAVEH
tELEH
tAVEL
tEHAX
E1S
E2S
tAVWL
tWLEH
WS
tEHDX
DQ0-DQ15
DATA INPUT
tDVEH
tBLBH
UBS, LBS
AI06285
Figure 24. SRAM Write AC Waveforms, UB/LB Controlled
tAVAV
A0-A18
VALID
tAVBH
tBHAX
E1S
E2S
tAVWL
tWLBH
WS
tWLQZ
DQ0-DQ15
tBHDX
DATA (1)
DATA INPUT
tDVBH
tAVBL
tBLBH
UBS, LBS
AI06286
Note: 1. During this period DQ0-DQ15 are in output state and input signals should not be applied.
59/92
M36WT864TF, M36WT864BF
Table 27. SRAM Write AC Characteristics
M36WT864TF/BF
Symbol
Parameter
Unit
70
tAVAV
Write Cycle Time
Min
70
ns
tAVBH
Address Valid to LBS, UBS High
Min
60
ns
tAVBL
Address Valid to LBS, UBS Low
Min
0
ns
tAVEH
Address Valid to Chip Enable High
Min
60
ns
tAVEL
Address valid to Chip Enable Low
Min
0
ns
tAVWH
Address Valid to Write Enable High
Min
60
ns
tAVWL
Address Valid to Write Enable Low
Min
0
ns
tBHAX
LBS, UBS High to Address Transition
Min
0
ns
tBHDX
LBS, UBS High to Input Transition
Min
0
ns
tBLBH
LBS, UBS Low to LBS, UBS High
Min
60
ns
tBLEH
LBS, UBS Low to Chip Enable High
Min
60
ns
tBLWH
LBS, UBS Low to Write Enable High
Min
60
ns
tDVBH
Input Valid to LBS, UBS High
Min
30
ns
tDVEH
Input Valid to Chip Enable High
Min
30
ns
tDVWH
Input Valid to Write Enable High
Min
30
ns
tEHAX
Chip Enable High to Address Transition
Min
0
ns
tEHDX
Chip enable High to Input Transition
Min
0
ns
tELBH
Chip Enable Low to LBS, UBS High
Min
60
ns
tELEH
Chip Enable Low to Chip Enable High
Min
60
ns
tELWH
Chip Enable Low to Write Enable High
Min
60
ns
tWHAX
Write Enable High to Address Transition
Min
0
ns
tWHDX
Write Enable High to Input Transition
Min
0
ns
Write Enable High to Output Transition
Min
5
ns
tWLBH
Write Enable Low to LBS, UBS High
Min
60
ns
tWLEH
Write Enable Low to Chip Enable High
Min
60
ns
Write Enable Low to Output Hi-Z
Max
20
ns
Write Enable Low to Write Enable High
Min
50
ns
tWHQX (1)
tWLQZ (1,2,3)
tWLWH
Note: 1. At any given temperature and voltage condition, tWLQZ is less than tWHQX for any given device.
2. These parameters are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output
voltage levels.
3. Tested initially and after any design or process changes that may affect these parameters.
60/92
M36WT864TF, M36WT864BF
Figure 25. SRAM Low VDD Data Retention AC Waveforms, E1S Controlled
DATA RETENTION MODE
3.3V
VDDS
2.7V
VDR > 1.5V
tCDR
tR
E1S ≥ VDR – 0.2V or UBS = LBS ≥ VDR – 0.2V
E1S or UBS/LBS
AI06287
Figure 26. SRAM Low VDD Data Retention AC Waveforms, E2S Controlled
DATA RETENTION MODE
3.3V
VDDS
2.7V
VDR > 1.5V
tCDR
tR
E2S ≥ 0.2V
E2S
AI06288
Table 28. SRAM Low VDD Data Retention Characteristics
Symbol
Parameter
Test Condition
IDDDR (1)
Supply Current (Data Retention)
VDD = 1.5V, E1S ≥ VDDS –0.2V or
E2S ≤ 0.2V or
UBS = LBS ≥ VDDS –0.2V, f = 0
tCDR (1,2)
Chip Deselected to Data
Retention Time
tR (2)
Operation Recovery Time
VDR (1)
Supply Voltage (Data Retention)
E1S ≥ VDDS –0.2V or E2S ≤ 0.2V or
UBS = LBS ≥ VDDS –0.2V, f = 0
Min
Typ
Max
Unit
5
10
µA
0
ns
tAVAV
ns
1.5
V
Note: 1. All other Inputs at VIH ≥ VDDS –0.2V or VIL ≤ 0.2V.
2. Tested initially and after any design or process that may affect these parameters. tAVAV is Read cycle time.
3. No input may exceed VDDS +0.2V.
61/92
M36WT864TF, M36WT864BF
PACKAGE MECHANICAL
Figure 27. Stacked LFBGA96 - 8x14mm, 8x10ball array, 0.8mm pitch, Bottom View Package Outline
D
D1
SE
E
E2
E1
b
BALL "A1"
e
ddd
FE1 FE
FD
SD
A2
A
A1
BGA-Z31
Note: Drawing is not to scale.
Table 29. Stacked LFBGA96 - 8x14mm, 8x10 ball array, 0.8mm pitch, Package Mechanical Data
Symbol
millimeters
Typ
Min
A
Typ
Min
1.400
A1
A2
0.960
Max
0.0551
0.300
0.0118
0.0378
b
0.400
0.350
0.450
0.0157
0.0138
0.0177
D
8.000
7.900
8.100
0.3150
0.3110
0.3189
D1
5.600
–
–
0.2205
–
ddd
62/92
inches
Max
0.100
–
0.0039
E
14.000
13.900
14.100
0.5512
0.5472
0.5551
E1
7.200
–
–
0.2835
–
–
E2
10.400
–
–
0.4094
–
–
e
0.800
–
–
0.0315
–
–
FD
1.200
–
–
0.0472
–
–
FE
3.400
–
–
0.1339
–
–
FE1
1.800
–
–
0.0709
–
–
SD
0.400
–
–
0.0157
–
–
SE
0.400
–
–
0.0157
–
–
M36WT864TF, M36WT864BF
PART NUMBERING
Table 30. Ordering Information Scheme
Example:
M36WT864TF
70 ZA
6
T
Device Type
M36 = MMP (Flash + SRAM)
Architecture
W = Multiple Bank, Burst mode
Operating Voltage
T = VDDF = 1.65V to 2.2V; VDDS = VDDQF = 2.7V to 3.3V
SRAM Chip Size & Organization
8 = 8 Mbit (512K x16-bit)
Device Function
64T = 64 Mbit (x16), Multiple Bank, Top Boot
64B = 64 Mbit (x16), Multiple Bank, Bottom Boot
B = SRAM Asynchronous 70ns
Speed
70 = 70ns
85 = 85ns
10 = 100ns
Package
ZA = LFBGA96 - 8x14mm, 8x10 ball array, 0.8mm pitch
Temperature Range
6 = –40 to 85°C
Option
T = Tape & Reel packing
Devices are shipped from the factory with the memory content bits erased to ’1’. For a list of available options (Speed, Package, etc...) or for further information on any aspect of this device, please contact the
STMicroelectronics Sales Office nearest to you.
63/92
M36WT864TF, M36WT864BF
REVISION HISTORY
Table 31. Document Revision History
Date
Version
10-Jul-2002
1.0
64/92
Revision Details
First Issue
M36WT864TF, M36WT864BF
APPENDIX A. FLASH BLOCK ADDRESS TABLES
4
3FF000-3FFFFF
1
4
3FE000-3FEFFF
2
4
3FD000-3FDFFF
3
4
3FC000-3FCFFF
4
4
3FB000-3FBFFF
5
4
3FA000-3FAFFF
6
4
3F9000-3F9FFF
7
4
3F8000-3F8FFF
8
32
3F0000-3F7FFF
9
32
3E8000-3EFFFF
10
32
3E0000-3E7FFF
11
32
3D8000-3DFFFF
12
32
3D0000-3D7FFF
13
32
3C8000-3CFFFF
14
32
3C0000-3C7FFF
15
32
3B8000-3BFFFF
16
32
3B0000-3B7FFF
17
32
3A8000-3AFFFF
18
32
3A0000-3A7FFF
19
32
398000-39FFFF
20
32
390000-397FFF
21
32
388000-38FFFF
22
32
380000-387FFF
23
32
378000-37FFFF
24
32
370000-377FFF
25
32
368000-36FFFF
26
32
360000-367FFF
27
32
358000-35FFFF
28
32
350000-357FFF
29
32
348000-34FFFF
30
32
340000-347FFF
31
32
338000-33FFFF
32
32
330000-337FFF
33
32
328000-32FFFF
34
32
320000-327FFF
35
32
318000-31FFFF
36
32
310000-317FFF
37
32
308000-30FFFF
38
32
300000-307FFF
Bank 4
0
Bank 5
Address Range
Bank 6
#
Bank 7
Bank 2
Bank 1
Bank 0
Parameter Bank
Bank
Size
(KWord)
Bank 3
Table 32. Flash Top Boot Block Addresses
39
32
2F8000-2FFFFF
40
32
2F0000-2F7FFF
41
32
2E8000-2EFFFF
42
32
2E0000-2E7FFF
43
32
2D8000-2DFFFF
44
32
2D0000-2D7FFF
45
32
2C8000-2CFFFF
46
32
2C0000-2C7FFF
47
32
2B8000-2BFFFF
48
32
2B0000-2B7FFF
49
32
2A8000-2AFFFF
50
32
2A0000-2A7FFF
51
32
298000-29FFFF
52
32
290000-297FFF
53
32
288000-28FFFF
54
32
280000-287FFF
55
32
278000-27FFFF
56
32
270000-277FFF
57
32
268000-26FFFF
58
32
260000-267FFF
59
32
258000-25FFFF
60
32
250000-257FFF
61
32
248000-24FFFF
62
32
240000-247FFF
63
32
238000-23FFFF
64
32
230000-237FFF
65
32
228000-22FFFF
66
32
220000-227FFF
67
32
218000-21FFFF
68
32
210000-217FFF
69
32
208000-20FFFF
70
32
200000-207FFF
71
32
1F8000-1FFFFF
72
32
1F0000-1F7FFF
73
32
1E8000-1EFFFF
74
32
1E0000-1E7FFF
75
32
1D8000-1DFFFF
76
32
1D0000-1D7FFF
77
32
1C8000-1CFFFF
78
32
1C0000-1C7FFF
65/92
Bank 11
66/92
1B8000-1BFFFF
111
32
80
81
32
1B0000-1B7FFF
112
32
0B0000-0B7FFF
32
1A8000-1AFFFF
113
32
0A8000-0AFFFF
82
32
1A0000-1A7FFF
114
32
0A0000-0A7FFF
83
32
198000-19FFFF
115
32
098000-09FFFF
84
32
190000-197FFF
116
32
090000-097FFF
85
32
188000-18FFFF
117
32
088000-08FFFF
86
32
180000-187FFF
118
32
080000-087FFF
87
32
178000-17FFFF
119
32
078000-07FFFF
88
32
170000-177FFF
120
32
070000-077FFF
89
32
168000-16FFFF
121
32
068000-06FFFF
90
32
160000-167FFF
122
32
060000-067FFF
91
32
158000-15FFFF
123
32
058000-05FFFF
92
32
150000-157FFF
124
32
050000-057FFF
93
32
148000-14FFFF
125
32
048000-04FFFF
94
32
140000-147FFF
126
32
040000-047FFF
95
32
138000-13FFFF
127
32
038000-03FFFF
96
32
130000-137FFF
128
32
030000-037FFF
97
32
128000-12FFFF
129
32
028000-02FFFF
98
32
120000-127FFF
130
32
020000-027FFF
99
32
118000-11FFFF
131
32
018000-01FFFF
100
32
110000-117FFF
132
32
010000-017FFF
101
32
108000-10FFFF
133
32
008000-00FFFF
102
32
100000-107FFF
134
32
000000-007FFF
103
32
0F8000-0FFFFF
104
32
0F0000-0F7FFF
105
32
0E8000-0EFFFF
106
32
0E0000-0E7FFF
107
32
0D8000-0DFFFF
108
32
0D0000-0D7FFF
109
32
0C8000-0CFFFF
110
32
0C0000-0C7FFF
Bank 12
32
Bank 13
79
Bank 14
Bank 10
Bank 9
Bank 8
M36WT864TF, M36WT864BF
0B8000-0BFFFF
Note: There are two Bank Regions, Region 1 contains all the banks
that are made up of main blocks only, Region 2 contains the
banks that are made up of the parameter and main blocks.
M36WT864TF, M36WT864BF
Bank 10
3F8000-3FFFFF
133
32
3F0000-3F7FFF
132
32
3E8000-3EFFFF
131
32
3E0000-3E7FFF
130
32
3D8000-3DFFFF
129
32
3D0000-3D7FFF
128
32
3C8000-3CFFFF
127
32
3C0000-3C7FFF
126
32
3B8000-3BFFFF
125
32
3B0000-3B7FFF
124
32
3A8000-3AFFFF
123
32
3A0000-3A7FFF
122
32
398000-39FFFF
121
32
390000-397FFF
120
32
388000-38FFFF
119
32
380000-387FFF
118
32
378000-37FFFF
117
32
370000-377FFF
116
32
368000-36FFFF
115
32
360000-367FFF
114
32
358000-35FFFF
113
32
350000-357FFF
112
32
348000-34FFFF
111
32
340000-347FFF
110
32
338000-33FFFF
109
32
330000-337FFF
108
32
328000-32FFFF
107
32
320000-327FFF
106
32
318000-31FFFF
105
32
310000-317FFF
104
32
308000-30FFFF
103
32
300000-307FFF
102
32
2F8000-2FFFFF
101
32
2F0000-2F7FFF
100
32
2E8000-2EFFFF
99
32
2E0000-2E7FFF
98
32
2D8000-2DFFFF
97
32
2D0000-2D7FFF
96
32
2C8000-2CFFFF
95
32
2C0000-2C7FFF
Bank 8
32
Bank 7
134
Bank 6
Address Range
#
Bank 5
Bank 11
Bank 12
Bank 13
Bank 14
Bank
Size
(KWord)
Bank 9
Table 33. Flash Bottom Boot Block Addresses
94
32
2B8000-2BFFFF
93
32
2B0000-2B7FFF
92
32
2A8000-2AFFFF
91
32
2A0000-2A7FFF
90
32
298000-29FFFF
89
32
290000-297FFF
88
32
288000-28FFFF
87
32
280000-287FFF
86
32
278000-27FFFF
85
32
270000-277FFF
84
32
268000-26FFFF
83
32
260000-267FFF
82
32
258000-25FFFF
81
32
250000-257FFF
80
32
248000-24FFFF
79
32
240000-247FFF
78
32
238000-23FFFF
77
32
230000-237FFF
76
32
228000-22FFFF
75
32
220000-227FFF
74
32
218000-21FFFF
73
32
210000-217FFF
72
32
208000-20FFFF
71
32
200000-207FFF
70
32
1F8000-1FFFFF
69
32
1F0000-1F7FFF
68
32
1E8000-1EFFFF
67
32
1E0000-1E7FFF
66
32
1D8000-1DFFFF
65
32
1D0000-1D7FFF
64
32
1C8000-1CFFFF
63
32
1C0000-1C7FFF
62
32
1B8000-1BFFFF
61
32
1B0000-1B7FFF
60
32
1A8000-1AFFFF
59
32
1A0000-1A7FFF
58
32
198000-19FFFF
57
32
190000-197FFF
56
32
188000-18FFFF
55
32
180000-187FFF
67/92
Bank 1
Bank 2
68/92
32
178000-17FFFF
22
32
53
52
32
170000-177FFF
21
32
070000-077FFF
32
168000-16FFFF
20
32
068000-06FFFF
51
32
160000-167FFF
50
32
158000-15FFFF
19
32
060000-067FFF
18
32
058000-05FFFF
49
32
48
32
150000-157FFF
17
32
050000-057FFF
148000-14FFFF
16
32
048000-04FFFF
47
32
46
32
140000-147FFF
15
32
040000-047FFF
138000-13FFFF
14
32
038000-03FFFF
45
32
130000-137FFF
13
32
030000-037FFF
44
43
32
128000-12FFFF
12
32
028000-02FFFF
32
120000-127FFF
11
32
020000-027FFF
42
32
118000-11FFFF
10
32
018000-01FFFF
41
32
110000-117FFF
9
32
010000-017FFF
40
32
108000-10FFFF
8
32
008000-00FFFF
39
32
100000-107FFF
7
4
007000-007FFF
38
32
0F8000-0FFFFF
6
4
006000-006FFF
37
32
0F0000-0F7FFF
5
4
005000-005FFF
36
32
0E8000-0EFFFF
4
4
004000-004FFF
35
32
0E0000-0E7FFF
3
4
003000-003FFF
34
32
0D8000-0DFFFF
2
4
002000-002FFF
33
32
0D0000-0D7FFF
1
4
001000-001FFF
32
32
0C8000-0CFFFF
0
4
000000-000FFF
31
32
0C0000-0C7FFF
30
32
0B8000-0BFFFF
29
32
0B0000-0B7FFF
28
32
0A8000-0AFFFF
27
32
0A0000-0A7FFF
26
32
098000-09FFFF
25
32
090000-097FFF
24
32
088000-08FFFF
23
32
080000-087FFF
Bank 0
54
Parameter Bank
Bank 3
Bank 4
M36WT864TF, M36WT864BF
078000-07FFFF
Note: There are two Bank Regions, Region 1 contains all the banks
that are made up of main blocks only, Region 2 contains the
banks that are made up of the parameter and main blocks.
M36WT864TF, M36WT864BF
APPENDIX B. FLASH COMMON FLASH INTERFACE
36, 37, 38, 40 and 1 show the addresses used to
The Common Flash Interface is a JEDEC apretrieve the data. The Query data is always preproved, standardized data structure that can be
sented on the lowest order data outputs (DQ0read from the Flash memory device. It allows a
DQ7), the other outputs (DQ8-DQ15) are set to 0.
system software to query the device to determine
various electrical and timing parameters, density
The CFI data structure also contains a security
information and functions supported by the memarea where a 64 bit unique security number is writory. The system can interface easily with the deten (see Table 1, Security Code area). This area
vice, enabling the software to upgrade itself when
can be accessed only in Read mode by the final
necessary.
user. It is impossible to change the security numWhen the Read CFI Query Command is issued
ber after it has been written by ST. Issue a Read
the device enters CFI Query mode and the data
Array command to return to Read mode.
structure is read from the memory. Tables 34, 35,
Table 34. Query Structure Overview
Offset
00h
Sub-section Name
Description
Reserved
Reserved for algorithm-specific information
10h
CFI Query Identification String
Command set ID and algorithm data offset
1Bh
System Interface Information
Device timing & voltage information
27h
Device Geometry Definition
Flash device layout
P
Primary Algorithm-specific Extended Query table
Additional information specific to the Primary
Algorithm (optional)
A
Alternate Algorithm-specific Extended Query table
Additional information specific to the Alternate
Algorithm (optional)
Security Code Area
Lock Protection Register
Unique device Number and
User Programmable OTP
80h
Note: The Flash memory display the CFI data structure when CFI Query command is issued. In this table are listed the main sub-sections
detailed in Tables 35, 36, 37, 38, 40 and 1. Query data is always presented on the lowest order data outputs.
Table 35. CFI Query Identification String
Offset
Sub-section Name
00h
0020h
Manufacturer Code
Description
01h
8810h
8811h
Device Code
02h
reserved
03h
reserved
Reserved
reserved
Reserved
0051h
11h
0052h
12h
0059h
13h
0003h
14h
0000h
15h
offset = P = 0039h
16h
0000h
17h
0000h
18h
0000h
19h
value = A = 0000h
1Ah
0000h
ST
Top
Bottom
Reserved
04h-0Fh
10h
Value
"Q"
Query Unique ASCII String "QRY"
"R"
"Y"
Primary Algorithm Command Set and Control Interface ID code 16
bit ID code defining a specific algorithm
Address for Primary Algorithm extended Query table (see Table 37)
p = 39h
Alternate Vendor Command Set and Control Interface ID Code
second vendor - specified algorithm supported
NA
Address for Alternate Algorithm extended Query table
NA
69/92
M36WT864TF, M36WT864BF
Table 36. CFI Query System Interface Information
Offset
Data
Description
Value
1Bh
0017h
VDD Logic Supply Minimum Program/Erase or Write voltage
bit 7 to 4
BCD value in volts
bit 3 to 0
BCD value in 100 millivolts
1.7V
1Ch
0022h
VDD Logic Supply Maximum Program/Erase or Write voltage
bit 7 to 4
BCD value in volts
bit 3 to 0
BCD value in 100 millivolts
2.2V
1Dh
0017h
VPPF [Programming] Supply Minimum Program/Erase voltage
bit 7 to 4
HEX value in volts
bit 3 to 0
BCD value in 100 millivolts
1.7V
1Eh
00C0h
VPPF [Programming] Supply Maximum Program/Erase voltage
bit 7 to 4
HEX value in volts
bit 3 to 0
BCD value in 100 millivolts
12V
1Fh
0004h
Typical time-out per single byte/word program = 2n µs
16µs
20h
0003h
Typical time-out for quadruple word program = 2n µs
8µs
21h
000Ah
Typical time-out per individual block erase = 2n ms
1s
22h
0000h
Typical time-out for full chip erase = 2n ms
NA
23h
0003h
Maximum time-out for word program = 2n times typical
128µs
24h
0004h
Maximum time-out for quadruple word = 2n times typical
128µs
25h
0002h
Maximum time-out per individual block erase = 2n times typical
4s
26h
0000h
Maximum time-out for chip erase = 2n times typical
NA
Table 37. Device Geometry Definition
Data
27h
0017h
Device Size = 2n in number of bytes
28h
29h
0001h
0000h
Flash Device Interface Code description
x16
Async.
2Ah
2Bh
0003h
0000h
Maximum number of bytes in multi-byte program or page = 2n
8 Byte
2Ch
0002h
Number of identical sized erase block regions within the device
bit 7 to 0 = x = number of Erase Block Regions
2
2Dh
2Eh
007Eh
0000h
Region 1 Information
Number of identical-size erase blocks = 007Eh+1
2Fh
30h
0000h
0001h
Region 1 Information
Block size in Region 1 = 0100h * 256 byte
31h
32h
0007h
0000h
Region 2 Information
Number of identical-size erase blocks = 0007h+1
33h
34h
0020h
0000h
Region 2 Information
Block size in Region 2 = 0020h * 256 byte
35h
38h
0000h
Reserved for future erase block region information
M36WT864TF
Offset Word
Mode
70/92
Description
Value
8 MByte
127
64 KByte
8
8 KByte
NA
M36WT864TF, M36WT864BF
M36WT864BF
Offset Word
Mode
Data
Description
2Dh
2Eh
0007h
0000h
Region 1 Information
Number of identical-size erase block = 0007h+1
2Fh
30h
0020h
0000h
Region 1 Information
Block size in Region 1 = 0020h * 256 byte
31h
32h
007Eh
0000h
Region 2 Information
Number of identical-size erase block = 007Eh+1
33h
34h
0000h
0001h
Region 2 Information
Block size in Region 2 = 0100h * 256 byte
35h
38h
0000h
Reserved for future erase block region information
Value
8
8 KByte
127
64 KByte
NA
Table 38. Primary Algorithm-Specific Extended Query Table
Offset
Data
(P)h = 39h
0050h
0052h
Description
Value
"P"
Primary Algorithm extended Query table unique ASCII string “PRI”
0049h
"R"
"I"
(P+3)h = 3Ch
0031h
Major version number, ASCII
"1"
(P+4)h = 3Dh
0030h
Minor version number, ASCII
"0"
(P+5)h = 3Eh
00E6h
Extended Query table contents for Primary Algorithm. Address (P+5)h
contains less significant byte.
0003h
(P+7)h = 40h
0000h
(P+8)h = 41h
0000h
(P+9)h = 42h
0001h
bit
bit
bit
bit
bit
bit
bit
bit
bit
bit
bit
0
1
2
3
4
5
6
7
8
9
10 to 31
Chip Erase supported
(1 = Yes, 0 = No)
Erase Suspend supported
(1 = Yes, 0 = No)
Program Suspend supported
(1 = Yes, 0 = No)
Legacy Lock/Unlock supported
(1 = Yes, 0 = No)
Queued Erase supported
(1 = Yes, 0 = No)
Instant individual block locking supported (1 = Yes, 0 = No)
Protection bits supported
(1 = Yes, 0 = No)
Page mode read supported
(1 = Yes, 0 = No)
Synchronous read supported
(1 = Yes, 0 = No)
Simultaneous operation supported
(1 = Yes, 0 = No)
Reserved; undefined bits are ‘0’. If bit 31 is ’1’ then another 31
bit field of optional features follows at the end of the bit-30
field.
No
Yes
Yes
No
No
Yes
Yes
Yes
Yes
Yes
Supported Functions after Suspend
Read Array, Read Status Register and CFI Query
Yes
bit 0
bit 7 to 1
(P+A)h = 43h
0003h
(P+B)h = 44h
0000h
Program supported after Erase Suspend (1 = Yes, 0 = No)
Reserved; undefined bits are ‘0’
Block Protect Status
Defines which bits in the Block Status Register section of the Query are
implemented.
bit 0
Block protect Status Register Lock/Unlock
bit active
(1 = Yes, 0 = No)
bit 1 Block Lock Status Register Lock-Down bit active (1 = Yes, 0 = No)
bit 15 to 2 Reserved for future use; undefined bits are ‘0’
Yes
Yes
71/92
M36WT864TF, M36WT864BF
Offset
Data
Description
Value
VDD Logic Supply Optimum Program/Erase voltage (highest performance)
(P+C)h = 45h
0018h
1.8V
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
VPPF Supply Optimum Program/Erase voltage
(P+D)h = 46h
00C0h
12V
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
Table 39. Protection Register Information
Offset
Data
Description
Value
(P+E)h = 47h
0001h
Number of protection register fields in JEDEC ID space. 0000h indicates that
256 fields are available.
1
(P+F)h = 48h
0080h
(P+10)h = 49h
0000h
(P+11)h = 4Ah
0003h
(P+12)h= 4Bh
0004h
Protection Field 1: Protection Description
Bits 0-7 Lower byte of protection register address
Bits 8-15 Upper byte of protection register address
Bits 16-23 2n bytes in factory pre-programmed region
Bits 24-31 2n bytes in user programmable region
0080h
8 Bytes
16 Bytes
Table 40. Burst Read Information
Offset
Data
Description
Value
(P+13)h = 4Ch
0003h
Page-mode read capability
bits 0-7
’n’ such that 2n HEX value represents the number of readpage bytes. See offset 28h for device word width to
determine page-mode data output width.
(P+14)h = 4Dh
0003h
Number of synchronous mode read configuration fields that follow.
3
(P+15)h = 4Eh
0001h
Synchronous mode read capability configuration 1
bit 3-7
Reserved
bit 0-2
’n’ such that 2n+1 HEX value represents the maximum
number of continuous synchronous reads when the device is
configured for its maximum word width. A value of 07h
indicates that the device is capable of continuous linear
bursts that will output data until the internal burst counter
reaches the end of the device’s burstable address space.
This field’s 3-bit value can be written directly to the read
configuration register bit 0-2 if the device is configured for its
maximum word width. See offset 28h for word width to
determine the burst data output width.
4
(P+16)h = 4Fh
0002h
Synchronous mode read capability configuration 2
8
(P+17)h = 50h
0007h
Synchronous mode read capability configuration 3
Cont.
8 Bytes
Table 41. Bank and Erase Block Region Information
M36WT864TF (top)
M36WT864BF (bottom)
Description
Offset
Data
Offset
Data
(P+18)h =51h
02h
(P+18)h =51h
02h
Number of Bank Regions within the device
Note: 1. The variable P is a pointer which is defined at CFI offset 15h.
2. Bank Regions. There are two Bank Regions, 1 contains all the banks that are made up of main blocks only, 2 contains the banks
that are made up of the parameter and main blocks.
72/92
M36WT864TF, M36WT864BF
Table 42. Bank and Erase Block Region 1 Information
M36WT864TF (top)
M36WT864BF (bottom)
Description
Offset
Data
Offset
Data
(P+19)h =52h
0Fh
(P+19)h =52h
01h
(P+1A)h =53h
00h
(P+1A)h =53h
00h
(P+1B)h =54h
11h
(P+1B)h =54h
11h
Number of program or erase operations allowed in region 1:
Bits 0-3: Number of simultaneous program operations
Bits 4-7: Number of simultaneous erase operations
(P+1C)h =55h
00h
(P+1C)h =55h
00h
Number of program or erase operations allowed in other banks
while a bank in same region is programming
Bits 0-3: Number of simultaneous program operations
Bits 4-7: Number of simultaneous erase operations
00h
Number of program or erase operations allowed in other banks
while a bank in this region is erasing
Bits 0-3: Number of simultaneous program operations
Bits 4-7: Number of simultaneous erase operations
Types of erase block regions in region 1
n = number of erase block regions with contiguous same-size
erase blocks.
Symmetrically blocked banks have one blocking region.(2)
(P+1D)h =56h
00h
(P+1D)h =56h
(P+1E)h =57h
01h
(P+1E)h =57h
02h
(P+1F)h =58h
07h
(P+1F)h =58h
07h
(P+20)h =59h
00h
(P+20)h =59h
00h
(P+21)h =5Ah
00h
(P+21)h =5Ah
20h
(P+22)h =5Bh
01h
(P+22)h =5Bh
00h
(P+23)h =5Ch
64h
(P+23)h =5Ch
64h
(P+24)h =5Dh
00h
(P+24)h =5Dh
00h
(P+25)h =5Eh
(P+26)h =5Fh
01h
03h
Number of identical banks within Bank Region 1
Bank Region 1 Erase Block Type 1 Information
Bits 0-15: n+1 = number of identical-sized erase blocks
Bits 16-31: n×256 = number of bytes in erase block region
Bank Region 1 (Erase Block Type 1)
Minimum block erase cycles × 1000
01h
Bank Region 1 (Erase Block Type 1): BIts per cell, internal
ECC
Bits 0-3: bits per cell in erase region
Bit 4: reserved for “internal ECC used”
BIts 5-7: reserved 5Eh 01 5Eh 01
(P+26)h =5Fh
03h
Bank Region 1 (Erase Block Type 1): Page mode and
synchronous mode capabilities
Bit 0: Page-mode reads permitted
Bit 1: Synchronous reads permitted
Bit 2: Synchronous writes permitted
Bits 3-7: reserved
(P+27)h =60h
06h
(P+28)h =61h
00h
(P+29)h =62h
00h
(P+2A)h =63h
01h
(P+2B)h =64h
64h
(P+2C)h =65h
00h
(P+25)h =5Eh
Bank Region 1 Erase Block Type 2 Information
Bits 0-15: n+1 = number of identical-sized erase blocks
Bits 16-31: n×256 = number of bytes in erase block region
Bank Region 1 (Erase Block Type 2)
Minimum block erase cycles × 1000
73/92
M36WT864TF, M36WT864BF
M36WT864TF (top)
M36WT864BF (bottom)
Description
Offset
Data
Offset
(P+2D)h =66h
(P+2E)h =67h
Data
01h
Bank Regions 1 (Erase Block Type 2): BIts per cell, internal
ECC
Bits 0-3: bits per cell in erase region
Bit 4: reserved for “internal ECC used”
BIts 5-7: reserved
03h
Bank Region 1 (Erase Block Type 2): Page mode and
synchronous mode capabilities
Bit 0: Page-mode reads permitted
Bit 1: Synchronous reads permitted
Bit 2: Synchronous writes permitted
Bits 3-7: reserved
Note: 1. The variable P is a pointer which is defined at CFI offset 15h.
2. Bank Regions. There are two Bank Regions, 1 contains all the banks that are made up of main blocks only, 2 contains the banks
that are made up of the parameter and main blocks.
Table 43. Bank and Erase Block Region 2 Information
M36WT864TF (top)
M36WT864BF (bottom)
Description
Offset
Data
Offset
Data
(P+27)h =60h
01h
(P+2F)h =68h
0Fh
(P+28)h =61h
00h
(P+30)h =69h
00h
Number of identical banks within bank region 2
(P+29)h =62h
11h
(P+31)h =6Ah
11h
Number of program or erase operations allowed in bank region
2:
Bits 0-3: Number of simultaneous program operations
Bits 4-7: Number of simultaneous erase operations
(P+2A)h =63h
00h
(P+32)h =6Bh
00h
Number of program or erase operations allowed in other banks
while a bank in this region is programming
Bits 0-3: Number of simultaneous program operations
Bits 4-7: Number of simultaneous erase operations
(P+2B)h =64h
00h
(P+33)h =6Ch
00h
Number of program or erase operations allowed in other banks
while a bank in this region is erasing
Bits 0-3: Number of simultaneous program operations
Bits 4-7: Number of simultaneous erase operations
Types of erase block regions in region 2
n = number of erase block regions with contiguous same-size
erase blocks.
Symmetrically blocked banks have one blocking region.(2)
(P+2C)h =65h
02h
(P+34)h =6Dh
01h
(P+2D)h =66h
06h
(P+35)h =6Eh
07h
(P+2E)h =67h
00h
(P+36)h =6Fh
00h
(P+2F)h =68h
00h
(P+37)h =70h
00h
(P+30)h =69h
01h
(P+38)h =71h
01h
(P+31)h =6Ah
64h
(P+39)h =72h
64h
(P+32)h =6Bh
00h
(P+3A)h =73h
00h
(P+33)h =6Ch
74/92
01h
(P+3B)h =74h
01h
Bank Region 2 Erase Block Type 1 Information
Bits 0-15: n+1 = number of identical-sized erase blocks
Bits 16-31: n×256 = number of bytes in erase block region
Bank Region 2 (Erase Block Type 1)
Minimum block erase cycles × 1000
Bank Region 2 (Erase Block Type 1): BIts per cell, internal
ECC
Bits 0-3: bits per cell in erase region
Bit 4: reserved for “internal ECC used”
BIts 5-7: reserved
M36WT864TF, M36WT864BF
M36WT864TF (top)
M36WT864BF (bottom)
Description
Offset
Data
(P+34)h =6Dh
03h
(P+35)h =6Eh
07h
(P+36)h =6Fh
00h
(P+37)h =70h
02h
(P+38)h =71h
00h
(P+39)h =72h
64h
(P+3A)h =73h
00h
(P+3B)h =74h
(P+3C)h =75h
Offset
(P+3C)h =75h
Data
03h
Bank Region 2 (Erase Block Type 1): Page mode and
synchronous
mode capabilities (defined in table 10)
Bit 0: Page-mode reads permitted
Bit 1: Synchronous reads permitted
Bit 2: Synchronous writes permitted
Bits 3-7: reserved
Bank Region 2 Erase Block Type 2 Information
Bits 0-15: n+1 = number of identical-sized erase blocks
Bits 16-31: n×256 = number of bytes in erase block region
Bank Region 2 (Erase Block Type 2)
Minimum block erase cycles × 1000
01h
Bank Region 2 (Erase Block Type 2): BIts per cell, internal
ECC
Bits 0-3: bits per cell in erase region
Bit 4: reserved for “internal ECC used”
BIts 5-7: reserved
03h
Bank Region 2 (Erase Block Type 2): Page mode and
synchronous
mode capabilities (defined in table 10)
Bit 0: Page-mode reads permitted
Bit 1: Synchronous reads permitted
Bit 2: Synchronous writes permitted
Bits 3-7: reserved
(P+3D)h =76h
(P+3D)h =76h
Feature Space definitions
(P+3E)h =77h
(P+3E)h =77h
Reserved
Note: 1. The variable P is a pointer which is defined at CFI offset 15h.
2. Bank Regions. There are two Bank Regions, Region 1 contains all the banks that are made up of main blocks only, Region 2 contains the banks that are made up of the parameter and main blocks.
75/92
M36WT864TF, M36WT864BF
APPENDIX C. FLASH FLOWCHARTS AND PSEUDO CODES
Figure 28. Program Flowchart and Pseudo Code
Start
program_command (addressToProgram, dataToProgram) {:
writeToFlash (bank_address, 0x40) ;
/*or writeToFlash (bank_address, 0x10) ; */
Write 40h or 10h
writeToFlash (addressToProgram, dataToProgram) ;
/*Memory enters read status state after
the Program Command*/
Write Address
& Data
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.SR7== 0) ;
YES
SR3 = 0
NO
VPP Invalid
Error (1, 2)
if (status_register.SR3==1) /*VPP invalid error */
error_handler ( ) ;
NO
Program
Error (1, 2)
if (status_register.SR4==1) /*program error */
error_handler ( ) ;
NO
Program to Protected
Block Error (1, 2)
YES
SR4 = 0
YES
SR1 = 0
if (status_register.SR1==1) /*program to protect block error */
error_handler ( ) ;
YES
End
}
AI06170
Note: 1. Status check of SR1 (Protected Block), SR3 (VPP (VPPF) Invalid) and SR4 (Program Error) can be made after each program operation or after a sequence.
2. If an error is found, the Status Register must be cleared before further Program/Erase Controller operations.
76/92
M36WT864TF, M36WT864BF
Figure 29. Double Word Program Flowchart and Pseudo code
Start
Write 30h
double_word_program_command (addressToProgram1, dataToProgram1,
addressToProgram2, dataToProgram2)
{
writeToFlash (bank_address, 0x30) ;
writeToFlash (addressToProgram1, dataToProgram1) ;
/*see note (3) */
writeToFlash (addressToProgram2, dataToProgram2) ;
/*see note (3) */
/*Memory enters read status state after
the Program command*/
Write Address 1
& Data 1 (3)
Write Address 2
& Data 2 (3)
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.b7== 0) ;
YES
SR3 = 0
NO
VPP Invalid
Error (1, 2)
if (status_register.SR3==1) /*VPP invalid error */
error_handler ( ) ;
NO
Program
Error (1, 2)
if (status_register.SR4==1) /*program error */
error_handler ( ) ;
YES
SR4 = 0
YES
SR1 = 0
NO
Program to Protected
Block Error (1, 2)
if (status_register.SR1==1) /*program to protect block error */
error_handler ( ) ;
YES
End
}
AI06171
Note: 1. Status check of b1 (Protected Block), b3 (VPP (VPPF) Invalid) and b4 (Program Error) can be made after each program operation
or after a sequence.
2. If an error is found, the Status Register must be cleared before further Program/Erase operations.
3. Address 1 and Address 2 must be consecutive addresses differing only for bit A0.
77/92
M36WT864TF, M36WT864BF
Figure 30. Quadruple Word Program Flowchart and Pseudo Code
Start
quadruple_word_program_command (addressToProgram1, dataToProgram1,
addressToProgram2, dataToProgram2,
addressToProgram3, dataToProgram3,
addressToProgram4, dataToProgram4)
{
writeToFlash (bank_address, 0x56) ;
Write 56h
Write Address 1
& Data 1 (3)
writeToFlash (addressToProgram1, dataToProgram1) ;
/*see note (3) */
Write Address 2
& Data 2 (3)
writeToFlash (addressToProgram2, dataToProgram2) ;
/*see note (3) */
writeToFlash (addressToProgram3, dataToProgram3) ;
/*see note (3) */
Write Address 3
& Data 3 (3)
writeToFlash (addressToProgram4, dataToProgram4) ;
/*see note (3) */
Write Address 4
& Data 4 (3)
/*Memory enters read status state after
the Program command*/
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.b7== 0) ;
YES
SR3 = 0
NO
VPP Invalid
Error (1, 2)
if (status_register.SR3==1) /*VPP invalid error */
error_handler ( ) ;
NO
Program
Error (1, 2)
if (status_register.SR4==1) /*program error */
error_handler ( ) ;
YES
SR4 = 0
YES
SR1 = 0
NO
Program to Protected
Block Error (1, 2)
if (status_register.SR==1) /*program to protect block error */
error_handler ( ) ;
YES
End
}
AI06977
Note: 1. Status check of SR1 (Protected Block), SR3 (VPP (VPPF) Invalid) and SR4 (Program Error) can be made after each program operation or after a sequence.
2. If an error is found, the Status Register must be cleared before further Program/Erase operations.
3. Address 1 to Address 4 must be consecutive addresses differing only for bits A0 and A1.
78/92
M36WT864TF, M36WT864BF
Figure 31. Program Suspend & Resume Flowchart and Pseudo Code
Start
program_suspend_command ( ) {
writeToFlash (any_address, 0xB0) ;
Write B0h
writeToFlash (bank_address, 0x70) ;
/* read status register to check if
program has already completed */
Write 70h
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.SR7== 0) ;
YES
SR2 = 1
NO
Program Complete
YES
Write FFh
}
Read data from
another address
Write D0h
if (status_register.SR2==0) /*program completed */
{ writeToFlash (bank_address, 0xFF) ;
read_data ( ) ; /*read data from another block*/
/*The device returns to Read Array
(as if program/erase suspend was not issued).*/
else
{ writeToFlash (bank_address, 0xFF) ;
read_data ( ); /*read data from another address*/
writeToFlash (any_address, 0xD0) ;
/*write 0xD0 to resume program*/
}
Write FFh
}
Program Continues
Read Data
AI06173
79/92
M36WT864TF, M36WT864BF
Figure 32. Block Erase Flowchart and Pseudo Code
Start
erase_command ( blockToErase ) {
writeToFlash (bank_address, 0x20) ;
Write 20h
writeToFlash (blockToErase, 0xD0) ;
/* only A12-A20 are significannt */
/* Memory enters read status state after
the Erase Command */
Write Block
Address & D0h
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.SR7== 0) ;
YES
SR3 = 0
NO
VPP Invalid
Error (1)
YES
Command
Sequence Error (1)
if (status_register.SR3==1) /*VPP invalid error */
error_handler ( ) ;
YES
SR4, SR5 = 1
if ( (status_register.SR4==1) && (status_register.SR5==1) )
/* command sequence error */
error_handler ( ) ;
NO
SR5 = 0
NO
Erase Error (1)
if ( (status_register.SR5==1) )
/* erase error */
error_handler ( ) ;
YES
SR1 = 0
NO
Erase to Protected
Block Error (1)
if (status_register.SR1==1) /*program to protect block error */
error_handler ( ) ;
YES
End
}
AI06174
Note: If an error is found, the Status Register must be cleared before further Program/Erase operations.
80/92
M36WT864TF, M36WT864BF
Figure 33. Erase Suspend & Resume Flowchart and Pseudo Code
Start
erase_suspend_command ( ) {
writeToFlash (bank_address, 0xB0) ;
Write B0h
writeToFlash (bank_address, 0x70) ;
/* read status register to check if
erase has already completed */
Write 70h
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.SR7== 0) ;
YES
SR6 = 1
NO
Erase Complete
if (status_register.SR6==0) /*erase completed */
{ writeToFlash (bank_address, 0xFF) ;
YES
read_data ( ) ;
/*read data from another block*/
/*The device returns to Read Array
(as if program/erase suspend was not issued).*/
Write FFh
Read data from
another block
or
Program/Protection Program
or
Block Protect/Unprotect/Lock
}
else
Write D0h
Write FFh
Erase Continues
Read Data
{ writeToFlash (bank_address, 0xFF) ;
read_program_data ( );
/*read or program data from another address*/
writeToFlash (bank_address, 0xD0) ;
/*write 0xD0 to resume erase*/
}
}
AI06175
81/92
M36WT864TF, M36WT864BF
Figure 34. Locking Operations Flowchart and Pseudo Code
Start
locking_operation_command (address, lock_operation) {
writeToFlash (bank_address, 0x60) ; /*configuration setup*/
Write 60h
if (lock_operation==LOCK) /*to protect the block*/
writeToFlash (address, 0x01) ;
else if (lock_operation==UNLOCK) /*to unprotect the block*/
writeToFlash (address, 0xD0) ;
else if (lock_operation==LOCK-DOWN) /*to lock the block*/
writeToFlash (address, 0x2F) ;
Write
01h, D0h or 2Fh
writeToFlash (bank_address, 0x90) ;
Write 90h
Read Block
Lock States
Locking
change
confirmed?
if (readFlash (address) ! = locking_state_expected)
error_handler () ;
/*Check the locking state (see Read Block Signature table )*/
NO
YES
writeToFlash (bank_address, 0xFF) ; /*Reset to Read Array mode*/
Write FFh
}
End
AI06176
82/92
M36WT864TF, M36WT864BF
Figure 35. Protection Register Program Flowchart and Pseudo Code
Start
protection_register_program_command (addressToProgram, dataToProgram) {:
writeToFlash (bank_address, 0xC0) ;
Write C0h
writeToFlash (addressToProgram, dataToProgram) ;
/*Memory enters read status state after
the Program Command*/
Write Address
& Data
do {
status_register=readFlash (bank_address) ;
/* E or G must be toggled*/
Read Status
Register
SR7 = 1
NO
} while (status_register.SR7== 0) ;
YES
SR3 = 0
NO
VPP Invalid
Error (1, 2)
if (status_register.SR3==1) /*VPP invalid error */
error_handler ( ) ;
NO
Program
Error (1, 2)
if (status_register.SR4==1) /*program error */
error_handler ( ) ;
NO
Program to Protected
Block Error (1, 2)
YES
SR4 = 0
YES
SR1 = 0
if (status_register.SR1==1) /*program to protect block error */
error_handler ( ) ;
YES
End
}
AI06177
Note: 1. Status check of SR1 (Protected Block), SR3 (VPP (VPPF) Invalid) and SR4 (Program Error) can be made after each program operation or after a sequence.
2. If an error is found, the Status Register must be cleared before further Program/Erase Controller operations.
83/92
M36WT864TF, M36WT864BF
Figure 36. Enhanced Factory Program Flowchart
SETUP PHASE
VERIFY PHASE
Start
Write PD1
Address WA1(1)
Write 30h
Address WA1
Write D0h
Address WA1
Read Status
Register
Read Status
Register
SR0 = 0?
NO
Check SR4, SR3
and SR1 for program,
VPP and Lock Errors
SR7 = 0?
Exit
PROGRAM PHASE
YES
Write PD2
Address WA2(1)
YES
SR0 = 0?
NO
NO
YES
Read Status
Register
Write PD1
Address WA1
SR0 = 0?
Read Status
Register
NO
YES
NO
SR0 = 0?
Write PDn
Address WAn(1)
YES
Write PD2
Address WA2(1)
Read Status
Register
Read Status
Register
SR0 = 0?
NO
YES
SR0 = 0?
NO
Write FFFFh
Address =/ Block WA1
YES
EXIT PHASE
Write PDn
Address WAn(1)
Read Status
Register
Read Status
Register
SR7 = 1?
NO
YES
SR0 = 0?
NO
Check Status
Register for Errors
YES
Write FFFFh
Address =/ Block WA1
Note 1. Address can remain Starting Address WA1 or be incremented.
84/92
End
AI06160
M36WT864TF, M36WT864BF
Enhanced Factory Program Pseudo Code
efp_command(addressFlow,dataFlow,n)
/* n is the number of data to be programmed */
{
/* setup phase */
writeToFlash(addressFlow[0],0x30);
writeToFlash(addressFlow[0],0xD0);
status_register=readFlash(any_address);
if (status_register.b7==1){
/*EFP aborted for an error*/
if (status_register.b4==1) /*program error*/
error_handler();
if (status_register.b3==1) /*VPP invalid error*/
error_handler();
if (status_register.b1==1) /*program to protect block error*/
error_handler();
}
else{
/*Program Phase*/
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
} while (status_register.b0==1)
/*Ready for first data*/
for (i=0; i++; i< n){
writeToFlash(addressFlow[i],dataFlow[i]);
/* status register polling*/
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
} while (status_register.b0==1);
/* Ready for a new data */
}
writeToFlash(another_block_address,FFFFh);
/* Verify Phase */
for (i=0; i++; i< n){
writeToFlash(addressFlow[i],dataFlow[i]);
/* status register polling*/
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
} while (status_register.b0==1);
/* Ready for a new data */
}
writeToFlash(another_block_address,FFFFh);
/* exit program phase */
/* Exit Phase */
/* status register polling */
do{
status_register=readFlash(any_address);
/* E or G must be toggled */
} while (status_register.b7==0);
if (status_register.b4==1) /*program failure error*/
error_handler();
if (status_register.b3==1) /*VPP invalid error*/
error_handler();
if (status_register.b1==1) /*program to protect block error*/
error_handler();
}
}
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M36WT864TF, M36WT864BF
Figure 37. Quadruple Enhanced Factory Program Flowchart
SETUP PHASE
LOAD PHASE
Start
Write PD1
Address WA1(1)
Write 75h
Address WA1
FIRST
LOAD PHASE
Write PD1
Address WA1
Read Status
Register
SR0 = 0?
Read Status
Register
NO
YES
Write PD2
Address WA2(2)
NO
SR7 = 0?
YES
Check SR4, SR3
and SR1 for program,
VPP and Lock Errors
Read Status
Register
SR0 = 0?
NO
YES
Write PD3
Address WA3(2)
Exit
Read Status
Register
SR0 = 0?
NO
YES
Write PD4
Address WA4(2)
PROGRAM AND
VERIFY PHASE
EXIT PHASE
Write FFFFh
Address =
/ Block WA1
Read Status
Register
NO
SR0 = 0?
Check Status
Register for Errors
YES
Last Page?
NO
End
YES
Note 1. Address can remain Starting Address WA1 (in which case the next Page is programmed) or can be
any address in the same block.
2.The address is only checked for the first Word of each Page as the order to program the Words is fixed
so subsequent Words in each Page can be written to any address.
86/92
AI06178
M36WT864TF, M36WT864BF
Quadruple Enhanced Factory Program Pseudo Code
quad_efp_command(addressFlow,dataFlow,n)
/* n is the number of pages to be programmed.*/
{
/* Setup phase */
writeToFlash(addressFlow[0],0x75);
for (i=0; i++; i< n){
/*Data Load Phase*/
/*First Data*/
writeToFlash(addressFlow[i],dataFlow[i,0]);
/*at the first data of the first page, Quad-EFP may be aborted*/
if (First_Page) {
status_register=readFlash(any_address);
if (status_register.b7==1){
/*EFP aborted for an error*/
if (status_register.b4==1) /*program error*/
error_handler();
if (status_register.b3==1) /*VPP invalid error*/
error_handler();
if (status_register.b1==1) /*program to protect block error*/
error_handler();
}
}
/*2nd data*/
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
}while (status_register.b0==1)
writeToFlash(addressFlow[i],dataFlow[i,1]);
/*3rd data*/
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
}while (status_register.b0==1)
writeToFlash(addressFlow[i],dataFlow[i,2]);
/*4th data*/
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
}while (status_register.b0==1)
writeToFlash(addressFlow[i],dataFlow[i,3]);
/* Program&Verify Phase */
do{
status_register=readFlash(any_address);
/* E or G must be toggled*/
}while (status_register.b0==1)
}
/* Exit Phase */
writeToFlash(another_block_address,FFFFh);
/* status register polling */
do{
status_register=readFlash(any_address);
/* E or G must be toggled */
} while (status_register.b7==0);
if (status_register.b1==1) /*program to protected block error*/
error_handler();
if (status_register.b3==1) /*VPP invalid error*/
error_handler();
if (status_register.b4==1) /*program failure error*/
error_handler();
}
}
87/92
M36WT864TF, M36WT864BF
APPENDIX D. FLASH COMMAND INTERFACE STATE TABLES
Table 44. Command Interface States - Modify Table, Next State
Current CI State
Ready
Lock/CR Setup
Setup
OTP
Busy
Setup
Program
Next CI State After Command Input
Erase
Confirm
Block
Read
P/E
Program Program
Clear Electronic
Erase,
Quad- Resume, Program/ Read
WP
DWP,
Read
EFP
status signature,
Bank
Erase
Status
EFP
Block
setup
QWP
Setup
Erase
Array(2)
(3,4)
Setup
Unlock Suspend Register Register Read CFI
Setup
(5)
Setup
(3,4)
Query
confirm,
(3,4)
EFP
Confirm
Quad-EFP
Program
Program
Ready
Erase Setup EFP Setup
Ready
Setup
Setup
Setup
Ready (Lock Error)
Ready
Ready (Lock Error)
OTP Busy
Program Busy
Busy
Suspend
Program Suspended
Setup
Ready (error)
Busy
Erase
Suspended
Program in
Erase
Suspend
Busy
Suspend
Lock/CR Setup
in Erase Suspend
Setup
EFP
Quad
EFP
Program Busy
Program Suspended
Ready (error)
Erase
Suspended
Erase Suspended
Erase Busy
Erase Busy
Erase Suspended
Program in Erase Suspend Busy
Setup
Program
in Erase
Suspend
Program
Busy
Erase Busy
Erase Busy
Erase
Suspend
Program
Suspended
Program Busy
Program in
Erase
Suspend
Suspended
Program in Erase Suspend Busy
Program in Erase Suspend Suspended
Erase Suspend (Lock Error)
Ready (error)
Program in
Erase
Suspend
Busy
Erase
Suspend
EFP Busy
Busy
EFP Busy (6)
Verify
EFP Verify (6)
Setup
Quad EFP Busy (6)
Busy
Quad EFP Busy(6)
Program in Erase Suspend Busy
Program in Erase Suspend Suspended
Erase Suspend (Lock Error)
Ready (error)
Note: 1. CI = Command Interface, CR = Configuration Register, EFP = Enhanced Factory Program, Quad EFP = Quadruple Enhanced Factory Program, DWP = Double Word Program, QWP = Quadruple Word Program, P/E. C. = Program/Erase Controller.
2. At Power-Up, all banks are in Read Array mode. A Read Array command issued to a busy bank, results in undetermined data output.
3. The two cycle command should be issued to the same bank address.
4. If the P/E.C. is active, both cycles are ignored.
5. The Clear Status Register command clears the Status Register error bits except when the P/E.C. is busy or suspended.
6. EFP and Quad EFP are allowed only when Status Register bit SR0 is set to ‘0’.EFP and Quad EFP are busy if Block Address is
first EFP Address. Any other commands are treated as data.
88/92
M36WT864TF, M36WT864BF
Table 45. Command Interface States - Modify Table, Next Output
Current CI State
Read
Array(2)
Program
DWP,
QWP
Setup
(3,4)
Block
Erase,
Bank
Erase
Setup
(3,4)
Next Output State After Command Input (6)
Erase
Confirm
P/E
Resume, Program/
QuadRead
EFP
Block
EFP
Erase
Status
Setup
Unlock
Setup
Suspend Register
confirm,
EFP
Confirm
Program Setup
Erase Setup
OTP Setup
Program in
Erase Suspend
EFP Setup
EFP Busy
EFP Verify
Quad EFP Setup
Quad EFP Busy
Lock/CR Setup
Lock/CR Setup
in Erase
Suspend
Clear status
Register
(5)
Read
Electronic
signature,
Read CFI
Query
Status Register
Status Register
OTP Busy
Array
Status Register
Output Unchanged
Status
Register
Output
Unchanged
Status
Register
Ready
Program Busy
Erase Busy
Program/Erase
Program in
Erase Suspend
Busy
Program in
Erase Suspend
Suspended
Array
Status Register
Output Unchanged
Status
Register
Output
Unchanged
Electronic
Signature/
CFI
Note: 1. CI = Command Interface, CR = Configuration Register, EFP = Enhanced Factory Program, Quad EFP = Quadruple Enhanced Factory Program, DWP = Double Word Program, QWP = Quadruple Word Program, P/E. C. = Program/Erase Controller.
2. At Power-Up, all banks are in Read Array mode. A Read Array command issued to a busy bank, results in undetermined data output.
3. The two cycle command should be issued to the same bank address.
4. If the P/E.C. is active, both cycles are ignored.
5. The Clear Status Register command clears the Status Register error bits except when the P/E.C. is busy or suspended.
6. The output state shows the type of data that appears at the outputs if the bank address is the same as the command address. A
bank can be placed in Read Array, Read Status Register, Read Electronic Signature or Read CFI Query mode, depending on the
command issued. Each bank remains in its last output state until a new command is issued. The next state does not depend on the
bank’s output state.
89/92
M36WT864TF, M36WT864BF
Table 46. Command Interface States - Lock Table, Next State
Next CI State After Command Input
Current CI State
Ready
Lock/CR Setup
OTP
Program
Lock/CR
Setup(4)
OTP Setup
Lock/CR
Setup
OTP Setup
(4)
EFP Exit,
Quad EFP
Exit (3)
Illegal
Command
(5)
Ready (Lock error)
Ready
N/A
Ready (Lock error)
N/A
N/A
OTP Busy
Busy
P/E. C.
Operation
Completed
Ready
Setup
Program Busy
N/A
Busy
Program Busy
Ready
Suspend
Program Suspended
N/A
Setup
Ready (error)
N/A
Busy
Erase Busy
Ready
Suspend
Lock/CR
Setup in
Erase
Suspend
Erase Suspended
Setup
N/A
Program in Erase Suspend Busy
N/A
Busy
Program in Erase Suspend Busy
Erase
Suspended
Suspend
Program in Erase Suspend Suspended
Lock/CR Setup
in Erase Suspend
Erase Suspend (Lock error)
Erase Suspend
Setup
EFP
Set CR
Confirm
Ready
Setup
Erase
Program in
Erase
Suspend
Block
Block Lock
Lock-Down
Confirm
Confirm
EFP Busy (2)
Verify
(2)
QuadEFP
Busy
N/A
Ready (error)
Busy
Setup
N/A
Erase Suspend (Lock
error)
EFP Verify
Quad EFP Busy
Quad EFP Busy (2)
N/A
EFP Verify
Ready
EFP Busy(2)
EFP Verify
(2)
(2)
N/A
Ready
N/A
Ready
Quad EFP
Busy(2)
Ready
Note: 1. CI = Command Interface, CR = Configuration Register, EFP = Enhanced Factory Program, Quad EFP = Quadruple Enhanced Factory Program, P/E. C. = Program/Erase Controller.
2. EFP and Quad EFP are allowed only when Status Register bit SR0 is set to ‘0’. EFP and Quad EFP are busy if Block Address is
first EFP Address. Any other commands are treated as data.
3. EFP and Quad EFP exit when Block Address is different from first Block Address and data is FFFFh.
4. If the P/E.C. is active, both cycles are ignored.
5. Illegal commands are those not defined in the command set.
90/92
M36WT864TF, M36WT864BF
Table 47. Command Interface States - Lock Table, Next Output
Current CI State
Program Setup
Erase Setup
OTP Setup
Program in Erase
Suspend
EFP Setup
EFP Busy
EFP Verify
Quad EFP Setup
Quad EFP Busy
Lock/CR Setup
Lock/CR Setup in
Erase Suspend
Lock/CR
Setup(3)
OTP Setup
(3)
Next Output State After Command Input
Block
EFP Exit,
Block Lock
Set CR
Lock-Down
Quad EFP
Confirm
Confirm
Confirm
Exit (2)
Illegal
Command
(4)
Output
Unchanged
Status Register
Status Register
P/E. C.
Operation
Completed
Array
Status Register
Output
Unchanged
OTP Busy
Status Register
Output Unchanged
Array
Output
Unchanged
Output
Unchanged
Ready
Program Busy
EraseBusy
Program/Erase
Program in Erase
Suspend Busy
Program in Erase
Suspend
Suspended
Status Register
Output Unchanged
Array
Output
Unchanged
Output
Unchanged
Note: 1. CI = Command Interface, CR = Configuration Register, EFP = Enhanced Factory Program, Quad EFP = Quadruple Enhanced Factory Program, P/E. C. = Program/Erase Controller.
2. EFP and Quad EFP exit when Block Address is different from first Block Address and data is FFFFh.
3. If the P/E.C. is active, both cycles are ignored.
4. Illegal commands are those not defined in the command set.
91/92
M36WT864TF, M36WT864BF
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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